JP4987500B2 - Inspection apparatus and inspection method for tape-like member attached to substrate - Google Patents

Description

  The present invention relates to an inspection apparatus and an inspection method for inspecting the adhesive state of the tape-shaped member before the electronic component is mounted after the adhesive tape-shaped member is adhered to the lead formed on the side portion of the substrate. .

  For example, in the assembly process of a liquid crystal display device, a plurality of tabs (TAB: Tape Automated Bonding) as electronic components on which liquid crystal driving ICs are mounted are mounted at predetermined intervals on the side of a liquid crystal display panel as a substrate. Similarly, a circuit board as an electronic component is electrically connected to these tabs to assemble the display device.

  When a tab is mounted on the liquid crystal display panel, an anisotropic conductive member having adhesiveness as a tape-like member is attached to the upper surface where a large number of leads on the side portions of the display panel are formed at predetermined intervals. Next, after temporarily bonding a plurality of tabs to the anisotropic conductive member at a predetermined interval, the tabs are finally bonded. When the tabs are finally pressure-bonded to the liquid crystal display panel, the circuit board having the anisotropic conductive member attached to one side is pressure-bonded to the tabs.

  Since the anisotropic conductive member attached to the side part of the liquid crystal display panel or the circuit board has adhesiveness as described above, the supply reel is overlapped with a highly peelable resin release tape and wound. It is. Then, after being fed from the supply reel and cut to a predetermined length with the side surface to which the release tape is not bonded down, it is pressure bonded to the upper surface of the side portion of the liquid crystal display panel.

  Next, after the release tape is peeled off from the portion of the anisotropic conductive member attached to the liquid crystal display panel, the substrate is transported to the next step of temporarily pressing the tab. If the tabs are temporarily crimped, the tabs are finally crimped in the next step, and then the circuit board is crimped to these tabs with an anisotropic conductive member.

  When peeling the release tape from the anisotropic conductive tape affixed to the liquid crystal display panel or circuit board, for example, the release roller is engaged with the release tape and the release roller is moved along the anisotropic conductive member. By doing so, the release tape is separated from the anisotropic conductive member.

  Therefore, since it is inevitable that the force to peel the release tape is applied to the anisotropic conductive tape, the anisotropic conductive member attached to the liquid crystal display panel or the circuit board may be peeled off by the force, And the edge part of the anisotropically conductive member which peeled may rise up from a liquid crystal display panel or a circuit board. As a result, there arises a problem that the tab cannot be securely crimped to the liquid crystal display panel or the circuit board in the next step.

  Therefore, if an anisotropic conductive tape is attached to a liquid crystal display panel or circuit board, it is automatically inspected whether the end of the anisotropic conductive member is rolled up before sending it to the next process. Has been done.

  When inspecting the rising of the end of the anisotropic conductive member, conventionally, as shown in Patent Document 1, the end portion of the anisotropic conductive member attached to the substrate is imaged by an imaging camera. Then, after binarizing the imaging pixels of the image into white pixels and black pixels, either one of the pixels is counted, and the counted value is compared with a preset threshold value.

  FIG. 6 shows the luminance of the substrate and leads in the visual field range imaged by the imaging camera and the threshold value B1 set when binarizing these. In the figure, X1 is the luminance of the lead where the anisotropic conductive member is adhered, X2 is the luminance of the lead where the anisotropic conductive member is not adhered, and X3 is the substrate between the leads. The brightness of the background is shown.

  If the end portion of the anisotropic conductive member is curled up, the lead is exposed from the curled up portion. Since the lead is made of a high-brightness metal that reflects light, the lead has a brightness higher than the threshold value B1 compared to a portion of the substrate such as a liquid crystal display panel or circuit board where the lead is not provided, and is binarized. When processed, it becomes a white pixel.

  Therefore, when the end of the anisotropic conductive member is rolled up and the lead is exposed, the portion becomes a white pixel. Therefore, the white portion is compared with the case where the anisotropic conductive member is normally attached. The number of pixels increases.

Therefore, if the count value of one of the white pixel and the black pixel is compared with the set value of the white pixel or the black pixel when the preset anisotropic conductive member is normally attached, the difference Thus, it can be determined whether or not the end of the anisotropic conductive member is rolled up.
JP 2003-75366 A

  By the way, when leads are formed on a substrate such as a liquid crystal display panel or a circuit board, the brightness of the leads may vary due to uneven processing at the time of forming the leads. For example, there are cases where the surface of the lead has a solid shape and the luminance is low, or the surface of the lead is a glossy surface and the luminance is high.

  When the brightness of a lead is high, even if an anisotropic conductive member is attached to the lead, the anisotropic conductive member is thin and has translucency, so the lead in the portion covered with the anisotropic conductive member May become higher than the threshold value B1, as indicated by the dotted line X4 in FIG.

