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JP5250286B2 - Tracking laser interferometer - Google Patents
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JP5250286B2 - Tracking laser interferometer - Google Patents

Tracking laser interferometer Download PDF

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JP5250286B2
JP5250286B2 JP2008084392A JP2008084392A JP5250286B2 JP 5250286 B2 JP5250286 B2 JP 5250286B2 JP 2008084392 A JP2008084392 A JP 2008084392A JP 2008084392 A JP2008084392 A JP 2008084392A JP 5250286 B2 JP5250286 B2 JP 5250286B2
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rotation mechanism
reference sphere
laser interferometer
cylindrical cover
wiring
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JP2009236746A (en
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尚之 武富
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Mitutoyo Corp
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Description

本発明は、追尾式レーザ干渉計に係り、特に、簡単な構成で、基準球支持部に配線の影響を与えることが無く、高精度の測定が可能な追尾式レーザ干渉計に関する。   The present invention relates to a tracking type laser interferometer, and more particularly to a tracking type laser interferometer having a simple configuration and capable of performing high-precision measurement without affecting the reference sphere support part.

特許文献1に記載されているように、図1に例示する如く、測定の基準を成す基準球10と、該基準球10を支持する基準球支持部12と、前記基準球10の周囲を2軸回転運動する、第一軸回転機構21及び第二軸回転機構22でなる回転機構部20と、該回転機構部20に搭載されたレーザ干渉測長機30とを有し、ターゲットとなる再帰的反射体(レトロリフレクタ)(例えばキャッツアイ)40からの戻り光の情報に基づきターゲットを追尾して、基準球10の中心座標を基準とし、回転機構部20に載ったレーザ干渉測長機30からの出射光と戻り光の光軸が平行となるレトロリフレクタ40との距離を測定する追尾式レーザ干渉計が知られている。図において、14は固定台である。   As described in Patent Document 1, as illustrated in FIG. 1, a reference sphere 10 that serves as a measurement reference, a reference sphere support 12 that supports the reference sphere 10, and a periphery of the reference sphere 10 are divided into two. A revolving mechanism 20 including a first axis rotating mechanism 21 and a second axis rotating mechanism 22 that rotate in a shaft, and a laser interference length measuring machine 30 mounted on the rotating mechanism 20, and a target recursion The target is tracked based on the information of the return light from a retroreflector (retroreflector) 40 (for example, a cat's eye) 40, and the laser interference length measuring machine 30 mounted on the rotation mechanism unit 20 is based on the center coordinates of the reference sphere 10. 2. Description of the Related Art A tracking type laser interferometer that measures a distance between a light beam emitted from a light beam and a retroreflector 40 in which the optical axes of return light beams are parallel is known. In the figure, 14 is a fixed base.

又、同様な追尾式レーザ干渉計(光軸偏向型レーザ干渉計とも称する)は、特許文献2〜4にも記載されている。   Similar tracking laser interferometers (also referred to as optical axis deflection laser interferometers) are also described in Patent Documents 2 to 4.

この種の追尾式レーザ干渉計では、出射光と戻り光の光軸のずれが所定の値(又は量)、又は所望の値(量)となるように回転機構部20を回転してレーザ干渉測長機30をレトロリフレクタ40の方向に向け、そのときの出射光と戻り光の干渉状態からレトロリフレクタ40までの距離を高精度に測定する。   In this type of tracking laser interferometer, the rotation mechanism unit 20 is rotated so that the deviation between the optical axes of the emitted light and the return light becomes a predetermined value (or amount) or a desired value (amount), thereby causing laser interference. The length measuring device 30 is directed toward the retroreflector 40, and the distance from the interference state between the outgoing light and the return light at that time to the retroreflector 40 is measured with high accuracy.

この追尾式レーザ干渉計では、第二軸回転機構22のモータ23やレーザ干渉測長機30は、第一軸回転機構21の回転側に配置されているので、各種信号配線50、モータ配線52、ファイバ線54等を、回転側から固定側(固定台14)まで導く必要がある。   In this tracking type laser interferometer, the motor 23 and the laser interferometer length measuring device 30 of the second axis rotation mechanism 22 are arranged on the rotation side of the first axis rotation mechanism 21, so that various signal wirings 50 and motor wirings 52 are provided. It is necessary to guide the fiber line 54 and the like from the rotation side to the fixed side (fixed base 14).

