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JP5057005B2 - Vacuum processing equipment - Google Patents
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JP5057005B2 - Vacuum processing equipment - Google Patents

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JP5057005B2
JP5057005B2 JP2004260958A JP2004260958A JP5057005B2 JP 5057005 B2 JP5057005 B2 JP 5057005B2 JP 2004260958 A JP2004260958 A JP 2004260958A JP 2004260958 A JP2004260958 A JP 2004260958A JP 5057005 B2 JP5057005 B2 JP 5057005B2
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substrate
substrate carrier
vacuum processing
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chamber
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JP2006077279A (en
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進 新井
勝彦 森
真人 宍倉
利夫 中島
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Ulvac Inc
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D19/00Degasification of liquids
    • B01D19/0005Degasification of liquids with one or more auxiliary substances
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D19/00Degasification of liquids
    • B01D19/0068General arrangements, e.g. flowsheets
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01CAMMONIA; CYANOGEN; COMPOUNDS THEREOF
    • C01C1/00Ammonia; Compounds thereof
    • C01C1/02Preparation, purification or separation of ammonia
    • C01C1/10Separation of ammonia from ammonia liquors, e.g. gas liquors
    • CCHEMISTRY; METALLURGY
    • C02TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02FTREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02F1/00Treatment of water, waste water, or sewage
    • C02F1/58Treatment of water, waste water, or sewage by removing specified dissolved compounds
    • C02F1/586Treatment of water, waste water, or sewage by removing specified dissolved compounds by removing ammoniacal nitrogen

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  • Organic Chemistry (AREA)
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  • Chemical Vapour Deposition (AREA)
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Description

本発明は、いわゆるインライン式の真空処理装置に係り、特に、タクトタイムを短縮し生産性を向上すると共に、省スペース化、低コスト化した、1m級以上の大型基板用の縦型方式の真空処理装置に関する。   The present invention relates to a so-called in-line vacuum processing apparatus, and in particular, a vertical type vacuum for a large substrate of 1 m class or more, which reduces tact time and improves productivity, and saves space and costs. The present invention relates to a processing apparatus.

例えば、プラズマディスプレイや液晶ディスプレイに用いられる大型ガラス基板を加工するには、真空下において、所望の温度まで昇温させる加熱工程や、スパッタリングやCVDなどの成膜工程、或いは、エッチング等の加工手段が必要である。   For example, to process a large glass substrate used for a plasma display or a liquid crystal display, a heating process for raising the temperature to a desired temperature under vacuum, a film forming process such as sputtering or CVD, or a processing means such as etching. is required.

ここで、以下、これら真空下における複数層の成膜工程の他、この成膜工程に付随する加熱工程等の真空下における処理工程を総括的に真空処理と呼び、また、真空槽内にスパッタリング装置やCVD、エッチングの他、加熱等の真空処理機構を具備し、基板を真空処理する機能を有する真空室を真空処理室と総括的に呼ぶこととする。   Hereafter, in addition to the multiple layer film forming step under vacuum, the processing step under vacuum such as the heating step accompanying this film forming step is generally referred to as vacuum processing, and sputtering is performed in the vacuum chamber. In addition to the apparatus, CVD and etching, a vacuum chamber having a vacuum processing mechanism such as heating and having a function of vacuum processing the substrate will be collectively referred to as a vacuum processing chamber.

特許文献1に示されるように、従来より、種々の真空処理装置が実用に供されている。
特許文献1のインライン型スパッタリング装置は、基板はローディング室の搬送手段に装着され、成膜室内で成膜処理されて、アンローディング室で回収されるワンスルータイプである(特許文献図10参照)。
As shown in Patent Document 1, various vacuum processing apparatuses have been put to practical use conventionally.
The inline-type sputtering apparatus of Patent Document 1 is a one-through type in which a substrate is mounted on a transfer means in a loading chamber, subjected to film formation in the film formation chamber, and collected in the unloading chamber (see FIG. 10 of Patent Document).

一方、従来の真空処理装置の例として、特許文献1とは異なる真空リターンタイプの縦型の真空処理装置を図4を用いて説明する。
図4は、従来の真空処理装置の主要構成を示す平面図である。
On the other hand, as an example of a conventional vacuum processing apparatus, a vacuum return type vertical vacuum processing apparatus different from Patent Document 1 will be described with reference to FIG.
FIG. 4 is a plan view showing a main configuration of a conventional vacuum processing apparatus.

図4に示すように、従来の真空処理装置100は、基板着脱部110、複数(図示のものでは3)の真空処理室130、132、134と、基板112を載置して搬送する基板キャリア140と、基板112を前記基板キャリア140に載せた状態で、大気側と真空側との間で搬入、搬出するための予備室120とを備えている。
また、同図において、150は真空排気装置である。
As shown in FIG. 4, the conventional vacuum processing apparatus 100 includes a substrate carrier for mounting and transporting a substrate attaching / detaching unit 110, a plurality (three in the illustrated example) of vacuum processing chambers 130, 132, and 134 and a substrate 112. 140 and a preliminary chamber 120 for carrying in and out between the atmosphere side and the vacuum side with the substrate 112 placed on the substrate carrier 140.
In the figure, reference numeral 150 denotes an evacuation device.

なお、基板112を、大気側と真空側との間で搬入、搬出するための予備室120については、以下、単に「予備室」、「ロード/アンロード室」、或いは、単に「L/UL室」という場合がある。
また、この従来装置100では、予備室120の基板入れ替え口120aの前には、基板キャリア140が配置されている。
The spare chamber 120 for carrying in and out the substrate 112 between the atmosphere side and the vacuum side is hereinafter simply referred to as “spare chamber”, “load / unload chamber”, or simply “L / UL”. Sometimes referred to as a “room”.
Further, in this conventional apparatus 100, a substrate carrier 140 is disposed in front of the substrate replacement port 120a of the preliminary chamber 120.

図4に示すように、基板着脱部110には、基板キャリア140に基板112を移載する移載ロボット114が配置されている。
また、図示による説明は省略するが、基板着脱部110には、基板カセットから水平搬送ロボットにより基板112を取り出し、移載ロボット114に受け渡すため、一旦、基板112を載置する受け台が設けられている。
As shown in FIG. 4, a transfer robot 114 for transferring the substrate 112 to the substrate carrier 140 is disposed in the substrate attaching / detaching unit 110.
Although not shown in the drawings, the substrate attaching / detaching unit 110 is provided with a cradle on which the substrate 112 is temporarily placed in order to take out the substrate 112 from the substrate cassette by the horizontal transfer robot and deliver it to the transfer robot 114. It has been.

