JP4898172B2 - 研磨パッド及びその製造方法並びに研磨方法 - Google Patents
研磨パッド及びその製造方法並びに研磨方法 Download PDFInfo
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- JP4898172B2 JP4898172B2 JP2005260273A JP2005260273A JP4898172B2 JP 4898172 B2 JP4898172 B2 JP 4898172B2 JP 2005260273 A JP2005260273 A JP 2005260273A JP 2005260273 A JP2005260273 A JP 2005260273A JP 4898172 B2 JP4898172 B2 JP 4898172B2
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- Prior art keywords
- polishing
- polishing pad
- abrasive grains
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Links
- 238000005498 polishing Methods 0.000 title claims description 211
- 238000000034 method Methods 0.000 title claims description 24
- 238000004519 manufacturing process Methods 0.000 title claims description 12
- 239000006061 abrasive grain Substances 0.000 claims description 81
- 239000011347 resin Substances 0.000 claims description 54
- 229920005989 resin Polymers 0.000 claims description 54
- 239000007788 liquid Substances 0.000 claims description 36
- 239000002245 particle Substances 0.000 claims description 25
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 15
- 229910000420 cerium oxide Inorganic materials 0.000 claims description 14
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 claims description 14
- 239000000463 material Substances 0.000 claims description 13
- 239000006185 dispersion Substances 0.000 claims description 12
- 239000011164 primary particle Substances 0.000 claims description 11
- 238000000465 moulding Methods 0.000 claims description 6
- 238000002156 mixing Methods 0.000 claims description 3
- 238000003825 pressing Methods 0.000 claims description 2
- 238000012545 processing Methods 0.000 claims description 2
- 230000000052 comparative effect Effects 0.000 description 17
- 239000011259 mixed solution Substances 0.000 description 16
- 239000002002 slurry Substances 0.000 description 16
- 239000004721 Polyphenylene oxide Substances 0.000 description 10
- 239000000853 adhesive Substances 0.000 description 10
- 230000001070 adhesive effect Effects 0.000 description 10
- 239000006260 foam Substances 0.000 description 10
- 239000000203 mixture Substances 0.000 description 10
- 229920000570 polyether Polymers 0.000 description 10
- 229920005862 polyol Polymers 0.000 description 10
- 150000003077 polyols Chemical class 0.000 description 10
- 239000000243 solution Substances 0.000 description 10
- 239000005057 Hexamethylene diisocyanate Substances 0.000 description 8
- RRAMGCGOFNQTLD-UHFFFAOYSA-N hexamethylene diisocyanate Chemical compound O=C=NCCCCCCN=C=O RRAMGCGOFNQTLD-UHFFFAOYSA-N 0.000 description 8
- 239000004814 polyurethane Substances 0.000 description 8
- 229920002635 polyurethane Polymers 0.000 description 8
- 238000012360 testing method Methods 0.000 description 7
- 239000012295 chemical reaction liquid Substances 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 239000010408 film Substances 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- UQSXHKLRYXJYBZ-UHFFFAOYSA-N Iron oxide Chemical compound [Fe]=O UQSXHKLRYXJYBZ-UHFFFAOYSA-N 0.000 description 4
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 4
- NUJOXMJBOLGQSY-UHFFFAOYSA-N manganese dioxide Chemical compound O=[Mn]=O NUJOXMJBOLGQSY-UHFFFAOYSA-N 0.000 description 4
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical group [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- 229910003460 diamond Inorganic materials 0.000 description 3
- 239000010432 diamond Substances 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000007517 polishing process Methods 0.000 description 3
- 238000002360 preparation method Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 229920000178 Acrylic resin Polymers 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical group F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- DHMQDGOQFOQNFH-UHFFFAOYSA-N Glycine Chemical group NCC(O)=O DHMQDGOQFOQNFH-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical group OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 2
