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JP5829031B2 - Faint light observation microscope and faint light acquisition method - Google Patents
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JP5829031B2 - Faint light observation microscope and faint light acquisition method - Google Patents

Faint light observation microscope and faint light acquisition method Download PDF

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JP5829031B2
JP5829031B2 JP2011067688A JP2011067688A JP5829031B2 JP 5829031 B2 JP5829031 B2 JP 5829031B2 JP 2011067688 A JP2011067688 A JP 2011067688A JP 2011067688 A JP2011067688 A JP 2011067688A JP 5829031 B2 JP5829031 B2 JP 5829031B2
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weak light
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wavelength
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平田 唯史
唯史 平田
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Olympus Corp
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Description

本発明は、観察対象から発せられる微弱光を取得して観察する微弱光観察顕微鏡及び微弱光取得方法に関するものである。   The present invention relates to a weak light observation microscope and a weak light acquisition method for acquiring and observing weak light emitted from an observation target.

従来、微弱光の観察として、例えば、発光顕微鏡を用いた細胞や組織の微細構造レベルの変化の長時間観察が行われている。
発光顕微鏡は、例えば、図5に示すように、対物レンズ51aと結像レンズ51bと撮像素子51cからなる撮像光学系51を有する。図5中、60は観察対象としての細胞・組織などのサンプル、60aは観察対象60における発光部、61は図示しないステージ上に載置された、観察対象60を収容するシャーレ、スライドガラス、マイクロプレート等の容器、60a’は撮像素子51で撮像される発光部60a’の像である。そして、発光顕微鏡を用いた観察では、発試薬等との化学反応によって観察対象から発せられる所定波長の微弱光を所定時間(例えば、15分等)露光し、これを数十回繰り返すことで、組織や細胞の変化を捉える。
従来、この種の発光顕微鏡としては、例えば、次の特許文献1,2に記載のものが提案されている。
Conventionally, as observation of weak light, for example, observation of a change in the fine structure level of a cell or tissue for a long time using a light emission microscope is performed.
For example, as shown in FIG. 5, the light emission microscope includes an imaging optical system 51 including an objective lens 51a, an imaging lens 51b, and an imaging element 51c. In FIG. 5, reference numeral 60 denotes a sample such as a cell / tissue as an observation target, 60 a denotes a light emitting portion of the observation target 60, 61 denotes a petri dish that houses the observation target 60, a slide glass, and a micro A container 60 a ′ such as a plate is an image of the light emitting unit 60 a ′ picked up by the image pickup device 51. Then, in the observation using the light emission microscope, the weak light of a predetermined wavelength emitted from the observation target by chemical reaction with light emission reagent such as a predetermined time (e.g., 15 minutes, etc.) it is exposed, by repeating this dozens of times Capture changes in tissues and cells.
Conventionally, as this type of light emission microscope, for example, those described in the following Patent Documents 1 and 2 have been proposed.

特開2007−108154号公報JP 2007-108154 A WO07/074923号公報WO07 / 074923 Publication

一般に、発光顕微鏡を用いて観察対象からの発光像を画像化する場合においては、微弱な発光の強度を補うために、撮像素子の露光時間を長くして受光される光量を増加させるといった手法が用いられる。また、微弱な発光像を極力明るく取得するために、対物レンズ及び結像レンズには、高NAのものが用いられる。   In general, when a light emission image from an observation target is imaged using a light emission microscope, there is a method of increasing the amount of light received by increasing the exposure time of the image sensor in order to compensate for weak light emission intensity. Used. Further, in order to obtain a weak light emission image as brightly as possible, a high NA lens is used for the objective lens and the imaging lens.

ここで、対物レンズのNAが大きいほど、明るい発光像が得られる。
しかし、低倍率の対物レンズで広い範囲を観察する場合、NAを高くすることは困難である。また、高倍率の対物レンズを用いてもNAには限界がある。
このため、従来の発光顕微鏡では、上記のように撮像素子の露光時間を長くすることで、明るさ不足を補わざるを得ない。しかし、撮像素子の露光時間が長いと、観察対象の速い変化を撮影することが難しい。
Here, the larger the NA of the objective lens, the brighter the emission image.
However, when observing a wide range with a low-magnification objective lens, it is difficult to increase the NA. Further, there is a limit to the NA even when a high-magnification objective lens is used.
For this reason, in the conventional light-emitting microscope, it is necessary to compensate for the lack of brightness by increasing the exposure time of the image sensor as described above. However, when the exposure time of the image sensor is long, it is difficult to capture a fast change of the observation target.

ところで、特許文献2には、観察対象に対して、発光画像を撮像するユニットと蛍光画像を撮像するユニットとが対向配置された構成が開示されている。
ここで、本件出願人は、特許文献2に開示の上記構成を応用し、観察対象に対して、2つの発光画像を撮像するユニットを対向配置し、2つのユニットで取得した発光画像を合成することで発光強度を補うことを着想した。
By the way, Patent Document 2 discloses a configuration in which a unit that captures a light emission image and a unit that captures a fluorescence image are arranged to face each other with respect to an observation target.
Here, the present applicant applies the above-described configuration disclosed in Patent Document 2, and arranges a unit that captures two luminescent images to face an observation target, and synthesizes the luminescent images acquired by the two units. The idea was to compensate for the emission intensity.

しかし、2つの発光画像を撮像するユニットを対向配置しても、夫々のユニットで撮像される発光強度が弱く、夫々のユニットにおける撮像素子の露光時間を短くすることができないため、観察対象の速い変化を撮影することが難しいという問題を解消できない。   However, even if the units for capturing two luminescent images are arranged opposite to each other, the luminescence intensity captured by each unit is weak, and the exposure time of the image sensor in each unit cannot be shortened. The problem that it is difficult to photograph changes cannot be solved.

本発明は、このような従来の問題点に鑑みてなされたものであり、撮像素子の露光時間を短縮でき、低倍率のレンズの使用や、観察対象の速い変化の撮影が可能な微弱光観察顕微鏡及び微弱光取得方法を提供することを目的としている。   The present invention has been made in view of such conventional problems, and is capable of shortening the exposure time of the imaging device, using a low-magnification lens, and capable of photographing a fast change of an observation object. It aims at providing the microscope and the weak light acquisition method.