基板キャリア140が水平に倒れると、この状態で基板着脱部110内の受け台の基板112を、移載ロボット114により基板キャリア140に移載し、移載後は基板キャリア140が垂直に立ち上がり、基板キャリア140は、略直立した状態で基板112を搬送する。   When the substrate carrier 140 falls horizontally, in this state, the substrate 112 of the cradle in the substrate attaching / detaching unit 110 is transferred to the substrate carrier 140 by the transfer robot 114, and after the transfer, the substrate carrier 140 rises vertically, The substrate carrier 140 conveys the substrate 112 in a substantially upright state.

また、図示は省略するが、各真空処理室130、132、134内には、基板キャリア140が下流側に搬送される往路となる第1の搬送経路と、上流側に搬送される復路となる第2の搬送経路の2つの搬送経路が設けられている。
更に、従来の真空処理装置100は、最後部(図中右端)の第3の真空処理室134が、基板キャリア140を往路から復路に、この2つの搬送経路に対して横方向に移動させて移載する移載機構(図示せず)を備えている。
Although not shown in the drawings, in each of the vacuum processing chambers 130, 132, and 134, there are a first transport path that is a forward path through which the substrate carrier 140 is transported downstream and a return path that is transported upstream. Two conveyance paths of the second conveyance path are provided.
Further, in the conventional vacuum processing apparatus 100, the third vacuum processing chamber 134 at the rearmost part (right end in the drawing) moves the substrate carrier 140 from the forward path to the return path in the lateral direction with respect to the two transport paths. A transfer mechanism (not shown) for transferring is provided.

以上の構成において、次に、従来の真空処理装置100の基本動作について、図4を用いて説明する。
先ず、基板着脱部110では、上述したように、移載ロボット114が、基板着脱部110内の所定位置にストックされた未処理基板112を取り込み、基板キャリア140に移載する。
基板着脱部110で、基板キャリア140に基板112が載置されると、この基板キャリア140は、ロード/アンロード室(L/UL室)120に搬入される。
Next, the basic operation of the conventional vacuum processing apparatus 100 will be described with reference to FIG.
First, in the substrate attaching / detaching unit 110, as described above, the transfer robot 114 takes the unprocessed substrate 112 stocked at a predetermined position in the substrate attaching / detaching unit 110 and transfers it to the substrate carrier 140.
When the substrate 112 is placed on the substrate carrier 140 by the substrate attaching / detaching unit 110, the substrate carrier 140 is carried into the load / unload chamber (L / UL chamber) 120.

L/UL室120に基板キャリア140が入室すると、このL/UL室120が真空排気され、高真空化された後に、第1の真空処理室130内に用意されている往路となる第1の搬送経路に搬出される。
基板キャリア140は、往路を搬送されながら、第1乃至第3の真空処理室130、132、134において、載置された基板が加熱や成膜等の真空処理が施される。
When the substrate carrier 140 enters the L / UL chamber 120, the L / UL chamber 120 is evacuated and evacuated, and then the first vacuum which becomes the forward path prepared in the first vacuum processing chamber 130. It is carried out to the conveyance route.
The substrate carrier 140 is subjected to vacuum processing such as heating and film formation in the first to third vacuum processing chambers 130, 132, and 134 while being transported in the forward path.

第3の真空処理室134で基板が真空処理された後は、基板キャリア140は復路となる第2の搬送経路に、図示しない移載機構により移載され、第3乃至第1の真空処理室134、132、130においてそれぞれ成膜等の真空処理がなされて、基板キャリア140は、真空処理された基板112を載置した状態で、L/UL室120を経て、基板着脱部110で基板112が取り外される。
即ち、この従来例は、真空中で基板112がL/UL室120に帰還してくる真空リターン方式である点に特徴を有している。
After the substrate is vacuum-processed in the third vacuum processing chamber 134, the substrate carrier 140 is transferred to the second transport path serving as a return path by a transfer mechanism (not shown), and the third to first vacuum processing chambers. The substrate carrier 140 is subjected to vacuum processing such as film formation at 134, 132, and 130, and the substrate 112 is placed in the substrate attaching / detaching unit 110 through the L / UL chamber 120 with the vacuum processed substrate 112 placed thereon. Is removed.
That is, this conventional example is characterized in that it is a vacuum return system in which the substrate 112 returns to the L / UL chamber 120 in a vacuum.

特開2000−129436JP 2000-129436 A

ところで、一般に、L/UL室では、基板キャリアの搬入、搬出の他に、真空排気と大気圧開放が行われる。
従って、真空処理装置のタクトは、このL/UL室の排気、ベント時間により影響を受ける。
Incidentally, in general, in the L / UL chamber, in addition to loading and unloading of the substrate carrier, evacuation and atmospheric pressure release are performed.
Therefore, the tact of the vacuum processing apparatus is affected by the exhaust / vent time of the L / UL chamber.

しかし、従来の真空処理装置では、L/UL室の基板入れ替え口には、基板キャリアが単数しか配置されていなかったために、基板着脱部において、基板キャリアが未処理基板の載置或いは処理基板の取り外しを行っている間、L/UL室では基板の仕込みや取出が行えない滞留時間が長くなり、タクトに悪影響が生じて、基板の真空処理効率が低下する問題を備えている。   However, in the conventional vacuum processing apparatus, since only a single substrate carrier is disposed at the substrate exchange port of the L / UL chamber, the substrate carrier is placed on an unprocessed substrate or a processed substrate in the substrate attaching / detaching portion. During the removal, the L / UL chamber has a problem that the residence time during which the substrate cannot be charged or taken out becomes long, the tact is adversely affected, and the vacuum processing efficiency of the substrate is lowered.

また、従来の真空処理装置では、基板着脱部には、基板カセットから水平搬送ロボットにより基板を取り出し、多関節ロボットである移載ロボットに受け渡すため、一旦、基板を受け台に載置し、それから移載ロボットより基板キャリアに移載する方式のために、水平搬送ロボットと移載ロボットの2台のロボットが必要であり、装置全体のコスト増に繋がっていた。   Moreover, in the conventional vacuum processing apparatus, in order to take out the substrate from the substrate cassette by the horizontal transfer robot and transfer it to the transfer robot that is an articulated robot, the substrate is temporarily placed on the cradle. Then, for the method of transferring from the transfer robot to the substrate carrier, two robots, a horizontal transfer robot and a transfer robot, are required, leading to an increase in the cost of the entire apparatus.

本発明は、上記従来の課題を解決し、タクトを短縮して、生産性を向上させるとともに、省スペース化、低コスト化した真空処理装置を提供することを目的とする。   An object of the present invention is to solve the above-mentioned conventional problems, to shorten the tact time, to improve the productivity, and to provide a vacuum processing apparatus that saves space and costs.

