JP5327657B2 - プラズマ発生装置 - Google Patents
プラズマ発生装置 Download PDFInfo
- Publication number
- JP5327657B2 JP5327657B2 JP2011155365A JP2011155365A JP5327657B2 JP 5327657 B2 JP5327657 B2 JP 5327657B2 JP 2011155365 A JP2011155365 A JP 2011155365A JP 2011155365 A JP2011155365 A JP 2011155365A JP 5327657 B2 JP5327657 B2 JP 5327657B2
- Authority
- JP
- Japan
- Prior art keywords
- plasma
- antenna
- electrode
- generation container
- frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
- H01J37/3211—Antennas, e.g. particular shapes of coils
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32357—Generation remote from the workpiece, e.g. down-stream
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
- H01J37/32541—Shape
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P30/00—Ion implantation into wafers, substrates or parts of devices
- H10P30/20—Ion implantation into wafers, substrates or parts of devices into semiconductor materials, e.g. for doping
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
- H05H1/4645—Radiofrequency discharges
- H05H1/4652—Radiofrequency discharges using inductive coupling means, e.g. coils
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Plasma Technology (AREA)
- Electron Sources, Ion Sources (AREA)
Description
12 プラズマ生成容器
16 プラズマ電極
18 電子放出孔
20 プラズマ
24 ガス
26 アンテナ
28 高周波
30 PFG電源
42 アンテナカバー
60 枠カバー
62 突起部
70 リフレクター
71 凹形状の窪み
Claims (3)
- プラズマ生成容器内で高周波放電によってガスを電離させてプラズマを生成して、電子放出孔を通して当該プラズマより電子を外部に放出する装置であって、プラズマ生成容器内に設けられていて高周波を放射するアンテナと前記アンテナ全体を覆うものであって絶縁物から成るアンテナカバーとを備えており、前記電子放出孔のあるプラズマ電極材質が導電性材料であるプラズマ発生装置において、前記プラズマ電極と前記アンテナとの間にあり、筒状の枠体領域に枠体の内側または内側と外側に電子の流れを遮る方向の長さにおいて、枠体の厚みと異なる突起部がある枠カバーをもっており、前記枠カバーの突起部が電子放出孔がある前記プラズマ電極の周辺に影をつくり、プラズマスパッタによるアルミナ等の絶縁物が堆積しにくくしていることを特徴とするプラズマ発生装置。
- 前記枠カバーの材質はカーボン製である請求項1記載のプラズマ発生装置。
- プラズマ生成容器内で高周波放電によってガスを電離させてプラズマを生成して、電子放出孔を通して当該プラズマより電子を外部に放出する装置であって、プラズマ生成容器内に設けられていて高周波を放射するアンテナと前記アンテナ全体を覆うものであって絶縁物から成るアンテナカバーとを備えており、前記電子放出孔のあるプラズマ電極材質が導電性材料であるプラズマ発生装置において、前記プラズマ電極は、第1のプラズマ電極と第2のプラズマ電極の2枚で構成され、プラズマ側の第1プラズマ電極が突起付き構造をしており、前記第1プラズマ電極の突起により前記第2のプラズマ電極上に影をつくり、プラズマスパッタによるアルミナ等の絶縁物が堆積しにくくしていることを特徴とするプラズマ発生装置。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011155365A JP5327657B2 (ja) | 2010-08-24 | 2011-07-14 | プラズマ発生装置 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010186824 | 2010-08-24 | ||
| JP2010186824 | 2010-08-24 | ||
| JP2011155365A JP5327657B2 (ja) | 2010-08-24 | 2011-07-14 | プラズマ発生装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012069509A JP2012069509A (ja) | 2012-04-05 |
| JP5327657B2 true JP5327657B2 (ja) | 2013-10-30 |
Family
ID=45696231
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011155365A Expired - Fee Related JP5327657B2 (ja) | 2010-08-24 | 2011-07-14 | プラズマ発生装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US8569955B2 (ja) |
| JP (1) | JP5327657B2 (ja) |
| KR (1) | KR101307111B1 (ja) |
| TW (1) | TWI449079B (ja) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101488659B1 (ko) * | 2012-03-06 | 2015-02-02 | 코닝정밀소재 주식회사 | 고주파 가열 장치 |
| KR101290570B1 (ko) * | 2012-03-06 | 2013-07-31 | 삼성코닝정밀소재 주식회사 | 고주파 가열 장치 |
| US9053907B2 (en) * | 2012-04-04 | 2015-06-09 | Taiwan Semiconductor Manufacturing Co., Ltd. | System and method of ion neutralization with multiple-zoned plasma flood gun |
| JP6076838B2 (ja) * | 2013-05-31 | 2017-02-08 | 住友重機械イオンテクノロジー株式会社 | 絶縁構造及び絶縁方法 |
| US9852887B2 (en) | 2013-08-23 | 2017-12-26 | Advanced Ion Beam Technology, Inc. | Ion source of an ion implanter |
| CN110234195B (zh) * | 2019-07-18 | 2024-12-31 | 中国科学技术大学 | 谐振腔式ecr等离子体源装置以及方法 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04351838A (ja) * | 1991-05-28 | 1992-12-07 | Hitachi Ltd | イオンビーム装置の中性化器 |
| JPH0547338A (ja) * | 1991-08-16 | 1993-02-26 | Nissin Electric Co Ltd | イオンビーム中性化装置 |
| JPH09245997A (ja) * | 1996-03-05 | 1997-09-19 | Nissin Electric Co Ltd | カバーで覆われた内壁とアンテナを持つプラズマ室 |
| JP3608416B2 (ja) * | 1999-02-02 | 2005-01-12 | 日新電機株式会社 | プラズマ源 |
| JP4366856B2 (ja) * | 2000-10-23 | 2009-11-18 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| KR100464902B1 (ko) * | 2001-02-12 | 2005-01-05 | (주)에스이 플라즈마 | 대기압에서 저온 플라즈마를 발생시키는 장치 |
| US6545419B2 (en) * | 2001-03-07 | 2003-04-08 | Advanced Technology Materials, Inc. | Double chamber ion implantation system |
