JP5998324B2 - Deformation measuring device and deformation measuring method - Google Patents

Description

  The present invention relates to a deformation measuring apparatus and a deformation measuring method, and more specifically, measures an XY displacement amount related to one side of a structure in a short time and with high accuracy despite a compact configuration. The present invention relates to a deformation measuring apparatus and a deformation measuring method capable of performing the above.

  XY displacement related to one side of the structure (eg, in a direction perpendicular to one side) to investigate the deformation and deterioration of long structures such as concrete buildings, automobile highways, railway tracks, etc. Deformation measurement is performed to measure the amount over a long period of time. Based on the measurement results of this deformation measurement, the future policy for the structure has been determined, and in particular, the structure to the structure by the excavation work, shield work, cutting / filling work around the structure is decided. This deformation measurement is important in order to make an impact. Conventionally, there are many techniques for measuring the deformation (displacement) of general structures, buildings, equipment, ground, roads, railways, waterways, etc. by utilizing the straightness of laser beams.

  For example, in Japanese Patent Laid-Open No. 5-213198 (Patent Publication 1), a laser light emitter and a laser light receiving scale plate are disposed at a predetermined distance on a rail for a railway vehicle, and laser emitted from the laser light emitter is provided. A trajectory deviation measuring method is disclosed in which the deviation of the linear portion of the rail is measured by measuring the spot of light with a laser receiving scale plate. Thereby, it is possible to automatically and continuously measure the trajectory deviation of the curved portion and the straight portion, and to perform extremely high precision and efficient measurement. Further, it is possible to accurately measure a deviation in a track having a large curvature for a high-speed vehicle such as a Shinkansen, and further increase the speed of the vehicle.

  In Japanese Utility Model Laid-Open No. 6-86012 (Patent Publication 2), a laser light source that is fixed to one end of a measurement section of a structure to be measured and irradiates a laser beam in parallel with the structure, along the structure. There is disclosed a distortion measuring apparatus for a structure, which includes a cart that can travel in a moving manner, distance measuring means that measures the travel distance of the cart, and a light receiver that is mounted on the cart and receives the laser light. In this strain measuring apparatus, orthogonal biaxial driving means for moving the light receiver along a surface intersecting with the laser light substantially perpendicularly so that the light receiver can always receive the laser light as the carriage moves. Displacement detection means for detecting the drive amount of the orthogonal biaxial drive means, and calculation means for obtaining the strain amount of the structure from the detection value of the displacement detection means are further provided. As a result, the laser beam is used as a reference line, and the trajectory is moved by the carriage while the reference line is captured by the light receiver, and the movement amount for maintaining the light receiver at the position of the reference line is taken in. The amount of movement of the light receiver can be handled as a deviation from the reference line of the orbit and an elevation deviation, and the distortion amount of the structure can be directly measured.

  Japanese Patent Laid-Open No. 8-292026 (Patent Publication 3) measures the amount of displacement of a measured object using a laser beam emitted from a laser sighting device and a displacement detector that operates by receiving the laser beam. In addition, an automatic inspection device such as a traffic system travel line alignment is disclosed which is provided with means for displaying at an appropriate location. As a result, the position of the ground coil can be inspected immediately when the vehicle is allowed to resume operation in Maghreb immediately after an earthquake that does not cause damage to the structure. It is said that it does not require the time and labor required by the method.

  Japanese Patent Laying-Open No. 2006-308304 (Patent Document 4) arranges light emitting means at one end of a track section to be measured, and receives light from the light emitting means at the other end and outputs a light reception signal. A light receiving means is disposed, and a feeding device that drives the light blocking piece driven in and out in a direction orthogonal to the track is disposed at the middle point of the track section, and the light blocking piece driven and driven by the feeding device is A trajectory deviation measuring device configured to measure a trajectory deviation in the trajectory section based on a drive amount when the optical path from the light emitting means to the light receiving means is interrupted is disclosed. This trajectory deviation measuring device is characterized by comprising a mount with a guide for shifting the set position of the feeding device to a position displaced by a predetermined distance from the trajectory position. As a result, it is possible to measure deviations in positive and negative trajectories in both straight sections and sections with large curvatures.

  Japanese Patent Laying-Open No. 2011-7667 (Patent Publication 5) discloses a displacement measuring device for measuring the displacement of an object. The displacement measuring device includes a PSD attached to the object, a light source that emits irradiation light toward the light receiving surface of the PSD, and a displacement measurement of the object from a light receiving position of the irradiation light on the light receiving surface of the PSD. Computational processing means for calculating a value is provided. As a result, since the direct light of the irradiation light from the light source is received by the light receiving surface of the PSD, the error of the displacement measurement value is small as compared with the conventional technique in which the reflected light is received, and in addition, the error is reduced. Therefore, it is not necessary to perform complicated correction, and the entire apparatus has a simple structure.

JP-A-5-213198 Japanese Utility Model Publication No. 6-86012 JP-A-8-292026 JP 2006-308304 A JP 2011-7667 A

  However, the techniques described in Patent Documents 1-5 have various problems as described later. For example, in the techniques described in Patent Documents 1 and 2, it is necessary to run a laser light receiving scale plate and a light receiver along a rail or a structure in order to measure a trajectory error or a distortion amount. There is.

  Further, the technique described in Patent Document 3 requires a special detection means such as a quadrant photoelectric element for the displacement detector, and there is a problem that costs increase.

  In the techniques described in Patent Documents 4 and 5, only the displacement of the light blocking piece and the light receiving surface of the PSD is measured. For example, when measuring the displacement of a plurality of linear portions, It is necessary to move the light blocking piece and the light receiving surface of the PSD, and there is a problem that it takes a long measurement time.

  In addition, the technique described in Patent Documents 1-5 has a problem that a specific measurement space is required and the location of the measurement target is limited.

  Therefore, the present invention has been made to solve the above problems, and measures the XY displacement amount related to one side of the structure in a short time and with high accuracy despite the compact configuration. It is an object of the present invention to provide a deformation measuring apparatus and a deformation measuring method that can be performed.

  As a result of intensive studies, the present inventor has completed a novel deformation measuring apparatus and deformation measuring method according to the present invention. That is, the deformation measurement apparatus according to the present invention is a deformation measurement apparatus that measures the displacement of a structure, and employs the following configuration.

The deformation measurement apparatus according to the present invention includes a laser irradiation unit, a reflection / reception unit, a close-up unit, a calculation unit, and a measurement unit. The laser irradiation unit irradiates a laser beam along one side of the structure. The reflection light receiving means reflects the laser beam at one reflection portion of the plurality of reflection portions arranged in series along one side of the structure, and receives the light on a light receiving plate arranged with respect to the reflection portion. Let The close-up means closes the spot of the laser beam on the light receiving plate by a camera of the light receiving plate that has received the laser beam among a plurality of cameras fixed for each light receiving plate. The calculating means uses an XY plane of a surface of the laser beam that has been photographed, with a plane perpendicular to the traveling direction of the laser beam when received by the light receiving plate as an XY plane, and a predetermined position of the light receiving plate as a reference point of the XY plane. Calculate the value. The measuring means reflects the laser beam for each reflecting part and receives the light for each light receiving plate, so that the XY displacement between the plurality of spots is calculated based on the XY coordinate values of the plurality of spots calculated for each camera. The amount is measured as the amount of XY displacement on one side of the structure. The deformation measuring device is configured such that the reflection part is installed in half of the opening of the cylindrical part, the laser beam is reflected by the half, and the other half is used as a translucent part, and the central axis of the cylindrical part and the axis of the laser beam are , And a rotary stage that rotatably supports the cylindrical portion with the central axis of the cylindrical portion as a rotation axis in a state where a laser beam is transmitted through the light transmitting portion of the cylindrical portion, and the rotary stage of the structure And a fixing member for fixing to a predetermined position on one side. The reflection light receiving means rotates the cylindrical portion of the rotary stage so that the laser beam is reflected by the reflecting portion or transmitted by the light transmitting portion.

