JP4592905B2

JP4592905B2 - Slit lamp microscope

Info

Publication number: JP4592905B2
Application number: JP2000294851A
Authority: JP
Inventors: 正喜大野; 忠志岡本
Original assignee: Topcon Corp
Current assignee: Topcon Corp
Priority date: 2000-09-27
Filing date: 2000-09-27
Publication date: 2010-12-08
Anticipated expiration: 2020-09-27
Also published as: JP2002102173A

Description

【０００１】
【発明の属する技術分野】
本発明は、細隙灯顕微鏡に関し、より詳しくは、被検眼の特定の観察部位の細隙像はもちろん、観察部位の周辺部をも同時に明瞭に観察可能な細隙灯顕微鏡に関する。
【０００２】
【従来の技術】
眼科分野で使用される眼科装置一種として、細隙灯顕微鏡がある。これは眼科医の日常の診察において使用されるもので、被検眼への照明方法を工夫することで被検眼の種々の病変部を観察可能とするものである。
【０００３】
この細隙灯顕微鏡は、図１４に概念的に示すように、光源２０１からの光を細隙状の光（スリット光）にして被検眼Ｅの角膜Ｅｄに照射し、角膜Ｅｄを光切断の状態にして、この光切断された角膜部分からの反射光を対物レンズ２０２を介して図示しない観察光学系、画像処理系に取り込み、図１５に示すように画像モニタ２０３の画面に角膜断面像Ｅｄ´を表示するものである。
【０００４】
この細隙灯顕微鏡は、チンダル現象を利用することで、被検眼Ｅのわずかな病変部を観察することができる（糸井素一、金上貞夫著「スリットランプ」ｐ２５，Ｆｉｇ３４メディカル葵出版参照）。
【０００５】
しかし、このような従来の細隙灯顕微鏡の場合、例えば角膜断面像Ｅｄ´のみを明瞭に観察できるものの、角膜断面以外の周辺の組織（強膜、虹彩等）は全く観察することはできない。これは、角膜をスリット状の照明光により照明するので照明野が極めて狭く、角膜断面以外の周辺領域は真っ暗（図１５においてクロス斜線で示す）となって画像化することが困難である。
【０００６】
しかし、被検眼Ｅのある特定部位の周辺の外観や組織状態も画像化し、被検眼全体に亘って病変部の位置、大きさが分かるようになれば、適切な診断ができるようになることから、ある特定部位の周辺の外観や組織状態をも観察可能とすることが要請される。このようにすれば、術者以外の第三者（患者やその家族、学会や雑誌等の関係者等）への病変部の説明が容易になる利点もある。
【０００７】
被検眼Ｅの特定部位の周辺領域へ背景照明光を照射する細隙灯顕微鏡の従来例について図１６を参照して説明する。
【０００８】
図１６に示す従来の細隙灯顕微鏡１００は、テーブル１０２上に移動機構部１０３を介して水平横方向及び水平縦方向に移動可能に支持された基台１０４と、傾倒操作により基台１０４を水平横方向及び水平縦方向に変位させる操作ハンドル１０５と、前記基台１０４により支持された顕微鏡系（観察光学系）１０６、前記基台１０４に対して支持枠１１３を介して支持されるとともに光源や細隙を内蔵し、支持枠１１３の所定の位置に設けたミラー１１２を介して被検眼Ｅに細隙状の照明光を照射する照明系１０８と、前記顕微鏡系１０６の対物レンズを収納した鏡筒本体１０９に対峙させた被検者用の顎受部１１０ａ、額当て１１０ｂを有する顎受け台１１０とを具備している。
【０００９】
前記鏡筒本体１０９の側面には、観察倍率変倍用の回転軸を突設し、この回転軸に対して外周に顕微鏡系１０６の観察倍率を示す６，１０，１６，２５，４０等の数字を付した操作ノブ１１１を装着している。
【００１０】
前記照明系１０８の筐体部には、この照明系１０８が発光する照明光の一部を利用する手動操作型のライトガイド１２０が取り付けられ、このライトガイド１２０の先端から前記被検眼Ｅに向けて背景照明光を照射するようになっている。図１６中、１３０は前記鏡筒本体１０９に取り付けた例えばビデオカメラのよううな撮像装置である。
【００１１】
前記顎受け台１１０には、図１７に示すように、その両側端１１０ｃ、１１０ｄに、嵌合状態で同一寸法の一対の装着受部１４１ａ、１４１ｂを設けている。そして、装着受部１４１ａに、固視標支持部材１５０を装着すようになっている。固視標支持部材１５０は、装着受部１４１ａに挿入する挿入部１５１と、第１の回転可能な継手部１５２と、この第１の回転可能な継手部１５２により回転可能に支持した第１アーム１５３と、第１アーム１５３の端部に取り付けた第２の回転可能な継手部１５４と、この第２の回転可能な継手部１５４により回転可能に支持した第２アーム１５５とを備え、この第２のアーム１５５の先端部に固視標１５６を取り付ける構造となっている。
【００１２】
このような顎受け台１１０に対して、図１８に示すように、顎受け台１１０の上部を支軸として被検者の顔の前方の領域を回動可能な回動部材１６０を配置し、この回動部材１６０における被検眼Ｅの近傍を占める位置に背景照明用のＬＥＤ１６１を取り付けた構造のものも知られている。
【００１３】
また、図１９に示すように、前記顎受け台１１０の側端１１０ａ（又は側端１１０ｂ）に対して、取り付け具１７１、第１アーム１７２、継手１７３、第２アーム１７４を介して背景照明用のＬＥＤ１７５を取り付けた構造のものも知られている。
【００１４】
【発明が解決しようとする課題】
しかしながら、図１６に示す従来の細隙灯顕微鏡１００の場合、前記ライトガイド１２０からの背景照明光の光源は前記照明系１０８の光源と共通であるため、被検眼Ｅに対する細隙状の照明光の光量調製を行うと、これに連動して背景照明光の光量も変化してしまい、背景照明光のみの光量調整はできないという問題がある。このことは、被検眼Ｅの視覚観察やビデオカメラによる撮像、スチールカメラによる撮影等、多角的に被検眼Ｅの観察、記録を行う各々の場合に、被検眼Ｅの特定部位に関する背景照明の最適化が困難であることを意味する。
【００１５】
また、図１６に示す従来の細隙灯顕微鏡１００の場合、前記ライトガイド１２０の先端部近傍に、光量調整用の複数の穴の空いた遮光部材を設け、穴の位置を切り換えることで前記背景照明光の光量調整を行うように構成している。
【００１６】
しかし、このような構成では、光量調整を行う都度検者が遮光部材を操作するために指をライトガイド１２０の先端部近傍の遮光部材に触らなければならず、このため、被検者に煩雑感を与え、また、細隙灯顕微鏡１００による被検眼Ｅの観察時の操作性を低下させるという問題がある。
【００１７】
一方、前記照明系１０８とは全く別途に図１８に示すような背景照明用のＬＥＤ１６１を設けたり、図１９に示すように各種機構部品を介して背景照明用のＬＥＤ１７５を取り付けた構造の場合、電源部、光源の付加が必要で細隙灯顕微鏡１００の全体構成の大型化、複雑化を招いてしまう。さらに、電源部、光源は前記テーブル１０２外の床上等に設置しなければならず、このため配線器具が増えたり、配線材の引き回し距離が長くなってしまい、細隙灯顕微鏡１００の可動部分のいずれかの箇所に接触する等、細隙灯顕微鏡１００自体の操作性を低下させてしまうという問題も生じる。
【００１８】
そこで、本発明は、従来例のようなライトガイドや配線材等を不要とし、省スペース化を図りつつ良好な操作性を得ることができ、しかも、被検眼の視覚観察やビデオカメラによる撮像、スチールカメラによる撮影等、多角的に被検眼の観察、記録を行う場合に、各々特定部位に対する最適な背景照明を得ることができる細隙灯顕微鏡を提供するものである。
