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JP4835341B2 - Ultrasonic flaw detection method - Google Patents
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JP4835341B2 - Ultrasonic flaw detection method - Google Patents

Ultrasonic flaw detection method Download PDF

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JP4835341B2
JP4835341B2 JP2006247900A JP2006247900A JP4835341B2 JP 4835341 B2 JP4835341 B2 JP 4835341B2 JP 2006247900 A JP2006247900 A JP 2006247900A JP 2006247900 A JP2006247900 A JP 2006247900A JP 4835341 B2 JP4835341 B2 JP 4835341B2
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ultrasonic
transducer
flaw detection
surface layer
billet
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JP2008070189A (en
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克仁 片岡
光宏 伊藤
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Daido Steel Co Ltd
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Daido Steel Co Ltd
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Description

本発明は超音波探傷方法に関し、特に、結晶粒径が表層部で相対的に小さく内質部で相対的に大きい分布を示す材料の探傷に好適な超音波探傷方法に関する。 The present invention relates to an ultrasonic flaw detection method , and more particularly to an ultrasonic flaw detection method suitable for flaw detection of a material whose crystal grain size is relatively small in the surface layer portion and relatively large in the inner quality portion.

圧延用のビレット等では一般に結晶粒径は断面表層部(以下、単に表層部という)から断面内質部(以下、単に内質部という)までほぼ均一でその径も小さい。このような材料に対する超音波探傷は従来、平面型の送受信振動子を備えた探触子を使用して材料断面内にほぼ平行な超音波ビームを発信し、材料内の内部割れ等の欠陥部で反射された超音波を受信して受信超音波の波形より欠陥の有無判定を行っていた。   In a billet or the like for rolling, the crystal grain size is generally uniform from the cross-sectional surface layer portion (hereinafter simply referred to as the surface layer portion) to the cross-section internal portion (hereinafter simply referred to as the internal portion), and its diameter is small. Conventionally, ultrasonic flaw detection for such materials uses a probe equipped with a flat-type transmitter / receiver transducer to transmit a substantially parallel ultrasonic beam in the cross section of the material, thereby causing defects such as internal cracks in the material. The ultrasonic waves reflected by the laser beam are received and the presence / absence of a defect is determined from the waveform of the received ultrasonic waves.

この場合、送受信振動子では材料表面での超音波反射の影響で当該振動子を設けた側の材料表層部の探傷はできない(不感帯)ため、上記振動子とは反対側の材料表層部で生じた反射波を受信して材料表層部の欠陥の有無を判定していた。   In this case, the transmitter / receiver transducer cannot detect flaws on the material surface layer on the side where the transducer is provided due to the influence of ultrasonic reflection on the surface of the material (dead zone), so it occurs on the material surface layer on the opposite side of the transducer. The reflected wave was received to determine the presence or absence of a defect in the surface layer of the material.

なお、特許文献1には、材料表面に複数の振動子を設けてこれら振動子の超音波ビーム軸が材料内部の一点で集束するようにし、一つの振動子から発した超音波の反射波を他の振動子で順次受信して、受信超音波を合成することにより材料内部の欠陥を検出する超音波探傷法が示されている。
特開2005−233874
In Patent Document 1, a plurality of transducers are provided on the surface of a material so that the ultrasonic beam axes of these transducers are focused at one point inside the material, and the reflected waves of the ultrasonic waves emitted from one transducer are reflected. There is shown an ultrasonic flaw detection method in which a defect inside a material is detected by sequentially receiving with other vibrators and synthesizing received ultrasonic waves.
JP-A-2005-233874

ところで圧延用のビレットには、鋼種によってその表層部から内質部へ向けて漸次結晶粒径が大きくなる場合がある。このような内質部が粗い材料に対しては内質部での減衰が大きくなるため、振動面を球面にして発信超音波を一点に集束させるようにした送受信振動子を使用する必要がある。   By the way, in the billet for rolling, the crystal grain size may gradually increase from the surface layer portion toward the inner quality portion depending on the steel type. For such a material with a rough inner part, the attenuation in the inner part is increased, and therefore it is necessary to use a transmission / reception vibrator having a vibrating surface made spherical and focusing the transmitted ultrasonic wave at one point. .

しかし、集束効果を向上させるために上記送受信振動子の振動子サイズを大きくすると不感帯が大きくなるとともに、内質部での超音波減衰が大きいために振動子と反対側の材料表層部で生じた反射波を受信することが困難となり、材料の全断面に亘る探傷ができないという問題があった。   However, increasing the transducer size of the transmitter / receiver transducer in order to improve the focusing effect increases the dead zone, and the ultrasonic attenuation at the inner part is large, resulting in the material surface layer on the opposite side of the transducer. It is difficult to receive the reflected wave, and there is a problem that flaws cannot be detected over the entire cross section of the material.

