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JP5353261B2 - Method for manufacturing metalized long resin film substrate and plating apparatus - Google Patents
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JP5353261B2 - Method for manufacturing metalized long resin film substrate and plating apparatus - Google Patents

Method for manufacturing metalized long resin film substrate and plating apparatus Download PDF

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JP5353261B2
JP5353261B2 JP2009009453A JP2009009453A JP5353261B2 JP 5353261 B2 JP5353261 B2 JP 5353261B2 JP 2009009453 A JP2009009453 A JP 2009009453A JP 2009009453 A JP2009009453 A JP 2009009453A JP 5353261 B2 JP5353261 B2 JP 5353261B2
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long resin
resin film
film
metal film
metal
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JP2010168597A (en
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靖司 川村
典之 佐伯
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Sumitomo Metal Mining Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a long-length metalized resin film showing little surface defects, even in continuous operation, and a plating apparatus for manufacturing the substrate. <P>SOLUTION: A joint part A is formed by contacting an end of a long-length resin film F having a metal film with an end of another long-length resin film F having a metal film and attaching a conductive tape 1 thereon. A rear tape 2 is an adhesive tape and can be used accordingly. At the joint part A, the conductive tape 1 and the rear tape 2 form a level difference d. While the joint part A is in contact with an electric supply roller of the plating apparatus, electric current supplied to the electric supply roller is controlled so that the maximum difference in electric potentials between an anode inside a plating liquid tank and the electric supply roller is in the range of 0.8-1.7 times of the difference in electric potentials during operation. <P>COPYRIGHT: (C)2010,JPO&amp;INPIT

Description

本発明は、金属化長尺樹脂フィルム基板の製造方法とその製造に用いるめっき装置に関する。 The present invention relates to a method for producing a metallized long resin film substrate and a plating apparatus used for the production.

樹脂フィルムはフレキシブル性を有し、容易に加工できるので、その表面に金属膜や酸化物膜を形成して電子部品や光学部品、包装材料などとして広く産業界で用いられている。例えば、フレキシブル性を有するフレキシブル配線基板が携帯電話など小型電子機器で使用されている。   Resin films have flexibility and can be easily processed. Therefore, a metal film or an oxide film is formed on the surface of the resin film, and it is widely used in the industry as electronic parts, optical parts, packaging materials, and the like. For example, flexible wiring boards having flexibility are used in small electronic devices such as mobile phones.

ところで、フレキシブル配線基板は、樹脂フィルムの一種であるポリイミドフィルムと銅箔の間に接着剤を用いて両者を重ねて張り合わせた3層銅ポリイミド基板からサブトラクティブ法等によって製造される。   By the way, a flexible wiring board is manufactured by a subtractive method or the like from a three-layer copper polyimide substrate in which an adhesive is used between a polyimide film, which is a kind of resin film, and a copper foil, and the both are laminated.

近年電子部品の軽薄短小化に伴い、配線を狭ピッチ化する要求が高まっている。従来からの3層銅ポリイミド基板から接着剤を用いない金属化樹脂フィルム基板の一種である金属化ポリイミド基板が要求されている。接着剤が無いことで、接着剤の特性に影響を受けず、ポリイミド本来の安定性を利用して配線の挟ピッチ化を実現可能とした。金属化ポリイミド基板は、液晶ディスプレイのドライバ回路にCOF(Chip on Film)として採用されている。   In recent years, as electronic components have become lighter, thinner, and smaller, there has been an increasing demand for narrowing the wiring pitch. There is a demand for a metallized polyimide substrate which is a kind of metallized resin film substrate that does not use an adhesive from a conventional three-layer copper polyimide substrate. Since there is no adhesive, it is not affected by the characteristics of the adhesive, and it is possible to realize a pitch between wirings by utilizing the inherent stability of polyimide. The metallized polyimide substrate is adopted as COF (Chip on Film) in a driver circuit of a liquid crystal display.

金属化ポリイミド基板を得る方法として、ポリイミドフィルム表面にスパッタリング法や蒸着法で金属膜を積層させた後に電気めっき法や電解めっき法を用いて金属層を厚付けする方法が知られている(例えば、特許文献1や特許文献2を参照。)。また、金属化ポリイミド基板(めっき法2層回路基材)の電解めっき方法も知られている(例えば、特許文献3参照。)。この特許文献3にはプラスチックフィルム基材を電解めっき装置で電解めっきを施す技術が開示されているが、連続操業する場合のプラスチックフィルム基材とこれに続くプラスチックフィルム基材への対応は開示されていない。
COFへの要求をみると、液晶ディスプレイの高精細化にともない微細配線化が進んでいる。このような状況で金属化ポリイミド基板の外観品質に対しての要求が厳しくなっている。このような要求としては、外観については銅メッキ層のピンホールに対して対策が先ず必要となり、さらに配線の微細化が進むにつれて金属化ポリイミド基板の銅メッキ層の表面の凹凸などの表面欠陥に対して削減が求められている(例えば、特許文献4参照。)。
As a method for obtaining a metallized polyimide substrate, a method is known in which a metal film is laminated on the surface of a polyimide film by sputtering or vapor deposition and then a metal layer is thickened by electroplating or electrolytic plating (for example, , See Patent Document 1 and Patent Document 2.) Moreover, the electrolytic plating method of a metallized polyimide board | substrate (plating method 2 layer circuit base material) is also known (for example, refer patent document 3). Although this patent document 3 discloses a technique for performing electrolytic plating on a plastic film substrate using an electrolytic plating apparatus, the correspondence to the plastic film substrate in the continuous operation and the subsequent plastic film substrate is disclosed. Not.
Looking at the demand for COF, the fine wiring is progressing with the high definition of the liquid crystal display. Under such circumstances, demands for the appearance quality of the metallized polyimide substrate are becoming strict. As such a requirement, as for the external appearance, it is first necessary to take measures against pinholes in the copper plating layer, and as the miniaturization of wiring further proceeds, surface defects such as irregularities on the surface of the copper plating layer of the metalized polyimide substrate On the other hand, reduction is demanded (see, for example, Patent Document 4).

特開2002−252257号公報JP 2002-252257 A 特開2003−334890号公報JP 2003-334890 A 特開2007−246962号公報JP 2007-246962 A 特開平9−289368号公報JP-A-9-289368

上記のように金属化ポリイミド基板がCOF材料として使用され、凹凸をはじめとする表面欠陥などの外観品質を向上させることが要求されている。   As described above, a metallized polyimide substrate is used as a COF material, and it is required to improve the appearance quality such as surface defects including irregularities.

本発明は、上記事情に鑑み、連続操業においても表面欠陥の少ない金属化長尺樹脂フィルム基板の製造方法及びこの基板を製造するためのめっき装置を提供することを目的とする。   An object of this invention is to provide the manufacturing method of the metallization long resin film board | substrate with few surface defects also in continuous operation, and the plating apparatus for manufacturing this board | substrate in view of the said situation.

本発明者らは上記課題を解決するために、金属化ポリイミドフィルム表面の欠陥の抑制方法を鋭意研究した。この結果、上記目的を達成するための金属化長尺樹脂フィルム基板の製造方法は、長尺樹脂フィルムの少なくとも一方の面に金属膜が形成された金属膜付長尺樹脂フィルムの前記金属膜上に、前記金属膜付長尺樹脂フィルムをその長手方向に搬送しながらめっき液槽で電気めっき膜を形成することにより金属化長尺樹脂フィルム基板を製造する製造方法において、
(1)複数の前記金属膜付長尺樹脂フィルムをその長手方向に電気的および機械的に接続させる互いに隣接する前記金属化長尺樹脂フィルムの間に接続部分を設け、
(2)該接続部分が、前記電気めっき装置の給電体と接触している間は、前記めっき液槽内部のアノード(陽極)と前記給電体の間の電位差の最大値が、操業時の電位差の0.8倍以上1.7倍以下の範囲内になるように前記給電体に流す電流を制御することを特徴とするものである。
In order to solve the above-mentioned problems, the present inventors diligently studied a method for suppressing defects on the surface of a metallized polyimide film. As a result, a method for producing a metallized long resin film substrate for achieving the above object is provided on the metal film of the long resin film with a metal film in which a metal film is formed on at least one surface of the long resin film. In the manufacturing method of manufacturing a metallized long resin film substrate by forming an electroplating film in a plating solution tank while conveying the long resin film with a metal film in the longitudinal direction,
(1) A connecting portion is provided between the metallized long resin films adjacent to each other to electrically and mechanically connect a plurality of the long resin films with metal films in the longitudinal direction;
(2) While the connecting portion is in contact with the power feeder of the electroplating apparatus, the maximum potential difference between the anode (anode) inside the plating bath and the power feeder is the potential difference during operation. The current flowing through the power feeder is controlled so as to be in the range of 0.8 times or more and 1.7 times or less.

ここで、
(3)前記金属膜は、ニッケル、クロムおよび銅から選ばれた金属、または、ニッケル、クロムおよび銅のいずれかを含む合金であり、
(4)前記電気めっきは、銅電気めっきであってもよい。
here,
(3) The metal film is a metal selected from nickel, chromium and copper, or an alloy containing any of nickel, chromium and copper,
(4) The electroplating may be copper electroplating.

また、
(5)前記金属膜は、真空成膜法で成膜されたものであってもよい。
Also,
(5) The metal film may be formed by a vacuum film forming method.

さらに、
(6)前記長尺樹脂フィルムはポリイミドフィルムであってもよい。
further,
(6) The long resin film may be a polyimide film.

さらにまた、
(7)前記接続部分は、導電性粘着テープの貼付または導電性接着剤での接着で形成されているものであってもよい。
Furthermore,
(7) The connecting portion may be formed by pasting a conductive pressure-sensitive adhesive tape or bonding with a conductive adhesive.