In addition, the present invention can be provided as a deformation measuring method for a deformation measuring apparatus that measures the displacement of a structure. The deformation measurement method according to the present invention includes an irradiation step, a light receiving step, a close-up step, a calculation step, and a measurement step. In the irradiation step, a laser beam is irradiated along one side of the structure. The reflection / light reception step reflects the laser beam at one reflection portion among a plurality of reflection portions arranged in series along one side of the structure and receives the light on a light receiving plate arranged with respect to the reflection portion. Let In the close-up step, a spot of the laser beam on the light receiving plate is photographed by a camera of the light receiving plate that has received the laser beam among a plurality of cameras fixed for each light receiving plate. In the calculation step, an XY coordinate of the spot of the laser beam that has been imaged with the surface perpendicular to the traveling direction of the laser beam when received by the light receiving plate as an XY plane and a predetermined position of the light receiving plate as a reference point of the XY plane Calculate the value. The measurement step reflects the XY displacement between the plurality of spots based on the XY coordinate values of the plurality of spots calculated for each camera by reflecting the laser beam for each reflecting portion and receiving each of the light receiving plates. The amount is measured as the amount of XY displacement on one side of the structure. The deformation measuring device is configured such that the reflection part is installed in half of the opening of the cylindrical part, the laser beam is reflected by the half, and the other half is used as a translucent part, and the central axis of the cylindrical part and the axis of the laser beam are , And a rotary stage that rotatably supports the cylindrical portion with the central axis of the cylindrical portion as a rotation axis in a state where a laser beam is transmitted through the light transmitting portion of the cylindrical portion, and the rotary stage of the structure And a fixing member for fixing to a predetermined position on one side. In the reflection light receiving step, the cylindrical portion of the rotary stage is rotated, so that the laser beam is reflected by the reflecting portion or transmitted by the light transmitting portion.

  Further, the present invention can be provided as a program for causing a computer to circulate individually via a telecommunication line or the like. In this case, the central processing unit (CPU) realizes the control operation in cooperation with each circuit other than the CPU according to the program of the present invention. Each means realized by using the program and the CPU can also be configured by using dedicated hardware. The program can also be distributed in a state where it is recorded on a computer-readable recording medium such as a CD-ROM.

  According to the deformation measuring apparatus and the deformation measuring method according to the present invention, the XY displacement amount related to one side of the structure can be measured in a short time and with high accuracy despite the compact configuration. Is possible.

It is the schematic and functional block diagram of the deformation measuring apparatus which concern on this invention. The figure (FIG. 2A) which shows an example of the state which the light transmission part of the cylindrical part which concerns on this invention permeate | transmitted the laser beam, The reflection part which concerns on this invention reflects a laser beam, and the light-receiving plate has received the said laser beam It is a figure (FIG. 2B) which shows an example. It is a figure (FIG. 3A) which shows an example of the positional relationship of the reflection part which concerns on this invention, a light-receiving plate, and a camera, and a figure (FIG. 3B) which shows an example of the spot in the image of the light-receiving plate which concerns on this invention. The figure (FIG. 4A) which shows the image containing the spot which concerns on this invention, the figure (FIG. 4B) which shows the image at the time of extracting the edge of a spot, and the time of calculating the pseudo radius of the said spot from the edge of a spot It is a figure (FIG. 4C) which shows an image. The figure which shows an example (FIG. 5A) in which the reflective part which concerns on this invention reflected the laser beam in the time t1 and the time t2 and the figure which shows an example in the state in which the 1st reflective part concerning this invention reflected the laser beam ( FIG. 5B) and a diagram (FIG. 5C) showing an example of a state in which the second reflecting portion according to the present invention reflects the laser beam. It is the schematic of the state which is measuring the XY displacement amount of one side of a structure with the deformation | transformation measuring apparatus which concerns on this invention. It is a flowchart for showing the execution procedure of the deformation | transformation measuring method which concerns on this invention. It is a figure (Drawing 8A) which shows an example of XY coordinate value of one side of a structure in time t1, and a figure (Drawing 8B) which shows an example of XY coordinate value of one side of a structure in time t1 and time t2. The perspective view (FIG. 9A) in the case of measuring the XY displacement amount of the rail of a track | line with the deformation | transformation measuring apparatus (reflection apparatus, light-receiving device) which concerns on this invention, the state which permeate | transmitted and reflected the laser beam with the reflection apparatus, and light reception It is a figure (FIG. 9B) which shows an example of the state which changed the position of the apparatus. The perspective view (FIG. 10A) which shows another example of the reflection part which concerns on this invention, The perspective view (FIG. 10B) which shows another example of a fixing member, The perspective view (FIG. 10C) which shows another example of a light-receiving plate and a camera, It is.

  Embodiments of a deformation measuring device and a deformation measuring method according to the present invention will be described below with reference to the accompanying drawings to help understand the present invention. In addition, the following embodiment is an example which actualized this invention, Comprising: The thing of the character which limits the technical scope of this invention is not.

<Deformation measuring device>
FIG. 1 is a schematic view and a block diagram of a deformation measuring apparatus according to the present invention. The deformation measuring apparatus 1 according to the present invention is a deformation measuring apparatus 1 that measures the displacement of a structure S. As shown in FIG. 1, a laser irradiation unit 10, a reflection light receiving unit 11, a close-up copying unit 12, and the like. , Calculating means 13 and measuring means 14. The laser irradiation unit 10 irradiates the laser beam L along one side S1 of the structure S. The reflection light receiving means 11 reflects the laser beam L at one reflection portion 15a among a plurality of reflection portions 15 (reflection mirrors) arranged in series along one side S1 of the structure S, and the reflection portion The light receiving plate 16a arranged with respect to 15a receives light. The light receiving plate 16 is provided for each reflecting portion 15. The laser beam L is reflected at the reflection point R of the reflecting portion 15a. The close-up means 12 takes a close-up of the spot C of the laser beam L on the light receiving plate 16a by the camera 17a of the light receiving plate 16a that has received the laser beam L among the plurality of cameras 17 fixed for each light receiving plate 16. The calculating means 13 uses the surface perpendicular to the traveling direction (Z direction) of the laser beam L when received by the light receiving plate 16a as the XY plane, and the predetermined position of the light receiving plate 11a as the reference point of the XY plane. The XY coordinate value of the spot C of the laser beam L is calculated. The measuring means 14 reflects the laser beam L for each reflecting portion 15 and receives the light for each light receiving plate 16, so that the plurality of spots are calculated based on the XY coordinate values of the plurality of spots C calculated for each camera 17. The XY displacement amount between the spots C is measured as the XY displacement amount of one side S1 of the structure S.

  Here, as shown in FIG. 1, for example, as shown in FIG. 1, the reflected light receiving means 11, the close-up means 12, the calculating means 13, and the measuring means 14 are a personal computer, a terminal device 18 such as a notebook computer, and a portable terminal device. The function of each means is realized by executing the program to be executed. For example, the CPU of the terminal device 18 uses a RAM as a work area, executes a program stored in a ROM, HDD, SSD, or the like, and executes processing of each unit.

  Thereby, in spite of a compact configuration, the amount of XY displacement related to one side S1 of the structure S (here, XY in a direction perpendicular to the one side S1 of the structure S) in a short time and with high accuracy. (Displacement amount) can be measured.

  In other words, in the present invention, the easily obtainable reflecting portion 15, the light receiving plate 16, and the camera 17 are combined, the XY coordinate value of the spot C is calculated from the image of the camera 17, and the structure is obtained from the XY coordinate values of the plurality of spots C. The XY displacement amount of one side S1 of S is measured. Therefore, a special member is not required, and the configuration can be simple and inexpensive.

  In the present invention, the reflection of the laser beam L by the reflecting portion 15, the reception of the laser beam L by the light receiving plate 16, the calculation of the XY coordinate value of the spot C of the laser beam L, and the amount of XY displacement between the plurality of spots C are calculated. By the measurement (calculation), the XY displacement amount of one side S1 of the structure S is measured. Here, if the reflecting portion 15, the light receiving plate 16, and the camera 17 are taken as a set, and a plurality of sets are provided in series along one side S1 of the structure S, these processes can be executed in several tens of seconds. Therefore, in the present invention, it is possible to measure the XY displacement amount of one side S1 of the structure S in a very short time as compared with the prior art.

