JP5634722B2 - Appearance inspection device - Google Patents

Description

  The present invention relates to an appearance inspection apparatus.

  Conventionally, there is an appearance inspection device for inspecting the appearance of a chip-type electronic component body such as a chip capacitor or a chip inductor. For example, in the appearance inspection apparatus described in Patent Document 1, an element supply unit and a recovery unit are provided along an edge of a transparent rotary table. In addition, a plurality of imaging units are arranged at predetermined intervals along the circumference of the rotary table between the supply unit and the collection unit, and sequentially image each end face of the element body conveyed by the rotation of the rotary table. It is like that.

JP 2003-139516 A

  By the way, in the appearance inspection apparatus as described above, there is a case where the rotary table is replaced or maintained while continuing to be used. At this time, since a plurality of imaging units are arranged at the edge of the rotary table over most of the circumference, in order to remove the rotary table from the apparatus, it is necessary to first remove the position-adjusted imaging unit. . Therefore, each time the rotary table is replaced or maintained, the position of the imaging unit must be readjusted.

  The present invention has been made to solve the above-described problems, and an object thereof is to provide an appearance inspection apparatus that can easily readjust the position of an imaging unit.

  In order to solve the above problems, an appearance inspection apparatus according to the present invention includes a rotary table, a chip-type electronic component supply unit and a recovery unit disposed around the rotary table, and a rotary table between the supply unit and the recovery unit. A plurality of image pickup units arranged at predetermined intervals around the image pickup unit, the image pickup unit between the image pickup position that overlaps the rotary table in plan view and the retreat position that does not overlap the rotary table in plan view. It is characterized by being supported by a support portion whose position can be switched.

  In this appearance inspection apparatus, the support unit can switch the position of the imaging unit between an imaging position where the imaging unit overlaps the rotary table in plan view and a retreat position where the imaging unit does not overlap the rotary table in plan view. ing. Therefore, when exchanging and maintaining the rotating table, the rotating table can be easily removed by retracting the imaging unit to the retracted position, while the imaging unit is imaged after installing the rotating table that has been replaced or maintained. By returning to the position, the position of the imaging unit can be readjusted easily.

  Moreover, it is preferable that the position of the imaging unit in the retracted position is below the rotary table. In this case, even when the rotary table is surrounded by a plurality of imaging units, it can be easily detached from the apparatus by moving the rotary table in the horizontal direction.

  With the appearance inspection apparatus according to the present invention, the position of the imaging unit can be easily readjusted.

It is a top view which shows one Embodiment of the external appearance inspection apparatus which concerns on this invention. It is a side view which shows the imaging unit supported at an imaging position. It is a side view which shows the imaging unit supported in a retracted position. It is a top view which shows a mode that a turntable is removed. It is a top view which shows a mode that a rotary table is installed.

  Hereinafter, preferred embodiments of an appearance inspection apparatus according to the present invention will be described in detail with reference to the drawings.

  FIG. 1 is a plan view showing an embodiment of an appearance inspection apparatus according to the present invention. The appearance inspection apparatus 1 is configured as an apparatus for inspecting the appearance of the chip electronic component S by sequentially imaging each end face of the chip electronic component S conveyed by the rotation of the turntable 2. As shown in FIG. 1, the appearance inspection apparatus 1 includes a rotary table 2, a supply unit 3 that supplies a chip-type electronic component S, and a plurality (three in the present embodiment) that capture images of each end surface of the chip-type electronic component S. ) Imaging unit 4 and a collection unit 5 that collects the chip-type electronic component S that has been imaged.

  The turntable 2 is formed in a disk shape using, for example, transparent glass or synthetic resin. The diameter of the rotary table 2 is, for example, 40 cm to 50 cm. For example, a servo motor is provided on the lower surface side of the rotary table 2. By driving the servo motor, the turntable 2 rotates at a constant speed around the central axis.

  The supply unit 3 includes a hopper and a feeder. A large number of chip-type electronic components S are accommodated in the hopper, and the chip-type electronic components S are supplied from the feeder toward the edge of the turntable 2 by opening the bottom of the hopper.

  The imaging unit 4 includes an imaging unit 11 that captures an end face of the chip-type electronic component S, and a dome-shaped illumination unit 12, for example. The imaging unit 4 is arranged around the rotary table 2 at a predetermined interval between the supply unit 3 and the collection unit 5. The imaging unit 11 and the illuminating unit 12 are set above the edge of the turntable 2 and can photograph the end surface of the chip-type electronic component S conveyed by the rotation of the turntable 2, whether there are scratches, unevenness, chipping, or the like. Have been adjusted so that. The three image pickup units 4 each pick up images of different end faces of the chip-type electronic component S.