ドイツ特許出願DE202004007647U1号公開公報German patent application DE202004007647U1 特開昭63−231286号公報Japanese Patent Laid-Open No. 63-231286 特開2007−309677号公報JP 2007-309677 A 特開2007−057522号公報JP 2007-057522 A

図1に示す如く、回転側の各種信号配線50、モータ配線52、ファイバ線54を固定側(固定台14)に直接配線した場合、回転機構部20が回転するため、各種配線は十分な長さに設定する必要があり、図1に示したように配線が装置の外側に出てしまい、周りで作業する時の作業性が悪く、他装置等に配線が干渉したり、場合によっては、配線がターゲット(レトロリフレクタ40)まで出射されるレーザ光線を遮蔽してしまう等の問題点を有していた。   As shown in FIG. 1, when the signal wires 50, the motor wires 52, and the fiber wires 54 on the rotation side are directly wired to the fixed side (fixed base 14), the rotation mechanism 20 rotates. As shown in FIG. 1, the wiring goes out of the device, the workability when working around is bad, the wiring interferes with other devices, etc. There is a problem that the wiring shields the laser beam emitted to the target (retroreflector 40).

一方、装置内側のスペースに配線を通し、固定側に配線を導く方法も考えられる。この方法によれば、装置外側に配線されないため、上記のような問題は発生しない。しかし、この方法でも、回転機構部20が回転するので、各種配線は十分な長さに設定する必要があり、スペース内に配置された配線が移動してしまい、基準球支持部12に配線が直接接触し、配線による張力、摩擦力が、基準球支持部12に作用してしまう。すると、基準球支持部12が変形するため、基準球10が移動することになる。この配線による力は、再現性が無く、管理することが非常に困難である。又、この追尾式レーザ干渉計は、基準球10を中心に回転機構部20が回転しながらターゲット(レトロリフレクタ40)と基準球10との距離を測定するので、基準球10が移動すると、測定基準が移動することになり、測定精度が低下する。   On the other hand, a method of passing the wiring through the space inside the apparatus and guiding the wiring to the fixed side can be considered. According to this method, since the wiring is not performed outside the apparatus, the above problem does not occur. However, even in this method, since the rotation mechanism unit 20 rotates, it is necessary to set various wires to a sufficient length, and the wires arranged in the space move, and the wires are connected to the reference sphere support unit 12. The direct contact and the tension and frictional force due to the wiring act on the reference ball support portion 12. Then, since the reference sphere support 12 is deformed, the reference sphere 10 moves. The force due to this wiring is not reproducible and is very difficult to manage. Further, this tracking laser interferometer measures the distance between the target (retroreflector 40) and the reference sphere 10 while the rotation mechanism 20 rotates around the reference sphere 10, so that the measurement is performed when the reference sphere 10 moves. The reference moves and the measurement accuracy decreases.

その他の方法で、固定側と回転側の双方向に電気信号を供給することができるものとして、スリップリングがある。このスリップリングを用いれば、基準球の変動は無くなる。しかし、スリップリングは、回転リングとブラシが接触することで信号を伝送しているために、信号S/Nの低下、メンテナンスの課題がある。又、追尾式レーザ干渉計においては、多種の信号伝送が必要であるため、スリップリングが大きくなり、そのスペースが必要で装置が大きくなり、且つ、コストが高い、又、クロストーク発生などの多数の課題が発生する。   Another method that can supply an electric signal in both directions of the fixed side and the rotating side is a slip ring. If this slip ring is used, the fluctuation of the reference sphere is eliminated. However, since the slip ring transmits a signal by the contact between the rotating ring and the brush, there is a problem of a decrease in signal S / N and a problem of maintenance. In addition, since tracking laser interferometers require various signal transmissions, the slip ring is large, the space is required, the device is large, the cost is high, and there are many occurrences such as crosstalk. Issue arises.

本発明は、前記従来の問題点を解消するべくなされたもので、簡単な構成で、基準球支持部への配線による影響を無くし、高精度測定を可能とすることを課題とする。   The present invention has been made to solve the above-described conventional problems, and an object thereof is to eliminate the influence of wiring to the reference sphere support portion with a simple configuration and to enable high-precision measurement.