  Here, if the XY displacement amount between the plural (two) spots C is measured using the XY coordinate values of the two types of spots C calculated at different times, the predetermined side S1 of the structure S is predetermined. The amount of XY displacement over time at the position can be measured. On the other hand, with reference to a predetermined spot C (for example, the spot of the light receiving plate 16 closest to the laser irradiation unit 10), the XY coordinate value of the spot C and the spot C forward from the spot C along the Z direction. If the XY displacement amount between spots C is measured using the XY coordinate value of a certain other spot C, the XY displacement amount in the Z direction of one side S1 of the structure S can be measured. Further, by using the XY coordinate values of the two kinds of spots C calculated by the camera 17 at different times for each light receiving plate 16, the XY displacement amount of the spot C over time for each light receiving plate 16 is measured. Then, the XY displacement amount with time of the one side S1 of the structure S can be measured.

  In the present invention, the laser beam L is reflected by the reflecting portion 15 so that the spot C of the laser beam L can be formed at a location different from the vicinity of one side S1 of the structure S to be deformed. . Therefore, there is no need to provide a measurement space in the vicinity of one side S1 of the structure S, and the light receiving plate 16 and the camera 17 are installed at arbitrary locations, and the spot C of the laser beam L is applied to the light receiving plate 16 by the reflecting portion 15. If the reflecting portion 15 is installed so as to be formed, deformation measurement can be performed. As a result, it is possible to realize space saving for deformation measurement, and it is possible to apply the deformation measurement apparatus 1 according to the environment of the deformation measurement target.

  Further, in the present invention, the laser beam L is received by the light receiving plate 16a, and the spot C of the laser beam L reflected on the light receiving plate 16a is close-up shot by the camera 17a, so that the image of the spot C becomes a high resolution image. If the XY coordinate value of the spot C is calculated from the high resolution image, the accuracy (measurement limit) of the XY coordinate value is 0. It becomes several mm. Therefore, in the present invention, the XY displacement amount of the side S1 of the structure S can be measured with very high accuracy.

  And since the reflection part 15 which controls formation of the spot C of the laser beam L is comparatively small and lightweight, it is hard to produce blurring when reflecting the laser beam L. Therefore, in the present invention, blurring errors are unlikely to occur in the calculated XY coordinate values of the spot C, and the accuracy of the measurement result can be further improved. Furthermore, since the light receiving plate 16 and the camera 17 can be installed at a position away from the laser beam L by providing the reflecting portion 15, each part of the apparatus can be reduced in size and space saving. It can be realized.

<Each component>
Here, the function of the laser irradiation unit 10 is not particularly limited as long as the object of the present invention is not hindered, and even from the function of simply irradiating the laser beam L, from the starting point of the laser beam L to the reflection point of the laser beam L. You may further have the function to measure the distance of the Z direction between these. If the distance in the Z direction can be measured according to the amount of received light like a laser distance meter, the XYZ coordinate value can also be measured, so the XYZ displacement amount of one side S1 of the structure S can be measured. It becomes.

  Further, the travel distance range of the laser beam L of the laser irradiation unit 10 is not particularly limited as long as the object of the present invention is not hindered, but is preferably in the range of 1 m to 100 m, for example, in the range of 1 m to 50 m. More preferably. This makes it possible to measure a wide range of XY displacement amounts of structures, buildings, equipment, ground, roads, railways, railways, waterways, etc., with very long sides.

  Further, the spot diameter (light diameter) of the laser beam L of the laser irradiation unit 10 is not particularly limited as long as it does not hinder the object of the present invention. For example, it is preferably within a range of 0.1 mm to 2.0 mm. More preferably, it is in the range of 0.1 mm to 1.0 mm. The smaller the spot diameter of the laser beam L, the closer the spot C is to an ideal point (zero-dimensional point), so the XY displacement amount between the plurality of spots C, that is, the XY displacement amount of one side S1 of the structure S is calculated. It becomes possible to measure accurately.

  Further, since the spot diameter of the laser beam L becomes wider (diffuses) as the traveling distance becomes longer, for example, between the laser irradiation unit 10 and the reflection unit 15 or between the reflection unit 15 and the light receiving plate 16. A lens that makes the spot diameter of the laser beam L constant may be further provided. Thereby, by making the spot diameter of the laser beam L constant over a long distance (10 m, 20 m, 50 m, etc.), the XY displacement amount of one side S1 of the structure S can be accurately measured over a long distance. It becomes.

  Further, the safety standard class of the laser beam L of the laser irradiation unit 10 is not particularly limited as long as the object of the present invention is not impaired. For example, the output is 1 mW or less with visible light having a wavelength in the range of 400 nm to 700 nm. Class 2 is preferred. In this class, for example, when measuring the XY displacement amount of the structure S, even if the laser beam L is temporarily irradiated to the user's eyes, the user only feels an aversion reaction of the eyes. There is no danger to the eyes and it is extremely safe.

  Further, the wavelength of the laser beam L of the laser irradiation unit 10 is not particularly limited as long as the object of the present invention is not hindered. For example, it is preferably 650 nm which shows red in visible light. Thereby, when measuring the amount of XY displacement of the structure S, the user can confirm whether the laser beam L is irradiated at a glance.

  Moreover, it is preferable that the laser beam L of the laser irradiation unit 10 is parallel to one side S1 of the structure S and maintains linearity. Therefore, for example, an inclinometer is provided in the laser irradiation unit 10, and a horizontal adjustment unit that can be horizontally adjusted is further provided on the installation bottom surface of the laser irradiation unit 10, so that the level of the laser beam L of the laser irradiation unit 10 can be adjusted appropriately. Such a configuration is preferable.

  Moreover, the installation position of the laser irradiation unit 10 may be a position on one side S1 of the structure S where the reflection unit 15 is installed, or a position of another structure existing on an extension line on the one side S1 of the structure S. I do not care. This is the case, for example, when the structure S and another structure are separate.

  The configuration of the reflecting portion 15 is not particularly limited as long as the object of the present invention is not hindered. For example, a triangular prism, a pentaprism, a reflecting mirror, a reflecting plate, etc. made of a transparent member are employed. For example, as shown in FIG. 1, the reflecting portion 15 has a shape in which one end portion of a rectangular parallelepiped of the transparent member is cut at an angle of 45 degrees from one end surface toward the opposite end surface. By providing a reflecting mirror, the laser beam L impinging on the reflecting portion 15 is reflected by 90 degrees perpendicularly. For example, a reflection-enhanced metal film such as a reflection-enhanced aluminum film is employed as the reflecting mirror.

  In addition, although the reflection angle of the laser beam L by the reflection part 15 is 90 degrees, for example, there is no limitation in particular unless the objective of this invention is inhibited. In principle, if the positional relationship among the reflector 15, the light receiving plate 16, and the camera 17 is uniquely determined, the XY coordinate value of the spot C of the reflected laser beam L does not depend on the reflection angle. (Displacement) corresponds to the XY coordinate value (displacement) of the reflection point R of the laser beam L in the reflection unit 15.

  Moreover, as for the size of the some reflection part 15, it is preferable in the size of all the reflection parts 15 being the same size, for example. In addition, the height at which each of the plurality of reflecting portions 15 is installed is not particularly limited as long as the object of the present invention is not impaired. For example, the height of any reflecting portion 15 is relative to one side S1 of the structure S. Are preferably the same height.

  Further, the method in which the reflection light receiving means 11 reflects the laser beam L with the reflection portion 15 is not particularly limited as long as the object of the present invention is not impaired. For example, the following configuration can be adopted. That is, as shown in FIG. 1 and FIG. 2, the reflecting portion 15 is installed in the half of the opening of the cylindrical portion 11a, the laser beam L is reflected by the half, and the remaining half is the light transmitting portion 11b, and the cylindrical portion 11a. The cylindrical portion 11a has the central axis of the cylindrical portion 11a as a rotation axis in a state where the central axis of the cylindrical portion 11a is parallel to the axis (traveling direction) of the laser beam L and the laser beam L is transmitted through the light transmitting portion 11b of the cylindrical portion 11a. A rotation stage 11c is provided for rotatably supporting the motor. Furthermore, a fixing member 11d (fixing jig) for fixing the rotary stage 11c to a predetermined position on one side S1 of the structure S is provided, and the fixing member 11d is positioned to receive the laser beam L reflected by the reflecting portion 15. The light receiving plate 16 is fixed, and the camera 17 is fixed at a position where the spot C of the laser beam L on the light receiving plate 16 is close-up shot. The reflection light receiving means 11 of the terminal device 18 is communicably connected to the rotary stage 11c via a communication cable. By rotating the cylindrical part 11a of the rotary stage 11c, the laser beam L is reflected by the reflection part 15 or transmitted. The light is transmitted through the light portion 11b.

