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JP5298664B2 - Shape measuring device - Google Patents
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JP5298664B2 - Shape measuring device - Google Patents

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JP5298664B2
JP5298664B2 JP2008168715A JP2008168715A JP5298664B2 JP 5298664 B2 JP5298664 B2 JP 5298664B2 JP 2008168715 A JP2008168715 A JP 2008168715A JP 2008168715 A JP2008168715 A JP 2008168715A JP 5298664 B2 JP5298664 B2 JP 5298664B2
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shape measuring
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康一 脇谷
聡裕 巣之内
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Panasonic Corp
Panasonic Holdings Corp
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Matsushita Electric Industrial Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a shape measuring device which enables attainment of image information different in a focal plane in a short time, without continuous and mechanical driving of a measuring object. <P>SOLUTION: A light quantity sensor 2 includes sensor elements 2a-2d in a one-dimensional direction. The sensor elements 2a-2d are made to form focuses Va, Vb, Vc and Vd at heights Ha, Hb, Hc and Hd near a measuring line 12 of the measuring object 1 by an optical system (not shown). The surface 13 of the measuring object 1 is colored black and white dividedly by coating and the sensor elements 2a-2d and the optical system are moved to scan in the direction from a region Y1 to a region Y8 of the measuring object 1. A light quantity value of each sensor element is read out at the time and recorded together with the position thereof. The light quantity value of each sensor element corresponds to black 13b or white 13w of the surface color when the focus is formed on the surface 13 of the measuring object 1 while having a value of gray made up of black and white mixed together when the focus is not formed thereon. By evaluating formation of the focus as to the heights Ha-Hd from these light quantity values of the black, white and gray, the height as to each region Y is identified. <P>COPYRIGHT: (C)2010,JPO&amp;INPIT

Description

本発明は、被測定物の表面の高さ形状を精密、かつ高速に測定する装置であって、特にプラズマディスプレイパネルのリブ高さ検査や集積回路の電極検査など大面積で微小な高さ測定をより高速で行う形状測定装置に関するものである。   The present invention is an apparatus for measuring the height and shape of the surface of an object to be measured accurately and at high speed, and in particular, measuring a small area and a small height such as a rib height inspection of a plasma display panel and an electrode inspection of an integrated circuit. The present invention relates to a shape measuring apparatus that performs the above at a higher speed.

従来の被測定物の高さ測定方法には、共焦点測定方式,三角測距方式,光切断方式,合焦方式などがある。   Conventional methods for measuring the height of an object to be measured include a confocal measurement method, a triangulation method, a light cutting method, and a focusing method.

この中の共焦点測定方式は、対物レンズの像側焦点位置にピンホールを設置した光学系を持ち、対物レンズが合焦する際に1つのピンホールを通過する光の量が最も大きくなることを利用して対象物の変位を計測する。   The confocal measurement method has an optical system with a pinhole at the image side focal position of the objective lens, and the amount of light passing through one pinhole is the largest when the objective lens is in focus. Measure the displacement of the object using.

この共焦点測定方式には、被測定物の反射率や表面状態の影響を受けにくいという長所があるが、対物レンズまたは被測定物を上下に動かす機構が必要であること、1回の計測で被測定物上の1点の情報しか得られず、面的な高さ情報を得るために計測点を走査する必要があるなどの理由により、計測に要する時間が長いという欠点がある。   This confocal measurement method has the advantage that it is not easily affected by the reflectivity and surface condition of the object to be measured. However, it requires an objective lens or a mechanism to move the object to be measured up and down. Only one point of information on the object to be measured can be obtained, and there is a disadvantage that the time required for measurement is long because it is necessary to scan the measurement point in order to obtain planar height information.

また、三角測距方式は対象物に集光させた照明を照射し、その反射光の一部を受光レンズでセンサーに結像させる。この対象物が変位すると反射光の集光する角度が変化し、センサー上の結像位置が移動することになる。これをとらえることで対象物の変位を計測する。この方式は可動部がないため高速な測定が可能であるという長所があるが、被測定物の反射率や表面状態,傾きなどによって測定精度が劣化しやすいという欠点がある。   Further, in the triangulation system, illumination focused on an object is irradiated, and a part of the reflected light is imaged on a sensor by a light receiving lens. When this object is displaced, the angle at which the reflected light is collected changes, and the imaging position on the sensor moves. By capturing this, the displacement of the object is measured. This method has the advantage that high-speed measurement is possible because there is no moving part, but has the disadvantage that the measurement accuracy tends to deteriorate due to the reflectivity, surface condition, inclination, etc. of the object to be measured.

光切断方式は三角測距方式の一種であり、対象物に集光させる照明をライン状とし、受光センサーに2次元センサーを用いることで、被測定物の変位をライン状にとらえるようにしたものである。   The light cutting method is a type of triangular distance measuring method, and the illumination to be focused on the object is in the form of a line, and the two-dimensional sensor is used as the light receiving sensor, so that the displacement of the object to be measured is captured in a line. It is.

合焦方式は、焦点の異なる複数枚の画像について画像処理的な手法で合焦度合いの評価を行うことで、画像に含まれる対象物の変位を計測する手法である(非特許文献1参照)。そして、被測定物の凹凸が大きい場合でも正しく測定でき、画像に含まれる複数の位置の高さ情報が1回の計測で得られるという長所があるが、一般に対物レンズまたは被測定物を上下に動かす機構が必要である。   The focusing method is a method of measuring the displacement of an object included in an image by evaluating the degree of focusing on a plurality of images with different focal points by an image processing method (see Non-Patent Document 1). . And even when the unevenness of the object to be measured is large, it is possible to measure correctly, and there is an advantage that the height information of a plurality of positions included in the image can be obtained by one measurement. Generally, the objective lens or the object to be measured is moved up and down. A moving mechanism is necessary.

これに対し、例えば光路に挿入した平行平板を順次回転させて切り替える等の方法によって光学的光路長を変えることで焦点面を高速に変位させるなどの工夫が提案されているが(特許文献1参照)、光路長の変化が不連続であること、光学素子が切り替わる期間は受光素子が不感帯となることなどの課題がある。   On the other hand, for example, a device has been proposed in which the focal plane is displaced at high speed by changing the optical optical path length by, for example, sequentially rotating and switching parallel plates inserted in the optical path (see Patent Document 1). ), The change in the optical path length is discontinuous, and the light receiving element becomes a dead zone during the period when the optical element is switched.

