JP5474420B2 - Fluorescent lamp inspection device - Google Patents

Description

  The present invention relates to a fluorescent lamp inspection apparatus for inspecting a fluorescent lamp typified by a cold cathode fluorescent lamp.

  Conventionally, a cold cathode fluorescent lamp (or cold cathode discharge lamp; CCFL) is generally used as a light source for a backlight of, for example, a liquid crystal display device. A fluorescent lamp represented by a cold cathode fluorescent lamp has a fluorescent coating formed on the inner peripheral surface of a cylindrical glass tube.

  When manufacturing such a fluorescent lamp, the fluorescent coating film may be peeled off or become extremely thin for some reason. For this reason, it is necessary to inspect whether the fluorescent coating film is normally formed after the formation of the fluorescent coating film.

  As a conventional inspection apparatus, an apparatus for inspecting the film thickness of a fluorescent coating by measuring the amount of light transmitted through a fluorescent lamp has been proposed (for example, see Patent Document 1). In such an inspection apparatus, the irradiation unit emits light to the fluorescent lamp, and the CCD camera as the imaging unit provided on the opposite side images (receives) light transmitted through the fluorescent lamp, and the CCD camera performs predetermined exposure. The quality of the fluorescent coating film is determined based on the luminance value of each pixel of different image data in proportion to the amount of light received in time.

  More specifically, in the captured image data, light that has been irradiated from the irradiation unit and transmitted through the fluorescent lamp based on the luminance value of the inspection region corresponding to the fluorescent lamp and the luminance value of the background region corresponding to the irradiation unit. The quality of the fluorescent coating film is determined by calculating the transmittance. Here, for example, when the fluorescent coating is peeled off or there is an extremely thin portion, the luminance value of the corresponding portion is equal to or higher than the reference value, so that the fluorescent coating can be determined to be defective.

JP 2008-267926 A

  However, by using the above-described conventional technology, for example, the exposure time of the CCD camera and the irradiation time of the irradiation means are relatively long under the imaging conditions where the luminance value of the inspection area corresponding to the fluorescent lamp becomes a luminance level with high accuracy. When the image is taken in the same manner, the luminance value of the background area corresponding to the irradiating means reaches the saturation level of the CCD camera (imaging device), and the transmittance of the light transmitted through the fluorescent lamp is calculated. It becomes impossible to accurately grasp the irradiation light amount (brightness value of the background area) of the reference irradiation means. Since the irradiation light quantity of the irradiation means varies depending on temperature, power supply voltage, changes with time, etc., in this case, even if the abnormality of the luminance value in the inspection area is grasped, it is caused by the abnormality of the thickness of the fluorescent coating film. It is impossible to determine whether this is caused by a change in the amount of light emitted from the irradiation means. As a result, there is a concern that the transmittance of the light transmitted through the fluorescent lamp cannot be accurately grasped, resulting in a decrease in inspection accuracy.

  The present invention has been made in view of the above circumstances, and has as its main object to provide a fluorescent lamp inspection apparatus capable of dramatically improving the inspection accuracy in the inspection of the fluorescent coating film of a fluorescent lamp. I am trying.

  Hereinafter, each means suitable for solving the above-described problem will be described separately. In addition, the effect specific to the means to respond | corresponds as needed is added.

Means 1. A fluorescent lamp inspection device for inspecting a fluorescent lamp in which a fluorescent coating film is formed on the inner peripheral surface of a cylindrical glass tube,
Irradiating means for irradiating the fluorescent lamp with light;
An imaging unit provided on a side opposite to the irradiation unit across the fluorescent lamp, receiving direct light from the irradiation unit and transmitted light transmitted through the fluorescent lamp, and outputting the image data including at least a luminance value; ,
Based on the image data obtained by the imaging means, comprising a determination means for determining the quality of the fluorescent coating film,
The imaging means includes
Outputting first image data imaged under a first imaging condition in which the luminance value of the inspection region corresponding to the fluorescent lamp does not reach a saturation level;
Outputs second image data captured under a second imaging condition in which the amount of received light is smaller than when captured under the first imaging condition and the luminance value of the background area corresponding to the irradiation means does not reach a saturation level. And
The determination means includes
Obtaining a first luminance value which is a luminance value of the inspection area from the first image data;
Obtaining a second luminance value that is a luminance value of the background region from the second image data;
From the second image data, a third luminance value that is a luminance value of the inspection area related to the second image data is calculated,
Based on the first luminance value and the third luminance value, a reference luminance level of the imaging means is calculated,
The light transmittance in the inspection area according to the second image data is calculated from the ratio between the difference between the second luminance value and the reference luminance level and the difference between the third luminance value and the reference luminance level. And
A fluorescent lamp inspection apparatus, wherein the film thickness of the fluorescent coating film is determined based on the transmittance.

