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JP6165701B2 - Depth prediction method for cracks caused by delayed fracture at the cut end of steel plate. - Google Patents
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JP6165701B2 - Depth prediction method for cracks caused by delayed fracture at the cut end of steel plate. - Google Patents

Depth prediction method for cracks caused by delayed fracture at the cut end of steel plate. Download PDF

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JP6165701B2
JP6165701B2 JP2014236927A JP2014236927A JP6165701B2 JP 6165701 B2 JP6165701 B2 JP 6165701B2 JP 2014236927 A JP2014236927 A JP 2014236927A JP 2014236927 A JP2014236927 A JP 2014236927A JP 6165701 B2 JP6165701 B2 JP 6165701B2
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crystal orientation
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kam value
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航佑 柴田
航佑 柴田
村上 俊夫
俊夫 村上
敬祐 小澤
敬祐 小澤
文雄 湯瀬
文雄 湯瀬
康宏 林田
康宏 林田
幸博 内海
幸博 内海
厚寛 白木
厚寛 白木
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Kobe Steel Ltd
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Description

本発明は、鋼板の切断端部において遅れ破壊により発生するき裂の深さを予測する方法に関するものである。   The present invention relates to a method for predicting the depth of a crack generated by delayed fracture at a cut end of a steel plate.

近年、自動車の軽量化と衝突安全性を両立させるために、骨格部品に用いられる自動車用鋼板に対して高強度化が求められている。しかしながら、自動車用鋼板としての高強度鋼板の採用には遅れ破壊の懸念があり、高強度化の障害となっている。   In recent years, in order to achieve both weight reduction and collision safety of automobiles, higher strength is required for automobile steel sheets used for frame parts. However, the adoption of high-strength steel plates as automotive steel plates is a concern for delayed fracture, which is an obstacle to high strength.

ここで、遅れ破壊とは、静的荷重が負荷された状態において一定時間が経過した後に、鋼が脆性的に破壊する現象であり、鋼中に侵入した水素に起因すると考えられている。また、鋼板に塑性ひずみが導入された場合には遅れ破壊が促進することが報告されている。   Here, delayed fracture is a phenomenon in which steel breaks brittlely after a certain period of time in a state where a static load is applied, and is considered to be caused by hydrogen that has entered the steel. It has also been reported that delayed fracture is promoted when plastic strain is introduced into the steel sheet.

特に、薄鋼板のせん断加工による切断端部には大きな塑性ひずみが導入されているためにせん断加工の影響を受けていない無ひずみ部に比べて耐遅れ破壊特性が劣っており、薄鋼板は切断端部から遅れ破壊が発生しやすいとされる。実際の使用環境において切断端部で遅れ破壊が発生し大きなき裂に成長すれば、部材強度を劣化させて重大な事故につながる可能性がある。そのため、実際の使用環境における鋼板の切断端部における遅れ破壊により発生するき裂の深さを見積もる方法の確立が切望されている。   In particular, since large plastic strain is introduced into the cut end of the thin steel plate due to shearing, the delayed fracture resistance is inferior to that of the unstrained portion that is not affected by shearing. It is said that delayed fracture is likely to occur from the end. If a delayed fracture occurs at the cut end in an actual use environment and grows into a large crack, the strength of the member may be degraded, leading to a serious accident. Therefore, establishment of the method of estimating the depth of the crack which generate | occur | produces by the delayed fracture in the cutting edge part of the steel plate in an actual use environment is desired.

実環境下での遅れ破壊特性を評価する試験としては、大気環境下で暴露し、遅れ破壊発生の有無や発生までの時間を指標とする大気暴露試験がある(非特許文献1)。しかしながら、大気暴露試験では試験期間が数ヶ月〜数年と非常に長期に及ぶことから、工業的な特性評価試験としては不向きであった。   As a test for evaluating delayed fracture characteristics in an actual environment, there is an atmospheric exposure test in which exposure is performed in an atmospheric environment and whether or not delayed fracture occurs and the time until the occurrence is used as an index (Non-Patent Document 1). However, the atmospheric exposure test has a very long test period of several months to several years, and is not suitable as an industrial characterization test.

また、公知の促進試験方法として酸性の溶液への浸漬試験があるが、例えば非特許文献2に記載されるような塩酸浸漬では実環境に比べて腐食速度が著しく大きくなる場合があり、実環境での試験結果とは異なる結果が得られることがある。   In addition, there is an immersion test in an acidic solution as a known accelerated test method. For example, in hydrochloric acid immersion as described in Non-Patent Document 2, the corrosion rate may be significantly higher than the actual environment. Results may differ from test results at.

衣笠純一郎、外4名,「高強度薄鋼板の耐遅れ破壊性評価(1470MPa級薄鋼板 大気暴露48ヶ月評価結果)」,材料とプロセス,一般社団法人日本鉄鋼協会,2009年, 第22巻,第1号,p.596Junichiro Kinugasa, 4 others, “Evaluation of delayed fracture resistance of high-strength steel sheets (1470 MPa class steel sheet, atmospheric exposure 48 months evaluation results)”, Materials and Processes, Japan Iron and Steel Institute, 2009, Vol. 22, No. 1, p. 596 田路勇樹、外4名,「高強度薄鋼板の耐水素脆化特性評価法」,鉄と鋼,一般社団法人日本鉄鋼協会,2009年,第95巻,第12号,p.887−894Yuki Taji, 4 others, “Method for evaluating hydrogen embrittlement resistance of high strength thin steel sheet”, Iron and Steel, Japan Iron and Steel Institute, 2009, Vol. 95, No. 12, p. 887-894

そこで本発明の目的は、鋼板の切断端部にて遅れ破壊により発生するき裂の深さを、短時間でかつ精度良く予測しうる方法を提供することにある。   Accordingly, an object of the present invention is to provide a method capable of accurately predicting the depth of a crack caused by delayed fracture at a cut end of a steel plate in a short time.

本発明の第1発明に係る鋼板切断端部における遅れ破壊により発生するき裂の深さ予測方法は、
引張強度が1000MPa以上であり、マルテンサイトおよび/またはベイナイトの合計面積率が80%以上の組織を有する鋼板について、その鋼板の切断端部にて遅れ破壊により発生するき裂の深さを予測する方法であって、
前記鋼板の切断端面に直交する板厚断面に対し、無ひずみ部にてEBSP測定を行うことで、無ひずみ部における結晶方位データを得る無ひずみ部結晶方位データ取得工程と、
前記板厚断面に対し、前記切断端部でのEBSP測定を行うことで、前記切断端部における結晶方位データを得る切断端部結晶方位データ取得工程と、
前記無ひずみ部における結晶方位データより、当該無ひずみ部における平均KAM(Kernel Average Misorientation)値K0を算出する無ひずみ部KAM値算出工程と、
前記切断端部における結晶方位データより、前記切断端面からその対向端面方向に向かって一定距離ごとに所定測定領域における平均KAM値K1を算出する切断端部KAM値算出工程と、
前記無ひずみ部における平均KAM値K0と、前記切断端部における、前記一定距離ごとの所定測定領域における平均KAM値K1を比較し、K1がK0より[前記結晶方位データの測定間隔(単位:μm)×2]°以上大きいという条件を満たす所定測定領域のうち、前記切断端面から最遠の所定測定領域までの距離をき裂深さと決定するき裂深さ決定工程と、
を有することを特徴とする。
The method for predicting the depth of a crack caused by delayed fracture at the steel sheet cutting end according to the first invention of the present invention is as follows.
For a steel sheet having a structure in which the tensile strength is 1000 MPa or more and the total area ratio of martensite and / or bainite is 80% or more, the depth of cracks caused by delayed fracture at the cut end of the steel sheet is predicted. A method,
With respect to the thickness cross section perpendicular to the cut end surface of the steel sheet, by performing EBSP measurement at the unstrained part, the unstrained part crystal orientation data acquisition step for obtaining crystal orientation data at the unstrained part,
A cutting edge crystal orientation data acquisition step for obtaining crystal orientation data at the cutting edge by performing EBSP measurement at the cutting edge with respect to the plate thickness cross section,
From the crystal orientation data in the unstrained part, a non-strained part KAM value calculating step for calculating an average KAM (Kernel Average Misoration) value K0 in the unstrained part,
From the crystal orientation data at the cut end, a cut end KAM value calculating step for calculating an average KAM value K1 in a predetermined measurement region for each fixed distance from the cut end face toward the facing end face direction;
The average KAM value K0 in the unstrained part is compared with the average KAM value K1 in the predetermined measurement area at the fixed distance at the cut end, and K1 is more than K0 [measurement interval of crystal orientation data (unit: μm). ) × 2] out of the predetermined measurement region that satisfies the condition that it is greater than or equal to °, a crack depth determination step for determining the distance from the cut end surface to the farthest predetermined measurement region as the crack depth;
It is characterized by having.