  For example, the reflection light receiving unit 11 maintains the cylindrical portion 11a of the rotary stage 11c at a predetermined rotation angle (a reference rotation angle, for example, 0 degrees), thereby, as shown in FIG. 2A, the cylindrical portion 11a. The laser beam L is transmitted (transmitted) by the light transmitting portion 11b. Further, the reflected light receiving means 11 rotates the cylindrical portion 11a of the rotary stage 11c 180 degrees from the rotation angle in the clockwise direction (or counterclockwise direction), as shown in FIG. The laser beam L is received by the reflecting portion 15 of the cylindrical portion 11a, reflected at a right angle, and a spot C of the laser beam L is formed on the light receiving plate 16 existing in the reflecting direction (downward). In this state, the close-up means 12 takes a close-up of the spot C with the camera 17. Then, the reflected light receiving means 11 further rotates the cylindrical portion 11a of the rotary stage 11c by 180 degrees in the clockwise direction (or counterclockwise direction) from this state. Returning to the rotation angle (0 degree), the laser beam L is transmitted through the light transmitting portion 11b of the cylindrical portion 11a, and the reflection of the reflecting portion 15 is released.

  As described above, when the method of reflecting or transmitting the laser beam L using the cylindrical portion 11a or the rotating stage 11c is adopted, the cylindrical portion 11a and the rotating stage 11c are inexpensive, so that the entire structure is inexpensive. I can do it. Further, since the configuration is simple and compact, the entire apparatus can be reduced in size. Further, since the reflecting portion 15 is lightweight, position fluctuation due to rotation hardly occurs, and reflection and light transmission can be switched only by rotation of 180 degrees, so that the control of the apparatus is simple and the durability of the apparatus is raised. I can do it.

  The cylindrical portion 11a may be a hollow cylinder, and may be cylindrical, elliptical, or polygonal. The fixing member 11d may have any configuration. For example, as shown in FIGS. 1 and 2, the cross-sectional shape is L-shaped, the rotating stage 11c is fixed to one surface, and the light receiving plate 16 is fixed to the other surface. And the camera 17 are fixed, and the other surface is fixed to the surface of one side S1 of the structure S.

  As another method, the reflection light receiving means 11 reflects the laser beam L. For example, the reflection unit 15 is simply put in and out with respect to a direction (X direction or Y direction) perpendicular to the traveling direction of the laser beam L. It doesn't matter how.

  Further, the method of arranging the plurality of reflecting portions 15 at the same height with respect to the one side S1 of the structure S is not particularly limited as long as the object of the present invention is not hindered. As described above, the cylindrical portion 11a, It is possible to adopt a method in which the rotary stage 11c and the fixed member 11d are all configured in the same manner for each reflecting portion 15. Here, the height of the structure S relative to one side S1 may be the height in the X direction, the height in the Y direction, or the height in the XY direction. Moreover, when arrange | positioning the several light-receiving plate 16 at the same height corresponding to the some reflection part 15, by installing in parallel for every installation location of one side S1 of the structure S, for example, The plurality of light receiving plates 16 are arranged at the same height.

  In addition, the method of arranging the plurality of reflecting portions 15 in series along one side S1 of the structure S is not particularly limited as long as the object of the present invention is not impaired, and the shape (corner portion, Corresponding to the end portion and the surface, the reflecting portion 15 is installed (using the fixing member 11d), or a long member such as a tape measure or a measure is placed along one side S1 of the structure S. The reflecting portion 15 can be arranged corresponding to each installation location.

  In addition, the distance between the reflecting portions 15 with respect to the direction of one side S1 of the structure S, that is, the traveling direction (Z direction) of the laser beam L, or the distance for each light receiving plate 16 is as long as the object of the present invention is not impaired. There is no particular limitation, and the user may appropriately correspond to a predetermined distance of one side S1 of the structure S for which the user wants to measure the XY displacement amount.

  For example, if it corresponds to the measurement of the XY displacement amount with time of one side S1 of the structure S, the distance between the reflecting parts 15 is set to several meters, and the distance from the reflecting part 15 closest to the laser irradiation part 10 is increased. The distance to the farthest reflecting portion 15 is set to 20 m, 50 m, 100 m, or the like. Further, the structure S is a railway track, and the XY displacement amount of the side S1 of the structure S corresponds to the measurement of the track deviation (for example, the X displacement amount is high and low, and the Y displacement amount is incorrect). In this case, the distance between the reflecting portions 15 is appropriately set to 5 m, 10 m, or the like according to the regulation of the orbital deviation.

  The size of the light receiving plate 16 is not particularly limited as long as it can receive the laser beam L, as long as the object of the present invention is not hindered. Within the range of 10 cm, the size in the short direction can be in the range of 3 cm to 8 cm.

  The shape of the light receiving plate 16 is not particularly limited as long as the object of the present invention is not impaired as long as the laser beam L can be received. For example, a rectangular shape, a polygonal shape, a circular shape, an elliptical shape, etc. are adopted. I can do it.

  The size of the plurality of light receiving plates 16 is not particularly limited as long as the object of the present invention is not impaired. For example, it is preferable that all the light receiving plates 16 have the same size. Further, the position where each of the plurality of light receiving plates 16 is installed is not particularly limited as long as the object of the present invention is not impaired. For example, the position of any light receiving plate 16 is relative to one side S1 of the structure S. The position may be close, or may be a position away from the structure S according to the environment of the structure S.

  Further, the surface (irradiation surface) of the light receiving plate 16 that receives the laser beam L is not particularly limited as long as the object of the present invention is not impaired, but considering the clarity of the position of the spot C of the laser beam L, for example, It is preferable that a sheet material (paper or the like) of a color (equivalent color) corresponding to the color of the laser beam L is provided. Specifically, if the color of the laser beam L is red, a corresponding red sheet material is provided on the irradiation surface of the light receiving plate 16. Thus, when the light receiving plate 16 is irradiated with the laser beam L, the outline (edge) of the spot S is emphasized, and the XY coordinate value of the spot C can be easily calculated, and the XY displacement amount of one side S1 of the structure S It is possible to improve the measurement accuracy. The surface of the light receiving plate 16 may be, for example, a white plate or a cloudy plate that makes the spot C clear.

  The method for the close-up means 12 to close-up the spot C of the laser beam L on the light receiving plate 16 by the camera 17 is not particularly limited as long as the object of the present invention is not impaired. For example, the following configuration is adopted. I can do it. That is, as shown in FIGS. 1, 2, and 3, the light receiving plate 16 is made of a transparent or translucent material, and the camera 17 is provided in the direction opposite to the traveling direction of the laser beam L with respect to the light receiving plate 16. The close-up means 12 of the terminal device 18 is communicably connected to the camera 17 via a communication cable. When the reflected light receiving means 11 receives the laser beam L with one light receiving plate 16a among the plurality of light receiving plates 16 through the one reflecting portion 15a, the close-up photographing means 12 is connected to the camera of the one light receiving plate 16a. 17a is activated, and the spot C of the laser beam L reflected on the light receiving plate 16a is photographed from the back side opposite to the light receiving surface.

  As a result, the spot C of the laser beam L reflected on the back surface of the light receiving plate 16a can be taken close-up and without taking a photographing angle, so that the XY coordinate value of the spot C can be calculated with higher accuracy. It becomes possible.

  The method for the close-up means 12 to close-up the spot C of the laser beam L reflected on the light receiving plate 16a from the back side is not particularly limited as long as the object of the present invention is not impaired. For example, the following configuration is adopted. I can do it. That is, as shown in FIGS. 1, 2, and 3, an outer bottom surface of an exterior 11 e having a U-shaped cross section is fixed to a fixing member 11 d, and a camera 17 is installed on the inner bottom surface of the exterior 11 e. The left and right end portions of the light receiving plate 16 are fixed to the end portions of the two side surfaces of 11e. Here, as shown in FIG. 3A, when fixing the light receiving plate 16 to the exterior 11e, the shortest shooting distance D () that allows the camera 17 to take a close-up without blurring the back surface of the light receiving plate 16 and generating a shooting angle. mm) can be secured.

