JP4710082B2 - Method and apparatus for measuring dielectric constant using microwaves - Google Patents
Method and apparatus for measuring dielectric constant using microwaves Download PDFInfo
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本発明は、マイクロ波電力を被測定物に照射し、その被測定物の誘電率を測定する測定方法とその測定装置に関する。 The present invention relates to a measuring method for irradiating an object to be measured with microwave power and measuring a dielectric constant of the object to be measured and a measuring apparatus therefor.
マイクロ波を利用して誘電材料及び磁性材料の材料特性(複素誘電率ε、複素透磁率μ)を測定する方法として、導波管法、共振器法、自由空間法などがある。 There are a waveguide method, a resonator method, a free space method, and the like as a method for measuring material characteristics (complex dielectric constant ε, complex magnetic permeability μ) of a dielectric material and a magnetic material using a microwave.
これら測定方法の中で、共振器法は、マイクロ波電力を供給する共振器に被測定物を挿入し、摂動法に基づいて測定するもので、被測定物の挿入前後におけるマイクロ波の共振周波数や共振効果を示すQの変化を測定し、その測定値から材料特性を計算する。 Among these measurement methods, the resonator method is a method in which an object to be measured is inserted into a resonator that supplies microwave power, and measurement is performed based on the perturbation method. The resonance frequency of the microwave before and after insertion of the object to be measured. And the change in Q indicating the resonance effect is measured, and the material properties are calculated from the measured values.
したがって、この共振器法では、被測定物の材料特性が一定で、共振器内の電磁界が乱されないことの条件を仮定しているため、被測定物の平均的な材料特性値が求まるに止まる。
そのため、数回の測定を試みても材料特性の平均値が求まるにすぎず、被測定物の材料特性の偏りや被測定物温度による材料特性の変化等については測定することができなかった。
Therefore, in this resonator method, since it is assumed that the material characteristics of the object to be measured are constant and the electromagnetic field in the resonator is not disturbed, the average material characteristic value of the object to be measured can be obtained. Stop.
For this reason, even if several measurements are attempted, only an average value of the material characteristics can be obtained, and it has not been possible to measure a deviation in the material characteristics of the object to be measured, a change in the material characteristics due to the temperature of the object to be measured, or the like.
具体的には、誘電体にマイクロ波を照射した場合、誘電体に吸収される電力Pvは次式によって求まる。
Pv=5/9・fE2ε′rtanδ×10−10(w/m3)
f:周波数(Hz)
E:電界の強さ(V/m)
ε′r:比誘電率
tanδ:誘電正接
Specifically, when the dielectric is irradiated with microwaves, the power Pv absorbed by the dielectric is obtained by the following equation.
Pv = 5/9 · fE 2 ε′rtan δ × 10 −10 (w / m 3 )
f: Frequency (Hz)
E: Electric field strength (V / m)
ε′r: relative dielectric constant
tan δ: dielectric loss tangent
この式から分かる通り、ε′r、tanδの変化によって誘電体の加熱状態が大きく変わるが、これらε′rとtanδがマイクロ波の周波数や誘電体の温度に影響するために材料特性として複素誘電率εを詳細に求めることが重要となる。 As can be seen from this equation, the heating state of the dielectric changes greatly due to changes in ε'r and tan δ. Since these ε'r and tan δ affect the frequency of the microwave and the temperature of the dielectric, complex dielectrics are used as material properties. It is important to obtain the rate ε in detail.
上記した実情にかんがみ、本発明では、被測定物である誘電体の材料性の偏りや温度による材料特性の変化に対応した複素誘電率εを求めることができるマイクロ波を利用した測定方法とその測定装置を提供することを目的とする。 In view of the above situation, in the present invention, a measurement method using a microwave capable of obtaining a complex dielectric constant ε corresponding to a material property deviation of a dielectric material to be measured and a change in material properties due to temperature, and its An object is to provide a measuring device.
上記した目的を達成するため、本発明では、第1の発明として、マイクロ波電力を供給する空胴共振器内に被測定物を挿入し摂動法によって被測定物の誘電率を測定する測定方法において、少なくとも2つ以上の被測定物M1、M2・・・・・Mnを前記空胴共振器に挿入する第1工程と、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QL、被測定物各々の挿入位置の電界強度E1、E2・・・・・Enを測定する第2工程と、被測定物数に応じて被測定物の位置を変え第2工程を繰り返す第3工程と、前記ωo、ωL、Qo、QL、E1、E2・・・・・Enと空胴共振器の体積V、被測定物各々の体積△Vとより被測定物各々の誘電率を演算する第4工程とを含むことを特徴とするマイクロ波を利用した誘電率の測定方法を提案する。
In order to achieve the above object, in the present invention, as a first invention, a measurement method for measuring a dielectric constant of a measurement object by a perturbation method by inserting the measurement object into a cavity resonator for supplying microwave power In the cavity resonator, a first step of inserting at least two objects to be measured M 1 , M 2 ... M n into the cavity resonator, and before and after the objects to be measured are inserted. resonance angular frequency omega o of the microwave, ω L, Q o indicating the resonance effect, Q L, a second for measuring the
第2の発明として、上記第1の発明の測定方法において、第2工程は、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QLを測定する工程と、前記空胴共振器の縦横の長さa、L、前記共振角周波数ωo、ωL、真空の透磁率μoに基づいて被測定物の挿入位置の電界強度E1、E2・・・・・Enを計算する計算工程とからなることを特徴とするマイクロ波を利用した誘電率の測定方法を提案する。 As a second invention, in the measurement method according to the first invention, the second step includes the resonance angular frequencies ω o and ω L of the microwaves in the cavity resonator before and after the measurement object is inserted, and the resonance effect. Q o , Q L indicating the length of the cavity resonators a, L, resonance angular frequency ω o , ω L , vacuum permeability μo field strength of the position E 1, E 2 ····· proposes a method of measuring the dielectric constant using a microwave characterized by comprising a calculation step of calculating an E n.