本発明の第2発明に係る鋼板切断端部における遅れ破壊により発生するき裂の深さ予測方法は、
上記第1発明において、
前記無ひずみ部結晶方位データ取得工程にて、
前記無ひずみ部で、100μm以上の測定領域内の各測定点で測定された結晶方位データから算出された複数のKAM値を算術平均して平均KAM値K0を得るとともに、
前記切断端部KAM値算出工程にて、
前記切断端部で、前記切断端面から5〜75μmの前記一定距離ごとに、板厚×前記対向端面方向0.5〜2μm幅の前記所定測定領域から得られた結晶方位データを用いるにあたり、前記所定測定領域を、板厚方向20〜300μm厚みの複数の測定区間に分割し、この複数の測定区間のそれぞれの測定区間内における各測定点でのKAM値を算術平均して前記それぞれの測定区間における平均KAM値を求め、これらそれぞれの測定区間における平均KAM値のうちで最大のものを当該所定測定領域における平均KAM値K1とするものである。
The method for predicting the depth of cracks caused by delayed fracture at the steel sheet cutting edge according to the second invention of the present invention is as follows.
In the first invention,
In the strain-free crystal orientation data acquisition step,
In the unstrained portion, an average KAM value K0 is obtained by arithmetically averaging a plurality of KAM values calculated from crystal orientation data measured at each measurement point in a measurement region of 100 μm 2 or more, and
In the cutting end KAM value calculating step,
In using the crystal orientation data obtained from the predetermined measurement region having a width of 0.5 to 2 μm in the opposite end face direction at the constant distance of 5 to 75 μm from the cut end face at the cut end, The predetermined measurement area is divided into a plurality of measurement sections having a thickness of 20 to 300 μm in the thickness direction, and the KAM values at the respective measurement points in the respective measurement sections of the plurality of measurement sections are arithmetically averaged to obtain the respective measurement sections. The average KAM value is obtained, and the largest of the average KAM values in the respective measurement sections is set as the average KAM value K1 in the predetermined measurement region.

本発明によれば、鋼板の切断端部および無ひずみ部のそれぞれで測定した結晶方位データから算出した方位差(KAM値)を用いて、切断時に導入された塑性ひずみ量を評価することで、鋼板の切断端部にて遅れ破壊により発生するき裂の深さを、短時間でかつ精度良く予測する方法を提供できるようになった。   According to the present invention, by using the orientation difference (KAM value) calculated from the crystal orientation data measured at each of the cut end portion and the unstrained portion of the steel sheet, by evaluating the amount of plastic strain introduced at the time of cutting, It has become possible to provide a method for accurately predicting the depth of a crack generated by delayed fracture at the cut end of a steel plate in a short time.

本発明の実施形態に係る予測方法の構成を説明するためのフローチャートである。It is a flowchart for demonstrating the structure of the prediction method which concerns on embodiment of this invention. 切断端面からの距離と局部の平均KAM値との関係を模式的に示すグラフである。It is a graph which shows typically the relation between the distance from a cut end face, and a local average KAM value. 第1実施形態における、切断端部を有する鋼板のEBSPによる測定部位を示す正面図である。It is a front view which shows the measurement site | part by EBSP of the steel plate which has a cutting | disconnection edge part in 1st Embodiment. 第2実施形態における、切断端部を有する鋼板のEBSPによる測定部位を示す正面図である。It is a front view which shows the measurement site | part by EBSP of the steel plate which has a cutting | disconnection edge part in 2nd Embodiment.

以下、本発明について、図面を参照しつつ、さらに詳細に説明する。   Hereinafter, the present invention will be described in more detail with reference to the drawings.

〔本発明の適用対象鋼板〕
本発明に係る予測方法を適用する対象鋼板は、「引張強度が1000MPa以上であり、マルテンサイトおよび/またはベイナイトの合計面積率が80%以上の組織を有する鋼板」である。
[Applicable steel plate of the present invention]
The target steel plate to which the prediction method according to the present invention is applied is a “steel plate having a structure in which the tensile strength is 1000 MPa or more and the total area ratio of martensite and / or bainite is 80% or more”.

遅れ破壊は、主に高強度鋼で発生する現象であり、引張強度が1000MPaに満たない鋼板においては本発明に係る予測方法で見積もられる(予測される)き裂深さと大気環境下での暴露試験の結果として得られるき裂深さが異なる場合がある。   Delayed fracture is a phenomenon that occurs mainly in high-strength steel. For steel sheets with a tensile strength of less than 1000 MPa, the crack depth estimated by the prediction method according to the present invention and exposure under atmospheric conditions The crack depth obtained as a result of the test may vary.

また、引張強度が1000MPa以上の鋼板の組織は、硬質なマルテンサイトやベイナイトを主相とすることがほとんどであるが、主相以外の第2相の割合が大きくなりすぎると、組織に対応した非常にミクロな塑性ひずみ分布が生じるために、本発明に係る予測方法で見積もられる(予測される)き裂深さと大気環境下での暴露試験の結果として得られるき裂深さが異なる場合がある。   Moreover, the structure of the steel sheet having a tensile strength of 1000 MPa or more is mainly composed of hard martensite or bainite, but the structure corresponds to the structure when the ratio of the second phase other than the main phase becomes too large. Due to the very micro plastic strain distribution, the crack depth estimated (predicted) by the prediction method according to the present invention may differ from the crack depth obtained as a result of the exposure test in the atmospheric environment. is there.

よって、本発明に係る予測方法の適用対象鋼板は、「引張強度が1000MPa以上であり、マルテンサイトおよび/またはベイナイトの合計面積率が80%以上の組織を有する鋼板」とした。   Therefore, the steel sheet to which the prediction method according to the present invention is applied is “a steel sheet having a structure in which the tensile strength is 1000 MPa or more and the total area ratio of martensite and / or bainite is 80% or more”.

