Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JP5693486B2 - High frequency circuit case cover, method for manufacturing the same, and high frequency circuit module using the same - Google Patents
[go: Go Back, main page]

JP5693486B2 - High frequency circuit case cover, method for manufacturing the same, and high frequency circuit module using the same - Google Patents

High frequency circuit case cover, method for manufacturing the same, and high frequency circuit module using the same Download PDF

Info

Publication number
JP5693486B2
JP5693486B2 JP2012029779A JP2012029779A JP5693486B2 JP 5693486 B2 JP5693486 B2 JP 5693486B2 JP 2012029779 A JP2012029779 A JP 2012029779A JP 2012029779 A JP2012029779 A JP 2012029779A JP 5693486 B2 JP5693486 B2 JP 5693486B2
Authority
JP
Japan
Prior art keywords
radio wave
wave absorber
frequency circuit
cover
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2012029779A
Other languages
Japanese (ja)
Other versions
JP2013168439A (en
Inventor
和宏 山口
和宏 山口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2012029779A priority Critical patent/JP5693486B2/en
Publication of JP2013168439A publication Critical patent/JP2013168439A/en
Application granted granted Critical
Publication of JP5693486B2 publication Critical patent/JP5693486B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F1/00Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
    • H01F1/01Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials
    • H01F1/03Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity
    • H01F1/12Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials
    • H01F1/34Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials non-metallic substances, e.g. ferrites
    • H01F1/36Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials non-metallic substances, e.g. ferrites in the form of particles
    • H01F1/37Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials non-metallic substances, e.g. ferrites in the form of particles in a bonding agent

Landscapes

  • Laminated Bodies (AREA)
  • Hard Magnetic Materials (AREA)
  • Soft Magnetic Materials (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)

Description

本発明は、高周波回路ケース用カバー、その製造方法およびこれを用いた高周波回路モジュールに関する。   The present invention relates to a high-frequency circuit case cover, a manufacturing method thereof, and a high-frequency circuit module using the same.

電子機器の分野では小型化・高性能化を図るため、高周波化と高密度実装化が進行している。特に高周波機器は回路機能ブロック毎に金属またはセラミックで形成されたケース等に収容し、実装された素子や回路導体を保護すると共に外部回路との相互電波干渉を防止する構造を採っている。高周波回路を完全に金属ケースで覆うことによって、ケース外部との相互電波干渉を防ぐことはできる。しかしながら、金属ケース内における自己干渉を防止することはできず、増幅器を含む高周波回路では金属ケース内に構成された高周波伝送線路から生じた輻射電波がケース内で反射し、増幅器に帰還して発信する場合がある。また使用周波数とケース内空間の寸法によっては空洞共振を起こす場合がある。空洞共振抑制のためには、空間寸法で決まる遮断周波数を考慮した電子機器設計を行うのが望ましい。しかしながら、回路規模、機能、大きさ等、同時に満足させなければならない制約が多いため、遮断周波数を優先した設計を行うことが難しいのが実情である。   In the field of electronic devices, high frequency and high density mounting are progressing in order to achieve miniaturization and high performance. In particular, high-frequency devices are housed in cases or the like made of metal or ceramic for each circuit functional block, and have a structure that protects mounted elements and circuit conductors and prevents mutual radio wave interference with external circuits. By completely covering the high-frequency circuit with a metal case, mutual radio wave interference with the outside of the case can be prevented. However, self-interference in the metal case cannot be prevented, and in a high-frequency circuit including an amplifier, the radiated radio wave generated from the high-frequency transmission line configured in the metal case is reflected in the case and returned to the amplifier for transmission. There is a case. Depending on the frequency used and the size of the space in the case, cavity resonance may occur. In order to suppress cavity resonance, it is desirable to design an electronic device in consideration of a cut-off frequency determined by a spatial dimension. However, since there are many restrictions that must be satisfied at the same time, such as circuit scale, function, size, etc., it is actually difficult to design with priority on the cutoff frequency.

これらケース内における自己干渉を抑制するには、ケース内で発生した不要電波を吸収する電波吸収体を設けることが有効であり、フェライト(磁性材料)を用いた電波吸収体をケース内に貼り付ける方法が採用されてきた。これはフェライトの電波吸収性能を利用したものである。特に高周波回路直上に設けることが有効であり、また十分に大面積に適用できるため高周波回路と対向するカバー(ケースの蓋面)に貼り付ける構成が一般的である。   In order to suppress the self-interference in these cases, it is effective to provide a radio wave absorber that absorbs unnecessary radio waves generated in the case, and a radio wave absorber using ferrite (magnetic material) is attached to the case. The method has been adopted. This utilizes the electromagnetic wave absorption performance of ferrite. In particular, it is effective to be provided immediately above the high-frequency circuit, and since it can be applied to a sufficiently large area, a configuration of attaching to a cover (case cover surface) facing the high-frequency circuit is common.

しかし、従来高周波磁界用の磁性材料として広く用いられてきたフェライトは複素透磁率の損失項であるμ´´の絶対値が低く、適用可能な周波数は数百MHzまでであり、問題となっている電磁波の周波数であるGHz帯では十分な吸収性能を有していない。GHz帯の吸収に適した電波吸収体には軟磁性金属が適するとされていることから、樹脂材料に軟磁性金属粉末を混合・分散させたシート状の電波吸収体が提案されている(特許文献1)。   However, ferrite, which has been widely used as a magnetic material for conventional high-frequency magnetic fields, has a low absolute value of μ ″, which is a loss term of complex permeability, and the applicable frequency is up to several hundred MHz, which is a problem. In the GHz band, which is the frequency of the electromagnetic wave that is present, it does not have sufficient absorption performance. Since a soft magnetic metal is suitable for a radio wave absorber suitable for absorption in the GHz band, a sheet-like radio wave absorber in which a soft magnetic metal powder is mixed and dispersed in a resin material has been proposed (patented) Reference 1).

一般の樹脂材料は温度上昇と共に塩素、臭素、アンモニア、水素、炭化水素等、半導体素子にとっては腐食性となるガスが発生し易い。このため、半導体装置の封止樹脂としては、これら腐食性元素を含まない樹脂材料を用いているが、樹脂材料を使用する限り微量ではあるが水分発生は避けられない。温度上昇と共に発生した水蒸気は、温度低下と共に電子機器ケース内で結露し、短絡や高周波回路導体、半導体素子を腐食する要因となる。特に気密封止する電子デバイスでは微量の水蒸気が致命的となる場合がある。ここで樹脂から発生する水分の除去には高温・長時間のベーキングが有効であるが、長時間のバッチ処理となるため製造能力を圧迫することとなり、また高価となる要因になっている。   General resin materials easily generate corrosive gases for semiconductor elements, such as chlorine, bromine, ammonia, hydrogen, and hydrocarbons, as the temperature rises. For this reason, a resin material that does not contain these corrosive elements is used as the sealing resin for the semiconductor device. However, as long as the resin material is used, the generation of moisture is unavoidable even though the amount is small. Water vapor generated as the temperature rises condenses in the electronic device case as the temperature decreases, causing corrosion of short circuits, high-frequency circuit conductors, and semiconductor elements. In particular, a trace amount of water vapor may be fatal in an electronic device that is hermetically sealed. Here, baking at a high temperature for a long time is effective for removing moisture generated from the resin. However, since the batch processing is performed for a long time, the production capacity is reduced, and the cost becomes high.