第3の発明としては、マイクロ波電力を供給する空胴共振器内に被測定物を挿入し摂動法によって被測定物の誘電率を測定する測定方法において、被測定物の少なくとも2部所以上の仮想分割位置P1、P2・・・・・Pnを定める第1工程と、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QL、被測定物の仮想分割位置各々の電界強度E1、E2・・・・・Enを測定する第2工程と、被測定物の分割位置数に応じて被測定物の位置を変え第2工程を繰り返す第3工程と、前記ωo、ωL、Qo、QL、E1、E2・・・・・Enと空胴共振器の体積V、被測定物の仮想分割位置の体積△Vとより被測定物の分割位置各々の誘電率を演算する第4工程とを含むことを特徴とするマイクロ波を利用した誘電率の測定方法を提案する。
According to a third aspect of the present invention, there is provided a measuring method in which a measured object is inserted into a cavity resonator for supplying microwave power and the dielectric constant of the measured object is measured by a perturbation method. First division step for determining virtual division positions P 1 , P 2 ... P n, and before and after insertion of the object to be measured, resonance angular frequencies ω o , ω L , and microwave resonance frequencies of the microwaves in the cavity resonator Q o indicating the resonance effect, Q L, and a second step of measuring the virtual division position of each of the
第4の発明としては、上記第3の発明の測定方法において、第2工程は、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QLを測定する工程と、前記空胴共振器の縦横の長さa、L、前記共振角周波数ωo、ωL、真空の透磁率μoに基づいて被測定物の仮想分割位置各々の電界強度E1、E2・・・・・Enを計算する計算工程とからなることを特徴とするマイクロ波を利用した誘電率の測定方法を提案する。 As a fourth invention, in the measurement method of the third invention, in the second step, the resonance angular frequencies ω o and ω L of the microwaves in the cavity resonator before and after the measurement object is inserted, The measurement of Q o and Q L indicating the effect, the longitudinal and lateral lengths a and L of the cavity, the resonance angular frequencies ω o and ω L , and the vacuum permeability μo Suggest dielectric constant measuring method using a microwave characterized by comprising a calculation step of calculating a virtual division position of each of the electric field strength E 1, E 2 ····· E n .
第5の発明としては、上記した第1又は第3の発明の測定方法において、前記第2工程は、初期測定において共振角周波数ωo、ωL、共振効果を示すQo、QL、電界強度E1、E2・・・・・Enを測定し、初期測定以後は電界強度E1、E2・・・・・Enを測定することを特徴とするマイクロ波を利用した誘電率の測定方法を提案する。
As a fifth invention, in the measurement method of the first or third invention described above, the second step includes resonance angular frequencies ω o , ω L , Q o , Q L , and electric field indicating resonance effects in the initial measurement. the
第6の発明としては、マイクロ波電力を供給する空胴共振器内に被測定物を挿入して摂動法によって被測定物の誘電率を測定する測定装置において、前記空胴共振器に挿入する少なくとも2つ以上の被測定物と、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QL、被測定物各々の挿入位置の電界強度E1、E2・・・・・Enを測定する測定手段と、被測定物数に応じて被測定物の位置を変え前記測定手段による測定を繰り返す制御手段と、前記ωo、ωL、Qo、QL、E1、E2・・・・・Enと空胴共振器の体積V、被測定物各々の体積△Vとより被測定物各々の誘電率を計算する演算手段とからなることを特徴とするマイクロ波を利用した誘電率の測定装置を提案する。
According to a sixth aspect of the present invention, in a measuring apparatus for measuring a dielectric constant of a measured object by a perturbation method by inserting the measured object into a cavity resonator that supplies microwave power, the measured object is inserted into the cavity resonator. At least two or more objects to be measured, and before and after inserting the objects to be measured, resonance angular frequencies ω o and ω L of microwaves in the cavity resonator, Q o and Q L indicating resonance effects, and the object to be measured measuring means for measuring the field strength E 1, E 2 ····· E n for each insertion position, and a control means to repeat the measurement by said measuring means change the position of the object to be measured according to the measurement object number the ω o, ω L, Q o , Q L, E 1,
第7の発明としては、上記第6の発明の測定装置において、前記測定手段は、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QLを測定する工程と、前記空胴共振器の縦横の長さa、L、前記共振角周波数ωo、ωL、真空の透磁率μoに基づいて被測定物の挿入位置の電界強度E1、E2・・・・・Enを計算する計算手段とからなることを特徴とするマイクロ波を利用した誘電率の測定装置を提案する。 As a seventh invention, in the measurement apparatus according to the sixth invention, the measurement means is configured to measure the resonance angular frequencies ω o and ω L of the microwaves in the cavity resonator before and after the measurement object is inserted. The measurement of Q o and Q L indicating the effect, the longitudinal and lateral lengths a and L of the cavity, the resonance angular frequencies ω o and ω L , and the vacuum permeability μo Suggest dielectric constant of a measuring device using microwaves, characterized in that comprising a calculating means for calculating a field intensity E 1, E 2 ····· E n of the insertion position.