【００１９】
【課題を解決するための手段】
請求項１記載の発明に係る細隙灯顕微鏡は、照明系により被検眼に細隙状の照明光を照射し、被検眼における細隙状の照明光の照射部位からの反射光を顕微鏡系にて観察する細隙灯顕微鏡において、前記顕微鏡系を構成する対物レンズの周りの鏡筒端面に、前記細隙状の照明光の照射野周辺への背景照明光を照射する発光素子群を配置したことを特徴とするものである。
【００２０】
この発明によれば、前記照明系により被検眼に細隙状の照明光を照射して被検眼の特定部位を観察できるとともに、顕微鏡系を構成する対物レンズの周りの鏡筒端面に前記細隙状の照明光の照射野周辺への背景照明光を照射する発光素子群を配置したものであるから、被検眼の特定部位については、前記細隙状の照明光に基づき明瞭な画像を得て観察し、記録可能となるとともに、その周辺部についても前記発光素子群からの背景照明光に基づき被検眼の特定部位とともに明瞭に観察し、記録することが可能となる。
【００２１】
請求項２記載の発明に係る細隙灯顕微鏡は、被検眼に対する位置を変位可能に配置した照明系により被検眼に細隙状の照明光を照射し、被検眼における細隙状の照明光の照射部位からの反射光を前記被検眼に対する位置を変位可能に配置した顕微鏡系にて観察する細隙灯顕微鏡において、前記顕微鏡系を構成する対物レンズの周りの鏡筒端面に周回配列され、前記細隙状の照明光の照射野周辺への背景照明光を照射する発光素子群と、前記被検眼に対する対物レンズの位置関係に応じて、前記対物レンズの周りの発光素子群のうちの点灯する発光素子の位置及び個数を調整する点灯調整手段とを有することを特徴とするものである。
【００２２】
この発明によれば、前記照明系により被検眼に細隙状の照明光を照射して被検眼の特定部位を観察できるとともに、顕微鏡系を構成する対物レンズの周りの鏡筒端面に前記細隙状の照明光の照射野周辺への背景照明光を照射する発光素子群を配置し、点灯調整手段により、前記被検眼に対する対物レンズの位置関係に応じて、前記対物レンズの周りの発光素子群のうちの点灯する発光素子の位置及び個数を調整するものである。
【００２３】
従って、被検眼の特定部位については、前記細隙状の照明光に基づき明瞭な画像を得て観察し、記録可能となるとともに、その周辺部に対しても前記発光素子群のうちの点灯する発光素子の位置及び個数を前記点灯調整手段により調整することで、前記被検眼に対する対物レンズの位置関係に応じた最適の背景照明光を照射でき、前記被検眼の特定部位とともにその周辺領域を明瞭に観察し、記録することが可能となる。
【００２４】
請求項３記載の発明に係る細隙灯顕微鏡は、被検眼に対する位置を変位可能に配置した照明系により被検眼に細隙状の照明光を照射し、被検眼における細隙状の照明光の照射部位からの反射光を前記被検眼に対する位置を変位可能に配置した顕微鏡系にて観察する細隙灯顕微鏡において、前記顕微鏡系を構成する対物レンズの周りの鏡筒端面に周回配列され、前記細隙状の照明光の照射野周辺への背景照明光を照射する発光素子群と、前記被検眼に対する対物レンズの位置関係に応じて、前記対物レンズの周りの発光素子群のうちの点灯する発光素子の位置及び個数を調整する点灯調整手段と、前記対物レンズの周りの発光素子群からの背景照明光の照度を調整する調光手段とを有することを特徴とするものである。
【００２５】
この発明によれば、請求項２記載の発明の構成に加えて、前記対物レンズの周りの発光素子群からの背景照明光の照度を調整する調光手段を設けているので、被検眼の特定部位については、前記細隙状の照明光に基づき明瞭な画像を得て観察し、記録可能となるとともに、その周辺部に対しても前記発光素子群のうちの点灯する発光素子の位置及び個数を前記点灯調整手段により調整することで、前記被検眼に対する対物レンズの位置関係に応じた最適の背景照明光を照射でき、前記被検眼の特定部位とともにその周辺領域を明瞭に観察し、記録することが可能となる。
【００２６】
さらに、前記点灯調整手段による点灯動作する発光素子の位置及び個数の調整と、調光手段による背景照明光の照度調整とを組み合わせることにより、被検眼の視覚観察やビデオカメラによる撮像、スチールカメラによる撮影等、多角的に被検眼の特定部位の観察、記録を行う場合に、各々最適な背景照明を得ることが可能となる。
【００２７】
請求項４記載の発明に係る細隙灯顕微鏡は、支持枠により被検眼に対する位置を変位可能に支持された照明系により被検眼に細隙状の照明光を照射し、被検眼における細隙状の照明光の照射部位からの反射光を前記被検眼に対する位置を変位可能に配置した顕微鏡系にて観察する細隙灯顕微鏡において、前記支持枠における前記被検眼に対向する領域に、前記被検眼へ照射する細隙状の照明光の照射野周辺への背景照明光を照射する発光素子群を配置したことを特徴とするものである。
【００２８】
この発明によれば、前記照明系により被検眼に細隙状の照明光を照射して被検眼の特定部位を観察できるとともに、照明系を支持する支持枠における前記被検眼に対向する領域に配置した発光素子群から、前記被検眼へ背景照明光を照射することにより、前記細隙状の照明光に基づく特定部位の周辺領域についても、明瞭に観察し、記録することが可能となる。
【００２９】
【発明の実施の形態】
以下に、本発明の実施の形態を説明する。
【００３０】
図１に示す本実施の形態の細隙灯顕微鏡１は、テーブル２上に移動機構部３を介して水平横方向及び水平縦方向に移動可能に支持された基台４と、傾倒操作により基台４を水平横方向及び水平縦方向に変位させる操作ハンドル５と、前記基台４により被検眼Ｅに対して水平方向に回動変位可能に支持された顕微鏡系６、前記基台４に対して支持枠１５を介して被検眼Ｅに対して水平方向に回動変位可能に支持されるとともに、光源や細隙状の照明光を形成する細隙を内蔵し、さらに細隙状の照明光の反射用のミラー１２を搭載した照明系８と、前記顕微鏡系６の対物レンズ３１を収納した鏡筒本体９に対峙させた被検者用の顎受部１０ａ、額当て１０ｂを有する顎受け台１０とを具備している。
【００３１】
前記鏡筒本体９の側面には、観察倍率変倍用の回転軸を突設し、この回転軸に対して外周に顕微鏡系６の観察倍率を示す６，１０，１６，２５，４０等の数字を付した操作ノブ１１を装着するようになっている。
【００３２】
前記鏡筒本体９における対物レンズ３１側の端面９ｂには、図２、図３に示すように、対物レンズ３１の回りを周回する配列で発光素子群、即ち、合計１６個の発光素子（例えば白色ＬＥＤ）Ｌ1 乃至Ｌ16が各々の発光面が前記顎受け台１０側、即ち、被検眼Ｅ側を向くようにして埋設され、これにより従来例のようなライトガイドを採用する場合に比べ省スペース化が図られている。
【００３３】
図４は、本実施の形態の細隙灯顕微鏡１の光学構成の概略を示すものであり、この細隙灯顕微鏡１は、鏡筒本体９に収納した顕微鏡系６と、鏡筒本体９に取り付けた例えばビデオカメラのような撮像カメラ４３を使用した撮像装置２０と、顕微鏡系６に対し、被検眼Ｅに対峙させるミラー１２に関して直交配置とした前記照明系８とを有している。顕微鏡系６は、対物レンズ３１と、変倍光学系３２と、集光レンズ３３と、ビームスプリッタ３４と、リレーレンズ３５と、光路を接眼鏡筒９ａ側に変更するプリズム３６と、接眼鏡筒９ａに配置した接眼レンズ３７とを具備し、被検眼Ｅの像を図４に示す結像点ｐに結像し検者眼Ｅ0 により観察可能とするようになっている。
【００３４】
前記撮像装置２０は、前記ビームスプリッタ３４により分岐される光束を集光する集光レンズ４１と、この集光レンズ４１からの光束を９０度直角に曲げるミラー４２と、撮像カメラ４３とを有している。
【００３５】
