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JP5423602B2 - Low dielectric constant insulating resin composition - Google Patents
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JP5423602B2 - Low dielectric constant insulating resin composition - Google Patents

Low dielectric constant insulating resin composition Download PDF

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JP5423602B2
JP5423602B2 JP2010160945A JP2010160945A JP5423602B2 JP 5423602 B2 JP5423602 B2 JP 5423602B2 JP 2010160945 A JP2010160945 A JP 2010160945A JP 2010160945 A JP2010160945 A JP 2010160945A JP 5423602 B2 JP5423602 B2 JP 5423602B2
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dielectric constant
low dielectric
insulating resin
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高示 森田
伸 高根沢
貴子 渡▲辺▼
雄介 淺川
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Resonac Corp
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Showa Denko Materials Co Ltd
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Description

本発明は、低誘電率であり、さらに耐熱性、ガラス転移温度及びピール強度などの特性にも優れる低誘電率絶縁性樹脂組成物、絶縁性樹脂ワニス、プリプレグ、絶縁性樹脂フィルム、積層板及び多層配線板に関する。   The present invention is a low dielectric constant insulating resin composition, an insulating resin varnish, a prepreg, an insulating resin film, a laminate, and a low dielectric constant, which are also excellent in characteristics such as heat resistance, glass transition temperature, and peel strength. The present invention relates to a multilayer wiring board.

近年、コンピュータ及び情報機器端末などに含まれる通信機器においては、大量のデータを高速で処理するため、データ伝送量の増大が求められている。その一環として、電気信号の高周波化が進行している。しかし、電気信号に高周波数成分が増えると、伝送経路に遅延が生じることにより信号波形が歪むこと、強度が減衰しやすくなり伝送経路での損失が増えること、信号の反射が増えること、伝送経路での不要な輻射が増えることという問題がある。そのため、高周波帯の本格的な利用を進めるためには、広帯域でインピーダンスを制御して、例えばプリント配線板用基板材料の誘電特性の制御、例えば誘電率を低く制御して(低誘電率化)、損失や反射を低減させることが必要である。そこで、電気信号を高速かつ低伝送損失で処理できる、低誘電率化したプリント配線板用基板材料が求められている。また、実用化には、誘電特性に加えて、耐熱性(ガラス転移温度、熱に対する寸法安定性を含む等)、接着性、機械的強度(例えばピール強度)などの特性も併せ持つことが肝要である。   In recent years, communication devices included in computers and information device terminals have been required to increase the amount of data transmission in order to process a large amount of data at high speed. As part of this, the frequency of electrical signals is increasing. However, when high frequency components increase in the electrical signal, the signal waveform is distorted due to the delay in the transmission path, the strength is easily attenuated, the loss in the transmission path increases, the reflection of the signal increases, the transmission path There is a problem that unnecessary radiation increases. Therefore, in order to promote full-fledged use of the high frequency band, the impedance is controlled in a wide band, for example, the dielectric property of the printed wiring board substrate material is controlled, for example, the dielectric constant is lowered (lower dielectric constant). It is necessary to reduce loss and reflection. Therefore, a printed circuit board material having a low dielectric constant capable of processing electrical signals at high speed with low transmission loss is desired. In addition, it is important for practical use to have characteristics such as heat resistance (including glass transition temperature and dimensional stability against heat), adhesion, and mechanical strength (for example, peel strength) in addition to dielectric properties. is there.

低誘電率化は、例えば、絶縁性樹脂組成物に、絶縁性樹脂組成物の比誘電率を低減させる目的の、その絶縁性樹脂組成物とは異なる物質である低誘電率化剤を混合し、その混合比率を制御して、得られる低誘電率絶縁性樹脂組成物の比誘電率を調整していた。絶縁性樹脂組成物への混合方法は、低誘電率化剤と樹脂(絶縁性樹脂組成物)と直接接触させる接触的混合、あるいは低誘電率化剤の表面を樹脂(絶縁性樹脂組成物)に対して不活性な材料で被覆した低誘電率化剤を樹脂(絶縁性樹脂組成物)と間接的に接触させる非接触的混合であった。接触的混合方法としては、低誘電率化剤を樹脂(絶縁性樹脂組成物)に均一溶解する方法、低誘電率化剤を樹脂(絶縁性樹脂組成物)に分散混合させる方法等がある。しかし、これらの方法では、求める比誘電率の調整は可能であるが、耐熱性、ガラス転移温度及びピール強度などの特性が低下するという問題がある。例えば、均一溶解(相溶化)する場合、絶縁性樹脂組成物の反応速度(例えば硬化速度)の低下、或いは上昇をまねき、反応制御が困難となる等の化学的特性の面で、加えて耐熱性(ガラス転移温度、熱に対する寸法安定性を含む等)、接着性、機械的強度(例えばピール強度)等の物理特性の面で、絶縁性樹脂組成物そのものから予測される各種の特性が低下する。このため、絶縁性樹脂組成物に低誘電率化剤を接触的混合させた場合には、所望の性能すべてが得られないという問題があった。粒子分散の場合においても同様な問題があった(特許文献1)。   Low dielectric constant is achieved by, for example, mixing an insulating resin composition with a low dielectric constant agent that is a substance different from the insulating resin composition for the purpose of reducing the relative dielectric constant of the insulating resin composition. The mixing ratio was controlled to adjust the relative dielectric constant of the obtained low dielectric constant insulating resin composition. The mixing method to the insulating resin composition is the contact mixing in which the low dielectric constant agent and the resin (insulating resin composition) are in direct contact, or the surface of the low dielectric constant agent is resin (insulating resin composition). It was non-contact mixing in which a low dielectric constant agent coated with a material inert to the resin was indirectly contacted with a resin (insulating resin composition). Examples of the contact mixing method include a method of uniformly dissolving a low dielectric constant agent in a resin (insulating resin composition), a method of dispersing and mixing the low dielectric constant agent in a resin (insulating resin composition), and the like. However, these methods can adjust the required dielectric constant, but have a problem that characteristics such as heat resistance, glass transition temperature, and peel strength are deteriorated. For example, in the case of uniform dissolution (compatibility), in addition to heat resistance in terms of chemical properties such as lowering or increasing the reaction rate (for example, curing rate) of the insulating resin composition, it becomes difficult to control the reaction. Various properties predicted from the insulating resin composition itself are reduced in terms of physical properties such as adhesiveness (including glass transition temperature, dimensional stability against heat, etc.), adhesion, and mechanical strength (for example, peel strength). To do. For this reason, when a low dielectric constant agent is contact-mixed with the insulating resin composition, there is a problem that not all desired performance can be obtained. There was a similar problem in the case of particle dispersion (Patent Document 1).

また、絶縁性樹脂組成物に非接触的混合させる場合には、樹脂(絶縁性樹脂組成物)と中空材とを混合する方法、樹脂(絶縁性樹脂組成物)に発泡剤を混合して絶縁性樹脂組成物の硬化物内に空隙を設ける方法(空隙配設)、低誘電率化剤を樹脂(絶縁性樹脂組成物)に不活性なコーティング材料で被覆して混合する方法(被覆混合)が挙げられる(特許文献2及び3)。しかし、空隙配設の場合には、機械的強度の点で問題があった。また、被覆混合の場合は、樹脂(絶縁性樹脂組成物)製コーティング材料では樹脂に対する分散性が悪く、均質化が困難であり、またセラミックス製コーティング材料では機械的強度が不十分であると共に、絶縁性樹脂組成物の加工が困難であるという問題があった。
そのため、絶縁性樹脂組成物について、特定の特性のみを調整でき、かつ耐熱性、ガラス転移温度及びピール強度などの特性の性能に悪影響を及ぼさない、樹脂用低誘電率化剤が求められている。
In addition, when non-contact mixing is performed with the insulating resin composition, a method of mixing the resin (insulating resin composition) and the hollow material, and mixing the foaming agent with the resin (insulating resin composition) for insulation A method of providing voids in the cured product of the conductive resin composition (void arrangement), a method of coating the low dielectric constant agent on the resin (insulating resin composition) with an inert coating material and mixing (coating mixing) (Patent Documents 2 and 3). However, there is a problem in terms of mechanical strength in the case of the gap arrangement. In the case of coating mixing, the resin (insulating resin composition) coating material has poor dispersibility to the resin and is difficult to homogenize, and the ceramic coating material has insufficient mechanical strength. There was a problem that it was difficult to process the insulating resin composition.
Therefore, there is a need for a low dielectric constant agent for resins that can adjust only specific characteristics of the insulating resin composition and that does not adversely affect the performance of characteristics such as heat resistance, glass transition temperature, and peel strength. .

特公表2004−513503号公報Japanese Patent Publication No. 2004-513503 特開平8−253625号公報JP-A-8-253625 特開平6−62346号公報JP-A-6-62346

本発明の目的は、低誘電率であり、耐熱性、ガラス転移温度及びピール強度などの特特性にも優れる、低誘電率絶縁性樹脂組成物を提供することにある。   An object of the present invention is to provide a low dielectric constant insulating resin composition which has a low dielectric constant and excellent properties such as heat resistance, glass transition temperature and peel strength.

本発明者らは上記の課題を解決するために鋭意研究した結果、本発明に到達した。
本発明は、絶縁性樹脂組成物及び低誘電率化剤を含む低誘電率絶縁性樹脂組成物であって、
該低誘電率化剤が、多孔性物質と、該多孔性物質内に埋め込まれた低誘電率化成分とで構成され、かつ該低誘電率化剤中の低誘電率化成分の誘電率が、該絶縁性樹脂組成物の誘電率よりも小さい低誘電率絶縁性樹脂組成物に関する(発明1)。
ここで、「埋め込まれている」とは、低誘電率化成分が多孔性物質内に存在するが、低誘電率化成分と絶縁性樹脂組成物が接触しても、誘電率以外の他の特性、例えば耐熱性、ガラス転移温度及びピール強度などの特性に悪影響を及ぼさない(相互作用を回避する状態である)。例えば、低誘電化率成分と絶縁性樹脂組成物の接触部の各々の面積は、低誘電率化成分と絶縁性樹脂組成物との相互作用を回避する接触面積である。接触面積は、多孔性物質の細孔径から算出することができ、多孔性物質の表面の平均細孔径が1〜1000nmであることが好ましい。
As a result of intensive studies to solve the above problems, the present inventors have reached the present invention.
The present invention is a low dielectric constant insulating resin composition comprising an insulating resin composition and a low dielectric constant agent,
The low dielectric constant agent is composed of a porous material and a low dielectric constant component embedded in the porous material, and the dielectric constant of the low dielectric constant component in the low dielectric constant agent is And an insulating resin composition having a low dielectric constant smaller than the dielectric constant of the insulating resin composition (Invention 1).
Here, “embedded” means that a low dielectric constant component exists in the porous material, but even if the low dielectric constant component and the insulating resin composition are in contact with each other, other than the dielectric constant, It does not adversely affect properties such as heat resistance, glass transition temperature and peel strength (a state in which interaction is avoided). For example, the area of each contact portion between the low dielectric constant component and the insulating resin composition is a contact area that avoids the interaction between the low dielectric constant component and the insulating resin composition. The contact area can be calculated from the pore diameter of the porous material, and the average pore diameter on the surface of the porous material is preferably 1 to 1000 nm.

