JP5028567B2 - 光照射装置及び調光方法 - Google Patents
光照射装置及び調光方法 Download PDFInfo
- Publication number
- JP5028567B2 JP5028567B2 JP2010160107A JP2010160107A JP5028567B2 JP 5028567 B2 JP5028567 B2 JP 5028567B2 JP 2010160107 A JP2010160107 A JP 2010160107A JP 2010160107 A JP2010160107 A JP 2010160107A JP 5028567 B2 JP5028567 B2 JP 5028567B2
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- light
- pwm
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- 238000000034 method Methods 0.000 title claims description 6
- 238000007689 inspection Methods 0.000 claims description 55
- 230000007246 mechanism Effects 0.000 claims description 24
- 230000001360 synchronised effect Effects 0.000 claims description 11
- 238000003384 imaging method Methods 0.000 claims description 8
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 238000012538 light obscuration Methods 0.000 claims description 2
- 230000007547 defect Effects 0.000 description 12
- 238000004904 shortening Methods 0.000 description 7
- 230000007723 transport mechanism Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000004043 responsiveness Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 239000000109 continuous material Substances 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
1・・・光照射機構
21・・・PWM制御部
C1、C2、C3、C4・・・ラインセンサカメラ
Claims (5)
- 1ラインの撮像が行われる間隔である所定のライン周期を有するとともに、複数の受光素子を一列に並べて構成されたラインセンサカメラに対して相対移動する検査対象を所定の明るさで撮像するために用いられる光照射装置であって、
前記検査対象に光を照射する光照射機構と、
所定のPWM周期で点灯期間及び消灯期間を交互に繰り返すPWM制御により、前記光照射機構を所定の明るさに制御するPWM制御部と、を備え、
各ライン周期に含まれる前記点灯期間が、1期間分又は数期間分であり、
前記PWM周期が、前記ライン周期と同期しているとともに、前記受光素子が1ライン周期に撮像する1画素のアスペクト比が大きくなるほど、1ライン周期に含まれる前記点灯期間の数が多くなるように設定されていることを特徴とする光照射装置。 - 前記点灯期間が開始されるタイミングと、前記ラインセンサカメラが撮像を開始するタイミングと、が揃えられている請求項1記載の光照射装置。
- 前記受光素子が正方形状のものであり、当該受光素子が1ライン周期に撮像する1画素のアスクペクト比が1:nである場合に、1ライン周期に含まれる前記点灯期間の数がnの少数点以下を切り上げた数となるように前記PWM周期が設定される請求項1又は2記載の光照射装置。
- 1ライン周期に含まれる前記点灯期間の長さの合計が一定値となるように設定されている請求項1、2又は3記載の光照射装置。
- 1ラインの撮像が行われる間隔である所定のライン周期を有するとともに、複数の受光素子を一列に並べて構成されたラインセンサカメラに対して相対移動する検査対象を所定の明るさで撮像するために用いられる光照射装置であり、前記検査対象に光を照射する光照射機構と、所定のPWM周期で点灯期間及び消灯期間を交互に繰り返すPWM制御により、前記光照射機構を所定の明るさに制御するPWM制御部と、を備えた光照射装置の調光方法であって、
各ライン周期に含まれる前記点灯期間を、1期間分又は数期間分とし、
前記PWM周期が、前記ライン周期と同期するとともに、前記受光素子が1ライン周期に撮像する1画素のアスペクト比が大きくなるほど、1ライン周期に含まれる前記点灯期間の数が多くなるように設定される設定ステップを備えたことを特徴とする調光方法。
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010160107A JP5028567B2 (ja) | 2010-07-14 | 2010-07-14 | 光照射装置及び調光方法 |
| KR1020110058567A KR101210674B1 (ko) | 2010-07-14 | 2011-06-16 | 광 조사 장치 및 조광 방법 |
| TW100124474A TWI437206B (zh) | 2010-07-14 | 2011-07-11 | 光照射裝置及調光方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010160107A JP5028567B2 (ja) | 2010-07-14 | 2010-07-14 | 光照射装置及び調光方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012021889A JP2012021889A (ja) | 2012-02-02 |
