Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JP5481643B2 - Electromagnetic horn type electron spin resonance device (1) - Google Patents
[go: Go Back, main page]

JP5481643B2 - Electromagnetic horn type electron spin resonance device (1) - Google Patents

Electromagnetic horn type electron spin resonance device (1) Download PDF

Info

Publication number
JP5481643B2
JP5481643B2 JP2009255036A JP2009255036A JP5481643B2 JP 5481643 B2 JP5481643 B2 JP 5481643B2 JP 2009255036 A JP2009255036 A JP 2009255036A JP 2009255036 A JP2009255036 A JP 2009255036A JP 5481643 B2 JP5481643 B2 JP 5481643B2
Authority
JP
Japan
Prior art keywords
microwave
sample
electromagnetic horn
esr
reflector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2009255036A
Other languages
Japanese (ja)
Other versions
JP2011099776A (en
Inventor
正 小林
孝文 原
Original Assignee
国立大学法人 大分大学
原 正和
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 国立大学法人 大分大学, 原 正和 filed Critical 国立大学法人 大分大学
Priority to JP2009255036A priority Critical patent/JP5481643B2/en
Publication of JP2011099776A publication Critical patent/JP2011099776A/en
Application granted granted Critical
Publication of JP5481643B2 publication Critical patent/JP5481643B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Constitution Of High-Frequency Heating (AREA)

Description

本発明は、感度と精度の向上、操作性と応用計測性を大幅に拡大(多目的化)した操作性のよい電磁ホーン型電子スピン共鳴装置に関するものである。 The present invention relates to an electromagnetic horn type electron spin resonance apparatus with good operability, which has improved sensitivity and accuracy, and greatly expanded (multipurpose) operability and applied measurement performance.

電磁ホーン型電子スピン共鳴装置の開発の先達は、1983年大矢博昭氏による初めての事例として、X-バンド電磁ホーン型ESRの開発事例と、1991年に相馬純吉・原秀元両氏によるK-バンド電磁ホーン型ESRの開発事例がある。
これに基く改良技術は、下記の特許文献1から特許文献3にて紹介されている。また最近では、発明者らが開発し、非特許文献1により次に紹介する電磁ホーン型電子スピン共鳴装置が紹介され注目されている。
大矢氏及び相馬・原両氏の論文文献や特許文献では、ザボイスキーにより1945年にESR装置が発明されて以来、殆どの場合に試料用セルとして、共振器(空洞共振器、誘電体共振器、ループ・ギャップ共振器等)が採用されてきた。そのために計測時に共振器の高いQ値の維持が必要な為,少量小型で且つ誘電ロスの小さい試料でしか測定できなかった。このため、誘電ロスの大きな試料(水溶液試料・含水試料・生体試料)、導電性試料、金属含有試料、大型試料、多量の溶液(特に誘電ロスの大きな水溶液)試料の場合のESR測定は困難または不可能で,多くの制約があった。特に市販の多くの/殆どのESR装置では共振器の同調の際に、AFC(自動周波数制御)装置を採用しているが、電磁ホーン型ESR装置の場合には、共振器の固有周波数に同調させる必要もなければ、その際の誘電ロスが大きい試料でのQディップの幅広化のためにAFCがうまく作動しない(かからない)、従ってESR計測が不可能という困難も起こらない。また共振器型試料セルでの水溶液試料で極端に細い、もしくは極端に薄い小さな容量の合成石英製の試料容器を使う必要もない。これは電磁ホーン型電子スピン共鳴装置(2)の新規な周波数掃引方式電磁ホーン型ESRの発想・発明につながる事項でもある。そして本発明者により静磁場固定で、マイクロ波周波数を広領域に掃引させた周波数掃引ESRスペクトルの計測にも成功している(8.5GHzから10.5GHzの2GHz間の周波数掃引で方解石中のMn(II)イオン(CaCO3:Mn(II))の6本のESRスペクトル及びDPPH固体粉末標準試料、及び40cc容量のTEMPOL水溶液試料の周波数掃引ESRスペクトルを得ている。当該周波数掃引方式YIG発振器の限界値8GHzから12.4GHzでも周波数掃引ESRスペクトルの確保は可能である。
The pioneer of the development of the electromagnetic horn type electron spin resonance device is the first case by Hiroaki Ohya in 1983, the development case of the X-band electromagnetic horn type ESR, and the K- by Junichi Soma and Hidemoto Hara in 1991. There is a development example of band electromagnetic horn type ESR.
Improvement techniques based on this are introduced in the following Patent Documents 1 to 3. Recently, an electromagnetic horn type electron spin resonance apparatus developed by the inventors and introduced next by Non-Patent Document 1 has been introduced and attracted attention.
According to Oya and Soma and Hara's papers and patent documents, since the ESR device was invented in 1945 by Zavoi Key, in most cases as a sample cell, a resonator (cavity resonator, dielectric resonator, loop)・ Gap resonators have been adopted. For this reason, since it is necessary to maintain a high Q value of the resonator during measurement, measurement was possible only with a small sample size and a small dielectric loss. For this reason, ESR measurement is difficult for samples with large dielectric loss (aqueous solution samples, water-containing samples, biological samples), conductive samples, metal-containing samples, large samples, and large amounts of solutions (especially aqueous solutions with large dielectric loss). It was impossible and there were many restrictions. In particular, many / most commercially available ESR devices use an AFC (automatic frequency control) device for tuning the resonator, but in the case of an electromagnetic horn type ESR device, it is tuned to the natural frequency of the resonator. Otherwise, the AFC does not work well because of the widening of the Q dip in the sample with a large dielectric loss at that time. Therefore, there is no difficulty that ESR measurement is impossible. Further, it is not necessary to use a sample container made of synthetic quartz having a small capacity that is extremely thin or extremely thin as an aqueous solution sample in a resonator type sample cell. This is also a matter that leads to the idea and invention of the novel frequency sweep type electromagnetic horn type ESR of the electromagnetic horn type electron spin resonance apparatus (2). The inventor has also succeeded in measuring a frequency-swept ESR spectrum in which the microwave frequency is swept over a wide region with a static magnetic field fixed (the frequency sweep between 2 GHz from 8.5 GHz to 10.5 GHz and Mn ( II) We obtained 6 ESR spectra of ions (CaCO 3 : Mn (II)) and frequency sweep ESR spectra of DPPH solid powder standard sample and 40cc capacity TEMPOL aqueous solution sample.Limits of the frequency sweep type YIG oscillator It is possible to secure a frequency swept ESR spectrum even at values from 8 GHz to 12.4 GHz.

上記の各種の問題を解決するために,1段階として、電磁ホーン(アンテナ)間の空間を試料セルとして採用し、共振器のようなマイクロ波定在波ではなくマイクロ波進行波を用いることで,共振器型ESRのもつ制約・困難を大幅に改善した透過方式電磁ホーン型ESRあるいは反射方式電磁ホーン型ESR(注記:大矢氏により透過方式・反射方式・誘導方式等のアイデアは大矢氏の論文に紹介されている)を稼働させ,感度的には球形や円筒形の高Q値の空洞共振器型ESRに比べ劣るものの、とにかく2006年にESR計測を行うことが可能となった。それ以後2009年の現在までに、感度的には3桁ほど改良してきた。こうして実用レベルでのESR計測を行うことが可能になった。
電磁ホーン型ESR発明の先達が従来開発した上記の装置は未だ感度が低い、
In order to solve the above-mentioned various problems, the space between the electromagnetic horns (antennas) is adopted as a sample cell as one step, and the microwave traveling wave is used instead of the microwave standing wave like a resonator. 、 Transmission type electromagnetic horn type ESR or reflection type electromagnetic horn type ESR that greatly improved the limitations and difficulties of resonator type ESR (Note: Oya's paper on transmission type, reflection type, induction type etc. However, the sensitivity was inferior to that of a spherical or cylindrical high-Q cavity resonator type ESR, but in any case it was possible to measure ESR in 2006. Since then, in 2009, the sensitivity has improved by about three orders of magnitude. Thus, ESR measurement at a practical level has become possible.
The above-mentioned device, which was previously developed by the pioneer of electromagnetic horn type ESR invention, still has low sensitivity.

