Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JP4877137B2 - Wiping mechanism for optical measuring device - Google Patents
[go: Go Back, main page]

JP4877137B2 - Wiping mechanism for optical measuring device - Google Patents

Wiping mechanism for optical measuring device Download PDF

Info

Publication number
JP4877137B2
JP4877137B2 JP2007201876A JP2007201876A JP4877137B2 JP 4877137 B2 JP4877137 B2 JP 4877137B2 JP 2007201876 A JP2007201876 A JP 2007201876A JP 2007201876 A JP2007201876 A JP 2007201876A JP 4877137 B2 JP4877137 B2 JP 4877137B2
Authority
JP
Japan
Prior art keywords
sample
light transmission
liquid sample
measurement
transmission surfaces
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2007201876A
Other languages
Japanese (ja)
Other versions
JP2009036664A (en
Inventor
英柱 池田
隆志 井上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2007201876A priority Critical patent/JP4877137B2/en
Priority to US12/178,239 priority patent/US8151396B2/en
Priority to EP08160947.1A priority patent/EP2023123B1/en
Publication of JP2009036664A publication Critical patent/JP2009036664A/en
Application granted granted Critical
Publication of JP4877137B2 publication Critical patent/JP4877137B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N2021/0346Capillary cells; Microcells
    • G01N2021/035Supports for sample drops
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N2021/036Cuvette constructions transformable, modifiable

Landscapes

  • Optical Measuring Cells (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

本発明は、試料載置台に載置された微量液体試料に光を照射してその透過光を測定する光学測定装置に関し、特にその液体試料の拭き取り機構に関する。   The present invention relates to an optical measurement apparatus that irradiates a trace liquid sample placed on a sample placement table and measures the transmitted light, and more particularly to a wiping mechanism for the liquid sample.

紫外可視分光光度計等の分光光度計において、液体試料の透過率や吸光度などの透過特性を測定する際には、液体試料を収容する角形状或いは円筒形状のキュベットセルを用いるのが一般的である。しかし、蛋白質やDNAの定量などの生化学分野では、分析対象である液体試料の量が極めて少量であることが多く、上記のようなキュベットセルを用いることはできない。   In a spectrophotometer such as an ultraviolet-visible spectrophotometer, when measuring transmission characteristics such as transmittance and absorbance of a liquid sample, it is common to use a square or cylindrical cuvette cell that accommodates the liquid sample. is there. However, in the biochemical field such as protein and DNA quantification, the amount of liquid sample to be analyzed is often very small, and the cuvette cell as described above cannot be used.

微量液体試料の分光測定を行う第一の装置として、従来より、米国ナノドロップテクノロジーズ社が販売している分光光度計ND-1000が知られている(非特許文献1参照)。この分光光度計では、図13に示すように、上下に対向させ、所定距離離間して設けた上部側基部80と下部側基部82との間の空間に表面張力により液体試料84を上下方向に架橋して保持する。この状態で上部側基部80内に設けた投光側光ファイバー81から出射した測定光を液体試料84中に通過させ、下部側基部82内に設けた受光側光ファイバー83で受け、分光測定等を行う。   Conventionally, a spectrophotometer ND-1000 sold by US Nanodrop Technologies Inc. is known as a first apparatus for spectroscopic measurement of a trace amount liquid sample (see Non-Patent Document 1). In this spectrophotometer, as shown in FIG. 13, a liquid sample 84 is vertically moved by a surface tension in a space between an upper side base 80 and a lower side base 82 which are vertically opposed to each other and separated by a predetermined distance. Crosslink and hold. In this state, the measurement light emitted from the light projecting optical fiber 81 provided in the upper base 80 is passed through the liquid sample 84 and received by the light receiving optical fiber 83 provided in the lower base 82 to perform spectroscopic measurement or the like. .

