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JP5454492B2 - Spectrophotometer - Google Patents
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JP5454492B2 - Spectrophotometer - Google Patents

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JP5454492B2
JP5454492B2 JP2011041152A JP2011041152A JP5454492B2 JP 5454492 B2 JP5454492 B2 JP 5454492B2 JP 2011041152 A JP2011041152 A JP 2011041152A JP 2011041152 A JP2011041152 A JP 2011041152A JP 5454492 B2 JP5454492 B2 JP 5454492B2
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JP2012177635A (en
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大二郎 加藤
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Shimadzu Corp
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Description

本発明は分光光度計に関し、さらに詳しくは、回転セクタ鏡などにより測定光を2方向へ振り分けるダブルビーム方式の分光光度計に関する。   The present invention relates to a spectrophotometer, and more particularly to a double beam type spectrophotometer that distributes measurement light in two directions by a rotating sector mirror or the like.

分光光度計には、その光路の構成によってダブルビーム方式とシングルビーム方式とがある。ダブルビーム方式は、吸光度を算出する過程で原理的に光源の光量変動による影響を相殺することが可能であるため、分析精度の点でシングルビーム方式よりも有利である。   The spectrophotometer has a double beam method and a single beam method depending on the configuration of the optical path. The double beam method is more advantageous than the single beam method in terms of analysis accuracy because it is possible in principle to cancel the influence of the light amount fluctuation of the light source in the process of calculating the absorbance.

ダブルビーム方式の分光光度計では、分光器(モノクロメータ)により取り出された単色光を、回転セクタ鏡を用いて試料側光束と参照側光束とに振り分ける方式がよく知られている。例えば特許文献1に開示された分光光度計では、単色光は一定速度で回転駆動されるセクタ鏡により試料側光束と参照側光束とに交互に振り分けられ、試料側光束は被測定試料に照射され、参照側光束は被測定成分を含まない例えば溶媒のみの参照試料に照射される。つぎに、被測定試料を透過した光と参照試料を透過した光とは1つの検出器に対し交互に導入され、各透過光に対応した信号が検出される。また、光が検出器に入射しない状態での暗電流などによる暗信号を測定するために、光を遮蔽する遮光部がセクタ鏡に一体に設けられている。   In a double beam spectrophotometer, a method of distributing monochromatic light extracted by a spectroscope (monochromator) into a sample side beam and a reference side beam using a rotating sector mirror is well known. For example, in the spectrophotometer disclosed in Patent Document 1, monochromatic light is alternately distributed into a sample-side light beam and a reference-side light beam by a sector mirror that is rotationally driven at a constant speed, and the sample-side light beam is irradiated onto a sample to be measured. The reference-side light beam is irradiated to a reference sample containing only the solvent, for example, which does not contain the component to be measured. Next, the light transmitted through the sample to be measured and the light transmitted through the reference sample are alternately introduced into one detector, and a signal corresponding to each transmitted light is detected. In addition, in order to measure a dark signal due to a dark current or the like in a state where light does not enter the detector, a light-shielding portion that shields light is provided integrally with the sector mirror.

図3は従来のダブルビーム方式の分光光度計の構成図である。図3において、光源41から発した光は、入口スリット42、回折格子43、出口スリット44、およびステッピングモータ45を含む分光器46に導入され、分光器46から所定の波長の単色光が取り出される。ステッピングモータ45は、入口スリット42を通過した入射光に対し回折格子43の角度を変えることにより、出口スリット44を介して取り出される単色光の波長を変化させる。取り出された単色光つまり測定光は、モータ49により一定速度で回転駆動されるセクタ鏡48によって、2つの反射鏡50、51の方向に交互に送られる。   FIG. 3 is a block diagram of a conventional double beam spectrophotometer. In FIG. 3, light emitted from a light source 41 is introduced into a spectroscope 46 including an entrance slit 42, a diffraction grating 43, an exit slit 44, and a stepping motor 45, and monochromatic light having a predetermined wavelength is extracted from the spectroscope 46. . The stepping motor 45 changes the wavelength of the monochromatic light extracted through the exit slit 44 by changing the angle of the diffraction grating 43 with respect to the incident light that has passed through the entrance slit 42. The extracted monochromatic light, that is, measurement light, is alternately sent in the direction of the two reflecting mirrors 50 and 51 by the sector mirror 48 that is rotationally driven by a motor 49 at a constant speed.