<本発明者等が開発し発表した電磁ホーン型電子スピン共鳴装置>
電磁ホーン型電子スピン共鳴装置であるK-band/X-band反射方式電磁ホーン型ESR装置のマイクロ波立体回路のブロック線図を図2に示す。
図2においてこのX-band反射方式電磁ホーン型ESR装置は、高周波域周波数のマイクロ波を発振するマイクロ波発振器001と、設定出力のマイクロ波mw0を減衰器ATT1とサーキュレータcirculatorを介して試料sampleに放射する電磁ホーンhornと、試料sampleへの磁場変調装置002と、磁場均一性のよい掃引磁界印加装置(電磁石)と、試料sampleを介したマイクロ波mw1を再び試料sampleを介して電磁ホーンhornに反射するマイクロ波反射板003と、設定出力のマイクロ波mw0と電磁ホーンhornからの反射マイクロ波mw2を導入し、反射マイクロ波mw2と逆の位相を持ち強度の等しい逆位相マイクロ波をつくり反射マイクロ波を逆反射マイクロ波で打ち消しバランスさせ、ある磁場で電子スピンが│-1/2>状態から│1/2>状態に遷移する所謂磁気共鳴によるスピン反転時に試料がその分だけマイクロ波エネルギーを吸収した際のアンバランスによるマイクロ波の極微量変化を増幅してESRスペクトルとして記録するマイクロ波処理回路004とからなる。
マイクロ波処理回路004において、WG-N,WG-SMA:同軸導波管交換器、ATT2:減衰器 Magic tee:マジックティー、Phase shifter:位相器、AMP:プリアンプとロックインアンプを各々示す。図中、ATT3は減衰器である。
この反射方式電磁ホーン型ESR装置の電磁ホーンは、例えば断面が方形の導波管であれば、開口端の開ロ面積が徐々に広くなるよう、底面が開放された角錐台の形状又は円錐台の形状のホーンを取り付けたものである。原理としては、導波管の内部を伝送された電磁波が、開ロ端反射することなく、空間に放射されるための最も単純な形と言える。電磁ホーンの長さは長ければ長いほど指向性は鋭くなる。角錐・円錐をホーンの形の基準とした場合、その頂角を中心角と呼ぶ。これは指向性を鋭くするための最適値がある。
一方マイクロ波反射板の反射面は平坦面が一般的で中には立体的形状が定かでないが側面から見て湾曲したものである。
このように、電磁ホーンのマイクロ波放射面は平坦面であり、マイクロ波反射板の反射面は平坦面かそれに類似のものであるため、何れもマイクロ波の収斂/集束が好ましくなく、ノイズが多く、感度も満足するものでなかった。
<Electromagnetic horn type electron spin resonance apparatus developed and announced by the present inventors>
FIG. 2 shows a block diagram of a microwave solid circuit of a K-band / X-band reflection type electromagnetic horn type ESR device which is an electromagnetic horn type electron spin resonance device.
In FIG. 2, this X-band reflection type electromagnetic horn type ESR device is a microwave oscillator 001 that oscillates microwaves in a high frequency range, and a set output microwave mw0 to a sample sample via an attenuator ATT1 and a circulator circulator. Radiating electromagnetic horn, magnetic field modulation device 002 to sample sample, sweep magnetic field application device (electromagnet) with good magnetic field uniformity, microwave mw1 through sample sample again to electromagnetic horn horn through sample sample Reflecting microwave reflector 003, setting output microwave mw0 and reflected microwave mw2 from electromagnetic horn horn are introduced to create a reversed-phase microwave with opposite phase to reflected microwave mw2 and equal intensity Waves are counterbalanced by retroreflecting microwaves, and the electron spin changes from the │-1 / 2> state to the │1 / 2> state in a certain magnetic field. A micro-wave processing circuit 004 Metropolitan be recorded as ESR spectra amplifies the trace amount change of the microwave due to imbalance upon absorption of microwave energy by the amount of.
In the microwave processing circuit 004, WG-N, WG-SMA: coaxial waveguide exchanger, ATT2: attenuator Magic tee: Magic tee, Phase shifter: phase shifter, AMP: preamplifier and lock-in amplifier, respectively. In the figure, ATT3 is an attenuator.
If the electromagnetic horn of this reflection type electromagnetic horn type ESR device is a waveguide having a square cross section, for example, the shape of the truncated pyramid or the truncated cone with the bottom open so that the open area of the open end gradually increases. The horn of the shape is attached. In principle, it can be said that the electromagnetic wave transmitted through the inside of the waveguide is the simplest form for radiating into the space without being reflected at the open end. The longer the electromagnetic horn, the sharper the directivity. When a pyramid / cone is used as a reference for the shape of the horn, the apex angle is called the central angle. This has an optimum value for sharpening directivity.
On the other hand, the reflection surface of the microwave reflection plate is generally a flat surface, and although the three-dimensional shape is not certain, it is curved as viewed from the side.
As described above, the microwave radiation surface of the electromagnetic horn is a flat surface, and the reflection surface of the microwave reflector is flat or similar. The sensitivity was not satisfactory.

特公平3-78945号公報(発信受信電磁ホーンに反射板を対向配置させたタイプの基本)Japanese Patent Publication No. 3-78945 (basic of the type in which a reflector is placed opposite to a transmitting / receiving electromagnetic horn) 特公平3-78591号公報(一方向性の発信電磁ホーンと受信電磁ホーンタイプの基本)Japanese Examined Patent Publication No. 3-78591 (basic unidirectional transmitting electromagnetic horn and receiving electromagnetic horn type) 特公平3-78944号公報(発信電磁ホーンと受信電磁ホーンの交差対向配置の基本)Japanese Examined Patent Publication No. 3-78944 (Basics of crossing arrangement of transmitting electromagnetic horn and receiving electromagnetic horn) 特公平3-78946号公報(受信電磁ホーンと反射板が無く試料からの反射マイクロ波を検出するタイプJapanese Examined Patent Publication No. 3-78946 (Receiving electromagnetic horn and no reflection plate, detecting the reflected microwave from the sample 「電磁ホーン型電子スピン共鳴(ESR)装置の開発とESR応用計測」小林正,桑田賢一・・・日本AEM学会誌Vol.17,No.1,2009年pp138-143“Development of Electromagnetic Horn-type Electron Spin Resonance (ESR) Apparatus and Application of ESR Measurement” Masaru Kobayashi, Kenichi Kuwata ・ ・ ・ Journal of AEM Society of Japan Vol.17, No.1, pp138-143

本発明は、電磁ホーンのマイクロ波放射面と、マイクロ波反射板の反射面を改良してマイクロ波の収斂/集束を良好に維持し、ノイズを激減させてESR測定感度を所望の感度(2,3桁向上)にするとともに、試料載置台に載せた試料のサイズ、質量、形状、成分等に応じて、電磁ホーンのマイクロ波放射面に対する試料載置台位置とマイクロ波反射板位置を最適に調節してESR測定感度をより高める電磁ホーン型電子スピン共鳴装置を提供する。
The present invention improves the microwave radiation surface of the electromagnetic horn and the reflection surface of the microwave reflector so as to maintain good convergence / focusing of the microwave, drastically reduce noise, and achieve the desired ESR measurement sensitivity (2 The position of the sample mounting table and microwave reflector on the microwave radiation surface of the electromagnetic horn is optimized according to the size, mass, shape, component, etc. of the sample mounted on the sample mounting table. Provided is an electromagnetic horn type electron spin resonance apparatus which is adjusted to further increase ESR measurement sensitivity.

本発明の特徴とするところは次の(1)〜(2)の通りである。
(1)、マイクロ波発信装置からのマイクロ波をマイクロ波導波管のメインアーム(01)を介して試料載置台(13)上の試料(13a)に放射する電磁ホーン(11)、
試料載置台(13)の周囲に設けた掃引磁場印加装置(171)(電磁石)と変調分光用の変調装置(170)、
電磁ホーン(11)から試料(13a)を介してのマイクロ波を再び試料(13a)を介して電磁ホーン(11)に反射するマイクロ波反射板(14)、
前記マイクロ波導波管のメインアーム(02)から分岐したリファレンスアーム(03)からの参照用の発信マイクロ波と、マイクロ波反射板(14)から試料(13a)と電磁ホーン(11)とメインアーム(02)を介しての反射マイクロ波をミキサー(32)に導入して、試料中の不対電子のスピンが反転する磁気共鳴時にマイクロ波エネルギーを試料が吸収した際のマイクロ波パワーの極微量変化を検出し記録する差動増幅装置(40)・ロックイン増幅装置(41),記録装置(42)とからなる電磁ホーン型電子スピン共鳴装置において、
前記電磁ホーンアンテナ装置の電磁ホーン(11)の表面(射出口)にマイクロ波放射凸面レンズ(12)を設け、前記マイクロ波反射板(14)を例えば放物凹面、球凹面、平面組み合わせ凹面、湾局面組み合わせ凹面、楕円凹面等の凹面とした凹面反射面型反射板(14a)にしたことを特徴とする電磁ホーン型電子スピン共鳴装置。
The features of the present invention are as follows (1) to (2).
(1), an electromagnetic horn (11) that radiates the microwave from the microwave transmission device to the sample (13a) on the sample mounting table (13) via the main arm (01) of the microwave waveguide,
Sweep magnetic field application device (171) (electromagnet) and modulation device (170) for modulation spectroscopy provided around the sample mounting table (13),
A microwave reflector (14) that reflects the microwave from the electromagnetic horn (11) through the sample (13a) to the electromagnetic horn (11) again through the sample (13a),
Transmitting microwave for reference from the reference arm (03) branched from the main arm (02) of the microwave waveguide, the sample (13a), the electromagnetic horn (11), and the main arm from the microwave reflector (14) Introducing the reflected microwave through (02) into the mixer (32), and the minute amount of microwave power when the sample absorbs microwave energy during magnetic resonance in which the spin of unpaired electrons in the sample is reversed In an electromagnetic horn type electron spin resonance apparatus comprising a differential amplifier (40), a lock-in amplifier (41), and a recording device (42) for detecting and recording a change,
A microwave radiation convex lens (12) is provided on the surface (exit) of the electromagnetic horn (11) of the electromagnetic horn antenna device, and the microwave reflector (14) is, for example, a parabolic concave surface, a spherical concave surface, a planar combined concave surface, An electromagnetic horn type electron spin resonance apparatus characterized by a concave reflecting surface type reflector (14a) having a concave surface such as a bay surface combined concave surface or an elliptical concave surface.