また、いずれの方法も焦点面を変位させるために機械的な駆動が必要であり、さらに測定の間は光学系を被測定物に対して静止させておかねばならない。
特開平8−304043号公報 石原満宏,佐々木博美,「合焦法による高速3次元形状計測」,精密工学会誌 vol.63,No.1,1997,pp124
In any of the methods, mechanical driving is required to displace the focal plane, and the optical system must be stationary with respect to the object to be measured during the measurement.
Japanese Patent Laid-Open No. 8-304043 Mitsuhiro Ishihara, Hiromi Sasaki, "High-speed 3D shape measurement by focusing method", Journal of Precision Engineering vol.63, No.1, 1997, pp124

しかしながら、このような従来の技術は、焦点面を変位させるために機械的な動作を伴うことから、動作速度を高めにくいという欠点がある。また従来の技術では、計測の際は光学系の観測位置を静止させる必要があることから、計測に要する時間を短縮することが困難であるという問題がある。   However, such a conventional technique has a drawback that it is difficult to increase the operation speed because it involves a mechanical operation to displace the focal plane. In addition, the conventional technique has a problem that it is difficult to reduce the time required for measurement because the observation position of the optical system needs to be stationary during measurement.

本発明は、前記従来技術の問題を解決するものであり、被測定物の連続的に焦点面の異なる画像情報を短時間で得られる安価な形状測定装置を提供することを目的とする。   SUMMARY OF THE INVENTION The present invention solves the above-described problems of the prior art, and an object thereof is to provide an inexpensive shape measuring apparatus that can obtain image information of continuously measuring objects having different focal planes in a short time.

前記の目的を達成するために、本発明に係る請求項1に記載した形状測定装置は、高さが同一の平面内に黒い領域と白い領域とを有する被測定物の表面の像を結像するための光学系と、前記被測定物の高さの異なる表面にそれぞれ対応する焦点面に配置した複数個の光量センサーと、前記被測定物の表面を前記光学系で走査するための駆動系と、前記複数個の光量センサーから得られる前記黒い領域及び前記白い領域にそれぞれ対応した電気信号を処理して合焦評価を行うことで合焦点を検出し、前記合焦点から前記被測定物の表面の形状を測定する信号処理部と、を備え、前記高さが同一の平面内において、前記被測定物を走査する方向に対して前記黒い領域の前または後ろに前記白い領域が配置されていることを特徴とする。 In order to achieve the above object, the shape measuring apparatus according to claim 1 of the present invention forms an image of the surface of an object to be measured having a black region and a white region in a plane having the same height. An optical system for scanning, a plurality of light quantity sensors arranged on focal planes corresponding to different surfaces of the object to be measured, and a drive system for scanning the surface of the object to be measured by the optical system And detecting the focal point by processing the electrical signals respectively corresponding to the black region and the white region obtained from the plurality of light quantity sensors and performing the focus evaluation, and from the focal point, the object to be measured is detected. A signal processing unit for measuring the shape of the surface , wherein the white area is disposed in front of or behind the black area in a direction in which the object to be measured is scanned in a plane having the same height. and said that you are.

前記構成によれば、被測定物に対して連続的に画像情報を得ることができ、また機械的に駆動することなく焦点面の異なる画像情報を得られることから測定時間を短縮することができる。   According to the above configuration, it is possible to obtain image information continuously with respect to the object to be measured, and it is possible to obtain image information with different focal planes without mechanical driving, thereby shortening the measurement time. .

本発明によれば、従来の方法に比較して、被測定物に対して静止することなく連続的に焦点面の異なる画像情報が得られることから、形状測定の時間を短縮することができるという効果を奏する。   According to the present invention, compared to the conventional method, image information having different focal planes can be obtained continuously without being stationary with respect to the object to be measured, so that the time for shape measurement can be shortened. There is an effect.

以下、図面を参照して本発明における実施の形態を詳細に説明する。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

(実施の形態1)
最初に、本実施の形態1の装置構成と、その動作について説明する。
(Embodiment 1)
First, the apparatus configuration and operation of the first embodiment will be described.

図1は本発明の実施の形態1における形状測定装置の全体構成を示すブロック図であり、図2は測定の際の動作を説明する図である。図2に示すように、被測定物1の異なる高さの表面における点A11a,点B11bは光学系のレンズ32により異なる空間(点A’21a,点B’21b)に焦点を結ぶ。この焦点近傍の空間に複数個の光量センサー2(センサー素子2a,2b)を配置する。図2に示す例では2個である。それぞれのセンサー素子2a、センサー素子2bは被測定物1の表面の点A11a、点B11bそれぞれの焦点におかれている。また、照明に関わる光学系はすべて省略している。   FIG. 1 is a block diagram showing the overall configuration of the shape measuring apparatus according to Embodiment 1 of the present invention, and FIG. 2 is a diagram for explaining the operation during measurement. As shown in FIG. 2, the points A11a and B11b on the surface of the object to be measured 1 having different heights are focused on different spaces (points A'21a and B'21b) by the lens 32 of the optical system. A plurality of light quantity sensors 2 (sensor elements 2a and 2b) are arranged in a space near the focal point. In the example shown in FIG. Each sensor element 2a and sensor element 2b is placed at the focal point of each of the points A11a and B11b on the surface of the DUT 1. Also, all the optical systems related to illumination are omitted.

図2の矢印方向に駆動系4(図1参照)を作動させて、被測定物1の表面を走査するとき、センサー素子2aは点A11aの高さがHaのときのみ波形Wa1のような変動する電気信号を出力する。同様にセンサー素子2bは点B11bの高さがHbのときのみ波形Wb1のような電気信号を出力する。各センサー素子が焦点を結ぶ点に位置しないとき、波形Wa2,Wb2のように出力の変動は少ない。   When the drive system 4 (see FIG. 1) is operated in the direction of the arrow in FIG. 2 to scan the surface of the object 1 to be measured, the sensor element 2a changes only like the waveform Wa1 when the height of the point A11a is Ha. Output electrical signals. Similarly, the sensor element 2b outputs an electrical signal like the waveform Wb1 only when the height of the point B11b is Hb. When each sensor element is not located at a focal point, the output fluctuation is small as in the waveforms Wa2 and Wb2.

これは光量センサーが合焦点にないときは、ぼやけて平均化された光量が入るため出力の変動が小さくなるからである。センサー素子2aとセンサー素子2bは、それぞれ高さHa、高さHbのみを検出することになる。そして、より多くの高さを検出するためには、多くの光量センサーを配置することにより、被測定物1上における複数の高さを細かく知ることができる。光量センサー(各センサー素子)からの出力電気信号は信号処理部により処理することで高さを同定する。   This is because when the light quantity sensor is not in focus, the fluctuation in the output is small because the light quantity that is blurred and averaged enters. The sensor element 2a and the sensor element 2b detect only the height Ha and the height Hb, respectively. And in order to detect more height, by arranging many light quantity sensors, it is possible to know a plurality of heights on the DUT 1 in detail. The output electric signal from the light quantity sensor (each sensor element) is processed by a signal processing unit to identify the height.