本発明は、固定台と、測定の基準を成す基準球と、該基準球を支持する、前記固定台上に配設された基準球支持部と、前記基準球の周囲を2軸回転運動する、前記固定台上に回転自在に配設された第一軸回転機構及び該第一軸回転機構上に回転自在に配設された第二軸回転機構でなる回転機構部と、該回転機構部に搭載されたレーザ干渉測長機を有し、ターゲットとなる再帰的反射体からの戻り光の情報に基づきターゲットを追尾して、基準球の中心座標を基準とし、回転機構部に載ったレーザ干渉測長機からの出射光と戻り光の光軸が平行となる再帰的反射体との距離を測定する追尾式レーザ干渉計において、前記第一軸回転機構の内周部を中空とし、該中空に、前記基準球支持部との隙間を介して筒状カバーを設け、該筒状カバーの外側と前記第一軸回転機構の内側の間、前記固定台から前記第二軸回転機構及び前記レーザ干渉測長機への配線が通過するようにして、前記課題を解決したものである。 The present invention provides a fixed base , a reference sphere that serves as a reference for measurement, a reference sphere support section that is disposed on the fixed base that supports the reference sphere, and rotates around the reference sphere in two axes. a rotation mechanism comprising a second axis turning mechanism rotatably disposed in the first axis turning mechanism and said uniaxial rotation mechanism on which is rotatably disposed on the fixed table, said rotary mechanism The laser interferometer is mounted on the laser and tracks the target based on the information of the return light from the recursive reflector as the target, and the laser mounted on the rotation mechanism section with reference to the center coordinates of the reference sphere in the tracking type laser interferometer in which the optical axis of the outgoing light and return light from the interferometer length measuring machine measures a distance between the recursive reflector formed of parallel, an inner peripheral portion of the first axis turning mechanism is a hollow, the hollow, tubular cover is provided through the gap between the reference sphere supporting portion, the outer cylindrical cover Between the inside of the first axis turning mechanism, as the wiring from the fixing base to the second axis turning mechanism and the laser interferometer length measuring machine passes, it is obtained by solving the above problems.

ここで、前記筒状カバーを2重とし、該筒状カバーの内側の空間、前記固定台から前記第二軸回転機構及び前記レーザ干渉測長機への配線が通過するようにすることができる。 Here, the cylindrical cover may be doubled so that the wiring from the fixed base to the second shaft rotating mechanism and the laser interference length measuring instrument passes through the space inside the cylindrical cover. it can.

本発明によれば、低価格な部品で、基準球支持部に対する各種配線、光ファイバ等の接触による張力や摩擦力による影響を無くして、高精度な測定が可能となる。又、配線が装置外側に大きくはみ出ることも無いため、作業スペースを拡大すると共に、他装置等との干渉も無くなり、信頼性の高い測定が可能となる。更に、スリップリングと比較すると、配線は有線であるため、各種信号間によるクロストークや信号劣化が無く、メンテナンスの必要も無く、信頼性の高い信号伝送が可能となる。   According to the present invention, it is possible to perform high-accuracy measurement with low-cost parts without the influence of tension or frictional force caused by contact of various wirings, optical fibers, or the like with respect to the reference sphere support. In addition, since the wiring does not protrude largely outside the apparatus, the work space is expanded and interference with other apparatuses is eliminated, so that highly reliable measurement is possible. Furthermore, compared with the slip ring, since the wiring is wired, there is no crosstalk or signal deterioration between various signals, no maintenance is required, and highly reliable signal transmission is possible.

以下図面を参照して、本発明の実施形態を詳細に説明する。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

本発明の第1実施形態は、図1と同様な追尾式レーザ干渉計において、図2に示す如く、本発明を第一軸回転機構21の外周部21Aが回転するタイプの追尾式レーザ干渉計に適用したもので、装置の基部(固定台14)に設置される第一軸回転機構21の内周部21Bを中空とし、該中空に基準球支持部12を設け、その外周部に、所望の隙間を有する円筒カバー60を設け、その外部に、回転側に設置された第二軸回転機構22、レーザ干渉測長機30、基準球10の表面とレーザ干渉測長機30間の距離を測定する変位計32からのモータ線・各種信号線70、ファイバ線・各種信号線72を通過させて、固定台14側のコネクタ80に導くようにしたものである。   The first embodiment of the present invention is a tracking laser interferometer similar to that shown in FIG. 1, and is a tracking laser interferometer of the type in which the outer peripheral portion 21A of the first shaft rotating mechanism 21 rotates as shown in FIG. The inner peripheral portion 21B of the first shaft rotation mechanism 21 installed in the base portion (fixing base 14) of the apparatus is made hollow, the reference ball support portion 12 is provided in the hollow, and the outer peripheral portion has a desired And a distance between the surface of the reference sphere 10 and the laser interference length measuring device 30 is set outside the second shaft rotation mechanism 22, the laser interference length measuring device 30 installed on the rotation side. The motor line / various signal lines 70 and the fiber line / various signal lines 72 from the displacement meter 32 to be measured are passed through and guided to the connector 80 on the fixed base 14 side.

