JP6144052B2 - Film-coated substrate and method for forming the same - Google Patents
Film-coated substrate and method for forming the same Download PDFInfo
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- JP6144052B2 JP6144052B2 JP2013003100A JP2013003100A JP6144052B2 JP 6144052 B2 JP6144052 B2 JP 6144052B2 JP 2013003100 A JP2013003100 A JP 2013003100A JP 2013003100 A JP2013003100 A JP 2013003100A JP 6144052 B2 JP6144052 B2 JP 6144052B2
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- 238000001035 drying Methods 0.000 claims description 50
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- 239000012528 membrane Substances 0.000 claims description 30
- 229910052751 metal Inorganic materials 0.000 claims description 17
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Description
本発明は、膜形成方法、及び、膜に関する。 The present invention relates to a film forming method and a film.
従来より、基板における段差を有する膜形成面に「金属粉末又はセラミックス粉末、有機バインダ、及び溶剤を少なくとも含んで構成される膜」を形成する手法として、スクリーン印刷法、接触式ディスペンサ法、スピンコート法、ダイコーター法、ディップコート法、テープ貼り付け法等が広く知られている。 Conventionally, screen printing, contact dispenser, spin coating have been used as a method for forming a “film comprising at least a metal powder or ceramic powder, an organic binder, and a solvent” on a film forming surface having a step in a substrate. A method, a die coater method, a dip coating method, a tape attaching method and the like are widely known.
しかしながら、上述の種々の手法では、「特に段差を跨ぐ部分において膜厚に大きなばらつきが生じ易い」、「一回の膜形成処理では、比較的大きな膜厚を得ることができない」等の問題があった。 However, the above-mentioned various methods have problems such as “a large variation in film thickness is likely to occur particularly in a portion across a level difference” and “a relatively large film thickness cannot be obtained by a single film formation process”. there were.
更には、膜厚が比較的大きい場合において膜厚のばらつきが大きいと、その後の乾燥・焼成工程時にて、膜にクラックや剥離(以下、「クラック等」と呼ぶ)が発生する、という問題が生じ易い(詳細は後述する。後述する図7を参照)。 Furthermore, if the film thickness is relatively large when the film thickness is relatively large, there is a problem that cracks and peeling (hereinafter referred to as “cracks”) occur in the film during the subsequent drying / firing process. (It will be described later in detail. See FIG. 7 described later).
ところで、近年、液体を液滴として吐出する装置(液滴吐出装置、インクジェットディスペンサ)を用いて、膜形成面に複数の液滴を吐出することによって、前記膜形成面に膜を形成する手法(液滴吐出法、インクジェット法)が広く知られてきている(例えば、特許文献1〜3を参照)。この液滴吐出法を採用すれば、上述の種々の手法と比べて、一回の膜形成処理で比較的大きな膜厚を得ることができ、且つ、段差を跨ぐ部分においても膜厚のばらつきを小さくすることができる。 By the way, in recent years, a method of forming a film on the film forming surface by discharging a plurality of liquid droplets onto the film forming surface using a device that discharges liquid as droplets (droplet discharging device, inkjet dispenser) ( A droplet discharge method and an ink jet method are widely known (see, for example, Patent Documents 1 to 3). By adopting this droplet discharge method, it is possible to obtain a relatively large film thickness by a single film formation process as compared with the above-mentioned various methods, and the variation in film thickness also in the portion across the step. Can be small.
本発明者は、この液滴吐出法を用いて、基板における段差を有する膜形成面に「金属粉末又はセラミックス粉末、及び有機バインダを少なくとも含んで構成される膜」を形成する場合において、乾燥・焼成工程時にて膜にクラック等が発生し難い条件を見出した。 The present inventor uses this droplet discharge method to dry and apply a “film comprising at least a metal powder or ceramic powder and an organic binder” on the film forming surface having a step in the substrate. The present inventors have found a condition in which cracks and the like are hardly generated in the film during the firing process.
即ち、本発明は、液滴吐出法を用いて基板における段差を有する膜形成面に膜を形成する膜形成方法であって、乾燥・焼成工程時にて膜にクラック等が発生し難いものを提供することを目的とする。 That is, the present invention provides a film forming method for forming a film on a film forming surface having a step in a substrate by using a droplet discharge method, which does not easily cause cracks in the film during the drying and baking process. The purpose is to do.
本発明に係る膜形成方法では、液滴吐出装置を用いて、金属粉末又はセラミックス粉末、有機バインダ、及び溶剤を少なくとも含む前駆体溶液が複数の液滴として、基板における「段差を有する膜形成面」の前記段差を含む膜形成領域における異なる複数の位置にそれぞれ吐出・着弾されて、前記膜形成面の膜形成領域に膜が形成される。 In the film forming method according to the present invention, using a droplet discharge device, a precursor solution containing at least a metal powder or ceramic powder, an organic binder, and a solvent is formed into a plurality of droplets, and a “film forming surface having a step in the substrate” is formed. Are discharged and landed at a plurality of different positions in the film formation region including the step, thereby forming a film in the film formation region of the film formation surface.
ここにおいて、「複数の液滴が膜形成領域における異なる複数の位置にそれぞれ吐出・着弾される」とは、一回の膜形成処理で膜の形成が完了することを指す。より具体的には、膜形成領域における同じ位置に液滴が繰り返し(2回以上)吐出・着弾されることがないことを指す。換言すれば、膜厚が、(積み重なった複数の液滴の厚さではなく)単一の液滴の大きさに基づいて決定されることを意味する。 Here, “a plurality of droplets are ejected and landed at a plurality of different positions in the film formation region” means that the film formation is completed by one film formation process. More specifically, it means that liquid droplets are not repeatedly ejected or landed (at least twice) at the same position in the film formation region. In other words, it means that the film thickness is determined based on the size of a single droplet (not the thickness of the stacked droplets).
前記段差の高さをhとし、「前記形成された膜の表面上の任意の点と、前記任意の点から延びる前記膜の表面に対する法線と前記膜形成面との交点と、の距離」を前記任意の点における膜厚とし、前記膜の乾燥後の状態における前記膜厚の最大値と最小値との差をΔtとし、前記膜の乾燥後の状態における前記膜厚の最小値をtminとしたとき、本発明に係る膜形成方法では、tmin>(2/3)hの関係が成立する場合において、Δt≦0.15hの関係が成立する。なお、「乾燥後の状態」とは、乾燥工程後且つ焼成工程前の状態を指す。以下、「乾燥後の状態の膜」を「乾燥膜」とも呼ぶ。 The height of the step is h, and “the distance between an arbitrary point on the surface of the formed film and the intersection of the normal to the surface of the film extending from the arbitrary point and the film forming surface” Is the film thickness at the arbitrary point, Δt is the difference between the maximum value and the minimum value of the film thickness in the dried state of the film, and the minimum value of the film thickness in the dried state of the film is tmin. Then, in the film forming method according to the present invention, when the relationship of tmin> (2/3) h is established, the relationship of Δt ≦ 0.15h is established. The “state after drying” refers to the state after the drying step and before the firing step. Hereinafter, the “film after drying” is also referred to as “dry film”.
