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JP4803545B2 - Straightness measurement method and apparatus - Google Patents
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JP4803545B2 - Straightness measurement method and apparatus - Google Patents

Straightness measurement method and apparatus Download PDF

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JP4803545B2
JP4803545B2 JP2005339103A JP2005339103A JP4803545B2 JP 4803545 B2 JP4803545 B2 JP 4803545B2 JP 2005339103 A JP2005339103 A JP 2005339103A JP 2005339103 A JP2005339103 A JP 2005339103A JP 4803545 B2 JP4803545 B2 JP 4803545B2
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measurement
stage
sensor
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JP2007147331A (en
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李  和樹
高三 山田
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Nihon University
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Description

本発明は、マイクロ機械要素の運動誤差の測定などに用いられる真直度測定方法及び装置に関する。   The present invention relates to a straightness measurement method and apparatus used for measuring a movement error of a micromechanical element.

直進運動するステージ(物体)が図10のような運動軌跡(運動誤差)を示したときに,この軌跡を平行な2平面I,IIで挟んだときの2平面の最小な間隔fをJISでは運動の真直度と定義している.
このような運動誤差を測定する方法として、従来逐次2点法がある。
When the stage (object) that moves linearly shows a motion trajectory (motion error) as shown in FIG. 10, the minimum interval f between the two planes when this trajectory is sandwiched between two parallel planes I and II is defined in JIS It is defined as the straightness of the movement.
As a method for measuring such a movement error, there is a conventional sequential two-point method.

図11は、逐次2点法の原理を示す説明図である。   FIG. 11 is an explanatory diagram showing the principle of the sequential two-point method.

逐次2点法では、2つのセンサA,Bを、移動可能なステージ101に固定し,ステージ101以外の場所に固定した測定基準物103との相対変位をこれら2つのセンサA,Bを用いて測定する。この測定値より、測定基準物103の形状誤差105とステージの運動誤差107とを独立に求めることができる。   In the sequential two-point method, two sensors A and B are fixed to a movable stage 101, and relative displacement with a measurement reference object 103 fixed at a place other than the stage 101 is used by using these two sensors A and B. taking measurement. From this measurement value, the shape error 105 of the measurement reference object 103 and the stage movement error 107 can be obtained independently.

さらに説明すると、図11に示した測定開始点(右端の点)を0とし,2つのセンサA,Bの間隔dの刻みでステージを右方向に送るときに,基準線(理想的な直線)109に対するステージの変位をX,X,・・・とする。
一方,測定基準物103はステージ101の基準線109と平行な直線111を基準とし,ステージ101の0位置におけるセンサBに対応する測定基準物103の変位をY,Y,・・・とする.
K番目のステージ位置における変位X,Y,XK+1,YK+1に対し,センサA,Bの出力VKA,VKBであるとすると,次のような関係が導かれる.
0B−V0A=Y−X
1A−V0A=Y−X1B−V0B=Y−Y−X
2A−V0A=Y−X2B−V0B=Y−Y−X
従って、K番目の位置における一般項は下記のようになる.
KA−V0A=Y−X(K−1)B−V0B=Y−Y−X
上述した関係からステージ101と測定基準物103の変位X,Yを下記のように表すことができる.
=V(K−1)B−VKA+X
=V(K−1)B−V(K−1)A+Y
ここで,初期値としてX=0,Y=0の値を与えることにより,X,Yから順にX,Y求めることができ,ステージの運動誤差を定量的に測定・評価することが可能となる。
More specifically, when the measurement start point (right end point) shown in FIG. 11 is set to 0 and the stage is sent in the right direction at intervals d between the two sensors A and B, the reference line (ideal straight line) The displacement of the stage with respect to 109 is assumed to be X 1 , X 2 ,.
On the other hand, the measurement reference object 103 is based on a straight line 111 parallel to the reference line 109 of the stage 101, and the displacement of the measurement reference object 103 corresponding to the sensor B at the 0 position of the stage 101 is expressed as Y 1 , Y 2 ,. Do it.
Assuming that the outputs V KA and V KB of the sensors A and B with respect to the displacements X K , Y K , X K + 1 and Y K + 1 at the K-th stage position, the following relationship is derived.
V 0B −V 0A = Y 1 −X 0
V 1A -V 0A = Y 1 -X 1 V 1B -V 0B = Y 2 -Y 1 -X 1
V 2A -V 0A = Y 2 -X 2 V 2B -V 0B = Y 3 -Y 1 -X 2
Thus, the general term at the Kth position is
V KA -V 0A = Y K -X K V (K-1) B -V 0B = Y K -Y 1 -X K - 1
From the relationship described above, the displacements X K and Y K of the stage 101 and the measurement reference object 103 can be expressed as follows.
X K = V (K-1 ) B -V KA + X K - 1
Y K = V (K-1 ) B -V (K-1) A + Y K - 1
Here, by giving values of X 0 = 0 and Y 0 = 0 as initial values, X K and Y K can be obtained in order from X 1 and Y 1 , and the stage motion error is measured and evaluated quantitatively. It becomes possible to do.

しかし、従来の逐次2点法では、ステージ101の移動距離と2つのセンサA,Bの間隔が問題となる。すなわち、測定間隔dが2つのセンサA,Bの大きさに依存するため,測定対象であるステージ101の移動距離が小さい場合には測定が困難となる。   However, in the conventional sequential two-point method, the moving distance of the stage 101 and the distance between the two sensors A and B are problematic. That is, since the measurement interval d depends on the sizes of the two sensors A and B, measurement becomes difficult when the moving distance of the stage 101 as the measurement target is small.

