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JP5324145B2 - Compound analyzer and program for compound analyzer - Google Patents
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JP5324145B2 - Compound analyzer and program for compound analyzer - Google Patents

Compound analyzer and program for compound analyzer Download PDF

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JP5324145B2
JP5324145B2 JP2008175388A JP2008175388A JP5324145B2 JP 5324145 B2 JP5324145 B2 JP 5324145B2 JP 2008175388 A JP2008175388 A JP 2008175388A JP 2008175388 A JP2008175388 A JP 2008175388A JP 5324145 B2 JP5324145 B2 JP 5324145B2
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孝予 平松
博生 相模
慎太郎 駒谷
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Toyota Motor Corp
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Description

この発明は、FTIR法によって試料の化合物に係る組成分析を行う化合物分析装置等に関するものであり、特にXRF法による分析を同時に行うことのできる分析装置等に関するものである。   The present invention relates to a compound analyzer that performs composition analysis on a compound of a sample by an FTIR method, and more particularly to an analyzer that can simultaneously perform an analysis by an XRF method.

従来、X線と赤外線とを同一試料に照射し、試料分析を行う装置として、特許文献1〜4に示すものが知られている。例えば特許文献1には、X線と赤外線を試料の同一位置に対して同時に照射したとき、試料において発生する二次及び反射赤外線をそれぞれX線検出器及び赤外線検出器によって検出し、これら検出器の出力を二次X線信号処理部及びFTIR信号処理部によってそれぞれ処理する構成の装置が記載されている。
特開2000−258340 特開2001−13095 特開2008−39522 特開平10−182802
Conventionally, devices shown in Patent Documents 1 to 4 are known as devices for performing sample analysis by irradiating the same sample with X-rays and infrared rays. For example, in Patent Document 1, when X-rays and infrared rays are simultaneously irradiated to the same position of a sample, secondary and reflected infrared rays generated in the sample are detected by an X-ray detector and an infrared detector, respectively. The apparatus has a configuration in which each of the outputs is processed by the secondary X-ray signal processing unit and the FTIR signal processing unit, respectively.
JP 2000-258340 A JP 2001-13095 A JP2008-39522 JP-A-10-182802

しかしながら、前記各文献記載の装置は、単に2つの手法による試料分析を同一試料に対して施すだけであり、装置入れ替えなどの手間を省くことはできるが、各分析方法を単独で施したときの分析上生じる問題点までも解決するものではない。   However, the devices described in the above-mentioned documents merely perform sample analysis by the two methods on the same sample, and can save time and effort such as device replacement. It does not solve problems that arise in analysis.

例えば、FTIR分析では、化合物間の干渉やクエンチングなどが生じるうえ、ピークが近似する化合物の有効な分離が難しいため、試料の組成が全く未知の場合などに誤った分析結果を出力する恐れがあるし、二次X線のスペクトルによる分析では、化合物の組成、特に構造が複雑な有機化合物の組成特定が困難であるという問題点があるが、前記各文献記載の装置では、このような単独分析での問題点は依然残されたままである。   For example, in FTIR analysis, interference between compounds occurs, quenching, etc., and effective separation of compounds whose peaks are close is difficult, so there is a risk of outputting incorrect analysis results when the composition of the sample is completely unknown. In addition, in the analysis based on the secondary X-ray spectrum, there is a problem that it is difficult to specify the composition of the compound, particularly the composition of the organic compound having a complicated structure. Analytical issues still remain.

そこで本発明は、上記問題点を解決し、FTIR法とXRF法とを組み合わせることによって、それぞれを単独で用いたときに生じる分析上の問題点を、相互の分析結果を互いに参照することで解決し、試料の化合物組成をより精度良く判別するとともに、その際の使い勝手をも向上することをその主たる所期課題としたものである。   Therefore, the present invention solves the above-mentioned problems and solves the analytical problems that occur when each of them is used alone by combining the FTIR method and the XRF method by referring to each other's analysis results. In addition, the main intended task is to determine the compound composition of the sample with higher accuracy and to improve the usability at that time.

