JP4545638B2 - X-ray foreign object detection device - Google Patents

Description

  The present invention relates to an X-ray foreign object detection device that processes an X-ray image generated based on an X-ray dose that has passed through an object to be inspected to detect the presence or absence of foreign objects contained in the object to be inspected.

  Conventionally, as an X-ray foreign matter detection apparatus, as shown in FIG. 22, an object to be inspected 980 that is composed of a container 981 such as a can and contents 982 accommodated in the container 981 and is conveyed by a conveyor belt 990 is used. X-ray source 911 that irradiates X-rays 911a and detection elements that detect X-rays 911a irradiated by X-ray source 911 are arranged in a direction orthogonal to the conveyance direction of object 980 to be inspected by conveyance belt 990 An X-ray image 930 (see FIG. 23) based on the detection result of the X-ray detector 912, and the generated X-ray image 930 is processed to be included in the inspected object 980. An X-ray foreign object detection apparatus that determines the presence or absence of a foreign object 984, and an X-ray image 930 is an area 931 (see FIG. 23) corresponding to an area 983 through which the X-ray 911 a is difficult to transmit due to the influence of the container 981. Et excluded by inspection region 932 (see FIG. 23.) Set, determines the X-ray foreign material detecting apparatus the presence or absence of a foreign object 984 is known in the inspection area 932 (for example, see Patent Document 1.).

Japanese Patent No. 3567120 (page 3-4, Fig. 3)

  However, the conventional X-ray foreign object detection apparatus has a problem that even if the foreign substance 984 exists in the region 983 where the presence / absence of the foreign substance 984 is not determined, the foreign substance 984 cannot be detected.

  The present invention has been made in order to solve the conventional problem, and it is possible to inspect the region 983 where the presence / absence of the foreign matter 984 could not be inspected, and the reliability of the determination of the presence / absence of the foreign matter 984 can be improved. It is an object of the present invention to provide an X-ray foreign object detection device that can be improved as compared with the prior art.

The X-ray foreign object detection apparatus of the present invention processes an X-ray image generated based on an X-ray dose transmitted through an object to be inspected that is contained in a container and conveyed, and contains the object in the object to be inspected. In the X-ray foreign object detection device for detecting the presence or absence of the X-ray, the X-ray image is placed in a strong influence area where the influence of the container is assumed to be strong and a non-strong influence area other than the strong influence area. It is assumed that a division threshold value setting means for setting a division threshold value for division according to the density of each pixel and the inspection object in the X-ray image respectively generated corresponding to each inspection object to be conveyed An area to be inspected for each inspected object by dividing the density of each pixel of the X-ray image and the division threshold, and the area dividing means For each area divided by the density of each pixel By treatment for each of the areas relative to serial X-ray image and a foreign substance determination means for determining the presence or absence of the foreign substance, the foreign substance determination means, for each of the areas divided by said area dividing means, a different filter And the presence or absence of the foreign matter is determined .

With this configuration, the X-ray foreign matter detection apparatus of the present invention determines the presence or absence of foreign matter by processing for each region in the inspected region of the X-ray image. It is also possible to inspect the area that could not be made, and the reliability of the determination of the presence or absence of foreign matter can be improved as compared with the prior art.
In addition, the X-ray foreign object detection device of the present invention is capable of applying a strong non-strong area other than the strong influence area to a strong influence area in which an influence of the container in the inspection object is assumed to be strong in the X-ray image of the inspection object. The presence or absence of a foreign object can be detected in the same manner as for the affected area.

In the X-ray foreign matter detection apparatus of the present invention, the foreign matter determination means applies different filters for each region divided by the division means to determine the presence or absence of foreign matters, so that the presence or absence of foreign matters can be more appropriately determined. .

Also, the region dividing means of the X-ray foreign material detecting apparatus of the present invention, the X-ray candidate of the strong impact area on the basis of the divided threshold set with concentrated Do及 beauty the dividing threshold value setting means of each pixel of the image The strong influence candidate area is divided, and the strong influence candidate area in contact with the boundary of the inspected object area is divided as the strong influence area.

  With this configuration, the X-ray foreign object detection device of the present invention can reduce the possibility that an area actually corresponding to a foreign object in the X-ray image of the inspection object is erroneously included in the strong influence area.

  In addition, the X-ray foreign object detection device of the present invention includes a display unit that displays an image, and a display control unit that causes the display unit to display at least one of the strong influence area and the non-strong influence area on the X-ray image. The division threshold setting means sets the division threshold specified by the user.

