JP6168944B2 - Deposition mask - Google Patents
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- JP6168944B2 JP6168944B2 JP2013195552A JP2013195552A JP6168944B2 JP 6168944 B2 JP6168944 B2 JP 6168944B2 JP 2013195552 A JP2013195552 A JP 2013195552A JP 2013195552 A JP2013195552 A JP 2013195552A JP 6168944 B2 JP6168944 B2 JP 6168944B2
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
- C23C14/086—Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2203/00—Indexing scheme relating to G06F3/00 - G06F3/048
- G06F2203/041—Indexing scheme relating to G06F3/041 - G06F3/045
- G06F2203/04103—Manufacturing, i.e. details related to manufacturing processes specially suited for touch sensitive devices
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Human Computer Interaction (AREA)
- Physical Vapour Deposition (AREA)
- Non-Insulated Conductors (AREA)
Description
本発明は、基板上に薄膜パターンを形成するための成膜マスクに関し、特にマスク材料と薄膜材料との線膨張係数の差に起因するマスクの変形を抑制して、薄膜パターンの位置精度を向上し得る成膜マスクに係るものである。 The present invention relates to a film formation mask for forming a thin film pattern on a substrate, and in particular, suppresses deformation of the mask due to a difference in linear expansion coefficient between the mask material and the thin film material, thereby improving the position accuracy of the thin film pattern. those of the deposition mask capable.
従来の成膜マスクは、非堆積領域とすべき部分を被覆して基材表面と密着させる材料が可撓性フィルムからなる可撓性貼付フィルムを用いた成膜マスクを使用し、可撓性貼付フィルムを基材の成膜側全表面に密着させた後、所望の堆積層を形成すべき領域を覆う可撓性貼付フィルムを選択的に除去し、その後に堆積層を形成する成膜工程を実施し、最後に基材表面上に残された可撓性貼付フィルムを除去するものとなっていた(例えば、特許文献1参照)。 The conventional film-forming mask uses a film-forming mask that uses a flexible adhesive film made of a flexible film made of a flexible film that covers a portion that should be a non-deposition area and adheres closely to the substrate surface. A film forming process in which the adhesive film is adhered to the entire surface of the base material on the film forming side, and then the flexible adhesive film covering a region where a desired deposited layer is to be formed is selectively removed and then the deposited layer is formed. Finally, the flexible adhesive film left on the substrate surface was removed (see, for example, Patent Document 1).
しかし、このような従来の成膜マスクにおいては、マスク材料が例えばポリイミド等の可撓性の樹脂フィルムであるため、該フィルムとフィルム上に堆積される薄膜材料としての例えば透明導電膜との線膨張係数の差によりフィルムに皺や反り等の変形が生じて、成膜される薄膜パターンの位置精度が悪くなるという問題があった。 However, in such a conventional film formation mask, since the mask material is a flexible resin film such as polyimide, a line between the film and a thin film material deposited on the film, for example, a transparent conductive film is used. There was a problem that deformation of the film such as wrinkles and warpage occurred due to the difference in the expansion coefficient, and the position accuracy of the thin film pattern to be formed deteriorated.
