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JP4712438B2 - Gas leak visualization device - Google Patents
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JP4712438B2 - Gas leak visualization device - Google Patents

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JP4712438B2
JP4712438B2 JP2005142089A JP2005142089A JP4712438B2 JP 4712438 B2 JP4712438 B2 JP 4712438B2 JP 2005142089 A JP2005142089 A JP 2005142089A JP 2005142089 A JP2005142089 A JP 2005142089A JP 4712438 B2 JP4712438 B2 JP 4712438B2
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光仁 亀井
智恵子 西田
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Mitsubishi Electric Corp
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Description

この発明は、SFガス絶縁機器からのガス漏れを人の目で確認できるようにしたガス漏れ可視化装置に関するものである。 The present invention relates to a gas leak visualization apparatus that enables gas leaks from SF 6 gas insulation equipment to be confirmed with the human eye.

従来のSFガス漏れを検出する第1の代表的な方法として、蓄積方と呼ばれるものがある。この蓄積法は、ガス漏れ検出対象のガス絶縁機器をビニールで巻き、微量のSFガス漏れをビニール内部に濃縮させた後、濃縮されたSFガスをイオン化して検出する方法である。 As a first typical method for detecting a conventional SF 6 gas leak, there is a so-called accumulation method. This accumulation method is a method in which a gas insulating device to be detected for gas leakage is wound with vinyl , a small amount of SF 6 gas leakage is concentrated inside the vinyl, and then the concentrated SF 6 gas is ionized and detected.

また、従来のSFガス漏れを検出する第2の方法として、ガス絶縁機器周辺の大気を光音響セル内部に繰り返しサンプリングし、光音響セル内部に波長が10.6μmの光(SFガスの分光吸収波長は10.6μm)をパルス的に発信し、対象ガスのSFガスが光を吸収する時に発する音響をマイクロホンで検出することにより微量のSFガスの漏れを検出する方法が研究レベルで開示されている(例えば、非特許文献1参照)。 In addition, as a second method of detecting a conventional SF 6 gas leak, the atmosphere around the gas insulation device is repeatedly sampled inside the photoacoustic cell, and light having a wavelength of 10.6 μm (SF 6 gas spectral absorption wavelength 10.6 [mu] m) were pulsed manner transmits a detection methods research level leakage of SF 6 gas traces by SF 6 gas target gas to detect the sound emitted when absorbing light at the microphone (See, for example, Non-Patent Document 1).

さらに、従来のSFガス漏れを検出する第3の方法として、上記SFガスの分光吸収を利用するもので、高出力のレーザ光を三次元空間に放射し、周辺構造物から乱反射するレーザ光の分光吸収の有無を確認することによりSFガスの漏れを検出する方法が開示されている(例えば、非特許文献2参照)。 Furthermore, as a third method for detecting SF 6 gas leakage in the prior art, a laser that uses the spectral absorption of the SF 6 gas, radiates high-power laser light into a three-dimensional space, and diffusely reflects the surrounding structure. A method of detecting leakage of SF 6 gas by confirming the presence or absence of spectral absorption of light has been disclosed (see, for example, Non-Patent Document 2).

“レーザー分光法による絶縁劣化の予知診断”、[online]、財団法人レーザー技術総合研究所、[平成17年4月20日検索]、インターネット<URL:http:www.ilt.or.jp/menu/6-3.html>"Prediction diagnosis of insulation degradation by laser spectroscopy", [online], Laser Technology Research Institute, [Search April 20, 2005], Internet <URL: http: www.ilt.or.jp/menu /6-3.html> Tom McRae、“GasVue and the Magnesium Industry:Advanced SF6 Leak Detection”、[online]、November 2−3,2000、米国EPRI solution,Inc.、[平成17年4月20日検索]、インターネット<URL:http:www.epa.gov/highgwp/electricpower-sf6/pdf/mcraeppt.pdf>Tom McRae, “GasVue and the Magnesium Industry: Advanced SF6 Leak Detection”, [online], November 2-3, 2000, US EPRI solution, Inc. [Search April 20, 2005] Internet <URL: http: www.epa.gov/highgwp/electricpower-sf6/pdf/mcraeppt.pdf>

