Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JP6120368B2 - Multi-wiring board - Google Patents
[go: Go Back, main page]

JP6120368B2 - Multi-wiring board - Google Patents

Multi-wiring board Download PDF

Info

Publication number
JP6120368B2
JP6120368B2 JP2013127199A JP2013127199A JP6120368B2 JP 6120368 B2 JP6120368 B2 JP 6120368B2 JP 2013127199 A JP2013127199 A JP 2013127199A JP 2013127199 A JP2013127199 A JP 2013127199A JP 6120368 B2 JP6120368 B2 JP 6120368B2
Authority
JP
Japan
Prior art keywords
conductor
wiring
plating
wiring board
insulating layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2013127199A
Other languages
Japanese (ja)
Other versions
JP2015002307A (en
Inventor
清治 阿野
清治 阿野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NGK Electronics Devices Inc
Original Assignee
NGK Electronics Devices Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NGK Electronics Devices Inc filed Critical NGK Electronics Devices Inc
Priority to JP2013127199A priority Critical patent/JP6120368B2/en
Publication of JP2015002307A publication Critical patent/JP2015002307A/en
Application granted granted Critical
Publication of JP6120368B2 publication Critical patent/JP6120368B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Structure Of Printed Boards (AREA)

Description

本発明は、半導体素子や水晶振動子などの電子部品を収容するための配線基板となる領域が複数個配列された多数個取り配線基板に関する。   The present invention relates to a multi-cavity wiring board in which a plurality of regions serving as wiring boards for housing electronic components such as semiconductor elements and crystal resonators are arranged.

図9は、半導体素子や水晶振動子等の電子部品を収容するための電子部品収納用パッケージに用いられる小型の配線基板50を示しており、酸化アルミニウム等のセラミックスからなる絶縁層51a乃至51dを複数積層して成り、上面に電子部品52を収容するためのキャビティ53を有する略四角形状の絶縁基体51と、キャビティ53内の段差54上に設けられた複数の配線導体55と、絶縁層51a乃至51cを貫通し一端が段差54上の配線導体55に接続されたビア56と、ビア56を介して段差上の配線導体55に接続された絶縁基体51の下面57の配線導体55とを有している。
なお、近似の電子装置の配線密度向上の要求に伴い、キャビティ53内に複数の段差54を設け、それぞれの段差54上に複数の配線導体55を設けることが行われている。キャビティ53内に配線導体形成用の段差54を複数設けることにより、より多くの配線導体55を絶縁基体51内に形成することができる。
このような段差54上の配線導体55の露出表面には、配線導体55が酸化腐食するのを防止するとともに配線導体55と電子部品52との電気的な接続を良好なものとするために、例えば厚みが1〜10μm程度のニッケルめっきと厚みが0.1〜3μm程度の金めっきとからなるめっき層58が電解めっき法により被着されている。この段差54上の配線導体55とめっき層58とで内部電極59を構成している。
同様に、下面57の配線導体55にも、配線導体55が酸化腐食するのを防止するとともに外部電気回路基板65の実装パッド66との電気的な接続を良好なものとするために、例えば厚みが1〜10μm程度のニッケルめっきと厚みが0.1〜3μm程度の金めっきとからなるめっき層58が電解めっき法により被着されている。この下面57の配線導体55とめっき層58とで外部電極60を構成している。
FIG. 9 shows a small wiring board 50 used in an electronic component storage package for storing electronic components such as semiconductor elements and crystal resonators. Insulating layers 51a to 51d made of ceramics such as aluminum oxide are shown. A substantially rectangular insulating base 51 having a cavity 53 for accommodating the electronic component 52 on the upper surface, a plurality of wiring conductors 55 provided on the step 54 in the cavity 53, and an insulating layer 51a. Through 51c, one end of which is connected to the wiring conductor 55 on the step 54, and the other end of the wiring conductor 55 is connected to the wiring conductor 55 on the step through the via 56. doing.
In addition, with the request | requirement of the wiring density improvement of an approximate electronic apparatus, providing the some level | step difference 54 in the cavity 53 and providing the some wiring conductor 55 on each level | step difference 54 is performed. By providing a plurality of steps 54 for forming a wiring conductor in the cavity 53, more wiring conductors 55 can be formed in the insulating base 51.
In order to prevent the wiring conductor 55 from being oxidized and corroded on the exposed surface of the wiring conductor 55 on the step 54, and to improve the electrical connection between the wiring conductor 55 and the electronic component 52, For example, a plating layer 58 made of nickel plating having a thickness of about 1 to 10 μm and gold plating having a thickness of about 0.1 to 3 μm is applied by an electrolytic plating method. The wiring conductor 55 and the plating layer 58 on the step 54 constitute an internal electrode 59.
Similarly, the thickness of the wiring conductor 55 on the lower surface 57 is reduced, for example, in order to prevent the wiring conductor 55 from being oxidatively corroded and to have good electrical connection with the mounting pads 66 of the external electric circuit board 65. A plating layer 58 made of nickel plating having a thickness of about 1 to 10 μm and gold plating having a thickness of about 0.1 to 3 μm is applied by an electrolytic plating method. The wiring conductor 55 and the plating layer 58 on the lower surface 57 constitute an external electrode 60.

この配線基板50によれば、絶縁基体51のキャビティ53内に電子部品52を収容するとともに、電子部品52の電極61をキャビティ53内の内部電極59にボンディングワイヤ62を介して電気的に接続し、しかる後、絶縁基体51上面のキャビティ外周63に蓋体64を接合させて電子部品52を気密に収容することによって製品としての電子装置となり、この電子装置は、外部電極60を外部電気回路基板65の実装パッド66に半田を介して接続することにより外部電気回路基板66に実装されるとともに電子部品52の電極61が外部電気回路に電気的に接続される。   According to this wiring board 50, the electronic component 52 is accommodated in the cavity 53 of the insulating base 51, and the electrode 61 of the electronic component 52 is electrically connected to the internal electrode 59 in the cavity 53 via the bonding wire 62. Thereafter, a lid 64 is joined to the cavity outer periphery 63 on the upper surface of the insulating base 51 to contain the electronic component 52 in an airtight manner, whereby an electronic device as a product is formed. It is mounted on the external electric circuit board 66 by being connected to the 65 mounting pads 66 via solder, and the electrode 61 of the electronic component 52 is electrically connected to the external electric circuit.

このような配線基板50は近時の電子装置の小型化の要求に伴い、その大きさが小さなものとなってきており、多数個の配線基板の取り扱いを容易とするために、一枚の広面積のセラミック多層基板に多数個の配線基板を縦横に配置した、いわゆる多数個取り配線基板の形態で製作されている。   Such a wiring board 50 has become smaller in size in response to the recent demand for downsizing of electronic devices. In order to facilitate handling of a large number of wiring boards, a single wide board is required. It is manufactured in the form of a so-called multi-cavity wiring board in which a large number of wiring boards are arranged vertically and horizontally on a ceramic multilayer substrate having an area.