また、ステージ101の寸法と2つのセンサA,Bの寸法との関係が問題となり、測定対象であるステージ101が小さい場合には,ここに2つのセンサA,Bを固定することができず、測定が困難となる。   Further, the relationship between the dimension of the stage 101 and the dimensions of the two sensors A and B becomes a problem, and when the stage 101 to be measured is small, the two sensors A and B cannot be fixed here. Measurement becomes difficult.

特開2001−157951号公報JP 2001-157951 A

解決しようとする問題点は、測定対象の移動距離、或いは測定対象が小さい場合には測定が困難になるという点である。   The problem to be solved is that the measurement distance becomes difficult when the movement distance of the measurement object or the measurement object is small.

本発明は、測定対象の移動距離、或いは測定対象が小さい場合でも測定を可能とするため、固定された測定基準物と、測定基準物に沿って所定の測定間隔で直線移動及び停止可能なステージと、前記ステージ上に設けた移動機構に支持され前記測定基準物の表面形状及び前記ステージの運動軌跡間の相対変位を検出する単一の変位センサとを備え、前記ステージは、前記変位センサを前記移動機構により前記測定間隔に応じ一方のセンサ位置から他方のセンサ位置へ任意に移動可能かつ前記各センサ位置で位置決め可能とし、前記変位センサを前記一方のセンサ位置に位置決め前記ステージを前記測定間隔で移動及び停止させて前記相対変位の測定を行うと共に、前記変位センサを前記他方のセンサ位置へ移動させて位置決め前記ステージを前記測定間隔で繰り返し移動及び停止させて前記相対変位の測定を行うことで前記相対変位の測定を前記測定間隔毎の各2点で行い、前記測定間隔毎の各2点の測定結果に基づき前記測定基準物の形状誤差及び前記ステージの運動誤差を求めることを真直度測定方法の特徴とする。 The present invention enables measurement even when the moving distance of the measuring object or the measuring object is small , and can be moved and stopped linearly at a predetermined measuring interval along a fixed measuring reference object. A stage, and a single displacement sensor that is supported by a moving mechanism provided on the stage and detects a relative displacement between a surface shape of the measurement reference object and a movement locus of the stage, and the stage includes the displacement sensor The moving mechanism can be arbitrarily moved from one sensor position to the other sensor position according to the measurement interval and can be positioned at each sensor position, and the displacement sensor is positioned at the one sensor position. The stage is moved and stopped at intervals to measure the relative displacement, and the displacement sensor is moved to the other sensor position for positioning. The relative displacement is measured by repeatedly moving and stopping at the measurement interval to measure the relative displacement at each of the two points for each measurement interval, and based on the measurement results of each of the two points for each measurement interval The straightness measurement method is characterized by obtaining the shape error of the measurement reference object and the movement error of the stage .

また、固定された測定基準物と、測定基準物に沿って所定の測定間隔で直線移動及び停止可能なステージと、前記ステージ上に設けた移動機構に支持され前記測定基準物の表面形状及び前記ステージの運動軌跡間の相対変位を検出する単一の変位センサとを備え、前記ステージは、前記変位センサを前記移動機構により前記測定間隔に応じ一方のセンサ位置から他方のセンサ位置へ任意に移動可能かつ前記各センサ位置で位置決め可能とし、前記変位センサを前記一方のセンサ位置に位置決め前記ステージを前記測定間隔で移動及び停止させて前記相対変位の測定を行うと共に、前記変位センサを前記他方のセンサ位置へ移動させて位置決め前記ステージを前記測定間隔で繰り返し移動及び停止させて前記相対変位の測定を行うことで前記相対変位の測定を前記測定間隔毎の各2点で行い、前記測定間隔毎の各2点の測定結果に基づき前記測定基準物の形状誤差及び前記ステージの運動誤差を求めることを真直度測定装置の特徴とする。 Further, a fixed measurement reference object , a stage that can be linearly moved and stopped at a predetermined measurement interval along the measurement reference object, a surface shape of the measurement reference object supported by a moving mechanism provided on the stage, and A single displacement sensor for detecting a relative displacement between the movement trajectories of the stage, and the stage arbitrarily moves the displacement sensor from one sensor position to the other sensor position according to the measurement interval by the moving mechanism. The displacement sensor is movable and can be positioned at each sensor position, the displacement sensor is positioned at the one sensor position, the stage is moved and stopped at the measurement interval, the relative displacement is measured, and the displacement sensor is moved to the other sensor position. The relative displacement is measured by repeatedly moving and stopping the stage at the measurement interval. Perform measurements versus displacement in the two points of each of the measurement interval, based on said measurement result of each two points for each measurement interval the metric object straightness measuring device to seek motion errors of shape error and the stage of It is characterized by.

本発明の真直度測定方法は、固定された測定基準物と、測定基準物に沿って所定の測定間隔で直線移動及び停止可能なステージと、前記ステージ上に設けた移動機構に支持され前記測定基準物の表面形状及び前記ステージの運動軌跡間の相対変位を検出する単一の変位センサとを備え、前記ステージは、前記変位センサを前記移動機構により前記測定間隔に応じ一方のセンサ位置から他方のセンサ位置へ任意に移動可能かつ前記各センサ位置で位置決め可能とし、前記変位センサを前記一方のセンサ位置に位置決め前記ステージを前記測定間隔で移動及び停止させて前記相対変位の測定を行うと共に、前記変位センサを前記他方のセンサ位置へ移動させて位置決め前記ステージを前記測定間隔で繰り返し移動及び停止させて前記相対変位の測定を行うことで前記相対変位の測定を前記測定間隔毎の各2点で行い、前記測定間隔毎の各2点の測定結果に基づき前記測定基準物の形状誤差及び前記ステージの運動誤差を求めるため、可動体の移動距離、或いは可動体が小さい場合でも測定を行うことができる。 The straightness measurement method of the present invention is supported by a fixed measurement reference object , a stage that can be linearly moved and stopped along the measurement reference object at a predetermined measurement interval, and a moving mechanism provided on the stage. A single displacement sensor for detecting a relative displacement between the surface shape of the measurement reference object and the movement locus of the stage, and the stage moves the displacement sensor from one sensor position according to the measurement interval by the moving mechanism. The position can be arbitrarily moved to the other sensor position and can be positioned at each sensor position, the displacement sensor is positioned at the one sensor position, the stage is moved and stopped at the measurement interval, and the relative displacement is measured. The displacement sensor is moved to the other sensor position and the positioning stage is repeatedly moved and stopped at the measurement interval to Perform measurements of the relative displacement by the constant in each two points of each of the measurement interval, obtains the motion errors of shape error and the stage of the metric object on the basis of the measurement result of the two points of each of the measurement interval Therefore, even when the moving distance of the movable body or the movable body is small, the measurement can be performed.