  With this configuration, the X-ray foreign object detection device of the present invention can allow the user to specify the division threshold while allowing the user to see at least one of the strong influence area and the non-strong influence area divided by the division threshold. The user can easily set the division threshold.

  Further, the X-ray foreign object detection device of the present invention is a pixel having the highest density among the display means for displaying an image and the pixels in the X-ray image of the strong influence region in the X-ray image having the same position in the transport direction. At least one of a graph representing the density of each pixel at each position and a graph representing the density of the pixel having the highest density among the pixels having the same position in the X-ray image of the non-strongly affected area at each position. And a display control means for displaying on the means.

  With this configuration, the X-ray foreign object detection device of the present invention determines the threshold value for determining the presence or absence of foreign matter on the X-ray image of the strong influence region and the presence or absence of foreign matter on the X-ray image of the non-strong influence region. The user can easily set at least one of the threshold value for determination.

  An object of the present invention is to provide an X-ray foreign object detection device that can inspect a region where the presence / absence of a foreign object could not be inspected and can improve the reliability of the determination of the presence / absence of a foreign object. It is something that can be done.

Furthermore, the X-ray foreign object detection device of the present invention is capable of applying a strong non-strong area other than the strong influence area to a strong influence area where the influence of the container in the inspection object is assumed to be strong in the X-ray image of the inspection object. The presence or absence of a foreign object can be detected in the same manner as for the affected area.

Furthermore, in the X-ray foreign matter detection apparatus of the present invention, since the foreign matter determination means applies different filters for each region divided by the division means to determine the presence or absence of foreign matters, the presence or absence of foreign matters can be determined more appropriately. .
Furthermore, the X-ray foreign object detection apparatus of the present invention can reduce the possibility that an area corresponding to a foreign substance in the X-ray image of the inspection object is erroneously included in the strong influence area.

  Furthermore, the X-ray foreign object detection apparatus of the present invention can allow the user to specify the division threshold while allowing the user to see at least one of the strong influence area and the non-strong influence area divided by the division threshold. The person can easily set the division threshold.

  Furthermore, the X-ray foreign object detection apparatus of the present invention determines a threshold value for determining the presence or absence of a foreign object with respect to an X-ray image of a strong influence area, and determines the presence or absence of a foreign object with respect to an X-ray image of a non-strong influence area. Therefore, the user can easily set at least one of the threshold values for the user.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

(First embodiment)
First, the configuration of the X-ray foreign object detection device according to the first embodiment will be described.

  As shown in FIGS. 1 and 2, the X-ray foreign object detection apparatus 10 according to the present embodiment includes an X-ray source 11 that irradiates an X-ray 11 a to an inspection object 80 conveyed by a conveyance belt 90, and an X-ray. An X-ray detector 12 in which detection elements for detecting X-rays 11 a irradiated by the source 11 are arranged in a direction orthogonal to the conveyance direction of the object 80 to be inspected by the conveyance belt 90, and the detection result of the X-ray detector 12 A computer 13 that generates an X-ray image 30 (see FIG. 3) based on the image, processes the generated X-ray image 30 to determine the presence or absence of the foreign material 84 contained in the inspected object 80, and the foreign material 84 by the computer 13. Display 14 as a display means for displaying the determination result and the like, and a touch panel 15 that is arranged on the screen of the display 14 and inputs a signal according to a user operation to the computer 13. That.

  The computer 13 is a ROM (Read Only Memory) (not shown) in which a program is recorded, a CPU (Central Processing Unit) (not shown) that operates based on the program recorded in the ROM, and a work area of the CPU. RAM (Random Access Memory) and the like are included.

  The inspected object 80 according to the present embodiment includes a container 81 and a content 82 stored in the container 81. The shape of the container 81 shown in FIG. 2 is a columnar shape as shown in FIG.

  Next, the operation of the X-ray foreign object detection device 10 will be described.

  First, the threshold value for dividing the inspection object region 31 (see FIG. 5) assumed to correspond to the inspection object 80 in the X-ray image 30 and the inspection object outside region 32 other than the inspection object region 31. A certain first division threshold 41 (see FIG. 6) and a strong influence region 31a (see FIG. 7) that is assumed to have a strong influence of the container 81 in the inspection object 80 in the inspection object region 31 and a strong influence. An operation for setting the second division threshold value 42 (see FIG. 6), which is a threshold value for dividing the non-strong influence region 31b (see FIG. 7) other than the region 31a, will be described.