図10及び図11は多数個取り配線基板の例を示し図10は平面図、図11は図10のA−A線に沿った断面図である。多数個取り配線基板70は複数の絶縁層71a乃至71dを積層して成るセラミック多層基板71で構成される。セラミック多層基板71の中央部には分割後に配線基板となる複数の配線基板領域72が縦横に配され、外周には分割時に配線基板領域72から切り離される捨て代領域85が形成されている。
配線基板領域72は各々がその上面に電子部品を収容するためのキャビティ73を有するとともに、キャビティ73内に複数の段差74が設けられ、各々の段差74上に複数の配線導体75が設けられている。配線導体75は絶縁層71a乃至71cを貫通するビア76を介して配線基板領域72の下面77の配線導体75に接続されている。なお、図10、図11の多数個取り配線基板70では、キャビティ73内に2つの段差74を設け、各々の段差74上にそれぞれ配線導体75を設けている。
捨て代領域85の側面には切り欠き86が形成され、切り欠き86の内壁に沿って導体層からなるめっき電極87が形成されている。このめっき電極87をめっき用電源に接続することにより、めっき層を被着させるすべての配線導体75に電解めっきのための電荷が印加される。
10 and 11 show an example of a multi-piece wiring board, FIG. 10 is a plan view, and FIG. 11 is a cross-sectional view taken along the line AA of FIG. The multi-piece wiring board 70 is constituted by a ceramic multilayer board 71 formed by laminating a plurality of insulating layers 71a to 71d. A plurality of wiring board regions 72 that become wiring boards after division are arranged vertically and horizontally in the central portion of the ceramic multilayer substrate 71, and a disposal margin area 85 that is separated from the wiring board region 72 at the time of division is formed on the outer periphery.
Each wiring board region 72 has a cavity 73 for accommodating an electronic component on its upper surface, a plurality of steps 74 are provided in the cavity 73, and a plurality of wiring conductors 75 are provided on each step 74. Yes. The wiring conductor 75 is connected to the wiring conductor 75 on the lower surface 77 of the wiring board region 72 through a via 76 that penetrates the insulating layers 71a to 71c. 10 and 11, two stepped portions 74 are provided in the cavity 73, and a wiring conductor 75 is provided on each stepped portion 74.
A notch 86 is formed on the side surface of the discard margin region 85, and a plating electrode 87 made of a conductor layer is formed along the inner wall of the notch 86. By connecting the plating electrode 87 to a plating power source, a charge for electrolytic plating is applied to all the wiring conductors 75 on which the plating layer is to be deposited.

各配線導体75の露出表面に電解めっき法によりニッケルめっき層や金めっき層を被着させるには、めっき層を被着させるすべての配線導体75をめっき電極87に接続させる必要がある。
すべての配線導体75をめっき電極87に接続させる例として、特許文献1の図2および図3には、すねいく配線16(千鳥配線)等の技術を駆使し、各電極部の入出力端子14を連12のまま同時にめっきを施してから、連12をブレイクあるいは切断により単品20とすることで、このすねいく配線16を分断する技術が記載されている。
In order to deposit a nickel plating layer or a gold plating layer on the exposed surface of each wiring conductor 75 by electrolytic plating, it is necessary to connect all the wiring conductors 75 on which the plating layer is to be deposited to the plating electrode 87.
As an example of connecting all the wiring conductors 75 to the plating electrode 87, in FIG. 2 and FIG. 3 of Patent Document 1, a technique such as a smooth wiring 16 (staggered wiring) is used, and the input / output terminals 14 of each electrode portion are used. A technique is described in which the continuous wiring 16 is subjected to plating at the same time, and then the continuous wiring 16 is divided by breaking or cutting into the single product 20.

図12は、特許文献1のすねいく配線を用いて多数個取り配線基板70の各配線導体75をめっき電極87に接続する方法を説明する平面図で、図12(a)は絶縁層71b上の配線導体75と絶縁層71b上の配線導体75に接続される下面77の配線導体75をめっき電極87に接続する方法を説明するための部分平面図、図12(b)は絶縁層71c上の配線導体75と絶縁層71c上の配線導体75に接続される下面77の配線導体75をめっき電極87に接続する方法を説明する部分平面図である。
図12(a)において、絶縁層71b外周の捨て代領域85には、四角枠状のめっき用共通導体枠90が形成されている。このめっき用共通導体枠90はめっき電極87に接続されている。隣接する配線基板領域72と配線基板領域72の間には、境界線84の左右に交互に折り返しパターンを描きながら蛇行し、両端がめっき用共通導体枠90に接続された連結導体91が形成されている。
各配線基板領域72の中央には、キャビティ73を形成するための開口92が形成され、開口92の周囲から配線基板領域72の境界線84に伸びる配線導体75が形成されている。配線導体75のうち、捨て代領域85との境界線84に伸びるものは引出し線93を介してめっき用共通導体枠90に接続されている。配線導体75のうち、隣接する配線基板領域72と配線基板領域72との境界線84に伸びるものは、連結導体91に接続されている。
このようにして、絶縁層72b上の配線導体75は、引出し線93、連結導体91、めっき用共通導体枠90を介してめっき電極87に接続される。同様に、図12(b)に示す絶縁層71c上の配線導体75も引出し線93、めっき用連結導体91、めっき用共通導体枠90を介してめっき電極87に接続される。
また、下面77の配線導体75は、ビア76を介して絶縁層72b上の配線導体75か絶縁層72c上の配線導体75のいずれかに接続されていることより、めっき電極87に接続されることになる。このめっき電極87をめっき用電源に接続することにより、配線導体75の露出面に電解めっきによるめっき金属層が被着される。
FIG. 12 is a plan view for explaining a method of connecting each wiring conductor 75 of the multi-piece wiring board 70 to the plating electrode 87 using the smooth wiring of Patent Document 1, and FIG. 12 (a) is on the insulating layer 71b. FIG. 12B is a partial plan view for explaining a method of connecting the wiring conductor 75 on the lower surface 77 connected to the wiring conductor 75 on the insulating layer 71b and the wiring conductor 75 on the insulating layer 71b to the plating electrode 87. FIG. FIG. 10 is a partial plan view for explaining a method of connecting the wiring conductor 75 of the lower surface 77 connected to the wiring conductor 75 and the wiring conductor 75 on the insulating layer 71 c to the plating electrode 87.
In FIG. 12A, a rectangular frame-shaped common conductor frame 90 for plating is formed in the disposal margin region 85 on the outer periphery of the insulating layer 71b. The plating common conductor frame 90 is connected to the plating electrode 87. Between the adjacent wiring board region 72 and the wiring board region 72, a connecting conductor 91 is formed which meanders while alternately drawing a folded pattern on the left and right sides of the boundary line 84 and both ends are connected to the plating common conductor frame 90. ing.
An opening 92 for forming the cavity 73 is formed at the center of each wiring board region 72, and a wiring conductor 75 extending from the periphery of the opening 92 to the boundary line 84 of the wiring board region 72 is formed. Among the wiring conductors 75, the one extending to the boundary line 84 with the disposal margin region 85 is connected to the plating common conductor frame 90 via the lead line 93. Among the wiring conductors 75, the one extending to the boundary line 84 between the adjacent wiring board region 72 and the wiring board region 72 is connected to the connecting conductor 91.
In this way, the wiring conductor 75 on the insulating layer 72b is connected to the plating electrode 87 via the lead wire 93, the connecting conductor 91, and the plating common conductor frame 90. Similarly, the wiring conductor 75 on the insulating layer 71c shown in FIG. 12B is also connected to the plating electrode 87 through the lead wire 93, the plating connecting conductor 91, and the plating common conductor frame 90.
Further, the wiring conductor 75 on the lower surface 77 is connected to the plating electrode 87 by being connected to either the wiring conductor 75 on the insulating layer 72 b or the wiring conductor 75 on the insulating layer 72 c through the via 76. It will be. By connecting the plating electrode 87 to a plating power source, a plated metal layer by electrolytic plating is deposited on the exposed surface of the wiring conductor 75.