上記目的を達成するため、本発明による微弱光観察顕微鏡及び微弱光取得方法は、対物レンズと結像レンズと撮像素子とからなる結像光学系を有し、前記結像光学系を介して観察対象から発せられる所定の微弱光を取得する微弱光観察顕微鏡であって、第2の対物レンズと、第2の結像レンズと、前記観察対象と共役な位置に配置されていて前記所定の微弱光の波長を反射させ前記所定の微弱光の波長以外の波長を透過するミラーと、を有する光戻し用光学系を、前記観察対象に対して前記結像光学系の反対側に有するとともに、前記ミラーに対して前記第2の結像レンズとは反対側に備えられていて、前記所定の微弱光の波長とは異なる波長からなる照明光を前記ミラーに向けて出射する照明光学系を有することを特徴としている。
In order to achieve the above object, a weak light observation microscope and a weak light acquisition method according to the present invention have an imaging optical system including an objective lens, an imaging lens, and an imaging device, and are observed through the imaging optical system. A weak light observation microscope that acquires predetermined weak light emitted from an object, the second objective lens, a second imaging lens, and the predetermined weak light disposed at a position conjugate with the observation object A light return optical system having a mirror that reflects the wavelength of light and transmits a wavelength other than the wavelength of the predetermined weak light, on the opposite side of the imaging optical system with respect to the observation target, and An illumination optical system that is provided on the opposite side of the mirror from the second imaging lens and emits illumination light having a wavelength different from the wavelength of the predetermined weak light toward the mirror. It is characterized by.

また、本発明の微弱光観察顕微鏡においては、さらに、前記結像光学系が、前記照明光の波長を遮光し、前記所定の微弱光の波長を透過させる波長選択素子を挿脱可能に備えるのが好ましい。   Further, in the feeble light observation microscope of the present invention, the imaging optical system further includes a wavelength selection element that blocks the wavelength of the illumination light and transmits the wavelength of the predetermined feeble light. Is preferred.

また、本発明の微弱光観察顕微鏡においては、収差補正手段を前記第2の対物レンズの瞳位置に備えるのが好ましい。   In the weak light observation microscope of the present invention, it is preferable that an aberration correction unit is provided at the pupil position of the second objective lens.

また、本発明の微弱光観察顕微鏡においては、前記収差補正手段が、補正環であるのが好ましい。   In the feeble light observation microscope of the present invention, it is preferable that the aberration correction unit is a correction ring.

また、本発明の微弱光観察顕微鏡においては、前記収差補正手段が、位相変調器であるのが好ましい。   In the feeble light observation microscope of the present invention, it is preferable that the aberration correction unit is a phase modulator.

また、本発明の微弱光観察顕微鏡においては、前記所定の微弱光が、化学反応により前記観察対象から発せられる発光であるのが好ましい。   In the weak light observation microscope of the present invention, it is preferable that the predetermined weak light is light emitted from the observation object by a chemical reaction.

また、本発明の微弱光観察顕微鏡においては、前記所定の微弱光が、励起波長の照射により前記観察対象から発せられる蛍光であり、前記照明光が、前記観察対象を励起する励起波長からなるのが好ましい。   In the feeble light observation microscope of the present invention, the predetermined feeble light is fluorescence emitted from the observation object by irradiation with an excitation wavelength, and the illumination light has an excitation wavelength that excites the observation object. Is preferred.

本発明によれば、撮像素子の露光時間を短縮でき、低倍率のレンズの使用や、観察対象の速い変化の撮影が可能な微弱光観察顕微鏡及び微弱光取得方法が得られる。   ADVANTAGE OF THE INVENTION According to this invention, the exposure time of an image pick-up element can be shortened, the use of a low magnification lens, and the weak light observation microscope and weak light acquisition method which can image | photograph the rapid change of an observation object are obtained.

本発明の第1実施形態にかかる微弱光観察顕微鏡の要部構成を示す説明図である。It is explanatory drawing which shows the principal part structure of the weak light observation microscope concerning 1st Embodiment of this invention. 本発明の第2実施形態にかかる微弱光観察顕微鏡の要部構成を示す説明図である。It is explanatory drawing which shows the principal part structure of the weak light observation microscope concerning 2nd Embodiment of this invention. 本発明の第3実施形態にかかる微弱光観察顕微鏡の要部構成を示す説明図である。It is explanatory drawing which shows the principal part structure of the weak light observation microscope concerning 3rd Embodiment of this invention. 本発明の第4実施形態にかかる微弱光観察顕微鏡の要部構成を示す説明図である。It is explanatory drawing which shows the principal part structure of the weak light observation microscope concerning 4th Embodiment of this invention. 従来の発光顕微鏡の一構成例を示す説明図である。It is explanatory drawing which shows the example of 1 structure of the conventional light emission microscope.

以下、本発明の実施形態について、図面を用いて説明する。なお、本発明の実施形態のうち、第1〜3実施形態は本発明の参考例である。
第1実施形態
図1は本発明の第1実施形態にかかる微弱光観察顕微鏡の要部構成を示す説明図である。
本実施形態の微弱光観察顕微鏡は、結像光学系1と、光戻し用光学系2を有する。
結像光学系1は、対物レンズ1aと、結像レンズ1bと、撮像素子1cとで構成されている。
光戻し用光学系2は、第2の対物レンズ2aと、第2の結像レンズ2bと、平面ミラー2cとで構成され、観察対象10に対して結像光学系1の反対側に設けられている。
ミラー2cは、観察対象10と共役な位置に配置されている。
観察対象10には、発光試薬等との化学反応によって所定の微弱光を発光する発光部10aを含んだ細胞・組織等であって、所定の微弱光の波長に対する光透過性のあるサンプルを用いている。なお、観察対象10は、シャーレ、スライドガラス、マイクロプレート等の容器11に収容されている。容器11は、図示しないステージ上に載置されている。
また、対物レンズ1a、第2の対物レンズ2aは、夫々ステージ12との相対的距離を変動させることによって、観察対象10に対してピントを調整することができるようになっている。
Hereinafter, embodiments of the present invention will be described with reference to the drawings. Of the embodiments of the present invention, the first to third embodiments are reference examples of the present invention.
First Embodiment FIG. 1 is an explanatory view showing the main configuration of a weak light observation microscope according to a first embodiment of the present invention.
The weak light observation microscope of the present embodiment includes an imaging optical system 1 and a light returning optical system 2.
The imaging optical system 1 includes an objective lens 1a, an imaging lens 1b, and an image sensor 1c.
The optical returning optical system 2 includes a second objective lens 2a, a second imaging lens 2b, and a plane mirror 2c, and is provided on the opposite side of the imaging optical system 1 with respect to the observation target 10. ing.
The mirror 2c is disposed at a position conjugate with the observation object 10.
The observation object 10 is a cell / tissue that includes a light emitting portion 10a that emits predetermined weak light by a chemical reaction with a luminescent reagent or the like, and uses a sample that transmits light with respect to the wavelength of the predetermined weak light. ing. The observation object 10 is accommodated in a container 11 such as a petri dish, a slide glass, or a microplate. The container 11 is placed on a stage (not shown).
The objective lens 1a and the second objective lens 2a can adjust the focus with respect to the observation object 10 by changing the relative distance between the objective lens 1a and the second objective lens 2a.