  Although the shortest shooting distance D depends on the performance of the camera 17 and the like, for example, if the number of pixels of the camera 17 is 300,000 pixels, the shortest shooting distance D that can be taken close by the camera 17 is 1.0 cm to 5.0 mm. Is set within the range. As a result, the image of the spot C of the laser beam L that has been taken close-up can be obtained as a high-resolution image, and can be reduced in size as a whole.

  The number of pixels of the camera 17 is not particularly limited as long as it does not hinder the object of the present invention, but considering the resolution of the image, for example, 300,000 pixels, 1 million pixels or the like can be adopted. Here, if the number of pixels of the camera 17 is increased, the resolution of the image captured by the camera 17 increases, but normally, the higher the resolution of the image, the XY of the spot C of the laser beam L in the image. Since the time required to calculate the coordinate value becomes long, the number of pixels of the camera 17 is appropriately designed in consideration of the measurement time.

  On the other hand, if the measurement time is not taken into account, if the number of pixels of the camera 17 is increased, the resolution of the image increases and the size per pixel becomes finer, so that the measurement accuracy is improved. For example, when the size of the image is 50 mm × 50 mm and the resolution of the image is 12 MB, the unit of 1 pixel is converted to the unit of 1 mm, and thus the measurement accuracy is the unit of 1 mm. Further, when the size of the image is 50 mm × 50 mm and the resolution of the image is 25 MB, since one pixel unit is converted to 0.5 mm unit, the measurement accuracy is 0. Improves to a few mm.

  The size of the image is not particularly limited as long as it does not hinder the object of the present invention, but the larger the image, the better the measurement accuracy. On the other hand, when increasing the size of the image, it is necessary to increase the shortest shooting distance D between the light receiving plate 16 and the camera 17, and thus the apparatus may be increased in size. Therefore, the image size is set in consideration of both measurement accuracy and miniaturization.

  The size of the camera 17 is not particularly limited as long as the object of the present invention is not impaired. For example, a small size is preferable because the entire device can be miniaturized.

  The thickness of the light receiving plate 16 is not particularly limited as long as it does not hinder the object of the present invention. For example, in the case of back-up close-up, the spot of the laser beam L is within a range of 0.5 mm to 2.0 mm. It is possible to accurately capture (capture) C from the back side. Note that there is no need to particularly limit the front close-up.

  Note that, instead of the back-up close-up, the close-up means 12 uses the camera 17 to close-up the spot C of the laser beam L on the light receiving plate 16, for example, simply by the traveling direction of the laser light L with respect to the light receiving plate 16. A camera 17 may be provided in the opposite direction, and the spot C of the laser beam L reflected on the light receiving plate 16 by the camera 17 may be taken close-up from the front side.

  In this case, the light receiving plate 16 may be made of an opaque material, but the camera 17 needs to be installed in an oblique direction with respect to the traveling direction of the laser beam L so as not to hinder the traveling of the laser beam L. An image reflecting the shooting angle is obtained. For this reason, the obtained image is subjected to geometric conversion based on the shooting angle, corrected to the image shot from the front, and then the XY coordinate values of the spot C of the laser beam L are calculated. Such geometric conversion is the same even when the camera 17 is arranged at a predetermined photographing angle on the back side with respect to the light receiving plate 16.

  Here, as shown in FIG. 3A, when the laser beam L is reflected at the reflection point R of the reflecting portion 15, the surface of the light receiving plate 16 coincides with the XY plane perpendicular to the traveling direction of the reflected laser beam L. Are arranged as follows. In this case, the XY plane of the surface of the light receiving plate 16 corresponds to the XY plane parallel to the traveling direction of the laser beam L irradiated by the laser irradiation unit 10. That is, the XY displacement amount of the reflection point R of the laser beam L corresponds to the XY displacement amount of the spot C on the light receiving plate 16. Therefore, by measuring the XY displacement amount of the spot C on the surface of the light receiving plate 16, the XY displacement amount of one side S1 of the structure S is measured.

  The method by which the calculating means 13 sets the predetermined position of the light receiving plate 16 as the reference point O on the XY plane is not particularly limited as long as the object of the present invention is not impaired. The reference point O on the XY plane is the light receiving point. Any method may be used as long as it is related to a predetermined position of one side S1 of the structure S via the plate 16.

  For example, as shown in FIG. 3B, in the close-up image P, one corner (lower left corner when viewed from the back side) of the light receiving plate 16 is set as the origin O (reference point) of the XY plane. I can do it. Here, for example, if the right direction from the origin O is the X direction and the upward direction from the origin O is the Y direction, the XY plane of the image P is a plane perpendicular to the traveling direction of the laser beam L as the XY plane. I can do it. Further, since the light receiving plate 16 is installed at a predetermined position on one side S1 of the structure S via the fixing member 11d, the origin O of the XY plane of the light receiving plate 16 is one side S1 of the structure S. Will be related to a predetermined position.

  Further, the method for calculating the XY coordinate value of the spot C of the laser beam L that has been photographed by the calculating means 13 is not particularly limited as long as the object of the present invention is not impaired. For example, using the three primary colors (RGB) of the spot C in the image P and calculating the center point of the spot C as the XY coordinate value of the spot C from the magnitude of the primary colors of the three colors, the image P For example, a method of calculating the area of the spot C at the center and calculating the center point of the area as the XY coordinate value of the spot C can be employed.

  For example, a method of using the three primary colors (RGB) of the spot C in the image P is as follows. As shown in FIG. 1, FIG. 2, and FIG. 3, the close-up means 12 is configured to close-up the spot C of the laser beam L reflected on the light receiving plate 16 from the back side, the color of the laser beam L is red, Red paper is placed on the surface of the light receiving plate 16 to which the laser beam L is irradiated. Then, when the light receiving plate 16 blocks the laser beam L, when the close-up means 12 takes a close-up back view of the light receiving plate 16 with the camera 17, an image P in which the spot C of the laser beam L is emphasized as shown in FIG. Can be obtained. The three primary colors (RGB) of the spot C in the image P are converted to gray scale, an edge corresponding to the outer edge of the spot C is extracted from the converted gray scale, and predetermined calculations such as circular fitting and elliptic fitting are performed. The center point of the extracted edge shape is calculated as an XY coordinate value of the spot C by the equation.

  Then, as shown in FIG. 4B, the X coordinate value of the center point is calculated as 92.5 mm, and the Y coordinate value of the center point is calculated as 171.5 mm. Thereby, the accuracy of the XY coordinate value of the spot C is 0. It is understood that it is several mm. Further, the pseudo radius of the spot C can be calculated as shown in FIG. 4C by back calculating a circle or an ellipse from the shape of the edge using a predetermined calculation formula.

  Further, the method for measuring the XY displacement amount between the plurality of spots C as the XY displacement amount of one side S1 of the structure S is not particularly limited as long as the object of the present invention is not impaired. The following configuration can be employed.

  First, using the XY coordinate values of the two types of spots C calculated at different times, the XY displacement amount between the two spots C is converted into the XY displacement amount over time at a predetermined position on one side S1 of the structure S. Is measured as follows. That is, as shown in FIG. 5A, first, the reflector 15, the light receiving plate 16, and the camera 17 (not shown) are installed at a predetermined position Z1 on one side S1 of the structure S, and a predetermined time t1 (at the time of installation). ), The laser beam L is caused to travel along one side S1 of the structure S, the laser beam L is reflected by the reflecting portion 15, the laser beam L is received by the light receiving plate 16, and the spot of the laser beam L photographed in close proximity by the camera 17 The XY coordinate value A1 of C (first XY coordinate value, X1, Y1) is calculated. This first XY coordinate value A1 becomes the reference coordinate value at time t1.

  Next, at a time t2 after a lapse of a predetermined period from the time t1, the laser beam L is again advanced along one side S1 of the structure S, the laser beam L is reflected by the reflecting portion 15, and the laser beam L is reflected by the light receiving plate 16. , And the XY coordinate value A2 (second XY coordinate value, X2, Y2) of the spot C of the laser beam L that is close-up photographed by the camera 17 is calculated.

  Here, when receiving the laser beam L, the reflecting portions 15 at time t1 and time t2 are arranged at the same height with respect to one side S1 of the structure S. If one side S1 of the structure S is displaced in the XY direction from time t1 to time t2, as shown in FIGS. 3B and 5A, the second XY coordinate value A2 (X2, Y2) and The XY displacement B1 (X2-X1, Y2-Y1) between the first XY coordinate value A1 (X1, Y1) represents the XY displacement over time at a predetermined position Z1 on one side S1 of the structure S. Will show. This XY displacement amount B1 corresponds to the displacement amount of the XY coordinate value of the reflection point in the reflecting portion 15, and corresponds to the displacement amount of the XY coordinate value of the spot C in the light receiving plate 16.