また、微量液体試料の分光測定を行う第二の装置として、本件出願人は、図14に示すように、回転可能な円盤状の試料プレート91上の外周近傍に試料保持部92を複数設けた微量液体試料用光学測定装置を国際特許出願した(国際出願番号:PCT/JP06/307032)。この装置では、まず試料供給位置U1で試料保持部92に液体試料を滴下する。次に試料プレート91を回転し、試料保持部92を測定位置U2まで移動させる。この状態でその上面に透明な窓板22を降下させ、光路長を定めた後に透過光の測定を実行する。測定終了後、窓板22を上昇させ、試料保持部92を測定位置U2から拭取位置U3まで移動し、そこに設けられたクリーニングパッド93により液体試料を吸収して除去する。また、窓板22の下面に付着した液体試料は、上述のように窓板22が上昇した状態で、クリーニングパッド93とは別の清掃用ウエス(図示省略)により拭き取る。
「ナノドロップ ND−1000 オーバービュー (NanoDrop ND-1000 Overview)」、米国ナノドロップ・テクノロジーズ社 (NanoDrop Technologies)、インターネット<http://www.nanodrop.com/nd-1000-overview.html>、[平成19年7月24日検索]
Further, as a second apparatus for performing spectroscopic measurement of a trace amount liquid sample, the present applicant provided a plurality of sample holding portions 92 near the outer periphery on a rotatable disk-shaped sample plate 91 as shown in FIG. An international patent application was filed for an optical measurement device for a trace liquid sample (international application number: PCT / JP06 / 307030). In this apparatus, first, a liquid sample is dropped onto the sample holder 92 at the sample supply position U1. Next, the sample plate 91 is rotated, and the sample holder 92 is moved to the measurement position U2. In this state, the transparent window plate 22 is lowered on the upper surface, and after measuring the optical path length, the transmitted light is measured. After completion of the measurement, the window plate 22 is raised, the sample holder 92 is moved from the measurement position U2 to the wiping position U3, and the liquid sample is absorbed and removed by the cleaning pad 93 provided there. Further, the liquid sample adhering to the lower surface of the window plate 22 is wiped off with a cleaning waste (not shown) separate from the cleaning pad 93 in a state where the window plate 22 is raised as described above.
“NanoDrop ND-1000 Overview”, NanoDrop Technologies, USA <http://www.nanodrop.com/nd-1000-overview.html>, [ Searched July 24, 2007]

上述した第一の装置によれば、1つの試料の測定を終了した後に次の試料の測定を行う際に投光側・受光側の両方の光ファイバー端面を紙ウエス等の清掃用ウエス(以下、単にウエスと呼ぶ)等で拭う必要がある。こうした作業は1つの試料測定が終了する毎に手作業で行う必要があるため、清掃作業に時間がかかるという問題がある。   According to the first apparatus described above, when the measurement of the next sample is completed after the measurement of one sample is completed, the optical fiber end faces on both the light projecting side and the light receiving side are cleaned with a cleaning waste such as a paper waste (hereinafter referred to as a waste cloth). It is necessary to wipe it with a waste cloth. Since such an operation needs to be performed manually every time one sample measurement is completed, there is a problem that the cleaning operation takes time.

第二の装置によれば、試料プレート91を回転させる必要があるとともに、試料保持部92と窓板22を別々のウエスで拭き取る必要がある。そのため、機構が複雑になり、部品点数も多くなる。   According to the second apparatus, the sample plate 91 needs to be rotated, and the sample holder 92 and the window plate 22 need to be wiped with separate waste cloths. This complicates the mechanism and increases the number of parts.

本発明は上記課題に鑑みて成されたものであり、その目的とするところは、微量液体試料用光学測定装置において、液体試料を手早くかつ効率よく拭き取ることができる拭き取り機構を提供することである。   The present invention has been made in view of the above problems, and an object of the present invention is to provide a wiping mechanism capable of quickly and efficiently wiping a liquid sample in an optical measurement apparatus for a small amount of liquid sample. .

上記課題を解決するために成された本発明に係る光学測定装置用拭き取り機構は、2枚の光透過面を接近させることにより両者の間に液体試料を保持し、該液体試料を透過する光を測定し、測定終了後に前記両光透過面を離間させる光学測定装置において、前記両光透過面に付着した液体試料を拭き取るための機構であって、
前記液体試料を拭き取る清掃用ウエスが上下面に取り付けられるサポート部と、
前記サポート部を前記両光透過面の間とその外との間で移動させる移動手段と、
測定終了後に、前記両光透過面の間に前記サポート部が移動された後、前記両光透過面を接近させて該両光透過面を前記清掃用ウエスに接触させる手段と、
を備えることを特徴とする。
The wiping mechanism for an optical measuring device according to the present invention, which has been made to solve the above-mentioned problems, holds the liquid sample between the two light transmission surfaces by bringing them close to each other, and transmits the liquid sample. In the optical measurement device that separates the two light transmission surfaces after the measurement is completed, a mechanism for wiping the liquid sample adhering to the both light transmission surfaces,
A support part to which a cleaning waste cloth for wiping off the liquid sample is attached to the upper and lower surfaces;
Moving means for moving the support part between the light transmission surfaces and the outside;
After the measurement is completed, after the support portion is moved between the two light transmission surfaces, the two light transmission surfaces are brought close to each other and the two light transmission surfaces are brought into contact with the cleaning waste.
It is characterized by providing.