このように構成された第1実施形態の微弱光観察顕微鏡では、観察対象10の発光部10aから結像光学系1側に向けて発せられた所定の微弱光は、対物レンズ1a、結像レンズ1bを経て、撮像素子1cの撮像面に結像する。図1中、10a’は撮像素子1cの撮像面に結像した発光部10の像である。
一方、観察対象10の発光部10aから光戻し用光学系2側に向けて発せられた所定の微弱光は、第2の対物レンズ2a、第2の結像レンズ2bを経て、ミラー2cの面に結像し、ミラー2cで反射され、第2の結像レンズ2b、第2の対物レンズ2aを経て、観察対象10に戻される。図1中、10a”はミラー2cの面に結像した発光部10aの像である。観察対象10に戻された所定の微弱光は、さらに、観察対象10を結像光学系1側に向けて透過し、対物レンズ1a、結像レンズ1bを経て、撮像素子1cの撮像面に結像する。
これにより、撮像素子1cには、従来の微弱光観察顕微鏡と比べて約2倍の光量の所定の微弱光が入射することになり、撮像素子1cの露光時間を約半分に短縮できる。
その結果、NAを大きくできない低倍率の対物レンズを用いても、発光像を撮像することが可能となり、また、観察対象(における発光部)の速い変化を撮影することができるようになる。
In the weak light observation microscope of the first embodiment configured as described above, the predetermined weak light emitted from the light emitting unit 10a of the observation target 10 toward the imaging optical system 1 side is the objective lens 1a and the imaging lens. Through 1b, an image is formed on the imaging surface of the imaging device 1c. In FIG. 1, 10a ′ is an image of the light emitting unit 10 formed on the imaging surface of the imaging device 1c.
On the other hand, predetermined weak light emitted from the light emitting unit 10a of the observation target 10 toward the light return optical system 2 side passes through the second objective lens 2a and the second imaging lens 2b, and then the surface of the mirror 2c. , Reflected by the mirror 2c, and returned to the observation object 10 through the second imaging lens 2b and the second objective lens 2a. In FIG. 1, 10a ″ is an image of the light emitting portion 10a formed on the surface of the mirror 2c. The predetermined weak light returned to the observation target 10 further directs the observation target 10 toward the imaging optical system 1 side. And passes through the objective lens 1a and the imaging lens 1b to form an image on the imaging surface of the imaging device 1c.
As a result, predetermined weak light having an amount of light twice as large as that of the conventional weak light observation microscope is incident on the image pickup device 1c, and the exposure time of the image pickup device 1c can be reduced to about half.
As a result, it is possible to capture a light emission image even using a low-magnification objective lens that cannot increase the NA, and it is possible to capture a fast change in the observation target (light emitting portion).

第2実施形態
図2は本発明の第2実施形態にかかる微弱光観察顕微鏡の要部構成を示す説明図である。なお、第1実施形態の微弱光観察顕微鏡と同じ構成部材については、同じ符号を付し、詳細な説明を省略する。
本実施形態の微弱光観察顕微鏡は、光戻し用光学系2において観察対象10と共役な位置に配置されるミラーが、可変形状ミラー2c’で構成されている。その他の構成は、第1実施形態の微弱光観察顕微鏡と略同じである。
Second Embodiment FIG. 2 is an explanatory view showing the main configuration of a weak light observation microscope according to a second embodiment of the present invention. In addition, about the same structural member as the weak light observation microscope of 1st Embodiment, the same code | symbol is attached | subjected and detailed description is abbreviate | omitted.
In the weak light observation microscope of the present embodiment, the mirror disposed at a position conjugate with the observation object 10 in the light return optical system 2 is constituted by a deformable mirror 2c ′. Other configurations are substantially the same as the weak light observation microscope of the first embodiment.

光戻し用光学系2における観察対象10と共役な位置に配置されるミラーとして平面ミラー2cを用いた構成においては、観察対象10の厚みが一定でない場合、観察対象10の一部の発光部10aから結像光学系1側に向けて発せられた所定の微弱光は、平面ミラー2cを前後する位置に結像する。そして、平面ミラー2cで反射された光が、観察対象10における発光部10aの発光点に戻らず、発光点を前後する位置に結像してしまう。その光が、結像光学系側に向けて透過し、対物レンズ1a、結像レンズ1bを経て、撮像素子1cの撮像面に結像しない状態で入射する。その結果、撮像素子1で撮像した像がボケてしまう。
しかるに、第2実施形態の微弱光観察顕微鏡によれば、可変形状ミラー2c’の反射面を観察対象10の厚み又は光路長に合せて変形させることで、可変形状ミラー2c’で反射された所定の微弱光を、観察対象10の発光点の位置に正確に戻すことができる。このため、観察対象10の厚みが一定でない場合であっても、像のボケを防止することができる。
その他の作用効果は、第1実施形態の微弱光観察顕微鏡と略同じである。
In the configuration in which the planar mirror 2c is used as a mirror disposed at a position conjugate with the observation target 10 in the optical return optical system 2, when the thickness of the observation target 10 is not constant, a part of the light emitting units 10a of the observation target 10 is used. The predetermined weak light emitted toward the imaging optical system 1 side forms an image at a position before and after the plane mirror 2c. Then, the light reflected by the flat mirror 2c does not return to the light emitting point of the light emitting unit 10a in the observation target 10, but forms an image at a position before and after the light emitting point. The light is transmitted toward the imaging optical system side and enters the imaging surface of the imaging element 1c without passing through the objective lens 1a and the imaging lens 1b. As a result, an image captured by the image sensor 1 is blurred.
However, according to the feeble light observation microscope of the second embodiment, the reflecting surface of the deformable mirror 2c ′ is deformed in accordance with the thickness or the optical path length of the observation object 10, so that the predetermined light reflected by the deformable mirror 2c ′ is obtained. Can be accurately returned to the position of the light emitting point of the observation object 10. For this reason, even when the thickness of the observation object 10 is not constant, it is possible to prevent the image from being blurred.
Other functions and effects are substantially the same as those of the weak light observation microscope of the first embodiment.