本発明の真空処理装置は、請求項1に記載のものでは、基板を真空処理する真空処理室と、前記基板を載置して搬送する基板キャリアと、前記基板を大気側と真空側との間で搬入、搬出するための予備室とを具備した真空処理装置において、前記基板キャリアを前記予備室の大気側基板キャリア入れ替え口の前面に2以上配置可能とされており、前記真空処理装置は、前記基板を略直立させた状態で真空処理を行う縦型方式であり、かつ、前記基板キャリアに基板を着脱する際には、当該基板キャリアを一旦水平に倒す方式の真空処理装置であって、複数の基板キャリア同士の干渉を防止する基板キャリア干渉防止機構を備え、前記基板キャリア干渉防止機構としては、前記基板キャリアに基板を取り付ける際には、一方の基板キャリアを水平面上で回転させ、当該基板キャリアは、他の基板キャリアとは反対側方向に水平に倒し、取り付けが完了すると、元の位置に復元し、かつ、前記基板キャリアから基板を取り外す際には、一方の基板キャリアを水平面上で回転させ、当該基板キャリアは、他の基板キャリアとは反対側方向に水平に倒し、取り外しが完了すると、元の位置に復元する機構である構成とした。 According to a vacuum processing apparatus of the present invention, a vacuum processing chamber for vacuum processing a substrate, a substrate carrier for mounting and transporting the substrate, and the substrate on the atmosphere side and the vacuum side are provided. In the vacuum processing apparatus having a preliminary chamber for carrying in and out between, two or more of the substrate carriers can be arranged in front of the atmosphere side substrate carrier replacement port of the preliminary chamber, and the vacuum processing apparatus A vertical processing system that performs vacuum processing in a state in which the substrate is substantially upright, and a method in which the substrate carrier is horizontally tilted when the substrate is attached to or detached from the substrate carrier. , comprising a substrate carrier interference prevention mechanism for preventing interference between the plurality of substrate carriers, as the substrate carrier interference prevention mechanism, when mounting the substrate on the substrate carrier, water one substrate carrier Rotate on the surface, the substrate carrier is tilted horizontally in the direction opposite to the other substrate carrier, and when the mounting is completed, it is restored to its original position, and when removing the substrate from the substrate carrier, One substrate carrier is rotated on a horizontal plane, the substrate carrier is horizontally tilted in a direction opposite to the other substrate carrier, and when the removal is completed, the mechanism is restored to the original position .

請求項2に記載の真空処理装置は、基板を真空処理する真空処理室と、前記基板を載置して搬送する基板キャリアと、前記基板を大気側と真空側との間で搬入、搬出するための複数の予備室と、前記予備室及び前記真空処理室の間に配置され、前記基板キャリアを前記予備室及び前記真空処理室の搬出入位置に移動させる基板キャリアスライド室とを具備した真空処理装置において、前記基板キャリアを前記予備室の大気側基板キャリア入れ替え口の前面に2以上配置可能とされており、前記真空処理装置は、前記基板を略直立させた状態で真空処理を行う縦型方式であり、かつ、前記基板キャリアに基板を着脱する際には、当該基板キャリアを一旦水平に倒す方式の真空処理装置であって、複数の基板キャリア同士の干渉を防止する基板キャリア干渉防止機構を備え、前記基板キャリア干渉防止機構としては、前記基板キャリアに基板を取り付ける際には、一方の基板キャリアを水平面上で回転させ、当該基板キャリアは、他の基板キャリアとは反対側方向に水平に倒し、取り付けが完了すると、元の位置に復元し、かつ、前記基板キャリアから基板を取り外す際には、一方の基板キャリアを水平面上で回転させ、当該基板キャリアは、他の基板キャリアとは反対側方向に水平に倒し、取り外しが完了すると、元の位置に復元する機構である構成とした。 The vacuum processing apparatus according to claim 2, wherein a vacuum processing chamber for vacuum processing the substrate, a substrate carrier for mounting and transporting the substrate, and loading and unloading the substrate between the atmosphere side and the vacuum side. A plurality of preliminary chambers and a substrate carrier slide chamber that is disposed between the preliminary chamber and the vacuum processing chamber and moves the substrate carrier to a loading / unloading position of the preliminary chamber and the vacuum processing chamber. In the processing apparatus, two or more of the substrate carriers can be arranged in front of the atmosphere side substrate carrier replacement port of the preliminary chamber, and the vacuum processing apparatus performs vertical processing in which the substrate is substantially upright and performs vacuum processing. A vacuum processing apparatus that is of a mold type and in which, when a substrate is attached to and detached from the substrate carrier, the substrate carrier is horizontally tilted once, and a substrate key for preventing interference between a plurality of substrate carriers. Comprising a rear interference prevention mechanism, as the substrate carrier interference prevention mechanism, when mounting the substrate on the substrate carrier, one of the substrate carrier is rotated on a horizontal plane, the substrate carrier opposite to the other of the substrate carrier Tilt horizontally in the lateral direction, and when the attachment is completed, when the substrate is removed from the substrate carrier, one substrate carrier is rotated on a horizontal plane, and the substrate carrier The structure is a mechanism that tilts horizontally in the direction opposite to the substrate carrier and restores to the original position when the removal is completed .

請求項3に記載の真空処理装置は、基板を真空処理する真空処理室と、前記基板を載置して搬送する基板キャリアと、前記基板を大気側と真空側との間で搬入、搬出するための予備室とを具備した真空処理装置において、前記基板キャリアを前記予備室の大気側基板キャリア入れ替え口の前面に2以上配置可能とされており、前記真空処理装置は、前記基板を略直立させた状態で真空処理を行う縦型方式であり、かつ、前記基板キャリアに基板を着脱する際には、当該基板キャリアを一旦水平に倒す方式の真空処理装置であって、複数の基板キャリア同士の干渉を防止する基板キャリア干渉防止機構を備え、前記基板キャリア干渉防止機構としては、前記基板キャリアに基板を取り付ける際には、少なくとも1つの基板キャリアを、前記予備室への移動方向とは直交する方向に水平に移動させ、他の基板キャリアと所定の間隙を設けて該他の基板キャリアが待機している方向と同方向に水平に倒し、取り付けが完了すると、元の位置に復元し、かつ、前記基板キャリアから基板を取り外す際には、少なくとも1つの基板キャリアを、前記予備室への移動方向とは直交する方向に水平に移動させ、他の基板キャリアと所定の間隙を設けて該他の基板キャリアが待機している方向と同方向に水平に倒し、取り外しが完了すると、元の位置に復元する機構である構成とした。 According to a third aspect of the present invention, there is provided a vacuum processing apparatus for vacuum processing a substrate, a substrate carrier for mounting and transporting the substrate, and transporting the substrate between the atmosphere side and the vacuum side. And two or more of the substrate carriers can be arranged in front of the atmosphere-side substrate carrier replacement port of the preliminary chamber, and the vacuum processing device can hold the substrate substantially upright. A vacuum processing apparatus that performs a vacuum process in a state in which the substrate carrier is attached to the substrate carrier, and when the substrate is attached to or detached from the substrate carrier, the substrate carrier is temporarily tilted horizontally. comprising a substrate carrier interference prevention mechanism to prevent interference, as the substrate carrier interference prevention mechanism, when mounting the substrate on the substrate carrier, at least one substrate carrier, the preliminary When moving horizontally to the direction perpendicular to the direction of movement, tilting in the same direction as the direction in which the other substrate carrier is waiting by providing a predetermined gap with the other substrate carrier, When restoring the original position and removing the substrate from the substrate carrier, move at least one substrate carrier horizontally in a direction perpendicular to the moving direction to the spare chamber, A mechanism is provided in which a predetermined gap is provided and the other substrate carrier is tilted horizontally in the same direction as the standby, and is restored to the original position when the removal is completed .

