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JP5597155B2 - Vacuum adsorption apparatus and method for manufacturing the same - Google Patents
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JP5597155B2 - Vacuum adsorption apparatus and method for manufacturing the same - Google Patents

Vacuum adsorption apparatus and method for manufacturing the same Download PDF

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JP5597155B2
JP5597155B2 JP2011070476A JP2011070476A JP5597155B2 JP 5597155 B2 JP5597155 B2 JP 5597155B2 JP 2011070476 A JP2011070476 A JP 2011070476A JP 2011070476 A JP2011070476 A JP 2011070476A JP 5597155 B2 JP5597155 B2 JP 5597155B2
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glass
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JP2012201578A (en
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基宏 梅津
知之 小倉
愛 早坂
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Taiheiyo Cement Corp
NTK Ceratec Co Ltd
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Nihon Ceratec Co Ltd
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Description

本発明は、たとえば、ラップ等の湿式加工を行うために半導体ウエハまたはガラス基板などの対象物を真空吸着する装置に関する。   The present invention relates to an apparatus for vacuum-sucking an object such as a semiconductor wafer or a glass substrate in order to perform wet processing such as lapping.

多孔質体からなる載置部と、緻密質体からなる支持部とが両者の接合界面に隙間が生じないように一体的に焼成されてなる真空吸着装置が提案されている(特許文献1参照)。当該真空吸着装置によれば、その洗浄時に載置部および支持部の隙間を通じた洗浄液の漏れが防止され、載置部の多孔質体内に残留した研削屑等の汚染物質が十分に除去されうる。   There has been proposed a vacuum suction device in which a placing portion made of a porous body and a support portion made of a dense body are integrally fired so that no gap is formed at the joint interface between them (see Patent Document 1). ). According to the vacuum suction device, the cleaning liquid can be prevented from leaking through the gap between the mounting portion and the support portion during cleaning, and contaminants such as grinding dust remaining in the porous body of the mounting portion can be sufficiently removed. .

特許第4336532号公報Japanese Patent No. 4336532

しかし、焼成などの熱処理の後における多孔質体の収縮等の原因によって、載置部および支持部の間の密着性が若干ではあるものの低下する可能性がある。   However, the adhesion between the mounting portion and the support portion may be slightly reduced due to the shrinkage of the porous body after the heat treatment such as firing.

そこで、本発明は、載置部および支持部の間の密着性のさらなる向上を図りうる真空吸着装置およびその製造方法を提供することを目的とする。   Then, an object of this invention is to provide the vacuum suction apparatus which can aim at the further improvement of the adhesiveness between a mounting part and a support part, and its manufacturing method.

本発明は、貫通孔が設けられている緻密質のセラミックス焼結体からなる支持部と、骨格粒子となるセラミックス粉末がガラスにより結合されることによって形成されている多孔質体からなる載置部とを備え、前記載置部が前記貫通孔を塞いでいる状態で前記多孔質体を構成するガラスによって前記支持部に対して接合されている真空吸着装置に関する。   The present invention provides a support portion made of a dense ceramic sintered body provided with through-holes and a mounting portion made of a porous body formed by bonding ceramic powder serving as skeleton particles with glass. And a vacuum adsorbing device joined to the support portion by glass constituting the porous body in a state where the placement portion closes the through hole.

本発明の真空吸着装置は、平均粒子径が2〜30[μm]の範囲であり、1次粒子の小粒径側からの累積個数が全粒子個数の95%における粒子径D95が平均粒子径の3倍以下の範囲であり、かつ、1次粒子の小粒径側からの累積個数が全粒子個数の3%における粒子径D3が平均粒子径の0.25倍以上の範囲である前記セラミックス粉末と、ガラス粉末とからなる原料によって前記多孔質体が形成され、前記載置部を構成する多孔質体の平均気孔径が1〜10[μm]の範囲(ただし、10[μm]を除く)であり、前記セラミックス粉末の平均粒子径に対する前記ガラスの粉末の平均粒子径の比が1/3以下である原料によって前記載置部が形成されていることを特徴とする。 In the vacuum adsorption apparatus of the present invention, the average particle diameter is in the range of 2 to 30 [μm] , and the average particle diameter is the particle diameter D95 when the cumulative number from the small particle diameter side of the primary particles is 95% of the total particle number. 3 times in the range of or less, the primary particles said ceramic cumulative number from smaller particle size side is in a range particle diameter D3 is more than 0.25 times the average particle diameter of 3% of the total number of particles of The porous body is formed of a raw material composed of powder and glass powder, and the average pore diameter of the porous body constituting the mounting portion is in the range of 1 to 10 [μm] (excluding 10 [μm]) The placement portion is formed of a raw material having a ratio of the average particle diameter of the glass powder to the average particle diameter of the ceramic powder of 1/3 or less .