なお、連結導体91を介して電気的に接続されている各配線基板領域72の隣接する配線導体75同士は、セラミック多層基板71を各配線基板領域72に分割した後、連結導体91が折り返しパターン単位に分断されることにより、それぞれが互いに電気的に独立することとなる。   The wiring conductors 75 adjacent to each other in the wiring board regions 72 electrically connected via the connecting conductors 91 divide the ceramic multilayer substrate 71 into the wiring board regions 72, and then the connecting conductors 91 are folded back. By being divided into units, each becomes electrically independent from each other.

特開平11−214832JP-A-11-214832

絶縁層71b上の配線導体75と絶縁層71c上の配線導体75とでは、通常配線導体の数、幅、長さ等が異なる。このため、絶縁層71b上の連結導体91とそれに接続される配線導体75で構成される絶縁層71bのめっき用回路の電気抵抗と、絶縁層71c上の連結導体91とそれに接続される配線導体75で構成される絶縁層71cのめっき用回路の電気抵抗とは異なったものとなる。この電気抵抗の差は1つの配線基板領域単位では小さいものであっても、近年の生産効率を向上させる目的で多数の配線基板領域が形成された多数個取り配線基板では、絶縁層71bのめっき用回路の電気抵抗と絶縁層71cのめっき用回路の電気抵抗との差は大きなものになってしまう。
そして、この多数個取り配線基板70を電解めっき浴に浸漬するとともにめっき電極87をめっき用電源に接続することによって、全ての配線導体75にめっき金属層を被着させると、絶縁層71b上の連結導体91に接続された配線導体75に被着されるめっき金属層の厚みと、絶縁層71c上の連結導体91に接続された配線導体75に被着されるめっき金属層の厚みの差が大きなものとなってしまい、全ての配線導体75に所定の厚みのめっき金属層を被着させることが困難であるという問題点を有していた。
The wiring conductor 75 on the insulating layer 71b and the wiring conductor 75 on the insulating layer 71c differ in the number, width, length, etc. of the normal wiring conductors. Therefore, the electrical resistance of the plating circuit of the insulating layer 71b composed of the connecting conductor 91 on the insulating layer 71b and the wiring conductor 75 connected thereto, and the connecting conductor 91 on the insulating layer 71c and the wiring conductor connected thereto. This is different from the electrical resistance of the plating circuit of the insulating layer 71c composed of 75. Even if this difference in electric resistance is small in one wiring board area unit, in the multi-cavity wiring board in which many wiring board areas are formed for the purpose of improving production efficiency in recent years, the plating of the insulating layer 71b is performed. The difference between the electric resistance of the circuit for use and the electric resistance of the plating circuit for the insulating layer 71c becomes large.
Then, by immersing the multi-piece wiring board 70 in an electrolytic plating bath and connecting the plating electrode 87 to a power source for plating, when a plating metal layer is deposited on all the wiring conductors 75, the insulating layer 71b is covered. There is a difference between the thickness of the plating metal layer deposited on the wiring conductor 75 connected to the connecting conductor 91 and the thickness of the plating metal layer deposited on the wiring conductor 75 connected to the connecting conductor 91 on the insulating layer 71c. Therefore, it is difficult to deposit a plated metal layer having a predetermined thickness on all the wiring conductors 75.

本発明はかかる従来の問題点に鑑み案出されたものであり、その目的は、各配線導体に被着されるめっき金属層の厚みのばらつきを小さいものとして、全ての配線導体に所定の厚みのめっき金属層を電解めっき法により被着させることが可能な多数個取り配線基板を提供することにある。   The present invention has been devised in view of such conventional problems, and its purpose is to reduce the variation in the thickness of the plated metal layer applied to each wiring conductor and to provide a predetermined thickness for all wiring conductors. An object of the present invention is to provide a multi-piece wiring board capable of depositing the plated metal layer by electrolytic plating.

上記課題を解決するための本発明の請求項1に記載の多数個取り配線基板は、
複数の絶縁層が積層された多層基板と、
上記多層基板の中央部に位置し、境界線によって区切られた配線基板領域が縦横に配列された製品領域と、
上記製品領域の外周に位置し、めっき電極を有する捨て代領域と、
上記絶縁層のうちの第1絶縁層上に形成されて、上記境界線の左右に交互に連続して配置された折り返しパターンからなる蛇行領域を有すると共に、少なくとも一端が上記めっき電極に接続された第1連結導体と、
上記絶縁層のうちの第2絶縁層上に形成されて、上記境界線の左右に交互に連続して配置された折り返しパターンからなる蛇行領域を有すると共に、少なくとも一端が上記めっき電極に接続された第2連結導体と、
上記第1絶縁層上に形成されて一端が上記第1連結導体の折り返しパターンの1つに接続された配線導体と、
上記第2絶縁層上に形成されて一端が上記第2連結導体の折り返しパターンの1つに接続された配線導体とを有する多数個取り配線基板において、
上記第1連結導体と第2連結導体のうちの少なくとも一方は上記配線導体に接続されない折り返しパターンを有し、
上記配線導体に接続されない折り返しパターンは同一配線基板領域内の異なる絶縁層上に形成された折り返しパターンにビアで接続されていることを特徴とする多数個取り配線基板である。
The multi-cavity wiring board according to claim 1 of the present invention for solving the above problems is
A multilayer substrate in which a plurality of insulating layers are laminated;
A product area in which the wiring board area located at the center of the multilayer board and arranged by the boundary line is arranged vertically and horizontally;
Located on the outer periphery of the product area, abandon area having a plating electrode,
The meandering region is formed on the first insulating layer of the insulating layers, and has a meandering pattern having a folded pattern alternately and continuously arranged on the left and right of the boundary line, and at least one end is connected to the plating electrode. A first connecting conductor;
The meandering region is formed on the second insulating layer of the insulating layers, and has a meandering pattern having a folded pattern alternately and continuously arranged on the left and right of the boundary line, and at least one end is connected to the plating electrode. A second connecting conductor;
A wiring conductor formed on the first insulating layer and having one end connected to one of the folded patterns of the first connecting conductor;
A multi-cavity wiring board having a wiring conductor formed on the second insulating layer and having one end connected to one of the folded patterns of the second connecting conductor,
At least one of the first connection conductor and the second connection conductor has a folded pattern that is not connected to the wiring conductor;
The folded pattern that is not connected to the wiring conductor is connected to a folded pattern formed on a different insulating layer in the same wiring board region with a via.