(2)、マイクロ波発信装置からのマイクロ波をマイクロ波導波管のメインアーム(01)を介して試料載置台(13)上の試料(13a)に放射する電磁ホーン(11)、
試料載置台(13)の周囲に設けた掃引磁場印加装置(171)(電磁石)と変調分光用の変調装置(170)、
電磁ホーン(11)から試料(13a)を介してのマイクロ波を再び試料(13a)を介して電磁ホーン(11)に反射するマイクロ波反射板(14)、
前記マイクロ波導波管のメインアーム(02)から分岐したリファレンスアーム(03)からの参照用の発信マイクロ波と、マイクロ波反射板(14)から試料(13a)と電磁ホーン(11)とメインアーム(02)を介しての反射マイクロ波をミキサー(32)に導入して、試料中の不対電子のスピンが反転する磁気共鳴時にマイクロ波エネルギーを試料が吸収した際のマイクロ波パワーの極微量変化を検出し記録する差動増幅装置(40)・ロックイン増幅装置(41),記録装置(42)とからなる電磁ホーン型電子スピン共鳴装置において、
前記電磁ホーンアンテナ装置の電磁ホーン(11)の表面(射出口)にマイクロ波放射凸面レンズ(12)を設け、前記マイクロ波反射板(14)を凹面反射面型反射板(14a)にし、最適のESRスペクトルを得るための同調/チューニング用として前記各マイクロ波のパワーモニター装置及び試料載置台(13)の位置調節装置(15)と反射板(14)の位置調整装置(16)を設けたことを特徴とする電磁ホーン型電子スピン共鳴装置。
(2), an electromagnetic horn (11) that radiates the microwave from the microwave transmission device to the sample (13a) on the sample mounting table (13) through the main arm (01) of the microwave waveguide,
Sweep magnetic field application device (171) (electromagnet) and modulation device (170) for modulation spectroscopy provided around the sample mounting table (13),
A microwave reflector (14) that reflects the microwave from the electromagnetic horn (11) through the sample (13a) to the electromagnetic horn (11) again through the sample (13a),
Transmitting microwave for reference from the reference arm (03) branched from the main arm (02) of the microwave waveguide, the sample (13a), the electromagnetic horn (11), and the main arm from the microwave reflector (14) Introducing the reflected microwave through (02) into the mixer (32), and the minute amount of microwave power when the sample absorbs microwave energy during magnetic resonance in which the spin of unpaired electrons in the sample is reversed In an electromagnetic horn type electron spin resonance apparatus comprising a differential amplifier (40), a lock-in amplifier (41), and a recording device (42) for detecting and recording a change,
A microwave radiation convex lens (12) is provided on the surface (exit) of the electromagnetic horn (11) of the electromagnetic horn antenna device, and the microwave reflecting plate (14) is a concave reflecting surface type reflecting plate (14a). For the tuning / tuning to obtain the ESR spectrum, the microwave power monitor device, the sample mounting table (13) position adjusting device (15), and the reflector (14) position adjusting device (16) were provided. An electromagnetic horn type electron spin resonance apparatus.

本発明の電磁ホーン型電子スピン共鳴装置は、前記構成により電磁ホーンのマイクロ波の収斂/集束を良好に維持し、ノイズを激減させてESR測定感度を所望の感度(2,3桁向上)にするとともに、試料載置台に載せた試料のサイズ、質量、形状、成分、状態等に応じて、電磁ホーンのマイクロ波放射面に対する試料載置台位置とマイクロ波反射板位置を最適に調節してESR測定感度をより高め、更に試料載置台に温度可変装置などを設けて、ESRスペクトルとともに、試料の誘電率、電気伝導度、比熱、熱伝導度、熱膨張率、音速等などの測定を同時に可能にする等の優れた効果を呈するものである。
以下に本発明の電磁ホーン型電子スピン共鳴装置の技術的作用効果を詳細に説明する。
The electromagnetic horn type electron spin resonance apparatus of the present invention maintains the convergence / focusing of the microwave of the electromagnetic horn with the above-described configuration, drastically reduces noise, and improves the ESR measurement sensitivity to a desired sensitivity (a few orders of magnitude improvement). At the same time, according to the size, mass, shape, composition, condition, etc. of the sample placed on the sample mounting table, the ESR is adjusted by optimally adjusting the position of the sample mounting table and the microwave reflector on the microwave radiation surface of the electromagnetic horn. The measurement sensitivity is further enhanced, and a temperature variable device is provided on the sample mounting table, allowing simultaneous measurement of the sample's dielectric constant, electrical conductivity, specific heat, thermal conductivity, thermal expansion coefficient, sound velocity, etc. along with the ESR spectrum. It exhibits excellent effects such as.
The technical operational effects of the electromagnetic horn type electron spin resonance apparatus of the present invention will be described in detail below.

1.電磁ホーンアンテナ装置の電磁ホーンの開口部(表面)にマイクロ波放射凸面レンズを設け、マイクロ波反射板を凹面反射面型のマイクロ波反射板にすることによりマイクロ波が良好に収斂/集束され、ノイズの低減、感度の向上につながる優れた作用効果を呈する。 1. A microwave radiation convex lens is provided at the opening (surface) of the electromagnetic horn of the electromagnetic horn antenna device, and the microwave is converged / focused well by making the microwave reflecting plate a concave reflecting surface type microwave reflecting plate, It exhibits excellent effects that reduce noise and improve sensitivity.

2.マイクロ波放射凸面レンズとマイクロ波凹面反射面型の反射板との間の試料載置台と、凹面反射板とを移動可能にし、その位置調節用としてパワーモニター装置を有する試料位置を精密に微調節する装置を設けることにより、試料とマイクロ波放射凸面レンズとマイクロ波凹面反射面型の反射板との相対関係位置を最適なESR測定条件にセットすることができ、最大感度でのESR計測を可能にする優れた作用効果を呈する。 2. The sample mounting table between the microwave radiating convex lens and the microwave concave reflecting surface type reflecting plate and the concave reflecting plate can be moved, and the position of the sample with the power monitor device is precisely fine-tuned to adjust its position. By installing the device, the relative position of the sample, the microwave radiation convex lens and the microwave concave reflecting surface type reflector can be set to the optimum ESR measurement conditions, and ESR measurement with maximum sensitivity is possible Exhibits excellent operational effects.

3.前記1.2.を採用したことによる装置全体の総合作用効果は、試料位置の調整、反射鏡の位置(マイクロ波が試料を透過しやすい試料の場合)、リファレンスアームの減衰器(アッテネーター)の調整、リファレンスアームの位相器(フェーズシフター)の調整などの4つの要素で最大測定感度を容易確実にチューニング(同調)することができる。 3. Said 1.2. The overall function and effect of the entire system by adopting is the adjustment of the position of the sample, the position of the reflector (in the case of a sample in which microwaves easily pass through the sample), the adjustment of the attenuator of the reference arm, The maximum measurement sensitivity can be easily and surely tuned (tuned) by four factors such as adjustment of a phase shifter.

4.このように感度の大幅な向上のために、磁場変調コイル用のAMPを従来より大出力がでるものに変更して、このAMPに整合させた多巻き磁場変調コイルを作製し、設置することが可能になり、大幅な感度の改善が可能になった。 4). In order to greatly improve the sensitivity in this way, it is possible to change the AMP for the magnetic field modulation coil to one that has a higher output than before, and to create and install a multi-turn magnetic field modulation coil that matches this AMP. It became possible, and a significant improvement in sensitivity became possible.

5.マイクロ波が試料通過の前後の箇所でのマイクロ波パワーモニターの設置と、マイクロ波メインアームとレファレンスアームでのミキサー直前でのパワーモニターの設置により、2.及び3.の同調(チューニング)がより精密に行えるようになった。 5. 1. Installation of a microwave power monitor before and after passing through the sample and installation of a power monitor immediately before the mixer in the microwave main arm and reference arm. And 3. Tuning has become more precise.

6.また試料載置台に温度可変装置を設けることにより、電極を施した強誘電体等の試料を設置してのESRスペクトルと誘電率の同時計測システムの構築及びESRスペクトルと熱容量(比熱)、ESRスペクトルと試料の電気伝導度、熱伝導度、熱膨張率、試料中の音速等の同時測定、さらにはESRスペクトルとSTM・STS(走査型トンネル顕微鏡像・走査型トンネル電流分光)又はAFM(原子間力顕微鏡像)との同時測定、さらにダイヤモンドアンビルやマイクロボンベ方式の超高圧静水圧印加時のESRスペクトルの計測、1軸性応力印加装置を設置して一軸性応力印加時の試料の歪みのスピンハミルトニアンを介しての研究を可能にする。 6). In addition, by installing a temperature variable device on the sample mounting table, construction of a simultaneous measurement system of ESR spectrum and dielectric constant by installing a sample such as a ferroelectric with electrodes, ESR spectrum and heat capacity (specific heat), ESR spectrum Simultaneous measurement of electrical conductivity, thermal conductivity, coefficient of thermal expansion, sound velocity in sample, ESR spectrum and STM / STS (scanning tunneling microscope image / scanning tunneling current spectroscopy) or AFM (interatomic) Measurement of ESR spectrum when applying ultrahigh pressure hydrostatic pressure using diamond anvil or micro cylinder method, and installing uniaxial stress application device to spin sample strain when applying uniaxial stress Enables research through the Hamiltonian.

電磁ホーン型ESR用に特別に開発した試料温度可変装置(a室温から高温までの抵抗加熱仕様試料温度可変装置、b不凍液やシリコーン・オイルをアルミ・ブロック製の温度可変装置に導き、クーリング・サーキュレーターで-20℃から+150℃まで可変出来る試料温度可変装置、c合成石英製ジュワー瓶(魔法瓶)に無誘導巻きヒーターを設置したステージを置き、ヒーターレベルより下に液体窒素あるいは冷媒を注入した低温用温度可変装置)に設置して固体・溶液試料のESRスペクトルの温度変化を計測する、(温度可変仕様の)単結晶試料用1軸回転/2軸回転/3軸回転仕様のゴニオメーターを設置してESRスペクトルの静磁場あるいはマイクロ波磁場方位を考慮した単結晶試料のESRスペクトル(共鳴磁場及び線幅、強度)角度依存性。また誘電率・電気伝導性・熱容量(比熱)・熱伝導性計測、熱膨張率との同時測定(発明者は既に硫酸三グリシン強誘電体単結晶の強誘電軸に垂直に電極を設置してコンデンサーにして、49℃の強誘電体キュリー温度前後の±30℃の温度範囲(20℃から80℃)で、各温度のステップ変化ごとのESRスペクトルと誘電率の同時計測に成功している。あるいは除振機構を備え、走査型トンネル分光(STS)装置を試料空間に設置し、トンネル電流とESR分光の同時計測、トンネル電流とESRスペクトル強度変化の相互エンハンス効果の計測、及びストレインゲージを用いた簡易熱膨張計等の他物性量との同時計測を、試料温度を可変しながら、可能にしたものである。)を可能ならしめる。 Sample temperature variable device specially developed for the electromagnetic horn type ESR (a Sample temperature variable device with resistance heating specification from room temperature to high temperature, b Leading antifreeze and silicone oil to temperature variable device made of aluminum block, cooling circulator Sample temperature variable device that can vary from -20 ° C to + 150 ° C, for a low temperature in which a stage with a non-inductive winding heater is placed in a synthetic quartz dewar (a thermos bottle) and liquid nitrogen or refrigerant is injected below the heater level Install a goniometer for single-crystal rotation, 2-axis rotation, and 3-axis rotation specifications for single crystal samples (with variable temperature specifications) to measure the temperature change of the ESR spectrum of solid / solution samples. ESR spectrum (resonance magnetic field and line width, intensity) angle dependence of single crystal sample considering static magnetic field or microwave magnetic field orientation of ESR spectrum. Simultaneous measurement of dielectric constant, electrical conductivity, heat capacity (specific heat), thermal conductivity, and coefficient of thermal expansion (the inventor has already installed an electrode perpendicular to the ferroelectric axis of triglycine sulfate single crystal) As a capacitor, we have succeeded in the simultaneous measurement of the ESR spectrum and dielectric constant for each step change in the temperature range of ± 30 ° C (20 ° C to 80 ° C) around the ferroelectric Curie temperature of 49 ° C. Or equipped with a vibration isolation mechanism, a scanning tunneling spectroscopy (STS) device is installed in the sample space, and simultaneous measurement of tunneling current and ESR spectroscopy, measurement of mutual enhancement effect of tunneling current and ESR spectrum intensity change, and strain gauge are used. This enables simultaneous measurement with other physical properties such as a simple thermal dilatometer while changing the sample temperature.