前記多孔質体の気孔率が10〜50[%]の範囲であることが好ましい。 The porosity of the porous body is preferably in the range of 10 to 50 [%].

前記支持部がアルミナおよび炭化珪素から選ばれる1種類のセラミックスからなる緻密質焼結体からなっていてもよい。   The support part may be formed of a dense sintered body made of one kind of ceramic selected from alumina and silicon carbide.

本発明の真空吸着装置の製造方法は、前記セラミックス粉末と、前記ガラス粉末と、水またはアルコールとを混合することによってスラリーを調整するスラリー調整工程と、支持部となるセラミックス緻密質焼結体に設けられている貫通孔が途中で遮断されるように前記貫通孔の一部に消失部材を充填する消失部材充填工程と、前記貫通孔および前記消失部材により形成される空間に前記スラリーを充填するスラリー充填工程と、前記セラミックス緻密質焼結体と、前記空間に充填された前記スラリーとをガラスの軟化点以上の温度で一体的に焼成する焼成工程とを含むことを特徴とする。   The manufacturing method of the vacuum suction device of the present invention includes a slurry adjustment step of adjusting a slurry by mixing the ceramic powder, the glass powder, and water or alcohol, and a ceramic dense sintered body serving as a support portion. A disappearing member filling step of filling a part of the through hole with a disappearing member so that the provided through hole is interrupted halfway, and a space formed by the through hole and the disappearing member is filled with the slurry. It includes a slurry filling step, a firing step of integrally firing the ceramic dense sintered body and the slurry filled in the space at a temperature equal to or higher than a softening point of glass.

本発明の一実施形態としての真空吸着装置の断面図。Sectional drawing of the vacuum suction apparatus as one Embodiment of this invention.

(真空吸着装置の構成)
図1に示されている本発明の一実施形態としての真空吸着装置は、半導体ウエハ等の対象物wが載置される略平板状の多孔質体からなる載置部1と、略平板状のセラミックス緻密質体からなる支持部2とを備えている。支持部2にはその中央部を上下方向に貫通する貫通孔20が形成されている。貫通孔20の上部空間21は、下部空間22よりも幅広または大径に形成されている。
(Configuration of vacuum suction device)
The vacuum suction apparatus as one embodiment of the present invention shown in FIG. 1 includes a mounting portion 1 made of a substantially flat porous body on which an object w such as a semiconductor wafer is mounted, and a substantially flat plate shape. And a support part 2 made of a ceramic dense body. A through hole 20 is formed in the support portion 2 so as to penetrate the center portion in the vertical direction. The upper space 21 of the through hole 20 is formed wider or larger in diameter than the lower space 22.

貫通孔20の上部空間21の側壁が載置部1の周縁に対して全周にわたり接合されることにより、載置部1が支持部2により支持されている。載置部1と支持部2との接合界面12は隙間なく一体的に焼成されている。「隙間なく一体的に焼成されている」とは、載置部1の多孔質体構造が支持部2と接する界面まで連続しており、かつ、載置部1と支持部2との接合界面12に隙間がなく、載置部1と支持部2とが一体的に焼成されてなることを意味する。   The placement portion 1 is supported by the support portion 2 by joining the side wall of the upper space 21 of the through hole 20 to the periphery of the placement portion 1 over the entire circumference. The joint interface 12 between the mounting portion 1 and the support portion 2 is integrally fired without a gap. “It is fired integrally with no gap” means that the porous body structure of the mounting portion 1 is continuous up to the interface contacting the support portion 2 and the bonding interface between the mounting portion 1 and the support portion 2. This means that there is no gap in 12 and the placing part 1 and the supporting part 2 are integrally fired.

載置部1の上端面は、支持部2またはその囲繞部の上端面とともに研磨加工されることによって形成される。載置部1の上端面および支持部2の上端面は同じ平面上に含まれる。貫通孔20が真空ポンプ(図示略)によって下部空間22の側から吸引されることにより、対象物wが載置部1に対して真空吸着される。   The upper end surface of the mounting portion 1 is formed by polishing together with the upper end surface of the support portion 2 or its surrounding portion. The upper end surface of the placement unit 1 and the upper end surface of the support unit 2 are included on the same plane. As the through hole 20 is sucked from the lower space 22 side by a vacuum pump (not shown), the object w is vacuum-sucked to the mounting portion 1.

