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JP4881499B2 - Method for removing short circuit part of solar cell - Google Patents
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JP4881499B2 - Method for removing short circuit part of solar cell - Google Patents

Method for removing short circuit part of solar cell Download PDF

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JP4881499B2
JP4881499B2 JP22247699A JP22247699A JP4881499B2 JP 4881499 B2 JP4881499 B2 JP 4881499B2 JP 22247699 A JP22247699 A JP 22247699A JP 22247699 A JP22247699 A JP 22247699A JP 4881499 B2 JP4881499 B2 JP 4881499B2
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Japan
Prior art keywords
reverse voltage
short
solar cell
waveform
voltage
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JP22247699A
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JP2001053297A (en
Inventor
克彦 林
英雄 山岸
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Kaneka Corp
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Kaneka Corp
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Priority to JP22247699A priority Critical patent/JP4881499B2/en
Priority to AU22398/00A priority patent/AU766466B2/en
Priority to AT06005885T priority patent/ATE396505T1/en
Priority to AT00106128T priority patent/ATE329372T1/en
Priority to US09/532,111 priority patent/US6365825B1/en
Priority to EP00106128A priority patent/EP1052704B1/en
Priority to DE60038990T priority patent/DE60038990D1/en
Priority to EP06005885A priority patent/EP1670067B1/en
Priority to ES06005885T priority patent/ES2303705T3/en
Priority to DE60028452T priority patent/DE60028452T2/en
Publication of JP2001053297A publication Critical patent/JP2001053297A/en
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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Description

【0001】
【発明の属する技術分野】
本発明は、非晶質半導体などを用いた薄膜太陽電池に生じた短絡部を除去する装置および方法に関する。さらに詳しくは、本発明は、上記薄膜太陽電池において、発電に寄与する光電変換半導体層を挟む基板側電極と裏面側電極の電極間に耐電圧以下の逆方向電圧を印加して、その際に発生したジュール熱により短絡部を除去または酸化して絶縁する装置および方法に関する。
【0002】
【従来の技術】
図5に薄膜太陽電池10の構造を示す。図5に示されるように、薄膜太陽電池10は、絶縁性基板1の一つの面に、第1の電極2、光電変換半導体層3、および第2の電極4をそれぞれ所定のパターンに加工して順次積層することにより構成される太陽電池セル5を複数設けた構造を有する。光電変換半導体層3は、たとえばpin接合を有するアモルファスシリコン系半導体層により構成されている。こうした構造により、太陽電池セル5aの第1の電極2aと隣接する太陽電池セル5bの第2の電極4b、太陽電池セル5bの第1の電極2bと隣接する太陽電池セル5cの第2の電極4cが直列に接続される。
【0003】
このような薄膜太陽電池において、例えば製造時に光電変換半導体層にピンホールが生じると、太陽電池セルの第1の電極と第2の電極とが短絡することがある。短絡が生じた太陽電池セルは発電に寄与しなくなるため、太陽電池の光電変換効率が低下する。この問題に対処するために、太陽電池セルの正負の電極間に逆方向電圧(逆バイアス電圧)を印加して短絡部を除去する処理(逆バイアス処理)が行われる。この処理では、光電変換半導体層に逆方向電圧を印加することにより短絡部に電流を集中させ、発生したジュール熱によって短絡部の金属を飛散させたり金属を酸化して絶縁体とすることにより短絡部を除去する。
【0004】