さらにまた、
(8)前記接続部分と前記金属膜付長尺樹脂フィルムで形成される各段差の高低差が100μm以下であってもよい。
Furthermore,
(8) The height difference of each level | step difference formed with the said connection part and the said long resin film with a metal film may be 100 micrometers or less.

さらにまた、
(9)前記導電性粘着テープの厚みが20μmから100μmであってもよい。
Furthermore,
(9) The conductive adhesive tape may have a thickness of 20 μm to 100 μm.

さらにまた、
(10)前記金属膜付長尺樹脂フィルムと、前記金属膜付長尺樹脂フィルムに貼付された前記導電性粘着テープの間の電気抵抗が0.1Ω以下であってもよい。
Furthermore,
(10) The electrical resistance between the long resin film with a metal film and the conductive adhesive tape affixed to the long resin film with a metal film may be 0.1Ω or less.

上記目的を達成するための本発明のめっき装置は、めっき液が収容されためっき液槽と、該めっき液槽内に設置されたアノード(陽極)と、長尺樹脂フィルムの少なくとも一方の面に金属膜が形成された金属膜付長尺樹脂フィルムの幅方向を水平に保ってその長手方向に搬送しながら前記金属膜付長尺樹脂フィルムを前記めっき液槽に浸漬させる搬送手段と、前記めっき液槽外にあって前記金属膜付長尺樹脂フィルムの金属膜に給電する給電体と、該給電体に流す電流を制御しながら電力を供給する電源を備えためっき装置において、
(11)複数の互いに離れて隣接する前記金属膜付長尺樹脂フィルムをその長手方向に電気的および機械的に接続させる前記金属化長尺樹脂フィルムの間に配置された接続部分と、
(12)前記金属膜付長尺樹脂フィルムの搬送経路上の前記めっき浴槽の前でかつ前記給電手段の前に配置された、前記接続部分を検出する接続部検出手段と、
(13)前記接続部検出手段が前記接続部分の検出の信号を受けて、前記接続部分が給電体と接触している間は、前記給電体と前記アノード間の電位差の最大値が、操業時の電位差の0.8倍以上1.7倍以下の範囲内になるように前記電源を制御する制御手段とを備えたことを特徴とするめっき装置。
In order to achieve the above object, a plating apparatus of the present invention comprises a plating solution tank containing a plating solution, an anode (anode) installed in the plating solution tank, and at least one surface of a long resin film. Conveying means for immersing the long resin film with a metal film in the plating solution tank while keeping the width direction of the long resin film with a metal film formed in a horizontal direction and conveying in the longitudinal direction thereof, and the plating In a plating apparatus provided with a power supply body that supplies power to the metal film of the long resin film with a metal film outside the liquid tank, and a power supply that supplies power while controlling a current flowing through the power supply body,
(11) A connecting portion disposed between the metallized long resin films that electrically and mechanically connect a plurality of the long resin films with metal films adjacent to each other apart from each other,
(12) A connecting portion detecting means for detecting the connecting portion, arranged in front of the plating bath on the transport path of the long resin film with a metal film and in front of the power feeding means,
(13) While the connection detection unit receives the detection signal of the connection part and the connection part is in contact with the power supply, the maximum value of the potential difference between the power supply and the anode is during operation. And a control means for controlling the power supply so as to be within a range of 0.8 times or more and 1.7 times or less of the potential difference.

ここで、金属膜付長尺樹脂フィルムとは、樹脂フィルムの表面に金属の薄膜が形成された(付いた)フィルムをいい、金属膜はスパッタリングなどで成膜される。樹脂がポリイミドのものも含まれる。   Here, the long resin film with a metal film refers to a film in which a metal thin film is formed (attached) on the surface of the resin film, and the metal film is formed by sputtering or the like. The thing whose resin is a polyimide is also contained.

また、金属化長尺樹脂フィルム基板とは、金属膜付長尺樹脂フィルムの金属薄膜の上に銅などを電気めっきしたフィルムをいう。   Moreover, a metallized long resin film substrate means the film which electroplated copper etc. on the metal thin film of the long resin film with a metal film.

また、操業時とは、上記の接続部分が給電体に接していない際に電気めっきを行っている時間帯をいう。   Moreover, the time of operation means the time slot | zone when electroplating is performed when said connection part is not contacting the electric power feeding body.

本発明によれば、めっき膜に凹凸など表面欠陥が少ない金属化長尺樹脂フィルム基板を連続的に製造することができ、COFなどに見られる挟ピッチ化された配線にも対応した金属化長尺樹脂フィルム基板を歩留まり良く提供可能となる。   According to the present invention, it is possible to continuously produce a metallized long resin film substrate with few surface defects such as irregularities on a plating film, and to support a metallized length corresponding to a pitched wiring found in COF or the like. A long resin film substrate can be provided with high yield.

本発明のめっき装置の一例を示す概略図である。It is the schematic which shows an example of the plating apparatus of this invention. 金属膜付長尺樹脂フィルムFの接続部分Aと給電体である給電ロールとが接触するときの位置関係を示す概略図である。It is the schematic which shows the positional relationship when the connection part A of the elongate resin film F with a metal film and the electric power feeding roll which is a power feeding body contact. 導電性テープ1を互いに隣接する金属膜付長尺樹脂フィルムF間でかつ金属膜Fa上に貼付した例を示す断面図である。It is sectional drawing which shows the example which affixed the electroconductive tape 1 on the metal film Fa between the long resin films F with a metal film adjacent to each other. 金属膜付長尺樹脂フィルムFを重ね合わせて導電性テープ1と裏面テープ2で接続部分Aを形成した例を示す断面図である。It is sectional drawing which shows the example which overlapped the long resin film with metal film F, and formed the connection part A with the conductive tape 1 and the back surface tape 2. FIG. 導電性接着剤4を用いて接続部分Aを形成した金属膜付長尺樹脂フィルムの幅方向からみた例を示す断面図である。It is sectional drawing which shows the example seen from the width direction of the long resin film with a metal film which formed the connection part A using the conductive adhesive 4. FIG. 実験例4において接続部分Aから終端方向に向かって120mまでの凹凸の出現頻度を表すグラフである。It is a graph showing the appearance frequency of the unevenness | corrugation to 120 m toward the terminal direction from the connection part A in Experimental example 4. FIG.

本発明は、ポリイミドフィルムの表面にニッケル−クロム合金の下地金属層をスパッタリング法で成膜し、下地金属層の表面に銅層をスパッタリング法で成膜して製造した金属膜付長尺樹脂フィルムに銅めっきするめっき装置に実現された。   The present invention is a long resin film with a metal film produced by forming a base metal layer of a nickel-chromium alloy on the surface of a polyimide film by a sputtering method and forming a copper layer on the surface of the base metal layer by a sputtering method. It has been realized in the plating equipment for copper plating.

本発明のめっき装置について図1を参照して説明する。   The plating apparatus of the present invention will be described with reference to FIG.

図1は、本発明のめっき装置の一例を示す概略図である。   FIG. 1 is a schematic view showing an example of a plating apparatus of the present invention.

めっき装置10は、金属膜付長尺樹脂フィルムFを巻き出す巻き出しロール12とめっき液Lが満たされためっき液槽11と、めっき液槽11の内部に配置されたアノード(陽極)14a,14b,14c,14d,14eと、めっき液槽11の外部にあって金属膜付長尺樹脂フィルムFに電力を給電する給電体の給電ロール(本発明にいう給電体の一例である)16a,16b,16c,16d,16eと、金属膜付長尺樹脂フィルムに電気めっきを施した金属化長尺樹脂フィルム基板Sを巻き取る巻取りロール15とを備えている。巻き出しロール12とめっき液槽11内部のロール13と給電ロール16と巻取りロール15により金属膜付長尺樹脂フィルムFの搬送手段が構成されており、金属膜付長尺樹脂フィルムFは、その幅方向を水平に保ってその長手方向に搬送されながらめっき液Lに浸漬される。   The plating apparatus 10 includes an unwinding roll 12 for unwinding the long resin film F with a metal film, a plating solution tank 11 filled with the plating solution L, an anode (anode) 14a disposed inside the plating solution vessel 11, 14b, 14c, 14d, and 14e, and a power supply roll 16a that is outside the plating bath 11 and supplies power to the long resin film F with a metal film (an example of a power supply according to the present invention) 16a, 16b, 16c, 16d, and 16e, and a winding roll 15 that winds up a metallized long resin film substrate S obtained by electroplating a long resin film with a metal film. The unwinding roll 12, the roll 13 inside the plating solution tank 11, the power supply roll 16, and the winding roll 15 constitute a conveying means for the long resin film F with the metal film. It is immersed in the plating solution L while being transported in the longitudinal direction while keeping its width direction horizontal.

金属膜付長尺樹脂フィルムFの搬送経路上での最初(一番目)の給電ロール16aと巻き出しロール12との間には、後述する接続部分Aを検出する接続部分検出手段を構成する光電センサー21と、光電センサー21から発せられる接続部分Aの検出の信号を受信して、各給電ロール16a,16b,16c,16d,16eに電力を供給する各電源23a,23b,23c,23d,23eを制御する制御器(本発明にいう制御手段の一例である)22とが備えられている。光電センサー21と制御器22の間、制御器22と各電源23の間は信号線24、25で結ばれている。各給電ロール16a,16b,16c,16d,16eと各電源23a,23b,23c,23d,23eとの間は電力線26で繋がれており、電源23aとアノード14a、電源23bとアノード14b、電源23cとアノード14c、電源23dとアノード14d、電源23eとアノード14eの間も電力線(図示せず)で結ばれている。各電源23は直流電源である。それぞれの給電ロール16a、16b、16c、16d、16eとアノード14a、14b、14c、14d、14eは対を成し、それぞれ独立した電源23a、23b、23c、23d、23eから電力を受けており、それぞれが別個の電流制御により電位差の最大値を制御している。   Between the first (first) power supply roll 16a and the unwinding roll 12 on the transport path of the long resin film F with the metal film, a photoelectric that constitutes a connection part detection means for detecting a connection part A described later. Each power supply 23a, 23b, 23c, 23d, 23e that receives the detection signal of the sensor 21 and the connection portion A emitted from the photoelectric sensor 21 and supplies power to the power supply rolls 16a, 16b, 16c, 16d, 16e. And a controller 22 (which is an example of the control means referred to in the present invention). Signal lines 24 and 25 are connected between the photoelectric sensor 21 and the controller 22 and between the controller 22 and each power source 23. Each power supply roll 16a, 16b, 16c, 16d, 16e and each power source 23a, 23b, 23c, 23d, 23e are connected by a power line 26. The power source 23a and the anode 14a, the power source 23b and the anode 14b, and the power source 23c. And the anode 14c, the power source 23d and the anode 14d, and the power source 23e and the anode 14e are also connected by a power line (not shown). Each power source 23 is a DC power source. Each of the power supply rolls 16a, 16b, 16c, 16d, 16e and the anodes 14a, 14b, 14c, 14d, 14e are paired and receive power from the independent power sources 23a, 23b, 23c, 23d, 23e, Each controls the maximum value of the potential difference by separate current control.