また、上記課題を解決するための本発明の請求項2に記載の多数個取り配線基板は、
上記第1連結導体を、上記蛇行領域と、上記第1絶縁層上の縦の境界線と横の境界線の交点を囲むループとで形成し、
上記第2連結導体を、上記蛇行領域と、上記第2絶縁層上の縦の境界線と横の境界線の交点を囲むループとで形成し、
上記第1連結導体のループと第2連結導体のループとをビアで接続したことを特徴とする請求項1に記載の多数個取り配線基板である。
Moreover, the multi-cavity wiring board according to claim 2 of the present invention for solving the above problems is
The first connecting conductor is formed by the meandering region and a loop surrounding an intersection of a vertical boundary line and a horizontal boundary line on the first insulating layer,
The second connecting conductor is formed by the meandering region and a loop surrounding an intersection of a vertical boundary line and a horizontal boundary line on the second insulating layer;
The multi-piece wiring board according to claim 1, wherein the loop of the first connecting conductor and the loop of the second connecting conductor are connected by vias.

本発明の請求項1に記載の多数個取り配線基板によれば、第1連結導体と第2連結導体のうちの少なくとも一方は配線導体に接続されない折り返しパターンを有し、上記配線導体に接続されない折り返しパターンは同一配線基板領域内の異なる絶縁層上に形成された折り返しパターンにビアで接続されている。
このため、第1連結導体とそれに接続される配線導体とで構成されるめっき用回路の電気抵抗と、第2連結導体とそれに接続される配線導体とで構成されるめっき用回路の電気抵抗との差をきわめて小さいものとすることができる。したがって、第1絶縁層上の配線導体に被着されるめっき厚みと第2絶縁層上の配線導体に被着されるめっき厚みの差をきわめて小さいものとすることができる。
また、ビアで接続されている第1絶縁層上の折り返しパターンと第2絶縁層上の折り返しパターンの両方に配線導体が接続されていると、多層基板を各配線基板領域に分割した後も、上記ビアを介して同一配線基板領域内の異なる絶縁層上の配線導体同士が分断されず短絡されたままとなる。このためビアで互いに接続される折り返しパターンの少なくとも一方には配線導体を接続させないようにすることにより、多層基板を各配線基板領域に分割した後に上記ビアを介して同一配線基板領域内の異なる絶縁層上の配線導体同士が短絡されたままにならないようにしている。
According to the multi-cavity wiring board according to claim 1 of the present invention, at least one of the first connecting conductor and the second connecting conductor has a folded pattern that is not connected to the wiring conductor, and is not connected to the wiring conductor. The folded pattern is connected to the folded pattern formed on different insulating layers in the same wiring board region by vias.
For this reason, the electrical resistance of the circuit for plating comprised by the 1st connection conductor and the wiring conductor connected to it, and the electrical resistance of the circuit for plating comprised by the 2nd connection conductor and the wiring conductor connected to it, The difference can be very small. Therefore, the difference between the plating thickness deposited on the wiring conductor on the first insulating layer and the plating thickness deposited on the wiring conductor on the second insulating layer can be made extremely small.
Further, when the wiring conductor is connected to both the folded pattern on the first insulating layer and the folded pattern on the second insulating layer connected by vias, even after dividing the multilayer board into each wiring board region, Through the vias, the wiring conductors on different insulating layers in the same wiring board region are not divided and remain short-circuited. For this reason, the wiring conductor is not connected to at least one of the folded patterns connected to each other by vias, so that after the multilayer substrate is divided into the respective wiring substrate regions, different insulations in the same wiring substrate region are provided via the vias. The wiring conductors on the layer are not short-circuited.

本発明の請求項2に記載の多数個取り配線基板によれば、請求項1に記載の第1連結導体と第2連結導体のそれぞれにループを形成するとともに、第1連結導体のループと第2連結導体のループをビアで接続している。
このため、第1連結導体とそれに接続される第1配線導体とで構成されるめっき用回路の電気抵抗と、第2連結導体とそれに接続される第2配線導体とで構成されるめっき用回路の電気抵抗との差をさらに小さいものとすることができる。したがって、第1絶縁層上の配線導体に被着されるめっき厚みと第2絶縁縁層上の配線導体に被着されるめっき厚みの差をさらに小さいものとすることができる。
According to the multiple wiring substrate according to claim 2 of the present invention, a loop is formed in each of the first connecting conductor and the second connecting conductor according to claim 1, and the loop of the first connecting conductor and the second connecting conductor are formed. Two connecting conductor loops are connected by vias.
For this reason, the electric resistance of the circuit for plating comprised by the 1st connection conductor and the 1st wiring conductor connected to it, and the circuit for plating comprised by the 2nd connection conductor and the 2nd wiring conductor connected to it The difference from the electrical resistance can be further reduced. Therefore, the difference between the plating thickness applied to the wiring conductor on the first insulating layer and the plating thickness applied to the wiring conductor on the second insulating edge layer can be further reduced.

本発明の実施形態1に係る多数個取り配線基板の平面図The top view of the multi-cavity wiring board which concerns on Embodiment 1 of this invention 図1のA−A線に沿った断面図Sectional drawing along the AA line of FIG. 図3(a)は図1の多数個取り配線基板10の絶縁層1bの部分平面図、図3(b)は図1の多数個取り配線基板10の絶縁層1cの部分平面図3A is a partial plan view of the insulating layer 1b of the multi-cavity wiring board 10 of FIG. 1, and FIG. 3B is a partial plan view of the insulating layer 1c of the multi-cavity wiring board 10 of FIG. 図4(a)は図3(a)の第1連結導体21−1の構成を説明するための部分拡大図、図4(b)は図3(b)の第2連結導体21−2の構成を説明するための部分拡大図FIG. 4A is a partially enlarged view for explaining the configuration of the first connecting conductor 21-1 in FIG. 3A, and FIG. 4B shows the second connecting conductor 21-2 in FIG. Partial enlarged view for explaining the configuration 図5(a)は本発明の実施形態2に係る多数個取り配線基板10の絶縁層1bの部分平面図、図5(b)は絶縁層1cの部分平面図5A is a partial plan view of the insulating layer 1b of the multi-piece wiring board 10 according to the second embodiment of the present invention, and FIG. 5B is a partial plan view of the insulating layer 1c. 図6(a)は図5(a)の第1連結導体21−1の構成を説明するための部分拡大図、図6(b)は図5(b)の第2連結導体21−2の構成を説明するための部分拡大図6A is a partially enlarged view for explaining the configuration of the first connection conductor 21-1 in FIG. 5A, and FIG. 6B is a view of the second connection conductor 21-2 in FIG. 5B. Partial enlarged view for explaining the configuration 本発明の実施形態3に係る多数個取り配線基板の部分拡大図Partial enlarged view of multi-cavity wiring board according to Embodiment 3 of the present invention 本発明の実施形態1の変形例を示す部分拡大図The elements on larger scale which show the modification of Embodiment 1 of this invention 電子部品収納用パッケージに用いられる小型の配線基板の断面図Cross-sectional view of a small wiring board used for electronic component storage packages 従来の多数個取り配線基板の平面図Plan view of a conventional multi-cavity wiring board 図10のA−A線に沿った断面図Sectional drawing along the AA line of FIG. 図12(a)は図10の多数個取り配線基板70の絶縁層71bの部分平面図、図12(b)は図10の多数個取り配線基板70の絶縁層71cの部分平面図12A is a partial plan view of the insulating layer 71b of the multi-piece wiring board 70 of FIG. 10, and FIG. 12B is a partial plan view of the insulating layer 71c of the multi-piece wiring board 70 of FIG.