そこで、本発明はこのような課題を解決するもので、結晶粒径が表層部で相対的に小さく内質部で相対的に大きい分布を示す材料に対してその全断面での探傷を可能にする超音波探傷方法を提供することを目的とする。 Therefore, the present invention solves such problems, and enables flaw detection in the entire cross section of a material whose crystal grain size is relatively small in the surface layer portion and relatively large in the inner quality portion. An object of the present invention is to provide an ultrasonic flaw detection method .

上記目的を達成するために、本発明の超音波探傷方法は、結晶粒径が表層部で相対的に小さく内質部で相対的に大きい分布を示す材料を探傷する超音波探傷方法であって、送信振動子の超音波ビーム軸と受信振動子の超音波ビーム軸を上記表層部内で互いに交差させて受信超音波の波形より当該表層部内における傷検出を行うとともに、送受信振動子の超音波ビームを上記内質部内で集束させて受信超音波の波形より当該内質部内における傷検出を行い、かつ上記送受信振動子の超音波周波数を上記送信振動子および受信振動子の超音波周波数に比して相対的に低くする。 In order to achieve the above object, the ultrasonic flaw detection method of the present invention is an ultrasonic flaw detection method for flaw detection of a material having a crystal grain size that is relatively small in the surface layer portion and relatively large in the inner quality portion. The ultrasonic beam axis of the transmitting transducer and the ultrasonic beam axis of the receiving transducer intersect each other in the surface layer portion to detect a flaw in the surface layer portion from the waveform of the received ultrasonic wave, and the ultrasonic beam of the transmitting / receiving transducer the ratio in the ultrasonic frequency of the flaw detecting There line, and the transmission and reception transducers of the ultrasonic the transmission oscillator and receiving transducer frequency in the inner quality portion from the waveform of the received ultrasonic wave is focused at the inner membrane portion And make it relatively low.

本発明においては、送信振動子と受信振動子は超音波ビーム軸を材料の表層部内で互いに交差させてあるから、送信振動子から出力された超音波は、材料表面での反射による不感帯を生じることなく表層部中の欠陥で反射されて受信振動子に入力する。これにより、表層部内に生じた欠陥が確実に検出される。また、材料の内質部内で超音波ビームを集束させた送受信振動子から出力された超音波は内質部で減衰することなく当該内質部中の欠陥で反射されて再び送受信振動子に入力する。これにより、内質部内に生じた欠陥が確実に検出される。また、本発明では結晶粒径が相対的に大きい内質部での超音波の減衰が最小限に抑えられる。 In the present invention , since the transmission transducer and the reception transducer have the ultrasonic beam axes intersecting each other in the surface layer portion of the material, the ultrasonic wave output from the transmission transducer generates a dead zone due to reflection on the material surface. Without being reflected by the defect in the surface layer portion, it is input to the receiving vibrator. Thereby, the defect which arose in the surface layer part is detected reliably. In addition, the ultrasonic wave output from the transmitter / receiver transducer that focuses the ultrasonic beam in the inner part of the material is reflected by the defect in the inner part without being attenuated by the inner part and is input to the transmitter / receiver again. To do. Thereby, the defect which arose in the internal quality part is detected reliably. Further, in the present invention, the attenuation of the ultrasonic wave at the inner part having a relatively large crystal grain size is minimized.

なお、上記カッコ内の符号は、後述する実施形態に記載の具体的手段との対応関係を示すものである。   In addition, the code | symbol in the said parenthesis shows the correspondence with the specific means as described in embodiment mentioned later.

以上のように、本発明の超音波探傷方法によれば、結晶粒径が表層部で相対的に小さく内質部で相対的に大きい分布を示す材料に対してその全断面での探傷を良好に行うことができる。 As described above, according to the ultrasonic flaw detection method of the present invention, the flaw detection in the entire cross section is good for a material having a relatively small crystal grain size distribution in the surface layer portion and a relatively large distribution in the inner quality portion. Can be done.