載置部1を構成する多孔質体は、セラミックス粉末およびガラス粉末を含む原料から製造される。アルミナまたは炭化珪素粉末がセラミックス粉末として採用される。純度が95.5〜99.5[%]の範囲に含まれ、平均粒子径が2〜30[μm]の範囲に含まれ、D95が平均粒子径の3倍以下の範囲に含まれ、かつ、D3が平均粒子径の0.25倍以上の範囲に含まれるようなセラミックス粉末が用いられる。「D95」は、1次粒子の小粒径側からの累積個数が全粒子個数の95[%]における粒子径を意味する。「D3」は、1次粒子の小粒径側からの累積個数が全粒子個数の3[%]における粒子径を意味する。   The porous body constituting the mounting part 1 is manufactured from raw materials including ceramic powder and glass powder. Alumina or silicon carbide powder is employed as the ceramic powder. The purity is included in the range of 95.5 to 99.5 [%], the average particle diameter is included in the range of 2 to 30 [μm], D95 is included in the range of three times or less of the average particle diameter, and A ceramic powder in which D3 is included in a range of 0.25 times or more of the average particle diameter is used. “D95” means the particle size when the cumulative number of primary particles from the small particle size side is 95% of the total number of particles. “D3” means the particle size when the cumulative number of primary particles from the small particle size side is 3 [%] of the total number of particles.

ガラスとして、その熱膨張係数がセラミックスの熱膨張係数より小さいものが用いられる。これにより、載置部1と支持部2との接合界面の隙間をなくすことができる。また、載置部1を構成する多孔質体において結合材としての役割を有するガラスに圧縮応力が加わった状態が実現される。   Glass having a thermal expansion coefficient smaller than that of ceramics is used. Thereby, the clearance gap of the joining interface of the mounting part 1 and the support part 2 can be eliminated. Moreover, the state where the compressive stress was added to the glass which has a role as a binder in the porous body which comprises the mounting part 1 is implement | achieved.

また、載置部1の構成原料において、セラミックス粉末の平均粒子径に対するガラス粉末の平均粒子径の比が1/3以下とされている。これにより、ガラス粉末がセラミックス粉末の充填を阻害し、ガラス軟化点以上で焼結する際に焼成収縮が防止される。   Moreover, in the constituent raw material of the mounting part 1, the ratio of the average particle diameter of the glass powder to the average particle diameter of the ceramic powder is 1/3 or less. As a result, the glass powder hinders the filling of the ceramic powder, and firing shrinkage is prevented when sintering is performed at a temperature equal to or higher than the glass softening point.

セラミックス粉末に対するガラス粉末の添加量は、目標とする気孔率、セラミックス粉末の粒度、焼成温度およびガラス粘性等が考慮された上で、質量比で5〜30[%]の範囲に調節される。これにより、多孔質体の焼成収縮が防止されるとともに、セラミックス粉末の結合強度が十分に高く確保される。   The amount of the glass powder added to the ceramic powder is adjusted to a mass ratio in the range of 5 to 30% in consideration of the target porosity, the particle size of the ceramic powder, the firing temperature, the glass viscosity, and the like. Thereby, the firing shrinkage of the porous body is prevented, and the bonding strength of the ceramic powder is ensured sufficiently high.

(真空吸着装置の製造方法)
本発明の真空吸着装置の製造方法は、「スラリー調整工程」、「消失部材充填工程」、「スラリー充填工程」および「焼成工程」を含む。焼成されることにより支持部2を構成するセラミックス成形体は、当該支持部と同様の構成を有しているので、支持部2に対して付された符号と同じ符号が付される。
(Manufacturing method of vacuum suction device)
The manufacturing method of the vacuum suction device of the present invention includes a “slurry adjusting step”, a “disappearing member filling step”, a “slurry filling step”, and a “firing step”. Since the ceramic molded body constituting the support part 2 by firing has the same configuration as the support part, the same reference numerals as those assigned to the support part 2 are given.