  When the inspection object 80 for setting the first division threshold value 41 and the second division threshold value 42 is conveyed by the conveyance belt 90, the X-ray source 11 irradiates the inspection object 80 with the X-ray 11a, and the X-ray detector. Twelve detection results are input to the computer 13.

  When the detection result of the X-ray detector 12 is input, the computer 13 starts the process shown in FIG. Note that the first division threshold 41 and the second division threshold 42 are, for example, “100” as initial values before the start of the processing shown in FIG. 8 when the detection result of the X-ray detector 12 is 7 bits (128 gradations). "Is set.

  That is, the computer 13 generates an X-ray image 30 based on the detection result of the X-ray detector 12 (S101), and the generated X-ray image 30 is displayed on the X-ray image display area 14a of the display 14 as shown in FIG. (S102).

  Next, the computer 13 sets an area of a pixel having a density equal to or higher than the current first division threshold 41 in the X-ray image 30 as an inspection object area 31, and sets an area other than the inspection object area 31 in the X-ray image 30. The region outside the inspection object region 32 is divided (S103), and the region of the pixel having the density equal to or higher than the current second division threshold value 42 in the divided inspection region 31 is defined as the strong influence region 31a. An area other than the strong influence area 31a is divided as a non-strong influence area 31b (S104).

  Then, the computer 13 displays the current strong influence area 31a, the first division threshold 41, and the second division threshold 42 on the X-ray image display area 14a of the display 14 as shown in FIG. 9 (S105). That is, the computer 13 superimposes the current strong influence area 31 a on the X-ray image 30 and displays it on the X-ray image display area 14 a of the display 14 and displays the divided threshold display area 14 b for the first division threshold 41 on the display 14. The current first division threshold value 41 is displayed, and the current second division threshold value 42 is displayed in the division threshold value display area 14 c for the second division threshold value 42 of the display 14.

  Next, the computer 13 determines whether or not a portion of the touch panel 15 corresponding to the divided threshold adjustment areas 14d and 14e (see FIG. 9) for the first divided threshold 41 of the display 14 has been touched by the user (see FIG. 9). S106).

  When the computer 13 determines in S106 that the portion of the touch panel 15 corresponding to the divided threshold adjustment areas 14d and 14e has been touched by the user within a predetermined time, the computer 13 resets the first divided threshold 41 (S107). , The process returns to S103. That is, when the part of the touch panel 15 corresponding to the division threshold adjustment area 14 d is touched by the user, the computer 13 resets the first division threshold 41 to a value obtained by subtracting one, and adjusts the division threshold adjustment of the touch panel 15. When the part corresponding to the area 14e is touched by the user, the first division threshold 41 is reset to a value obtained by adding one, and the process returns to S103.

  On the other hand, when the computer 13 determines in S106 that the part corresponding to the division threshold adjustment areas 14d and 14e in the touch panel 15 has not been touched by the user, the division threshold for the second division threshold 42 of the display 14 in the touch panel 15 is obtained. It is determined whether or not portions corresponding to the adjustment areas 14f and 14g (see FIG. 9) have been touched by the user (S108).

  When the computer 13 determines in S108 that the portion of the touch panel 15 corresponding to the divided threshold adjustment areas 14f and 14g has been touched by the user within a predetermined time, the computer 13 resets the second divided threshold 42 (S109). , The process returns to S104. That is, when the part of the touch panel 15 corresponding to the division threshold adjustment area 14f is touched by the user, the computer 13 resets the second division threshold 42 to a value obtained by subtracting one, and adjusts the division threshold adjustment of the touch panel 15. When the part corresponding to the region 14g is touched by the user, the second division threshold value 42 is reset to a value obtained by adding one, and the process returns to S104.

  On the other hand, when the computer 13 determines in S108 that the portion of the touch panel 15 corresponding to the divided threshold adjustment areas 14f and 14g has not been touched by the user, the computer 13 determines whether or not a predetermined time has passed (S110).

  When the computer 13 determines in S110 that the predetermined time has not elapsed, the process returns to S106. When the computer 13 determines in S110 that the predetermined time has elapsed, the series of processes illustrated in FIG.

  Next, an operation for detecting the presence or absence of the foreign substance 84 contained in the inspection object 80 will be described.

