JP4699581B2 - Microwave dielectric ceramic composition - Google Patents
Microwave dielectric ceramic composition Download PDFInfo
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- JP4699581B2 JP4699581B2 JP29556399A JP29556399A JP4699581B2 JP 4699581 B2 JP4699581 B2 JP 4699581B2 JP 29556399 A JP29556399 A JP 29556399A JP 29556399 A JP29556399 A JP 29556399A JP 4699581 B2 JP4699581 B2 JP 4699581B2
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Description
【0001】
【発明の属する技術分野】
本発明は、特定の結晶構造を有する成分からなる新規なマイクロ波誘電体磁器組成物(以下、「誘電体磁器組成物」という。)に関する。本発明の誘電体磁器組成物は、マイクロ波領域における誘電体共振器の他、マイクロ波集積回路基板、各種マイクロ波回路のインピーダンス整合部材等として利用することができる。
【0002】
【従来の技術】
本発明者らは、特開平11−199320号公報に開示されるように、CaTiO3系組成物を主成分とし、Al2O3等の酸化物を含有する誘電体磁器材料において、Quが3500〜4200であり、且つτfが0〜+8.0ppm/℃である優れた誘電特性を有する誘電体磁器組成物を発明した。
【0003】
【発明が解決しようとする課題】
本発明は、CaTiO3−REAlO3系組成物が優れた誘電特性を有することを見出し完成させた。
【0004】
【課題を解決するための手段】
第1発明の誘電体磁器組成物は、組成式xCaTiO3−(1−x)REAlO3〔但し、0.54≦x≦0.82である。〕で表され、REがLa、Nd及びSmのうちの少なくともLaである成分を主成分とし、該主成分を100重量部とした場合に、Ta2O5を0.3〜5重量部含有し、上記主成分と上記Ta2O5との合計量を100重量部とした場合に、更にMnO2を0.01重量部以上0.5重量部以下含有することを特徴とする。
【0005】
上記「x」が、0.54未満の場合は、τfが負に大きくなり過ぎ、εrが小さくなり好ましくない。一方、xが0.82を超える場合は、τfが正に大きくなり過ぎ好ましくない。このxは、0.6〜0.8とすることがより好ましく、0.65〜0.7とすることが特に好ましい。このような組成とすることにより、εrを39以上(更には42以上、特に44以上、最大値は50以上)、Quを3850以上(更には3900以上、特に4000以上、最大値は4250以上)、τfを−30〜+45ppm/℃(更には−30〜+30ppm/℃、特に−10〜+10ppm/℃)とすることができる。
【0006】
また、第2発明のように、このREとして含有されるLa、Nd及びSmのモル比を、La:Nd:Sm=α:β:γとした場合に、0.4≦α≦1.0、0≦β≦0.2、0≦γ≦0.5、且つα+β+γ=1.0とすることができる。αを上記の範囲外にするとεrが低下し易く好ましくない。また、βを上記の範囲外にするとQuが低下し易く好ましくない。更に、γを上記の範囲外にするとεrが低下すると共に、τfが負に大きくなり易く好ましくない。
【0007】
α、β、γを上記の範囲にすることにより、εrが、43以上(更には44以上、最大値は44.5以上)、Quが、3900以上(更には4000以上、最大値は4100以上)、τfが、−1.3〜−5.5ppm/℃(更には−1.3〜−4.5ppm/℃)である優れた誘電特性を有する誘電体磁器組成物を得ることができる。
【0008】
第1発明では、更にTa2O5を0.3〜5重量部含有している。Ta2O5を含有することにより、τfを0付近の小さい値に安定させることができる。更に、Ta2O5の含有量は、0.5〜4重量部とすることが好ましく、1〜3.5重量部とすることがより好ましい。これにより、εrが40以上(更には43以上、特に44以上、最大値は48以上)であり、Quが3800以上(更には3900以上、特に4000以上)であり、τfが−9〜+9ppm/℃(更には、−8〜+8ppm/℃、特に、−7〜+7ppm/℃)である優れた誘電体磁器組成物とすることができる。この含有量が5重量部を超える場合は、εrは48以上と大きくすることができるが、Quは3700を下回り好ましくない。
【0009】
更に、主成分とTa2O5の合計量を100重量部とした場合に、MnO2を0.01重量部以上0.5重量部以下含有させる。MnO2の含有量が0.5重量部を超えると、εrは大きくなるものの、Quが3800以下と小さくなり、τfの絶対値が大きくなり易い。このMnO2の含有量は、0.01〜0.45重量部とすることがより好ましく、0.1〜0.4重量部とすることが特に好ましい。
