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JP5145209B2 - Vacuum processing equipment - Google Patents
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JP5145209B2 - Vacuum processing equipment - Google Patents

Vacuum processing equipment Download PDF

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JP5145209B2
JP5145209B2 JP2008331302A JP2008331302A JP5145209B2 JP 5145209 B2 JP5145209 B2 JP 5145209B2 JP 2008331302 A JP2008331302 A JP 2008331302A JP 2008331302 A JP2008331302 A JP 2008331302A JP 5145209 B2 JP5145209 B2 JP 5145209B2
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vacuum chamber
substrate
vacuum
processing
suction
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JP2010153654A (en
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誠 菊地
秀幸 小田木
昌司 久保
稔 土城
良直 佐藤
雅弘 長嶋
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Ulvac Inc
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Ulvac Inc
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Description

真空処理の技術分野に関し、特に、大気中から真空雰囲気に複数の基板を搬入する技術に関する。   The present invention relates to the technical field of vacuum processing, and in particular, to a technology for carrying a plurality of substrates from the atmosphere into a vacuum atmosphere.

従来から、基板を真空雰囲気中で一枚ずつ処理する枚葉式の真空処理装置が広く用いられているが、太陽電池などの技術分野では、小型の基板に対して成膜処理が行われるため、複数枚の基板を一緒に処理して処理速度を向上させたいという要求がある。   Conventionally, a single-wafer type vacuum processing apparatus that processes substrates one by one in a vacuum atmosphere has been widely used. However, in a technical field such as a solar cell, a film forming process is performed on a small substrate. There is a demand to improve the processing speed by processing a plurality of substrates together.

この場合、各基板を処理する際に、ハンドとピンとの間で基板を受け渡し、ハンドから真空処理室内の載置台上に基板を移載しようとすると、基板の枚数に応じてピンが増えるため、載置台上に形成するピンが出入りする穴も増加し、載置台中にヒータを設けることも困難となり、また、基板と載置台との間の接触面積が減少する。また、小径の基板がピン上から脱落する虞もある。   In this case, when processing each substrate, when the substrate is transferred between the hand and the pin and the substrate is transferred from the hand onto the mounting table in the vacuum processing chamber, the number of pins increases according to the number of the substrates. The number of holes through which the pins formed on the mounting table go in and out increases, making it difficult to provide a heater in the mounting table, and the contact area between the substrate and the mounting table decreases. In addition, there is a possibility that the small-diameter substrate falls off from the pins.

複数の基板をトレイ上に配置し、トレイを一枚の基板と見て搬送すると、従来と同じ構造の装置が使用でき、脱落の問題も解消できるが、トレイを基板と一緒に大気中に取り出すと大気が吸着し、トレイと共に基板を真空雰囲気中に搬入すると、トレイから吸着ガスが放出される。
また、トレイも一緒に成膜処理されるため、トレイに薄膜が付着し、パーティクル発生を防止するため、トレイの洗浄が必要となる。
When multiple substrates are placed on a tray and transported with the tray viewed as a single substrate, a device with the same structure as before can be used and the problem of dropping off can be solved, but the tray is taken out together with the substrate to the atmosphere. When the substrate is carried into the vacuum atmosphere together with the tray, the adsorbed gas is released from the tray.
In addition, since the film is formed together with the tray, a thin film adheres to the tray and it is necessary to clean the tray in order to prevent generation of particles.

真空雰囲気中で基板を搬送する装置は例えば下記文献に記載されている。
特開2006−19544号公報
An apparatus for transporting a substrate in a vacuum atmosphere is described in, for example, the following document.
JP 2006-19544 A

本発明は上記従来技術の問題を解決するために創作されたものであり、複数枚の基板を大気雰囲気から真空槽内に一緒に移動させる技術を課題とする。   The present invention was created in order to solve the above-described problems of the prior art, and an object thereof is a technique for moving a plurality of substrates together from an atmospheric atmosphere into a vacuum chamber.

上記課題を解決するために本発明は、処理用真空槽と、前記処理用真空槽にそれぞれ接続された搬入用真空槽と搬出用真空槽とを有し、前記搬入用真空槽と前記処理用真空槽と前記搬出用真空槽とを真空排気し、前記搬入用真空槽に配置された複数の基板を前記処理用真空槽に移動させて前記処理用真空槽内で真空処理した後、前記搬出用真空槽に移動させる真空処理装置であって、前記搬入用真空槽と前記搬出用真空槽には、行列状に配置された複数の基板を非接触の状態で吸着する吸着部と、前記吸着部を上下移動させる吸着部移動装置と、が設けられ、前記吸着部に吸着される前記基板の行数と同数の細長の指部が、前記基板の行間隔と同間隔で同方向に水平面内に配置されたハンド部と、前記ハンド部を、前記指部が前記吸着部に吸着される前記基板の各行の真下で静止する第一の移載位置と、前記処理用真空槽内の所定の第二の移載位置の間を往復移動させるハンド移動装置とがそれぞれ設けられ、前記処理用真空槽には、前記ハンド部よりも低い位置に配置され、複数の基板を載置可能な載置台と、前記載置台の表面に形成され、前記指部が伸びる方向と同方向に延設された前記指部よりも一本以上多い溝と、前記各溝の伸びる方向と同方向に延設され、前記各溝内にそれぞれ静止可能な複数の横棒と、前記横棒を前記溝内の位置と前記指部表面の高さよりも高い位置との間で上下移動させる上下移動装置と、が設けられ、前記指部の幅は、隣接する溝に配置される前記横棒間の隙間よりも小さく形成され、前記指部が前記第二の移載位置で静止したときに、前記指部は横棒間の隙間の真上に位置するように形成された真空処理装置である。
また本発明は、前記吸着部は、鉛直下方に向けられた吸着面と、前記吸着面に形成され、吸着する前記基板と同間隔の行列状に配置された複数の凹部と、前記各凹部内に複数個ずつ配置され、気体の噴出が可能な噴出孔と、前記凹部の外側に配置された突起とを有する真空処理装置である。
また本発明は、前記上下移動装置は、前記載置台の外部に位置して前記横棒の端部に鉛直に取り付けられ、前記横棒を上下移動させる支持部を有する真空処理装置である。
In order to solve the above-described problems, the present invention includes a processing vacuum chamber, a loading vacuum chamber and an unloading vacuum chamber respectively connected to the processing vacuum chamber, and the loading vacuum chamber and the processing vacuum chamber. The vacuum chamber and the unloading vacuum chamber are evacuated, a plurality of substrates arranged in the loading vacuum chamber are moved to the processing vacuum chamber, and vacuum processing is performed in the processing vacuum chamber, and then the unloading is performed. A vacuum processing apparatus for moving to a vacuum chamber for suction, wherein the suction vacuum chamber for transporting and the vacuum chamber for unloading are each provided with a suction portion for sucking a plurality of substrates arranged in a matrix in a non-contact state; A suction part moving device for moving the part up and down, and the same number of elongated fingers as the number of rows of the substrate to be sucked by the suction part in a horizontal plane in the same direction at the same interval as the row interval of the substrate. intake and placed hand portion, the front Symbol hand portion, the finger portion is the suction portion A first transfer position that is stationary immediately below each row of the substrate and a hand moving device that reciprocates between a predetermined second transfer position in the processing vacuum chamber, The processing vacuum chamber is disposed at a position lower than the hand unit, and can be mounted on a mounting table on which a plurality of substrates can be mounted, and is formed on the surface of the mounting table, and extends in the same direction as the finger unit extends. One or more grooves than the provided fingers, a plurality of horizontal bars extending in the same direction as the direction in which each of the grooves extends, and each of the horizontal bars being stationary in each of the grooves; And a vertical movement device that moves up and down between a position inside and a position higher than the height of the finger surface, and the width of the finger is a gap between the horizontal bars arranged in adjacent grooves And when the finger is stationary at the second transfer position, the finger A vacuum processing apparatus which is formed so as to be positioned directly above the gap between the bars.
Further, according to the present invention, the suction portion includes a suction surface directed vertically downward, a plurality of recesses formed in the suction surface and arranged in a matrix with the same interval as the substrate to be suctioned, and the inside of each recess A vacuum processing apparatus having a plurality of nozzles arranged on each of the nozzles and capable of jetting gas and a protrusion disposed outside the recess.
Further, the present invention is the vacuum processing apparatus according to the present invention, wherein the vertical movement device is located outside the mounting table and is vertically attached to an end portion of the horizontal bar, and has a support portion that moves the horizontal bar up and down.