この光量センサーから得られた情報によって、領域ごとに合焦の度合いを評価するための画像処理の手法にはいくつかの方法が用いられる。例えば、最大最小法、平均差二乗和法(分散法)、平均差絶対値和法、差分絶対値総和法、差分二乗総和法などがあげられる。   Several methods are used as an image processing method for evaluating the degree of focusing for each region based on information obtained from the light quantity sensor. For example, a maximum-minimum method, an average difference square sum method (dispersion method), an average difference absolute value sum method, a difference absolute value sum method, a difference square sum method, and the like can be given.

続いて、本実施の形態1で得られた測定結果の処理方法について説明する。   Next, a method for processing the measurement results obtained in the first embodiment will be described.

以下に合焦の度合いを評価するための画像処理の手法の詳細を示す。ここでは、座標(x,y)の光量情報をi(x,y)とする。   Details of an image processing method for evaluating the degree of focusing will be described below. Here, the light amount information of the coordinates (x, y) is i (x, y).

まず、最大最小法EDRGとは領域内の値の最大値と最小値の差を合焦評価値とするものであり、下記式(数1)として定義する。 First, the maximum / minimum method EDRG uses the difference between the maximum value and the minimum value in the region as the focus evaluation value, and is defined as the following equation (Equation 1).

Figure 0005298664
平均差二乗和法EVARとは領域内の光量の代表的値と、各光量センサーの値との差の二乗和を合焦評価値とする方法である。領域内の光量の代表値として相加平均である、下記式(数2)を用いる。
Figure 0005298664
The average difference square sum method E VAR is a method in which the sum of squares of the difference between the representative value of the light quantity in the region and the value of each light quantity sensor is used as the focus evaluation value. The following equation (Equation 2), which is an arithmetic mean, is used as a representative value of the amount of light in the region.

Figure 0005298664
また、平均差二乗和を、下記式(数3)として定義する。
Figure 0005298664
The mean square sum of differences is defined as

Figure 0005298664
これは一般に標本分散として知られる値である。また二乗の代わりに絶対値を用いてもよく、これを平均差絶対値和法EVRSと呼び、下記式(数4)と定義する。
Figure 0005298664
This is a value commonly known as sample variance. Moreover, you may use an absolute value instead of a square, and this is called the average difference absolute value sum method EVRS, and is defined by the following formula | equation (Formula 4).

Figure 0005298664
また代表値として、相加平均のほかにさまざまな要約統計量を用いることができ、例えば相乗平均である、下記式(数5)を用いてもよい。
Figure 0005298664
In addition to the arithmetic mean, various summary statistics can be used as the representative value. For example, the following formula (Equation 5) which is a geometric mean may be used.

Figure 0005298664
このほか、中央値や最頻値などを用いてもよい。
Figure 0005298664
In addition, a median value or a mode value may be used.

差分絶対値総和法ESADとは、空間上で異なる位置における光量値との差の絶対値の総和として定義する。絶対値の代わりに二乗を用いてもよく(差分二乗総和法)、その場合の評価値をESSDと呼ぶ。いずれも、差分を算出する相手との空間上の位置関係をdxおよびdyとして、下記式(数6)と定義する。 The difference absolute value summation method ESAD is defined as the sum of absolute values of differences from light quantity values at different positions in space. A square may be used instead of the absolute value (difference square summation method), and the evaluation value in this case is called E SSD . In both cases, the positional relationship in space with the partner whose difference is to be calculated is defined as dx and dy as follows:

Figure 0005298664
dxおよびdyの値は被測定物の表面状態や光学分解能によって選択する。
Figure 0005298664
The values of dx and dy are selected according to the surface state of the object to be measured and the optical resolution.

なお、ここにあげた算出方法によって得られた評価値はすべて数値が大きいほど合焦の程度が大きいことを示すが、もちろん算出方法によっては合焦の程度が大きいほど数値が小さくなるようなものも考えられる。   The evaluation values obtained by the calculation methods listed here all indicate that the greater the numerical value, the greater the degree of focusing.Of course, depending on the calculation method, the larger the degree of focusing, the smaller the numerical value. Is also possible.

この光量センサーから得た9つの出力値により最大最小法、平均差二乗和法(分散法)、平均差絶対値和法、差分絶対値総和法、差分二乗総和法を用いた具体的な2つの例を図3に示す。   Based on the nine output values obtained from this light quantity sensor, two specific methods using the maximum / minimum method, the average difference sum of squares method (dispersion method), the average difference absolute value sum method, the difference absolute value sum method, and the difference square sum method are used. An example is shown in FIG.

以降の説明では便宜的に、文中において特段の注記のない限り評価値の数値が大きいほど合焦の程度が大きい評価方法をとるものとした。ここで、合焦評価は光量センサーから得られた複数の情報をもとに行うことから、得られた光量値よりも合焦評価値の方が情報の空間密度が低い。合焦評価の方法やパラメータが同じであれば、より正確な合焦評価値を得るためには光量センサーから得られた光量値をより多く用いればよいが、それに伴って合焦評価値の空間密度が低下する。合焦評価値の空間密度の低下を防ぐためには、より少ない数の光量値を用いて正確な合焦評価ができる合焦評価手法を選択する必要がある。   In the following description, for the sake of convenience, unless there is a special note in the text, the evaluation method is assumed to have a greater degree of focus as the evaluation value is larger. Here, since the focus evaluation is performed based on a plurality of pieces of information obtained from the light quantity sensor, the focus evaluation value has a lower spatial density of information than the obtained light quantity value. If the focus evaluation method and parameters are the same, in order to obtain a more accurate focus evaluation value, more light quantity values obtained from the light quantity sensor may be used. Density decreases. In order to prevent a reduction in the spatial density of the focus evaluation value, it is necessary to select a focus evaluation method capable of performing accurate focus evaluation using a smaller number of light quantity values.

図4では、光学系(レンズ32)の開口数をより高めることで、信号処理により適した電気信号を光量センサー2から得ることができる。一般に光学系の合焦する範囲Dは、光学系の開口数をNAとすると、下記式(数7)なる関係を持つ。   In FIG. 4, an electrical signal more suitable for signal processing can be obtained from the light quantity sensor 2 by further increasing the numerical aperture of the optical system (lens 32). In general, the in-focus range D of the optical system has a relationship represented by the following formula (Expression 7), where NA is the numerical aperture of the optical system.