また、シート状の電波吸収体とカバーの接合固定には腐食ガス発生源となる接着剤は使用できない。このため、はんだ付けや低温ろう付けを用いているが、そのために電波吸収体にはんだや低温ろう材に濡れる金属層を形成しなければならず、やはり高価とならざるを得ない構成であった。軟磁性金属は鉄が主成分であるため非常に安価な素材であるが、このような軟磁性金属をカバーに貼り付けて電波吸収体として構成する場合には、高価になってしまう要因が多々あった。   In addition, an adhesive serving as a source of corrosive gas cannot be used for joining and fixing the sheet-shaped wave absorber and the cover. For this reason, soldering or low-temperature brazing is used, but for this purpose, a metal layer that gets wet with solder or low-temperature brazing material has to be formed on the radio wave absorber, which is also an expensive structure. . Soft magnetic metal is a very inexpensive material because it contains iron as its main component. However, when such a soft magnetic metal is affixed to a cover and configured as a radio wave absorber, there are many factors that make it expensive. there were.

また、GHz帯で十分な電波吸収性能を有し、腐食ガスや水分の発生がほぼ無い焼結体を電波吸収体として使用し、蓋体に貼り付ける方法が開示されている(特許文献2)。しかしながら、この電波吸収体も金属層を形成し、はんだやろう材を用いて接合するところは前述したシート状電波吸収体の場合と同様であり、高価なものとなっている。   In addition, a method is disclosed in which a sintered body having sufficient radio wave absorption performance in the GHz band and almost no generation of corrosive gas or moisture is used as a radio wave absorber and is attached to a lid (Patent Document 2). . However, this radio wave absorber also forms a metal layer and is joined using a solder or brazing material as in the case of the above-described sheet-like radio wave absorber, and is expensive.

特開2004−87686号公報Japanese Patent Laid-Open No. 2004-87686 特開2005−72156号公報JP 2005-72156 A

特許文献1に示されるようにフェライトではGHz帯の電波吸収体としては性能不足のため樹脂に軟磁性金属粉を分散させる方法により吸収性能を得ているが、樹脂は水分発生が避けられず、ケース内の高周波回路腐食要因を完全には無くすことはできない。また、水分除去のため、長時間のベーキング工程が必要であるなど製造に時間がかかり、高価となるという問題がある。また電波吸収体取り付けのため電波吸収体に金属層を形成するのが必須である一方、カバーにも、はんだ付けまたは低温ろう付け可能な金属層の形成が必須であるため、さらに高価となる問題がある。   As shown in Patent Document 1, ferrite has obtained absorption performance by a method of dispersing soft magnetic metal powder in a resin due to insufficient performance as a radio wave absorber in the GHz band, but the resin cannot avoid generation of moisture, The high-frequency circuit corrosion factor in the case cannot be completely eliminated. In addition, there is a problem that it takes time to manufacture such as a long baking process is necessary for removing moisture, resulting in high cost. In addition, it is essential to form a metal layer on the radio wave absorber for mounting the radio wave absorber, but it is also necessary to form a metal layer that can be soldered or brazed at a low temperature on the cover. There is.

特許文献2では電波吸収体を焼結体とすることで電波吸収体自体からの水分発生は防止されているが、電波吸収体及びカバーにはんだ付けまたはろう付け可能な金属層を形成する必要があり、高価となる製造工程が必要な点は何ら変わっていない。   In Patent Document 2, moisture generation from the radio wave absorber itself is prevented by using the radio wave absorber as a sintered body. However, it is necessary to form a metal layer that can be soldered or brazed to the radio wave absorber and the cover. There is no change in the need for expensive manufacturing processes.

本発明は、上記に鑑みてなされたもので、腐食ガスや水分を発生することなく、安定でかつ安価な高周波回路ケース用カバー、その製造方法およびこれを用いた高周波回路モジュールを提供することを目的とする。   The present invention has been made in view of the above, and provides a stable and inexpensive cover for a high-frequency circuit case, a manufacturing method thereof, and a high-frequency circuit module using the same without generating corrosive gas and moisture. Objective.

上述した課題を解決し、目的を達成するために、本発明の高周波回路ケース用カバーは、Fe−Si−B系の軟磁性体球状粉末と、SiOを含まず、かつ400℃以上600℃未満の軟化点を有するBi系ガラス粉末とが重量割合が8:2〜9:1で混合された混合物から成る電波吸収体と、金属製またはセラミック製のカバー本体と、前記電波吸収体と前記カバー本体との間で、前記電波吸収体及びカバー本体とともに焼結温度400℃未満で加圧焼結接合された低温焼結金属とを備えたことを特徴とする。 To solve the above problems and achieve the object, the cover for a high frequency circuit case of the present invention includes a soft magnetic material spherical powder of Fe-Si-B-based, free of SiO 2, and 400 ° C. or higher 600 ° C. A radio wave absorber made of a mixture of a Bi-based glass powder having a softening point of less than 8: 2 to 9: 1, a metal or ceramic cover body, the radio wave absorber, A low-temperature sintered metal press-sintered at a sintering temperature of less than 400 ° C. is provided together with the radio wave absorber and the cover main body between the cover main body and the cover main body.

本発明によれば、電波吸収体は、Fe−Si−B系で球状粉末形態の軟磁性体が高周波回路から発生したGHz帯の電波を吸収するため、高周波回路ケース内の共振、発振、ケース外への電波漏れを防止できる。また軟磁性体粉を固形化するためにSiOを含まないBi系ガラスを使用することで軟磁性体の特性を損なわない、電波吸収体を得ることが出来る。 According to the present invention, the radio wave absorber is a Fe-Si-B-based soft magnetic material in the form of spherical powder that absorbs GHz band radio waves generated from the high frequency circuit. It is possible to prevent radio wave leakage to the outside. In addition, a radio wave absorber that does not impair the properties of the soft magnetic material can be obtained by using Bi glass that does not contain SiO 2 in order to solidify the soft magnetic material powder.

また電波吸収体及び低温焼結金属はいずれも焼結物であるため腐食ガスや水分発生が無く、高周波回路を腐食する心配が無い。また低温焼結金属による接合では電波吸収体面とカバー面に金属層を設ける必要が無く、低コスト化を図ることができるという効果がある。また、軟磁性体の特性を保つため電波吸収体形成に適用するガラス粉末は400℃以上600℃未満の低温ガラス材料としているが、電波吸収体とカバーの接合には400℃未満の低温焼結金属を使用しているので電波吸収体を固形化しているガラスが再溶融することもなく、安定な電波吸収体付き高周波回路用カバーを提供できる。   Further, since both the radio wave absorber and the low-temperature sintered metal are sintered products, there is no generation of corrosive gas and moisture, and there is no fear of corroding the high-frequency circuit. Further, in joining with a low-temperature sintered metal, it is not necessary to provide a metal layer on the radio wave absorber surface and the cover surface, and there is an effect that the cost can be reduced. In order to maintain the characteristics of the soft magnetic material, the glass powder applied to the formation of the radio wave absorber is a low temperature glass material of 400 ° C. or higher and lower than 600 ° C. Since a metal is used, the glass for solidifying the radio wave absorber is not melted again, and a stable high frequency circuit cover with a radio wave absorber can be provided.