上記従来の第1の代表的な方法は、ビニールテープを巻いてSFガスが濃縮されるまでに長時間を要し、検査に長い時間を必要とし、また、ガス絶縁機器のどの部位から漏れているかの特定にまでは至らず、さらなる複雑な作業工程をともなう詳細診断をする必要がある場合があり、ガス漏れ検出から修理までの作業を迅速化する必要があるという課題が残されていた。 The above-mentioned conventional first typical method takes a long time to wind the vinyl tape and concentrate the SF 6 gas, requires a long time for inspection, and leaks from any part of the gas insulation equipment. However, there is a case where it is necessary to make a detailed diagnosis with a more complicated work process, and there is a problem that it is necessary to speed up the work from gas leak detection to repair. .

上記非特許文献1の方法では、分光吸収を利用するために、三次元的に大規模な構造物であるガス絶縁機器の周辺の大気を光音響セル内部へ繰り返しサンプリングする繁雑さが大きな障害となっているという課題がある。   In the method of Non-Patent Document 1, in order to use spectral absorption, the complexity of repeatedly sampling the atmosphere around the gas insulation device, which is a three-dimensional large-scale structure, into the photoacoustic cell is a major obstacle. There is a problem of becoming.

上記非特許文献2の方法では、高出力のレーザ光源と、周辺構造物から乱反射するレーザ光の分光吸収の有無を確認するための大掛かりな装置が必要であり、また、レーザ光の出力を上げることによって人体への危険があるという課題がある。   The method of Non-Patent Document 2 requires a high-power laser light source and a large-scale device for confirming the presence or absence of spectral absorption of laser light diffusely reflected from surrounding structures, and increases the output of the laser light. There is a problem that there is a danger to the human body.

この発明は、上記のような課題を解決するものであり、簡単な構成で、かつ、簡単な操作でガス漏れ検出及び漏れ箇所の特定ができ、また、人体への危険がないガス漏れ可視化装置を提供することを目的とする。   The present invention solves the above-described problems, and has a simple configuration and can easily detect a gas leak and specify a leak location with a simple operation. Moreover, the gas leak visualization apparatus has no danger to the human body. The purpose is to provide.

この発明に係るガス漏れ可視化装置は、波長が10.6μmの遠赤外光または10.6μmの遠赤外光を含む遠赤外光を放射する遠赤外光源
上記遠赤外光源に対向し測定空間を挟んで直線上に隣接配置され、上記遠赤外光源から放射される遠赤外光を上記測定空間を介して受け、上記波長が10.6μmの遠赤外光のみを透過する遠赤外フィルタ
上記遠赤外フィルタの対面に配置され、上記遠赤外フィルタを透過した遠赤外光を検出する遠赤外光電素子
上記遠赤外光電素子の出力を画面表示信号に変換し画面表示する処理・表示装置を一体化した可搬式の測定プローブを備え、
上記測定プローブをSFガス絶縁機器のガス漏れを検出したい部位に接近させて、上記遠赤外光電素子からの出力を上記処理・表示装置に画面表示し上記SFガス絶縁機器から上記測定空間内に到来するSFの存在を検出するものである。
Gas leak visualization device according to the present invention includes a far infrared light source wavelength radiating far infrared light including far-infrared light in the far-infrared light or 10.6 [mu] m of 10.6 [mu] m,
Opposite the far-infrared light source and adjacently arranged on a straight line across the measurement space, receive far-infrared light emitted from the far-infrared light source through the measurement space, and the wavelength is 10.6 μm. and the far-infrared filter that transmits only infrared light,
A far-infrared photoelectric element that is disposed on the opposite side of the far-infrared filter and detects far-infrared light transmitted through the far-infrared filter;
Comprising the far-infrared transportable measuring probe the output of the photoelectric element integrating the processing and display device for converting a screen displayed on the screen display signal,
The measurement probe is brought close to the site where gas leakage of the SF 6 gas insulation device is to be detected , the output from the far infrared photoelectric element is displayed on the processing / display device, and the measurement space from the SF 6 gas insulation device is displayed. The presence of SF 6 coming in is detected.