前記照明系８は、ハロゲンランプ等の光源５１と、この光源５１からの光を集光する集光レンズ５３と、この集光レンズ５３を通過した光の一部のみを通過させる細隙（スリット）５４と、細隙５４を通過し細隙状の照明光を集光する集光レンズ５５とを有し、細隙状の照明光を前記ミラー１２で反射させ、被検眼Ｅの特定部位に照射するように構成している。
【００３６】
前記細隙５４と被検眼Ｅとは、集光レンズ５５に対して共役の位置になるように配置され、これにより、前記ミラー１２を介して被検眼Ｅの例えば角膜に対し、細隙状の照明光を照射し、被検眼Ｅの角膜断面像を前記顕微鏡系６により観察可能としている。
【００３７】
また、前記対物レンズ３１の回りに配置した発光素子Ｌ1 乃至Ｌ16により被検眼Ｅに向けて背景照明光が照射される。
【００３８】
図５は、前記細隙灯顕微鏡１の制御系の主要部を示すものであり、前記光源５１の点灯制御を含む全体の動作制御を行う制御部８１と、前記撮像カメラ４３からの画像信号を取り込む画像制御部８２と、この画像制御部８２に接続した液晶ディスプレイ等の画像モニタ８３と、画像制御部８２に接続した記憶手段である画像メモリ８４と、前記細隙灯顕微鏡１全体の動作に必要な電力を供給する電源部８５と、以下に詳細を説明する発光素子Ｌ1 乃至Ｌ16用の点灯調整手段及び調光手段を構成する操作パネル９０とを有している。
【００３９】
この操作パネル９０の一端側には、図６に示すように、中央部に前記発光素子Ｌ1 乃至Ｌ16の全てを点灯させるためのスイッチＳ1 を配置するとともに、このスイッチＳ1 の回りに８個のスイッチＳ2 乃至Ｓ9 を円形配列し、合計９個のスイッチ構成からなる点灯調整手段を設けている。
【００４０】
また、操作パネル９０の他端側には、図６に示すように、前記発光素子Ｌ1 乃至Ｌ16用の調光釦（光量増加用）９１ａ、調光釦（光量減少用）９１ｂからなる調光スイッチ部と、発光素子Ｌ1 乃至Ｌ16の光量（背景照明光による被検眼Ｅの照射領域の照度）をバー形式表示で可視的に表示する光量レベル表示部９２とからなる調光手段を設けている。
【００４１】
図７は前記合計９個のスイッチＳ1 乃至Ｓ9 と、前記発光素子Ｌ1 乃至Ｌ16との点灯位置及び個数の対応表を示すものである。
【００４２】
図７から明らかなように、点灯調整手段は、例えばスイッチＳ1 の操作により発光素子Ｌ1 乃至Ｌ16の全てを点灯させ、スイッチＳ2 の操作により対物レンズ上側の５個の発光素子Ｌ1 乃至Ｌ5 を点灯させ、スイッチＳ4 の操作により対物レンズ左側の５個の発光素子Ｌ5 乃至Ｌ9 を点灯させ、スイッチＳ6 の操作により対物レンズ下側の５個の発光素子Ｌ5 乃至Ｌ9 を点灯させ、スイッチＳ8 の操作により対物レンズ右側の５個の発光素子Ｌ13乃至Ｌ1 を点灯させるというように、合計９個のスイッチ構成により被検眼Ｅに対する前記発光素子Ｌ1 乃至Ｌ16の点灯位置及び個数を任意に調整し、被検眼Ｅに照射する背景照明光の最適化が可能となっている。
【００４３】
次に、上述した構成の細隙灯顕微鏡１の動作を図８乃至図９をも参照して説明する。
【００４４】
前記照明系８の光源５１から発光した光は、集光レンズ５３を介して細隙５４を照射する。細隙５４と被検眼Ｅとは共役に配置されているので、細隙５４を通過して形成された細隙状の照明光は集光レンズ５５、ミラー１２を経て例えば図８に示すように被検眼Ｅの角膜断面（図８に斜線を付して示す）Ｅｄに照射される。
【００４５】
この場合、点灯調整手段においては、例えばスイッチＳ1 の操作により、被検眼Ｅに正面から対峙させている対物レンズ３１の回りの発光素子Ｌ1 乃至Ｌ16の全てを点灯させ、発光素子Ｌ1 乃至Ｌ16からの背景照明光を被検眼Ｅの角膜断面Ｅｄの周辺部に照射する。これにより被検眼Ｅの全体（主に周辺部分：虹彩等）が照明されることになる。
【００４６】
このようにして、被検眼Ｅに照射され、被検眼Ｅの角膜断面Ｅｄで反射した光及び被検眼Ｅの全体で反射した光束は、前記顕微鏡系６の対物レンズ３１に入射し、さらに、ビームスプリッタ３４を経てその一部が図４に示す結像点ｐに結像し、検者眼Ｅ0 により観察されることになる。
【００４７】
また、ビームスプリッタ３４によりにより分岐される光束は前記ミラー４２を経て撮像カメラ４３に入射し、これにより、検者眼Ｅ0 の観察像と同一の観察像が撮像カメラ４３により撮像され、前記画像制御部８２の制御の基に画像モニタ８３に送られて表示される。
【００４８】
この観察像、即ち、細隙状の照明光による角膜断面像Ｅｄ´は、図１１に示すように、良好なコントラストを維持した状態で観察でき、同時に被検眼Ｅにおける虹彩等を含む全体像Ｅ´をも明瞭に観察できるので、被検眼Ｅの全体像を把握しながら病変部等を観察することが可能となる。
【００４９】
また、本実施の形態によれば、前記発光素子Ｌ1 乃至Ｌ16が各々の発光面が前記顎受け台１０側、即ち、被検眼Ｅ側を向くようにして顕微鏡系６の対物レンズ３１の回りに埋設されているので、省スペース化が可能であり、また、従来例のようなライトガイドを採用する場合に比べ、検者が背景照明の調整のために被検眼Ｅの近傍に手を伸ばす必要もなく、操作性の向上を図れる。
【００５０】
また、上述した場合において、前記調光手段における調光釦９１ａ又は調光釦９１ｂを操作し、発光素子Ｌ1 乃至Ｌ16からの背景照明光を適宜調整することにより、検者眼Ｅ0 より観察する観察像の明るさを調整したり、撮像カメラ４３により撮像する観察像の明るさを調整したり、さらには、撮像カメラ４３の代わりにスチールカメラで被検眼Ｅを撮影する場合の被検眼像の明るさを調整したりすることができる。
【００５１】
図９は細隙状の照明光を被検眼Ｅの正面から照射し、対物レンズ３１を被検眼Ｅの上方から見て水平方向右側に配置した状態で発光素子群からの背景照明光を被検眼Ｅに向けて照射する場合を示すものである。
【００５２】
この場合には、点灯調整手段においては、前記スイッチＳ8 の操作により、被検眼Ｅに対峙させている対物レンズ３１の右側の５個の発光素子Ｌ13乃至Ｌ1 を点灯させ、発光素子Ｌ13乃至Ｌ1 からの背景照明光を前記細隙状の照明光の周辺部に照射する。これにより被検眼Ｅの特定部位を上方から見て水平方向右側から観察する場合においても、背景照明光が最適化され、被検眼Ｅの全体像を把握しながら病変部等を観察することが可能となる。
【００５３】
図１０は細隙状の照明光を被検眼Ｅの正面から照射し、対物レンズ３１を被検眼Ｅの上方から見て水平方向左側に配置した状態で発光素子群からの背景照明光を被検眼Ｅに向けて照射する場合を示すものである。
【００５４】
この場合には、点灯調整手段においては、前記スイッチＳ4 の操作により、被検眼Ｅに対峙させている対物レンズ３１の左側の５個の発光素子Ｌ5 乃至Ｌ9 を点灯させ、発光素子Ｌ5 乃至Ｌ9 からの背景照明光を前記細隙状の照明光の周辺部に照射する。これにより被検眼Ｅの特定部位を上方から見て水平方向左側から観察する場合においても、背景照明光が最適化され、被検眼Ｅの全体像を把握しながら病変部等を観察することが可能となる。
【００５５】
尚、図９、図１０に示す場合においても、前記調光手段における調光釦９１ａ又は調光釦９１ｂの操作を組み合わせ、検者眼Ｅ0 より観察する観察像の明るさを調整したり、撮像カメラ４３により撮像する観察像の明るさを調整したり、さらには、撮像カメラ４３の代わりにスチールカメラで被検眼Ｅを撮影する場合の被検眼像の明るさを調整したりすることも勿論可能である。
【００５６】
図１２は本発明の実施の形態の変形例を示すものであり、対物レンズ３１の回りに発光素子群を配置する代わりに、前記基台４上の照明系８を支持する支持枠１５における前記被検眼Ｅに対向する左右両片１５ａ、１５ｂに、前記被検眼Ｅへ照射する細隙状の照明光の照射野周辺への背景照明光を照射する例えば８個の発光素子Ｌ21乃至Ｌ28からなる発光素子群を垂直配列に設け、これら発光素子Ｌ21乃至Ｌ28を記述した場合と同様に点灯制御するように構成したものである。