すなわち本発明に係る化合物分析装置は、FTIR法によって試料を測定した結果にピークサーチマッチングを施してこれを分析し、当該試料を構成する化合物組成の候補を1又は複数抽出するFTIR分析部と、XRF法によって前記試料を測定した結果にピークサーチマッチングを施してこれを分析し、当該試料を構成する元素組成の候補を1又は複数抽出するXRF分析部と、前記FTIR分析部とXRF分析部とによる候補抽出結果を照合し、FTIR分析部で抽出された各候補に対して試料組成としての妥当性を示す妥当性評価値をそれぞれ算出する評価部と、を具備していることを特徴とするものである。   That is, the compound analyzer according to the present invention performs peak search matching on the result of measuring a sample by the FTIR method, analyzes this, and extracts one or a plurality of compound composition candidates constituting the sample; The result of measuring the sample by the XRF method is subjected to peak search matching and analyzed, and an XRF analysis unit that extracts one or a plurality of element composition candidates constituting the sample, the FTIR analysis unit, the XRF analysis unit, And an evaluation unit that calculates validity evaluation values indicating the validity of the sample composition for each candidate extracted by the FTIR analysis unit. Is.

このようなものであれば、前記FTIR分析部による候補抽出結果とXRF分析部による候補抽出結果とを照合し、相互の分析結果に生じている矛盾等を考慮して各組成候補の妥当性評価値を算出するので、従来のようなFTIR単独での分析に比べて遙かに組成判別精度がよく、確からしい分析結果を自動的に得ることができる。また、この結果、組成が全く未知の試料に対しても、有効な分析結果を得ることが可能になる。   If this is the case, the candidate extraction result by the FTIR analysis unit and the candidate extraction result by the XRF analysis unit are collated, and the validity evaluation of each composition candidate is performed in consideration of inconsistencies and the like occurring in the mutual analysis results. Since the value is calculated, the composition discrimination accuracy is much better than in the conventional FTIR alone analysis, and a probable analysis result can be obtained automatically. As a result, an effective analysis result can be obtained even for a sample whose composition is completely unknown.

より好ましくは、前記評価部が、XRF分析部で抽出された各候補に対しても、試料組成としての妥当性を示す妥当性評価値をそれぞれ算出するようにしてもよい。   More preferably, the evaluation unit may calculate a validity evaluation value indicating validity as a sample composition for each candidate extracted by the XRF analysis unit.

本発明の効果が特に顕著となるのは、前記化合物が有機物の場合であり、XRF法による分析結果と照合することにより、FTIR法で測定された組成判定ミスを有効に排除できる。   The effect of the present invention is particularly remarkable when the compound is an organic substance, and the composition determination error measured by the FTIR method can be effectively eliminated by collating with the analysis result by the XRF method.

ユーザの使い勝手の観点から言えば、前記評価部で算出された妥当性評価値に基づいて、FTIR分析部で抽出された各候補のうちから試料組成としての妥当性が高いものを絞り込む絞り込み部をさらに具備しているものが好ましい。   From the viewpoint of user convenience, a narrowing-down unit that narrows down candidates having high relevance as a sample composition out of the candidates extracted by the FTIR analysis unit based on the validity evaluation value calculated by the evaluation unit. Furthermore, what is equipped is preferable.

絞り込んだ候補は、画面に出力されるが、このとき、それら候補に加え、FTIR分析部による試料分析結果、XRF分析部による試料分析結果、及び当該試料のカメラ画像を同一画面又は用紙に出力するように構成しておけば、分析結果のユーザ自らによる確認やその記録を好適に行うことができ、ユーザの使い勝手をより向上させることができるようになる。   The narrowed candidates are output on the screen. At this time, in addition to these candidates, the sample analysis result by the FTIR analysis unit, the sample analysis result by the XRF analysis unit, and the camera image of the sample are output on the same screen or paper. If constituted in this way, the user can confirm and record the analysis result by himself / herself, and the user-friendliness can be further improved.