この発明に係るガス漏れ可視化装置によれば、簡単な構成で、かつ、簡単な操作でガス漏れ検出部位を特定することができ、修理作業までの迅速化を図ることができ、かつ、人体への危険がないガス漏れ可視化装置とすることができる。   According to the gas leak visualization apparatus according to the present invention, it is possible to identify the gas leak detection site with a simple configuration and simple operation, to speed up the repair work, and to the human body. It can be set as the gas leak visualization apparatus without the danger of.

また、簡単な構成であるので、可搬式とすることができる。   Moreover, since it is a simple structure, it can be made portable.

実施の形態1.
図1は、この発明に係るガス漏れ可視化装置の実施の形態1を示す斜視図である。図1に示したように、実施の形態1におけるガス漏れ可視化装置は、測定プローブ1を備えている。
Embodiment 1 FIG.
FIG. 1 is a perspective view showing Embodiment 1 of a gas leak visualization apparatus according to the present invention. As shown in FIG. 1, the gas leakage visualization apparatus according to Embodiment 1 includes a measurement probe 1.

測定プローブ1は、SFガス20の分光吸収波長である10.6μmの遠赤外光を含む遠赤外光10を放射する遠赤外光源2、遠赤外光源2から放射された遠赤外光を空間を介して受ける遠赤外フィルタ3及び遠赤外フィルタ3を通過した遠赤外光を検出する遠赤外光電素子4、遠赤外光電素子4の出力を画面表示信号に変換して出力の強度情報を色表示、数値表示、あるいは棒グラフによるレベル表示等によって表示する処理・表示装置5を備えている。 The measurement probe 1 includes a far-infrared light source 2 that emits far-infrared light 10 including far-infrared light of 10.6 μm that is the spectral absorption wavelength of the SF 6 gas 20, and far-red light emitted from the far-infrared light source 2. Far-infrared filter 3 that receives external light through space, far-infrared photoelectric element 4 that detects far-infrared light that has passed through far-infrared filter 3, and the output of far-infrared photoelectric element 4 is converted into a screen display signal. Then, a processing / display device 5 for displaying output intensity information by color display, numerical display, level display by a bar graph, or the like is provided.

遠赤外光源2から空間に放射された遠赤外光は、遠赤外フィルタ3によって10.6μmの遠赤外光のみが選択され、遠赤外光電素子4に入射する。このような構成において、測定プローブ1をガス絶縁機器のガス漏れを検出したい部位に接近させると、ガス漏れがある場合には、遠赤外光源2と遠赤外フィルタ3及び遠赤外光電素子4の対との間の空間にSFガスが到来し、10.6μmの遠赤外光がSFガスに吸収され、遠赤外光電素子4の出力が減少する。 As far-infrared light radiated from the far-infrared light source 2 to the space, only the far-infrared light of 10.6 μm is selected by the far-infrared filter 3 and enters the far-infrared photoelectric element 4. In such a configuration, when the measurement probe 1 is brought close to a portion where gas leakage of the gas insulation device is desired to be detected, if there is a gas leakage, the far infrared light source 2, the far infrared filter 3, and the far infrared photoelectric element. SF 6 gas arrives in the space between the four pairs, 10.6 μm of far-infrared light is absorbed by SF 6 gas, and the output of the far-infrared photoelectric element 4 decreases.

この実施の形態1によれば、簡単な構成で、かつ、簡単な操作でガス漏れ検出部位を特定することができ、ガス漏れ検出から修理までの作業の迅速化を図ることができ、かつ、人体への危険もないガス漏れ可視化装置を提供することができる。   According to the first embodiment, it is possible to identify a gas leak detection site with a simple configuration and simple operation, to speed up the work from gas leak detection to repair, and It is possible to provide a gas leakage visualization device that is free from danger to the human body.