ここで、前記乾燥膜の状態において、tmin≧6.5μmの関係が成立することが好適である。また、膜形成面に着弾された隣り合う液滴の中心の間の距離を「ピッチ」と呼ぶことにしたとき、ピッチが液滴の直径(着弾する前の値)より大きく、且つ、着弾後の各液滴が重力の作用によって自然に平面方向に拡がっていく過程(所謂「レベリング」が進行していく過程)にて隣り合う液滴が繋がるように、ピッチ、液滴の直径、液滴の粘度等が調整されることが好適である。 Here, in the state of the dry film, it is preferable that the relationship of tmin ≧ 6.5 μm is established. In addition, when the distance between the centers of adjacent droplets landed on the film formation surface is called “pitch”, the pitch is larger than the diameter of the droplets (value before landing) and after landing In order for the droplets of each of the above to expand naturally in the plane direction due to the action of gravity (so-called “leveling” progresses), the adjacent droplets are connected, so that the pitch, the diameter of the droplets, the droplets It is preferable that the viscosity and the like are adjusted.
後述するように、本発明者は、tmin>(2/3)hの関係が成立する条件下にて、Δt≦0.15hの関係が成立する場合、そうでない場合と比べて、乾燥・焼成工程時にて膜にクラック等が発生し難いことを見出した(後述する表1を参照)。 As will be described later, the present inventor, when the relationship of tmin> (2/3) h is established, the case where the relationship of Δt ≦ 0.15h is established, compared with the case where it is not, drying / calcination It was found that cracks and the like were hardly generated in the film during the process (see Table 1 described later).
更には、後述するように、本発明者は、前記乾燥膜を構成する成分のうち前記金属粉末又はセラミックス粉末を除いた部分の体積比率が25%以上である場合、そうでない場合と比べて、乾燥・焼成工程時にて膜にクラック等が特に発生し難いことを見出した(後述する表2を参照)。 Furthermore, as will be described later, the present inventor, when the volume ratio of the portion excluding the metal powder or ceramic powder among the components constituting the dry film is 25% or more, compared to the case where it is not so, It has been found that cracks and the like are hardly generated in the film during the drying / firing process (see Table 2 described later).
更には、後述するように、本発明者は、前記膜の乾燥前(乾燥工程前、より正確には、成膜工程前)の状態において、前記膜形成面を構成する基板の気孔率が0%より大きく50%以下である場合、そうでない場合と比べて、乾燥・焼成工程時にて膜にクラック等が特に発生し難いことを見出した(後述する表3を参照)。 Further, as will be described later, the present inventor has found that the porosity of the substrate constituting the film forming surface is 0 before the film is dried (before the drying process, more precisely before the film forming process). It has been found that cracks and the like are not particularly likely to occur in the film during the drying / firing process when it is greater than 50% and less than or equal to 50% (see Table 3 below).
また、前記液滴吐出装置内に貯留された前記前駆体溶液の粘度は、室温下で、1×105cP以下であることが好適である。これによれば、レベリングの進行が容易になり、膜厚のばらつきを小さくできる。 Moreover, it is preferable that the viscosity of the precursor solution stored in the droplet discharge device is 1 × 10 5 cP or less at room temperature. According to this, the progress of leveling becomes easy, and the variation in film thickness can be reduced.
以下、本発明の実施形態(本実施形態)に係る膜形成方法、並びに、その膜形成方法によって形成された膜について説明する。 Hereinafter, a film forming method according to an embodiment (this embodiment) of the present invention and a film formed by the film forming method will be described.
(本実施形態に係る膜形成方法の概要)
本実施形態では、液体を液滴として吐出する液滴吐出装置(インクジェットディスペンサ)を用いて基板における膜形成面に複数の液滴を吐出することによって前記膜形成面に膜を形成する手法(液滴吐出法、インクジェット法)が採用される。基板は、例えば、焼成体、焼成前の成形体、金属、樹脂等で構成される。
(Outline of film forming method according to this embodiment)
In the present embodiment, a technique (liquid solution) is formed by ejecting a plurality of droplets onto a film formation surface of a substrate using a droplet ejection device (inkjet dispenser) that ejects liquid as droplets. Droplet discharge method, ink jet method) is employed. The substrate is made of, for example, a fired body, a molded body before firing, a metal, a resin, or the like.
本実施形態に適用される液滴吐出装置Aとしては、例えば、図1に示すように、「膜を形成する成分が含まれる前駆体溶液が貯留された貯留室の内部にて振動子を振動することによって、前記貯留室に連通する微細なノズル孔から液滴を吐出する形式を有するもの」、或いは、図2に示すように、「前記前駆体溶液が貯留された貯留室を画定する振動板を圧電素子の駆動によって振動することによって、前記貯留室に連通する微細なノズル孔から液滴を吐出する形式を有するもの」、等が挙げられる。液滴吐出装置Aとして、上述の形式以外の形式を有するものが採用されてもよい。 As the droplet discharge device A applied to the present embodiment, for example, as shown in FIG. 1, “a vibrator is vibrated inside a storage chamber in which a precursor solution containing a component that forms a film is stored. 2, and having a form in which droplets are ejected from fine nozzle holes communicating with the storage chamber, or as shown in FIG. 2, “a vibration that defines the storage chamber in which the precursor solution is stored. And the like having a form in which droplets are ejected from fine nozzle holes communicating with the storage chamber by vibrating the plate by driving a piezoelectric element. As the droplet discharge device A, a device having a format other than the above-described format may be employed.
図3(a)に示すように、本実施形態では、室温下、平板状の基板の上方(基板からz軸正方向に離れた位置)にて、下方(z軸負方向)に向けて配置された液滴吐出装置Aのノズル孔を基板の上面(膜形成面)に対して所定の相対速度をもって膜形成面に沿って平行移動しながら、液滴が所定の周期をもって吐出されていく。この結果、各液滴が膜形成面の膜形成領域内において、異なる位置に順に着弾・付着していく。 As shown in FIG. 3A, in the present embodiment, at room temperature, above the flat substrate (position away from the substrate in the z-axis positive direction) and downward (z-axis negative direction). The liquid droplets are ejected at a predetermined cycle while the nozzle holes of the liquid droplet ejection apparatus A are translated along the film formation surface at a predetermined relative speed with respect to the upper surface (film formation surface) of the substrate. As a result, the respective droplets land and adhere to different positions in sequence within the film formation region on the film formation surface.
着弾後の各液滴は、着弾順に、膜形成面上において、重力の作用によってx−y平面方向に自然に拡がっていく(所謂レベリングが進行していく)。この結果、膜形成面上に膜厚のばらつきが小さい膜が形成される(図3(b)を参照)。このように形成された膜の膜厚(最小値)は、乾燥後(後述する乾燥工程後、且つ、焼成工程前)において、6.5μm以上であることが好ましい。 Each droplet after landing naturally spreads in the xy plane direction by the action of gravity on the film forming surface in the order of landing (so-called leveling proceeds). As a result, a film having a small variation in film thickness is formed on the film formation surface (see FIG. 3B). The film thickness (minimum value) of the film formed in this manner is preferably 6.5 μm or more after drying (after the drying process described later and before the firing process).