例えば図5において、太陽電池セル5bの光電変換半導体層3bに生じた第1の電極2bと第2の電極4bとの短絡部を除去する場合について説明する。この場合、太陽電池セル5bの第2の電極4bおよび隣接する太陽電池セル5cの第2の電極4c(この第2の電極4cは、太陽電池セル5bの第1の電極2bに直列接続されている)にそれぞれ第1および第2のプローブ6a、6bを接触させ、発電に寄与する光電変換半導体層3bを挟む第1の電極2bと第2の電極4b間に耐電圧以下の逆方向電圧を印加する。
【0005】
従来は、第1および第2のプローブ6a、6b間に直流の逆方向電圧またはパルス状の矩形波をなす逆方向電圧を供給することにより逆バイアス処理を実施していた。
【0006】
しかし、太陽電池はダイオードと等価である。このため、第1の電極2と第2の電極4間に逆方向電圧を印加すると、第1の電極2、光電変換半導体層3および第2の電極4からなる太陽電池セル5がコンデンサーとして働き、印加電圧を除いた後にも電荷が蓄積しやすい。そして、この蓄積電荷による電圧に起因して光電変換半導体層3の欠陥(短絡部)以外の弱い部分が破壊されることがあるという問題がわかってきた。さらに、最近になって、逆方向電圧の印加による電荷の蓄積は極めて容易に起こり、この蓄積電荷による悪影響が予想以上に大きいことがわかってきた。
【0007】
【発明が解決しようとする課題】
本発明の目的は、薄膜太陽電池に逆方向電圧を印加して短絡部を除去する際に、電極間に電荷が蓄積される現象をできるだけ抑えて短絡部以外の部分が破壊されるのを避けることができる装置および方法を提供することにある。
【0008】
【課題を解決するための手段】
太陽電池の短絡部除去方法は、基板上に第1の電極層、半導体層、第2の電極層が順次形成された1又は複数の太陽電池セルを含む太陽電池の短絡部を除去する方法であって、前記太陽電池セルの正負の電極間に周波数が20〜1000Hzで、0.2秒以下の時間内で周期的に変化する波形を有する逆方向電圧を印加し、前記波形が0Vの期間及びピーク値から0Vに近づく期間を複数有し、当該期間に、蓄積された電荷を放電することを特徴とする。この方法では、逆方向電圧の印加時間は、(1/逆方向電圧の周波数)秒以上であれば十分である。たとえば、本発明において逆方向電圧として周波数60Hzの正弦波を印加する場合、逆方向電圧の印加時間は1〜12サイクル時間に相当する。
【0010】
本発明の方法では、第1および第2の電極間に周期的に変化する波形を示す逆方向電圧を0.2秒以下という短時間だけ印加するので、太陽電池セルにおける電荷の蓄積を極力抑制でき、かつ逆方向電圧が0Vの期間及びピーク値から0Vに近づく期間に蓄積された電荷を効果的に放電できるので、蓄積電荷に起因して短絡部以外の個所が破壊されるのを抑制できる。
【0011】
本発明の方法においては、周期的に変化する波形を示す逆方向電圧を0.2秒以下の時間だけ印加する操作を、逆方向電圧のピーク値を順次増加させながら繰り返してもよい。
【0012】
本発明の方法において、前記逆方向電圧の波形としては、正弦波、正弦波の半波、ノコギリ波または矩形波が用いられる。なお、逆方向電圧は、逆方向成分を主として、一部順方向成分を含んでいてもよい。
【0013】
なお、逆方向電圧の周波数は、太陽電池の容量Cと逆方向の抵抗Rで定義される時定数にマッチングさせることが好ましい。逆方向電圧の周波数を上記のように設定すると、印加電圧の波形を電源電圧の波形に追随させることができる。具体的には、逆方向電圧の周波数は20〜1000Hz、さらに50〜120Hzの範囲に設定される。
別の太陽電池の短絡部除去方法は、基板上に第1の電極層、半導体層、第2の電極層が順次形成された1又は複数の太陽電池セルを含む太陽電池の短絡部を除去する方法であって、前記太陽電池セルの正負の電極間に逆方向電圧および直流順方向電圧を交互に印加し、当該逆方向電圧が0.2秒以下の時間内で周期的に変化する波形を有していることを特徴とする。
【0014】
【発明の実施の形態】
本発明に係る太陽電池の短絡部除去装置を図1を参照して説明する。
【0015】
図1における薄膜太陽電池10は、図5と同様に、絶縁性基板1上に、第1の電極2、光電変換半導体層3および第2の電極4をそれぞれ所定のパターンに加工して順次積層することにより構成される太陽電池セル5を複数設けた構造を有し、各太陽電池セル5a、5bは互いに直列に接続されている。
【0016】
絶縁性基板1としてガラス基板や透明性樹脂基板などを用いた場合、第1の電極2としてはITO(Indium Tin Oxide:酸化錫を混入した酸化インジウム)などの透明電極材料が、第2の電極4としては金属電極材料が用いられる。一方、絶縁性基板1として透光性を示さない基板材料を用いた場合、第1の電極2としては金属電極材料が、第2の電極4としては透明電極材料が用いられる。
【0017】
半導体層3としては、非晶質シリコン系半導体の場合、非晶質シリコン、水素化非晶質シリコン、水素化非晶質シリコンカーバイド、非晶質シリコンナイトライドなどのほか、シリコンとゲルマニウムや錫などの他の金属との非晶質シリコン系合金などの材料が用いられる。また、半導体層はシリコン系に限られず、CdS系、GaAs系、InP系などの材料を用いて構成してもよい。これらの非晶質半導体層または微結晶半導体層はpin型、nip型、ni型、pn型、MIS型、ヘテロ接合型、ホモ接合型、ショットキーバリアー型またはこれらを組み合わせた形をなすように構成される。
【0018】
本発明に係る太陽電池の短絡部除去装置の一例を具体的に説明する。図1に示されるように、太陽電池セル5aの第1の電極2aおよび隣接する太陽電池セル5bの第2の電極4bに接触するように、それぞれ第1のプローブ6aおよび第2のプローブ6bが押圧される。これらのプローブ6aおよびプローブ6bには、ファンクションジネレータ11から増幅器(電流リミッタ内蔵)12を介して周期的に変化する波形を示す逆バイアス電圧が印加される。ファンクションジネレータ11から発生される逆方向電圧の印加時間はコンピュータ13により制御される。また、プローブ6aと増幅器12との間の配線には抵抗14が挿入され、この抵抗14の両端にかかる電圧がデジタルボルトメータ15により測定される。デジタルボルトメータ15により測定された逆方向電圧のピーク値はコンピュータ13に入力され、ファンクションジネレータ11へフィードバックされて、所定のピーク値を有する逆方向電圧が印加されるように制御される。さらにコンピュータ13により、太陽電池10が載置されているテーブル(図示せず)のX−Y移動、およびテーブルまたはプローブ機構の昇降が制御される。