本発明は、低誘電率であり、耐熱性、ガラス転移温度及びピール強度などの特性にも優れる、低誘電率絶縁性樹脂組成物を達成したものである。   The present invention achieves a low dielectric constant insulating resin composition having a low dielectric constant and excellent properties such as heat resistance, glass transition temperature and peel strength.

図1は、本発明の充填多孔質シリカ、並びに未充填多孔質シリカの断面観察SEM写真である。FIG. 1 is a cross-sectional observation SEM photograph of filled porous silica of the present invention and unfilled porous silica.

本発明によれば、低誘電率化剤は、多孔性物質内に低誘電率化成分を埋め込ませるため、低誘電率化成分を多孔性物質内に充填し、固定化して構成される。低誘電率化剤(多孔性物質)外部の絶縁性樹脂組成物と、低誘電率化成分との相互作用を回避させる面積内で接触するため、低誘電率絶縁性樹脂組成物の比誘電率を低減しながらも、低誘電率絶縁性樹脂組成物の他の特性(耐熱性(ガラス転移温度、熱に対する寸法安定性を含む等)、接着性、機械的強度(例えばピール強度))の性能は維持される。   According to the present invention, the low dielectric constant agent is configured by filling the low dielectric constant component in the porous material and immobilizing it in order to embed the low dielectric constant component in the porous material. Low dielectric constant agent (porous material) The dielectric constant of the low dielectric constant insulating resin composition is in contact with the insulating resin composition outside the area in order to avoid interaction with the low dielectric constant component. Performance of other characteristics (heat resistance (including glass transition temperature, dimensional stability against heat, etc.), adhesiveness, mechanical strength (for example, peel strength)) with low dielectric constant insulating resin composition Is maintained.

ここで、多孔性物質の細孔に、他の物質を充填した複合体が知られている(特許文献2及び特許文献3)。特許文献2は、多孔質シリカにシリコーン硬化物を充填して撥水性とした撥水性粉末が開示されている。また、特許文献3は、多孔質シリカに、イオン交換樹脂・キレート樹脂を充填して、複合体の表面積を増大させた、クロマトグラム等の分離・吸着剤が開示されている。これらは、いずれも、多孔性物質の表面又は内部に介在させた作用物質(シリコーン硬化物又はイオン交換樹脂・キレート樹脂)を、対象物質(水又は金属など)と接触させ、対象物質に作用を及ぼすことを目的としている。よって、本発明のように、多孔性物質内に作用物質(低誘電率化成分)を埋め込み、対象物質(絶縁性樹脂組成物)との所望しない相互作用を回避させるように接触をさせるものとは、その構造及び作用・機能が異なる。   Here, composites in which pores of a porous material are filled with other materials are known (Patent Documents 2 and 3). Patent Document 2 discloses a water-repellent powder that is made water-repellent by filling a porous silica with a silicone cured product. Patent Document 3 discloses a separation / adsorbent such as a chromatogram in which porous silica is filled with an ion exchange resin / chelate resin to increase the surface area of the composite. All of these are made to contact the target substance (water or metal, etc.) with the active substance (silicone cured product or ion exchange resin / chelate resin) intervened on the surface or inside of the porous substance, and act on the target substance. The purpose is to affect. Therefore, as in the present invention, an active substance (low dielectric constant component) is embedded in a porous substance, and contact is made so as to avoid an unwanted interaction with the target substance (insulating resin composition). Are different in structure, action and function.

本発明の多孔性物質は、細孔を有し、樹脂に対して不活性である材料であれば材質は限定されない。細孔は、独立細孔以外に、多孔性物質外部に通じ、細孔同士が連関していることが好ましい。多孔性物質の材質は、例えばシリカ、シリカゲル、ガラス、アルミナ、ゼオライト、水酸化アルミニウム等の金属水酸化物、珪藻土、ケイ酸カルシウム等のケイ酸塩、リン酸カルシウム等のリン酸塩、炭酸カルシウム等の炭酸塩、活性炭、アクリル樹脂、ポリイミド樹脂、ウレタン樹脂、キトサン樹脂、ポリシロキサン樹脂、シリコーンゴム、酢酸セルロース樹脂などが挙げられる。多孔性物質としては、好ましくは無機多孔性物質であり、多孔質シリカであることがより好ましい。   The material of the porous material of the present invention is not limited as long as the material has pores and is inert to the resin. In addition to the independent pores, it is preferable that the pores lead to the outside of the porous material and are associated with each other. The material of the porous material is, for example, silica, silica gel, glass, alumina, zeolite, metal hydroxide such as aluminum hydroxide, diatomaceous earth, silicate such as calcium silicate, phosphate such as calcium phosphate, calcium carbonate, etc. Examples thereof include carbonate, activated carbon, acrylic resin, polyimide resin, urethane resin, chitosan resin, polysiloxane resin, silicone rubber, and cellulose acetate resin. The porous material is preferably an inorganic porous material, and more preferably porous silica.

また、本発明の多孔性物質の形状も特に限定されない。例えば、球状、鱗片状、針状、無結晶粉末状、板状、ハニカム状などが挙げられる。球状である場合、樹脂の流動性を制御できるので好ましい。表面の平均細孔径は1〜1000nmであることが好ましく、1〜100nmであることがより好ましく、1〜50nmであることがより好ましい。表面の平均細孔径が1nm以上であると、低誘電率化成分の充填が容易であり、1000nm以下であると、低誘電率化成分と樹脂と相互作用が回避される接触面積である。   Further, the shape of the porous material of the present invention is not particularly limited. For example, spherical shape, scale shape, needle shape, amorphous powder shape, plate shape, honeycomb shape and the like can be mentioned. A spherical shape is preferable because the fluidity of the resin can be controlled. The average pore diameter on the surface is preferably 1 to 1000 nm, more preferably 1 to 100 nm, and more preferably 1 to 50 nm. When the average pore diameter on the surface is 1 nm or more, filling of the low dielectric constant component is easy, and when it is 1000 nm or less, the contact area is such that interaction between the low dielectric constant component and the resin is avoided.

本発明の多孔性物質の平均粒径は、0.05〜100μmであることが好ましく、0.1〜10μmであることがより好ましい。多孔性物質への低誘電率化成分の充填量としては、多孔性物質の表面上に存在させないことを考慮すると、細孔容積〜100未満容積%であることが好ましい。充填量は、低誘電率化成分が高充填であるほど、多孔性物質の機械的強度が高くなる。また、多孔性物質内部、例えば独立細孔内に誘電率が1と低い空気を多く存在させると、多孔性物質自体の誘電率が低くなり、低誘電率化剤の低誘電率化効果が高くなる。低誘電率化成分の充填量が細孔容積の100容積%未満であると、多孔性物質の細孔内に低誘電率化成分が埋め込まれ、多孔性物質の表面上に存在していない。細孔容積はJIS K 5101−13−1精製あまに油法の吸油量に換算して10〜700ml/100gであることが好ましく、50〜500ml/100gであることがより好ましい。吸油量が10ml/100g以上であると、誘電率の調整効果が有意であり、700ml/100g以下であると、多孔性物質の強度が充分である。本発明における細孔容積は、多孔性物質外部に通じる細孔の容積であり、独立細孔の容積は含まれない。
本発明の多孔性物質として、材質、形状、平均細孔径、吸油量、平均粒径が異なる、2種類以上の多孔性物質を用いることができる。
The average particle size of the porous material of the present invention is preferably 0.05 to 100 μm, and more preferably 0.1 to 10 μm. The filling amount of the dielectric constant-reducing component into the porous material is preferably from pore volume to less than 100% by volume, considering that it does not exist on the surface of the porous material. As for the filling amount, the higher the filling of the low dielectric constant component, the higher the mechanical strength of the porous material. Further, if a large amount of air having a low dielectric constant of 1 is present in the porous material, for example, in the independent pores, the dielectric constant of the porous material itself is lowered, and the low dielectric constant agent has a high effect of reducing the dielectric constant. Become. When the filling amount of the low dielectric constant component is less than 100% by volume of the pore volume, the low dielectric constant component is embedded in the pores of the porous material and does not exist on the surface of the porous material. The pore volume is preferably 10 to 700 ml / 100 g, more preferably 50 to 500 ml / 100 g in terms of oil absorption by the JIS K 5101-13-1 refined linseed oil method. When the oil absorption is 10 ml / 100 g or more, the effect of adjusting the dielectric constant is significant, and when it is 700 ml / 100 g or less, the strength of the porous material is sufficient. The pore volume in the present invention is the volume of pores communicating with the outside of the porous material, and does not include the volume of independent pores.
As the porous substance of the present invention, two or more kinds of porous substances having different materials, shapes, average pore diameters, oil absorptions, and average particle diameters can be used.

本発明で多孔性物質に埋め込む低誘電率化成分は、多孔性物質外側の絶縁性樹脂組成物より誘電率が低ければ、特に限定されない。低誘電率化を考慮すると、絶縁性樹脂組成物よりも誘電率が0.2以上低いことが好ましい The low dielectric constant component embedded in the porous material in the present invention is not particularly limited as long as the dielectric constant is lower than that of the insulating resin composition outside the porous material. In consideration of lowering the dielectric constant, the dielectric constant is preferably 0.2 or more lower than that of the insulating resin composition .

絶縁性樹脂組成物への低誘電率化成分の溶解を抑制するために、低誘電率化成分が、20℃以上で固体であることが好ましく、23℃以上で固体であることがより好ましい。加えて、絶縁性樹脂組成物の溶剤に不溶であることが好ましい。
また、多孔性物質に埋め込む際の取扱い性を考慮すると、低誘電率化成分は、加圧又は加熱により流動性を有する、すなわち溶剤を用いずに流動性を有することが好ましい。これは、溶剤のような揮発性物質を用いて流動性を得ると、加熱・乾燥時、或いは貯蔵時に溶剤が揮発する場合があるので、低誘電化率成分の固定及び充填の制御を考慮すると、溶剤を用いないことが好ましい
In order to suppress dissolution of the low dielectric constant component in the insulating resin composition, the low dielectric constant component is preferably solid at 20 ° C. or higher, and more preferably solid at 23 ° C. or higher. In addition, it is preferably insoluble in the solvent of the insulating resin composition.
In consideration of handleability when embedding in a porous material, the low dielectric constant component preferably has fluidity by pressurization or heating, that is, has fluidity without using a solvent. This is because if the fluidity is obtained using a volatile substance such as a solvent, the solvent may volatilize during heating / drying or storage, so when considering the fixation and filling control of the low dielectric constant component It is preferable not to use a solvent .