  According to the means 1, the amount of light received by the imaging means is set such that, for example, the exposure time of the imaging means is increased within a range where the luminance value of the inspection area corresponding to the fluorescent lamp does not reach the saturation level. By setting the imaging condition so that the number of images is relatively large, the first luminance value, which is the luminance value of the inspection area, can be accurately acquired from the first image data at an appropriate luminance level.

  Further, from the second image data, the second luminance value, which is the luminance value of the background area, can be acquired at a luminance level that does not reach the saturation level of the imaging means.

  Since the luminance value of each pixel of the image data is a value that changes approximately in proportion to the amount of light received by the imaging means (imaging device), the predetermined variable relating to the imaging condition is obtained by acquiring the first luminance value. The change rate of the luminance value of the inspection area with respect to the change amount (for example, the exposure time) can be calculated as a monotonically increasing function.

  Accordingly, it is possible to calculate the light transmittance in the inspection region related to the second image data based on the monotonically increasing function. That is, it is possible to calculate a more accurate transmittance based on the luminance value of the background region (irradiation light amount of the irradiation unit) obtained accurately without reaching the saturation level.

  As a result, it is possible to accurately grasp the transmittance of the light transmitted through the fluorescent lamp without being affected by the change in the irradiation light quantity of the irradiation means, and to dramatically improve the film thickness inspection accuracy of the fluorescent coating film. .

  In addition, since it is not affected by the difference in the characteristics and sensitivity of the light receiving means, when inspecting with a plurality of imaging means, for example, when a plurality of imaging means are provided in the longitudinal direction and the area is inspected, the characteristics of the imaging means Not affected by variation.

In general, due to the characteristics of the imaging means (imaging device), for example, even when the exposure time is 0, the output level (luminance value) of the luminance signal output from the imaging means does not become 0, but shows a predetermined value (hereinafter referred to as the following). This value is called the reference luminance level of the image pickup means). Even in such a case, according to the present means 1, the light transmittance in the inspection region can be calculated without knowing in advance the reference luminance level of the imaging means. As a result, it is not necessary to perform the work of specifying or setting the reference luminance level in advance before the inspection, and the inspection efficiency can be improved.

Means 2 . Wherein by adjusting the exposure time of the image pickup means, the fluorescent lamp test apparatus according to means 1, wherein the switching between the second imaging condition and the first imaging condition.

According to the means 2 , various image data necessary for acquiring the various luminance values are obtained by a relatively simple method such as changing the exposure time of the imaging means and adjusting the amount of light received by the imaging means. Therefore, complication of control processing in the inspection apparatus can be suppressed.

Means 3 . Wherein by adjusting the irradiation time of the irradiation means, the fluorescent lamp test apparatus according to means 1, wherein the switching between the second imaging condition and the first imaging condition.

According to the means 3 , various image data necessary for acquiring the various brightness values are obtained by a relatively simple method of changing the irradiation time of the irradiation means and adjusting the amount of light received by the imaging means. Therefore, complication of control processing in the inspection apparatus can be suppressed.

Means 4 . Wherein by adjusting the aperture of the imaging means, the fluorescent lamp test apparatus according to means 1, wherein the switching between the second imaging condition and the first imaging condition.

According to the means 4 , various image data necessary to acquire the various luminance values are imaged by a relatively simple method such as changing the aperture of the imaging means and adjusting the amount of light received by the imaging means. Therefore, complication of control processing in the inspection apparatus can be suppressed.

It is a block diagram which shows schematic structure of a fluorescent lamp test | inspection apparatus. It is a schematic diagram for demonstrating structures, such as a fluorescent lamp. It is a schematic diagram which shows the arrangement configuration of a fluorescent lamp, an illuminating device, and a CCD camera. It is a flowchart which shows a film thickness defect determination processing routine. It is a schematic diagram for demonstrating image data. It is the figure which showed the relationship between the exposure time in a test | inspection area | region and a background area | region, and a luminance value.