請求項4に記載の真空処理装置は、基板を真空処理する真空処理室と、前記基板を載置して搬送する基板キャリアと、前記基板を大気側と真空側との間で搬入、搬出するための複数の予備室と、前記予備室及び前記真空処理室の間に配置され、前記基板キャリアを前記予備室及び前記真空処理室の搬出入位置に移動させる基板キャリアスライド室とを具備した真空処理装置において、前記基板キャリアを前記予備室の大気側基板キャリア入れ替え口の前面に2以上配置可能とされており、前記真空処理装置は、前記基板を略直立させた状態で真空処理を行う縦型方式であり、かつ、前記基板キャリアに基板を着脱する際には、当該基板キャリアを一旦水平に倒す方式の真空処理装置であって、複数の基板キャリア同士の干渉を防止する基板キャリア干渉防止機構を備え、前記基板キャリア干渉防止機構としては、前記基板キャリアに基板を取り付ける際には、少なくとも1つの基板キャリアを、前記予備室への移動方向とは直交する方向に水平に移動させ、他の基板キャリアと所定の間隙を設けて該他の基板キャリアが待機している方向と同方向に水平に倒し、取り付けが完了すると、元の位置に復元し、かつ、前記基板キャリアから基板を取り外す際には、少なくとも1つの基板キャリアを、前記予備室への移動方向とは直交する方向に水平に移動させ、他の基板キャリアと所定の間隙を設けて該他の基板キャリアが待機している方向と同方向に水平に倒し、取り外しが完了すると、元の位置に復元する機構である構成とした。 The vacuum processing apparatus according to claim 4 carries a vacuum processing chamber for vacuum processing a substrate, a substrate carrier for mounting and transporting the substrate, and transports the substrate between the atmosphere side and the vacuum side. A plurality of preliminary chambers and a substrate carrier slide chamber that is disposed between the preliminary chamber and the vacuum processing chamber and moves the substrate carrier to a loading / unloading position of the preliminary chamber and the vacuum processing chamber. In the processing apparatus, two or more of the substrate carriers can be arranged in front of the atmosphere side substrate carrier replacement port of the preliminary chamber, and the vacuum processing apparatus performs vertical processing in which the substrate is substantially upright and performs vacuum processing. A vacuum processing apparatus that is of a mold type and in which, when a substrate is attached to and detached from the substrate carrier, the substrate carrier is horizontally tilted once, and a substrate key for preventing interference between a plurality of substrate carriers. Comprising a rear interference prevention mechanism, moving As the substrate carrier interference prevention mechanism, when mounting the substrate on the substrate carrier, at least one substrate carrier horizontally in a direction perpendicular to the moving direction to the preliminary chamber Tilted horizontally in the same direction as the other substrate carrier is waiting with a predetermined gap from the other substrate carrier, and when the mounting is completed, it is restored to its original position, and from the substrate carrier When removing the substrate, at least one substrate carrier is moved horizontally in a direction perpendicular to the direction of movement to the spare chamber, and a predetermined gap is provided between the other substrate carrier and the other substrate carrier is on standby. The structure is a mechanism that is tilted horizontally in the same direction as the moving direction and restored to the original position when the removal is completed .

請求項に記載の真空処理装置は、基板移載ロボットとして、上記基板を上記基板キャリアに水平に着脱する水平搬送ロボットを用いている構成とした。 The vacuum processing apparatus according to claim 5 is configured such that a horizontal transfer robot that horizontally attaches and detaches the substrate to and from the substrate carrier is used as the substrate transfer robot.

本発明の真空処理装置は、上述のように構成したために、以下のような優れた効果を有する。
(1)請求項1に記載したように構成すると、一つの基板キャリアが予備室に入室している間に、他の基板キャリアに基板の移載が行われ、予備室における真空排気或いはベントのブランクタイムが削減されるので、真空処理のタクトを短くすることができ、生産効率が向上する。
(2)また、基板が巨大化した場合でも、設置スペースを抑えた状態で、複数の基板キャリアが配置でき、生産性を向上することができる。
(3)更に、基板が巨大化した場合、基板にかかる風圧の影響を抑えて、動作時間の短い基板キャリア干渉防止機構を備えた真空処理装置とすることができる。
Since the vacuum processing apparatus of the present invention is configured as described above, it has the following excellent effects.
(1) According to the first aspect of the present invention, while one substrate carrier enters the spare chamber, the substrate is transferred to another substrate carrier, and evacuation or venting in the spare chamber is performed. Since the blank time is reduced, the tact time of vacuum processing can be shortened and the production efficiency is improved.
(2) Even when the substrate is enlarged, a plurality of substrate carriers can be arranged in a state where installation space is suppressed, and productivity can be improved.
(3) Further, when the substrate is enlarged, the effect of wind pressure applied to the substrate can be suppressed, and a vacuum processing apparatus provided with a substrate carrier interference prevention mechanism having a short operation time can be obtained.

)請求項2に記載したように構成すると、一つの基板キャリアが一つの予備室に入室している間に、他の基板キャリアに基板の移載が行われ、予備室における真空排気或いはベントのブランクタイムが削減されるので、真空処理のタクトを短くすることができ、生産効率が向上する。
(5)また、基板が巨大化した場合でも、設置スペースを抑えた状態で、複数の基板キャリアが配置でき、生産性を向上することができる。
(6)更に、基板が巨大化した場合、基板にかかる風圧の影響を抑えて、動作時間の短い基板キャリア干渉防止機構を備えた真空処理装置とすることができる。
( 4 ) According to the structure described in claim 2, while one substrate carrier enters one spare chamber, the substrate is transferred to the other substrate carrier, and vacuum exhaust or Since the blank time of the vent is reduced, the tact time of vacuum processing can be shortened and the production efficiency is improved.
(5) Even when the substrate is enlarged, a plurality of substrate carriers can be arranged in a state where installation space is suppressed, and productivity can be improved.
(6) Further, when the substrate is enlarged, the effect of wind pressure applied to the substrate can be suppressed, and a vacuum processing apparatus provided with a substrate carrier interference prevention mechanism having a short operation time can be obtained.