7.各種形状の試料及び測定容器、デバイス等機器、及び他物性量との同時測定のESR計測のために、各所に作業用の穴や隙間及び各種の資材・機器の取り付け機構等を設けることができた。
これにより、当該装置を多目的利用するために、各所に作業用の穴や資材の取り付け用の固定器が設置できる仕様になっている。(1)紫外線や可視光線、あるいは温度可変用の赤外線照射装置の設置機構、(2)単結晶試料の1軸・2軸回転装置の設置機構、(3)クロマトグラフィー用のカラム等の垂直上下移動・計測機構の設置、(4)2種又は多種の試薬の試料セル内での混合・反応機構の設置、(5)ESRスペクトルと誘電率・比熱・熱膨張率等との各種物性量同時計測用の設置空間の確保(脱着可能なマイクロ波反射板の後方にかなり大きな空間を設けている)と各種多目的計測用器具設置用のビス穴、ジグ設置用固定器具等々の取り付け機構の設置が自由に可能である。
7). For various types of specimens and measuring containers, devices such as devices, and ESR measurement for simultaneous measurement with other physical properties, working holes and gaps and attachment mechanisms for various materials and equipment can be provided at various locations. It was.
Thereby, in order to use the apparatus for multiple purposes, it is in a specification that a working hole and a fixing device for attaching materials can be installed in various places. (1) Installation mechanism of ultraviolet irradiation light, visible light, or infrared irradiation device for variable temperature, (2) Installation mechanism of single- and double-axis rotation device for single crystal sample, (3) Vertical vertical movement of chromatography column, etc. Installation of movement / measuring mechanism, (4) Installation of two types or various reagents in the sample cell, installation of reaction mechanism, (5) Simultaneous measurement of various physical properties such as ESR spectrum and dielectric constant / specific heat / thermal expansion coefficient Securing installation space for measurement (a considerably large space is provided behind the detachable microwave reflector) and installation of mounting mechanisms such as screw holes for installing various multipurpose measurement instruments, fixtures for jig installation, etc. It is possible freely.

<活用例など>
本発明の電磁ホーン型電子スピン共鳴装置の活用例は次の通りである。
(1)、今後 aダイヤモンドアンビルによる超高圧静水圧下でのESR計測、b発明者が開発した2電源Zupancic型MRIコイルとアンチヘルムホルツMRIコイルを設置した、電磁ホーン型3次元ESRイメージング装置、c電磁ホーン型cwESR装置のパルスESR化、並びに d走査型トンネル分光(STS)との併用計測・クロス計測が可能となる
(2)、単一〜単三型のマンガン乾電池に抵抗をつなぎ、放電/消耗させながら電解質中の炭素ラジカルと途中から生成するマンガン2価イオンのESRスペクトルの時間依存性。
(既に計測・解析済み) 新規な二次電池・太陽電池・燃料電池開発への応用性を内在している。
(3)、生活排水中及び工場排水中のCr(III)、Mn(II)イオン等の計測。(一部 実施済み 環境科学への応用:水処理、水モニター、排気ガス・粉塵モニター等)
(4)、TEMPOLラジカルのL-アスコルビン酸(ビタミンC)によるラジカル消去のin situ 実験。(既に計測・解析済み)
(5)、DPPH溶液、TEMPOL水溶液、硫酸マンガン水溶液の溶解過程のESR計測。これら試料のESRスペクトルの濃度依存性。(既に計測・解析済み)
(6)、強誘電体チタン酸バリウム:Mn(II)、 硫酸グリシン:Cu(II)イオン等の誘電ロスの大きなキュリー点とその前後の温度でのESRスペクトルと誘電率の同時計測。(既に計測・解析済み)
(7)、DMPO等のスピントラップ剤を用いたO2 -(スーパーオキシド)ラジカル、OHラジカルの計測と、ビタミンCやビタミンEあるいはコエンザイム剤による
これらのラジカルの消去過程の検証、新薬の開発手段に活用。
(8)、アラニンや蔗糖で作成したESR用の試料及びESRイメージングプレートによる放射線量測定システム。ESRスペクトルの線幅の大きな場合のESRイメージング。
<Examples of use>
An application example of the electromagnetic horn type electron spin resonance apparatus of the present invention is as follows.
(1) Future a Electromagnetic horn type 3D ESR imaging device equipped with a double power supply Zupancic type MRI coil and an anti-helmholtz MRI coil developed by the inventors, a ESR measurement under ultra-high hydrostatic pressure with a diamond anvil, c Using electromagnetic horn-type cwESR system with pulse ESR and combined measurement and cross measurement with d-scanning tunneling spectroscopy (STS)
(2) The time dependence of the ESR spectrum of carbon radicals in the electrolyte and manganese divalent ions generated from the middle while connecting resistance to single to AA type manganese batteries and discharging / consuming them.
(Already measured and analyzed) Applicable to the development of new secondary batteries, solar cells and fuel cells.
(3) Measurement of Cr (III) and Mn (II) ions in domestic wastewater and industrial wastewater. (Partially implemented: Application to environmental science: water treatment, water monitor, exhaust gas / dust monitor, etc.)
(4) In situ experiment of radical scavenging of TEMPOL radical by L-ascorbic acid (vitamin C). (Already measured and analyzed)
(5) ESR measurement of dissolution process of DPPH solution, TEMPOL aqueous solution and manganese sulfate aqueous solution. Concentration dependence of ESR spectra of these samples. (Already measured and analyzed)
(6) Simultaneous measurement of ESR spectrum and dielectric constant at Curie point with large dielectric loss such as ferroelectric barium titanate: Mn (II), glycine sulfate: Cu (II) ion, and temperature around it. (Already measured and analyzed)
(7), O using spin trapping agent such as DMPO 2 - (superoxide) radicals, the measurement of the OH radicals, the verification of the erase process of these radicals by vitamin C and vitamin E, or coenzyme agents, development means of new drugs Take advantage of.
(8) Radiation dose measurement system using ESR sample and ESR imaging plate made with alanine or sucrose. ESR imaging when the line width of the ESR spectrum is large.

マイクロ波反射方式電磁ホーン型ESR装置を実施するための最良の形態は次のとおりである。
マイクロ波反射方式電磁ホーン型ESR装置は、マイクロ波発振器と、電磁ホーン11のマイクロ波放射凸面レンズ12からマイクロ波を試料に放射する電磁ホーンアンテナ装置と、試料への掃引磁場印加装置171(電磁石)と、変調分光用の磁場変調装置170と、試料を介したマイクロ波を再び試料を介して電磁ホーン11に反射させる凹面反射面型のマイクロ波反射板14aと、マイクロ波導波管のメインアーム02からマイクロ波をリファレンスム03に分波させ、これをメインアーム02でのサーキュレーター5、電磁ホーン11、試料13a、反射板14a、試料13a、電磁ホーン11、サーキュレーター5を通してミキサー32(マジックティー)に導入するマイクロ波と逆の位相を持ち、これらメインアーム02経由で試料を介したマイクロ波と、リファレンスアーム03を介したマイクロ波をミキサー32にいれ検波して、差動(前置)増幅器して後、ロックイン増幅器に導く。
これにより磁場掃引時あるいは周波数掃引時に、磁気共鳴によりマイクロ波を吸収し、電子スピン反転時にのみ試料がマイクロ波エネルギーを吸収した際のメインアーム側とリファレンスアーム側のマイクロ波パワーのアンバランスによる変化分を磁場変調あるいは周波数変調分光法で高感度に検出した磁場掃引ESRスペクトルあるいは周波数掃引ESRスペクトルとして記録するマイクロ波増幅回路と、試料位置・反射板位置を最適化し最適のESRスペクトルを得るための同調/チューニング用として前記各マイクロ波のパワーモニター装置を有する試料の位置調節装置からなる。
The best mode for implementing the microwave reflection type electromagnetic horn type ESR device is as follows.
The microwave reflection type electromagnetic horn type ESR device includes a microwave oscillator, an electromagnetic horn antenna device that radiates microwaves from the microwave radiating convex lens 12 of the electromagnetic horn 11, and a sweep magnetic field applying device 171 (electromagnet) to the sample. ), A magnetic field modulator 170 for modulation spectroscopy, a microwave reflecting plate 14a of a concave reflecting surface type that reflects the microwave through the sample again to the electromagnetic horn 11 through the sample, and a main arm of the microwave waveguide The microwave is split from 02 to the reference 03, and this is mixed through the circulator 5, electromagnetic horn 11, sample 13a, reflector 14a, sample 13a, electromagnetic horn 11, and circulator 5 in the main arm 02 through the mixer 32 (magic tee) Have a phase opposite to that of the microwave to be introduced into the sample, the microwave via the main arm 02 and the microphone via the reference arm 03 By detecting put a wave to the mixer 32, after differentially (pre) amplifier, leading to the lock-in amplifier.
As a result, when the magnetic field sweep or frequency sweep is performed, the microwave is absorbed by magnetic resonance, and the change due to the unbalance of the microwave power on the main arm side and the reference arm side when the sample absorbs the microwave energy only at the time of electron spin inversion. A microwave amplification circuit that records the minute as a magnetic field swept ESR spectrum or frequency swept ESR spectrum detected with high sensitivity by magnetic field modulation or frequency modulation spectroscopy, and to obtain the optimum ESR spectrum by optimizing the sample position and reflector position It comprises a sample position adjusting device having a power monitoring device for each microwave for tuning / tuning.