  In this case, the XY displacement amount B1 is a displacement amount (X2-X1, Y2-Y1) obtained by subtracting the first XY coordinate value A1 (X1, Y1) from the second XY coordinate value A2 (X2, Y2). Calculated.

  The first XY coordinate value A1 is, for example, that the reflecting portion 15 and the light receiving plate 16 are fixed at a predetermined position Z1 on one side S1 of the structure S. Using the XYZ coordinate value of the plate 16, it can be converted into the XYZ coordinate value of the position Z1.

  Next, with reference to a predetermined spot C (for example, the spot of the reflection unit 15 and the light receiving plate 16 closest to the laser irradiation unit 10), the XY coordinate value of the spot C and the Z direction from the spot C When the XY displacement amount between the spots C is measured as the XY displacement amount in the Z direction of the one side S1 of the structure S using the XY coordinate values of the other spots C ahead along It becomes like this.

  That is, as shown in FIG. 5B, first, the first reflecting portion 151, the first light receiving plate 161, and the first camera 171 (not shown) are started at a predetermined position Z1 on one side S1 of the structure S. The second reflector 152, the second light receiving plate 162, and the second camera 172 (not shown) are set as end points at a predetermined position Z2 that is separated from the position Z1 by a distance Z in the Z direction. To do. At this time, the two reflecting portions 151 and 152 are arranged at the same height with respect to one side S1 of the structure S and in series along the one side S1 of the structure S.

  Next, the laser beam L is caused to travel along one side S1 of the structure S, the laser beam L is reflected by the first reflecting portion 151, the laser beam L is received by the first light receiving plate 161, and FIG. As shown, the XY coordinate value A3 (third XY coordinate value, X3, Y3) of the spot C of the laser beam L taken close-up by the first camera 171 is calculated. Further, the reflection of the first reflecting portion 151 is released, the laser beam L is reflected by the second reflecting portion 152, and the laser beam L is received by the second light receiving plate 162, as shown in FIG. 5C. As described above, the XY coordinate value A4 (fourth XY coordinate value, X4, Y4) of the spot C of the laser beam L photographed by the second camera 172 is calculated.

  Here, at the time of reflection, reception, and close-up of the laser beam L, both the first reflection part 151 and the second reflection part 152 are arranged at the same height with respect to the one side S1 of the structure S. 5C, the relative XY displacement amount B2 between the third XY coordinate value A3 (X3, Y3) and the fourth XY coordinate value A4 (X4, Y4) is a predetermined distance Z. The XY displacement amount of one side S1 of the structure S is indicated. This XY displacement amount B2 corresponds to the displacement amount of the XY coordinate value of the reflection point in the first reflecting portion 151 and the second reflecting portion 152, and the spot C in the first light receiving plate 161 and the second light receiving plate 162. Corresponds to the amount of displacement of the XY coordinate values. As a result, the XY displacement amount of one side S1 of the structure S with respect to the traveling direction of the laser beam L can be measured from the XY displacement amount B2 between the plurality of spots C.

  Here, the XY coordinate value of any one spot C among the XY coordinate values of the plurality of spots C is used as a reference, and the light receiving plate 16 and the reflection unit 15 that have copied the one spot C are used as a reference. It is possible to measure how much the light receiving plate 16 and the reflecting portion 15 that project the other plurality of spots C are displaced in the XY directions.

  For example, in the above case, if the third XY coordinate value A3 (X3, Y3) is used as a reference, the XY displacement amount B2 is changed from the fourth XY coordinate value A4 (X4, Y4) to the third XY coordinate. It is calculated as a displacement amount (X4-X3, Y4-Y3) obtained by subtracting the value A3 (X3, Y3). The same applies to the fourth XY coordinate value A4 (X4, Y4).

  Further, the XY displacement amount with time at a predetermined position Z1 of one side S1 of the structure S and the XY of one side S1 of the structure S at a predetermined distance Z in the Z direction from the position Z1 to the predetermined position Z2. By combining the displacement amount, the XY displacement amount with time of one side S1 of the structure S can be measured. In this case, XY coordinate values of two types of spots C are calculated at different times t1 and t2 for each reflecting portion 15 and the light receiving plate 16, and the XY displacement of the spot C over time for each reflecting portion 15 and the light receiving plate 16 is calculated. What is necessary is just to measure quantity.

  Such measurement of the XY displacement amount of the side S1 of the structure S over time is affected when, for example, construction or the like that affects the structure S is performed around the structure S. It is implemented for the purpose of measuring the degree.

  The structure S is not particularly limited as long as the object of the present invention is not hindered. For example, the structure S is a long structure such as a general structure, building, equipment, ground, road, railway, railway, waterway, etc. Structures can be mentioned. Further, one side S1 of the structure S is assumed to be a substantially straight side.

  Here, when the amount of XY displacement of one side S1 of the structure S is measured, it is preferable that the fixed member 11d is further provided with a flat slide portion that slidably holds the rotary stage 11c or the cylindrical portion 11c on the XY plane. . For example, when the amount of XY displacement is very large, the position of the reflecting portion 15 is deviated from the laser beam L (range over), the laser beam L is not reflected properly, and the spot C of the laser beam L does not appear on the light receiving plate 16. There is sex. In that case, the rotary stage 11c or the cylindrical portion 11c is slid to the XY plane so that the reflecting portion 15 receives the laser beam L by the plane slide portion. Here, the slide amount after the slide is calculated, the XY coordinate value of the spot C of the laser beam L is calculated by the reflector 15 after the slide, and the XY coordinate value of the spot C of the laser beam L after the slide is calculated. If the slide amount is added, the XY coordinate value of the spot C of the laser beam L before the slide can be calculated backward. Thereby, it is possible to reliably prevent the measurement of the XY displacement amount over time due to the range over. The light receiving plate 16 may be slid along with the sliding of the reflecting portion 15 or may be in a fixed state.

  The measuring means 14 outputs the XY displacement amount of the one side S1 of the structure S as long as it does not hinder the object of the present invention. For example, the XY displacement amount is expressed by the liquid crystal of the terminal device 18. Examples include a method of outputting (displaying) via a display means such as a display or outputting (transmitting) a mail address registered in advance via a communication means such as a network.

  Further, the measuring means 14 determines whether or not the XY displacement amount of one side S1 of the measured structure exceeds the management value by using a management value registered in advance, and the XY displacement amount is determined. When the management value is exceeded, a warning screen or a warning message may be displayed via the display means, or a warning message may be sent via the communication means. Here, the management value is, for example, the XY displacement amount from the reference XY coordinate value, and is registered in each of the X direction and the Y direction, and is set to, for example, 3 mm, 5 mm, or the like. As a result, the current visualization of the side S1 of the structure S can be promoted. Further, when measuring a trajectory error, in addition to the XY coordinate value and the XY displacement amount, an arc may be drawn to display a deformed diagram indicating an up-and-down error and a passing error.

<Deformation measurement method>
Next, an execution procedure of the deformation measurement method according to the embodiment of the present invention when measuring the XY displacement amount of the side S1 of the structure S over time will be described with reference to FIGS.

  First, as shown in FIG. 6, the user installs the laser irradiation unit 10 on the extension line of the side S1 of the structure S to be measured for the XY displacement, and the laser beam L of the laser irradiation unit 10 It is confirmed that the irradiation is performed along one side S1 of the structure S.

  Next, the user constructs a plurality of (for example, five) reflection / reception devices 19 in which the reflection portion 15, the light receiving plate 16, the camera 17, the cylindrical portion 11a, the rotary stage 11c, the fixing member 11d, and the exterior 11e are integrated. The objects S are arranged in series at a predetermined interval Z along one side S1. Here, the user arranges the laser beam L so that the laser beam L is transmitted through the light transmitting portion 11b of the cylindrical portion 11a and the reflecting portion 15 reflects the laser beam L when the cylindrical portion 11a rotates.

  The plurality of reflection light receiving devices 19 have, for example, the same configuration, and are installed at a predetermined position (end portion) of one side S1 of the structure S. It becomes the same height with respect to one side S1 of S.

