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JP5202011B2 - Lens meter - Google Patents
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JP5202011B2 - Lens meter - Google Patents

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JP5202011B2
JP5202011B2 JP2008025638A JP2008025638A JP5202011B2 JP 5202011 B2 JP5202011 B2 JP 5202011B2 JP 2008025638 A JP2008025638 A JP 2008025638A JP 2008025638 A JP2008025638 A JP 2008025638A JP 5202011 B2 JP5202011 B2 JP 5202011B2
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measurement
power
index
lens
column surface
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JP2008241694A5 (en
JP2008241694A (en
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正 梶野
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2008025638A priority Critical patent/JP5202011B2/en
Priority to US12/071,260 priority patent/US7733468B2/en
Priority to EP08151684.1A priority patent/EP1965189B1/en
Priority to KR1020080018177A priority patent/KR101437175B1/en
Priority to CN2008100820325A priority patent/CN101256114B/en
Publication of JP2008241694A publication Critical patent/JP2008241694A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0228Testing optical properties by measuring refractive power
    • G01M11/0235Testing optical properties by measuring refractive power by measuring multiple properties of lenses, automatic lens meters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B11/27Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0221Testing optical properties by determining the optical axis or position of lenses
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583Lenses

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Description

本発明は、被検レンズの光学特性を測定するレンズメータに関する。   The present invention relates to a lens meter that measures optical characteristics of a lens to be examined.

被検レンズに測定光束を投光し、被検レンズを透過した測定光束を受光素子により検出し、その検出結果に基づいて被検レンズの光学特性(球面度数S、柱面度数C及び柱面軸角度A)を得る測定光学系を持つレンズメータが知られている。この種の従来のレンズメータは、測定光軸を中心とした4つの測定指標(原理的には3つの測定指標)を一組として受光素子により検出される測定指標の偏位に基づいて被検レンズの光学特性を測定する構成とされていた(例えば、特許文献1、2参照)。また、被検レンズの光学特性の分布や累進レンズの遠用部、近用部を容易に測定するために、ノーズピース内に配置された多数の測定指標を使用するレンズメータも提案されている(例えば、特許文献3参照)。何れのレンズメータにおいても、単焦点レンズの測定においては、測定指標が測定光軸から離れるほど収差の影響が大きくなるため、基本的には測定光軸を中心に直径2〜3mmの円周上に配置された測定指標を使用して測定が行われていた。
特開昭60−17335号公報 特開昭50−145249号公報 特開2003−75296号公報
The measurement light beam is projected onto the test lens, and the measurement light beam transmitted through the test lens is detected by the light receiving element. Based on the detection result, the optical characteristics of the test lens (spherical power S, column surface power C, and column surface) Lens meters having a measuring optical system for obtaining an axial angle A) are known. This type of conventional lens meter is based on the deviation of the measurement index detected by the light receiving element with a set of four measurement indices (in principle, three measurement indices) around the measurement optical axis. It was set as the structure which measures the optical characteristic of a lens (for example, refer patent document 1, 2). In addition, a lens meter using a large number of measurement indexes arranged in the nosepiece has been proposed in order to easily measure the distribution of optical characteristics of the lens to be measured and the distance and near portions of the progressive lens. (For example, refer to Patent Document 3). In any lens meter, since the influence of the aberration increases as the measurement index moves away from the measurement optical axis in the measurement of the single focus lens, basically, it is on the circumference having a diameter of 2 to 3 mm around the measurement optical axis. Measurements were made using measurement indicators placed in
Japanese Unexamined Patent Publication No. 60-17335 JP 50-145249 A JP 2003-75296 A

しかし、測定光軸付近の測定指標を基にした測定では、レンズ度数やレンズ面の状態によって光学特性の測定が不安定となり、測定精度の信頼性が劣る場合があった。すなわち、レンズの屈折力が弱度数の場合、光軸付近の指標の偏位が少ないため、測定値が不安定になりやすい。特に、柱面度数が弱度数の場合には、それによる柱面軸角度が大きくバラツキ、測定結果が不安定になり、その測定精度が悪くなる。また、測定光軸付近の指標を使用した測定では、その測定領域にキズや汚れがある場合も測定値が安定せず、測定精度の信頼性が劣る。   However, in the measurement based on the measurement index near the measurement optical axis, the measurement of the optical characteristics becomes unstable depending on the lens power and the state of the lens surface, and the reliability of the measurement accuracy may be inferior. That is, when the refractive power of the lens is a weak power, the measured value tends to be unstable because the deviation of the index near the optical axis is small. In particular, when the column surface frequency is weak, the column surface axis angle varies greatly, resulting in an unstable measurement result, resulting in poor measurement accuracy. Further, in measurement using an index near the measurement optical axis, even when there are scratches or dirt in the measurement region, the measurement value is not stable, and the reliability of measurement accuracy is poor.

本発明は、上記従来技術の問題点に鑑み、レンズの光学特性を安定して精度良く得ることができるレンズメータを提供することを技術課題とする。   An object of the present invention is to provide a lens meter that can stably and accurately obtain optical characteristics of a lens in view of the above-described problems of the prior art.

上記課題を解決するために、本発明は以下のような構成を備えることを特徴とする。   In order to solve the above problems, the present invention is characterized by having the following configuration.