第8の発明としては、マイクロ波電力を供給する空胴共振器内に被測定物を挿入して摂動法によって被測定物の誘電率を測定する測定装置において、少なくとも2部所以上の仮想分割位置P1、P2・・・・・Pnを定めた被測定物と、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QL、被測定物の仮想分割位置各々の電界強度E1、E2・・・・・Enを測定する測定手段と、被測定物の分割位置数に応じて被測定物の位置を変え前記測定手段による測定を繰り返す制御手段と、前記ωo、ωL、Qo、QL、E1、E2・・・・・Enと空胴共振器の体積V、被測定物の仮想分割位置の体積△Vとより被測定物の分割位置各々の誘電率を計算する演算手段とからなることを特徴とするマイクロ波を利用した誘電率の測定装置を提案する。
According to an eighth aspect of the present invention, there is provided a measurement apparatus for measuring a dielectric constant of a measured object by a perturbation method by inserting the measured object into a cavity resonator that supplies microwave power, and at least two or more virtual divisions position P 1, P 2 · · · · · and P DUT of n defining the, before and after insertion of an object to be measured, the microwave resonance angular frequency omega o within said cavity resonator, omega L, the resonance effect the illustrated Q o, Q L, and measuring means for measuring a virtual division position of each of the electric field strength E 1, E 2 ····· E n of the object to be measured according to the number of the division position of the object to be measured control means for repeating the measurement by said measuring means changing the position of the object, the ω o, ω L, Q o , Q L, E 1,
第9の発明としては、上記した第8の発明の測定装置において、前記測定手段は、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QLを測定する手段と、前記空胴共振器の縦横の長さa、L、前記共振角周波数ωo、ωL、真空の透磁率μoに基づいて被測定物の仮想分割位置各々の電界強度E1、E2・・・・・Enを計算する計算手段とからなることを特徴とするマイクロ波を利用した誘電率の測定装置を提案する。 As a ninth invention, in the measurement apparatus according to the eighth invention described above, the measurement means is configured such that the resonance angular frequencies ω o , ω L , and microwave resonance frequencies of the microwave in the cavity resonator before and after the measurement object is inserted. Q o indicating the resonance effect, means for measuring the Q L, the cavity resonator of the vertical and horizontal length a, L, the resonance angular frequency omega o, omega L, the object to be measured based on the magnetic permeability μo of the vacuum Suggest dielectric constant of a measuring device using microwaves, characterized in that comprising a virtual division position of each of the electric field strength E 1, calculating means for calculating E 2 ····· E n.
第10の発明としては、上記した第6〜第9のいずれかの発明の測定装置において、前記空胴共振器としてTE103モ−ドの矩形空胴共振器を備えたことを特徴とするマイクロ波を利用した誘電率の測定装置を提案する。 According to a tenth aspect of the invention, in the measurement apparatus according to any one of the sixth to ninth aspects, a TE 103- mode rectangular cavity resonator is provided as the cavity resonator. A device for measuring dielectric constant using waves is proposed.
本発明によれば、多種類の被測定物の材料特性を同じ測定条件で測定できるので、被測定物の特定比較などにおいて有利となる他、所定値以上又は所定値以下の誘電率の被測定物を選別することができるので、不良品となる材料を知ることができる。
また、本発明によれば、被測定物の仮想分割位置各々の材料特性を測定することができるので、材料特性の偏りについても詳細にしることができる。
具体的には、被測定物の切断面の材料特定の偏りについて知ることができる。
According to the present invention, the material properties of various types of objects to be measured can be measured under the same measurement conditions, which is advantageous in specific comparison of objects to be measured, and also has a dielectric constant that is greater than or equal to a predetermined value. Since objects can be sorted out, it is possible to know a material that becomes a defective product.
Further, according to the present invention, since the material characteristics at each virtual division position of the object to be measured can be measured, the deviation of the material characteristics can be detailed.
Specifically, it is possible to know the material specific bias of the cut surface of the object to be measured.
また、温度依存性のある被測定物の材料特性は、複素誘電率εの虚数部が温度の上昇にしたがって大きく変化するが、本発明によれば、複素誘電率εの実数部と虚数部とを詳細に求めることができるから、マイクロ波加熱される誘電体の材料特性について高精度に測定することができる。 In addition, the material property of the measured object having temperature dependence changes greatly as the imaginary part of the complex dielectric constant ε increases with increasing temperature. According to the present invention, the real part and the imaginary part of the complex dielectric constant ε Therefore, it is possible to measure the material characteristics of the microwave heated dielectric material with high accuracy.
次に、本発明の実施形態について説明するが、本実施形態では摂動法にしたがって測定するため、先ず、摂動法の測定について説明する。
摂動法は、被測定物が小さく、共振器内の電磁界が被測定物の挿入前後で等しいと仮定され、マクスウェル方程式から次の式が誘導される。
Next, an embodiment of the present invention will be described. In this embodiment, since measurement is performed according to the perturbation method, measurement of the perturbation method will be described first.
In the perturbation method, it is assumed that the device under test is small and the electromagnetic field in the resonator is the same before and after insertion of the device under test, and the following equation is derived from the Maxwell equation.