そこで、本発明は、このような問題点に対処し、マスク材料と薄膜材料との線膨張係数の差に起因するマスクの変形を抑制して、薄膜パターンの位置精度を向上し得る成膜マスクを提供することを目的とする。 Therefore, the present invention addresses such problems and suppresses mask deformation caused by the difference in linear expansion coefficient between the mask material and the thin film material, thereby improving the position accuracy of the thin film pattern. The purpose is to provide
上記目的を達成するために、第1の発明による成膜マスクは、基板上に成膜される薄膜パターンに対応して開口パターンを形成した樹脂マスクと、前記開口パターンを内包する大きさの貫通孔を形成して前記樹脂マスクの一面側に設置される磁性金属部材のメタルマスクと、を備えて構成され、前記樹脂マスクと前記メタルマスクとの間には、前記基板の裏面に設置される磁石の磁力が前記メタルマスクに作用すると前記メタルマスクを吸引して前記樹脂マスクに密着させ、前記磁石の磁力の作用が取り去られると前記メタルマスクをその弾性復元力により前記樹脂マスクから離隔させ得る大きさの隙間が設けられているものである。 In order to achieve the above object, a film-forming mask according to a first invention comprises a resin mask in which an opening pattern is formed corresponding to a thin film pattern formed on a substrate, and a through-hole having a size including the opening pattern. And a metal mask of a magnetic metal member that is provided on one side of the resin mask by forming a hole, and is provided on the back surface of the substrate between the resin mask and the metal mask. When the magnetic force of the magnet acts on the metal mask, the metal mask is attracted and adhered to the resin mask, and when the magnetic force of the magnet is removed, the metal mask can be separated from the resin mask by its elastic restoring force. A gap of a size is provided .
本発明によれば、樹脂マスクとメタルマスクとの間に所定の隙間を設けているので、成膜時には、基板の裏面に配置された磁石によりメタルマスクが吸引されて樹脂マスクを基板面に密着させ、成膜終了後、磁石によるメタルマスクの吸引作用が解除されたときには、メタルマスクをその弾性復元力により樹脂マスクから離隔させることができる。したがって、樹脂マスクに堆積した薄膜が分断され、樹脂マスクの材料と薄膜材料との間の線膨張係数の差に起因した内部応力も分断されるので、樹脂マスクの変形を抑制することができる。それ故、基板に形成される薄膜パターンの位置精度を向上することができる。 According to the present invention, since the predetermined gap is provided between the resin mask and the metal mask, at the time of film formation, the metal mask is attracted by the magnet disposed on the back surface of the substrate and the resin mask is brought into close contact with the substrate surface. In addition, after the film formation is completed, when the attracting action of the metal mask by the magnet is released, the metal mask can be separated from the resin mask by its elastic restoring force. Therefore, the thin film deposited on the resin mask is divided, and internal stress caused by the difference in linear expansion coefficient between the resin mask material and the thin film material is also divided, so that deformation of the resin mask can be suppressed. Therefore, the positional accuracy of the thin film pattern formed on the substrate can be improved.
以下、本発明の実施形態を添付図面に基づいて詳細に説明する。図1は本発明による成膜マスクの実施形態を示す中心線断面図である。この成膜マスク1は、基板上に薄膜パターンを形成するためのもので、第1のマスク2と、第2のマスク3と、を備えて構成されている。 Embodiments of the present invention will be described below in detail with reference to the accompanying drawings. FIG. 1 is a center line sectional view showing an embodiment of a film forming mask according to the present invention. The film formation mask 1 is used to form a thin film pattern on a substrate, and includes a first mask 2 and a second mask 3.
上記第1のマスク2は、基板上に開口パターン4を介して成膜し、薄膜パターンを形成するためのものであり、メインマスクとなるもので、図2(a)に示すように、樹脂製のフィルム(以下「樹脂マスク5」という)と、金属薄膜6と、第1のフレーム7と、を備えて構成されている。 The first mask 2 is formed on the substrate through the opening pattern 4 to form a thin film pattern, and serves as a main mask. As shown in FIG. It is configured to include a manufactured film (hereinafter referred to as “resin mask 5”), a metal thin film 6, and a first frame 7.