また、前記評価部で算出された妥当性評価値を表示出力するスコア出力部をさらに具備しているものであれば、より望ましい。   Further, it is more desirable if it further includes a score output unit that displays and outputs the validity evaluation value calculated by the evaluation unit.

以上に説明した本発明によれば、分析結果から得られる組成判定について、FTIR法とXRF法との結果を自動的に照合して可及的に矛盾を排除するので、試料の化合物組成をより精度良く判別できるうえに、試料分析する際のユーザの使い勝手を種々の観点から向上させることができるようになる。   According to the present invention described above, the composition determination obtained from the analysis results is automatically collated with the results of the FTIR method and the XRF method to eliminate as much discrepancy as possible. In addition to being able to discriminate with high accuracy, the user-friendliness when analyzing a sample can be improved from various viewpoints.

以下、本発明の一実施形態を図面を参照して説明する。   Hereinafter, an embodiment of the present invention will be described with reference to the drawings.

本発明に係る有機化合物分析装置100は、図1に示すように、FTIR法によって試料を測定するFTIR測定機構1と、XRF法によって試料を測定するXRF測定機構2と、これら測定機構からの原測定データを受信して分析する情報処理機構3とを具備しており、同一の試料を移動させることなく載置したままで、各測定機構による試料同一箇所の測定が行えるようにしたものである。   As shown in FIG. 1, an organic compound analyzer 100 according to the present invention includes an FTIR measurement mechanism 1 that measures a sample by the FTIR method, an XRF measurement mechanism 2 that measures a sample by the XRF method, and an original from these measurement mechanisms. It includes an information processing mechanism 3 that receives and analyzes measurement data, and allows the same sample to be measured by each measurement mechanism while the same sample is placed without being moved. .

しかして、前記情報処理機構3は、ハードウェア構成としては、CPU、メモリ、ADコンバータなどからなるものであって、前記メモリに記憶させたプログラムにしたがって、CPUやその周辺機器が動作することにより、FTIR分析部31、XRF分析部32、評価部33、絞り込み部34、スコア出力部35、画像出力部36等としての機能を発揮する。なお、この情報処理機構3は、物理的に一体である必要はなく、分散して存在しても構わない。例えばFTIR測定機構1側に、この情報処理機構3の一部があるなどしてもよい。   The information processing mechanism 3 is composed of a CPU, a memory, an AD converter, etc. as a hardware configuration, and the CPU and its peripheral devices operate in accordance with the program stored in the memory. FTIR analysis unit 31, XRF analysis unit 32, evaluation unit 33, narrowing unit 34, score output unit 35, image output unit 36, etc. Note that the information processing mechanisms 3 do not have to be physically integrated, and may exist in a distributed manner. For example, there may be a part of the information processing mechanism 3 on the FTIR measurement mechanism 1 side.

次にこの情報処理機構3における各機能部の説明を兼ねて、その動作につき、以下に説明する。   Next, the operation of the information processing mechanism 3 will be described below with the explanation of each function unit.

まず、前記FTIR測定機構1で試料の測定が行われると、その測定データである赤外線吸収スペクトルデータが、FTIR分析部31に送信される(図2、ステップS1)。
FTIR分析部31は、この赤外線吸収スペクトルデータに、ガウシアン関数をフィッティングするなどしてピーク波数を決定する(ステップS2)。そして、そのピーク波数に対応する分子(有機化合物)を、メモリの所定領域に設けた化合物−ピーク波数関係格納部D1から検索して抽出し、化合物組成候補として出力する(ステップS3)。
First, when a sample is measured by the FTIR measurement mechanism 1, infrared absorption spectrum data as measurement data is transmitted to the FTIR analysis unit 31 (FIG. 2, step S1).
The FTIR analysis unit 31 determines the peak wave number by fitting a Gaussian function to the infrared absorption spectrum data (step S2). Then, the molecule (organic compound) corresponding to the peak wave number is retrieved and extracted from the compound-peak wave number relationship storage unit D1 provided in a predetermined area of the memory, and is output as a compound composition candidate (step S3).