加熱により流動性を得る場合、流動点又は融点の温度は、多孔性物質の機械的強度が維持される温度範囲であることが好ましい。製造環境等を考慮すると、融点は、100〜200℃であることが好ましい。
流動点以上の粘度が10000ポイズ(1kPa・s)以下であると好ましい。
When obtaining fluidity by heating, the temperature of the pour point or melting point is preferably in the temperature range in which the mechanical strength of the porous material is maintained. Considering the production environment and the like, the melting point is preferably 100 to 200 ° C.
The viscosity above the pour point is preferably 10,000 poise (1 kPa · s) or less.

低誘電率化成分としては、例えば、ポリエチレン、ポリプロピレンのようなポリオレフィン、ポリプロピレンエーテル、ポリアミド、ポリアミドイミド、ポリアリレート、熱可塑ポリイミド、ポリエーテルエーテルケトン、ポリエチレンオキシド、ポリエチレンテレフタレート、ポリ塩化ビニリデン、ポリ塩化ビニル、ポリカーボネート、ポリ酢酸ビニル、ポリスチレン、ポリブタジエン、ポリビニルエーテル等の熱可塑樹脂、エポキシ樹脂、キシレン樹脂、グアナミン樹脂、ジアリルフタレート樹脂、不飽和ポリエステル樹脂、フェノール樹脂、不飽和ポリエステル樹脂、ポリイミド、ポリウレタン、マレイン樹脂、メラミン樹脂、ユリア樹脂等の熱硬化性樹脂、エポキシアクリレート等の感光性樹脂が挙げられる。   Low dielectric constant components include, for example, polyolefins such as polyethylene and polypropylene, polypropylene ether, polyamide, polyamideimide, polyarylate, thermoplastic polyimide, polyetheretherketone, polyethylene oxide, polyethylene terephthalate, polyvinylidene chloride, and polychlorinated chloride. Thermoplastic resin such as vinyl, polycarbonate, polyvinyl acetate, polystyrene, polybutadiene, polyvinyl ether, epoxy resin, xylene resin, guanamine resin, diallyl phthalate resin, unsaturated polyester resin, phenol resin, unsaturated polyester resin, polyimide, polyurethane, Examples thereof include thermosetting resins such as maleic resin, melamine resin and urea resin, and photosensitive resins such as epoxy acrylate.

また、埋め込む低誘電率化成分は単一でも、2種類以上用いることができる。低誘電率化成分は、熱硬化性であることが好ましい。あるいは低誘電率化成分が、リン酸エステル又はポリオレフィンであることが好ましい。リン酸エステルとしては、例えば〔(CH32632P(O)OC64OP(O)〔C63(CH32〕が挙げられる。 In addition, a single low dielectric constant component can be embedded, or two or more types can be used. The low dielectric constant component is preferably thermosetting. Alternatively, the low dielectric constant component is preferably a phosphate ester or a polyolefin. Examples of the phosphate ester include [(CH 3 ) 2 C 6 H 3 ] 2 P (O) OC 6 H 4 OP (O) [C 6 H 3 (CH 3 ) 2 ].

本発明の目的の範囲内において、多孔性物質内に、低誘電率化成分と、耐熱性、ガラス転移温度及びピール強度などの特性を調整する成分(難燃性調整成分、密度調整成分、離型性調整成分、帯電防止成分、抗菌性成分、防臭成分等)とを介在させる、或いは兼用させることができる。   Within the scope of the object of the present invention, a low dielectric constant component and a component for adjusting characteristics such as heat resistance, glass transition temperature and peel strength (a flame retardant adjusting component, a density adjusting component, a release agent) are included in the porous material. Moldability adjusting component, antistatic component, antibacterial component, deodorizing component, etc.) may be interposed or combined.

本発明による、多孔性物質内に低誘電率化成分を固定する方法として、埋め込み方法により例示する。埋め込み方法としては、毛細管現象を利用して、充填することが簡便である。充填方法は、例えば、液状の低誘電率化成分と多孔性物質を撹拌して細孔内に充填する方法、加圧下で液状の低誘電率化成分と多孔性物質を撹拌して細孔内に充填する方法、減圧してから液状の低誘電率化成分に多孔性物質を投入し撹拌して細孔内に充填する方法、予め多孔性物質と低誘電率化成分を混合しておき加熱により低誘電率化成分を溶解して細孔内に充填する方法、予め多孔性物質と低誘電率化成分を混合しておき減圧してから加熱により低誘電率化成分を溶解して細孔内に充填する方法、予め多孔性物質と低誘電率化成分を混合しておき加圧、加熱により低誘電率化成分を溶解して細孔内に充填する方法、低誘電率化成分を溶剤等で溶解して多孔性物質と撹拌し細孔内に充填する方法、低誘電率化成分を溶剤等で溶解して多孔性物質と撹拌し細孔内に充填した後、加熱により溶剤を除去する方法、低誘電率化成分を溶剤等で溶解して多孔性物質と撹拌し細孔内に充填した後、減圧加熱により溶剤を除去する方法が挙げられる。低誘電率化成分が充填された多孔性物質は、低誘電率化剤として使用する前に多孔性物質外部に残る低誘電率化成分を除去するために、溶剤等で洗浄することができる。   An example of a method for fixing a low dielectric constant component in a porous material according to the present invention is an embedding method. As an embedding method, it is easy to fill using a capillary phenomenon. The filling method is, for example, a method of stirring the liquid low dielectric constant component and the porous material into the pores, or stirring the liquid low dielectric constant component and the porous material under pressure to fill the pores. The method of filling in the pores, the method of charging the porous material into the liquid low dielectric constant component after reducing the pressure, stirring and filling the pores, the porous material and the low dielectric constant component are mixed in advance and heated The method of dissolving the low dielectric constant component and filling it in the pores by mixing the porous material and the low dielectric constant component in advance, reducing the pressure and then dissolving the low dielectric constant component by heating A method of filling inside, a method in which a porous material and a low dielectric constant component are mixed in advance, and the low dielectric constant component is dissolved by pressurization and heating to fill the pores, and the low dielectric constant component is a solvent A method of stirring with a porous material and filling the pores with a porous material, etc. The method of removing the solvent by heating after filling the pores with the quality of the material, dissolving the low dielectric constant component with a solvent, etc., stirring with the porous material and filling the pores, and then heating the solvent under reduced pressure The method of removing is mentioned. The porous material filled with the low dielectric constant component can be washed with a solvent or the like in order to remove the low dielectric constant component remaining outside the porous material before being used as a low dielectric constant agent.

また、本発明によれば、多孔性物質内に低誘電率化成分を固定する方法について、低誘電率化成分を充填する前に低誘電率化成分の充填性を高めるために、オリゴマー又はシランカップリン剤等で多孔性物質の細孔表面を処理することができる。
低誘電率化成分を充填した低誘電率化剤は、分散性を高めるために、オリゴマー又はシランカップリング剤あるいは混合する絶縁性樹脂組成物等で、充填した多孔質物質の表面処理することができ、粉砕等の処理を行って粒径を小さくすることができる。
このように、多孔性物質内に毛細管現象等で充填する場合、低誘電化剤は製造が容易で安価である。
Further, according to the present invention, in the method of fixing the low dielectric constant component in the porous material, the oligomer or silane is used to increase the filling property of the low dielectric constant component before filling the low dielectric constant component. it can be processed pore surfaces of the porous material a cup-rings agent.
Lower dielectric constant material filled with low dielectric constant component, in order to enhance the dispersibility, etc. in the oligomer or silane coupling agent or a mixed insulative resin composition, to the surface treatment of filled porous material The particle size can be reduced by performing a treatment such as pulverization.
Thus, when filling a porous material by capillary action or the like, the low dielectric agent is easy to manufacture and inexpensive.

本発明の絶縁性樹脂組成物は電気絶縁性を有すれば、特に限定されない。例えばポリエチレン、ポリプロピレン、ポリアミド、ポリアミドイミド、ポリアリレート、熱可塑性ポリイミド、ポリエーテルエーテルケトン、ポリエチレンオキサイド、ポリエチレンテレフタレート等の熱可塑樹脂、エポキシ樹脂、ポリイミド樹脂、トリアジン樹脂、フェノール樹脂、メラミン樹脂等の熱硬化性樹脂、エポキシアクリレート等の感光性樹脂等が挙げられる。また、絶縁性樹脂組成物は単一でも、2種類以上用いることができる。絶縁性樹脂組成物は、熱硬化性であることが好ましい。絶縁性樹脂組成物は、エポキシ樹脂であることが好ましい。   The insulating resin composition of the present invention is not particularly limited as long as it has electrical insulating properties. For example, heat of thermoplastic resins such as polyethylene, polypropylene, polyamide, polyamideimide, polyarylate, thermoplastic polyimide, polyether ether ketone, polyethylene oxide, polyethylene terephthalate, epoxy resin, polyimide resin, triazine resin, phenol resin, melamine resin, etc. Examples thereof include curable resins and photosensitive resins such as epoxy acrylate. Moreover, even if the insulating resin composition is single, it can use 2 or more types. The insulating resin composition is preferably thermosetting. The insulating resin composition is preferably an epoxy resin.

本発明には、絶縁性樹脂組成物の硬化剤を使用することができ、従来公知の種々のものを使用することができる。例えば、樹脂としてエポキシ樹脂を用いる場合には、ジシアンジアミド、ジアミノジフェニルメタン、ジアミノジフェニルスルフォン、無水フタル酸、無水ピロメリット酸、フェノールノボラックやクレゾールノボラック等の多官能性フェノール等をあげることができる。これらの硬化剤は何種類かを併用することも可能である。促進剤の種類や配合量は特に限定するものではなく、例えばイミダゾール系化合物、有機リン系化合物、第3級アミン、第4級アンモニウム塩等が用いられ、2種類以上を併用することができる。   In the present invention, a curing agent for the insulating resin composition can be used, and various conventionally known ones can be used. For example, when an epoxy resin is used as the resin, examples thereof include dicyandiamide, diaminodiphenylmethane, diaminodiphenylsulfone, phthalic anhydride, pyromellitic anhydride, polyfunctional phenols such as phenol novolac and cresol novolac. Several kinds of these curing agents can be used in combination. The kind and amount of the accelerator are not particularly limited. For example, an imidazole compound, an organic phosphorus compound, a tertiary amine, a quaternary ammonium salt, or the like is used, and two or more kinds can be used in combination.