  Hereinafter, an embodiment will be described with reference to the drawings. First, the fluorescent lamp 11 as an inspection object will be described with reference to FIG. The fluorescent lamp 11 includes a tubular glass tube 12 and a fluorescent coating 13 formed on the inner peripheral surface of the glass tube 12.

  Next, the fluorescent lamp inspection apparatus 1 for inspecting the fluorescent lamp 11 will be described. As shown in FIG. 1, the fluorescent lamp inspection apparatus 1 includes an illumination device 2 as an irradiating unit, a CCD camera 3 as an imaging unit, and an image processing device 4.

  The fluorescent lamps 11 are arranged along the horizontal direction with both ends held by holding means (not shown), and a plurality of fluorescent lamps 11 are used for inspection in a parallel state with a predetermined interval. Further, the fluorescent lamp inspection apparatus 1 is provided with moving means (not shown) capable of transporting the fluorescent lamp 11 along its longitudinal direction by moving the holding means in the longitudinal direction of the fluorescent lamp 11. . By the moving means, the fluorescent lamp 11 is intermittently moved between the illumination device 2 of the fluorescent lamp inspection apparatus 1 and the CCD camera 3 while maintaining the horizontal state and the parallel state. Further, in the present embodiment, there are provided rotating means (not shown) capable of rotating the front end portions (holding portions of the fluorescent lamps 11) of both holding means in synchronism with each predetermined rotation angle. The rotating means enables the fluorescent lamp 11 to rotate at a predetermined rotation angle in its circumferential direction. In addition, a transporting means (not shown) is provided for moving the holding means to transport a plurality of fluorescent lamps 11 in the direction orthogonal to the longitudinal direction every time inspection is completed.

  The illumination device 2 is a surface-emitting light source that emits predetermined light from below the fluorescent lamp 11. The illumination device 2 includes a large number of LEDs, and light from the LEDs is irradiated upward through a diffusion plate. In addition, the illuminating device 2 is provided along the conveyance path | route of the fluorescent lamp 11, and can irradiate light with respect to the longitudinal direction whole region of the several fluorescent lamp 11 currently supported in the parallel state. .

  The CCD camera 3 is provided on the opposite side of the illumination device 2 with the fluorescent lamp 11 in between (see FIG. 3). The CCD camera 3 includes a lens, an image sensor, and the like. A CCD sensor is employed as the image sensor. Then, the CCD camera 3 captures (receives) the direct light from the illumination device 2 and the transmitted light transmitted through the fluorescent lamp 11. The image data of the present embodiment that is imaged by the CCD camera 3 and output to the image processing device 4 is grayscale image data that includes at least a luminance value for each pixel.

  The image processing device 4 includes an image memory 5, an arithmetic device 6, a display unit 7, an output unit 8, and camera timing control means 9.

  The image memory 5 stores image data. The image data captured by the CCD camera 3 is converted into a digital format and stored.

  The arithmetic unit 6 includes a determination unit 17 that determines whether the fluorescent coating film 13 is good or bad, and is implemented by a CPU. In the determination means 17, a film thickness defect inspection process for determining the quality of the fluorescent coating film 13 is performed. Details of the procedure of the film thickness defect inspection process will be described later.

  The arithmetic device 6 outputs the inspection result of the fluorescent coating film 13 made by the determination means 17 to the display unit 7 and the output unit 8. When the determination means 17 determines that the fluorescent coating film 13 is “bad”, in addition to the inspection result, the positional information of the defective portion of the fluorescent coating film 13 is displayed on the display unit 7 and the output unit 8. Is output.

  The display unit 7 displays the inspection result (“good” or “bad”) or the like input from the arithmetic device 6 on the monitor 16. That is, when the fluorescent coating film 13 is determined to be “defective”, the inspection result is displayed as “defective” on the monitor 16 and the position information of the defective portion of the fluorescent coating film 13 is displayed on the monitor 16. The

  The output unit 8 stores the inspection result input from the arithmetic unit 6 in an information collection memory (not shown), and controls the transport unit and the like based on the inspection result.

  The information collection memory stores position information of a defective part when at least a defect occurs in the fluorescent coating film 13. By analyzing the position information of the defective part stored in the information collecting memory, it is possible to specify a part having a high defect occurrence frequency. Thereby, it is possible to effectively take measures for reducing the frequency of occurrence of defects when the fluorescent coating film 13 is formed.