(1) 被検レンズの光学特性を測定し、測定結果を表示手段に表示するレンズメータにおいて、測定光軸を中心に所定のパターンで配置された多数の測定指標を有する指標板であって,測定光軸に近い第1領域にある第1測定指標と該第1領域の外側の第2領域にある第2測定指標とを含む測定指標を有する指標板と,該指標板及び被検レンズを通過した測定光束を受光する受光素子と,を持つ測定光学系と、
前記受光素子により検出された測定指標に基づいて単焦点レンズの光学特性を演算する演算手段であって,前記第1測定指標の検出結果に基づいてレンズの球面度数、柱面度数及び柱面軸角度を含む第1光学特性を演算し,前記第1測定指標及び第2測定指標の検出結果に基づいてレンズの球面度数,柱面度数及び柱面軸角度を含む第2光学特性を演算する演算手段と、
前記演算手段により演算された前記第1光学特性の柱面度数が、前記第2測定指標を使用することによる収差の影響が少ないものとして設定された所定の弱度数以下のとき,又は柱面度数及び球面度数が共に、前記第2測定指標を使用することによる収差の影響が少ないものとして設定された所定の弱度数以下のときに,前記第2光学特性を被検レンズの測定結果として前記表示手段に表示させ,前記第1光学特性の柱面度数が前記所定の弱度数より強度のとき,又は柱面度数及び球面度数が共に前記所定の弱度数より強度のときに,前記第1光学特性を被検レンズの測定結果として前記表示手段に表示させる測定制御手段と、
を備えることを特徴とするレンズメータ。
(2) 被検レンズの光学特性を測定し、測定結果を表示手段に表示するレンズメータにおいて、
測定光軸を中心に所定のパターンで配置された多数の測定指標を有する指標板であって,測定光軸に近い第1領域にある第1測定指標と該第1領域の外側の第2領域にある第2測定指標とを含む測定指標を有する指標板と,該指標板及び被検レンズを通過した測定光束を受光する受光素子と,を持つ測定光学系と、
前記受光素子により検出された測定指標に基づいて単焦点レンズの光学特性を演算する演算手段であって,前記第1測定指標の検出結果に基づいてレンズの球面度数、柱面度数及び柱面軸角度を含む第1光学特性を演算し,前記第1測定指標及び第2測定指標の検出結果に基づいてレンズの球面度数,柱面度数及び柱面軸角度を含む第2光学特性を演算する演算手段と、
前記演算手段により演算された前記第1光学特性の柱面度数が、前記第2測定指標を使用することによる収差の影響が少ないものとして設定された所定の弱度数以下のとき,又は柱面度数及び球面度数が共に、前記第2測定指標を使用することによる収差の影響が少ないものとして設定された所定の弱度数以下のときであって、さらに前記第1光学特性の球面度数及び柱面度数と前記第2光学特性の球面度数及び柱面度数とを比較し、球面度数及び柱面度数のそれぞれの差が共に所定の許容誤差内であるときに,前記第2光学特性を被検レンズの測定結果として前記表示手段に表示させ,前記第1光学特性の柱面度数が前記所定の弱度数より強度のとき,又は柱面度数及び球面度数が共に前記所定の弱度数より強度のときに,前記第1光学特性を被検レンズの測定結果として前記表示手段に表示させる測定制御手段と、
を備えることを特徴とするレンズメータ。
(1) In a lens meter that measures optical characteristics of a lens to be measured and displays a measurement result on a display means, an index plate having a large number of measurement indexes arranged in a predetermined pattern around a measurement optical axis, An index plate having a measurement index including a first measurement index in a first area close to the measurement optical axis and a second measurement index in a second area outside the first area; and the index plate and the test lens A measurement optical system having a light receiving element that receives the measurement light flux that has passed, and
Computation means for computing the optical characteristics of the single focus lens based on the measurement index detected by the light receiving element, and based on the detection result of the first measurement index, the spherical power, column surface power, and column surface axis of the lens An operation for calculating a first optical characteristic including an angle and calculating a second optical characteristic including a spherical power, a column surface power, and a column surface axis angle of the lens based on detection results of the first measurement index and the second measurement index. Means,
When the column surface frequency of the first optical characteristic calculated by the calculation means is equal to or less than a predetermined weak power level that is set to be less affected by aberrations by using the second measurement index, or a column surface frequency And the second optical characteristic as the measurement result of the test lens when both the spherical power and the spherical power are equal to or lower than a predetermined weak power set to be less affected by the aberration caused by using the second measurement index. The first optical characteristic is displayed when the column surface power of the first optical characteristic is higher than the predetermined weak power, or when both the column power and the spherical power are higher than the predetermined weak power. Measurement control means for displaying on the display means as a measurement result of the test lens ;
A lens meter comprising:
(2) In a lens meter that measures the optical characteristics of the test lens and displays the measurement result on the display means,
An index plate having a large number of measurement indexes arranged in a predetermined pattern around a measurement optical axis, the first measurement index in a first region close to the measurement optical axis and a second region outside the first region A measurement optical system having an index plate having a measurement index including the second measurement index and a light receiving element that receives the measurement light beam that has passed through the index plate and the test lens;
Computation means for computing the optical characteristics of the single focus lens based on the measurement index detected by the light receiving element, and based on the detection result of the first measurement index, the spherical power, column surface power, and column surface axis of the lens An operation for calculating a first optical characteristic including an angle and calculating a second optical characteristic including a spherical power, a column surface power, and a column surface axis angle of the lens based on detection results of the first measurement index and the second measurement index. Means,
When the column surface frequency of the first optical characteristic calculated by the calculation means is equal to or less than a predetermined weak power level that is set to be less affected by aberrations by using the second measurement index, or a column surface frequency And the spherical power and the spherical surface power of the first optical characteristic when both the spherical power and the spherical power are equal to or lower than a predetermined weak power set to be less affected by the aberration caused by using the second measurement index. And the spherical optical power and the cylindrical surface power of the second optical characteristic are compared, and when both the spherical power and the cylindrical surface power are within a predetermined tolerance, the second optical characteristic is When the column surface power of the first optical characteristic is stronger than the predetermined weak power, or when both the column surface power and the spherical power are stronger than the predetermined weak power, the measurement unit displays the measurement result. The first optical characteristic Measurement control means for displaying on the display unit as a measurement result of the subject lens, and
Lens meter, characterized in that it comprises a.

本発明によれば、レンズの光学特性を安定して精度良く得ることができる。   According to the present invention, the optical characteristics of the lens can be obtained stably and accurately.

本発明の実施の形態を図面に基いて説明する。図1は実施形態のレンズメータの外観を示した図である。   Embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a diagram illustrating an appearance of a lens meter according to the embodiment.

1はレンズメータ本体である。2はLCD等で構成されたディスプレイであり、測定結果やアライメントのターゲット等の測定に必要な情報が表示される。3は入力用のスイッチであり、ディスプレイ2に表示されるスイッチ表示に対応したものを押すことにより、測定モードの切換え等の必要な入力指示を行う。4は被検レンズLEを置き、測定時の基点となるノーズピースである。5はレンズ押えであり、これを下に降ろすことでノーズピース4に載せられた被検レンズLEを安定して保持することができる。   Reference numeral 1 denotes a lens meter main body. Reference numeral 2 denotes a display composed of an LCD or the like, which displays information necessary for measurement such as measurement results and alignment targets. Reference numeral 3 denotes an input switch. When a switch corresponding to the switch display displayed on the display 2 is pressed, a necessary input instruction such as switching of the measurement mode is performed. Reference numeral 4 denotes a nosepiece on which a test lens LE is placed and which serves as a base point during measurement. Reference numeral 5 denotes a lens presser. By lowering the lens presser 5, the test lens LE placed on the nosepiece 4 can be stably held.