)請求項3又は4に記載したように構成すると、基板の大きさが中程度の場合、簡単な構成の基板キャリア干渉防止機構を備えた真空処理装置とすることができる。 ( 7 ) When configured as described in claim 3 or 4, when the size of the substrate is medium, a vacuum processing apparatus having a substrate carrier interference preventing mechanism with a simple configuration can be provided.

)請求項に記載したように構成すると、水平搬送ロボット1台で、基板の着脱が可能になり、装置のコストダウンが可能になる。 ( 8 ) When configured as described in claim 5 , the substrate can be attached and detached with one horizontal transfer robot, and the cost of the apparatus can be reduced.

以下、本発明の真空処理装置の一実施の形態を、図1乃至図3を用いて説明する。
図1は、本発明の真空処理装置の一実施の形態の構成を示す平面図である。
図2及び図3は、本発明の真空処理装置の一実施の形態の特徴を説明する一部裁断平面図である。
Hereinafter, an embodiment of the vacuum processing apparatus of the present invention will be described with reference to FIGS.
FIG. 1 is a plan view showing a configuration of an embodiment of a vacuum processing apparatus of the present invention.
2 and 3 are partially cut plan views for explaining the features of an embodiment of the vacuum processing apparatus of the present invention.

先ず、本実施の形態の真空処理装置10の主要構成を図1を用いて説明する。
図1に示すように、本実施の形態の真空処理装置10は、従来の真空処理装置100同様に、基板着脱部20と複数(図示のものは3)の真空処理室130、132、134及び真空排気装置150を備えている。
First, the main structure of the vacuum processing apparatus 10 of this Embodiment is demonstrated using FIG.
As shown in FIG. 1, the vacuum processing apparatus 10 of the present embodiment, like the conventional vacuum processing apparatus 100, has a substrate attaching / detaching unit 20 and a plurality (three in the drawing) of vacuum processing chambers 130, 132, 134, and A vacuum exhaust device 150 is provided.

一方、本実施の形態の真空処理装置10の構成上の第1の特徴として、複数(図示のものでは2)のL/UL室30A、30Bを有すると共に、このL/UL室30A、30Bの基板入れ替え口30Aa、30Baに、それぞれ基板キャリア12A、12Bが用意されている。
また、L/UL室30A、30Bが複数であるため、基板キャリア12A、12Bを、L/UL室30A、30Bと、第1の真空処理室130の搬出入ポジションに位置制御する基板スライド室40を配置している。
On the other hand, as a first feature of the configuration of the vacuum processing apparatus 10 according to the present embodiment, there are a plurality (2 in the illustrated example) of the L / UL chambers 30A, 30B, and the L / UL chambers 30A, 30B. Substrate carriers 12A and 12B are prepared in the substrate replacement ports 30Aa and 30Ba, respectively.
Also, since there are a plurality of L / UL chambers 30A and 30B, the substrate carrier 12A and 12B is controlled to the loading / unloading positions of the L / UL chambers 30A and 30B and the first vacuum processing chamber 130. Is arranged.

また、本実施の形態の真空処理装置10の構成上の第2の特徴としては、基板キャリア12A、12Bが基板24の着脱のため、水平に倒される際に、複数の基板キャリア12A、12B同士が接触し合わないようにする、基板キャリア干渉防止機構50を備えている。   In addition, as a second feature of the configuration of the vacuum processing apparatus 10 according to the present embodiment, when the substrate carriers 12A and 12B are tilted horizontally for attaching and detaching the substrate 24, the plurality of substrate carriers 12A and 12B are A substrate carrier interference preventing mechanism 50 is provided to prevent the two from contacting each other.

この機構50を備えていない場合は、図2に示すように、基板キャリア12A、12B同士の接触を避けるためには、2つのL/UL室30A、30Bをある程度離しておかなければならない。
これは、基板24が小さい場合は、装置10全体の設置スペースに大きな影響は与えないが、基板24が2m級以上のものになると、2つのL/UL室30A、30Bに隣接する基板キャリアスライド室40が巨大化するとともに、装置10全体が過大になり、クリーンルームに配置できる真空処理装置10の台数に制限が加えられ、クリーンルームの建設コスト、維持コスト等のコストが増大する恐れを有している。
If this mechanism 50 is not provided, as shown in FIG. 2, in order to avoid contact between the substrate carriers 12A and 12B, the two L / UL chambers 30A and 30B must be separated to some extent.
This does not greatly affect the installation space of the entire apparatus 10 when the substrate 24 is small, but when the substrate 24 is 2 m class or higher, the substrate carrier slide adjacent to the two L / UL chambers 30A and 30B. As the chamber 40 becomes larger and the entire apparatus 10 becomes excessive, the number of vacuum processing apparatuses 10 that can be arranged in the clean room is limited, and there is a risk that costs such as construction cost and maintenance cost of the clean room increase. Yes.

そこで、本実施の形態では、基板キャリア干渉防止機構50としては、図1の矢印に示すように、一方の基板キャリア12Aを水平面上で回転させて、基板キャリア12Aを水平に倒して基板24を着脱する際には、他方の基板キャリア12Bとは反対方向に水平に倒し、基板24の着脱が完了すると、元の位置に復元する回転方式を採用している。   Therefore, in the present embodiment, as the substrate carrier interference preventing mechanism 50, as shown by the arrow in FIG. 1, one substrate carrier 12A is rotated on a horizontal plane, and the substrate carrier 12A is tilted horizontally to move the substrate 24. When attaching / detaching, a rotation method is adopted in which the substrate carrier 12B is tilted horizontally in the opposite direction, and when the attachment / detachment of the substrate 24 is completed, the original position is restored.

このように、基板キャリア干渉防止機構50を構成すると、基板24が2m級以上と巨大化した場合でも、L/UL室30A、30Bの間隙を、基板の大きさに連動させてして大きくする必要はなく、隣接する基板キャリアスライド室40の大きさも最小限に抑えられ、同時に、真空処理装置10の設置スペースを小さく抑えることができる。   As described above, when the substrate carrier interference prevention mechanism 50 is configured, the gap between the L / UL chambers 30A and 30B is increased in conjunction with the size of the substrate even when the substrate 24 is enlarged to 2 m class or larger. There is no need, and the size of the adjacent substrate carrier slide chamber 40 can be minimized, and at the same time, the installation space of the vacuum processing apparatus 10 can be kept small.

また、特に、2m級以上の巨大な基板24を真空処理する場合、図3に示すように、基板キャリア12Aを波線から実線で示すように、矢印方向にスライドさせて、基板キャリア12A、12B同士の接触を避ける場合よりも空気抵抗が少なくて済むため、安定した動作が可能となる。   In particular, when vacuum processing is performed on a huge substrate 24 of 2 m class or higher, as shown in FIG. 3, the substrate carrier 12A is slid in the direction of the arrow as indicated by the solid line from the wavy line, so that the substrate carriers 12A and 12B are Since the air resistance is less than when avoiding the contact, stable operation is possible.