| JP5028567B2 true JP5028567B2 (ja) | 2012-09-19 |
Family
ID=45612794
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010160107A Expired - Fee Related JP5028567B2 (ja) | 2010-07-14 | 2010-07-14 | 光照射装置及び調光方法 |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP5028567B2 (ja) |
| KR (1) | KR101210674B1 (ja) |
| TW (1) | TWI437206B (ja) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE202014100974U1 (de) * | 2014-03-04 | 2015-06-08 | Retsch Technology Gmbh | Vorrichtung zur Bestimmung der Partikelgröße und/oder der Partikelform eines Partikelgemisches |
| EP3205258A4 (en) | 2014-10-10 | 2018-08-01 | Olympus Corporation | Light source device and method for controlling light source device |
| FR3078851B1 (fr) * | 2018-03-07 | 2020-02-14 | Teledyne E2V Semiconductors Sas | Camera de vision a mesure de temps de vol optimisee pour environnement multi-cameras |
| JP7145033B2 (ja) * | 2018-10-26 | 2022-09-30 | シーシーエス株式会社 | Oled駆動装置 |
| FI128235B (en) * | 2018-12-10 | 2020-01-15 | Procemex Oy Ltd | Overhead sidelight |
| CN110376207B (zh) * | 2019-07-16 | 2020-07-17 | 北京科技大学 | 一种超宽厚板表面缺陷在线检测系统图像采集方法 |
| CN111521609B (zh) * | 2020-05-06 | 2023-07-18 | 宁波九纵智能科技有限公司 | 一种同时控制图像采集装置和打光装置的系统及方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07298001A (ja) * | 1994-04-25 | 1995-11-10 | Canon Inc | 調光装置 |
| JP3459770B2 (ja) * | 1998-04-10 | 2003-10-27 | キヤノン株式会社 | 画像読取装置および方法、記録媒体 |
| JP3918392B2 (ja) | 2000-02-03 | 2007-05-23 | シーシーエス株式会社 | Ledを用いた製品検査用ライン照明装置 |
| JP3958062B2 (ja) * | 2002-02-15 | 2007-08-15 | キヤノン株式会社 | 画像読取装置、画像処理装置、光源制御方法、記憶媒体、及びプログラム |
| JP4368626B2 (ja) * | 2003-07-31 | 2009-11-18 | 株式会社リコー | 画像読取装置 |
| JP2005347645A (ja) * | 2004-06-04 | 2005-12-15 | Ccs Inc | 光量制御装置及び光照射装置 |
| JP4361043B2 (ja) * | 2005-09-20 | 2009-11-11 | アドバンスド・マスク・インスペクション・テクノロジー株式会社 | パタン検査装置 |
| JP2008032487A (ja) | 2006-07-27 | 2008-02-14 | Sumitomo Electric Ind Ltd | 外観検査装置 |
| JP2009074802A (ja) * | 2007-09-18 | 2009-04-09 | Lasertec Corp | 検査装置、検査方法及びパターン基板の製造方法 |
| JP2009288050A (ja) | 2008-05-29 | 2009-12-10 | Toppan Printing Co Ltd | 撮像装置及び検査装置 |
-
2010
- 2010-07-14 JP JP2010160107A patent/JP5028567B2/ja not_active Expired - Fee Related
-
2011
- 2011-06-16 KR KR1020110058567A patent/KR101210674B1/ko not_active Expired - Fee Related
- 2011-07-11 TW TW100124474A patent/TWI437206B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| JP2012021889A (ja) | 2012-02-02 |
| TWI437206B (zh) | 2014-05-11 |
| KR101210674B1 (ko) | 2012-12-10 |
| TW201235634A (en) | 2012-09-01 |
| KR20120007443A (ko) | 2012-01-20 |
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