Figure 0005298664
そのため、開口数を高めることにより光学系(レンズ32)の合焦する範囲がより狭くなる。これにより、より小さい焦点面の変位によって、より大きな電気信号の変化が得られるようになる。
Figure 0005298664
Therefore, by increasing the numerical aperture, the focusing range of the optical system (lens 32) becomes narrower. This allows a greater change in electrical signal due to smaller focal plane displacement.

また、光学系(レンズ32)の倍率や、被測定物1を照明する方法について、被測定物1の表面状態に応じて適切に選択すると、より信号処理に適した電気信号を得られる場合がある。例えば、斜め方向から照明を照射するといった方法がある。   Further, if the magnification of the optical system (lens 32) and the method of illuminating the device under test 1 are appropriately selected according to the surface state of the device under test 1, an electrical signal more suitable for signal processing may be obtained. is there. For example, there is a method of irradiating illumination from an oblique direction.

実際に被測定物から得られた光量値を用いて、本実施の形態1で示した各種の合焦評価手法を比較した結果を(表1)に示す。   Table 1 shows the result of comparing the various focus evaluation methods shown in the first embodiment using the light amount value actually obtained from the object to be measured.

Figure 0005298664
(表1)より、差分絶対値総和法において、dx,dyのパラメータを「1」とした場合に最も評価値の変化割合が大きくなっていることがわかる。例えば、表面粗さが3μm程度の表面を持つ被測定物の表面20μm四方を、開口数0.46で空間分解能が1μm程度となるような倍率を持つ対物レンズを用いて、1μmおきに撮像する。
Figure 0005298664
From Table 1, it can be seen that, in the difference absolute value summation method, when the dx and dy parameters are set to “1”, the change rate of the evaluation value is the largest. For example, a 20 μm square surface of an object having a surface with a surface roughness of about 3 μm is imaged every 1 μm using an objective lens having a magnification such that the numerical aperture is 0.46 and the spatial resolution is about 1 μm. .

光量センサーから得られる出力電気信号は20点×20点の計400点であるが、これをサンプリングして得られた光量数値に対して、評価関数として差分絶対値総和法を用いて合焦評価値を算出した結果、合焦位置から1μm変位させたときに、評価値が5%程度の変化を示した。変位がないときの評価値の変動は3σで3%程度であったため、1μmの変位を充分に検出できた。   The output electric signal obtained from the light amount sensor is 20 points × 20 points in total, which is 400 points. Focus evaluation by using the difference absolute value summation method as an evaluation function for the light amount value obtained by sampling this. As a result of calculating the value, the evaluation value showed a change of about 5% when displaced by 1 μm from the in-focus position. Since the fluctuation of the evaluation value when there was no displacement was about 3% at 3σ, a displacement of 1 μm could be sufficiently detected.

ここで光量センサーに、例えば1次元方向に複数のセンサー素子を配列させたものを用いる。それぞれのセンサー素子が異なる高さに焦点を結ぶように傾斜させてセンサー素子を配置する。センサー素子の傾斜は、被測定物の高さに応じて決定する。例えば、被測定物が100μmの凹凸を持つ場合には、焦点面の傾斜は100μmよりも大きくしなければならない。   Here, for example, a light amount sensor having a plurality of sensor elements arranged in a one-dimensional direction is used. The sensor elements are arranged so as to be inclined so that each sensor element is focused at a different height. The inclination of the sensor element is determined according to the height of the object to be measured. For example, when the object to be measured has an unevenness of 100 μm, the inclination of the focal plane must be larger than 100 μm.

図5はセンサー素子を1次元方向に配列した様子を示す図である。光学系(レンズ32)によって、光量センサー2のセンサー素子2a〜センサー素子2fが、それぞれ被測定物1の位置Pa〜位置Pfにおける高さHa〜高さHfに焦点を結んでいる。このような配置は、一般的に使われているCCDやMOSなど半導体の1次元イメージセンサーが利用できるため簡単かつ安価に装置を構成することができる。   FIG. 5 is a diagram showing a state in which sensor elements are arranged in a one-dimensional direction. By the optical system (lens 32), the sensor elements 2a to 2f of the light quantity sensor 2 are focused on the height Ha to the height Hf at the position Pa to the position Pf of the object 1 to be measured, respectively. Such an arrangement makes it possible to construct a device simply and inexpensively because a commonly used semiconductor one-dimensional image sensor such as a CCD or MOS can be used.

以下に1次元方向に複数のセンサー素子を配列した場合の動作について説明する。図6(a)の斜視図に示すように、光量センサー2としてセンサー素子2a〜2dを1次元方向に4つ備えた装置を例とする。光量センサー2のセンサー素子2a〜2dは光学系(煩雑になるので図示せず)によって、それぞれ被測定物1の計測線12近傍の高さHa,Hb,Hc,Hdに焦点Va,Vb,Vc,Vdを結ぶよう構成されている。   The operation when a plurality of sensor elements are arranged in the one-dimensional direction will be described below. As shown in the perspective view of FIG. 6A, an apparatus including four sensor elements 2a to 2d in the one-dimensional direction as the light quantity sensor 2 is taken as an example. The sensor elements 2a to 2d of the light quantity sensor 2 are focused on heights Ha, Hb, Hc, and Hd near the measurement line 12 of the object to be measured 1 by an optical system (not shown because it is complicated). , Vd.

また、被測定物1の表面13は、実際には図6(c)に示すごとく黒白に塗り分けられているが、煩雑になるため図6(a)の被測定物1には表面の色を描いていない。ここでセンサー素子2a,2b,2c,2dと光学系を図6(a)の被測定物1の領域Y1から領域Y8の方向に向かって図6(b)の矢印の方向に移動走査する。時刻が進む度に各センサー素子から光量値を読み出し、その値を位置とともに記録する。   In addition, the surface 13 of the device under test 1 is actually painted black and white as shown in FIG. 6C, but the surface color of the device under test 1 in FIG. Not drawn. Here, the sensor elements 2a, 2b, 2c, 2d and the optical system are moved and scanned in the direction of the arrow in FIG. 6B from the area Y1 of the DUT 1 to the area Y8 in FIG. 6A. As the time advances, the light amount value is read from each sensor element, and the value is recorded together with the position.

各センサー素子から得られる光量値は、被測定物1の表面13に合焦していれば表面の色に応じて、黒13bまたは白13wに対応する値を持つ。被測定物1の表面13に合焦していなければ、各センサー素子からは黒と白が混ざり合った灰色に相当する値を持つ。光量センサーにより記録された光量値を図7(a)〜(c)に示す。   The light quantity value obtained from each sensor element has a value corresponding to black 13b or white 13w depending on the color of the surface if the surface 13 of the DUT 1 is in focus. If the surface 13 of the DUT 1 is not focused, each sensor element has a value corresponding to gray in which black and white are mixed. The light amount values recorded by the light amount sensor are shown in FIGS.

