JP4845976B2 - Drop test device and method of use thereof - Google Patents

Description

  The present invention relates to a balance test of a stationary or moving state for an electronic device or an electronic component incorporated in the device, and more particularly to a drop test apparatus for a semiconductor chip package product.

  In order to ensure the predetermined design quality of the product in the user's operation and carrying, usually the final product test is performed on the chip package after completion of mounting, for example, aging test, electrical test, pull test, solder ball joint strength test, etc. . Next, a chip package with good quality and reliability is assembled into an electronic product such as a memory module, which is then modularized and applied to electronic devices often found in everyday life, such as personal computers, mobile phones, digital cameras, and PDAs. Therefore, the requirements for impact resistance and resistance stress resistance are strictly demanded, and the necessary tests become more and more important. As a result, the industry defines strict test standards for impact resistance evaluation of chip packages or memory modules. For example, JEDEC (United States Joint Electronic Device Committee) defines standards for drop tests. In accordance with this standard, the drop impact resistance of electronic products can be calculated.

When we examined the conventional drop test, we found several phenomena.
1. Low reproducibility of test conditions. Since it is difficult to manually position the altitude and angle of the device under test (DUT), there is a problem that the test results obtained with variations in the drop angle and impact position are completely different.
2. The cost of the test is high and the preparation time before the test is considerably long. Since the reproducibility of the test conditions is low, many DUTs are prepared. However, once the design is changed, the DUTs must be prepared again. In particular, in the product development stage, the cost of each DUT is relatively high, and the drop test is a destructive experiment, and there is a problem that the material cost due to repeated testing is heavy.
3. Since a collision phenomenon may occur during the drop test process, a non-linear phenomenon may occur.
4. The conventional drop test apparatus is applied only to a single measurement condition and the test parameters are constant. For example, a DUT is dropped from a predetermined height H and a shock wave (impulse) due to a collision is measured. If the DUT mounting form or application environment is different, the test conditions cannot be changed, and the standards to which each manufacturer conforms are different, so once the test conditions are changed, another drop test device must be purchased. The test cost cannot be reduced.

  The present invention has been made to solve the above problems, and can be applied to a DUT having various dimensions to perform a drop test at various angles and to adjust different test conditions. An object is to provide a kind of drop test apparatus.

In order to achieve the above object, a drop test apparatus according to the present invention mainly includes a fixed rack, a drop start angle setting jig, and a clamp. The fixed rack is provided with a sliding seat having a horizontal sliding rail. The drop start angle setting jig is installed on a sliding seat and is connected to a test sample table that can be adjusted up and down. The test sample stage provides the first reference plane, the jig provides the second reference plane, and the first reference plane moves between the first set position and the first attachment / detachment position by moving the test sample stage up and down. To do. When the jig receives the guide of the horizontal sliding rail and moves horizontally, the second reference surface moves between the second setting position and the second attachment / detachment position. When the clamp sandwiches the DUT, the first reference surface at the first setting position contacts the first surface of the waiting test device , and the second reference surface at the second setting position contacts the second surface of the waiting test device . .

In order to achieve the above object, the present invention adopts still another technique.
In the drop test device, a first stopper is installed on the side edge of the sliding seat, a second stopper is connected to the side edge of the drop start angle setting jig, and the second reference is made when the second stopper contacts the first stopper. The surface moves to the second attach / detach position.
In the above drop test apparatus, a fastening member may be installed on the second stopper in order to fix the relative position between the jig and the sliding seat.
In the above drop test apparatus, the jig may have an adjustment rod and an elastic member. The elastic member provides elasticity for moving the test sample stage toward the first setting position, and the adjustment bar has the test sample stage first. Limit the degree of movement toward the set position.
In the drop test apparatus, a sliding member may be connected to both sides of the test sample table, and one vertical sliding rail for sliding the sliding member in the vertical direction may be installed on both sides of the jig.
In the drop test apparatus, a plurality of adjustment legs may be installed at the bottom of the fixed rack in order to adjust the horizontal plane of the horizontal sliding rail.
In the drop test apparatus, the standby test device may be an elongated memory module.
In the drop test apparatus, the first reference surface and the second reference surface may be perpendicular to each other.
The drop test apparatus may further include a clamp seat for coupling with the clamp.
In the above drop test apparatus, the clamp has an outer shape that is L-shaped upside down and provides the first sandwiching surface and the second sandwiching surface, and the sandwiching gap of the first sandwiching surface is sandwiched between the second sandwiching surfaces. The first sandwiching surface is farther from the first reference surface than the second sandwiching surface.
In the drop test apparatus, a crack may be formed between the first reference surface at the first setting position and the second reference surface at the second setting position.