なお、上記適用対象鋼板の板厚については特に限定されないが、本発明に係る予測方法は、板厚3mm未満の薄鋼板に適用するのが特に好ましい。   In addition, although it does not specifically limit about the plate | board thickness of the said application target steel plate, It is especially preferable to apply the prediction method which concerns on this invention to the thin steel plate of plate | board thickness less than 3 mm.

〔本発明の主要構成〕
本発明に係る予測方法は、図1に示すように、EBSP測定により無ひずみ部における結晶方位データを取得する無ひずみ部結晶方位データ取得工程(ステップS1)と、EBSP測定により切断端部における結晶方位データを取得する切断端部結晶方位データ取得工程(ステップS2)と、無ひずみ部における結晶方位データから平均KAM値K0を算出する無ひずみ部KAM値算出工程(ステップS3)と、切断端部における結晶方位データから、切断端部から一定距離ごとの平均KAM値K1を算出する切断端部KAM値算出工程(ステップS4)と、K1≧K0+[結晶方位データ測定間隔(単位:μm)×2]°を満たす切断端面からの最大距離をき裂深さと決定するき裂深さ決定工程(ステップS5)と、を主な構成として有している。
[Main Configuration of the Present Invention]
As shown in FIG. 1, the prediction method according to the present invention includes a strain-free portion crystal orientation data acquisition step (step S1) for acquiring crystal orientation data in an unstrained portion by EBSP measurement, and a crystal at a cut end by EBSP measurement. Cutting end crystal orientation data acquiring step (step S2) for acquiring orientation data, unstrained portion KAM value calculating step (step S3) for calculating average KAM value K0 from crystal orientation data in the unstrained portion, and cutting end Cutting end KAM value calculating step (step S4) for calculating an average KAM value K1 for each fixed distance from the cutting end, and K1 ≧ K0 + [crystal orientation data measurement interval (unit: μm) × 2 And a crack depth determining step (step S5) for determining the maximum distance from the cut end surface satisfying the angle as the crack depth as a main component. That.

ここで、無ひずみ部結晶方位取得工程(ステップS1)と切断端部結晶方位取得工程(ステップS2)は、どちらを先に行ってもよい。また、無ひずみ部KAM値算出工程(ステップS3)と切断端部KAM値算出工程(ステップS4)は、どちらを先に行ってもよい。以下、各工程について、実施形態に基づき、詳細に説明する。   Here, either the unstrained part crystal orientation acquisition step (step S1) or the cut end crystal orientation acquisition step (step S2) may be performed first. In addition, either the undistorted portion KAM value calculating step (step S3) or the cut end KAM value calculating step (step S4) may be performed first. Hereinafter, each process is demonstrated in detail based on embodiment.

[第1実施形態]
(1)無ひずみ部結晶方位データ取得工程
本工程は、前記鋼板の切断端面に直交する板厚断面に対し、無ひずみ部にてEBSP測定を行うことで、無ひずみ部における結晶方位データを得る工程である。
[First Embodiment]
(1) Unstrained part crystal orientation data acquisition step This step obtains crystal orientation data in the unstrained part by performing EBSP measurement at the unstrained part on the thickness cross section orthogonal to the cut end face of the steel sheet. It is a process.

鋼板の切断端部は塑性ひずみ分布を有している。すなわち、図2に模式的に示すように、塑性ひずみ量(局所の平均KAM値)は、切断端部に近いほど大きく、切断端部から遠ざかるほど小さくなる。本発明においては、この塑性ひずみ分布を定量的に評価する必要があることから、鋼板の切断端面に直交する板厚断面に対しEBSP測定を行う。   The cut end of the steel sheet has a plastic strain distribution. That is, as schematically shown in FIG. 2, the plastic strain amount (local average KAM value) increases as the distance from the cut end increases, and decreases as the distance from the cut end increases. In this invention, since it is necessary to evaluate this plastic strain distribution quantitatively, EBSP measurement is performed with respect to the plate | board thickness cross section orthogonal to the cutting end surface of a steel plate.

ここで、EBSPとは、試験片表面に電子線を入射させたときに発生する反射電子から得られた菊池パターン(「菊池線」ともいう。)のことであり、この菊池パターンを解析することにより、電子線入射位置における結晶方位を決定することができるものである。また、菊池パターン(菊池線)とは、結晶に当たった電子線が散乱して回折された際に、白黒一対の平行線や帯状またはアレイ状に電子線回折像の背後に現れるパターンのことを指す。   Here, EBSP is a Kikuchi pattern (also referred to as “Kikuchi Line”) obtained from reflected electrons generated when an electron beam is incident on the surface of a test piece, and this Kikuchi pattern is analyzed. Thus, the crystal orientation at the electron beam incident position can be determined. The Kikuchi pattern (Kikuchi line) is a pattern that appears behind the electron diffraction pattern as a pair of black and white parallel lines or strips or arrays when the electron beam hitting the crystal is scattered and diffracted. Point to.

EBSPによる結晶方位の決定は、通常の顕微鏡観察では同一と判断される組織であって結晶方位差の異なる板厚方向の鋼組織を、(1) 色調差によって識別できる、(2) TEM(透過型電子顕微鏡;Transmission Electron Microscope)では難しいバルク(塊状)試料の測定が可能である、(3) 観察用の薄膜試料の作成が不要である、(4) 測定・解析時間を飛躍的に短縮することが可能である、等の利点がある。   The determination of crystal orientation by EBSP is to identify the steel structure in the thickness direction, which is the same in ordinary microscopic observations but with different crystal orientation differences, by (1) color difference, (2) TEM (transmission) Type electron microscope (Transmission Electron Microscope) makes it possible to measure bulk samples, (3) No need to make a thin film sample for observation, (4) Significantly shortens measurement and analysis time There are advantages such as being possible.

EBSPによる結晶粒のひずみ量の測定は、EBSP検出器を備えたFE−SEM(電界放射型 走査型電子顕微鏡;Field Emission−Scanning Electron Microscope)を用いた組織評価によって行なうことが好ましい。FE−SEMによって試験片の表面に電子線を2次元で走査し、所定のピッチごとに結晶方位を測定することで、試験片表面における結晶方位データを解析することができる。なお、EBSP検出器を備えたFE−SEMとしては、例えば、「日本電子社製 電界放出型走査電子顕微鏡 JSM−6500F」を用いることができる。   The measurement of the amount of crystal grain distortion by EBSP is preferably performed by structural evaluation using an FE-SEM (Field Emission-Scanning Electron Microscope) equipped with an EBSP detector. The crystal orientation data on the surface of the test piece can be analyzed by scanning the surface of the test piece two-dimensionally with the FE-SEM and measuring the crystal orientation at every predetermined pitch. In addition, as a FE-SEM provided with the EBSP detector, for example, “JEOL field emission scanning electron microscope JSM-6500F” can be used.

無ひずみ部BにおけるEBSPによる測定領域B1としては、図3および図4に示すように、例えば、切断端面11から10mm以上離れた位置で、鋼板(試験片)1の板厚tの1/4の深さ位置(t/4)を中心とする一定領域を測定領域B1とし、その測定領域B1の面積としては100μm以上とするのが望ましい。 As the measurement area B1 by EBSP in the unstrained portion B, as shown in FIGS. 3 and 4, for example, at a position separated from the cut end face 11 by 10 mm or more, ¼ of the thickness t of the steel plate (test piece) 1 is obtained. A constant region centered at the depth position (t / 4) is defined as a measurement region B1, and the area of the measurement region B1 is preferably 100 μm 2 or more.