【００５７】
このような支持枠１５に発光素子群を設けた構成によっても、被検眼Ｅに対する背景照明光が最適化され、被検眼Ｅの全体像を把握しながら病変部等を観察することが可能となる。
【００５８】
図１３は、本発明の実施の形態のさらに別の変形例の顎受け台１０、固視標支持部材２３ａ、ＬＥＤ支持部材２３ｂの配置を示す分解図である。
【００５９】
前記顎受け台１０の両側端１０ｃ、１０ｄには、図１３に示すように、嵌合状態で同一寸法の装着受部２１ａ、２１ｂを設けている。
【００６０】
また、ＬＥＤを用いた固視標２２を支持する固視標支持部材２３ａと、前記固視標支持部材２３ａと略同一構成からなり背景照明用のＬＥＤ２４を支持するＬＥＤ支持部材２３ｂとを、前記各装着受部２１ａ、２１ｂに各々着脱可能に、かつ、相互に交換可能に配置している。
【００６１】
背景照明用にＬＥＤ２４を用いているが、これは、最近高輝度の白色ＬＥＤがで実用化されたこと、大きさも小さく、しかも安価であることによるものである。前記固視標支持部材２３ａは、装着受部２１ａ、２１ｂに挿入する挿入部２５と、第１の回転可能な継手部２６と、この第１の回転可能な継手部２６により回転可能に支持した第１アーム２７と、第１アーム２７の端部に取り付けた第２の回転可能な継手部２８と、この第２の回転可能な継手部２８により回転可能に支持した第２アーム２９とを備え、この第２のアーム２９の先端部に固視標２２を取り付けている。
【００６２】
前記ＬＥＤ支持部材２３ｂは、前記第２のアーム２９の先端部に、前記固視標２２の替わりに背景照明用のＬＥＤ２４を取り付ける他は、前記固視標支持部材２３ａと同様の構成になっている。
【００６３】
上述した構成を備えた細隙灯顕微鏡１によれば、顎受け台１０の両側端１０ｃ、１０ｄに設けた一対の同様な構成の装着受部２１ａ、２１ｂに対し、固視標２２を支持する固視標支持部材２３ａと、背景照明用のＬＥＤ２４を支持するＬＥＤ支持部材２３ｂとを各々装着して、前記固視標２２による検眼を行なうことはもちろんのこと、被検眼Ｅのスリット観察時に前記ＬＥＤ２４による背景照明光の照射を容易に行なうことが可能となる。
【００６４】
さらに、前記固視標支持部材２３ａ、ＬＥＤ支持部材２３ｂは、適宜装着受部２１ａ、２１ｂから取り外るせるので、顎受け台１０に被検者の顔があるとき等に邪魔にならず、また、周辺領域を整然とすることができる。
【００６５】
また、取り外した固視標支持部材２３ａの替わりに、別のＬＥＤ支持部材２３ｂを装着受部２１ａに取り付けることができ、この場合には、被検眼Ｅの左右両方向からの背景照明を実現でき、より影のない良好な被検眼の背景像を得ることができる。
【００６６】
さらにまた、前記固視標２２と背景照明用のＬＥＤ２４とを同一の支持部材により支持し、切り替えスイッチにより交互に切り替える構造のものでも良い。
【００６７】
このような図１３に示す構成によれば、顎受け台１０に設けた一対の同一の構成の装着部２１ａ、２１ｂに対し、固視標２２を支持する固視標支持部材２３ａと、被検眼Ｅのスリット観察時の背景照明用のＬＥＤ２４を支持するＬＥＤ支持部材２３ｂとを各々装着して、固視標２４による被検眼Ｅの誘導と、前記ＬＥＤ２４による披検眼Ｅのスリット観察の背景照明とを各々容易に行なうことができる。また、被検眼Ｅの検査時の操作性の向上、金物部品、電気部品の削減及び共通化による構成の簡素化を図ることができる。
【００６８】
さらに、固視標支持部材２３ａ、ＬＥＤ支持部材２３ｂとは寸法的に共通化され、しかも、固視標２２のＬＥＤ、前記ＬＥＤ２４の点灯用の電力は、細隙灯顕微鏡１の主電源から共通に得ることができるので、別電源の必要性はなく構造の簡略化が図れる。
【００６９】
【発明の効果】
本発明によれば、省スペース化を図りつつ良好な操作性を得ることができ、しかも、被検眼を多角的に被検眼の観察、記録を行う場合に、各々特定部位に対する最適な背景照明を得て、被検眼の特定部位、周辺部ともに明瞭に観察し、記録することが可能な細隙灯顕微鏡を提供することができる。
【００７０】
また、本発明によれば、被検眼に対する対物レンズの位置関係に応じた最適の背景照明光を照射でき、異なる角度から被検眼の特定部位を観察する場合においてもその周辺領域を明瞭に観察し、記録することが可能な細隙灯顕微鏡を提供することができる。
【００７１】
さらに本発明によれば、照明系を支持する支持枠における被検眼に対向する領域に発光素子群を配置した構成で省スペース化を図りつつ良好な操作性の基に被検眼の特定部位、周辺部ともに明瞭に観察し、記録することが可能な細隙灯顕微鏡を提供することができる。
【図面の簡単な説明】
【図１】本発明の実施の形態１の細隙灯顕微鏡の外観を示す側面図である。
【図２】本発明の実施の形態１の細隙灯顕微鏡の顕微鏡系及び顎受け台の部分斜視図である。
【図３】本発明の実施の形態１の顕微鏡系の顕微鏡鏡筒端面の発光素子群を示す説明図である。
【図４】本発明の実施の形態１の細隙灯顕微鏡の光学系の主要部を示す概略図である。
【図５】本発明の実施の形態１の細隙灯顕微鏡の制御系の主要部を示すブロック図である。
【図６】本発明の実施の形態１の細隙灯顕微鏡の操作パネルを示す平面図である。
【図７】本発明の実施の形態１のスイッチと発光素子群との点灯対応表である。
【図８】本発明の実施の形態１の被検眼に対する細隙状の照明光と背景照明光の照射状態を示す説明図である。
【図９】本発明の実施の形態１の被検眼に対する細隙状の照明光と背景照明光の照射状態の他例を示す説明図である。
【図１０】本発明の実施の形態１の被検眼に対する細隙状の照明光と背景照明光の照射状態のさらに別の例を示す説明図である。
【図１１】本発明の実施の形態１の被検眼像の一例を示す説明図である。
【図１２】本発明の実施の形態の変形例を示す部分拡大図である。
【図１３】本発明の実施の形態のさらに別の変形例の顎受け台、固視標支持部材、ＬＥＤ支持部材の配置を示す分解図である。
【図１４】従来の細隙灯顕微鏡におけるスリット光の照射状態を示す説明図である。
【図１５】従来の細隙灯顕微鏡における観察像を示す説明図である。
【図１６】従来の細隙灯顕微鏡の外観を示す側面図である。
【図１７】従来例の顎受け台、固視標支持部材の配置を示す分解図である。
【図１８】従来の顎受け台、背景照明用のＬＥＤの配置の一例を示す正面図である。
【図１９】従来の顎受け台、用のＬＥＤの配置の他例を示す正面図である。
【符号の説明】
１細隙灯顕微鏡
６顕微鏡系
８照明系
１２ミラー
２０撮像装置
２１ａ装着受部
２１ｂ装着受部
２２固視標
２３ａ固視標支持部材
２３ｂＬＥＤ支持部材
２４ＬＥＤ
３１対物レンズ
３２変倍光学系
３３集光レンズ
３４ビームスプリッタ
３５リレーレンズ
３６プリズム
４３撮像カメラ
５１光源
５３集光レンズ
５４細隙
８１制御部
８２画像制御部
８３画像モニタ
８４画像メモリ
９０操作パネル
９１ａ調光釦
９２光量レベル表示部
Ｓ1 乃至Ｓ9 スイッチ
Ｌ1 乃至Ｌ16 発光素子[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a slit lamp microscope, and more particularly to a slit lamp microscope capable of clearly observing not only a slit image of a specific observation site of an eye to be examined but also a peripheral portion of the observation site simultaneously.