本発明の真直度測定装置は、固定された測定基準物と、測定基準物に沿って所定の測定間隔で直線移動及び停止可能なステージと、前記ステージ上に設けた移動機構に支持され前記測定基準物の表面形状及び前記ステージの運動軌跡間の相対変位を検出する単一の変位センサとを備え、前記ステージは、前記変位センサを前記移動機構により前記測定間隔に応じ一方のセンサ位置から他方のセンサ位置へ任意に移動可能かつ前記各センサ位置で位置決め可能とし、前記変位センサを前記一方のセンサ位置に位置決め前記ステージを前記測定間隔で移動及び停止させて前記相対変位の測定を行うと共に、前記変位センサを前記他方のセンサ位置へ移動させて位置決め前記ステージを前記測定間隔で繰り返し移動及び停止させて前記相対変位の測定を行うことで前記相対変位の測定を前記測定間隔毎の各2点で行い、前記測定間隔毎の各2点の測定結果に基づき前記測定基準物の形状誤差及び前記ステージの運動誤差を求めることができる。 The straightness measuring apparatus of the present invention is supported by a fixed measurement reference object , a stage that can be linearly moved and stopped at a predetermined measurement interval along the measurement reference object , and a moving mechanism provided on the stage. A single displacement sensor for detecting a relative displacement between the surface shape of the measurement reference object and the movement locus of the stage, and the stage moves the displacement sensor from one sensor position according to the measurement interval by the moving mechanism. The position can be arbitrarily moved to the other sensor position and can be positioned at each sensor position, the displacement sensor is positioned at the one sensor position, the stage is moved and stopped at the measurement interval, and the relative displacement is measured. The displacement sensor is moved to the other sensor position and the positioning stage is repeatedly moved and stopped at the measurement interval to Perform measurements of the relative displacement by the constant in each two points of each of the measurement interval, obtains the motion errors of shape error and the stage of the metric object on the basis of the measurement result of the two points of each of the measurement interval be able to.

測定対象の移動距離、或いは測定対象が小さい場合でも測定を可能にするという目的を、可動体又は固定体の2点についての相対変位の測定を可動体の移動を繰り返して各別に行わせることにより実現した。   For the purpose of enabling measurement even when the measurement object is moved or the measurement object is small, by measuring the relative displacement of the two points of the movable body or the fixed body separately by repeating the movement of the movable body It was realized.

図1,図2は、本発明の実施例1に係る真直度測定方法及び装置の原理を示す説明図である。   1 and 2 are explanatory views showing the principle of a straightness measurement method and apparatus according to Embodiment 1 of the present invention.

[真直度測定装置]
本実施例の真直度測定装置は、測定基準物1を例えばブロックゲージ等で構成し、可動体を、直線移動可能な1軸のステージ3とした。ステージ3には、例えば単一のセンサ支持部5が備えられ、センサ支持部5は、ステージ3上の移動機構により、センサ位置A1からセンサ位置B1まで任意に移動し、制御された任意の位置で変位センサ7を位置決めすることができる。移動機構は、微細なレールにセンサ支持部5を支持し、センサ支持部5を微細なラック・ピニオン機構及びモータにより駆動するようなものである。但し、移動機構の構造は、任意であり、手動による移動機構も可能である。
[Straightness measuring device]
In the straightness measuring apparatus of the present embodiment, the measurement reference object 1 is constituted by a block gauge, for example, and the movable body is a uniaxial stage 3 that can move linearly. The stage 3 is provided with, for example, a single sensor support portion 5. The sensor support portion 5 is arbitrarily moved from the sensor position A1 to the sensor position B1 by a moving mechanism on the stage 3, and is controlled at an arbitrary position. Thus, the displacement sensor 7 can be positioned. The moving mechanism is such that the sensor support 5 is supported on a fine rail, and the sensor support 5 is driven by a fine rack and pinion mechanism and a motor. However, the structure of the moving mechanism is arbitrary, and a manual moving mechanism is also possible.

ステージ3は、測定基準物1に沿って一定の測定間隔d1で直線移動および停止可能となっている。測定間隔d1は、センサ位置A1,B1の間隔に対応し、ステージ3の大きさ、移動距離に合わせて任意に変更することができる。   The stage 3 can be linearly moved and stopped along the measurement reference object 1 at a constant measurement interval d1. The measurement interval d1 corresponds to the interval between the sensor positions A1 and B1, and can be arbitrarily changed according to the size of the stage 3 and the movement distance.

前記ステージ3のセンサ支持部5には、固定体及び可動体の表面形状及び運動軌跡間の相対変位を検出する変位センサ7が着脱自在に支持されている。変位センサ7は、例えばレーザ変位計、渦電流型変位計、静電容量型変位計等で構成されている。この内、レーザ変位計は、測定範囲(スポット径)が小さく、最も適している。   A displacement sensor 7 for detecting the relative displacement between the surface shapes of the fixed body and the movable body and the movement locus is detachably supported on the sensor support portion 5 of the stage 3. The displacement sensor 7 includes, for example, a laser displacement meter, an eddy current displacement meter, a capacitance displacement meter, and the like. Of these, the laser displacement meter is most suitable because it has a small measurement range (spot diameter).