ここで、「切断端面11から10mm以上離れた位置」とするのは、切断端部Aに導入された塑性ひずみの影響を無視できる位置で測定するためである。また、「板厚tの1/4深さ位置」とするのは、成分の偏析や特殊な組織が存在する可能性のある表面部や板厚中心部を避けて平均的な成分組成および組織を有する板厚中間部で測定するためである。また、「一定領域B1の面積としては100μm以上」とするのは、十分な広さの領域にて多数の測定点で測定することで、無ひずみ部Bにおける代表的な結晶方位データを得るためである。なお、より好ましい一定領域Bの面積は400μm以上、特に好ましい一定領域Bの面積は1000μm以上である。 Here, the “position away from the cut end face 11 by 10 mm or more” is for measurement at a position where the influence of the plastic strain introduced into the cut end A can be ignored. In addition, “1/4 depth position of the thickness t” means that the average component composition and structure avoiding the surface portion and the center of the plate thickness where segregation of components or a special structure may exist. This is because the measurement is performed at the middle portion having a thickness. Further, “the area of the constant region B1 is 100 μm 2 or more” is to obtain representative crystal orientation data in the unstrained portion B by measuring at a large number of measurement points in a sufficiently wide region. Because. A more preferable area of the constant region B is 400 μm 2 or more, and a particularly preferable area of the constant region B is 1000 μm 2 or more.

以下、結晶方位データの測定手段について、具体的に説明する。   The crystal orientation data measuring means will be specifically described below.

先ず、切断端面を有する鋼板を、その切断端面に直交する板厚方向に切断し、その切断面を測定面とするため研磨するが、研磨による組織変化の影響を防ぐため電解研磨を行なうことが好ましい。   First, a steel plate having a cut end face is cut in the thickness direction orthogonal to the cut end face, and polished to make the cut face a measurement surface, but electrolytic polishing may be performed to prevent the influence of the structure change due to polishing. preferable.

次に、FE−SEMの鏡筒内に試験片をセットして測定部位に電子線を照射し、スクリーン上にEBSPを投影する。これを高感度カメラで撮影してコンピュータに画像データとして取り込む。そして、EBSPの画像解析を行ない、既知の結晶系(FCC:面心立方格子、BCC:体心立方格子)を用いたシミュレーションによるパターンとの比較によって、認識した結晶系の方位決定を行なう。なお、解析に用いるソフトウェアとしては、例えば、「EDAX−TSL社製 OIM(Orientation Imaging Microscopy)Analysis6×64」を用いることができる。なお、粒界等を含む方位角決定の信頼性が著しく低いCI≦0.1のデータを除外して解析することが好ましい。   Next, a test piece is set in the lens barrel of the FE-SEM, the measurement site is irradiated with an electron beam, and EBSP is projected on the screen. This is photographed with a high-sensitivity camera and captured as image data into a computer. Then, EBSP image analysis is performed, and the orientation of the recognized crystal system is determined by comparison with a simulation pattern using a known crystal system (FCC: face-centered cubic lattice, BCC: body-centered cubic lattice). As software used for analysis, for example, “OIM (Orientation Imaging Microscopy) Analysis 6 × 64 manufactured by EDAX-TSL” can be used. In addition, it is preferable to analyze by excluding data of CI ≦ 0.1, which has extremely low reliability in determining the azimuth angle including grain boundaries.

(2)切断端部結晶方位データ取得工程
次に、切断端部AにおけるEBSPによる測定領域A1としては、図3に示すように、例えば、板厚中央位置を中心とする板厚方向所定厚さ(例えば40μm)×切断端面11からその図示しない対向端面方向の所定距離まで(例えば0〜300μm)の範囲を測定領域A1として選択すればよい(後記実施例における発明例1、3参照)。これにより、大気暴露試験を実施することなく、短時間の測定で精度良くき裂深さを見積もる(予測する)ことが可能となる。
(2) Cutting Edge Crystal Orientation Data Acquisition Step Next, as the measurement region A1 by EBSP at the cutting edge A, for example, as shown in FIG. A range from (for example, 40 μm) × the cut end surface 11 to a predetermined distance in the opposite end surface direction (not shown) (for example, 0 to 300 μm) may be selected as the measurement region A1 (see Invention Examples 1 and 3 in Examples described later). This makes it possible to accurately estimate (predict) the crack depth with a short time measurement without carrying out an atmospheric exposure test.

結晶方位データの測定手段については、上記無ひずみ部結晶方位データ取得工程で説明した手段と同様の手段を用いればよい。   As the means for measuring crystal orientation data, the same means as described in the strain-free crystal orientation data acquisition step may be used.

(3)無ひずみ部KAM値算出工程
上記無ひずみ部Bにおける結晶方位データから、当該無ひずみ部Bにおける平均KAM(Kernel Average Misorientation)値K0を算出する。無ひずみ部Bにおける平均KAM値K0は、測定領域B1の全測定点におけるKAM値を算術平均することで求めることができる。
(3) Unstrained part KAM value calculation step From the crystal orientation data in the unstrained part B, an average KAM (Kernel Average Misoration) value K0 in the unstrained part B is calculated. The average KAM value K0 in the unstrained portion B can be obtained by arithmetically averaging the KAM values at all measurement points in the measurement region B1.

EBSPによる結晶粒の方位差の評価としては、KAM(Kernel Average Misorientation)を用いることで、局所的な方位差を定量評価できる。KAMは、局所的な方位変化に基づくひずみ分布を示すものであり、各測定点において、隣り合う6つのピクセル間の方位差の平均値によって表されるものである。ピクセル間における微小な角度変化は、その領域に導入された塑性ひずみ量によって決定される転位密度と対応するものと考えることができる。そのため、KAM値を用いて局所的な方位変化に基づく塑性ひずみ分布を評価することができる。   As evaluation of orientation difference of crystal grains by EBSP, local orientation difference can be quantitatively evaluated by using KAM (Kernel Average Misorientation). KAM indicates a strain distribution based on a local azimuth change, and is represented by an average value of azimuth differences between six adjacent pixels at each measurement point. A minute angle change between pixels can be considered to correspond to a dislocation density determined by the amount of plastic strain introduced into the region. Therefore, it is possible to evaluate the plastic strain distribution based on the local orientation change using the KAM value.

ここで、隣接する測定点間で5°を超える方位差があった場合は、その方位差は亜粒界やセル壁と考えてKAMの計算から除いている。したがって、5°以下の方位差のみを結晶粒内の方位揺らぎと考えて解析を行った。   Here, if there is an orientation difference exceeding 5 ° between adjacent measurement points, the orientation difference is considered as a subgrain boundary or cell wall and excluded from the calculation of KAM. Therefore, the analysis was performed considering only the orientation difference of 5 ° or less as the orientation fluctuation in the crystal grains.

(4)切断端部KAM値算出工程
次に、上記無ひずみ部KAM値算出工程と同様にして、上記切断端部Aにおける測定領域A1で測定した結晶方位データより、切断端面11から対向端面方向に向かって一定幅(例えば1μm)の所定測定領域A11ごとに平均KAM値K1を算出する。
(4) Cutting end KAM value calculating step Next, in the same manner as the unstrained portion KAM value calculating step, from the crystal orientation data measured in the measurement region A1 in the cutting end A, the direction from the cutting end surface 11 to the facing end surface An average KAM value K1 is calculated for each predetermined measurement region A11 having a constant width (for example, 1 μm) toward the front.