第3実施形態
図3は本発明の第3実施形態にかかる微弱光観察顕微鏡の要部構成を示す説明図である。なお、第2実施形態の微弱光観察顕微鏡と同じ構成部材については、同じ符号を付し、詳細な説明を省略する。
本実施形態の微弱光観察顕微鏡は、第2実施形態の構成に加えて、さらに、光路分割部材3と、照明光学系4を有している。
光路分割部材3は、所定の微弱光の波長を透過し、所定の微弱光の波長以外の波長を反射する光学特性を持つダイクロイックミラーで構成され、第2の対物レンズ2aと第2の結像レンズ2bとの間に配置されている。
照明光学系4は、所定の微弱光の波長とは異なる波長からなる照明光を光路分割部材3に向けて出射するように構成され、光戻し用光学系2の側方に設けられている。
図3の例では、照明光学系4は、光源4aと、光源からの光を平行光束に変換するコリメートレンズ4bと、バンドパスフィルタ4cを備えている。光源4aは、通常の白色光を出射する。バンドパスフィルタ4cは、所定の微弱光波長を遮光し、所定の微弱光波長以外の波長を透過する光学特性を持っている。また、バンドパスフィルタ4cは、照明光学系4の光路中に挿脱可能に設けられている。
Third Embodiment FIG. 3 is an explanatory view showing the main configuration of a weak light observation microscope according to a third embodiment of the present invention. In addition, about the same structural member as the weak light observation microscope of 2nd Embodiment, the same code | symbol is attached | subjected and detailed description is abbreviate | omitted.
The weak light observation microscope of the present embodiment further includes an optical path dividing member 3 and an illumination optical system 4 in addition to the configuration of the second embodiment.
The optical path dividing member 3 is composed of a dichroic mirror having optical characteristics that transmits a predetermined weak light wavelength and reflects a wavelength other than the predetermined weak light wavelength, and the second objective lens 2a and the second imaging lens. It arrange | positions between the lenses 2b.
The illumination optical system 4 is configured to emit illumination light having a wavelength different from a predetermined weak light wavelength toward the optical path dividing member 3, and is provided on the side of the light return optical system 2.
In the example of FIG. 3, the illumination optical system 4 includes a light source 4a, a collimator lens 4b that converts light from the light source into a parallel light beam, and a bandpass filter 4c. The light source 4a emits normal white light. The bandpass filter 4c has an optical characteristic of shielding a predetermined weak light wavelength and transmitting a wavelength other than the predetermined weak light wavelength. The band pass filter 4c is provided in the optical path of the illumination optical system 4 so that it can be inserted and removed.

また、結像光学系1は、さらに、対物レンズ1aと結像レンズ1bとの間に、照明光カットフィルタ1dを挿脱可能に備えている。照明光カットフィルタ1dは、照明光の波長を遮光し、所定の微弱光の波長を透過する特性を持っている。
その他の構成は、第2実施形態の微弱光観察顕微鏡と略同じである。
The imaging optical system 1 further includes an illumination light cut filter 1d that can be inserted and removed between the objective lens 1a and the imaging lens 1b. The illumination light cut filter 1d has a characteristic of blocking the wavelength of illumination light and transmitting the wavelength of predetermined weak light.
Other configurations are substantially the same as the weak light observation microscope of the second embodiment.

このように構成された第3実施形態の微弱光観察顕微鏡においては、微弱光観察及び通常光による透過照明観察を次の2つの方法で切替えて行うことができる。
第1の方法は、照明光カットフィルタ1dを、対物レンズ1aと結像レンズ1bとの間に挿入し、かつ、照明光学系4の光源4aをONにした状態で、対物レンズ1aと結像レンズ1bとの間において照明光カットフィルタ1dを挿脱する方法である。
微弱光観察を行う場合には、照明光カットフィルタ1dを挿入する。観察対象10から光戻し用光学系2側に向けて発せられた所定の微弱光は、第2の対物レンズ2aを経て、光路分割部材3を透過し、第2の結像レンズ2bを経て、ミラー2cの面に結像し、ミラー2cで反射され、第2の結像レンズ2bを経て、光路分割部材3を透過し、第2の対物レンズ2aを経て、観察対象10に戻る。また、観察対象10を結像光学系1側に向けて透過した所定の微弱光及び、観察対象10から結像光学系1側に向けて発せられた所定の微弱光は、対物レンズ1aを経て、照明光カットフィルタ1dを透過し、結像レンズ1bを経て、撮像素子1cの撮像面に結像する。なお、照明光学系4からの照明光は、光路分割部材3で反射されて、第2の対物レンズ2a、観察対象10に入射する。観察対象10を透過した光は、対物レンズ1aを経て、照明光カットフィルタ1dに入射するが、照明光カットフィルタ1dで遮光される。
一方、通常光による透過照明観察を行う場合には、照明光カットフィルタ1dを抜き出す。照明光学系4からの照明光は、光路分割部材3で反射され、対物レンズ2aを経て、観察対象10に入射する。観察対象10を透過した光は、対物レンズ1a、結像レンズ1bを経て、撮像素子1cの撮像面に結像する。
In the feeble light observation microscope of the third embodiment configured as described above, the feeble light observation and the transmitted illumination observation with normal light can be switched by the following two methods.
In the first method, the illumination light cut filter 1d is inserted between the objective lens 1a and the imaging lens 1b and the light source 4a of the illumination optical system 4 is turned on to form an image with the objective lens 1a. In this method, the illumination light cut filter 1d is inserted into and removed from the lens 1b.
When faint light observation is performed, an illumination light cut filter 1d is inserted. Predetermined weak light emitted from the observation target 10 toward the light return optical system 2 side passes through the second objective lens 2a, passes through the optical path dividing member 3, passes through the second imaging lens 2b, and The image is formed on the surface of the mirror 2c, reflected by the mirror 2c, transmitted through the optical path dividing member 3 through the second imaging lens 2b, and returned to the observation object 10 through the second objective lens 2a. Further, the predetermined weak light transmitted through the observation target 10 toward the imaging optical system 1 side and the predetermined weak light emitted from the observation target 10 toward the imaging optical system 1 side pass through the objective lens 1a. Then, the light passes through the illumination light cut filter 1d, passes through the imaging lens 1b, and forms an image on the imaging surface of the imaging device 1c. The illumination light from the illumination optical system 4 is reflected by the optical path dividing member 3 and enters the second objective lens 2a and the observation object 10. The light transmitted through the observation object 10 enters the illumination light cut filter 1d through the objective lens 1a, but is blocked by the illumination light cut filter 1d.
On the other hand, when performing transmitted illumination observation with normal light, the illumination light cut filter 1d is extracted. The illumination light from the illumination optical system 4 is reflected by the optical path dividing member 3 and enters the observation object 10 through the objective lens 2a. The light transmitted through the observation object 10 forms an image on the imaging surface of the imaging element 1c through the objective lens 1a and the imaging lens 1b.