次に、前記XRF測定機構2で試料の測定が行われると、その測定データであるX線の蛍光スペクトルデータが、XRF分析部32に送信される(ステップS4)。
XRF分析部32は、この蛍光スペクトルデータに、ガウシアン関数をフィッティングするなどしてピークエネルギ(又はピーク角度)を決定する(ステップS5)。そして、そのピークエネルギに対応する元素を、メモリの所定領域に設けた元素−ピークエネルギ関係格納部D2から検索して抽出し、元素組成候補として出力する(ステップS6)。
Next, when the sample is measured by the XRF measurement mechanism 2, X-ray fluorescence spectrum data, which is the measurement data, is transmitted to the XRF analysis unit 32 (step S4).
The XRF analysis unit 32 determines peak energy (or peak angle) by fitting a Gaussian function to the fluorescence spectrum data (step S5). Then, an element corresponding to the peak energy is retrieved and extracted from the element-peak energy relationship storage unit D2 provided in a predetermined area of the memory, and is output as an element composition candidate (step S6).

次に、評価部33が、前記FTIR分析部31によって抽出された化合物組成候補と、XRF分析部32によって抽出された元素組成候補とを照合し、FTIR分析部31で抽出された各化合物組成候補に対して、試料組成としての妥当性を示す妥当性評価値をそれぞれ算出する(ステップS7)。例えば、XRFによって検出されなかった元素を含んだ化合物が、FTIR分析部31による候補にあるとすれば、その候補は、判定信頼性が低いとして評価値が小さくなる。その他に、候補化合物から算出される元素比などの整合性も照合し、評価値を決定する。なお、この評価部33は、XRF分析部32によって抽出された各元素組成候補に対しても、FTIR分析部31によって抽出された化合物組成候補との関係に基づいて評価値を算出する(ステップS8)。   Next, the evaluation unit 33 collates the compound composition candidate extracted by the FTIR analysis unit 31 with the element composition candidate extracted by the XRF analysis unit 32, and each compound composition candidate extracted by the FTIR analysis unit 31 On the other hand, a validity evaluation value indicating validity as a sample composition is calculated (step S7). For example, if a compound containing an element that has not been detected by XRF is a candidate by the FTIR analysis unit 31, the candidate has a low evaluation value because the determination reliability is low. In addition, the evaluation value is determined by checking the consistency such as the element ratio calculated from the candidate compound. The evaluation unit 33 also calculates an evaluation value for each element composition candidate extracted by the XRF analysis unit 32 based on the relationship with the compound composition candidate extracted by the FTIR analysis unit 31 (step S8). ).

このようにして妥当性評価値が算出されると、次に、絞り込み部34が、ある一定の閾値以上の評価値を有する化合物組成候補及び元素組成候補を抽出する(ステップS9)。この絞り込みのための閾値は、ユーザが適宜指定することもできる。   Once the validity evaluation value is calculated in this way, the narrowing-down unit 34 next extracts a compound composition candidate and an element composition candidate having an evaluation value equal to or greater than a certain threshold value (step S9). The threshold for narrowing down can also be designated by the user as appropriate.

そして、最終的には、図3に示すように、画像出力部36が、前記絞り込み部34で絞り込まれた候補5に加え、FTIR分析部31による試料分析結果(ここでは赤外線吸収スペクトル)G1、XRF分析部32による試料分析結果(ここでは蛍光スペクトル)G2、及び当該試料のカメラ画像G3を、同時にディスプレイ4の画面又はプリンタ用紙に出力する(ステップS10)。さらにこの実施形態では、スコア出力部35によって、前記評価部33で算出された妥当性評価値6をもが、画面又は用紙に同時に表示出力される。   And finally, as shown in FIG. 3, in addition to the candidate 5 narrowed down by the narrowing-down part 34, the image output part 36, in addition to the sample analysis result (here, infrared absorption spectrum) G1 by the FTIR analysis part 31, The sample analysis result (here, the fluorescence spectrum) G2 by the XRF analyzer 32 and the camera image G3 of the sample are simultaneously output to the screen of the display 4 or to the printer paper (step S10). Furthermore, in this embodiment, the score output unit 35 also displays and outputs the validity evaluation value 6 calculated by the evaluation unit 33 on the screen or paper simultaneously.