[実施形態1]
以下、図面を参照しながら本発明の実施形態の一例を説明する。図1は本発明の多数個取り配線基板の平面図、図2は図1のA−A線に沿った断面図を示し、アルミナ等のセラミックス焼結体からなる複数の絶縁層1a乃至1dが積層されたセラミック多層基板1で構成される。セラミック多層基板1の中央部には分割後に配線基板となる複数の配線基板領域2が縦横に配され、外周には分割時に配線基板領域2から切り離される捨て代領域15が形成されている。配線基板領域2の各々はその上面に電子部品を収容するためのキャビティ3を有するとともに、キャビティ3内に複数の段差4が設けられている。各々の段差4上には、タングステンやモリブデン等の導体ペーストの印刷・焼付けによって形成される複数の配線導体5が設けられている。配線導体5は絶縁層1a乃至1cを貫通するビア6を介して配線基板領域2の下面7の配線導体5に接続されている。
そして、各配線導体5の露出表面には例えば厚みが1〜10μm程度のニッケルめっき層と厚みが0.1〜3μm程度の金めっき層とからなるめっき層8が電解めっき法により被着されている。
なお、図1、図2の多数個取り配線基板10では、キャビティ3内に2つの段差4―1、4−2を設け、各々の段差上にそれぞれ第1配線導体5−1、第2配線導体5−2を設けている。
捨て代領域15の側面には切り欠き16が形成され、切り欠き16の内壁に沿って導体層からなるめっき電極17が形成されている。このめっき電極17をめっき用電源に接続することにより、すべての配線導体の露出面に電解めっきのための電荷が印加される。
[Embodiment 1]
Hereinafter, an example of an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a plan view of a multi-piece wiring board according to the present invention, FIG. 2 is a cross-sectional view taken along the line AA in FIG. 1, and a plurality of insulating layers 1a to 1d made of a ceramic sintered body such as alumina are provided. The laminated ceramic multilayer substrate 1 is used. A plurality of wiring board regions 2 that become wiring boards after division are arranged vertically and horizontally in the central portion of the ceramic multilayer substrate 1, and a disposal margin area 15 that is separated from the wiring board region 2 at the time of division is formed on the outer periphery. Each of the wiring board regions 2 has a cavity 3 for accommodating electronic components on the upper surface thereof, and a plurality of steps 4 are provided in the cavity 3. A plurality of wiring conductors 5 formed by printing / baking a conductive paste such as tungsten or molybdenum is provided on each step 4. The wiring conductor 5 is connected to the wiring conductor 5 on the lower surface 7 of the wiring board region 2 through a via 6 penetrating the insulating layers 1a to 1c.
Then, a plating layer 8 composed of, for example, a nickel plating layer having a thickness of about 1 to 10 μm and a gold plating layer having a thickness of about 0.1 to 3 μm is deposited on the exposed surface of each wiring conductor 5 by an electrolytic plating method. Yes.
1 and FIG. 2, two steps 4-1 and 4-2 are provided in the cavity 3, and the first wiring conductor 5-1 and the second wiring are provided on each step. A conductor 5-2 is provided.
A cutout 16 is formed on the side surface of the discard margin region 15, and a plating electrode 17 made of a conductor layer is formed along the inner wall of the cutout 16. By connecting the plating electrode 17 to a plating power source, a charge for electrolytic plating is applied to the exposed surfaces of all the wiring conductors.

次に、各配線導体5に電解めっき法によりニッケルめっき層や金めっき層を被着させるためにすべての配線導体5をめっき電極17に接続させる本実施例の手順について、図3、図4を用いて説明する。図3(a)は本実施例に係る多数個取り配線基板10の絶縁層1bの部分平面図、図3(b)は絶縁層1cの部分平面図、図4(a)は第1連結導体21−1の構成を説明するための部分拡大図、図4(b)は第2連結導体21−2の構成を説明するための部分拡大図である。
図3(a)において、絶縁層1b外周の捨て代領域15には、四角枠状のめっき用共通導体枠20が形成されている。このめっき用共通導体枠20はめっき電極17に接続されている。隣接する配線基板領域2と配線基板領域2の間には、境界線14の左右に交互に連続して配置された略コの字状の折り返しパターン24からなる蛇行領域を有する第1連結導体21−1が形成され、第1連結導体21−1の両端は引出し線23を介してめっき用共通導体枠20に接続されている。尚、引出し線23の数は図3に示すように1本でも構わないし、図6のように2本に分岐する形状でも構わない。
各配線基板領域2の中央には、キャビティ3を形成するための開口22が形成され、開口22の周囲から配線基板領域2の境界線14に伸びる第1配線導体5−1が形成されている。第1配線導体5−1はビア6を介して配線基板領域2の下面7の配線導体5に接続されている。
第1配線導体5−1のうち、捨て代領域15との境界線14に伸びるものは引出し線23を介してめっき用共通導体枠20に接続されている。第1配線導体5−1のうち、隣接する配線基板領域2と配線基板領域2との境界線14に伸びるものは、第1連結導体21−1の折り返しパターン24a(図4参照)の内の1つに接続されている。
このようにして、第1配線導体5−1と、第1配線導体5−1にビア6を介して接続される下面7の配線導体5とは、引出し線23、第1連結導体21−1、めっき用共通導体枠20を介してめっき電極17に接続される。
同様に、図3(b)に示す第2配線導体5−2と、第2配線導体5−2にビア6を介して接続される下面7の配線導体5とは、引出し線23、第2連結導体21−2、めっき用共通導体枠20を介してめっき電極17に接続される。
このめっき電極17をめっき用電源に接続することにより、配線導体5の露出面に電解めっきによるめっき層8が被着される。そして、連結導体21−1、21−2を介して電気的に接続されている各配線基板領域2の隣接する配線導体5同士は、セラミック多層基板1を各配線基板領域2に分割した後、連結導体21−1、21−2が折り返しパターン単位に分断されることにより、それぞれが互いに電気的に独立することとなる。
Next, FIG. 3 and FIG. 4 are used to explain the procedure of this embodiment in which all the wiring conductors 5 are connected to the plating electrodes 17 in order to deposit the nickel plating layer or the gold plating layer on each wiring conductor 5 by electrolytic plating. It explains using. 3A is a partial plan view of the insulating layer 1b of the multi-piece wiring board 10 according to the present embodiment, FIG. 3B is a partial plan view of the insulating layer 1c, and FIG. 4A is a first connecting conductor. FIG. 4B is a partially enlarged view for explaining the configuration of the second connecting conductor 21-2.
In FIG. 3A, a rectangular frame-shaped common conductor frame 20 for plating is formed in the discard margin region 15 on the outer periphery of the insulating layer 1b. The plating common conductor frame 20 is connected to the plating electrode 17. Between the adjacent wiring board area | regions 2 and the wiring board area | region 2, the 1st connection conductor 21 which has the meandering area | region which consists of the substantially U-shaped folding pattern 24 arrange | positioned alternately on either side of the boundary line 14 continuously. -1 is formed, and both ends of the first connecting conductor 21-1 are connected to the common conductor frame 20 for plating via lead wires 23. Incidentally, the number of the lead lines 23 may be one as shown in FIG. 3, or may be branched into two as shown in FIG.
An opening 22 for forming the cavity 3 is formed at the center of each wiring board region 2, and a first wiring conductor 5-1 extending from the periphery of the opening 22 to the boundary line 14 of the wiring board region 2 is formed. . The first wiring conductor 5-1 is connected to the wiring conductor 5 on the lower surface 7 of the wiring board region 2 through the via 6.
Among the first wiring conductors 5-1, the one extending to the boundary line 14 with the disposal margin region 15 is connected to the plating common conductor frame 20 through the lead wire 23. Among the first wiring conductors 5-1, the one extending to the boundary line 14 between the adjacent wiring board region 2 and the wiring board region 2 is included in the folded pattern 24 a (see FIG. 4) of the first connection conductor 21-1. Connected to one.
In this way, the first wiring conductor 5-1 and the wiring conductor 5 on the lower surface 7 connected to the first wiring conductor 5-1 via the via 6 are connected to the lead wire 23 and the first connecting conductor 21-1. The plating electrode 17 is connected via the plating common conductor frame 20.
Similarly, the second wiring conductor 5-2 shown in FIG. 3B and the wiring conductor 5 on the lower surface 7 connected to the second wiring conductor 5-2 through the via 6 are the lead wire 23, the second wiring conductor 5 and the second wiring conductor 5-2. It is connected to the plating electrode 17 through the connecting conductor 21-2 and the common conductor frame 20 for plating.
By connecting the plating electrode 17 to a plating power source, the plating layer 8 by electrolytic plating is deposited on the exposed surface of the wiring conductor 5. Then, the adjacent wiring conductors 5 of each wiring board region 2 electrically connected via the connecting conductors 21-1 and 21-2, after dividing the ceramic multilayer substrate 1 into each wiring board region 2, The connection conductors 21-1 and 21-2 are divided into folded pattern units, so that they are electrically independent from each other.