ここで、上記樹脂マスク5は、基板上に成膜される複数の薄膜パターンに対応して該薄膜パターンと形状寸法の同じ貫通する複数の開口パターン4を形成したもので、例えば厚みが10μm〜30μm程度のポリイミド又はポリエチレンテレフタレート(PET)等の可視光を透過する樹脂製フィルムである。なお、以下の説明においては、線膨張係数が被成膜基板としてのガラスの線膨張係数に近似した3×10−6〜5×10−6/℃程度のポリイミドの場合について説明する。 Here, the resin mask 5 is formed by forming a plurality of opening patterns 4 penetrating in the same shape and dimensions as the thin film pattern corresponding to the plurality of thin film patterns formed on the substrate. It is a resin film that transmits visible light, such as polyimide of about 30 μm or polyethylene terephthalate (PET). In the following description, a case of polyimide having a linear expansion coefficient of approximately 3 × 10 −6 to 5 × 10 −6 / ° C. that approximates the linear expansion coefficient of glass as a film formation substrate will be described.
詳細には、上記開口パターン4は、ポリイミドのフィルムを後述の第1のフレーム7に架張して固定した状態で、形成しようとする開口パターン4の形状に整形されたレーザビームを上記フィルムの一面側からポリイミドのフィルムに照射して形成される。この場合、形成しようとする複数の開口パターン4の形成位置に対応して複数の基準マークを形成した透明なガラス基板上に上記フィルムを設置し、透明なポリイミドを透して観察される上記基準マークを目標に上記レーザビームを照射して、上記フィルムに複数の開口パターン4を形成するとよい。又は、上記レーザビームを予め定められた所定のピッチでステップ移動させながら、上記フィルムの面内に複数の開口パターン4を形成してもよい。 Specifically, the opening pattern 4 is obtained by applying a laser beam shaped into the shape of the opening pattern 4 to be formed in a state where a polyimide film is stretched and fixed on a first frame 7 described later. It is formed by irradiating a polyimide film from one side. In this case, the reference is observed through transparent polyimide by placing the film on a transparent glass substrate on which a plurality of reference marks are formed corresponding to the formation positions of the plurality of opening patterns 4 to be formed. A plurality of opening patterns 4 may be formed on the film by irradiating the mark with the laser beam. Alternatively, a plurality of opening patterns 4 may be formed in the plane of the film while stepping the laser beam at a predetermined pitch.
また、上記樹脂マスク5の一面5aにて、上記複数の開口パターン4が形成される有効領域の外側領域には、孤立した複数のパターンからなる金属薄膜6が樹脂マスク5の周縁部に沿って設けられている。この金属薄膜6は、後述の第1のフレーム7の一端面7aにスポット溶接されて、上記樹脂マスク5を第1のフレーム7に固定するためのもので、例えばニッケル等の金属膜を30μm程度の厚みにめっき形成したものである。又は、専用のメタルマスクを使用してスパッタリング又は蒸着により形成してもよく、樹脂マスク5の一面5aの全面に金属薄膜を成膜した後、エッチングして孤立した複数の金属薄膜6のパターンを形成してもよい。 Further, on one surface 5 a of the resin mask 5, a metal thin film 6 composed of a plurality of isolated patterns is formed along the peripheral portion of the resin mask 5 in an outer region of the effective region where the plurality of opening patterns 4 are formed. Is provided. This metal thin film 6 is spot-welded to one end face 7a of a first frame 7 described later, and fixes the resin mask 5 to the first frame 7. For example, a metal film such as nickel is about 30 μm. The thickness is plated. Alternatively, it may be formed by sputtering or vapor deposition using a dedicated metal mask. After a metal thin film is formed on the entire surface 5a of the resin mask 5, a pattern of a plurality of metal thin films 6 isolated by etching is formed. It may be formed.