  Further, when the inspection result is “defective”, the output unit 8 controls the conveying means to transfer the fluorescent lamp 11 determined to be “defective” to a predetermined defective product storage unit (not shown). And transport.

  The camera timing control means 9 controls the exposure time of the CCD camera 3 and the timing at which captured image data is taken into each image memory 5. Such timing is controlled based on a signal from the arithmetic device 6.

  Here, the film thickness defect inspection process for determining the quality of the fluorescent coating film 13 will be described. In such a film thickness defect inspection process, the film thickness defect inspection process routine shown in FIG.

First, in step S11, a first imaging process is performed. In the first imaging process, imaging is performed under the first imaging condition where the exposure time of the CCD camera 3 is t ₁ while the luminance of the illumination device 2 is kept constant. The captured image data is stored in the image memory 5 as first image data. The image data acquired here is, for example, grayscale image data schematically shown in FIG. That is, inspection areas WA1 to WA8 (hatched portions in FIG. 5) corresponding to the fluorescent lamp 11 and background areas WB1 to WB9 corresponding to the illumination device 2 in a rectangular area corresponding to the imaging field of view S of the CCD camera 3. Are image data arranged alternately so as to form a striped pattern.

The exposure time t ₁ is a value that is arbitrarily set in advance within a range in which the luminance values of the inspection areas WA1 to WA8 do not reach the saturation level (see FIG. 6).

In the subsequent step S12, a second imaging process is performed. In the second imaging process, imaging is performed under the second imaging condition in which the exposure time of the CCD camera 3 is t ₂ shorter than the exposure time t ₁ while the luminance of the illumination device 2 is kept constant. The captured image data is stored in the image memory 5 as second image data.

The exposure time t ₂ is previously arbitrarily set value in the range where the luminance value of the background region WB1~WB9 corresponding to the illumination device 2 does not reach the saturation level (see FIG. 6).

  In step S13, a process of calculating the film thickness index X of the fluorescent lamp 11 based on the first image data and the second image data is performed.

More specifically, as shown in FIG. 6, first, from the first image data acquired in step S11, for each inspection area WA1 to WA8, the first luminance value Y _1w that is the average luminance value of all the pixels in the area. Are calculated respectively.

Next, from the second image data acquired in step S12, a second luminance value Y _2b that is an average luminance value of all the pixels in all the background regions WB1 to WB9 is calculated.

Subsequently, from the second image data, for each of the inspection areas WA1 to WA8, a third luminance value Y _2w that is a luminance average value of all the pixels in the area is calculated.

Then, the reference luminance level Y ₀ is calculated from the first luminance value Y _1w and the third luminance value Y _{2w based} on the following arithmetic expression (1). The reference luminance level Y ₀ is a value determined based on the characteristics of the CCD camera 3 and corresponds to the output level of the luminance signal output from the CCD camera 3 when the exposure time is zero.

_{Y 0 = Y 1w - {(} Y 1w -Y 2w) / (t 1 -t 2)} · t 1
= {(Y _2w · t ₁ −Y _1w · t ₂ ) / (t ₁ −t ₂ )} (1)
Subsequently, based on the reference luminance level Y ₀ , the second luminance value Y _2b , and the third luminance value Y _2w , the light transmittance α / β of each of the inspection areas WA1 to WA8 in the second image data is calculated as follows. It calculates based on Formula (2).

α / β = (Y _2w −Y ₀ ) / (Y _2b −Y ₀ )
= (Y _1w −Y ₀ ) / {(Y _2b −Y ₀ ) · (t ₁ / t ₂ )}
= {(Y _1w −Y ₀ ) · t ₂ } / {(Y _2b −Y ₀ ) · t ₁ }
_{= {(Y 1w -Y 2w)} · t 2} / {(Y 2b -Y 2w) · t 1 - (Y 2b -Y 1w) · t 2} ... (2)
Furthermore, in this embodiment, the reciprocal of the transmittance α / β is calculated as the film thickness index X, and the film thickness of the fluorescent coating film 13 is determined based on the film thickness index X. The film thickness index X is calculated based on the following arithmetic expression (3).

