JP4801103B2 - プラズマ発生装置 - Google Patents
プラズマ発生装置 Download PDFInfo
- Publication number
- JP4801103B2 JP4801103B2 JP2008023801A JP2008023801A JP4801103B2 JP 4801103 B2 JP4801103 B2 JP 4801103B2 JP 2008023801 A JP2008023801 A JP 2008023801A JP 2008023801 A JP2008023801 A JP 2008023801A JP 4801103 B2 JP4801103 B2 JP 4801103B2
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- Prior art keywords
- plasma
- electrode
- workpiece
- discharge port
- outer housing
- Prior art date
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- 238000012545 processing Methods 0.000 description 14
- 238000004381 surface treatment Methods 0.000 description 9
- 239000007789 gas Substances 0.000 description 8
- 230000008569 process Effects 0.000 description 8
- 238000001816 cooling Methods 0.000 description 6
- 238000003754 machining Methods 0.000 description 6
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- 230000006866 deterioration Effects 0.000 description 3
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- 238000006243 chemical reaction Methods 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
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- 239000002699 waste material Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32798—Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
- H01J37/32816—Pressure
- H01J37/32834—Exhausting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32522—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32541—Shape
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
Description
図1に示すように、被加工物1の局所領域に対してアッシングまたは食刻などのプラズマ加工が行われる場合、プラズマ発生装置によって発生して垂直方向に噴出されるプラズマが加工領域以外の周辺領域にも広がることになる。よって、局所的なプラズマ加工が必要であるにもかかわらず、被加工物の加工領域が(図に符号3で示す)不要に拡張して精密な加工を達成しにくい問題点があった。
以上説明した本発明の好ましい実施例は例示の目的で開示したもので、本発明が属する技術分野で通常の知識を持った者であれば、本発明の技術的思想を逸脱しない範囲内でいろいろに置換、変形、及び変更可能であり、このような置換、変更などは本発明の特許請求範囲に属するものである。
2 発生熱
3 被加工物の加工部位
10 第1電極
20 第2電極
30 誘電体
40 プラズマ排出口
50 外部ハウジング
60 吸入口
70 ダンパー(damper)
80 排気口
90 冷却部
Claims (5)
- プラズマ発生装置であって、
電源放電電圧が印加される第1電極、及び前記第1電極に付着されるかまたは第1電極を取り囲む形態の誘電体でなる第1電極部、
前記第1電極部から所定間隔離隔して設置され、前記第1電極部と対向する面の反対側の面から突出するように伸びるプラズマ排出口を有する第2電極、及び
前記プラズマ排出口の周辺を開放しつつ、前記第1電極部及び第2電極の周囲を取り囲む外部ハウジング、を含み、
前記外部ハウジングとプラズマ排出口との間の間隙でもって、微細物質を吸い込む吸入口を形成すること
を特徴とする、プラズマ発生装置。 - 前記プラズマ排出口は、スリット状であることを特徴とする、請求項1に記載のプラズマ発生装置。
- 前記プラズマ排出口は、ホール状であることを特徴とする、請求項1に記載のプラズマ発生装置。
- 前記吸入口を通じて微細物質を吸いこむダンパー、及び前記微細物質を前記外部ハウジングの外部に排出する排気口をさらに含むことを特徴とする、請求項1に記載のプラズマ発生装置。
- 前記外部ハウジングに冷却部をさらに設けたことを特徴とする、請求項1に記載のプラズマ発生装置。
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2007-0012129 | 2007-02-06 | ||
| KR1020070012129A KR100875233B1 (ko) | 2007-02-06 | 2007-02-06 | 돌출된 플라즈마 배출구 주위에 흡입구가 형성된 플라즈마발생장치 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008192618A JP2008192618A (ja) | 2008-08-21 |
| JP4801103B2 true JP4801103B2 (ja) | 2011-10-26 |
Family
ID=39752484
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008023801A Expired - Fee Related JP4801103B2 (ja) | 2007-02-06 | 2008-02-04 | プラズマ発生装置 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP4801103B2 (ja) |