また、簡単な構成であるので、可搬式とすることができる。   Moreover, since it is a simple structure, it can be made portable.

実施の形態2.
上記実施の形態1において、SFガスの漏れは遠赤外光電素子4の出力減少によって可視化されるが、遠赤外光源2の劣化や汚損、空間への異物侵入などによっても遠赤外光電素子4の出力減少が生じる。
Embodiment 2. FIG.
In the first embodiment, the SF 6 gas leakage is visualized by a decrease in the output of the far-infrared photoelectric element 4, but the far-infrared photoelectric leak is also caused by the deterioration or fouling of the far-infrared light source 2 and the entry of foreign matter into the space. The output of the element 4 is reduced.

図2は、この発明に係るガス漏れ可視化装置の実施の形態2を示す斜視図である。図2に示したように、この実施の形態2では、上記実施の形態1の構成に加えて、遠赤外光源2から空間に放射された遠赤外光を受ける第2の遠赤外フィルタ7、第2の遠赤外フィルタ7を通過した遠赤外光を検出する第2の遠赤外光電素子6及び補正装置8を備える。第2の遠赤外フィルタ7は、SFガスが吸収しない10.6μmの遠赤外光以外の遠赤外光を透過する。補正装置8は、遠赤外光電素子4の出力を補正する。すなわち、例えば、空間に異物が到来し、遠赤外光電素子4の出力及び第2の遠赤外光電素子6の出力が同じように減少した場合は、遠赤外光電素子4の出力に対して補正装置8により補正値が加えられて処理・表示装置5にSFガスの漏れなしの表示がなされる。また、第2の遠赤外光電素子6の出力は減少せず、遠赤外光電素子4の出力のみが減少した場合は、遠赤外光電素子4の出力に対して補正装置8により補正値が加えられずに処理・表示装置5にSFガスの漏れが発生していることが表示される。 FIG. 2 is a perspective view showing Embodiment 2 of the gas leakage visualization apparatus according to the present invention. As shown in FIG. 2, in the second embodiment, in addition to the configuration of the first embodiment, a second far-infrared filter that receives far-infrared light emitted from the far-infrared light source 2 into space. 7. A second far-infrared photoelectric element 6 that detects far-infrared light that has passed through the second far-infrared filter 7 and a correction device 8 are provided. The second far-infrared filter 7 transmits far-infrared light other than 10.6 μm far-infrared light that is not absorbed by the SF 6 gas. The correction device 8 corrects the output of the far infrared photoelectric element 4. That is, for example, when a foreign substance arrives in the space and the output of the far-infrared photoelectric element 4 and the output of the second far-infrared photoelectric element 6 decrease in the same way, the output of the far-infrared photoelectric element 4 Then, the correction value is added by the correction device 8 and the processing / display device 5 is displayed with no leakage of SF 6 gas. When the output of the second far-infrared photoelectric element 6 does not decrease and only the output of the far-infrared photoelectric element 4 decreases, the correction device 8 corrects the output of the far-infrared photoelectric element 4. Is displayed on the processing / display device 5 indicating that SF 6 gas has leaked.

以上のように、この実施の形態2によれば、遠赤外光源2の劣化や汚損、空間への異物侵入などのガス漏れ以外の要因による誤判断を抑制し、ガス漏れのみを可視化することができる。   As described above, according to the second embodiment, it is possible to suppress misjudgment due to factors other than gas leakage such as deterioration and contamination of the far-infrared light source 2 and entry of foreign matter into the space, and visualize only gas leakage. Can do.

実施の形態3.
図3及び図4は、この発明に係るガス漏れ可視化装置の実施の形態3を示す平面図である。
Embodiment 3 FIG.
3 and 4 are plan views showing Embodiment 3 of the gas leak visualization apparatus according to the present invention.