図7(a)に示すように、最初にセンサー素子2dが領域Y1にさしかかったときの時刻をT1、また最後にセンサー素子2aが領域Y8を走査する時刻をT14とする。その間の時刻を順にT2〜T13とする。時刻の間隔は必ずしも等しいとは限らない。黒,白,灰色はそれぞれセンサー素子から得られた光量値を示す。斜線で示した部分は、センサー素子が被測定物に当たらない位置関係にあることを示し、この部分は処理に無関係である。   As shown in FIG. 7A, the time when the sensor element 2d first approaches the area Y1 is T1, and the time when the sensor element 2a scans the area Y8 is T14. The time between them is set to T2 to T13 in order. The time intervals are not necessarily equal. Black, white, and gray indicate light intensity values obtained from the sensor elements. The hatched portion indicates that the sensor element is in a positional relationship where it does not hit the object to be measured, and this portion is irrelevant to the processing.

なお、図6(a)は図7(a)の時刻T7における位置関係を描いたものである。センサー素子2a〜2dは各々の高さHa〜Hdに対応する。また各センサー素子が領域Y1〜Y8を通過した時刻をもとに位置と時刻をセンサー素子ごとに対応させる。この結果を図7(b)に示す。この結果に対し、さらに高さHa〜Hdそれぞれの情報列について合焦評価を行った結果を図7(c)に示す。   FIG. 6 (a) depicts the positional relationship at time T7 in FIG. 7 (a). The sensor elements 2a to 2d correspond to the respective heights Ha to Hd. Further, the position and time are associated with each sensor element based on the time when each sensor element passes through the regions Y1 to Y8. The result is shown in FIG. FIG. 7C shows the result of focusing evaluation performed on the information strings of the heights Ha to Hd.

図7(c)において黒く示した部分は合焦していないことを、白く示した部分は合焦していることをそれぞれ示す。これより、それぞれの領域Yについて、その高さを同定できる。例えば、領域Y1近傍については高さHaが最も合焦していることがわかる。このようにして被測定物1の表面13の計測線12に沿った形状を再現できる。   In FIG. 7C, the portion shown in black indicates that it is not in focus, and the portion shown in white indicates that it is in focus. Thus, the height of each region Y can be identified. For example, it can be seen that the height Ha is most focused in the vicinity of the region Y1. Thus, the shape along the measurement line 12 of the surface 13 of the DUT 1 can be reproduced.

なお、ここでは被測定物1を固定して光量センサー2を動かす方法を説明したが、被測定物1を動かして光量センサー2を固定してもよいし、光量センサー2と被測定物1を両方とも動かしてもよい。またここでは、便宜的に説明の処理をいくつかのステップに分割したが、必ずしもこのように処理を分割して行う必要はない。   Here, the method of moving the light quantity sensor 2 while fixing the object to be measured 1 has been described. However, the light quantity sensor 2 may be fixed by moving the object to be measured 1, or the light quantity sensor 2 and the object to be measured 1 may be fixed. Both may be moved. In addition, here, the process of explanation is divided into several steps for convenience, but it is not always necessary to divide the process in this way.

この光学系の倍率は計測視野の短辺方向のサイズにより決定する。本方式における計測精度は、倍率ではなく主に光学系の開口数によって決定される。合焦評価を行うためには、被測定物1の表面13に存在する凹凸を光量の変化としてとらえる必要があることから被測定物1の表面状態と光量センサー2のサイズに応じて光学系の倍率を決定する。例えば、被測定物1の表面13が1μm程度の粗さを持つ場合は、これをとらえるためには、これより高い分解能が得られるよう倍率を選択する。また走査方向の情報密度は光量センサーからのデータ読み出し頻度と走査速度によって決まるが、これも同様に被測定物1の表面13の構造に応じて決定すればよく、必ずしも視野の短辺方向の分解能と一致させる必要はない。   The magnification of this optical system is determined by the size of the measurement visual field in the short side direction. The measurement accuracy in this method is determined not by the magnification but mainly by the numerical aperture of the optical system. In order to perform in-focus evaluation, the unevenness present on the surface 13 of the object to be measured 1 needs to be captured as a change in the amount of light. Determine the magnification. For example, when the surface 13 of the DUT 1 has a roughness of about 1 μm, in order to capture this, the magnification is selected so that a higher resolution can be obtained. The information density in the scanning direction is determined by the frequency of reading data from the light quantity sensor and the scanning speed, but this may be determined according to the structure of the surface 13 of the object 1 to be measured, and the resolution in the short side direction of the field of view is not necessarily required. There is no need to match.

また、高さ方向の測定レンジは1次元方向の光量センサー2の長さおよびピッチと焦点面の傾斜の程度で決まる。測定レンジを増加させるためにはセンサー素子の個数を増やしたり、1次元方向の光量センサー2上の受光素子をより粗に配置したり、焦点面の傾斜の程度を強めるなどすればよい。高さ方向の測定分解能は高さ方向の測定レンジをセンサー素子の個数で割ったものであるから、分解能を高めるためには、焦点面の傾斜の程度を小さくしたり、1次元方向の光量センサー2上の受光素子の間隔を不均一にし、分解能を高める箇所により密に配置したりすればよい。   The measurement range in the height direction is determined by the length and pitch of the light quantity sensor 2 in the one-dimensional direction and the degree of inclination of the focal plane. In order to increase the measurement range, the number of sensor elements may be increased, the light receiving elements on the light quantity sensor 2 in the one-dimensional direction may be arranged more roughly, or the degree of inclination of the focal plane may be increased. The measurement resolution in the height direction is obtained by dividing the measurement range in the height direction by the number of sensor elements. Therefore, in order to increase the resolution, the degree of inclination of the focal plane is reduced, or the light quantity sensor in the one-dimensional direction. The intervals between the light receiving elements on 2 may be non-uniform, and the light receiving elements may be arranged more densely in places where the resolution is improved.

(実施の形態2)
本発明の実施の形態2は、前述の実施の形態1で用いた光量センサー2を2次元のものに置き換えて、1回の走査によって被測定物1の面での高さ測定を可能としたものである。例えば、4×8素子で構成(センサー素子2as1〜8、2bs1〜8、2cs1〜8、2ds1〜8)される2次元光量センサー2sを用い、図8(a),(b)に示すような被測定物1を走査した例を示す。また、図8においても光学系は描いていない。
(Embodiment 2)
In the second embodiment of the present invention, the light quantity sensor 2 used in the first embodiment is replaced with a two-dimensional sensor, and the height of the object to be measured 1 can be measured by one scan. Is. For example, as shown in FIGS. 8A and 8B, a two-dimensional light quantity sensor 2s configured with 4 × 8 elements (sensor elements 2as1 to 8, 2bs1 to 8, 2cs1 to 8, 2ds1 to 8) is used. The example which scanned the to-be-measured object 1 is shown. Also, the optical system is not drawn in FIG.

