JP4968574B2 - アルミナ膜の形成方法 - Google Patents
アルミナ膜の形成方法 Download PDFInfo
- Publication number
- JP4968574B2 JP4968574B2 JP2006013875A JP2006013875A JP4968574B2 JP 4968574 B2 JP4968574 B2 JP 4968574B2 JP 2006013875 A JP2006013875 A JP 2006013875A JP 2006013875 A JP2006013875 A JP 2006013875A JP 4968574 B2 JP4968574 B2 JP 4968574B2
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- Japan
- Prior art keywords
- self
- alumina film
- substrate
- film
- boehmite particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 title claims description 44
- 238000000034 method Methods 0.000 title claims description 24
- 239000000758 substrate Substances 0.000 claims description 39
- 229910001593 boehmite Inorganic materials 0.000 claims description 35
- 239000002245 particle Substances 0.000 claims description 35
- FAHBNUUHRFUEAI-UHFFFAOYSA-M hydroxidooxidoaluminium Chemical compound O[Al]=O FAHBNUUHRFUEAI-UHFFFAOYSA-M 0.000 claims description 34
- 239000002094 self assembled monolayer Substances 0.000 claims description 27
- 239000013545 self-assembled monolayer Substances 0.000 claims description 27
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims description 15
- 125000000217 alkyl group Chemical group 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 8
- 238000010438 heat treatment Methods 0.000 claims description 6
- 238000001338 self-assembly Methods 0.000 claims description 4
- 238000010304 firing Methods 0.000 claims description 3
- 125000000524 functional group Chemical group 0.000 claims description 3
- 239000010408 film Substances 0.000 description 55
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 11
- 229910052737 gold Inorganic materials 0.000 description 11
- 239000010931 gold Substances 0.000 description 11
- 229910052782 aluminium Inorganic materials 0.000 description 10
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 239000000243 solution Substances 0.000 description 5
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 4
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 239000010410 layer Substances 0.000 description 3
- 230000001590 oxidative effect Effects 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- DTQVDTLACAAQTR-UHFFFAOYSA-N Trifluoroacetic acid Chemical compound OC(=O)C(F)(F)F DTQVDTLACAAQTR-UHFFFAOYSA-N 0.000 description 2
- 238000005411 Van der Waals force Methods 0.000 description 2
- 125000004429 atom Chemical group 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 239000011787 zinc oxide Substances 0.000 description 2
- TZVOTYCXLFYAPY-UHFFFAOYSA-N 2-sulfanylhexadecanoic acid Chemical compound CCCCCCCCCCCCCCC(S)C(O)=O TZVOTYCXLFYAPY-UHFFFAOYSA-N 0.000 description 1
- DKIDEFUBRARXTE-UHFFFAOYSA-N 3-mercaptopropanoic acid Chemical compound OC(=O)CCS DKIDEFUBRARXTE-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- -1 aluminum ions Chemical class 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000002120 nanofilm Substances 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 125000004430 oxygen atom Chemical group O* 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 125000003396 thiol group Chemical group [H]S* 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Landscapes
- Chemically Coating (AREA)
Description
また、容易にアルミナ膜の形成を可能としつつ、形成されるアルミナ膜の厚みを制御できるようにすることは非常に重要である。
先ず、図2に示されるように、シリコン基板に金を蒸着する(ステップA)。蒸着時間は4分である。
2 自己組織化単分子膜
3 ベーマイト粒子
4 アルミナ膜
Claims (4)
- 自己組織化法によって末端にカルボキシ基を有する分子を基材表面に配向させて自己組織化単分子膜を形成する第1ステップと、
前記自己組織化単分子膜上にベーマイト粒子を固定する第2ステップと、
前記ベーマイト粒子を固定した自己組織化単分子膜が形成された基材を加熱焼成する第3ステップと
を有することを特徴とするアルミナ膜の形成方法。 - 前記自己組織化単分子膜上に固定するベーマイト粒子は、粒子径を数nm〜100nmの範囲で選別したものであることを特徴とする請求項1記載のアルミナ膜の形成方法。
- 前記カルボキシ基を末端に有する分子は、アルキル鎖の一端にカルボキシ基を有し、他端に基材の表面と反応する結合性官能基が設けられたものであり、前記アルキル鎖の炭素数を10〜30に設定することを特徴とする請求項1記載のアルミナ膜の形成方法。
- ベーマイト粒子を固定した自己組織化単分子膜を加熱焼成する設定温度は、450℃〜1250℃であることを特徴とする請求項1記載のアルミナ膜の形成方法。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006013875A JP4968574B2 (ja) | 2006-01-23 | 2006-01-23 | アルミナ膜の形成方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006013875A JP4968574B2 (ja) | 2006-01-23 | 2006-01-23 | アルミナ膜の形成方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2007197737A JP2007197737A (ja) | 2007-08-09 |
| JP4968574B2 true JP4968574B2 (ja) | 2012-07-04 |
Family
ID=38452624
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006013875A Expired - Fee Related JP4968574B2 (ja) | 2006-01-23 | 2006-01-23 | アルミナ膜の形成方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4968574B2 (ja) |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58151306A (ja) * | 1982-03-02 | 1983-09-08 | Michihiro Takase | 金属酸化物の薄膜の製造法 |
| JPH02124707A (ja) * | 1988-11-01 | 1990-05-14 | Fujitsu Ltd | 金属酸化物超薄膜の作製方法 |
| JPH10101377A (ja) * | 1996-09-27 | 1998-04-21 | Central Glass Co Ltd | 防曇性被膜及びその製法 |
| JP3311978B2 (ja) * | 1997-11-05 | 2002-08-05 | 財団法人電気磁気材料研究所 | 単分子膜累積法を用いた無機薄膜及びその製造方法 |
| JP2003328140A (ja) * | 2002-05-13 | 2003-11-19 | Nagoya Industrial Science Research Inst | 領域選択析出方法 |
-
2006
- 2006-01-23 JP JP2006013875A patent/JP4968574B2/ja not_active Expired - Fee Related
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| Publication number | Publication date |
|---|---|
| JP2007197737A (ja) | 2007-08-09 |
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