【0019】
本発明において、ファンクションジェネレータから第1および第2のプローブを通して太陽電池セルの正負の両極間に供給される、周期的に変化する波形を示す逆方向電圧の波形の例を図2(A)〜(C)に示す。図2(A)に示す逆方向電圧の波形は正弦波である。図2(B)に示す逆方向電圧の波形は正弦波の半波である。図2(C)に示す逆方向電圧の波形はノコギリ波である。本発明においては、逆方向電圧の印加時間(図2においてT1で表示)を0.2秒以下に設定する。
【0020】
このように、逆方向電圧の印加時間が0.2秒以下と非常に短いので、電荷が蓄積されにくくなる。また、上記のような波形を示す逆方向電圧を印加することによって、逆方向電圧値がピーク値から徐々に0V近傍に近づくにつれて、第1および第2の電極2、4間に蓄積された電荷を減少させることができ、正常な部分の破壊を抑制できる。
【0021】
本発明において、ファンクションジェネレータから第1および第2のプローブを通して太陽電池セルの正負の両極間に供給される、周期的に変化する波形を示す逆方向電圧は、逆方向成分を主として、一部順方向成分を含んでいてもよい。このような逆方向電圧の波形を図3(A)〜(D)に示す。図3(A)に示す逆方向電圧の波形は一部順方向成分を含む正弦波である。図3(B)に示す逆方向電圧の波形は一部順方向成分を含む正弦波の半波である。図3(C)に示す逆方向電圧の波形は一部順方向成分を含む矩形波である。図3(D)に示す逆方向電圧の波形は一部順方向成分を含むノコギリ波である。
【0022】
上記のような波形を示す逆方向電圧を印加すると、順方向成分の印加時に第1および第2の電極2、4間に蓄積された電荷をさらに減少させることができ、正常な部分の破壊を抑制できる。
【0023】
本発明においては、周期的に変化する波形を示す逆方向電圧を0.2秒以下の時間だけ印加する操作を、逆方向電圧のピーク値を順次増加させながら繰り返すことが好ましい。このような方法では以下のような利点が得られる。
【0024】
一般的に太陽電池セルの逆耐圧は8〜10Vである。こうした太陽電池セルに対して、最初から4V以上(耐電圧以下)の比較的高い逆方向電圧を印加すると、かえって短絡部が除去しにくい状態になることがある。すなわち、短絡部が除去されずに残っている状態では本来的に逆方向電圧とリーク電流(短絡部を流れる電流)とは比例してリニアなV−I特性を示し、短絡部が除去された後にリーク電流が急激に減少するはずである。しかし、最初からピーク値が高い逆方向電圧を印加した場合には観測されるリーク電流が想定したV−I特性の直線よりも大きくなることがある。こうした太陽電池セルに対して最初のピーク値よりも高いピーク値を有する逆方向電圧を印加しても、さらにリーク電流の増加傾向が顕著になり、短絡部をより一層除去しにくくなることが多い。
【0025】
これに対して、逆方向電圧のピーク値を低い値(具体的には2V以下)から高い値へと変化させながら本発明による短時間の逆バイアス処理を繰り返すと、リーク電流の変化の傾向から、その太陽電池セルの短絡部が除去可能であるか、または除去しにくくなる性質のものであるかを判断することができる。したがって、逆バイアス処理の続行または終了を適切に決定して、最適な逆バイアス処理が可能になる。
【0026】
さらに、図4に示すように、このような処理において、ある回の逆方向成分の印加時(T1)時間と、前回の逆方向電圧よりも高いピーク値を有する次の逆方向成分の印加時(T1)時間との間のT2時間に、−0.5V以下の順方向電圧を印加してもよい。なお、逆方向電圧の変化のさせ方は、図4に示す例に限らず、種々の態様が考えられる。
【0027】
このようにT2時間に順方向電圧を印加すれば、第1および第2の電極2、4間に蓄積された電荷をさらに減少させることができ、正常な部分の破壊を抑制できる。
【0028】
実際に、以下のように本発明の方法および従来の方法に従って、60個の太陽電池セルを直列に集積した太陽電池の各セルに対して逆バイアス処理を行い、効果を比較した。
【0029】
本発明の方法に従い、以下のようなスケジュールで逆方向電圧および順方向電圧を印加して逆バイアス処理を行った。(1)周波数60Hz、ピーク値2Vの正弦波からなる逆方向電圧を0.17秒印加、(2)−0.1Vの直流順方向電圧を0.17秒印加、(3)周波数60Hz、ピーク値4Vの正弦波からなる逆方向電圧を0.17秒印加、(4)−0.1Vの直流順方向電圧を0.17秒印加、(5)周波数60Hz、ピーク値6Vの正弦波からなる逆方向電圧を0.17秒印加、(6)−0.1Vの直流順方向電圧を0.17秒印加(合計処理時間1.02秒)。この場合、60個のセルのうち58個のセルで良好な光電変換特性が認められた。
【0030】
一方、従来の方法に従い、周波数60Hz、ピーク値4Vの矩形波パルスを1.0秒間印加して逆バイアス処理を行った。この場合、60個のセルのうち良好な光電変換特性が認められたのは50個だけであった。これらの結果から、本発明による短絡部除去方法は極めて有効であることがわかる。
【0031】
【発明の効果】
以上詳述したように本発明の太陽電池の短絡部除去装置および短絡部除去方法を用いれば、電極間に電荷が蓄積される現象をできるだけ抑えて短絡部以外の部分が破壊されるのを避けることができ、しかも確実に短絡部を除去することができるので、太陽電池の光電変換特性の改善に大きく寄与する。
【図面の簡単な説明】
【図1】本発明に係る太陽電池の短絡部除去装置の構成を示す図。
【図2】本発明による逆方向電圧の波形を示す図。