(5)き裂深さ決定工程
無ひずみ部Bにおける平均KAM値K0と、切断端部Aにおける所定測定領域A11ごとの平均KAM値K1を比較し、K1がK0より[結晶方位データの測定間隔t1(単位:μm)×2]°以上大きいという条件を満たす測定領域A1のうち、切断端面11から最遠の所定測定領域A11までの距離をき裂深さと決定する。
(5) Crack depth determination step The average KAM value K0 in the unstrained part B and the average KAM value K1 for each predetermined measurement region A11 in the cut end A are compared, and K1 is determined from K0 [measurement interval of crystal orientation data. Of the measurement region A1 that satisfies the condition of t1 (unit: μm) × 2] ° or more, the distance from the cut end surface 11 to the farthest predetermined measurement region A11 is determined as the crack depth.

本発明者らは、上述のように、切断端部における遅れ破壊の支配因子が塑性ひずみ量であることを見出し、塑性ひずみ量を評価する指標としてEBSPを用いて得られる結晶方位データから算出されるKAM値を用いる方法を考案するに至った。そして、種々の鋼板について、本発明に係る予測方法を用いて予測したき裂深さと、大気暴露試験によって実際に測定したき裂深さを比較することで、切断端部の平均KAM値が無ひずみ部の平均KAM値より[結晶方位データの測定間隔(単位:μm)×2]°以上大きいという条件を満たす測定領域では遅れ破壊が発生することを知見した。そして、この知見に基づき、上記条件を満たす測定領域の中で切断端面から最も離れた測定領域と切断端面の距離によってき裂深さを見積もることができることを見出したものである。   As described above, the present inventors have found that the dominant factor of delayed fracture at the cutting edge is the amount of plastic strain, and calculated from crystal orientation data obtained using EBSP as an index for evaluating the amount of plastic strain. The inventors have come up with a method that uses KAM values. For various steel sheets, the average KAM value at the cutting edge is reduced by comparing the crack depth predicted using the prediction method according to the present invention with the crack depth actually measured by the atmospheric exposure test. It was found that delayed fracture occurs in a measurement region that satisfies the condition of [measurement interval of crystal orientation data (unit: μm) × 2] ° or more than the average KAM value of the strained portion. And based on this knowledge, it discovered that a crack depth could be estimated by the distance of the measurement area | region farthest from the cutting end surface in the measurement area | region which satisfy | fills the said conditions, and a cutting end surface.

なお、無ひずみ部の平均KAM値との差異が結晶方位データの測定間隔に依存するのは、KAM値の絶対値自体が結晶方位データの測定間隔に依存して変化するためである。本発明におけるEBSP測定においては、KAM値の絶対値は結晶方位データの測定間隔に比例することが知られている。そして、図2に示すように、上記測定間隔が0.1μmのときには、無ひずみ部との平均KAM値の差異が0.2°以上の測定領域のうち、切断端面から最遠の測定領域までの距離をき裂深さとして見積もることができることがわかった。そこで、上記のように、無ひずみ部の平均KAM値との差異のしきい値を、[結晶方位データの測定間隔(単位:μm)×2]°と規定したものである。   The reason why the difference from the average KAM value of the unstrained part depends on the measurement interval of the crystal orientation data is that the absolute value of the KAM value itself changes depending on the measurement interval of the crystal orientation data. In the EBSP measurement in the present invention, it is known that the absolute value of the KAM value is proportional to the measurement interval of crystal orientation data. As shown in FIG. 2, when the measurement interval is 0.1 μm, the measurement area whose average KAM value with respect to the unstrained part is 0.2 ° or more, from the cut end face to the farthest measurement area. It was found that the distance can be estimated as the crack depth. Therefore, as described above, the threshold value of the difference from the average KAM value of the unstrained portion is defined as [measurement interval of crystal orientation data (unit: μm) × 2] °.

[第2実施形態]
本実施形態は、上記第1実施形態と、上記(2)切断端部結晶方位データ取得工程と(4)切断端部KAM値算出工程が異なるものである。なお、上記(1)無ひずみ部結晶方位データ取得工程、(3)無ひずみ部KAM値算出工程、および、(5)き裂深さ決定工程については、上記第1実施形態と共通であるので説明を省略する。
[Second Embodiment]
This embodiment is different from the first embodiment in (2) cutting edge crystal orientation data acquisition step and (4) cutting edge KAM value calculation step. The above (1) unstrained portion crystal orientation data acquisition step, (3) unstrained portion KAM value calculation step, and (5) crack depth determination step are the same as those in the first embodiment. Description is omitted.

(2)切断端部結晶方位データ取得工程
切断端部AにおけるEBSPによる測定領域A11としては、図4に示すように、切断端面11からその図示しない対向端面方向の所定距離(例えば300μm)までの範囲で、切断端面11から5〜75μmの一定距離Lごとに、板厚t×前記対向端面方向0.5〜2μm幅dの所定測定領域A11とするのがより好ましい(後記実施例における発明例2、4参照)。これにより、より短時間の測定で精度良くき裂深さを予測することができる。
(2) Cutting end crystal orientation data acquisition step As shown in FIG. 4, the measurement region A11 by EBSP at the cutting end A is from the cutting end surface 11 to a predetermined distance (for example, 300 μm) in the opposite end surface direction (not shown). It is more preferable to set a predetermined measurement area A11 having a thickness t × 0.5 to 2 μm width d in the opposite end face direction at a constant distance L of 5 to 75 μm from the cut end face 11 (invention examples in the examples described later) 2 and 4). As a result, the crack depth can be predicted with high accuracy in a shorter time.

ここで、一定距離Lを5〜75μmとするのは、一定距離Lを小さくしすぎると、切断端部Aにおける測定点が多くなりすぎて測定時間が過大となる一方、一定距離Lを大きくしすぎると、き裂深さの予測精度が劣化するためである。さらに好ましい一定距離Lは20〜70μmであり、特に好ましい一定距離L50μmである。   Here, the constant distance L is set to 5 to 75 μm. If the constant distance L is made too small, the measurement points at the cut end A become too many and the measurement time becomes excessive, while the constant distance L is increased. This is because if it is too large, the crack depth prediction accuracy deteriorates. A more preferable constant distance L is 20 to 70 μm, and a particularly preferable constant distance L is 50 μm.

また、幅dを0.5〜2μmとするのは、幅dを小さくしすぎると、き裂深さの予測精度が劣化する一方、幅dを大きくしすぎると、切断端部Aにおける測定点が多くなりすぎて測定時間が過大となるためである。さらに好ましい幅dは0.7〜1.5μmであり、特に好ましい幅dは1.0μmである。   The width d is set to 0.5 to 2 μm because if the width d is too small, the crack depth prediction accuracy deteriorates. On the other hand, if the width d is too large, the measurement point at the cut end A is measured. This is because the measurement time becomes excessive due to the excessive amount of. A more preferable width d is 0.7 to 1.5 μm, and a particularly preferable width d is 1.0 μm.