さらに、上記樹脂マスク5の一面5a側には、第1のフレーム7が設けられている。この第1のフレーム7は、上記樹脂マスク5を架張した状態で、樹脂マスク5の金属薄膜6の部分を一端面7aにスポット溶接して樹脂マスク5を支持するもので、上記樹脂マスク5の複数の開口パターン4を内包する大きさの開口8を有し、外形が上記樹脂マスク5の外形に略等しい大きさの枠状を成した、例えば厚みが30mm〜50mm程度の例えばインバー又はインバー合金等の磁性金属部材である。なお、図2(b)において、符号10は、第1のマスク2を第2のマスク3に固定するためのねじ穴である。 Further, a first frame 7 is provided on the one surface 5 a side of the resin mask 5. The first frame 7 supports the resin mask 5 by spot welding a portion of the metal thin film 6 of the resin mask 5 to one end surface 7a in a state where the resin mask 5 is stretched. For example, an invar or an invar having a thickness of about 30 mm to 50 mm, for example, having a frame shape with an outer shape substantially equal to the outer shape of the resin mask 5. A magnetic metal member such as an alloy. In FIG. 2B, reference numeral 10 denotes a screw hole for fixing the first mask 2 to the second mask 3.
上記第1のマスク2の樹脂マスク5の一面5a側には、樹脂マスク5に対して予め定められた所定の隙間9を設けて第2のマスク3が設置されている。この第2のマスク3は、上記樹脂マスク5に薄膜材料が堆積し、樹脂マスク5と薄膜材料との線膨張係数の差に起因して樹脂マスク5が変形するのを防止するためのものであり、サブマスクとなるもので、図2(b)に示すように、メタルマスク11と、第2のフレーム12とを備えて構成されている。 The second mask 3 is provided on the surface 5 a side of the resin mask 5 of the first mask 2 with a predetermined gap 9 defined in advance with respect to the resin mask 5. The second mask 3 is for preventing the resin mask 5 from being deformed due to the difference in the linear expansion coefficient between the resin mask 5 and the thin film material due to the thin film material deposited on the resin mask 5. Yes, it is a sub mask, and comprises a metal mask 11 and a second frame 12 as shown in FIG.
ここで、上記メタルマスク11は、少なくとも一つの開口パターン4を内包する大きさの貫通孔13を形成した、例えば厚みが30μm〜50μm程度の磁性金属部材であり、外形が上記第1のフレーム7の開口8内に収まる大きさになっており、上記樹脂マスク5に対して上記隙間9を設けて設置されている。この隙間9は、基板の裏面に設置される磁石の磁力がメタルマスク11に作用するとメタルマスク11を吸引して樹脂マスク5に密着させ、磁石の磁力の作用が取り去られるとメタルマスク11をその弾性復元力により樹脂マスク5から離隔させ得る大きさに設定されるのが望ましく、例えば300μm程度である。なお、上記貫通孔13の大きさは、複数の開口パターン4を内包する大きさであってもよいが、樹脂マスク5上への薄膜材料の堆積面積を減らして、マスク材料と薄膜材料との線膨張係数の差に起因して生じる樹脂マスク5の変形を抑制するためには、貫通孔13は一つの開口パターン4を内包する大きさとするのがより望ましい。 Here, the metal mask 11 is a magnetic metal member having, for example, a thickness of about 30 μm to 50 μm in which a through-hole 13 having a size including at least one opening pattern 4 is formed, and has an outer shape of the first frame 7. The resin mask 5 is provided with the gap 9 provided in the opening 8. When the magnetic force of the magnet installed on the back surface of the substrate acts on the metal mask 11, the gap 9 attracts the metal mask 11 to adhere to the resin mask 5, and when the magnetic force of the magnet is removed, the metal mask 11 is removed. It is desirable to set the size so that it can be separated from the resin mask 5 by an elastic restoring force, for example, about 300 μm. The through-hole 13 may have a size including a plurality of opening patterns 4, but the deposition area of the thin film material on the resin mask 5 is reduced to reduce the mask material and the thin film material. In order to suppress the deformation of the resin mask 5 caused by the difference in linear expansion coefficient, it is more desirable that the through hole 13 has a size including one opening pattern 4.