また、給電ロール16a、16b、16c、16d、16eとアノード14a、14b、14c、14d、14eの対ごとに電源23a、23b、23c、23d、23eを備えるのでそれぞれの給電ロール16a、16b、16c、16d、16eとアノード14a、14b、14c、14d、14e対は電気的に独立している。同じめっき槽11内に複数のアノード14a、14b、14c、14d、14eを有していても、各給電ロール16a、16b、16c、16d、16eとアノード14a、14b、14c、14d、14eの対はそれぞれ電気的に独立している。   In addition, since the power supply rolls 16a, 16b, 16c, 16d, and 16e and the anodes 14a, 14b, 14c, 14d, and 14e are provided with the power sources 23a, 23b, 23c, 23d, and 23e, the power supply rolls 16a, 16b, and 16c are provided. , 16d, 16e and the anodes 14a, 14b, 14c, 14d, 14e are electrically independent. Even if a plurality of anodes 14a, 14b, 14c, 14d, and 14e are provided in the same plating tank 11, a pair of each of the power supply rolls 16a, 16b, 16c, 16d, and 16e and the anodes 14a, 14b, 14c, 14d, and 14e Are electrically independent of each other.

制御器22が行う電源23の制御は、接続部分Aの導電性テープ1または導電性接着剤4を検出する光電センサー21を配置し、給電ロール16a、16b、16c、16d、16eと接続部分Aが接触するタイミングを把握しておき(何秒後に接触するかを把握しておき)、接続部分Aが給電ロール16a、16b、16c、16d、16eと接触する直前に電流制御を行うものである。具体的には、制御器22はプログラマブルロジックコントローラ(PLC)すなわちシーケンサで構成されている。光電センサー21が導電性テープ1(または導電性接着剤4)を検出したとき、制御器22は、導電性テープ1が各給電ロール16に接触する時間を算出し、導電性テープ1が各給電ロール16に接触している間は、各給電ロール16a、16b、16c、16d、16eとこれに対応する各アノード14a、14b、14c、14d、14eとの間の電位差の最大値が、操業時の電位差の0.8倍以上1.7倍以下の範囲内になるように制御器22が電源23a、23b、23c、23d、23eを制御して各給電ロール16a、16b、16c、16d、16eに流す電流を制御する。   The control of the power source 23 performed by the controller 22 is provided with a photoelectric sensor 21 for detecting the conductive tape 1 or the conductive adhesive 4 in the connection portion A, and the power supply rolls 16a, 16b, 16c, 16d, 16e and the connection portion A. Is grasped (when grasping how many seconds later), and current control is performed immediately before the connection portion A contacts the power supply rolls 16a, 16b, 16c, 16d, and 16e. . Specifically, the controller 22 includes a programmable logic controller (PLC), that is, a sequencer. When the photoelectric sensor 21 detects the conductive tape 1 (or the conductive adhesive 4), the controller 22 calculates the time that the conductive tape 1 contacts each power supply roll 16, and the conductive tape 1 supplies each power supply. While in contact with the roll 16, the maximum potential difference between the power supply rolls 16a, 16b, 16c, 16d, and 16e and the corresponding anodes 14a, 14b, 14c, 14d, and 14e is determined during operation. The controller 22 controls the power supplies 23a, 23b, 23c, 23d, and 23e so as to be within the range of 0.8 to 1.7 times the potential difference of the power supply rolls 16a, 16b, 16c, 16d, and 16e. To control the current flowing through.

金属化長尺樹脂フィルム基板Sの一種である銅ポリイミド基板を製造するプロセスをめっき装置10で製造した例を説明する。接続部分Aは、後述する図2に示す金属膜付長尺樹脂フィルムFを突合せ導電性テープ1を貼付した構造とした。   The example which manufactured the process which manufactures the copper polyimide board | substrate which is 1 type of the metallization long resin film board | substrate S with the plating apparatus 10 is demonstrated. The connecting portion A has a structure in which a long resin film F with a metal film shown in FIG.

金属膜付長尺樹脂フィルムFとして、ポリイミドフィルムの表面にニッケル−クロム合金の下地金属層をスパッタリング法で成膜し、下地金属層の表面に銅層をスパッタリング法で成膜して製造した。   A long resin film F with a metal film was manufactured by forming a base metal layer of nickel-chromium alloy on the surface of a polyimide film by a sputtering method, and forming a copper layer on the surface of the base metal layer by a sputtering method.

金属膜付長尺樹脂フィルムFを、金属膜付長尺樹脂フィルムFの金属膜Faの面が給電ロール16に接する向きに、巻き出しロール12、給電ロール16、ロール13を経て巻取りロール15へ至るように装着する。めっき液槽11には銅めっき液を満たした。銅めっき液としては公知の銅めっき液、例えば公知の硫酸銅めっき浴(光沢浴)を用いることができる。この硫酸銅めっき浴は、硫酸銅、硫酸、微量の塩素イオンおよび公知の添加剤等で構成されており、その組成は適宜に選択できる。アノード14a、14b、14c、14d、14eとして公知の含リン銅アノードを用いた。   The long resin film F with the metal film is wound in the direction in which the surface of the metal film Fa of the long resin film F with the metal film is in contact with the power supply roll 16 through the unwinding roll 12, the power supply roll 16, and the roll 13. Attach to reach. The plating solution tank 11 was filled with a copper plating solution. As the copper plating solution, a known copper plating solution, for example, a known copper sulfate plating bath (bright bath) can be used. This copper sulfate plating bath is composed of copper sulfate, sulfuric acid, a small amount of chlorine ions, known additives, and the like, and the composition thereof can be appropriately selected. Known phosphorous copper anodes were used as the anodes 14a, 14b, 14c, 14d, and 14e.

金属膜付長尺樹脂フィルムFをめっき装置10内部で搬送し、給電ロール16とアノード14a、14b、14c、14d、14eとの間に電位差を生じさせて、金属膜付長尺樹脂フィルムの被めっき面積当たりの電流密度を所望の膜厚を実現できる値にした制御で電流をながし電気めっきを行い金属化長尺樹脂フィルム基板S(銅ポリイミド基板)を得る。光電センサー21が、接続部分Aの導電性テープ1を検出したときは、導電性テープ1がそれぞれの給電ロール16a、16b、16c、16d、16eのいずれかに接触している間、制御器22が、操業時の電位差の0.8倍以上1.7倍以下の範囲内となるような電流制御を、導電性テープ1が接触している給電ロールが接続されている電源23a、23b、23c、23d、23eのいずれかに対して行う。すなわち、導電性テープ1が接触しているいずれかの給電ロール16a、16b、16c、16d、16eの電源23a、23b、23c、23d、23eのみが、操業時の電位差の0.8倍以上1.7倍以下の範囲内となるように電流制御される。従って、導電性テープ1が接触していない給電ロール16a、16b、16c、16d、16eには通常の操業時の制御を行い、すなわち、本項で説明した電位差の最大値を定めた電流制御は行われない。導電テープ1が、接触していない給電ロール16とアノード14の間は、通常の操業時の電位差であり、製品のめっき厚も前記電流制御の影響を受けない。   The long resin film F with the metal film is transported inside the plating apparatus 10, and a potential difference is generated between the power supply roll 16 and the anodes 14 a, 14 b, 14 c, 14 d, 14 e, so that the long resin film with the metal film is covered. By controlling the current density per plating area to a value that can realize a desired film thickness, electroplating is performed by performing current plating to obtain a metallized long resin film substrate S (copper polyimide substrate). When the photoelectric sensor 21 detects the conductive tape 1 of the connection portion A, the controller 22 while the conductive tape 1 is in contact with one of the power feeding rolls 16a, 16b, 16c, 16d, and 16e. However, the power supply 23a, 23b, 23c to which the power supply roll in contact with the conductive tape 1 is connected is controlled so that the electric current difference is within the range of 0.8 times to 1.7 times the potential difference during operation. , 23d, or 23e. That is, only the power sources 23a, 23b, 23c, 23d, and 23e of any of the power supply rolls 16a, 16b, 16c, 16d, and 16e that are in contact with the conductive tape 1 are 0.8 times or more the potential difference during operation. The current is controlled so as to be within the range of 7 times or less. Therefore, the power supply rolls 16a, 16b, 16c, 16d, and 16e that are not in contact with the conductive tape 1 are controlled during normal operation, that is, the current control that determines the maximum potential difference described in this section is performed. Not done. Between the power supply roll 16 and the anode 14 where the conductive tape 1 is not in contact, there is a potential difference during normal operation, and the plating thickness of the product is not affected by the current control.