【0010】
また、本第1発明〜第2発明の誘電体磁器組成物は、共振周波数800MHzにおけるQuが3000以上であり、且つτfが−10〜+10ppm/℃である。即ち、このように低い周波数域において使用することができ、このような場合のQuは特に高い値を得ることができ、且つτfは、0ppm/℃に近く、非常に狭い範囲に保持することができる。
【0011】
【発明の実施の形態】
以下、実施例により本発明を具体的に説明する。
(1)マイクロ波誘電体磁器組成物からなる試験片の作製
TiO2粉末(純度;99.95%)と、CaCO3粉末(純度;99.9%)と、La2O3粉末(純度;99.9%)と、Nd2O3粉末粉末(純度;99.9%)と、Sm2O3粉末粉末(純度;99.9%)と、Al2O3粉末(純度;99.95%)と、Ta2O5粉末(純度;99.2%)とを表1の割合となるように混合した。その後、ミキサーで乾式による混合(20〜30分)を行い、更に、一次粉砕を施した。その後、大気雰囲気、1100〜1300℃にて2時間仮焼した。その後、仮焼粉末に適量の有機バインダーと水を加え、直径10mmのジルコニアボールを用いて、90rpmにて10〜15時間粉砕を行った。次いで、真空凍結乾燥(真空度約0.4Torr、凍結温度−20〜−40℃、乾燥温度40〜50℃、真空乾燥時間約20時間)により造粒し、この造粒された原料を用いて1トン/cm2のプレス圧で直径19mm、高さ11mmの円柱状に成形した。
【0012】
次に、この成形体を大気雰囲気中、500℃にて、4時間脱脂した。その後、1400〜1700℃で4時間焼成した。次いで、得られた焼結体の両端面を研磨し、直径16mm、高さ8mmの円柱状の試験片を得た。
尚、上記仮焼工程における昇温速度は200℃/h及び降温速度は−200℃/h、この脱脂工程における昇温速度は50℃/h、焼成工程における昇温速度は100℃/h及び降温速度は−100℃/hであった。
【0013】
(2)誘電特性の評価
上記各試料につき、平行導体板型誘電体円柱共振器法(TE011モード)により、Qu、εr及びτfを測定した。尚、共振周波数は3.0〜5.0GHzである。また、τfは25〜80℃の温度領域で測定し、τf=(f80−f25)/(f25×ΔT)、ΔT=80℃−25℃=55℃にて算出した。これらの結果を表1に示す。
【0014】
【表1】
尚、表1において、No.25−27は実施例であり、No.1−23、28は参考例である。
【0015】
表1の結果によれば、CaTiO3−REAlO3系の焼結体により、εrが39〜51、Quが3800〜4240、τfが−30〜+40ppm/℃で制御が可能な誘電体磁器組成物を得ることができることが分かる。特に、Ta2O5を含有することにより、εrを大きくすることができ、τfを正の小さな値で細かく制御することができることが分かる。また、REサイトに固溶するNd及びSmを変化させることにより、τfを負の小さな値で細かく制御することができることが分かる。また、MnO2を含有させることにより、τfを正の小さな値において細かく制御することができる。
【0016】
尚、本発明においては、前記具体的実施例に示すものに限られず、目的、用途に応じて本発明の範囲内で種々変更した実施例とすることができる。例えば、原料粉末の混合にあたっては、酸化チタン、酸化カルシウム、酸化ランタン、酸化ネオジウム、酸化サマリウム、酸化アルミニウム、酸化タンタル、酸化マンガン等の各粉末以外にも、各金属の炭酸塩等の焼成によりTiO2、CaO、La2O3、Nd2O3、Sm2O3、Al2O3、Ta2O3及びMnO2を生成するものを使用することができる。
【0017】
【発明の効果】
第1発明によると、CaTiO3−REAlO3系の結晶構造により構成され、実用上十分なεrを備えながら、Qu及びτfを幅広く可変させることのできる誘電体磁器組成物を得ることができる。更に、第2発明によると、より細かくQu及びτfの値を制御することができる。[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a novel microwave dielectric ceramic composition (hereinafter referred to as “dielectric ceramic composition”) comprising a component having a specific crystal structure. The dielectric ceramic composition of the present invention can be used as a dielectric resonator in a microwave region, a microwave integrated circuit substrate, an impedance matching member for various microwave circuits, and the like.