【図3】本発明による逆方向電圧の波形を示す図。
【図4】本発明による逆方向電圧の波形を示す図。
【図5】太陽電池の構成と短絡部除去方法を説明する図。
【符号の説明】
1…絶縁性基板
2…第1の電極
3…光電変換半導体層
4…第2の電極
5…太陽電池セル
6…プローブ
10…太陽電池
11…ファンクションジネレータ
12…増幅器
13…コンピュータ
14…抵抗
15…デジタルボルトメータ
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an apparatus and method for removing a short-circuit portion generated in a thin film solar cell using an amorphous semiconductor or the like. More specifically, in the thin film solar cell, the present invention applies a reverse voltage equal to or lower than the withstand voltage between the substrate-side electrode and the back-side electrode sandwiching the photoelectric conversion semiconductor layer that contributes to power generation. The present invention relates to an apparatus and a method for insulating by removing or oxidizing a short-circuit portion by generated Joule heat.
[0002]
[Prior art]
FIG. 5 shows the structure of the thin film solar cell 10. As shown in FIG. 5, the thin-film solar cell 10 is formed by processing the first electrode 2, the photoelectric conversion semiconductor layer 3, and the second electrode 4 in a predetermined pattern on one surface of the insulating substrate 1. Thus, a plurality of solar cells 5 configured by sequentially stacking are provided. The photoelectric conversion semiconductor layer 3 is composed of, for example, an amorphous silicon semiconductor layer having a pin junction. With this structure, the second electrode 4b of the solar battery cell 5b adjacent to the first electrode 2a of the solar battery cell 5a, and the second electrode of the solar battery cell 5c adjacent to the first electrode 2b of the solar battery cell 5b. 4c are connected in series.
[0003]
In such a thin film solar cell, for example, if a pinhole is generated in the photoelectric conversion semiconductor layer during manufacturing, the first electrode and the second electrode of the solar cell may be short-circuited. Since the solar cell in which the short circuit has occurred does not contribute to power generation, the photoelectric conversion efficiency of the solar cell is reduced. In order to cope with this problem, a process (reverse bias process) is performed in which a reverse voltage (reverse bias voltage) is applied between the positive and negative electrodes of the solar battery cell to remove the short-circuit portion. In this process, by applying a reverse voltage to the photoelectric conversion semiconductor layer, the current is concentrated in the short circuit part, and the generated Joule heat scatters the metal in the short circuit part or oxidizes the metal to form an insulator. Remove the part.