操業時の電位差の0.8倍以上1.7倍以下の範囲内となるように制御されている際に電気めっきされた金属膜付長尺樹脂フィルムFはめっき工程終了後に通常の製品から切り離される。例えば、接続部分A(導電性テープ1)が給電ロール16に接している間に電流制御した時間あたりの搬送長さが1mならば、金属膜付長尺樹脂フィルムFの終端(0m)から1m〜2mの範囲および他方の金属膜付樹脂フィルムFの終端(0m)から1m〜2m範囲は、金属膜厚が不足するので製品として使用を控える。   The long resin film F with metal film electroplated when it is controlled to be within the range of 0.8 times or more and 1.7 times or less of the potential difference at the time of operation is separated from the normal product after the end of the plating process. It is. For example, if the transport length per time when the current is controlled while the connection portion A (the conductive tape 1) is in contact with the power supply roll 16 is 1 m, the end length (0 m) of the long resin film F with the metal film is 1 m. The range of ˜2 m and the range of 1 m to 2 m from the end (0 m) of the other resin film F with a metal film are not used as products because the metal film thickness is insufficient.

これまで説明したとおり、めっき装置10は、複数の金属膜付長尺樹脂フィルムFに上述の立ち上げ制御や立ち下げ制御を接続部分Aの度に行うことなく、連続して電気めっきを行うことができる。   As explained so far, the plating apparatus 10 continuously performs electroplating on a plurality of long resin films with metal films F without performing the above-described start-up control and turn-off control for each connection portion A. Can do.

さらに、めっき装置10では、多段めっきであり、めっき回数が増えるにつれて印加される電流値が上昇するように運転される。めっき装置のめっきの段数(給電ロールとアノード対の数)にもよるが、最初から半分(中間)までの前半の段数のめっきでは電流値が低く設定されるので、スパーク発生の懸念が無く、接続部分A(導電性テープ1)が給電ロールに接触していても電位差の最大値を定める制御は不要である。しかし、半分(中間)から数段のめっきでは電流値が高くなっており、スパークの懸念があるので、接続部分A(導電性テープ1)が給電ロールに接触している間は、電位差の最大値を定める制御が必要である。さらに電気めっきが進むと金属膜付長尺樹脂フィルムの銅めっき膜厚も厚くなり、導電性テープの表面にも電気めっきが施されるので、導電性テープによる段差が解消しスパークの懸念も無くなる。このように、めっき装置10の多段めっきでは、中間の数段には、接続部分A(導電性テープ1)が給電ロールに接触している間は、電位差の最大値を定める制御を行なってもよい。   Furthermore, the plating apparatus 10 is multi-stage plating, and is operated so that the value of the applied current increases as the number of times of plating increases. Depending on the number of plating stages (the number of feed rolls and anode pairs) in the plating equipment, the current value is set low in the first half of the plating from the beginning to the half (middle), so there is no concern about the occurrence of sparks. Even if the connection portion A (conductive tape 1) is in contact with the power supply roll, control for determining the maximum value of the potential difference is not necessary. However, the current value is high in half (intermediate) to several steps of plating, and there is a concern of sparking. Therefore, while the connection portion A (conductive tape 1) is in contact with the power supply roll, the potential difference is maximum. Control to determine the value is necessary. As the electroplating progresses, the copper film thickness of the long resin film with metal film also increases, and the surface of the conductive tape is also electroplated, eliminating the level difference caused by the conductive tape and eliminating the risk of sparks. . As described above, in the multi-stage plating of the plating apparatus 10, even when control is performed to determine the maximum value of the potential difference while the connecting portion A (conductive tape 1) is in contact with the power supply roll, in the middle several stages. Good.

めっき装置10では、金属膜付長尺樹脂フィルムFを数m〜数十m/分で搬送させながらめっき液L内を移動させて銅めっき層を形成した。   In the plating apparatus 10, the copper plating layer was formed by moving the inside of the plating solution L while conveying the long resin film F with a metal film at several m to several tens m / min.

本発明の金属化長尺樹脂フィルム基板の製造方法は、長尺樹脂フィルムの少なくとも一方の面に金属膜が形成された金属膜付長尺樹脂フィルムの金属膜上に、金属膜付長尺樹脂フィルムをその長手方向に搬送してめっき液槽で電気めっき膜を行うめっき装置にて金属化長尺樹脂フィルム基板の製造方法において、複数の前記金属膜付長尺樹脂フィルムをその長手方向に電気的および機械的に接続させる隣接する前記金属化長尺樹脂フィルムの間に接続部分を設け、この接続部分が前記電気めっき装置の給電体と接触している間は前記めっき液槽内部のアノード(陽極)と前記給電体の間の電位差の最大値が、操業時の電位差の0.8倍以上1.7倍以下の範囲内になるように給電体に流す電流を制御することを特徴とする金属化長尺樹脂フィルム基板の製造方法である。すなわち、金属膜付長尺樹脂フィルムをロール等の搬送手段によりめっき液槽に浸漬させ、前記アノードと給電体(図1に示すめっき装置10では給電ロール16a,16b,16c,16d,16e)との電位差で金属化長尺樹脂フィルムの金属膜上に電気めっきを施して金属化長尺樹脂フィルム基板を製造する製造方法であり、特に、複数の金属膜付長尺樹脂フィルムが連続的に供給される場合に金属膜付長尺樹脂フィルムとこれに隣接する(続く)金属膜付長尺樹脂フィルムの間にその長手方向で電気的および機械的に接続する接続部分を設け、この接続部分が前記給電体と接触している間は前記アノードと前記給電体の電位差の最大値を操業時の電位差の0.8倍以上1.7倍以下の範囲内にさせるように給電体に流す電流を制御することを特徴とする製造方法である。なお、ここに操業時とは、接続部分が給電体に接していない際に電気めっきを行う時間帯を言う。   The method for producing a metallized long resin film substrate of the present invention comprises a long resin with a metal film on a metal film of a long resin film with a metal film in which a metal film is formed on at least one surface of the long resin film. In a method for producing a metallized long resin film substrate in a plating apparatus that transports a film in the longitudinal direction and performs an electroplating film in a plating bath, a plurality of the long resin films with metal films are electrically charged in the longitudinal direction. A connecting part is provided between the adjacent metalized long resin films to be connected mechanically and mechanically, and while the connecting part is in contact with the power feeder of the electroplating apparatus, the anode ( The current flowing through the power feeding body is controlled so that the maximum value of the potential difference between the anode) and the power feeding body is within the range of 0.8 times to 1.7 times the potential difference during operation. Metalized long resin film It is a method for producing a beam substrate. That is, a long resin film with a metal film is immersed in a plating bath by a conveying means such as a roll, and the anode and a power feeder (power feeding rolls 16a, 16b, 16c, 16d, 16e in the plating apparatus 10 shown in FIG. 1) and Is a manufacturing method for producing a metallized long resin film substrate by electroplating on the metal film of a metallized long resin film with a potential difference of, in particular, a plurality of long resin films with metal films are continuously supplied A connecting portion that is electrically and mechanically connected in the longitudinal direction is provided between the long resin film with a metal film and a long resin film with a metal film adjacent thereto (following). While in contact with the power supply, the current flowing through the power supply is adjusted so that the maximum value of the potential difference between the anode and the power supply is within the range of 0.8 to 1.7 times the potential difference during operation. Control It is a manufacturing method comprising. In addition, the time of operation here means the time slot | zone when electroplating is performed when the connection part is not in contact with the electric power feeder.

互いに隣接する金属膜付長尺樹脂フィルムをその長手方向で電気的に接続するように接続部分を設けることにより、複数の前記金属膜付長尺樹脂フィルムがその長手方向において電気的に導通が常に確保される。導通が常に確保されることにより、めっき膜に電気めっきに起因する凹凸等の表面欠陥の発生を抑制することが可能となる。   By providing a connecting portion so as to electrically connect the long resin films with metal films adjacent to each other in the longitudinal direction, the plurality of long resin films with metal films are always electrically connected in the longitudinal direction. Secured. By always ensuring conduction, it is possible to suppress the occurrence of surface defects such as irregularities due to electroplating in the plating film.

電気めっき工程を考察すると、金属化長尺樹脂フィルム基板を製造工程中の電気めっき工程では、金属膜付長尺樹脂フィルム先頭部分(先端部分)と金属膜付長尺樹脂フィルム終了部分(終端部分)では、金属膜付長尺樹脂フィルムの中間部分のめっき条件の制御(電流制御)とは異なる立上げ制御および立下げ制御が必要となる。電気めっきでは、めっき液槽中での被めっき物の面積に対する電流密度を一定に保つことが、めっき膜の膜厚を一定に保つために必要である。かかる立上げ制御および立下げ制御は、被めっき面積の増加および減少に対応する電流制御を行うので、急激な電流の増減に起因する電気めっきによる表面欠陥の発生を引き起こす起点となる事が多い。しかし、互いに隣接する金属膜付長尺樹脂フィルムの間にこれら両者を電気的および機械的に接続させる接続部分を設けることにより、複数の金属膜付長尺樹脂フィルムが長手方向において電気的に導通が常に確保されるので、立上げ制御および立下げ制御の頻度を減らし、表面欠陥を抑制することができる。また、接続部分が給電体に接触する場合には、接触の前後の時期に金属膜付長尺樹脂フィルムと接続部分により形成される段差で給電体との接触が不安定となるので給電が不安定となってスパークが発生する恐れがある。しかし、アノードと給電体の間の電位差の最大値を、操業時の電位差の0.8倍以上1.7倍以下の範囲内になるように制御することにより、高電圧スパークの発生を抑制させることが可能となる。また、接続部分が給電体に接触視する場合に操業時の電位差の0.8倍以上とするのは、電位差を低下させる際の上述の立上げ制御又は立ち下げ制御と同様の電流制御を行うことを避けるためである。すなわち、電位差を操業時の0.8倍未満とすれば、電流値を増減させる範囲が広くなり、急激な電流の増減による表面欠陥の発生に影響する。   Considering the electroplating process, in the electroplating process during the manufacturing process of the metallized long resin film substrate, the top part of the long resin film with metal film (tip part) and the end part of the long resin film with metal film (terminal part) ) Requires start-up control and turn-down control different from control of the plating conditions (current control) of the intermediate portion of the long resin film with a metal film. In electroplating, it is necessary to keep the current density with respect to the area of the object to be plated in the plating bath constant in order to keep the thickness of the plating film constant. Since the start-up control and the fall-down control perform current control corresponding to the increase and decrease in the area to be plated, they often become a starting point that causes surface defects due to electroplating due to a sudden increase or decrease in current. However, by providing a connecting portion that electrically and mechanically connects both of the long resin films with metal films adjacent to each other, a plurality of long resin films with metal films are electrically connected in the longitudinal direction. Therefore, it is possible to reduce the frequency of start-up control and fall-down control and suppress surface defects. In addition, when the connection part comes into contact with the power supply body, the contact with the power supply body becomes unstable due to the step formed by the long resin film with metal film and the connection part before and after the contact. There is a risk of sparks becoming stable. However, by controlling the maximum value of the potential difference between the anode and the power supply so as to be within the range of 0.8 times to 1.7 times the potential difference during operation, the occurrence of high voltage spark is suppressed. It becomes possible. In addition, when the connection portion is in contact with the power feeder, the current difference is set to 0.8 times or more of the potential difference during operation to perform current control similar to the above-described start-up control or fall-down control when reducing the potential difference. This is to avoid that. That is, if the potential difference is less than 0.8 times that during operation, the range in which the current value is increased or decreased is widened, which affects the occurrence of surface defects due to a sudden increase or decrease in current.