第2の方法は、照明光カットフィルタ1dを、対物レンズ1aと結像レンズ1bとの間から抜き出した状態で、照明光学系4の光源4aのON/OFFを切り替える方法である。
微弱光観察を行う場合には、照明光学系4の光源4aをOFFにする。観察対象10から光戻し用光学系2側に向けて発せられた所定の微弱光は、第2の対物レンズ2aを経て、光路分割部材3を透過し、第2の結像レンズ2bを経て、ミラー2cの面に結像し、ミラー2cで反射され、第2の結像レンズ2bを経て、光路分割部材3を透過し、第2の対物レンズ2aを経て、観察対象10に戻る。また、観察対象10を結像光学系1側に向けて透過した所定の微弱光及び、観察対象10から結像光学系1側に向けて発せられた所定の微弱光は、対物レンズ1a、結像レンズ1bを経て、撮像素子1cの撮像面に結像する。
一方、通常光による透過照明観察を行う場合には、照明光学系4の光源4aをONにする。照明光学系4からの照明光は、第1の方法と同様の経路を辿り、撮像素子1cの撮像面に結像する。
The second method is a method of switching ON / OFF of the light source 4a of the illumination optical system 4 in a state where the illumination light cut filter 1d is extracted from between the objective lens 1a and the imaging lens 1b.
When performing faint light observation, the light source 4a of the illumination optical system 4 is turned off. Predetermined weak light emitted from the observation target 10 toward the light return optical system 2 side passes through the second objective lens 2a, passes through the optical path dividing member 3, passes through the second imaging lens 2b, and The image is formed on the surface of the mirror 2c, reflected by the mirror 2c, transmitted through the optical path dividing member 3 through the second imaging lens 2b, and returned to the observation object 10 through the second objective lens 2a. The predetermined weak light transmitted through the observation target 10 toward the imaging optical system 1 side and the predetermined weak light emitted from the observation target 10 toward the imaging optical system 1 side are connected to the objective lens 1a. An image is formed on the imaging surface of the imaging element 1c through the image lens 1b.
On the other hand, when performing transmission illumination observation with normal light, the light source 4a of the illumination optical system 4 is turned on. The illumination light from the illumination optical system 4 follows the same path as in the first method, and forms an image on the imaging surface of the imaging element 1c.

第3実施形態の微弱光観察顕微鏡によれば、微弱光観察と透過照明観察とを切替えることができる上、第1及び第2実施形態の微弱光観察顕微鏡と同様の効果が得られる。即ち、従来の微弱光観察顕微鏡と比べて約2倍の光量の所定の微弱光が入射することになり、撮像素子1cの露光時間を約半分に短縮でき、NAを大きくできない低倍率の対物レンズを用いても、発光像を撮像することが可能となり、また、観察対象(における発光部)の速い変化を撮影することができるようになり、しかも、可変形状ミラー2c’の反射面を観察対象10の厚み又は光路長に合せて変形させることで、可変形状ミラー2c’で反射された所定の微弱光を、観察対象10の発光点の位置に正確に戻すことができ、観察対象10の厚みが一定でない場合であっても、像のボケを防止することができる。   According to the weak light observation microscope of the third embodiment, the weak light observation and the transmitted illumination observation can be switched, and the same effect as the weak light observation microscope of the first and second embodiments can be obtained. That is, a predetermined weak light having a light quantity about twice that of a conventional weak light observation microscope is incident, and the exposure time of the image sensor 1c can be shortened to about half, and the low magnification objective lens that cannot increase the NA. It is possible to pick up a luminescent image even when using, and it is possible to take a quick change of the observation target (light emitting portion), and the reflection surface of the deformable mirror 2c ′ is to be observed. The predetermined weak light reflected by the deformable mirror 2c ′ can be accurately returned to the position of the light emitting point of the observation object 10 by being deformed according to the thickness of 10 or the optical path length. Even if is not constant, it is possible to prevent image blurring.

なお、図3の例では、所定の微弱波長は、発光試薬等との化学反応によって観察対象から発せられる発光波長として説明したが、所定の微弱波長は、励起波長の照射により観察対象から発せられる蛍光波長であってもよい。
その場合には、バンドパスフィルタ4cは、所定の蛍光波長を遮光し、所定の励起光波長を透過する光学特性を持つものを用いればよい。
また、第3実施形態においては、光戻し用光学系2において観察対象10と共役な位置に配置されるミラーを、可変形状ミラー2c’で構成したが、平面ミラー2cで構成してもよい。
In the example of FIG. 3, the predetermined weak wavelength is described as the emission wavelength emitted from the observation target by a chemical reaction with the luminescent reagent or the like, but the predetermined weak wavelength is emitted from the observation target by irradiation with the excitation wavelength. It may be a fluorescence wavelength.
In that case, a band pass filter 4c may be used that has an optical characteristic of shielding a predetermined fluorescence wavelength and transmitting a predetermined excitation light wavelength.
In the third embodiment, the mirror disposed at a position conjugate with the observation target 10 in the light return optical system 2 is configured by the deformable mirror 2c ′, but may be configured by the plane mirror 2c.