前記ステージ3の2点、例えばセンサ位置A1,B1における前記測定基準物1及びステージ3の表面形状及び運動軌跡間の相対変位を、前記測定間隔d1毎に測定した結果に基づき前記測定基準物1の形状誤差及びステージ3の運動誤差を求めている。   Based on the measurement result of the relative displacement between the surface shape and the motion trajectory of the measurement reference object 1 and the stage 3 at two points on the stage 3, for example, sensor positions A1 and B1, based on the measurement interval d1. And the movement error of the stage 3 are obtained.

測定した形状誤差、運動誤差は、ディスプレイに表示して確認し、或いは工作機械の制御に用いることもできる。   The measured shape error and motion error can be confirmed by displaying them on a display or used for controlling a machine tool.

[真直度測定方法]
前記相対変位の測定間隔d1毎の測定は、前記ステージ3のセンサ位置A1,B1についてステージ3の移動を繰り返し前記変位センサ7をセンサ位置A1,B1に各別に配置して行う。本実施例では、前記相対変位の測定間隔d1毎の測定を、前記ステージ3の1点であるセンサ位置A1に前記変位センサ7を配置し、ステージ3を測定間隔d1で移動させて位置0〜K番目まで行った後、他の1点であるセンサ位置B1に前記変位センサ7を配置して、測定間隔d1でステージ3を繰り返し移動させ位置0〜K番目まで行う。
[Straightness measurement method]
The relative displacement is measured at each measurement interval d1 by repeatedly moving the stage 3 at the sensor positions A1 and B1 of the stage 3 and disposing the displacement sensors 7 at the sensor positions A1 and B1, respectively. In the present embodiment, the measurement of the relative displacement at every measurement interval d1 is performed by disposing the displacement sensor 7 at the sensor position A1, which is one point of the stage 3, and moving the stage 3 at the measurement interval d1. After performing up to the Kth, the displacement sensor 7 is arranged at the other one sensor position B1, and the stage 3 is repeatedly moved at the measurement interval d1 until the position 0 to the Kth.

従って、相対変位の測定間隔d1毎の測定は、ステージ3を測定間隔d1で移動させ位置0〜K番目まで繰り返して各別に行わせる。すなわち、相対変位の測定間隔d1毎の測定を、ステージ3のセンサ位置A1について行った後、他のセンサ位置B1について行う方法を採っている。   Accordingly, the measurement of the relative displacement at every measurement interval d1 is performed separately by moving the stage 3 at the measurement interval d1 and repeating from the position 0 to the Kth position. That is, a method is adopted in which measurement is performed for each sensor position B1 after measuring the relative displacement measurement interval d1 for the sensor position A1 of the stage 3.

さらに説明すると、図1に示すように変位センサ7をセンサ支持部5に支持させ、センサ位置A1に配置する。ステージ3を一定測定間隔d1で移動させ、位置0〜K番目までステージ3と測定基準物1との相対変位を測定する.その後,図2に示すようにセンサ支持部5を移動させ、変位センサ7をセンサ位置B1にずらし、同様に、位置0〜K番目まで繰り返して測定を行い、
=V(K−1)B−VKA+X
=V(K−1)B−V(K−1)A+Y
の関係を用いてX,Yを順次測定する。従って、本実施例の真直度測定方法は、従来の逐次2点法に対し繰り返し2点法といえる。
More specifically, as shown in FIG. 1, the displacement sensor 7 is supported by the sensor support portion 5 and is arranged at the sensor position A1. The stage 3 is moved at a constant measurement interval d1, and the relative displacement between the stage 3 and the measurement reference object 1 is measured from the position 0 to the Kth position. Thereafter, as shown in FIG. 2, the sensor support 5 is moved, the displacement sensor 7 is shifted to the sensor position B1, and similarly, measurement is repeated from position 0 to position K.
X K = V (K-1 ) B -V KA + X K - 1
Y K = V (K-1 ) B -V (K-1) A + Y K - 1
X K and Y K are sequentially measured using the relationship. Therefore, the straightness measurement method of the present embodiment can be said to be a repetitive two-point method with respect to the conventional sequential two-point method.

図3は、従来の逐次2点法と繰り返し2点法との比較を示す説明図であり、(a)は、逐次2点法、(b)は、繰り返し2点法である。   FIG. 3 is an explanatory diagram showing a comparison between a conventional sequential two-point method and a repeated two-point method, in which (a) is a sequential two-point method and (b) is a repeated two-point method.

図3(a)(b)の実線はステージの運動誤差を示し、●は、ステージの測定間隔毎の位置を示す。   The solid lines in FIGS. 3A and 3B indicate the stage movement error, and ● indicates the position of the stage at every measurement interval.

図3(a)のように、逐次2点法では、ステージの運動距離(測定間隔)がセンサ間隔の影響を受けるため、一定以上に測定間隔を小さくすることができていない。これに対し、図3(b)のように、繰り返し2点法では、ステージ3の運動距離(測定間隔)がセンサ間隔の影響を受けないため、さらに細かい測定間隔で測定することができた。   As shown in FIG. 3A, in the sequential two-point method, the movement distance (measurement interval) of the stage is affected by the sensor interval, and thus the measurement interval cannot be reduced beyond a certain level. On the other hand, as shown in FIG. 3B, in the repetitive two-point method, the movement distance (measurement interval) of the stage 3 is not affected by the sensor interval, so that it was possible to measure at a finer measurement interval.