- 239000004793 Polystyrene Substances 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 230000003750 conditioning effect Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000004745 nonwoven fabric Substances 0.000 description 2
- -1 polyethylene Polymers 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- 229920002223 polystyrene Polymers 0.000 description 2
- 229920000915 polyvinyl chloride Polymers 0.000 description 2
- 239000004800 polyvinyl chloride Substances 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 235000012239 silicon dioxide Nutrition 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical group [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- 239000002759 woven fabric Substances 0.000 description 2
- IBOFVQJTBBUKMU-UHFFFAOYSA-N 4,4'-methylene-bis-(2-chloroaniline) Chemical compound C1=C(Cl)C(N)=CC=C1CC1=CC=C(N)C(Cl)=C1 IBOFVQJTBBUKMU-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical group [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- 239000004471 Glycine Chemical group 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical group C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 description 1
- 239000012964 benzotriazole Chemical group 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 150000002334 glycols Chemical class 0.000 description 1
- 238000011065 in-situ storage Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- MVFCKEFYUDZOCX-UHFFFAOYSA-N iron(2+);dinitrate Chemical group [Fe+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O MVFCKEFYUDZOCX-UHFFFAOYSA-N 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- JLKDVMWYMMLWTI-UHFFFAOYSA-M potassium iodate Chemical group [K+].[O-]I(=O)=O JLKDVMWYMMLWTI-UHFFFAOYSA-M 0.000 description 1
- 239000001230 potassium iodate Chemical group 0.000 description 1
- 229940093930 potassium iodate Drugs 0.000 description 1
- 235000006666 potassium iodate Nutrition 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- LOAUVZALPPNFOQ-UHFFFAOYSA-N quinaldic acid Chemical group C1=CC=CC2=NC(C(=O)O)=CC=C21 LOAUVZALPPNFOQ-UHFFFAOYSA-N 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 239000011550 stock solution Substances 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical group [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
- B24B37/245—Pads with fixed abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/28—Resins or natural or synthetic macromolecular compounds
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Description
11・・・樹脂シート
12・・・砥粒
13・・・溝
14・・・両面接着シート
15・・・ベースシート
16・・・接着剤
20・・・研磨装置
21・・・定盤
22・・・研磨ヘッド
23・・・ノズル
R、r・・・回転方向
W・・・ワーク
Claims (5)
- 研磨パッドであって、
平坦な表面を有する樹脂シート、及び
前記樹脂シートの内部及び表面に分散して固定される砥粒、
から成り、
当該研磨パッドの引張強度が45MPa以上、60MPa以下の範囲にあり、
当該研磨パッドの引張破断伸度が2%以上、50%以下の範囲にあり、
前記砥粒の一次粒子径の平均粒子径が、0.05μm以上、0.2μm以下の範囲にあり、
前記砥粒が酸化セリウムからなる、
ところの研磨パッド。 - 請求項1の研磨パッドであって、
前記樹脂シートが無発泡体からなる、
ところの研磨パッド。 - 研磨パッドの製造方法であって、
前記研磨パッドが、平坦な表面を有する樹脂シート、及び前記樹脂シートの内部及び表面に分散して固定される砥粒から成り、前記研磨パッドの引張強度が45MPa以上、60MPa以下の範囲にあり、前記研磨パッドの引張破断伸度が2%以上、50%以下の範囲にあり、前記砥粒の一次粒子径の平均粒子径が、0.05μm以上、0.2μm以下の範囲にあり、前記砥粒が酸化セリウムからなり、
当該製造方法が、
樹脂溶液と前記砥粒とを混合して、砥粒分散液を製造する工程、
成形型を使用して、前記砥粒分散液を硬化し、内部及び表面に前記砥粒を固定した板状のブロックを成形する工程、及び
前記ブロックを、成形型から取り出した後に、前記ブロックの両面を研削し、所定の厚さに加工する工程、
から成る製造方法。 - ワークの表面を平坦化する研磨方法であって、
表面に研磨パッドを貼り付けた定盤を回転させる工程、
前記研磨パッドの表面に研磨液を供給する工程、及び
前記研磨液を供給した前記研磨パッドの表面に、前記ワークの表面を押し付け、前記ワークを回転させる工程、
から成り、
前記研磨パッドが、平坦な表面を有する樹脂シート、及び前記樹脂シートの内部及び表面に分散して固定される砥粒から成り、前記研磨パッドの引張強度が45MPa以上、60MPa以下の範囲にあり、前記研磨パッドの引張破断伸度が2%以上、50%以下の範囲にあり、前記砥粒の一次粒子径の平均粒子径が、0.05μm以上、0.2μm以下の範囲にあり、前記砥粒が酸化セリウムからなる、
ところの研磨方法。 - 請求項4の研磨方法であって、
前記研磨液として、水が使用される、
ところの研磨方法。
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005260273A JP4898172B2 (ja) | 2005-09-08 | 2005-09-08 | 研磨パッド及びその製造方法並びに研磨方法 |
| US11/518,065 US7241204B2 (en) | 2005-09-08 | 2006-09-07 | Polishing pad, method of producing same and method of polishing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005260273A JP4898172B2 (ja) | 2005-09-08 | 2005-09-08 | 研磨パッド及びその製造方法並びに研磨方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2007073796A JP2007073796A (ja) | 2007-03-22 |
| JP2007073796A5 JP2007073796A5 (ja) | 2008-10-09 |