本発明に係る光学測定装置用拭き取り機構では、2枚の光透過面の間を離した状態でサポート部を両光透過面の間に入れ、両光透過面を接近させることにより、液体試料が付着する2枚の光透過面がサポート部の上下面に接触する。その状態で、サポート部を両光透過面の間から外に移動させることにより、両光透過面に付着した液体試料を同時に拭き取ることができる。   In the wiping mechanism for an optical measuring device according to the present invention, the liquid sample is placed by placing the support portion between the two light transmission surfaces in a state where the two light transmission surfaces are separated, and bringing the both light transmission surfaces close to each other. The two light-transmitting surfaces that adhere are in contact with the upper and lower surfaces of the support portion. In this state, the liquid sample adhering to both light transmission surfaces can be wiped off simultaneously by moving the support part from between the light transmission surfaces.

以下、添付図面に基づき、本発明の一実施例である、液体試料の拭き取り機構を備えた微量液体試料用光学測定装置を説明する。   Hereinafter, an optical measurement apparatus for a trace amount liquid sample having a liquid sample wiping mechanism according to an embodiment of the present invention will be described with reference to the accompanying drawings.

図1は本実施例に係る微量液体試料用光学測定装置の概略構成図であり、図2は測定時の液体試料の状態を示す図である。   FIG. 1 is a schematic configuration diagram of an optical measuring device for a trace amount liquid sample according to the present embodiment, and FIG. 2 is a diagram showing a state of the liquid sample at the time of measurement.

図1において、ベース13上に支持柱15が垂直に立設され、その中間箇所から略水平に延びる試料台10が設置されている。試料台10には測定光を通過させるための孔が設けられ、その上面には液体試料を保持するための透明な試料滴下台11が設けられている。試料滴下台11の上部には、支持柱15に沿って上下に移動可能な窓板ホルダ23が設けられている。窓板ホルダ23の前記試料台10の通過孔に対応する位置には、同様の通過孔が設けられ、その下面には、試料滴下台11と共に液体試料を保持する透明な窓板22が固定されている。   In FIG. 1, a support column 15 is erected vertically on a base 13, and a sample stage 10 that extends substantially horizontally from an intermediate position thereof is installed. The sample stage 10 is provided with a hole for allowing measurement light to pass through, and a transparent sample dropping base 11 for holding a liquid sample is provided on the upper surface thereof. A window plate holder 23 that can move up and down along the support column 15 is provided on the top of the sample dropping table 11. A similar passage hole is provided at a position of the window plate holder 23 corresponding to the passage hole of the sample table 10, and a transparent window plate 22 that holds the liquid sample together with the sample dropping table 11 is fixed to the lower surface thereof. ing.

支持柱15の上部には略水平方向に測定光を出射する光源16が取り付けられ、その正面には測定光を下方向に、窓板ホルダ23及び試料台10の通過孔に向けて反射する平面鏡17が設けられている。   A light source 16 that emits measurement light in a substantially horizontal direction is attached to the upper portion of the support column 15, and a plane mirror that reflects the measurement light downwardly toward the window plate holder 23 and the passage hole of the sample stage 10 on the front surface thereof. 17 is provided.

試料台10の通過孔の下方にはスリット19が固定され、その更に下方には回折格子20が設けられている。回折格子20の回折光出射位置にはマルチチャンネル型の検出器21が設けられている。   A slit 19 is fixed below the passage hole of the sample stage 10, and a diffraction grating 20 is provided further below. A multi-channel detector 21 is provided at the diffracted light emission position of the diffraction grating 20.