The present invention further discloses a method of use applied to the drop test apparatus, the method of use comprising several steps. First, the test sample stage and the jig are adjusted to move the first reference surface to the first setting position and the second reference surface to the second setting position. Next, place the first surface of the waiting test device to the first reference plane, the jig waiting test device into contact respectively the second surface of the waiting test device to the second reference plane. Next, the waiting test device is fixed with a clamp. Then, the first reference surface is moved to the first attachment / detachment position, and the test sample stage is lowered so as not to contact the waiting test device . Here, the waiting test device is still in contact with the second reference surface of the jig. Next, the second reference surface is moved to the second attachment / detachment position, and the jig is moved in the lateral direction so as not to contact the waiting test device . Finally, release the waiting test device .

As described above, the drop test device according to the present invention and the method of using the same have the following advantages and effects:
1. It is provided so that various falling surfaces of the waiting test device can be measured and applied to waiting test devices of various dimensions.
2. When performing a drop test, it is possible to maintain the posture of the drop start, for example, the same altitude, the same angle, and the same position, thereby improving the reproducibility of the test conditions and further reducing the test cost.
Third, the altitude, angle and position of the falling test device can be controlled quickly, accurately and stably.
4. The sliding seat does not rub against the waiting test device when moving, and the position of the waiting test device does not change with the movement of the sliding seat.
5. The fall start angle setting jig can be quickly and stably returned to the designated reference position via the tightening fixing member and the stopper.
6. It is possible to keep the test sample stand of the drop test device in a horizontal state via the adjustment leg, and it is possible to measure the accurate number by holding the fall of the waiting test device vertically. Become.
7. When performing a drop test, the waiting test device is dropped in an arbitrary posture, for example, an upright or a horizontal angle, and it is not necessary to adjust not only the height of the clamp but also the relative height of the clamp seat.

It is a three-dimensional view showing a drop test device according to the first embodiment of the present invention. FIG. 4 is a partially enlarged three-dimensional view showing that the drop start angle setting jig of the drop test apparatus according to the first embodiment of the present invention is moved to a set position and the DUT is left unattended. It is a partially expanded three-dimensional view showing that the drop start angle setting jig of the drop test apparatus according to the first embodiment of the present invention has been moved to the attachment / detachment position. It is a three-dimensional view showing the adjusting leg of the drop test device according to the first embodiment of the present invention. It is a side view which shows the element in the usage method of the drop test apparatus by 1st Example of this invention. It is a side view which shows the element in the usage method of the drop test apparatus by 1st Example of this invention. It is a side view which shows the element in the usage method of the drop test apparatus by 1st Example of this invention. It is a side view which shows the element in the usage method of the drop test apparatus by 1st Example of this invention. It is a side view which shows the element in the usage method of the drop test apparatus by 1st Example of this invention. It is a side view which shows the element in the usage method of the drop test apparatus by 1st Example of this invention. FIG. 6 is a partially enlarged three-dimensional view showing that the drop start angle setting jig of the drop test apparatus according to the first embodiment of the present invention is moved to a set position and the DUT as the second adjustment drop start angle is left unattended. It is a partially expanded three-dimensional view showing that the DUT as the third adjustment drop start angle is left after moving the drop start angle setting jig of the drop test apparatus according to the first embodiment of the present invention to the set position. FIG. 5 is a partially enlarged three-dimensional view showing that the drop start angle setting jig of the drop test apparatus is moved to a set position and another type of DUT is left unattended. It is a partially expanded three-dimensional view which shows the drop test apparatus by the 2nd Example of this invention. The drop start angle setting jig of the drop test apparatus according to the second embodiment of the present invention is moved to the set position and the DUT having various drop start angles depending on the posture such as upright, horizontal, or lying is left unattended. FIG. The drop start angle setting jig of the drop test apparatus according to the second embodiment of the present invention is moved to the set position and the DUT having various drop start angles depending on the posture such as upright, horizontal, or lying is left unattended. FIG. The drop start angle setting jig of the drop test apparatus according to the second embodiment of the present invention is moved to the set position and the DUT having various drop start angles depending on the posture such as upright, horizontal, or lying is left unattended. FIG. The drop start angle setting jig of the drop test apparatus according to the second embodiment of the present invention is moved to the set position, and other DUTs having various drop start angles according to postures such as upright, horizontal, or lying are left unattended. It is a partially expanded three-dimensional view showing this. The drop start angle setting jig of the drop test apparatus according to the second embodiment of the present invention is moved to the set position, and other DUTs having various drop start angles according to postures such as upright, horizontal, or lying are left unattended. It is a partially expanded three-dimensional view showing this. The drop start angle setting jig of the drop test apparatus according to the second embodiment of the present invention is moved to the set position, and other DUTs having various drop start angles according to postures such as upright, horizontal, or lying are left unattended. It is a partially expanded three-dimensional view showing this.

  Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, in the drawings, it is a schematic diagram showing the basic configuration and implementation method of the present invention, showing only the elements and configuration according to the present invention, and describing the number, outline, and dimensions of members actually implemented at a certain ratio. Rather, they are simplified or exaggerated for convenience and clarity of explanation. On the other hand, the number, shape, and dimensions actually used depend on various designs, and the arrangement of members may be more complicated.

A drop test apparatus according to a first embodiment of the present invention will be described with reference to FIG.
The illustrated drop test apparatus 100 mainly includes a fixed rack 110, a drop start angle setting jig 120, and a clamp 130. The drop test apparatus 100 drops the DUT 10 from a predetermined height, and is used for measuring the drop impact resistance of the DUT 10. The DUT 10 corresponds to a “waiting test device” in the claims. The DUT 10 may be an elongated memory module, for example, DIMM (Dual In-Line Memory Modules) or SO-DIMM (Small Outline Dual In-Line Memory Modules). The DUT 10 may be another electronic product. The type of the DUT 10 is not particularly limited, and may be a flip chip package, a lead frame package, a multichip package, or another conventional chip package. However, there are many types of chip packages, and the test standards of each manufacturer are different, and it is difficult to manufacture at low cost. On the other hand, the present invention is an adjustable drop test applied to various test standards. The device can be designed and the cost can be reduced.

  As shown in FIGS. 1 and 2, a sliding seat 111 is installed on the fixed rack 110, and the sliding seat 111 has a horizontal sliding rail 112. The fixed rack 110 includes an upright rack 110A and a bottom frame 110B. The upright rack 110A is fixed upright on the bottom frame 110B, and the bottom frame 110B occupies a certain area so that the fixed rack 110 does not easily fall over. ing. In this embodiment, the bottom frame 110B has a U-shape, and the inside surrounds the collision surface of the drop test (as shown in FIG. 1). The sliding seat 111 is installed on a cantilever of the fixed rack 110 and is used as an altitude setting for the drop start angle setting jig 120 at a predetermined height, for example, 30 cm, 50 cm, 60 cm, and 120 cm.

  As shown in FIGS. 2 and 3, the drop start angle setting jig 120 is installed on the slide seat 111 and is connected to a test sample table 121 (as shown in FIG. 3) that can be adjusted up and down. The test sample stage 121 provides a first reference surface 122 that is horizontal or inclined, and the jig 120 provides a second reference surface 123 that is vertical or inclined. The guide of the horizontal sliding rail 112 allows the jig 120 to move horizontally, and the first reference surface 122 and the second reference surface 123 are preferably perpendicular to each other, thereby providing positioning of the DUT Is done.