図1は、実施の形態1による高周波回路ケース用カバーを示す断面図である。1 is a cross-sectional view showing a high-frequency circuit case cover according to Embodiment 1. FIG. 図2は、実施の形態1による高周波回路モジュールを示す断面図である。FIG. 2 is a sectional view showing the high-frequency circuit module according to the first embodiment. 図3は、実施の形態1による電波吸収体の製造方法を示す模式図である。FIG. 3 is a schematic diagram showing a method of manufacturing the radio wave absorber according to the first embodiment. 図4は、実施の形態1による高周波回路用カバーの製造方法を示す模式図である。FIG. 4 is a schematic diagram illustrating a method for manufacturing the high-frequency circuit cover according to the first embodiment. 図5は、実施の形態1で用いられるFe−Si−B系軟磁性体球状粉末の通過損失周波数特性を示す図である。FIG. 5 is a graph showing the pass loss frequency characteristics of the Fe—Si—B soft magnetic spherical powder used in the first embodiment. 図6は、比較例の六方晶系フェライトの通過損失周波数特性を示す図である。FIG. 6 is a graph showing the pass loss frequency characteristics of the hexagonal ferrite of the comparative example. 図7は、比較例のFe−Si−B系軟磁性体扁平粉の通過損失周波数特性を示す図である。FIG. 7 is a graph showing the pass loss frequency characteristics of the Fe—Si—B soft magnetic material flat powder of the comparative example. 図8は、実施の形態1によるガラスを重量比で20%添加した場合の電波吸収体の通過損失周波数特性を示す図である。FIG. 8 is a diagram showing the passing loss frequency characteristics of the radio wave absorber when the glass according to Embodiment 1 is added at a weight ratio of 20%. 図9は、比較例のガラスを重量比で40%添加した場合の電波吸収体の通過損失周波数特性を示す図である。FIG. 9 is a diagram showing the pass loss frequency characteristics of the radio wave absorber when the glass of the comparative example is added by 40% by weight.

以下、本発明にかかる高周波回路ケース用カバーの一実施の形態を図面に基づいて説明する。   Hereinafter, an embodiment of a high-frequency circuit case cover according to the present invention will be described with reference to the drawings.

実施の形態1.
図1は実施の形態1の電波吸収体付き高周波回路ケース用カバーの例を示す断面図であり、金属製またはセラミック製のカバー本体1の面に電波吸収体2が取付けられている。図2はこの高周波回路ケース用カバーを用いた高周波回路モジュールを示す断面図である。本実施の形態1の電波吸収体付き高周波回路ケース用カバーCは、Fe−Si−B系の損失性の軟磁性体球状粉末と、SiOを含まず、かつ400℃以上600℃未満の軟化点を有するBi系ガラス粉末とが重量割合が8:2〜9:1で混合された混合物から成る電波吸収体2と、金属製またはセラミック製のカバー本体1と、電波吸収体2とカバー本体との間で、これらとともに加圧焼結接合された焼結温度400℃未満の低温焼結金属3とを備えたことを特徴とする。電波吸収体2は高周波損失性が高いFe−Si−B系の軟磁性体球状粉末とSiOを含まないBi系ガラスとから構成され、低温焼結金属3を焼結することによりカバー本体1の表面に焼結接合されている。ここで軟磁性体球状粉末としてはCu、Nbが添加された Fe-Cu-Nb-Si-Bを用いている。
Embodiment 1.
FIG. 1 is a cross-sectional view showing an example of a cover for a high-frequency circuit case with a radio wave absorber according to the first embodiment. A radio wave absorber 2 is attached to the surface of a cover body 1 made of metal or ceramic. FIG. 2 is a cross-sectional view showing a high-frequency circuit module using the high-frequency circuit case cover. The cover C for a high-frequency circuit case with a radio wave absorber according to the first embodiment includes a Fe—Si—B lossy soft magnetic spherical powder and a softening that does not contain SiO 2 and is 400 ° C. or higher and lower than 600 ° C. Radio wave absorber 2 made of a mixture in which Bi-based glass powder having dots is mixed at a weight ratio of 8: 2 to 9: 1, metal or ceramic cover body 1, radio wave absorber 2 and cover body And a low-temperature sintered metal 3 having a sintering temperature of less than 400 ° C., which is press-sintered together with them. The radio wave absorber 2 is composed of a Fe-Si-B soft magnetic spherical powder with high high-frequency loss and Bi-based glass not containing SiO 2 , and a low-temperature sintered metal 3 is sintered to cover the cover body 1. It is sintered and joined to the surface. Here, Fe-Cu-Nb-Si-B added with Cu and Nb is used as the soft magnetic spherical powder.

また、この高周波回路ケース用カバーを用いた高周波回路モジュールにおいては、図2に示すように、多層誘電体基板を構成するセラミック基板4上に高周波回路チップ6aと、信号処理のための回路チップ6bとが搭載され、筒状金属からなるケース本体10に装着される。そしてこのケース本体10に、高周波回路チップ6aに相対向する位置に電波吸収体2が位置するように、高周波回路ケース用カバーCが、装着されている。これら高周波回路チップ6a及び回路チップ6bは、セラミック基板4上に形成された回路パターン5にボンディングワイヤ7を介して電気的に接続されている。通常高周波回路モジュールにおいては、導波管などの伝送部が搭載されることが多いがここでは説明を省略する。   In the high-frequency circuit module using the high-frequency circuit case cover, as shown in FIG. 2, a high-frequency circuit chip 6a and a signal processing circuit chip 6b are formed on a ceramic substrate 4 constituting a multilayer dielectric substrate. Are mounted on the case body 10 made of cylindrical metal. A high-frequency circuit case cover C is attached to the case body 10 so that the radio wave absorber 2 is located at a position opposite to the high-frequency circuit chip 6a. The high-frequency circuit chip 6 a and the circuit chip 6 b are electrically connected to the circuit pattern 5 formed on the ceramic substrate 4 through bonding wires 7. Usually, in a high-frequency circuit module, a transmission unit such as a waveguide is often mounted, but the description thereof is omitted here.

次に、この高周波回路ケース用カバーの製造方法について説明する。説明に先立ち、まず電波吸収体2の製造方法について説明する。図3はこの工程説明図である。図3(a)に示すように、Fe−Si−B系の軟磁性体球状粉末とSiOを含まないBi系ガラスを混合し、さらに有機バインダを混合した電波吸収体粉末2Fを得る。そして電波吸収体粉末2Fを所望の大きさ・形状の成形型100に入れ、プレス装置200を用いて加圧成形して成形ペレット2Pを得る(図3(b))。このとき、Fe−Si−B系の軟磁性体球状粉末と、SiOを含まず、かつ400以上600℃未満の軟化点を有するBi系ガラス粉末とが重量割合8:2〜9:1となるように混合する。また有機バインダとしては例えばセルロース系樹脂を用いた。 Next, a method for manufacturing the high frequency circuit case cover will be described. Prior to the description, a method for manufacturing the radio wave absorber 2 will be described first. FIG. 3 is an explanatory diagram of this process. As shown in FIG. 3 (a), mixing the Bi-based glass containing no soft magnetic spherical powder and SiO 2 of Fe-Si-B system, to obtain the radio wave absorbent powder 2F is further mixed with an organic binder. Then, the radio wave absorber powder 2F is put into a molding die 100 having a desired size and shape, and is press-molded using the press device 200 to obtain a molded pellet 2P (FIG. 3B). At this time, the Fe-Si-B-based soft magnetic spherical powder and the Bi-based glass powder not containing SiO 2 and having a softening point of 400 to 600 ° C. have a weight ratio of 8: 2 to 9: 1. Mix to be. For example, a cellulose resin is used as the organic binder.