  When the inspection object 80 for detecting the foreign substance 84 is conveyed by the conveyance belt 90, the X-ray source 11 irradiates the inspection object 80 with the X-ray 11 a, and the detection result of the X-ray detector 12 is input to the computer 13. Is done.

  When the detection result of the X-ray detector 12 is input, the computer 13 starts the process shown in FIG.

  That is, the computer 13 generates an X-ray image 30 based on the detection result of the X-ray detector 12 (S121), and the first division set in advance by the processing shown in FIG. 8 in the generated X-ray image 30. A region of a pixel having a density equal to or higher than the threshold 41 is set as an inspection object region 31, and an area other than the inspection object region 31 in the X-ray image 30 is divided as an inspection object outside region 32 (S122). A region of a pixel having a density equal to or higher than the second division threshold value 42 set in advance by the processing shown in FIG. 8 in the region 31 is set as a strong influence region 31a, and a region other than the strong influence region 31a in the inspected region 31 is set. The non-strong influence area 31b is divided (S123).

  Next, the computer 13 determines the presence / absence of the foreign matter 84 based on the pixel density and the predetermined foreign matter detection threshold value 51 (see FIG. 11) with respect to the X-ray image 30 of the strong influence region divided in S123 ( S124), the foreign matter 84 based on the pixel density and the predetermined foreign matter detection threshold 52 (see FIG. 12) different from the foreign matter detection threshold 51 for the X-ray image 30 of the non-strongly affected area 31b divided in S123. Whether or not there is is determined (S125).

  Then, the computer 13 displays the determination results in S124 and S125 on the display 14 (S126), and ends the series of processes shown in FIG. That is, when the computer 13 determines that there is a foreign object 84 in at least one of S124 and S125, the computer 13 displays on the display 14 that there is a foreign object 84, and when it determines that there is no foreign object 84 in any of S124 and S125. The fact that there is no foreign object 84 is displayed on the display 14, and the series of processing shown in FIG.

  The computer 13 performs a series of processes shown in FIG. 10 each time a new inspection object 80 for detecting the foreign substance 84 is conveyed by the conveyance belt 90.

  Note that the strong influence area 31a and the non-strong influence area 31b divided in S123 shown in FIG. 10 are, for example, the first division threshold when the shape of the container 81 of the inspected object 80 is cylindrical as shown in FIG. When the appropriate first division threshold 41 and second division threshold 42 are set by the processing shown in FIG. 8 for the inspected object 80 for setting 41 and the second division threshold 42, When the inspection object 80 passes between the X-ray source 11 and the X-ray detector 12 as shown in FIG. 2, it becomes as shown in FIG. 7, and the inspection object 80 for detecting the foreign matter 84 becomes the X-ray source. When passing between 11 and the X-ray detector 12 as shown in FIG. 13, it becomes as shown in FIG.

  Further, the strong influence area 31a and the non-strong influence area 31b divided in S123 shown in FIG. 10 are, for example, a cylindrical shape as shown in FIG. When 80 is made into one lump as shown in FIG. 15, the process shown in FIG. 8 can be performed on the lump of four inspected objects 80 for setting the first division threshold 41 and the second division threshold 42. When the 1-division threshold 41 and the second-division threshold 42 are set, as shown in FIG. 16, the lump of four inspected objects 80 for detecting the foreign matter 84 is between the X-ray source 11 and the X-ray detector 12. When it passes through, it will be as shown in FIG.

As described above, the computer 13 divides the inspected object region 31 into a plurality of regions of the strong influence region 31a and the non-strong influence region 31b in S123 shown in FIG. 10, and the region dividing means 13b. Is configured. Further, the computer 13 determines the presence or absence of a foreign substance 84 with respect to the X-ray image 30 in the strong influence area 31a in S124 shown in FIG. 10, and also in the non-strong influence area 31b in S125 shown in FIG. The presence / absence of a foreign substance 84 is determined with respect to the X-ray image 30, and constitutes a foreign substance determination means 13c . Therefore, the X-ray foreign object detection device 10 determines the presence / absence of the foreign substance 84 for each area in the inspected object area 31 by processing for each area. (See FIGS. 2, 13, and 16) can also be inspected, and the reliability of the determination of the presence or absence of the foreign matter 84 can be improved as compared with the prior art. For example, as shown in FIGS. 2, 13, and 16, the X-ray foreign object detection device 10 is difficult to transmit the X-ray 11a due to the influence of the container 81, and an area 83 corresponding to the strong influence area 31a in the X-ray image 30. Even if the foreign matter 84 exists, the foreign matter 84 can be detected.