ここで、第一軸回転機構21は、水平方向の回転で、方位方向に回転し、第二軸回転機構22は、仰角方向に回転する。   Here, the first axis rotation mechanism 21 rotates in the azimuth direction by horizontal rotation, and the second axis rotation mechanism 22 rotates in the elevation direction.

又、前記変位計32は、特許文献4に記載したように、レーザ干渉測長機30と基準球10の表面の距離を実測して、高精度の測定を可能とするためのものである。   The displacement meter 32 is for measuring the distance between the surface of the laser interferometer 30 and the reference sphere 10 as described in Patent Document 4 to enable high-precision measurement.

本実施形態では、第一回転軸機構21の方位方向の回転に対しては、内周部21Bの中空に設置された円筒カバー60のところで、配線の遊びが設けられ(円筒カバーに巻き付けるなどにより遊びを設ける)、内部で処理される。又、配線の外部に出ている部分で遊びを作り、第二軸回転機構22の仰角方向の回転に対応している。   In this embodiment, with respect to the rotation of the first rotating shaft mechanism 21 in the azimuth direction, a play of wiring is provided at the cylindrical cover 60 installed in the hollow of the inner peripheral portion 21B (by wrapping around the cylindrical cover, etc.) Provide play), processed inside. Further, a play is made at a portion outside the wiring, corresponding to the rotation of the second shaft rotation mechanism 22 in the elevation direction.

本実施形態によれば、回転機構部20が回転し、その中空内で各種配線が移動しても、円筒カバー60に配線が接触するため、配線の摩擦や張力は、円筒カバー60のみに影響を与える。従って、基準球支持部12に配線による影響が無くなり、基準球10の変動も無くなる。   According to the present embodiment, even if the rotation mechanism unit 20 rotates and various wirings move within the hollow space, the wiring contacts the cylindrical cover 60, so that the friction and tension of the wiring affects only the cylindrical cover 60. give. Therefore, the reference sphere support 12 is not affected by the wiring, and the reference sphere 10 is not changed.

次に、図3を参照して、本発明の第2実施形態を説明する。   Next, a second embodiment of the present invention will be described with reference to FIG.

本実施形態は、本発明を第一軸回転機構21の内周部21Bが回転するタイプの追尾式レーザ干渉計に適用したもので、第一軸回転機構21の外周部21Aが固定台14に固定されている点を除き、第1実施形態と同様であるので説明は省略する。   In the present embodiment, the present invention is applied to a tracking type laser interferometer in which the inner peripheral portion 21B of the first shaft rotating mechanism 21 rotates, and the outer peripheral portion 21A of the first shaft rotating mechanism 21 is attached to the fixed base 14. Since it is the same as that of 1st Embodiment except the point fixed, description is abbreviate | omitted.

次に、図4を参照して、本発明の第3実施形態を説明する。   Next, a third embodiment of the present invention will be described with reference to FIG.

本実施形態は、第2実施形態において、円筒カバーを第一軸回転機構21側にも設けた二重構造の円筒カバー62としたものである。   This embodiment is a double-structured cylindrical cover 62 in which the cylindrical cover is also provided on the first shaft rotating mechanism 21 side in the second embodiment.

本実施形態によれば、配線の回転部への接触を確実に防止できる。   According to this embodiment, the contact of the wiring with the rotating part can be reliably prevented.

前記実施形態は、いずれも、特許文献4に記載の追尾式レーザ干渉計と同様に、変位計32を設けてレーザ干渉測長機30と基準球10の表面の距離を実測しているので、高精度の測定が可能である。なお、用途によっては変位計32を省略することも可能である。   In any of the above embodiments, as with the tracking laser interferometer described in Patent Document 4, a displacement meter 32 is provided to measure the distance between the surface of the laser interferometer 30 and the reference sphere 10. High-precision measurement is possible. The displacement meter 32 may be omitted depending on the application.