そしてこの成形ペレット2Pを形成した上で焼成・焼結することで、電波吸収体2が得られる。ガラスは金属やセラミックと強固な接合、固形化が出来るため古くから焼結助剤材として用いられ、導電材や抵抗材等の機能材料を固形化、接合する手段として広く用いられているが、本実施の形態ではFe−Si−B系の軟磁性体球状粉末を機能材として用いる。   The radio wave absorber 2 is obtained by firing and sintering the formed pellets 2P. Glass has long been used as a sintering aid because it can be firmly bonded and solidified with metals and ceramics, and has been widely used as a means to solidify and bond functional materials such as conductive materials and resistance materials. In this embodiment, Fe—Si—B soft magnetic spherical powder is used as a functional material.

次に、この電波吸収体2のカバー本体1との接合方法について説明する。図4(a)〜(c)は工程説明図である。カバー本体1としては、金属製またはセラミック製が適用可能であるが、ここではセラミック製を用いる。図4(a)〜(b)はこのカバー本体1と電波吸収体2との接合工程を示す図である。まず、図4(a)に示すように、カバー本体1に未焼成低温焼結金属3Pを塗布する。未焼成低温焼結金属3Pは直径数ナノメートルから数マイクロメートルの金属微粒子に溶剤を混合してペースト状としたものまたはこのペーストを乾燥させてシート状としたものである。   Next, a method for joining the radio wave absorber 2 to the cover body 1 will be described. 4A to 4C are process explanatory views. The cover body 1 can be made of metal or ceramic, but here, ceramic is used. FIGS. 4A and 4B are views showing a joining process between the cover main body 1 and the radio wave absorber 2. First, as shown in FIG. 4A, an unfired low-temperature sintered metal 3P is applied to the cover body 1. The unsintered low-temperature sintered metal 3P is obtained by mixing a metal fine particle having a diameter of several nanometers to several micrometers with a solvent, or by drying the paste to form a sheet.

未焼成低温焼結金属3Pは、金属粒子が微小であることから微粒子同士が非常に低温で拡散接合する特質をもつ構成の金属であり、金、銀、銅、などが低温焼結可能な材質として代表的である。また未焼成低温焼結金属3Pは拡散性が高いことから他種金属やセラミックとの接合性が高いという特長があり、はんだやろう材との濡れ性を確保するためのめっき層などの金属層は必ずしも必要ではない。ここで未焼成低温焼結金属3Pを構成する金属微粒子の直径を数ナノメートルから数マイクロメートルとしたのは、コスト的に比較的安価で手に入りやすいという観点から下限を選択し、十分な分散性を得ることができるという観点から上限を設定している。   The unsintered low-temperature sintered metal 3P is a metal having a characteristic that the fine particles are diffusion-bonded at a very low temperature because the metal particles are very small, and gold, silver, copper, etc. can be sintered at a low temperature. As representative. In addition, the unsintered low-temperature sintered metal 3P has a high diffusibility, so that it has a high bondability with other types of metals and ceramics, and a metal layer such as a plating layer to ensure wettability with solder and brazing material Is not necessarily required. Here, the diameter of the metal fine particles constituting the unfired low-temperature sintered metal 3P is set to several nanometers to several micrometers, and the lower limit is selected from the viewpoint of being relatively inexpensive and easy to obtain. The upper limit is set from the viewpoint that dispersibility can be obtained.

また未焼成低温焼結金属3Pは、焼結が完了すると、その融点はその金属元素固有の融点と同等であるため、焼結後に焼結接合工程温度を超える場合があっても溶融することが無く、はんだやろう材とは全く異なる特質を備えている。また原材料に樹脂成分を含まないため低温で焼成された焼結物であっても、塩素、臭素、アンモニア、水素、炭化水素、等、半導体素子にとっては腐食性となるガスや水分の発生が無く、電子機器ケース内を汚染する心配が無い。焼結温度は金属粒子のサイズ及び焼結を抑止している溶剤の種類や金属微粒子の分散性により選択可能であるが、電波吸収体2の電波吸収性能を損なわない温度として600℃未満の制限を満足し、また軟化点が400〜500℃程度のガラスを用いていることから400℃未満で焼結するよう調整されたものを選定した。本実施の形態では低温焼結金属としては、大気中300℃焼成のAgナノ粒子ペーストを用いた。つまり、低温焼結金属としては大気中で焼成することができ、また素材としても安価な銀素材のものを用いているが、大気中で焼成することができる金素材のもの、あるいは焼成に還元雰囲気を必要とはするが安価な銅素材のものも適用可能である。   In addition, the unsintered low-temperature sintered metal 3P has a melting point equal to that inherent to the metal element when the sintering is completed, and therefore may melt even if the sintering joining process temperature may be exceeded after sintering. No, it has completely different characteristics from solder and brazing material. In addition, since the raw materials do not contain resin components, there is no generation of gases and moisture that are corrosive to semiconductor devices, such as chlorine, bromine, ammonia, hydrogen, hydrocarbons, etc. There is no worry of contaminating the electronic device case. The sintering temperature can be selected depending on the size of the metal particles and the type of the solvent that suppresses the sintering and the dispersibility of the metal fine particles. In addition, since a glass having a softening point of about 400 to 500 ° C. is used, a glass adjusted to be sintered at less than 400 ° C. was selected. In this embodiment, an Ag nanoparticle paste fired at 300 ° C. in the atmosphere is used as the low-temperature sintered metal. In other words, the low-temperature sintered metal can be fired in the air, and the material is an inexpensive silver material, but the gold material that can be fired in the air or reduced to firing. An inexpensive copper material that requires an atmosphere is also applicable.

セラミック製のカバー本体1と電波吸収体2の間にペースト状またはシート状の未焼成低温焼結金属3Pを挟み、数MPa以上の加圧下で加熱して焼成することにより電波吸収体2を金属製またはセラミック製のカバー本体1に接合した(図4(b))。加圧は低温焼結金属の焼結には必ずしも必要ではないが、より強固な接合を実現するとともにより緻密な焼成物とするために加圧している。焼結に際し、低温焼結金属自体から腐食性ガスが発生することは無いが、気孔率が高い焼結物はガスや水分を吸蔵し易いため、加圧して気孔を低減し緻密な焼結物とし、ガスや水分の急増を防止する。   By sandwiching a paste-like or sheet-like unfired low-temperature sintered metal 3P between the ceramic cover body 1 and the radio wave absorber 2, the radio wave absorber 2 is made of metal by heating and firing under pressure of several MPa or more. It joined to the cover main body 1 made from a product or a ceramic (FIG.4 (b)). Pressurization is not necessarily required for sintering of the low-temperature sintered metal, but pressurization is performed in order to achieve stronger bonding and a denser fired product. During sintering, no corrosive gas is generated from the low-temperature sintered metal itself, but sintered products with high porosity are easy to occlude gas and moisture. And prevent sudden increase in gas and moisture.