図2を参照して、金属膜付長尺樹脂フィルムFの接続部分Aと給電ロール16の位置関係を説明する。図2(a)及び(b)は、金属膜付長尺樹脂フィルムFの接続部分Aと給電体である給電ロール16とが接触するときの位置関係を示す概略図である。スパークは、接続部分Aによって生じる段差と給電ロール16の間で発生する。さらに詳しく説明すると、接続部分Aの段差によって生じた接触面積が狭い部分などの高抵抗部分が給電ロール16に接触する際に、この狭い部分に一定値の電流を流そうとして高電圧となってスパークが発生する。スパーク痕は、金属膜付長尺樹脂フィルムFの接続部分Aの付近に発生する。スパークが発生した場合、給電ロール16の表面に汚れが発生し、この汚れに起因して金属化長尺樹脂フィルム基板に表面欠陥が発生する。   With reference to FIG. 2, the positional relationship of the connection part A of the elongate resin film F with a metal film and the feed roll 16 is demonstrated. 2A and 2B are schematic views showing a positional relationship when the connection portion A of the long resin film F with a metal film comes into contact with the power supply roll 16 that is a power supply body. The spark is generated between the step generated by the connection portion A and the power supply roll 16. More specifically, when a high resistance portion such as a portion having a narrow contact area caused by the step of the connection portion A comes into contact with the power supply roll 16, a high voltage is caused to flow a constant value through the narrow portion. Sparks are generated. The spark mark is generated in the vicinity of the connection portion A of the long resin film F with the metal film. When sparking occurs, dirt is generated on the surface of the power supply roll 16, and surface defects are generated in the metallized long resin film substrate due to the dirt.

給電ロール16とアノード間の電位差は、適宜に選択される。例えば、上述した図1のめっき装置10では、通常の操業すなわち接続部分ではない金属膜付長尺樹脂フィルムに電気めっきをする際にはアノードと給電ロールの間の電位差は3Vであるが、接触部分が給電ロールに接触している際には、最大電位差を5Vに抑制する(電流制御をかける)ことにより、スパークの発生を防ぐことができる。結果的にはスパークが発生しないので、表面欠陥が発生しない。なお、本発明の製造方法によらないでスパークを発生させた場合のスパークの電位は不明であるが、スパークが発生していない給電体は電圧が落ちていることから、相当な高い電位差が生じていると思われる。   The potential difference between the power supply roll 16 and the anode is appropriately selected. For example, in the plating apparatus 10 of FIG. 1 described above, when electroplating a long resin film with a metal film that is not a normal operation, that is, a connecting portion, the potential difference between the anode and the power supply roll is 3 V, but contact When the portion is in contact with the power supply roll, the occurrence of a spark can be prevented by suppressing the maximum potential difference to 5 V (applying current control). As a result, since no spark is generated, no surface defect is generated. Note that the spark potential when spark is generated without using the manufacturing method of the present invention is unknown, but since the voltage of the power feeder that does not generate spark is low, a considerable potential difference occurs. It seems that

図3から図5までを参照して、接続部分Aの各種例について説明する。   Various examples of the connection portion A will be described with reference to FIGS.

図3から図5までは、接続部分Aの金属膜付長尺樹脂フィルムFの幅方向からみた側面の概略を示す断面図である。   3 to 5 are cross-sectional views schematically showing the side surface of the long resin film F with a metal film in the connection portion A viewed from the width direction.

図3は、導電性テープ1を互いに隣接する金属膜付長尺樹脂フィルムF間でかつ金属膜Fa上に貼付した例を示す断面図である。図3の例では、金属膜付長尺樹脂フィルムの端面同士を突き合わせて、導電性テープ1を貼付して接続部分Aが形成されている。裏面テープ2は粘着テープであり、適宜用いることができる。図3の接続部分Aでは導電性テープ1と裏面テープ2により段差dが形成される。   FIG. 3 is a cross-sectional view showing an example in which the conductive tape 1 is affixed between the metal film-attached long resin films F adjacent to each other and on the metal film Fa. In the example of FIG. 3, the end surfaces of the long resin film with a metal film are brought into contact with each other, and the conductive tape 1 is applied to form the connection portion A. The back tape 2 is an adhesive tape and can be used as appropriate. In the connection portion A of FIG. 3, a step d is formed by the conductive tape 1 and the back surface tape 2.

図4は、金属膜付長尺樹脂フィルムFを重ね合わせて導電性テープ1と裏面テープ2で接続部分を形成した例を示す断面図である。図4の例では、金属膜付長尺樹脂フィルムFの重なり部分は両面粘着テープ3で貼り合わされている。導電性テープ1は金属膜Fa上に貼付する。   FIG. 4 is a cross-sectional view showing an example in which the connection portion is formed by the conductive tape 1 and the back surface tape 2 by overlapping the long resin film F with a metal film. In the example of FIG. 4, the overlapping portion of the long resin film F with the metal film is bonded with the double-sided adhesive tape 3. The conductive tape 1 is stuck on the metal film Fa.

図5は、導電性接着剤4を用いて接続部分を形成した金属膜付長尺樹脂フィルムの幅方向からみた例を示す断面図である。図5の例では、金属膜付長尺樹脂フィルムFの長手方向端部を重ね合わせて金属膜Faの導電性が確保できるように導電性接着剤4で接着すればよい。また、金属膜付長尺樹脂フィルムFの重ね合わせ部分には導電性接着剤4で適宜に接着してもよい。   FIG. 5 is a cross-sectional view illustrating an example of the long resin film with a metal film in which a connection portion is formed using the conductive adhesive 4 as seen from the width direction. In the example of FIG. 5, the conductive film 4 may be bonded to the metal film Fa so as to ensure the conductivity of the metal film Fa by overlapping the longitudinal ends of the long resin film F with the metal film. Moreover, you may adhere | attach suitably with the electrically conductive adhesive 4 to the overlapping part of the elongate resin film F with a metal film.

導電性接着剤4としては、めっき液に化学的に耐えることに留意して、公知の導電性接着剤を用いることができる。導電性接着剤4は、銀粉末や銅粉末などの導電粉末と、フェノール樹脂やエポキシ樹脂等の混合物で、金属膜付長尺樹脂フィルムに塗布して加熱等で硬化させることができる。   As the conductive adhesive 4, a known conductive adhesive can be used in consideration of being chemically resistant to the plating solution. The conductive adhesive 4 is a mixture of a conductive powder such as silver powder or copper powder and a phenol resin or an epoxy resin, and can be applied to a long resin film with a metal film and cured by heating or the like.

導電性テープ1としては、粘着部分と金属箔から構成される市販の金属箔テープを用いることができる。また、金属箔テープの導電性を考慮して銅箔の金属箔テープとすることが望ましい。金属箔テープの粘着部分は、めっき液に化学的に耐えることがでればよい。また、導電性テープ1は、その粘着部分が導電性を有することが必要である。   As the conductive tape 1, a commercially available metal foil tape composed of an adhesive portion and a metal foil can be used. Moreover, it is desirable to use a copper foil metal foil tape in consideration of the conductivity of the metal foil tape. The adhesive portion of the metal foil tape only needs to be chemically resistant to the plating solution. Moreover, the adhesive tape 1 needs that the adhesion part has electroconductivity.

上記の接続部分Aと金属膜付長尺樹脂フィルムFにより生じる段差dは複数の段差が形成されても良いが、1つの段差dの高低差が100μmを超えないことが望ましい。この理由は、1つの段差の高低差が100μmを超えた場合、段差の影響で給電体との接触が不安定になりスパークが発生する恐れがあるからである。ここで、段差dの高低差とは、金属膜付長尺樹脂フィルムFの面の法線方向の高低差をいう。
導電性テープ1の厚みは、テープ厚が20μmから100μmが望ましい。この理由は、テープ厚みが20μm未満では、金属箔が薄くなり、導電性テープ1の導電率が小さく(抵抗率が大きく)なり電気的な導通性が損なわれる一方、テープ厚みが100μmを超えたときは、テープ段差の影響でスパークの発生が懸念されるからである。
A plurality of steps may be formed as the step d caused by the connection portion A and the long resin film F with the metal film, but it is desirable that the height difference of one step d does not exceed 100 μm. This is because, when the height difference of one step exceeds 100 μm, the contact with the power feeder becomes unstable due to the step, and sparks may occur. Here, the height difference of the level difference d means a height difference in the normal direction of the surface of the long resin film F with a metal film.
The thickness of the conductive tape 1 is desirably 20 μm to 100 μm. The reason for this is that when the tape thickness is less than 20 μm, the metal foil becomes thin, the conductivity of the conductive tape 1 becomes small (the resistivity increases), and the electrical conductivity is impaired, while the tape thickness exceeds 100 μm. This is because there is a concern about the occurrence of sparks due to the tape step.