スラリー調整工程において、多孔質体の原料粉末であるセラミックス粉末およびガラス粉末と、水またはアルコールとが混合されてスラリーが調整される。当該混合法として、ボールミルまたはミキサー等を用いた公知の方法が適用されうる。水またはアルコールの添加量は、セラミックス粉末の粒度およびガラス粉末の添加量などが考慮された上で、所望の流動性を有するスラリーが得られるように任意に調整されうる。   In the slurry adjustment step, the slurry is adjusted by mixing ceramic powder and glass powder, which are the raw material powder of the porous body, and water or alcohol. As the mixing method, a known method using a ball mill or a mixer can be applied. The addition amount of water or alcohol can be arbitrarily adjusted so as to obtain a slurry having a desired fluidity in consideration of the particle size of the ceramic powder and the addition amount of the glass powder.

また、消失部材充填工程において、支持部2のセラミックス緻密質焼結体に設けられている貫通孔20が途中で遮断されるように貫通孔の一部に消失部材が充填される。たとえば、貫通孔20のうち、上部空間21の下側空間および下部空間22に対してろうまたは樹脂等の焼失部材が充填される。セラミックス緻密質焼結体は、アルミナまたは炭化珪素により構成される。   Further, in the vanishing member filling step, the vanishing member is filled into a part of the through hole so that the through hole 20 provided in the ceramic dense sintered body of the support portion 2 is blocked on the way. For example, in the through hole 20, the lower space 22 and the lower space 22 of the upper space 21 are filled with a burning member such as wax or resin. The ceramic dense sintered body is made of alumina or silicon carbide.

次に、スラリー充填工程において、貫通孔20および消失部材により形成される空間、たとえば、上部空間21の上側空間にスラリーが充填される。この際、必要に応じて、スラリー中の残留気泡を除去するために真空脱泡が実施され、あるいは、充填率を高めるために振動が加えられてもよい。   Next, in the slurry filling step, the slurry is filled into the space formed by the through hole 20 and the disappearing member, for example, the upper space of the upper space 21. At this time, if necessary, vacuum defoaming may be performed to remove residual bubbles in the slurry, or vibration may be applied to increase the filling rate.

そして、焼成工程において、消失部材により形成される空間にスラリーが充填されたセラミックス成形体が十分に乾燥された後、ガラスの軟化点以上の温度でセラミックス緻密質焼結体およびスラリー由来の原料が一体的に焼成される。この際、焼成温度が高すぎると載置部1に変形または収縮が発生するため、ガラスの軟化点以上であっても可能な限り低温(たとえば1000[℃])で焼成することが望ましい。焼成工程において、貫通孔20を塞いでいた消失部材が消失する。   In the firing step, after the ceramic molded body in which the slurry is filled in the space formed by the disappearing member is sufficiently dried, the ceramic dense sintered body and the slurry-derived raw material are heated at a temperature equal to or higher than the softening point of the glass. Fired integrally. At this time, if the firing temperature is too high, deformation or shrinkage occurs in the mounting portion 1. Therefore, it is desirable to perform firing at as low a temperature as possible (for example, 1000 [° C.]) even if it is above the softening point of glass. In the firing step, the disappearing member that has blocked the through hole 20 disappears.

その後、載置部1の上端面および支持部2の上端面が同一平面となるようにダイヤモンド砥石で研磨されることにより真空吸着装置の吸着面が得られた。   Then, the suction surface of the vacuum suction device was obtained by polishing with a diamond grindstone so that the upper end surface of the mounting portion 1 and the upper end surface of the support portion 2 were flush with each other.

(実施例)
(実施例1)
セラミックス粉末として、平均粒子径Dが10[μm]であり、D95が30.0[μm]であって平均粒子径Dの3.0倍であり、D3が3.0[μm]であって平均粒子径Dの0.3倍であるアルミナ粉末が用いられた。アルミナ粉末の純度はたとえば96.5[%]である。ガラス粉末としては、平均粒子径3.0[μm]であってセラミックス粉末の平均粒子径の0.3倍であり、熱膨張係数4.0×10-6/℃、軟化点800℃のほう珪酸ガラスが用いられた。セラミックス粉末、ガラス粉末および蒸留水が100:20:20の質量比で混合され、ミキサーにより混錬されることによりスラリーが調整された。
(Example)
Example 1
As ceramic powder, the average particle diameter D is 10 [μm], D95 is 30.0 [μm], 3.0 times the average particle diameter D, and D3 is 3.0 [μm] An alumina powder having an average particle diameter D of 0.3 times was used. The purity of the alumina powder is, for example, 96.5 [%]. The glass powder has an average particle size of 3.0 [μm], 0.3 times the average particle size of the ceramic powder, a thermal expansion coefficient of 4.0 × 10 −6 / ° C., and a softening point of 800 ° C. Silicate glass was used. Ceramic powder, glass powder and distilled water were mixed at a mass ratio of 100: 20: 20 and kneaded by a mixer to prepare a slurry.