なお、電波吸収体2は焼結体であるため、焼成の際に表面に露出した軟磁性体表面には酸化膜が形成されている。このため、低温焼結接合に当たり、研磨して酸化膜を除去した上で低温焼結接合する方がさらに強固な接合を得られる。焼成雰囲気は未焼成低温焼結金属の種類により選定する必要がある。例えば、還元雰囲気を要する銅では大気中での焼成は出来ないが、金や銀であれば大気、不活性雰囲気のどちらでも焼成可能である。添加するガラスとしてBi−ZnO−B系(軟化点414℃、焼成温度550℃、焼成雰囲気は大気)を用いた。 Since the radio wave absorber 2 is a sintered body, an oxide film is formed on the surface of the soft magnetic body exposed on the surface during firing. For this reason, in the low temperature sintering bonding, it is possible to obtain a stronger bonding by polishing and removing the oxide film and then performing the low temperature sintering bonding. The firing atmosphere must be selected according to the type of the unfired low-temperature sintered metal. For example, copper that requires a reducing atmosphere cannot be fired in air, but gold or silver can be fired in either air or an inert atmosphere. Bi 2 O 3 —ZnO—B 2 O 3 system (softening point 414 ° C., firing temperature 550 ° C., firing atmosphere is air) was used as the glass to be added.

電波吸収体2が低温焼結金属3で金属製またはセラミック製のカバー本体1に接合して形成された高周波回路ケース用カバーCを図2に示すように高周波回路チップ6aを収容したケース本体10に適用した場合、高周波回路チップ6aから発生するGHz帯の電波を吸収し、ケース内共振の防止やケース外部への不要電波の放射を防止することができる。また電波吸収体2とその接合材料である低温焼結金属3は焼結体であるため加熱しても樹脂のように腐食ガスや水分が発生する恐れが無く、密閉ケースであっても収容された高周波回路チップ6aを汚染したり腐食させることが無い高信頼性の電波吸収体2を得ることが出来る。   A case body 10 containing a high-frequency circuit chip 6a as shown in FIG. 2 is a cover C for a high-frequency circuit case formed by bonding the radio wave absorber 2 to a metal or ceramic cover body 1 with a low-temperature sintered metal 3. When this is applied, it is possible to absorb GHz band radio waves generated from the high frequency circuit chip 6a and prevent resonance within the case and emission of unnecessary radio waves to the outside of the case. In addition, since the radio wave absorber 2 and the low-temperature sintered metal 3 which is a bonding material thereof are sintered bodies, there is no risk of generating corrosive gas or moisture like a resin even when heated, and even a sealed case is accommodated. In addition, it is possible to obtain a highly reliable radio wave absorber 2 that does not contaminate or corrode the high frequency circuit chip 6a.

なお、前記実施の形態においては、磁性粉を固体化して電波吸収体として機能させるため用いられる、バインダ成分としてセルロース系樹脂を適用したが、特に限定されることはなく、エチルセルロースやメチルセルロース等のセルロース系樹脂や、メチルメタアクリレートやエチルメタアクリレート等のアクリル系樹脂等を用いることができる。   In the above embodiment, the cellulose resin is applied as a binder component used for solidifying the magnetic powder and functioning as a radio wave absorber, but is not particularly limited, and cellulose such as ethyl cellulose or methyl cellulose. An acrylic resin such as a methyl resin or methyl methacrylate or ethyl methacrylate can be used.

Fe−Si−B系の軟磁性体球状粉末は、GHz帯の電波を吸収する損失性磁性体であり、電波吸収体2の基本組成である。電波吸収体2の材料組成・構成を決定するに当たり、高周波回路導体パターンに損失性磁性体を被せた際のS21:通過損失(Sパラメータ)を測定した。また測定に当たり、磁性粉を固体化して電波吸収体として機能させるためバインダ成分、溶剤を混合してペースト状とし、セラミック基板に形成した高周波回路導体パターンに被せて印刷し、焼成した。ここでは純粋に磁性体の特性比較を行うため、また電波吸収体としての強度も必要ではないため焼結助剤としてのガラスは混合していない。   The Fe—Si—B-based soft magnetic spherical powder is a lossy magnetic material that absorbs radio waves in the GHz band and is the basic composition of the radio wave absorber 2. In determining the material composition and configuration of the radio wave absorber 2, S21: passage loss (S parameter) when the lossy magnetic material was put on the high-frequency circuit conductor pattern was measured. For measurement, in order to solidify the magnetic powder and function as a radio wave absorber, a binder component and a solvent were mixed to form a paste, which was printed over a high-frequency circuit conductor pattern formed on a ceramic substrate, and fired. Here, since the properties of the magnetic material are purely compared and the strength as a radio wave absorber is not required, glass as a sintering aid is not mixed.

図5はFe−Si−B系の軟磁性体球状粉を用いた場合の高周波通過損失特性、図6は従来から電波吸収体として用いられている六方晶系フェライトを用いた場合の高周波通過損失特性を示している。図5、図6で示したように、Fe−Si−B系の軟磁性体材料の方が、六方晶系フェライトの場合よりも通過損失量が大きい。通過損失量が大きいということは電波吸収性能が高いということであり、図5に示すように、Fe−Si−B系の軟磁性体球状粉末はGHz帯における電波吸収性能の有効性が認められた。図6の六方晶系フェライトではGHz帯の通過損失量が小さく、電波吸収性能が非常に低く有効ではない。   FIG. 5 shows high-frequency transmission loss characteristics when Fe-Si-B soft magnetic spherical powder is used, and FIG. 6 shows high-frequency transmission loss when hexagonal ferrite that has been conventionally used as a radio wave absorber is used. The characteristics are shown. As shown in FIGS. 5 and 6, the Fe—Si—B soft magnetic material has a larger passage loss than the hexagonal ferrite. A large amount of passage loss means that the radio wave absorption performance is high. As shown in FIG. 5, the Fe-Si-B soft magnetic spherical powder is recognized to be effective in radio wave absorption performance in the GHz band. It was. The hexagonal ferrite shown in FIG. 6 has a small amount of passing loss in the GHz band and has a very low radio wave absorption performance and is not effective.