以下、膜形成面に着弾された隣り合う液滴の中心の間の距離(ピッチ)をPとし、吐出された液滴の直径(着弾する前の値)をDとする(図3(a)を参照)。図3(a)〜(b)に示す例では、PがDより大きいことに起因して着弾直後では隣り合う液滴が離れているが(図3(a))、その後のレベリングが進行する過程にて、隣り合う液滴が繋がっている(図3(a)、(b))。これに対し、PがDより小さいことに起因して着弾直後から隣り合う液滴が繋がっていてもよい。なお、Pは、液滴の吐出周期及び膜形成面に対するノズル孔の相対移動速度を制御することによって調整され得る。Dは、ノズル径、並びに、前駆体溶液の粘度を制御することによって調整され得る。 Hereinafter, the distance (pitch) between the centers of adjacent droplets landed on the film forming surface is P, and the diameter (value before landing) of the discharged droplets is D (FIG. 3A). See). In the example shown in FIGS. 3A to 3B, adjacent droplets are separated immediately after landing due to P being larger than D (FIG. 3A), but the subsequent leveling proceeds. In the process, adjacent droplets are connected (FIGS. 3A and 3B). On the other hand, adjacent droplets may be connected immediately after landing due to P being smaller than D. Note that P can be adjusted by controlling the droplet discharge period and the relative movement speed of the nozzle hole with respect to the film formation surface. D can be adjusted by controlling the nozzle diameter as well as the viscosity of the precursor solution.
図3(a)では、膜形成面に対するノズル孔のy軸方向の移動のみを利用して、膜形成面上にて、複数の液滴がy軸方向に沿って一列にのみ付着される場合が示されている。この場合、膜形成領域は、z軸正方向からみて、x軸方向に狭くy軸方向に広い細長い形状となる。これに対し、膜形成面に対するノズル孔のx軸方向の移動とy軸方向の移動とを適宜組み合わせることによって、膜形成面上にて、複数の液滴がx−y平面方向にてマトリクス状に付着されてもよい。この場合、膜形成領域は、z軸正方向からみて、x軸方向にもy軸方向にも広い形状となり得る。 In FIG. 3A, when only a movement of the nozzle hole in the y-axis direction relative to the film formation surface is used, a plurality of liquid droplets are attached only in a line along the y-axis direction on the film formation surface. It is shown. In this case, the film formation region has an elongated shape that is narrow in the x-axis direction and wide in the y-axis direction when viewed from the positive z-axis direction. On the other hand, by appropriately combining the movement of the nozzle hole in the x-axis direction and the movement in the y-axis direction with respect to the film formation surface, a plurality of liquid droplets are formed in a matrix in the xy plane direction on the film formation surface. May be attached. In this case, the film formation region can have a wide shape in both the x-axis direction and the y-axis direction when viewed from the positive z-axis direction.
本実施形態では、一回の膜形成処理で膜(即ち、焼成前の膜)の形成が完了する。より具体的には、膜形成領域における同じ位置に液滴が繰り返し(2回以上)吐出・着弾されることがない。換言すれば、図3(a)〜(b)に示すように、膜形成面に形成される膜の膜厚が、(積み重なった複数の液滴の厚さではなく)単一の液滴の大きさに基づいて決定されるといえる。 In the present embodiment, formation of a film (that is, a film before firing) is completed by a single film formation process. More specifically, liquid droplets are not repeatedly ejected or landed at the same position in the film formation region (twice or more times). In other words, as shown in FIGS. 3A to 3B, the thickness of the film formed on the film formation surface is not a single droplet (rather than the thickness of a plurality of stacked droplets). It can be said that it is determined based on the size.
図3(b)に示す膜は、その後、乾燥・焼成工程に供される。乾燥工程では、この膜は、35〜120℃の環境下に0.2〜1.5時間に亘って曝される。この結果、膜内部に含まれる溶剤成分が蒸発によって除去されて、膜が乾燥させられ、上記乾燥膜が形成される。焼成工程では、乾燥膜が、750〜1600℃で1時間以上に亘って焼成される。この結果、乾燥膜内部に含まれる有機バインダ等が焼失し、最終形態としての膜(即ち、焼成膜)が完成する。 The film shown in FIG. 3B is then subjected to a drying / firing process. In the drying process, the membrane is exposed to an environment of 35 to 120 ° C. for 0.2 to 1.5 hours. As a result, the solvent component contained in the film is removed by evaporation, the film is dried, and the dry film is formed. In the firing step, the dried film is fired at 750 to 1600 ° C. for 1 hour or longer. As a result, the organic binder or the like contained in the dry film is burned out, and a film as a final form (that is, a fired film) is completed.
(前駆体溶液の成分)
本実施形態で使用される前駆体溶液には、金属粉末又はセラミックス粉末、有機バインダ、及び溶剤が少なくとも含まれ、必要に応じて、可塑剤、分散剤、レオロジーコントロール剤等も含まれる。金属粉末としては、例えば、パラジウム、白金、金、銀、銅、ニッケル、タングステン、モリブデンの粉末、並びに、これらの合金からなる粉末が使用され得る。これらの金属粉末は、単独で使用されてもよく、また、2種以上を混合して使用され得る。セラミックス粉末としては、例えば、酸化アルミニウム、酸化ジルコニウム、酸化ニッケル、酸化鉄、酸化銅、酸化ランタン、酸化セリウム、酸化クロム、酸化チタン等の金属酸化物や窒化アルミニウム、窒化チタン、窒化珪素等の窒化物の粉末が使用され得る。上記粉末の粒径は、0.1〜20μmである。有機バインダとしては、例えば、ブチラール系、アクリル系、エチルセルロース、メチルセルロース等のセルロース系、フェノール系樹脂が使用され得る。溶剤としては、例えば、アセトン、メチルエチルケトン、ジプロピルケトン、ジイソブチルケトン等のケトン類、エタノール、イソプロパノール、ブタノール、2−エチルヘキサノール等のアルコール類、トルエン、キシレン等の芳香族炭化水素類、プロピオン酸メチル、プロピオン酸エチル、プロピオン酸ブチル、ブタン酸メチル、ブタン酸エチル、ブタン酸ブチル、ペンタン酸メチル、ペンタン酸エチル、ペンタン酸ブチル、ヘキサン酸メチル、ヘキサン酸エチル、ヘキサン酸ブチル、酢酸2−エチルヘキシル、酪酸2−エチルヘキシル等のエステル類、メチルセロソルブ、エチルセロソルブ、ブチルセロソルブ、テルピネオール、ブチルカルビトール、ブチルカルビトールアセテート、等が使用され得る。これらの有機溶剤は、単独で使用されてもよく、また、2種以上を混合して使用され得る。可塑剤としては、例えば、フタル酸誘導体、イソフタル酸誘導体、テトラヒドロフタル酸誘導体、アジピン酸誘導体、マレイン酸誘導体、フマル酸誘導体、トリメリット誘導体、ピロメリット誘導体、ステアリン酸誘導体、オレイン酸誘導体、イタコン酸誘導体、リシノール誘導体が使用でき、特にフタル酸誘導体系可塑剤が好ましい。具体的には、ジメチルフタレート、ジエチルフタレート、ジブチルフタレート、ジ−(2−エチルヘキシル)フタレート、ジオクチルフタレート、ジイソオクチルフタレート、ジイソブチルフタレート、ジヘプチルフタレート、ジフェニルフタレート等が使用され得る。分散剤としては、例えば、金属粉末又はセラミックス粉末表面と親和性がある高分子化合物が使用され得る。各成分の含有割合は、金属粉末又はセラミックス粉末が15〜45体積%、有機バインダが7〜25体積%、溶剤が35〜73体積%、可塑剤が3〜20体積%、分散剤が2〜15体積%、とされ得る。この前駆体溶液の粘度は、室温下で、1×105cP以下であることが好ましい。これにより、上記レベリングの進行が容易になり、膜厚のばらつきが小さくされ得る。
(Components of precursor solution)