セラミックス緻密質焼結体として、外径250[mm]、厚さ50[mm]の円盤状であって、当該円盤の中央部を上下方向または厚さ方向に貫通する貫通孔20が形成されているアルミナの緻密質焼結体が用いられた。成形体および消失部材により形成されている、内径200[mm]、深さ40[mm]の円柱状の空間にスラリーが充填された。スラリー中の真空脱泡が実施された後、振動が加えられてスラリーが沈降充填させた。セラミックス緻密質焼結体および当該空間に充填されたスラリーが100[℃]で2時間にわたり乾燥された後、1000[℃]で3時間にわたって焼成されることにより、図1に示されているような真空吸着装置が製造された。   As a ceramic dense sintered body, a through-hole 20 having an outer diameter of 250 [mm] and a thickness of 50 [mm] and penetrating through the center of the disk in the vertical direction or thickness direction is formed. A dense sintered body of alumina was used. Slurry was filled in a cylindrical space having an inner diameter of 200 [mm] and a depth of 40 [mm] formed by the molded body and the disappearing member. After vacuum defoaming in the slurry was performed, vibration was applied to settle and fill the slurry. As shown in FIG. 1, the ceramic dense sintered body and the slurry filled in the space are dried at 100 [° C.] for 2 hours and then fired at 1000 [° C.] for 3 hours. A vacuum suction device was manufactured.

(実施例2)
載置部1の原料に含まれるセラミックス粉末の平均粒子径Dが2.0[μm]であり、D95が5.0[μm]であって平均粒子径Dの2.5倍であり、D3が1.2[μm]であって平均粒子径Dの0.6倍である点およびガラス粉末の平均粒子径が0.6[μm]である点を除き、実施例1と同様の条件下で真空吸着装置が製造された。
(Example 2)
The average particle diameter D of the ceramic powder contained in the raw material of the mounting portion 1 is 2.0 [μm], D95 is 5.0 [μm], 2.5 times the average particle diameter D, and D3 Is 1.2 [μm] and is 0.6 times the average particle diameter D, and the average particle diameter of the glass powder is 0.6 [μm]. A vacuum suction device was manufactured.

(実施例3)
載置部1の原料に含まれるセラミックス粉末の平均粒子径Dが30[μm]であり、D95が50[μm]であって平均粒子径Dの1.67倍であり、D3が19[μm]であって平均粒子径Dの0.63倍である点およびガラス粉末の平均粒子径が4.0[μm]であってセラミックス粉末の平均粒子径の0.13倍である点を除き、実施例1と同様の条件下で真空吸着装置が製造された。
(Example 3)
The average particle diameter D of the ceramic powder contained in the raw material of the mounting portion 1 is 30 [μm], D95 is 50 [μm], 1.67 times the average particle diameter D, and D3 is 19 [μm]. And the average particle size of the glass powder is 4.0 [μm] and 0.13 times the average particle size of the ceramic powder, A vacuum adsorption device was manufactured under the same conditions as in Example 1.

(実施例4)
載置部1の原料に含まれるセラミックス粉末のD3が6.5[μm]であって平均粒子径Dの0.65倍である点を除き、実施例1と同様の条件下で真空吸着装置が製造された。
Example 4
A vacuum adsorption apparatus under the same conditions as in Example 1 except that D3 of the ceramic powder contained in the raw material of the mounting portion 1 is 6.5 [μm] and 0.65 times the average particle diameter D. Was manufactured.

(実施例5)
載置部1の原料に含まれるセラミックス粉末のD95が15.0[μm]であって平均粒子径Dの1.5倍であり、D3が2.5[μm]であって平均粒子径Dの0.25倍である点を除き、実施例1と同様の条件下で真空吸着装置が製造された。
(Example 5)
D95 of the ceramic powder contained in the raw material of the mounting portion 1 is 15.0 [μm], 1.5 times the average particle diameter D, D3 is 2.5 [μm], and the average particle diameter D A vacuum suction device was manufactured under the same conditions as in Example 1 except that the ratio was 0.25 times.