6は前後方向に移動可能なレンズ当てであり、眼鏡フレーム入りレンズの測定においてフレームの下部(眼鏡装用状態における下部)に当接させて安定させることによりAxis(柱面軸角度)測定の基準を作る。7はレンズLEに印点を施す場合に使用する印点機構である。8は被検レンズLEの光学特性データを読み取るためのREADスイッチである。READスイッチ8を押すことにより、測定値がディスプレイ2にホールド表示されると共に装置内部に記憶される。   Reference numeral 6 denotes a lens pad that is movable in the front-rear direction. In measurement of a lens with a spectacle frame, it is brought into contact with the lower part of the frame (the lower part in the spectacle wearing state) and is stabilized, thereby providing a reference for measuring Axis (columnar axis angle) create. Reference numeral 7 denotes a marking mechanism used when marking is applied to the lens LE. Reference numeral 8 denotes a READ switch for reading optical characteristic data of the test lens LE. By pressing the READ switch 8, the measured value is held on the display 2 and stored in the apparatus.

図2は光学系と制御系を示す図である。20は測定光学系であり、L1はその測定光軸である。測定光学系20は、光軸L1上に配置されたLED等の測定光源21、コリメーティングレンズ22、測定指標が形成されたグリッド板23、受光素子としての2次元のイメージセンサ24を備える。光軸L1はノーズピース4が持つ開口4aの中心を通り、かつ開口4aの開口平面に対して垂直に配置されている。グリッド板23はノーズピース開口4aの近傍に配置されている。イメージセンサ24とノーズピース4の上端(レンズLEの後頂点)の間隔は、レンズLEの測定範囲の内の最小焦点距離よりも小さく設計されている。   FIG. 2 is a diagram showing an optical system and a control system. Reference numeral 20 denotes a measurement optical system, and L1 denotes its measurement optical axis. The measurement optical system 20 includes a measurement light source 21 such as an LED disposed on the optical axis L1, a collimating lens 22, a grid plate 23 on which a measurement index is formed, and a two-dimensional image sensor 24 as a light receiving element. The optical axis L1 passes through the center of the opening 4a of the nosepiece 4 and is disposed perpendicular to the opening plane of the opening 4a. The grid plate 23 is disposed in the vicinity of the nosepiece opening 4a. The distance between the image sensor 24 and the upper end of the nosepiece 4 (the rear vertex of the lens LE) is designed to be smaller than the minimum focal length within the measurement range of the lens LE.

なお、グリッド板23の配置は、ノーズピース4に載置される被検レンズLEより光源21側にしても良い。また、グリッド板23と同様な測定光束を得るように、光源21を二次元配置して測定指標を構成しても良い。   The grid plate 23 may be arranged on the light source 21 side from the lens LE to be placed on the nosepiece 4. Further, the measurement index may be configured by two-dimensionally arranging the light sources 21 so as to obtain a measurement light beam similar to that of the grid plate 23.

グリッド板23が持つ測定指標の指標パターンを図3に示す。この例では、幾何学的に配置された多数の測定指標としての円形の孔25(ドット指標)が、0.5mmの間隔で格子状に配置されている。孔25は9×9の配列であるが、ノーズピース4の開口を測定光が通過する範囲でもっと多くの孔25を配置しても良い。また、この例では、孔25の中心間の距離が0.5mmの等間隔としているが、所定の幾何学的な配列であればこれに限られない。孔25の内、光軸L1上にある孔(第4測定指標)H5と、この孔H5を中心とする1辺の長さが2mmの正方形のコーナーに位置する孔(第5測定指標)H1、H2、H3、H4は、直径0.5mmに形成されている。孔H1〜H5以外の孔25は直径0.2mmで形成されている。中心孔H5及び孔H5と一定の関係で配置された孔H1〜H4は、サイズが異なる他の孔25に対して区別されて検出される。中心孔H5は、イメージセンサ24で受光される各孔25の偏位の基準位置検出に使用される。また、レンズLE上の傷や汚れにより中心孔H5が正常に検出されない場合は、孔H1〜H4が代用される。また、孔H1〜H4の組は、コンタクトレンズ用の小口径のノーズピース使用時にも測定可能な領域とされる。   The index pattern of the measurement index that the grid plate 23 has is shown in FIG. In this example, a large number of geometrically arranged circular holes 25 (dot indices) as measurement indices are arranged in a grid pattern at intervals of 0.5 mm. The holes 25 are arranged in a 9 × 9 arrangement, but more holes 25 may be arranged in a range in which the measurement light passes through the opening of the nosepiece 4. In this example, the distance between the centers of the holes 25 is equal to 0.5 mm. However, the distance is not limited to this as long as it has a predetermined geometric arrangement. Of the holes 25, a hole (fourth measurement index) H5 on the optical axis L1 and a hole (fifth measurement index) H1 located at a square corner with a side length of 2 mm around the hole H5. , H2, H3, and H4 are formed to have a diameter of 0.5 mm. The holes 25 other than the holes H1 to H5 are formed with a diameter of 0.2 mm. The holes H1 to H4 arranged in a fixed relationship with the central hole H5 and the hole H5 are detected by being distinguished from other holes 25 having different sizes. The center hole H5 is used for detecting the reference position of the deviation of each hole 25 received by the image sensor 24. When the center hole H5 is not normally detected due to scratches or dirt on the lens LE, the holes H1 to H4 are substituted. The group of holes H1 to H4 is a region that can be measured even when a small diameter nosepiece for a contact lens is used.

光源21からの光束はコリメーティングレンズ22により平行光束とされ、レンズLEに投光される。その透過光束のうち、グリッド板23の孔25を通過した光束がイメージセンサ24上に届く。イメージセンサ24からの出力信号は制御部40に入力される。制御部40には、演算結果を記憶するためのメモリ41、演算結果等の情報をディスプレイ2に表示するための表示回路42が接続されている。   The light beam from the light source 21 is converted into a parallel light beam by the collimating lens 22 and projected onto the lens LE. Of the transmitted light flux, the light flux that has passed through the holes 25 of the grid plate 23 reaches the image sensor 24. An output signal from the image sensor 24 is input to the control unit 40. Connected to the control unit 40 are a memory 41 for storing calculation results, and a display circuit 42 for displaying information such as calculation results on the display 2.