  Here, as shown in FIG. 2, the imaging unit 11 and the illumination unit 12 are supported by, for example, a rod-shaped support unit 13. The support part 13 has a base end part 13a having a leg part 13c, and a tip part 13b to which the imaging part 11 and the illumination part 12 are fixed. The tip part 13b is a rotary table with respect to the base end part 13a. It is pivotally supported so as to be able to tilt toward the outside of 2. In a state where the distal end portion 13b is tilted with respect to the proximal end portion 13a, the imaging unit 11 and the illumination unit 12 are supported at a position below the rotary table 2, as shown in FIG. With such a support unit 13, the positions of the imaging unit 11 and the illumination unit 12 are an imaging position that overlaps the edge of the turntable 2 in a plan view and a retreat position that does not overlap the edge of the turntable 2 in a plan view. It is possible to switch between them.

  As shown in FIG. 1, the recovery unit 5 includes gas injection nozzles 14, 15, a non-defective product recovery unit 16, and a defective product recovery unit 17. The gas injection nozzles 14 and 15 are devices that spray gas onto the surface of the rotary table 2. The nozzles of the gas injection nozzles 14 and 15 are respectively directed to the non-defective product recovery unit 16 and the defective product recovery unit 17, and the timing of gas injection is controlled by a control unit (not shown).

  This control unit acquires imaging data from each imaging unit 4 and the rotation amount of the rotary table 2. First, the control unit performs image processing based on the imaging data to inspect whether there is a defect on each end face of the chip type electronic component S and determine whether the chip type electronic component S is a non-defective product. Then, the control unit causes the gas injection nozzle 14 to eject gas when the chip-type electronic component S determined to be non-defective based on the rotation amount of the turntable 2 reaches the position of the non-defective product collection unit 16. The non-defective product collecting unit 16 collects the chip-type electronic component S. Further, the control unit causes the gas injection nozzle 15 to eject gas when the chip-type electronic component S that is determined to be defective reaches the position of the defective-product collection unit 17, so that the chip-type electronic component S is defective. The collection unit 17 collects them.

  In such an appearance inspection apparatus 1, when exchanging and maintaining the rotary table 2, first, as shown in FIG. 4, the distal end portion 13 b of each support portion 13 of each imaging unit 4 is tilted to image the imaging portion 11. And the position of the illumination part 12 is moved from an imaging position to a tilt position. In this state, the imaging unit 11 and the illuminating unit 12 do not overlap the edge of the turntable 2 in plan view, so that the turntable 2 can be removed from the appearance inspection apparatus 1 by moving the turntable 2 in the horizontal direction. it can.

  Further, the imaging unit 11 and the illumination unit 12 at the tilted position are supported at a position below the rotary table 2 as shown in FIG. Therefore, when the rotary table 2 is moved in the horizontal direction, it is possible to pass above the imaging unit 11 and the illumination unit 12, and the rotary table 2 is removed without lifting the rotary table 2 upward from the use state. be able to.

  When the rotary table 2 that has been replaced or maintained is installed again, as shown in FIG. 5, first, the rotary table 2 is moved in the horizontal direction and returned to the original position. Next, the tip part 13b of each support part 13 of each imaging unit 4 is made upright, and the positions of the imaging part 11 and the illumination part 12 are returned from the tilted position to the imaging position. Thereby, the appearance inspection of the chip-type electronic component S can be quickly executed without readjustment of the imaging unit 11 and the illumination unit 12. In the above-described embodiment, the chip-type electronic component S is exemplified as the end surface inspection target. However, the element body before the terminal electrode or the like is formed may be the inspection target.

  DESCRIPTION OF SYMBOLS 1 ... Appearance inspection apparatus, 2 ... Rotary table, 3 ... Supply unit, 4 ... Imaging unit, 5 ... Recovery unit, 13 ... Support part, S ... Chip-type electronic component.

Claims (1)

A rotating table,
A chip-type electronic component supply unit and a recovery unit arranged around the rotary table;
A plurality of imaging units arranged at predetermined intervals around the rotary table between the supply unit and the recovery unit;
The imaging unit is supported by a support unit capable of switching the position of the imaging unit between an imaging position that overlaps the rotary table in a plan view and a retracted position that does not overlap the rotary table in a plan view.
Ri is lower der than the rotary table position of the imaging unit in the retracted position,
The support portion has a base end portion and a tip end portion that is pivotally supported with respect to the base end portion so as to be tiltable toward the outside of the turntable, and the tilt center of the tip end portion is more than the turntable. Is also located below .

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