さらに、導電性テープ1と金属膜付長尺樹脂フィルムFとの間の電気抵抗値は、0.1Ω以下となることが望ましい。導電性テープ1を使用することによりスパーク発生の防止、外観品質の安定性を保つ事としており、接触抵抗値が満足するのであれば、導電性テープ1としては接着剤など別種を使用してもかまわないし、材質も金属性である事を特定はしない。   Furthermore, the electrical resistance value between the conductive tape 1 and the long resin film F with a metal film is preferably 0.1Ω or less. The use of the conductive tape 1 prevents the occurrence of sparks and maintains the stability of the appearance quality. If the contact resistance value is satisfied, the conductive tape 1 may use another type such as an adhesive. It does not matter and the material is not specified to be metallic.

長尺樹脂フィルムについて説明する。   The long resin film will be described.

長尺樹脂フィルムとしては、ポリイミドフィルム、ポリアミドフィルム、ポリエチレンナフタレートフィルム、ポリエステルフィルム、ポリテトラフルオロエチレン系フィルム、液晶ポリマーフィルム、ポリエーテルサルフォンフィルム等を用いることができる。これらの樹脂フィルムのうちポリイミドフィルムが、電気絶縁性、耐熱性、フレキシブル性で望ましい。なお、上述の図3に示す接続部分の構造によれば、長尺樹脂フィルムの問題となる。金属膜付長尺樹脂フィルムを重ね合わせて接続部分を構成する場合には、長尺樹脂フィルムの厚みは、金属膜の膜厚と接続部分の段差を考慮して50μm以下が望ましい。   As the long resin film, a polyimide film, a polyamide film, a polyethylene naphthalate film, a polyester film, a polytetrafluoroethylene film, a liquid crystal polymer film, a polyether sulfone film, or the like can be used. Of these resin films, a polyimide film is desirable in terms of electrical insulation, heat resistance, and flexibility. In addition, according to the structure of the connection part shown in the above-mentioned FIG. 3, it becomes a problem of a long resin film. In the case where the connection portion is configured by overlapping the long resin film with a metal film, the thickness of the long resin film is preferably 50 μm or less in consideration of the thickness of the metal film and the step of the connection portion.

金属膜付長尺樹脂フィルムFについて説明する。   The long resin film F with a metal film will be described.

金属膜付長尺樹脂フィルムFとは、上述の長尺樹脂フィルムの表面に金属膜を形成した(付した)長尺樹脂フィルムをいう。長尺樹脂フィルムの表面に金属膜を形成するとは、接着剤を用いずに金属膜を形成することをいう。すなわち、金属膜付長尺樹脂フィルムFは、長尺樹脂フィルムの表面に真空成膜法などで金属膜を形成した長尺樹脂フィルムである。金属膜付長尺樹脂フィルムFは、後述するように電気めっき工程を経て金属化長尺樹脂フィルム基板になる。   The long resin film F with a metal film refers to a long resin film in which a metal film is formed (applied) on the surface of the above-described long resin film. Forming a metal film on the surface of a long resin film means forming a metal film without using an adhesive. That is, the long resin film F with a metal film is a long resin film in which a metal film is formed on the surface of the long resin film by a vacuum film formation method or the like. As will be described later, the long resin film with metal film F becomes a metallized long resin film substrate through an electroplating process.

金属膜付長尺樹脂フィルムFは、上述の通り、真空成膜法で長尺樹脂フィルムの金属膜を成膜して製造される。真空成膜法には、真空蒸着法、スパッタリング法等の物理的成膜法、化学的気相成長法(CVD)等の化学的成膜法がある。具体的に説明すると、真空蒸着法は、抵抗加熱や電子銃照射により蒸発源の成膜材料を加熱蒸発させ、基材上に薄膜を形成する方法である。蒸着の際に、薄膜の密着性、緻密化を目的として、蒸発源と基材の間にプラズマを形成するプラズマアシスト蒸着法も知られている。   As described above, the long resin film with a metal film F is manufactured by forming a metal film of a long resin film by a vacuum film forming method. Examples of the vacuum film forming method include a physical film forming method such as a vacuum vapor deposition method and a sputtering method, and a chemical film forming method such as a chemical vapor deposition method (CVD). More specifically, the vacuum deposition method is a method of forming a thin film on a substrate by heating and evaporating a film forming material of an evaporation source by resistance heating or electron gun irradiation. A plasma-assisted vapor deposition method is also known in which plasma is formed between an evaporation source and a substrate for the purpose of adhesion and densification of a thin film during vapor deposition.

真空成膜法のうち、スパッタリング法が望ましい。スパッタリング法は、成膜材料をプレート状に成形したターゲットを用い、このターゲットを放電用電極として上記プラズマ発生方法を用いて基材とターゲットの間にプラズマを発生させ、電位勾配を用いてターゲット表面にイオンを照射衝突させることによって、ターゲット物質を叩き出して基材上にターゲット物質の薄膜を形成する方法である。スパッタリング法が望ましい理由は、磁場などでプラズマを制御できるからである。   Of the vacuum film forming methods, the sputtering method is desirable. The sputtering method uses a target obtained by forming a film forming material into a plate shape, generates plasma between the substrate and the target using the above plasma generation method using the target as an electrode for discharge, and uses the potential gradient to generate a target surface. In this method, the target material is knocked out by irradiating and colliding with ions to form a thin film of the target material on the substrate. The reason why the sputtering method is desirable is that the plasma can be controlled by a magnetic field or the like.

金属膜付長尺樹脂フィルムFの金属膜は、ニッケル、クロムおよび銅から選ばれた金属または、ニッケル、クロムおよび銅のいずれかを含む合金を選択することができる。例えば、上述の金属化ポリイミド基板(最表面の金属が銅である場合には、銅ポリイミド基板という。)であれば、ポリイミドフィルムの表面に真空成膜法で付する金属には、ニッケルおよびクロムまたは、ニッケルまたはクロムのいずれかを含む合金とすることが望ましい。ニッケルまたはクロムのいずれかを含む合金の組成は、公知の合金組成を銅ポリイミド基板の用途などから適宜に選択できる。ニッケルやクロムまたはそれらの合金を用いる理由は、ポリイミドフィルムと金属との密着性を向上させるためである。銅ポリイミド基板では、ニッケルやクロムまたはこれらのいずれかを含む合金の膜の表面に、銅層を真空成膜法で成膜する。銅層を成膜する理由は、電気めっきを行う際の導電性を確保するためである。電気めっきは、金属膜付長尺樹脂フィルムの銅層の表面に行われるからであり、銅はニッケルやクロムまたはそれらの合金などからすれば抵抗値が低いからである。   As the metal film of the long resin film F with the metal film, a metal selected from nickel, chromium and copper or an alloy containing any of nickel, chromium and copper can be selected. For example, in the case of the above-mentioned metallized polyimide substrate (when the outermost metal is copper, it is referred to as a copper polyimide substrate), the metal applied to the surface of the polyimide film by a vacuum film forming method includes nickel and chromium. Alternatively, an alloy containing either nickel or chromium is desirable. As the composition of the alloy containing either nickel or chromium, a known alloy composition can be appropriately selected from the use of the copper polyimide substrate. The reason for using nickel, chromium, or an alloy thereof is to improve the adhesion between the polyimide film and the metal. In a copper polyimide substrate, a copper layer is formed on a surface of a film of nickel, chromium, or an alloy containing any of these by a vacuum film formation method. The reason for forming the copper layer is to ensure conductivity when performing electroplating. This is because electroplating is performed on the surface of the copper layer of the long resin film with a metal film, and copper has a low resistance value if it is made of nickel, chromium, or an alloy thereof.

ここでは、銅ポリイミド基板用の金属膜付長尺樹脂フィルムについて説明したが、銅ポリイミド基板用の金属膜付長尺樹脂フィルムは、ポリイミドフィルム、ニッケルやクロムまたはこれらのいずれかを含む合金膜、銅層の順に積層されている。ここで、ニッケルやクロムまたはこれらのいずれかを含む合金膜を下地金属層と呼ぶ。下地金属層と銅層の積層膜が金属膜となる。   Here, a long resin film with a metal film for a copper polyimide substrate has been described, but a long resin film with a metal film for a copper polyimide substrate is a polyimide film, nickel or chromium, or an alloy film containing any of these, The copper layers are stacked in this order. Here, nickel, chromium, or an alloy film containing any of these is referred to as a base metal layer. A laminated film of the base metal layer and the copper layer becomes a metal film.

金属膜付長尺樹脂フィルムの製法で真空成膜法の他には、無電解めっき法などを行うこともできる。   In addition to the vacuum film forming method for producing a long resin film with a metal film, an electroless plating method or the like can also be performed.

金属化長尺樹脂フィルム基板について説明する。   The metallized long resin film substrate will be described.