本発明は、処理用真空槽と、前記処理用真空槽に接続された搬入用真空槽とを有し、前記搬入用真空槽と前記処理用真空槽を真空排気し、前記搬入用真空槽に配置された複数の基板を前記処理用真空槽に移動させて前記処理用真空槽内で真空処理する真空処理装置であって、前記搬入用真空槽には、行列状に配置された複数の基板を非接触の状態で吸着する吸着部と、前記吸着部を上下移動させる吸着部移動装置と、が設けられ、前記吸着部に吸着される前記基板の行数と同数の細長の指部が、前記基板の行間隔と同間隔で同方向に水平面内に配置されたハンド部と、前記ハンド部を、前記指部が前記吸着部に吸着される前記基板の各行の真下で静止する第一の移載位置と、前記処理用真空槽内の所定の第二の移載位置の間を往復移動させるハンド移動装置とがそれぞれ設けられ、前記処理用真空槽には、前記ハンド部よりも低い位置に配置され、複数の基板を載置可能な載置台と、前記載置台の表面に形成され、前記指部が伸びる方向と同方向に延設された前記指部よりも一本以上多い溝と、前記各溝の伸びる方向と同方向に延設され、前記各溝内にそれぞれ静止可能な複数の横棒と、前記横棒を前記溝内の位置と前記指部表面の高さよりも高い位置との間で上下移動させる上下移動装置と、が設けられ、前記指部の幅は、隣接する溝に配置される前記横棒間の隙間よりも小さく形成され、前記指部が前記第二の移載位置で静止したときに、前記指部は横棒間の隙間の真上に位置するように形成された真空処理装置であってもよい。
また、本発明は、基板の行数よりも多い指部を有していてもよいし、また、指部が一本であってもよい。
The present invention has a processing vacuum tank and a loading vacuum tank connected to the processing vacuum tank, and the loading vacuum tank and the processing vacuum tank are evacuated to the loading vacuum tank. A vacuum processing apparatus for moving a plurality of arranged substrates to the processing vacuum chamber and performing vacuum processing in the processing vacuum chamber, wherein the plurality of substrates arranged in a matrix in the loading vacuum chamber An adsorbing part that adsorbs the adsorbing part in a non-contact state, and an adsorbing part moving device that moves the adsorbing part up and down, and the same number of elongated fingers as the number of rows of the substrate adsorbed to the adsorbing part, a hand portion with a line the same interval as the substrate arranged in the same direction in a horizontal plane, the front Symbol hand portion, first to the finger rests beneath the row of the substrate to be attracted to the suction unit Between the transfer position and a predetermined second transfer position in the processing vacuum chamber. Each of which is provided at a position lower than the hand unit, and is formed on the surface of the mounting table. One or more grooves that extend in the same direction as the direction in which the fingers extend, and a plurality of grooves that extend in the same direction as the direction in which each of the grooves extends and can rest in each of the grooves A horizontal bar, and a vertical movement device for moving the horizontal bar up and down between a position in the groove and a position higher than the height of the finger surface, and the width of the finger is defined by an adjacent groove. So that when the finger portion is stationary at the second transfer position, the finger portion is positioned directly above the gap between the horizontal bars. It may be a formed vacuum processing apparatus.
Further, the present invention may have more finger parts than the number of rows on the substrate, or may have one finger part.

基板表面が一貫して上方に向けられており、成膜面である表面が吸着装置や搬送装置に接触しない。
複数の基板がトレイを用いずに一緒に搬送されるから、真空処理の効率が高く、また、トレイの清掃が不要である。
The surface of the substrate is consistently directed upward, and the surface that is the film formation surface does not contact the suction device or the transport device.
Since a plurality of substrates are transported together without using a tray, the efficiency of vacuum processing is high, and cleaning of the tray is unnecessary.

図1の符号10は、本発明の真空処理装置である。
この真空処理装置10は、搬入受渡室102aと、処理室103と、搬出受渡室102bとを有している。搬入受渡室102aと、処理室103と、搬出受渡室102bは、搬入用真空槽112aと、処理用真空槽113と、搬出用真空槽112bとをそれぞれ有している。
Reference numeral 10 in FIG. 1 is a vacuum processing apparatus of the present invention.
The vacuum processing apparatus 10 includes a carry-in / delivery chamber 102a, a processing chamber 103, and a carry-out / delivery chamber 102b. The carry-in / delivery chamber 102a, the processing chamber 103, and the carry-out / delivery chamber 102b each have a carry-in vacuum chamber 112a, a process vacuum chamber 113, and a carry-out vacuum chamber 112b.

搬入用真空槽112aと処理用真空槽113とは搬入用仕切弁123によって接続され、処理用真空槽113と搬出用真空槽112bとは搬出用仕切弁124によって接続されている。
搬入用真空槽112aと大気雰囲気との間には搬入用扉122が設けられ、搬出用真空槽112bと大気雰囲気との間には搬出用扉125が設けられている。
The carry-in vacuum tank 112a and the processing vacuum tank 113 are connected by a carry-in gate valve 123, and the process vacuum tank 113 and the carry-out vacuum tank 112b are connected by a carry-out gate valve 124.
A carry-in door 122 is provided between the carry-in vacuum tank 112a and the atmospheric atmosphere, and a carry-out door 125 is provided between the carry-out vacuum tank 112b and the atmospheric atmosphere.

各真空槽112a、112b、113には、真空排気装置181a、181b、182がそれぞれ接続されており、搬入用扉122と搬出用扉125を閉じ、真空排気装置181a、181b、182によって各真空槽112a、112b、113内を真空排気して真空雰囲気にすると、搬入用及び搬出用仕切弁123、124を開閉することで、処理用真空槽113の真空雰囲気を維持した状態で、搬入用真空槽112aと搬出用真空槽112bとを処理用真空槽113に接続できるように構成されている。   Vacuum exhaust devices 181a, 181b, and 182 are connected to the vacuum chambers 112a, 112b, and 113, respectively, the loading door 122 and the unloading door 125 are closed, and the vacuum chambers 181a, 181b, and 182 are used to close the vacuum chambers. When the insides of 112a, 112b, and 113 are evacuated to a vacuum atmosphere, the loading and unloading partition valves 123 and 124 are opened and closed to maintain the vacuum atmosphere of the processing vacuum tank 113 and carry in the loading vacuum tank. 112a and the unloading vacuum chamber 112b can be connected to the processing vacuum chamber 113.