次に、Fe−Si−B系の軟磁性粉末の粒子形状が通過損失に与える影響を調べるために、Fe−Si−B系の軟磁性材料の粒子形状が扁平状粉の場合につき高周波回路導体パターンに損失性磁性体を被せた際のS21:通過損失を測定した。ここでも純粋に磁性体の特性比較を行うため、また電波吸収体としての強度も必要ではないため焼結助剤としてのガラスは混合していない。扁平粉とは球状粉を押しつぶした平たい形状の粉末をいうものとする。上記高周波回路導体パターンに損失性磁性体を被せた際の通過損失を測定した結果を図7に示す。図7は粒子形状が扁平状粉の場合の高周波通過損失を示しており、図5で示した軟磁性材料が球状粉末の場合の高周波通過損失と比べ、扁平粉はGHz帯における通過損失量が小さく、球状粉末の方が電波吸収性能として有効性が高いことが認められた。扁平粉の場合に高周波通過損失が小さいのは扁平形状であるため通過する高周波電波に対する粉末の分布方向性が不適当、また軟磁性体としての厚さが不足するためと考えられる。   Next, in order to investigate the influence of the particle shape of the Fe-Si-B soft magnetic powder on the passage loss, the high-frequency circuit conductor is used when the particle shape of the Fe-Si-B soft magnetic material is a flat powder. S21 when the pattern was covered with a lossy magnetic material: Passage loss was measured. Again, since the properties of the magnetic material are purely compared and the strength as a radio wave absorber is not required, glass as a sintering aid is not mixed. The flat powder is a flat powder obtained by crushing a spherical powder. FIG. 7 shows the result of measuring the passage loss when the lossy magnetic material is put on the high-frequency circuit conductor pattern. FIG. 7 shows the high-frequency passage loss when the particle shape is a flat powder. Compared with the high-frequency passage loss when the soft magnetic material shown in FIG. 5 is a spherical powder, flat powder has a passage loss amount in the GHz band. It was confirmed that the smaller spherical powder was more effective as a radio wave absorbing performance. In the case of flat powder, the high-frequency passage loss is small because of the flat shape, the powder distribution direction with respect to high-frequency radio waves passing therethrough is inappropriate, and the thickness of the soft magnetic material is insufficient.

次に電波吸収体を形成するためのガラス粉末の混合量について説明する。ガラス粉末としては、SiOを含まず、かつ400℃以上600℃未満の軟化点を有するBi系ガラス粉末を用いる。Fe−Si−B系の軟磁性粉末を結合し、電波吸収体2として固体化させるためガラス焼結を利用するが、混合するBi系ガラス粉末の量(ガラス量)と軟磁性粉の混合比により電波吸収性能が変化するため電波吸収体粉末2F(図3参照)に混合するガラス量を変化させて電波吸収体としての損失性磁性体を形成し、この通過損失を測定した。ここでは、高周波回路導体パターンにこの損失性磁性体を被せた際のS21:通過損失を測定した。図5、図8、図9はBi系ガラス粉末の混合重量比に対する通過損失との関係を示しており、図5は前記したようにガラスの混合重量比は0%の場合を示し、図8はガラスの混合重量比20%、図9はガラスの混合重量比40%の場合を示している。図5、図8、図9から分かるようにガラスの混合重量比0%の場合が最も通過損失量が大きく、ガラス混合比が増えるに従い通過損失量が小さくなり、図9に示すガラスの混合重量比40%の場合では高周波損失特性がほとんど消失した。高周波損失特性が有効と認められたのは図8に示すガラスの混合重量比20%の場合までであるが、ガラスの混合重量比が10%未満では軟磁性粉の結合・固体化が困難である。以上の結果から、ガラスの混合重量比は周波損失特性を有する10〜20%が最適である。 Next, the mixing amount of the glass powder for forming the radio wave absorber will be described. As the glass powder, Bi-based glass powder not containing SiO 2 and having a softening point of 400 ° C. or higher and lower than 600 ° C. is used. Glass sintering is used to bind the Fe-Si-B soft magnetic powder and solidify it as the radio wave absorber 2, but the amount of Bi glass powder to be mixed (glass amount) and the mixing ratio of the soft magnetic powder. Therefore, the loss of magnetic material as a radio wave absorber was formed by changing the amount of glass mixed with the radio wave absorber powder 2F (see FIG. 3), and the passage loss was measured. Here, S21: Passing loss when this lossy magnetic material was put on the high-frequency circuit conductor pattern was measured. 5, FIG. 8, and FIG. 9 show the relationship between the passing loss with respect to the mixing weight ratio of the Bi-based glass powder, and FIG. 5 shows the case where the mixing weight ratio of the glass is 0% as described above. Shows a case where the mixing weight ratio of glass is 20%, and FIG. 9 shows a case where the mixing weight ratio of glass is 40%. As can be seen from FIGS. 5, 8, and 9, when the glass mixing weight ratio is 0%, the passage loss amount is the largest, and as the glass mixing ratio increases, the passage loss amount decreases, and the glass mixing weight shown in FIG. When the ratio was 40%, the high-frequency loss characteristics almost disappeared. The high-frequency loss characteristics were recognized to be effective up to a glass mixing weight ratio of 20% as shown in FIG. 8, but when the glass mixing weight ratio was less than 10%, it was difficult to bond and solidify soft magnetic powder. is there. From the above results, the mixing weight ratio of glass is optimally 10 to 20% having frequency loss characteristics.

次に軟磁性粉末に混合するガラスの種別を決定するに当たり、焼成温度とFe−Si−B系の軟磁性体球状粉末材料の物性変化の相関につき検討した。Fe−Si−B系の軟磁性体球状粉末材料は焼成温度1500℃以上の焼結物であるが、600℃を越える温度に再昇温すると結晶化反応や酸化反応が進み、高周波損失性能が低下することが分っているため、これら反応が生じない温度を焼成温度として選ぶ必要があり、ガラスの種別も軟化温度が低いものを選定した。具体的にはSiOを含まないBi系ガラスであり、Bi,ZnO,Bからなる組成により構成され、軟化点が400〜500℃程度で600℃未満で焼結可能なガラスが適当である。SiOを含むガラスはBi系であっても軟化点が高くなるため、Fe−Si−B系の軟磁性体の高周波損失特性を損なわずに焼結させるには適さない。なお、ここで用いるBi系ガラスの軟化点はFe−Si−B系の軟磁性体の高周波損失特性の維持という観点からは、400〜500℃程度であるのが望ましいが、600℃未満であればよい。 Next, in determining the type of glass to be mixed with the soft magnetic powder, the correlation between the firing temperature and the change in physical properties of the Fe-Si-B soft magnetic spherical powder material was examined. Fe-Si-B-based soft magnetic spherical powder material is a sintered product having a firing temperature of 1500 ° C. or higher, but if the temperature is raised again to a temperature exceeding 600 ° C., the crystallization reaction and oxidation reaction proceed, and the high frequency loss performance is improved. Since it is known that the temperature is lowered, it is necessary to select a temperature at which these reactions do not occur as the firing temperature, and a glass having a low softening temperature is selected. Specifically, it is Bi-based glass that does not contain SiO 2 , is composed of Bi 2 O 3 , ZnO, B 2 O 3, and can be sintered at a softening point of about 400 to 500 ° C. and less than 600 ° C. Glass is suitable. Since the glass containing SiO 2 has a high softening point even if it is Bi-based, it is not suitable for sintering without impairing the high-frequency loss characteristics of the Fe—Si—B-based soft magnetic material. The softening point of the Bi-based glass used here is preferably about 400 to 500 ° C. from the viewpoint of maintaining the high-frequency loss characteristics of the Fe—Si—B based soft magnetic material. That's fine.