  As the test sample stage 121 moves up and down, the first reference surface 122 moves between the first set position and the first attachment / detachment position. Here, the first set position is the position where the test sample stage 121 is raised (see FIG. 5A). The first attachment / detachment position is that the test sample stage 121 is located at the lowered position (as shown in FIG. 5B).

  When the jig 120 moves horizontally by the guide of the horizontal sliding rail 112, the second reference plane 123 moves between the second setting position and the second attachment / detachment position, where the second setting position is the second setting position. The reference plane 123 moves forward and moves away from the fixed rack 110 (as shown in FIGS. 5A and 5B), and the second attachment / detachment position is a position where the second reference plane 123 moves rearward and approaches the fixed rack 110. (As shown in FIG. 5D).

  As shown in FIG. 2, when the DUT 10 is fixed by the clamp 130, the DUT 10 first surface 11 comes into contact with the first reference surface 122 at the first setting position, and when the DUT 10 is placed on the test sample table 121, the DUT 10 The second surface 12 contacts the second reference surface 123 at the second set position (as shown in FIGS. 2 and 3). In this embodiment, the first surface 11 is a longitudinal surface of the memory module, and the second surface 12 is a substrate surface or an element installation surface of the memory module.

  After placing the DUT 10, the first surface 11 and the second surface 12 of the DUT 10 come into contact with the first reference surface 122 and the second reference surface 123, respectively, and are fixed with clamps 130 sandwiching both sides of the DUT 10. In this embodiment, the surface on which the DUT 10 is sandwiched is the short side surface of the memory module. Therefore, the fall altitude and the start angle and position of the DUT 10 can be installed quickly, accurately and stably, and the repeated fall altitude and fall It is also possible to keep the starting angle the same, and no deviation occurs. Specifically, both ends (not shown) of the clamp 130 are connected to the upright rack 110A to adjust the height of the clamp 130 up and down. In addition, the clamp 130 is telescopic and can be applied to various dimensions of the DUT 10.

  Specifically, as shown in FIGS. 2 and 3, the first stopper 113 is installed on the side edge of the sliding seat 111, and the second stopper 124 is connected to the side edge of the drop start angle setting jig 120. Here, the side edge of the slide seat 111 is located on the same side as the side edge of the drop start angle setting jig 120. From now on, when the drop start angle setting jig 120 is moved in the horizontal direction, the second stopper 124 contacts the first stopper 113 to move the second reference surface 123 to the second attaching / detaching position (as shown in FIGS. 3 and 5D). Further, a third stopper 115 is further installed on the side edge of the sliding seat 111, and when the drop start angle setting jig 120 moves in the horizontal direction, the second stopper 124 comes into contact with the third stopper 115, thereby The two reference planes 123 are moved to the second setting position. In this way, the second setting position and the second attachment / detachment position can be clearly defined.

  More specifically, as shown in FIG. 2, a fastening member 125 is installed on the second stopper 124 to fix the relative position between the jig 120 and the sliding seat 111 so as not to move.

  Further, as shown in FIG. 3, the jig 120 has an adjustment rod 126 and an elastic member 127, and the elastic member 127 provides elasticity so as to move the test sample table 121 toward the first setting position. The adjustment rod 126 limits the degree to which the test sample stage 121 moves toward the first setting position. Thus, the first reference surface 122 of the test sample table 121 can accurately arrive at the first set position through the insertion top dead center of the adjustment rod 126 and the return elasticity of the elastic member 127. On the other hand, the first reference surface 122 of the test sample base 121 can accurately arrive at the first attachment / detachment position via the insertion bottom dead center of the adjustment rod 126 and the return elasticity of the elastic member 127. Thereby, a 1st setting position and a 1st attachment / detachment position can be defined clearly. In addition, one sliding member 128 is connected to each side of the test sample base 121, and one vertical sliding rail 129 is installed on each side of the jig 120 for vertical sliding of the sliding member 128. By rotating the rod 126, the test sample stage 121 can be moved in the vertical direction by the guide of the vertical sliding rail 129.