しかして、このように構成した本実施形態による有機化合物分析装置100によれば、FTIR分析部31による候補抽出結果とXRF分析部32による候補抽出結果とを照合し、各組成候補の妥当性評価値を算出するので、従来のようなFTIR単独での分析に比べて遙かに組成判別精度がよく、確からしい分析結果を得ることができる。特に有機化合物の組成判定には、従来ユーザの経験に大きく依存していたが、この有機化合物分析装置100によれば、経験の浅いユーザでも使いこなすことができるようになる。また、組成が全く未知の試料に対しても、有効な分析結果を得ることが可能になる。   Thus, according to the organic compound analyzer 100 according to the present embodiment configured as described above, the candidate extraction result by the FTIR analysis unit 31 and the candidate extraction result by the XRF analysis unit 32 are collated, and the validity evaluation of each composition candidate is performed. Since the value is calculated, the composition discrimination accuracy is much better than in the conventional analysis with FTIR alone, and a probable analysis result can be obtained. In particular, the composition determination of organic compounds has largely depended on the experience of conventional users, but this organic compound analyzer 100 can be used even by inexperienced users. In addition, it is possible to obtain an effective analysis result even for a sample whose composition is completely unknown.

さらに、FTIR分析部31による試料分析結果、XRF分析部32による試料分析結果、及び当該試料のカメラ画像を同一画面又は用紙に出力するようにしているので、分析結果のユーザ自らによる確認やその記録に際して役立つものとなる。   Furthermore, since the sample analysis result by the FTIR analysis unit 31, the sample analysis result by the XRF analysis unit 32, and the camera image of the sample are output on the same screen or paper, the user can confirm and record the analysis result by himself / herself. It will be useful in that case.

なお、本発明は前記実施形態に限られるものではなく、その趣旨を逸脱しない範囲で種々の変形が可能であることは言うまでもない。   Note that the present invention is not limited to the above-described embodiment, and various modifications can be made without departing from the spirit of the present invention.

本発明を適用することにより、試料の化合物組成をより精度良く判別できるうえに、試料分析する際のユーザの使い勝手を種々の観点から向上させることができるようになる。   By applying the present invention, the compound composition of a sample can be discriminated more accurately, and the user-friendliness when analyzing a sample can be improved from various viewpoints.

本発明の一実施形態に係る化合物分析装置の機能ブロック図。The functional block diagram of the compound analyzer which concerns on one Embodiment of this invention. 同実施形態における化合物分析装置の動作を示すフローチャート。The flowchart which shows operation | movement of the compound analyzer in the same embodiment. 同実施形態における化合物分析装置の表示画面の一例を示す画面図。The screen figure which shows an example of the display screen of the compound analyzer in the same embodiment.

符号の説明Explanation of symbols

100・・・化合物分析装置
31・・・FTIR分析部
32・・・XRF分析部
33・・・評価部
34・・・絞り込み部
35・・・スコア出力部
36・・・画像出力部
DESCRIPTION OF SYMBOLS 100 ... Compound analyzer 31 ... FTIR analysis part 32 ... XRF analysis part 33 ... Evaluation part 34 ... Refinement part 35 ... Score output part 36 ... Image output part

Claims (7)