本発明の低誘電率化剤の配合率は、絶縁性樹脂組成物の5〜80容積%であることが好ましく、10〜60容積%であることが特に好ましい。低誘電率化剤の配合率が5容積%以上であると、誘電率の低減効果が有意であり、80容積%以下であると、絶縁性樹脂組成物の取扱いが容易である。ここで、配合率は、それぞれの配合量(重量)に比重を掛けて算出した。比重は、絶縁性樹脂組成物(未硬化の状態)(例えば、エポキシ樹脂)の比重:1.2、多孔性物質(例えば、多孔質シリカ)の比重:2.2、低誘電化成分(例えば、縮合リン酸エステル)の比重:1.15である。   The blending ratio of the low dielectric constant agent of the present invention is preferably 5 to 80% by volume, and particularly preferably 10 to 60% by volume of the insulating resin composition. When the blending ratio of the low dielectric constant agent is 5% by volume or more, the effect of reducing the dielectric constant is significant, and when it is 80% by volume or less, the insulating resin composition is easily handled. Here, the blending ratio was calculated by multiplying the blending amount (weight) by the specific gravity. Specific gravity of insulating resin composition (uncured state) (for example, epoxy resin): 1.2, specific gravity of porous material (for example, porous silica): 2.2, low dielectric component (for example, The specific gravity of the condensed phosphate ester is 1.15.

また、低誘電率化剤の樹脂に対する分散性を向上するために、ニーダー、ボールミル、ビーズミル、三本ロール、ナノマイザー等既知の混練方法、あるいは低誘電率化剤を粉砕し粒径を小さくすることができる。
このように、本発明の低誘電化剤は、絶縁性樹脂組成物に物理的に混合するのみで、その機能を発揮するため、従来の絶縁性樹脂組成物の製造工程を変更する必要がなく、取扱いが容易である。
In order to improve the dispersibility of the low dielectric constant agent in the resin, the kneader, ball mill, bead mill, three rolls, nanomizer and other known kneading methods or the low dielectric constant agent should be pulverized to reduce the particle size. Can do.
Thus, since the low dielectric agent of the present invention exerts its function only by physically mixing with the insulating resin composition, there is no need to change the conventional manufacturing process of the insulating resin composition. Easy to handle.

本発明の絶縁性樹脂組成物を希釈する溶剤は、絶縁性樹脂組成物を溶解できれば、限定されない。例えば、メチルエチルケトン、ヘキサン、キシレン、トルエン、アセトン、エチレングリコールモノエチルエーテル、シクロヘキサノン、エチルエトキシプロピオネート、N,N−ジメチルホルムアミド、N,N−ジメチルアセトアミド等が挙げられる。これらの溶剤は、単独あるいは混合系を用いることができる。この溶剤の前記樹脂に対する割合は、絶縁性樹脂組成物を塗工する設備にあわせてその使用量を調整する。   The solvent for diluting the insulating resin composition of the present invention is not limited as long as the insulating resin composition can be dissolved. Examples thereof include methyl ethyl ketone, hexane, xylene, toluene, acetone, ethylene glycol monoethyl ether, cyclohexanone, ethyl ethoxypropionate, N, N-dimethylformamide, N, N-dimethylacetamide and the like. These solvents can be used alone or in a mixed system. The ratio of the solvent to the resin is adjusted according to the equipment for applying the insulating resin composition.

本発明の絶縁性樹脂組成物には、本発明の目的の範囲内において、充填剤、添加剤、他の強化繊維材等を添加することができる。例えば、添加剤としては、難燃剤、酸化防止剤、熱安定剤、帯電防止剤、可塑剤、カップリング剤、顔料、染料、着色剤、ゴム等が挙げられる。   In the insulating resin composition of the present invention, fillers, additives, other reinforcing fiber materials, and the like can be added within the scope of the object of the present invention. For example, examples of the additive include a flame retardant, an antioxidant, a heat stabilizer, an antistatic agent, a plasticizer, a coupling agent, a pigment, a dye, a colorant, and rubber.

低誘電率絶縁性樹脂組成物をガラスクロスやガラス不織布、有機織布や有機不織布に塗工してプリプレグを作製する場合は、溶剤を除く樹脂の固形分が絶縁性樹脂ワニスの20〜80重量%となるように溶剤の使用量を調節することが好ましい。低誘電率絶縁性樹脂組成物をコンマコータでキャリアフィルムや銅箔に塗工して絶縁フィルムを作製する場合は、溶剤を除く樹脂の固形分が絶縁性樹脂ワニスの30〜60重量%となるように溶剤の使用量を調節することが好ましい。 When a low dielectric constant insulating resin composition is applied to glass cloth, glass nonwoven fabric, organic woven fabric or organic nonwoven fabric to produce a prepreg, the solid content of the resin excluding the solvent is 20 to 80 weight of the insulating resin varnish. It is preferable to adjust the amount of the solvent used so that it becomes%. When an insulating film is produced by applying a low dielectric constant insulating resin composition to a carrier film or copper foil with a comma coater , the solid content of the resin excluding the solvent is 30 to 60% by weight of the insulating resin varnish. It is preferable to adjust the amount of the solvent used.

本発明の低誘電率絶縁性樹脂組成物を用いたプリプレグは、従来、一般的に行われている製造法をそのまま適用することができる。すなわち、本発明のプリプレグは本発明の低誘電率絶縁性樹脂組成物を基材に含浸、塗工してなるものであり、基材としては各種の電気絶縁材料用積層板に用いられている周知のものが使用できる。基材の材質の例としては、Eガラス、Dガラス、Sガラス又はQガラス等の無機物繊維、ポリイミド、ポリエステル又はテトラフルオロエチレン等の有機繊維、及びそれらの混合物等が挙げられる。これらの基材は、例えば織布、不織布、ロービンク、チョップドストランドマット、サーフェシングマット等の形状を有するが、材質及び形状は、目的とする成形物の用途や性能により選択され必要により単独若しくは2種類以上の材質及び形状からの使用が可能である。基材の厚みには特に制限されないが、通常0.03〜0.5mm程度のものを使用し、シランカップリング剤等で表面処理したものや機械的に開繊処理を施したものは耐熱性や耐湿性、加工性の面から好適である。通常、該基材に対する低誘電率絶縁性樹脂組成物の付着量が、乾燥後のプリプレグの樹脂含有率で20〜90重量%となるように基材に含浸又は塗工した後、通常100〜200℃の温度で1〜30分加熱乾燥し、半硬化状態(Bステージ状態)のプリプレグを得る。   The prepreg using the low dielectric constant insulating resin composition of the present invention can be applied with conventional production methods as it is. That is, the prepreg of the present invention is obtained by impregnating and coating the base material with the low dielectric constant insulating resin composition of the present invention, and the base material is used in various laminates for electrical insulating materials. A well-known thing can be used. Examples of the material of the substrate include inorganic fibers such as E glass, D glass, S glass, and Q glass, organic fibers such as polyimide, polyester, and tetrafluoroethylene, and mixtures thereof. These base materials have, for example, woven fabric, non-woven fabric, low-ink, chopped strand mat, surfacing mat, and the like, and the material and shape are selected depending on the intended use and performance of the molded product, and may be single or 2 as necessary. It can be used from more than a variety of materials and shapes. Although there is no particular limitation on the thickness of the base material, a material with a thickness of about 0.03 to 0.5 mm is usually used, and surface treated with a silane coupling agent or the like or mechanically subjected to fiber opening treatment is heat resistant. And from the viewpoint of moisture resistance and workability. Usually, after the base material is impregnated or coated so that the amount of the low dielectric constant insulating resin composition attached to the base material is 20 to 90% by weight in terms of the resin content of the prepreg after drying, it is usually 100 to 100%. Heat-dry at a temperature of 200 ° C. for 1 to 30 minutes to obtain a semi-cured state (B stage state) prepreg.

前述のプリプレグを用いて積層成形することにより積層板を作製することができる。積層成形は一般的な方法をそのまま適用することができ、例えば本発明のプリプレグを通常1〜20枚重ね、その片面もしくは両面に銅やアルミニウム等の金属箔を配置した構成で加熱加圧により成形することにより積層板とすることができる。金属箔はプリント配線板材料用途で用いられているものであれば特に制限されない。成形条件としては通常の電気絶縁材料用積層板及び多層板の手法が適用でき、例えば多段プレス、多段真空プレス、連続成形、オートクレーブ成形機等を使用し、通常、温度100〜250℃、圧力2〜100kg/cm、加熱時間0.1〜5時間の範囲で成形する。 A laminate can be produced by laminate molding using the above-described prepreg. Laminate molding can be applied by general methods as it is, for example, usually 1 to 20 prepregs of the present invention are stacked, and a metal foil such as copper or aluminum is arranged on one or both sides by heating and pressing. It can be set as a laminated board by doing. The metal foil is not particularly limited as long as it is used for printed wiring board materials. As the molding conditions, conventional laminates for electrical insulating materials and multilayer boards can be applied. For example, a multi-stage press, a multi-stage vacuum press, continuous molding, an autoclave molding machine, etc. are used. Molding is performed in a range of ˜100 kg / cm 2 and a heating time of 0.1 to 5 hours.

本発明の絶縁フィルムに用いる支持基材には、銅やアルミニウム等の金属箔、ポリエステルやポリイミド等の樹脂フィルム、あるいはこれらの樹脂フィルムの表面に離型剤を塗布したものなどを用いることができる。支持基材に銅箔を用いた場合は、銅箔をそのまま回路導体として使用することができる利点があり、また支持基材に離型剤処理が施されていると支持基材から絶縁フィルムを引き剥がす際や支持基材付フィルムを基板に積層した後支持基材だけを剥離する際の作業性を向上させる上で好ましい。   As the support substrate used for the insulating film of the present invention, a metal foil such as copper or aluminum, a resin film such as polyester or polyimide, or a resin film with a release agent applied to the surface thereof can be used. . When copper foil is used for the support substrate, there is an advantage that the copper foil can be used as a circuit conductor as it is, and when the release agent treatment is applied to the support substrate, an insulating film is removed from the support substrate. It is preferable for improving workability when peeling off only the supporting base material after peeling or laminating the film with the supporting base material on the substrate.

このように支持基材の片面に絶縁性の樹脂層を形成した絶縁フィルムは、以下に示す方法によって多層配線板の製造に供することができる。例えば、支持基材を除去したフィルム状の絶縁フィルムを1枚又は複数枚積層しその上下に銅箔を配置してプレス成形するか、あるいは支持基材である銅箔に絶縁性樹脂ワニスを塗工した絶縁フィルムをフィルム同士合わせるように貼り合わせ、さらに必要ならばその間に基材を除去した絶縁フィルムを1枚以上介在させてプレス成形することによって多層配線板用の積層板を製造することができる。   Thus, the insulating film which formed the insulating resin layer in the single side | surface of a support base material can be used for manufacture of a multilayer wiring board by the method shown below. For example, one or a plurality of film-like insulating films from which the supporting base material has been removed are laminated and copper foil is placed on the top and bottom of the film, or press molding is performed, or an insulating resin varnish is applied to the copper foil that is the supporting base material. A laminated board for a multilayer wiring board can be manufactured by laminating the processed insulating films so that the films are combined, and further press-molding with one or more insulating films from which the substrate is removed if necessary. it can.