[0002]
[Prior art]
One type of ophthalmic apparatus used in the ophthalmic field is a slit lamp microscope. This is used in daily examinations by ophthalmologists, and it is possible to observe various lesions of the eye to be examined by devising a lighting method for the eye to be examined.
[0003]
As conceptually shown in FIG. 14, the slit lamp microscope irradiates the cornea Ed of the eye E with the light from the light source 201 as slit-like light (slit light), and performs light cutting on the cornea Ed. Then, the reflected light from the light-cut corneal portion is taken into an observation optical system and an image processing system (not shown) via the objective lens 202, and the corneal cross-sectional image Ed is displayed on the screen of the image monitor 203 as shown in FIG. 'Is displayed.
[0004]
This slit lamp microscope can observe a slight lesion of the eye E by using the Tyndall phenomenon (see Slit Lamp, p. 25, Fig. 34, Medical 34, published by Motoichi Itoi and Sadao Kanegami). .
[0005]
However, in the case of such a conventional slit lamp microscope, for example, only the corneal cross-sectional image Ed ′ can be clearly observed, but surrounding tissues (sclera, iris, etc.) other than the corneal cross-section cannot be observed at all. This is because the cornea is illuminated with slit-like illumination light, so the illumination field is extremely narrow, and the peripheral area other than the cornea cross section is completely dark (indicated by cross diagonal lines in FIG. 15) and is difficult to image.
[0006]
However, if the appearance and tissue state around a specific part of the eye E to be examined are also imaged and the position and size of the lesioned part can be understood over the entire eye to be examined, an appropriate diagnosis can be made. In addition, it is required to be able to observe the appearance and tissue state around a specific site. In this way, there is also an advantage that it becomes easy to explain the lesioned part to a third party other than the operator (patients and their families, related parties such as academic societies and magazines).
[0007]
A conventional example of a slit lamp microscope that irradiates background illumination light to a peripheral region of a specific part of eye E will be described with reference to FIG.
[0008]
A conventional slit lamp microscope 100 shown in FIG. 16 has a base 104 supported on a table 102 so as to be movable in a horizontal horizontal direction and a horizontal vertical direction via a moving mechanism unit 103, and a base 104 by a tilting operation. An operating handle 105 that is displaced horizontally and vertically, a microscope system (observation optical system) 106 supported by the base 104, and a light source that is supported by the base 104 via a support frame 113 and a light source. And an illumination system 108 that irradiates the eye E with a slit-like illumination light via a mirror 112 provided at a predetermined position of the support frame 113 and an objective lens of the microscope system 106 are housed. A chin rest 110a for a subject facing the lens barrel body 109 and a chin rest 110 having a forehead support 110b are provided.
[0009]
On the side surface of the lens barrel body 109, a rotation shaft for changing the magnification of observation is provided, and the rotation magnification of the microscope system 106, such as 6, 10, 16, 25, 40, is shown on the outer periphery of the rotation shaft. An operation knob 111 with numbers is attached.
[0010]
A manual operation type light guide 120 that uses a part of the illumination light emitted from the illumination system 108 is attached to the casing of the illumination system 108, and the tip of the light guide 120 is directed toward the eye E to be examined. The background illumination light is emitted. In FIG. 16, reference numeral 130 denotes an imaging device such as a video camera attached to the lens barrel body 109.
[0011]
As shown in FIG. 17, the chin rest 110 is provided with a pair of mounting receiving portions 141a and 141b having the same dimensions in the fitted state on both side ends 110c and 110d. The fixation target support member 150 is attached to the attachment receiving portion 141a. The fixation target support member 150 includes an insertion portion 151 to be inserted into the mounting receiving portion 141a, a first rotatable joint portion 152, and a first arm rotatably supported by the first rotatable joint portion 152. 153, a second rotatable joint 154 attached to the end of the first arm 153, and a second arm 155 rotatably supported by the second rotatable joint 154. The fixation target 156 is attached to the tip of the second arm 155.
[0012]
With respect to such a chin rest 110, as shown in FIG. 18, a rotating member 160 capable of turning a region in front of the subject's face with the upper portion of the chin rest 110 as a support shaft is disposed. A structure in which the LED 161 for background illumination is attached to a position occupying the vicinity of the eye E in the rotating member 160 is also known.
[0013]
Further, as shown in FIG. 19, for the side illumination 110a (or the side edge 110b) of the chin rest 110, for the background illumination via the attachment 171, the first arm 172, the joint 173, and the second arm 174. A structure having the LED 175 attached thereto is also known.
[0014]
[Problems to be solved by the invention]
However, in the case of the conventional slit lamp microscope 100 shown in FIG. 16, the light source of the background illumination light from the light guide 120 is the same as the light source of the illumination system 108, so that the slit-shaped illumination light for the eye E is examined. When the amount of light is adjusted, the amount of background illumination light also changes in conjunction with this, and there is a problem that the amount of light of only the background illumination light cannot be adjusted. This means that in each case of observing and recording the eye E from various perspectives, such as visual observation of the eye E, imaging with a video camera, imaging with a still camera, etc., the optimal background illumination for a specific part of the eye E It is difficult to convert.
[0015]
In the case of the conventional slit lamp microscope 100 shown in FIG. 16, a light shielding member having a plurality of holes for adjusting the amount of light is provided near the tip of the light guide 120, and the background is changed by switching the positions of the holes. It is configured to adjust the amount of illumination light.
[0016]
However, in such a configuration, every time the light amount adjustment is performed, the examiner must touch the light shielding member near the tip of the light guide 120 in order to operate the light shielding member. There is a problem that it gives a feeling and the operability during observation of the eye E with the slit lamp microscope 100 is lowered.
[0017]
On the other hand, in the case of a structure in which the LED 161 for background illumination as shown in FIG. 18 is provided separately from the illumination system 108 or the LED 175 for background illumination is attached via various mechanical parts as shown in FIG. The addition of a power supply unit and a light source is necessary, leading to an increase in size and complexity of the overall configuration of the slit lamp microscope 100. Furthermore, the power supply unit and the light source must be installed on the floor outside the table 102. For this reason, the number of wiring devices increases and the distance of wiring material increases, and the movable part of the slit lamp microscope 100 is There is also a problem that the operability of the slit lamp microscope 100 itself is lowered, such as contact with any part.
[0018]
Therefore, the present invention eliminates the need for a light guide or wiring material as in the conventional example, can obtain good operability while achieving space saving, and further, visual observation of the eye to be examined and imaging with a video camera, The present invention provides a slit lamp microscope that can obtain optimum background illumination for each specific part when observing and recording an eye to be examined from various angles such as photographing with a still camera.
[0019]
[Means for Solving the Problems]
The slit lamp microscope according to the first aspect of the present invention irradiates the eye to be examined with a slit-like illumination light by the illumination system, and uses the microscope system to reflect the reflected light from the irradiation portion of the slit-like illumination light on the eye to be examined. In the slit lamp microscope to be observed, a light emitting element group for irradiating the background illumination light around the irradiation field of the slit illumination light is disposed on the end surface of the barrel around the objective lens constituting the microscope system. It is characterized by this.
[0020]
According to the present invention, it is possible to observe a specific part of the eye to be examined by irradiating the eye to be examined with the illumination system by the illumination system, and the slit on the end surface of the lens barrel around the objective lens constituting the microscope system. Since the light emitting element group that irradiates the background illumination light around the irradiation field of the shaped illumination light is arranged, a specific image of the eye to be examined is obtained based on the slit-like illumination light. Observation and recording are possible, and the peripheral portion can be clearly observed and recorded together with a specific part of the eye to be inspected based on the background illumination light from the light emitting element group.