次に、本実施の形態の真空処理装置10の基本動作を図1を用いて説明する。
複数の基板キャリア12A、12Bの内、例えば、一つの基板キャリア12Aは、基板着脱部20において、図1に示すように、基板キャリア干渉防止機構50により水平に回転させられ、基板キャリア12Aが水平に倒されると、未処理基板を単独の水平搬送ロボットである移載ロボット22から移載され、大気開放されている複数のL/UL室30A、30Bのいずれかに入室する。
Next, the basic operation of the vacuum processing apparatus 10 of the present embodiment will be described with reference to FIG.
Among the plurality of substrate carriers 12A and 12B, for example, one substrate carrier 12A is rotated horizontally by the substrate carrier interference preventing mechanism 50 in the substrate attaching / detaching unit 20 as shown in FIG. The unprocessed substrate is transferred from the transfer robot 22, which is a single horizontal transfer robot, and enters any of the plurality of L / UL chambers 30A and 30B that are open to the atmosphere.

基板キャリア12AがいずれかのL/UL室30A、30Bに入室すると、このL/UL室30A、30Bは真空排気され、所定の真空度となったところで、基板キャリアスライド室とのゲート(図示せず)が開けられ、基板キャリアスライド室40に退出する。   When the substrate carrier 12A enters one of the L / UL chambers 30A and 30B, the L / UL chambers 30A and 30B are evacuated to a predetermined degree of vacuum. ) Is opened, and the substrate carrier slide chamber 40 is withdrawn.

基板キャリア12Aが、基板キャリアスライド室40に入室すると、基板キャリアスライド室40の図示しない位置制御機構により、基板キャリア12Aは第1の真空処理室130の入室ポジションに位置制御され、真空処理室130に送り出される。
その後、従来の真空処理装置100同様に、第1乃至第3の真空処理室130、132、134により、成膜等の真空処理が施されて、基板キャリアスライド室40に帰還し、L/UL室30A、30Bのいずれかの入室ポジションに位置制御されて、L/UL室30A、30Bのいずれかに入室する。
When the substrate carrier 12A enters the substrate carrier slide chamber 40, the position of the substrate carrier 12A is controlled to the entry position of the first vacuum processing chamber 130 by a position control mechanism (not shown) of the substrate carrier slide chamber 40, and the vacuum processing chamber 130 Sent out.
After that, as in the conventional vacuum processing apparatus 100, vacuum processing such as film formation is performed in the first to third vacuum processing chambers 130, 132, and 134, and the liquid is returned to the substrate carrier slide chamber 40, where L / UL The position is controlled to one of the entry positions of the chambers 30A and 30B, and the user enters one of the L / UL chambers 30A and 30B.

基板キャリア12AがL/UL室30A、30Bのいずれかに入室すると、そのL/UL室30A、30Bは大気開放されて、基板キャリア12Aは基板着脱部20に退出し、基板移載ロボット22により処理基板24が取り外される。   When the substrate carrier 12A enters one of the L / UL chambers 30A and 30B, the L / UL chambers 30A and 30B are released to the atmosphere, and the substrate carrier 12A is retreated to the substrate attaching / detaching unit 20, and is transferred by the substrate transfer robot 22. The processing substrate 24 is removed.

ところで、本実施の形態の真空処理装置10では、1つの基板キャリア12AがいずれかのL/UL室30A、30Bに入室し真空排気がなされている間に、他の基板キャリア12Bには、水平搬送ロボット22により未処理基板24の移載を行うことができる。
従って、本実施の形態の真空処理装置10では、従来のものでは、基板キャリア140のL/UL室120から真空側への搬送、及び、L/UL室120の真空排気には時間がかかっていたが、この時間のブランクが少なくすることができ、タクトを短くすることができ、生産効率を向上させることができる特徴を有している。
By the way, in the vacuum processing apparatus 10 of the present embodiment, while one substrate carrier 12A enters one of the L / UL chambers 30A and 30B and is evacuated, the other substrate carrier 12B has a horizontal The unprocessed substrate 24 can be transferred by the transfer robot 22.
Therefore, in the conventional vacuum processing apparatus 10 of the present embodiment, it takes time to transfer the substrate carrier 140 from the L / UL chamber 120 to the vacuum side and to evacuate the L / UL chamber 120. However, there is a feature that the blank of this time can be reduced, the tact can be shortened, and the production efficiency can be improved.

また、上述したように、基板キャリア干渉防止機構50により、基板24の大きさが巨大化した場合でも、それに連動して、L/UL室30A、30Bの間隔を大きくする必要はないので、基板キャリアスライド室40の大きさも最小限に抑えられ、また、装置10の省スペース化が可能となる。   Further, as described above, even when the size of the substrate 24 is increased by the substrate carrier interference preventing mechanism 50, it is not necessary to increase the interval between the L / UL chambers 30A and 30B in conjunction with the increase in size. The size of the carrier slide chamber 40 is also minimized, and the space of the apparatus 10 can be saved.

本発明の真空処理装置は上記実施の形態に限定されず、種々の変更が可能である。
例えば、上記実施の形態の真空処理装置では、複数のL/UL室のそれぞれに、単数の基板キャリアを配置した例で説明したが、本発明の第1の特徴は、基板キャリアを複数配置し、一つの基板キャリアがL/UL室内で真空排気或いは大気開放している間に、他の基板キャリアでは移載ロボットにより基板の着脱を行うことで、L/UL室のブランクタイムの問題を解消することであるので、単数のL/UL室の基板入れ替え口の前面に複数の基板キャリアを配置した場合、若しくは、複数のL/UL室の基板入れ替え口の前面に複数の基板キャリアを配置した場合についても、本発明に含まれるのは勿論のことである。
The vacuum processing apparatus of the present invention is not limited to the above embodiment, and various modifications are possible.
For example, in the vacuum processing apparatus of the above-described embodiment, the example in which a single substrate carrier is disposed in each of the plurality of L / UL chambers has been described. However, the first feature of the present invention is that a plurality of substrate carriers are disposed. While one substrate carrier is evacuated or released to the atmosphere in the L / UL chamber, other substrate carriers can be removed and mounted by a transfer robot, eliminating the problem of blank time in the L / UL chamber. Therefore, when a plurality of substrate carriers are arranged in front of the substrate exchange port of a single L / UL chamber, or a plurality of substrate carriers are arranged in front of the substrate exchange ports of a plurality of L / UL chambers. Of course, the present invention also includes the case.