さらに制御部40は、レンズLEが無い場合のグリッド板23を通してイメージセンサ24に届いた孔25の像(測定指標)の位置を基準に、屈折力を持つレンズLEを置いたときに得られる測定指標の位置偏位から、レンズLEの光学特性(球面度数S、柱面度数C、柱面軸角度A、プリズム度数)を演算する。基本的には、球面度数のみを持つレンズLEが置かれた場合、レンズLEが無い場合に対して、各孔像はレンズLEの光学中心から円形状に拡大又は縮小する。この拡大又は縮小の偏位に基づいて球面度数Sが求められる。柱面度数Cのみを持つレンズLEが置かれた場合、各孔像はレンズLEの柱面軸中心から拡大又は縮小して偏位する。この拡大又は縮小の偏位により柱面度数Cが求められる。柱面軸角度Aは、偏位の中心軸として求められる。また、プリズム度数は孔H5又はその付近の孔の平行移動量によって求められる。球面度数、柱面度数を持つレンズLEはこれらの複合として考えれば良い(特開昭60−17335号公報、特開昭50−145249号公報等に記載された求め方と同様な方法を使用できる)。   Further, the control unit 40 obtains the measurement obtained when the lens LE having refractive power is placed on the basis of the position of the image (measurement index) of the hole 25 that reaches the image sensor 24 through the grid plate 23 when there is no lens LE. The optical characteristics (spherical power S, column surface frequency C, column surface axis angle A, prism power) of the lens LE are calculated from the positional deviation of the index. Basically, when a lens LE having only a spherical power is placed, each hole image is enlarged or reduced in a circular shape from the optical center of the lens LE, compared to the case where there is no lens LE. The spherical power S is obtained based on this enlargement or reduction deviation. When the lens LE having only the columnar power C is placed, each hole image is deviated by being enlarged or reduced from the center of the columnar axis of the lens LE. The column surface frequency C is obtained by this enlargement or reduction deviation. The column surface axis angle A is obtained as the center axis of the displacement. Further, the prism power is obtained from the amount of parallel movement of the hole H5 or a hole in the vicinity thereof. The lens LE having a spherical power and a columnar power may be considered as a composite of these (the same method as described in Japanese Patent Laid-Open Nos. 60-17335, 50-145249, etc. can be used). ).

多数の測定指標を使用する場合は、測定光軸L1を中心とした直径2〜3mmにある5×5(25個)、7×7(49個)等の指標を使用し、同一円周上にあり、好ましくは隣接する4つ又は3つの指標を1組として得られる全ての組の光学特性を平均化する演算により、単焦点レンズの光学特性を精度良く得られる。また、5×5(25個)、7×7(49個)等の指標について、各視標の偏位の検出結果を基に光線追跡法を利用し、最小二乗法を適用して最もフィッティングするS,C,Aの回帰平面を求めることより、光学特性を演算する方法でも良い。従来の4つ又は3つの指標による1組のみの光学特性の演算に対して、それよりも多い多数の指標を使用することにより、単焦点レンズの光学特性を精度良く求めることができる。   When using a large number of measurement indexes, use 5 × 5 (25), 7 × 7 (49), etc., which are 2 to 3 mm in diameter with the measurement optical axis L1 as the center. Preferably, the optical characteristics of the single-focus lens can be obtained with high accuracy by calculating the average of the optical characteristics of all sets obtained by setting four or three adjacent indexes as one set. In addition, the index of 5 × 5 (25), 7 × 7 (49), etc. is most fitted by applying the least square method using the ray tracing method based on the detection result of the deviation of each target. Alternatively, a method of calculating optical characteristics may be used by obtaining a regression plane of S, C, and A. In contrast to the conventional calculation of only one set of optical characteristics using four or three indices, the optical characteristics of the single focus lens can be obtained with high accuracy by using a larger number of indices.

なお、累進レンズを測定する場合、隣接する4つ(少なくとも3つ)の指標(孔25)を1組として光学特性を演算することにより、累進レンズの微小部分における光学特性の分布が得られる。すなわち、ノーズピース4の開口内における光学特性の分布が得られる。これにより、累進レンズの測定においては、現在の測定位置が遠用部にあるか否かを効率よく判定でき、同様に現在の測定位置が近用部にあるか否かが効率よく判定できる。   When measuring a progressive lens, the distribution of optical characteristics in a minute portion of the progressive lens can be obtained by calculating the optical characteristics with a set of four adjacent (at least three) indexes (holes 25). That is, a distribution of optical characteristics in the opening of the nosepiece 4 is obtained. Thereby, in the measurement of the progressive lens, it can be efficiently determined whether or not the current measurement position is in the distance portion, and similarly, it can be efficiently determined whether or not the current measurement position is in the near portion.

ここで、単焦点レンズの光学特性を測定する場合、測定指標である孔25が測定光軸L1から離れるほど収差の影響が大きくなるため、基本的には測定光軸L1が位置する中心孔H5付近の小領域(直径2〜3mmの領域内)に配置された少なくとも3つの測定指標を使用してレンズLEの光学特性を演算する(第1演算)。例えば、H5を中心とした5×5の25個、又は7×7の49個の指標の検出結果に基づいて光学特性を演算する。しかし、測定光軸L1付近の指標を使用した測定では、レンズLEの屈折力が弱い場合には指標の偏位が少ないため、各測定値が不安定になりやすく、測定精度の信頼性が劣る。特に柱面度数Cが弱度数の場合には、柱面軸角度の演算結果が不安定になり、測定精度の信頼性も悪くなる。   Here, when measuring the optical characteristics of the single focus lens, the influence of the aberration increases as the measurement index hole 25 moves away from the measurement optical axis L1, so that basically the central hole H5 where the measurement optical axis L1 is located. The optical characteristics of the lens LE are calculated by using at least three measurement indexes arranged in a nearby small area (within a diameter of 2 to 3 mm) (first calculation). For example, the optical characteristics are calculated based on detection results of 25 indexes of 5 × 5 or 49 indexes of 7 × 7 with H5 as the center. However, in measurement using an index in the vicinity of the measurement optical axis L1, when the refractive power of the lens LE is weak, the deviation of the index is small, so that each measurement value is likely to be unstable, and the reliability of measurement accuracy is poor. . In particular, when the column surface frequency C is a weak frequency, the calculation result of the column surface axis angle becomes unstable, and the reliability of measurement accuracy also deteriorates.