X = β / α
= (Y _2b −Y ₀ ) / (Y _2w −Y ₀ )
_{= {(Y 2b -Y 2w)} · t 1 - (Y 2b -Y 1w) · t 2} / {(Y 1w -Y 2w) · t 2}
_{= {(Y 2b -Y 2w)} / (Y 1w -Y 2w)} · (t 1 / t 2) + {(Y 2b -Y 1w) / (Y 2w -Y 1w)} ... (3)
When the film thickness index X is calculated, in the subsequent step S14, it is determined whether or not the value of the film thickness index X is within a preset allowable range (A ≦ X ≦ B). Since the lower limit A and the upper limit B differ depending on the product type of the fluorescent lamp 11 depending on the size of the glass tube 12 and the type of the fluorescent coating 13, the luminance obtained by sampling some non-defective products prior to the inspection. A value calculated based on the value is set in advance. Here, for example, when the film thickness of the fluorescent coating film 13 is thinner than a predetermined value or thick, it is determined as “film thickness defect”.

  Here, when it is determined that the value of the film thickness index X is within a preset allowable range, a non-defective product determination is performed in step S15, and this process is terminated. On the other hand, if a negative determination is made, defective product determination is performed in step S16, and this process is temporarily terminated. These inspection results are output to the monitor 16 or the like.

  In the present embodiment, the rotation means changes the direction of the fluorescent lamp 11 along the circumferential direction of the fluorescent lamp 11, and the moving means changes the inspection target position along the longitudinal direction of the fluorescent lamp 11. A film thickness inspection is performed on the entire fluorescent lamp 11.

  Then, after the inspection of the entire fluorescent lamp 11 is completed, the fluorescent lamp 11 that has not been determined to be “film thickness defect” is finally processed as a non-defective product by the determination means 17. On the other hand, the fluorescent lamp 11 determined to be “film thickness defect” is transferred to a defective product storage unit.

As described above in detail, according to the present embodiment, the exposure time t ₁ of the CCD camera 3 is relatively long as long as the luminance values of the inspection areas WA1 to WA8 corresponding to the fluorescent lamp 11 do not reach the saturation level. The first image data is acquired under the first imaging condition. Thus, it is possible to obtain precisely a first luminance value Y _{1 w} a luminance average value of each inspection area WA1~WA8 at the appropriate luminance level.

Further, the second image data is acquired under the second imaging condition in which the exposure time t ₂ of the CCD camera 3 is relatively short. As a result, the second luminance value Y _2b that is the average luminance value of the background areas WB 1 to WB 9 corresponding to the illumination device 2 can be acquired at a luminance level that does not reach the saturation level of the CCD camera 3.

Then, from the second image data, the third luminance value Y _2w that is the average luminance value of each of the inspection areas WA1 to WA8 is calculated, and the reference luminance level Y ₀ of the CCD camera 3 is calculated based on the above equation (1). doing. As a result, based on these values and the above-described arithmetic expressions (2) and (3), the transmittance α / β of the inspection areas WA1 to WA8 related to the second image data, and the film thickness index X are calculated. Yes.

  As a result, the transmittance α / β of the light transmitted through the fluorescent lamp 11 and thus the film thickness index X can be accurately grasped without being affected by the change in the amount of irradiation light of the illumination device 2, and the film of the fluorescent coating film 13. Thickness inspection accuracy can be dramatically improved.

Further, as described above, in the present embodiment, the reference luminance level of the CCD camera 3 is based on the first luminance value Y _1w acquired from the first image data and the third luminance value Y _2w acquired from the second image data. Y ₀ is calculated, and the ratio of the difference β between the second luminance value Y _2b acquired from the second image data and the reference luminance level Y ₀ and the difference α between the third luminance value Y _2w and the reference luminance level Y ₀ is calculated. From this, the light transmittance α / β and hence the film thickness index X in the inspection areas WA1 to WA8 related to the second image data are calculated. That is, even if the reference luminance level Y ₀ of the CCD camera 3 is not grasped in advance, the light transmittance α / β and thus the film thickness index X in the inspection areas WA1 to WA8 can be calculated. As a result, it is not necessary to perform the work of the work and set to identify the pre-reference luminance level Y ₀ before the test, it is possible to improve the inspection efficiency.

  In addition, it is not limited to the description content of the said embodiment, For example, you may implement as follows. Of course, other application examples and modification examples not illustrated below are also possible.