  In such a state, when the end portion of the anisotropic conductive member is imaged by the imaging camera and the captured image is binarized to create a binarized image P1 as shown in FIG. Not only the lead portion exposed from the member but also the lead portion covered by the anisotropic conductive member becomes a white pixel. In this case, the black pixel is only the portion of the substrate exposed from between the leads.

  For this reason, since the ratio of white pixels is larger than a preset value, it is determined that the end of the anisotropic conductive member is not raised but actually rises. Sometimes.

  This invention is a tape-like member adhered to a substrate that can reliably determine whether or not the end of an anisotropic conductive member is rolled up even when the brightness of the lead is high An inspection apparatus and an inspection method are provided.

This invention is an inspection device for inspecting the state of attachment of a tape-like member attached to the upper surface of a side surface of a substrate provided with a plurality of leads at predetermined intervals,
Imaging means for imaging an end portion of the tape-like member attached to the substrate;
A lead brightness measurement unit that measures the luminance of a range across a plurality of leads including a part of the substrate in the imaging range of the imaging means;
A binarization threshold setting unit that binarizes the luminance of a portion excluding the portion of the substrate included in the range measured by the lead brightness measurement unit, and sets a threshold;
A binarized image creating unit that binarizes the captured image of the imaging unit based on the threshold set by the binarized threshold setting unit;
A tape-like member affixed to a substrate, comprising: a determination unit that determines a state of an end portion of the tape-like member based on a binarized image obtained by the binarized image creating unit. In the inspection equipment.

The lead brightness measurement unit measures the luminance in a range spanning a plurality of leads including a part of the substrate,
It is preferable that the binarization threshold setting unit performs binarization processing except for the portion of the substrate included in the range measured by the lead brightness measurement unit.

The threshold set by the binarization threshold setting unit is a value obtained by multiplying the average value of the luminance of the lead measured by the lead brightness measurement unit by a coefficient α,
The coefficient α is preferably 0.8 to 0.9.

The determination means is
A count unit that calculates the ratio of white pixels and black pixels of the binarized image obtained by the binarized image creation unit, and a preset value that sets the ratio of white pixels and black pixels counted by the count unit It is preferable that it is comprised by the comparison part to compare with and the determination part which determines the sticking state of the edge part of the said tape-shaped member based on the comparison in this comparison part.

The present invention is an inspection method for inspecting a sticking state of a tape-like member that is stuck on a side surface of a substrate provided with a plurality of leads at predetermined intervals,
Imaging a portion of the end of the tape-like member attached to the substrate;
Measuring the brightness of a range spanning a plurality of leads including a part of the substrate at the end portion of the imaged tape-shaped member;
A step of binarizing the luminance of a portion excluding the portion of the substrate included in the measured range to set a threshold;
A step of binarizing the captured image of the end portion of the tape-shaped member based on the set threshold;
And a step of determining the state of the end of the tape-shaped member based on the binarized image obtained by the binarization process. is there.

  According to this invention, when imaging the end portion of the tape-like member attached to the substrate, the luminance of the lead in the portion where the tape-like member is not attached is measured, and the threshold value is determined each time based on the luminance. Therefore, even if the brightness of the lead varies, it is possible to reliably determine whether or not the lead is exposed because the end of the tape-like member is not affected by the brightness.

Embodiments of the present invention will be described below with reference to the drawings.
FIG. 1 is a block diagram showing an inspection apparatus 1 according to an embodiment of the present invention. This inspection apparatus 1 has an imaging camera 2. The imaging camera 2 images an end portion of one side where a plurality of leads 3 of a substrate W such as a liquid crystal display panel or a circuit board shown in FIG. 2 are provided at a predetermined interval.

  An anisotropic conductive member 4 as a tape-like member is attached to one side of the substrate W by a sticking device (not shown) over the entire length, and the imaging camera 2 is connected to the end of the anisotropic conductive member 4. The edge part of the one side part of the said board | substrate W is imaged so that a part may enter into a visual field range. The visual field range of the imaging camera 2 is indicated by R in FIG.

  As shown in FIG. 1, the imaging signal S of the imaging camera 2 is output to the image memory 5 and stored therein. The imaging signal S stored in the image memory 5 is read out to the read brightness measurement unit 6. This lead brightness / darkness measurement unit 6 calculates an average value M of the luminance of the lead 3 in the detection range r shown in FIG. The detection range r is a part of one lead 3 to which the anisotropic conductive member 4 is not attached, and the average value M is an average luminance value of the detection range r.