[0004]
For example, in FIG. 5, the case where the short circuit part of the 1st electrode 2b and the 2nd electrode 4b which arose in the photoelectric conversion semiconductor layer 3b of the photovoltaic cell 5b is removed is demonstrated. In this case, the second electrode 4b of the solar battery cell 5b and the second electrode 4c of the adjacent solar battery cell 5c (this second electrode 4c is connected in series to the first electrode 2b of the solar battery cell 5b). The first and second probes 6a and 6b are in contact with each other, and a reverse voltage equal to or lower than the withstand voltage is applied between the first electrode 2b and the second electrode 4b sandwiching the photoelectric conversion semiconductor layer 3b contributing to power generation. Apply.
[0005]
Conventionally, reverse bias processing is performed by supplying a DC reverse voltage or a reverse voltage in the form of a pulsed rectangular wave between the first and second probes 6a and 6b.
[0006]
However, a solar cell is equivalent to a diode. For this reason, when a reverse voltage is applied between the first electrode 2 and the second electrode 4, the solar cell 5 including the first electrode 2, the photoelectric conversion semiconductor layer 3, and the second electrode 4 functions as a capacitor. Charges are likely to accumulate even after the applied voltage is removed. And the problem that weak parts other than the defect (short circuit part) of the photoelectric conversion semiconductor layer 3 may be destroyed due to the voltage by this stored charge has been found. Furthermore, recently, it has been found that charge accumulation due to application of a reverse voltage occurs very easily, and the adverse effect of the accumulated charge is greater than expected.
[0007]
[Problems to be solved by the invention]
The object of the present invention is to suppress the phenomenon that charges are accumulated between electrodes as much as possible when a reverse voltage is applied to a thin-film solar cell to remove the short-circuit portion, thereby avoiding destruction of portions other than the short-circuit portion. It is to provide an apparatus and method that can be used.
[0008]
[Means for Solving the Problems]
The solar cell short-circuit removal method is a method of removing a short-circuit portion of a solar cell including one or a plurality of solar cells in which a first electrode layer, a semiconductor layer, and a second electrode layer are sequentially formed on a substrate. A reverse voltage having a waveform with a frequency of 20 to 1000 Hz and periodically changing within 0.2 seconds or less is applied between the positive and negative electrodes of the solar battery cell, and the waveform is 0 V And a plurality of periods approaching 0 V from the peak value, and the accumulated charges are discharged during the period . In this method, it is sufficient that the application time of the reverse voltage is (1 / reverse voltage frequency) or more. For example, when a sine wave having a frequency of 60 Hz is applied as the reverse voltage in the present invention, the reverse voltage application time corresponds to 1 to 12 cycle times.
[0010]
In the method of the present invention, the reverse voltage indicating a periodically changing waveform is applied between the first and second electrodes only for a short time of 0.2 seconds or less, so that accumulation of charges in the solar cell is suppressed as much as possible. The charge accumulated during the period when the reverse voltage is 0V and the period approaching 0V from the peak value can be effectively discharged, so that it is possible to suppress the destruction of the portion other than the short-circuit portion due to the accumulated charge. .
[0011]
In the method of the present invention, the operation of applying the reverse voltage indicating a periodically changing waveform for a time of 0.2 seconds or less may be repeated while sequentially increasing the peak value of the reverse voltage.
[0012]
In the method of the present invention, a sine wave, a half sine wave, a sawtooth wave, or a rectangular wave is used as the waveform of the reverse voltage. Note that the reverse voltage may mainly include a forward component, mainly a reverse component.
[0013]
The frequency of the reverse voltage is preferably matched with a time constant defined by the capacity C of the solar cell and the resistance R in the reverse direction. When the frequency of the reverse voltage is set as described above, the waveform of the applied voltage can be made to follow the waveform of the power supply voltage. Specifically, the frequency of the reverse voltage is set to a range of 20 to 1000 Hz, and further 50 to 120 Hz.
Another solar cell short-circuit portion removal method removes a short-circuit portion of a solar cell including one or a plurality of solar cells in which a first electrode layer, a semiconductor layer, and a second electrode layer are sequentially formed on a substrate. In this method, a reverse voltage and a DC forward voltage are alternately applied between the positive and negative electrodes of the solar battery cell, and a waveform in which the reverse voltage periodically changes within a time of 0.2 seconds or less. It is characterized by having.
[0014]
DETAILED DESCRIPTION OF THE INVENTION
A solar cell short-circuit removing apparatus according to the present invention will be described with reference to FIG.