いずれの実施例においても、多孔質体の載置部1と支持部2との接合界面12において、亀裂または隙間は観察されなかった。表1には各実施例の製造条件の一部および接合界面12における亀裂の有無等の確認結果がまとめて示されている。   In any of the examples, no cracks or gaps were observed at the bonding interface 12 between the porous mounting portion 1 and the support portion 2. Table 1 summarizes a part of the manufacturing conditions of each example and the confirmation results such as the presence or absence of cracks at the bonding interface 12.

Figure 0005597155
Figure 0005597155

表1から明らかなように、実施例1〜5によれば、多孔質体の気孔率が10〜50[%]の範囲に収まっている。   As is apparent from Table 1, according to Examples 1 to 5, the porosity of the porous body is within the range of 10 to 50 [%].

(比較例)
(比較例1)
セラミックス粉末の平均粒子径Dが1.0[μm]であり、2〜30[μm]の下限値よりも小さい点を除き、(D95/D)が3以下であり、(D3/D)が0.25以上であり、かつ、{D/(ガラス粉末の平均粒子径)}が1/3以下である点で一致することを含めて実施例1と同様の条件下で真空吸着装置が製造された。
(Comparative example)
(Comparative Example 1)
Except for the point that the average particle diameter D of the ceramic powder is 1.0 [μm] and is smaller than the lower limit of 2 to 30 [μm], (D95 / D) is 3 or less, and (D3 / D) is The vacuum suction device was manufactured under the same conditions as in Example 1, including that the values were 0.25 or more and {D / (average particle diameter of glass powder)} was 1/3 or less. It was done.

(比較例2)
セラミックス粉末の平均粒子径が40[μm]であり、2〜30[μm]の上限値よりも大きい点を除き、(D95/D)が3以下であり、(D3/D)が0.25以上であり、かつ、{D/(ガラス粉末の平均粒子径)}が1/3以下である点で一致することを含めて実施例1と同様の条件下で真空吸着装置が製造された。
(Comparative Example 2)
The average particle diameter of the ceramic powder is 40 [μm], and (D95 / D) is 3 or less, and (D3 / D) is 0.25, except that it is larger than the upper limit of 2 to 30 [μm]. The vacuum adsorption apparatus was manufactured under the same conditions as in Example 1 including the above and matching that {D / (average particle diameter of glass powder)} was 1/3 or less.

(比較例3)
セラミックス粉末のD95が40[μm]であって、平均粒子径Dの3倍を超えている点を除き、平均粒子径Dが2〜30[μm]の範囲に含まれ、(D3/D)が0.25以上であり、かつ、{D/(ガラス粉末の平均粒子径)}が1/3以下である点で一致することを含めて実施例1と同様の条件下で真空吸着装置が製造された。
(Comparative Example 3)
Except for the point that D95 of the ceramic powder is 40 [μm] and exceeds 3 times the average particle diameter D, the average particle diameter D is included in the range of 2 to 30 [μm], (D3 / D) Is equal to or greater than 0.25, and {D / (average particle diameter of glass powder)} is equal to or less than 1/3, and the vacuum adsorption apparatus is under the same conditions as in Example 1. manufactured.

(比較例4)
セラミックス粉末のD3が2.0[μm]であって、平均粒子径Dの0.25倍未満である点を除き、平均粒子径Dが2〜30[μm]の範囲に含まれ、(D95/D)が3以下であり、かつ、{D/(ガラス粉末の平均粒子径)}が1/3以下である点で一致することを含めて実施例1と同様の条件下で真空吸着装置が製造された。
(Comparative Example 4)
Except for the point that D3 of the ceramic powder is 2.0 [μm] and less than 0.25 times the average particle diameter D, the average particle diameter D is included in the range of 2 to 30 [μm] (D95 / D) is 3 or less, and {D / (average particle diameter of the glass powder)} is the same as that of Example 1, including that they are equal to 1/3 or less. Was manufactured.

(比較例5)
ガラスの粉末の平均粒子径が4.0[μm]であって、セラミックス粉末の平均粒子径の1/3倍を超えている点を除き、平均粒子径Dが2〜30[μm]の範囲に含まれ、(D95/D)が3以下である点で一致することを含めて実施例1と同様の条件下で真空吸着装置が製造された。
(Comparative Example 5)
The average particle diameter of the glass powder is 4.0 [μm], and the average particle diameter D is in the range of 2 to 30 [μm] except that the average particle diameter exceeds 1/3 times the average particle diameter of the ceramic powder. And a vacuum adsorption device was produced under the same conditions as in Example 1 including that they coincided with each other in that (D95 / D) was 3 or less.