他方、搬入用仕切弁123と搬出用仕切弁124を閉じた状態で、搬入用扉122と搬出用扉125を開け、乾燥大気又はN2ガスを導入すると、処理用真空槽113内部の真空雰囲気を維持した状態で、搬入用真空槽112aの内部と搬出用真空槽112bの内部を乾燥した大気雰囲気(又はN2雰囲気)にすることができる。 On the other hand, when the carry-in gate valve 123 and the carry-out door 125 are opened while the carry-in gate valve 123 and the carry-out gate valve 124 are closed and dry air or N 2 gas is introduced, a vacuum atmosphere inside the processing vacuum chamber 113 is obtained. In this state, the inside of the carrying-in vacuum chamber 112a and the inside of the carrying-out vacuum chamber 112b can be made into a dry air atmosphere (or N 2 atmosphere).

ここでは、搬入用扉122と搬出用扉125の外側には、大気雰囲気に置かれた搬入室101aと搬出室101bがそれぞれ配置されており、搬入用扉122と搬出用扉125が開けられると、搬入用真空槽112aの内部と搬出用真空槽112bの内部は、それぞれ搬入室101aの内部と搬出室101bの内部に接続されるようになっている。   Here, outside the carry-in door 122 and the carry-out door 125, the carry-in chamber 101a and the carry-out chamber 101b, which are placed in an air atmosphere, are arranged, respectively, and the carry-in door 122 and the carry-out door 125 are opened. The inside of the carry-in vacuum chamber 112a and the inside of the carry-out vacuum chamber 112b are connected to the inside of the carry-in chamber 101a and the inside of the carry-out chamber 101b, respectively.

搬入室101a内と搬出室101b内には、第一、第二の大気側搬入装置141がそれぞれ配置されている。第一、第二の大気側搬入装置141は、基板を載置可能な移動板145と、移動板145を水平方向に移動させる移動装置143を有しており、図2に示すように、搬入室101a内の第一の大気側搬入装置141の移動板145上に基板31を行列状に配置し、搬入用扉122を開けて搬入受渡室102aの搬入用真空槽112aの内部に移動板145を搬入する。   In the carry-in chamber 101a and the carry-out chamber 101b, first and second atmosphere side carry-in devices 141 are respectively arranged. The first and second atmosphere side carry-in devices 141 have a moving plate 145 on which a substrate can be placed and a moving device 143 that moves the moving plate 145 in the horizontal direction. As shown in FIG. The substrates 31 are arranged in a matrix on the moving plate 145 of the first atmosphere side loading device 141 in the chamber 101a, the loading door 122 is opened, and the moving plate 145 is placed inside the loading vacuum chamber 112a of the loading / unloading chamber 102a. Carry in.

搬入受渡室102aの内部には、第一の吸着装置131aと第一の搬送装置151aが設けられている。
搬出受渡室102bの内部にも、第二の吸着装置131bと第二の搬送装置151bが設けられており、第一の吸着装置131aと第二の吸着装置131bは同じ構成であり、同じ部材には同じ符号を付して一緒に説明する。
第一、第二の吸着装置131a、131bは、吸着部135と、吸着部135を上下移動させる吸着部移動装置133とを有している。
A first suction device 131a and a first transfer device 151a are provided inside the carry-in / delivery chamber 102a.
A second suction device 131b and a second transport device 151b are also provided inside the carry-out delivery chamber 102b, and the first suction device 131a and the second suction device 131b have the same configuration, and the same member Are described together with the same reference numerals.
The first and second suction devices 131a and 131b include a suction portion 135 and a suction portion moving device 133 that moves the suction portion 135 up and down.

図3に示すように、行列状の基板31が移動板145上に配置されて搬入用真空槽112a内部に搬入されると、移動板145は、吸着部135本体の下方位置で静止される。
吸着部135の鉛直下方を向いた吸着面137には、基板31より小径の凹部136が複数個形成されており、図15に示すように、各凹部136の内周面には、凹部136一個毎にそれぞれ複数個の気体噴出孔138が配置され、各凹部136の外側には、凹部136一個毎に複数個の突起170が配置されている。
As shown in FIG. 3, when the matrix-like substrate 31 is arranged on the moving plate 145 and loaded into the loading vacuum chamber 112 a, the moving plate 145 is stopped at a position below the main body of the suction unit 135.
A plurality of recesses 136 having a diameter smaller than that of the substrate 31 are formed on the suction surface 137 facing vertically below the suction part 135, and one recess 136 is provided on the inner peripheral surface of each recess 136 as shown in FIG. 15. A plurality of gas ejection holes 138 are arranged for each, and a plurality of protrusions 170 are arranged for each recess 136 on the outside of each recess 136.

各凹部136は行列状に配置されており、移動板145上の基板31は、凹部136の行列と同じ行列状に配置されている。凹部136の行列と基板の行列は、水平面内で同方向に向けられており、各凹部136の真下位置に基板31が一枚ずつ配置される位置で移動板145は停止される。
その状態で吸着部移動装置133によって吸着部135を下降させると、凹部136が基板31に接近する。
The concave portions 136 are arranged in a matrix, and the substrates 31 on the moving plate 145 are arranged in the same matrix as the matrix of the concave portions 136. The matrix of the recesses 136 and the matrix of the substrates are directed in the same direction in the horizontal plane, and the moving plate 145 is stopped at a position where the substrates 31 are arranged one by one immediately below each recess 136.
In this state, when the suction portion 135 is lowered by the suction portion moving device 133, the concave portion 136 approaches the substrate 31.

図13は、一枚の基板の拡大図である。この基板31は、太陽電池用の基板であり、正方形の四隅が円形の一部を形成するように丸められている。
ここでは突起170は凹部136毎に四個ずつ設けられており、各凹部136周辺の突起170は、凹部136に基板31が接近したときに、基板31の四辺に近接した四辺よりも外側位置に配置されるように形成されている。
FIG. 13 is an enlarged view of one substrate. This substrate 31 is a substrate for a solar cell, and is rounded so that four corners of a square form a part of a circle.
Here, four protrusions 170 are provided for each recess 136, and the protrusions 170 around each recess 136 are located outside the four sides adjacent to the four sides of the substrate 31 when the substrate 31 approaches the recess 136. It is formed to be arranged.

従って、基板31に凹部136が接近すると、図16に示すように基板31は突起170の間に入り込む。
吸着部135の降下は、突起170間に基板31が入った後、吸着面が基板31の表面に接触する前に停止される。
Accordingly, when the recess 136 approaches the substrate 31, the substrate 31 enters between the protrusions 170 as shown in FIG.
The lowering of the suction unit 135 is stopped after the substrate 31 enters between the protrusions 170 and before the suction surface contacts the surface of the substrate 31.