  And if a user connects the laser irradiation part 10 and the some reflection light-receiving device 19 to the terminal device 18 via a communication cable, the preparation for the measurement of XY displacement amount of one side S1 of the structure S will be completed.

  When the user activates the terminal device 18 and inputs a measurement start key using a mouse, a keyboard or the like, the terminal device 18 causes the laser irradiation unit 10 to emit the laser beam L via the communication cable at a predetermined time t1. Irradiate (FIG. 7: S101).

  Next, the reflection / reception unit 11 of the terminal device 18 rotates the cylindrical portion 11a of the predetermined reflection / reception device 19 of the plurality of reflection / reception devices 19 by the rotary stage 11c via the communication cable. The laser beam L is reflected by the reflecting portion 15 of the light receiving device 19 and received by the light receiving plate 16 of the reflected light receiving device 19 (FIG. 7: S102).

  Correspondingly, the close-up means 12 takes a close-up image of the spot C of the laser beam L on the light receiving plate 16 by the camera 17 of the light receiving plate 16 that blocks the laser light L via a communication cable (FIG. 7: S103). ).

  Further, when an image of the spot C of the laser beam L is taken, the calculation means 13 correspondingly sets the plane perpendicular to the traveling direction of the laser beam L when it is received by the light receiving plate 16 as the XY plane. Using the predetermined position of the light receiving plate 16 as a reference point on the XY plane, the XY coordinate value of the spot C of the laser beam L that has been imaged is calculated (FIG. 7: S104). Thereby, the XY coordinate value of one spot C is calculated. The time required from S102 to S104 is several tens of seconds (for example, 30 seconds).

  When the XY coordinate value of one spot C is calculated, the measuring means 14 calculates whether or not the laser beam L is reflected by all the reflection parts 15, that is, calculates the XY coordinate value of the spot C by all the light receiving plates 16. It is determined whether it has been performed (FIG. 7: S105).

  At the present time, since only the XY coordinate value of one spot C is calculated, the measuring means 14 does not reflect the laser beam L at all the reflection parts 15 or the spot C is reflected by all the light receiving plates 16. It is determined that the XY coordinate value has not been calculated (FIG. 7: S105 NO), and this is notified to the reflected light receiving means 11. Upon receipt of the notification, the reflected light receiving means 12 returns the cylindrical portion 11a that has been rotated earlier to cancel the reflection of the reflecting portion 15 (FIG. 7: S106), returns to S102, and returns to the other reflected light receiving device 19. The cylindrical portion 11a is similarly rotated by the rotary stage 11c, and the laser beam L is reflected by the reflecting portion 15 of the other reflection / light-receiving device 19 and received by the light-receiving plate 16 of the other reflection / light-receiving device 19 (FIG. 7). : S102).

  In this way, the processing is repeated from S102 to S104 until the laser beam L is reflected by each reflecting portion 15 and the XY coordinate value of the spot C is calculated by each light receiving plate 16.

  The order of the reflecting portions 15 that reflect the laser beam L is not particularly limited as long as the object of the present invention is not impaired. For example, the order corresponds to the order of the reflecting portions 15 of the reflection light receiving device 19 close to the laser irradiation portion 10. Suppose that the reflection part 15 is the first from the reflection part 15 close to the laser irradiation part 10, and the reflection and the light transmission are repeated in order up to the fifth reflection part 15.

  Then, when the XY coordinate values of the five spots C are calculated by being reflected by the farthest reflecting portion 15 (the fifth reflecting portion 15 from the laser irradiation portion 10), the measuring means 14 makes all the reflecting portions 15. It is determined that the laser beam L has been reflected or the XY coordinate values of the spot C have been calculated by all the light receiving plates 16 (FIG. 7: S105 YES). And the measurement means 14 measures the XY coordinate value of one side S1 of the structure S used as the reference based on the XY coordinate values of the plurality of spots C.

  Here, for example, from the XY coordinate values A11 (X11, Y11) of the spot C on the light receiving plate 16 of the reflection unit 15 closest to the laser irradiation unit 10 at time t1, A21 (X21, Y21), A31 (X31, Y31), A41 (X41, Y41), A51 (X51, Y51), and each spot C with a predetermined interval Z with reference to the XY coordinate value A11 of the spot C on the light receiving plate 16 of the nearest reflector 15 When plotting the XY coordinate values A11, A21, A31, A41, A51 for each of the X direction (X axis) or the Y direction (Y axis), as shown in FIG. A waveform (shape) of the one side S1 in the X direction or the Y direction appears.

  Here, for example, the measuring means 14 uses A11 (X11, Y11) as a reference, and A21 (X21, Y21) is subtracted from A11 (X11, Y11) (BX21 = X21-X11, BY21 = Y21-Y11). ) Can be measured as the XY displacement amount B1 of one side S1 of the structure S from the first reflecting portion 15 to the second reflecting portion 15 (FIG. 7: S107). Thereby, the X displacement amount and the Y displacement amount of one side S1 of the structure S can be understood at a glance with respect to the Z direction.

  Next, when a user inputs a measurement start key again after a predetermined period with a plurality of reflection light receiving devices 19 installed, the terminal device 18 performs S101 to S105 at a predetermined time t2 (> t2). To XY coordinate values A12 (X12, Y12) of the spot C on the light receiving plate 16 of the nearest reflecting portion 15 at time t2, A22 (X22, Y22), A32 (X32, Y32), A42. (X42, Y42), A52 (X52, Y52) can be obtained.

  The XY coordinate values A12, A22, A32, A42, A52 for each spot C at time t2 are overlapped with the XY coordinate values A11, A21, A31, A41, A51 for each spot C at time t1, and the X direction When plotted against each of the (X axis) or Y direction (Y axis), as shown in FIG. 8B, the displacement amount of the side S1 of the structure S between the time t1 and the time t2 in the X direction or the Y direction as shown in FIG. 8B. Appears. The XY coordinate values A12, A22, A32, A42, A52 for each spot C at time t2 are connected by a solid line, and the XY coordinate values A11, A21, A31, A41, A51 for each spot C at time t1 are broken lines. Tied.

  Here, for example, the measurement means 14 uses A11 (X11, Y11) at time t1 as a reference, and a displacement amount (BX11 = X12−X11) obtained by subtracting A11 (X11, Y11) from A12 (X12, Y12) at time t2. , BY11 = Y12−Y11) can be measured as the amount of XY displacement over time at a predetermined position on one side S1 of the structure S (FIG. 7: S107). Then, based on the XY coordinate values A11, A21, A31, A41, A51, A12, A22, A32, A42, and A52 for every spot C, the time of the side S1 of the structure S from time t1 to time t2 XY displacement amount can be measured at a stretch.

  The time required from the start of measurement at time t1 or time t2 to the calculation of this measurement result is considered to be about 10 minutes. In comparison with this, for example, when calculating the XY coordinate value of each reflector 15 (or a predetermined position on one side S1 of the structure S corresponding thereto) with a three-dimensional surveying instrument using a target seal, the optical axis setting In some cases, it may take 30 minutes or more. Therefore, in the present invention, it is possible to dramatically shorten the measurement time.

  As described above, the present invention is characterized by including the laser irradiation unit 10 described above, the reflection / reception unit 11, the close-up unit 12, the calculation unit 13, and the measurement unit 14. Thereby, it is possible to measure the amount of XY displacement in a direction perpendicular to one side S of the structure S in a short time and with high accuracy despite the compact configuration.

  In the present invention, the reflecting portion 15 can be reduced in size, and in principle, the XY coordinate value of the spot C can be measured even if the reflecting portion 15 and the light receiving plate 16 are installed at different positions. For example, as shown in FIG. 9A, it is also possible to measure the track error by applying to the rail S1 of the track S where it is difficult to secure a measurement space. When measuring the trajectory deviation, for example, the reflecting portion 15, the cylindrical portion 11a, the rotary stage 11c, and the fixed member 11d are configured as the reflecting device 20, and the light receiving plate 16, the camera 17, and the exterior 11e are configured as separate light receiving devices 21. . The reflection devices 20 are arranged in series along the rail S1 at a predetermined interval Z = 5 m. By reducing the size of the reflecting device 20, even if it is installed in the vicinity of the rail S1, it does not become an obstacle. In addition, by arranging the light receiving device 21 at a position away from the reflecting device 20, for example, even if a train travels on the rail S1, it does not get in the way.