第4実施形態
図4は本発明の第4実施形態にかかる微弱光観察顕微鏡の要部構成を示す説明図である。なお、第1実施形態の微弱光観察顕微鏡と同じ構成部材については、同じ符号を付し、詳細な説明を省略する。
本実施形態の微弱光観察顕微鏡は、光戻し用光学系2における観察対象10と共役な位置に配置されるミラーが、所定の微弱光波長を反射し、所定の微弱光波長以外の波長を透過する特性を持つ光路分割部材としての機能を併せ持つ、ダイクロイックミラー2c”で構成されている。
また、本実施形態の微弱光観察顕微鏡は、第1実施形態の構成に加えて、さらに、ダイクロイックミラー2c”に対して第2の結像レンズ2bとは反対側に、照明光学系4’を有している。
図4の例では、照明光学系4’は、光源4a’と、光源4a’からの光をダイクロイックミラー2c”に集光させる集光レンズ4b’を備えている。光源4a’は、所定の微弱光波長とは異なる波長からなる照明光を出射する。なお、照明光学系4’における光源4a’の代わりに、図3の例と同様の通常の白色光を出射する光源4aを用いるとともに、バンドパスフィルタ4cを備えてもよい。
Fourth Embodiment FIG. 4 is an explanatory view showing the main configuration of a weak light observation microscope according to a fourth embodiment of the present invention. In addition, about the same structural member as the weak light observation microscope of 1st Embodiment, the same code | symbol is attached | subjected and detailed description is abbreviate | omitted.
In the feeble light observation microscope according to the present embodiment, a mirror disposed at a position conjugate with the observation target 10 in the light returning optical system 2 reflects a predetermined weak light wavelength and transmits a wavelength other than the predetermined weak light wavelength. It is composed of a dichroic mirror 2c ″ that also has a function as an optical path dividing member having the above characteristics.
In addition to the configuration of the first embodiment, the weak light observation microscope of the present embodiment further includes an illumination optical system 4 ′ on the side opposite to the second imaging lens 2b with respect to the dichroic mirror 2c ″. Have.
In the example of FIG. 4, the illumination optical system 4 ′ includes a light source 4a ′ and a condensing lens 4b ′ for condensing the light from the light source 4a ′ on the dichroic mirror 2c ″. The light source 4a ′ is a predetermined light source 4a ′. Illumination light having a wavelength different from the weak light wavelength is emitted, instead of the light source 4a ′ in the illumination optical system 4 ′, a light source 4a that emits normal white light similar to the example of FIG. A band pass filter 4c may be provided.

また、結像光学系1は、さらに、対物レンズ1aと結像レンズ1bとの間に、照明光カットフィルタ1dを挿脱可能に備えている。照明光カットフィルタ1dは、照明光の波長を遮光し、所定の微弱光の波長を透過する特性を持っている。
その他の構成は、第1実施形態の微弱光観察顕微鏡と略同じである。
The imaging optical system 1 further includes an illumination light cut filter 1d that can be inserted and removed between the objective lens 1a and the imaging lens 1b. The illumination light cut filter 1d has a characteristic of blocking the wavelength of illumination light and transmitting the wavelength of predetermined weak light.
Other configurations are substantially the same as the weak light observation microscope of the first embodiment.

このように構成された第4実施形態の微弱光観察顕微鏡においては、微弱光観察及び通常光による透過照明観察を次の2つの方法で切替えて行うことができる。
第1の方法は、照明光カットフィルタ1dを、対物レンズ1aと結像レンズ1bとの間に挿入し、かつ、照明光学系4’の光源4a’をONにした状態で、対物レンズ1aと結像レンズ1bとの間において照明光カットフィルタ1dを挿脱する方法である。
微弱光観察を行う場合には、照明光カットフィルタ1dを挿入する。観察対象10から光戻し用光学系2側に向けて発せられた所定の微弱光は、第2の対物レンズ2a、第2の結像レンズ2bを経て、ダイクロイックミラー2c”の面に結像し、ダイクロイックミラー2c”で反射され、第2の結像レンズ2b、第2の対物レンズ2aを経て、観察対象10に戻る。また、観察対象10を結像光学系1側に向けて透過した所定の微弱光及び、観察対象10から結像光学系1側に向けて発せられた所定の微弱光は、対物レンズ1aを経て、照明光カットフィルタ1dを透過し、結像レンズ1bを経て、撮像素子1cの撮像面に結像する。なお、照明光学系4’からの照明光は、ダイクロイックミラー2c”を透過し、第2の結像レンズ2b、第2の対物レンズ2a、観察対象10、対物レンズ1aを経て、照明光カットフィルタ1dに入射するが、照明光カットフィルタ1dで遮光される。
一方、通常光による透過照明観察を行う場合には、照明光カットフィルタ1dを抜き出す。照明光学系4’からの光は、ダイクロイックミラー2c”を透過し、第2の結像レンズ2b、第2の対物レンズ2a、観察対象10、対物レンズ1a、結像レンズ1bを経て、撮像素子1cの撮像面に結像する。
In the weak light observation microscope according to the fourth embodiment configured as described above, the weak light observation and the transmitted illumination observation using the normal light can be switched by the following two methods.
In the first method, the illumination light cut filter 1d is inserted between the objective lens 1a and the imaging lens 1b, and the light source 4a ′ of the illumination optical system 4 ′ is turned on. In this method, the illumination light cut filter 1d is inserted into and removed from the imaging lens 1b.
When faint light observation is performed, an illumination light cut filter 1d is inserted. Predetermined weak light emitted from the observation object 10 toward the light return optical system 2 side forms an image on the surface of the dichroic mirror 2c ″ through the second objective lens 2a and the second imaging lens 2b. , Reflected by the dichroic mirror 2c ", returns to the observation object 10 through the second imaging lens 2b and the second objective lens 2a. Further, the predetermined weak light transmitted through the observation target 10 toward the imaging optical system 1 side and the predetermined weak light emitted from the observation target 10 toward the imaging optical system 1 side pass through the objective lens 1a. Then, the light passes through the illumination light cut filter 1d, passes through the imaging lens 1b, and forms an image on the imaging surface of the imaging device 1c. Illumination light from the illumination optical system 4 ′ passes through the dichroic mirror 2c ″, passes through the second imaging lens 2b, the second objective lens 2a, the observation object 10, and the objective lens 1a, and then passes through the illumination light cut filter. 1d, but is blocked by the illumination light cut filter 1d.
On the other hand, when performing transmitted illumination observation with normal light, the illumination light cut filter 1d is extracted. The light from the illumination optical system 4 ′ passes through the dichroic mirror 2c ″, passes through the second imaging lens 2b, the second objective lens 2a, the observation object 10, the objective lens 1a, and the imaging lens 1b, and then passes through the imaging device. The image is formed on the imaging surface 1c.