(A) In the above embodiment, for each inspection area WA1 to WA8, by calculating the average luminance value of all the pixels in the area as the first luminance value _Y1w and the third luminance value _Y2w , the fluorescent coating film The film thickness inspection of 13 is performed. For example, the inspection is performed for each pixel of the inspection areas WA1 to WA8, or the luminance average value of all the pixels in all the inspection areas WA1 to WA8 is obtained as the first luminance value Y _1w and the inspection is performed. It is good.

(B) In the above-described embodiment, the imaging condition is switched by adjusting the exposure time of the CCD camera 3. However, the present invention is not limited to this. For example, the irradiation time and light source luminance of the illumination device 2 with a constant exposure time are used. The imaging conditions may be switched by changing the aperture or changing the aperture amount of the CCD camera 3. The imaging conditions such as the exposure times t ₁ and t ₂ are preferably specified in advance by sampling inspection or the like so that the first luminance value Y _1w to be acquired can be acquired at an appropriate luminance level. Further, since there is a possibility that an appropriate luminance level at which the first luminance value Y _{1w and the} like can be obtained with high accuracy may be changed due to a change with time in the amount of irradiation light of the illumination device 2, imaging conditions such as the exposure times t ₁ and t ₂ are appropriately set. It is preferable to correct.

( C ) Although not specifically mentioned in the above embodiment, in order to obtain the luminance values of the inspection areas WA1 to WA8 in consideration of the angle of view of the imaging unit and the luminance unevenness of the illumination unit, the background region near the center of the image On the basis of the brightness value (the brightness value near the center of the background area WB5) and the brightness value of the background area toward the edge of the image (such as the edge of the background area WB1, WB9, or WB5). It is good also as a structure to perform.

1 ... fluorescent lamp inspection device, 2 ... illuminating device, 3 ... CCD camera, 6 ... arithmetic unit, 11 ... fluorescent lamp, 12 ... glass tube, 13 ... fluorescent coating, 17 ... judging means, t _1, t ₂ ... exposure time, WA1~WA8 ... inspection area, WB1~WB9 ... background area, X ... thickness index, Y _{1 w} ... first luminance value, Y _2b ... second luminance value, Y _2w ... third luminance value, Y ₀ ... reference Luminance level.

Claims (4)

A fluorescent lamp inspection device for inspecting a fluorescent lamp in which a fluorescent coating film is formed on the inner peripheral surface of a cylindrical glass tube,
Irradiating means for irradiating the fluorescent lamp with light;
An imaging unit provided on a side opposite to the irradiation unit across the fluorescent lamp, receiving direct light from the irradiation unit and transmitted light transmitted through the fluorescent lamp, and outputting the image data including at least a luminance value; ,
Based on the image data obtained by the imaging means, comprising a determination means for determining the quality of the fluorescent coating film,
The imaging means includes
Outputting first image data imaged under a first imaging condition in which the luminance value of the inspection region corresponding to the fluorescent lamp does not reach a saturation level;
Outputs second image data captured under a second imaging condition in which the amount of received light is smaller than when captured under the first imaging condition and the luminance value of the background area corresponding to the irradiation means does not reach a saturation level. And
The determination means includes
Obtaining a first luminance value which is a luminance value of the inspection area from the first image data;
Obtaining a second luminance value that is a luminance value of the background region from the second image data;
From the second image data, a third luminance value that is a luminance value of the inspection area related to the second image data is calculated,
Based on the first luminance value and the third luminance value, a reference luminance level of the imaging means is calculated,
The light transmittance in the inspection area according to the second image data is calculated from the ratio between the difference between the second luminance value and the reference luminance level and the difference between the third luminance value and the reference luminance level. And
A fluorescent lamp inspection apparatus, wherein the film thickness of the fluorescent coating film is determined based on the transmittance. Wherein by adjusting the exposure time of the image pickup means, the fluorescent lamp inspection apparatus according to claim 1, characterized in that switching between the second imaging condition and the first imaging condition. Wherein by adjusting the irradiation time of the irradiation means, the fluorescent lamp inspection apparatus according to claim 1, characterized in that switching between the second imaging condition and the first imaging condition. Wherein by adjusting the aperture of the imaging means, the fluorescent lamp inspection apparatus according to claim 1, characterized in that switching between the second imaging condition and the first imaging condition.

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