[0021]
A slit lamp microscope according to a second aspect of the invention irradiates a slit eye with slit-like illumination light by an illumination system in which a position relative to the eye to be examined is displaceable, so that the slit-like illumination light in the eye to be examined is irradiated. In the slit lamp microscope for observing the reflected light from the irradiated site with a microscope system arranged to displace the position relative to the eye to be examined, it is arranged around the lens barrel end surface around the objective lens constituting the microscope system, The light emitting element group that irradiates the background illumination light around the irradiation field of the slit-shaped illumination light and the light emitting element group around the objective lens are turned on according to the positional relationship of the objective lens with respect to the eye to be examined. It has lighting adjustment means for adjusting the position and the number of the light emitting elements.
[0022]
According to the present invention, it is possible to observe a specific part of the eye to be examined by irradiating the eye to be examined with the illumination system by the illumination system, and the slit on the end surface of the lens barrel around the objective lens constituting the microscope system. A light emitting element group for irradiating background illumination light around the irradiation field of the shaped illumination light is arranged, and the light emitting element group around the objective lens is determined by the lighting adjustment means according to the positional relationship of the objective lens with respect to the eye to be examined. The position and the number of light emitting elements to be lit are adjusted.
[0023]
Therefore, a specific part of the eye to be examined can be observed and recorded with a clear image based on the slit-like illumination light, and the peripheral part thereof is also lit in the light emitting element group. By adjusting the position and the number of light emitting elements with the lighting adjustment means, it is possible to irradiate the optimal background illumination light according to the positional relationship of the objective lens with respect to the eye to be examined, and to clearly identify the peripheral region along with the specific part of the eye to be examined. It is possible to observe and record.
[0024]
According to a third aspect of the present invention, the slit lamp microscope irradiates the subject's eye with slit-like illumination light by an illumination system arranged so that the position relative to the subject's eye can be displaced, and the slit-like illumination light of the subject's eye is irradiated. In the slit lamp microscope for observing the reflected light from the irradiated site with a microscope system arranged to displace the position relative to the eye to be examined, it is arranged around the lens barrel end surface around the objective lens constituting the microscope system, The light emitting element group that irradiates the background illumination light around the irradiation field of the slit-shaped illumination light and the light emitting element group around the objective lens are turned on according to the positional relationship of the objective lens with respect to the eye to be examined. It is characterized by having lighting adjustment means for adjusting the position and the number of light emitting elements, and light adjustment means for adjusting the illuminance of background illumination light from the light emitting element group around the objective lens.
[0025]
According to this invention, in addition to the configuration of the invention according to claim 2, since the light control means for adjusting the illuminance of the background illumination light from the light emitting element group around the objective lens is provided, the eye to be examined is specified. With respect to the site, a clear image can be obtained and observed based on the slit-like illumination light, can be recorded, and the position and number of light-emitting elements to be lit in the light-emitting element group also on the periphery thereof By adjusting the lighting adjustment means, it is possible to irradiate the optimum background illumination light according to the positional relationship of the objective lens with respect to the eye to be examined, and clearly observe and record the peripheral region together with the specific part of the eye to be examined. It becomes possible.
[0026]
Further, by combining the adjustment of the position and the number of light emitting elements that are lit by the lighting adjustment means and the illuminance adjustment of the background illumination light by the dimming means, visual observation of the eye to be examined, imaging by a video camera, When observing and recording a specific part of the eye to be examined from various angles such as photographing, it is possible to obtain optimum background illumination.
[0027]
The slit lamp microscope according to the invention described in claim 4 irradiates the subject's eye with slit-like illumination light by the illumination system supported by the support frame so that the position of the subject's eye relative to the subject's eye can be displaced. In a slit lamp microscope for observing the reflected light from the irradiation site of the illumination light with a microscope system in which the position relative to the eye to be examined is displaceable, the eye to be examined is located in a region facing the eye to be examined in the support frame. The light emitting element group which irradiates the background illumination light to the circumference | surroundings of the irradiation field periphery of the slit-shaped illumination light irradiated to is characterized by the above-mentioned.
[0028]
According to the present invention, a specific part of the eye to be examined can be observed by irradiating the eye to be examined with a slit-like illumination light by the illumination system, and disposed in a region facing the eye to be examined in the support frame that supports the illumination system. By irradiating the eye to be examined with background illumination light from the light emitting element group, it is possible to clearly observe and record the peripheral region of the specific part based on the slit-like illumination light.
[0029]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described.
[0030]
A slit lamp microscope 1 according to the present embodiment shown in FIG. 1 includes a base 4 supported on a table 2 so as to be movable in a horizontal horizontal direction and a horizontal vertical direction via a moving mechanism 3, and a tilting operation. An operation handle 5 for displacing the table 4 in the horizontal and horizontal directions and a horizontal and vertical direction, a microscope system 6 supported by the base 4 so as to be able to be rotated and displaced in the horizontal direction with respect to the eye E, and the base 4 The support frame 15 is supported so as to be able to rotate and displace in the horizontal direction with respect to the eye E, and has a built-in slit for forming a light source and slit-like illumination light. A jaw holder having a chin rest 10a and a forehead rest 10b for a subject opposed to an illumination system 8 on which a reflecting mirror 12 is mounted and a lens barrel body 9 housing an objective lens 31 of the microscope system 6 And a table 10.
[0031]
On the side surface of the lens barrel body 9, a rotation shaft for changing the magnification of observation is provided, and 6, 10, 16, 25, 40, etc. indicating the observation magnification of the microscope system 6 on the outer periphery with respect to this rotation shaft. An operation knob 11 with numbers is attached.
[0032]
As shown in FIGS. 2 and 3, the end surface 9b on the objective lens 31 side of the lens barrel body 9 has a light emitting element group, that is, a total of 16 light emitting elements (for example, a total of 16 light emitting elements). White LEDs L1 to L16 are embedded so that each light emitting surface faces the chin rest 10 side, that is, the eye E side, thereby saving space compared to the case of using a light guide as in the conventional example. It is planned.
[0033]
FIG. 4 shows an outline of the optical configuration of the slit lamp microscope 1 according to the present embodiment. The slit lamp microscope 1 includes a microscope system 6 housed in a lens barrel body 9 and a lens barrel body 9. For example, the imaging apparatus 20 using an attached imaging camera 43 such as a video camera, and the illumination system 8 arranged orthogonal to the microscope system 6 with respect to the mirror 12 facing the eye E to be examined are provided. The microscope system 6 includes an objective lens 31, a variable magnification optical system 32, a condenser lens 33, a beam splitter 34, a relay lens 35, a prism 36 that changes the optical path to the eyepiece tube 9a side, and an eyepiece tube. The eyepiece lens 37 is disposed at 9a, and an image of the eye E is formed at the image point p shown in FIG. 4 so that it can be observed by the examiner's eye E0.
[0034]
The imaging device 20 includes a condenser lens 41 that condenses the light beam branched by the beam splitter 34, a mirror 42 that bends the light beam from the condenser lens 41 at a right angle of 90 degrees, and an imaging camera 43. ing.
[0035]
The illumination system 8 includes a light source 51 such as a halogen lamp, a condensing lens 53 that condenses light from the light source 51, and a slit (slit) that allows only part of the light that has passed through the condensing lens 53 to pass therethrough. ) 54 and a condensing lens 55 that passes through the slit 54 and collects the slit-like illumination light. The slit-like illumination light is reflected by the mirror 12 and applied to a specific part of the eye E to be examined. It is configured to irradiate.
[0036]
The slit 54 and the eye E to be examined are arranged so as to be in a conjugate position with respect to the condensing lens 55, so that the slit 54 and the eye E are slit-like with respect to the cornea, for example, of the eye E through the mirror 12. Illumination light is irradiated so that the corneal cross-sectional image of the eye E can be observed by the microscope system 6.
[0037]
Further, the background illumination light is irradiated toward the eye E by the light emitting elements L1 to L16 arranged around the objective lens 31.
[0038]
FIG. 5 shows a main part of a control system of the slit lamp microscope 1, and a control unit 81 that performs overall operation control including lighting control of the light source 51 and an image signal from the imaging camera 43. In the operation of the image controller 82 to be captured, an image monitor 83 such as a liquid crystal display connected to the image controller 82, an image memory 84 which is a storage means connected to the image controller 82, and the operation of the slit lamp microscope 1 as a whole. It has a power supply unit 85 for supplying necessary power and an operation panel 90 that constitutes lighting adjustment means and dimming means for the light emitting elements L1 to L16, which will be described in detail below.