多数個取り配線基板10は、図4(a)に示すように、第1連結導体21−1が、第1配線導体5−1に接続される折り返しパターン24aと、第1配線導体5−1に接続されない折り返しパターン24bを有している。同様に、図4(b)に示すように、第2連結導体21−2が、第2配線導体5−2に接続される折り返しパターン24cと、第2配線導体5−2に接続されない折り返しパターン24dを有している。そして、第1配線導体5−1に接続されない折り返しパターン24bと第2配線導体5−2に接続されない折り返しパターン24dとは平面視で略同位置に形成されるとともに、ビア25で接続されている。
このため、第1連結導体21−1とそれに接続される第1配線導体5―1とで構成されるめっき用回路と、第2連結導体21−2とそれに接続される第2配線導体5−2とで構成されるめっき用回路をビア25で短絡させているので、上記2つのめっき用回路の電気抵抗の差をきわめて小さいものとすることができる。したがって、第1配線導体5−1に被着されるめっき厚みと第2配線導体5−2に被着されるめっき厚みの差をきわめて小さいものとすることができる。
また、ビア25で接続されている折り返しパターン24bと折り返しパターン24dに配線導体5(5−1、5−2)が接続されていると、セラミック多層基板1を各配線基板領域2に分割した後も、ビア25を介して同一配線基板領域内の異なる絶縁層上の配線導体5−1、5−2同士が分断されず短絡されたままとなる。このためビア25で互いに接続される折り返しパターン24b、24dには配線導体5−1、5−2を接続させないようにすることにより、多層基板1を各配線基板領域2に分割した後にビア25を介して同一配線基板領域内の異なる絶縁層上の配線導体5−1、5−2同士が短絡されたままにならないようにしている。
As shown in FIG. 4A, the multi-piece wiring board 10 includes a folded pattern 24a in which the first connection conductor 21-1 is connected to the first wiring conductor 5-1, and the first wiring conductor 5-1. The folded pattern 24b is not connected to the. Similarly, as shown in FIG. 4B, the second connecting conductor 21-2 has a folded pattern 24c connected to the second wiring conductor 5-2 and a folded pattern not connected to the second wiring conductor 5-2. 24d. The folded pattern 24b that is not connected to the first wiring conductor 5-1 and the folded pattern 24d that is not connected to the second wiring conductor 5-2 are formed at substantially the same position in plan view and are connected by the via 25. .
For this reason, the circuit for plating comprised by the 1st connection conductor 21-1 and the 1st wiring conductor 5-1 connected to it, the 2nd connection conductor 21-2, and the 2nd wiring conductor 5- connected to it 2 is short-circuited by the via 25, the difference in electrical resistance between the two plating circuits can be made extremely small. Therefore, the difference between the plating thickness deposited on the first wiring conductor 5-1 and the plating thickness deposited on the second wiring conductor 5-2 can be made extremely small.
Further, when the wiring conductor 5 (5-1, 5-2) is connected to the folded pattern 24b and the folded pattern 24d connected by the via 25, the ceramic multilayer substrate 1 is divided into the respective wiring substrate regions 2. In addition, the wiring conductors 5-1 and 5-2 on different insulating layers in the same wiring board region are not divided and are short-circuited via the via 25. For this reason, by not connecting the wiring conductors 5-1 and 5-2 to the folded patterns 24 b and 24 d connected to each other by the via 25, the via 25 is formed after the multilayer substrate 1 is divided into the wiring substrate regions 2. Thus, the wiring conductors 5-1 and 5-2 on different insulating layers in the same wiring board region are not short-circuited.

[実施形態2]
実施形態1では、第1連結導体21−1と第2連結導体21−2の両方に、配線導体5に接続されない折り返しパターン24b、24dを形成し、折り返しパターン24b、24d同士をビア25で接続していた。これに対して実施形態2では、図5乃至図6のように、第1連結導体21−1は、第1配線導体5−1に接続される折り返しパターン24aと、第1配線導体5−1に接続されない折り返しパターン24bを有しているのに対して、第2連結導体21−2は、第2配線導体5−2に接続される折り返しパターン24cのみを有している。そして、第1配線導体5−1に接続されない折り返しパターン24bは第2配線導体5−2に接続されている折り返しパターン24cにビア25で接続されている。
本実施形態においても、第1連結導体21−1とそれに接続される第1配線導体5―1とで構成されるめっき用回路と、第2連結導体21−2とそれに接続される第2配線導体5−2とで構成されるめっき用回路の電気抵抗の差をきわめて小さいものとすることができ、第1配線導体5−1に被着されるめっき厚みと第2配線導体5−2に被着されるめっき厚みの差をきわめて小さいものとすることができる。
また、本実施形態のように、ビア25で互いに接続される折り返しパターンの一方24bのみに配線導体5−1を接続させないようにすることによっても、多層基板1を各配線基板領域2に分割した後にビア25を介して同一配線基板領域内の異なる絶縁層上の配線導体5−1、5−2同士が短絡されたままにならないようにすることができる。
[Embodiment 2]
In the first embodiment, the folded patterns 24b and 24d that are not connected to the wiring conductor 5 are formed on both the first connecting conductor 21-1 and the second connecting conductor 21-2, and the folded patterns 24b and 24d are connected to each other through the via 25. Was. On the other hand, in the second embodiment, as shown in FIGS. 5 to 6, the first connecting conductor 21-1 has the folded pattern 24 a connected to the first wiring conductor 5-1 and the first wiring conductor 5-1. The second connection conductor 21-2 has only the folding pattern 24c connected to the second wiring conductor 5-2, whereas the folding pattern 24b is not connected to the second wiring conductor 5-2. The folded pattern 24b not connected to the first wiring conductor 5-1 is connected by a via 25 to the folded pattern 24c connected to the second wiring conductor 5-2.
Also in the present embodiment, a plating circuit composed of the first connecting conductor 21-1 and the first wiring conductor 5-1 connected thereto, and the second connecting conductor 21-2 and the second wiring connected thereto. The difference in electrical resistance of the plating circuit composed of the conductor 5-2 can be made extremely small, and the plating thickness deposited on the first wiring conductor 5-1 and the second wiring conductor 5-2 The difference in the plating thickness to be deposited can be made extremely small.
Further, as in the present embodiment, the multilayer substrate 1 is also divided into the respective wiring substrate regions 2 by not connecting the wiring conductor 5-1 to only one of the folded patterns 24b connected to each other by the via 25. It is possible to prevent the wiring conductors 5-1 and 5-2 on different insulating layers in the same wiring board region from being short-circuited via the via 25 later.