マイクロ波反射方式電磁ホーン型ESR装置は、上記した構成により、3桁以上のESR測定感度の向上。パソコン自動化によるESRスペクトルの積算機能によるS/N比(感度)の向上及び操作性の向上。マイクロ波波長計(マイクロ波フリーケンシーカウンター)とプロトンのNMR(核磁気共鳴)を利用した磁場測定器を用いて、精密なマイクロ波周波数と共鳴磁場(磁束密度)の計測を行い、hν=gβH の式から精度のよいg値(結晶の場合はgテンソル)や零磁場分裂相互作用定数(結晶の場合はDテンソル、D,E定数)及び超微細構造定数(hfs定数、結晶の場合はhfs相互作用テンソル)を計測することができる。
このように精密多目的仕様にして、物理学、化学分野の基礎科学から材料科学、環境科学、医薬学分野での臨床現場での血液、生体組織検査と新薬の開発、レドックス関連の加齢現象、発癌機構の研究等に即応用可能にするX-バンドおよびK-バンド(さらには電磁石等の均一磁場発生器の磁場(磁束密度)の大きさが大きく出来れば、さらに高感度化が可能なQ-バンドのマイクロ波反射方式電磁ホーン型電子スピン共鳴(ESR/EPR)装置が実現できる電磁ホーン型ESR装置である。
更には、数十〜数百GHz帯のマイクロ波をライトパイプ、小型電磁ホーン、平面導波路回路を設けた高周波長帯での電磁ホーン型(または別種アンテナ型)ESR装置も可能となる。
The microwave reflection type electromagnetic horn type ESR device improves the ESR measurement sensitivity by 3 digits or more by the above configuration. Improvement of S / N ratio (sensitivity) and operability by ESR spectrum integration function by personal computer automation. Using a microwave wavelength meter (microwave frequency counter) and a magnetic field measuring device using proton NMR (nuclear magnetic resonance), the precise microwave frequency and resonance magnetic field (magnetic flux density) are measured, and hν = From the equation of gβH, accurate g value (g tensor in the case of crystal), zero field splitting interaction constant (D tensor in the case of crystal, D, E constant) and hyperfine structure constant (hfs constant, in the case of crystal) hfs interaction tensor) can be measured.
In this way, with precision and multi-purpose specifications, from basic science in physics and chemistry to material science, environmental science, clinical practice in the field of medicine, development of new biomedical tests and redox-related aging phenomena, X-band and K-band that can be applied immediately to research on carcinogenic mechanisms (and Q that can increase sensitivity if the magnetic field (magnetic flux density) of a uniform magnetic field generator such as an electromagnet can be increased) -It is an electromagnetic horn type ESR device that can realize an electromagnetic horn type electron spin resonance (ESR / EPR) device with a microwave reflection system.
Furthermore, an electromagnetic horn type (or different antenna type) ESR device in a high frequency long band provided with a microwave of several tens to several hundreds GHz band as a light pipe, a small electromagnetic horn, and a planar waveguide circuit is also possible.

本発明の電磁ホーン型電子スピン共鳴装置の実施例として、X-バンドおよびK-バンド反射方式電磁ホーン型ESR装置を図1に示し、その各構成と技術的意義を以下に詳細に説明する。
図1に示す実施例1の電磁ホーン型電子スピン共鳴装置の基本回路構成は、マイクロ波発振装置と、マイクロ波を試料に放射する電磁ホーンアンテナ装置と、試料への磁場変調装置と、試料を介したマイクロ波を再び試料を介して電磁ホーンに反射するマイクロ波反射板14と、電磁ホーン11からの反射マイクロ波を導入し、リファレンスアーム03でのこれと逆の位相を持ち強度の等しい逆位相マイクロ波をつくり反射マイクロ波を逆位相マイクロ波で打ち消しバランスさせ、ある磁場強度での磁気共鳴によるスピン反転時に試料がマイクロ波エネルギーを吸収した際のアンバランスによる反射マイクロ波の変化をミキサー(マジック・ティー)32部で検波するマイクロ波立体回路部と、高感度で増幅してESRスペクトルとして記録する差動増幅40・ロックイン増幅装置41とからなる。
As an embodiment of the electromagnetic horn type electron spin resonance apparatus of the present invention, an X-band and K-band reflection type electromagnetic horn type ESR apparatus is shown in FIG. 1, and its configuration and technical significance will be described in detail below.
The basic circuit configuration of the electromagnetic horn type electron spin resonance apparatus of the first embodiment shown in FIG. 1 includes a microwave oscillation device, an electromagnetic horn antenna device that radiates microwaves to a sample, a magnetic field modulation device for the sample, and a sample. Introducing the microwave reflector 14 that reflects the reflected microwave to the electromagnetic horn again through the sample, and the reflected microwave from the electromagnetic horn 11, and having the opposite phase to that of the reference arm 03 and having the same strength A phase microwave is created and the reflected microwave is counterbalanced by an antiphase microwave and balanced, and the change in the reflected microwave due to unbalance when the sample absorbs the microwave energy during spin reversal by magnetic resonance at a certain magnetic field intensity ( Magic Tee) Microwave stereo circuit that detects at 32 parts, and differential amplification that records with high sensitivity and records as ESR spectrum 4 0 and a lock-in amplifier 41.

1.マイクロ波発振装置の構成と作用効果
マイクロ波発振装置は、ガン発振器用電源33、ガン発振器34、単向管35、半固定式減衰器36、マイクロ波導波管からマイクロ波用同軸ケーブルに変換する同軸導波管変換器39a、アンプ電源37、広帯域用アンプ38からなる大出力も可能なマイクロ波発生部と、アンプ38からのマイクロ波を導入する同軸導波管変換器37aとメインアーム導波管01、アイソレータ1、マイクロ波周波数カウンター2、方向性結合器3、減衰器(メインアーム用)4、サ−キュレータ5、メインアーム導波管02、試料入射前マイクロ波パワーモニター計測端子部6、試料からの反射マイクロ波のパワーモニター計測端子部6'からなるマイクロ波導波管メインアーム部とからなる。
前記マイクロ波発生部は、ガン発振器用電源33からの一定電圧供給で所定のマイクロ波をガン発振器34で発生させ、ガン発振器34からの進行波と後退波の混じったマイクロ波を単向管35で進行マイクロ波のみに選択し、単向管35からの進行マイクロ波を半固定式減衰器36と同軸導波管変換器39aによりマイクロ波用同軸ケーブルにもってきて、マイクロ波増幅用のアンプ38に導入し、アンプ38から同軸導波管変換器37aを経て、再び導波管にマイクロ波を導入する。
これにより同軸導波管変換器37aでマイクロ波導波管01に導入されたマイクロ波は単向管(アイソレーター)1で進行マイクロ波のみに選択され、そのごく一部は同軸導波管変換器1aを介して、マイクロ波周波数カウンター2に導入されて、ガン発振器の正確な周波数を6から7桁精度で計測する。メインアーム導波管01は方向性結合器3でメインアーム導波管02とリファレンスアーム導波管03との二つに分岐され、メインアーム導波管02側ではマイクロ波パワー調整用の減衰器4をとおり、パワーを調整されてサーキュレーター5に入る。
このマイクロ波はサーキュレーター5の特徴で、全てのマイクロ波が試料のある電磁ホーン11側に導かれる。途中にあるパワーモニター用の計測端子6でこのマイクロ波が検知され、パワーモニター22で計測される。一方、試料を介して電磁ホーンに戻ってきたマイクロ波はパワーモニター用の計測端子6'で検知され、パワーモニター23で計測される。
1. Microwave Oscillator Configuration and Operational Effects Microwave Oscillator converts from Gunn Oscillator Power Supply 33, Gunn Oscillator 34, Unidirectional Tube 35, Semi-fixed Attenuator 36, Microwave Waveguide to Microwave Coaxial Cable A microwave generator comprising a coaxial waveguide converter 39a, an amplifier power supply 37, and a broadband amplifier 38 capable of high output, a coaxial waveguide converter 37a for introducing the microwave from the amplifier 38, and a main arm waveguide Tube 01, isolator 1, microwave frequency counter 2, directional coupler 3, attenuator (for main arm) 4, circulator 5, main arm waveguide 02, microwave power monitor measurement terminal section 6 before sample incidence And a microwave waveguide main arm portion comprising a power monitor measurement terminal portion 6 'for reflected microwaves from the sample.
The microwave generation unit generates a predetermined microwave by the gun oscillator 34 by supplying a constant voltage from the gun oscillator power supply 33, and generates a microwave mixed with a traveling wave and a backward wave from the gun oscillator 34. The traveling microwave from the unidirectional tube 35 is sent to the microwave coaxial cable by the semi-fixed attenuator 36 and the coaxial waveguide converter 39a, and the amplifier for microwave amplification is selected. Then, the microwave is again introduced from the amplifier 38 to the waveguide through the coaxial waveguide converter 37a.
As a result, the microwave introduced into the microwave waveguide 01 by the coaxial waveguide converter 37a is selected only as the traveling microwave by the unidirectional tube (isolator) 1, and only a part of the microwave is selected by the coaxial waveguide converter 1a. Is introduced into the microwave frequency counter 2 to measure the exact frequency of the Gunn oscillator with 6 to 7 digits accuracy. The main arm waveguide 01 is branched by the directional coupler 3 into a main arm waveguide 02 and a reference arm waveguide 03, and an attenuator for adjusting microwave power is provided on the main arm waveguide 02 side. Go through 4 and enter circulator 5 with adjusted power.
This microwave is a characteristic of the circulator 5, and all the microwaves are guided to the electromagnetic horn 11 side where the sample is located. This microwave is detected by the power monitor measuring terminal 6 in the middle and measured by the power monitor 22. On the other hand, the microwave returning to the electromagnetic horn via the sample is detected by the power monitoring measurement terminal 6 ′ and measured by the power monitor 23.