搬入用真空槽112aの外部には気体供給系172が設けられており、この気体供給系172から各気体噴出孔138に気体が供給されると、基板31と吸着部135が非接触の状態で、基板31と凹部136の間に気体が噴出される。気体噴出孔138からの気体の噴出方向は、半径方向とは垂直な方向であり、一個の凹部136の縁の円周上では気体は円周の同一方向に噴出される。   A gas supply system 172 is provided outside the carry-in vacuum chamber 112a. When gas is supplied from the gas supply system 172 to each gas ejection hole 138, the substrate 31 and the suction unit 135 are in a non-contact state. A gas is jetted between the substrate 31 and the recess 136. The gas ejection direction from the gas ejection hole 138 is perpendicular to the radial direction, and the gas is ejected in the same circumferential direction on the circumference of the edge of one recess 136.

この気体により基板31には回転力が印加されるが、基板31の一部が突起170に当接し、回転は制止される。基板31が停止した状態では基板31表面と凹部136表面との間で気体の渦139が形成され、凹部136内が負圧になり、大気圧との差圧によって基板31が凹部136に吸着される。   Although a rotational force is applied to the substrate 31 by this gas, a part of the substrate 31 comes into contact with the protrusion 170 and the rotation is stopped. In a state in which the substrate 31 is stopped, a gas vortex 139 is formed between the surface of the substrate 31 and the surface of the recess 136, the inside of the recess 136 becomes negative pressure, and the substrate 31 is adsorbed by the recess 136 due to the differential pressure from the atmospheric pressure. The

このとき、基板31と吸着面137との間には、噴出気体の流束が形成されており、基板31が吸着面に接触しようとすると圧縮された流束の反発力によって押し戻され、基板31は吸着面と接触しないで凹部136に吸着された状態が維持される。   At this time, a flux of ejected gas is formed between the substrate 31 and the adsorption surface 137, and when the substrate 31 tries to contact the adsorption surface, it is pushed back by the repulsive force of the compressed flux. Is maintained in the state of being attracted to the recess 136 without contacting the suction surface.

従って、図4に示すように、吸着部移動装置133によって吸着部135を上方に移動させると、各基板31は凹部136に非接触の状態で、吸着部135に吸着されて吸着部135と一緒に上方に移動されるので、基板31は移動板145上から除去される。   Therefore, as shown in FIG. 4, when the suction part 135 is moved upward by the suction part moving device 133, each substrate 31 is attracted to the suction part 135 in a non-contact state with the recess 136 and together with the suction part 135. Accordingly, the substrate 31 is removed from the moving plate 145.

第一、第二の搬送装置151a、151bは、ハンド部155と、ハンド部155を水平方向に移動させるハンド移動装置153を有している。ハンド部155は、搬入用真空槽112aや搬出用真空槽112b内に搬入される移動板145の下方に位置しており、移動板145が搬入用真空槽112a内や搬出用真空槽112b内から除去されると、吸着部135の真下に位置している。   The first and second transport devices 151a and 151b include a hand unit 155 and a hand moving device 153 that moves the hand unit 155 in the horizontal direction. The hand unit 155 is positioned below the moving plate 145 that is carried into the carry-in vacuum chamber 112a or the carry-out vacuum vessel 112b, and the movable plate 145 is moved from the carry-in vacuum vessel 112a or the carry-out vacuum vessel 112b. When removed, it is located directly below the suction part 135.

ハンド部155には、図14(a)に示すような、行列状に配置された凹部136の行の数又は列の数と同じ本数の指部156が設けられている。各指部156は細長に形成され、凹部136の行又は列が伸びる方向と同方向に延設されている。   The hand portion 155 is provided with the same number of finger portions 156 as the number of rows or columns of the concave portions 136 arranged in a matrix as shown in FIG. Each finger part 156 is formed in an elongated shape and extends in the same direction as the direction in which the rows or columns of the recesses 136 extend.

ここでは基板31は、搬入用真空槽112aから搬出用真空槽112bに、処理用真空槽113を通って向きを変えずに移動しており、凹部136の行又は列の一方が基板31の移動方向に沿って配置され、他方がそれと直角の方向に沿って配置されており、凹部136及び基板31の行列のうち、基板31の移動方向を行とすると、各指部156は行に沿った方向に延設されている。   Here, the substrate 31 is moved from the loading vacuum chamber 112 a to the unloading vacuum chamber 112 b through the processing vacuum chamber 113 without changing the direction, and one of the rows or columns of the recesses 136 is moved by the substrate 31. Are arranged along the direction, and the other is arranged along a direction perpendicular to the other. When the moving direction of the substrate 31 is a row in the matrix of the recesses 136 and the substrate 31, each finger portion 156 follows the row. It extends in the direction.

基板31の各行の真下を第一の移載位置とすると、ハンド部155は、指部156が第一の移載位置に位置するように静止している。
その状態で吸着部135が降下すると、一行中の基板31が一本の指部156に接近する。吸着部移動装置133は、基板31が指部156に接触するか接触する直前に停止するように制御されており、その状態で気体の噴出が停止され、吸着が解除されると、図14(b)に示すように、一行中の基板31が一本の指部156上に乗り、図5に示すように、基板31がハンド部155上に載置される。
When the first transfer position is directly below each row of the substrate 31, the hand unit 155 is stationary so that the finger unit 156 is positioned at the first transfer position.
When the suction unit 135 is lowered in this state, the substrate 31 in one row approaches one finger unit 156. The suction part moving device 133 is controlled so that the substrate 31 comes into contact with the finger part 156 or stops immediately before coming into contact therewith, and in this state, when the ejection of gas is stopped and the suction is released, FIG. As shown in FIG. 5B, the substrate 31 in one row rides on one finger portion 156, and the substrate 31 is placed on the hand portion 155 as shown in FIG.

吸着装置135への基板31の吸着は、搬入用真空槽112a内や搬出用真空槽112b内が大気圧又はそれに近い圧力の状態で行われており、搬入用真空槽112a内の第一の吸着装置131aの吸着が解除された後、搬入用真空槽112aと搬入室101aの間の搬入用扉122が閉じられ、搬入用真空槽112a内が真空排気される。   The adsorption of the substrate 31 to the adsorption device 135 is performed in a state where the inside of the carry-in vacuum chamber 112a or the carry-out vacuum vessel 112b is at or near the atmospheric pressure, and the first adsorption in the carry-in vacuum vessel 112a. After the adsorption of the device 131a is released, the loading door 122 between the loading vacuum chamber 112a and the loading chamber 101a is closed, and the inside of the loading vacuum chamber 112a is evacuated.

処理用真空槽113は真空雰囲気に置かれており、搬入用真空槽112a内が所定圧力に真空排気され、処理室103用真空槽と同程度の圧力になった後、搬入用仕切弁123が開き、ハンド移動装置153によってハンド部155を移動させ、搬入用仕切弁123を通して処理用真空槽113内に搬入する。なお、ハンド部155は、アーム部154を介して、ハンド移動装置153に接続されており、アーム部154は真空槽内をスライド移動し、ハンド部155はアーム部154上をアーム部154に対してスライド移動することで、搬入用真空槽112aや搬出用真空槽112b内から処理用真空槽113にハンド部155を進入及び退去できるようになっている。   The processing vacuum chamber 113 is placed in a vacuum atmosphere, and after the inside of the carrying-in vacuum chamber 112a is evacuated to a predetermined pressure and becomes the same pressure as the vacuum chamber for the processing chamber 103, the carrying-in partition valve 123 is The hand unit 155 is moved by the hand moving device 153 and is carried into the processing vacuum chamber 113 through the carry-in gate valve 123. The hand unit 155 is connected to the hand moving device 153 via the arm unit 154. The arm unit 154 slides in the vacuum chamber, and the hand unit 155 moves on the arm unit 154 with respect to the arm unit 154. Thus, the hand portion 155 can enter and leave the processing vacuum chamber 113 from the inside of the loading vacuum chamber 112a and the unloading vacuum chamber 112b.