セクタ鏡48の回転に伴い、分光器46からの単色光の照射位置に開口部93が到来したときには、単色光は開口部93を通過して反射鏡51に照射され、試料側光束Lsとなって被測定試料53に照射される。一方、単色光の照射位置に反射鏡92が到来したときには、単色光はその反射鏡92にて反射された後に反射鏡50に照射され、参照側光束Lrとなって参照試料52に照射される。また、単色光の照射位置に遮光部94、95が到来したときには、試料側光束Ls、参照側光束Lrはいずれも照射されない。   When the opening 93 arrives at the irradiation position of the monochromatic light from the spectroscope 46 along with the rotation of the sector mirror 48, the monochromatic light passes through the opening 93 and is irradiated onto the reflecting mirror 51 to become the sample-side light beam Ls. The sample 53 to be measured is irradiated. On the other hand, when the reflecting mirror 92 arrives at the irradiation position of the monochromatic light, the monochromatic light is reflected by the reflecting mirror 92 and then irradiated to the reflecting mirror 50 to be irradiated on the reference sample 52 as a reference side light beam Lr. . Further, when the light-shielding portions 94 and 95 arrive at the monochromatic light irradiation position, neither the sample-side light beam Ls nor the reference-side light beam Lr is irradiated.

例えば、被測定試料53は試料セルに被測定試料溶液が充填されたもの、参照試料52は同じ試料セルに溶媒のみが充填されたものである。セクタ鏡48には、開口部93、反射鏡92、遮光部94、95が軸の周りに45°の間隔で設けられ、また軸の点対称位置に同様の部分を有する。したがって、1サイクル(1/2回転期間)中で、被測定試料53と参照試料52とに光が照射される期間は等しく、その間で光が遮蔽される期間も等しい。   For example, the measured sample 53 is a sample cell filled with a measured sample solution, and the reference sample 52 is the same sample cell filled with only a solvent. In the sector mirror 48, an opening 93, a reflecting mirror 92, and light-shielding portions 94 and 95 are provided at intervals of 45 ° around the axis, and a similar portion is provided at a point-symmetrical position of the axis. Therefore, in one cycle (1/2 rotation period), the period during which the sample 53 to be measured and the reference sample 52 are irradiated with light is equal, and the period during which light is shielded is also equal.

参照試料52を通過した参照側光束Lrは反射鏡54で反射され、被測定試料53を通過した試料側光束Lsは反射鏡55、56で反射され、いずれも検出器75に入射される。ところで、分光光度計では紫外域から赤外域まで広い波長範囲で分光分析を行うために、波長範囲が広くなると一つの検出器で全波長を検出することが困難となり、複数の検出器を設置することが必要となる。   The reference-side light beam Lr that has passed through the reference sample 52 is reflected by the reflecting mirror 54, and the sample-side light beam Ls that has passed through the sample 53 to be measured is reflected by the reflecting mirrors 55 and 56, and both enter the detector 75. By the way, since the spectrophotometer performs spectral analysis in a wide wavelength range from the ultraviolet region to the infrared region, it becomes difficult to detect all wavelengths with one detector when the wavelength range becomes wide, and a plurality of detectors are installed. It will be necessary.