本発明の低誘電率絶縁性樹脂組成物のプリプレグ及び絶縁フィルムを用いた多層プリント配線板の製造法について説明する。まず、本発明の低誘電率絶縁性樹脂組成物をパターン加工された内層回路基板上に積層する。その方法は本発明の低誘電率絶縁性樹脂組成物からなるプリプレグ及び絶縁フィルムを1枚以上積層し、さらにその上に銅箔や回路形成基板を配置して加圧、加熱条件下で基板上にラミネート又はプレスして加熱硬化させる。なお、回路形成基板としてはガラスエポキシ基板、金属基板、ポリエステル基板、ポリイミド基板、BTレジン基板、熱硬化型PPE基板などを使用することができ、回路表面は予め粗化処理することができる。加熱硬化の条件は、温度120℃以上、好ましくは170〜220℃で、通常15〜300分、好ましくは60〜150分加熱硬化させて製造することができる。   The manufacturing method of the multilayer printed wiring board using the prepreg and insulating film of the low dielectric constant insulating resin composition of this invention is demonstrated. First, the low dielectric constant insulating resin composition of the present invention is laminated on a patterned inner layer circuit board. The method includes laminating one or more prepregs and insulating films made of the low dielectric constant insulating resin composition of the present invention, and further placing a copper foil or a circuit-forming substrate on the substrate under pressure and heating conditions. Laminate or press to heat cure. As the circuit formation substrate, a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, a thermosetting PPE substrate, or the like can be used, and the circuit surface can be roughened in advance. The heat curing conditions are a temperature of 120 ° C. or higher, preferably 170 to 220 ° C., and usually 15 to 300 minutes, preferably 60 to 150 minutes.

上記のように基板上に本発明の低誘電率絶縁性樹脂組成物を積層し硬化させた後、ドリルおよび/又はレーザー穴明けを行ない、スルーホールやバイアホールを形成させる。レーザー穴明け機には、炭酸ガスレーザー、YAGレーザー、エキシマレーザーなどを用いることができる。その後、無電解銅めっき、金属蒸着、スパッタリング、イオンプレーティングなどの手法を用いて内層と外層の電気的導通を得た後は、通常のプリント配線板における回路形成方法を用いて、積層した本発明の低誘電率絶縁性樹脂組成物の表面に回路形成を行う。   After laminating and curing the low dielectric constant insulating resin composition of the present invention on the substrate as described above, drilling and / or laser drilling is performed to form through holes and via holes. As the laser drilling machine, a carbon dioxide laser, a YAG laser, an excimer laser, or the like can be used. Then, after obtaining electrical continuity between the inner layer and the outer layer using techniques such as electroless copper plating, metal vapor deposition, sputtering, ion plating, etc., the laminated book using the circuit forming method in a normal printed wiring board Circuit formation is performed on the surface of the low dielectric constant insulating resin composition of the invention.

本発明の低誘電率絶縁性樹脂組成物の用途としては、自動車部品、電子・電気部品等が挙げられる。電子・電気部品としては、例えば回路基板用積層板材料、半導体封止材料等が挙げられる。   Applications of the low dielectric constant insulating resin composition of the present invention include automobile parts, electronic / electric parts, and the like. Examples of the electronic / electrical component include circuit board laminate materials and semiconductor sealing materials.

次に、下記の実施例により本発明をさらに詳しく説明するが、これらの実施例は本発明をいかなる意味においても制限するものではない。   Next, the present invention will be described in more detail with reference to the following examples, but these examples are not intended to limit the present invention in any way.

表面処理剤の作製
撹拌装置、コンデンサー及び温度計を備えたガラスフラスコに、ジメトキシジメチルシラン20g、テトラメトキシシラン25g及びメタノール105gを配合した溶液を導入し、その後酢酸0.60g及び蒸留水17.8gを添加して、50℃で8時間撹拌した。シロキサン単位の重合度が30であるシロキサン系表面処理剤を合成した。得られたシロキサン系表面処理剤は、水酸基と反応する末端管能基としてメトキシ基及びシラノール基を有するものである。
Preparation of surface treatment agent A solution containing 20 g of dimethoxydimethylsilane, 25 g of tetramethoxysilane and 105 g of methanol was introduced into a glass flask equipped with a stirrer, a condenser and a thermometer, and then 0.60 g of acetic acid and 17.8 g of distilled water. Was added and stirred at 50 ° C. for 8 hours. A siloxane-based surface treating agent having a siloxane unit polymerization degree of 30 was synthesized. The obtained siloxane-based surface treating agent has a methoxy group and a silanol group as terminal functional groups that react with hydroxyl groups.

実施例1
(1)多孔性物質として多孔質シリカ1[吸油量150ml/100g(充填可能な空隙率:76.7%)、表面の平均細孔径5〜15nm、比重:2.2、平均粒径2.1μm、鈴木油脂工業株式会社製ゴッドボールE−2C(商品名)]と、充填する低誘電率化成分として固体状の縮合リン酸エステル[融点95℃、大八化学工業株式会社製PX−200(商品名)、誘電率:2.8]を用い、多孔質シリカ1 200重量部、縮合リン酸エステル(PX−200)600重量部を温度計、冷却管、減圧装置、攪拌装置を備えた4つ口セパラブルフラスコに取り、撹拌しながら4つ口セパラブルフラスコ内を減圧した。4つ口セパラブルフラスコ内の圧力が10mmHg(1.3kPa)以下まで下がった事を確認後、内部温度が120℃になるように4つ口セパラブルフラスコを加熱し、温度を保持したまま5時間加熱撹拌して、溶解されて液状となった縮合リン酸エステルを多孔質シリカ1内に充填した。
Example 1
(1) Porous silica 1 as a porous material [oil absorption 150 ml / 100 g (fillable porosity: 76.7%), surface average pore diameter 5-15 nm, specific gravity 2.2, average particle diameter 2. 1 μm, God Ball E-2C (trade name) manufactured by Suzuki Yushi Kogyo Co., Ltd.] and solid condensed phosphate ester [melting point 95 ° C., PX-200 manufactured by Daihachi Chemical Industry Co., Ltd.] as a low dielectric constant component to be filled (Trade name), dielectric constant: 2.8], and 200 parts by weight of porous silica and 600 parts by weight of condensed phosphate ester (PX-200) were equipped with a thermometer, a condenser, a decompressor, and a stirrer. It took in the 4-neck separable flask and pressure-reduced the inside of a 4-neck separable flask, stirring. After confirming that the pressure in the four-neck separable flask has dropped to 10 mmHg (1.3 kPa) or less, heat the four-neck separable flask so that the internal temperature becomes 120 ° C. The porous silica 1 was filled with the condensed phosphate ester which was heated and stirred for a period of time and dissolved to be liquid.

(2)(1)の4つ口セパラブルフラスコを50℃まで冷却し、液状の縮合リン酸エステルを固化させた。メチルエチルケトン1400重量部を4つ口セパラブルフラスコに投入、撹拌して、過剰な固体状の縮合リン酸エステルを溶解した。空冷により室温まで冷却後、開孔径0.45μmのフィルターを用いて、溶解された液状の縮合リン酸エステルの吸引ろ過を行い、過剰な液状の縮合リン酸エステルと充填された多孔質シリカ1とを分離した。 (2) The four-neck separable flask of (1) was cooled to 50 ° C. to solidify the liquid condensed phosphate ester. 1400 parts by weight of methyl ethyl ketone was put into a four-necked separable flask and stirred to dissolve excess solid condensed phosphate ester. After cooling to room temperature by air cooling, suction filtration of the dissolved liquid condensed phosphate ester is performed using a filter having an aperture diameter of 0.45 μm, and the porous silica 1 filled with excess liquid condensed phosphate ester Separated.

(3)(2)の充填された多孔質シリカ1は、表面に付着したリン酸縮合エステルが付着している場合があるために、200重量部のメチルエチルケトンに(2)の充填された多孔質シリカ1を投入して、15分間撹拌して、表面付着リン酸縮エステルを溶解して除去した(多孔質シリカの洗浄)。その後、開孔径0.45μmのフィルターを用いて、溶解されたリン酸縮合エステルの吸引ろ過を行い、表面付着リン酸縮合エステルと多孔質シリカ1(充填)とを分離した。(3)の工程を再度繰り返し多孔質シリカ1(充填)の洗浄を行った。その後、50℃で10時間乾燥を行い、低誘電率化剤1(縮合リン酸エステルを多孔質シリカの細孔容積のほぼ100容積%でまで充填した多孔質シリカ1、表面にリン酸縮合エステルが付着していない)を作製した。低誘電率化剤1は、低誘電率化成分含有率:76.7%であった。 (3) Since the porous silica 1 filled in (2) may have a phosphoric acid condensed ester adhering to the surface thereof, the porous silica filled in (2) in 200 parts by weight of methyl ethyl ketone. Silica 1 was added and stirred for 15 minutes to dissolve and remove the surface-attached phosphoric acid condensed ester (cleaning of porous silica). Subsequently, the dissolved phosphoric acid condensed ester was subjected to suction filtration using a filter having a pore size of 0.45 μm to separate the surface-adhered phosphoric acid condensed ester and the porous silica 1 (filled). The process of (3) was repeated again to wash the porous silica 1 (filling). Thereafter, drying is carried out at 50 ° C. for 10 hours, and a low dielectric constant agent 1 (porous silica 1 filled with condensed phosphate ester to approximately 100% by volume of the porous silica pore volume, phosphoric acid condensed ester on the surface) Is not attached). Low dielectric constant agent 1 had a low dielectric constant component content: 76.7%.

得られた低誘電率化剤1において、多孔質シリカ1(充填)が100容積%であることを、多孔質シリカ1(充填)と多孔質シリカ(未充填)について顕微鏡観察して確認した。試料は、日立製作所製、FB2000A、加速電圧30kV、イオン源Gaを用いて、任意の断面を集束イオンビーム(FIB)加工により切り出し(FIB加工後試料)、FIB加工後表面を清浄にするため、日立製作所製、E3200、加速電圧4kVを用いて、イオンミリング処理した(イオンミリング処理後試料)。イオンミリング処理後試料は、多孔質シリカ(未充填)は細孔が確認されるが、多孔質シリカ1(充填)では隙間なく充填されていること(細孔容積100%充填)が明らかである。FIB加工後試料及びイオンミリング処理後試料をSEM(日立製作所製、型番S−4700、加速電圧5.0kV、倍率:10万倍)で観察した。
図1に、多孔質シリカ1(充填)と多孔質シリカ(未充填)について、FIB加工後試料及びイオンミリング処理後試料の断面観察SEM写真を示す。
In the obtained low dielectric constant agent 1, it was confirmed by microscopic observation of porous silica 1 (filled) and porous silica (unfilled) that the porous silica 1 (filled) was 100% by volume. Sample is made by Hitachi, FB2000A, acceleration voltage 30kV, ion source Ga, cut out any cross section by focused ion beam (FIB) processing (sample after FIB processing), to clean the surface after FIB processing, Ion milling was performed using Hitachi, E3200, and an acceleration voltage of 4 kV (sample after ion milling). In the sample after the ion milling treatment, pores are confirmed in the porous silica (unfilled), but it is clear that the porous silica 1 (filled) is filled without a gap (filled with a pore volume of 100%). . The sample after FIB processing and the sample after ion milling treatment were observed with SEM (manufactured by Hitachi, model number S-4700, acceleration voltage 5.0 kV, magnification: 100,000 times).
FIG. 1 shows cross-sectional observation SEM photographs of the sample after FIB processing and the sample after ion milling for porous silica 1 (filled) and porous silica (unfilled).