  More specifically, as shown in FIGS. 1 and 4, a plurality of adjustment legs 114 are installed at the bottom of the fixed rack 110, and these adjustment legs 114 are two or four on the bottom frame 110 </ b> B of the fixed rack 110. The horizontal legs of the horizontal sliding rail 112 are adjusted by the adjusting legs 114, and the test sample stage 121 of the drop test apparatus 100 is held in a horizontal state. At this time, the DUT 10 falls vertically. And accurate numbers can be measured.

  The present invention further explains how to use the drop test apparatus 100 with reference to side views shown in FIGS. 5A to 5F.

  First, as shown in FIG. 5A, by adjusting the test sample stage 121 and the jig 120, the first reference surface 122 is moved to the first setting position, and the second reference surface 123 is moved to the second setting position. become. In the first setting position, the first reference surface 122 of the test sample stage 121 is located at the ascending position, and in the second setting position, the second reference surface 123 is moved to the front position. The first reference surface 122 and the second reference surface 123 are perpendicular to each other. 5A, the DUT 10 is placed on the test sample stage 121 of the jig 120, the first surface 11 of the DUT 10 contacts the first reference surface 122, and the second surface 12 of the DUT 10 is It contacts the second reference surface 123 (as shown in FIG. 5C). Next, when both sides of the DUT 10 are fixed with clamps 130 (as shown in FIG. 2), the altitude and angle of the DUT 10 are controlled quickly, accurately, and stably, and tests under the same conditions (altitude and angle) are performed. It can be repeated and no deviation occurs.

  Next, as shown in FIG. 5B, by turning the adjustment rod 126, the test sample stage 121 is lowered, and the first reference surface 122 moves to the first attachment / detachment position and does not come into contact with the first surface 11 of the DUT 10. However, the second surface 12 of the DUT 10 is still in contact with the second reference surface 123 of the jig 120. Here, the direction in which the adjusting rod 126 is rotated is clockwise as indicated by the arrow in FIG. 5B, and the descending direction of the test sample stage 121 is downward as indicated by the arrow in FIG. 5B.

Next, as shown in FIG. 5C, by laterally moving the jig 120, the second reference surface 123 moves to the second attachment / detachment position and does not come into contact with the DUT 10. Here, the horizontal movement direction is the left direction indicated by the arrow in FIG. 5C. At this time, the second stopper 124 comes into contact with the first stopper 113, and the relative position between the jig 120 and the sliding seat 111 is fixed using the tightening fixing member 125 and is not moved. The fixing method is to rotate the tightening and fixing member 125 in the counterclockwise direction indicated by the arrow in FIG. 5C. In addition, since the first surface 11 of the DUT 10 is not in contact with the first reference surface 122 in the process of horizontally moving the jig 120 backward, the sliding seat 111 does not rub against the DUT 10 when moving, and the sliding seat 111 The position of the DUT 10 does not change even if there is any movement. Both sides of the DUT 10 are sandwiched between clamps 130 and float in the air.

  Next, as indicated by the slanted arrow in FIG. 5D, the release of the clamp 130 allows the DUT 10 to fall on the ground and measure data while the first surface 11 faces downward. The falling direction is the downward direction indicated by the arrow in FIG. 5D.

  When performing a repeated drop test, the jig 120 can be moved horizontally and returned to the second set position, as shown in FIG. 5E. Here, the direction of the horizontal movement is the right direction indicated by the arrow in FIG. 5E. At this time, the second stopper 124 comes into contact with the third stopper 125 so that the jig 120 does not move and is stopped. Then, the relative position between the jig 120 and the sliding seat 111 is fixed by using the tightening fixing member 125 so as not to slide. The fixing method is to rotate the tightening fixing member 125 in the clockwise direction indicated by the arrow in FIG. 5E.

  Next, as shown in FIG. 5F, the adjustment rod 126 is rotated so that the first reference surface 122 of the test sample table 121 is raised and returned to the first setting position (ie, a predetermined test height). The adjustment rod 126 is rotated in the direction indicated by the arrow in FIG. 5F, and the rising direction of the first reference surface 122 is upward as indicated by the arrow in FIG. 5F.

  Next, the steps shown in FIGS. 5A to 5F are repeated to test the DUTs 10 one by one. In the testing process, the DUT 10 can be maintained at a predetermined height and a predetermined position, and the fall start angle can be adjusted. In other words, the reproducibility and accuracy of the drop test can be improved, and the test cost can be reduced.

  The drop test apparatus 100 according to the present invention can be applied not only to testing the DUT 10 at various drop start angles but also to the DUT 10 having various dimensions. As shown in FIG. 6, the DUT 10 may be placed on the test sample stage 121. Specifically, as shown in FIGS. 3 and 5F, a gap G is formed between the first reference surface 122 at the first setting position and the second reference surface 123 at the second setting position. Is larger than the thickness of the DUT 10, the DUT 10 can be partially fitted into the gap G when it is placed horizontally, and it is easier to fix the clamp 130 without the need to adjust the fixing height of the clamp 130. At this time, the DUT 10 is placed on the test sample stage 121 so as to be in contact with the first surface 11 of the first reference surface 122, and the first surface 11 is a substrate surface or an element installation surface of the memory module. The second surface 12 of the DUT 10 is a longitudinal side surface of the memory module, and the second surface 12 is fitted into a gap G formed between the second reference surface 123 and the test sample table 121, whereby a clamp 130 is obtained. Can fix the short side surface of the memory module.

  As shown in FIG. 7, the DUT 10 may be placed on the test sample table 121 in an upright manner. In this case, the first surface 11 of the DUT 10 is in contact with the first reference surface 122, and the second surface 12 of the DUT 10 is in contact with the second reference surface 123. Since the first surface 11 is a surface on the short side of the memory module and the second surface 12 is a substrate surface or an element arrangement surface of the memory module, the clamp 130 can fix the surface on the long side of the memory module. .

  Moreover, as shown in FIG. 8, DUT20 from which another dimension or a product form differs can also be put in the drop test apparatus 100 of this invention. In this case, the telescopic clamp 130 is adjusted according to various dimensions so that the first surface 21 of the DUT 20 contacts the first reference surface 122 and the second surface 22 of the DUT 20 contacts the second reference surface 123. The DUT 20 is fixed, and the drop test is performed on the DUT 10 having various dimensions with the same drop test apparatus 10.

  Another type of drop test apparatus according to the second embodiment of the present invention will be described with reference to FIG. The drop test apparatus mainly includes a fixed rack 110, a drop start angle setting jig 120, and a clamp 130. In this embodiment, members having the same functions as the main members used in the first embodiment are given the same member numbers, and the description thereof is omitted.

  In this embodiment, the drop test apparatus further includes a clamp seat 240, which is disposed opposite the fixed rack 110 and connected to the clamp 130 with a horizontal bar. The clamp 130 has an L shape that is upside down, has a first sandwiching surface 231 and a second sandwiching surface 232, and the sandwiching gap between the first sandwiching surfaces 231 is sandwiched between the second sandwiching surfaces 232. The first sandwiching surface 231 is farther from the first reference surface than the second sandwiching surface 232. Thereby, when performing a drop test at various drop angles, it is not necessary to adjust the altitudes of the clamp 130 and the clamp seat 240, that is, it is not necessary to raise or lower the clamp seat 240. For each DUT 10, when the difference in horizontal distance between the first clamping surface 231 and the second clamping surface 232 of the clamp 130 is exactly half the length of the long side surface and the short side surface of the DUT 10, the clamp 130 The DUT 10 can be fixed by the same pinching process regardless of the posture of the DUT 10, for example, upright, horizontal, or lying.

  A drop test with various drop start angles will be described with reference to FIGS. 10A to 10C. As shown in FIG. 10A, when the DUT 10 is placed on the test sample stage 121 in an upright manner, the first surface 11 of the DUT 10 contacts the first reference surface 122 and the second surface 12 of the DUT 10 contacts the second reference surface 123, respectively. To do. Here, the first surface 11 is a short side surface of the memory module, and the second surface 12 is a substrate surface or an element arrangement surface of the memory module. The clamping gap of the first clamping surface 231 of the clamp 130 is adjusted so as to be equal to the length of the longitudinal side surface of the memory module. There is no need to adjust the altitude of the clamp 130 across the gap.

  When the DUT 10 is placed on the test sample stage 121 (as shown in FIG. 10B), the first surface 11 of the DUT 10 contacts the first reference surface 122 and the second surface 12 of the DUT 10 contacts the second reference surface 123, respectively. To do. Here, the first surface 11 is a longitudinal side surface of the memory module, and the second surface 12 is a substrate surface or an element arrangement surface of the memory module. The clamping gap of the second clamping surface 232 of the clamp 130 is adjusted so as to be equal to the length of the surface on the long side of the memory module. It will be.

  Further, when the DUT 10 is laid on the test sample stage 121 (as shown in FIG. 10C), the DUT 10 can be partially fitted into the gap G (as shown in FIG. 9), and the clamping height of the clamp 130 is adjusted. Since there is no need, it becomes easier to fix. At this time, the first surface 11 of the DUT 10 in contact with the first reference surface 122 is a substrate surface or an element installation surface of the memory module. Since the long side surface of the DUT 10 can be fitted into the gap G formed between the second reference surface 123 and the test sample base 121, the short side surface of the memory module can be sandwiched between the clamps 130. It becomes possible.

  Therefore, it is not necessary to adjust the altitude between the clamp 130 and the clamp seat 240 regardless of the posture of the DUT 10 such as upright, horizontal, or lying when performing a drop test, and various drops can be applied to the DUT 10 of the same form. Drop testing can be performed at the starting angle (including upright, sideways, and sideways) and can provide data statistics and analysis. Further, using the difference between the clamping gap of the first clamping surface 231 and the clamping gap of the second clamping surface 232, the clamp 130 can be used in the same clamping process regardless of the position of the DUT 10, for example, standing upright or lying down. Can be fixed.

  In addition, as shown to FIG. 11A-11C, the drop test apparatus by 2nd Example of this invention can put DUT20 of another kind and a different form, This DUT20 is longer or larger than said DUT10. May be. Here, the clamp 130 has a first sandwiching surface 231 and a second sandwiching surface 232 by having an outer shape that makes the L shape upside down. As shown in FIG. 11A, when the DUT 20 is placed on the test sample stage 121 in an upright position, the DUT 20 contacts the first surface 21 of the first reference surface 122 and the second surface 22 of the second reference surface 123, respectively. These are the short side surface of the memory module, the substrate surface of the memory module, and the element arrangement surface. The surface side of the long side of the memory module can be sandwiched only by the first clamping surface 231 of the clamp 130, and the drop test is performed at the drop start angle in an upright posture.

  As shown in FIG. 11B, when the DUT 20 is placed on the test sample stage 121, it is memory that the DUT 20 contacts the first surface 21 of the first reference surface 122 and the second surface 22 of the second reference surface 123, respectively. These are the surface on the long side of the module, the substrate surface of the memory module, and the element arrangement surface. Only the second clamping surface 232 of the clamp 130 can sandwich the short side surface of the memory module, and the drop test is performed at the drop start angle in the horizontal orientation.

  As shown in FIG. 11C, when the DUT 20 is laid on the test sample stage 121, it is the substrate surface of the memory module of the DUT 20 or the element arrangement surface that comes into contact with the first surface 21 of the first reference surface 122. The second surface 22 of the DUT 20 is partly fitted in the gap G (as shown in FIG. 9), and this second surface 22 is the longitudinal side surface of the memory module. Only the second clamping surface 232 of the clamp 130 can sandwich the short side surface of the memory module, and the drop test is performed at the fall start angle in the lying posture.

  As described above, it is necessary to adjust the altitude of the clamp 130 and the clamp seat 240 even if the drop test is performed at various drop start angles regardless of the posture such as the upright position, the horizontal position, and the lying position with respect to the DUT 20 having the same form. There is no. Using the drop test apparatus of the above embodiment, it is possible to suppress changes in the drop posture, the reproducibility of test conditions is excellent, and errors in data acquired by a manual method are eliminated.

  Although the present invention has been described based on the preferred embodiments thereof, the protection scope of the present invention is limited by the appended claims, and within the spirit and scope of the present invention based on this protection scope. Any changes or modifications that come into contact with the invention belong to the protection scope of the present invention.

10: Device under test (DUT) 11: First surface 12: Second surface 20: Introducing groove 21: First surface 22: Second surface 100: Drop test device 110: Fixed rack 110A : Upright rack, 110B: Bottom frame, 111: Sliding seat, 112: Horizontal sliding rail, 113: First stopper, 114: Adjustment leg, 115: Third stopper, 120: Drop start angle setting jig, 121: Test Sample stand 122: First reference surface 123: Second reference surface 124: Second stopper 125: Tightening fixing member 126: Adjustment rod 127: Elastic member 128: Sliding member 129: Vertical sliding rail 130: Clamp, 231: First clamping surface, 232: Second clamping surface, 240: Clamp seat, G: Gap,

Claims (13)

A fixed rack having a sliding seat provided with a horizontal sliding rail;
A drop start angle setting jig installed on the sliding seat and having a test sample stage having a first reference surface and a second reference surface;
With a clamp,
By moving the test sample table up and down, the first reference plane moves between a first setting position and a first attachment / detachment position,
When the jig receives the guide of the horizontal sliding rail and moves horizontally, the second reference plane moves between a second setting position and a second attachment / detachment position,
When the clamp sandwiches the waiting test device , the first reference surface at the first setting position is in contact with the first surface of the waiting test device , and the second reference surface at the second setting position is the waiting surface. drop test apparatus characterized by contacting the second surface of the test device. A first stopper is installed on a side edge of the sliding seat, a second stopper is connected to a side edge of the drop start angle setting jig, and when the second stopper contacts the first stopper, the second reference The drop test apparatus according to claim 1, wherein the surface moves to the second attachment / detachment position.   The drop test apparatus according to claim 2, wherein a fastening member is installed on the second stopper to fix the relative position between the jig and the sliding seat.   The jig includes an adjustment rod and an elastic member, and the elastic member provides elasticity for moving the test sample table toward the first set position, and the adjustment rod is provided on the first test sample table by the first test sample table. The drop test apparatus according to claim 1, wherein the degree of movement toward the set position is limited.   6. A sliding member is connected to each side of the test sample table, and one vertical sliding rail is installed on each side of the jig for vertical sliding of the sliding member. The drop test device described.   The drop test apparatus according to claim 1, wherein a plurality of adjustment legs are installed at the bottom of the fixed rack to adjust the horizontal plane of the horizontal sliding rail. The drop test apparatus according to claim 1, wherein the waiting test device is an elongated memory module.   The drop test apparatus according to claim 1, wherein the first reference surface and the second reference surface are perpendicular to each other.   The drop test apparatus according to claim 1, further comprising a clamp seat for coupling with the clamp.   The clamp has an L shape that is upside down and has a first clamping surface and a second clamping surface, and the clamping gap of the first clamping surface is greater than the clamping gap of the second clamping surface. The drop test apparatus according to claim 1, wherein the drop test apparatus is smaller and the first sandwiching surface is farther from the second reference surface than the first reference surface.   The drop test apparatus according to claim 1, wherein a gap is formed between the first reference surface at the first setting position and the second reference surface at the second setting position. Adjusting the test sample stage and the jig to move the first reference surface to the first setting position and the second reference surface to the second setting position; and the first surface of the waiting test device Placing the waiting test device on the jig so that the second reference surface is brought into contact with the first reference surface and the second surface of the waiting test device in contact with the second reference surface, and fixing the waiting test device with the clamp step and the first reference surface moves to the first detachable position, comprising the steps of lowering the test sample stage so as not to contact the waiting test device, wherein the waiting test device wherein the still Osamu Contacting the second reference surface of the tool;
Moving the second reference surface to the second attaching / detaching position and moving the jig laterally so as not to contact the waiting test device ;
The method for using the drop test apparatus according to claim 1, further comprising: releasing the waiting test device . 13. The method of using a drop test apparatus according to claim 12, wherein the waiting test device does not rub against the test sample stage and the jig in the step of lowering the test sample stage and the step of moving the jig.

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