実施形態1でした説明と同様に、被測定物1の表面には模様14として、図8(b)示すような黒白の模様がついている。煩雑になるのを防ぐため、図8(a)にはこの模様を描いていない。   Similar to the description in the first embodiment, the surface of the DUT 1 has a black and white pattern as the pattern 14 as shown in FIG. In order to prevent complication, this pattern is not drawn in FIG.

図8(a)において、2次元光量センサー2sを4素子(行センサー素子2a,2b,2c,2d)からなる第1方向と、8素子(列センサー素子s1〜s8)からなる第2方向とする。第2方向と直交する方向へ2次元光量センサー2sを走査し測定する。被測定物1の表面を走査する方向と平行な方向をそれぞれ領域Y1〜Y8とする。行センサー素子2a〜2dはそれぞれ異なる高さHa〜Hdを走査し、列センサー素子s1〜s9はそれぞれ異なる領域X1〜X8を走査する。これは実施の形態1における1次元の光量センサー2が8組(すなわち、s1(2a,2b,2c,2d)〜s8(2a,2b,2c,2d))あるのと本質的に同じである。   In FIG. 8A, the two-dimensional light quantity sensor 2s has a first direction composed of four elements (row sensor elements 2a, 2b, 2c, 2d) and a second direction composed of eight elements (column sensor elements s1 to s8). To do. The two-dimensional light quantity sensor 2s is scanned and measured in a direction orthogonal to the second direction. The directions parallel to the direction of scanning the surface of the DUT 1 are defined as regions Y1 to Y8, respectively. The row sensor elements 2a to 2d scan different heights Ha to Hd, and the column sensor elements s1 to s9 scan different areas X1 to X8, respectively. This is essentially the same as the eight-dimensional one-dimensional light quantity sensor 2 in the first embodiment (that is, s1 (2a, 2b, 2c, 2d) to s8 (2a, 2b, 2c, 2d)). .

各センサー素子から得られる電気信号を時系列に表したものを図9に示す。図9において、黒,白,灰色,斜線の各意味は実施の形態1と同様である。黒,白は被測定物1の表面模様14に光学系が合焦しており、その位置における被測定物1の表面の色がそれぞれ黒,白であったことを示す。灰色は被測定物1の表面に光学系が合焦していないことを示す。斜線は光学系が被測定物1をとらえていないことを示す。   FIG. 9 shows a time series of electrical signals obtained from each sensor element. In FIG. 9, the meanings of black, white, gray, and diagonal lines are the same as those in the first embodiment. Black and white indicate that the optical system is focused on the surface pattern 14 of the DUT 1 and the color of the surface of the DUT 1 at that position is black and white, respectively. Gray indicates that the optical system is not focused on the surface of the DUT 1. The oblique lines indicate that the optical system does not capture the object 1 to be measured.

図9の時刻T1のとき、センサー素子2ds1〜8が領域Y1に達する。同様に、時刻T7のときセンサー素子2as1〜8が領域Y1に達する。図8(a)は時刻T7における位置関係を描いたものである。列センサー素子s1〜s8は被測定物1の領域X1〜X8と対応する。時刻Tと走査方向の領域Yの関係は既知なので、これを用いて時刻Tと領域Yが対応する。   At time T1 in FIG. 9, the sensor elements 2ds1 to 8 reach the region Y1. Similarly, at time T7, the sensor elements 2as1 to 8 reach the region Y1. FIG. 8A depicts the positional relationship at time T7. The column sensor elements s1 to s8 correspond to the regions X1 to X8 of the DUT 1. Since the relationship between the time T and the region Y in the scanning direction is known, the time T corresponds to the region Y using this.

これにより、図10に示すように情報を並べ替えることができる。さらに、高さHa〜Hdについて情報を整理すれば、図11に示すように高さHごとに領域X−Yに関する2次元的な光量情報が得られる。この情報に対して領域ごとに合焦評価を算出した結果を図12に示す。これより、領域ごとの高さが同定され、被測定物1の形状が得られる。得られた形状の情報を図13に示す。   Thereby, information can be rearranged as shown in FIG. Furthermore, if the information on the heights Ha to Hd is arranged, two-dimensional light quantity information on the area XY can be obtained for each height H as shown in FIG. FIG. 12 shows the result of calculating the focus evaluation for each area for this information. Thereby, the height for each region is identified, and the shape of the DUT 1 is obtained. The obtained shape information is shown in FIG.

(実施の形態3)
前述の実施の形態1において少し説明したが、光量センサー2のセンサー素子を増やすことにより(すなわち特定焦点位置に光量センサー2を密に配置することより)多くの高さレベルを検出することができる(高さ分解能をあげることができる)。そこで、本発明の実施の形態3は、図14に示すように、図5における光量センサー2のセンサー素子2fを3つに分割(2f−1,2f−2,2f−3)した例を示している。この例では高さHeと高さHfを3分割(Hf1,Hf2,Hf3)した分解能で高さHfの周りに3レベル検出することができる。
(Embodiment 3)
As described in the first embodiment, a large number of height levels can be detected by increasing the number of sensor elements of the light quantity sensor 2 (that is, by densely arranging the light quantity sensors 2 at a specific focal position). (The height resolution can be increased). Therefore, Embodiment 3 of the present invention shows an example in which the sensor element 2f of the light quantity sensor 2 in FIG. 5 is divided into three (2f-1, 2f-2, 2f-3) as shown in FIG. ing. In this example, three levels can be detected around the height Hf with a resolution obtained by dividing the height He and the height Hf into three (Hf1, Hf2, Hf3).

また、本実施の形態3の応用として、より高い高さ分解能が被測定物1の特定の高さで必要な場合には図15に示すような光量センサー2のセンサー素子配置ができる。すなわち、特定の焦点位置近傍で隣同士であるセンサー素子の位置差を小さくする。特定の焦点位置でセンサー素子を密に配置するのである。   Further, as an application of the third embodiment, when a higher height resolution is required at a specific height of the DUT 1, a sensor element arrangement of the light quantity sensor 2 as shown in FIG. That is, the position difference between adjacent sensor elements in the vicinity of a specific focal position is reduced. The sensor elements are densely arranged at a specific focal position.