処理用真空槽113内には、載置台165と移載機構161とが設けられている。
図17に示すように、移載機構161は、指部156よりも一本以上多い本数の横棒162と、各横棒162の端部に一本ずつ接続された支持部163と、前記支持部163を上下移動させる上下移動装置164とを有している。
A mounting table 165 and a transfer mechanism 161 are provided in the processing vacuum chamber 113.
As shown in FIG. 17, the transfer mechanism 161 includes one or more horizontal bars 162 more than the finger parts 156, a support part 163 connected to each end of each horizontal bar 162, and the support And a vertical movement device 164 for moving the portion 163 up and down.

各支持部163は鉛直に配置され、各横棒162は支持部163によって支持されており、上下移動装置164が支持部163を上下移動させると、各横棒162は支持部163と共に上下移動する。
各横棒162は指部156の伸びる方向と同方向に延設されており、水平面内で互いに平行に離間して配置されている。
Each support portion 163 is arranged vertically, each horizontal bar 162 is supported by the support portion 163, and when the vertical movement device 164 moves the support portion 163 up and down, each horizontal bar 162 moves up and down together with the support portion 163. .
Each horizontal bar 162 extends in the same direction as the direction in which the finger portion 156 extends, and is arranged in parallel with each other in the horizontal plane.

ハンド部155が処理用真空槽113に進入する前に、横棒162はハンド部155よりも低い位置に位置しており、図6に示すように、ハンド部155は、ハンド移動装置153により、指部156が横棒162と横棒162の隙間の真上に位置するように静止される。   Before the hand unit 155 enters the processing vacuum chamber 113, the horizontal bar 162 is positioned at a lower position than the hand unit 155. As shown in FIG. 6, the hand unit 155 is moved by the hand moving device 153. The finger portion 156 is stopped so as to be positioned immediately above the gap between the horizontal bar 162 and the horizontal bar 162.

横棒162がハンド部155の指部156の間を通って、ハンド部155の下方から上方に移動できるハンド部155の位置を第二の移載位置とすると、第二の移載位置は、平面図の図18(a)とその側面図の図18(b)に示すように、指部156が、横棒162と横棒162の間の隙間の真上に位置する位置である。   Assuming that the position of the hand unit 155 through which the horizontal bar 162 passes between the fingers 156 of the hand unit 155 and moves upward from below the hand unit 155 is the second transfer position, the second transfer position is As shown in FIG. 18A of the plan view and FIG. 18B of the side view thereof, the finger portion 156 is located at a position directly above the gap between the horizontal bar 162 and the horizontal bar 162.

また、第二の移載位置は、指部156がハンド部155本体に接続された根本である掌部157が、横棒162部よりも、各ハンド部155のハンド移動装置153が配置された真空槽に近い位置である。
横棒162の幅は、指部156と指部156の隙間の幅よりも小さく形成されており、横棒162が上昇したときに横棒162は、掌部157に衝突せず指部156の間を通って指部156よりも上方に移動できる。
Further, the second transfer position is such that the palm portion 157, which is the root of the finger portion 156 connected to the hand portion 155 main body, is arranged with the hand moving device 153 of each hand portion 155 rather than the horizontal bar 162 portion. Close to the vacuum chamber.
The width of the horizontal bar 162 is smaller than the width of the gap between the finger part 156 and the finger part 156, and the horizontal bar 162 does not collide with the palm part 157 when the horizontal bar 162 is raised. It can move above the finger 156 through the gap.

図14(b)に示すように、各基板31は指部156の幅よりも大きく、各基板31の両側の一部が指部156からはみ出して配置されており、横棒162が下方から上昇すると、一本の指部156上の各基板31の裏面は、指部156の片側に露出した部分が同じ横棒162に接触し、他の片側に露出した部分が他の同じ横棒162に接触する。   As shown in FIG. 14B, each substrate 31 is larger than the width of the finger portion 156, a part of each side of each substrate 31 protrudes from the finger portion 156, and the horizontal bar 162 rises from below. Then, as for the back surface of each board | substrate 31 on one finger part 156, the part exposed to the one side of the finger part 156 contacts the same horizontal bar 162, and the part exposed to the other one side contacts the other same horizontal bar 162. Contact.

図7に示すように横棒162が指部156の表面よりも上方に移動すると、一本の指部156上に載置されていた一行中の基板31は、二本の横棒162上に乗る。
このように各基板31が横棒162に移載されると、各基板31は指部156から離間しており、指部156は横棒162の支持部163の間に位置しており、ハンド部155を搬入用真空槽112a内に戻すとともに、横棒162をハンド部155が静止していた位置よりも下方に移動させることができる。
As shown in FIG. 7, when the horizontal bar 162 moves above the surface of the finger part 156, the substrate 31 in one row placed on the one finger part 156 is placed on the two horizontal bars 162. get on.
When each substrate 31 is transferred to the horizontal bar 162 in this way, each substrate 31 is separated from the finger portion 156, and the finger portion 156 is located between the support portions 163 of the horizontal bar 162. While returning the part 155 in the vacuum chamber 112a for carrying in, the horizontal bar 162 can be moved below rather than the position where the hand part 155 was stationary.

横棒162の下方への移動先には載置台165が配置されている。
この載置台165は、横棒162の延伸方向と同じ方向の長さが横棒162よりも短く形成されており、各横棒162の端部に取り付けられた支持部163は、載置台165の外部に位置し、載置台165には支持部163を挿通させる貫通孔は形成されていない。
A mounting table 165 is disposed at a position where the horizontal bar 162 moves downward.
The mounting table 165 is formed so that the length in the same direction as the extending direction of the horizontal bar 162 is shorter than that of the horizontal bar 162, and the support portion 163 attached to the end of each horizontal bar 162 is connected to the mounting table 165. A through hole that is located outside and through which the support portion 163 is inserted is not formed in the mounting table 165.

平面図の図19(a)とその側面図の図19(b)に示すように、各横棒162の真下位置には、溝168がそれぞれ形成されている。各溝168は、横棒162よりも短く、両端が載置台165の外周に開口しており、横棒162が降下すると、各横棒162は溝168の内部に進入する。   As shown in FIG. 19A of the plan view and FIG. 19B of the side view thereof, a groove 168 is formed at a position directly below each horizontal bar 162. Each groove 168 is shorter than the horizontal bar 162, and both ends are open to the outer periphery of the mounting table 165. When the horizontal bar 162 descends, each horizontal bar 162 enters the inside of the groove 168.

溝168は、進入する横棒162の厚み以上の深さに形成されており、図8と平面図の図20(a)とその側面図の図20(b)に示すように、横棒162の表面が載置台165の表面以下の高さになるまで降下すると、横棒162上の各基板31の裏面は載置台165表面と接触する。   The groove 168 is formed to a depth equal to or greater than the thickness of the entering horizontal bar 162. As shown in FIG. 8A and FIG. 20A of the plan view and FIG. 20B of the side view, the horizontal bar 162 is formed. When the surface of the substrate 31 is lowered to a height below the surface of the mounting table 165, the back surface of each substrate 31 on the horizontal bar 162 comes into contact with the surface of the mounting table 165.