また、上記実施の形態では、基板干渉防止機構としては、基板を着脱する際に、一つの基板キャリアを水平面上で回転させ、他の基板キャリアとは反対方向に基板キャリアを水平に倒す構成のもので説明した。
これは、上述したように、特に、2m級以上の巨大な基板を大気中で移載する場合、風圧を考慮すると、このような反転させる構成のものが有利である。
しかし、中程度の基板を移載する場合等、あまり風圧の影響を考慮しなくてすむ場合などでは、例えば、一つの基板キャリアをスライドさせて、他の基板キャリアとは干渉しないようにしてから、基板を着脱するするようにしても良いので、基板キャリア干渉防止機構は、必ずしも上記実施の形態で説明したものに限定されるものではない。
In the above embodiment, the substrate interference prevention mechanism is configured to rotate one substrate carrier on a horizontal plane and horizontally tilt the substrate carrier in the opposite direction to the other substrate carriers when the substrate is attached or detached. Explained with things.
As described above, in particular, when a huge substrate of 2 m class or higher is transferred in the atmosphere, such a structure that is reversed is advantageous in consideration of wind pressure.
However, if you do not need to consider the effect of wind pressure, such as when transferring a medium substrate, for example, slide one substrate carrier so that it does not interfere with other substrate carriers. Since the substrate may be attached and detached, the substrate carrier interference prevention mechanism is not necessarily limited to that described in the above embodiment.

本発明の一実施の形態の真空処理装置の主要構成を示す平面図である。It is a top view which shows the main structures of the vacuum processing apparatus of one embodiment of this invention. 本発明の真空処理装置の特徴を説明する一部裁断平面図である。It is a partially cut top view explaining the characteristic of the vacuum processing apparatus of this invention. 本発明の真空処理装置の特徴を説明する一部裁断平面図である。It is a partially cut top view explaining the characteristic of the vacuum processing apparatus of this invention. 従来の真空処理装置の主要構成を示す平面図である。It is a top view which shows the main structures of the conventional vacuum processing apparatus.

符号の説明Explanation of symbols

10:真空処理装置
12A、12B:基板キャリア
20:基板着脱部
22:水平搬送ロボット
30A、30B:L/UL室(予備室)
30Aa、30Ba:基板入れ替え口
40:基板キャリアスライド室
50:基板キャリア干渉防止機構
130、132、134:真空処理室
10: Vacuum processing apparatus 12A, 12B: Substrate carrier
20: Substrate attaching / detaching portion
22: Horizontal transfer robot 30A, 30B: L / UL room (spare room)
30Aa, 30Ba: Substrate replacement port
40: Substrate carrier slide chamber
50: Substrate carrier interference prevention mechanism 130, 132, 134: Vacuum processing chamber

Claims (5)