The precursor solution used in this embodiment includes at least a metal powder or ceramic powder, an organic binder, and a solvent, and also includes a plasticizer, a dispersant, a rheology control agent, and the like as necessary. As the metal powder, for example, powders of palladium, platinum, gold, silver, copper, nickel, tungsten, molybdenum, and powders made of these alloys can be used. These metal powders may be used alone or in combination of two or more. Examples of the ceramic powder include metal oxides such as aluminum oxide, zirconium oxide, nickel oxide, iron oxide, copper oxide, lanthanum oxide, cerium oxide, chromium oxide, and titanium oxide, and nitride such as aluminum nitride, titanium nitride, and silicon nitride. Product powders can be used. The particle size of the powder is 0.1 to 20 μm. As the organic binder, for example, cellulose-based or phenolic resins such as butyral-based, acrylic-based, ethylcellulose, and methylcellulose can be used. Examples of the solvent include ketones such as acetone, methyl ethyl ketone, dipropyl ketone, and diisobutyl ketone, alcohols such as ethanol, isopropanol, butanol, and 2-ethylhexanol, aromatic hydrocarbons such as toluene and xylene, and methyl propionate. , Ethyl propionate, butyl propionate, methyl butanoate, ethyl butanoate, butyl butanoate, methyl pentanoate, ethyl pentanoate, butyl pentanoate, methyl hexanoate, ethyl hexanoate, butyl hexanoate, 2-ethylhexyl acetate, Esters such as 2-ethylhexyl butyrate, methyl cellosolve, ethyl cellosolve, butyl cellosolve, terpineol, butyl carbitol, butyl carbitol acetate, and the like can be used. These organic solvents may be used alone or in combination of two or more. Examples of the plasticizer include phthalic acid derivatives, isophthalic acid derivatives, tetrahydrophthalic acid derivatives, adipic acid derivatives, maleic acid derivatives, fumaric acid derivatives, trimellitic derivatives, pyromellitic derivatives, stearic acid derivatives, oleic acid derivatives, itaconic acid. Derivatives and ricinol derivatives can be used, and phthalic acid derivative plasticizers are particularly preferred. Specifically, dimethyl phthalate, diethyl phthalate, dibutyl phthalate, di- (2-ethylhexyl) phthalate, dioctyl phthalate, diisooctyl phthalate, diisobutyl phthalate, diheptyl phthalate, diphenyl phthalate and the like can be used. As the dispersant, for example, a polymer compound having an affinity for the metal powder or ceramic powder surface can be used. The content of each component is 15 to 45% by volume of metal powder or ceramic powder, 7 to 25% by volume of organic binder, 35 to 73% by volume of solvent, 3 to 20% by volume of plasticizer, and 2 to 2 of dispersant. 15% by volume. The viscosity of the precursor solution is preferably 1 × 10 5 cP or less at room temperature. Thereby, the progress of the leveling can be facilitated, and the variation in film thickness can be reduced.
(クラック発生の抑制のための条件)
本発明では、基板の膜形成面に段差が存在し、且つ、前記段差を跨ぐように前記膜形成面に膜が形成される状況が想定されている。図4に示すように、1段の段差を有する膜形成面に前記段差を跨ぐように膜が形成される場合のみならず、図5に示すように、複数段(この例では、3段)の段差を有する膜形成面に前記段差を跨ぐように膜が形成される場合も想定され得る。図5に示す場合、複数段の段差を構成する複数枚の基板のそれぞれの材質が異なっていても良い。この場合、段差の上側と下側との間で、基板(膜形成面)の材質が異なる。
(Conditions for suppressing cracks)
In the present invention, it is assumed that there is a step on the film formation surface of the substrate and a film is formed on the film formation surface so as to straddle the step. As shown in FIG. 4, not only when the film is formed so as to straddle the step on the film forming surface having one step, but as shown in FIG. It may be assumed that the film is formed so as to straddle the step on the film forming surface having the step. In the case shown in FIG. 5, the materials of the plurality of substrates constituting the plurality of steps may be different. In this case, the material of the substrate (film formation surface) is different between the upper side and the lower side of the step.
ところで、従来より、段差を有する膜形成面(基板の表面)に膜を形成する手法として、本実施形態で採用される液滴吐出法以外にも、スクリーン印刷法等が広く知られている。しかしながら、スクリーン印刷法等では、図6に示すように、特に段差を跨ぐ部分において膜厚に大きなばらつきが生じ易い。具体的には、図6に示す例では、膜の表面の段差の高さ(z軸方向の高低差)が、膜形成面(基板の表面)の段差の高さ(z軸方向の高低差)に対して小さい。この結果、段差の右側の膜厚が左側の膜厚よりも大きくなっている。 Incidentally, conventionally, as a method for forming a film on a film forming surface having a step (surface of the substrate), a screen printing method or the like is widely known in addition to the droplet discharge method employed in the present embodiment. However, in the screen printing method or the like, as shown in FIG. Specifically, in the example shown in FIG. 6, the height of the step on the surface of the film (the difference in height in the z-axis direction) is the height of the step on the film formation surface (the surface of the substrate) (the difference in height in the z-axis direction). ) Is small. As a result, the film thickness on the right side of the step is larger than the film thickness on the left side.
このように、段差を跨ぐ部分にて膜厚に大きなばらつきが存在する膜が、乾燥・焼成工程に供されると、図7に示すように、段差部分において膜にクラックが生じ易い。或いは、段差部分において、膜と膜形成面との界面に剥離が生じることもある。このクラックや剥離は、乾燥・焼成時にて、膜厚の大きな相違に基づく膜の収縮量の大きな相違が段差部分において局所的に発生することに起因して、段差部分において膜内にて大きい応力が局所的に発生することに基づく、と考えられる。 As described above, when a film having a large variation in film thickness in a portion across the step is subjected to a drying / firing process, the film is likely to crack in the step portion as shown in FIG. Alternatively, separation may occur at the interface between the film and the film formation surface at the stepped portion. These cracks and delamination are caused by large stresses in the film at the stepped part due to the fact that a large difference in film shrinkage due to a large difference in film thickness occurs locally at the stepped part during drying and firing. Is thought to be based on local occurrence.