ωo: 被測定物挿入前の共振角周波数
ω : 被測定物挿入後の共振角周波数
V : 共振器の体積
△V: 被測定物の体積
εo: 真空中の誘電率
εr: 比誘電率
μo: 真空中の誘磁率
Eo: 被測定物挿入前の電界
E : 被測定物挿入後の電界
Ho: 被測定物挿入前の磁界
ωo: Resonant angular frequency before the measurement object is inserted
ω: Resonant angular frequency after the measurement object is inserted
V: Volume of the resonator
ΔV: Volume of measured object
εo: Dielectric constant in vacuum
εr: relative dielectric constant
μo: Magnetic reluctance in vacuum
Eo: Electric field before measurement object is inserted
E: Electric field after measurement object is inserted
Ho: Magnetic field before measurement object is inserted
また、共振状態では電界のエネルギ−と磁界のエネルギ−とは等しいから、次式が得られる。
Further, since the electric field energy and the magnetic field energy are equal in the resonance state, the following equation is obtained.
さらに、TE103モ−ド空胴共振器を利用する場合は、共振器の中での電磁界成分がEy、Hx、Hzしか存在しないので、電磁界の各成分を次式で示すことができる。
ここで、LはZ方向の長さ、aはX方向の長さ、Cは常数である。
Further, when the TE 103 mode cavity resonator is used, the electromagnetic field components in the resonator are only Ey, Hx, and Hz, so that the electromagnetic field components can be expressed by the following equations. .
Here, L is the length in the Z direction, a is the length in the X direction, and C is a constant.
空胴共振器が共振したときの角周波数は複素数を考えると、次式となる。
ここで、添え字rとiは実数部と虚数部を表し、QLは負荷のQである。
When the complex frequency is considered, the angular frequency when the cavity resonator resonates is as follows.
Here, the subscripts r and i represent the real part and the imaginary part, and Q L is the load Q.
共振状態にある空胴共振器の内部に被測定物を挿入すると、複素共振角周波数が変化し、上記(2)式から次式が得られる。
ここで、添え字0は被測定物挿入前の状態であり、添え字1は被測定物挿入後の状態を示す。
When the object to be measured is inserted into the cavity resonator in the resonance state, the complex resonance angular frequency changes, and the following equation is obtained from the above equation (2).
Here, the
したがって、上記(2)、(5)式から次式を得ることができる。
ここでε′rとε″rは、複素誘電率の実数部と虚数部とを表わす。
Therefore, the following equation can be obtained from the above equations (2) and (5).
Here, ε′r and ε ″ r represent a real part and an imaginary part of the complex permittivity.
したがって、共振器の体積V、被測定物の体積△V、被測定物の挿入前のωo、Qo、被測定物の挿入後のωL、QLを測定し、さらに最大の電界強度Eoを求めれば、上記(6)式から複素誘電率を計算することができる。 Therefore, the volume V of the resonator, the volume ΔV of the object to be measured, ωo, Qo before insertion of the object to be measured, ω L , Q L after insertion of the object to be measured are measured, and the maximum electric field strength Eo is obtained. If it calculates | requires, a complex dielectric constant can be calculated from said (6) Formula.
次に、本発明の実施形態について図面に沿って説明する。
図1は、第1実施形態の測定方法及び測定装置として使用する空胴共振器10と、ネットワ−クアナライザ−11と、被測定物A、Bとを示し、図2は空胴共振器10の簡略拡大斜視図、図3及び図4は測定動作を説明するための空胴共振器10の簡略平面図である。
Next, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 shows a
本実施形態では、図2に示すように、空胴共振器10としてX方向の長さa=109.2mm、Y方向の長さb=27.3mm、Z方向の長さL=221.8mmの矩形空胴共振器を使用し、この空胴共振器10にTE103モ−ドでマイクロ波電力を供給するようにしてある。
In the present embodiment, as shown in FIG. 2, the
一方、本実施形態は、丸棒状の2種類の被測定物A、B(例えば、セラミックと酸化金属セラミック)を挿入口10aから空胴共振器内に挿入し、上記した摂動法にしたがってこれら被測定物A、Bの材料特性(複素誘電率)を測定する。 On the other hand, in the present embodiment, two kinds of measurement objects A and B (for example, a ceramic and a metal oxide ceramic) having a round bar shape are inserted into the cavity resonator from the insertion port 10a, and these objects are measured according to the perturbation method described above. The material properties (complex dielectric constant) of the measurement objects A and B are measured.
被測定物Aは、図3に示すように、電界が最大で磁界が零の位置として、X=a/2、Z=L/2の位置に挿入する。
この挿入位置は、TE103モ−ドのマイクロ波電力の電界Eoで、その最大振幅Aoとして次式で表わすことができる。
被測定物Bは、被測定物Aの横に挿入する。
なお、被測定物AとBの間隔は図2に示すようにdとする。
As shown in FIG. 3, the device under test A is inserted at a position where X = a / 2 and Z = L / 2, where the electric field is maximum and the magnetic field is zero.
This insertion position is an electric field Eo of microwave power of TE 103 mode, and can be expressed by the following equation as its maximum amplitude Ao.
The object to be measured B is inserted beside the object to be measured A.
Note that the distance between the objects A and B is d as shown in FIG.
そして、先ず図2に示す表示測定物A、Bの挿入条件で測定する本実施形態は、上記した摂動公式(2)から次式が得られる。
ここでVは空胴共振器10の体積、△VA、△VBは被測定物A、Bの体積、ε′rAとε′rBは被測定物AとBの複素比誘電率の実数部である。
And this embodiment which measures on the insertion conditions of the display measurement objects A and B shown in FIG. 2 first obtains the following equation from the perturbation formula (2).