第2の方法は、照明光カットフィルタ1dを、対物レンズ1aと結像レンズ1bとの間から抜き出した状態で、照明光学系4’の光源4a’のON/OFFを切り替える方法である。
微弱光観察を行う場合には、照明光学系4’の光源4a’をOFFにする。観察対象10から光戻し用光学系2側に向けて発せられた所定の微弱光は、第2の対物レンズ2a、第2の結像レンズ2bを経て、ダイクロイックミラー2c”の面に結像し、ダイクロイックミラー2c”で反射され、第2の結像レンズ2b、第2の対物レンズ2aを経て、観察対象10に戻る。また、観察対象10を結像光学系1側に向けて透過した所定の微弱光及び、観察対象10から結像光学系1側に向けて発せられた所定の微弱光は、対物レンズ1a、結像レンズ1bを経て、撮像素子1cの撮像面に結像する。
一方、通常光による透過照明観察を行う場合には、照明光学系4’の光源4a’をONにする。照明光学系4’からの照明光は、ダイクロイックミラー2c”の面に集光し、ダイクロイックミラー2c”を透過し、第2の結像レンズ、第2の対物レンズ2aを経て、観察対象10に入射し、観察対象10を透過した光は、対物レンズ1a、結像レンズ1bを経て、撮像素子1cの撮像面に結像する。
The second method is a method of switching ON / OFF of the light source 4a ′ of the illumination optical system 4 ′ with the illumination light cut filter 1d extracted from between the objective lens 1a and the imaging lens 1b.
When performing faint light observation, the light source 4a ′ of the illumination optical system 4 ′ is turned off. Predetermined weak light emitted from the observation object 10 toward the light return optical system 2 side forms an image on the surface of the dichroic mirror 2c ″ through the second objective lens 2a and the second imaging lens 2b. , Reflected by the dichroic mirror 2c ", returns to the observation object 10 through the second imaging lens 2b and the second objective lens 2a. The predetermined weak light transmitted through the observation target 10 toward the imaging optical system 1 side and the predetermined weak light emitted from the observation target 10 toward the imaging optical system 1 side are connected to the objective lens 1a. An image is formed on the imaging surface of the imaging element 1c through the image lens 1b.
On the other hand, when performing transmitted illumination observation with normal light, the light source 4a ′ of the illumination optical system 4 ′ is turned ON. The illumination light from the illumination optical system 4 ′ is collected on the surface of the dichroic mirror 2c ″, transmitted through the dichroic mirror 2c ″, and passed through the second imaging lens and the second objective lens 2a to the observation object 10. The incident light that has passed through the observation object 10 forms an image on the imaging surface of the imaging element 1c via the objective lens 1a and the imaging lens 1b.

第4実施形態の微弱光観察顕微鏡によれば、極めて少ない部材点数で微弱光観察と透過照明観察とを切替えることができる上、第1実施形態の微弱光観察顕微鏡と同様の効果が得られる。即ち、従来の微弱光観察顕微鏡と比べて約2倍の光量の所定の微弱光が入射することになり、撮像素子1cの露光時間を約半分に短縮でき、NAを大きくできない低倍率の対物レンズを用いても、発光像を撮像することが可能となり、また、観察対象(における発光部)の速い変化を撮影することができるようになる。   According to the weak light observation microscope of the fourth embodiment, it is possible to switch between the weak light observation and the transmitted illumination observation with an extremely small number of members, and the same effects as the weak light observation microscope of the first embodiment can be obtained. That is, a predetermined weak light having a light quantity about twice that of a conventional weak light observation microscope is incident, and the exposure time of the image sensor 1c can be shortened to about half, and the low magnification objective lens that cannot increase the NA. Even if is used, it is possible to capture a light emission image, and it is possible to capture a fast change of the observation target (light emitting portion).

なお、図4の例では、所定の微弱波長は、発光試薬等との化学反応によって観察対象から発せられる発光波長として説明したが、所定の微弱波長は、励起波長の照射により観察対象から発せられる蛍光波長であってもよい。
その場合には、光源4a’と集光レンズ4b’との間に、所定の蛍光波長を遮光し、所定の励起光波長を透過する光学特性を持つバンドパスフィルタを挿脱可能に備えるとよい。
また、第4実施形態においては、光戻し用光学系2において観察対象10と共役な位置に配置されるミラーを、平面形状のダイクロイックミラー2c”で構成したが、可変形状のダイクロイックミラーで構成してもよい。
そのようにすれば、可変形状ダイクロイックミラー2c”の反射面を観察対象10の厚み又は光路長に合せて変形させることで、可変形状ダイクロイックミラー2c”で反射された所定の微弱光を、観察対象10の発光点の位置に正確に戻すことができ、観察対象10の厚みが一定でない場合であっても、像のボケを防止することができる。
In the example of FIG. 4, the predetermined weak wavelength is described as the emission wavelength emitted from the observation target by a chemical reaction with the luminescent reagent or the like, but the predetermined weak wavelength is emitted from the observation target by irradiation with the excitation wavelength. It may be a fluorescence wavelength.
In that case, a band-pass filter having optical characteristics that shields a predetermined fluorescence wavelength and transmits a predetermined excitation light wavelength between the light source 4a ′ and the condenser lens 4b ′ may be detachably provided. .
In the fourth embodiment, the mirror disposed at the position conjugate with the observation object 10 in the light return optical system 2 is configured by the planar dichroic mirror 2c ″. However, the mirror is configured by a variable shape dichroic mirror. May be.
By doing so, by deforming the reflecting surface of the deformable dichroic mirror 2c ″ in accordance with the thickness or optical path length of the observation object 10, predetermined weak light reflected by the deformable dichroic mirror 2c ″ can be obtained. 10 can be accurately returned to the position of the light emitting point, and even if the thickness of the observation object 10 is not constant, blurring of the image can be prevented.

以上、本発明の微弱光観察顕微鏡の実施形態について説明したが、本発明の微弱光観察顕微鏡は、これらの構成に限定されるものではない。
例えば、各実施形態における第2の対物レンズ2aの瞳位置に、補正環や位相変調器などの収差補正手段を備えると好ましい。
観察対象10を収容する容器11が、シャーレやマイクロプレートの場合、容器11中の液面が表面張力で曲がり、収差が発生しうる。第2の対物レンズ2aの瞳位置に収差補正手段を備えれば、液面の曲がりによる収差を補正してミラー2c(2c’,2c”)に結像することができる。
As mentioned above, although embodiment of the weak light observation microscope of this invention was described, the weak light observation microscope of this invention is not limited to these structures.
For example, it is preferable to provide an aberration correction means such as a correction ring or a phase modulator at the pupil position of the second objective lens 2a in each embodiment.
When the container 11 that accommodates the observation object 10 is a petri dish or a microplate, the liquid surface in the container 11 is bent by surface tension, and aberration may occur. If an aberration correction means is provided at the pupil position of the second objective lens 2a, it is possible to correct the aberration due to the bending of the liquid surface and form an image on the mirror 2c (2c ′, 2c ″).