これに対し、本実施形態のように、液滴吐出法を採用すれば、図8に示すように、スクリーン印刷法等と比べて、段差を跨ぐ部分における膜厚のばらつきを小さくすることができる。以下、図8に示すように、膜形成面の段差の高さ(z軸方向の高低差)をhとする。膜の表面上の任意の点における膜厚tを、「膜の表面上の任意の点」と「任意の点から延びる膜の表面に対する法線と膜形成面との交点」との距離とする(図8を参照)。また、乾燥工程後且つ焼成工程前の状態の膜(即ち、乾燥膜)の表面全域について、膜厚tの分布における最大値、最小値をそれぞれtmax、tminとし、tmaxとtminとの差(膜厚のばらつき)をΔtとする。 On the other hand, if the droplet discharge method is employed as in the present embodiment, as shown in FIG. 8, the variation in film thickness in the portion across the step can be reduced as compared with the screen printing method or the like. . Hereinafter, as shown in FIG. 8, the height of the step on the film formation surface (the difference in height in the z-axis direction) is assumed to be h. The film thickness t at an arbitrary point on the surface of the film is a distance between “an arbitrary point on the surface of the film” and “the intersection of the normal to the film surface extending from the arbitrary point and the film forming surface”. (See FIG. 8). Further, regarding the entire surface of the film after the drying process and before the baking process (that is, the dried film), the maximum value and the minimum value in the distribution of the film thickness t are tmax and tmin, respectively, and the difference between tmax and tmin (film) Let Δt be the variation in thickness.
最大値Tmax、最小値tminとしては、「z軸正方向(膜形成面に対して垂直の方向)からみたとき、膜形成領域の形状に対して重心位置が同じであり且つ面積が80%の相似形状の領域」の内部での膜厚のみが考慮される。換言すれば、前記相似形状の領域の外である「膜形成領域の周縁部」での膜厚は、最大値Tmax、最小値tminとして考慮されない。なお、前記段差は、前記相似形状の領域内に含まれる。 As the maximum value Tmax and the minimum value tmin, “when viewed from the positive z-axis direction (direction perpendicular to the film formation surface), the center of gravity is the same as the shape of the film formation region and the area is 80%. Only the film thickness within the “similar shape region” is considered. In other words, the film thickness at the “periphery of the film forming region” outside the region having the similar shape is not considered as the maximum value Tmax and the minimum value tmin. The step is included in the region having the similar shape.
本発明者は、液滴吐出法を用いて、段差を有する膜形成面に膜を形成する場合において、tmin>(2/3)hの関係が成立する条件下において、Δt≦0.15hの関係が成立する場合、そうでない場合と比べて、乾燥・焼成工程時にて膜にクラックが発生し難いことを見出した。以下、このことを確認した試験Aについて説明する。 In the case where a film is formed on a film forming surface having a step using the droplet discharge method, the present inventor satisfies Δt ≦ 0.15h under the condition that the relationship of tmin> (2/3) h is established. When the relationship is established, it was found that cracks are less likely to occur in the film during the drying / firing process than when the relationship is not. Hereinafter, test A in which this has been confirmed will be described.
(試験A)
試験Aでは、上述した本実施形態に係る膜形成方法を用いて、一回の膜形成処理(即ち、膜形成領域における同じ位置に液滴が2回以上吐出されない)で、12種類のパターン(水準)で、基板における段差を有する膜形成面に膜(即ち、乾燥・焼成工程前の膜)が形成され、その後、その膜が乾燥・焼成工程に供された。各パターンにおける、Δt、tmim、及びhの組み合わせは、表1に示すとおりであった。各パターンに対して10個のサンプル(N=10)が存在していた。各パターンについて、tmin≧6.5μmの関係が成立していた。また、tmin>(2/3)hの関係が成立していた。
(Test A)
In test A, using the film forming method according to the present embodiment described above, 12 types of patterns (with no droplets discharged twice or more at the same position in the film forming region) by one film forming process (that is, Level), a film (that is, a film before the drying / firing process) was formed on the film forming surface having a step in the substrate, and then the film was subjected to the drying / firing process. The combinations of Δt, tmim, and h in each pattern are as shown in Table 1. There were 10 samples (N = 10) for each pattern. The relationship of tmin ≧ 6.5 μm was established for each pattern. Further, the relationship of tmin> (2/3) h was established.
各パターンにて、室温下にて、膜形成面に対するノズル孔のx軸方向の移動とy軸方向の移動とを適宜組み合わせることによって、膜形成面上にて、複数の液滴がy軸方向に沿って複数の列に亘って付着された。この結果、膜形成領域は、z軸正方向からみて、直方体形状であった。各パターンにて、液滴の直径Dは60〜400μmの範囲内、液滴間のピッチP(x軸方向及びy軸方向のそれぞれについて)は100〜1000μmの範囲内(ただし、P>D)でそれぞれ調整された。この結果、各パターンにて、着弾直後では隣り合う液滴が離れていたが(図3(a))、その後のレベリングが進行する過程にて、隣り合う液滴が繋がっていた(図3(a)(b))。 In each pattern, a plurality of liquid droplets are formed on the film forming surface in the y-axis direction by appropriately combining the movement of the nozzle hole in the x-axis direction and the movement in the y-axis direction relative to the film forming surface at room temperature. Along multiple rows. As a result, the film formation region was a rectangular parallelepiped when viewed from the positive z-axis direction. In each pattern, the droplet diameter D is in the range of 60 to 400 μm, and the pitch P between the droplets (in each of the x-axis direction and the y-axis direction) is in the range of 100 to 1000 μm (where P> D). Adjusted respectively. As a result, in each pattern, adjacent droplets were separated immediately after landing (FIG. 3A), but adjacent droplets were connected in the process of subsequent leveling (FIG. 3 ( a) (b)).