このようにして選定した材料構成において、Fe−Si−B系の軟磁性体球状粉末材料とSiOを含まないBi系ガラス粉末を8:2〜9:1の重量割合で混合し、有機バインダを加えて電波吸収体粉末2Fを作製し、図3に示したように電波吸収体粉末2Fを所望の大きさ・形状の成形型100に入れ、プレス装置200を用いて50MPa以上(粉末が固形化される圧力であれば良い)の加圧力により粉体成形して成形ペレット2Pを形成した上で焼成・焼結し、電波吸収体2を作製した。 In this way, the selected material structure, Fe-Si-B system soft magnetic spherical powder material and SiO 2 and Bi-based glass powder that does not contain 8: 2 to 9: 1 were mixed in a weight ratio, an organic binder To prepare a radio wave absorber powder 2F. As shown in FIG. 3, the radio wave absorber powder 2F is put into a molding die 100 having a desired size and shape, and 50 MPa or more (powder is solid) using a press apparatus 200. The molded article 2P was formed by pressurizing with a pressing force of 2), and the molded pellets 2P were formed and fired and sintered to produce the radio wave absorber 2.

このようにして得られた電波吸収体2を、焼結温度400℃未満の未焼成低温焼結金属3Pをはさんで金属製またはセラミック製のカバー本体に被せ、400℃未満で焼結してカバーを作成しているため、安価でかつ腐食ガスや水分発生が無く、高周波回路を腐食する心配が無い低コストの電波吸収体付き高周波回路用カバーを提供することができる。   The radio wave absorber 2 thus obtained is placed on a metal or ceramic cover body with an unsintered low-temperature sintered metal 3P having a sintering temperature of less than 400 ° C. and sintered at less than 400 ° C. Since the cover is made, it is possible to provide a low-cost cover for a high-frequency circuit with a radio wave absorber that is inexpensive, does not generate corrosive gas and moisture, and does not have a risk of corroding the high-frequency circuit.

なお、未焼成低温焼結金属としては、大気焼成可能な金属微粒子をペースト状、またはペーストを乾燥させたシート状として使用し、これを電波吸収体とカバー本体との間に挟むようにした。未焼成低温焼結金属をペースト状にした場合は、必要とする厚さに塗布すればよく、調整が容易である。一方シート状にする場合は、挟み込むだけでよいため、取り扱いが容易である。   In addition, as the unfired low-temperature sintered metal, metal fine particles that can be fired in the air were used as a paste or a sheet obtained by drying the paste, and this was sandwiched between the radio wave absorber and the cover body. When the unsintered low-temperature sintered metal is made into a paste, it may be applied to the required thickness and adjustment is easy. On the other hand, in the case of a sheet, it is easy to handle because it only needs to be sandwiched.

また、前記実施の形態では、カバー本体1の高周波回路チップ6aに対向する領域にのみ電波吸収体2を形成したが、回路チップ6b上にも到達するように、カバー本体1のほぼ全面にわたって電波吸収体2が形成されるようにしてもよい。   In the above embodiment, the radio wave absorber 2 is formed only in the region of the cover body 1 facing the high frequency circuit chip 6a. However, the radio wave is almost entirely covered by the cover body 1 so as to reach the circuit chip 6b. The absorber 2 may be formed.

以上のように、本実施の形態によれは、高周波性能に優れ、長寿命の高周波回路ケース用カバーおよびこれを用いた、信頼性の高い高周波回路モジュールを提供することが可能となる。   As described above, according to the present embodiment, it is possible to provide a high-frequency circuit case cover having excellent high-frequency performance and having a long life and a high-reliability high-frequency circuit module using the same.

なお、前記実施の形態では、高周波回路チップを搭載する基板として、多層誘電体基板を構成するセラミック基板を用いたが、単層誘電体基板でもよいことはいうまでもなく、金属またはセラミック基板を用いることができる。また、カバー本体1についても、金属またはセラミックで構成することができる。   In the above embodiment, the ceramic substrate constituting the multilayer dielectric substrate is used as the substrate on which the high-frequency circuit chip is mounted. Needless to say, a single-layer dielectric substrate may be used, but a metal or ceramic substrate is used. Can be used. The cover body 1 can also be made of metal or ceramic.

以上のように、本発明にかかる電波吸収体付き高周波回路用カバーは、腐食ガスや水分発生が無い構成の電波吸収体が形成できるため、特に気密封止する構成の高周波回路デバイスに有効性が高い。また焼結体であるため高湿下環境においても材質の変質は生じ難く、幅広い設置環境で安定した高周波電波吸収性能を発揮することが出来る。また電波吸収体は400℃未満であれば焼結体構成が保たれ、低温焼結金属は400℃程度で再溶融することは無く、軟磁性体は600℃未満であれば電波吸収性能が損なわれることは無いため、400℃未満の高温環境化での電波吸収体として利用できる。   As described above, the radio frequency circuit cover with a radio wave absorber according to the present invention can be formed into a radio wave absorber having a structure free from corrosive gas and moisture generation. high. In addition, since it is a sintered body, the material is hardly deteriorated even in a high humidity environment, and stable high frequency radio wave absorption performance can be exhibited in a wide range of installation environments. If the wave absorber is less than 400 ° C, the structure of the sintered body is maintained, the low-temperature sintered metal does not remelt at about 400 ° C, and if the soft magnetic material is less than 600 ° C, the wave absorption performance is impaired. Therefore, it can be used as a radio wave absorber in a high temperature environment of less than 400 ° C.

C 電波吸収体付き高周波回路ケース用カバー
1 カバー本体
2 電波吸収体
2F 電波吸収体粉末
2P 成形ペレット
3 低温焼結金属
3P 未焼成低温焼結金属
4 セラミック基板
6a 高周波回路チップ
6b 回路チップ
10 ケース本体
100 成形型
200 プレス装置
C Cover for radio frequency circuit case with radio wave absorber 1 Cover body 2 Radio wave absorber 2F Radio wave absorber powder 2P Molded pellet 3 Low temperature sintered metal 3P Unsintered low temperature sintered metal 4 Ceramic substrate 6a High frequency circuit chip 6b Circuit chip 10 Case body 100 Mold 200 Pressing device

Claims (6)