図1は材料たる圧延用のビレットMに対して探触子1,2を位置させた状態を示すもので、155角〜160角の断面を有する長尺直方体形の、ビレットMの上面Maに接して内質部用と表層部用の二種類の探触子1,2が隣接して配設されている。内質部用探触子1は下方のビレット深さ方向へ超音波を出力しその反射波を受信する単一の送受信振動子11で構成されている。一方、表層部用探触子2は分割形成された送信振動子21と受信振動子22で構成されて、送信振動子21はビレット深さ方向へ超音波を出力し、受信振動子22はその反射波を受信する。そして、これら探触子1,2は図の矢印で示すようにビレット幅方向へ往復移動させられつつビレット長手方向へ移動させられてビレットMの上面Ma全面で走査させられる。各探触子1,2はそれぞれ信号処理器31,32に接続されており、信号処理器31,32はそれぞれ探触子1,2に対して発信信号を出力するとともに探触子1,2の受信信号を入力してその信号波形よりビレットM内部の割れ等の欠陥の有無を判定する。こうした隣接配設により、探傷時の操作性を向上させることができる。また、探触子を配設した面(ビレット)側の表層部を直接探傷でき、ビレット内に超音波を通して、反対側の面の表層部を探傷する場合に比して、探傷の精度を向上させることができる。    FIG. 1 shows a state in which the probes 1 and 2 are positioned with respect to a billet M for rolling, which is a material. On the upper surface Ma of the billet M having a long rectangular parallelepiped shape having a cross section of 155 to 160 squares. Two kinds of probes 1 and 2 for the inner part and the surface part are disposed adjacent to each other. The inner part probe 1 is composed of a single transmission / reception transducer 11 that outputs ultrasonic waves in the billet depth direction below and receives the reflected waves. On the other hand, the surface layer probe 2 is composed of a transmission transducer 21 and a reception transducer 22 that are formed in a divided manner. The transmission transducer 21 outputs ultrasonic waves in the billet depth direction, and the reception transducer 22 Receive reflected waves. The probes 1 and 2 are moved in the billet longitudinal direction while being reciprocated in the billet width direction as indicated by arrows in the figure, and are scanned over the entire upper surface Ma of the billet M. The probes 1 and 2 are connected to signal processors 31 and 32, respectively. The signal processors 31 and 32 output transmission signals to the probes 1 and 2, and the probes 1 and 2, respectively. The received signal is input, and the presence or absence of a defect such as a crack in the billet M is determined from the signal waveform. Such adjacent arrangement can improve the operability at the time of flaw detection. In addition, the surface layer part on the surface (billet) side where the probe is installed can be directly inspected, and the accuracy of the flaw detection is improved compared to the case where the surface layer part on the opposite surface is inspected by passing ultrasonic waves through the billet. Can be made.

ここで、本発明の被検査対象である上記ビレットMの、断面内での結晶粒径分布の一例を図2の線Xで示す。線Xは、フェライト系ステンレス鋼(JIS SUS430)の結晶粒径分布を示しており、このような鋼種では、熱処理によって結晶粒を微細化できないため、圧延によって表層部がわずかに微細化されるだけである。図より明らかなように、ビレットMはその断面内の表面から深さ方向で結晶粒径が0.2mm程度から1.6mm以上へと漸次大きくなっている。これに対して従来一般的なビレットでは、図2の線Yで示すように、その断面内で結晶粒径は表面から内部までほぼ均一で、その径も0.1mm以下と小さい。なお、線Yは、クロムモリブデン鋼(JIS SCM435)の結晶粒径分布を示している。   Here, an example of the crystal grain size distribution in the cross section of the billet M, which is the object to be inspected according to the present invention, is shown by a line X in FIG. Line X shows the grain size distribution of ferritic stainless steel (JIS SUS430). In such a steel type, the crystal grains cannot be refined by heat treatment, so the surface layer portion is only slightly refined by rolling. It is. As is apparent from the figure, the billet M has a crystal grain size that gradually increases from about 0.2 mm to 1.6 mm or more in the depth direction from the surface in the cross section. On the other hand, as shown by the line Y in FIG. 2, in the conventional general billet, the crystal grain size is almost uniform from the surface to the inside in the cross section, and the diameter is also as small as 0.1 mm or less. The line Y indicates the crystal grain size distribution of chromium molybdenum steel (JIS SCM435).