各パターンにて、基板としては、焼成体、或いは、焼成前の成形体が使用された。「金属粉末又はセラミックス粉末」としては銀が使用された。粉末の粒径は、0.1〜20.0μmであった。有機バインダとしてはエチルセルロースが使用された。溶剤としては、ブチルカルビトールアセテートが使用された。可塑剤としては、ジオクチルフタレートが使用された。分散剤としては、DISPERBYK−2095が(ビックケミー・ジャパン株式会社製)使用された。各成分の含有割合(体積割合)は、銀が25体積%、有機バインダが15体積%、溶剤が49体積%、可塑剤が5体積%、分散剤が6体積%、であった。前駆体溶液の粘度は、室温下で、1×105cP以下であった。前駆体溶液の粘度は、東機産業(株)製のE型粘度計(品番:TV−25)の1°34'×R24ローターを用いて、回転速度5rpm、室温下(25℃)で測定された。膜厚t(tmin)の調整は、液滴の直径Dを調整すること(即ち、ノズル径、前駆体溶液の粘度等を調整すること)及びピッチを調整することによって達成された。また、膜厚のばらつきΔtの調整は、DとPとの間の関係、並びに、前駆体溶液の粘度を調整することによって達成された。 In each pattern, a fired body or a molded body before firing was used as the substrate. Silver was used as the “metal powder or ceramic powder”. The particle size of the powder was 0.1 to 20.0 μm. Ethyl cellulose was used as the organic binder. Butyl carbitol acetate was used as the solvent. Dioctyl phthalate was used as the plasticizer. DISPERBYK-2095 (manufactured by Big Chemie Japan Co., Ltd.) was used as the dispersant. The content ratio (volume ratio) of each component was 25% by volume for silver, 15% by volume for the organic binder, 49% by volume for the solvent, 5% by volume for the plasticizer, and 6% by volume for the dispersant. The viscosity of the precursor solution was 1 × 10 5 cP or less at room temperature. The viscosity of the precursor solution was measured using a 1 ° 34 ′ × R24 rotor of an E-type viscometer (product number: TV-25) manufactured by Toki Sangyo Co., Ltd. at a rotational speed of 5 rpm and at room temperature (25 ° C.). It was done. The adjustment of the film thickness t (tmin) was achieved by adjusting the diameter D of the droplet (that is, adjusting the nozzle diameter, the viscosity of the precursor solution, etc.) and the pitch. Also, the adjustment of the film thickness variation Δt was achieved by adjusting the relationship between D and P and the viscosity of the precursor solution.
そして、各パターンについて、膜(即ち、乾燥・焼成前の膜)が、乾燥・焼成工程に供された。乾燥工程では、膜は、35〜120℃の環境下に0.2〜1.5時間に亘って曝された。この結果、膜内部の溶剤成分が蒸発によって除去された。焼成工程では、膜は、750℃〜900℃で1時間以上に亘って焼成された。この結果、膜内部の有機バインダ等が焼失し、最終形態としての膜(即ち、焼成膜)が完成した。そして、各パターンについて、段差部分においてクラックが生じているか否かが判定された。この判定は、目視、或いは、顕微鏡を使用した観察に基づいてなされた。この結果は表1に示すとおりである。 And about each pattern, the film | membrane (namely, film | membrane before drying and baking) was used for the drying and baking process. In the drying process, the membrane was exposed to an environment of 35 to 120 ° C. for 0.2 to 1.5 hours. As a result, the solvent component inside the film was removed by evaporation. In the firing step, the film was fired at 750 ° C. to 900 ° C. for over 1 hour. As a result, the organic binder or the like inside the film was burned out, and a film as a final form (ie, a fired film) was completed. Then, for each pattern, it was determined whether or not a crack occurred in the step portion. This determination was made based on visual observation or observation using a microscope. The results are as shown in Table 1.
表1から理解できるように、Δt/hに着目すると、tmin>(2/3)hの条件下、Δt/h>0.15の関係が成立する場合にはクラック発生率がゼロより大きく、Δt/h≦0.15の関係が成立する場合にはクラック発生率がゼロであった。なお、クラック発生率とは、各パターンについて、「全サンプル数」に対する「全サンプルのうちクラックが発生していたものの数」の割合である。以上より、tmin>(2/3)hの関係が成立する条件下において、Δt/h≦0.15の関係が成立する場合、そうでない場合と比べて、乾燥・焼成工程時にて膜にクラックが発生し難い、いうことができる。 As can be understood from Table 1, when attention is paid to Δt / h, when the relationship of Δt / h> 0.15 is satisfied under the condition of tmin> (2/3) h, the crack occurrence rate is larger than zero. When the relationship of Δt / h ≦ 0.15 was established, the crack occurrence rate was zero. The crack occurrence rate is a ratio of “the number of cracks in all the samples” to “the total number of samples” for each pattern. As described above, when the relationship of tmin> (2/3) h is established, the film is cracked during the drying / firing process when the relationship of Δt / h ≦ 0.15 is established, as compared with the case where it is not. It can be said that is difficult to occur.
以下、膜の乾燥後(乾燥工程後、且つ、焼成工程前)の状態において、膜を構成する成分のうち「金属粉末又はセラミックス粉末」を除いた部分の体積比率をP(%)とする。本発明者は、tmin>(2/3)hの関係が成立する条件下において、Δt≦0.15hの関係が成立する場合において、P≧25%であると、その後の乾燥・焼成工程時にてより一層膜にクラック等が発生し難いことも見出した。以下、このことを確認した試験Bについて説明する。 Hereinafter, in the state after the film is dried (after the drying process and before the firing process), the volume ratio of the component constituting the film excluding “metal powder or ceramic powder” is defined as P (%). When the relationship of Δt ≦ 0.15h is satisfied under the condition that the relationship of tmin> (2/3) h is satisfied, the present inventor determines that P ≧ 25% during the subsequent drying / firing process. It has also been found that cracks and the like are less likely to occur in the film. Hereinafter, test B in which this has been confirmed will be described.
(試験B)
試験Bでも、試験Aと同様と同じ手順によって、12種類のパターン(水準)で、段差を有する膜形成面に膜(即ち、乾燥膜)が形成された。各パターンにおける、Δt、tmim、h、及びPの組み合わせは、表2に示すとおりであった。各パターンに対して10個程度のサンプル(N≒10)が存在していた。各パターンについて、tmin≧6.5μmの関係が成立し、且つ、tmin>(2/3)hの関係が成立していた。各パターンについて、Δt/h≦0.15が成立していた。試験Aと同様、基板としては、焼成体、或いは、焼成前の成形体が使用された。
(Test B)
Also in Test B, a film (that is, a dry film) was formed on a film forming surface having steps with 12 types of patterns (levels) by the same procedure as in Test A. The combinations of Δt, tmim, h, and P in each pattern are as shown in Table 2. About 10 samples (N≈10) existed for each pattern. For each pattern, a relationship of tmin ≧ 6.5 μm was established, and a relationship of tmin> (2/3) h was established. For each pattern, Δt / h ≦ 0.15 was established. As in Test A, a fired body or a molded body before firing was used as the substrate.
そして、各パターンについて、乾燥・焼成条件を除いて試験Aと同じ条件で、膜(即ち、乾燥・焼成前の膜)が、乾燥・焼成工程に供された。乾燥工程では、膜は、120℃〜140℃の環境下に0.2〜0.5時間に亘って曝された。焼成工程では、膜は、900℃〜1000℃で1時間以上に亘って焼成された。即ち、乾燥・焼成条件として、試験Aの場合と比べて熱的に過酷な条件が採用された。そして、各パターンについて、段差部分においてクラックが生じているか否かが判定された。この結果は表2に示すとおりである。 And about each pattern, the film | membrane (namely, film | membrane before drying and baking) was used for the drying and baking process on the same conditions as the test A except drying and baking conditions. In the drying process, the membrane was exposed to an environment of 120 ° C. to 140 ° C. for 0.2 to 0.5 hours. In the firing step, the film was fired at 900 ° C. to 1000 ° C. for 1 hour or more. That is, as the drying / firing condition, a condition that is thermally severer than that in the case of Test A was adopted. Then, for each pattern, it was determined whether or not a crack occurred in the step portion. The results are as shown in Table 2.