結晶方位データの測定間隔Δtは0.02〜0.5μmとするのが好ましい。これは、マルテンサイトやベイナイトのブロック間隔が1μm程度であることから、0.5μmを超える測定間隔ではブロック内の方位差を評価することが難しく、一方、0.02μm未満の測定間隔では測定に時間が掛かりすぎることから実用的な方法となり得ないからである。さらに好ましい測定間隔Δtは0.05〜0.2μmであり、特に好ましい測定間隔Δtは0.1μmである。   The measurement interval Δt of crystal orientation data is preferably 0.02 to 0.5 μm. This is because the block interval of martensite and bainite is about 1 μm, so it is difficult to evaluate the orientation difference in the block at a measurement interval exceeding 0.5 μm, while the measurement interval is less than 0.02 μm. This is because it cannot be a practical method because it takes too much time. A more preferable measurement interval Δt is 0.05 to 0.2 μm, and a particularly preferable measurement interval Δt is 0.1 μm.

(4)切断端部KAM値算出工程
上記切断端部Aにおいて、切断端面11からその図示しない対向端面方向に向かって一定距離Lごとに、板厚t×対向端面方向幅dの所定測定領域A11で測定した結晶方位データより、切断端面11から対向端面方向に向かって一定距離Lごとに所定測定領域A11における平均KAM値K1を算出する。
(4) Cutting edge portion KAM value calculation step In the cutting edge portion A, a predetermined measurement region A11 having a thickness t × a facing edge surface width d at every predetermined distance L from the cutting edge surface 11 toward the facing edge surface (not shown). From the crystal orientation data measured in step 1, the average KAM value K1 in the predetermined measurement region A11 is calculated for each fixed distance L from the cut end surface 11 toward the facing end surface.

なお、所定測定領域A11における平均KAM値K1を算出するにあたり、図4に示すように、所定測定領域A11を、板厚方向20〜300μm厚みt1の複数の区間A2i(i=1〜n;nは分割数)に分割し、この複数の区間A2i(i=1〜n)のそれぞれの区間内における各測定点でのKAM値を算術平均して前記それぞれの区間における平均KAM値K1i(i=1〜n)を求め、これらそれぞれの区間A2i(i=1〜n)における平均KAM値K1i(i=1〜n)のうちで最大のものを当該所定測定領域A11における平均KAM値K1とすることが、さらに好ましい。   In calculating the average KAM value K1 in the predetermined measurement area A11, as shown in FIG. 4, the predetermined measurement area A11 is divided into a plurality of sections A2i (i = 1 to n; n) having a thickness t1 of 20 to 300 μm. Is the number of divisions), and the KAM value at each measurement point in each of the plurality of sections A2i (i = 1 to n) is arithmetically averaged to obtain the average KAM value K1i (i = 1 to n), and the largest one of the average KAM values K1i (i = 1 to n) in the respective sections A2i (i = 1 to n) is set as the average KAM value K1 in the predetermined measurement area A11. More preferably.

シャー切断等により切断端部に導入された塑性ひずみ量は、板厚方向で分布を持つが、板厚方向のどの位置で最大になるかは鋼板の材質や切断条件等により種々変化するため、それに応じて、遅れ破壊により切断端部に発生するき裂の板厚方向における発生位置も種々変化する。このため、上記のように、切断端面からの一定距離ごとに板厚方向で最大となる平均KAM値を代表値とすることで、板厚断面内においてき裂が最も発生しやすい場所を2次元的に予測することが可能となり、き裂深さの予測精度がより向上することとなる。   The amount of plastic strain introduced at the cutting end by shear cutting etc. has a distribution in the plate thickness direction, but the maximum position in the plate thickness direction varies depending on the material of the steel plate, cutting conditions, etc. Correspondingly, the generation position in the plate thickness direction of the crack generated at the cut end due to delayed fracture also changes variously. For this reason, as described above, the average KAM value that is the maximum in the thickness direction for each fixed distance from the cut end surface is used as a representative value, so that the place where cracks are most likely to occur in the thickness section is two-dimensional. Therefore, the prediction accuracy of crack depth can be further improved.

以下、実施例を挙げて本発明をより具体的に説明するが、本発明はもとより下記実施例によって制限を受けるものではなく、前・後記の趣旨に適合し得る範囲で適当に変更を加えて実施することももちろん可能であり、それらはいずれも本発明の技術的範囲に包含される。   EXAMPLES Hereinafter, the present invention will be described more specifically with reference to examples. However, the present invention is not limited by the following examples, but may be appropriately modified within a range that can meet the purpose described above and below. Of course, it is possible to implement them, and they are all included in the technical scope of the present invention.

〔発明例〕
(使用鋼板)
本実施例では、下記表1に示す引張強度および鋼組織を有する2種類の鋼板を使用した。なお、これらの鋼板は、従来公知の方法で製造されたものであり、その板厚はともに1.0mmである。
[Invention Example]
(Use steel plate)
In this example, two types of steel plates having the tensile strength and steel structure shown in Table 1 below were used. In addition, these steel plates are manufactured by a conventionally well-known method, and the plate | board thickness is 1.0 mm in both.

(各相の面積率の測定方法)
下記表1に記載の各相の面積率は、以下のようにして測定した。すなわち、供試材となる各鋼板を鏡面研磨し、その表面を3%ナイタール液で腐食して金属組織を顕出させた後、走査型電子顕微鏡(SEM)を用いて板厚1/4部の概略40μm×30μmの領域5視野について倍率2000倍で観察し、黒く観察される領域のうち、内部に白く観察される炭化物を含むものをベイナイト、灰色にみえる領域をマルテンサイトとそれぞれ定義した。なお、ベイナイト、マルテンサイトの内部には炭化物が存在する場合があるが、炭化物はこれを含有する組織(マルテンサイトまたはベイナイト)の一部であるとみなして、マルテンサイト、ベイナイトの面積率を求めた。
(Measurement method of area ratio of each phase)
The area ratio of each phase described in Table 1 below was measured as follows. That is, each steel plate as a test material was mirror-polished, its surface was corroded with a 3% nital solution to reveal a metal structure, and then a thickness of 1/4 part was measured using a scanning electron microscope (SEM). A region of approximately 40 μm × 30 μm was observed at a magnification of 2000 times, and among regions observed in black, those containing carbides observed in white inside were defined as bainite, and regions that appeared gray were defined as martensite. In addition, although carbide may exist inside bainite and martensite, the carbide is considered to be a part of the structure (martensite or bainite) containing this, and the area ratio of martensite and bainite is obtained. It was.

Figure 0006165701
Figure 0006165701

(切断端面を有する鋼板の作製)
上記板厚1.0mmの平板状の鋼板に対し、シャー切断を施すことで、切断端面を有する鋼板を作製した。なお、切断端面が30mm幅となるように、30mmW×50mmL×1.0mmtの大きさに切断した。
(Production of steel plate with cut end face)
The plate-shaped steel plate having a thickness of 1.0 mm was subjected to shear cutting to produce a steel plate having a cut end face. In addition, it cut | disconnected in the magnitude | size of 30 mmWx50mmLx1.0mmt so that a cut end surface might be set to 30 mm width.

(EBSP測定)
上記30mmW×50mmL×1.0mmtの鋼板の切断端面に直交する板厚断面を観察するため、放電加工によって15mmW×50mmL×1.0mmtとなるように切断し、その放電加工切断面に対して電解研磨を行い、測定間隔0.1μmでEBSP測定を行った。EBSP測定には「日本電子社製 電界放出型走査電子顕微鏡 JSM−6500F」を用いた。
(EBSP measurement)
In order to observe the plate thickness cross section perpendicular to the cut end face of the 30 mmW × 50 mmL × 1.0 mmt steel plate, it is cut to 15 mmW × 50 mmL × 1.0 mmt by electric discharge machining and electrolysis is performed on the electric discharge machining cut surface. Polishing was performed, and EBSP measurement was performed at a measurement interval of 0.1 μm. For the EBSP measurement, a “field emission scanning electron microscope JSM-6500F manufactured by JEOL Ltd.” was used.