[ステージが小さい場合]
ステージ3が小さい場合には,変位センサ7をステージ3の上に固定することができないため,変位センサ7と測定基準物1との位置関係を入れ替える。すなわち,変位センサ7をステージ3以外の固定側に配置し,測定基準物1をステージ3上に固定する。この場合,測定基準物1は、ステージ3の大きさに準じた大きさのものを作成する。また,変位センサ7をセンサ位置A1からセンサ位置B1に移す動作は、前記のようにモータを用いた移動機構或いは手動による移動機構で行われる。従って、測定基準物7が可動体となり、変位センサ7の取付相手が固定体となる。
[When stage is small]
When the stage 3 is small, the displacement sensor 7 cannot be fixed on the stage 3, so that the positional relationship between the displacement sensor 7 and the measurement reference object 1 is switched. That is, the displacement sensor 7 is arranged on the fixed side other than the stage 3, and the measurement reference object 1 is fixed on the stage 3. In this case, the measurement reference object 1 having a size according to the size of the stage 3 is created. Further, the operation of moving the displacement sensor 7 from the sensor position A1 to the sensor position B1 is performed by the moving mechanism using the motor or the manually moving mechanism as described above. Therefore, the measurement reference object 7 becomes a movable body, and the mounting counterpart of the displacement sensor 7 becomes a fixed body.

この場合の測定原理は,基本的には従来の逐次2点法と同様であるが,変位センサ7と測定基準物1との移動関係が入れ替わったため,次のようになる。   The measurement principle in this case is basically the same as that of the conventional sequential two-point method, but is as follows because the movement relationship between the displacement sensor 7 and the measurement reference object 1 is switched.

図4,5は、センサ位置A1とセンサ位置B1とにおける測定の概要を示す説明図である。   4 and 5 are explanatory diagrams showing an outline of measurement at the sensor position A1 and the sensor position B1.

前記の方法と同様に,K番目のセンサ位置における変位X+Y,XK+K+1とセンサの出力VKA,VKBとの関係は次のようになる。
+Y+=V0A+Y=V0B
+Y+=V1A+Y=V1B
従って、一般式を次のように表すことができる。
Similar to the above method, the relationship between the displacements X K + Y K and X K + X K + 1 at the K-th sensor position and the sensor outputs V KA and V KB is as follows.
X 0 + Y 0 + = V 0A X 0 + Y 1 = V 0B
X 1 + Y 1 + = V 1A X 1 + Y 2 = V 1B
Therefore, the general formula can be expressed as follows.

+Y=V(K−1)A+Y=V(K−1)B
この関係から、X,Yを次のように表すことができる。
X K - 1 + Y K - 1 = V (K-1) A X K - 1 + Y K = V (K-1) B
From this relationship, X K and Y K can be expressed as follows.

=VKAー(K−1)B−+X
=V(K−1)B−V(K−1)A+Y
ここで,従来の方法と同様に初期値X=0,Y=0を設定することにより、X,Yを順次求めることができる。
X K = V KA over V (K-1) B - + X K - 1
Y K = V (K-1 ) B -V (K-1) A + Y K - 1
Here, X K and Y K can be obtained sequentially by setting initial values X 0 = 0 and Y 0 = 0 as in the conventional method.

[実験]
図6,図7は、前記繰り返し2点法に基づいた測定の性能を評価するための実験装置を示し、図6は、斜視図、図7は、他の方向から見た斜視図である。
[Experiment]
6 and 7 show an experimental apparatus for evaluating the performance of the measurement based on the repeated two-point method, FIG. 6 is a perspective view, and FIG. 7 is a perspective view seen from another direction.

図6のように、本装置では、測定基準物1と1軸のステージ3と測定用センサである変位センサ7とを備え、その他にトリガ用センサ9、コーナーキューブ11、レーザ測長器13を備えている。   As shown in FIG. 6, this apparatus includes a measurement reference object 1, a single-axis stage 3, and a displacement sensor 7 that is a measurement sensor. In addition, a trigger sensor 9, a corner cube 11, and a laser length measuring device 13 are provided. I have.

ステージ3は、本実験例では手動であり、矢印Eで示すように左下から右上方向に移動させる。但し、移動の向きは逆でもよい.ステージ3には、測定基準物1を固定しており,これとの相対変位をステージ以外の場所に固定した測定用の変位センサ7にて測定した。また,測定の開始点と終了点を決めるためのトリガ用センサ9を変位センサ7の反対側に固定した。一方で,ステージ3の送り方向の位置を測定するためにステージ3上にコーナーキューブ11を固定し,これを外部に固定したレーザ測長器13にて測定した。ここに示したトリガ用センサ9、コーナーキューブ11、ならびにレーザ測長器13は提案した原理を検証するために用いたものであり、必ずしも必要としない。   The stage 3 is manual in this experimental example, and is moved from the lower left to the upper right as indicated by the arrow E. However, the direction of movement may be reversed. The measurement reference object 1 is fixed on the stage 3, and the relative displacement with the measurement reference object 1 is measured by a measurement displacement sensor 7 fixed at a place other than the stage. In addition, a trigger sensor 9 for determining the measurement start point and end point is fixed to the opposite side of the displacement sensor 7. On the other hand, in order to measure the position of the stage 3 in the feeding direction, the corner cube 11 was fixed on the stage 3 and measured with a laser length measuring device 13 fixed outside. The trigger sensor 9, the corner cube 11, and the laser length measuring device 13 shown here are used for verifying the proposed principle and are not necessarily required.