  The average value M calculated by the read light / darkness measurement unit 6 is read by the binarization threshold value setting unit 8. The binarization threshold value setting unit 8 sets a value obtained by multiplying the average value M by a predetermined coefficient α as a threshold value B (shown in FIG. 3), and the imaging signal S of the visual field range R read from the image memory 5. Is binarized.

  The coefficient α is preferably 0.70 to 0.95, more preferably 0.80 to 0.90, and is set to 0.85 in this embodiment. That is, the coefficient α sets the luminance of the lead 3 in the detection range r to a value of 85% lower than the actual luminance of the lead 3.

  That is, by setting the coefficient α to 0.85, the threshold value B is higher than the luminance of the portion of the lead 3 where the anisotropic conductive member 4 is adhered, and the lead exposed from the anisotropic conductive member 4. It is set every time each substrate W is inspected so as to have a value lower than the luminance of 3.

  Thereby, the threshold value B set by multiplying by the coefficient α is a value that can reliably determine whether or not the lead 3 is covered with the anisotropic conductive member 4 regardless of the luminance of the lead 3. . Since the threshold value B is higher than the luminance of the background of the substrate W exposed between the leads 3, the background of the substrate W can also be reliably determined.

  The imaging signal S binarized by the binarization threshold setting unit 8 is read out to the binarized image creating unit 9, where a binarized image P shown in FIG. 4 is created. The binarized image P created by the binarized image creating unit 9 is read out by the counting unit 11, where the number of white pixels and the number of black pixels included in the binarized image P are counted.

  Then, the ratio of the number of white pixels to the number of black pixels or the number of white pixels or the number of black pixels is stored in the count unit 11 as the count signal C. In this embodiment, the number of white pixels is stored in the count unit 11 as the count signal C.

  The count signal C stored in the count unit 11 is read by the comparison unit 12 and is compared with a set value V set in advance by the comparison unit 12. This set value V is a black pixel in the portion of the binarized image P previously covered with the anisotropic conductive member 4 of the lead 3 and the background portion of the substrate W, and a white pixel in the exposed portion of the lead 3. Is set according to the number of white pixels.

  Therefore, if the count signal C is larger than the set value V, it means that there are more white pixels than black pixels, and therefore it is determined that the end of the anisotropic conductive member 4 is turned and the lead 3 is exposed. Is done. On the contrary, if the set value V is smaller than the count signal C, it means that there are more black pixels than white pixels, and therefore it is determined that the end of the anisotropic conductive member 4 is not rolled.

  Then, the determination results are output from the comparison unit 12 to the determination unit 13, and the determination results are displayed or alarmed by the determination unit 13 to notify the operator.

  According to the inspection apparatus 1 having such a configuration, when inspecting whether or not the end of the anisotropic conductive member 4 is curled, the anisotropic material adhered to one side of the substrate W by the imaging camera 2 The edge part of the conductive conductive member 4 is imaged. The imaging signal S of the imaging camera 2 is taken into the image memory 5 and read out to the lead brightness measurement unit 6.

In the lead brightness measuring unit 6 extracts a portion of the leads 3 anisotropic conductive member 4 of the field-of-view range R of the imaging camera 2 is not adhered as a detection range r, the average value of the luminance of the detection range r Find M.

  Then, the binarization threshold setting unit 8 sets the threshold B by multiplying the average value M by a coefficient α smaller than 1, in this embodiment, α = 0.85. The image signal S is binarized into white pixels and black pixels by the unit 9 to create a binarized image P.

The threshold value B is set by multiplying the average luminance of the detection range r, which is a portion where the anisotropic conductive member 4 of the lead 3 is not attached, by a coefficient α. Therefore, even when the luminance of the lead 3 is high, the threshold value B is lower than the luminance X2 of the exposed portion where the anisotropic conductive member 4 of the lead 3 is not attached as shown in FIG. The luminance X1 of the portion where the anisotropic conductive member 4 of the lead 3 is adhered and the luminance X3 of the background of the substrate W are higher.

  Therefore, if the binarized image creating unit 9 creates the binarized image P, the portion where the anisotropic conductive member 4 of the lead 3 is pasted and the substrate on which the lead 3 is not formed as shown in FIG. The portion of the background of W is a black pixel, and the exposed portion of the lead 3 that is not covered by the anisotropic conductive member 4 of the lead 3 is a white pixel.

  Therefore, even when the luminance X2 of the lead 3 formed on the substrate W is high, if the lead 3 is covered with the anisotropic conductive member 4, the luminance X1 of the portion is smaller than the threshold value B, and thus the black. Since the luminance X2 of the portion exposed from the anisotropic conductive member 4 of the lead 3 is larger than the threshold value B, it becomes a white pixel.