図3に、例として非稼動の検出器57に光電子増倍管、稼動の検出器75にフォトダイオードを使用した場合を示す。負高圧回路74を備えた検出器57は電流電圧変換器72、AD変換器58を経て制御部40へ、また検出器75は電流電圧変換器71およびAD変換器58を経て制御部40へ接続されている。ところで、非稼動の検出器57の光電子増倍管は測定波長が変わった場合、稼動の検出器75のフォトダイオードからすぐに切り替え、計測が開始されるように、常時高電圧が印加されることが望ましい。しかし、非稼動の検出器57の光電子増倍管は外光などの異常に大きな光が入力すると過大な信号が出力され劣化してしまうので、非稼動の検出器57の光電子増倍管にかける負高圧電圧をほぼゼロにしている。   FIG. 3 shows a case where a photomultiplier tube is used for the non-operating detector 57 and a photodiode is used for the operating detector 75 as an example. The detector 57 having the negative high voltage circuit 74 is connected to the control unit 40 through the current-voltage converter 72 and the AD converter 58, and the detector 75 is connected to the control unit 40 through the current-voltage converter 71 and the AD converter 58. Has been. By the way, when the measurement wavelength changes, the photomultiplier tube of the non-operating detector 57 is switched from the photodiode of the active detector 75 immediately, and a high voltage is constantly applied so that measurement can be started. Is desirable. However, if the photomultiplier tube of the non-operating detector 57 is input with abnormally large light such as external light, an excessive signal is output and deteriorates, so that it is applied to the photomultiplier tube of the non-operating detector 57. Negative high voltage is almost zero.

特開2010−156655号公報JP 2010-156655 A

しかしながら、非稼動の検出器57の光電子増倍管にかける負高圧電圧をほぼゼロにしているので、稼動の検出器75のフォトダイオードから非稼動の検出器57の光電子増倍管に切り替える際に、再度非稼動の検出器57の負高圧電圧を高くする必要があり、安定するまでに時間がかかるため分析時間が長くなるという欠点があった。また、負高圧電圧が安定するのを待たずにデータを取ればデータの精度が悪くなるという欠点があった。   However, since the negative high voltage applied to the photomultiplier tube of the non-operating detector 57 is almost zero, when switching from the photodiode of the active detector 75 to the photomultiplier tube of the non-operating detector 57, Further, it is necessary to increase the negative high voltage of the non-operating detector 57 again, and it takes time to stabilize, so there is a disadvantage that analysis time becomes long. In addition, there is a drawback in that the accuracy of data deteriorates if data is taken without waiting for the negative high voltage to stabilize.

本発明は、前記課題を解決するために、測定光を試料側光路と参照側光路とに交互に振り分ける手段と、前記振り分けにおける1サイクル中の一定期間測定光を遮蔽する光路切替手段と、前記試料側光路中に配設された被測定試料を通過した試料側信号と前記参照側光路中に配設された参照試料を通過した参照側信号とを検出する複数の検出器を具備するダブルビーム方式の分光光度計において、前記測定光が前記光路切替手段で切り替えられる際に生じる測定光遮蔽時の暗信号の安定待機時間に、電圧を印加された光電子増倍管を用いた非稼動の前記検出器の保護を行うための保護手段を備えたものである。   In order to solve the above problems, the present invention provides means for alternately distributing measurement light to a sample-side optical path and a reference-side optical path, optical path switching means for shielding measurement light for a certain period in one cycle in the distribution, A double beam comprising a plurality of detectors for detecting a sample side signal passing through a sample to be measured arranged in a sample side optical path and a reference side signal passing through a reference sample arranged in the reference side optical path In the spectrophotometer of the system, the non-operating said photomultiplier tube using a voltage is applied during the stable waiting time of the dark signal when the measurement light is blocked when the measurement light is switched by the optical path switching means. It is provided with a protection means for protecting the detector.

さらに本発明は、測定光を試料側光路と参照側光路とに交互に振り分ける手段と、前記振り分けにおける1サイクル中の一定期間測定光を遮蔽する光路切替手段と、前記試料側光路中に配設された被測定試料を通過した試料側信号と前記参照側光路中に配設された参照試料を通過した参照側信号とを検出する複数の検出器を具備するダブルビーム方式の分光光度計において、前記測定光が前記光路切替手段で切り替えられる際に生じる前記試料側信号または参照側信号の測定信号安定待機時間に、光電子増倍管を用いた前記検出器に印加される電圧の測定を行うための測定手段を備えたものである。   Further, the present invention provides a means for alternately distributing the measurement light into the sample side optical path and the reference side optical path, an optical path switching means for shielding the measurement light for a certain period in one cycle of the distribution, and the sample side optical path. In a spectrophotometer of a double beam system comprising a plurality of detectors for detecting a sample side signal that has passed through a measured sample and a reference side signal that has passed through a reference sample disposed in the reference side optical path, In order to measure the voltage applied to the detector using a photomultiplier tube during the measurement signal stabilization waiting time of the sample side signal or the reference side signal generated when the measurement light is switched by the optical path switching means The measuring means is provided.