そして、無ひずみ部としては、切断端面からその対向端面方向に15mm離れた位置で、板厚1/4の位置を中心とする40μm×40μmの領域でEBSP測定を行った。   And as an unstrained part, EBSP measurement was performed in a 40 μm × 40 μm region centered on a position of a thickness of ¼ at a position 15 mm away from the cut end face in the direction of the facing end face.

また、切断端部としては、発明例1、3では、板厚中央位置を中心とする板厚方向40μm×切断端面からの距離0〜300μmの領域でEBSP測定を行った。   Further, as the cut end portion, in Invention Examples 1 and 3, EBSP measurement was performed in a region having a plate thickness direction of 40 μm centered on the plate thickness center position and a distance of 0 to 300 μm from the cut end surface.

一方、同切断端部として、発明例2、4では、切断端面から300μmまでの範囲で、切断端面からの距離50μmごとに、板厚×1μm幅の領域をEBSP測定した。   On the other hand, in the inventive examples 2 and 4 as the cut end portion, an EBSP measurement was performed on a region of plate thickness × 1 μm width at a distance of 50 μm from the cut end surface in a range from the cut end surface to 300 μm.

(KAM値の算出)
解析ソフトウェアとしては、「EDAX−TSL社製 OIM 6×64」を用いて、各測定点におけるKAM値を算出した。なお、粒界等を含む方位角決定の信頼性が著しく低いCI≦0.1のデータを除外して解析を行った。ここで、隣接する測定点間で5°を超える方位差があった場合は、その方位差は亜粒界やセル壁と考えてKAMの計算から除外した。したがって、5°以下の方位差のみを結晶粒内の方位揺らぎと考えて解析を行った。
(Calculation of KAM value)
As analysis software, “EDM-TSL OIM 6 × 64” was used to calculate the KAM value at each measurement point. The analysis was performed excluding data of CI ≦ 0.1, which has extremely low reliability in determining the azimuth angle including grain boundaries. Here, when there was an orientation difference exceeding 5 ° between adjacent measurement points, the orientation difference was considered as a subgrain boundary or a cell wall, and was excluded from the calculation of KAM. Therefore, the analysis was performed considering only the orientation difference of 5 ° or less as the orientation fluctuation in the crystal grains.

無ひずみ部の平均KAM値K0としては、上記40μm×40μmの測定視野全体のKAM値を平均することで求めた。   The average KAM value K0 of the unstrained part was obtained by averaging the KAM values of the entire 40 μm × 40 μm measurement visual field.

切断端部においては、発明例1、3では、切断端面から一定幅1μm×板厚方向40μmの測定領域ごとに各測定点におけるKAM値を算術平均することで、切断端面からの一定距離1μmごとの平均KAM値K1を求めた(上記第1実施形態に相当)。   At the cutting end, in Invention Examples 1 and 3, the KAM value at each measurement point is arithmetically averaged for each measurement region having a constant width of 1 μm and a plate thickness direction of 40 μm from the cutting end surface, so that the constant distance from the cutting end surface is 1 μm Average KAM value K1 was obtained (corresponding to the first embodiment).

一方、実施例2、4では、一つの測定領域(板厚×1μm幅)を板厚方向40μmごとに分割し、この分割された複数区間のそれぞれの区間ごとに平均KAM値を求め、これらの平均KAM値のうち最大のものを、その一つの測定領域全体の平均KAM値の代表値として算出し、切断端面から一定距離50μmごとの平均KAM値K1を求めた(上記第2実施形態に相当)。   On the other hand, in Examples 2 and 4, one measurement region (plate thickness × 1 μm width) is divided every 40 μm in the plate thickness direction, and an average KAM value is obtained for each of the divided plural sections. The largest average KAM value is calculated as a representative value of the average KAM value of the entire measurement area, and an average KAM value K1 is obtained for each fixed distance of 50 μm from the cut end surface (corresponding to the second embodiment). ).

(き裂深さの見積り)
そして、切断端部における一定距離ごとの平均KAM値K1が、無ひずみ部における平均KAM値K0より[測定間隔(単位:μm)×2]°以上大きいという条件を満たすもののうち、切断端面から最遠の測定領域までの距離をき裂深さとした。
(Estimation of crack depth)
Among those that satisfy the condition that the average KAM value K1 for each fixed distance at the cut end is larger than the average KAM value K0 at the unstrained portion by [measurement interval (unit: μm) × 2] ° or more, the maximum KAM value from the cut end face. The distance to the far measurement area was the crack depth.

〔参考例〕
本発明の適用性を評価するための基準となる参考例として、上記発明例と同じ2種類の鋼板を用い、上記発明例と同じ方法および条件で作製した、切断端部を有する鋼板に対し、大気暴露試験を実施した。大気暴露試験は、JIS Z 2381に準拠した方法にて、大気中に48ヶ月放置する条件で行った。大気暴露試験実施後は、放電加工によって上記発明例と同じ寸法に切断した切断面について、鏡面研磨を行い、光学顕微鏡を用いてき裂を観察し、そのき裂深さを測定した。
[Reference example]
As a reference example that serves as a reference for evaluating the applicability of the present invention, using the same two types of steel sheets as in the above invention examples, the steel sheet having a cut end produced by the same method and conditions as in the above invention examples, An air exposure test was conducted. The atmospheric exposure test was performed under the condition of leaving in the atmosphere for 48 months by a method according to JIS Z 2381. After carrying out the atmospheric exposure test, the cut surface cut into the same dimensions as the above invention example by electric discharge machining was mirror-polished, the crack was observed using an optical microscope, and the crack depth was measured.

〔比較例〕
また、比較例として、上記発明例と同じ2種類の鋼板を用い、上記発明例と同じ方法および条件で作製した、切断端部を有する鋼板に対し、塩酸浸漬試験を実施した。塩酸浸漬試験は、pHを1.0、液温を25℃に管理した塩酸に48時間浸漬する条件で行った。塩酸浸漬試験実施後は、上記参考例と同じく、放電加工によって上記発明例と同じ寸法に切断した切断面について、鏡面研磨を行い、光学顕微鏡を用いてき裂を観察し、そのき裂深さを測定した。
[Comparative Example]
Moreover, the hydrochloric acid immersion test was implemented with respect to the steel plate which has the cut end part produced by the same method and conditions as the said invention example using the same two types of steel plate as the said invention example as a comparative example. The hydrochloric acid immersion test was performed under the condition of immersing in hydrochloric acid having a pH of 1.0 and a liquid temperature of 25 ° C. for 48 hours. After the hydrochloric acid immersion test, as in the above reference example, the cut surface cut into the same dimensions as the above invention example by electrical discharge machining was mirror-polished and the crack was observed using an optical microscope, and the crack depth was determined. It was measured.