(4)低誘電率化剤1は、同重量のメチルエチルケトンに分散させ、上記のシロキサン系表面処理剤を、低誘電率化剤1の重量に対して、表面処理剤の固形分が1重量%になるように配合して、メチルエチルケトンの還流温度で一時間加熱処理して、表面処理した低誘電率化剤1を得た。 (4) The low dielectric constant agent 1 is dispersed in the same weight of methyl ethyl ketone, and the solid content of the surface treatment agent is 1% by weight with respect to the weight of the low dielectric constant agent 1. And heat-treated at the reflux temperature of methyl ethyl ketone for 1 hour to obtain a surface-treated low dielectric constant agent 1.

(5)(4)で作製した低誘電率化剤1を絶縁性樹脂組成物に配合して、下記の組成で低誘電率絶縁性樹脂組成物に溶剤を加えて絶縁性樹脂ワニスを作製した(低誘電化剤:32容積%配合)。この時のエポキシに対する熱硬化剤の当量は1.0当量とした。
低誘電率化剤1 50重量部
絶縁性樹脂組成物
・クレゾールノボラック型エポキシ樹脂、ESCN−190−3
(住友化学株式会社社製、商品名) 75重量部
・熱硬化剤ジシアンジアミド
(日本カーバイド株式会社製) 4重量部
・熱硬化剤ノボラックフェノール樹脂、HP−850
(日立化成工業株式会社製、商品名) 21重量部
・イミダゾール、2−フェニルイミダゾール(四国化成工業株式会社製、商品名2PZ)
0.5重量部
溶剤
・メチルエチルケトン 75重量部
(5) (4) a low dielectric constant agent 1 prepared by blending in the insulating resin composition, prepared insulation resin varnish by adding solvent to the low dielectric constant insulating resin composition in the following composition (Low dielectric agent: 32% by volume). The equivalent of the thermosetting agent to the epoxy at this time was 1.0 equivalent.
Low dielectric constant agent 1 50 parts by weight insulating resin composition / cresol novolac type epoxy resin, ESCN-190-3
(Product name, manufactured by Sumitomo Chemical Co., Ltd.) 75 parts by weight, thermosetting agent dicyandiamide (manufactured by Nippon Carbide Co., Ltd.) 4 parts by weight, thermosetting agent novolak phenol resin, HP-850
(Trade name, manufactured by Hitachi Chemical Co., Ltd.) 21 parts by weight imidazole, 2-phenylimidazole (trade name, 2PZ, manufactured by Shikoku Chemical Industries, Ltd.)
0.5 parts by weight Solvent / methyl ethyl ketone 75 parts by weight

(6)次に、この絶縁性樹脂ワニスを厚み18μmの銅箔上に塗工し、100℃−20分乾燥して膜厚100±3μmの銅箔付き絶縁性樹脂フィルムを作製した。作製した銅箔付き絶縁性樹脂フィルムの樹脂面に厚み18μmの銅箔を配し、170℃、90分、1.0MPaのプレス条件で両面銅箔付き絶縁性樹脂フィルムを作製した。 (6) Next, this insulating resin varnish was applied onto a copper foil having a thickness of 18 μm and dried at 100 ° C. for 20 minutes to produce an insulating resin film with a copper foil having a thickness of 100 ± 3 μm. A copper foil having a thickness of 18 μm was placed on the resin surface of the produced insulating resin film with copper foil, and an insulating resin film with double-sided copper foil was produced under the press conditions of 170 ° C., 90 minutes, 1.0 MPa.

実施例2
実施例1において、多孔質シリカ1を、多孔質シリカ2[吸油量330ml/100g(充填可能な空隙率:87.9%)、表面の平均細孔径10nm、比重:2.2、平均粒径2.6μm、富士シリシア化学株式会社製SYLYSIA310P(商品名)]とし、配合量を100重量部とし、縮合リン酸エステルの配合量は1200重量部とし、冷却後に4つ口セパラブルフラスコに投入するエチルメチルケトンの量を2600重量として、低誘電率化剤2を作製した以外は、実施例1と同様にして行い、低誘電率化剤2を得た(充填率100%)。低誘電率化剤2は、低誘電率化成分含有率:87.9%であった。
その後、実施例1と同様にして、低誘電率絶縁性樹脂組成物、絶縁性樹脂ワニス、銅箔付き絶縁性樹脂フィルム、両面銅箔付き絶縁性樹脂フィルムを作製し、特性試験を行った。
Example 2
In Example 1, porous silica 1 was changed to porous silica 2 [oil absorption amount 330 ml / 100 g (fillable void ratio: 87.9%), surface average pore diameter 10 nm, specific gravity 2.2, average particle diameter 2.6 μm, SYLYSIA310P (trade name) manufactured by Fuji Silysia Chemical Co., Ltd.], the blending amount is 100 parts by weight, the blending amount of the condensed phosphate ester is 1200 parts by weight, and after cooling, it is put into a four-neck separable flask. A low dielectric constant agent 2 was obtained (filling rate 100%), except that the amount of ethyl methyl ketone was 2600 wt. Low dielectric constant agent 2 had a low dielectric constant component content: 87.9%.
Then, it carried out similarly to Example 1, produced the low dielectric constant insulating resin composition, the insulating resin varnish, the insulating resin film with copper foil, and the insulating resin film with double-sided copper foil, and performed the characteristic test.

実施例3
実施例1において、多孔質シリカ1を、多孔質シリカ3[吸油量80ml/100g(充填可能な空隙率:63.8%)、表面の平均細孔径17mm、比重:2.2、平均粒径3.1μm、旭硝子株式会社製L−31−C(商品名)]とし、配合量を200重量部とし、縮合リン酸エステルの配合量は400重量部とし、冷却後に4つ口セパラブルフラスコに投入するエチルメチルケトンの量を1200重量として、低誘電率化剤3を作製した以外は、実施例1と同様にして行い、低誘電率化剤3を得た(充填率100%)。低誘電率化剤3は、低誘電率化成分含有率:63.8%であった。
その後、実施例1と同様にして、低誘電率絶縁性樹脂組成物、絶縁性樹脂ワニス、銅箔付き絶縁性樹脂フィルム、両面銅箔付き絶縁性樹脂フィルムを作製し、特性試験を行った。
Example 3
In Example 1, porous silica 1 was changed to porous silica 3 [oil absorption amount 80 ml / 100 g (fillable porosity: 63.8%), surface average pore diameter 17 mm, specific gravity 2.2, average particle diameter 3.1 μm, L-31-C (trade name) manufactured by Asahi Glass Co., Ltd.], the blending amount is 200 parts by weight, and the blending amount of the condensed phosphate ester is 400 parts by weight. A low dielectric constant agent 3 was obtained in the same manner as in Example 1 except that the amount of ethyl methyl ketone added was 1200 weight and the low dielectric constant agent 3 was produced (filling rate 100%). Low dielectric constant agent 3 had a low dielectric constant component content: 63.8%.
Then, it carried out similarly to Example 1, produced the low dielectric constant insulating resin composition, the insulating resin varnish, the insulating resin film with copper foil, and the insulating resin film with double-sided copper foil, and performed the characteristic test.

実施例4
実施例1において、低誘電率化剤1を100重量部とし、絶縁性樹脂ワニスを作る際のメチルエチルケトンを200重量部とした以外は、実施例1と同様にして行い、低誘電率化剤4を得た(充填率100%)。低誘電率化剤4は、低誘電率化成分含有率:76.7%であった。
その後、実施例1と同様にして、低誘電率絶縁性樹脂組成物、絶縁性樹脂ワニス、銅箔付き絶縁性樹脂フィルム、両面銅箔付き絶縁性樹脂フィルムを作製し、特性試験を行った。
Example 4
In Example 1, except that the low dielectric constant agent 1 was 100 parts by weight and the methyl ethyl ketone used for making the insulating resin varnish was 200 parts by weight, the low dielectric constant agent 4 (Filling rate 100%) was obtained. Low dielectric constant agent 4 had a low dielectric constant component content: 76.7%.
Then, it carried out similarly to Example 1, produced the low dielectric constant insulating resin composition, the insulating resin varnish, the insulating resin film with copper foil, and the insulating resin film with double-sided copper foil, and performed the characteristic test.

比較例1
実施例1の低誘電率化剤と同重量と計算される無孔質シリカとリン酸エステルを下記の組成で配合し、低誘電率絶縁性樹脂組成物を作製し、溶剤を配合して絶縁性樹脂ワニスを作成した。この時のエポキシに対する熱硬化剤の当量は1.0当量とした。
縮合リン酸エステルリン酸エステル、PX−200
(大八化学工業株式会社製、商品名) 30重量部
無孔質シリカ、SO−25R、平均粒径0.5μm
(株式会社アドマテックス製、商品名) 20重量部
絶縁性樹脂組成物
・クレゾールノボラック型エポキシ樹脂、ESCN−190−3
(住友化学株式会社社製、商品名) 75重量部
・熱硬化剤ジシアンジアミド
(日本カーバイド株式会社製、商品名) 4重量部
・熱硬化剤ノボラックフェノール樹脂、HP−850
(日立化成工業株式会社製、商品名) 21重量部
・イミダゾール、2−フェニルイミダゾール(四国化成工業株式会社製、商品名2PZ)
0.5重量部
溶剤
・メチルエチルケトン 75重量部
(5)次に、この絶縁性樹脂ワニスを銅箔上に塗工し、100℃−10分乾燥して膜厚100±3μmの銅箔付き絶縁性樹脂フィルムを作製した。作製した銅箔付き絶縁性樹脂フィルムの樹脂面に厚み18μmの銅箔を配し、170℃、90分、1.0MPaのプレス条件で両面銅箔付き絶縁性樹脂フィルムを作製した。
Comparative Example 1
Nonporous silica and phosphoric acid ester calculated as having the same weight as the low dielectric constant agent of Example 1 are blended in the following composition to produce a low dielectric constant insulating resin composition, and a solvent is blended to insulate. A functional resin varnish was prepared. The equivalent of the thermosetting agent to the epoxy at this time was 1.0 equivalent.
Condensed phosphate ester phosphate ester, PX-200
(Product name, manufactured by Daihachi Chemical Industry Co., Ltd.) 30 parts by weight of nonporous silica, SO-25R, average particle size of 0.5 μm
(Product name, manufactured by Admatechs Co., Ltd.) 20 parts by weight insulating resin composition / cresol novolac epoxy resin, ESCN-190-3
(Product name, manufactured by Sumitomo Chemical Co., Ltd.) 75 parts by weight / thermosetting agent dicyandiamide (product name, manufactured by Nippon Carbide Corporation) 4 parts by weight / thermosetting agent novolak phenol resin, HP-850
(Trade name, manufactured by Hitachi Chemical Co., Ltd.) 21 parts by weight imidazole, 2-phenylimidazole (trade name, 2PZ manufactured by Shikoku Chemicals Co., Ltd.)
0.5 parts by weight solvent, methyl ethyl ketone 75 parts by weight (5) Next, this insulating resin varnish is coated on a copper foil and dried at 100 ° C. for 10 minutes to have an insulating property with a copper foil of 100 ± 3 μm. A resin film was prepared. A copper foil having a thickness of 18 μm was placed on the resin surface of the produced insulating resin film with copper foil, and an insulating resin film with double-sided copper foil was produced under the press conditions of 170 ° C., 90 minutes, 1.0 MPa.