上記の装置を使用し、センサ位置A1,B1の間隔を0.2mm,全移動距離5mmという条件で測定を行った。センサ位置A1とセンサ位置B1とを変えるに当たっては,ステージ3上に固定した手動ステージを用いた。   Using the above apparatus, the measurement was performed under the conditions that the distance between the sensor positions A1 and B1 was 0.2 mm and the total moving distance was 5 mm. In changing the sensor position A1 and the sensor position B1, a manual stage fixed on the stage 3 was used.

本実験より得た変位センサ7と測定基準物1との相対距離から、
=VKAー(K−1)B−+X
=V(K−1)B−V(K−1)A+Y
を用いて求めたステージ3の運動軌跡(運動誤差)と測定基準物1の形状は、図8,図9のようであった。図8は、ステージの運動軌跡を示すグラフ、図9は、測定基準物の形状を示すグラフである。
図8,図9に示すように、提案した本発明実施例の方法及び装置では、測定基準物1とステージ3との動きが干渉することなく測定できていることを確認した。その結果,ステージ3の真直度が13.4μm、測定基準物1の真直度は1.7μmであった。なお,ステージ3は、1mmの周期で大きなうねりを示しているが、これはステージ3駆動のために使用している送りねじのリードと一致しており、ねじの振れ回りに起因するものであることが分かる。
以上より、提案した本発明実施例の方法及び装置を用いると、直進運動するマイクロ機械要素の真直度を測定することができる。
From the relative distance between the displacement sensor 7 and the measurement reference object 1 obtained from this experiment,
X K = V KA over V (K-1) B - + X K - 1
Y K = V (K-1 ) B -V (K-1) A + Y K - 1
The motion trajectory (motion error) of the stage 3 and the shape of the measurement reference object 1 obtained by using FIG. 8 are as shown in FIGS. FIG. 8 is a graph showing the motion trajectory of the stage, and FIG. 9 is a graph showing the shape of the measurement reference object.
As shown in FIGS. 8 and 9, it was confirmed that the method and apparatus of the proposed embodiment of the present invention were able to measure without interference between the movement of the measurement reference object 1 and the stage 3. As a result, the straightness of the stage 3 was 13.4 μm, and the straightness of the measurement reference object 1 was 1.7 μm. The stage 3 shows a large swell with a period of 1 mm, which coincides with the lead of the feed screw used for driving the stage 3 and is caused by the swirling of the screw. I understand that.
As described above, when the proposed method and apparatus of the embodiment of the present invention is used, it is possible to measure the straightness of the micromachine element that moves straight.

[実施例の効果]
本発明実施例によれば、変位センサ7の数を従来の2つから1つにすることができ、センサ間隔によって制限されていた測定間隔を小さくすることができる。
[Effect of Example]
According to the embodiment of the present invention, the number of displacement sensors 7 can be reduced from the conventional two to one, and the measurement interval limited by the sensor interval can be reduced.

変位センサ7と測定基準物1との位置関係を入れ替えることにより,測定対象となるステージ3の大きさと移動距離の制限が無くなり,原理的にはマイクロメートルオーダの微小なステージ3が微小量移動する場合においても,その運動精度を測定・評価することが可能となった。   By exchanging the positional relationship between the displacement sensor 7 and the measurement reference object 1, there are no restrictions on the size and movement distance of the stage 3 to be measured, and in principle the minute stage 3 on the order of micrometers moves by a minute amount. Even in cases, it was possible to measure and evaluate the motion accuracy.

すなわち、本発明実施例の真直度測定方法は、測定基準物1及び該測定基準物1に沿って一定の測定間隔d1で直線移動および停止可能なステージ3と、前記測定基準物1及びステージ3の表面形状及び運動軌跡間の相対変位を検出する変位センサ7とを備え、前記測定基準物1又はステージ3上の2点につき前記測定間隔d1毎に測定した結果に基づき前記測定基準物1及びステージ3の形状誤差、運動誤差を求める真直度測定方法であって、前記相対変位の測定間隔毎の測定を、前記ステージ3の2点についてステージ3の移動を繰り返して各別に行うため、ステージ3の移動距離、或いはステージ3が小さい場合でも測定を行うことができる。   That is, the straightness measurement method of the embodiment of the present invention includes the measurement reference object 1 and the stage 3 that can be linearly moved and stopped along the measurement reference object 1 at a constant measurement interval d1, and the measurement reference object 1 and the stage 3 Displacement sensor 7 for detecting the relative displacement between the surface shape and the movement locus of the measurement reference object 1 or two points on the stage 3 based on the measurement results for each measurement interval d1 and the measurement reference object 1 and A straightness measurement method for obtaining a shape error and a motion error of the stage 3, wherein the measurement of the relative displacement at every measurement interval is performed separately by repeatedly moving the stage 3 at two points of the stage 3. The measurement can be performed even when the moving distance is smaller or the stage 3 is small.

前記相対変位の測定間隔d1毎の測定を、前記ステージ3の1点について行った後、他の1点について行うため、ステージ3の移動距離、或いはステージ3が小さい場合でも測定を確実に行うことができる。   Since the measurement for each relative displacement measurement interval d1 is performed for one point of the stage 3 and then for the other one point, the measurement is surely performed even when the moving distance of the stage 3 or the stage 3 is small. Can do.