前記測定信号安定待機時間および暗信号の安定待機時間に分光器の性能を向上させる新たな機能を追加するものである。   A new function for improving the performance of the spectrometer is added to the measurement signal stabilization standby time and the dark signal stabilization standby time.

AD変換器を増やすことなく、光電子増倍管の信号の異常を検知して即自己の保護動作を行えるので確実な保護ができる。   Without increasing the number of AD converters, it is possible to detect the abnormality of the signal of the photomultiplier tube and immediately perform the self-protection operation, so that reliable protection can be achieved.

本発明の実施例による分光光度計の要部の構成図である。It is a block diagram of the principal part of the spectrophotometer by the Example of this invention. 本発明の実施例の分光光度計におけるデータ処理を説明するためのタイミング図である。図2(a)は「検出器に入力される信号」を表す。図2(b)は「測定信号測定時間」を表す。図2(c)は「安定待機時間」を表す。図2(d)は「セクタ鏡のフォトセンサから制御部に入力される信号」を表す。図2(e)「セクタ鏡のモード」を表す。It is a timing diagram for demonstrating the data processing in the spectrophotometer of the Example of this invention. FIG. 2A shows a “signal input to the detector”. FIG. 2B shows “measurement signal measurement time”. FIG. 2C shows “stable waiting time”. FIG. 2D shows a “signal input to the control unit from the photo sensor of the sector mirror”. FIG. 2E shows the “sector mirror mode”. 従来の分光光度計の要部の構成図である。It is a block diagram of the principal part of the conventional spectrophotometer.

図1は本発明のダブルビーム方式の分光光度計の要部の構成図である。図1において、光源1から発した光は、入口スリット2、回折格子3、出口スリット4、およびステッピングモータ5を含む分光器6に導入され、分光器6から所定の波長の単色光が取り出される。ステッピングモータ5は、入口スリット2を通過した入射光に対し回折格子3の角度を変えることにより、出口スリット4を介して取り出される単色光の波長を変化させる。取り出された単色光すなわち測定光は、モータ9により一定速度で回転駆動されるセクタ鏡8によって、2つの反射鏡10、11の方向に交互に送られる。   FIG. 1 is a configuration diagram of a main part of a double beam type spectrophotometer according to the present invention. In FIG. 1, light emitted from a light source 1 is introduced into a spectroscope 6 including an entrance slit 2, a diffraction grating 3, an exit slit 4, and a stepping motor 5, and monochromatic light having a predetermined wavelength is extracted from the spectroscope 6. . The stepping motor 5 changes the wavelength of the monochromatic light extracted through the exit slit 4 by changing the angle of the diffraction grating 3 with respect to the incident light that has passed through the entrance slit 2. The extracted monochromatic light, that is, measurement light, is alternately sent in the direction of the two reflecting mirrors 10 and 11 by the sector mirror 8 that is rotationally driven by the motor 9 at a constant speed.

セクタ鏡8の回転に伴い、分光器6からの単色光の照射位置に開口部83が到来したとき、単色光は開口部83を抜けて反射鏡11に照射され、試料側光束Lsとなって被測定試料13に照射される。一方、単色光の照射位置に反射鏡82が到来したとき、単色光はその反射鏡82で反射された後に反射鏡10に照射され、参照側光束Lrとなって参照試料12に照射される。また、単色光の照射位置に遮光部84、85が到来したときには、試料側光束Ls、参照側光束Lrのいずれも照射されない。   When the opening 83 arrives at the position where the monochromatic light from the spectroscope 6 is irradiated with the rotation of the sector mirror 8, the monochromatic light passes through the opening 83 and is irradiated onto the reflecting mirror 11 to become the sample-side light beam Ls. The sample 13 to be measured is irradiated. On the other hand, when the reflecting mirror 82 arrives at the irradiation position of the monochromatic light, the monochromatic light is reflected by the reflecting mirror 82 and then irradiated to the reflecting mirror 10 to be irradiated to the reference sample 12 as a reference side light beam Lr. Further, when the light shielding portions 84 and 85 arrive at the monochromatic light irradiation position, neither the sample-side light beam Ls nor the reference-side light beam Lr is irradiated.