試料台10には、本発明に係るウエス保持機構を備えた液体試料拭き取り機構が設けられている。液体試料拭き取り機構は、試料台10に固定された回転軸34、回転軸34から略水平方向に延出された回転可能なアーム31、そしてアーム31の先端に固定されたヘッド14から成る。ヘッド14の高さは、試料滴下台11の直上となるようにセットされている。   The sample stage 10 is provided with a liquid sample wiping mechanism provided with a waste holding mechanism according to the present invention. The liquid sample wiping mechanism includes a rotating shaft 34 fixed to the sample stage 10, a rotatable arm 31 extending from the rotating shaft 34 in a substantially horizontal direction, and a head 14 fixed to the tip of the arm 31. The height of the head 14 is set to be directly above the sample dropping table 11.

液体試料拭き取り機構の詳細を図3〜図5に示す。図3に示すように、ヘッド14は、液体試料を拭き取るための筒状のウエス40と、ウエス40に内包され、芯となるゴムブロック33と、ゴムブロック33を支えるサポータ32と、サポータ32の左右にそれぞれ設けられたアーチバネ35から成る。本実施例では、ヘッド14のサポータ32、その左右のアーチバネ35及びアーム31は1枚の薄い金属板で一体に成形されている。   Details of the liquid sample wiping mechanism are shown in FIGS. As shown in FIG. 3, the head 14 includes a cylindrical waste 40 for wiping the liquid sample, a rubber block 33 that is contained in the waste 40 and serves as a core, a supporter 32 that supports the rubber block 33, and a supporter 32. It consists of arch springs 35 provided on the left and right respectively. In this embodiment, the supporter 32 of the head 14, the left and right arch springs 35, and the arm 31 are integrally formed of one thin metal plate.

図5に示すように、ゴムブロック33の中心には長手方向に延びる貫通穴が設けられ、サポータ32はこの貫通穴に挿通されることによりゴムブロック33を保持する。ゴムブロック33の上下面には、ウエス40による試料滴下台11及び窓板22の拭き取りを確実にするための長手方向の筋が多数設けられている。この筋は、図3及び図5に示すような直線状のV溝に限らず、うねりながら延伸する波線の溝や、断面が矩形の溝でもよい。   As shown in FIG. 5, a through hole extending in the longitudinal direction is provided at the center of the rubber block 33, and the supporter 32 holds the rubber block 33 by being inserted into the through hole. A number of longitudinal streaks are provided on the upper and lower surfaces of the rubber block 33 to ensure that the sample dropping table 11 and the window plate 22 are wiped off by the waste 40. The streak is not limited to a linear V-groove as shown in FIGS. 3 and 5, and may be a wavy-line groove extending in a wavy manner or a groove having a rectangular cross section.

図4に示すように、前記金属板は途中に屈曲部39を有し、屈曲部39よりも固定側(回転軸34側)がアーム31となり、自由側がサポータ32となる。この屈曲部39により、ゴムブロック33は常に一定の位置に固定される。なお、1個のゴムブロック33の代わりに、2個のゴムブロックをサポータ32の上下面に貼り合わせる構成にしてもよい。   As shown in FIG. 4, the metal plate has a bent portion 39 in the middle, and the fixed side (rotary shaft 34 side) of the bent portion 39 is the arm 31 and the free side is the supporter 32. The rubber block 33 is always fixed at a fixed position by the bent portion 39. Instead of one rubber block 33, two rubber blocks may be bonded to the upper and lower surfaces of the supporter 32.

図3に示すように、左右のアーチバネ35は、アーム31の左右から少し延出し、上方に折り曲げられ、そこから前方に延出している。その前方に延出する部分でアーチ形とされており、このアーチ形部分がバネ作用を有する。   As shown in FIG. 3, the left and right arch springs 35 slightly extend from the left and right of the arm 31, are bent upward, and extend forward therefrom. The portion extending forward is an arch shape, and this arch portion has a spring action.

図6に示すように、回転軸34は直下に設けたバネ36により上下に弾性的に移動可能となっている。これによりヘッド14は、窓板22に押さえられた場合、窓板22及び試料滴下台11に平行な状態を保ったまま、窓板22に従動する。なお、図7に示すように、アーム31の剛性を低くすることにより、同様にヘッド14を窓板22に従動させるようにしてもよい。   As shown in FIG. 6, the rotating shaft 34 is elastically movable up and down by a spring 36 provided immediately below. As a result, when the head 14 is pressed by the window plate 22, the head 14 follows the window plate 22 while maintaining a state parallel to the window plate 22 and the sample dropping table 11. As shown in FIG. 7, the head 14 may be similarly driven by the window plate 22 by reducing the rigidity of the arm 31.