本発明実施例の真直度測定装置は、測定基準物1及び該測定基準物1に沿って一定の測定間隔d1で直線移動および停止可能なステージ3と、前記測定基準物1及びステージ3の表面形状及び運動軌跡間の相対変位を検出する変位センサ7とを備え、前記ステージ3の2点につき前記測定間隔d1毎に測定した結果に基づき前記測定基準物1及びステージ3の形状誤差、運動誤差を求める真直度測定装置であって、前記相対変位の測定間隔d1毎の測定を、前記ステージ3の2点について前記ステージ3の移動を繰り返し前記変位センサを各別に配置して行うため、ステージ3の移動距離、或いはステージ3が小さい場合でも測定を行うことができる。   The straightness measuring apparatus of the embodiment of the present invention includes a measurement reference object 1 and a stage 3 that can be linearly moved and stopped along the measurement reference object 1 at a constant measurement interval d1, and the surfaces of the measurement reference object 1 and the stage 3 A displacement sensor 7 for detecting a relative displacement between the shape and the movement locus, and the shape error and the movement error of the measurement reference object 1 and the stage 3 based on the measurement result of the two points of the stage 3 at the measurement interval d1. A straightness measuring device for obtaining the relative displacement of the stage 3 in order to measure the relative displacement at every measurement interval d1 by repeatedly moving the stage 3 at two points of the stage 3 and arranging the displacement sensors separately. The measurement can be performed even when the moving distance is smaller or the stage 3 is small.

前記相対変位の測定間隔d1毎の測定を、前記ステージ3の1点に前記変位センサ7を配置して行った後、他の1点に前記変位センサ7を配置して行うため、ステージ3の移動距離、或いはステージ3が小さい場合でも測定を確実に行うことができる。   After the displacement sensor 7 is placed at one point of the stage 3 and the displacement sensor 7 is placed at another point after the measurement of the relative displacement measurement interval d1, the stage 3 Even when the moving distance or the stage 3 is small, the measurement can be reliably performed.

真直度測定方法及び装置の原理を示す説明図である(実施例1)。It is explanatory drawing which shows the principle of a straightness measuring method and an apparatus (Example 1). 真直度測定方法及び装置の原理を示す説明図である(実施例1)。It is explanatory drawing which shows the principle of a straightness measuring method and an apparatus (Example 1). 逐次2点法と繰り返し2点法との比較を示す説明図であり、(a)は、逐次2点法、(b)は、繰り返し2点法である(実施例1)。It is explanatory drawing which shows the comparison with a sequential 2 point method and a repetition 2 point method, (a) is a sequential 2 point method, (b) is a repetition 2 point method (Example 1). センサ位置A1とセンサ位置B1とにおける測定の概要を示す説明図である(実施例1)。It is explanatory drawing which shows the outline | summary of the measurement in sensor position A1 and sensor position B1 (Example 1). センサ位置A1とセンサ位置B1とにおける測定の概要を示す説明図である(実施例1)。It is explanatory drawing which shows the outline | summary of the measurement in sensor position A1 and sensor position B1 (Example 1). 繰り返し2点法に基づいた測定の性能を評価するための実験装置を示す斜視図である(実施例1)。It is a perspective view which shows the experimental apparatus for evaluating the performance of the measurement based on the two-point method repeatedly (Example 1). 他の方向から見た斜視図である(実施例1)。(Example 1) which is the perspective view seen from the other direction. ステージの運動軌跡を示すグラフである(実施例1)。It is a graph which shows the movement locus | trajectory of a stage (Example 1). 測定基準物の形状を示すグラフである(実施例1)。It is a graph which shows the shape of a measurement reference object (Example 1). 直進運動するステージ(物体)の運動軌跡(運動誤差)を示す説明図である(従来例)。It is explanatory drawing which shows the movement locus | trajectory (movement error) of the stage (object) which carries out rectilinear movement (conventional example). 逐次2点法の原理を示す説明図である(実施例1)。It is explanatory drawing which shows the principle of a sequential two-point method (Example 1).

符号の説明Explanation of symbols

1 測定基準物(固定体)
3 ステージ(可動体)
5 センサ支持部
7 変位センサ
1 Measurement standard (fixed body)
3 Stage (movable body)
5 Sensor support 7 Displacement sensor

Claims (4)