例えば、被測定試料13は試料セルに被測定試料溶液が充填されたもの、参照試料12は同じ試料セルに溶媒のみが充填されたものである。セクタ鏡8には、開口部83、反射鏡82、遮光部84、85が軸の周りに45°の間隔で設けられ、また軸の点対称位置に同様の部分を有する。したがって、1サイクル(1/2回転期間)中で、被測定試料13と参照試料12とに光が照射される期間は等しく、その間で光が遮蔽される期間も等しい。   For example, the sample 13 to be measured is a sample cell filled with a sample solution to be measured, and the reference sample 12 is a sample cell filled with only a solvent. The sector mirror 8 is provided with an opening 83, a reflecting mirror 82, and light shielding portions 84 and 85 at an interval of 45 ° around the axis, and has a similar portion at a point-symmetrical position of the axis. Therefore, in one cycle (1/2 rotation period), the period during which the sample 13 to be measured and the reference sample 12 are irradiated with light is equal, and the period during which the light is shielded is also equal.

つぎに、セクタ鏡8の動きを詳しく説明する。セクタ鏡8には、軸の周りには反射鏡82、開口部83、遮光部84、85が、交互に設けられている。いま、分光器6から取り出された単色光の光束が図1中に示す点線に沿って入射する位置にセクタ鏡8が設置されているとした場合、セクタ鏡8が1回転する間に、光束は、反射鏡82→遮光部84→開口部83→遮光部85→反射鏡82→遮光部84の順に進行する。図2に本発明の分光光度計におけるデータ処理を説明するためのタイミング図を示しているが、セクタ鏡8のモードとしては、図2(e)に示すとおり、反射(R)→遮光(DR)→通過(S)→遮光(DS)→反射(R)→遮光(DR)の順に切り替えられる。   Next, the movement of the sector mirror 8 will be described in detail. The sector mirror 8 is provided with reflecting mirrors 82, openings 83, and light-shielding portions 84 and 85 alternately around the axis. Now, assuming that the sector mirror 8 is installed at a position where the monochromatic light beam extracted from the spectroscope 6 is incident along the dotted line shown in FIG. Proceeds in the order of the reflecting mirror 82 → the light shielding portion 84 → the opening 83 → the light shielding portion 85 → the reflecting mirror 82 → the light shielding portion 84. FIG. 2 shows a timing chart for explaining data processing in the spectrophotometer of the present invention. As a mode of the sector mirror 8, as shown in FIG. 2 (e), reflection (R) → light shielding (DR ) → passing (S) → shading (DS) → reflection (R) → shading (DR).

通過(S)の期間には被測定試料に試料側光束が照射され、反射(R)の期間には参照試料に参照側光束が照射される。なお、遮光(DS、DR)の期間には検出器へ光が入射しない。その結果、検出器において、通過(S)の期間には試料側信号が、反射(R)の期間には参照側信号が、遮光(DS、DR)の期間には暗信号が、時分割で得られる。   The sample-side light beam is irradiated to the sample to be measured during the passage (S), and the reference-side light beam is irradiated to the reference sample during the reflection (R) period. Note that light does not enter the detector during the period of light shielding (DS, DR). As a result, in the detector, the sample-side signal is time-divisionally transmitted during the passage (S) period, the reference-side signal is transmitted during the reflection (R) period, and the dark signal is transmitted during the light-shielding (DS, DR) period. can get.