上記実施の形態1及び2では遠赤外光電素子4が1個の例を示したが、この実施の形態3では、図3及び図4に示したように、遠赤外フィルタと遠赤外光電素子とのペアをm行×n列のマトリクス状に配列し、遠赤外光電素子の出力により処理・表示装置により表示される光電素子絵素9は(m,n)で特定するものとし、同図では5行×5列のマトリクスを例示している。   In the first and second embodiments, an example in which the far-infrared photoelectric element 4 is one is shown. However, in the third embodiment, as shown in FIGS. 3 and 4, a far-infrared filter and a far-infrared filter are used. The pairs of photoelectric elements are arranged in a matrix of m rows × n columns, and the photoelectric element picture elements 9 displayed by the processing / display device by the output of the far infrared photoelectric elements are specified by (m, n). In the figure, a matrix of 5 rows × 5 columns is illustrated.

図4は、ガス漏れが検出され、表示された状態を示している。同図で、黒塗り部がSFガスの検出濃度が高く、斜線部は黒塗り部よりSFガスの検出濃度が低く、白抜き部はSFガスが検出されていない部分を示している。同図では、黒塗り部(5,2)から漏れたSFガスが上方の斜線部の方へ広がっていく様相を示している。 FIG. 4 shows a state where a gas leak is detected and displayed. In the figure, the black portion shows a higher detected concentration of SF 6 gas, the shaded portion shows a lower detected concentration of SF 6 gas than the black portion, and the white portion shows a portion where SF 6 gas is not detected. . In the same figure, the SF 6 gas leaked from the black coating portion (5, 2) is shown to spread toward the upper shaded portion.

以上のように、この実施の形態3によれば、ガス漏れ部のピンポイント標定ができるとともに、ガス漏れの様相を確認することができる。   As described above, according to the third embodiment, it is possible to pinpoint the gas leakage portion and to confirm the aspect of gas leakage.

なお、上記実施の形態1〜3において、遠赤外光源を10.6μmの遠赤外光のみを放射する光源としてもよいが、遠赤外フィルタは外光等の影響を考慮すれば必須のものである。   In the first to third embodiments, the far-infrared light source may be a light source that emits only 10.6 μm far-infrared light, but the far-infrared filter is indispensable if the influence of external light or the like is taken into consideration. Is.

本発明に係るガス漏れ可視化装置は、SFガス絶縁機器からのガス漏れがどの部位で発生しているかを検出し、人の目で確認できるようにすることに有効に利用できる。 The gas leak visualization device according to the present invention can be effectively used to detect in which part gas leak from the SF 6 gas insulation device is generated and to be confirmed with the human eye.

この発明に係るガス漏れ可視化装置の実施の形態1を示す斜視図である。It is a perspective view which shows Embodiment 1 of the gas leak visualization apparatus which concerns on this invention. この発明に係るガス漏れ可視化装置の実施の形態2を示す斜視図である。It is a perspective view which shows Embodiment 2 of the gas leak visualization apparatus which concerns on this invention. この発明に係るガス漏れ可視化装置の実施の形態3を示す平面図である。It is a top view which shows Embodiment 3 of the gas leak visualization apparatus which concerns on this invention. この発明に係るガス漏れ可視化装置の実施の形態3を示す平面図である。It is a top view which shows Embodiment 3 of the gas leak visualization apparatus which concerns on this invention.

符号の説明Explanation of symbols

1 測定プローブ、2 遠赤外光源、3 遠赤外フィルタ、4 遠赤外光電素子、
5 処理・表示装置、6 第2遠赤外光電素子、7 第2遠赤外フィルタ、
8 補正装置、9 光電素子絵素、10 遠赤外光、20 漏れSF
1 measurement probe, 2 far infrared light source, 3 far infrared filter, 4 far infrared photoelectric element,
5 processing / display device, 6 second far infrared photoelectric element, 7 second far infrared filter,
8 Correction device, 9 Photoelectric element picture element, 10 Far infrared light, 20 Leakage SF 6 .