図15に示す場合は、光量センサー2のセンサー素子2a〜2c、センサー素子2g〜2iの高さ分解能はセンサー素子2d〜2fのそれより高い。ここで、分解能の上限は主に光学系(レンズ32)の被写界深度と、合焦評価に使える光量値の情報量との評価手法によって決まる。被写界深度は浅いほど高い分解能が実現できる。また、被写界深度は光学系の開口数によって変化し、開口数が大きいほど被写界深度が浅くなる。   In the case shown in FIG. 15, the height resolution of the sensor elements 2a to 2c and sensor elements 2g to 2i of the light quantity sensor 2 is higher than that of the sensor elements 2d to 2f. Here, the upper limit of the resolution is mainly determined by the evaluation method of the depth of field of the optical system (lens 32) and the information amount of the light amount value that can be used for focusing evaluation. The lower the depth of field, the higher the resolution. The depth of field varies depending on the numerical aperture of the optical system, and the larger the numerical aperture, the shallower the depth of field.

例えば、開口数が0.46の受光光学系を用い、空間分解能を1μm程度に設定し、被測定物1の表面20μm角を走査して得られた20点×20点、すなわち400点の光量値情報を用いて合焦評価を行った結果、高さ方向の分解能の上限は0.5μm程度であった。このとき、前述した実施の形態1で説明した差分絶対値総和法を合焦評価に用いた。   For example, using a light receiving optical system having a numerical aperture of 0.46, setting the spatial resolution to about 1 μm, and scanning the surface of the DUT 1 20 μm square, 20 points × 20 points, that is, 400 points of light quantity As a result of focusing evaluation using value information, the upper limit of the resolution in the height direction was about 0.5 μm. At this time, the difference absolute value summation method described in the first embodiment was used for focusing evaluation.

(実施の形態4)
本発明の実施の形態4は、前述の実施の形態3のように高さ分解能を部分的にあげたり下げたりすることを、直線的に焦点位置を変えた光量センサーを用いても可能としたものである。図16に示すように、光学系の光学素子34を設けたことによって、光学的に焦点位置を直線的ではなく歪ませることで行う。これにより、高さHa〜高さHiの合焦位置は、等間隔でない刻みで配置されることになる。
(Embodiment 4)
In the fourth embodiment of the present invention, it is possible to partially increase or decrease the height resolution as in the above-described third embodiment even by using a light amount sensor in which the focal position is linearly changed. Is. As shown in FIG. 16, by providing the optical element 34 of the optical system, the focal position is optically distorted instead of linear. Thereby, the in-focus positions of the height Ha to the height Hi are arranged at intervals not equal to each other.

(実施の形態5)
本発明の実施の形態5は、実施の形態1で説明した1次元方向の光量センサー2(図6参照)を用いた場合と同様に、実施の形態2に示したような二次元光量センサー2s(図8参照)を用いた場合においても、図16の光学素子34を用いた手段によって高さ分解能を部分的にあげたり下げたりすることが可能である。もちろん、センサー素子を傾斜させて配置させる方法と本方法を併用することもできる。
(Embodiment 5)
In the fifth embodiment of the present invention, the two-dimensional light quantity sensor 2s as shown in the second embodiment is used, similarly to the case where the one-dimensional light quantity sensor 2 (see FIG. 6) described in the first embodiment is used. Even when (see FIG. 8) is used, the height resolution can be partially increased or decreased by means using the optical element 34 of FIG. Of course, this method can be used in combination with a method in which the sensor elements are arranged at an inclination.

光量センサーの感度が高いほど、また応答速度が速いほど、高速に被測定物1の表面を走査することができる。また、実施の形態3に記載した構成を実現するにあたっては、センサー受光面を曲面にできる構造を有していることが望ましい。このような観点から、光量センサーとして光電子増倍管、マイクロチャンネルプレート、イメージインテンシファイアなどの光電子増倍機能を有する素子を用いるのもよい。これらの素子は一般にCCDやMOSなど半導体を用いたイメージセンサーと比べて感度を高めてもノイズの発生が少なく、また平面上のみならず曲面に配列させることがより容易なためである。   The higher the sensitivity of the light quantity sensor and the faster the response speed, the faster the surface of the DUT 1 can be scanned. In order to realize the configuration described in the third embodiment, it is desirable that the sensor light receiving surface has a curved surface. From such a viewpoint, an element having a photomultiplier function such as a photomultiplier tube, a microchannel plate, or an image intensifier may be used as the light amount sensor. This is because these elements generally generate less noise even when the sensitivity is higher than that of an image sensor using a semiconductor such as a CCD or MOS, and are easier to arrange on a curved surface as well as on a flat surface.

本発明に係る形状測定装置は、被測定物に対して静止することなく連続的に情報を得るとともに、機械的な駆動なしに焦点面の異なる画像情報が得られることから、大面積で高速に微細な3次元形状の検査が必要な分野に用いることができ、またシート状の対象物などを連続的に搬送している途上などで、被測定物を静止させずに表面の立体形状を測定することが求められる用途にも有用である。   The shape measuring apparatus according to the present invention continuously obtains information without being stationary with respect to the object to be measured, and obtains image information with different focal planes without mechanical driving. It can be used in fields that require inspection of fine three-dimensional shapes, and measures the three-dimensional shape of the surface without stopping the object to be measured, such as during the continuous conveyance of sheet-like objects. It is also useful for applications that need to be done.