[0039]
On one end side of the operation panel 90, as shown in FIG. 6, a switch S1 for turning on all the light emitting elements L1 to L16 is arranged at the center, and eight switches are arranged around the switch S1. S2 to S9 are circularly arranged, and lighting adjustment means having a total of nine switch configurations is provided.
[0040]
Further, as shown in FIG. 6, the other end side of the operation panel 90 is a light control comprising light control buttons (for increasing the light amount) 91a and light control buttons (for decreasing the light amount) 91b for the light emitting elements L1 to L16. There is provided a light control means including a switch unit and a light amount level display unit 92 that visually displays the light amount of the light emitting elements L1 to L16 (illuminance of the irradiation area of the eye E to be examined by background illumination light) in a bar format display. .
[0041]
FIG. 7 shows a correspondence table of lighting positions and numbers of the nine switches S1 to S9 in total and the light emitting elements L1 to L16.
[0042]
As is apparent from FIG. 7, the lighting adjustment means turns on all of the light emitting elements L1 to L16 by operating the switch S1, for example, and turns on the five light emitting elements L1 to L5 above the objective lens by operating the switch S2. The five light emitting elements L5 to L9 on the left side of the objective lens are turned on by operating the switch S4, the five light emitting elements L5 to L9 on the lower side of the objective lens are turned on by operating the switch S6, and the objective is operated by operating the switch S8. The lighting positions and the number of the light emitting elements L1 to L16 with respect to the eye E to be examined are arbitrarily adjusted by a total of nine switch configurations such that the five light emitting elements L13 to L1 on the right side of the lens are lit. The background illumination light to be irradiated can be optimized.
[0043]
Next, the operation of the slit lamp microscope 1 configured as described above will be described with reference to FIGS.
[0044]
The light emitted from the light source 51 of the illumination system 8 irradiates the slit 54 through the condenser lens 53. Since the slit 54 and the eye E to be examined are arranged in a conjugate manner, the slit-shaped illumination light formed through the slit 54 passes through the condenser lens 55 and the mirror 12 as shown in FIG. Irradiated to the corneal cross section (shown by hatching in FIG. 8) Ed of the eye E.
[0045]
In this case, in the lighting adjustment means, for example, by operating the switch S1, all of the light emitting elements L1 to L16 around the objective lens 31 facing the eye E from the front are turned on, and the light emitting elements L1 to L16 are turned on. The background illumination light is irradiated to the peripheral portion of the corneal section Ed of the eye E. As a result, the entire eye E (mainly the peripheral part: iris, etc.) is illuminated.
[0046]
In this way, the light irradiated on the eye E and reflected by the corneal section Ed of the eye E and the light beam reflected by the whole eye E are incident on the objective lens 31 of the microscope system 6, and further the beam. A part of the image is formed at the image forming point p shown in FIG. 4 through the splitter 34 and observed by the examiner's eye E0.
[0047]
Further, the light beam branched by the beam splitter 34 enters the imaging camera 43 through the mirror 42, whereby an observation image identical to the observation image of the examiner's eye E0 is captured by the imaging camera 43, and the image control is performed. The image is sent to the image monitor 83 and displayed under the control of the unit 82.
[0048]
As shown in FIG. 11, this observation image, that is, the corneal cross-sectional image Ed ′ obtained by the slit-like illumination light can be observed in a state where a good contrast is maintained, and at the same time, the whole image E including the iris etc. in the eye E to be examined. Since 'can also be clearly observed, it is possible to observe a lesioned part or the like while grasping the entire image of the eye E to be examined.
[0049]
Further, according to the present embodiment, the light emitting elements L1 to L16 are arranged around the objective lens 31 of the microscope system 6 so that each light emitting surface faces the chin rest 10 side, that is, the eye E side. Because it is buried, it can save space, and it is necessary for the examiner to reach near the eye E to adjust the background illumination, compared to the case of using a light guide as in the conventional example. Therefore, the operability can be improved.
[0050]
Further, in the above-described case, an observation observed from the examiner's eye E0 by operating the dimming button 91a or the dimming button 91b in the dimming means and appropriately adjusting the background illumination light from the light emitting elements L1 to L16. The brightness of the eye image when adjusting the brightness of the image, adjusting the brightness of the observation image picked up by the image pickup camera 43, and photographing the eye E with a still camera instead of the image pickup camera 43 Can be adjusted.
[0051]
In FIG. 9, slit-shaped illumination light is irradiated from the front of the subject eye E, and the background illumination light from the light emitting element group is placed on the subject eye 31 in a state where the objective lens 31 is disposed on the right side in the horizontal direction when viewed from above the subject eye E. The case where it irradiates toward E is shown.
[0052]
In this case, the lighting adjustment means turns on the five light emitting elements L13 to L1 on the right side of the objective lens 31 facing the eye E by operating the switch S8, and the light emitting elements L13 to L1 are turned on. The background illumination light is irradiated to the periphery of the slit-like illumination light. As a result, even when a specific part of the eye E is viewed from above and observed from the right in the horizontal direction, the background illumination light is optimized, and it is possible to observe the lesioned part etc. while grasping the whole image of the eye E It becomes.
[0053]
FIG. 10 irradiates slit-shaped illumination light from the front of the subject eye E, and background illumination light from the light emitting element group in a state where the objective lens 31 is disposed on the left side in the horizontal direction when viewed from above the subject eye E. The case where it irradiates toward E is shown.
[0054]
In this case, the lighting adjustment means turns on the five light emitting elements L5 to L9 on the left side of the objective lens 31 facing the eye E by operating the switch S4, and the light emitting elements L5 to L9 The background illumination light is irradiated to the periphery of the slit-like illumination light. As a result, even when a specific part of the eye E is viewed from above and observed from the left side in the horizontal direction, the background illumination light is optimized, and the lesioned part or the like can be observed while grasping the entire image of the eye E. It becomes.
[0055]
9 and 10, the operation of the light control button 91a or the light control button 91b in the light control means is combined to adjust the brightness of the observation image observed from the examiner's eye E0, It is of course possible to adjust the brightness of the observation image captured by the camera 43, and of course to adjust the brightness of the eye image when the eye E is photographed with a still camera instead of the imaging camera 43. It is.
[0056]
FIG. 12 shows a modification of the embodiment of the present invention. Instead of disposing a light emitting element group around the objective lens 31, the support frame 15 in the support frame 15 that supports the illumination system 8 on the base 4 is shown. The left and right pieces 15a and 15b facing the eye E are composed of, for example, eight light emitting elements L21 to L28 that irradiate the background illumination light around the irradiation field of the slit-like illumination light irradiated to the eye E. The light emitting element group is provided in a vertical arrangement, and the lighting control is performed in the same manner as when the light emitting elements L21 to L28 are described.
[0057]
Even with such a configuration in which the light emitting element group is provided on the support frame 15, the background illumination light for the eye E is optimized, and it is possible to observe a lesioned part or the like while grasping the entire image of the eye E. .
[0058]
FIG. 13 is an exploded view showing the arrangement of the chin rest 10, the fixation target support member 23a, and the LED support member 23b according to still another modification of the embodiment of the present invention.
[0059]
As shown in FIG. 13, attachment receiving portions 21a and 21b having the same dimensions in the fitted state are provided on both side ends 10c and 10d of the chin rest 10, respectively.
[0060]
Further, a fixation target support member 23a that supports the fixation target 22 using LEDs, and an LED support member 23b that has substantially the same configuration as the fixation target support member 23a and supports the LED 24 for background illumination, Each of the mounting receivers 21a and 21b is detachably arranged and interchangeable.
[0061]
The LED 24 is used for background illumination. This is due to the fact that a high-intensity white LED has recently been put into practical use, its size is small, and it is inexpensive. The fixation target support member 23a is rotatably supported by the insertion portion 25 to be inserted into the mounting receiving portions 21a and 21b, the first rotatable joint portion 26, and the first rotatable joint portion 26. A first arm 27; a second rotatable joint portion 28 attached to an end of the first arm 27; and a second arm 29 rotatably supported by the second rotatable joint portion 28. The fixation target 22 is attached to the tip of the second arm 29.