2.電磁ホーンアンテナ装置の構成と作用効果
電磁ホーンアンテナ装置は、スリースタブチューナー7、ツイスト導波管8、矩形円形導波管9、円形導波管10、電磁ホーン11、テフロン(登録商標)製のマイクロ波放射凸面レンズ12からなる。
電磁ホーンアンテナ装置は、サ−キュレータ5とパワーモニター用の計測端子6を通過したマイクロ波は、試料位置を仮想的位置に置ける働きのあるスリースタブチューナー7(通常使用時にはこれを全て抜いておいて無効化にしておく)に導入され、さらにマイク波振動面を90°回転されるためにツイスト導波管8に導入して、さらに矩形円形導波管9にて円形マイクロ波モードにして、円形導波管10の延長上の電磁ホーン11に導入しそのマイクロ波放射凸面レンズ12から試料13aを介して凹面反射面型のマイクロ波反射板14aに向けて放射する。
これによりマイクロ波パワー計測端子6でパワー計測されたマイクロ波はスリースタブチューナー7に入り、定在波モードのマイクロ波振動面をツイスト導波管で90°回転された後、矩形から円形マイクロ波モードに矩形円形導波管9で変換されて、電磁ホーンアンテナ11にて定在波から球面進行波になり試料空間に放出される。これは測定感度を上げるためにテフロン(登録商標)製のマイクロ波放射凸面レンズ12にて極力収斂させる。誘電ロスが大きくて透過性の悪い試料では試料13で直ちに反射され、マイクロ波の透過性のよい試料では、さらに後方の凹面反射面型のマイクロ波反射板14aに達し、ここで凹面反射面型の反射板14aの効果で、収斂反射されて再度試料13aに入り、試料13aを抜けて電磁ホーン11に戻り、マイクロ波パワー計測端子6'にてパワー計測された後にサーキュレーター5に入り、サーキュレーター5から同軸導波管交換器51と減衰器52、同軸導波管交換器53を介して進行しミキサー(マジックティー)32へと導かれ、またパワーモニター21でパワー計測される。
2. Configuration and Effect of Electromagnetic Horn Antenna Device The electromagnetic horn antenna device includes a slew tab tuner 7, a twist waveguide 8, a rectangular circular waveguide 9, a circular waveguide 10, an electromagnetic horn 11, and Teflon (registered trademark). It consists of a microwave radiation convex lens 12.
In the electromagnetic horn antenna device, the microwave passing through the circulator 5 and the power monitoring measurement terminal 6 is a sliving stub tuner 7 which has a function of placing the sample position in a virtual position. In order to rotate the microphone vibration surface by 90 °, it is introduced into the twisted waveguide 8 to be further turned into the circular microwave mode in the rectangular circular waveguide 9, It is introduced into the electromagnetic horn 11 on the extension of the circular waveguide 10 and radiates from the microwave radiation convex lens 12 toward the concave reflecting surface type microwave reflecting plate 14a through the sample 13a.
As a result, the microwave power measured by the microwave power measuring terminal 6 enters the stub tuner 7, and the microwave vibration surface in the standing wave mode is rotated by 90 ° with the twisted waveguide, and then the rectangular to circular microwave. The mode is converted by the rectangular and circular waveguide 9, and the electromagnetic horn antenna 11 changes from a standing wave to a spherical traveling wave and is emitted to the sample space. This is converged as much as possible by the microwave radiation convex lens 12 made of Teflon (registered trademark) in order to increase the measurement sensitivity. A sample with a large dielectric loss and poor transmission is immediately reflected by the sample 13, and a sample with good microwave transmission reaches the rear microwave reflecting plate 14a of the concave reflecting surface type. Here, the concave reflecting surface type Due to the effect of the reflecting plate 14a, the light is converged and reflected and enters the sample 13a again, passes through the sample 13a, returns to the electromagnetic horn 11, and enters the circulator 5 after power measurement at the microwave power measuring terminal 6 '. Then, the light travels through the coaxial waveguide exchanger 51, the attenuator 52, and the coaxial waveguide exchanger 53, is guided to the mixer (magic tee) 32, and power is measured by the power monitor 21.

3.試料への掃引磁場印加装置(電磁石)と磁場変調装置の構成と作用効果
磁場変調装置は、公知のものであり、図1で電磁ホーン11、試料13a、凹面反射面型の反射鏡14aを囲むように描かれた点線の円形部分に磁場変調コイルを設置して、100kHzのサイン波を大出力のアンプで増幅して、当該アンプにインピーダンス・マッチングさせた一対の多巻きコイルに導入されて、試料への掃引磁場印加装置で発生させた磁場均一性のよい静磁場に100kHzの交流磁場を重畳させて、ロックイン増幅装置41とあわせて変調分光法にて3桁ほどの計測感度の改善を行っている。図1では点線の円形部分の磁場変調コイル設置部以外は省略されている。
3. The configuration of the sweep magnetic field application device (electromagnet) and the magnetic field modulation device and the effect magnetic field modulation device to the sample are known, and surround the electromagnetic horn 11, the sample 13a, and the concave reflecting surface type reflecting mirror 14a in FIG. A magnetic field modulation coil is installed in the circular part of the dotted line drawn as follows, a 100 kHz sine wave is amplified with a high output amplifier, and introduced into a pair of multi-winding coils impedance matched to the amplifier, A 100 kHz AC magnetic field is superimposed on a static magnetic field with good magnetic field uniformity generated by a device that applies a sweep magnetic field to the sample, and the measurement sensitivity is improved by about three orders of magnitude using modulation spectroscopy with the lock-in amplifier 41. Is going. In FIG. 1, portions other than the magnetic field modulation coil installation portion of the dotted circular portion are omitted.

4.位置調節装置の構成と作用効果(信号処理内容)
マイクロ波放射凸面レンズ12とマイクロ波凹面反射面型の反射板14との間に設けた試料載置台13と、凹面反射面型のマイクロ波反射板14には、各々位置調節装置のラックピニオン式の位置調節機構15、16を設けてある。
位置調節装置は、手動でもよいが、本例は、前記各々 ラックピニオン式の位置調節機構15、16のピニオン用ステッピングモータM1、M2のGP-IB制御器Co1,Co2を介して統括制御用コンピュータ装置Coにより、次の操作が行われる。
a ,パワーモニター22で所定のマイクロ波出力値に設定する。(例えば300mW)
b ,ステッピングモーターM2で凹面反射面型の反射板14を一番後方まで移動 (又は マイクロ波吸収板を試料13aと凹面反射面型の反射板14間に挿入する)
c ,次にパワーモニター21の読みが最大になるように、モーターM2を回して凹面反射面型の反射板14を試料13aに近づける。
d ,メインアーム導波管02の減衰器4でパワーモニター22の出力を設定する。レファレンス側減衰器39でパワーモニター32aを調整して、パワーモニター21とパワーモニター32aで測定のマイクロ波出力値がバランスするように調整する。
e ,この状態でリファレンスアーム導波管03の位相器31を調整してJEOL製(日本電子社製)マイクロ波ユニットのモニター電流を最小にするように位相調整をする。
f ,磁場掃引をしてパソコン画面上に磁場掃引ESRスペクトルを得る。
以上のaからfの処理を、手動又はパソコン制御自動化(GP-IBもしくはラボビュー等で)を行う。
4). Positioning device configuration and effects (signal processing content)
The sample mounting table 13 provided between the microwave radiating convex lens 12 and the microwave concave reflecting surface type reflecting plate 14 and the concave reflecting surface type microwave reflecting plate 14 are each provided with a rack and pinion type of position adjusting device. Position adjusting mechanisms 15 and 16 are provided.
The position adjusting device may be manually operated, but in this example, the rack and pinion type position adjusting mechanisms 15 and 16 are respectively connected to the pinion stepping motors M1 and M2 via the GP-IB controllers Co1 and Co2. The following operations are performed by the device Co.
a, The power monitor 22 sets a predetermined microwave output value. (Eg 300mW)
b, Move the concave reflecting surface type reflector 14 to the rearmost position by the stepping motor M2 (or insert a microwave absorbing plate between the sample 13a and the concave reflecting surface type reflector 14)
c. Next, the motor M2 is rotated so that the reading of the power monitor 21 is maximized, and the concave reflecting surface type reflecting plate 14 is brought close to the sample 13a.
d, The output of the power monitor 22 is set by the attenuator 4 of the main arm waveguide 02. The power monitor 32a is adjusted by the reference-side attenuator 39, and the microwave output value of the measurement is adjusted to be balanced by the power monitor 21 and the power monitor 32a.
e. In this state, the phase adjuster 31 of the reference arm waveguide 03 is adjusted to adjust the phase so that the monitor current of the microwave unit made by JEOL (manufactured by JEOL Ltd.) is minimized.
f, The magnetic field sweep ESR spectrum is obtained on the personal computer screen by the magnetic field sweep.
The above processing from a to f is performed manually or by PC control automation (GP-IB or lab view).

5.温度可変装置と単結晶用ゴニオメーターと誘電率計測装置とこれらの同時計測手段についてその構成と作用効果。 5. Configuration and operation effect of temperature variable device, single crystal goniometer, dielectric constant measuring device and their simultaneous measuring means.