Where V is the volume of the
上記(8)式を簡単にするために、ωr1−ωo/ωro=△ω、
(ε′rA−1)=△ε′rA 、(ε′rB−1)=ε′rB とすると次式となる。
この(9)式において、
In order to simplify the above equation (8), ωr 1 −ωo / ωro = Δω,
When (ε′r A −1) = Δε′r A and (ε′r B −1) = ε′r B , the following equation is obtained.
In this equation (9),
また、被測定物の挿入位置において、電界が一様と考えると、被測定物Aが最大電界位置となっているので、Eo=Aoとなり、被測定物Bの挿入位置では、E1=AoCOS(3πd/L)となる。
したがって、体積積分を行なうと次のようになる。
Further, assuming that the electric field is uniform at the insertion position of the object to be measured, since the object A to be measured is at the maximum electric field position, Eo = Ao, and E 1 = Ao at the insertion position of the object B to be measured. COS (3πd / L).
Therefore, the volume integration is as follows.
上記(9)式の摂動公式に上記(10)、(11)式を代入すると次式を得る。
Substituting the above expressions (10) and (11) into the perturbation formula of the above expression (9) yields the following expression.
本実施形態では、被測定物A、Bを図3に示すように挿入する前と後の複素共振角周波数の変化量(△ω1)を測定する。
すなわち、共振周波数やQ値の変化を測定して複素共振角周波数△ω1を求める。
その後、被測定物AとBとの位置を図4に示すように交換し、上記同様にして複素共振周波数△ω2を求める。
In the present embodiment, the amount of change (Δω 1 ) in the complex resonance angular frequency before and after the objects to be measured A and B are inserted as shown in FIG. 3 is measured.
That is, the complex resonance angular frequency Δω 1 is obtained by measuring changes in the resonance frequency and the Q value.
Thereafter, the positions of the objects to be measured A and B are exchanged as shown in FIG. 4, and the complex resonance frequency Δω 2 is obtained in the same manner as described above.
上記の測定結果と上記(12)式から次の連立方程式が得られる。
The following simultaneous equations are obtained from the above measurement results and the above equation (12).
この連立方程式を解くと、
Solving these simultaneous equations,
したがって、ε′rA=1+△ε′rAから複素誘電率の実線部が次式から求められる。
Therefore, the solid line part of the complex dielectric constant is obtained from the following equation from ε′r A = 1 + Δε′r A.
同様に複素誘電率の虚数部が次式から求められる。
Similarly, the imaginary part of the complex dielectric constant can be obtained from the following equation.
ここで、△Q=(1/QL1−1/QL2)となる。添え字1は被測定物A、Bが図3の挿入位置の場合、添え字2は被測定物A、Bが図4の挿入位置の場合である。
以上から分かる通り、二種類の被測定物A、Bのそれぞれの複素誘電率を求めることができる。
なお、電界強度Eo、E1については式(11)によって計算して求める他に測定により求めることもできる。
Here, ΔQ = (1 / Q L1 −1 / Q L2 ). Subscript 1 is when the measured objects A and B are at the insertion position in FIG. 3, and
As can be seen from the above, the complex permittivity of each of the two types of measured objects A and B can be obtained.
Incidentally, the electric field strength Eo, for E 1 can also be determined by measuring the addition obtained by calculation by Equation (11).
図5、図6は、丸棒状の4本の被測定物M1、M2、M3,M4の複素誘電率を同様に測定する第2実施形態を示す。
なお、これら図5、図6は図3、図4同様の空胴共振器10の簡略平面図である。
5 and 6 show a second embodiment in which the complex dielectric constants of four round-bar-shaped objects to be measured M 1 , M 2 , M 3 , and M 4 are similarly measured.
FIGS. 5 and 6 are simplified plan views of the
このように実施する場合は、被測定物M1〜M4の挿入位置をX、Z座標によって求める。
すなわち、図5の場合は、M1位置を(X11 、Z11)、M2位置を(X12 、Z12)、M3位置を(X13 、Z13)、M4位置を(X14 、Z14)として被測定物の挿入位置d11 、d12 、d13 、d14 を求める。
When implemented in this way, the insertion positions of the objects to be measured M 1 to M 4 are obtained from the X and Z coordinates.
That is, in the case of FIG. 5, the M1 position is (X 11 , Z 11 ), the M2 position is (X 12 , Z 12 ), the M3 position is (X 13 , Z 13 ), and the M4 position is (X 14 , Z 14). ), The insertion positions d 11 , d 12 , d 13 and d 14 of the object to be measured are obtained.
このように、被測定物の挿入位置が定まれば、被測定物M1〜M4間の距離を特定することができるから、特定距離を上式(15)、(16)のdとして、ε′r1 、ε′r2 、ε′r3 、ε′r4 を導き出し、被測定物M1〜M4各々の複素誘電率を求めることができる。 Thus, if the insertion position of the object to be measured is determined, the distance between the objects to be measured M 1 to M 4 can be specified. Therefore, the specific distance is defined as d in the above formulas (15) and (16). ε′r 1 , ε′r 2 , ε′r 3 , and ε′r 4 can be derived to determine the complex dielectric constant of each of the objects to be measured M 1 to M 4 .
図7及び図8は第3実施形態を示す。
本実施形態は、一つの被測定物21を空胴共振器10に挿入し、この被測定物21の内部を複数の部分に分け、各部分の複素誘電率を測定す構成としてある。
7 and 8 show a third embodiment.