[0015]
As in FIG. 5, the thin film solar cell 10 in FIG. 1 is sequentially laminated on the insulating substrate 1 by processing the first electrode 2, the photoelectric conversion semiconductor layer 3, and the second electrode 4 in a predetermined pattern. Thus, the solar battery cells 5a and 5b are connected in series with each other.
[0016]
When a glass substrate or a transparent resin substrate is used as the insulating substrate 1, a transparent electrode material such as ITO (Indium Tin Oxide) is used as the second electrode as the first electrode 2. 4 is a metal electrode material. On the other hand, when a substrate material that does not transmit light is used as the insulating substrate 1, a metal electrode material is used as the first electrode 2, and a transparent electrode material is used as the second electrode 4.
[0017]
As the semiconductor layer 3, in the case of an amorphous silicon-based semiconductor, amorphous silicon, hydrogenated amorphous silicon, hydrogenated amorphous silicon carbide, amorphous silicon nitride, etc., as well as silicon and germanium or tin are used. A material such as an amorphous silicon alloy with another metal is used. Further, the semiconductor layer is not limited to a silicon system, and may be configured using a material such as a CdS system, a GaAs system, or an InP system. The amorphous semiconductor layer or the microcrystalline semiconductor layer may have a pin type, nip type, ni type, pn type, MIS type, heterojunction type, homojunction type, Schottky barrier type, or a combination thereof. Composed.
[0018]
An example of the solar cell short-circuit removing apparatus according to the present invention will be specifically described. As shown in FIG. 1, the first probe 6a and the second probe 6b are in contact with the first electrode 2a of the solar battery cell 5a and the second electrode 4b of the adjacent solar battery cell 5b, respectively. Pressed. A reverse bias voltage indicating a periodically changing waveform is applied to the probe 6 a and the probe 6 b via the amplifier (built-in current limiter) 12 from the function generator 11. The application time of the reverse voltage generated from the function generator 11 is controlled by the computer 13. A resistor 14 is inserted in the wiring between the probe 6 a and the amplifier 12, and the voltage applied to both ends of the resistor 14 is measured by the digital voltmeter 15. The peak value of the reverse voltage measured by the digital voltmeter 15 is input to the computer 13 and fed back to the function generator 11 so that a reverse voltage having a predetermined peak value is applied. Further, the computer 13 controls the XY movement of a table (not shown) on which the solar cell 10 is placed and the elevation of the table or probe mechanism.
[0019]
In this invention, the example of the waveform of the reverse voltage which shows the waveform which changes periodically and is supplied between the positive / negative poles of a photovoltaic cell through a 1st and 2nd probe from a function generator from FIG. Shown in (C). The reverse voltage waveform shown in FIG. 2A is a sine wave. The reverse voltage waveform shown in FIG. 2B is a half wave of a sine wave. The waveform of the reverse voltage shown in FIG. 2C is a sawtooth wave. In the present invention, the reverse voltage application time (indicated by T 1 in FIG. 2) is set to 0.2 seconds or less.
[0020]
As described above, since the application time of the reverse voltage is as short as 0.2 seconds or less, it is difficult to accumulate charges. Further, by applying the reverse voltage having the waveform as described above, the charge accumulated between the first and second electrodes 2 and 4 as the reverse voltage value gradually approaches 0V from the peak value. Can be reduced, and destruction of normal parts can be suppressed.
[0021]
In the present invention, the reverse voltage, which is supplied between the positive and negative electrodes of the solar battery cell from the function generator through the first and second probes and shows a periodically changing waveform, is mainly partially in the reverse direction. A direction component may be included. Such reverse voltage waveforms are shown in FIGS. The waveform of the reverse voltage shown in FIG. 3A is a sine wave that partially includes a forward component. The waveform of the reverse voltage shown in FIG. 3B is a half wave of a sine wave that partially includes a forward component. The waveform of the reverse voltage shown in FIG. 3C is a rectangular wave partially including a forward component. The waveform of the reverse voltage shown in FIG. 3D is a sawtooth wave that partially includes a forward component.
[0022]
When a reverse voltage having the waveform as described above is applied, the charge accumulated between the first and second electrodes 2 and 4 when the forward component is applied can be further reduced, and the normal portion is destroyed. Can be suppressed.
[0023]
In the present invention, it is preferable to repeat the operation of applying a reverse voltage indicating a periodically changing waveform for a time of 0.2 seconds or less while sequentially increasing the peak value of the reverse voltage. Such a method provides the following advantages.