ブランク1
比較例1において、縮合リン酸エステルを除き、その他は比較例1と同様にして低誘電率絶縁性樹脂組成物、絶縁性樹脂ワニス、銅箔付き絶縁性樹脂フィルム、両面銅箔付き絶縁性樹脂フィルムを作製し、特性試験を行った。
Blank 1
In Comparative Example 1, except for the condensed phosphate ester, the rest was the same as in Comparative Example 1, and the low dielectric constant insulating resin composition, the insulating resin varnish, the insulating resin film with copper foil, and the insulating resin with double-sided copper foil were used. A film was prepared and subjected to a characteristic test.

特性試験
作製した両面銅箔付き絶縁性樹脂フィルムについて、以下の特性を評価した。
結果を表1に示す。
・耐熱性:50mm×50mmに切断した両面銅箔付き絶縁性樹脂フィルムを用いて,260℃及び288℃の溶融はんだにフロートした際に両面銅箔付き絶縁性樹脂フィルムがふくれるまでの時間を測定した。
・銅箔ピール強さ:JIS−C−6481に準拠して測定した。
また、両面の銅箔を除去して以下の特性を評価した。結果を表1に示す。
・ガラス転移温度:熱機械分析装置(マックサイエンス株式会社製TMA−4000)を用いて昇温速度5℃/minの条件でガラス転移温度(Tg)を測定した。結果を表1に示した。
・誘電率:RFインピーダンス/マテリアルアナライザ(アジレントテクノロジー社製、HP 4291B)を用いて1GHzでの誘電率を測定した。
Characteristic test The following characteristics were evaluated about the produced insulating resin film with a double-sided copper foil.
The results are shown in Table 1.
・ Heat resistance: Using an insulating resin film with double-sided copper foil cut to 50 mm x 50 mm, measure the time until the insulating resin film with double-sided copper foil swells when floated on molten solder at 260 ° C and 288 ° C did.
Copper foil peel strength: measured in accordance with JIS-C-6481.
Moreover, the copper foil on both sides was removed and the following characteristics were evaluated. The results are shown in Table 1.
Glass transition temperature: The glass transition temperature (Tg) was measured using a thermomechanical analyzer (TMA-4000, manufactured by Mac Science Co., Ltd.) at a temperature increase rate of 5 ° C./min. The results are shown in Table 1.
Dielectric constant: The dielectric constant at 1 GHz was measured using an RF impedance / material analyzer (manufactured by Agilent Technologies, HP 4291B).

ここで、ブランク1は、実施例1〜4の低誘電率絶縁性樹脂組成物において低誘電率化剤を、比較例1の低誘電率絶縁性樹脂組成物において低誘電化成分であるリン酸エステルを除いた絶縁性樹脂組成物とほぼ同様の組成を有する。よって、低誘電率化する前の、絶縁性樹脂組成物の特性を示す(ブランク)である。   Here, blank 1 is phosphoric acid which is a low dielectric constant component in the low dielectric constant insulating resin composition of Comparative Example 1 and a low dielectric constant agent in the low dielectric constant insulating resin composition of Examples 1 to 4. It has almost the same composition as the insulating resin composition excluding the ester. Therefore, it is the (blank) which shows the characteristic of the insulating resin composition before making low dielectric constant.

表2から明らかなように、本発明の低誘電率化剤を含む低誘電率絶縁性樹脂組成物を用いた実施例1〜4では、誘電率が3.5以下に低誘電率化された。そして、耐熱性は60秒以上であるので、耐熱性は維持された。ピール強度は1.0kN/m以上であるので、接着性、機械的強度は維持された。ガラス転移温度は150℃以上であるので、ガラス転移温度、熱に対する寸法安定性は維持された。   As is apparent from Table 2, in Examples 1 to 4 using the low dielectric constant insulating resin composition containing the low dielectric constant agent of the present invention, the dielectric constant was lowered to 3.5 or less. . And since heat resistance is 60 seconds or more, heat resistance was maintained. Since the peel strength was 1.0 kN / m or more, the adhesiveness and mechanical strength were maintained. Since the glass transition temperature was 150 ° C. or higher, the glass transition temperature and the dimensional stability against heat were maintained.

一方、本発明の低誘電率化剤を含まない低誘電率絶縁性樹脂組成物を用いた比較例1については、比較例1ではピール強度は1.3kN/mではあるが、耐熱性、ガラス転移温度、誘電率は悪影響を受けた。   On the other hand, in Comparative Example 1 using the low dielectric constant insulating resin composition not containing the low dielectric constant agent of the present invention, the comparative example 1 has a peel strength of 1.3 kN / m. The transition temperature and dielectric constant were adversely affected.

実施例5
(1) 実施例1において、低誘電率化剤1を50重量部として樹脂組成物を作製し、絶縁性樹脂ワニスを作る際のメチルエチルケトンを100重量部とした以外は、実施例1と同様にして、絶縁性樹脂ワニスを得た。
(2) 得られた絶縁性樹脂ワニスを、厚さ約0.1mmのガラス布(#2116、E−ガラス)に含浸後、150℃で3〜10分加熱乾燥して樹脂分43重量%のプリプレグを得た。これらのプリプレグ4枚を重ね、その両側に厚みが18μmの銅箔を重ね、170℃、90分、3.0MPaのプレス条件で両面銅張積層板を作製した。
Example 5
(1) In Example 1, except that the resin composition was prepared by using 50 parts by weight of the low dielectric constant agent 1, and 100 parts by weight of methyl ethyl ketone used for making the insulating resin varnish was the same as in Example 1. Thus, an insulating resin varnish was obtained.
(2) After impregnating the obtained insulating resin varnish into a glass cloth (# 2116, E-glass) having a thickness of about 0.1 mm, it was dried by heating at 150 ° C. for 3 to 10 minutes to have a resin content of 43% by weight. A prepreg was obtained. Four of these prepregs were stacked, and a copper foil having a thickness of 18 μm was stacked on both sides thereof, and a double-sided copper-clad laminate was produced under press conditions of 170 ° C., 90 minutes, 3.0 MPa.

実施例6
実施例2において、低誘電率化剤2を50重量部として樹脂組成物を作製し、絶縁性樹脂ワニスを作る際のメチルエチルケトンを100重量部とした以外は、実施例2と同様にして、絶縁性樹脂ワニスを得た。
実施例5の絶縁性樹脂ワニスの代わりに、上記の絶縁性樹脂ワニスを用いた以外は、実施例5と同様にして、両面銅張積層板を作製した。
Example 6
In Example 2, a resin composition was prepared with 50 parts by weight of the low dielectric constant agent 2, and the insulation was performed in the same manner as in Example 2 except that 100 parts by weight of methyl ethyl ketone was used for making the insulating resin varnish. Resin varnish was obtained.
A double-sided copper clad laminate was produced in the same manner as in Example 5 except that the above insulating resin varnish was used instead of the insulating resin varnish of Example 5.

実施例7
実施例3において、低誘電率化剤3を50重量部として樹脂組成物を作製し、絶縁性樹脂ワニスを作る際のメチルエチルケトンを100重量部とした以外は、実施例3と同様にして、絶縁性樹脂ワニスを得た。
実施例5の絶縁性樹脂ワニスの代わりに、上記の絶縁性樹脂ワニスを用いた以外は、実施例5と同様にして、両面銅張積層板を作製した。
Example 7
In Example 3, the resin composition was prepared with 50 parts by weight of the low dielectric constant agent 3, and the insulation was performed in the same manner as in Example 3 except that 100 parts by weight of methyl ethyl ketone was used for making the insulating resin varnish. Resin varnish was obtained.
A double-sided copper clad laminate was produced in the same manner as in Example 5 except that the above insulating resin varnish was used instead of the insulating resin varnish of Example 5.

実施例8
実施例5の絶縁性樹脂ワニスの代わりに、実施例4の絶縁性樹脂ワニスを用いた以外は、実施例5と同様にして、両面銅張積層板を作製した。
Example 8
A double-sided copper-clad laminate was prepared in the same manner as in Example 5 except that the insulating resin varnish of Example 4 was used instead of the insulating resin varnish of Example 5.

比較例2
実施例5の絶縁性樹脂ワニスの代わりに、比較例1の絶縁性樹脂ワニスを用いた以外は、実施例5と同様にして、両面銅張積層板を作製した。
Comparative Example 2
A double-sided copper clad laminate was prepared in the same manner as in Example 5 except that the insulating resin varnish of Comparative Example 1 was used instead of the insulating resin varnish of Example 5.

ブランク2
実施例5の絶縁性樹脂ワニスの代わりに、比較例2の絶縁性樹脂ワニスを用いた以外は、実施例5と同様にして、両面銅張積層板を作製した。
Blank 2
A double-sided copper clad laminate was produced in the same manner as in Example 5 except that the insulating resin varnish of Comparative Example 2 was used instead of the insulating resin varnish of Example 5.

得られた両面銅張積層板について、以下の特性を評価した。
結果を、表4に示す。
・耐熱性:50mm×50mmに切断した両面銅張積層板を用いて、260℃の溶融はんだにフロートした際に両面銅張積層板がふくれるまでの時間を測定した。
・銅箔ピール強さ:JIS−C−6481に準拠して測定した。
・誘電率:RFインピーダンス/マテリアルアナライザ(アジレントテクノロジー社製、HP 4291B)を用いて1GHzでの誘電率を測定した。
The obtained double-sided copper-clad laminate was evaluated for the following characteristics.
The results are shown in Table 4.
-Heat resistance: Using a double-sided copper-clad laminate cut to 50 mm x 50 mm, the time until the double-sided copper-clad laminate swelled when floated on molten solder at 260 ° C was measured.
Copper foil peel strength: measured in accordance with JIS-C-6481.
Dielectric constant: The dielectric constant at 1 GHz was measured using an RF impedance / material analyzer (manufactured by Agilent Technologies, HP 4291B).