FTIR法によって試料を測定した結果にピークサーチマッチングを施してこれを分析し、当該試料を構成する化合物組成の候補を1又は複数抽出するFTIR分析部と、
XRF法によって前記試料を測定した結果にピークサーチマッチングを施してこれを分析し、当該試料を構成する元素組成の候補を1又は複数抽出するXRF分析部と、
前記FTIR分析部による候補抽出結果とXRF分析部による候補抽出結果のうち少なくとも元素の有無または元素比の結果とを照合し、FTIR分析部で抽出された各候補に対して試料組成としての妥当性を示す妥当性評価値をそれぞれ算出する評価部と、を具備しているFTIR分析装置。
An FTIR analysis unit that performs peak search matching on the result of measuring the sample by the FTIR method, analyzes the result, and extracts one or more candidates for the compound composition constituting the sample;
An XRF analysis unit that performs peak search matching on the result of measuring the sample by the XRF method, analyzes the result, and extracts one or a plurality of element composition candidates constituting the sample;
The candidate extraction result by the FTIR analysis unit and the candidate extraction result by the XRF analysis unit are collated with the result of at least the presence or absence of elements or the element ratio, and the validity as the sample composition for each candidate extracted by the FTIR analysis unit An FTIR analyzer comprising: an evaluation unit that calculates a validity evaluation value indicating
前記評価部が、XRF分析部で抽出された各候補に対しても、試料組成としての妥当性を示す妥当性評価値をそれぞれ算出するものである請求項1記載の化合物分析装置。   2. The compound analyzer according to claim 1, wherein the evaluation unit calculates a validity evaluation value indicating validity as a sample composition for each candidate extracted by the XRF analysis unit. 前記化合物が有機物である請求項1又は2記載の化合物分析装置。   The compound analyzer according to claim 1, wherein the compound is an organic substance. 前記評価部で算出された妥当性評価値に基づいて、FTIR分析部で抽出された各候補のうちから試料組成としての妥当性が高いものを絞り込む絞り込み部をさらに具備している請求項1乃至3いずれか記載の化合物分析装置。   The throttling part which narrows down the thing with high relevance as a sample composition out of each candidate extracted by the FTIR analysis part based on the validity evaluation value computed in the said evaluation part. 3. The compound analyzer according to any one of 3. 前記絞り込み部によって絞り込まれた候補に加え、FTIR分析部による試料分析結果、XRF分析部による試料分析結果、及び当該試料のカメラ画像を、同一画面又は用紙に出力する画像出力部を更に具備している請求項4記載の化合物分析装置。   In addition to the candidates narrowed down by the narrowing-down unit, an image output unit that outputs the sample analysis result by the FTIR analysis unit, the sample analysis result by the XRF analysis unit, and the camera image of the sample to the same screen or paper is further provided. The compound analyzer according to claim 4. 前記評価部で算出された妥当性評価値を表示出力するスコア出力部をさらに具備している請求項5記載の化合物分析装置。   The compound analyzer according to claim 5, further comprising a score output unit that displays and outputs the validity evaluation value calculated by the evaluation unit. FTIR法によって試料を測定した結果にピークサーチマッチングを施してこれを分析し、当該試料を構成する化合物組成の候補を1又は複数抽出
XRF法によって前記試料を測定した結果にピークサーチマッチングを施してこれを分析し、当該試料を構成する元素組成の候補を1又は複数抽出
前記FTIRによる候補抽出結果とXRFによる候補抽出結果のうち少なくとも元素の有無または元素比の結果とを照合し、FTIRで抽出された各候補に対して試料組成としての妥当性を示す妥当性評価値をそれぞれ算出することを特徴とするFTIR分析方法
This was analyzed by performing the peak search matching results of the measurement of the sample by FTIR method, the candidate compound composition constituting the sample one or more extraction,
To analyze it by performing the peak search matching result of the measurement of the sample by XRF method, the candidate of the elemental composition constituting the sample 1 or more extraction,
Collates the results of at least elements whether or elemental ratio of the candidate extraction result by the candidate extraction results and XRF method by the FTIR method, appropriate to indicate the validity of the sample composition for each candidate extracted by the FTIR method FTIR analysis method characterized by calculating each sex evaluation value.
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