[0024]
Generally, the reverse breakdown voltage of the solar battery cell is 8 to 10V. If a relatively high reverse voltage of 4 V or higher (withstand voltage or lower) is applied to such a solar battery cell from the beginning, the short circuit portion may be difficult to remove. That is, in the state where the short-circuited portion is not removed, the reverse voltage and the leakage current (current flowing through the short-circuited portion) inherently show linear VI characteristics, and the short-circuited portion is removed. Later, the leakage current should decrease rapidly. However, when a reverse voltage having a high peak value is applied from the beginning, the observed leakage current may be larger than the assumed line of VI characteristics. Even when a reverse voltage having a peak value higher than the first peak value is applied to such a solar battery cell, the increase tendency of the leakage current becomes more remarkable, and it is often difficult to remove the short-circuit portion. .
[0025]
On the other hand, when the reverse bias processing for a short time according to the present invention is repeated while changing the peak value of the reverse voltage from a low value (specifically, 2 V or less) to a high value, the tendency of the change in the leakage current occurs. It is possible to determine whether the short circuit portion of the solar battery cell can be removed or is difficult to remove. Therefore, it is possible to appropriately determine whether to continue or end the reverse bias process and to perform an optimal reverse bias process.
[0026]
Further, as shown in FIG. 4, in such a process, the time of applying a reverse component at one time (T 1 ) and the application of the next reverse component having a peak value higher than the previous reverse voltage. A forward voltage of −0.5 V or less may be applied for a time T 2 between the time (T 1 ) time. Note that the method of changing the reverse voltage is not limited to the example shown in FIG. 4, and various modes are conceivable.
[0027]
If the forward voltage is applied in the time T 2 in this way, the charge accumulated between the first and second electrodes 2 and 4 can be further reduced, and the destruction of the normal part can be suppressed.
[0028]
Actually, according to the method of the present invention and the conventional method as described below, reverse bias treatment was performed on each cell of solar cells in which 60 solar cells were integrated in series, and the effects were compared.
[0029]
According to the method of the present invention, reverse bias treatment was performed by applying a reverse voltage and a forward voltage according to the following schedule. (1) A reverse voltage composed of a sine wave having a frequency of 60 Hz and a peak value of 2 V is applied for 0.17 seconds, (2) a DC forward voltage of -0.1 V is applied for 0.17 seconds, and (3) a frequency of 60 Hz, peak A reverse voltage consisting of a sine wave having a value of 4V is applied for 0.17 seconds, a DC forward voltage of (4) -0.1V is applied for 0.17 seconds, and (5) a sine wave having a frequency of 60 Hz and a peak value of 6V. A reverse voltage was applied for 0.17 seconds, and a DC forward voltage of (6) -0.1 V was applied for 0.17 seconds (total processing time 1.02 seconds). In this case, good photoelectric conversion characteristics were recognized in 58 cells out of 60 cells.
[0030]
On the other hand, according to a conventional method, a reverse bias process was performed by applying a rectangular wave pulse having a frequency of 60 Hz and a peak value of 4 V for 1.0 second. In this case, only 50 cells had good photoelectric conversion characteristics among the 60 cells. From these results, it can be seen that the method for removing a short-circuit portion according to the present invention is extremely effective.
[0031]
【Effect of the invention】
As described above in detail, by using the solar cell short-circuit removing device and the short-circuit removing method of the present invention, it is possible to suppress the phenomenon of charge accumulation between the electrodes as much as possible and avoid destruction of portions other than the short-circuited portion. In addition, since the short-circuit portion can be reliably removed, it greatly contributes to the improvement of the photoelectric conversion characteristics of the solar cell.
[Brief description of the drawings]
FIG. 1 is a diagram showing a configuration of a solar cell short-circuit removing apparatus according to the present invention.
FIG. 2 is a diagram showing a waveform of a reverse voltage according to the present invention.
FIG. 3 is a diagram showing a waveform of a reverse voltage according to the present invention.
FIG. 4 is a diagram showing a waveform of a reverse voltage according to the present invention.
FIG. 5 is a diagram for explaining a configuration of a solar cell and a method for removing a short-circuit portion.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 ... Insulating substrate 2 ... 1st electrode 3 ... Photoelectric conversion semiconductor layer 4 ... 2nd electrode 5 ... Solar cell 6 ... Probe 10 ... Solar cell 11 ... Function generator 12 ... Amplifier 13 ... Computer 14 ... Resistance 15 ... Digital voltmeter

Claims (6)

基板上に第1の電極層、半導体層、第2の電極層が順次形成された1又は複数の太陽電池セルを含む太陽電池の短絡部を除去する方法であって、前記太陽電池セルの正負の電極間に周波数が20〜1000Hzで、0.2秒以下の時間内で周期的に変化する波形を有する逆方向電圧を印加し、前記波形が0Vの期間及びピーク値から0Vに近づく期間を複数有し、当該期間に、蓄積された電荷を放電することを特徴とする太陽電池の短絡部除去方法。A method of removing a short-circuit portion of a solar battery including one or a plurality of solar cells in which a first electrode layer, a semiconductor layer, and a second electrode layer are sequentially formed on a substrate, wherein the positive and negative of the solar cells A reverse voltage having a waveform having a frequency of 20 to 1000 Hz and periodically changing within a time of 0.2 seconds or less is applied between the electrodes, and the waveform has a period of 0V and a period in which the peak value approaches 0V. A method for removing a short-circuited portion of a solar cell, comprising: a plurality, wherein the accumulated charge is discharged during the period . 前記逆方向電圧を印加する操作を、逆方向電圧のピーク値を順次増加させながら繰り返し、各逆方向電圧が0.2秒以下の時間内で周期的に変化する波形を有していることを特徴とする請求項1記載の太陽電池の短絡部除去方法。  The operation of applying the reverse voltage is repeated while sequentially increasing the peak value of the reverse voltage, and each reverse voltage has a waveform that periodically changes within a time of 0.2 seconds or less. The short circuit part removal method of the solar cell of Claim 1 characterized by the above-mentioned. 前記逆方向電圧は、正弦波、正弦波の半波、ノコギリ波または矩形波であることを特徴とする請求項1または2記載の太陽電池の短絡部除去方法。  3. The method for removing a short circuit portion of a solar cell according to claim 1, wherein the reverse voltage is a sine wave, a half wave of a sine wave, a sawtooth wave, or a rectangular wave. 前記逆方向電圧の周波数が50〜120Hzであることを特徴とする請求項記載の太陽電池の短絡部除去方法。Short circuit portion removing method of the solar cell according to claim 1, wherein the frequency of the reverse voltage is 50~120Hz. 基板上に第1の電極層、半導体層、第2の電極層が順次形成された1又は複数の太陽電池セルを含む太陽電池の短絡部を除去する方法であって、前記太陽電池セルの正負の電極間に逆方向電圧および直流順方向電圧を交互に印加し、当該逆方向電圧が0.2秒以下の時間内で周期的に変化する波形を有していることを特徴とする太陽電池の短絡部除去方法。  A method of removing a short-circuit portion of a solar battery including one or a plurality of solar cells in which a first electrode layer, a semiconductor layer, and a second electrode layer are sequentially formed on a substrate. A reverse voltage and a DC forward voltage are alternately applied between the electrodes, and the reverse voltage has a waveform that periodically changes within a time of 0.2 seconds or less. Of removing the short circuit. 前記逆方向電圧は、正弦波、正弦波の半波、ノコギリ波または矩形波であることを特徴とする請求項記載の太陽電池の短絡部除去方法。The method of claim 5 , wherein the reverse voltage is a sine wave, a half sine wave, a sawtooth wave, or a rectangular wave.
JP22247699A 1999-05-14 1999-08-05 Method for removing short circuit part of solar cell Expired - Lifetime JP4881499B2 (en)

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JP22247699A JP4881499B2 (en) 1999-08-05 1999-08-05 Method for removing short circuit part of solar cell
AU22398/00A AU766466B2 (en) 1999-05-14 2000-03-20 Reverse biasing apparatus for solar battery module
AT00106128T ATE329372T1 (en) 1999-05-14 2000-03-21 GENERATOR PROVIDING A REVERSE BIAS FOR A SOLAR CELL MODULE
US09/532,111 US6365825B1 (en) 1999-05-14 2000-03-21 Reverse biasing apparatus for solar battery module
EP00106128A EP1052704B1 (en) 1999-05-14 2000-03-21 Reverse biasing apparatus for solar battery module
DE60038990T DE60038990D1 (en) 1999-05-14 2000-03-21 A reverse bias generator for a solar cell module
AT06005885T ATE396505T1 (en) 1999-05-14 2000-03-21 GENERATOR PROVIDING A REVERSE BIAS FOR A SOLAR CELL MODULE
EP06005885A EP1670067B1 (en) 1999-05-14 2000-03-21 Reverse biasing method and apparatus for solar battery module
ES06005885T ES2303705T3 (en) 1999-05-14 2000-03-21 PROCEDURE OF INVERSE POLARIZATION AND APPARATUS FOR A SOLAR CELL MODULE.
DE60028452T DE60028452T2 (en) 1999-05-14 2000-03-21 A reverse bias generator for a solar cell module

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