| JP3758520B2 (ja) * | 2001-04-26 | 2006-03-22 | 日新イオン機器株式会社 | イオンビーム照射装置および関連の方法 |
| US6452198B1 (en) | 2001-06-28 | 2002-09-17 | Advanced Micro Devices, Inc. | Minimized contamination of semiconductor wafers within an implantation system |
| US6852990B1 (en) | 2001-06-29 | 2005-02-08 | Advanced Micro Devices, Inc. | Electrostatic discharge depolarization using high density plasma |
| JP4974318B2 (ja) * | 2001-08-17 | 2012-07-11 | 株式会社アルバック | マイクロ波プラズマ処理装置および処理方法 |
| DE60329292D1 (de) * | 2002-03-08 | 2009-10-29 | Canon Anelva Corp | Verfahren und Vorrichtung zum Herstellen von Metall-Schichten |
| JP4374487B2 (ja) * | 2003-06-06 | 2009-12-02 | 株式会社Sen | イオン源装置およびそのクリーニング最適化方法 |
| JP4550507B2 (ja) * | 2004-07-26 | 2010-09-22 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
| US20070137576A1 (en) * | 2005-12-19 | 2007-06-21 | Varian Semiconductor Equipment Associates, Inc. | Technique for providing an inductively coupled radio frequency plasma flood gun |
| US7342240B2 (en) | 2006-02-24 | 2008-03-11 | Varian Semiconductor Equipment Associates, Inc. | Ion beam current monitoring |
| JP4001185B1 (ja) * | 2007-03-06 | 2007-10-31 | 日新イオン機器株式会社 | プラズマ発生装置 |
| JP2008251857A (ja) * | 2007-03-30 | 2008-10-16 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| JP5060869B2 (ja) | 2007-08-21 | 2012-10-31 | 株式会社アルバック | プラズマ処理装置 |
| JP5317509B2 (ja) * | 2008-03-27 | 2013-10-16 | 東京エレクトロン株式会社 | プラズマ処理装置および方法 |
| US20100159120A1 (en) * | 2008-12-22 | 2010-06-24 | Varian Semiconductor Equipment Associates, Inc. | Plasma ion process uniformity monitor |
| JP5188385B2 (ja) * | 2008-12-26 | 2013-04-24 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置及びプラズマ処理装置の運転方法 |
-
2011
- 2011-06-30 KR KR1020110064532A patent/KR101307111B1/ko not_active Expired - Fee Related
- 2011-07-14 JP JP2011155365A patent/JP5327657B2/ja not_active Expired - Fee Related
- 2011-07-19 TW TW100125387A patent/TWI449079B/zh not_active IP Right Cessation
- 2011-08-04 US US13/198,429 patent/US8569955B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| TW201209878A (en) | 2012-03-01 |
| KR101307111B1 (ko) | 2013-09-11 |
| US8569955B2 (en) | 2013-10-29 |
| US20120049738A1 (en) | 2012-03-01 |
| TWI449079B (zh) | 2014-08-11 |
| KR20120022547A (ko) | 2012-03-12 |
| JP2012069509A (ja) | 2012-04-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5327657B2 (ja) | プラズマ発生装置 | |
| JP4992885B2 (ja) | プラズマ発生装置 | |
| US9425023B2 (en) | Ion generator and thermal electron emitter | |
| JP4001185B1 (ja) | プラズマ発生装置 | |
| RU2014109915A (ru) | Осаждение из паровой фазы для нанесения покрытия с погружением в дуговую плазму низкого давления и ионная обработка | |
| US8796649B2 (en) | Ion implanter | |
| WO2013030953A1 (ja) | プラズマ処理装置用アンテナ及び該アンテナを用いたプラズマ処理装置 | |
| JP2006324050A (ja) | イオン源 | |
| US9922795B2 (en) | High brightness ion beam extraction using bias electrodes and magnets proximate the extraction aperture | |
| EP4372782A2 (en) | Ion source cathode | |
| JP2002170516A (ja) | イオンビーム照射装置 | |
| KR20090037343A (ko) | 자화된 유도결합형 플라즈마 처리장치 및 플라즈마 발생방법 | |
| JP2012084624A (ja) | プラズマ発生装置 | |
| US8664861B1 (en) | Plasma generator | |
| US20090166555A1 (en) | RF electron source for ionizing gas clusters | |
| JP5684483B2 (ja) | プラズマ処理装置用アンテナ及び該アンテナを用いたプラズマ処理装置 | |
| JP2015088218A (ja) | イオンビーム処理装置及び中和器 | |
| TW201824366A (zh) | 離子植入機以及將離子植入半導體基板中的方法 | |
| KR20020004934A (ko) | 선형이온빔의 플라즈마소스 | |
| JP5325623B2 (ja) | 電子源 | |
| KR102584240B1 (ko) | 집속 유도 결합 플라즈마용 페라이트 쉴드를 포함하는 플라즈마 발생장치 | |
| CN118400857B (zh) | 一种微波等离子体喷枪 | |
| JP2004006109A (ja) | イオンビーム処理装置 | |
| JP2019003899A (ja) | イオン生成装置及びイオン生成方法 | |
| US20200279722A1 (en) | Charge neutralizer and plasma generator |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20120626 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120919 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20130404 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130410 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130522 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20130628 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20130711 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5327657 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| LAPS | Cancellation because of no payment of annual fees |