筒状のウエス40は、吸水性のある厚手の紙ウエス(紙タオル)の1枚もの又はそれを複数枚重ねたものを筒状に巻き、端を接着剤等で固定することで製作することができる。紙ウエスの素材によっては、熱圧を加えることにより接合することも可能である。   The cylindrical waste 40 is manufactured by winding one thick paper waste (paper towel) having water absorption or a plurality of stacked paper wastes into a cylindrical shape and fixing the end with an adhesive or the like. Can do. Depending on the material of the paper waste, it is also possible to join by applying hot pressure.

このような構成を有する本実施例の光学測定装置による微量液体試料の測定方法は次の通りである。まず、窓板ホルダ23を上に引き上げた状態で試料台10の試料滴下台11上に微量の液体試料を滴下し、窓板ホルダ23を下ろして液体試料を試料滴下台11と窓板ホルダ23の窓板22の間に挟む。この状態で光源16を点灯し、測定光を出射する。測定光は集光レンズ18により集光され、試料滴下台11と窓板22の間に保持された液体試料を透過し、その下方に設けられたスリット19で光域が制限される。光域が制限された試料透過光は回折格子20により波長分散され、マルチチャンネル型検出器21により全測定波長の強度が一斉に検出される。これにより、液体試料の分析等が行われる。   A method of measuring a trace amount liquid sample by the optical measuring apparatus of the present embodiment having such a configuration is as follows. First, a small amount of liquid sample is dropped on the sample dropping table 11 of the sample table 10 with the window plate holder 23 pulled up, and the window plate holder 23 is lowered to place the liquid sample on the sample dropping table 11 and the window plate holder 23. Between the two window plates 22. In this state, the light source 16 is turned on to emit measurement light. The measurement light is collected by the condenser lens 18, passes through the liquid sample held between the sample dropping table 11 and the window plate 22, and the light region is limited by the slit 19 provided below the sample. The sample transmitted light whose optical range is limited is wavelength-dispersed by the diffraction grating 20, and the intensities of all measurement wavelengths are detected all at once by the multichannel detector 21. Thereby, analysis of a liquid sample etc. are performed.

測定終了後、次の測定のために窓板ホルダ23を引き上げ、試料滴下台11及び窓板22の表面に付着する液体試料を拭き取り除去する。   After completion of the measurement, the window plate holder 23 is pulled up for the next measurement, and the liquid sample adhering to the surfaces of the sample dropping table 11 and the window plate 22 is wiped off.

この拭き取り作業を図1、図6、及び図8を用いて説明する。窓板ホルダ23が、図1に示すように試料滴下台11から十分離れた位置で停止すると、図8(a)の位置に退避していたヘッド14は、回転軸34を中心に試料台10に平行に旋回し、窓板22と試料滴下台11の間に移動する(図8(b))。その後、窓板ホルダ23を下降させ、窓板22をヘッド14に押し付ける。このとき、図6に示すように回転軸34が下方に移動するため、ヘッド14はその下の試料滴下台11にも接触する。この状態でヘッド14を旋回させて図8(a)の位置に戻すことにより、ヘッド14に被せたウエス40が窓板22の下面と試料滴下台11の上面に付着した液体試料を同時に拭き取る。ここで、ヘッド14の旋回は手動で行ってもよいし、モータ等を用いて自動的に行ってもよい。自動的に行う場合、窓板ホルダ23及びヘッド14の動きを試料測定シーケンスに組み込み、全てを自動化することが望ましい。   This wiping operation will be described with reference to FIG. 1, FIG. 6, and FIG. When the window plate holder 23 stops at a position sufficiently away from the sample dropping table 11 as shown in FIG. 1, the head 14 evacuated to the position of FIG. And move between the window plate 22 and the sample dropping table 11 (FIG. 8B). Thereafter, the window plate holder 23 is lowered and the window plate 22 is pressed against the head 14. At this time, as shown in FIG. 6, the rotating shaft 34 moves downward, so that the head 14 also contacts the sample dropping table 11 below. In this state, the head 14 is turned and returned to the position shown in FIG. 8A, so that the waste 40 placed on the head 14 wipes simultaneously the liquid sample adhering to the lower surface of the window plate 22 and the upper surface of the sample dropping table 11. Here, the turning of the head 14 may be performed manually or automatically using a motor or the like. When performing automatically, it is desirable to incorporate the movement of the window plate holder 23 and the head 14 into the sample measurement sequence and to automate all of them.