また、図1〜図4に示す各実施形態においては、ミラー2c,2c’,2c”が観察対象10と共役な位置に配置されるものであれば、光戻し用光学系2は、どのような倍率で構成してもよい。なお、微弱光の像を極力明るくするためには、第2の対物レンズ2aには、NAが対物レンズ1aよりも大きいものを用いるのが好ましい。   In each embodiment shown in FIGS. 1 to 4, if the mirrors 2 c, 2 c ′, 2 c ″ are arranged at a position conjugate with the observation target 10, the optical return optical system 2 is In order to make the image of weak light as bright as possible, it is preferable to use the second objective lens 2a having a larger NA than that of the objective lens 1a.

また、図1〜図4の例では、光戻し用光学系2が、観察対象10に対して、結像光学系1の反対側に備えたが、本発明の微弱光観察顕微鏡における光戻し用光学系2は、このような配置に限定されるものではない。
例えば、透明なキューブ状の容器に収容された観察対象に対し、観察対象の側方にも光戻し光学系2を設けてもよい。
1 to 4, the light return optical system 2 is provided on the opposite side of the imaging optical system 1 with respect to the observation target 10, but for light return in the weak light observation microscope of the present invention. The optical system 2 is not limited to such an arrangement.
For example, the light return optical system 2 may be provided on the side of the observation target with respect to the observation target accommodated in the transparent cube-shaped container.

本発明の微弱光観察顕微鏡及び微弱光取得方法は、例えば、発光による細胞や組織の微細構造レベルの変化の長時間観察や、蛍光観察等、非常に微弱な光を発する観察対象を観察することが求められるあらゆる分野に有用である。   The weak light observation microscope and the weak light acquisition method of the present invention are for observing an observation object that emits very weak light, such as long-time observation of changes in the fine structure level of cells and tissues due to light emission, fluorescence observation, etc. It is useful in all fields where is required.

1 結像光学系
1a 対物レンズ
1b 結像レンズ
1c 撮像素子
1d 照明光カットフィルタ
2 光戻し用光学系
2a 第2の対物レンズ
2b 第2の結像レンズ
2c (平面)ミラー
2c’ 可変形状ミラー
2c” ダイクロイックミラー
3 光路分割部材
4、4’ 照明光学系
4a、4a’ 光源
4b コリメートレンズ
4b’ 集光レンズ
4c バンドパスフィルタ
10 観察対象(サンプル)
10a 発光部
10a’、10a” 発光部の像
11 容器
51 撮像光学系
51a 対物レンズ
51b 結像レンズ
51c 撮像素子
60 観察対象(サンプル)
60a 発光部
60a’ 発光部の像
61 容器
DESCRIPTION OF SYMBOLS 1 Imaging optical system 1a Objective lens 1b Imaging lens 1c Image pick-up element 1d Illumination light cut filter 2 Optical return optical system 2a Second objective lens 2b Second imaging lens 2c (Plane) mirror 2c 'Variable shape mirror 2c Dichroic mirror 3 Optical path dividing member 4, 4 'Illumination optical system 4a, 4a' Light source 4b Collimator lens 4b 'Condensing lens 4c Bandpass filter 10 Observation object (sample)
10a Light emitting unit 10a ′, 10a ″ Image of light emitting unit 11 Container 51 Imaging optical system 51a Objective lens 51b Imaging lens 51c Imaging element 60 Observation target (sample)
60a Light emitting part 60a 'Image of light emitting part 61 Container

Claims (7)

対物レンズと結像レンズと撮像素子とからなる結像光学系を有し、前記結像光学系を介して観察対象から発せられる所定の微弱光を取得する微弱光観察顕微鏡であって、
第2の対物レンズと、第2の結像レンズと、前記観察対象と共役な位置に配置されていて前記所定の微弱光の波長を反射させ前記所定の微弱光の波長以外の波長を透過するミラーと、を有する光戻し用光学系を、前記観察対象に対して前記結像光学系の反対側に有するとともに、
前記ミラーに対して前記第2の結像レンズとは反対側に備えられていて、前記所定の微弱光の波長とは異なる波長からなる照明光を前記ミラーに向けて出射する照明光学系を有することを特徴とする微弱光観察顕微鏡。
A weak light observation microscope having an imaging optical system composed of an objective lens, an imaging lens, and an image sensor, and acquiring predetermined weak light emitted from an observation object via the imaging optical system;
The second objective lens, the second imaging lens, and the observation object are arranged at a conjugate position to reflect the wavelength of the predetermined weak light and transmit a wavelength other than the wavelength of the predetermined weak light. And a light return optical system having a mirror on the opposite side of the imaging optical system with respect to the observation target,
An illumination optical system is provided on the opposite side of the mirror from the second imaging lens and emits illumination light having a wavelength different from the wavelength of the predetermined weak light toward the mirror. A weak light observation microscope characterized by that.
さらに、前記結像光学系が、前記照明光の波長を遮光し、前記所定の微弱光の波長を透過させる波長選択素子を挿脱可能に備えることを特徴とする請求項1に記載の微弱光観察顕微鏡。   2. The feeble light according to claim 1, wherein the imaging optical system further includes a wavelength selection element that shields the wavelength of the illumination light and allows the wavelength of the predetermined feeble light to pass through. Observation microscope. 収差補正手段を前記第2の対物レンズの瞳位置に備えることを特徴とする請求項1又は2に記載の微弱光観察顕微鏡。   The weak light observation microscope according to claim 1, wherein an aberration correction unit is provided at a pupil position of the second objective lens. 前記収差補正手段が、補正環であることを特徴とする請求項3に記載の微弱光観察顕微鏡。   The weak light observation microscope according to claim 3, wherein the aberration correction unit is a correction ring. 前記収差補正手段が、位相変調器であることを特徴とする請求項3に記載の微弱光観察顕微鏡。   The weak light observation microscope according to claim 3, wherein the aberration correction unit is a phase modulator. 前記所定の微弱光が、化学反応により前記観察対象から発せられる発光であることを特徴とする請求項1〜5のいずれかに記載の微弱光観察顕微鏡。   The weak light observation microscope according to claim 1, wherein the predetermined weak light is luminescence emitted from the observation object by a chemical reaction. 前記所定の微弱光が、励起波長の照射により前記観察対象から発せられる蛍光であり、
前記照明光が、前記観察対象を励起する励起波長からなることを特徴とする請求項2、請求項2に従属する請求項3〜5のいずれかに記載の微弱光観察顕微鏡。
The predetermined weak light is fluorescence emitted from the observation object by irradiation with an excitation wavelength;
The weak light observation microscope according to claim 2, wherein the illumination light has an excitation wavelength that excites the observation object.
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