Fe−Si−B系の軟磁性体球状粉末と、SiOを含まず、かつ400以上600℃未満の軟化点を有するBi系ガラス粉末とが、重量割合8:2〜9:1で混合された混合物の焼結体から成る電波吸収体と、
金属製またはセラミック製のカバー本体と、
前記電波吸収体と前記カバー本体との間で、これらとともに焼結温度400℃未満で加圧焼結接合された低温焼結金属とを備えたことを特徴とする電波吸収体付き高周波回路ケース用カバー。
Fe-Si-B-based soft magnetic spherical powder and Bi-based glass powder not containing SiO 2 and having a softening point of 400 to 600 ° C. are mixed at a weight ratio of 8: 2 to 9: 1. An electromagnetic wave absorber made of a sintered body of a mixture,
A metal or ceramic cover body;
A high-frequency circuit case with a radio wave absorber comprising a low-temperature sintered metal pressure-sintered and bonded at a sintering temperature of less than 400 ° C. between the radio wave absorber and the cover body. cover.
前記電波吸収体は、前記軟磁性体球状粉末と前記ガラス粉末にバインダ成分を加えて加圧成形し、600℃未満の温度で焼結して得られた焼結体であることを特徴とする請求項1に記載の電波吸収体付き高周波回路ケース用カバー。   The radio wave absorber is a sintered body obtained by adding a binder component to the soft magnetic spherical powder and the glass powder, press molding, and sintering at a temperature of less than 600 ° C. The cover for a high-frequency circuit case with a radio wave absorber according to claim 1. 金属製またはセラミック製のカバー本体を用意する工程と、
Fe−Si−B系の軟磁性体球状粉末と、SiOを含まず、かつ400以上600℃未満の軟化点を有するBi系ガラス粉末とが重量割合8:2〜9:1で混合された混合物を焼結して、電波吸収体を形成する工程と、
焼結温度400℃未満の低温焼結可能な未焼成低温焼結材料を調整する工程と、
前記電波吸収体と前記カバー本体との間に、前記未焼成低温焼結材料を挟み、これらとともに焼結温度400℃未満で加圧焼結接合する工程とを含む電波吸収体付き高周波回路ケース用カバーの製造方法。
Preparing a cover body made of metal or ceramic;
Fe-Si-B-based soft magnetic spherical powder and Bi-based glass powder not containing SiO 2 and having a softening point of 400 to less than 600 ° C. were mixed at a weight ratio of 8: 2 to 9: 1. Sintering the mixture to form a radio wave absorber;
A step of adjusting a low-temperature-sinterable green low-temperature sintered material having a sintering temperature of less than 400 ° C .;
For a high-frequency circuit case with a radio wave absorber, including a step of sandwiching the unsintered low-temperature sintered material between the radio wave absorber and the cover main body and pressurizing and sintering together with the non-fired low-temperature sintered material Manufacturing method of the cover.
前記電波吸収体を形成する工程は、前記軟磁性体球状粉末と前記ガラス粉末にバインダ成分を加えて加圧成形し、600℃未満の温度で焼結する工程を含むことを特徴とする請求項3に記載の電波吸収体付き高周波回路ケース用カバーの製造方法。   The step of forming the radio wave absorber includes a step of adding a binder component to the soft magnetic spherical powder and the glass powder, press molding, and sintering at a temperature of less than 600 ° C. 4. A method for manufacturing a cover for a high-frequency circuit case with a radio wave absorber according to 3. 前記低温焼結材料を調整する工程は、直径数ナノメートルから数マイクロメートルの大気焼成可能な金属微粒子をペースト状、またはペーストを乾燥させたシート状とする工程を含むことを特徴とする請求項3または4に記載の電波吸収体付き高周波回路ケース用カバーの製造方法。   The step of adjusting the low-temperature sintering material includes a step of forming metal fine particles having a diameter of several nanometers to several micrometers that can be fired in the form of a paste or a sheet obtained by drying the paste. A method for producing a cover for a high-frequency circuit case with a radio wave absorber according to 3 or 4. ケース本体と、
誘電体基板上に搭載され、前記ケース本体内に収納された高周波回路チップと、
電波吸収体付き高周波回路ケース用カバーと、を備えた高周波回路モジュールであって、
前記電波吸収体付き高周波回路ケース用カバーが、
Fe−Si−B系の軟磁性体球状粉末と、SiOを含まず、かつ400以上600℃未満の軟化点を有するBi系ガラス粉末とが重量割合8:2〜9:1で混合された混合物の焼結体から成る電波吸収体と、
金属製またはセラミック製のカバー本体と、
前記電波吸収体と前記カバー本体との間で、これらとともに焼結温度400℃未満で加圧焼結接合された低温焼結金属とを備えたことを特徴とする高周波回路モジュール。
The case body,
A high frequency circuit chip mounted on a dielectric substrate and housed in the case body;
A high frequency circuit module including a radio frequency circuit case cover with a radio wave absorber,
The cover for the high-frequency circuit case with the radio wave absorber is,
Fe-Si-B-based soft magnetic spherical powder and Bi-based glass powder not containing SiO 2 and having a softening point of 400 to less than 600 ° C. were mixed at a weight ratio of 8: 2 to 9: 1. An electromagnetic wave absorber made of a sintered body of a mixture;
A metal or ceramic cover body;
A high-frequency circuit module comprising: a low-temperature sintered metal pressure-sintered and bonded at a sintering temperature of less than 400 ° C. between the radio wave absorber and the cover body.
JP2012029779A 2012-02-14 2012-02-14 High frequency circuit case cover, method for manufacturing the same, and high frequency circuit module using the same Expired - Fee Related JP5693486B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012029779A JP5693486B2 (en) 2012-02-14 2012-02-14 High frequency circuit case cover, method for manufacturing the same, and high frequency circuit module using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012029779A JP5693486B2 (en) 2012-02-14 2012-02-14 High frequency circuit case cover, method for manufacturing the same, and high frequency circuit module using the same

Publications (2)

Publication Number Publication Date
JP2013168439A JP2013168439A (en) 2013-08-29
JP5693486B2 true JP5693486B2 (en) 2015-04-01

Family

ID=49178652

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012029779A Expired - Fee Related JP5693486B2 (en) 2012-02-14 2012-02-14 High frequency circuit case cover, method for manufacturing the same, and high frequency circuit module using the same

Country Status (1)

Country Link
JP (1) JP5693486B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6366496B2 (en) * 2014-12-22 2018-08-01 三菱電機株式会社 Radio wave absorber and method of manufacturing radio wave absorber
JP2017118015A (en) * 2015-12-25 2017-06-29 株式会社トーキン Electronic device and method of arranging electromagnetic interference suppressor

Also Published As

Publication number Publication date
JP2013168439A (en) 2013-08-29

Similar Documents

Publication Publication Date Title
US6919387B2 (en) Electromagnetic wave absorber, method of manufacturing the same and appliance using the same
JP6337909B2 (en) Manufacturing method of electronic component module
JP5065603B2 (en) Coil-embedded substrate and electronic device
CN104754876B (en) Electric wiring layer, the manufacturing method of electric wiring substrate and formation component
KR101607027B1 (en) Chip electronic component and board having the same mounted thereon
JP6522297B2 (en) Coil parts
US20140306329A1 (en) Semiconductor package
CN111599771A (en) Semiconductor device package and method of manufacturing the same
WO2019018613A1 (en) Dry method of metallizing polymer thick film surfaces
WO2020213273A1 (en) Current detection resistor
CN109964406A (en) Surface acoustic wave element package and method of making the same
JP5693486B2 (en) High frequency circuit case cover, method for manufacturing the same, and high frequency circuit module using the same
JP4703459B2 (en) Coil built-in board
KR102212258B1 (en) EMI protection composition, method of fabricating the same and electronic device including EMI protection layer
JP2010047676A (en) Sheet-like molded body
JP2002016167A (en) Semiconductor device housing package component and semiconductor device housing package using the same
JP6366496B2 (en) Radio wave absorber and method of manufacturing radio wave absorber
CN101325126A (en) Composite material chip-type inductive element and preparation method thereof
JP4428962B2 (en) Electromagnetic wave absorber and high frequency circuit package using the same
JP2012195455A (en) Cover for high frequency circuit and manufacturing method therefor
JP4105998B2 (en) High frequency circuit package lid, manufacturing method thereof, and high frequency circuit package using the same
JP2012064616A (en) Storage package for high heat radiation type electronic component
JP4028765B2 (en) Electromagnetic wave absorber and high frequency circuit package using the same
JP2013034006A (en) Substrate with built-in coil and electronic device
US7145217B2 (en) Chip-type noise filter, manufacturing method thereof, and semiconductor package

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20140402

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20141128

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20150106

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20150203

R150 Certificate of patent or registration of utility model

Ref document number: 5693486

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

LAPS Cancellation because of no payment of annual fees