| JP4898172B2 true JP4898172B2 (ja) | 2012-03-14 |
Family
ID=37830602
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005260273A Expired - Fee Related JP4898172B2 (ja) | 2005-09-08 | 2005-09-08 | 研磨パッド及びその製造方法並びに研磨方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7241204B2 (ja) |
| JP (1) | JP4898172B2 (ja) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB0612788D0 (en) * | 2006-06-28 | 2006-08-09 | Insectshield Ltd | Pest control materials |
| DE102009030298B4 (de) * | 2009-06-24 | 2012-07-12 | Siltronic Ag | Verfahren zur lokalen Politur einer Halbleiterscheibe |
| DE102009030297B3 (de) | 2009-06-24 | 2011-01-20 | Siltronic Ag | Verfahren zum Polieren einer Halbleiterscheibe |
| JP5851124B2 (ja) * | 2011-06-13 | 2016-02-03 | スリーエム イノベイティブ プロパティズ カンパニー | 研磨用構造体 |
| KR101295921B1 (ko) * | 2011-11-07 | 2013-08-13 | 주식회사 엘지실트론 | 연마패드의 표면처리방법 및 이를 이용한 웨이퍼의 연마방법 |
| KR101631974B1 (ko) * | 2011-12-16 | 2016-06-20 | 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 | 연마 패드 |
| CN102814751B (zh) * | 2012-07-31 | 2015-09-30 | 安徽威铭耐磨材料有限公司 | 一种掺有pvc树脂粉的陶瓷cbn砂轮 |
| JP6186809B2 (ja) | 2013-03-29 | 2017-08-30 | 株式会社リコー | 研磨ローラ、定着装置、及び画像形成装置 |
| CN104339278A (zh) * | 2013-08-07 | 2015-02-11 | 辽宁黄海砂轮制造有限公司 | 一种磨盘及其制备方法和应用 |
| US9421666B2 (en) | 2013-11-04 | 2016-08-23 | Applied Materials, Inc. | Printed chemical mechanical polishing pad having abrasives therein |
| JP2015226016A (ja) * | 2014-05-29 | 2015-12-14 | ニッタ・ハース株式会社 | 研磨パッド及び研磨パッドの判定方法 |
| JP2016198878A (ja) * | 2015-04-07 | 2016-12-01 | 株式会社サンエス | 砥石、加工装置、被加工物の加工方法 |
| CN106363501A (zh) * | 2015-07-24 | 2017-02-01 | 蓝思科技(长沙)有限公司 | 一种陶瓷产品的弧面加工及抛光方法以及陶瓷面板 |
| WO2017163565A1 (ja) * | 2016-03-25 | 2017-09-28 | バンドー化学株式会社 | 研磨材 |
| US10014022B1 (en) | 2017-01-04 | 2018-07-03 | International Business Machines Corporation | Flexible media burnishing apparatus and method |
| JP7074644B2 (ja) * | 2018-10-31 | 2022-05-24 | 信越化学工業株式会社 | 合成石英ガラス基板の研磨用研磨粒子の製造方法、並びに合成石英ガラス基板の研磨方法 |
| US20210213702A1 (en) * | 2019-12-17 | 2021-07-15 | Saint-Gobain Abrasives, Inc. | Nonwoven article |
| US20250282021A1 (en) * | 2024-03-07 | 2025-09-11 | Wolfspeed, Inc. | Disc Grinding for Semiconductor Wafers on Polishing System |
| CN118650542A (zh) * | 2024-06-03 | 2024-09-17 | 陈湛 | 一种碳化硅抛光的方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6069080A (en) * | 1992-08-19 | 2000-05-30 | Rodel Holdings, Inc. | Fixed abrasive polishing system for the manufacture of semiconductor devices, memory disks and the like |
| EP1015176B1 (en) * | 1997-04-04 | 2003-03-12 | Rodel Holdings, Inc. | Improved polishing pads and methods relating thereto |
| US6287185B1 (en) * | 1997-04-04 | 2001-09-11 | Rodel Holdings Inc. | Polishing pads and methods relating thereto |
| US6682402B1 (en) * | 1997-04-04 | 2004-01-27 | Rodel Holdings, Inc. | Polishing pads and methods relating thereto |
| DE69827147T2 (de) * | 1997-08-06 | 2006-03-02 | Rohm and Haas Electronic Materials CMP Holdings, Inc., Newark | Verfahren zum herstellen von einem polierkissen |
| US6080671A (en) * | 1998-08-18 | 2000-06-27 | Lucent Technologies Inc. | Process of chemical-mechanical polishing and manufacturing an integrated circuit |
| US6095902A (en) * | 1998-09-23 | 2000-08-01 | Rodel Holdings, Inc. | Polyether-polyester polyurethane polishing pads and related methods |
| CN1137013C (zh) * | 1999-01-21 | 2004-02-04 | 罗德尔控股公司 | 改进的抛光垫及其抛光方法 |
| US6328634B1 (en) * | 1999-05-11 | 2001-12-11 | Rodel Holdings Inc. | Method of polishing |
| JP2005007520A (ja) * | 2003-06-19 | 2005-01-13 | Nihon Micro Coating Co Ltd | 研磨パッド及びその製造方法並びに研磨方法 |
| TW200528550A (en) * | 2003-12-22 | 2005-09-01 | Uyemura C & Co Ltd | Polishing solution and method of polishing nonferrous metal materials |
-
2005
- 2005-09-08 JP JP2005260273A patent/JP4898172B2/ja not_active Expired - Fee Related
-
2006
- 2006-09-07 US US11/518,065 patent/US7241204B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2007073796A (ja) | 2007-03-22 |
| US7241204B2 (en) | 2007-07-10 |
| US20070054600A1 (en) | 2007-03-08 |
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