載置台165の内部にはヒータ166が配置されており、予めこのヒータ166に通電して発熱させ、載置台165を昇温させておくと、載置台165に接触した基板31は載置台165からの熱伝導によって加熱される。横棒162をハンド部155の下方に位置させるとき、横棒162を溝168内に収容し、昇温させておき、基板31の裏面を溝168内の横棒162と接触させると、基板31は横棒162からの熱伝導によっても加熱される。   A heater 166 is disposed inside the mounting table 165. When the heater 166 is energized in advance to generate heat and the mounting table 165 is heated, the substrate 31 in contact with the mounting table 165 is removed from the mounting table 165. It is heated by heat conduction. When the horizontal bar 162 is positioned below the hand portion 155, the horizontal bar 162 is accommodated in the groove 168, the temperature is raised, and the back surface of the substrate 31 is brought into contact with the horizontal bar 162 in the groove 168. Is also heated by heat conduction from the horizontal bar 162.

載置台165の上方には、シャワープレート171が配置されている。処理用真空槽113の外部にはガス導入系が配置されており、第一の搬送装置151aのハンド部155を搬入用真空槽112a内に戻し、搬入用仕切弁123を閉じて搬入用真空槽112aと処理用真空槽113とを分離し、ガス導入系からシャワープレート171に薄膜の原料ガスを供給し、シャワープレート171から処理用真空槽113内に原料ガスを散布させながらシャワープレート171に電圧を印加すると、載置台165上の基板31表面の上方で原料ガスのプラズマが形成され、化学反応により基板31表面に薄膜が形成される。   A shower plate 171 is disposed above the mounting table 165. A gas introduction system is arranged outside the processing vacuum chamber 113, the hand portion 155 of the first transfer device 151a is returned into the loading vacuum chamber 112a, the loading partition valve 123 is closed, and the loading vacuum chamber is closed. 112a and the processing vacuum chamber 113 are separated, a thin film source gas is supplied to the shower plate 171 from the gas introduction system, and a voltage is applied to the shower plate 171 while the source gas is dispersed into the processing vacuum chamber 113 from the shower plate 171. Is applied, plasma of the source gas is formed above the surface of the substrate 31 on the mounting table 165, and a thin film is formed on the surface of the substrate 31 by a chemical reaction.

ここでは原料ガスとして、Siを含む化合物のガスとそれと反応する化合物のガスが供給され、処理用真空槽113内では基板31表面にSiの薄膜が形成される。
他方、搬入用真空槽112a側では、ハンド部155が搬入用真空槽112a内に戻って搬入用仕切弁123が閉じられた後、搬入用真空槽112a内に大気が導入され、搬入用扉122が開けられる。
Here, as a source gas, a compound gas containing Si and a compound gas reacting therewith are supplied, and a Si thin film is formed on the surface of the substrate 31 in the processing vacuum chamber 113.
On the other hand, on the side of the loading vacuum chamber 112a, after the hand portion 155 returns to the loading vacuum chamber 112a and the loading gate valve 123 is closed, the atmosphere is introduced into the loading vacuum chamber 112a and the loading door 122 is reached. Can be opened.

搬入室101a内の大気側搬送ロボットには、新しい基板32が行列状に配置されて移動板145に乗せられており、その移動板145が搬入用真空槽112a内に搬入され、処理用真空槽113内で基板31表面に薄膜が成長している間に、上述したように、基板32は移動板145上からハンド部155の指部156上に移載され、移動板145が搬入室101aに戻された後、搬入用扉122が閉じられ、未処理の基板32がハンド上に配置されたまま、搬入用真空槽112a内が真空排気される。   New substrates 32 are arranged in a matrix and are placed on a moving plate 145 in the atmosphere-side transfer robot in the loading chamber 101a, and the moving plate 145 is loaded into the loading vacuum chamber 112a to be processed. While the thin film is growing on the surface of the substrate 31 in 113, as described above, the substrate 32 is transferred from the moving plate 145 to the finger portion 156 of the hand portion 155, and the moving plate 145 enters the carry-in chamber 101a. After returning, the loading door 122 is closed, and the inside of the loading vacuum chamber 112a is evacuated while the unprocessed substrate 32 is placed on the hand.

処理用真空槽113内では、基板31表面に所定膜厚の薄膜が形成されたら、電圧を停止してプラズマを消滅させる。
次に、横棒162を上昇させ、載置台165表面から横棒162上に基板31を移載し、搬出用真空槽112b内のハンド部155の移動高さよりも高い位置で静止させる。
In the processing vacuum chamber 113, when a thin film having a predetermined thickness is formed on the surface of the substrate 31, the voltage is stopped and the plasma is extinguished.
Next, the horizontal bar 162 is raised, the substrate 31 is transferred from the surface of the mounting table 165 onto the horizontal bar 162, and is stopped at a position higher than the moving height of the hand portion 155 in the unloading vacuum chamber 112b.

次に、図9に示すように、搬出用仕切弁124を開け、搬出用真空槽112b内のハンド部155を処理用真空槽113内に移動させる。
横棒162を支持する支持部163は横棒162の両端位置で横棒162に取り付けられているため、搬出用真空槽112b内の第二の搬送装置151bのハンド部155は、指部156が根本位置から先端に伸びる方向が、搬入用真空槽112a内の第一の搬送装置151aのハンド部155の指部156とは逆向き、すなわち、第二の搬送装置151bのハンド部155が処理用真空槽113内に移動したときに、搬出用真空槽112bに近い方が根本の掌部157にされており、処理用真空槽113に進入すると、指部156が支持部163の間を通って横棒162間の隙間の下方まで移動し、指部156の根本部分が支持部163に当接する前に停止する。
Next, as shown in FIG. 9, the carry-out gate valve 124 is opened, and the hand portion 155 in the carry-out vacuum tank 112 b is moved into the processing vacuum tank 113.
Since the support part 163 which supports the horizontal bar 162 is attached to the horizontal bar 162 at both end positions of the horizontal bar 162, the hand part 155 of the second transport device 151b in the unloading vacuum chamber 112b has the finger part 156. The direction extending from the root position to the tip is opposite to the finger portion 156 of the hand portion 155 of the first transfer device 151a in the loading vacuum chamber 112a, that is, the hand portion 155 of the second transfer device 151b is for processing. When moved into the vacuum chamber 113, the side closer to the unloading vacuum chamber 112 b is the base palm portion 157, and when entering the processing vacuum chamber 113, the finger portion 156 passes between the support portions 163. It moves to below the gap between the horizontal bars 162 and stops before the base portion of the finger portion 156 comes into contact with the support portion 163.

横棒162上では基板31の両端が横棒162上に乗せられており、その状態で横棒162を降下させると、図10に示すように、各基板31は、中央部分が指部156上に乗る。
このように、横棒162上から第二の搬送装置151bのハンド部155上に基板31が移載された後、ハンド部155は、基板31を乗せた状態で横棒162上から移動し、搬出用真空槽112b内に戻り、搬出用仕切弁124は閉じられる。
Both ends of the substrate 31 are placed on the horizontal bar 162 on the horizontal bar 162. When the horizontal bar 162 is lowered in this state, the central part of each substrate 31 is on the finger portion 156 as shown in FIG. get on.
As described above, after the substrate 31 is transferred from the horizontal bar 162 onto the hand unit 155 of the second transport device 151b, the hand unit 155 moves from the horizontal bar 162 with the substrate 31 placed thereon. Returning into the unloading vacuum chamber 112b, the unloading gate valve 124 is closed.