[0002]
[Prior art]
As disclosed in JP-A-11-199320, the present inventors have a dielectric ceramic material containing a CaTiO 3 composition as a main component and containing an oxide such as Al 2 O 3 with a Qu of 3500. A dielectric ceramic composition having excellent dielectric properties of ˜4200 and τ f of 0 to +8.0 ppm / ° C. was invented.
[0003]
[Problems to be solved by the invention]
The present invention has been completed by finding that the CaTiO 3 -REAlO 3 composition has excellent dielectric properties.
[0004]
[Means for Solving the Problems]
The dielectric ceramic composition of the first invention has a composition formula xCaTiO 3- (1-x) REAlO 3 (where 0.54 ≦ x ≦ 0.82. And a component in which RE is at least La of La, Nd and Sm as a main component, and when the main component is 100 parts by weight, Ta 2 O 5 is contained in an amount of 0.3 to 5 parts by weight. and, characterized in that it contains in the case where the total amount of the main component and the Ta 2 O 5 and 100 parts by weight, further MnO 2 0.5 parts by weight or less than 0.01 parts by weight.
[0005]
When “x” is less than 0.54, τ f becomes too large negatively and ε r becomes small, which is not preferable. On the other hand, when x exceeds 0.82, τ f becomes too large, which is not preferable. This x is more preferably 0.6 to 0.8, and particularly preferably 0.65 to 0.7. With such a composition, ε r is 39 or more (more 42 or more, particularly 44 or more, the maximum value is 50 or more), and Qu is 3850 or more (more 3900 or more, especially 4000 or more, the maximum value is 4250 or more). ), Τ f can be −30 to +45 ppm / ° C. (further −30 to +30 ppm / ° C., particularly −10 to +10 ppm / ° C.).
[0006]
As in the second invention, when the molar ratio of La, Nd and Sm contained as RE is La: Nd: Sm = α: β: γ, 0.4 ≦ α ≦ 1.0 0 ≦ β ≦ 0.2, 0 ≦ γ ≦ 0.5, and α + β + γ = 1.0. If α is outside the above range, ε r tends to decrease, which is not preferable. Further, when β is out of the above range, it is not preferable because Qu tends to decrease. Further, if γ is out of the above range, ε r decreases, and τ f tends to increase negatively.
[0007]
By setting α, β, and γ in the above ranges, ε r is 43 or more (more 44 or more, the maximum value is 44.5 or more), Qu is 3900 or more (more 4000 or more, the maximum value is 4100). As described above, it is possible to obtain a dielectric ceramic composition having excellent dielectric properties in which τ f is −1.3 to −5.5 ppm / ° C. (further, −1.3 to −4.5 ppm / ° C.). it can.
[0008]
In the first invention, and further Ta 2 O 5 and it contains 0.3 to 5 parts by weight. By containing Ta 2 O 5 , τ f can be stabilized at a small value near 0. Furthermore, the content of Ta 2 O 5 is preferably 0.5 to 4 parts by weight, and more preferably 1 to 3.5 parts by weight. Thus, epsilon r is 40 or more (further more than 43, especially more than 44, the maximum value of 48 or higher) is, Qu is 3800 or more (further 3900 or more, particularly 4000 or more) and, tau f is -9 An excellent dielectric ceramic composition of +9 ppm / ° C. (further, −8 to +8 ppm / ° C., particularly −7 to +7 ppm / ° C.) can be obtained. If the content exceeds 5 parts by weight, epsilon r is can be as large as 48 or more, Qu is not preferable less than 3700.