金属化長尺樹脂フィルム基板は、上述の金属膜付長尺樹脂フィルムFの金属膜上に電気めっきでめっき膜を形成して製造される。例えば、金属化長尺樹脂フィルム基板の一種である上述の銅ポリイミド基板では、ポリイミドフィルムに真空成膜法の一種であるスパッタリング法でニッケルやクロムまたはこれらのいずれかを含む合金層からなる前記下地金属層と前記下地金属層の上に銅層をポリイミドフィルムに積層した金属膜付長尺樹脂フィルムFに、前記銅層の上に銅電気めっきで銅めっき膜を成膜して製造する。金属膜付長尺樹脂フィルムFの下地金属層と銅層は合わせて数Åから数千Åまでの厚みであり、銅めっき膜の厚みは数μmから数百μmまでの厚みを形成する。なお、銅電気めっきに先立ち、前記銅層の上に無電解めっき法を適宜行うことができる。
(実験例1)
The metallized long resin film substrate is manufactured by forming a plating film on the metal film of the long resin film with metal film F described above by electroplating. For example, in the above-mentioned copper polyimide substrate, which is a kind of metallized long resin film substrate, the base comprising a nickel film, a chromium film, or an alloy layer containing any of these by sputtering, which is a kind of vacuum film forming method. It is manufactured by forming a copper plating film on the copper layer by copper electroplating on a long resin film F with a metal film in which a copper layer is laminated on a polyimide film on the metal layer and the base metal layer. The base metal layer and the copper layer of the long resin film F with the metal film have a total thickness of several to several thousand, and the thickness of the copper plating film forms a thickness of several to several hundred μm. In addition, prior to copper electroplating, an electroless plating method can be appropriately performed on the copper layer.
(Experiment 1)

図1のめっき装置10で電気めっきを行った。   Electroplating was performed with the plating apparatus 10 of FIG.

長尺樹脂フィルムに東レ・デュポン製のポリイミドフィルム150EN−F(厚さ38μm、幅524mm)の表面にスパッタリング法でニッケル7%クロムの下地金属層を膜厚75Åに成膜し、下地金属層の表面に銅層を成膜して金属膜(合計膜厚1100Å)を積層した金属膜付長尺樹脂(ポリイミド)フィルムを得た。接続部分Aは、金属膜付長尺樹脂フィルムFを図2に示すようにつき合わせて導電性テープ(銅テープ:大日本インキ化学工業株式会社製、薄型銅箔テープ E−1100LC 18μm厚銅箔、粘着層22μm 幅50mm)で接続して形成した。金属膜付長尺樹脂フィルムFには膜厚8μmとなるように銅めっき膜を形成して金属化長尺ポリイミドフィルム基板Sとした。通常のめっきの電位差は3Vととした。電流密度は、電源23aが0.01A/cm、電源23bが0.02A/cm、電源23cが0.03A/cm、電源23dが0.04A/cm、電源23eが0.04A/cmとなるように設定した。導電性テープ1(接続部分A)が給電ロール16と接触している間の電圧が5Vを超えない様に電流制御し連続製造したところ、接続部分の0〜10m間(一対の給電ロールとアノードにより電気めっきが施される範囲。すなわち電流密度が保持される範囲)の50mm×50mmあたりの20〜50μm径の凹凸個数が0.2個/50mm□となった。接続部分から10m〜20m離れた箇所でも0.2個/50mm□であった。さらに接続部分から20m〜30m離れた箇所では、0.3個/50mm□であった。従って接続部分の表面欠陥としては実用の範囲であった。 A base metal layer of nickel 7% chromium was formed on a surface of a polyimide resin 150EN-F (thickness 38 μm, width 524 mm) made by Toray DuPont on a long resin film by a sputtering method to a thickness of 75 mm. A copper film was formed on the surface, and a metal film-attached long resin (polyimide) film in which a metal film (total film thickness 1100 mm) was laminated was obtained. As shown in FIG. 2, the connecting portion A is a conductive tape (copper tape: manufactured by Dainippon Ink & Chemicals, Inc., thin copper foil tape E-1100LC 18 μm thick copper foil). Adhesive layer 22 [mu] m wide 50 mm) and connected. A copper-plated film was formed on the long resin film F with a metal film so as to have a film thickness of 8 μm to obtain a metalized long polyimide film substrate S. The potential difference of normal plating was 3V. Current density, power 23a is 0.01 A / cm 2, the power 23b is 0.02 A / cm 2, the power 23c is 0.03 A / cm 2, power 23d is 0.04 A / cm 2, the power supply 23e 0.04 A / Cm 2 was set. When the current was controlled so that the voltage while the conductive tape 1 (connection portion A) was in contact with the power supply roll 16 did not exceed 5V, the tape was continuously manufactured between 0 to 10 m (a pair of power supply roll and anode). The number of irregularities with a diameter of 20 to 50 μm per 50 mm × 50 mm in the range in which electroplating is performed, that is, the range in which the current density is maintained was 0.2 / 50 mm □. The number was 0.2 / 50 mm □ even at a location 10 m to 20 m away from the connection portion. Furthermore, it was 0.3 piece / 50mm (square) in the location 20m-30m away from the connection part. Therefore, the surface defects at the connection portion were within the practical range.

なお、上述の表面欠陥の評価結果は、めっきの開始時や終了時の立ち上げ制御や立ち下げ制御時の評価結果ではない。めっきを開始した立ち上げ制御では金属化ポリイミドフィルムSでは先端(0m)から20mまでは、20μm〜50μm径の凹凸が1.0個/50mm□以上であり、実用に耐えず、廃棄する必要がある。また、立ち下げ制御でも終端(0m)から20mまでの凹凸の発生状況は同様であった。本発明の金属化長尺樹脂(ポリイミド)フィルム基板の製造方法を用いることで、金属化ポリイミドフィルム基板を連続して操業でき、立ち上げ制御および立ち下げ制御の回数を減らすことが可能となり、製品の廃棄量が激減する。
(実験例2)
Note that the above-described evaluation results of surface defects are not evaluation results at the time of start-up control or start-up control at the start or end of plating. In the start-up control after the start of plating, the metalized polyimide film S has 1.0 μm / 50 mm □ or more of irregularities with a diameter of 20 μm to 50 μm from the tip (0 m) to 20 m, which is not practical and must be discarded. is there. Further, in the falling control, the occurrence of unevenness from the end (0 m) to 20 m was the same. By using the metallized long resin (polyimide) film substrate manufacturing method of the present invention, the metallized polyimide film substrate can be operated continuously, and the number of start-up and turn-off controls can be reduced. The amount of waste is drastically reduced.
(Experimental example 2)

実験例1と同様の方法で金属化ポリイミドフィルムSを製造した場合、外観検査で白ムラ状の20μm以下の微小凹凸発生が面積費で0%のものが製造された。
(比較例1)
When the metallized polyimide film S was produced by the same method as in Experimental Example 1, a white unevenness-like fine unevenness of 20 μm or less was produced by an area inspection with an area cost of 0%.
(Comparative Example 1)

図2に示されるように金属膜付長尺樹脂フィルムFと金属膜付長尺樹脂フィルムFとを突き合わせて形成する接続部分Aに導電性テープ1を使用せずに導電性テープ1に代えて非導電性のマスキングテープで接続して電流制御を行わず連続製造したところ、給電ロール16cと接続部分で瞬間電流が50Aを超えるスパークが発生し、接続部分Aの近傍の基板表面欠陥が激増した。表面欠陥が多く、実用に耐えないものであった。
(実験例3)
As shown in FIG. 2, the conductive tape 1 is used instead of the conductive tape 1 in the connection portion A formed by abutting the long resin film F with the metal film and the long resin film F with the metal film. When connected with a non-conductive masking tape and continuously manufactured without current control, a spark with an instantaneous current exceeding 50 A occurred at the connecting portion with the feeding roll 16c, and the substrate surface defects near the connecting portion A increased dramatically. . There were many surface defects, and it was not practical.
(Experimental example 3)

図2に示される金属膜付長尺樹脂フィルムFと金属膜付長尺樹脂フィルムFとを突き合わせて形成された接続部分Aの導電性テープ1に35μm厚銅箔、粘着層35μm 幅25mmのスリーエム製導電性テープを用いた以外は実験例1と同様の方法で金属化ポリイミドフィルムを製造した。この場合、外観検査でも白ムラ状の凹凸20μm以下の微小凹凸発生が面積比で23%発生するものが出来た。しかし、凹凸が20μm以下の表面欠陥の微小凹凸なので銅ポリイミド基板としては実用可能な範囲である。
(実験例4)
3m with 35 μm thick copper foil, 35 μm adhesive layer and 25 mm width on the conductive tape 1 of the connecting portion A formed by abutting the long resin film F with metal film and the long resin film F with metal film shown in FIG. A metalized polyimide film was produced in the same manner as in Experimental Example 1 except that a conductive tape was used. In this case, even in the appearance inspection, a white uneven unevenness of 20 μm or less was generated with an area ratio of 23%. However, since the irregularities are minute irregularities with surface defects of 20 μm or less, it is in a practical range as a copper polyimide substrate.
(Experimental example 4)

スリーエム製導電性テープの貼付を金属膜付長尺樹脂フィルムに実験例3よりも密着するよう押さえ付けた以外は実験例3と同じ条件で、電気めっきした。接続部分から10m〜20m離れた箇所でも0.3個/50mm□であった。接続部分から0m〜10m離れた箇所では、0.4個/50mm□であった。   Electroplating was performed under the same conditions as in Experimental Example 3, except that the 3M conductive tape was pressed against the long resin film with a metal film so as to adhere more closely than in Experimental Example 3. The number was 0.3 / 50 mm □ even at a location 10 m to 20 m away from the connection portion. It was 0.4 pieces / 50mm □ in the place 0m-10m away from the connection part.

図6を参照して、実験例4において、金属化長尺樹脂フィルム基板Sにおける直径20μm〜50μmの凹凸の平均出現頻度について説明する。図6は、接続部分Aから終端方向に向かって120mまでの凹凸の出現頻度を表すグラフである。   With reference to FIG. 6, the average appearance frequency of the unevenness | corrugation of 20 micrometers-50 micrometers in diameter in the metallization long resin film board | substrate S in Experimental example 4 is demonstrated. FIG. 6 is a graph showing the appearance frequency of irregularities from the connection portion A to the end direction of 120 m.