表2から理解できるように、tmin>(2/3)hの関係が成立する条件下、Δt≦0.15hの関係が成立する場合において、P≧25%である場合、そうでない場合と比して、クラック発生率が小さい。以上より、tmin>(2/3)hの関係が成立する条件下、Δt≦0.15hの関係が成立する場合において、P≧25%である場合、そうでない場合と比べて、乾燥・焼成工程時にて膜にクラックがより一層発生し難い、いうことができる。 As can be understood from Table 2, under the condition that the relationship of tmin> (2/3) h is satisfied, when the relationship of Δt ≦ 0.15h is satisfied, the case where P ≧ 25% is compared with the case where it is not And the crack generation rate is small. From the above, when the relationship of Δt ≦ 0.15h is satisfied under the condition that the relationship of tmin> (2/3) h is satisfied, the case where P ≧ 25% is compared with the case where it is not so, the drying / firing It can be said that cracks are less likely to occur in the film during the process.
以下、基板の気孔率について検討する。本発明者は、tmin>(2/3)hの関係が成立する条件下において、Δt≦0.15hの関係が成立する場合において、膜の乾燥前(乾燥工程前)の段階において基板の気孔率が0%より大きく50%以下であると、その後の乾燥・焼成工程時にてより一層膜にクラック等が発生し難いことも見出した。以下、このことを確認した試験Cについて説明する。 Hereinafter, the porosity of the substrate will be examined. The present inventor has determined that the pores of the substrate at the stage before drying of the film (before the drying process) when the relationship of Δt ≦ 0.15h is satisfied under the condition that the relationship of tmin> (2/3) h is satisfied. It has also been found that when the rate is greater than 0% and 50% or less, cracks and the like are less likely to occur in the film during the subsequent drying and firing steps. Hereinafter, test C in which this has been confirmed will be described.
(試験C)
試験Cでも、試験Aと同様と同じ手順によって、12種類のパターン(水準)で、段差を有する膜形成面に膜(即ち、乾燥膜)が形成された。各パターンにおける、Δt、tmim、h、及び基板の気孔率の組み合わせは、表3に示すとおりであった。基板の気孔率としては、膜の成膜工程前の段階での値が採用された。各パターンに対して10個程度のサンプル(N≒10)が存在していた。各パターンについて、tmin≧6.5μmの関係が成立し、且つ、tmin>(2/3)hの関係が成立していた。各パターンについて、Δt/h≦0.15が成立していた。試験Aと同様、基板としては、焼成体、或いは、焼成前の成形体が使用された。
(Test C)
In Test C, a film (that is, a dry film) was formed on a film forming surface having a step in 12 types of patterns (levels) by the same procedure as in Test A. Table 3 shows combinations of Δt, tmim, h, and substrate porosity in each pattern. As the porosity of the substrate, the value before the film formation process was adopted. About 10 samples (N≈10) existed for each pattern. For each pattern, a relationship of tmin ≧ 6.5 μm was established, and a relationship of tmin> (2/3) h was established. For each pattern, Δt / h ≦ 0.15 was established. As in Test A, a fired body or a molded body before firing was used as the substrate.
そして、各パターンについて、乾燥・焼成条件を除いて試験Aと同じ条件で、膜(即ち、乾燥・焼成前の膜)が、乾燥・焼成工程に供された。乾燥工程では、膜は、120℃〜140℃の環境下に0.2〜0.5時間に亘って曝された。焼成工程では、膜は、900℃〜1000℃で1時間以上に亘って焼成された。即ち、乾燥・焼成条件として、試験Aの場合と比べて熱的に過酷な条件が採用された。そして、各パターンについて、段差部分においてクラックが生じているか否かが判定された。この結果は表3に示すとおりである。 And about each pattern, the film | membrane (namely, film | membrane before drying and baking) was used for the drying and baking process on the same conditions as the test A except drying and baking conditions. In the drying process, the membrane was exposed to an environment of 120 ° C. to 140 ° C. for 0.2 to 0.5 hours. In the firing step, the film was fired at 900 ° C. to 1000 ° C. for 1 hour or more. That is, as the drying / firing condition, a condition that is thermally severer than that in the case of Test A was adopted. Then, for each pattern, it was determined whether or not a crack occurred in the step portion. The results are as shown in Table 3.
表3から理解できるように、tmin>(2/3)hの関係が成立する条件下、Δt≦0.15hの関係が成立する場合において、基板の気孔率(膜の成膜工程前の段階)が0%より大きく50%以下である場合、そうでない場合と比して、クラック発生率が小さい。以上より、tmin>(2/3)hの関係が成立する条件下、Δt≦0.15hの関係が成立する場合において、基板の気孔率(膜の乾燥前の段階)が0%より大きく50%以下である場合、そうでない場合と比べて、乾燥・焼成工程時にて膜にクラックがより一層発生し難い、いうことができる。 As can be understood from Table 3, when the relationship of Δt ≦ 0.15h is satisfied under the condition that the relationship of tmin> (2/3) h is satisfied, the porosity of the substrate (the stage before the film forming process) ) Is greater than 0% and less than or equal to 50%, the crack occurrence rate is small as compared to the case where it is not. As described above, when the relationship of Δt ≦ 0.15h is satisfied under the condition that the relationship of tmin> (2/3) h is satisfied, the porosity of the substrate (stage before drying of the film) is greater than 0% and 50 When the content is less than or equal to%, it can be said that cracks are less likely to occur in the film during the drying / firing process than in the other cases.
ここで、「基板の気孔率(膜の成膜工程前の段階)が大きいと、乾燥・焼成工程時において膜にクラックが発生し易くなる理由」について付言する。膜の成膜工程前の段階において、基板の気孔率が大きいと、膜内部に含まれる溶剤成分が、基板の気孔内に吸収され易くなる。溶剤成分が基板の気孔内に吸収されるにつれて、膜内部の溶剤成分の濃度が小さくなって膜の粘度が増大する。膜の粘度が増大すると、上記のレベリングの進行が阻害されて、膜厚のばらつきが大きい膜が形成される。膜厚のばらつきが大きいと、その後の乾燥・焼成工程時において、膜内部において局所的な応力集中が発生して膜にクラックが発生し易くなる。以上のメカニズムによって、「基板の気孔率(膜の成膜工程前の段階)が大きいと、乾燥・焼成工程時において膜にクラックが発生し易くなる。」と考えられる。 Here, “additional reason why if the porosity of the substrate (the stage before the film forming process) is large, cracks are likely to occur in the film during the drying / firing process” will be added. If the porosity of the substrate is large before the film is formed, the solvent component contained in the film is easily absorbed into the pores of the substrate. As the solvent component is absorbed into the pores of the substrate, the concentration of the solvent component inside the film decreases and the viscosity of the film increases. When the viscosity of the film increases, the progress of the leveling is hindered, and a film with a large variation in film thickness is formed. When the variation in the film thickness is large, local stress concentration occurs in the film during the subsequent drying and baking processes, and cracks are likely to occur in the film. Based on the above mechanism, it is considered that “if the porosity of the substrate (the stage before the film formation process) is large, cracks are likely to occur in the film during the drying / firing process”.