[0009]
Furthermore, when the total amount of the main component and Ta 2 O 5 is 100 parts by weight, MnO 2 is contained in an amount of 0.01 parts by weight to 0.5 parts by weight. When the content of MnO 2 exceeds 0.5 parts by weight, ε r increases, but Qu decreases to 3800 or less, and the absolute value of τ f tends to increase. The content of MnO 2 is more preferably 0.01 to 0.45 parts by weight, and particularly preferably 0.1 to 0.4 parts by weight.
[0010]
The dielectric ceramic composition of the present first invention-second invention, Qu is not less than 3000 at the resonance frequency 800 MHz, and tau f is -10~ + 10ppm / ℃. That is, it can be used in such a low frequency range, Qu in such a case can obtain a particularly high value, and τ f should be kept in a very narrow range close to 0 ppm / ° C. Can do.
[0011]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, the present invention will be described specifically by way of examples.
(1) Preparation of test piece made of microwave dielectric ceramic composition TiO 2 powder (purity; 99.95%), CaCO 3 powder (purity; 99.9%), and La 2 O 3 powder (purity; 99.9%), Nd 2 O 3 powder (purity; 99.9%), Sm 2 O 3 powder (purity; 99.9%), and Al 2 O 3 powder (purity; 99.95). %) And Ta 2 O 5 powder (purity; 99.2%) were mixed so as to have the ratio shown in Table 1. Thereafter, mixing by a dry method (20 to 30 minutes) was performed with a mixer, and further primary pulverization was performed. Then, it calcined for 2 hours at 1100-1300 degreeC in air | atmosphere. Thereafter, an appropriate amount of an organic binder and water were added to the calcined powder, and pulverization was performed at 90 rpm for 10 to 15 hours using zirconia balls having a diameter of 10 mm. Next, granulation was performed by vacuum freeze-drying (vacuum degree: about 0.4 Torr, freezing temperature: -20 to -40 ° C, drying temperature: 40-50 ° C, vacuum drying time: about 20 hours), and the granulated raw material was used. It was molded into a cylindrical shape having a diameter of 19 mm and a height of 11 mm with a pressing pressure of 1 ton / cm 2 .
[0012]
Next, this molded body was degreased for 4 hours at 500 ° C. in an air atmosphere. Then, it baked at 1400-1700 degreeC for 4 hours. Next, both end surfaces of the obtained sintered body were polished to obtain a cylindrical test piece having a diameter of 16 mm and a height of 8 mm.
The temperature increase rate in the calcination step is 200 ° C./h, the temperature decrease rate is −200 ° C./h, the temperature increase rate in this degreasing step is 50 ° C./h, and the temperature increase rate in the firing step is 100 ° C./h. The temperature lowering rate was −100 ° C./h.
[0013]
(2) Evaluation of dielectric characteristics For each of the above samples, Qu, ε r and τ f were measured by the parallel conductor plate type dielectric cylindrical resonator method (TE 011 mode). The resonance frequency is 3.0 to 5.0 GHz. Further, τ f was measured in a temperature range of 25 to 80 ° C., and calculated at τ f = (f 80 −f 25 ) / (f 25 × ΔT) and ΔT = 80 ° C.−25 ° C. = 55 ° C. These results are shown in Table 1.
[0014]
[Table 1]
In Table 1, no . Nos. 25-27 are examples. Reference numerals 1-23 and 28 are reference examples.
[0015]
According to the results of Table 1, a dielectric ceramic that can be controlled by CaTiO 3 -REAlO 3 based sintered body at ε r of 39 to 51, Qu of 3800 to 4240, and τ f of −30 to +40 ppm / ° C. It can be seen that a composition can be obtained. In particular, by containing Ta 2 O 5 , ε r can be increased, and τ f can be finely controlled with a small positive value. Further, by varying the Nd and Sm in solid solution in the RE site, it can be seen that it is possible to finely control the tau f with a negative small value. Further, by containing MnO 2 , τ f can be finely controlled at a small positive value.