このとき、未処理の基板32は、第一の搬送装置151aのハンド上に乗せられて待機しており、搬入用真空槽112a内が所定圧力まで真空排気された後、搬入用仕切弁123が開けられ、上記と同様の手順により、行列状に配置された未成膜の基板32が載置台165上に配置され、薄膜の形成が開始される。   At this time, the unprocessed substrate 32 is placed on the hand of the first transfer device 151a and is waiting, and after the inside of the loading vacuum chamber 112a is evacuated to a predetermined pressure, the loading gate valve 123 is opened. The substrate 32 is opened and the non-film-formed substrates 32 arranged in a matrix are arranged on the mounting table 165, and the formation of the thin film is started.

第二の搬送装置151bのハンド部155は、薄膜を形成した基板31を配置した状態で、第二の吸着装置131bの真下に位置しており、搬出用仕切弁124を閉じた後、搬出用真空槽112b内に大気を導入し、大気圧になった後、搬出用扉125を開け、第二の吸着装置131bを降下させて、指部156上の基板31を非接触で吸着部135に吸着する。   The hand unit 155 of the second transfer device 151b is located immediately below the second suction device 131b with the substrate 31 on which a thin film is formed, and after the discharge gate valve 124 is closed, After the atmosphere is introduced into the vacuum chamber 112b and the atmospheric pressure is reached, the unloading door 125 is opened, the second suction device 131b is lowered, and the substrate 31 on the finger portion 156 is brought into contact with the suction portion 135 without contact. Adsorb.

図11に示すように、第二の吸着装置131bの吸着部135を上方に移動させた後、搬出用扉125を開け、搬出室101bから搬出用真空槽112b内に第二の大気側搬入装置141の移動板145を挿入し、吸着装置の真下に位置させる。   As shown in FIG. 11, after moving the suction part 135 of the second suction device 131b upward, the unloading door 125 is opened, and the second atmosphere side loading device is opened from the unloading chamber 101b into the unloading vacuum chamber 112b. 141 moving plate 145 is inserted and positioned just below the suction device.

吸着装置を降下させ、基板31の裏面が移動板145と接触するか又はその直前のときに降下を停止させ、吸着を解除すると図12に示すように、基板31は移動板145上に乗せられ、移動板145を搬出室101bに戻すと、真空処理が行われた基板31を真空処理装置10の外部に取り出すことができる。   When the suction device is lowered and the lowering is stopped when the back surface of the substrate 31 comes into contact with or just before the moving plate 145 and the suction is released, the substrate 31 is placed on the moving plate 145 as shown in FIG. When the movable plate 145 is returned to the carry-out chamber 101b, the substrate 31 that has been subjected to vacuum processing can be taken out of the vacuum processing apparatus 10.

このとき、処理用真空槽113内では、搬入された基板32の表面に薄膜が成長されており、この薄膜が所定膜厚に形成された後、上記と同じ手順によって、搬出室101bに搬送され、真空処理装置10の外部に取り出され、他方、処理用真空槽113内には、搬入室101aから搬入された基板33が真空処理される。   At this time, in the processing vacuum chamber 113, a thin film is grown on the surface of the loaded substrate 32, and after this thin film is formed to a predetermined thickness, it is transferred to the unloading chamber 101b by the same procedure as described above. The substrate 33 taken out from the vacuum processing apparatus 10 and carried into the processing vacuum chamber 113 from the carry-in chamber 101a is vacuum-processed.

このように、本発明はトレイを使用せずに複数の基板を一緒に真空処理することが可能であり、トレイ洗浄は不要であり、また、ピンの先端上に基板を配置しないので、基板が脱落する危険性も少ない。
なお、上記実施例では、真空処理が基板上に薄膜を形成する成膜処理であったが、本発明はそれに限定されるものではなく、真空雰囲気内で行われる真空処理を広く含む。
As described above, the present invention can vacuum-process a plurality of substrates together without using a tray, does not require tray cleaning, and does not place a substrate on the tip of a pin. There is little risk of dropping off.
In the above embodiment, the vacuum process is a film forming process for forming a thin film on the substrate. However, the present invention is not limited to this, and widely includes a vacuum process performed in a vacuum atmosphere.

本発明の真空処理装置の一例について説明する断面図Sectional drawing explaining an example of the vacuum processing apparatus of this invention 本発明の真空処理装置の一例について基板の真空槽搬入前における状態を説明する断面図Sectional drawing explaining the state before carrying in the vacuum chamber of a board | substrate about an example of the vacuum processing apparatus of this invention 本発明の真空処理装置の一例について基板の搬入用真空槽搬入時における状態を説明する断面図Sectional drawing explaining the state at the time of carrying in the vacuum tank for carrying in a board | substrate about an example of the vacuum processing apparatus of this invention 本発明の真空処理装置の一例について基板が第一の搬送装置へ載置される前の時点における状態を説明する断面図Sectional drawing explaining the state in the time before a board | substrate is mounted in a 1st conveying apparatus about an example of the vacuum processing apparatus of this invention. 本発明の真空処理装置の一例について基板が第一の搬送装置へ載置された時点における状態を説明する断面図Sectional drawing explaining the state in the time of the board | substrate being mounted in the 1st conveying apparatus about an example of the vacuum processing apparatus of this invention 本発明の真空処理装置の一例について基板を第一の搬送装置に載置して横棒を配置した移載機構の真上に移動させた時点における状態を説明する断面図Sectional drawing explaining the state at the time of moving a board | substrate on the 1st conveyance apparatus about the example of the vacuum processing apparatus of this invention, and moving right above the transfer mechanism which has arrange | positioned the horizontal bar | burr. 本発明の真空処理装置の一例について基板が第一の搬送装置から横棒を配置した移載機構に移載された時点における状態を説明する断面図Sectional drawing explaining the state in the time of the board | substrate being transferred to the transfer mechanism which has arrange | positioned the horizontal bar from the 1st conveying apparatus about an example of the vacuum processing apparatus of this invention. 本発明の真空処理装置の一例について横棒を配置した移載機構に移載された基板が成膜されている時間における状態を説明する断面図Sectional drawing explaining the state in the time when the board | substrate transferred to the transfer mechanism which has arrange | positioned the horizontal bar about the example of the vacuum processing apparatus of this invention is formed into a film 本発明の真空処理装置の一例について成膜処理された基板が横棒を配置した移載機構から第二の搬送装置に移載される前の時点における状態を説明する断面図Sectional drawing explaining the state before the board | substrate by which the film-forming process was carried out about an example of the vacuum processing apparatus of this invention was transferred to the 2nd conveying apparatus from the transfer mechanism which has arrange | positioned the horizontal bar | burr 本発明の真空処理装置の一例について成膜処理された基板が横棒を配置した移載機構から第二の搬送装置に移載された時点における状態を説明する断面図Sectional drawing explaining the state in the time of the board | substrate by which film-forming processing was carried out about an example of the vacuum processing apparatus of this invention being transferred to the 2nd conveyance apparatus from the transfer mechanism which has arrange | positioned the horizontal bar | burr 本発明の真空処理装置の一例について成膜処理された基板が第二の搬送装置から離れて搬出される前の時点における状態を説明する断面図Sectional drawing explaining the state in the time before the board | substrate by which film-forming processing was carried out about an example of the vacuum processing apparatus of this invention leaves | separates from a 2nd conveying apparatus, and is carried out. 本発明の真空処理装置の一例について成膜処理された基板が大気側搬入装置に移載されて搬出される時点における状態を説明する断面図Sectional drawing explaining the state in the time of the board | substrate by which the film-forming process was carried out about an example of the vacuum processing apparatus of this invention being transferred to the atmosphere side carrying-in apparatus and carrying out 本発明の処理対象である基板の一例を説明する平面図The top view explaining an example of the board | substrate which is a process target of this invention (a)、(b)本発明の搬送装置部材に設けられた部材の一例の一状態を説明する平面図(A), (b) The top view explaining one state of an example of the member provided in the conveying apparatus member of this invention 本発明の吸着装置部材に設けられた部材の一例の一状態を説明する平面図The top view explaining one state of an example of the member provided in the adsorption | suction apparatus member of this invention 本発明の吸着装置部材に設けられた部材の一例の別の状態を説明する平面図The top view explaining another state of an example of the member provided in the adsorption | suction apparatus member of this invention 本発明の移載機構部材に設けられた部材の一例の一状態を説明する平面図The top view explaining one state of an example of the member provided in the transfer mechanism member of this invention (a)、(b)本発明における処理対象基板を移載する時点での一状態を説明する平面図(A), (b) The top view explaining one state at the time of transferring the process target board | substrate in this invention. (a)、(b)本発明における処理対象基板を移載する時点での別の状態を説明する平面図(A), (b) The top view explaining another state at the time of transferring the process target board | substrate in this invention. (a)、(b)本発明において処理対象基板の成膜前後における状態を説明する平面図(A), (b) The top view explaining the state before and behind the film-forming of the process target board | substrate in this invention