固定された測定基準物と、
測定基準物に沿って所定の測定間隔で直線移動及び停止可能なステージと、
前記ステージ上に設けた移動機構に支持され前記測定基準物の表面形状及び前記ステージの運動軌跡間の相対変位を検出する単一の変位センサとを備え、
前記ステージは、前記変位センサを前記移動機構により前記測定間隔に応じ一方のセンサ位置から他方のセンサ位置へ任意に移動可能かつ前記各センサ位置で位置決め可能とし、
前記変位センサを前記一方のセンサ位置に位置決め前記ステージを前記測定間隔で移動及び停止させて前記相対変位の測定を行うと共に、前記変位センサを前記他方のセンサ位置へ移動させて位置決め前記ステージを前記測定間隔で繰り返し移動及び停止させて前記相対変位の測定を行うことで前記相対変位の測定を前記測定間隔毎の各2点で行い、
前記測定間隔毎の各2点の測定結果に基づき前記測定基準物の形状誤差及び前記ステージの運動誤差を求める、
ことを特徴とする真直度測定方法。
A fixed metric, and
A stage that can be linearly moved and stopped at predetermined measurement intervals along the measurement reference ;
A single displacement sensor that is supported by a moving mechanism provided on the stage and detects a relative displacement between the surface shape of the measurement reference object and the movement trajectory of the stage ;
The stage can arbitrarily move the displacement sensor from one sensor position to the other sensor position according to the measurement interval by the moving mechanism and can be positioned at each sensor position.
Positioning the displacement sensor to the one sensor position The stage is moved and stopped at the measurement interval to measure the relative displacement, and the displacement sensor is moved to the other sensor position to position the stage. By measuring the relative displacement by repeatedly moving and stopping at a measurement interval, the relative displacement is measured at each of the two points for each measurement interval,
Obtaining the shape error of the measurement reference object and the movement error of the stage based on the measurement results of each two points for each measurement interval;
A straightness measurement method characterized by the above.
固定された単一の変位センサと、
該変位センサに対し所定の測定間隔で直線移動及び停止可能なステージと、
前記ステージ上に設けた移動機構に支持された測定基準物とを備え、
前記単一の変位センサは、前記測定基準物の表面形状との相対距離を検出可能とし、
前記ステージは、前記測定基準物を前記移動機構により前記測定間隔に応じ一方の被測定位置から他方の被測定位置へ任意に移動可能かつ前記各被測定位置で位置決め可能とし、
前記測定基準物を前記一方の被測定位置に位置決め前記ステージを前記測定間隔で移動及び停止させて前記相対距離の測定を行うと共に、前記測定基準物を前記他方の被測定位置へ移動させて位置決め前記ステージを前記測定間隔で繰り返し移動及び停止させて前記相対距離の測定を行うことで前記相対距離の測定を前記測定間隔毎の各2点で行い、
前記測定間隔毎の各2点の測定結果に基づき前記測定基準物の形状誤差及び前記ステージの運動誤差を求める、
ことを特徴とする真直度測定方法。
A single fixed displacement sensor;
A stage capable of linear movement and stopping at a predetermined measurement interval with respect to the displacement sensor;
A measurement reference object supported by a moving mechanism provided on the stage,
The single displacement sensor can detect a relative distance from the surface shape of the measurement reference object,
The stage is capable of arbitrarily moving the measurement reference object from one measurement position to the other measurement position according to the measurement interval by the moving mechanism and positioning at each measurement position.
Positioning the measurement reference object at the one measurement position The stage is moved and stopped at the measurement interval to measure the relative distance, and the measurement reference object is moved to the other measurement position for positioning. Measuring the relative distance by repeatedly moving and stopping the stage at the measurement interval and measuring the relative distance at two points for each measurement interval,
Obtaining the shape error of the measurement reference object and the movement error of the stage based on the measurement results of each two points for each measurement interval;
A straightness measurement method characterized by the above.
固定された測定基準物と、
測定基準物に沿って所定の測定間隔で直線移動及び停止可能なステージと、
前記ステージ上に設けた移動機構に支持され前記測定基準物の表面形状及び前記ステージの運動軌跡間の相対変位を検出する単一の変位センサとを備え、
前記ステージは、前記変位センサを前記移動機構により前記測定間隔に応じ一方のセンサ位置から他方のセンサ位置へ任意に移動可能かつ前記各センサ位置で位置決め可能とし、
前記変位センサを前記一方のセンサ位置に位置決め前記ステージを前記測定間隔で移動及び停止させて前記相対変位の測定を行うと共に、前記変位センサを前記他方のセンサ位置へ移動させて位置決め前記ステージを前記測定間隔で繰り返し移動及び停止させて前記相対変位の測定を行うことで前記相対変位の測定を前記測定間隔毎の各2点で行い、
前記測定間隔毎の各2点の測定結果に基づき前記測定基準物の形状誤差及び前記ステージの運動誤差を求める、
ことを特徴とする真直度測定装置。
A fixed metric, and
A stage that can be linearly moved and stopped at predetermined measurement intervals along the measurement reference ;
A single displacement sensor that is supported by a moving mechanism provided on the stage and detects a relative displacement between the surface shape of the measurement reference object and the movement trajectory of the stage ;
The stage can arbitrarily move the displacement sensor from one sensor position to the other sensor position according to the measurement interval by the moving mechanism and can be positioned at each sensor position.
Positioning the displacement sensor to the one sensor position The stage is moved and stopped at the measurement interval to measure the relative displacement, and the displacement sensor is moved to the other sensor position to position the stage. By measuring the relative displacement by repeatedly moving and stopping at a measurement interval, the relative displacement is measured at each of the two points for each measurement interval,
Obtaining the shape error of the measurement reference object and the movement error of the stage based on the measurement results of each two points for each measurement interval;
Straightness measuring device characterized by that.
固定された単一の変位センサと、
該変位センサに対し所定の測定間隔で直線移動及び停止可能なステージと、
前記ステージ上に設けた移動機構に支持された測定基準物とを備え、
前記単一の変位センサは、前記測定基準物の表面形状との相対距離を検出可能とし、
前記ステージは、前記測定基準物を前記移動機構により前記測定間隔に応じ一方の被測定位置から他方の被測定位置へ任意に移動可能かつ前記各被測定位置で位置決め可能とし、
前記測定基準物を前記一方の被測定位置に位置決め前記ステージを前記測定間隔で移動及び停止させて前記相対距離の測定を行うと共に、前記測定基準物を前記他方の被測定位置へ移動させて位置決め前記ステージを前記測定間隔で繰り返し移動及び停止させて前記相対距離の測定を行うことで前記相対距離の測定を前記測定間隔毎の各2点で行い、
前記測定間隔毎の各2点の測定結果に基づき前記測定基準物の形状誤差及び前記ステージの運動誤差を求める、
ことを特徴とする真直度測定装置。
A single fixed displacement sensor;
A stage capable of linear movement and stopping at a predetermined measurement interval with respect to the displacement sensor;
A measurement reference object supported by a moving mechanism provided on the stage,
The single displacement sensor can detect a relative distance from the surface shape of the measurement reference object,
The stage is capable of arbitrarily moving the measurement reference object from one measurement position to the other measurement position according to the measurement interval by the moving mechanism and positioning at each measurement position.
Positioning the measurement reference object at the one measurement position The stage is moved and stopped at the measurement interval to measure the relative distance, and the measurement reference object is moved to the other measurement position for positioning. Measuring the relative distance by repeatedly moving and stopping the stage at the measurement interval and measuring the relative distance at two points for each measurement interval,
Obtaining the shape error of the measurement reference object and the movement error of the stage based on the measurement results of each two points for each measurement interval;
Straightness measuring device characterized by that.
JP2005339103A 2005-11-24 2005-11-24 Straightness measurement method and apparatus Expired - Fee Related JP4803545B2 (en)

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