比較例1〜3では、多孔質体の平均気孔径が1〜10[μm]の範囲から外れている。比較例1、3、4では、多孔質体の気孔率が10〜50[%]の範囲から外れている。比較例1〜5のすべてにおいて、載置部1および支持部2の接合界面12に亀裂または隙間が観察された。特に、比較例5では、非常に大きな隙間が観察された。表2には各比較例の製造条件の一部および接合界面12における亀裂の有無等の確認結果がまとめて示されている。   In Comparative Examples 1 to 3, the average pore diameter of the porous body is out of the range of 1 to 10 [μm]. In Comparative Examples 1, 3, and 4, the porosity of the porous body is out of the range of 10 to 50 [%]. In all of Comparative Examples 1 to 5, cracks or gaps were observed at the bonding interface 12 between the placement portion 1 and the support portion 2. In particular, in Comparative Example 5, a very large gap was observed. Table 2 summarizes the results of confirmation of part of the manufacturing conditions of each comparative example and the presence or absence of cracks at the bonding interface 12.

Figure 0005597155
Figure 0005597155

表2から明らかなように、比較例1によれば、多孔質体の気孔率が55%であり、前記範囲(10〜50[%])から外れている。本製法では、セラミックス粉末の平均粒子径が小さ過ぎると、骨格粒子の充填率が悪くなるため、気孔率が高くなる傾向を示すためである。また、比較例2によれば、多孔質体の平均気孔径が15.0[μm]であり、前記範囲(1〜10[μm])から外れている。これは、セラミックス粉末の平均粒子径が大き過ぎると、骨格粒子の充填間の空間が大きくなるためである。比較例3によれば、多孔質体の気孔率が52%であり、前記範囲から外れている。これは、D95が大き過ぎると、骨格粒子の充填率が悪くなるため、気孔率が高くなる傾向を示すためである。このように、多孔質体の気孔率や平均気孔径が大き過ぎると、接合界面12との接触面が少なくなり、それにより接合強度が弱まるため、隙間が発生する。   As apparent from Table 2, according to Comparative Example 1, the porosity of the porous body is 55%, which is out of the above range (10 to 50 [%]). This is because, in this production method, if the average particle size of the ceramic powder is too small, the filling rate of the skeleton particles is deteriorated, so that the porosity tends to increase. Moreover, according to the comparative example 2, the average pore diameter of the porous body is 15.0 [μm], which is out of the range (1 to 10 [μm]). This is because if the average particle diameter of the ceramic powder is too large, the space between the filling of the skeleton particles becomes large. According to Comparative Example 3, the porosity of the porous body is 52%, which is out of the above range. This is because when D95 is too large, the filling rate of the skeletal particles deteriorates, and the porosity tends to increase. As described above, when the porosity or average pore diameter of the porous body is too large, the contact surface with the bonding interface 12 is reduced, and thereby the bonding strength is weakened, so that a gap is generated.

比較例4によれば、多孔質体の気孔率が8%であり、前記範囲から外れている。これは、D3が小さ過ぎると、骨格粒子の充填率が向上し、気孔率が低くなる傾向を示すためである。比較例5によれば、多孔質体のガラス粉末がDの1/3倍以上であり、前記範囲から外れている。このように、骨格粒子の充填率が高過ぎたり、ガラス粉末の平均粒子径が大き過ぎると、顕著な焼成収縮が発生し、一体化できない。   According to Comparative Example 4, the porosity of the porous body is 8%, which is out of the above range. This is because when D3 is too small, the filling rate of the skeleton particles is improved and the porosity tends to be low. According to the comparative example 5, the glass powder of a porous body is 1/3 times or more of D, and has remove | deviated from the said range. Thus, if the filling rate of the skeleton particles is too high, or the average particle diameter of the glass powder is too large, remarkable firing shrinkage occurs and integration cannot be performed.

(発明の効果)
本発明によれば、載置部1および支持部2の間の密着性のさらなる向上が図られた真空吸着装置が得られる。
(Effect of the invention)
According to the present invention, a vacuum suction device in which the adhesion between the placement unit 1 and the support unit 2 is further improved can be obtained.