実施の形態1における形状測定装置の全体構成を示すブロック図FIG. 3 is a block diagram showing the overall configuration of the shape measuring apparatus in the first embodiment. 実施の形態1の測定の動作を説明する図The figure explaining the operation | movement of the measurement of Embodiment 1. 光量センサーから得た出力値による最大最小法、平均差二乗和法(分散法)、平均差絶対値和法、差分絶対値総和法、差分二乗総和法の具体的な例を示す図The figure which shows the concrete example of the maximum minimum method by the output value obtained from the light quantity sensor, the average difference sum of squares method (dispersion method), the average difference absolute value sum method, the difference absolute value summation method, and the difference square summation method 実施の形態1の形状測定装置の構成と原理の説明図Explanatory drawing of the configuration and principle of the shape measuring apparatus of the first embodiment 実施の形態1の1次元方向に配列したセンサー素子を示す図The figure which shows the sensor element arranged in the one-dimensional direction of Embodiment 1. (a)実施の形態1の形状測定の動作を説明する斜視図、(b)実施の形態1の形状測定の動作を説明する側面図、(c)実施の形態1の形状測定の動作を説明する被測定物の表面を示す図(A) A perspective view for explaining the shape measurement operation of the first embodiment, (b) a side view for explaining the shape measurement operation of the first embodiment, and (c) for explaining the shape measurement operation of the first embodiment. Showing the surface of the object to be measured (a)実施の形態1の光量センサーにより記録された光量値を示す図、(b)実施の形態1の光量センサーにより記録された光量値を示す図、(c)実施の形態1の光量センサーにより記録された光量値を示す図(A) The figure which shows the light quantity value recorded by the light quantity sensor of Embodiment 1, (b) The figure which shows the light quantity value recorded by the light quantity sensor of Embodiment 1, (c) The light quantity sensor of Embodiment 1 Showing the light intensity value recorded by (a)実施の形態2における形状測定の動作を説明する斜視図、(b)実施の形態2における形状測定の動作を説明する被測定物の表面を示す図(A) The perspective view explaining the shape measurement operation in Embodiment 2, (b) The figure which shows the surface of the to-be-measured object explaining the shape measurement operation in Embodiment 2 実施の形態2の光量センサーにより時系列に記録された光量値を示す図The figure which shows the light quantity value recorded in time series by the light quantity sensor of Embodiment 2. FIG. 実施の形態2の光量センサーの並べ替えた光量値を示す図The figure which shows the light quantity value which the light quantity sensor of Embodiment 2 rearranged 実施の形態2の光量センサーの高さごとの値を示す図The figure which shows the value for every height of the light quantity sensor of Embodiment 2. 実施の形態2の光量センサーの情報に対して領域ごとに合焦評価を算出した結果を示す図The figure which shows the result of having calculated the focus evaluation for every area | region with respect to the information of the light quantity sensor of Embodiment 2. 実施の形態2の光量センサーから得られた形状の情報を示す図The figure which shows the information of the shape obtained from the light quantity sensor of Embodiment 2. 実施の形態3における光量センサーの高さ分解能をあげる方法を示す図The figure which shows the method of raising the height resolution of the light quantity sensor in Embodiment 3. 実施の形態3の光量センサーの高さ分解能をあげる別の方法を示す図The figure which shows another method which raises the height resolution of the light quantity sensor of Embodiment 3. 実施の形態4における光学素子により光量センサーの高さ分解能を変える方法を示す図The figure which shows the method of changing the height resolution of a light quantity sensor with the optical element in Embodiment 4.

符号の説明Explanation of symbols

1 被測定物
2 光量センサー
2a,2b,2c,2d,2e,2f,2g,2i センサー素子
2f−1,2f−2,2f−3 センサー素子
3 光学系
4 駆動系
5 制御部
11a 点A
11b 点B
12 計測線
13 表面
13b 黒
13w 白
14 模様
21a 点A’
21b 点B’
31 光源
32 レンズ
33 ミラー
34 光学素子
DESCRIPTION OF SYMBOLS 1 Measured object 2 Light quantity sensor 2a, 2b, 2c, 2d, 2e, 2f, 2g, 2i Sensor element 2f-1, 2f-2, 2f-3 Sensor element 3 Optical system 4 Drive system 5 Control part 11a Point A
11b Point B
12 Measurement line 13 Surface 13b Black 13w White 14 Pattern 21a Point A '
21b Point B '
31 Light source 32 Lens 33 Mirror 34 Optical element

Claims (8)

高さが同一の平面内に黒い領域と白い領域とを有する被測定物の表面の像を結像するための光学系と、
前記被測定物の高さの異なる表面にそれぞれ対応する焦点面に配置した複数個の光量センサーと、
前記被測定物の表面を前記光学系で走査するための駆動系と、
前記複数個の光量センサーから得られる前記黒い領域及び前記白い領域にそれぞれ対応した電気信号を処理して合焦評価を行うことで合焦点を検出し、前記合焦点から前記被測定物の表面の形状を測定する信号処理部と、を備え、
前記高さが同一の平面内において、前記被測定物を走査する方向に対して前記黒い領域の前または後ろに前記白い領域が配置されている
ことを特徴とする形状測定装置。
An optical system for forming an image of the surface of the object to be measured having a black area and a white area in the same plane ;
A plurality of light quantity sensors arranged on focal planes corresponding to different surfaces of the object to be measured,
A drive system for scanning the surface of the object to be measured with the optical system;
Focusing is detected by performing an in-focus evaluation by processing electrical signals respectively corresponding to the black region and the white region obtained from the plurality of light quantity sensors, and the surface of the object to be measured is detected from the in-focus point. A signal processing unit for measuring the shape,
The shape measuring apparatus according to claim 1 , wherein the white region is arranged in front of or behind the black region with respect to a direction in which the measurement object is scanned in a plane having the same height .
前記光量センサーから得られる信号差分の絶対値総和の大きさにより合焦点を検出することを特徴とする請求項1記載の形状測定装置。   The shape measuring apparatus according to claim 1, wherein the focal point is detected based on a magnitude of a sum of absolute values of signal differences obtained from the light quantity sensor. 前記被測定物は前記黒い領域と前記白い領域とに塗り分けられていることを特徴とする請求項1または2記載の形状測定装置。 The shape measuring apparatus according to claim 1, wherein the object to be measured is separately applied to the black area and the white area . 前記複数個の光量センサーが配置された方向と、被測定物を走査する方向が一致していることを特徴とする請求項3記載の形状測定装置。   4. The shape measuring apparatus according to claim 3, wherein a direction in which the plurality of light quantity sensors are arranged coincides with a direction in which the object to be measured is scanned. 前記被測定物は、該被測定物を走査する方向と垂直な面及び該垂直な面と直交する水平な面のみから形成されたことを特徴とする請求項1〜4のいずれか1項に記載の形状測定装置。 The object to be measured, to any one of claims 1-4, characterized in that it is formed of only a horizontal plane perpendicular to the direction perpendicular to the plane and the vertical plane for scanning the該被measured The shape measuring apparatus described. 前記高さが同一の平面は黒い領域と白い領域とのみから形成されたことを特徴とする請求項1〜5のいずれか1項に記載の形状測定装置。 The shape measuring apparatus according to claim 1, wherein the planes having the same height are formed only from a black region and a white region . 記複数個の光量センサーは、それぞれの鉛直下方の領域を撮像することを特徴とする請求項〜6のいずれか1項に記載の形状測定装置。 Before SL plurality of light amount sensors, the shape measuring apparatus according to any one of claims 1-6, characterized in that for imaging the region of the respective vertically downward. 光量センサーが、光電子増倍機能を備えた素子を用いたことを特徴とする請求項1〜7のいずれか1項に記載の形状測定装置。   The shape measuring apparatus according to claim 1, wherein the light quantity sensor uses an element having a photomultiplier function.
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