基板を真空処理する真空処理室と、前記基板を載置して搬送する基板キャリアと、前記基板を大気側と真空側との間で搬入、搬出するための予備室とを具備した真空処理装置において、
前記基板キャリアを前記予備室の大気側基板キャリア入れ替え口の前面に2以上配置可能とされており、前記真空処理装置は、前記基板を略直立させた状態で真空処理を行う縦型方式であり、かつ、前記基板キャリアに基板を着脱する際には、当該基板キャリアを一旦水平に倒す方式の真空処理装置であって、複数の基板キャリア同士の干渉を防止する基板キャリア干渉防止機構を備え、前記基板キャリア干渉防止機構としては、前記基板キャリアに基板を取り付ける際には、一方の基板キャリアを水平面上で回転させ、当該基板キャリアは、他の基板キャリアとは反対側方向に水平に倒し、取り付けが完了すると、元の位置に復元し、かつ、前記基板キャリアから基板を取り外す際には、一方の基板キャリアを水平面上で回転させ、当該基板キャリアは、他の基板キャリアとは反対側方向に水平に倒し、取り外しが完了すると、元の位置に復元する機構であることを特徴とする真空処理装置。
A vacuum processing apparatus comprising: a vacuum processing chamber for vacuum processing a substrate; a substrate carrier for mounting and transporting the substrate; and a preliminary chamber for transporting the substrate between the atmosphere side and the vacuum side. In
Two or more substrate carriers can be arranged in front of the atmosphere-side substrate carrier replacement port in the preliminary chamber, and the vacuum processing apparatus is a vertical type that performs vacuum processing in a state where the substrate is substantially upright. And, when attaching and detaching the substrate to and from the substrate carrier, it is a vacuum processing apparatus of a method of once tilting the substrate carrier horizontally, and includes a substrate carrier interference prevention mechanism for preventing interference between a plurality of substrate carriers, As the substrate carrier interference prevention mechanism, when attaching a substrate to the substrate carrier, one substrate carrier is rotated on a horizontal plane, and the substrate carrier is tilted horizontally in the opposite direction to the other substrate carrier, When the attachment is completed, the substrate is restored to the original position, and when removing the substrate from the substrate carrier, one substrate carrier is rotated on a horizontal plane to Carrier horizontally reclined on the opposite side direction to the other of the substrate carrier, the removal is complete, the vacuum processing apparatus which is a mechanism to restore to its original position.
基板を真空処理する真空処理室と、前記基板を載置して搬送する基板キャリアと、前記基板を大気側と真空側との間で搬入、搬出するための複数の予備室と、前記予備室及び前記真空処理室の間に配置され、前記基板キャリアを前記予備室及び前記真空処理室の搬出入位置に移動させる基板キャリアスライド室とを具備した真空処理装置において、
前記基板キャリアを前記予備室の大気側基板キャリア入れ替え口の前面に2以上配置可能とされており、前記真空処理装置は、前記基板を略直立させた状態で真空処理を行う縦型方式であり、かつ、前記基板キャリアに基板を着脱する際には、当該基板キャリアを一旦水平に倒す方式の真空処理装置であって、複数の基板キャリア同士の干渉を防止する基板キャリア干渉防止機構を備え、前記基板キャリア干渉防止機構としては、前記基板キャリアに基板を取り付ける際には、一方の基板キャリアを水平面上で回転させ、当該基板キャリアは、他の基板キャリアとは反対側方向に水平に倒し、取り付けが完了すると、元の位置に復元し、かつ、前記基板キャリアから基板を取り外す際には、一方の基板キャリアを水平面上で回転させ、当該基板キャリアは、他の基板キャリアとは反対側方向に水平に倒し、取り外しが完了すると、元の位置に復元する機構であることを特徴とする真空処理装置。
A vacuum processing chamber for vacuum processing the substrate; a substrate carrier for mounting and transporting the substrate; a plurality of spare chambers for carrying the substrate between the atmosphere side and the vacuum side; And a substrate carrier slide chamber disposed between the vacuum processing chamber and moving the substrate carrier to a loading / unloading position of the preliminary chamber and the vacuum processing chamber,
Two or more substrate carriers can be arranged in front of the atmosphere-side substrate carrier replacement port in the preliminary chamber, and the vacuum processing apparatus is a vertical type that performs vacuum processing in a state where the substrate is substantially upright. And, when attaching and detaching the substrate to and from the substrate carrier, it is a vacuum processing apparatus of a method of once tilting the substrate carrier horizontally, and includes a substrate carrier interference prevention mechanism for preventing interference between a plurality of substrate carriers, As the substrate carrier interference prevention mechanism, when attaching a substrate to the substrate carrier, one substrate carrier is rotated on a horizontal plane, and the substrate carrier is tilted horizontally in the opposite direction to the other substrate carrier, When the attachment is completed, the substrate is restored to the original position, and when removing the substrate from the substrate carrier, one substrate carrier is rotated on a horizontal plane to Carrier horizontally reclined on the opposite side direction to the other of the substrate carrier, the removal is complete, the vacuum processing apparatus which is a mechanism to restore to its original position.
基板を真空処理する真空処理室と、前記基板を載置して搬送する基板キャリアと、前記基板を大気側と真空側との間で搬入、搬出するための予備室とを具備した真空処理装置において、
前記基板キャリアを前記予備室の大気側基板キャリア入れ替え口の前面に2以上配置可能とされており、前記真空処理装置は、前記基板を略直立させた状態で真空処理を行う縦型方式であり、かつ、前記基板キャリアに基板を着脱する際には、当該基板キャリアを一旦水平に倒す方式の真空処理装置であって、複数の基板キャリア同士の干渉を防止する基板キャリア干渉防止機構を備え、前記基板キャリア干渉防止機構としては、前記基板キャリアに基板を取り付ける際には、少なくとも1つの基板キャリアを、前記予備室への移動方向とは直交する方向に水平に移動させ、他の基板キャリアと所定の間隙を設けて該他の基板キャリアが待機している方向と同方向に水平に倒し、取り付けが完了すると、元の位置に復元し、かつ、前記基板キャリアから基板を取り外す際には、少なくとも1つの基板キャリアを、前記予備室への移動方向とは直交する方向に水平に移動させ、他の基板キャリアと所定の間隙を設けて該他の基板キャリアが待機している方向と同方向に水平に倒し、取り外しが完了すると、元の位置に復元する機構であることを特徴とする真空処理装置。
A vacuum processing apparatus comprising: a vacuum processing chamber for vacuum processing a substrate; a substrate carrier for mounting and transporting the substrate; and a preliminary chamber for transporting the substrate between the atmosphere side and the vacuum side. In
Two or more substrate carriers can be arranged in front of the atmosphere-side substrate carrier replacement port in the preliminary chamber, and the vacuum processing apparatus is a vertical type that performs vacuum processing in a state where the substrate is substantially upright. And, when attaching and detaching the substrate to and from the substrate carrier, it is a vacuum processing apparatus of a method of once tilting the substrate carrier horizontally, and includes a substrate carrier interference prevention mechanism for preventing interference between a plurality of substrate carriers, As the substrate carrier interference prevention mechanism, when attaching a substrate to the substrate carrier, at least one substrate carrier is moved horizontally in a direction perpendicular to the moving direction to the spare chamber, Tilt horizontally in the same direction as the other substrate carrier waiting with a predetermined gap, and when the attachment is completed, the original position is restored and the substrate key is restored. When removing the substrate from the rear, at least one substrate carrier is moved horizontally in a direction orthogonal to the moving direction to the spare chamber, and a predetermined gap is provided between the other substrate carrier and the other substrate carrier. The vacuum processing apparatus is a mechanism that is tilted horizontally in the same direction as the waiting direction and is restored to its original position when the removal is completed .
基板を真空処理する真空処理室と、前記基板を載置して搬送する基板キャリアと、前記基板を大気側と真空側との間で搬入、搬出するための複数の予備室と、前記予備室及び前記真空処理室の間に配置され、前記基板キャリアを前記予備室及び前記真空処理室の搬出入位置に移動させる基板キャリアスライド室とを具備した真空処理装置において、
前記基板キャリアを前記予備室の大気側基板キャリア入れ替え口の前面に2以上配置可能とされており、前記真空処理装置は、前記基板を略直立させた状態で真空処理を行う縦型方式であり、かつ、前記基板キャリアに基板を着脱する際には、当該基板キャリアを一旦水平に倒す方式の真空処理装置であって、複数の基板キャリア同士の干渉を防止する基板キャリア干渉防止機構を備え、前記基板キャリア干渉防止機構としては、前記基板キャリアに基板を取り付ける際には、少なくとも1つの基板キャリアを、前記予備室への移動方向とは直交する方向に水平に移動させ、他の基板キャリアと所定の間隙を設けて該他の基板キャリアが待機している方向と同方向に水平に倒し、取り付けが完了すると、元の位置に復元し、かつ、前記基板キャリアから基板を取り外す際には、少なくとも1つの基板キャリアを、前記予備室への移動方向とは直交する方向に水平に移動させ、他の基板キャリアと所定の間隙を設けて該他の基板キャリアが待機している方向と同方向に水平に倒し、取り外しが完了すると、元の位置に復元する機構であることを特徴とする真空処理装置。
A vacuum processing chamber for vacuum processing the substrate; a substrate carrier for mounting and transporting the substrate; a plurality of spare chambers for carrying the substrate between the atmosphere side and the vacuum side; And a substrate carrier slide chamber disposed between the vacuum processing chamber and moving the substrate carrier to a loading / unloading position of the preliminary chamber and the vacuum processing chamber,
Two or more substrate carriers can be arranged in front of the atmosphere-side substrate carrier replacement port in the preliminary chamber, and the vacuum processing apparatus is a vertical type that performs vacuum processing in a state where the substrate is substantially upright. And, when attaching and detaching the substrate to and from the substrate carrier, it is a vacuum processing apparatus of a method of once tilting the substrate carrier horizontally, and includes a substrate carrier interference prevention mechanism for preventing interference between a plurality of substrate carriers, As the substrate carrier interference prevention mechanism, when attaching a substrate to the substrate carrier, at least one substrate carrier is moved horizontally in a direction perpendicular to the moving direction to the spare chamber, Tilt horizontally in the same direction as the other substrate carrier waiting with a predetermined gap, and when the attachment is completed, the original position is restored and the substrate key is restored. When removing the substrate from the rear, at least one substrate carrier is moved horizontally in a direction orthogonal to the moving direction to the spare chamber, and a predetermined gap is provided between the other substrate carrier and the other substrate carrier. The vacuum processing apparatus is a mechanism that is tilted horizontally in the same direction as the waiting direction and is restored to its original position when the removal is completed .
上記真空処理装置は、基板移載ロボットとして、上記基板を上記基板キャリアに水平に着脱する水平搬送ロボットを用いていることを特徴とする請求項1乃至4のいずれかに記載の真空処理装置。 5. The vacuum processing apparatus according to claim 1, wherein a horizontal transfer robot that horizontally attaches and detaches the substrate to and from the substrate carrier is used as the substrate transfer robot.
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