ここで、ブランク2は、実施例5〜8の低誘電率絶縁性樹脂組成物において低誘電率化剤を、比較例2の低誘電率絶縁性樹脂組成物において低誘電率化成分リン酸エステルを除いた絶縁性樹脂組成物とほぼ同様の組成を有する。よって、低誘電率化する前の、絶縁性樹脂組成物の特性を示す(ブランク)である。   Here, the blank 2 is a low dielectric constant agent in the low dielectric constant insulating resin compositions of Examples 5 to 8, and the low dielectric constant component phosphate ester in the low dielectric constant insulating resin composition of Comparative Example 2. The composition has almost the same composition as the insulating resin composition except for. Therefore, it is the (blank) which shows the characteristic of the insulating resin composition before making low dielectric constant.

表4から明らかなように、本発明の低誘電率化材料を含む低誘電率絶縁性樹脂組成物を用いた両面銅張積層板の実施例5〜8では、誘電率が3.9以下に低誘電率化された。そして、耐熱性は60秒以上であるので、耐熱性は維持された。ピール強度は1.1kN/m以上であるので、接着性、機械的強度は維持された。   As is clear from Table 4, in Examples 5 to 8 of the double-sided copper-clad laminate using the low dielectric constant insulating resin composition containing the low dielectric constant material of the present invention, the dielectric constant was 3.9 or less. The dielectric constant was lowered. And since heat resistance is 60 seconds or more, heat resistance was maintained. Since the peel strength was 1.1 kN / m or more, the adhesion and mechanical strength were maintained.

一方、本発明の低誘電率化剤を含まない絶縁性樹脂組成物を用いた両面銅張積層板の比較例2については、比較例2では、耐熱性が充分でないために、プレス成形できず、両面銅張積層板を作製することができなかった。   On the other hand, in Comparative Example 2 of the double-sided copper clad laminate using the insulating resin composition not containing the low dielectric constant agent of the present invention, Comparative Example 2 cannot be press-molded because the heat resistance is not sufficient. A double-sided copper-clad laminate could not be produced.

本発明は、比誘電率のみが低減され、かつ他の特性(耐熱性(ガラス転移温度、熱に対する寸法安定性を含む等)、接着性、機械的強度(例えばピール強度))の性能が維持された低誘電率絶縁性樹脂組成物を達成したものである。   In the present invention, only the relative dielectric constant is reduced, and the performance of other characteristics (heat resistance (including glass transition temperature, dimensional stability against heat, etc.), adhesion, and mechanical strength (for example, peel strength)) is maintained. The obtained low dielectric constant insulating resin composition is achieved.

Claims (20)

絶縁性樹脂組成物及び低誘電率化剤を含む低誘電率絶縁性樹脂組成物であって、該低誘電率化剤が、多孔性物質と、該多孔性物質内に埋め込まれた低誘電率化成分とで構成され、かつ該低誘電率化剤中の該低誘電率化成分の誘電率が、該絶縁性樹脂組成物の誘電率よりも小さく、該低誘電率化成分が、熱可塑樹脂、熱硬化性樹脂、感光性樹脂及びリン酸エステルからなる群から選択される1種以上であり、該低誘電率化成分の流動点以上の粘度が10000ポイズ(1kPa・s)以下であることを特徴とする低誘電率絶縁性樹脂組成物。 A low dielectric constant insulating resin composition containing an insulating resin composition and a low dielectric constant material, a low dielectric low dielectric constant material is a multi-porous material, embedded in the porous substance in The dielectric constant of the low dielectric constant component in the low dielectric constant agent is smaller than the dielectric constant of the insulating resin composition, and the low dielectric constant component is plasticizers resins, thermosetting resins state, and are one or more selected from the group consisting of a photosensitive resin and phosphoric acid esters, viscosity or pour point of the low dielectric constant component 10000 poise (1 kPa · s) or less low dielectric constant resin composition, characterized in der Rukoto. 該低誘電率化成分が、ポリオレフィン、ポリプロピレンエーテル、ポリアミド、ポリアミドイミド、ポリアリレート、熱可塑ポリイミド、ポリエーテルエーテルケトン、ポリエチレンオキシド、ポリエチレンテレフタレート、ポリ塩化ビニリデン、ポリ塩化ビニル、ポリカーボネート、ポリ酢酸ビニル、ポリスチレン、ポリブタジエン、ポリビニルエーテル;エポキシ樹脂、キシレン樹脂、グアナミン樹脂、ジアリルフタレート樹脂、不飽和ポリエステル樹脂、フェノール樹脂、不飽和ポリエステル樹脂、ポリイミド、ポリウレタン、マレイン樹脂、メラミン樹脂、ユリア樹脂;エポキシアクリレート;及びリン酸エステルからなる群から選択される1種以上であることを特徴とする請求項1記載の低誘電率絶縁性樹脂組成物。   The low dielectric constant component is polyolefin, polypropylene ether, polyamide, polyamideimide, polyarylate, thermoplastic polyimide, polyether ether ketone, polyethylene oxide, polyethylene terephthalate, polyvinylidene chloride, polyvinyl chloride, polycarbonate, polyvinyl acetate, Polystyrene, polybutadiene, polyvinyl ether; epoxy resin, xylene resin, guanamine resin, diallyl phthalate resin, unsaturated polyester resin, phenol resin, unsaturated polyester resin, polyimide, polyurethane, maleic resin, melamine resin, urea resin; epoxy acrylate; 2. The low dielectric constant insulating resin composition according to claim 1, wherein the composition is one or more selected from the group consisting of phosphate esters. 該多孔性物質の表面の平均細孔径が、1〜1000nmである、請求項1又は2記載の低誘電率絶縁性樹脂組成物。   The low dielectric constant insulating resin composition according to claim 1 or 2, wherein an average pore diameter of the surface of the porous material is 1-1000 nm. 該多孔性物質の平均粒径が、0.05〜100μmである、請求項1〜3のいずれか1項記載の低誘電率絶縁性樹脂組成物。   The low dielectric constant insulating resin composition according to any one of claims 1 to 3, wherein an average particle diameter of the porous material is 0.05 to 100 µm. 該低誘電率化成分が、該多孔性物質内に、該多孔性物質の細孔容積に対して1以上〜100未満容積%埋め込まれている、請求項1〜4のいずれか1項記載の低誘電率絶縁性樹脂組成物。   The low dielectric constant component is embedded in the porous material in an amount of 1 to less than 100% by volume with respect to the pore volume of the porous material. Low dielectric constant insulating resin composition. 該低誘電率化成分が、20℃以上で固体である、請求項1〜5のいずれか1項記載の低誘電率絶縁性樹脂組成物。   The low dielectric constant insulating resin composition according to claim 1, wherein the low dielectric constant component is solid at 20 ° C. or higher. 該多孔性物質の細孔容積が、吸油量に換算して10〜700ml/100gである、請求項1〜6のいずれか1項記載の低誘電率絶縁性樹脂組成物。   The low dielectric constant insulating resin composition according to any one of claims 1 to 6, wherein the porous volume of the porous material is 10 to 700 ml / 100 g in terms of oil absorption. 該多孔性物質が、多孔質シリカである、請求項1〜7のいずれか1項記載の低誘電率絶縁性樹脂組成物。   The low dielectric constant insulating resin composition according to claim 1, wherein the porous substance is porous silica. 該低誘電率化成分が、熱硬化性である、請求項1〜8のいずれか1項記載の低誘電率絶縁性樹脂組成物。   The low dielectric constant insulating resin composition according to any one of claims 1 to 8, wherein the low dielectric constant component is thermosetting. 該絶縁性樹脂組成物が、熱硬化性である、請求項1〜9のいずれか1項記載の低誘電率絶縁性樹脂組成物。   The low dielectric constant insulating resin composition according to any one of claims 1 to 9, wherein the insulating resin composition is thermosetting. 該低誘電率化成分が、リン酸エステル又はポリオレフィンである、請求項1〜8のいずれか1項記載の低誘電率絶縁性樹脂組成物。   The low dielectric constant insulating resin composition according to any one of claims 1 to 8, wherein the low dielectric constant component is a phosphate ester or a polyolefin. 該絶縁性樹脂組成物が、エポキシ樹脂を含む、請求項1〜11のいずれか1項記載の低誘電率絶縁性樹脂組成物。   The low dielectric constant insulating resin composition according to claim 1, wherein the insulating resin composition contains an epoxy resin. 請求項1〜12のいずれか1項に記載の低誘電率絶縁性樹脂組成物と溶剤とからなる絶縁性樹脂ワニス。 An insulating resin varnish comprising the low dielectric constant insulating resin composition according to any one of claims 1 to 12 and a solvent. 請求項1〜12のいずれか1項記載の低誘電率絶縁性樹脂組成物を、ガラスクロス、ガラス不織布及び有機織布からなる群より選ばれる1種の基材に、含浸、塗工してなるプリプレグ。   The low dielectric constant insulating resin composition according to any one of claims 1 to 12 is impregnated and applied to one substrate selected from the group consisting of glass cloth, glass nonwoven fabric and organic woven fabric. A prepreg. 請求項1〜12のいずれか1項記載の低誘電率絶縁性樹脂組成物を、プラスチックフィルム又は有機フィルム上に塗工してなる絶縁性樹脂フィルム。   The insulating resin film formed by coating the low dielectric constant insulating resin composition of any one of Claims 1-12 on a plastic film or an organic film. 請求項1〜12のいずれか1項記載の低誘電率絶縁性樹脂組成物を、銅箔上に塗工してなる銅箔付絶縁性樹脂フィルム。   The insulating resin film with copper foil formed by coating the low-dielectric-constant insulating resin composition of any one of Claims 1-12 on copper foil. 請求項14記載のプリプレグを用いて積層成形することにより得られる積層板。   A laminate obtained by laminate molding using the prepreg according to claim 14. 請求項15又は16記載の絶縁性樹脂フィルムを用いて形成することを特徴とする積層板。   A laminate comprising the insulating resin film according to claim 15 or 16. 請求項14記載のプリプレグを用いて絶縁層を形成することを特徴とする多層配線板。   An insulating layer is formed using the prepreg according to claim 14. 請求項15又は16記載の絶縁性樹脂フィルムを用いて絶縁層を形成することを特徴とする多層配線板。   An insulating layer is formed using the insulating resin film according to claim 15 or 16, and a multilayer wiring board.
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