  Therefore, the number of white pixels included in the binarized image P created by the binarized image creation unit 9 is the portion where the anisotropic conductive member 4 of the lead 3 is not attached and the anisotropic conductive member 4. As the brightness X2 of the lead 3 is increased and the white pixels are not increased as in the conventional case, the white pixels of the binarized image P counted by the count unit 11 are not increased. When the number is compared with the set value V by the comparison unit 12, it can be reliably determined whether or not the anisotropic conductive member 4 is bald.

  In the above embodiment, the average value M of the luminance of the lead 3 measured by the lead light / darkness measuring unit 6 is measured by extracting a part of one lead 3 from the visual field range R of the imaging camera 2 as the detection range r. However, as shown in FIG. 5, the portions of the plurality of leads 3 including the background portion of the substrate W are extracted as the detection range r ′.

  Then, from the detection range r ′, the average value M of the luminance of the portions of the leads 3 excluding the background portion of the substrate W is obtained, and the threshold value B is set by multiplying the average value M by the coefficient α. May be.

  Thus, by setting the detection range r ′ to a range that spans the plurality of leads 3, for example, the positioning accuracy of the substrate W and the imaging camera 2 is reduced, and the extracted detection range r ′ is shifted and included in the range. Even if the ratio of the surface area of the substrate W to be changed changes, the luminance M of the leads 3 can be obtained with high accuracy in order to exclude the luminance of the substrate W.

1 is a block diagram of an inspection apparatus showing an embodiment of the present invention. Explanatory drawing when extracting a detection range from the visual field range of an imaging camera. The figure which shows the relationship between the threshold value set from the average value of the brightness | luminance of a detection range, and the brightness | luminance of the board | substrate of a visual field range, and a lead | read | reed. The figure which shows the binarized image obtained by binarizing the imaging signal of a visual field range based on the set threshold value. Explanatory drawing when extracting a detection range from the visual field range of the imaging camera which shows other embodiment of this invention. The figure which shows the relationship between the conventional threshold value and the brightness | luminance of the board | substrate of a visual field range of an imaging camera, and a lead | read | reed. The figure of the binarized image obtained when the brightness | luminance of the conventional lead is high.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 2 ... Imaging camera (imaging means), 3 ... Lead, 4 ... Anisotropic conductive member, 5 ... Image memory, 6 ... Lead brightness measurement part, 8 ... Binarization threshold value setting part, 9 ... Binarization image creation part 11... Counting unit (determination unit) 12... Comparison unit (determination unit) 13.

Claims (4)

An inspection device for inspecting the attached state of a tape-like member attached to the upper surface of a side surface of a substrate provided with a plurality of leads at predetermined intervals,
Imaging means for imaging an end portion of the tape-like member attached to the substrate;
A lead brightness measurement unit that measures the luminance of a range across a plurality of leads including a part of the substrate in the imaging range of the imaging means;
A binarization threshold setting unit that binarizes the luminance of a portion excluding the portion of the substrate included in the range measured by the lead brightness measurement unit, and sets a threshold;
A binarized image creating unit that binarizes the captured image of the imaging unit based on the threshold set by the binarized threshold setting unit;
A tape-like member affixed to a substrate, comprising: a determination unit that determines a state of an end portion of the tape-like member based on a binarized image obtained by the binarized image creating unit. Inspection equipment. The threshold set by the binarization threshold setting unit is a value obtained by multiplying the average value of the luminance of the lead measured by the lead brightness measurement unit by a coefficient α,
2. The inspection apparatus for a tape-like member adhered to a substrate according to claim 1, wherein the coefficient [alpha] is 0.8 to 0.9. The determination means is
A count unit that calculates the ratio of white pixels and black pixels of the binarized image obtained by the binarized image creation unit, and a preset value that sets the ratio of white pixels and black pixels counted by the count unit The substrate according to claim 1, comprising: a comparison unit that compares with a determination unit that determines a sticking state of an end portion of the tape-shaped member based on comparison in the comparison unit. Inspection device for stuck tape-like members. It is an inspection method for inspecting the attached state of a tape-like member attached to the upper surface of a side portion of a substrate provided with a plurality of leads at a predetermined interval,
Imaging a portion of the end of the tape-like member attached to the substrate;
Measuring the brightness of a range spanning a plurality of leads including a part of the substrate at the end portion of the imaged tape-shaped member;
A step of binarizing the luminance of a portion excluding the portion of the substrate included in the measured range to set a threshold;
A step of binarizing the captured image of the end portion of the tape-shaped member based on the set threshold;
And a step of determining a state of an end portion of the tape-shaped member based on a binarized image obtained by the binarization process. A method for inspecting a tape-shaped member attached to a substrate.

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