符号の説明Explanation of symbols

112a……搬入用真空槽 113……処理用真空槽
112b……搬出用真空槽 133……吸着部移動装置
135……吸着部 136……凹部 170……突起
138……噴出孔 153……ハンド移動装置 155……ハンド部
162……横棒 163……支持部 164……上下移動装置
165……載置台 168……溝
31……基板
112a …… Vacuum chamber for loading 113 …… Vacuum chamber for processing 112b …… Vacuum chamber for unloading 133 …… Suction portion moving device 135 …… Suction portion 136 …… Recess portion 170 …… Protrusion 138 …… Blowout hole 153 …… Hand Moving device 155 …… Hand portion 162 …… Horizontal bar 163 …… Supporting portion 164 …… Vertical moving device 165 …… Place 168 …… Groove 31 …… Substrate

Claims (3)

処理用真空槽と、前記処理用真空槽にそれぞれ接続された搬入用真空槽と搬出用真空槽とを有し、前記搬入用真空槽と前記処理用真空槽と前記搬出用真空槽とを真空排気し、前記搬入用真空槽に配置された複数の基板を前記処理用真空槽に移動させて前記処理用真空槽内で真空処理した後、前記搬出用真空槽に移動させる真空処理装置であって、
前記搬入用真空槽と前記搬出用真空槽には、
行列状に配置された複数の基板を非接触の状態で吸着する吸着部と、
前記吸着部を上下移動させる吸着部移動装置と、
が設けられ、
前記吸着部に吸着される前記基板の行数と同数の細長の指部が、前記基板の行間隔と同間隔で同方向に水平面内に配置されたハンド部と
記ハンド部を、前記指部が前記吸着部に吸着される前記基板の各行の真下で静止する第一の移載位置と、前記処理用真空槽内の所定の第二の移載位置の間を往復移動させるハンド移動装置とがそれぞれ設けられ、
前記処理用真空槽には、
前記ハンド部よりも低い位置に配置され、複数の基板を載置可能な載置台と、
前記載置台の表面に形成され、前記指部が伸びる方向と同方向に延設された前記指部よりも一本以上多い溝と、
前記各溝の伸びる方向と同方向に延設され、前記各溝内にそれぞれ静止可能な複数の横棒と、
前記横棒を前記溝内の位置と前記指部表面の高さよりも高い位置との間で上下移動させる上下移動装置と、
が設けられ、
前記指部の幅は、隣接する溝に配置される前記横棒間の隙間よりも小さく形成され、
前記指部が前記第二の移載位置で静止したときに、前記指部は横棒間の隙間の真上に位置するように形成された真空処理装置。
A vacuum chamber for processing, a vacuum chamber for loading and a vacuum chamber for unloading respectively connected to the vacuum chamber for processing, and vacuuming the vacuum chamber for loading, the vacuum chamber for processing, and the vacuum chamber for unloading A vacuum processing apparatus that evacuates and moves a plurality of substrates disposed in the loading vacuum chamber to the processing vacuum chamber, vacuums the substrate in the processing vacuum chamber, and then moves the substrate to the unloading vacuum chamber. And
In the carrying-in vacuum tank and the carrying-out vacuum tank,
An adsorbing portion that adsorbs a plurality of substrates arranged in a matrix in a non-contact state;
A suction part moving device for moving the suction part up and down;
Is provided,
Fingers of the same number of elongated rows of the substrate to be attracted to the suction unit, and a hand portion disposed in a horizontal plane in the same direction in a row the same interval as the substrate,
The front Symbol hand portion, a first transfer position where the finger is still beneath the row of the substrate to be attracted to the suction portion, of the predetermined second transfer position of the processing vacuum tank And a hand moving device that reciprocates between them,
In the processing vacuum chamber,
Placed at a position lower than the hand unit, a mounting table capable of mounting a plurality of substrates,
One or more grooves formed on the surface of the mounting table and extending in the same direction as the direction in which the finger portion extends, and more than one groove,
A plurality of horizontal bars extending in the same direction as the direction in which each of the grooves extends, and capable of resting in each of the grooves,
A vertical movement device for moving the horizontal bar up and down between a position in the groove and a position higher than the height of the finger surface;
Is provided,
The width of the finger is formed smaller than the gap between the horizontal bars arranged in adjacent grooves,
A vacuum processing apparatus formed such that when the finger portion is stationary at the second transfer position, the finger portion is positioned directly above a gap between horizontal bars.
前記吸着部は、鉛直下方に向けられた吸着面と、前記吸着面に形成され、吸着する前記基板と同間隔の行列状に配置された複数の凹部と、前記各凹部内に複数個ずつ配置され、気体の噴出が可能な噴出孔と、前記凹部の外側に配置された突起とを有する請求項1記載の真空処理装置。   The suction part includes a suction surface that is directed vertically downward, a plurality of recesses that are formed on the suction surface and are arranged in a matrix at the same interval as the substrate to be suctioned, and a plurality of the suction parts are disposed in each recess. The vacuum processing apparatus according to claim 1, further comprising an ejection hole through which gas can be ejected and a protrusion disposed outside the recess. 前記上下移動装置は、前記載置台の外部に位置して前記横棒の端部に鉛直に取り付けられ、前記横棒を上下移動させる支持部を有する請求項1又は請求項2のいずれか1項記載の真空処理装置。   3. The vertical movement device according to claim 1, further comprising a support portion that is positioned outside the mounting table and is vertically attached to an end portion of the horizontal bar, and moves the horizontal bar up and down. The vacuum processing apparatus as described.
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