ここにおいて、本実施形態では、図3に示すように、内質部用探触子1の送受信振動子11の、振動面11aの形状を下方へ向く曲率半径200mmの円形の凹状球面とし、かつ集束効果を上げるために振動面サイズを直径40mmと大きくしてある。そして、ビレットMの内質部では前述のように結晶粒径が大きいため、出力超音波の減衰を避けるべく発信超音波の周波数は1MHzと相対的に低周波にし、加えて波数1.5〜2の広帯域波として探傷分解能を向上させている。これにより、送受信振動子11から出力された超音波はビレットMの上面(表面)Maから下方h(本実施形態では80mm)の点に集束し、表面下30〜140mmのビレット内質部の探傷を行うことができる。ここで、発信超音波の周波数は0.7〜2.0MHzの範囲とするのが良く、振動面サイズは直径30〜40mmの範囲とするのが良い。また、振動子として高強度の超音波を送受信可能なコンポジット型のものを使用するのが好ましい。このような内質部用探触子1の仕様の詳細を表1に示す。   Here, in the present embodiment, as shown in FIG. 3, the shape of the vibration surface 11 a of the transmitting / receiving transducer 11 of the inner probe 1 is a circular concave spherical surface having a radius of curvature of 200 mm facing downward, and In order to increase the focusing effect, the vibration surface size is increased to 40 mm in diameter. And since the crystal grain size is large in the inner part of the billet M as described above, the frequency of the transmitted ultrasonic wave is set to a relatively low frequency of 1 MHz in order to avoid attenuation of the output ultrasonic wave, and in addition, the wave number of 1.5 to The flaw detection resolution is improved as 2 broadband waves. Thereby, the ultrasonic wave output from the transmission / reception transducer 11 is focused from the upper surface (front surface) Ma of the billet M to a point h (80 mm in this embodiment), and flaw detection of the billet internal part 30 to 140 mm below the surface. It can be performed. Here, the frequency of the transmitted ultrasonic wave is preferably in the range of 0.7 to 2.0 MHz, and the vibration surface size is preferably in the range of 30 to 40 mm in diameter. Moreover, it is preferable to use a composite type vibrator that can transmit and receive high-intensity ultrasonic waves. Table 1 shows the details of the specifications of such an inner part probe 1.

表層部用探触子2の送信振動子21と受信振動子22の振動面21a,22aはいずれも10mmと15mmの長方形で、図4(1)に示すような短辺方向の曲率半径150mmと図4(2)に示すような長辺方向の曲率半径200mmの下方へ向く凹状面となっている。なお、図4(1)と図4(2)は振動面21a,22aを90度異なる側面方向から見たものである。本探触子2で使用する超音波の周波数は2MHzと相対的に高周波にし、加えて波数1.5〜2の広帯域波として探傷分解能をより向上させている。送信振動子21と受信振動子22は互いの超音波ビーム軸Ax,Ayを図4(1)に示すように交差させてあり、これによってビレットMの表面から下方3〜22mmの範囲に交軸範囲Rが生じて、表面下2〜30mmのビレット表層部の探傷を行うことができる。ここで、発信超音波の周波数は2.0〜5.0MHzの範囲とするのが良い。このような表層部用探触子2の仕様の詳細を表1に示す。なお、表1に示す振動子傾斜角とは、上述のように交軸範囲を探触子側に近づけるために、2つの振動子に設けた角度である。本実施形態では、図4に示すように振動子傾斜角θを7.2°に設定している。   The vibration surfaces 21a and 22a of the transmitting transducer 21 and the receiving transducer 22 of the surface layer probe 2 are 10 mm and 15 mm rectangles, respectively, and have a radius of curvature of 150 mm in the short side direction as shown in FIG. As shown in FIG. 4 (2), it is a concave surface facing downward with a radius of curvature of 200 mm in the long side direction. 4 (1) and 4 (2) are views of the vibration surfaces 21a and 22a as viewed from the side direction different by 90 degrees. The frequency of the ultrasonic wave used in the probe 2 is relatively high, 2 MHz, and in addition, the flaw detection resolution is further improved as a broadband wave having a wave number of 1.5-2. The transmission transducer 21 and the reception transducer 22 intersect each other with the ultrasonic beam axes Ax and Ay as shown in FIG. The range R is generated, and the flaw detection of the billet surface layer portion 2 to 30 mm below the surface can be performed. Here, the frequency of the transmitted ultrasonic wave is preferably in the range of 2.0 to 5.0 MHz. Table 1 shows details of the specifications of the surface layer probe 2. The transducer inclination angle shown in Table 1 is an angle provided for two transducers in order to bring the cross axis range closer to the probe side as described above. In the present embodiment, the vibrator inclination angle θ is set to 7.2 ° as shown in FIG.

以上の各超音波探触子1,2で得られる受信信号を図5(1),(2)に模式的に示す。図5(1)は内質部用探触子1の受信信号を示し、その波形は、ビレットMの表面と裏面での反射波による信号ピークP1,P2を生じるとともに、ビレット内質部に欠陥がある場合にはこれら信号ピークP1,P2の間に上記欠陥での反射波による信号ピークP3を生じる。なお、表面反射波による信号ピークを生じる、いわゆる不感帯Zdは、振動子サイズを相対的に大きくしたことによって比較的広くなっている。   The reception signals obtained by the ultrasonic probes 1 and 2 are schematically shown in FIGS. 5 (1) and 5 (2). FIG. 5 (1) shows the received signal of the inner part probe 1, and its waveform causes signal peaks P1 and P2 due to reflected waves on the front and back surfaces of the billet M and a defect in the billet inner part. If there is, a signal peak P3 due to the reflected wave at the defect is generated between these signal peaks P1 and P2. Note that a so-called dead zone Zd that generates a signal peak due to a surface reflection wave is relatively widened by relatively increasing the vibrator size.