この検出信号の変化の一例を図2(a)に示す。通常、セクタ鏡8が回転する際に各セクタの切り替わりの前後で信号は大きく変化するが、検出器やその後段の電気回路の周波数応答の制約などのために、信号の変化は図示するとおり、立ち上がりと立ち下がりに鈍りが生じる。このため、図2(c)に示す信号の静定しない安定待機時間が生じる。この検出信号はAD変換器において所定のサンプリング周期でサンプリングされてデジタル値に変換されるが、上述のとおり信号が静定していない範囲では正確なデータを得ることができないため、実際には図2(b)に示した期間にデータを収集する。なお、図2(d)に、セクタ鏡8に設置されたフォトセンサ(図示せず)より、セクタ鏡8が開口部83、反射鏡82、遮光部84、85と切り替わるときを表すタイミング信号を示す。   An example of the change in the detection signal is shown in FIG. Usually, when the sector mirror 8 rotates, the signal changes greatly before and after the switching of each sector. However, due to the restriction of the frequency response of the detector and the subsequent electric circuit, the change of the signal is as shown in the figure. Dullness occurs at the rise and fall. For this reason, a stable waiting time in which the signal shown in FIG. This detection signal is sampled at a predetermined sampling period and converted to a digital value in the AD converter. However, as described above, accurate data cannot be obtained in a range where the signal is not settled. Data is collected during the period shown in 2 (b). 2D shows a timing signal indicating when the sector mirror 8 is switched to the opening 83, the reflecting mirror 82, and the light shielding portions 84 and 85 from a photo sensor (not shown) installed in the sector mirror 8. In FIG. Show.

即ち、図2(b)において、Dsは試料側信号データの収集期間、Drは参照側信号データの収集期間、Ddsは試料側暗信号データの収集期間、Ddrは参照側暗信号データの収集期間である。また、図2(c)において、Tsは試料側信号安定待機時間、Trは参照側信号安定待機時間、Tdsは試料側暗信号安定待機時間、Tdrは参照側暗信号安定待機時間である。   That is, in FIG. 2B, Ds is the sample-side signal data collection period, Dr is the reference-side signal data collection period, Dds is the sample-side dark signal data collection period, and Ddr is the reference-side dark signal data collection period. It is. In FIG. 2C, Ts is a sample side signal stabilization standby time, Tr is a reference side signal stabilization standby time, Tds is a sample side dark signal stabilization standby time, and Tdr is a reference side dark signal stabilization standby time.

参照試料12を通過した参照側光束Lrは反射鏡14で反射され、被測定試料13を通過した試料側光束Lsは反射鏡15、16で反射され、いずれも検出器19に導入される。検出器19による検出信号は電流電圧変換器31を経てAD変換器18に入力され、所定のサンプリング周期でサンプリングされてデジタル値に変換される。これにより、検出器19に入射した光の強度に対応したデータが得られ、これが制御部20に入力される。   The reference-side light beam Lr that has passed through the reference sample 12 is reflected by the reflecting mirror 14, and the sample-side light beam Ls that has passed through the sample 13 to be measured is reflected by the reflecting mirrors 15 and 16, and both are introduced into the detector 19. A detection signal from the detector 19 is input to the AD converter 18 via the current-voltage converter 31, sampled at a predetermined sampling period, and converted into a digital value. As a result, data corresponding to the intensity of the light incident on the detector 19 is obtained and input to the controller 20.

ところで、分光光度計では紫外域から赤外域まで広い波長範囲で分光分析を行うために、波長範囲が広くなると一つの検出器で全波長を検出することが困難となり、複数の検出器を設置することが必要となる。図1に、例として非稼動の検出器17に光電子増倍管、稼動の検出器19にフォトダイオードを使用した場合を示す。検出器17は電流電圧変換器32、AD変換器18を経て制御部20へ、また検出器19はAD変換器18を経て制御部20へ接続されている。ここで、非稼動の検出器17は常時電圧が印加されており、測定波長が変わった場合、稼動の検出器19からすぐに切り替え、即検出器17による測定が開始される。ところで、非稼動の検出器17の光電子増倍管は外光などの異常に大きな光が入力すると過大な信号が出力され劣化してしまうので、検出器17を保護することが必要となる。   By the way, since the spectrophotometer performs spectral analysis in a wide wavelength range from the ultraviolet region to the infrared region, it becomes difficult to detect all wavelengths with one detector when the wavelength range becomes wide, and a plurality of detectors are installed. It will be necessary. FIG. 1 shows a case where a photomultiplier tube is used for the non-operating detector 17 and a photodiode is used for the operating detector 19 as an example. The detector 17 is connected to the control unit 20 via the current-voltage converter 32 and the AD converter 18, and the detector 19 is connected to the control unit 20 via the AD converter 18. Here, a voltage is constantly applied to the non-operating detector 17, and when the measurement wavelength is changed, the non-operating detector 17 is immediately switched from the active detector 19 and measurement by the immediate detector 17 is started. By the way, if the photomultiplier tube of the non-operating detector 17 is input with abnormally large light such as outside light, an excessive signal is output and deteriorates, so that it is necessary to protect the detector 17.