  The computer 13 determines the presence / absence of the foreign object 84 by simply comparing each pixel with the foreign object detection threshold 51 or the foreign object detection threshold 52, but more appropriately determines the presence / absence of the foreign object 84. Therefore, after the X-ray image 30 is subjected to a predetermined filter, the presence / absence of the foreign substance 84 may be determined based on a predetermined threshold for the filtered X-ray image 30. When the computer 13 determines the presence / absence of the foreign substance 84 with respect to the filtered X-ray image 30, the computer 13 applies the filter applied to the X-ray image 30 in the strong influence area 31a and the non-strong influence area 31b. The filter applied to the X-ray image 30 may be different.

Further, the computer 13 sets the second division threshold value 42 for dividing the strong influence area 31a and the non-strong influence area 31b in S109 shown in FIG. 8, and constitutes a division threshold setting means 13a. Yes. Further, the computer 13 divides the strong influence area 31a and the non-strong influence area 31b based on the pixel density distribution and the second division threshold value 42 in S123 shown in FIG. Therefore, the X-ray foreign object detection device 10 also applies the strong influence area 31a to the strong influence area 31a in which the influence of the container 81 in the inspection object 80 is assumed to be strong in the X-ray image 30 of the inspection object 80. The presence / absence of the foreign substance 84 can be detected in the same manner as in the non-strongly affected area 31b.

Further, the computer 13 is configured to display the strong influence area 31a on the X-ray image 30 on the display 14 in S105 shown in FIG. 8, and constitutes a display control means 13d . Further, the computer 13 is configured to set the second division threshold 42 designated by the user in S109 shown in FIG. Therefore, the X-ray foreign object detection device 10 can allow the user to specify the second division threshold value 42 while allowing the user to see the strong influence area 31a divided by the second division threshold value 42. The two-divided threshold value 42 can be easily set. In S105 shown in FIG. 8, the computer 13 superimposes the strong influence area 31a on the X-ray image 30 and displays it on the display 14, but instead of the strong influence area 31a, the non-strong influence area 31b is changed to an X-ray image. 30 may be displayed on the display 14, or both the strong influence area 31 a and the non-strong influence area 31 b may be displayed on the display 14 so as to overlap the X-ray image 30. .

  The computer 13 determines the density of the pixel having the highest density among the pixels having the same position in the transport direction of the inspection object 80 in the X-ray image 30 of the strong influence region 31a for each position in the transport direction of the inspection object 80. 11, that is, the graph as shown in FIG. 11 is displayed on the display 14, the foreign matter detection threshold for determining the presence or absence of the foreign matter 84 with respect to the X-ray image 30 of the strong influence region 31 a. 51 can be easily set by the user. Similarly, the computer 13 determines the density of the pixel having the highest density among the pixels having the same position in the conveyance direction of the inspection object 80 in the X-ray image 30 of the non-strongly affected area 31b in the conveyance direction of the inspection object 80. If the graph shown for each position, that is, the graph as shown in FIG. 12 is displayed on the display 14, it is possible to determine the presence or absence of the foreign substance 84 with respect to the X-ray image 30 of the non-strongly affected area 31b. The foreign object detection threshold 52 can be easily set by the user.

  Further, the computer 13 is configured such that the first division threshold 41 and the second division threshold 42 are set to “100” in advance as initial values before the start of the process shown in FIG. After the detection result is input, at least one of the first division threshold value 41 and the second division threshold value 42 may be automatically set before the processing shown in FIG. 8 is started. For example, when the detection result of the X-ray detector 12 is input to the computer 13, the X-ray image 30 as shown in FIG. 6 of the inspected object 80 for setting the first division threshold value 41 and the second division threshold value 42. The process shown in FIG. 8 may be started after the optimum first division threshold value 41 and the second division threshold value 42 are automatically set based on the pixel density distribution in FIG.

(Second Embodiment)
The configuration of the X-ray foreign object detection device according to the second embodiment is the same as that of the X-ray foreign object detection device 10 according to the first embodiment (see FIG. 1) except that the program recorded in the computer 13 is different. ), The same reference numerals as those of the X-ray foreign object detection apparatus 10 are used.

  An operation of the X-ray foreign object detection device according to the present embodiment will be described.