[0016]
The present invention is not limited to the specific examples described above, and various modifications can be made within the scope of the present invention depending on the purpose and application. For example, when mixing raw material powders, in addition to titanium oxide, calcium oxide, lanthanum oxide, neodymium oxide, samarium oxide, aluminum oxide, tantalum oxide, manganese oxide, etc. 2 , CaO, La 2 O 3 , Nd 2 O 3 , Sm 2 O 3 , Al 2 O 3 , Ta 2 O 3, and MnO 2 can be used.
[0017]
【The invention's effect】
According to the first invention, it is possible to obtain a dielectric ceramic composition that is composed of a CaTiO 3 -REAlO 3 based crystal structure and that can vary Qu and τ f widely while having practically sufficient ε r. . Furthermore, according to the second invention, the values of Qu and τ f can be controlled more finely.
Claims (3)
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| JP29556399A JP4699581B2 (en) | 1999-10-18 | 1999-10-18 | Microwave dielectric ceramic composition |
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| JP29556399A JP4699581B2 (en) | 1999-10-18 | 1999-10-18 | Microwave dielectric ceramic composition |
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| JP4699581B2 true JP4699581B2 (en) | 2011-06-15 |
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| JP4795550B2 (en) * | 2000-11-20 | 2011-10-19 | 日本特殊陶業株式会社 | Microwave dielectric ceramic composition and dielectric resonator |
| JP4694775B2 (en) * | 2003-07-18 | 2011-06-08 | 日本特殊陶業株式会社 | Low temperature fired dielectric porcelain |
| JP4691876B2 (en) * | 2003-07-25 | 2011-06-01 | 株式会社村田製作所 | High frequency dielectric ceramic composition, dielectric resonator, dielectric filter, dielectric duplexer, and communication device |
| CN100590095C (en) * | 2007-11-22 | 2010-02-17 | 郴州高斯贝尔数码科技有限公司 | Environment-friendly Microwave Dielectric Ceramics for Ka-band |
| JP5349146B2 (en) * | 2009-06-08 | 2013-11-20 | 京セラ株式会社 | Dielectric ceramics and dielectric resonator |
| CN103073285B (en) * | 2013-01-14 | 2017-05-31 | 江苏江佳电子股份有限公司 | A kind of low-loss microwave dielectric ceramic with medium dielectric constant and its preparation technology |
| CN104270116A (en) * | 2014-09-16 | 2015-01-07 | 张家港保税区灿勤科技有限公司 | Tuning screw, manufacturing technology thereof and L-waveband LC tunable filter with tuning screw |
| CN107010942B (en) * | 2017-03-30 | 2020-06-09 | 郴州功田电子陶瓷技术有限公司 | Ceramic dielectric resonator for high-Q-value communication |
| CN110156465B (en) * | 2019-06-10 | 2021-12-28 | 南京信息工程大学 | Preparation method of ceramic dielectric resonator material with medium dielectric constant |
| CN111302787A (en) * | 2020-04-03 | 2020-06-19 | 厦门松元电子有限公司 | Microwave dielectric ceramic material with high Qf and high strength and preparation method thereof |
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| JP2625074B2 (en) * | 1992-06-24 | 1997-06-25 | 京セラ株式会社 | Dielectric ceramic composition and dielectric resonator |
| JPH0757537A (en) * | 1993-08-17 | 1995-03-03 | Alps Electric Co Ltd | Dielectric porcelain composition |
| JP3274950B2 (en) * | 1994-06-30 | 2002-04-15 | 京セラ株式会社 | Dielectric ceramic composition and dielectric resonator |
| KR0155066B1 (en) * | 1995-09-07 | 1998-11-16 | 김은영 | High Frequency Dielectric Magnetic Composition |
| JP4131996B2 (en) * | 1997-04-02 | 2008-08-13 | 京セラ株式会社 | Dielectric ceramic composition and dielectric resonator using the same |
| JP3559434B2 (en) * | 1997-09-30 | 2004-09-02 | 京セラ株式会社 | Method for producing dielectric porcelain composition |
| JP3744660B2 (en) * | 1997-10-30 | 2006-02-15 | 京セラ株式会社 | Dielectric ceramic composition and dielectric resonator using the same |
| JPH11322417A (en) * | 1998-05-21 | 1999-11-24 | Alps Electric Co Ltd | Dielectric ceramic composition |
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