そのため、フォトダイオードによってAD変換器18が使用されていない暗信号の安定待機時間中に、AD変換器18を使用して光電子増倍管によって異常を検知した場合には、制御部20からの指令により即光電子増倍管の電源をオフにするという保護動作を行う。ただし、暗信号の安定待機時間以外は光電子増倍管への異常入力は監視されないが、安定待機時間は、通常測定で5〜6msec間隔、最もゆっくりした測定でも10〜12msec間隔で発生するので、光電子増倍管の保護は可能である。   Therefore, when an abnormality is detected by the photomultiplier tube using the AD converter 18 during the dark signal stabilization standby time when the AD converter 18 is not used by the photodiode, a command from the control unit 20 is used. Thus, the protection operation of turning off the power of the photomultiplier tube is performed. However, abnormal input to the photomultiplier tube is not monitored except for the stable waiting time of the dark signal, but the stable waiting time occurs at intervals of 5 to 6 msec for normal measurement and at intervals of 10 to 12 msec for the slowest measurement. Protection of the photomultiplier tube is possible.

また、検出器17には常時電圧が印加されており、測定精度を保証するため常に電圧の監視が必要である。そのため、AD変換器を新たに追加することなく、試料側検出信号および参照側検出信号の計測のみに使用されていたAD変換器18を用いて、AD変換器18が使用されていない試料側信号または参照側信号の検出信号安定待機時間中に、負高圧回路34によって検出器17の光電子増倍管に印加される電圧がモニタ回路33によって計測される。前記測定データはAD変換器18を経て制御部20に入力され、もし基準電圧を外れた場合、制御部20からの指令により光電子増倍管の電源をオフにして分光器の計測を中断する。   Further, a voltage is constantly applied to the detector 17, and it is necessary to constantly monitor the voltage in order to ensure measurement accuracy. Therefore, the sample-side signal in which the AD converter 18 is not used by using the AD converter 18 that has been used only for the measurement of the sample-side detection signal and the reference-side detection signal without newly adding an AD converter. Alternatively, the voltage applied to the photomultiplier tube of the detector 17 by the negative high voltage circuit 34 is measured by the monitor circuit 33 during the detection signal stabilization standby time of the reference side signal. The measurement data is input to the control unit 20 via the AD converter 18, and if the reference voltage is deviated, the photomultiplier tube is turned off by the command from the control unit 20 and the measurement of the spectrometer is interrupted.

AD変換器18に入力された検出信号は所定のサンプリング周期でサンプリングされてデジタル値に変換され、検出器19に入射した光の強度に対応したデータが得られ、これが制御部20に入力される。セクタ鏡8に設置されたフォトセンサ(図示せず)より、セクタ鏡8の開口部83、反射鏡82、遮光部84、85と切り替わるときの入力光量の変化のタイミング信号(図2(d)参照)が制御部20に取り込まれ、また制御部20は、ステッピングモータ5およびモータ9などを制御する制御信号を送る。制御部20は必要なデータを取捨選択するとともに分類して保存し、さらにはそのデータを用いた所定の演算処理を実行し、被測定試料による吸光度を波長毎に計算する。   The detection signal input to the AD converter 18 is sampled at a predetermined sampling period and converted into a digital value, and data corresponding to the intensity of the light incident on the detector 19 is obtained, which is input to the control unit 20. . Timing signal of change in input light amount when switching from the photosensor (not shown) installed in the sector mirror 8 to the opening 83, the reflecting mirror 82, and the light shielding portions 84 and 85 of the sector mirror 8 (FIG. 2D). The control unit 20 sends a control signal for controlling the stepping motor 5 and the motor 9 and the like. The control unit 20 selects and classifies necessary data, classifies and stores the data, and executes predetermined calculation processing using the data, and calculates the absorbance of the sample to be measured for each wavelength.