そこで、本装置では、柱面度数Cが所定の弱度数以下のときは、測定光軸L1付近の小領域(直径2〜3mmの領域内)に対して測定領域及び測定指標の数を拡大(増加)して光学特性を演算する(第2演算)。柱面度数Cが弱度数のときは、測定光軸L1からの測定領域の範囲が広がっても、それによる収差の影響は少ないため、測定指標の数が増えることによる柱面軸角度の測定精度の向上と、安定性が図られる。以下、その動作例を図4のフローチャートに基づいて説明する。   Therefore, in this apparatus, when the column surface power C is equal to or lower than the predetermined weak power, the number of measurement regions and measurement indexes is expanded with respect to a small region (in a region having a diameter of 2 to 3 mm) near the measurement optical axis L1 ( Increase) to calculate the optical characteristics (second calculation). When the column surface frequency C is a weak power, even if the range of the measurement region from the measurement optical axis L1 is widened, the influence of the aberration is small, so the measurement accuracy of the column surface axis angle due to the increase in the number of measurement indices Improvement and stability. Hereinafter, an example of the operation will be described based on the flowchart of FIG.

装置の測定モードには、単焦点レンズを測定するモードと累進レンズを測定するモードがあり、ここでは単焦点レンズの測定モードを選択する。検者はディスプレイ2に表示されるレンズの左右選択を指定するスイッチを押して、測定するレンズの左右を選択する。   The measurement mode of the apparatus includes a mode for measuring a single focus lens and a mode for measuring a progressive lens. Here, the measurement mode of the single focus lens is selected. The examiner presses a switch for designating left / right selection of the lens displayed on the display 2 to select the left / right of the lens to be measured.

レンズLEがノーズピース4上に載せられると、制御部40は、イメージセンサ24により検出される多数の指標像(孔25の像)のうち、光軸L1を中心に配置された7×7(49個)の指標像の偏位に基づいて各測定値(S,C,A、プリズム度数)を演算する(S−1)。図5(a)はこのときのディスプレイ2に表示されるアライメントの画面例である。50はアライメント用のレチクル、51及び52は左右それぞれの測定値を表示する測定値表示部であり、マーク53の表示により現在、右レンズが測定されていることを示す。このとき得られた、各測定値は右測定値表示部51に表示される。また、レンズLEの光軸L1に対する光学中心の偏位方向とそのズレ量であるプリズム度数に基づいてリングターゲット54がディスプレイ2に表示される。また、孔H1〜H5の検出結果に基づいてリングターゲット54の表示位置を求め、アライメントを行うようにしても良い。   When the lens LE is placed on the nosepiece 4, the control unit 40 selects 7 × 7 (centered on the optical axis L <b> 1 among many index images (images of the holes 25) detected by the image sensor 24. Each measured value (S, C, A, prism frequency) is calculated based on the deviation of the 49 index images (S-1). FIG. 5A is an example of an alignment screen displayed on the display 2 at this time. Reference numeral 50 denotes an alignment reticle, and reference numerals 51 and 52 denote measurement value display units for displaying respective measurement values on the left and right sides. The display of the mark 53 indicates that the right lens is currently measured. Each measurement value obtained at this time is displayed on the right measurement value display unit 51. Further, the ring target 54 is displayed on the display 2 based on the deviation direction of the optical center with respect to the optical axis L1 of the lens LE and the prism power that is the amount of deviation. Further, the display position of the ring target 54 may be obtained based on the detection results of the holes H1 to H5, and alignment may be performed.

レンズLEが移動され、プリズム度数(Δ)が0.5Δ未満に入ると、リングターゲット54が十字ターゲット55に切換えられる(図5(b)参照)。度数を測定するのみであれば、この状態でREADスイッチ8を押すことにより、測定値がホールドされる。レンズLEに印点を施す場合には、さらに正確なアライメントをするために、レチクル50の中心に十字ターゲット55が向かうようにレンズLEを移動し、プリズム度数が0.1Δ未満になると、十字ターゲット55は大十字ターゲット57へと切換えられる。これにより、検者は精密なアライメントが完了したことを知ることができる。   When the lens LE is moved and the prism power (Δ) is less than 0.5Δ, the ring target 54 is switched to the cross target 55 (see FIG. 5B). If only the frequency is to be measured, the measured value is held by pressing the READ switch 8 in this state. When marking the lens LE, the lens LE is moved so that the cross target 55 is directed to the center of the reticle 50 for more accurate alignment. When the prism power becomes less than 0.1Δ, the cross target 55 is switched to the great cross target 57. Thereby, the examiner can know that precise alignment has been completed.

このような単焦点レンズの測定において、制御部40による光学特性の演算は一定の時間間隔で連続的に行われている。このとき、制御部40は、光軸L1を中心に配置された7×7(49個)の指標像の偏位に基づいて得られた光学特性の内、柱面度数が所定の弱度数δcD(及び球面度数がεsD、D:ディオプタ)以下か否かを判定する(S−2)。例えば、δcDは、柱面度数をマイナス読みとし、−0.5D以下の弱度数とする。   In the measurement of such a single focus lens, the calculation of the optical characteristics by the control unit 40 is continuously performed at regular time intervals. At this time, the control unit 40 has a column surface power of a predetermined weak power δcD among optical characteristics obtained based on the deviation of 7 × 7 (49) index images arranged around the optical axis L1. It is determined whether (and spherical power is εsD, D: diopter) or less (S-2). For example, δcD is a weak reading of −0.5D or less with the column face frequency being negatively read.