図5(2)には表層部用探触子2の受信信号を示し、その波形は、上記内質部用探触子1の受信信号では不感帯Zdとなっているビレット表層部において、欠陥がある場合に当該欠陥での反射波によって信号ピークP4を生じる。このようにして、結晶粒径が表層部で相対的に小さく内質部で相対的に大きい分布を示すビレットMの、表層部から内質部までの探傷が可能となる。そして、上記ビレットMを適宜反転させて、異なる側面を上面にし探触子を走査することにより、ビレットMの内部を全て探傷することができる。   FIG. 5 (2) shows the received signal of the probe 2 for the surface layer, and the waveform thereof is a defect in the billet surface layer where the dead zone Zd is in the received signal of the probe 1 for the inner part. In some cases, the signal peak P4 is generated by the reflected wave at the defect. In this manner, flaw detection from the surface layer portion to the inner quality portion of the billet M having a crystal grain size relatively small in the surface layer portion and relatively large in the inner quality portion can be performed. Then, the inside of the billet M can be completely detected by inverting the billet M as appropriate and scanning the probe with different side surfaces as the upper surface.

Figure 0004835341
Figure 0004835341

本発明の一実施形態を示す、探触子を位置させたビレットの斜視図である。It is a perspective view of the billet which located the probe which shows one embodiment of the present invention. ビレット断面の結晶粒径分布を示すグラフである。It is a graph which shows the crystal grain size distribution of a billet cross section. 内質部用探触子の超音波ビームを示す概略側面図である。It is a schematic side view which shows the ultrasonic beam of the probe for internal parts. 表層部用探触子の超音波ビームを示す概略側面図である。It is a schematic side view which shows the ultrasonic beam of the probe for surface layer parts. 探触子の信号波形を示す図である。It is a figure which shows the signal waveform of a probe.

符号の説明Explanation of symbols

1…表層部用探触子、11…送受信振動子、2…内質部用探触子、21…送信振動子、22…受信振動子、Ax,Ay…ビーム軸、M…ビレット(材料)。 DESCRIPTION OF SYMBOLS 1 ... Surface layer probe, 11 ... Transmission / reception vibrator, 2 ... Inner part probe, 21 ... Transmission vibrator, 22 ... Reception vibrator, Ax, Ay ... Beam axis, M ... Billet (material) .

Claims (1)

結晶粒径が表層部で相対的に小さく内質部で相対的に大きい分布を示す材料を探傷する超音波探傷方法であって、送信振動子の超音波ビーム軸と受信振動子の超音波ビーム軸を前記表層部内で互いに交差させて受信超音波の波形より当該表層部内における傷検出を行うとともに、送受信振動子の超音波ビームを前記内質部内で集束させて受信超音波の波形より当該内質部内における傷検出を行い、かつ前記送受信振動子の超音波周波数を前記送信振動子および受信振動子の超音波周波数に比して相対的に低くしたことを特徴とする超音波探傷方法。 An ultrasonic flaw detection method for flaw detection of a material having a relatively small crystal grain size in a surface layer portion and a relatively large distribution in an inner quality portion, wherein the ultrasonic beam axis of a transmission transducer and the ultrasonic beam of a reception transducer In the surface layer portion, the axes intersect each other to detect flaws in the surface layer portion from the waveform of the received ultrasonic wave, and the ultrasonic beam of the transmission / reception transducer is focused in the inner part to detect the internal wave from the waveform of the received ultrasonic wave. ultrasonic flaw detection method have rows flaw detection, and characterized in that the ultrasonic frequency of the transceiver transducer was relatively lower than the ultrasonic frequency of the transmission oscillator and the receiving transducer in the quality unit.
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JPS6144349A (en) * 1984-08-08 1986-03-04 Toshiba Corp Method and apparatus for ultrasonic flaw detection
JPH0619341B2 (en) * 1985-11-11 1994-03-16 株式会社東芝 Electronic scanning ultrasonic flaw detector
JP2002257800A (en) * 2001-03-02 2002-09-11 Sumitomo Metal Ind Ltd Method and apparatus for ultrasonic flaw detection of square billet
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