図6の横軸は、接続部分Aによって連続させられた金属化長尺樹脂フィルム基板の先端部又は接続部分からの距離(m)を表し、縦軸は、直径20μm〜50μmの凹凸の50mm×50mmでの平均出現頻度を表す。図6に表す平均出現頻度は、金属化長尺樹脂フィルム基板Sを長手方向10mごとの直径20μm〜50μmの凹凸の個数を測定(画像処理)し、その凹凸が50mm×50mm面積あたりどのくらい出現するかを示す指標である。   The horizontal axis of FIG. 6 represents the distance (m) from the front-end | tip part or connection part of the metallization long resin film board | substrate continued by the connection part A, and a vertical axis | shaft is 50 mm x unevenness | corrugation with a diameter of 20 micrometers-50 micrometers. The average appearance frequency at 50 mm is expressed. The average appearance frequency shown in FIG. 6 is determined by measuring the number of irregularities having a diameter of 20 μm to 50 μm for every 10 m in the longitudinal direction of the metallized long resin film substrate S (image processing), and how many the irregularities appear per 50 mm × 50 mm area. It is an indicator that shows.

本発明は、接続部分Aを設けなければ、それぞれの金属化長尺樹脂フィルム基板の先端と終端は比較例のように凹凸が多数発生するが、互いに分離している金属膜付長尺樹脂フィルムFを接続部分Aを設けて接続することにより複数の金属化樹脂フィルム基板が電気的及び機械的に接続されるので、比較例のような凹凸の多発は、連続した金属化長尺樹脂フィルム基板Sの先端と終端にのみ発生して、それぞれの金属化長尺樹脂フィルム基板Sでの先端や終点での凹凸の多発を防ぐ効果がある。   In the present invention, if the connection portion A is not provided, the front and end of each metallized long resin film substrate have many irregularities as in the comparative example, but the long resin film with metal film is separated from each other. Since a plurality of metallized resin film substrates are electrically and mechanically connected by providing F with a connecting portion A, the occurrence of irregularities as in the comparative example is a continuous metallized long resin film substrate It occurs only at the front end and the end of S, and there is an effect of preventing the occurrence of unevenness at the front end and end point of each metallized long resin film substrate S.

本発明の金属化ポリイミドフィルムはフレキシブルプリント配線板に好適に利用される。   The metallized polyimide film of the present invention is suitably used for flexible printed wiring boards.

10 めっき装置
11 めっき液槽
12 巻き出しロール
14a,14b,14c,14d,14e アノード(陽極)
15 巻取りロール
16a,16b,16c,16d,16e 給電ロール
21 光電センサー
22 制御器
23a、23b、23c、23d、23e 電源
A 接続部分
L めっき液
F 金属膜付長尺樹脂フィルム
S 金属化長尺樹脂フィルム基板
DESCRIPTION OF SYMBOLS 10 Plating apparatus 11 Plating solution tank 12 Unwinding roll 14a, 14b, 14c, 14d, 14e Anode (anode)
15 Winding rolls 16a, 16b, 16c, 16d, 16e Feeding roll 21 Photoelectric sensor 22 Controllers 23a, 23b, 23c, 23d, 23e Power supply A Connection portion L Plating solution F Long resin film with metal film S Metalized long Resin film substrate

Claims (9)

長尺樹脂フィルムの少なくとも一方の面に金属膜が形成された金属膜付長尺樹脂フィルムの前記金属膜上に、前記金属膜付長尺樹脂フィルムをその長手方向に搬送しながらめっき液槽で電気めっき膜を形成することにより金属化長尺樹脂フィルム基板を製造する製造方法において、
複数の前記金属膜付長尺樹脂フィルムをその長手方向に電気的および機械的に接続させる互いに隣接する前記金属化長尺樹脂フィルムの間に接続部分を設け、
該接続部分が、前記電気めっき装置の給電体と接触している間は、前記めっき液槽内部のアノード(陽極)と前記給電体の間の電位差の最大値が、操業時の電位差の0.8倍以上1.7倍以下の範囲内になるように前記給電体に流す電流を制御することを特徴とする金属化長尺樹脂フィルム基板の製造方法。
On the metal film of the long resin film with a metal film having a metal film formed on at least one surface of the long resin film, in the plating solution tank, the long resin film with the metal film is conveyed in the longitudinal direction. In the manufacturing method of manufacturing a metallized long resin film substrate by forming an electroplated film,
Providing a connecting portion between the metallized long resin films adjacent to each other for electrically and mechanically connecting the plurality of long resin films with metal films in the longitudinal direction;
While the connecting portion is in contact with the power supply body of the electroplating apparatus, the maximum value of the potential difference between the anode (anode) inside the plating bath and the power supply body is 0. 0 of the potential difference during operation. A method for producing a metallized long resin film substrate, characterized in that the current flowing through the power feeder is controlled so as to fall within a range of 8 times to 1.7 times.
前記金属膜は、ニッケル、クロムおよび銅から選ばれた金属、または、ニッケル、クロムおよび銅のいずれかを含む合金であり、
前記電気めっきは、銅電気めっきであることを特徴とする請求項1に記載の金属化長尺樹脂フィルム基板の製造方法。
The metal film is a metal selected from nickel, chromium and copper, or an alloy containing any of nickel, chromium and copper,
The said electroplating is copper electroplating, The manufacturing method of the metallization long resin film board | substrate of Claim 1 characterized by the above-mentioned.
前記金属膜は、真空成膜法で成膜されたものであることを特徴とする請求項1又は2に記載の金属化長尺樹脂フィルム基板の製造方法。   The method for producing a metallized long resin film substrate according to claim 1 or 2, wherein the metal film is formed by a vacuum film formation method. 前記長尺樹脂フィルムはポリイミドフィルムであることを特徴とする請求項1,2,又は3に記載の金属化長尺樹脂フィルム基板の製造方法。   The said long resin film is a polyimide film, The manufacturing method of the metallized long resin film board | substrate of Claim 1, 2, or 3 characterized by the above-mentioned. 前記接続部分は、導電性粘着テープの貼付または導電性接着剤での接着で形成されているものであることを特徴とする請求項1から4までのうちのいずれか一項に記載の金属化長尺樹脂フィルム基板の製造方法。   5. The metallization according to claim 1, wherein the connection portion is formed by applying a conductive adhesive tape or bonding with a conductive adhesive. 6. A method for producing a long resin film substrate. 前記接続部分と前記金属膜付長尺樹脂フィルムで形成される各段差の高低差が100μm以下であることを特徴とする請求項5に記載の金属化長尺樹脂フィルム基板の製造方法。   6. The method for producing a metallized long resin film substrate according to claim 5, wherein a difference in height of each step formed by the connecting portion and the long resin film with a metal film is 100 μm or less. 前記導電性粘着テープの厚みが20μmから100μmであること特徴とする請求項5又は6に記載の金属化長尺樹脂フィルム基板の製造方法。   The method for producing a metallized long resin film substrate according to claim 5 or 6, wherein the conductive adhesive tape has a thickness of 20 µm to 100 µm. 前記金属膜付長尺樹脂フィルムと、前記金属膜付長尺樹脂フィルムに貼付された前記導電性粘着テープの間の電気抵抗が0.1Ω以下であることを特徴とする請求項5から7のうちのいずれか一項に記載の金属化長尺樹脂フィルム基板の製造方法。 8. The electrical resistance between the long resin film with a metal film and the conductive adhesive tape affixed to the long resin film with a metal film is 0.1Ω or less . The manufacturing method of the metallization long resin film board | substrate as described in any one of them . めっき液が収容されためっき液槽と、該めっき液槽内に設置されたアノード(陽極)と、長尺樹脂フィルムの少なくとも一方の面に金属膜が形成された金属膜付長尺樹脂フィルムの幅方向を水平に保ってその長手方向に搬送しながら前記金属膜付長尺樹脂フィルムを前記めっき液槽に浸漬させる搬送手段と、前記めっき液槽外にあって前記金属膜付長尺樹脂フィルムの金属膜に給電する給電体と、該給電体に流す電流を制御しながら電力を供給する電源を備えためっき装置において、
複数の互いに離れて隣接する前記金属膜付長尺樹脂フィルムをその長手方向に電気的および機械的に接続させる前記金属化長尺樹脂フィルムの間に配置された接続部分と、
前記金属膜付長尺樹脂フィルムの搬送経路上の前記めっき浴槽の前でかつ前記給電手段の前に配置された、前記接続部分を検出する接続部検出手段と、
前記接続部検出手段が前記接続部分の検出の信号を受けて、前記接続部分が給電体と接触している間は、前記給電体と前記アノード間の電位差の最大値が、操業時の電位差の0.8倍以上1.7倍以下の範囲内になるように前記電源を制御する制御手段を備えたことを特徴とするめっき装置。
A plating solution tank containing a plating solution, an anode (anode) installed in the plating solution tank, and a long resin film with a metal film in which a metal film is formed on at least one surface of the long resin film A conveying means for immersing the long resin film with a metal film in the plating solution tank while keeping the width direction horizontal and conveying in the longitudinal direction; and the long resin film with a metal film outside the plating solution tank In a plating apparatus provided with a power supply that supplies power to the metal film of the power supply and a power supply that supplies power while controlling the current flowing through the power supply,
A plurality of connecting portions disposed between the metallized long resin films that electrically and mechanically connect the long resin films with metal films adjacent to each other in the longitudinal direction;
A connecting part detecting means for detecting the connecting part, disposed in front of the plating bath on the transport path of the long resin film with metal film and in front of the power feeding means,
While the connection part detection means receives the detection signal of the connection part and the connection part is in contact with the power feeding body, the maximum value of the potential difference between the power feeding body and the anode is the potential difference during operation. A plating apparatus comprising control means for controlling the power supply so as to fall within a range of 0.8 times to 1.7 times.
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