  First, an operation for setting the first division threshold 41 and the second division threshold 42 will be described.

  As shown in FIG. 18, the computer 13 executes the processing from S141 to S143 in the same manner as the processing from S101 to S103 shown in FIG. Next, the computer 13 selects a region of a pixel having a density equal to or higher than the current second division threshold value 42 of the inspected region 31 divided in S143 as a strong influence candidate region 33a (see FIG. 19). .) Is divided (S144), and the region of the divided strong influence candidate region 33a that is in contact with the boundary of the inspected region 31 is defined as a strong influence region 31a as shown in FIG. The area other than the influence area 31a is divided as the non-strong influence area 31b (S145). And the computer 13 performs the process from S146 to S151 similarly to the process from S105 to S110 shown in FIG. 8, and complete | finishes a series of processes shown in FIG.

  Next, an operation for detecting the presence or absence of the foreign substance 84 contained in the inspection object 80 will be described.

  As shown in FIG. 21, the computer 13 executes the processes of S161 and S162 in the same manner as the processes of S121 and S122 shown in FIG. Next, the computer 13 is a candidate for the strong influence region 31a in the pixel region 31 having the density equal to or higher than the second division threshold 42 set in advance by the processing shown in FIG. The strong influence candidate area 33a is divided (S163), and the area of the divided strong influence candidate area 33a that is in contact with the boundary of the inspected object area 31 is defined as the strong influence area 31a. The other areas are divided as non-strongly affected areas 31b (S164). Then, similarly to the processing from S124 to S126 shown in FIG. 10, the computer 13 executes the processing from S165 to S167, and ends the series of processing shown in FIG.

  As described above, the computer 13 of the X-ray foreign object detection device according to the present embodiment divides the strong influence candidate region 33a based on the pixel density distribution and the second division threshold value 42, and the object region 31 to be inspected. The strong influence candidate area 33a in contact with the boundary is divided into strong influence areas 31a. Therefore, the X-ray foreign material detection apparatus according to the present embodiment reduces the possibility that the region corresponding to the foreign material 84 in the X-ray image 30 of the object 80 is erroneously included in the strong influence region 31a. be able to.

  As described above, the X-ray foreign object detection apparatus according to the present invention can inspect even a region where the presence or absence of a foreign object could not be inspected, and improves the reliability of the determination of the presence or absence of a foreign object. It is useful as an X-ray foreign matter detection device or the like installed on a production line for food or the like.

The block diagram of the X-ray foreign material detection apparatus which concerns on the 1st Embodiment of this invention (A) Front view of the X-ray source and X-ray detector of the X-ray foreign object detection device shown in FIG. 1 (b) X-ray source and X-ray detection shown in FIG. 2 (a) in the situation shown in FIG. 2 (a) Side view The figure which shows the image displayed on the display of the X-ray foreign material detection apparatus shown in FIG. (A) Top view of the test object shown in FIG. 2 (b) Side view of the test object shown in FIG. The figure which shows the to-be-inspected object area | region of the X-ray image produced | generated by the X-ray foreign material detection apparatus shown in FIG. The figure which shows the density distribution of the pixel in the X-ray image produced | generated by the X-ray foreign material detection apparatus shown in FIG. The figure which shows the strong influence area | region and non-strong influence area | region of to-be-inspected object area | region of the X-ray image produced | generated by the X-ray foreign material detection apparatus shown in FIG. A flowchart of the operation of the X-ray foreign object detection device shown in FIG. 1 when the division threshold is set by the user. The figure which shows the image displayed on the display of the X-ray foreign material detection apparatus shown in FIG. 1 when a division | segmentation threshold value is set by the user. A flowchart of the operation of the X-ray foreign matter detection apparatus shown in FIG. 1 when detecting the presence or absence of foreign matter contained in the object to be inspected. The density of the pixel having the highest density in the X-ray image of the strong influence region divided by the X-ray foreign substance detection apparatus shown in FIG. Diagram showing graphs for each position In the X-ray image of the non-strongly affected area divided by the X-ray foreign matter detection apparatus shown in FIG. 1, the density of the pixel having the highest density among the pixels having the same position in the transport direction of the test object is determined as the transport direction of the test object. The figure which shows the graph which represents every position in (A) Front view of the X-ray source and X-ray detector of the X-ray foreign object detection device shown in FIG. 1 when the object shown in FIG. 2 is conveyed in a situation different from the situation shown in FIG. Side view of the X-ray source and X-ray detector shown in FIG. 13A in the situation shown in FIG. The figure which shows the strong influence area | region and non-strong influence area | region divided | segmented by the X-ray foreign material detection apparatus shown in FIG. 1 when a to-be-inspected object is conveyed in the condition shown in FIG. (A) Top view of the lump of the test object shown in FIG. 4 (b) Side view of the lump shown in FIG. 15 (a) (A) Front view of the X-ray source and X-ray detector of the X-ray foreign object detection device shown in FIG. 1 when the lump shown in FIG. 15 is conveyed (b) FIG. 16 (16) in the situation shown in FIG. Side view of X-ray source and X-ray detector shown in a) The figure which shows the strong influence area | region and non-strong influence area | region divided | segmented by the X-ray foreign material detection apparatus shown in FIG. 1 when the lump shown in FIG. 15 is conveyed in the situation shown in FIG. A flowchart of the operation of the X-ray foreign object detection device according to the second embodiment of the present invention when the division threshold is set by the user. The figure which shows the strong influence candidate area | region divided | segmented by the X-ray foreign material detection apparatus which concerns on the 2nd Embodiment of this invention. The figure which shows the strong influence area | region and non-strong influence area | region divided | segmented by the X-ray foreign material detection apparatus which concerns on the 2nd Embodiment of this invention. Flowchart of the operation of the X-ray foreign matter detection apparatus according to the second embodiment of the present invention when detecting the presence or absence of foreign matter contained in the object to be inspected. (A) Front view of X-ray source and X-ray detector of conventional X-ray foreign object detection device (b) In the situation shown in FIG. 22 (a), the X-ray source and X-ray detector shown in FIG. Side view The figure which shows the X-ray image produced | generated by the X-ray foreign material detection apparatus shown in FIG.