1‥載置部、12‥接合界面、2‥支持部、21‥上部空間、22‥下部空間、w‥対象物。 DESCRIPTION OF SYMBOLS 1 ... Mounting part, 12 ... Joining interface, 2 ... Supporting part, 21 ... Upper space, 22 ... Lower space, w ... Object.

Claims (4)

貫通孔が設けられている緻密質のセラミックス焼結体からなる支持部と、骨格粒子となるセラミックス粉末がガラスにより結合されることによって形成されている多孔質体からなる載置部とを備え、前記載置部が前記貫通孔を塞いでいる状態で前記多孔質体を構成するガラスによって前記支持部に対して接合されている真空吸着装置であって、
平均粒子径が2〜30[μm]の範囲であり、1次粒子の小粒径側からの累積個数が全粒子個数の95%における粒子径D95が平均粒子径の3倍以下の範囲であり、かつ、1次粒子の小粒径側からの累積個数が全粒子個数の3%における粒子径D3が平均粒子径の0.25倍以上の範囲である前記セラミックス粉末と、ガラス粉末とからなる原料によって前記多孔質体が形成され、
前記載置部を構成する多孔質体の平均気孔径が1〜10[μm]の範囲(ただし、10[μm]を除く)であり、
前記セラミックス粉末の平均粒子径に対する前記ガラスの粉末の平均粒子径の比が1/3以下である原料によって前記載置部が形成されていることを特徴とする真空吸着装置。
A support portion made of a dense ceramic sintered body provided with through-holes, and a placement portion made of a porous body formed by bonding ceramic powder serving as skeletal particles with glass, A vacuum suction device joined to the support portion by glass constituting the porous body in a state where the placement portion closes the through hole,
The average particle size is in the range of 2 to 30 [μm] , and the cumulative number from the small particle size side of the primary particles is in the range where the particle size D95 at 95% of the total number of particles is not more than 3 times the average particle size . And the ceramic powder in which the cumulative number from the small particle size side of the primary particles is 3% of the total particle number and the particle diameter D3 is in the range of 0.25 times or more of the average particle diameter, and the glass powder. The porous body is formed by raw materials,
The average pore diameter of the porous body constituting the mounting portion is in the range of 1 to 10 [μm] (except 10 [μm]),
The vacuum suction apparatus, wherein the placement portion is formed of a raw material having a ratio of an average particle diameter of the glass powder to an average particle diameter of the ceramic powder of 1/3 or less .
請求項1記載の真空吸着装置において、
前記多孔質体の気孔率が10〜50[%]の範囲であることを特徴とする真空吸着装置。
The vacuum suction apparatus according to claim 1,
The vacuum adsorbing device, wherein the porosity of the porous body is in a range of 10 to 50 [%].
請求項1又は2記載の真空吸着装置において、
前記支持部がアルミナおよび炭化珪素から選ばれる1種類のセラミックスからなる緻密質焼結体からなることを特徴とする真空吸着装置。
The vacuum suction apparatus according to claim 1 or 2 ,
The vacuum adsorbing device, wherein the support portion is formed of a dense sintered body made of one kind of ceramic selected from alumina and silicon carbide.
請求項1〜3のいずれか1項に記載の真空吸着装置の製造方法であって、
前記セラミックス粉末と、前記ガラス粉末と、水またはアルコールとを混合することによってスラリーを調整するスラリー調整工程と、
支持部となるセラミックス緻密質焼結体に設けられている貫通孔が途中で遮断されるように前記貫通孔の一部に消失部材を充填する消失部材充填工程と、
前記貫通孔および前記消失部材により形成される空間に前記スラリーを充填するスラリー充填工程と、
前記支持部となるセラミックス緻密質焼結体と、前記空間に充填された前記スラリーとをガラスの軟化点以上の温度で一体的に焼成する焼成工程とを含むことを特徴とする方法。
It is a manufacturing method of the vacuum adsorption device according to any one of claims 1 to 3 ,
A slurry adjustment step of adjusting a slurry by mixing the ceramic powder, the glass powder, and water or alcohol;
A vanishing member filling step of filling the vanishing member into a part of the through hole so that the through hole provided in the ceramic dense sintered body serving as the support portion is interrupted in the middle;
A slurry filling step of filling the slurry into the space formed by the through hole and the disappearing member;
And a firing step of integrally firing the ceramic dense sintered body serving as the support portion and the slurry filled in the space at a temperature equal to or higher than a softening point of glass.
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