必要な場合には1回の測定毎、そうでない場合には複数回の測定毎に、ウエス40を交換する。ウエス40の取り外し及び装着は、ヘッド14の左右のアーチバネ35を指で押さえることにより簡単に行うことができる。   If necessary, the waste 40 is exchanged for each measurement, and otherwise, for each measurement. The waste 40 can be easily removed and attached by pressing the left and right arch springs 35 of the head 14 with fingers.

上記説明においてはヘッド14を試料台10に平行に旋回させ、窓板22及び試料滴下台11の接液面に平行に移動させることとしたが、図9(a)(b)に示すようにヘッド14をレール37に沿って平行移動させてもよく、また、図10(a)(b)に示すように試料滴下台11の表面に平行なアーム41を軸としてヘッド44を回転させてもよい。なお、図9及び図10には窓板22又は試料滴下台11のいずれかしか描かれていないが、上記ヘッド14の旋回の場合と同様、窓板22及び試料滴下台11を同時に拭き取ることができる。   In the above description, the head 14 is swung in parallel with the sample table 10 and moved in parallel with the liquid contact surface of the window plate 22 and the sample dropping table 11, but as shown in FIGS. 9 (a) and 9 (b). The head 14 may be translated along the rail 37, or the head 44 may be rotated about the arm 41 parallel to the surface of the sample dropping table 11 as shown in FIGS. 10 (a) and 10 (b). Good. 9 and 10 only depict either the window plate 22 or the sample dropping table 11, but the window plate 22 and the sample dropping table 11 can be wiped at the same time as in the case of the turning of the head 14. it can.

ウエス40を保持するための弾性手段としては、図11に示すように、ゴムブロック33の側面にゴムブロック33と一体に設けた凸起部38を用いてもよい。なお、いずれの弾性手段もゴムブロック33の両側面ではなく片面のみに設けてもよい。   As an elastic means for holding the waste 40, a protruding portion 38 provided integrally with the rubber block 33 on the side surface of the rubber block 33 may be used as shown in FIG. Any elastic means may be provided on only one side of the rubber block 33 and not on both sides.

ウエスは、シート状ウエスをゴムブロック33の上下面に1枚ずつ両面テープで固定したり、図12のようにシート状ウエス41の端部をゴムブロック53の側面に設けた切り込み42に差し込んで固定してもよい。   As for the waste, the sheet-like waste is fixed to the upper and lower surfaces of the rubber block 33 one by one with double-sided tape, or the end of the sheet-like waste 41 is inserted into a notch 42 provided on the side of the rubber block 53 as shown in FIG. It may be fixed.

本発明の一実施例である微量液体試料用光学測定装置の概略構成図。BRIEF DESCRIPTION OF THE DRAWINGS The schematic block diagram of the optical measuring apparatus for trace liquid samples which is one Example of this invention. 測定時の液体試料12の状態を示す図。The figure which shows the state of the liquid sample 12 at the time of a measurement. 液体試料拭き取り機構の構成を示す斜視図。The perspective view which shows the structure of a liquid sample wiping mechanism. 液体試料拭き取り機構の断面図。Sectional drawing of a liquid sample wiping mechanism. ヘッド14の端面図。FIG. 3 is an end view of the head 14. 回転軸34の移動を示す概念側面図。The conceptual side view which shows the movement of the rotating shaft 34. FIG. アーム31の変形を示す概念側面図。FIG. 3 is a conceptual side view showing deformation of an arm 31. ヘッド14の旋回を示す概略平面図。FIG. 3 is a schematic plan view showing the turning of the head 14. ヘッド14の平行移動を示す概念平面図。FIG. 3 is a conceptual plan view showing parallel movement of a head 14. ヘッド14の回転を示す概念斜視図。FIG. 3 is a conceptual perspective view showing rotation of the head 14. ゴムブロック33の側面に凸起部38を設けた液体試料拭き取り機構の平面図。The top view of the liquid sample wiping mechanism which provided the protrusion part 38 in the side surface of the rubber block 33. FIG. シート状ウエス41を取り付けたゴムブロック53の端面図End view of rubber block 53 with sheet-like waste 41 attached 従来の微量液体試料の分光測定を行う第一の装置における液体試料の保持方法の説明図。Explanatory drawing of the holding method of the liquid sample in the 1st apparatus which performs the spectroscopic measurement of the conventional trace amount liquid sample. 従来の微量液体試料の分光測定を行う第二の装置における試料プレート上面を示す図。The figure which shows the sample plate upper surface in the 2nd apparatus which performs the spectroscopic measurement of the conventional trace liquid sample.

符号の説明Explanation of symbols

10…試料台
11…試料滴下台
12…液体試料
13…ベース
14、44…ヘッド
15…支持柱
16…光源
17…平面鏡
18…集光レンズ
19…スリット
20…回折格子
21…検出器
22…窓板
23…窓板ホルダ
31、41…アーム
32…サポータ
33、53…ゴムブロック
34…回転軸
35…アーチバネ
36…バネ
37…レール
38…凸起部
39…屈曲部
40…ウエス
41…シート状ウエス
42…切り込み
DESCRIPTION OF SYMBOLS 10 ... Sample stand 11 ... Sample dropping stand 12 ... Liquid sample 13 ... Base 14, 44 ... Head 15 ... Support column 16 ... Light source 17 ... Plane mirror 18 ... Condensing lens 19 ... Slit 20 ... Diffraction grating 21 ... Detector 22 ... Window Plate 23 ... Window plate holder 31, 41 ... Arm 32 ... Supporter 33, 53 ... Rubber block 34 ... Rotating shaft 35 ... Arch spring 36 ... Spring 37 ... Rail 38 ... Raised portion 39 ... Bending portion 40 ... Waste 41 ... Sheet-like waste 42 ... Incision

Claims (5)

2枚の光透過面を接近させることにより両者の間に液体試料を保持し、該液体試料を透過する光を測定し、測定終了後に前記両光透過面を離間させる光学測定装置において、前記両光透過面に付着した液体試料を拭き取るための機構であって、
前記液体試料を拭き取る清掃用ウエスが上下面に取り付けられるサポート部と、
前記サポート部を前記両光透過面の間とその外との間で移動させる移動手段と、
測定終了後に、前記両光透過面の間に前記サポート部が移動された後、前記両光透過面を接近させて該両光透過面を前記清掃用ウエスに接触させる手段と、
を備えることを特徴とする光学測定装置用拭き取り機構。
In the optical measurement apparatus in which the two light transmission surfaces are brought close to each other, a liquid sample is held between the two, the light transmitted through the liquid sample is measured, and the light transmission surfaces are separated after the measurement is completed. A mechanism for wiping off a liquid sample adhering to a light transmission surface,
A support part to which a cleaning waste cloth for wiping off the liquid sample is attached to the upper and lower surfaces;
Moving means for moving the support part between the light transmission surfaces and the outside;
After the measurement is completed, after the support portion is moved between the two light transmission surfaces, the two light transmission surfaces are brought close to each other and the two light transmission surfaces are brought into contact with the cleaning waste.
A wiping mechanism for an optical measuring device.
前記移動手段が前記サポート部を両光透過面に平行に旋回させることを特徴とする請求項1に記載の光学測定装置用拭き取り機構。   The wiping mechanism for an optical measuring device according to claim 1, wherein the moving means turns the support portion in parallel with both light transmission surfaces. 前記移動手段が前記サポート部を両光透過面に平行に平行移動させることを特徴とする請求項1に記載の光学測定装置用拭き取り機構。   The wiping mechanism for an optical measuring device according to claim 1, wherein the moving means translates the support portion in parallel to both light transmission surfaces. 前記移動手段が前記サポート部を、両光透過面に平行な軸を中心に回転させることを特徴とする請求項1に記載の光学測定装置用拭き取り機構。   2. The wiping mechanism for an optical measuring device according to claim 1, wherein the moving means rotates the support portion around an axis parallel to both light transmission surfaces. 前記サポート部が、前記光透過面の移動方向に従動可能となっていることを特徴とする請求項1〜4のいずれかに記載の光学測定装置用拭き取り機構。   The wiping mechanism for an optical measuring device according to any one of claims 1 to 4, wherein the support portion is movable in the moving direction of the light transmission surface.
JP2007201876A 2007-07-26 2007-08-02 Wiping mechanism for optical measuring device Active JP4877137B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2007201876A JP4877137B2 (en) 2007-08-02 2007-08-02 Wiping mechanism for optical measuring device
US12/178,239 US8151396B2 (en) 2007-07-26 2008-07-23 Liquid-sample wiping mechanism and wipe-material holding mechanism for optical measurement apparatus
EP08160947.1A EP2023123B1 (en) 2007-07-26 2008-07-23 Optical Measurement Apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007201876A JP4877137B2 (en) 2007-08-02 2007-08-02 Wiping mechanism for optical measuring device

Publications (2)

Publication Number Publication Date
JP2009036664A JP2009036664A (en) 2009-02-19
JP4877137B2 true JP4877137B2 (en) 2012-02-15

Family

ID=40438711

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007201876A Active JP4877137B2 (en) 2007-07-26 2007-08-02 Wiping mechanism for optical measuring device

Country Status (1)

Country Link
JP (1) JP4877137B2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2071317B1 (en) 2006-10-06 2020-05-20 Shimadzu Corporation Spectrophotometer
JP4853420B2 (en) * 2007-07-26 2012-01-11 株式会社島津製作所 Optical measuring device
EP2342549B1 (en) * 2008-10-03 2014-06-04 NanoDrop Technologies LLC Optical path length sensor and method for optimal absorbance measurements
CN109540757B (en) * 2018-10-09 2021-10-01 南京哈昵特户外用品有限公司 A kind of inspection method of waterproof and breathable fabric

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5310471B2 (en) * 1975-02-19 1978-04-13
JPS5467986A (en) * 1977-11-09 1979-05-31 Hitachi Ltd Stair for escalator
JPS55141054A (en) * 1979-04-23 1980-11-04 Matsushita Electric Ind Co Ltd Electrofocusing vidicon target
JPH07103897A (en) * 1993-09-30 1995-04-21 Shimadzu Corp Emission spectroscopy analyzer
JP2007170984A (en) * 2005-12-22 2007-07-05 Shimadzu Corp Sample cell and spectrophotometer using the sample cell

Also Published As

Publication number Publication date
JP2009036664A (en) 2009-02-19

Similar Documents

Publication Publication Date Title
US8151396B2 (en) Liquid-sample wiping mechanism and wipe-material holding mechanism for optical measurement apparatus
JP4853518B2 (en) Spectrophotometer
JP4877137B2 (en) Wiping mechanism for optical measuring device
US8208145B2 (en) Analytical apparatus
US7872749B2 (en) Instrument for making optical measurements on multiple samples retained by surface tension
JP4645739B2 (en) Optical measuring device for trace liquid samples
JP5568070B2 (en) Micro cuvette assembly and method of using the same
JP2006322841A (en) Spectroscopic measurement method and spectrophotometer
JP4853420B2 (en) Optical measuring device
WO2015127422A1 (en) Multi-capillary cartridge for capillary electrophoresis
EP1873515B1 (en) Analyzer and method for cleaning photometry mechanism in such analyzer
JP2007170984A (en) Sample cell and spectrophotometer using the sample cell
JP4398399B2 (en) Capillary electrophoresis apparatus and capillary electrophoresis method
CN101592594A (en) Multifunctional sample holder for nondestructive testing on quality of agricultural and animal products
CN217277879U (en) Solid sample support for spectrophotometer
EP1865304A1 (en) Microcell and microcell holder
JP2006125901A5 (en)
JP2003028876A (en) Chromatographic quantitative measurement device
JP2017138265A (en) Holding device, and checking kit
JP2010190713A (en) Fluorescence measuring apparatus
CN114062339A (en) Micro-fluorescence spectrum acquisition system
WO2013137525A1 (en) Sample-mounting device for analysis of small amount of sample, and analysis apparatus and analysis method using same
JPH0382961A (en) Urine test paper clamper
CN110907418A (en) Device for detecting optical characteristics of liquid sample in pipette head
KR20190129271A (en) Diagnosis kit with transparent detection areas divided by grids and optical scanning reader using the same

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20091008

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20091008

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20110224

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20110301

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110427

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20111101

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20111114

R151 Written notification of patent or utility model registration

Ref document number: 4877137

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20141209

Year of fee payment: 3