Explanation of symbols

10 X-ray foreign matter detection device 13 Computer (area division means, foreign matter judgment means, division threshold setting means, display control means)
14 Display (display means)
30 X-ray image 31 Area to be inspected 31a Strongly affected area (area)
31b Non-strong influence area (area)
33a Strongly affected candidate area 42 Second division threshold (division threshold)
80 inspected object 81 container (part of the inspected object)
84 Foreign matter

Claims (4)

The X-ray image (30) generated based on the X-ray dose transmitted through the object (80) in which the contents (82) are housed and transported in the container (81) is processed and included in the object. In the X-ray foreign object detection device (10) for detecting the presence or absence of a foreign object (84)
Depending on the density of each pixel of the X-ray image, the X-ray image is applied to the strong influence area (31a) and the non-strong influence area (31b) other than the strong influence area, which are assumed to be strongly influenced by the container. A division threshold setting means (13a) for setting a division threshold (42) for dividing;
An object region (31) assumed to correspond to the object to be inspected in the X-ray image generated corresponding to each object to be inspected is provided for each object to be inspected. Area dividing means (13b) for dividing the pixel by comparing the density of each pixel with the division threshold;
A foreign matter judgment means (13c) for judging the presence or absence of the foreign matter by processing for each area of the X-ray image for each area divided by the density of each pixel of the X-ray image by the area dividing means; equipped with a,
The X-ray foreign matter detection apparatus , wherein the foreign matter determination means determines the presence or absence of the foreign matter by applying a different filter to each of the regions divided by the region division means . The region dividing unit divides the strong influence candidate region (33a) that is a candidate for the strong influence region based on the density of each pixel of the X-ray image and the division threshold set by the division threshold setting unit, The X-ray foreign object detection apparatus according to claim 1, wherein the strong influence candidate area in contact with a boundary of the inspection object area is divided as the strong influence area . Display means (14) for displaying an image, and display control means (13d) for displaying on the display means at least one of the strong influence area and the non-strong influence area on the X-ray image,
The dividing threshold setting means, X-rays foreign object detection apparatus according to claim 1 or 2, characterized in that to set the division threshold specified by the user. The density of the pixel having the highest density among the pixels having the same position in the transport direction of the object to be inspected in the X-ray image of the strong influence area is displayed for each position. Display control means (13d) for causing the display means to display at least one of the graph and the density of the pixel having the highest density among the pixels having the same position in the X-ray image of the non-strongly affected area for each position. ) and X-ray foreign material detecting apparatus according to claim 1 or 2, further comprising a.