〔測定結果〕
測定結果を下記表2に示す。なお、同表において、「大気暴露試験でのき裂深さとの差異」とは、同一鋼種について、大気暴露試験で測定されたき裂深さLcと、各試験で予測ないし測定されたき裂深さLcとの差の絶対値|Lc−Lc|を意味する。また、|Lc0−Lc|が50μm未満の場合には、き裂深さの予測精度が特に優れた評価法であるとして◎、|Lc−Lc|が50μm以上100μm未満の場合には、き裂深さの予測精度が優れた評価方法であるとして○、|Lc−Lc|が100μm以上の場合には、き裂深さの予測精度が劣る評価方法であるとして×でそれぞれ表示し、◎および○を合格とした。
〔Measurement result〕
The measurement results are shown in Table 2 below. In the table, “difference from crack depth in air exposure test” means crack depth Lc 0 measured in air exposure test and crack depth predicted or measured in each test for the same steel type. This means the absolute value | Lc 0 −Lc | of the difference from the thickness Lc. In addition, when | Lc0−Lc | is less than 50 μm, it is considered that the crack depth prediction accuracy is a particularly excellent evaluation method, and when | Lc 0 −Lc | is 50 μm or more and less than 100 μm, As an evaluation method with excellent crack depth prediction accuracy, ○, and when | Lc 0 -Lc | is 100 μm or more, each is indicated by × as an evaluation method with poor crack depth prediction accuracy, ◎ and ○ were accepted.

同表から明らかなように、従来からの促進試験の一つである塩酸浸漬試験で測定されたき裂深さは、大気暴露試験で測定されたき裂深さと大きくかい離しており、き裂深さの予測精度が劣るのに対し、本発明に係る予測方法を用いることで、き裂深さの予測精度が大幅に向上することが確認された。   As is clear from the table, the crack depth measured in the hydrochloric acid immersion test, which is one of the conventional accelerated tests, is largely separated from the crack depth measured in the atmospheric exposure test. It was confirmed that the prediction accuracy of the crack depth was greatly improved by using the prediction method according to the present invention.

Figure 0006165701
Figure 0006165701

1…鋼板(試験片)
11…切断端面
A…切断端部
A1…測定領域
A11…所定測定領域
B…無ひずみ部
B1…測定領域
d…幅
L…一定距離
t…板厚
1 ... Steel plate (test piece)
DESCRIPTION OF SYMBOLS 11 ... Cutting end surface A ... Cutting end A1 ... Measurement area A11 ... Predetermined measurement area B ... Unstrained part B1 ... Measurement area d ... Width L ... Constant distance t ... Plate thickness

Claims (2)

引張強度が1000MPa以上であり、マルテンサイトおよび/またはベイナイトの合計面積率が80%以上の組織を有する鋼板について、その鋼板の切断端部にて遅れ破壊により発生するき裂の深さを予測する方法であって、
前記鋼板の切断端面に直交する板厚断面に対し、無ひずみ部にてEBSP測定を行うことで、無ひずみ部における結晶方位データを得る無ひずみ部結晶方位データ取得工程と、
前記板厚断面に対し、前記切断端部でのEBSP測定を行うことで、前記切断端部における結晶方位データを得る切断端部結晶方位データ取得工程と、
前記無ひずみ部における結晶方位データより、当該無ひずみ部における平均KAM(Kernel Average Misorientation)値K0を算出する無ひずみ部KAM値算出工程と、
前記切断端部における結晶方位データより、前記切断端面からその対向端面方向に向かって一定距離ごとに所定測定領域における平均KAM値K1を算出する切断端部KAM値算出工程と、
前記無ひずみ部における平均KAM値K0と、前記切断端部における、前記一定距離ごとの所定測定領域における平均KAM値K1を比較し、K1がK0より[前記結晶方位データの測定間隔(単位:μm)×2]°以上大きいという条件を満たす所定測定領域のうち、前記切断端面から最遠の所定測定領域までの距離をき裂深さと決定するき裂深さ決定工程と、
を有することを特徴とする、
鋼板切断端部における遅れ破壊により発生するき裂の深さ予測方法。
For a steel sheet having a structure in which the tensile strength is 1000 MPa or more and the total area ratio of martensite and / or bainite is 80% or more, the depth of cracks caused by delayed fracture at the cut end of the steel sheet is predicted. A method,
With respect to the thickness cross section perpendicular to the cut end surface of the steel sheet, by performing EBSP measurement at the unstrained part, the unstrained part crystal orientation data acquisition step for obtaining crystal orientation data at the unstrained part,
A cutting edge crystal orientation data acquisition step for obtaining crystal orientation data at the cutting edge by performing EBSP measurement at the cutting edge with respect to the plate thickness cross section,
From the crystal orientation data in the unstrained part, a non-strained part KAM value calculating step for calculating an average KAM (Kernel Average Misoration) value K0 in the unstrained part,
From the crystal orientation data at the cut end, a cut end KAM value calculating step for calculating an average KAM value K1 in a predetermined measurement region for each fixed distance from the cut end face toward the facing end face direction;
The average KAM value K0 in the unstrained part is compared with the average KAM value K1 in the predetermined measurement area at the fixed distance at the cut end, and K1 is more than K0 [measurement interval of crystal orientation data (unit: μm). ) × 2] out of the predetermined measurement region that satisfies the condition that it is greater than or equal to °, a crack depth determination step for determining the distance from the cut end surface to the farthest predetermined measurement region as the crack depth;
It is characterized by having
A method for predicting the depth of cracks caused by delayed fracture at the cut end of a steel plate.
前記無ひずみ部結晶方位データ取得工程にて、
前記無ひずみ部で、100μm以上の測定領域内の各測定点で測定された結晶方位データから算出された複数のKAM値を算術平均して平均KAM値K0を得るとともに、
前記切断端部KAM値算出工程にて、
前記切断端部で、前記切断端面から5〜75μmの前記一定距離ごとに、板厚×前記対向端面方向0.5〜2μm幅の前記所定測定領域から得られた結晶方位データを用いるにあたり、前記所定測定領域を、板厚方向20〜300μm厚みの複数の測定区間に分割し、この複数の測定区間のそれぞれの測定区間内における各測定点でのKAM値を算術平均して前記それぞれの測定区間における平均KAM値を求め、これらそれぞれの測定区間における平均KAM値のうちで最大のものを当該所定測定領域における平均KAM値K1とする、
請求項1に記載の鋼板切断端部における遅れ破壊により発生するき裂の深さ予測方法。
In the strain-free crystal orientation data acquisition step,
In the unstrained portion, an average KAM value K0 is obtained by arithmetically averaging a plurality of KAM values calculated from crystal orientation data measured at each measurement point in a measurement region of 100 μm 2 or more, and
In the cutting end KAM value calculating step,
In using the crystal orientation data obtained from the predetermined measurement region having a width of 0.5 to 2 μm in the opposite end face direction at the constant distance of 5 to 75 μm from the cut end face at the cut end, The predetermined measurement area is divided into a plurality of measurement sections having a thickness of 20 to 300 μm in the thickness direction, and the KAM values at the respective measurement points in the respective measurement sections of the plurality of measurement sections are arithmetically averaged to obtain the respective measurement sections. The average KAM value at the respective measurement intervals is obtained, and the maximum one of the average KAM values in the respective measurement sections is set as the average KAM value K1 in the predetermined measurement region.
The depth prediction method of the crack which generate | occur | produces by the delayed fracture in the steel plate cutting edge part of Claim 1.
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WO2013114604A1 (en) * 2012-02-02 2013-08-08 中国電力株式会社 Method for estimating crack growth, and information processing device

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