In the present embodiment, a single device under
図7は、被測定物21を載置する回転板22の一例を示し、この回転板22は空胴共振器10内で回転軸23を中心に間欠的に回転させるように設けてある。
すなわち、この回転板22を間欠的に回転させ、各々の回転位置で複素共振角周波数の変化量△ωを測定する。
FIG. 7 shows an example of a
That is, the rotating
図8は、被測定物21の仮想的な分割状態を示し、P1 、P2 ・・・・・・Pnは仮想分割区分(分割位置)を示す。
なお、分割区分数は任意に定めることができる。
また、このように分割した仮想分割区分P1 、P2 ・・・・・Pnの各々の位置については上記したと同様にXZ座標にしたがって求めることができる。
FIG. 8 shows a virtual division state of the
Note that the number of divisions can be arbitrarily determined.
Further, the positions of the virtual divided sections P 1 , P 2 ... Pn divided in this way can be obtained according to the XZ coordinates in the same manner as described above.
このように構成した本実施形態では、回転板22を僅かづつm回転(1回転以内)し、この回転位置毎に被測定物21の挿入前後の共振角周波数の変化量△ω1 、△ω2 ・・・・・△ωmを測定する。
これより、上記(9)式にしたがって次式を得る。
ただし、添え字1〜mは測定回数、△V1〜△Vnは仮想分割区分の体積、E11〜E1n〜Em1〜Emnは仮想分割区分各々の電界強度である。
In the present embodiment configured as described above, the
From this, the following equation is obtained according to the equation (9).
However, subscripts 1 to m are the number of measurements, ΔV 1 to ΔVn are the volumes of the virtual divided sections, and E 11 to E 1n to E m1 to E mn are the electric field strengths of the virtual divided sections.
したがって、上記(15)式及び(16)式と同様にして上記(17)式より複素誘電率の実数部ε′r1 、ε′r2 ・・・・・ε′rn と虚数部ε″r1 、ε″r2 ・・・・・ε″rn を求めることができる。
なお、測定回数mと仮想分割区分数nとの関係が、m≧nの場合に測定可能となるが、例えば、m回の各式を、例えば、最小二乗法を適用して誤差の合計が最小となるε′r1 〜ε′rn を求めることができる。
Therefore, in the same manner as the above equations (15) and (16), the real part ε′r 1 , ε′r 2 ... Ε′r n of the complex permittivity and the imaginary part ε from the above equation (17). "r 1, ε" it is possible to obtain the r 2 ····· ε "r n.
Note that the relationship between the number of times of measurement m and the number of virtual division sections n can be measured when m ≧ n. For example, each equation of m times can be calculated by applying, for example, the least square method to obtain the total error. it can be obtained ε'r 1 ~ε'r n that minimizes.
セラミック、酸化金属セラミックなどの金属材の他に、食材、木材、コンクリ−トなどの内部水分の状態などについて測定するための測定方法と測定装置に利用することができる。 In addition to metal materials such as ceramics and metal oxide ceramics, it can be used in measurement methods and measuring devices for measuring the state of internal moisture such as foods, wood, concrete, and the like.
10 空胴共振器
10a 挿入口
11 ネットワ−クアナライザ−
22 回転板
A、B、M1 〜M4 、21 被測定物
P1〜Pn 仮想分割区分
10 Cavity Resonator
22 Rotating plates A, B, M 1 to M 4 , 21 DUTs P 1 to Pn Virtual division
Claims (10)
少なくとも2つ以上の被測定物M1、M2・・・・・Mnを前記空胴共振器に挿入する第1工程と、
被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QL、被測定物各々の挿入位置の電界強度E1、E2・・・・・Enを測定する第2工程と、
被測定物数に応じて被測定物の位置を変え第2工程を繰り返す第3工程と、
前記ωo、ωL、Qo、QL、E1、E2・・・・・Enと空胴共振器の体積V、被測定物各々の体積△Vとより被測定物各々の誘電率を演算する第4工程とを含むことを特徴とするマイクロ波を利用した誘電率の測定方法。 In a measurement method for measuring the dielectric constant of a measured object by a perturbation method by inserting the measured object into a cavity resonator that supplies microwave power,
A first step of inserting at least two or more measured objects M 1 , M 2 ... M n into the cavity resonator;
Before and after the insertion of the object to be measured, the resonance angular frequencies ω o and ω L of the microwaves in the cavity resonator, Q o and Q L indicating the resonance effect, and the electric field intensity E 1 at each insertion position of the object to be measured, a second step of measuring the E 2 ····· E n,
A third step in which the position of the object to be measured is changed according to the number of objects to be measured and the second step is repeated;
Wherein ω o, ω L, Q o , Q L, E 1, E 2 ····· E n and the cavity resonator volume V, each more DUT and the volume △ V of the object each dielectric A dielectric constant measuring method using microwaves, comprising: a fourth step of calculating a rate.