[0062]
The LED support member 23b has the same configuration as the fixation target support member 23a except that the LED 24 for background illumination is attached to the distal end portion of the second arm 29 instead of the fixation target 22. Yes.
[0063]
According to the slit lamp microscope 1 having the above-described configuration, the fixation target 22 is supported with respect to a pair of similar mounting receiving portions 21a and 21b provided on both side ends 10c and 10d of the chin rest 10. The fixation target support member 23a and the LED support member 23b that supports the LED 24 for background illumination are respectively mounted to perform the optometry with the fixation target 22, as well as the slit observation of the eye E. It becomes possible to easily irradiate the background illumination light by the LED 24.
[0064]
Furthermore, since the fixation target support member 23a and the LED support member 23b are appropriately removed from the mounting receivers 21a and 21b, it does not get in the way when the subject's face is on the chin rest 10 and the like. In addition, the peripheral area can be ordered.
[0065]
Further, instead of the removed fixation target support member 23a, another LED support member 23b can be attached to the mounting receiving portion 21a, and in this case, background illumination from both the left and right directions of the eye E can be realized, It is possible to obtain a good background image of the eye without a shadow.
[0066]
Further, the fixation target 22 and the background illumination LED 24 may be supported by the same support member and switched alternately by a changeover switch.
[0067]
According to the configuration shown in FIG. 13, the fixation target support member 23 a that supports the fixation target 22 with respect to the pair of mounting portions 21 a and 21 b having the same configuration provided on the chin rest 10, and the eye to be examined The LED support member 23b for supporting the LED 24 for background illumination at the time of slit observation of E is mounted, and guidance of the eye E by the fixation target 24, and background illumination of the slit observation of the eye E by the LED 24, and Can be easily performed. In addition, it is possible to improve the operability during the examination of the eye E and to simplify the configuration by reducing and sharing the hardware parts and electrical parts.
[0068]
Furthermore, the fixation target support member 23a and the LED support member 23b are made common in dimension, and the LED of the fixation target 22 and the power for lighting the LED 24 are shared from the main power source of the slit lamp microscope 1. Therefore, there is no need for a separate power source, and the structure can be simplified.
[0069]
【The invention's effect】
According to the present invention, it is possible to obtain good operability while saving space, and in addition, when observing and recording the eye to be examined from various angles, optimal background illumination for each specific part is provided. Thus, it is possible to provide a slit lamp microscope capable of clearly observing and recording both the specific part and the peripheral part of the eye to be examined.
[0070]
Further, according to the present invention, it is possible to irradiate optimal background illumination light according to the positional relationship of the objective lens with respect to the eye to be examined, and clearly observe the peripheral region even when observing a specific part of the eye to be examined from different angles. A slit lamp microscope capable of recording can be provided.
[0071]
Furthermore, according to the present invention, the specific part of the eye to be examined and the surroundings can be saved on the basis of good operability while saving space in the configuration in which the light emitting element group is arranged in the region facing the eye to be examined in the support frame that supports the illumination system It is possible to provide a slit lamp microscope that can clearly observe and record both parts.
[Brief description of the drawings]
FIG. 1 is a side view showing an appearance of a slit lamp microscope according to a first embodiment of the present invention.
FIG. 2 is a partial perspective view of a microscope system and a chin rest of the slit lamp microscope according to the first embodiment of the present invention.
FIG. 3 is an explanatory diagram showing a light emitting element group on an end surface of a microscope barrel of the microscope system according to the first embodiment of the present invention.
FIG. 4 is a schematic diagram showing the main part of the optical system of the slit lamp microscope according to the first embodiment of the present invention.
FIG. 5 is a block diagram showing a main part of a control system of the slit lamp microscope according to the first embodiment of the present invention.
FIG. 6 is a plan view showing an operation panel of the slit lamp microscope according to the first embodiment of the present invention.
FIG. 7 is a lighting correspondence table between switches and light emitting element groups according to the first embodiment of the present invention.
FIG. 8 is an explanatory diagram showing an irradiation state of slit-shaped illumination light and background illumination light on the eye to be examined according to the first embodiment of the present invention.
FIG. 9 is an explanatory diagram showing another example of the irradiation state of the slit-shaped illumination light and the background illumination light on the eye to be examined according to the first embodiment of the present invention.
FIG. 10 is an explanatory diagram showing still another example of the irradiation state of the slit-shaped illumination light and the background illumination light on the eye to be examined according to the first embodiment of the present invention.
FIG. 11 is an explanatory diagram showing an example of an eye image to be examined according to the first embodiment of the present invention.
FIG. 12 is a partially enlarged view showing a modification of the embodiment of the present invention.
FIG. 13 is an exploded view showing an arrangement of a chin rest, a fixation target support member, and an LED support member according to still another modified example of the embodiment of the present invention.
FIG. 14 is an explanatory view showing an irradiation state of slit light in a conventional slit lamp microscope.
FIG. 15 is an explanatory view showing an observation image in a conventional slit lamp microscope.
FIG. 16 is a side view showing the appearance of a conventional slit lamp microscope.
FIG. 17 is an exploded view showing the arrangement of a conventional chin rest and a fixation target support member.
FIG. 18 is a front view showing an example of an arrangement of a conventional chin rest and LEDs for background illumination.
FIG. 19 is a front view showing another example of the arrangement of the conventional chin rest and LEDs for use.
[Explanation of symbols]
1 slit lamp microscope
6 Microscope system
8 Lighting system
12 Mirror
20 Imaging device
21a Wear receiving part
21b Wear receiving part
22 fixation target
23a Fixation target support member
23b LED support member
24 LED
31 Objective lens
32 Variable magnification optical system
33 condenser lens
34 Beam splitter
35 Relay lens
36 prism
43 Imaging Camera
51 light source
53 Condensing lens
54 slit
81 Control unit
82 Image control unit
83 Image monitor
84 Image memory
90 Operation panel
91a Light control button
92 Light level display
S1 to S9 switch
L1 to L16 light emitting elements

Claims

In the slit lamp microscope that irradiates the subject eye with slit-like illumination light by the illumination system, and observes the reflected light from the irradiation site of the slit-like illumination light in the subject eye with the microscope system,
A slit lamp microscope characterized in that a light emitting element group for irradiating background illumination light around the irradiation field of the slit illumination light is arranged on a lens barrel end surface around an objective lens constituting the microscope system. .

A slit-shaped illumination light is irradiated to the eye to be examined by an illumination system arranged so that the position of the eye to be examined can be displaced, and the position of the reflected light from the illuminated part of the slit-shaped illumination light on the eye to be examined is displaced. In a slit lamp microscope to observe with a microscope system arranged as possible,
A light emitting element group that circulates around a lens barrel end surface around the objective lens constituting the microscope system and irradiates background illumination light around the irradiation field of the slit-like illumination light, and
Lighting adjustment means for adjusting the position and number of light emitting elements to be lit among the light emitting element groups around the objective lens, according to the positional relationship of the objective lens with respect to the eye to be examined;
A slit lamp microscope characterized by comprising:

A slit-shaped illumination light is irradiated to the eye to be examined by an illumination system arranged so that the position of the eye to be examined can be displaced, and the position of the reflected light from the illuminated part of the slit-shaped illumination light on the eye to be examined is displaced. In a slit lamp microscope to observe with a microscope system arranged as possible,
A light emitting element group that circulates around a lens barrel end surface around the objective lens constituting the microscope system and irradiates background illumination light around the irradiation field of the slit-like illumination light, and
Lighting adjustment means for adjusting the position and number of light emitting elements to be lit among the light emitting element groups around the objective lens, according to the positional relationship of the objective lens with respect to the eye to be examined;
Dimming means for adjusting the illuminance of background illumination light from the light emitting element group around the objective lens;
A slit lamp microscope characterized by comprising:

A slit-shaped illumination light is irradiated to the eye to be examined by an illumination system that is supported by the support frame so that the position of the eye to be examined can be displaced, and reflected light from a portion of the slit-shaped illumination light irradiated on the eye to be examined In the slit lamp microscope to observe with a microscope system that can be displaced relative to the position,
A slit is characterized in that a light emitting element group for irradiating background illumination light around the irradiation field of the slit-shaped illumination light for irradiating the eye to be examined is disposed in a region facing the eye to be examined in the support frame. Light microscope.