(1)、試料載置台13に設ける温度可変装置は次の3種類の温度可変を行っている。
a ,アルミブロックに穴をあけ、ヒーターと制御用熱電対と試料測温用熱電対を挿入して、PID制御で温度可変をする。室温から200℃まで
温度可変を行えた。
b ,合成石英でジュワー瓶を作製し、ジュワー瓶内に銅製の縦長の試料載置台を設置して、試料載置台最高部に試料を設置し、試料の直ぐ下に、無誘導巻きのマンガニン線ヒーターを設置し、冷媒(液体窒素又はアルコールとドライアイスの混合物等)を、ヒーター部より下部に満たして、
PID制御で温度可変を-196℃から+70℃までの温度可変を行う。
当該装置では、試料載置台部分に試料回転装置を設け、1軸試料回転仕様の温度可変装置にしている。
c ,L字型アルミブロックに縦横高さ方向の一筆書きの溶液通路を設け、測温用の熱電対穴も設けて、クーリング・サーキュレーターからの
不凍液を流しこれまでのところ試料設置部で−15℃から+60℃までの温度可変と、シリコーンオイルに切り替えて室温から+130℃までの温度可変を行っている。
(1) The temperature variable device provided on the sample mounting table 13 performs the following three types of temperature variations.
a, Make a hole in the aluminum block, insert a heater, a thermocouple for control, and a thermocouple for sample temperature measurement, and change the temperature by PID control. The temperature was variable from room temperature to 200 ° C.
b, Prepare a dewar bottle with synthetic quartz, install a copper vertical sample holder in the dewar bottle, place the sample at the highest part of the sample holder, and place a non-inductively wound manganin wire directly under the sample. Install a heater and fill the refrigerant (liquid nitrogen or a mixture of alcohol and dry ice, etc.) below the heater,
Variable temperature from -196 ° C to + 70 ° C with PID control.
In this apparatus, a sample rotating device is provided in the sample mounting table portion to make a temperature variable device of a single-axis sample rotating specification.
c, An L-shaped aluminum block is provided with a single-stroke solution path in the vertical and horizontal height direction, a thermocouple hole for temperature measurement is also provided, and the antifreeze from the cooling circulator is poured so far at the sample installation section at -15. The temperature can be varied from ℃ to + 60 ℃, and the temperature can be varied from room temperature to + 130 ℃ by switching to silicone oil.

(2)、試料載置台13に設ける単結晶用ゴニオメーターについて
a ,円筒形プラスチック容器を2枚重ね、外部を試料載置台13に固定して、角度目盛りをつけた内部円筒型プラスチック容器に軽量紙粘土で単結晶試料等を固定して、外部容器内で回転させる1軸回転機構付き試料回転装置。試料回転軸は鉛直線に平行。
b ,試料設置部をマコールもしくは軟質テフロン(登録商標)もしくはデルリン(登録商標)製の容器状に作製した試料載置台に軽量紙粘土で試料を固定して、試料載置台13にアルミの立板に設置し、後方の目盛りのついた大型ダイヤルで角度を読みながら回転させる1軸回転機構付き試料回転装置。試料回転軸はマイクロ波照射方向に平行にする。
c ,発明者が過去に共振器型ESR装置用に開発した5種類の2軸ゴニオメーターを仕様の小変更とゴニオメーターを大型化し、一部のギヤーや
回転装置をテフロンから金属(アルミもしくは真鍮)に変更した2軸ゴニオメーター。(室温計測用、温度可変計測用、ステッピングモーターを用いた自動計測用2軸ゴニオメーター)
これには発明者が1985年に開発したウルフネットと2軸ゴニオメータを用いたスピンハミルトニアンテンソルの主軸の直接探索法が応用できる。
d ,発明者が過去に共振器型ESR装置用に開発した3軸ゴニオメーターを仕様の小変更とゴニオメーターを大型化し、一部のギヤーや 回転装置をテフロンから金属(アルミもしくは真鍮)に変更した3軸ゴニオメーター。単結晶中のある不対電子センターのあるサイトのみの定量状態分析法に利用できる。
(2) About the goniometer for single crystals provided on the sample stage 13
a, Two cylindrical plastic containers are stacked, the outside is fixed to the sample mounting table 13, and a single crystal sample etc. is fixed to the internal cylindrical plastic container with an angle scale with lightweight paper clay. A sample rotation device with a single-axis rotation mechanism for rotation. The sample rotation axis is parallel to the vertical line.
b, the sample mounting part is fixed to a sample mounting table made in a container made of Macor or soft Teflon (registered trademark) or Delrin (registered trademark) with lightweight paper clay, and an aluminum stand plate is mounted on the sample mounting table 13 A sample rotation device with a single-axis rotation mechanism that is installed in the center and rotates while reading the angle with a large dial with a rear scale. The sample rotation axis is parallel to the microwave irradiation direction.
c, 5 types of 2-axis goniometers developed by the inventor for resonator-type ESR devices in the past, specifications were changed and the goniometers were enlarged, and some gears and rotating devices were changed from Teflon to metal (aluminum or brass). 2 axis goniometer changed to). (Two-axis goniometer for automatic measurement using room temperature measurement, variable temperature measurement, stepping motor)
The direct search method of the main axis of the spin Hamiltonian tensor using the Wolfnet and the biaxial goniometer developed by the inventor in 1985 can be applied to this.
d, the inventor has previously developed a three-axis goniometer for the resonator type ESR device, changed the specification and increased the size of the goniometer, and changed some gears and rotating devices from Teflon to metal (aluminum or brass) 3 axis goniometer. It can be used for quantitative state analysis of only sites with a certain unpaired electron center in a single crystal.

(3)、誘電率計測とESRスペクトルの同時計測装置
(1)のaの温度可変装置に試料の一部に帯状の電極を施して、一部分をコンデンサー仕様にした試料を設置して、温度をPID制御でステップ・スキャンで変化させて各測定温度で固定させてESR計測と誘電率計測を行うもので、ESRと他の物性量との同時計測として、Cu(II)イオンを添加させた強誘電体硫酸三グリシン単結晶試料のキュリー点とその前後の強誘電相と常誘電相でESRスペクトルと誘電率(ε',ε")の同時計測に成功している。
(3) Simultaneous measurement device for dielectric constant measurement and ESR spectrum
Install a sample with a strip-shaped electrode on a part of the sample and a capacitor part of the sample on the temperature variable device in (1) a, and change the temperature by PID control by step scan at each measurement temperature. The ESR measurement and dielectric constant measurement are performed in a fixed state. For simultaneous measurement of ESR and other physical properties, the Curie point of a ferroelectric triglycine sulfate single crystal sample to which Cu (II) ions are added and before and after that. The ESR spectrum and dielectric constant (ε ', ε ") have been measured simultaneously in the ferroelectric and paraelectric phases.

(4)、(3)と同様に
a ,熱容量(比熱)とESRスペクトルの同時測定、
b ,リン青銅バネにストレインゲージを貼り付けた簡易型熱膨張計とESR計測の同時測定
c ,熱伝導率とESRスペクトルとの同時測定装置
d ,電気伝導率とESRスペクトルとの同時測定装置
e ,除振機構を設けてその中に設置したSTS(走査型トンネル電流分光)装置を設け、トンネル電流とESRスペクトルの同時計測・クロス計測を介してフェルミ準位での電子状態の研究。
f ,発明者が過去に共振器用ESR装置で開発した1軸性応力印加装置を電磁ホーン型ESRに改造して設置する。
g ,ダイヤモンドアンビル装置を設置して超高圧静水圧を印加してその高圧下でのESRスペクトル観測
h ,発明者が過去に開発した2電流電源用多巻きZupancic型MRIコイルとアンチヘルムホルツMRIコイルを用いた3次元MRIコイルを設置して、
ESRイメージング(ESR-CT)仕様にする。
(4) Same as (3)
a, Simultaneous measurement of heat capacity (specific heat) and ESR spectrum,
b, Simultaneous measurement of simple thermal dilatometer with strain gauge attached to phosphor bronze spring and ESR measurement
c, Apparatus for simultaneous measurement of thermal conductivity and ESR spectrum
d, device for simultaneous measurement of electrical conductivity and ESR spectrum
e, STS (scanning tunneling current spectroscopy) device installed in the vibration isolation mechanism, and studying the electronic state at the Fermi level through simultaneous measurement and cross measurement of tunneling current and ESR spectrum.
f, The uniaxial stress applying device developed by the inventor in the past for the resonator ESR device is modified and installed in the electromagnetic horn type ESR.
g. Install diamond anvil device and apply ultra-high hydrostatic pressure to observe ESR spectrum under high pressure.
h, Installed a three-dimensional MRI coil using a multi-winding Zupancic type MRI coil and an anti-helmholtz MRI coil developed by the inventor in the past for two current power sources,
Use ESR imaging (ESR-CT) specifications.

本発明装置は、前述の優れた効果を呈する。このため以下に紹介の各種分野に適用でき、この種産業に多大な貢献をするものである。
1.物理学、化学の基礎科学分野での各種固相、液相、気相物質の基礎研究
2.医学での臨床検査室での血液、生体組織の迅速検査
3.医薬学分野でのレドックス関連の加齢現象及び難治疾患(癌、糖尿病、虚血、高血圧、アルツハイマー等)の機作解明。
4.環境科学分野での水処理、水質検査、ジーゼル排気ガス等の粉塵検査。
5.MRIコイルを用いたESRイメージング、さらにはESR-STM (走査型トンネル顕微鏡)装置開発と磁場印加で生じたラーモア歳差運動のある周波数に選択された高分解能ESRイメージング像の獲得。
6.アラニン及びアラニンイメージングプレートを用いた放射線線量計測システムの構築。試料の非破壊ESR年代測定法への応用。
7.他の診断機器(X線コンピュータトモグラフィー、超音波画像診断等、PET等)との同時/連続検査診断が可能となる。
The device of the present invention exhibits the excellent effects described above. For this reason, it can be applied to various fields introduced below and makes a great contribution to this kind of industry.
1. 1. Basic research on various solid-phase, liquid-phase, and gas-phase substances in the fields of physics and basic science of chemistry 2. Rapid examination of blood and living tissue in medical clinical laboratories. Elucidation of redox-related aging phenomena and intractable diseases (cancer, diabetes, ischemia, hypertension, Alzheimer, etc.) in the pharmaceutical field.
4). Water treatment in the field of environmental science, water quality inspection, and dust inspection of diesel exhaust.
5. ESR imaging using MRI coil, ESR-STM (scanning tunneling microscope) device development and acquisition of high-resolution ESR imaging images selected for frequencies with Larmor precession caused by magnetic field application.
6). Construction of radiation dosimetry system using alanine and alanine imaging plate. Application to non-destructive ESR dating of samples.
7). Simultaneous / continuous examination diagnosis with other diagnostic devices (X-ray computer tomography, ultrasonic imaging diagnosis, PET, etc.) becomes possible.