1、41:光源
2、42:入口スリット
3、43:回折格子
4、44:出口スリット
5、45:ステッピングモータ
6、46:分光器
8、48:セクタ鏡
9、49:モータ
10、11、14、15、16、50、51、54、55、56:反射鏡
12、52:参照試料
13、53:被測定試料
17、57:検出器(光電子増倍管)
19、75:検出器(フォトダイオード)
18、58:AD変換器
20、40:制御部
31、32、71、72:電流電圧変換器
33 :モニタ回路
34、74:負高圧回路
82、92:反射鏡
83、93:開口部
84、94:遮光部(R)
85、95:遮光部(S)
DESCRIPTION OF SYMBOLS 1, 41: Light source 2, 42: Entrance slit 3, 43: Diffraction grating 4, 44: Exit slit 5, 45: Stepping motor 6, 46: Spectrometer 8, 48: Sector mirror 9, 49: Motors 10, 11, 14, 15, 16, 50, 51, 54, 55, 56: Reflector 12, 52: Reference sample 13, 53: Sample 17 to be measured 17, 57: Detector (photomultiplier tube)
19, 75: Detector (photodiode)
18, 58: AD converter 20, 40: Control units 31, 32, 71, 72: Current-voltage converter 33: Monitor circuit 34, 74: Negative high voltage circuit 82, 92: Reflector 83, 93: Opening 84, 94: Shading part (R)
85, 95: Shading part (S)

Claims (2)

測定光を試料側光路と参照側光路とに交互に振り分ける手段と、前記振り分けにおける1サイクル中の一定期間測定光を遮蔽する光路切替手段と、前記試料側光路中に配設された被測定試料を通過した試料側信号と前記参照側光路中に配設された参照試料を通過した参照側信号とを検出する複数の検出器を具備するダブルビーム方式の分光光度計において、前記測定光が前記光路切替手段で切り替えられる際に生じる測定光遮蔽時の暗信号の安定待機時間に、電圧を印加された光電子増倍管を用いた非稼動の前記検出器の保護を行うための保護手段を備えたことを特徴とする分光光度計。   Means for alternately distributing the measurement light to the sample-side optical path and the reference-side optical path, optical path switching means for shielding the measurement light for a certain period in one cycle of the distribution, and a sample to be measured disposed in the sample-side optical path A double-beam spectrophotometer comprising a plurality of detectors that detect a sample-side signal that has passed through and a reference-side signal that has passed through a reference sample disposed in the reference-side optical path. Protective means for protecting the non-operating detector using a photomultiplier tube to which a voltage is applied during the stable standby time of the dark signal at the time of shielding the measuring light that occurs when switching is performed by the optical path switching means A spectrophotometer characterized by that. 測定光を試料側光路と参照側光路とに交互に振り分ける手段と、前記振り分けにおける1サイクル中の一定期間測定光を遮蔽する光路切替手段と、前記試料側光路中に配設された被測定試料を通過した試料側信号と前記参照側光路中に配設された参照試料を通過した参照側信号とを検出する複数の検出器を具備するダブルビーム方式の分光光度計において、前記測定光が前記光路切替手段で切り替えられる際に生じる前記試料側信号または参照側信号の測定信号安定待機時間に、光電子増倍管を用いた前記検出器に印加される電圧の測定を行うための測定手段を備えたことを特徴とする分光光度計。   Means for alternately distributing the measurement light to the sample-side optical path and the reference-side optical path, optical path switching means for shielding the measurement light for a certain period in one cycle of the distribution, and a sample to be measured disposed in the sample-side optical path A double-beam spectrophotometer comprising a plurality of detectors that detect a sample-side signal that has passed through and a reference-side signal that has passed through a reference sample disposed in the reference-side optical path. Measuring means for measuring the voltage applied to the detector using a photomultiplier tube during the measurement signal stabilization waiting time of the sample side signal or the reference side signal that is generated when switching is performed by the optical path switching means. A spectrophotometer characterized by that.
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