柱面度数がδcD(及び球面度数がεsD)以下の場合、測定領域及び指標の数を拡大しても、それによる収差の響は少ないので、測定値の安定性と柱面軸角度の精度向上を図るため、通常の7×7(49個)の測定領域及び指標の数を拡大して光学特性を演算する。制御部40は、7×7個の孔25による光学特性の演算とは別に、それよりも測定領域を拡大することにより測定指標の数を増加させ、中心孔H5を中心とした9×9個(81個)の指標像による光学特性を演算する(S−3)。   When the column surface power is less than δcD (and the spherical power is εsD), even if the number of measurement areas and indices is increased, the effect of aberration is small, so the stability of the measurement value and the accuracy of the column surface axis angle are improved. Therefore, the optical characteristics are calculated by enlarging the number of normal 7 × 7 (49) measurement areas and indices. The control unit 40 increases the number of measurement indexes by expanding the measurement area separately from the calculation of the optical characteristics by the 7 × 7 holes 25, and 9 × 9 centering on the central hole H 5. The optical characteristics of (81) index images are calculated (S-3).

ここで、好ましくは、さらに次のような判定条件を設ける(なお、次の判定条件のみを単一の条件とすることもできる)。制御部40は、7×7個で演算した各測定値と、9×9個で演算した測定値とを比較する。各測定値を比較した結果、それぞれが許容誤差の範囲内に収まるか否かを判定する(S−4)。本実施形態においては、球面度数及び柱面度数の差が共に許容差±0.06D以内であれば、測定領域及び測定指標の数を拡大したことによる収差の影響が少なく、9×9個の指標像から演算する方が信頼性の高い測定値が得られるとして、制御部40は9×9個の指標像に基づく測定結果をディスプレイ2に表示する(S−5)。そして、READスイッチ8が押されれば、制御部40は測定値をホールドし、メモリ41に記憶する(S−6)。   Here, preferably, the following determination condition is further provided (only the next determination condition can be a single condition). The control unit 40 compares each measurement value calculated by 7 × 7 and the measurement value calculated by 9 × 9. As a result of comparing each measurement value, it is determined whether or not each measurement value falls within the allowable error range (S-4). In this embodiment, if the difference between the spherical power and the column surface power is both within the tolerance ± 0.06D, the influence of the aberration due to the increase in the number of measurement areas and measurement indices is small, and 9 × 9. Assuming that a measurement value with higher reliability can be obtained by calculating from the index image, the control unit 40 displays a measurement result based on 9 × 9 index images on the display 2 (S-5). If the READ switch 8 is pressed, the control unit 40 holds the measured value and stores it in the memory 41 (S-6).

一方、ステップS−4にて、7×7個と9×9個とによる測定値を比較した結果、球面度数又は柱面度数の差が許容誤差の範囲を外れていた場合、測定値の安定性の向上が見込めないとして、制御部40は7×7個の指標像による演算結果を測定値とする(S−7)。   On the other hand, as a result of comparing the measurement values of 7 × 7 and 9 × 9 in step S-4, if the difference in spherical power or column surface power is outside the allowable error range, the measurement value is stabilized. Assuming that the improvement of the property cannot be expected, the control unit 40 uses the calculation result of 7 × 7 index images as the measurement value (S-7).

先のステップS−2において、柱面度数が所定の弱度数δcDより強度の場合、光軸L1を中心に配置された9×9個の指標像を含めると収差の影響が強くなり、7×7個の指標像による測定結果でも精度の信頼性が確保できるので、そのまま7×7個の指標像による演算結果を測定結果として表示する(S−7)。   In the previous step S-2, if the column surface power is stronger than the predetermined weak power δcD, the inclusion of 9 × 9 index images arranged around the optical axis L1 increases the influence of aberration, and 7 × Since the reliability of accuracy can be ensured even with the measurement results of the seven index images, the calculation results of the 7 × 7 index images are displayed as the measurement results as they are (S-7).

なお、上記のステップS−4の判定においては、7×7個の演算と9×9個の演算を行う処理をそれぞれ複数回(例えば、3回)実施した結果を基に切換えるようにしても良い。そして、1回ごとの両者の差が許容差±0.06D以内で、連続して3回測定された各測定値のばらつきも±0.06Dであれば、測定値の安定化と柱面軸角度の精度が見込めるとして、以降9×9個で演算された測定結果に切換える。そして、上記の条件を外れた場合は、そのまま7×7個の演算結果を測定結果とする処理を継続する。これは、レンズが大きく移動した時(プリズム度数の変化から分かる)、又は新しいレンズがノーズピース4に載せられるまで継続するが、レンズの移動がない場合も数秒毎に再確認して判定するようにしても良い。   In the determination of step S-4, the process of performing 7 × 7 operations and 9 × 9 operations is performed a plurality of times (for example, 3 times). good. If the difference between the two is within the tolerance of ± 0.06D and the variation of the measured values measured three times in succession is also ± 0.06D, the measurement value is stabilized and the column surface axis Assuming that the accuracy of the angle can be expected, the measurement result is switched to 9 × 9. If the above condition is not satisfied, the process of using 7 × 7 calculation results as measurement results is continued. This continues until the lens moves greatly (as seen from the change in prism power) or until a new lens is placed on the nosepiece 4. However, even if there is no movement of the lens, it is reconfirmed every few seconds. Anyway.

また、本発明の実施形態は上記に限るものではない。ステップS−2の判定に用いる柱面度数や、ステップS−4の判定に用いる基準は、適宜変更してもよい。また、測定対象とする指標像の個数は、光軸L1を中心に7×7個と9×9個の間で切換える方式を説明したが、これらの個数に限定されるものではない。例えば、測定光軸L1に位置する孔H5を中心にした5×5個の指標を通常の測定対象とし、柱面度数がδcD以下の場合にそれよりも領域を拡大することにより測定指標の個数を増やすように切換える。また、測定光軸L1を中心とした直径2mmの同一円周上にある指標を通常の測定対象とし、柱面度数がδcD以下の場合に拡大した直径の内部に位置する指標に切換えるようにしても良い。また、柱面度数に応じて5×5個、7×7個、9×9個と複数段階で切換える構成でも良い。   The embodiment of the present invention is not limited to the above. You may change suitably the column surface frequency used for determination of step S-2, and the reference | standard used for determination of step S-4. In addition, the method of switching the number of index images to be measured between 7 × 7 and 9 × 9 around the optical axis L1 has been described, but the number is not limited to these numbers. For example, 5 × 5 indexes centered on the hole H5 located on the measurement optical axis L1 are set as normal measurement targets, and the number of measurement indexes is increased by enlarging the region when the column surface frequency is δcD or less. Switch to increase. In addition, an index on the same circumference with a diameter of 2 mm centered on the measurement optical axis L1 is set as a normal measurement object, and the index is switched to an index positioned inside the enlarged diameter when the column surface power is δcD or less. Also good. Moreover, the structure which switches in multiple steps with 5x5 piece, 7x7 piece, and 9x9 piece according to the column surface frequency may be sufficient.