| KR (1) | KR100875233B1 (ja) |
| CN (1) | CN101242705A (ja) |
| TW (1) | TW200841774A (ja) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014132540A (ja) * | 2013-01-07 | 2014-07-17 | Kowa Dennetsu Keiki:Kk | プラズマ表面処理装置 |
| CN108886866B (zh) * | 2016-03-22 | 2021-04-27 | 皇家飞利浦有限公司 | 用于处理表面的冷等离子体设备 |
| WO2020250964A1 (ja) * | 2019-06-11 | 2020-12-17 | 横浜ゴム株式会社 | タイヤの洗浄方法およびタイヤの製造方法 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07326587A (ja) * | 1994-06-02 | 1995-12-12 | Hitachi Electron Eng Co Ltd | ワーク反応装置の温度調整機構 |
| JPH09263931A (ja) * | 1996-03-25 | 1997-10-07 | Agency Of Ind Science & Technol | 真空処理方法、およびその真空処理装置 |
| JP3561080B2 (ja) * | 1996-04-23 | 2004-09-02 | 松下電器産業株式会社 | プラズマ処理装置及びプラズマ処理方法 |
| JP2000045074A (ja) * | 1998-07-27 | 2000-02-15 | Komatsu Ltd | 表面処理方法 |
| JP3972970B2 (ja) * | 1998-08-06 | 2007-09-05 | 株式会社エフオーアイ | プラズマリアクタ |
| JP2001118831A (ja) | 1999-10-19 | 2001-04-27 | Nec Kansai Ltd | ドライエッチング装置 |
| JP2001127041A (ja) * | 1999-10-26 | 2001-05-11 | Matsushita Electric Ind Co Ltd | 基板のプラズマ処理装置およびプラズマ処理方法 |
| JP3366301B2 (ja) * | 1999-11-10 | 2003-01-14 | 日本電気株式会社 | プラズマcvd装置 |
| JP2001321633A (ja) * | 2000-05-18 | 2001-11-20 | Asahi Lite Optical Co Ltd | 異臭を除去する方法とその装置 |
| JP2002001099A (ja) * | 2000-06-20 | 2002-01-08 | Matsushita Electric Ind Co Ltd | プラズマ処理方法及び装置 |
| JP2002025988A (ja) * | 2000-07-07 | 2002-01-25 | Chemitoronics Co Ltd | プラズマエッチング装置 |
| JP2002237480A (ja) * | 2000-07-28 | 2002-08-23 | Sekisui Chem Co Ltd | 放電プラズマ処理方法 |
| JP2003022900A (ja) * | 2001-07-06 | 2003-01-24 | Sekisui Chem Co Ltd | 常圧パルスプラズマ処理方法 |
| JP4077704B2 (ja) * | 2001-09-27 | 2008-04-23 | 積水化学工業株式会社 | プラズマ処理装置 |
| JP2003208999A (ja) * | 2002-01-10 | 2003-07-25 | Sekisui Chem Co Ltd | 放電プラズマ処理方法及びその装置 |
| JP2003318000A (ja) * | 2002-04-19 | 2003-11-07 | Sekisui Chem Co Ltd | 放電プラズマ処理装置 |
| JP4140324B2 (ja) * | 2002-09-10 | 2008-08-27 | 住友金属鉱山株式会社 | 金属ホウ化物粉末及びその製造方法 |
| JP3686662B1 (ja) * | 2003-05-14 | 2005-08-24 | 積水化学工業株式会社 | プラズマ処理装置 |
| JP4420690B2 (ja) * | 2004-02-04 | 2010-02-24 | ホソカワミクロン株式会社 | 微粒子製造方法及び微粒子製造装置 |
| JP2005260186A (ja) * | 2004-03-15 | 2005-09-22 | Sharp Corp | プラズマプロセス装置 |
| WO2006103945A1 (ja) * | 2005-03-28 | 2006-10-05 | Mitsubishi Denki Kabushiki Kaisha | 無声放電式プラズマ装置 |
| JP5168907B2 (ja) * | 2007-01-15 | 2013-03-27 | 東京エレクトロン株式会社 | プラズマ処理装置、プラズマ処理方法及び記憶媒体 |
-
2007
- 2007-02-06 KR KR1020070012129A patent/KR100875233B1/ko not_active Expired - Fee Related
-
2008
- 2008-02-04 JP JP2008023801A patent/JP4801103B2/ja not_active Expired - Fee Related
- 2008-02-05 TW TW097104684A patent/TW200841774A/zh not_active IP Right Cessation
- 2008-02-13 CN CNA2008100099030A patent/CN101242705A/zh active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| TW200841774A (en) | 2008-10-16 |
| KR20080073471A (ko) | 2008-08-11 |
| TWI369158B (ja) | 2012-07-21 |
| CN101242705A (zh) | 2008-08-13 |
| KR100875233B1 (ko) | 2008-12-19 |
| JP2008192618A (ja) | 2008-08-21 |
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