[実施形態3]
実施形態1と実施形態2では、第1連結導体21−1と第2連結導体21−2は、全領域が蛇行領域で形成されていた。これに対して本実施形態では、第1連結導体21−1と第2連結導体21−2を、図7のように第1蛇行領域26−1、第2蛇行領域26−2と、縦の境界線14yと横の境界線14xの交点27を囲むループ28−1、28−2とで構成し、第1連結導体21−1の第1ループ28−1と第2連結導体21−2の第2ループ28−2をビア29で接続している。
このため、第1連結導体21−1とそれに接続される第1配線導体5−1とで構成されるめっき用回路の電気抵抗と、第2連結導体21−2とそれに接続される第2配線導体5−2とで構成されるめっき用回路の電気抵抗との差をさらに小さいものとすることができる。したがって、第1配線導体5−1に被着されるめっき厚みと第2配線導体5−2に被着されるめっき厚みの差をさらに小さいものとすることができる。
[Embodiment 3]
In the first embodiment and the second embodiment, the first connection conductor 21-1 and the second connection conductor 21-2 are all formed in a meandering region. On the other hand, in this embodiment, the first connecting conductor 21-1 and the second connecting conductor 21-2 are connected to the first meandering region 26-1 and the second meandering region 26-2 as shown in FIG. The loops 28-1 and 28-2 surround the intersection 27 of the boundary line 14y and the horizontal boundary line 14x, and the first loop 28-1 and the second connection conductor 21-2 of the first connection conductor 21-1 are formed. The second loop 28-2 is connected by a via 29.
For this reason, the electrical resistance of the circuit for plating comprised by the 1st connection conductor 21-1 and the 1st wiring conductor 5-1 connected to it, the 2nd connection conductor 21-2, and the 2nd wiring connected to it The difference with the electric resistance of the circuit for plating comprised with the conductor 5-2 can be made still smaller. Therefore, the difference between the plating thickness applied to the first wiring conductor 5-1 and the plating thickness applied to the second wiring conductor 5-2 can be further reduced.

(実施例)
まず、図1乃至図4に示すめっき前の多数個取り配線基板10を作成した。次に、作成した多数個取り配線基板10の任意の配線基板領域2について、第1内部電極11−1からめっき電極17までの抵抗値と第2内部電極11−2からめっき電極17までの抵抗値を測定した。次に、めっき電極17にめっき用電源を接続して電解めっき法でニッケルめっきを施した後、上記抵抗値を測定した内部電極11−1、11−2に形成されたニッケルめっきの厚みを測定した。結果を表1に示す。
比較例として図10乃至図12に示すめっき前の多数個取り配線基板70を作成し、上記の抵抗値を測定した配線基板領域2と同じ位置の配線基板領域72について、絶縁層71b上の内部電極81(第1内部電極11−1に対応)からめっき電極87までの抵抗値と、絶縁層71c上の内部電極81(第2内部電極11−2に対応)からめっき電極87までの抵抗値を測定した。次に、めっき電極87にめっき用電源を接続して電解めっき法でニッケルめっきを施した後、上記抵抗値を測定した内部電極81に形成されたニッケルめっきの厚みを測定した。結果を表1に示す。
(Example)
First, a multi-piece wiring board 10 before plating shown in FIGS. 1 to 4 was prepared. Next, the resistance value from the first internal electrode 11-1 to the plating electrode 17 and the resistance value from the second internal electrode 11-2 to the plating electrode 17 for an arbitrary wiring board region 2 of the prepared multi-piece wiring board 10. The value was measured. Next, after connecting a plating power source to the plating electrode 17 and performing nickel plating by an electrolytic plating method, the thickness of the nickel plating formed on the internal electrodes 11-1 and 11-2 where the resistance values were measured is measured. did. The results are shown in Table 1.
As a comparative example, a multi-cavity wiring board 70 before plating shown in FIGS. 10 to 12 was prepared, and the wiring board area 72 at the same position as the wiring board area 2 where the resistance value was measured was measured on the insulating layer 71b. A resistance value from the electrode 81 (corresponding to the first internal electrode 11-1) to the plating electrode 87, and a resistance value from the internal electrode 81 (corresponding to the second internal electrode 11-2) on the insulating layer 71c to the plating electrode 87 Was measured. Next, a plating power source was connected to the plating electrode 87 and nickel plating was performed by an electrolytic plating method, and then the thickness of the nickel plating formed on the internal electrode 81 where the resistance value was measured was measured. The results are shown in Table 1.

Figure 0006120368
Figure 0006120368

表1に示すように、実施例の多数個取り配線基板は、比較例に比べて第1内部電極と第2内部電極の抵抗値の差が減少し、第1内部電極に被着されたニッケルめっきの厚みと第2電極に形成されたニッケルめっきの厚みの差が減少していることが確認できた。   As shown in Table 1, in the multi-cavity wiring board of the example, the difference in resistance value between the first internal electrode and the second internal electrode is reduced as compared with the comparative example, and nickel deposited on the first internal electrode It was confirmed that the difference between the thickness of the plating and the thickness of the nickel plating formed on the second electrode was reduced.

本実施例ではニッケルめっきを行ったときの厚みばらつきについて説明したが、ニッケルめっきの上に金めっきを行った場合の金めっきの厚みばらつきも低減できる事はいうまでも無い。   In this embodiment, the thickness variation when nickel plating is described, but it goes without saying that the thickness variation of gold plating when gold plating is performed on nickel plating can also be reduced.