以上は、レンズLEの度数に応じて測定領域及び測定指標の数を拡大する演算(第2演算)を使用するものとしたが、レンズLEにキズや汚れがある場合にもこの第2演算を適用すると効果的である。すなわち、レンズLEにキズや汚れがあり、測定光軸L1付近の小領域(7×7個)の指標像の内、光量不足や指標像の形状不良により、正常に検出された指標像の数が所定数又は一定割合(4割、5割等)に満たない場合、測定結果がバラツキやすくなり、測定精度の信頼性も乏しくなる。この場合、制御部40は9×9個の指標に基づく第2演算により得られた測定結果をディスプレイ2に表示する。この場合、正常に検出される指標像が増加することにより、測定結果の安定性の向上が図られる。また、測定精度の向上も期待できる。正常に検出された指標像の数が所定数又は一定割合を満たすときは、制御部40はそのまま7×7個の指標像の演算により得られた測定結果をディスプレイ2に表示する。   In the above description, the calculation (second calculation) for enlarging the number of measurement areas and measurement indexes according to the power of the lens LE is used. However, the second calculation is also performed when the lens LE is scratched or dirty. It is effective when applied. That is, the number of index images that are normally detected due to insufficient light quantity or poor index image shape among index images in a small region (7 × 7) in the vicinity of the measurement optical axis L1 because the lens LE is scratched or dirty. Is less than a predetermined number or a fixed ratio (40%, 50%, etc.), the measurement results are likely to vary and the reliability of measurement accuracy is poor. In this case, the control unit 40 displays the measurement result obtained by the second calculation based on 9 × 9 indexes on the display 2. In this case, the stability of the measurement results is improved by increasing the number of index images that are normally detected. In addition, improvement in measurement accuracy can be expected. When the number of normally detected index images satisfies a predetermined number or a fixed ratio, the control unit 40 displays the measurement results obtained by calculating 7 × 7 index images as they are on the display 2.

またさらに、各測定値の演算の際に、各測定値の標準偏差を求めることにより、値の揃った指標だけを選択することも可能である。指標像の検出処理に比べ、光学特性の演算は僅かな時間で処理できるため、1回の測定指標の検出後に、採用/不採用の指標を選択していき、標準偏差が必要とするレベルに改善されるまでこれを繰り返す。これにより、測定時間の延長を伴わずに、安定した測定結果が得られる。   Furthermore, by calculating the standard deviation of each measurement value when calculating each measurement value, it is also possible to select only the indicators having the same value. Compared with the index image detection process, the calculation of the optical characteristics can be processed in a short time, so after the detection of the measurement index once, the adopted / non-adopted index is selected and the standard deviation is at the required level. Repeat until improved. Thereby, a stable measurement result can be obtained without extending the measurement time.

なお、上記の7×7個の指標による測定結果から9×9個の指標による測定結果への切換えについては、レンズメーカ等での使用においては必ずしも適さない場合もあるので、この切換え機能を適用するか、今まで通りに7×7個の指標による測定結果のままとするかを、ディスプレイ2に設けられた選択スイッチで選択可能にしておくことが好ましい。   Note that switching from the measurement result using the 7 × 7 index to the measurement result using the 9 × 9 index may not always be suitable for use in a lens manufacturer or the like. It is preferable that the selection switch provided on the display 2 can be used to select whether the measurement result based on the 7 × 7 indicators remains as it is.

上記の実施形態の第2演算は、測定領域及び測定指標の数を共に拡大(増加)させて光学特性を演算するものとしたが、いずれか一方でも良い。例えば、通常の第1演算では測定光軸L1付近の小領域にある7×7個の49個を対象とし、第2演算では9×9個の測定領域に拡大するが、演算処理時間を長くしないために、拡大した9×9個の全てを対象とするのではく、1個間隔を置く等で第1演算と同じ49個の測定指標を対象として演算する。また、測定指標の数のみを拡大する例として、通常の第1演算では演算処理時間を短くするために7×7個の測定領域の内、1個間隔を置いた25個の測定指標を対象として演算する。一方、第2演算では、7×7個の測定領域にある全ての測定指標を対象として演算する。第2演算は、先の実施形態のように測定領域及び測定指標の数の拡大を共に行うことが好ましいが、一方のみでも従来の第1演算に対して安定した結果が得られる。   In the second calculation of the above embodiment, the optical characteristics are calculated by expanding (increasing) both the number of measurement regions and the number of measurement indexes, but either one may be used. For example, the normal first calculation targets 7 × 7 49 in a small area near the measurement optical axis L1, and the second calculation expands to 9 × 9 measurement areas, but the calculation processing time is increased. Therefore, the calculation is performed on the same 49 measurement indexes as in the first calculation, such as by setting one interval, instead of targeting all of the enlarged 9 × 9. In addition, as an example of expanding only the number of measurement indexes, in the normal first calculation, in order to shorten the calculation processing time, out of 7 × 7 measurement areas, 25 measurement indexes spaced by one are targeted. Calculate as On the other hand, in the second calculation, calculation is performed for all measurement indexes in the 7 × 7 measurement regions. The second calculation is preferably performed together with the expansion of the number of measurement areas and measurement indices as in the previous embodiment, but only one of them can provide a stable result with respect to the conventional first calculation.

実施形態のレンズメータの外観を説明する図である。It is a figure explaining the external appearance of the lens meter of embodiment. 実施形態の光学系と制御系を説明する図である。It is a figure explaining the optical system and control system of an embodiment. 測定指標の指標パターンを説明する図である。It is a figure explaining the index pattern of a measurement index. 実施形態の動作例を説明する図である。It is a figure explaining the operation example of embodiment. アライメントの表示画面を説明する図である。It is a figure explaining the display screen of alignment.