又、前記実施形態においては、いずれも、駆動や案内方法は省略しているが、駆動ではベルト、摩擦、ダイレクトモータ方式等、案内では、転がり軸受、空気軸受等いろいろあるが、その方法を制限するものではない。カバーの断面形状も円形に限定されず、楕円形や矩形等、他の形状であってもよい。   In the above embodiments, the driving and guiding methods are omitted, but there are various belts, friction, direct motor methods, etc. for driving, rolling bearings, air bearings, etc. for guiding, but the methods are limited. Not what you want. The cross-sectional shape of the cover is not limited to a circle, and may be another shape such as an ellipse or a rectangle.

DE202004007647U1に記載された従来技術を示す断面図Sectional view showing the prior art described in DE202004007647U1 本発明の第1実施形態を示す断面図Sectional drawing which shows 1st Embodiment of this invention 同じく第2実施形態を示す断面図Sectional drawing which similarly shows 2nd Embodiment 同じく第3実施形態を示す断面図Sectional drawing which similarly shows 3rd Embodiment

符号の説明Explanation of symbols

10…基準球
12…基準球支持部
20…回転機構部
21…第一軸回転機構
22…第二軸回転機構
30…レーザ干渉測長機
40…レトロリフレクタ
60、62…円筒カバー
70、72…配線
DESCRIPTION OF SYMBOLS 10 ... Reference sphere 12 ... Reference sphere support part 20 ... Rotation mechanism part 21 ... 1st axis | shaft rotation mechanism 22 ... 2nd axis | shaft rotation mechanism 30 ... Laser interference length measuring machine 40 ... Retro reflector 60, 62 ... Cylindrical cover 70, 72 ... wiring

Claims (2)

固定台と、測定の基準を成す基準球と、該基準球を支持する、前記固定台上に配設された基準球支持部と、前記基準球の周囲を2軸回転運動する、前記固定台上に回転自在に配設された第一軸回転機構及び該第一軸回転機構上に回転自在に配設された第二軸回転機構でなる回転機構部と、該回転機構部に搭載されたレーザ干渉測長機を有し、
ターゲットとなる再帰的反射体からの戻り光の情報に基づきターゲットを追尾して、基準球の中心座標を基準とし、回転機構部に載ったレーザ干渉測長機からの出射光と戻り光の光軸が平行となる再帰的反射体との距離を測定する追尾式レーザ干渉計において、
前記第一軸回転機構の内周部を中空とし、
該中空に、前記基準球支持部との隙間を介して筒状カバーを設け、
該筒状カバーの外側と前記第一軸回転機構の内側の間、前記固定台から前記第二軸回転機構及び前記レーザ干渉測長機への配線が通過することを特徴とする追尾式レーザ干渉計。
A fixed base, a reference sphere which forms a reference of measurement, supporting the reference sphere, the fixed bench disposed a reference sphere supporting portion, biaxially rotational motion around the reference sphere, the fixing base A rotation mechanism portion comprising a first shaft rotation mechanism rotatably disposed on the first shaft rotation mechanism and a second shaft rotation mechanism rotatably disposed on the first shaft rotation mechanism, and mounted on the rotation mechanism portion Have a laser interferometer,
The target is tracked based on the information of the return light from the recursive reflector as a target, and the light emitted from the laser interference length measuring machine mounted on the rotation mechanism unit and the light of the return light with reference to the center coordinates of the reference sphere. In a tracking laser interferometer that measures the distance to a retroreflector whose axes are parallel,
The inner peripheral portion of the first axis turning mechanism and a hollow,
In the hollow, a cylindrical cover is provided via a gap with the reference sphere support,
A tracking type laser characterized in that wiring from the fixed base to the second axis rotation mechanism and the laser interference length measuring instrument passes between the outside of the cylindrical cover and the inside of the first axis rotation mechanism. Interferometer.
前記筒状カバーが2重とされ、該筒状カバーの内側の空間、前記固定台から前記第二軸回転機構及び前記レーザ干渉測長機への配線が通過することを特徴とする請求項1に記載の追尾式レーザ干渉計。 The cylindrical cover is doubled, and wiring from the fixed base to the second shaft rotation mechanism and the laser interferometer is passed through a space inside the cylindrical cover. 2. The tracking type laser interferometer according to 1.
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