第2工程は、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QLを測定する工程と、前記空胴共振器の縦横の長さa、L、前記共振角周波数ωo、ωL、真空の透磁率μoに基づいて被測定物の挿入位置の電界強度E1、E2・・・・・Enを計算する計算工程とからなることを特徴とするマイクロ波を利用した誘電率の測定方法。 The measuring method according to claim 1,
The second step is a step of measuring the resonant angular frequencies ω o , ω L of the microwaves in the cavity resonator and Q o , Q L indicating the resonance effect before and after inserting the object to be measured; Electric field strengths E 1 , E 2 ... E n at the insertion position of the object to be measured based on the longitudinal and lateral lengths a and L of the resonator, the resonance angular frequencies ω o and ω L , and the vacuum permeability μo. A method for measuring a dielectric constant using a microwave, characterized by comprising a calculation step of calculating
被測定物の少なくとも2部所以上の仮想分割位置P1、P2・・・・・Pnを定める第1工程と、
被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QL、被測定物の仮想分割位置各々の電界強度E1、E2・・・・・Enを測定する第2工程と、
被測定物の分割位置数に応じて被測定物の位置を変え第2工程を繰り返す第3工程と、
前記ωo、ωL、Qo、QL、E1、E2・・・・・Enと空胴共振器の体積V、被測定物の仮想分割位置の体積△Vとより被測定物の分割位置各々の誘電率を演算する第4工程とを含むことを特徴とするマイクロ波を利用した誘電率の測定方法。 In a measurement method for measuring the dielectric constant of a measured object by a perturbation method by inserting the measured object into a cavity resonator that supplies microwave power,
A first step of determining virtual division positions P 1 , P 2 ... P n at least at two or more locations of the object to be measured;
Before and after the insertion of the object to be measured, the resonance angular frequencies ω o and ω L of the microwaves in the cavity resonator, Q o and Q L indicating the resonance effect, and the electric field intensity E 1 at each virtual division position of the object to be measured a second step of measuring the E 2 · · · · · E n,
A third step of repeating the second step by changing the position of the measurement object according to the number of division positions of the measurement object;
Wherein ω o, ω L, Q o , Q L, E 1, E 2 ····· E n and the cavity resonator volume V, the virtual division more DUT and the volume △ V position of the object And a fourth step of calculating a dielectric constant at each of the divided positions. A method for measuring a dielectric constant using microwaves.
第2工程は、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QLを測定する工程と、前記空胴共振器の縦横の長さa、L、前記共振角周波数ωo、ωL、真空の透磁率μoに基づいて被測定物の仮想分割位置各々の電界強度E1、E2・・・・・Enを計算する計算工程とからなることを特徴とするマイクロ波を利用した誘電率の測定方法。 In the measuring method according to claim 3,
The second step is a step of measuring the resonant angular frequencies ω o , ω L of the microwaves in the cavity resonator and Q o , Q L indicating the resonance effect before and after inserting the object to be measured; Based on the longitudinal and lateral lengths a and L of the resonator, the resonance angular frequencies ω o and ω L , and the vacuum magnetic permeability μo, the electric field strengths E 1 , E 2. method of measuring the dielectric constant using a microwave characterized by comprising a calculation step of calculating an E n.
前記第2工程は、初期測定において共振角周波数ωo、ωL、共振効果を示すQo、QL、電界強度E1、E2・・・・・Enを測定し、初期測定以後は電界強度E1、E2・・・・・Enを測定することを特徴とするマイクロ波を利用した誘電率の測定方法。 In the measurement method according to claim 1 or 3,
The second step is the resonance angular frequency omega o at the initial measurement, omega L, Q o indicating the resonance effect, Q L, the electric field strength E 1, by measuring the E 2 · · · · · E n, initial measurement after the dielectric constant measuring method using microwaves and measuring the electric field strength E 1, E 2 ····· E n .
前記空胴共振器に挿入する少なくとも2つ以上の被測定物と、
被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QL、被測定物各々の挿入位置の電界強度E1、E2・・・・・Enを測定する測定手段と、
被測定物数に応じて被測定物の位置を変え前記測定手段による測定を繰り返す制御手段と、
前記ωo、ωL、Qo、QL、E1、E2・・・・・Enと空胴共振器の体積V、被測定物各々の体積△Vとより被測定物各々の誘電率を計算する演算手段とからなることを特徴とするマイクロ波を利用した誘電率の測定装置。 In a measuring device that measures the dielectric constant of a measured object by a perturbation method by inserting the measured object into a cavity resonator that supplies microwave power,
At least two objects to be measured inserted into the cavity resonator;
Before and after the insertion of the object to be measured, the resonance angular frequencies ω o and ω L of the microwaves in the cavity resonator, Q o and Q L indicating the resonance effect, and the electric field intensity E 1 at each insertion position of the object to be measured, and measurement means for measuring the E 2 ····· E n,
Control means for changing the position of the object to be measured according to the number of objects to be measured and repeating the measurement by the measuring means;
Wherein ω o, ω L, Q o , Q L, E 1, E 2 ····· E n and the cavity resonator volume V, each more DUT and the volume △ V of the object each dielectric An apparatus for measuring a dielectric constant using a microwave, characterized by comprising a calculation means for calculating a rate.