なお、この試験A(表1)、試験B(表2)、及び試験C(表3)では、金属粉末又はセラミックス粉末として銀が使用されているが、その他の材料の粉末が使用された場合も、上記と同じ結果が得られることが確認されている。また、この試験A(表1)、試験B(表2)、及び試験C(表3)では、tmin≧6.5μmの関係が成立していたが、tmin<6.5μmの場合であっても、上記と同じ結果が得られることが確認されている。 In this test A (Table 1), test B (Table 2), and test C (Table 3), silver is used as the metal powder or ceramic powder, but powder of other materials is used. It has been confirmed that the same results as above can be obtained. In this test A (Table 1), test B (Table 2), and test C (Table 3), the relationship of tmin ≧ 6.5 μm was established, but tmin <6.5 μm. It has been confirmed that the same results as above can be obtained.
なお、本発明は上記実施形態に限定されることはなく、本発明の範囲内において種々の変形例を採用することができる。例えば、図8等に示す例では、膜形成面における段差が、比較的緩やかな傾斜を有する形状を呈しているが、膜形成面における段差がステップ状を呈していてもよい。また、図8に示す例では、膜形成面における段差が1段となっているが、図5に示すように、膜形成面における段差が複数段であってもよい。この場合、それぞれ段差について、上述した関係(Δt、tmin、hの間の関係)が適用される。 In addition, this invention is not limited to the said embodiment, A various modification can be employ | adopted within the scope of the present invention. For example, in the example shown in FIG. 8 and the like, the step on the film formation surface has a shape having a relatively gentle slope, but the step on the film formation surface may have a step shape. In the example shown in FIG. 8, the level difference on the film formation surface is one step. However, as shown in FIG. 5, the level difference on the film formation surface may be a plurality of levels. In this case, the relationship described above (the relationship between Δt, tmin, and h) is applied to each step.
Claims (9)
前記段差の高さがh(5μm≦h≦250μm)であり、
前記膜の表面上の任意の点と、前記任意の点から延びる前記膜の表面に対する法線と前記膜形成面との交点と、の距離を、前記任意の点における膜厚とし、
前記膜の乾燥後の状態における前記膜厚の最大値と最小値との差をΔtとし、
前記膜の乾燥後の状態における前記膜厚の最小値をtminとしたとき、
tmin>(2/3)hの関係が成立すると共にΔt≦0.15hの関係が成立する、 膜を有する基板。 Is formed on the film formation region including the step of film forming surface having a step in the substrate, and to a substrate having metal powder or ceramic powder, and comprising at least a structure membrane of an organic binder,
Height of the step is h (5μm ≦ h ≦ 250μm) ,
The distance between an arbitrary point on the surface of the film and the intersection of the normal to the surface of the film extending from the arbitrary point and the film forming surface is a film thickness at the arbitrary point,
The difference between the maximum value and the minimum value of the film thickness in the dried state of the film is Δt,
When the minimum value of the film thickness in the state after drying of the film is tmin,
A substrate having a film , wherein a relationship of tmin> (2/3) h is established and a relationship of Δt ≦ 0.15h is established.
前記膜の乾燥後の状態において、tmin≧6.5μmの関係が成立する、膜を有する基板。 A substrate having the film of claim 1,
A substrate having a film , wherein a relation of tmin ≧ 6.5 μm is established in a state after the film is dried.
前記膜の乾燥後の状態において、前記膜を構成する成分のうち前記金属粉末又はセラミックス粉末を除いた部分の体積比率が25%以上である、膜を有する基板。 In the substrate having the film according to claim 1 or 2,
The board | substrate which has a film | membrane whose volume ratio of the part except the said metal powder or ceramic powder among the components which comprise the said film | membrane in the state after the said film | membrane dried is 25% or more.
前記膜の乾燥前の状態において、前記膜形成面を構成する基板の気孔率が0%以上50%以下である、膜を有する基板。 In the board | substrate which has a film | membrane as described in any one of Claims 1 thru | or 3,
The board | substrate which has a film | membrane whose porosity of the board | substrate which comprises the said film formation surface is 0% or more and 50% or less in the state before the said film | membrane dried.
前記段差の高さがh(5μm≦h≦250μm)であり、
前記形成された膜の表面上の任意の点と、前記任意の点から延びる前記膜の表面に対する法線と前記膜形成面との交点と、の距離を、前記任意の点における膜厚とし、
前記膜の乾燥後の状態における前記膜厚の最大値と最小値との差をΔtとし、
前記膜の乾燥後の状態における前記膜厚の最小値をtminとしたとき、
tmin>(2/3)hの関係が成立すると共にΔt≦0.15hの関係が成立するように液滴を吐出する、
膜付き基板の形成方法。 Using a droplet discharge device, a precursor solution containing at least a metal powder or a ceramic powder, an organic binder, and a solvent is used as a plurality of droplets, and a film forming surface having a step difference in the substrate is different in the film forming region including the step. A film forming method for forming a film in a film forming region of the film forming surface by discharging each of a plurality of positions,
The height of the front Symbol step is h (5μm ≦ h ≦ 250μm) ,
The distance between an arbitrary point on the surface of the formed film and the intersection of the normal to the surface of the film extending from the arbitrary point and the film forming surface is a film thickness at the arbitrary point,
The difference between the maximum value and the minimum value of the film thickness in the dried state of the film is Δt,
When the minimum value of the film thickness in the state after drying of the film is tmin,
droplets are ejected so that a relationship of tmin> (2/3) h is established and a relationship of Δt ≦ 0.15h is established.
Method for forming substrate with film.
前記膜の乾燥後の状態において、tmin≧6.5μmの関係が成立する、膜付き基板の形成方法。 In the formation method of the board | substrate with a film | membrane of Claim 5,
A method for forming a substrate with a film, wherein a relationship of tmin ≧ 6.5 μm is established in a state after the film is dried.
前記膜の乾燥後の状態において、前記膜を構成する成分のうち前記金属粉末又はセラミックス粉末を除いた部分の体積比率が25%以上である、膜付き基板の形成方法。 In the formation method of the board | substrate with a film | membrane of Claim 5 or Claim 6,
A method for forming a substrate with a film, wherein in a state after the film is dried, a volume ratio of a component excluding the metal powder or ceramic powder among components constituting the film is 25% or more.
前記膜の乾燥前の状態において、前記膜形成面を構成する基板の気孔率が0%以上50%以下である、膜付き基板の形成方法。 In the formation method of the board | substrate with a film | membrane as described in any one of Claim 5 thru | or 7,
In the state before drying of the membrane, the porosity of the substrate of the film forming surface is 50% or less than 0%, the method of forming the film-coated substrate.
前記液滴吐出装置内に貯留された前記前駆体溶液の粘度が、室温下で、1×105cP以下である、膜付き基板の形成方法。 In the formation method of the substrate with a film according to any one of claims 5 to 8,
A method for forming a film -coated substrate, wherein the precursor solution stored in the droplet discharge device has a viscosity of 1 × 10 5 cP or less at room temperature.
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