  As shown in FIG. 9B, the reflecting device 20 is fixed in a form connected to a part of the bottom of the rail S1, and the light receiving device 21 is fixed at a position slightly separated from the reflecting device 20 in the horizontal direction. Normally, the laser beam L is transmitted through the light transmitting portion 11b of the cylindrical portion 11a of the reflecting device 20, and the cylindrical portion 11a is rotated by 180 degrees during measurement, so that the laser beam L is reflected by the reflecting portion 15 and reflected. The received laser beam L is received by the light receiving plate 16 of the light receiving device 21. By photographing the spot C of the laser beam L on the light receiving plate 16 with the camera 17 of the light receiving device 21, the XY coordinate value of the spot C of the laser beam L is calculated as described above.

  By making the reflection device 20 and the light receiving device 21 separate, the reflection direction of the laser beam L by the reflection portion 15 of the reflection device 20 can be changed, and the reflection is performed without being influenced by the environment around the rail S1. The device 20 can be installed in the vicinity of the rail S1, and the light receiving device 21 can be installed as appropriate according to the environment around the rail S1. For example, as shown in FIG. 9B, the reflection direction α of the laser beam L by the reflection unit 15 is set 45 degrees above the horizontal direction, and the light receiving device 21 is installed corresponding to the reflection direction α of the laser beam L. . The reflection direction α may be horizontal, 45 degrees below, or vertical, and can be arbitrarily set according to the environment around the rail S1. Thereby, it becomes possible to measure the XY displacement amount of one side S1 of the structure S without worrying about the measurement space.

  In the present invention, the position of the reflecting portion 15 is not particularly limited as long as the object of the present invention is not hindered. As shown in FIG. 1, the reflecting portion 15 is cylindrical in the direction opposite to the traveling direction of the laser beam L. The reflection part 15 may be provided in the cylindrical part 11a along the traveling direction of the laser beam L and may reflect the laser beam L that has passed through the cylindrical part 11a as shown in FIG. 10A. You may do it. In this case, the light receiving plate 16 and the camera 17 are installed according to the reflection point by the reflection unit 15.

  Further, the structure of the fixing member 11d for fixing the reflecting portion 15 and the cylindrical portion 11a is not particularly limited as long as the object of the present invention is not hindered, and as shown in FIG. 10A, an L-shaped sheet metal and a U-shape. The fixing member 11d may be combined with the sheet metal, or as shown in FIG. 10B, a box-shaped sheet metal is detachably provided on the L-shaped sheet metal, and the light receiving plate 16 and the camera 17 are installed in the box. The member 11d may be used. This assumes that the reflection device 20 and the light receiving device 21 can be configured separately as described above. The configuration of the light receiving plate 16 and the camera 17 is not particularly limited as long as the object of the present invention is not hindered. As shown in FIG. 10B, the camera 17 is installed immediately below the back surface of the square light receiving plate 16. Alternatively, as shown in FIG. 10C, the camera 17 may be installed after a predetermined shortest shooting distance D is provided on the back surface of the circular light receiving plate 16.

  In deformation measurement, the intensity of external light in the measurement environment, such as indoor, outdoor, daytime, and nighttime, is not constant, and the disturbance affects the spot of the laser beam L received by the light receiving plate 11. There is. If the spot of the laser beam L fluctuates due to disturbance, a measurement error occurs. Therefore, in order to prevent external light, it is preferable to provide an opening only in a portion where the reflected laser beam L enters the light receiving plate 16 and provide a case that covers the light receiving plate 16 and the camera 17. This makes it possible to perform deformation measurement with high accuracy in any measurement environment. When providing a case, for example, a member that prevents the influence of disturbance due to the external environment, such as a ventilation part that ventilates internal air, a moisture absorption part that prevents internal condensation, and an exhaust part that exhausts internal dust, may be provided as appropriate. good.

  In the present invention, the terminal device 18 is configured to include each unit. However, a program that realizes each unit may be stored in a storage medium, and the storage medium may be provided. In the configuration, the program is read by a predetermined terminal device 18, and the terminal device 18 realizes the respective means. In that case, the program itself read from the recording medium exhibits the effects of the present invention. Furthermore, it is possible to provide the steps executed by each means as the deformation measuring method of the present invention.

  As described above, the deformation measuring device and the deformation measuring method according to the present invention are a measurement field for measuring deformation of general structures, buildings, equipment, grounds, roads, railways, waterways, etc., civil engineering It is useful in the technical field, surveying technical field, measurement technical field, etc., and it is possible to measure the XY displacement amount related to one side of the structure in a short time and with high accuracy despite the compact configuration. It is effective as a possible deformation measuring device and deformation measuring method.

DESCRIPTION OF SYMBOLS 1 Deformation measuring apparatus 10 Laser irradiation part 11 Reflection light reception means 12 Close-up photography means 13 Calculation means 14 Measurement means 15 Reflection part 16 Light receiving plate 17 Camera 18 Terminal apparatus

Claims (2)

A deformation measuring device for measuring the displacement of a structure,
A laser irradiation unit for irradiating a laser beam along one side of the structure;
Reflective light receiving means for reflecting the laser beam at one reflecting portion of the plurality of reflecting portions arranged in series along one side of the structure and receiving the light on a light receiving plate arranged with respect to the reflecting portion; ,
Of a plurality of cameras fixed for each light receiving plate, a close-up means for taking a close-up of the laser beam spot on the light receiving plate by a camera of the light receiving plate that has received the laser beam,
The XY coordinate value of the spot of the laser beam that has been imaged is calculated by using a plane perpendicular to the traveling direction of the laser beam when received by the light receiving plate as an XY plane and a predetermined position of the light receiving plate as a reference point of the XY plane. A calculation means;
Based on the XY coordinate values of the plurality of spots calculated for each camera, the XY displacement amount between the plurality of spots is reflected by reflecting the laser beam for each reflection unit and receiving each of the light receiving plates. Measuring means for measuring the amount of XY displacement on one side of the structure ,
The deformation measuring device is configured such that the reflection part is installed in half of the opening of the cylindrical part, the laser beam is reflected by the half, and the other half is used as a translucent part, and the central axis of the cylindrical part and the axis of the laser beam are A rotation stage that rotatably supports the cylindrical portion with the central axis of the cylindrical portion as a rotation axis in a state in which a laser beam is transmitted through the transparent portion of the cylindrical portion.
A fixing member for fixing the rotary stage at a predetermined position on one side of the structure;
With
The deformation measuring apparatus , wherein the reflection light receiving means rotates a cylindrical portion of the rotary stage to reflect a laser beam at a reflecting portion or transmit light at a light transmitting portion . A deformation measuring method of a deformation measuring device for measuring the displacement of a structure,
An irradiation step of irradiating a laser beam along one side of the structure;
A reflection light receiving step of reflecting the laser beam at one reflection part among a plurality of reflection parts arranged in series along one side of the structure and receiving the light on a light receiving plate arranged with respect to the reflection part; ,
Of a plurality of cameras fixed for each light receiving plate, a close-up step of taking a close-up of the spot of the laser beam on the light receiving plate by the camera of the light receiving plate that has received the laser beam,
The XY coordinate value of the spot of the laser beam that has been imaged is calculated by using a plane perpendicular to the traveling direction of the laser beam when received by the light receiving plate as an XY plane and a predetermined position of the light receiving plate as a reference point of the XY plane. A calculation step;
Based on the XY coordinate values of the plurality of spots calculated for each camera, the XY displacement amount between the plurality of spots is reflected by reflecting the laser beam for each reflection unit and receiving each of the light receiving plates. A measurement step for measuring the amount of XY displacement on one side of the structure ,
The deformation measuring device is configured such that the reflection part is installed in half of the opening of the cylindrical part, the laser beam is reflected by the half, and the other half is used as a translucent part, and the central axis of the cylindrical part and the axis of the laser beam are A rotation stage that rotatably supports the cylindrical portion with the central axis of the cylindrical portion as a rotation axis in a state in which a laser beam is transmitted through the transparent portion of the cylindrical portion.
A fixing member for fixing the rotary stage at a predetermined position on one side of the structure;
With
In the reflection light receiving step, the cylindrical portion of the rotary stage is rotated, so that the laser beam is reflected by the reflecting portion or transmitted by the light transmitting portion .