前記測定手段は、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QLを測定する工程と、前記空胴共振器の縦横の長さa、L、前記共振角周波数ωo、ωL、真空の透磁率μoに基づいて被測定物の挿入位置の電界強度E1、E2・・・・・Enを計算する計算手段とからなることを特徴とするマイクロ波を利用した誘電率の測定装置。 The measuring apparatus according to claim 6, wherein
The measuring means measures the resonant angular frequencies ω o and ω L of microwaves in the cavity resonator before and after inserting the object to be measured, Q o and Q L indicating resonance effects, and the cavity Electric field strengths E 1 , E 2 ... E n at the insertion position of the object to be measured based on the longitudinal and lateral lengths a and L of the resonator, the resonance angular frequencies ω o and ω L , and the vacuum permeability μo. An apparatus for measuring a dielectric constant using a microwave, characterized by comprising: a calculating means for calculating
少なくとも2部所以上の仮想分割位置P1、P2・・・・・Pnを定めた被測定物と、
被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QL、被測定物の仮想分割位置各々の電界強度E1、E2・・・・・Enを測定する測定手段と、
被測定物の分割位置数に応じて被測定物の位置を変え前記測定手段による測定を繰り返す制御手段と、
前記ωo、ωL、Qo、QL、E1、E2・・・・・Enと空胴共振器の体積V、被測定物の仮想分割位置の体積△Vとより被測定物の分割位置各々の誘電率を計算する演算手段とからなることを特徴とするマイクロ波を利用した誘電率の測定装置。 In a measuring device that measures the dielectric constant of a measured object by a perturbation method by inserting the measured object into a cavity resonator that supplies microwave power,
An object to be measured in which at least two or more virtual divided positions P 1 , P 2 ... P n are determined;
Before and after the insertion of the object to be measured, the resonance angular frequencies ω o and ω L of the microwaves in the cavity resonator, Q o and Q L indicating the resonance effect, and the electric field intensity E 1 at each virtual division position of the object to be measured a measuring means for measuring the E 2 ····· E n,
Control means for changing the position of the object to be measured according to the number of division positions of the object to be measured and repeating the measurement by the measuring means;
Wherein ω o, ω L, Q o , Q L, E 1, E 2 ····· E n and the cavity resonator volume V, the virtual division more DUT and the volume △ V position of the object An apparatus for measuring a dielectric constant using a microwave, comprising: an arithmetic means for calculating a dielectric constant at each of the divided positions.
前記測定手段は、被測定物の挿入前後において、前記空胴共振器内のマイクロ波の共振角周波数ωo、ωL、共振効果を示すQo、QLを測定する手段と、前記空胴共振器の縦横の長さa、L、前記共振角周波数ωo、ωL、真空の透磁率μoに基づいて被測定物の仮想分割位置各々の電界強度E1、E2・・・・・Enを計算する計算手段とからなることを特徴とするマイクロ波を利用した誘電率の測定装置。 The measuring apparatus according to claim 8, wherein
The measurement means measures the resonance angular frequencies ω o and ω L of microwaves in the cavity resonator before and after insertion of the object to be measured, Q o and Q L indicating resonance effects, and the cavity Based on the longitudinal and lateral lengths a and L of the resonator, the resonance angular frequencies ω o and ω L , and the vacuum magnetic permeability μo, the electric field strengths E 1 , E 2. dielectric constant measuring apparatus utilizing microwaves, characterized in that comprising a calculating means for calculating a E n.
前記空胴共振器としてTE103モ−ドの矩形空胴共振器を備えたことを特徴とするマイクロ波を利用した誘電率の測定装置。
In the measuring device according to any one of claims 6 to 9,
A dielectric constant measuring apparatus using microwaves, comprising a TE 103- mode rectangular cavity resonator as the cavity resonator.
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| CN111157802A (en) * | 2020-01-03 | 2020-05-15 | 西安交通大学 | A method for measuring microwave dielectric properties of high loss materials using electric field symmetric structure |
| RU2744487C1 (en) * | 2020-07-07 | 2021-03-10 | Акционерное общество «Обнинское научно-производственное предприятие «Технология» им. А.Г.Ромашина» | Device for measuring dielectric properties of materials while heating |
| RU2811857C1 (en) * | 2023-03-17 | 2024-01-18 | Акционерное общество "Обнинское научно-производственное предприятие "Технология" им. А.Г.Ромашина" | Method for determining dielectric properties of destructive materials during heating |
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| US4861484A (en) * | 1988-03-02 | 1989-08-29 | Synlize, Inc. | Catalytic process for degradation of organic materials in aqueous and organic fluids to produce environmentally compatible products |
| JPH0370372U (en) * | 1989-11-08 | 1991-07-15 | ||
| JP3210769B2 (en) * | 1993-04-28 | 2001-09-17 | 京セラ株式会社 | Apparatus and method for measuring dielectric constant |
| JPH07120515A (en) * | 1993-08-31 | 1995-05-12 | New Oji Paper Co Ltd | Dielectric constant measuring device |
| JP3204366B2 (en) * | 1996-05-23 | 2001-09-04 | ティーディーケイ株式会社 | Waveguide device and dielectric property measuring device |
| JP3532069B2 (en) * | 1997-06-25 | 2004-05-31 | 京セラ株式会社 | How to measure surface resistance |
| JP3580695B2 (en) * | 1998-03-23 | 2004-10-27 | 京セラ株式会社 | Method for measuring dielectric constant and magnetic permeability |
| KR100762807B1 (en) * | 2003-07-31 | 2007-10-04 | 오지 세이시 가부시키가이샤 | Method and device for measuring moisture content |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111157802A (en) * | 2020-01-03 | 2020-05-15 | 西安交通大学 | A method for measuring microwave dielectric properties of high loss materials using electric field symmetric structure |
| RU2744487C1 (en) * | 2020-07-07 | 2021-03-10 | Акционерное общество «Обнинское научно-производственное предприятие «Технология» им. А.Г.Ромашина» | Device for measuring dielectric properties of materials while heating |
| RU2813651C1 (en) * | 2023-02-27 | 2024-02-14 | Акционерное общество "Обнинское научно-производственное предприятие "Технология" им. А.Г.Ромашина" | Method for determining dielectric properties of destructive materials when heated |
| RU2811857C1 (en) * | 2023-03-17 | 2024-01-18 | Акционерное общество "Обнинское научно-производственное предприятие "Технология" им. А.Г.Ромашина" | Method for determining dielectric properties of destructive materials during heating |
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