Claims (3)

波長が10.6μmの遠赤外光または10.6μmの遠赤外光を含む遠赤外光を放射する遠赤外光源
上記遠赤外光源に対向し測定空間を挟んで直線上に隣接配置され、上記遠赤外光源から放射される遠赤外光を上記測定空間を介して受け、上記波長が10.6μmの遠赤外光のみを透過する遠赤外フィルタ
上記遠赤外フィルタの対面に配置され、上記遠赤外フィルタを透過した遠赤外光を検出する遠赤外光電素子
上記遠赤外光電素子の出力を画面表示信号に変換し画面表示する処理・表示装置を一体化した可搬式の測定プローブを備え、
上記測定プローブをSFガス絶縁機器のガス漏れを検出したい部位に接近させて、上記遠赤外光電素子からの出力を上記処理・表示装置に画面表示し、上記SFガス絶縁機器から上記測定空間内に到来するSFの存在を検出することを特徴とするガス漏れ可視化装置。
And far-infrared light source wavelength radiating far infrared light including far-infrared light in the far-infrared light or 10.6 [mu] m of 10.6 [mu] m,
Opposite the far-infrared light source and adjacently arranged on a straight line across the measurement space, receive far-infrared light emitted from the far-infrared light source through the measurement space, and the wavelength is 10.6 μm. and the far-infrared filter that transmits only infrared light,
A far-infrared photoelectric element that is disposed on the opposite side of the far-infrared filter and detects far-infrared light transmitted through the far-infrared filter;
Comprising the far-infrared transportable measuring probe the output of the photoelectric element integrating the processing and display device for converting a screen displayed on the screen display signal,
The measurement probe is brought close to a part where SF 6 gas insulation equipment is desired to detect gas leakage, the output from the far-infrared photoelectric device is displayed on the processing / display device, and the measurement is performed from the SF 6 gas insulation equipment. A gas leak visualization apparatus, characterized by detecting the presence of SF 6 arriving in space.
上記測定プローブは、上記遠赤外光源から放射された10.6μmの遠赤外光を含む遠赤外光を上記測定空間を介して受け、上記遠赤外光源が放射する上記波長が10.6μmの遠赤外光以外の遠赤外光を透過する第2遠赤外フィルタ、及び上記第2遠赤外フィルタと対をなし、上記第2遠赤外フィルタを透過した遠赤外光を検出する第2遠赤外光電素子が設けられ、上記第2遠赤外光電素子の出力と上記遠赤外光電素子の出力とを比較して、上記遠赤外光電素子の出力におけるSFガスのガス漏れ以外の要因による出力を補正する補正装置を備えたことを特徴とする請求項1記載のガス漏れ可視化装置。 The measurement probe receives far-infrared light including 10.6 μm far-infrared light emitted from the far-infrared light source through the measurement space, and the wavelength emitted by the far-infrared light source is 10. The far-infrared light that forms a pair with the second far-infrared filter that transmits far-infrared light other than 6 μm far-infrared light and the second far-infrared filter, and that has passed through the second far-infrared filter. A second far-infrared photoelectric element to be detected is provided, and the output of the second far-infrared photoelectric element is compared with the output of the far-infrared photoelectric element, and SF 6 gas at the output of the far-infrared photoelectric element is compared. The gas leakage visualization device according to claim 1, further comprising a correction device that corrects an output caused by a factor other than the gas leakage. 上記測定プローブは、上記遠赤外フィルタと上記遠赤外光電素子との対が、マトリクス状に配列され、上記処理・表示装置には、上記遠赤外光電素子それぞれの出力を画面表示する絵素がマトリクス状に配列されていることを特徴とする請求項1記載のガス漏れ可視化装置。 In the measurement probe, pairs of the far-infrared filter and the far-infrared photoelectric element are arranged in a matrix, and the processing / display device displays a picture of each output of the far-infrared photoelectric element on the screen. 2. The gas leakage visualization apparatus according to claim 1, wherein the elements are arranged in a matrix.
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