1…セラミック多層基板 1a、1b、1c、1d…絶縁層 2…配線基板領域
3…キャビティ 4、4−1、4−2…段差 5…配線導体 5−1…第1配線導体
5−2…第2配線導体 6…ビア 7…下面 8…めっき層 10…多数個取り配線基板
11−1…第1内部電極 11−2…第2内部電極 12…外部電極
14…境界線 15…捨て代領域 16…切り欠き 17…めっき電極
20…めっき用共通導体枠 21−1…第1連結導体 21−2…第2連結導体
22…開口 23…引出し線 24、24a、24b、24c、24d…折り返しパターン
25…ビア 26−1…第1蛇行領域 26−2…第2蛇行領域 27…交点
28−1…第1ループ 28−2…第2ループ 29…ビア
DESCRIPTION OF SYMBOLS 1 ... Ceramic multilayer substrate 1a, 1b, 1c, 1d ... Insulating layer 2 ... Wiring board area | region 3 ... Cavity 4, 4-1, 4-2 ... Level | step difference 5 ... Wiring conductor 5-1 ... 1st wiring conductor 5-2 ... 2nd wiring conductor 6 ... Via 7 ... Bottom surface 8 ... Plating layer 10 ... Multi-cavity wiring substrate 11-1 ... First internal electrode 11-2 ... Second internal electrode 12 ... External electrode 14 ... Boundary line 15 ... Disposal allowance area DESCRIPTION OF SYMBOLS 16 ... Notch 17 ... Plating electrode 20 ... Common conductor frame for plating 21-1 ... 1st connection conductor 21-2 ... 2nd connection conductor 22 ... Opening 23 ... Lead wire 24, 24a, 24b, 24c, 24d ... Folding pattern 25 ... via 26-1 ... first meandering region 26-2 ... second meandering region 27 ... intersection 28-1 ... first loop 28-2 ... second loop 29 ... via

Claims (2)

複数の絶縁層が積層された多層基板と、
上記多層基板の中央部に位置し、境界線によって区切られた配線基板領域が縦横に配列された製品領域と、
上記製品領域の外周に位置し、めっき電極を有する捨て代領域と、
上記絶縁層のうちの第1絶縁層上に形成されて、上記境界線の左右に交互に連続して配置された折り返しパターンからなる蛇行領域を有すると共に、少なくとも一端が上記めっき電極に接続された第1連結導体と、
上記絶縁層のうちの第2絶縁層上に形成されて、上記境界線の左右に交互に連続して配置された折り返しパターンからなる蛇行領域を有すると共に、少なくとも一端が上記めっき電極に接続された第2連結導体と、
上記第1絶縁層上に形成されて一端が上記第1連結導体の折り返しパターンの1つに接続された配線導体と、
上記第2絶縁層上に形成されて一端が上記第2連結導体の折り返しパターンの1つに接続された配線導体とを有する多数個取り配線基板において、
上記第1連結導体と第2連結導体のうちの少なくとも一方は上記配線導体に接続されない折り返しパターンを有し、
上記配線導体に接続されない折り返しパターンは同一配線基板領域内の異なる絶縁層上に形成された折り返しパターンにビアで接続されていることを特徴とする多数個取り配線基板。
A multilayer substrate in which a plurality of insulating layers are laminated;
A product area in which the wiring board area located at the center of the multilayer board and arranged by the boundary line is arranged vertically and horizontally;
Located on the outer periphery of the product area, abandon area having a plating electrode,
The meandering region is formed on the first insulating layer of the insulating layers, and has a meandering pattern having a folded pattern alternately and continuously arranged on the left and right of the boundary line, and at least one end is connected to the plating electrode. A first connecting conductor;
The meandering region is formed on the second insulating layer of the insulating layers, and has a meandering pattern having a folded pattern alternately and continuously arranged on the left and right of the boundary line, and at least one end is connected to the plating electrode. A second connecting conductor;
A wiring conductor formed on the first insulating layer and having one end connected to one of the folded patterns of the first connecting conductor;
A multi-cavity wiring board having a wiring conductor formed on the second insulating layer and having one end connected to one of the folded patterns of the second connecting conductor,
At least one of the first connection conductor and the second connection conductor has a folded pattern that is not connected to the wiring conductor;
A multi-piece wiring board, wherein the folded pattern not connected to the wiring conductor is connected to a folded pattern formed on a different insulating layer in the same wiring board region by a via.
上記第1連結導体を、上記蛇行領域と、上記第1絶縁層上の縦の境界線と横の境界線の交点を囲むループとで形成し、
上記第2連結導体を、上記蛇行領域と、上記第2絶縁層上の縦の境界線と横の境界線の交点を囲むループとで形成し、
上記第1連結導体のループと第2連結導体のループとをビアで接続したことを特徴とする請求項1に記載の多数個取り配線基板。
The first connecting conductor is formed by the meandering region and a loop surrounding an intersection of a vertical boundary line and a horizontal boundary line on the first insulating layer,
The second connecting conductor is formed by the meandering region and a loop surrounding an intersection of a vertical boundary line and a horizontal boundary line on the second insulating layer;
The multi-piece wiring board according to claim 1, wherein the loop of the first connection conductor and the loop of the second connection conductor are connected by a via.
JP2013127199A 2013-06-18 2013-06-18 Multi-wiring board Active JP6120368B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013127199A JP6120368B2 (en) 2013-06-18 2013-06-18 Multi-wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013127199A JP6120368B2 (en) 2013-06-18 2013-06-18 Multi-wiring board

Publications (2)

Publication Number Publication Date
JP2015002307A JP2015002307A (en) 2015-01-05
JP6120368B2 true JP6120368B2 (en) 2017-04-26

Family

ID=52296635

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013127199A Active JP6120368B2 (en) 2013-06-18 2013-06-18 Multi-wiring board

Country Status (1)

Country Link
JP (1) JP6120368B2 (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3274971B2 (en) * 1996-06-17 2002-04-15 京セラ株式会社 Wiring board
JP2000012989A (en) * 1998-06-18 2000-01-14 Murata Mfg Co Ltd Aggregate substrate and unit substrate formed by splitting the same
JP4404460B2 (en) * 2000-08-09 2010-01-27 京セラ株式会社 Multi-cavity wiring board, wiring board, multi-cavity semiconductor element storage package and semiconductor element storage package
JP4565383B2 (en) * 2004-10-07 2010-10-20 日立金属株式会社 Multilayer ceramic substrate with cavity and method for manufacturing the same
JP2009194000A (en) * 2008-02-12 2009-08-27 Ngk Spark Plug Co Ltd Multiple wiring board

Also Published As

Publication number Publication date
JP2015002307A (en) 2015-01-05

Similar Documents

Publication Publication Date Title
US9412509B2 (en) Multilayer electronic component having conductive patterns and board having the same
US10014111B2 (en) Substrate terminal mounted electronic element
JP6030351B2 (en) Wiring board and electronic device
JP5182448B2 (en) Component built-in board
CN101996766A (en) Electronic component and manufacturing method thereof
JP4676964B2 (en) Multi-chip substrate
JP2000294899A (en) Mother substrate, child substrate and method of manufacturing the same
KR20160000329A (en) Multi-layered inductor and board having the same mounted thereon
JP5958454B2 (en) Built-in module
JP6151572B2 (en) Electronic device mounting substrate and electronic device
JP5738109B2 (en) Multiple wiring board
JP6120368B2 (en) Multi-wiring board
JP5956185B2 (en) Multiple wiring board
JP3838935B2 (en) Multi-wiring board
JP4605945B2 (en) Multi-circuit board and method for manufacturing electronic device
JP5966146B2 (en) Multilayer electronic component and manufacturing method thereof
JP4272507B2 (en) Multiple wiring board
JP4458933B2 (en) Multiple wiring board
JP4388410B2 (en) Multiple wiring board
JP6121860B2 (en) Wiring board and electronic device
JPWO2014046133A1 (en) Electronic component storage package and electronic device
JP6465611B2 (en) Electronic component, wiring board with built-in electronic component, and manufacturing method thereof
JP4272506B2 (en) Multiple wiring board
JP4272560B2 (en) Multiple wiring board
JP2006100546A (en) Multi-circuit board, electronic component storage package and electronic device

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20160429

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20170216

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20170323

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20170323

R150 Certificate of patent or registration of utility model

Ref document number: 6120368

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250