電磁ホーン型電子スピン共鳴装置の一例であるX-band及びK-band反射方式電磁ホーン型ESR装置のマイクロ波立体回路のブロック線図である。It is a block diagram of the microwave solid circuit of the X-band and K-band reflection system electromagnetic horn type | mold ESR apparatus which is an example of an electromagnetic horn type | mold electron spin resonance apparatus. 従来の電磁ホーン型電子スピン共鳴装置の一例を示すブロック線図である。It is a block diagram which shows an example of the conventional electromagnetic horn type | mold electron spin resonance apparatus.

図1において
1:アイソレータ
2:周波数カウンター
3:方向性結合器
4:減衰器(メインアーム)
5:サ−キュレータ
7:スリースタブチューナー
8:ツイスト導波管
9:矩形円形導波管
10:円形導波管
11:電磁ホーン
12:マイクロ波放射凸面レンズ
13a:試料
13:試料載置台
14a:凹面反射面型のマイクロ波反射板
15:試料の位置調節機構(ラックピニオン式)
16:凹面反射面型の反射板の位置調節機構(ラックピニオン式)
17:磁場変調コイル
21:パワーモニター
22:パワーモニター
23:パワーモニター
32a:パワーモニター
31:位相器(リファレンスアーム)
32:ミキサー(マジックT)
33:ガン電源
34:ガン発振器
35:単向管
36:半固定式減衰器
37:アンプ電源
38:アンプ
In FIG. 1, 1: isolator 2: frequency counter 3: directional coupler 4: attenuator (main arm)
5: Circulator 7: Three-stub tuner 8: Twisted waveguide 9: Rectangular circular waveguide
10: Circular waveguide
11: Electromagnetic horn
12: Microwave radiation convex lens
13a: Sample
13: Sample mounting table
14a: concave reflector type microwave reflector
15: Sample position adjustment mechanism (rack and pinion type)
16: Position adjustment mechanism of concave reflecting surface type reflector (rack and pinion type)
17: Magnetic field modulation coil
21: Power monitor
22: Power monitor
23: Power monitor
32a: Power monitor
31: Phaser (reference arm)
32: Mixer (Magic T)
33: Gun power supply
34: Gun oscillator
35: Unidirectional pipe
36: Semi-fixed attenuator
37: Amplifier power supply
38: Amplifier

Claims (1)

マイクロ波発信装置からのマイクロ波をマイクロ波導波管のメインアーム(01)を介して試料載置台(13)上の試料(13a)に放射する電磁ホーン(11)、試料載置台(13)の周囲に設けた掃引磁場印加装置(171)(電磁石)と変調分光用の変調装置(170)、電磁ホーン(11)から試料(13a)を介してのマイクロ波を再び試料(13a)を介して電磁ホーン(11)に反射するマイクロ波反射板(14)、前記マイクロ波導波管のメインアーム(02)から分岐したリファレンスアーム(03)からの参照用の発信マイクロ波と、マイクロ波反射板(14)から試料(13a)と電磁ホーン(11)とメインアーム(02)を介しての反射マイクロ波をミキサー(32)に導入して、試料中の不対電子スピンが反転する磁気共鳴時にマイクロ波エネルギーを試料が吸収した際のマイクロ波パワーの極微量変化を検出し記録する差動増幅装置(40)・ロックイン増幅装置(41),記録装置(42)とからなる電磁ホーン型電子スピン共鳴装置において、前記電磁ホーンアンテナ装置の電磁ホーン(11)の表面(射出口)にマイクロ波放射凸面レンズ(12)を設け、前記マイクロ波反射板(14)を凹面反射面型反射板(14a)にし、最適のESRスペクトルを得るための同調/チューニング用として前記各マイクロ波のパワーモニター装置及び試料載置台13)の位置調節装置(15)と反射板(14)の位置調整装置(16)を設けたことを特徴とする電磁ホーン型電子スピン共鳴装置。


An electromagnetic horn (11) that radiates microwaves from the microwave transmission device to the sample (13a) on the sample mounting table (13) via the main arm (01) of the microwave waveguide, of the sample mounting table (13) Sweep magnetic field applying device (171) (electromagnet) and modulation device (170) for modulation spectroscopy provided around, microwave from the electromagnetic horn (11) through the sample (13a) again through the sample (13a) A microwave reflector (14) that reflects to the electromagnetic horn (11), a reference transmission microwave from the reference arm (03) branched from the main arm (02) of the microwave waveguide, and a microwave reflector ( 14) from the sample (13a), the electromagnetic horn (11), and the reflected microwave through the main arm (02) are introduced into the mixer (32), and the microscopic resonance occurs when the unpaired electron spin in the sample is reversed. A differential amplifier that detects and records very small changes in microwave power when a sample absorbs wave energy In an electromagnetic horn type electron spin resonance device comprising a device (40), a lock-in amplifier (41), and a recording device (42), a microwave is applied to the surface (exit port) of the electromagnetic horn (11) of the electromagnetic horn antenna device. A power monitor device for each microwave is provided for tuning / tuning to obtain an optimum ESR spectrum by providing a radiation convex lens (12) and making the microwave reflector (14) a concave reflector type reflector (14a). And a position adjusting device (15) for the sample mounting table 13) and a position adjusting device (16) for the reflecting plate (14).


JP2009255036A 2009-11-06 2009-11-06 Electromagnetic horn type electron spin resonance device (1) Expired - Fee Related JP5481643B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009255036A JP5481643B2 (en) 2009-11-06 2009-11-06 Electromagnetic horn type electron spin resonance device (1)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009255036A JP5481643B2 (en) 2009-11-06 2009-11-06 Electromagnetic horn type electron spin resonance device (1)

Publications (2)

Publication Number Publication Date
JP2011099776A JP2011099776A (en) 2011-05-19
JP5481643B2 true JP5481643B2 (en) 2014-04-23

Family

ID=44191063

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009255036A Expired - Fee Related JP5481643B2 (en) 2009-11-06 2009-11-06 Electromagnetic horn type electron spin resonance device (1)

Country Status (1)

Country Link
JP (1) JP5481643B2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102539985B (en) * 2012-02-10 2014-05-07 东莞市冠佳电子设备有限公司 Automatic ageing and testing device and method
JP6260964B2 (en) * 2013-05-21 2018-01-17 国立大学法人 大分大学 Microwave reflection type electromagnetic horn type ESR device
CN104849298B (en) * 2015-05-26 2017-10-31 衢州普林千叶电子科技有限公司 A kind of sample detection analyzer and method for nmr analysis
JP6181327B2 (en) * 2015-05-29 2017-08-16 株式会社日立製作所 Electron spin resonance measurement method and apparatus
CN110220930B (en) * 2019-06-21 2021-09-28 南京大学 Spin effect microelectronic integrated test bench

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6082982A (en) * 1983-10-14 1985-05-11 Jeol Ltd Electron spin resonance device
JP3525884B2 (en) * 2000-10-16 2004-05-10 日本電気株式会社 Wireless device having lens antenna device

Also Published As

Publication number Publication date
JP2011099776A (en) 2011-05-19

Similar Documents

Publication Publication Date Title
Morley et al. A multifrequency high-field pulsed electron paramagnetic resonance/electron-nuclear double resonance spectrometer
Neugebauer et al. Liquid state DNP of water at 9.2 T: an experimental access to saturation
JP5481643B2 (en) Electromagnetic horn type electron spin resonance device (1)
US20130088232A1 (en) Solid-State NMR Spectrometer, Sample Holder Therefor, and Method of Solid-State NMR Spectroscopy
US9287606B2 (en) Dual-mode microwave resonator device and method of electron spin resonance measurement
Bramley et al. Electron paramagnetic resonance spectroscopy at zero magnetic field
Na Measurement of electrical properties of small particles using a microwave Hall effect (MHE) technique
WO2016179523A1 (en) Apparatus and method for nuclear magnetic resonance utilizing dynamic nuclear polarization
Saliba et al. Pulsed electron decoupling and strategies for time domain dynamic nuclear polarization with magic angle spinning
JP2021099377A (en) Pulsed electron paramagnetic resonance spectrometer
US6046586A (en) Crossed-loop resonator structure for spectroscopy
US8823373B2 (en) Dual-resonance structure and method for examining samples using a plurality of conductive strips
US8289022B2 (en) Magnetic resonance compatible magnetic field detection, based on diffuse reflectance of nano-magnet sets
Jaroš et al. Electron spin resonance spectroscopy in a transmission electron microscope
Rohrer et al. Fabry-Perot resonator for high-field multi-frequency ESR at millimetre and submillimetre wavelengths
JP5434492B2 (en) Electromagnetic horn type electron spin resonance device
Seliger et al. New methods for detection of 14N NQR frequencies
JP4266216B2 (en) NMR / ESR antenna and analyzer using the same
Rinard et al. An X-band crossed-loop EPR resonator
US6791326B2 (en) NMR detector for supported monolayer and multilayer films
Hotra et al. Current status and development prospects of nuclear quadrupole resonance pulsed spectroscopy methods: A review
Deng et al. High sensitivity far infrared laser diagnostics for the C-2U advanced beam-driven field-reversed configuration plasmas
Barter et al. Design considerations of a dual mode X-Band EPR resonator for rapid in-situ microwave heating
Khan et al. Broadband dielectric characterization of tumorous and nontumorous breast tissues
JP5417616B2 (en) Electromagnetic horn type electron spin resonance device (3)

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20120926

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20121119

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20130726

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130924

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20131007

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20131217

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20140116

R150 Certificate of patent or registration of utility model

Ref document number: 5481643

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313117

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees