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JP5247239B2 - Emission part structure of vacuum evaporation system - Google Patents
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JP5247239B2 - Emission part structure of vacuum evaporation system - Google Patents

Emission part structure of vacuum evaporation system Download PDF

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JP5247239B2
JP5247239B2 JP2008133709A JP2008133709A JP5247239B2 JP 5247239 B2 JP5247239 B2 JP 5247239B2 JP 2008133709 A JP2008133709 A JP 2008133709A JP 2008133709 A JP2008133709 A JP 2008133709A JP 5247239 B2 JP5247239 B2 JP 5247239B2
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discharge hole
vapor deposition
discharge
diameter
deposition material
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JP2009280861A (en
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恵美子 東
浩敏 ▲柳▼
将志 宮下
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Kanadevia Corp
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Hitachi Zosen Corp
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Description

本発明は、放出孔から蒸着材料を拡散放出して、基板などの被蒸着材に均一な膜厚を形成する真空蒸着装置の放出部構造に関する。   The present invention relates to a discharge part structure of a vacuum evaporation apparatus that diffuses and discharges a deposition material from a discharge hole to form a uniform film thickness on a deposition material such as a substrate.

たとえば特許文献1には、蒸発源に接続された複数の移送管の先端部に、それぞれ複数の放出孔が一定間隔ごとに穿孔された放出部を、ガラス基板の蒸着面に対向して設けた発明が開示され、これにより、従来の点蒸発源に比較して放出分布範囲を広く確保し、ガラス基板と放出孔とを接近して配置することにより、蒸着材料の付着効率(利用効率、蒸着率、収率ともいう)を向上させている。
特開2002−249868号公報
For example, in Patent Document 1, a plurality of discharge holes each having a plurality of discharge holes drilled at regular intervals are provided at the front ends of a plurality of transfer pipes connected to an evaporation source so as to face the vapor deposition surface of the glass substrate. The invention is disclosed, thereby ensuring a wide emission distribution range as compared with conventional point evaporation sources, and arranging the glass substrate and the emission holes close to each other, so that the deposition efficiency (utilization efficiency, deposition) Rate, also called yield).
JP 2002-249868 A

しかしながら、特許文献1の段落[0031]に、付着効率の向上が数値で示されているが、膜厚の均一性の向上については放出孔の配置と分岐管の加熱が記載されているに過ぎない。近年、広い面積の基板に、より均一な膜厚を形成できる蒸着装置が望まれている。   However, in paragraph [0031] of Patent Document 1, the improvement in the adhesion efficiency is indicated by numerical values, but the arrangement of the discharge holes and the heating of the branch pipe are only described for the improvement of the film thickness uniformity. Absent. In recent years, a vapor deposition apparatus that can form a more uniform film thickness on a large-area substrate has been desired.

本発明は上記問題点を解決して、放出孔から放出される蒸着材料を被蒸着材にさらに均一に蒸着できる真空蒸着装置の放出部構造を提供することを目的とする。   SUMMARY OF THE INVENTION An object of the present invention is to solve the above-described problems and to provide a discharge part structure of a vacuum evaporation apparatus capable of more uniformly depositing a vapor deposition material discharged from a discharge hole on a deposition target material.

請求項1記載の発明は、蒸発された蒸着材料が導入される分散容器に、当該分散容器に対向して配置される被蒸着材に向かって蒸着材料を放出する放出孔を形成した真空蒸着装置の放出部構造であって、放出孔の軸心上で放出孔の入口面から被蒸着材側に、放出孔の入口面の孔径より小径で、かつ入口面から外方に離れるほど大径となる錐形の反射面を有する倒立姿勢の反射部材を設け、放出孔の入口面の孔径:D、放出孔の入口面から反射部材の頂部までの距離:h1とすると、h1≧(2/3)Dとしたものである。 According to the first aspect of the present invention, there is provided a vacuum deposition apparatus in which a dispersion container into which an evaporated deposition material is introduced has a discharge hole for discharging the deposition material toward a deposition target disposed opposite to the dispersion container. The discharge portion structure of the discharge hole is smaller than the diameter of the discharge hole inlet surface from the discharge hole entrance surface to the deposition material side on the axial center of the discharge hole , and the larger the diameter is away from the inlet surface. An inverted reflecting member having a conical reflecting surface is provided, and assuming that the hole diameter of the inlet surface of the discharge hole is D and the distance from the inlet surface of the discharge hole to the top of the reflecting member is h1, h1 ≧ (2/3) ) D.

請求項2記載の発明は、蒸発された蒸着材料が導入される分散容器に、当該分散容器に対向して配置される被蒸着材に向かって蒸着材料を放出する放出孔を形成した真空蒸着装置の放出部構造であって、放出孔の軸心上で放出孔の入口面から分散容器の反被蒸着材側に、放出孔の入口面の孔径より小径で、かつ入口面に接近するほど小径となる錐形の反射面を有する正立姿勢の反射部材を設けたものである。 According to a second aspect of the present invention, there is provided a vacuum deposition apparatus in which a dispersion vessel into which an evaporated deposition material is introduced has a discharge hole for discharging the deposition material toward a deposition target disposed opposite to the dispersion vessel. The discharge portion structure of the discharge hole is smaller in diameter than the diameter of the inlet surface of the discharge hole and closer to the inlet surface on the axis of the discharge hole from the inlet surface of the discharge hole to the counter-deposition material side of the dispersion container. A reflection member having an upright posture having a conical reflection surface is provided.

請求項3記載の発明は、請求項1または2に記載の構成において、放出孔は、円柱形、または直円柱部と当該直円柱部の上縁から拡径される開放テーパ部からなる漏斗形としたものである。 According to a third aspect of the present invention, in the configuration according to the first or second aspect , the discharge hole has a cylindrical shape or a funnel shape having a right cylindrical portion and an open tapered portion whose diameter is expanded from the upper edge of the right cylindrical portion. It is what.

請求項1記載の発明によれば、放出孔の入口面から被蒸着材側に、錐形で倒立姿勢の反射部材を設けることにより、放出孔の軸心部近傍に飛散経路を有する蒸着材料を反射して放出孔軸心部への蒸着材料の集中度を低下させ、これにより被蒸着材への蒸着分布を均一化することができる。また、放出孔の入口面から反射部材までの距離を、放出孔の入口面の孔径の(2/3)倍以上とすることにより、被蒸着材への蒸着分布をより均一化することができる。 According to the first aspect of the present invention, the vapor deposition material having a scattering path in the vicinity of the axial center portion of the discharge hole is provided by providing a conical and inverted reflection member on the deposition target side from the entrance surface of the discharge hole. The concentration of the vapor deposition material on the axial center of the emission hole is reflected to reduce the vapor deposition distribution on the material to be vaporized. Further, by setting the distance from the entrance surface of the discharge hole to the reflecting member to be not less than (2/3) times the hole diameter of the entrance surface of the discharge hole, it is possible to make the deposition distribution on the deposition target material more uniform. .

請求項2記載の発明によれば、放出孔の入口面から反被蒸着部材側に、錐形で正立姿勢の反射部材を設けることにより、放出孔の軸心部近傍に飛散経路を有する蒸着材料を反射して放出孔軸心部への蒸着材料の集中度を低下させ、これにより被蒸着材への蒸着分布を均一化することができる。 According to the second aspect of the present invention, the evaporation member having the scattering path in the vicinity of the axial center portion of the emission hole is provided by providing the conical and upright reflecting member on the side opposite to the evaporation target member from the entrance surface of the emission hole. The material is reflected to reduce the concentration of the vapor deposition material on the axial center of the discharge hole, thereby making the vapor deposition distribution on the vapor deposition material uniform.

以下、本発明の実施の形態を図面に基づいて説明する。
[実施の形態1]
まず、本発明に係る放出部を有する真空蒸着装置を説明する。
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
[Embodiment 1]
First, a vacuum deposition apparatus having an emission part according to the present invention will be described.

(真空蒸着装置の第1形態)
この真空蒸着装置10は、単一の蒸着材料を蒸着するものであって、図6に示すように、真空蒸着室11の中央下部に加熱装置(図示せず)を有する蒸発容器12が配置され、蒸発容器12内に、蒸着材料を収容するるつぼ13が配置されている。そして蒸発容器12の上面から伸びる移送ダクト14が底壁を貫通して真空蒸着室11内に導入され、真空蒸着室11内の底部に配置された中空状面形の分散容器15の底面中央部に接続されている。また真空蒸着室11内の天部に、分散容器15に対向して固定式の保持具(図示せず)に保持された被蒸着材である基板Pが配置されている。この分散容器15は、所定の厚みを有する正方形または長方形の中空箱体形で、基板Pに対向する上部の放出面の所定位置に、放出孔1を有する放出部が設けられている。
(First form of vacuum evaporation system)
This vacuum vapor deposition apparatus 10 deposits a single vapor deposition material. As shown in FIG. 6, an evaporation container 12 having a heating device (not shown) is disposed at the center lower part of the vacuum vapor deposition chamber 11. The crucible 13 for accommodating the vapor deposition material is disposed in the evaporation container 12. Then, a transfer duct 14 extending from the upper surface of the evaporation container 12 passes through the bottom wall and is introduced into the vacuum deposition chamber 11, and the center of the bottom surface of the hollow planar dispersion container 15 disposed at the bottom of the vacuum deposition chamber 11. It is connected to the. In addition, a substrate P, which is a material to be vapor-deposited held by a fixed holder (not shown), is disposed on the top of the vacuum vapor deposition chamber 11 so as to face the dispersion container 15. The dispersion container 15 has a square or rectangular hollow box shape having a predetermined thickness, and a discharge portion having a discharge hole 1 is provided at a predetermined position on the upper discharge surface facing the substrate P.

(真空蒸着装置の第2形態)
この真空蒸着装置20は、単一の蒸着材料を蒸着するものであって、図7に示すように、真空蒸着室21の中央下部に加熱装置(図示せず)を有する蒸発容器22が配置され、蒸発容器22内に、蒸着材料を収容するるつぼ23が配置されている。そして蒸発容器22の上面から伸びる移送ダクト24が底壁を貫通して真空蒸着室21内に導入され、真空蒸着室21内の底部に幅方向に配置された中空状ライン形の分散容器25の下面中央部に接続されている。分散容器25は、所定の厚みで幅方向に長い中空箱体形で、基板Pに対向する上部の放出面に幅方向に所定間隔ごとに、放出孔1を有する放出部が設けられている。さらに真空蒸着室21内の天部には、被蒸着材である基板Pを保持して長さ方向に移動させる可動式保持具(図示せず)が配置され、分散容器25の放出孔1から放出される蒸着材料が、可動式保持具により移動される基板P下部の蒸着面に蒸着される。
(Second form of vacuum evaporation system)
This vacuum deposition apparatus 20 is for depositing a single deposition material, and as shown in FIG. 7, an evaporation container 22 having a heating device (not shown) is arranged at the lower center of the vacuum deposition chamber 21. A crucible 23 for accommodating a vapor deposition material is disposed in the evaporation container 22. Then, a transfer duct 24 extending from the upper surface of the evaporation container 22 is introduced into the vacuum deposition chamber 21 through the bottom wall, and the hollow line-shaped dispersion container 25 disposed in the width direction at the bottom of the vacuum deposition chamber 21. It is connected to the bottom center. The dispersion container 25 has a hollow box shape having a predetermined thickness and long in the width direction, and discharge portions having discharge holes 1 are provided at predetermined intervals in the width direction on the upper discharge surface facing the substrate P. Furthermore, a movable holder (not shown) that holds the substrate P as a deposition material and moves it in the length direction is disposed at the top of the vacuum deposition chamber 21, and is disposed from the discharge hole 1 of the dispersion container 25. The released deposition material is deposited on the deposition surface below the substrate P moved by the movable holder.

(真空蒸着装置の第3形態)
この真空蒸着装置30は、3種類の蒸着材料を一度に基板Pの蒸着面に蒸着するもので、図8に示すように、真空蒸着室31の中央下部に加熱装置(図示せず)を有する3つの蒸発容器32A〜32Cがそれぞれ配置され、蒸発容器32A〜32C内に、それぞれ蒸着材料が収容されたるつぼ33A〜33Cが配置されている。真空蒸着室31の底部には、所定隙間をあけて上下3段に中空箱体状で面形の上段分散容器35Aおよび中段分散容器35Bならびに下段分散容器35Cが設置されており、各蒸発容器32A〜32Cの上面からそれぞれ伸びる移送ダクト34A〜34Cが底壁を貫通して真空蒸着室31内に導入され、移送ダクト34Cは直接上段分散容器35Cの底面中央部近傍に接続され、また移送ダクト34Bは下段分散容器35Bを貫通して中段分散容器35Bの底面中央部近傍に接続され、さらに移送ダクト34Aは下段分散容器35Cおよび中段分散容器35Bをそれぞれ貫通して上段分散容器35Aの底面中央部近傍に接続されている。
(Third form of vacuum evaporation system)
The vacuum deposition apparatus 30 deposits three kinds of deposition materials on the deposition surface of the substrate P at a time, and has a heating device (not shown) at the lower center of the vacuum deposition chamber 31 as shown in FIG. Three evaporation containers 32A to 32C are arranged, respectively, and crucibles 33A to 33C each containing a vapor deposition material are arranged in the evaporation containers 32A to 32C. At the bottom of the vacuum vapor deposition chamber 31, there are provided an upper dispersion container 35A, an intermediate dispersion container 35B, and a lower dispersion container 35C having a hollow box shape in three upper and lower stages with a predetermined gap, and each evaporation container 32A. To 32C, the transfer ducts 34A to 34C extending from the upper surface of the gas are respectively introduced into the vacuum deposition chamber 31 through the bottom wall. The transfer duct 34C is directly connected to the vicinity of the center of the bottom surface of the upper dispersion vessel 35C, and the transfer duct 34B. Passes through the lower dispersion container 35B and is connected to the vicinity of the center of the bottom of the middle dispersion container 35B, and the transfer duct 34A passes through the lower dispersion container 35C and the middle dispersion container 35B, and is near the center of the bottom of the upper dispersion container 35A. It is connected to the.

各分散容器35A〜35Cは、所定の厚みを有する正方形または長方形の箱体形で、上段の分散容器35A上部の放出面の所定位置に、放出孔1を有する放出部が設けられている。これら複数の放出孔1のうち、上段分散容器35Aに連通される放出孔1は、その上面板に直接開口されて上段分散容器35A内の蒸着材料を放出する。また中段分散容器35Bに連通される放出孔1に、中段分散容器35Bの上面板から上段分散容器35Aを貫通する中段接続ノズル36Bを介して接続されて中段分散容器35B内の蒸着材料を放出する。さらに下段分散容器35Cに連通する放出孔1は、下段分散容器35Cの上面板から中段分散容器34Bおよび上段分散容器35Aを貫通する下段接続ノズル36Cを介して接続されて下段分散容器35C内の蒸着材料を放出する。   Each of the dispersion containers 35A to 35C has a square or rectangular box shape having a predetermined thickness, and a discharge portion having a discharge hole 1 is provided at a predetermined position on the discharge surface of the upper dispersion container 35A. Out of the plurality of discharge holes 1, the discharge hole 1 communicating with the upper dispersion container 35 </ b> A is directly opened on the upper surface plate to discharge the vapor deposition material in the upper dispersion container 35 </ b> A. Further, it is connected to the discharge hole 1 communicated with the middle stage dispersion container 35B from the upper surface plate of the middle stage dispersion container 35B through the middle stage connection nozzle 36B penetrating the upper stage dispersion container 35A and discharges the vapor deposition material in the middle stage dispersion container 35B. . Further, the discharge hole 1 communicating with the lower dispersion container 35C is connected from the upper surface plate of the lower dispersion container 35C via the lower dispersion nozzle 35C penetrating the middle dispersion container 34B and the upper dispersion container 35A, and vapor deposition in the lower dispersion container 35C. Release material.

真空蒸着室31内の天部に、固定式の保持具37に保持された被蒸着材である基板Pが配置され、上段分散容器35Aの各放出孔1から放出される蒸着材料が基板Pに蒸着される。   A substrate P, which is a material to be vapor-deposited held by a fixed holder 37, is disposed on the top of the vacuum vapor deposition chamber 31, and the vapor deposition material discharged from each discharge hole 1 of the upper dispersion vessel 35A is applied to the substrate P. Vapor deposited.

(真空蒸着装置の第4形態)
第4形態の真空蒸着装置40は、第3形態における各移送ダクト34A〜34Cを上段、中段、下段分散容器35A〜35Cの側端部にそれぞれ接続したもので、図9を参照して説明する。他の部材は同一に構成されるため、第3形態と同一部材には同一符号を付して説明を省略する。
(4th form of a vacuum evaporation system)
The vacuum deposition apparatus 40 of the fourth embodiment is such that the transfer ducts 34A to 34C in the third embodiment are respectively connected to the side end portions of the upper, middle, and lower dispersion containers 35A to 35C, and will be described with reference to FIG. . Since the other members are configured identically, the same members as those in the third embodiment are denoted by the same reference numerals, and description thereof is omitted.

側端部に移送ダクト34A〜34Cがそれぞれ接続された各分散容器35A〜35C内に、これら移送ダクト34A〜34Cの出口から放出される蒸着材料を、分散容器35A〜35Cの中央部にそれぞれ案内するインナーマニホールド41A〜41Cが設けられている。各インナーマニホールド41A〜41Cは、分散容器35A〜35Cの底部で移送ダクト34A〜34Cの接続部から各分散容器35A〜35Cの中央部にわたって配置されたダクトにより形成され、分散容器35A〜35Cの中央部に出口41a〜41cが開口されている。これにより、蒸着材料を各分散容器35A〜35C内に均一に分散させて、各放出孔1からそれぞれ蒸着材料を均一に放出することができる。   The vapor deposition material discharged from the outlets of the transfer ducts 34A to 34C is guided into the central portions of the dispersion containers 35A to 35C in the dispersion containers 35A to 35C, to which the transfer ducts 34A to 34C are respectively connected to the side ends. Inner manifolds 41A to 41C are provided. Each of the inner manifolds 41A to 41C is formed by a duct arranged at the bottom of the dispersion containers 35A to 35C from the connection portion of the transfer ducts 34A to 34C to the center of each of the dispersion containers 35A to 35C. Exits 41a to 41c are opened in the part. Accordingly, the vapor deposition material can be uniformly dispersed in each of the dispersion containers 35 </ b> A to 35 </ b> C, and the vapor deposition material can be uniformly discharged from each discharge hole 1.

(放出部の第1の実施の形態)
次に上記真空蒸着装置10,20,30,40に設けられて本発明に係る放出部の第1の実施の形態を図1〜図3を参照して説明する。
(First embodiment of discharge section)
Next, a first embodiment of the discharge portion provided in the vacuum deposition apparatus 10, 20, 30, 40 according to the present invention will be described with reference to FIGS.

図1(a)に示すように、分散容器15,25,35Aに設けられた放出部は、上面板52に形成された放出孔1と、放出孔1の軸心上に配置された倒立姿勢の反射部材51とで構成されている。前記放出口1は、距離H(図では上面板52の厚み)の円柱形に形成されている。また反射部材51は、基準面である入口面1aから距離h1の位置に頂部が配置されている。 As shown in FIG. 1A, the discharge portions provided in the dispersion containers 15, 25, and 35 </ b> A include a discharge hole 1 formed in the upper surface plate 52 and an inverted posture arranged on the axis of the discharge hole 1. And the reflecting member 51. The discharge port 1 is formed in a cylindrical shape having a distance H (the thickness of the upper surface plate 52 in the figure). The top of the reflecting member 51 is disposed at a distance h1 from the entrance surface 1a, which is a reference surface.

もちろん、図1(b)に示すように、放出孔1を、薄い板厚の上面板62に立設された円筒部材62aにより距離Hの円柱形に形成してもよい。
この反射部材51は、下端が頂部となる倒立姿勢の無底円錐形で、錐形の錐辺外周面が反射面に構成され、頂角βは図では90°で示されている。この頂角βは75°〜105°の範囲が好適値であり、さらにβ=60°〜120°の範囲も有効である。また、図示していないが、反射部材51は、たとえば上面板52に立設されて放出孔1の軸心から放射方向に配置される支持板により取り付けられている。
Of course, as shown in FIG. 1B, the discharge hole 1 may be formed in a columnar shape with a distance H by a cylindrical member 62a erected on the upper plate 62 having a thin plate thickness.
The reflecting member 51 has an inverted bottomless conical shape with the lower end at the top, and the outer peripheral surface of the conical pyramid is configured as a reflecting surface, and the apex angle β is 90 ° in the figure. The apex angle β is preferably in the range of 75 ° to 105 °, and the range of β = 60 ° to 120 ° is also effective. Although not shown, the reflecting member 51 is attached by a support plate that is erected on the upper surface plate 52 and is arranged in the radial direction from the axis of the discharge hole 1, for example.

次に図2に、この反射部材51による分散効果をシミュレーションにより求めたグラフを示す。ここで、放出孔1の孔径D=9mm、距離H=6mmとし、この反射部材51を、頂部が放出孔1の出口面に接するように、h1=H=6mmに配置し、その底辺外径W1を、ケース1ではW1=(1/9)D=1mm、ケース2ではW1=(5/9)D=5mm、ケース3ではW1=D=9mmと変化させ、膜厚分布および蒸着材料の付着個数を求めている。ここで、この(a)のグラフは、膜厚分布の最大値を1として縦軸を計算したもので、(a)および(b)のグラフとも、横軸は、放出孔1の軸心からの半径xと、放出孔1から基板Pまでの距離Lとの比(x/L)で示している。 Next, FIG. 2 shows a graph in which the dispersion effect by the reflecting member 51 is obtained by simulation. Here, the hole diameter D of the discharge hole 1 is set to 9 mm, the distance H is set to 6 mm, and the reflection member 51 is arranged at h1 = H = 6 mm so that the top portion is in contact with the exit surface of the discharge hole 1 and the bottom outer diameter thereof. In case 1, W1 = (1/9) D = 1 mm, in case 2, W1 = (5/9) D = 5 mm, and in case 3, W1 = D = 9 mm. Finding the number of deposits. Here, in the graph of (a), the vertical axis is calculated by setting the maximum value of the film thickness distribution to 1, and in both the graphs of (a) and (b), the horizontal axis is from the axis of the discharge hole 1. The ratio (x / L) between the radius x of the gas and the distance L from the discharge hole 1 to the substrate P is shown.

放出孔1から放出される蒸着材料の希薄流は、反射部材51を有しない基本ケースに示すように、放出孔1の軸心を中心として、cosθ(コサイン則)による分布を示し、中心の軸心付近が最も蒸着材料の放出が多く、軸心から離れるに従って減少していく分布を示す。しかし、本発明では、軸心上に反射部材51を配置して、軸心近傍の飛散経路に沿って飛散される蒸着材料を反射することにより、蒸着分布の均一化を向上させている。 As shown in the basic case without the reflecting member 51, the dilute flow of the vapor deposition material emitted from the emission hole 1 shows a distribution according to cos n θ (cosine law) with the axis of the emission hole 1 as the center. In the vicinity of the axis, the deposition material is released most, and the distribution decreases with increasing distance from the axis. However, in the present invention, the reflective member 51 is disposed on the axial center, and the vapor deposition material scattered along the scattering path in the vicinity of the axial center is reflected to improve the uniformity of the vapor deposition distribution.

すなわち、図2によれば、放出孔1の孔径Dと反射部材51の底辺外径W1とが等しいケース3の場合が均一性が最も良く、分布集中度が大幅に低減されている。ケース1の場合でも、基本ケースに比べて、効果が小さいながらも、僅かに均一性が改善されているが、ケース2の場合には、分布集中度がより効果的に低減されていることがわかる。このように、反射部材51の頂部が放出孔1の出口面(h=D)に接するように配置した状態で、反射部材51の効果が確認されるとともに、反射部材51の底辺外径が、W1=(1/9)Dから、W1=(1/5)D、W1=Dと大きくなるほど、分布集中度を低減させることができることが確認できた。 That is, according to FIG. 2, the case 3 in which the hole diameter D of the discharge hole 1 is equal to the bottom outer diameter W1 of the reflecting member 51 has the best uniformity, and the distribution concentration is greatly reduced. Even in the case 1, the uniformity is slightly improved compared to the basic case, but the uniformity is slightly improved. However, in the case 2, the distribution concentration is more effectively reduced. Recognize. As described above, the effect of the reflection member 51 is confirmed in a state where the top portion of the reflection member 51 is disposed so as to contact the exit surface (h = D) of the discharge hole 1, and the bottom outer diameter of the reflection member 51 is from W1 = (1/9) D, the greater the W1 = (1/5) D, W1 = D, it was confirmed that it is possible to reduce the distribution degree of concentration.

また図3に、他の条件で反射部材51による効果をシミュレーションにより求めたグラフを示す。この反射部材51は、底辺外径W1=(5/9)D=5mmとし、配置位置h1を、ケース4のh1=(1/3)D=3mm、ケース5のh1=(2/3)D=6mm、ケース6のh1=D=9mmとなるように、放出孔1の軸心上で変化させ、膜厚分布および蒸着材料の付着個数を求めている。ここで、図3の(a)および(b)の横軸と縦軸は図2と同様に表されている。 FIG. 3 shows a graph in which the effect of the reflecting member 51 is obtained by simulation under other conditions. The reflecting member 51 has a base outer diameter W1 = (5/9) D = 5 mm, and the arrangement position h1 is h1 = (1/3) D = 3 mm in case 4 and h1 = (2/3) in case 5. In order to satisfy D = 6 mm and h1 = D = 9 mm of the case 6, the thickness is varied on the axis of the discharge hole 1 to obtain the film thickness distribution and the number of deposited deposition materials. Here, the horizontal and vertical axes in FIGS. 3A and 3B are represented in the same manner as in FIG.

図3によれば、ケース5を中心に、ケース4とケース6とが近い均一性を示し、基本ケースよりいずれも優れた均一性が得られることがわかった。またケース4とケース6とを比較すると、ケース6の方が若干優れており、均一性のピークはh1=7mm近傍にあると推測される。これにより、反射部材51の有効性が確認された。そして、上記グラフから、実用的な均一性を確保できる反射部材51は、入口面1aから反射部材51までの距離:h1が、放出孔1の孔径Dの(2/3)倍以上[h1≧(2/3)D]が望ましいことがわかった。さらに、反射部材51の配置位置は、出口面からその上部近傍に設置すればよいことがわかった。 According to FIG. 3, it was found that the case 4 and the case 6 have a uniform uniformity around the case 5, and a uniformity superior to that of the basic case can be obtained. Further, when comparing the case 4 and the case 6, the case 6 is slightly better, and it is estimated that the uniformity peak is in the vicinity of h1 = 7 mm. Thereby, the effectiveness of the reflecting member 51 was confirmed. From the above graph, the reflecting member 51 that can ensure practical uniformity is the distance from the entrance surface 1a to the reflecting member 51: h1 is not less than (2/3) times the hole diameter D of the discharge hole 1 [h1 ≧ (2/3) D] was found to be desirable. Furthermore, it has been found that the reflection member 51 may be disposed in the vicinity of the upper portion from the exit surface.

上記実施の形態によれば、放出孔1の軸心上で入口面1aから基板P側に、錐辺外周部を反射面とする反射部材51を倒立姿勢で配置することにより、放出孔1の軸心部近傍に飛散経路を有する蒸着材料を反射して軸心部への蒸着材料の集中度を低下させ、これにより基板Pへの蒸着分布を均一化することができる。   According to the above-described embodiment, by disposing the reflecting member 51 having the outer peripheral portion of the cone side as the reflecting surface on the axis side of the discharge hole 1 from the entrance surface 1a to the substrate P side in an inverted posture, The vapor deposition material having the scattering path in the vicinity of the axial center portion is reflected to reduce the concentration of the vapor deposition material on the axial center portion, thereby making the vapor deposition distribution on the substrate P uniform.

また、放出孔1の入口面1aから反射部材51までの距離h1を、放出孔1の入口面1aの孔径Dの(2/3)倍以上とすることにより、基板Pへの蒸着分布をより均一化することができる。 Further, by setting the distance h1 from the entrance surface 1a of the discharge hole 1 to the reflecting member 51 to be not less than (2/3) times the hole diameter D of the entrance surface 1a of the discharge hole 1, the deposition distribution on the substrate P can be further increased. It can be made uniform.

なお、図1(c)(d)は放出孔1に開放テーパ部52c,62cを形成した変形例を示。この放出孔1は、入口面1aから距離h2の直円柱部52b,62bと、直円柱部52b,62bの上縁部から開放角αで出口面1bほど拡径される距離h3の漏斗状の開放テーパ部52c,62cとにより形成されている。これら変形例は、第1の実施の形態に比較して基板Pへの蒸着分布の均一性が向上される傾向が変わらず、反射部材51により同様の作用効果が得られることが確認されている。ここで、開放テーパ部52c,62cの軸心に対する傾斜角αは、図では、たとえば60°で示しているが、45°≦α≦75°が好適値である。 Incidentally, FIG. 1 (c) (d) is shows the modified example of forming the opening taper portion 52c, 62c to release holes 1. The release holes 1 is a straight cylindrical portion 52b of the distance h2 from the entrance face 1a, 62b and a straight cylindrical portion 52b, the distance h3 to be expanded as the exit surface 1b with an opening angle α from the upper edge of 62b funnel-shaped The open taper portions 52c and 62c are formed. In these modified examples, it is confirmed that the same effect can be obtained by the reflecting member 51 without changing the tendency to improve the uniformity of the vapor deposition distribution on the substrate P as compared with the first embodiment. . Here, the inclination angle α with respect to the axial center of the open taper portions 52c and 62c is shown as 60 ° in the figure, for example, but 45 ° ≦ α ≦ 75 ° is a preferable value.

(放出部の第2の実施の形態)
次に上記真空蒸着装置10、20に設けられた本発明に係る放出部の第2の実施の形態を図4,図5を参照して説明する。なお、第1の実施の形態と同一部材には、同一符号を付して説明を省略する。
(Second embodiment of discharge section)
Next, a second embodiment of the discharge portion according to the present invention provided in the vacuum evaporation apparatuses 10 and 20 will be described with reference to FIGS. Note that the same members as those in the first embodiment are denoted by the same reference numerals and description thereof is omitted.

図4(a)に示すように、この分散容器15,25に形成された放出孔1は、距離H(ここでは上面板52の厚み分)の円柱形に形成されており、放出孔1の軸心上で、基準面である入口面1aに一致する位置から下方(反基板 P側)に距離h4に頂部が位置する正立姿勢の反射部材61が設けられている。もちろん、図4(b)に示すように、放出孔1を、薄い板厚の上面板62に立設された円筒部材62aにより形成してもよい。   As shown in FIG. 4A, the discharge holes 1 formed in the dispersion containers 15 and 25 are formed in a columnar shape having a distance H (here, the thickness of the upper surface plate 52). On the axis, a reflecting member 61 in an upright posture is provided, the apex of which is located at a distance h4 downward (on the opposite side of the substrate P) from a position that coincides with the entrance surface 1a that is the reference surface. Of course, as shown in FIG. 4B, the discharge hole 1 may be formed by a cylindrical member 62a erected on the upper plate 62 having a thin plate thickness.

この反射部材61は、上端が頂部となる正立姿勢の無底円錐形で、錐形の錐辺外周面が反射面に構成されており、頂角βは図では90°で示されているが、頂角βは、75°〜105°の範囲が好適値であり、またβ=60°〜120°も有効である。また、図示していないが、反射部材61はたとえば上面板52から垂下されて放出孔1の軸心を中心とする放射方向に配置された支持板により取り付けられている。   The reflecting member 61 is a bottomless conical shape in an upright posture with the upper end at the top, and the outer peripheral surface of the cone-shaped cone side is formed as a reflecting surface, and the apex angle β is 90 ° in the figure. However, the apex angle β is preferably in the range of 75 ° to 105 °, and β = 60 ° to 120 ° is also effective. Although not shown, the reflecting member 61 is attached by a support plate that is suspended from the upper surface plate 52 and arranged in a radial direction centered on the axis of the discharge hole 1.

ここで、図5に、この反射部材61による分散効果をシミュレーションにより求めたグラフを示す。ここでは、比較のために、円板状の反射板と円錐状の反射部材61を用いた。円板状の反射板を用いた円板ケース1は、反射板の外径を1mmとし、放出孔1,1A〜1Cの基準となる入口面1aからの距離h4=−(1/3)D=−3mmとした(「−」は反基板P側を示す、Dは放出孔1の入口面の孔径)。また同円板ケース2は、反射板の外径を1mmとし、入口面1aからの距離h4=−(1/9)D=−1mmとした。さらに同円板ケース3は、反射板の外径を(1/3)D=3mmとし、入口面1aからの距離h4=−3mmとした。また反射部材61を用いた円錐ケースでは、底辺外径W1=5mmで第1の実施の形態と同様に形成され、入口面1aからの距離h4=−(1/3)D=−3mmの位置に配置した。ここで、放出孔1の孔径D=9mm、距離H=6mmである。またここで、図3の(a)および(b)の横軸と縦軸は図2と同様に表されている。 Here, the graph which calculated | required the dispersion | distribution effect by this reflective member 61 by simulation in FIG. 5 is shown. Here, for comparison, a disc-shaped reflecting plate and a conical reflecting member 61 were used. The disc case 1 using a disc-shaped reflector has an outer diameter of 1 mm and a distance h4 = − (1/3) D from the entrance surface 1a serving as a reference for the discharge holes 1, 1A to 1C. = −3 mm (“−” indicates the side opposite to the substrate P, D is the hole diameter of the inlet surface of the discharge hole 1 ). Further, in the same disk case 2, the outer diameter of the reflecting plate was set to 1 mm, and the distance h4 = − (1/9) D = −1 mm from the entrance surface 1a. Furthermore, in the same disc case 3, the outer diameter of the reflecting plate was set to (1/3) D = 3 mm, and the distance h4 from the entrance surface 1a was set to −3 mm. Further, the conical case using the reflecting member 61 is formed in the same manner as in the first embodiment with the base outer diameter W1 = 5 mm, and is located at a distance h4 = − (1/3) D = −3 mm from the entrance surface 1a. Arranged. Here, the hole diameter D of the discharge hole 1 is 9 mm, and the distance H is 6 mm. Here, the horizontal and vertical axes in FIGS. 3A and 3B are represented in the same manner as in FIG.

図5によれば、円板状の反射板を用いた円板ケース1〜3の場合、入口面1aからの距離h4を変化させても、基本ケースとほぼ同じであり、膜厚分布にあまり変化がない。しかし、円錐ケースの場合、放出部の第1形態に示した底辺外径W1=5mm、h1=6mmの均一性にまで及ばないものの、基本ケースに比較して、均一性を改善することができた。   According to FIG. 5, in the case of the disk cases 1 to 3 using the disk-shaped reflector, even if the distance h4 from the entrance surface 1a is changed, it is almost the same as the basic case, and the film thickness distribution is not much. no change. However, in the case of the conical case, although it does not reach the uniformity of the bottom outer diameter W1 = 5 mm and h1 = 6 mm shown in the first form of the discharge portion, the uniformity can be improved as compared with the basic case. It was.

上記実施の形態によれば、放出孔1の入口面1aから内側に、錐形の反射部材61を正立姿勢で設けることにより、放出孔1の軸心部近傍に飛散経路を有する蒸着材料を反射して軸心部への蒸着材料の集中度を低下させ、これにより基板Pへの蒸着分布を均一化することができる。   According to the above embodiment, the vapor deposition material having the scattering path in the vicinity of the axial center portion of the discharge hole 1 is provided by providing the conical reflection member 61 in an upright posture on the inner side from the entrance surface 1 a of the discharge hole 1. The concentration of the vapor deposition material on the axial center is reduced by reflection, so that the vapor deposition distribution on the substrate P can be made uniform.

また反射部材61の底辺の外径W1を、放出孔1の入口面1a孔径Dの(1/9)倍以上とすることにより、基板Pへの蒸着分布をより均一化することができる。
なお、図4(c)(d)は放出孔1を放出孔1に開放テーパ部52c,62cを形成した変形例を示し、入口面1aから距離h2の直円柱部52b,62bと、直円柱部52b,62bの上縁部から開放角αで出口面1bほど拡径される距離h3の漏斗状の開放テーパ部52c,62cを形成している。これら変形例は、第2の実施の形態に比較して基板Pへの蒸着分布の均一性が向上される傾向が変わらず、反射部材61により同様の作用効果が得られることが確認されている。ここで、開放テーパ部52c,62cの軸心に対する傾斜角αは、図では、たとえば60°で示しているが、45°≦α≦75°が好適値である。
Further, by setting the outer diameter W1 of the bottom side of the reflecting member 61 to be equal to or greater than (1/9) times the hole diameter D of the entrance surface 1a of the discharge hole 1, the deposition distribution on the substrate P can be made more uniform.
4 (c) and 4 (d) show a modification in which the discharge hole 1 is formed in the discharge hole 1 with open taper portions 52c and 62c, and the right circular cylinder portions 52b and 62b at a distance h2 from the inlet surface 1a, and the right circular cylinder. Funnel-shaped open taper portions 52c and 62c having a distance h3 whose diameter is increased from the upper edge portions of the portions 52b and 62b by the open angle α toward the exit surface 1b are formed. In these modified examples, it is confirmed that the same effect can be obtained by the reflecting member 61 without changing the tendency of improving the uniformity of the vapor deposition distribution on the substrate P as compared with the second embodiment . . Here, the inclination angle α with respect to the axial center of the open taper portions 52c and 62c is shown as 60 ° in the figure, for example, but 45 ° ≦ α ≦ 75 ° is a preferable value.

本発明に係る真空蒸着装置の放出部の第1の実施の形態を示し、(a)は第1の実施の形態を示す縦断面図、(b)は第1の実施の形態の変形例を示す縦断面図、(c)は第1の実施の形態の変形形態を示す縦断面図、(d)は変形形態の変形例を示す縦断面図である。The 1st Embodiment of the discharge | release part of the vacuum evaporation system which concerns on this invention is shown, (a) is a longitudinal cross-sectional view which shows 1st Embodiment, (b) is a modification of 1st Embodiment. FIG. 4C is a longitudinal sectional view showing a modification of the first embodiment, and FIG. 4D is a longitudinal sectional view showing a modification of the modification. 第1の実施の形態における反射部材の底辺外径の変化による膜厚分布を示し、(a)は縦軸に膜厚分布、横軸に放出孔の軸心からの半径と放出孔から基板までの距離との比を示したグラフ、(b)は縦軸に蒸着材料の付着個数、横軸を放出孔の軸心からの径と放出孔から基板までの距離との比を示したグラフである。The film thickness distribution by the change of the base outer diameter of the reflective member in 1st Embodiment is shown, (a) is a film thickness distribution on a vertical axis | shaft, the radius from the axis of an emission hole and the emission hole to a board | substrate on a horizontal axis. (B) is a graph showing the ratio between the number of deposition materials deposited on the vertical axis, the diameter from the axis of the discharge hole, and the distance from the discharge hole to the substrate. It is. 第1の実施の形態における反射部材の配置位置の変化による膜厚分布を示し、(a)は縦軸に膜厚分布、横軸に放出孔の軸心からの半径と、放出孔から基板までの距離との比を示したグラフ、(b)は縦軸に蒸着材料の付着個数、横軸に放出孔の軸心からの半径と放出孔から基板までの距離との比を示したグラフである。The film thickness distribution by the change of the arrangement position of the reflecting member in 1st Embodiment is shown, (a) is the film thickness distribution on a vertical axis | shaft, the radius from the axis of a discharge hole on a horizontal axis, and from a discharge hole to a board | substrate. (B) is a graph showing the ratio between the number of deposition materials deposited on the vertical axis and the radius from the axis of the discharge hole to the distance from the discharge hole to the substrate. is there. 本発明に係る真空蒸着装置の放出部の第2の実施の形態を示し、(a)は第2形態を示す縦断面図、(b)は第2の実施の形態の変形例を示す縦断面図、(c)は第2の実施の形態の他の変形形態を示す縦断面図、(d)は他の変形形態の変形例を示す縦断面図である。The 2nd Embodiment of the discharge | release part of the vacuum evaporation system which concerns on this invention is shown, (a) is a longitudinal cross-sectional view which shows 2nd form, (b) is a longitudinal cross-section which shows the modification of 2nd Embodiment. FIG. 4C is a longitudinal sectional view showing another modification of the second embodiment, and FIG. 4D is a longitudinal sectional view showing a modification of the other modification. 第2の実施の形態において、平板と錐形の反射部材を配置した時の膜厚分布を示し、(a)は縦軸に膜厚分布、横軸に放出孔の軸心からの半径と放出孔から基板までの距離との比を示したグラフ、(b)は縦軸に蒸着材料の付着個数、横軸に放出孔の軸心からの半径と放出孔から基板までの距離との比を示したグラフである。In 2nd Embodiment, thickness distribution when a flat plate and a cone-shaped reflecting member are arrange | positioned is shown, (a) is a film thickness distribution on a vertical axis | shaft, and the radius and discharge | release from the axial center of an emission hole are shown on a horizontal axis. (B) is a graph showing the ratio of the distance from the hole to the substrate, and (b) shows the ratio of the number of deposition materials deposited on the vertical axis and the radius from the axis of the discharge hole to the distance from the discharge hole to the substrate on the horizontal axis. It is the shown graph. 本発明に係る放出部を有する真空蒸着装置の第1形態を示す概略斜視図である。It is a schematic perspective view which shows the 1st form of the vacuum evaporation system which has the discharge | release part which concerns on this invention. 本発明に係る放出部を有する真空蒸着装置の第2形態を示す概略斜視図である。It is a schematic perspective view which shows the 2nd form of the vacuum evaporation system which has the discharge | release part which concerns on this invention. 本発明に係る放出部を有する真空蒸着装置の第3形態を示す側面図である。It is a side view which shows the 3rd form of the vacuum evaporation system which has a discharge | release part based on this invention. 本発明に係る放出部を有する真空蒸着装置の第4形態を示し、(a)は側面図、(b)は分散容器の縦断面図である。The 4th form of the vacuum evaporation system which has the discharge | release part which concerns on this invention is shown, (a) is a side view, (b) is a longitudinal cross-sectional view of a dispersion container.

1 放出孔
P 基板
10,20,30,40 真空蒸発装置
11,21,31 真空蒸発室
12,22,32A〜32C 蒸発容器
13,23,33A〜33C るつぼ
14,24,34A〜34C 移送ダクト
15,25,35A〜35C 分散容器
36B 中段接続ノズル
36C 下段接続ノズル
51,61 反射部材
52,62 上面板
62a 円筒部材
52b,62b 直円柱部
52c,62c 開放テーパ部
DESCRIPTION OF SYMBOLS 1 Release hole P Board | substrate 10,20,30,40 Vacuum evaporation apparatus 11,21,31 Vacuum evaporation chamber 12,22,32A-32C Evaporation container 13,23,33A-33C Crucible 14,24,34A-34C Transfer duct 15 , 25, 35A to 35C Dispersion vessel 36B Middle connection nozzle 36C Lower connection nozzle 51, 61 Reflective member 52, 62 Upper surface plate
62a cylindrical member 52b , 62b straight cylindrical part 52c , 62c open taper part

Claims (3)

蒸発された蒸着材料が導入される分散容器に、当該分散容器に対向して配置される被蒸着材に向かって蒸着材料を放出する放出孔を形成した真空蒸着装置の放出部構造であって、
放出孔の軸心上で放出孔の入口面から被蒸着材側に、放出孔の入口面の孔径より小径で、かつ入口面から外方に離れるほど大径となる錐形の反射面を有する倒立姿勢の反射部材を設け、
放出孔の入口面の孔径:D、放出孔の入口面から反射部材の頂部までの距離:h1とすると、
h1≧(2/3)Dとした
ことを特徴とする真空蒸着装置の放出部構造。
A discharge container structure of a vacuum evaporation apparatus in which a discharge hole for discharging a vapor deposition material is formed in a dispersion container into which evaporated vapor deposition material is introduced, and the vapor deposition material is discharged toward a material to be deposited facing the dispersion container,
A conical reflecting surface having a diameter smaller than the diameter of the entrance surface of the discharge hole and a larger diameter away from the entrance surface on the deposition target side from the entrance surface of the discharge hole on the axis of the discharge hole. Provide a reflective member in an inverted position,
When the hole diameter at the entrance surface of the discharge hole is D, and the distance from the entrance surface of the discharge hole to the top of the reflecting member is h1,
The discharge part structure of the vacuum evaporation apparatus characterized by satisfying h1 ≧ (2/3) D.
蒸発された蒸着材料が導入される分散容器に、当該分散容器に対向して配置される被蒸着材に向かって蒸着材料を放出する放出孔を形成した真空蒸着装置の放出部構造であって、
放出孔の軸心上で放出孔の入口面から反被蒸着材側に、放出孔の入口面の孔径より小径で、かつ入口面に接近するほど小径となる錐形の反射面を有する正立姿勢の反射部材を設けた
ことを特徴とする真空蒸着装置の放出部構造。
A discharge container structure of a vacuum evaporation apparatus in which a discharge hole for discharging a vapor deposition material is formed in a dispersion container into which evaporated vapor deposition material is introduced, and the vapor deposition material is discharged toward a material to be deposited facing the dispersion container,
An upright having a conical reflecting surface that is smaller in diameter than the diameter of the inlet surface of the discharge hole and closer to the inlet surface on the side opposite to the material to be deposited from the inlet surface of the discharge hole on the axis of the discharge hole An emission part structure of a vacuum vapor deposition apparatus, characterized in that a reflective member having a posture is provided.
放出孔は、円柱形、または直円柱部と当該直円柱部の上縁から拡径される開放テーパ部からなる漏斗形である
ことを特徴とする請求項1または2に記載の真空蒸着装置の放出部構造。
3. The vacuum evaporation apparatus according to claim 1 , wherein the discharge hole has a columnar shape or a funnel shape including a straight columnar portion and an open taper portion whose diameter is expanded from an upper edge of the right columnar portion . Emission part structure.
JP2008133709A 2008-05-22 2008-05-22 Emission part structure of vacuum evaporation system Expired - Fee Related JP5247239B2 (en)

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JP6941564B2 (en) * 2016-05-10 2021-09-29 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated Evaporation source for depositing evaporated material and method for depositing evaporated material
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