符号の説明Explanation of symbols

2 ディスプレイ
4 ノーズピース
21 測定光源
23 グリッド板
24 イメージセンサ
40 制御部
41 メモリ
2 Display 4 Nosepiece 21 Measuring light source 23 Grid plate 24 Image sensor 40 Control unit 41 Memory

Claims (2)

被検レンズの光学特性を測定し、測定結果を表示手段に表示するレンズメータにおいて、
測定光軸を中心に所定のパターンで配置された多数の測定指標を有する指標板であって,測定光軸に近い第1領域にある第1測定指標と該第1領域の外側の第2領域にある第2測定指標とを含む測定指標を有する指標板と,該指標板及び被検レンズを通過した測定光束を受光する受光素子と,を持つ測定光学系と、
前記受光素子により検出された測定指標に基づいて単焦点レンズの光学特性を演算する演算手段であって,前記第1測定指標の検出結果に基づいてレンズの球面度数、柱面度数及び柱面軸角度を含む第1光学特性を演算し,前記第1測定指標及び第2測定指標の検出結果に基づいてレンズの球面度数,柱面度数及び柱面軸角度を含む第2光学特性を演算する演算手段と、
前記演算手段により演算された前記第1光学特性の柱面度数が、前記第2測定指標を使用することによる収差の影響が少ないものとして設定された所定の弱度数以下のとき,又は柱面度数及び球面度数が共に、前記第2測定指標を使用することによる収差の影響が少ないものとして設定された所定の弱度数以下のときに,前記第2光学特性を被検レンズの測定結果として前記表示手段に表示させ,前記第1光学特性の柱面度数が前記所定の弱度数より強度のとき,又は柱面度数及び球面度数が共に前記所定の弱度数より強度のときに,前記第1光学特性を被検レンズの測定結果として前記表示手段に表示させる測定制御手段と、
を備えることを特徴とするレンズメータ。
In the lens meter that measures the optical characteristics of the test lens and displays the measurement result on the display means,
An index plate having a large number of measurement indexes arranged in a predetermined pattern around a measurement optical axis, the first measurement index in a first region close to the measurement optical axis and a second region outside the first region A measurement optical system having an index plate having a measurement index including the second measurement index and a light receiving element that receives the measurement light beam that has passed through the index plate and the test lens;
Computation means for computing the optical characteristics of the single focus lens based on the measurement index detected by the light receiving element, and based on the detection result of the first measurement index, the spherical power, column surface power, and column surface axis of the lens An operation for calculating a first optical characteristic including an angle and calculating a second optical characteristic including a spherical power, a column surface power, and a column surface axis angle of the lens based on detection results of the first measurement index and the second measurement index. Means,
When the column surface frequency of the first optical characteristic calculated by the calculation means is equal to or less than a predetermined weak power level that is set to be less affected by aberrations by using the second measurement index, or a column surface frequency And the second optical characteristic as the measurement result of the test lens when both the spherical power and the spherical power are equal to or lower than a predetermined weak power set to be less affected by the aberration caused by using the second measurement index. The first optical characteristic is displayed when the column surface power of the first optical characteristic is higher than the predetermined weak power, or when both the column power and the spherical power are higher than the predetermined weak power. Measurement control means for displaying on the display means as a measurement result of the test lens ;
A lens meter comprising:
被検レンズの光学特性を測定し、測定結果を表示手段に表示するレンズメータにおいて、
測定光軸を中心に所定のパターンで配置された多数の測定指標を有する指標板であって,測定光軸に近い第1領域にある第1測定指標と該第1領域の外側の第2領域にある第2測定指標とを含む測定指標を有する指標板と,該指標板及び被検レンズを通過した測定光束を受光する受光素子と,を持つ測定光学系と、
前記受光素子により検出された測定指標に基づいて単焦点レンズの光学特性を演算する演算手段であって,前記第1測定指標の検出結果に基づいてレンズの球面度数、柱面度数及び柱面軸角度を含む第1光学特性を演算し,前記第1測定指標及び第2測定指標の検出結果に基づいてレンズの球面度数,柱面度数及び柱面軸角度を含む第2光学特性を演算する演算手段と、
前記演算手段により演算された前記第1光学特性の柱面度数が、前記第2測定指標を使用することによる収差の影響が少ないものとして設定された所定の弱度数以下のとき,又は柱面度数及び球面度数が共に、前記第2測定指標を使用することによる収差の影響が少ないものとして設定された所定の弱度数以下のときであって、さらに前記第1光学特性の球面度数及び柱面度数と前記第2光学特性の球面度数及び柱面度数とを比較し、球面度数及び柱面度数のそれぞれの差が共に所定の許容誤差内であるときに,前記第2光学特性を被検レンズの測定結果として前記表示手段に表示させ,前記第1光学特性の柱面度数が前記所定の弱度数より強度のとき,又は柱面度数及び球面度数が共に前記所定の弱度数より強度のときに,前記第1光学特性を被検レンズの測定結果として前記表示手段に表示させる測定制御手段と、
を備えることを特徴とするレンズメータ。
In the lens meter that measures the optical characteristics of the test lens and displays the measurement result on the display means,
An index plate having a large number of measurement indexes arranged in a predetermined pattern around a measurement optical axis, the first measurement index in a first region close to the measurement optical axis and a second region outside the first region A measurement optical system having an index plate having a measurement index including the second measurement index and a light receiving element that receives the measurement light beam that has passed through the index plate and the test lens;
Computation means for computing the optical characteristics of the single focus lens based on the measurement index detected by the light receiving element, and based on the detection result of the first measurement index, the spherical power, column surface power, and column surface axis of the lens An operation for calculating a first optical characteristic including an angle and calculating a second optical characteristic including a spherical power, a column surface power, and a column surface axis angle of the lens based on detection results of the first measurement index and the second measurement index. Means,
When the column surface frequency of the first optical characteristic calculated by the calculation means is equal to or less than a predetermined weak power level that is set to be less affected by aberrations by using the second measurement index, or a column surface frequency And the spherical power and the spherical surface power of the first optical characteristic when both the spherical power and the spherical power are equal to or lower than a predetermined weak power set to be less affected by the aberration caused by using the second measurement index. And the spherical optical power and the cylindrical surface power of the second optical characteristic are compared, and when both the spherical power and the cylindrical surface power are within a predetermined tolerance, the second optical characteristic is When the column surface power of the first optical characteristic is stronger than the predetermined weak power, or when both the column surface power and the spherical power are stronger than the predetermined weak power, the measurement unit displays the measurement result. The first optical characteristic Measurement control means for displaying on the display unit as a measurement result of the subject lens, and
Lens meter, characterized in that it comprises a.
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