詳細には、上記貫通孔13は、図3に示すようにレジストマスク14を使用して磁性金属部材のシートをウェットエッチングして形成するとよい。この場合、ウェットエッチングにおいては、磁性金属部材は、等方性エッチングされるため、同図(a)に示すように一方の面側からのみエッチングすると、貫通孔13は、その開口面積がレジストマスク14の形成面側から他面側に向かって狭くなるように形成される。また、同図(b)に示すように、磁性金属部材を両面側からエッチングすると、貫通孔13は、両面側の開口面積が内部よりも広くなるように形成される。したがって、成膜時に貫通孔13の側壁に薄膜材料が付着するのを抑制し、成膜後、メタルマスク11を樹脂マスク5から容易に離隔させるためには、メタルマスク11は、同図(c)に示すように貫通孔13の開口面積が広い面側を樹脂マスク5に対面させるとよい。なお、本実施形態においては、貫通孔13の縁部が成膜の影となるのを抑制するために、貫通孔13の開口面積が狭い面側を樹脂マスク5側とした場合について説明する。但し、スパッタリング成膜の場合は、蒸着に比べてスパッタ粒子の回り込みが多いため、図3(c)に示すように、貫通孔13の開口面積が広い面側を樹脂マスク5側としても貫通孔13の縁部が成膜に及ぼす影響は小さい。 Specifically, the through hole 13 may be formed by wet etching a sheet of magnetic metal member using a resist mask 14 as shown in FIG. In this case, since the magnetic metal member is isotropically etched in the wet etching, if the etching is performed only from one surface side as shown in FIG. 14 is formed so as to become narrower from the formation surface side toward the other surface side. Further, as shown in FIG. 4B, when the magnetic metal member is etched from both sides, the through hole 13 is formed so that the opening area on both sides is wider than the inside. Therefore, in order to prevent the thin film material from adhering to the side wall of the through hole 13 during film formation and to easily separate the metal mask 11 from the resin mask 5 after film formation, the metal mask 11 is shown in FIG. ), The surface side of the through hole 13 having a large opening area may be opposed to the resin mask 5. In the present embodiment, a case will be described in which the side of the through hole 13 having a small opening area is the resin mask 5 side in order to prevent the edge of the through hole 13 from being a shadow of film formation. However, in the case of sputtering film formation, since sputtered particles wrap around more than vapor deposition, as shown in FIG. 3 (c), even if the surface side with a large opening area of the through hole 13 is the resin mask 5 side, the through hole The influence of 13 edges on film formation is small.
上記メタルマスク11の上記樹脂マスク5側とは反対側には、第2のフレーム12が設けられている。この第2のフレーム12は、上記メタルマスク11を架張した状態で、図2(b)に示すように、メタルマスク11の周縁部を一端面12aにスポット溶接してメタルマスク11を支持するもので、上記メタルマスク11の複数の貫通孔13を内包する大きさの開口15を有し、外形が上記第1のフレーム7の開口8内に収まる大きさの枠状を成した、例えば厚みが30mm〜50mm程度の例えばインバー又はインバー合金等の磁性金属部材である。さらに、上記第2のフレーム12の他端面12b側には、上記開口15側とは反対側に張り出したつば16が設けられ、該つば16に上記第1のフレーム7の他端面7bがねじ17(図1参照)で着脱自在に固定されるようになっている。この場合、第1のフレーム7が第2のフレーム12の上記つば16に固定された状態で、上記隙間9が生じるように、第1のフレーム7、第2のフレーム12及びつば16の各厚みが決定される。なお、図2(b)において、符号18は、ねじ17を通すための孔である。 On the opposite side of the metal mask 11 from the resin mask 5 side, a second frame 12 is provided. As shown in FIG. 2B, the second frame 12 supports the metal mask 11 by spot-welding the peripheral edge of the metal mask 11 to the one end surface 12a as shown in FIG. It has an opening 15 having a size that encloses the plurality of through-holes 13 of the metal mask 11, and has a frame shape whose size can be accommodated in the opening 8 of the first frame 7. Is a magnetic metal member such as Invar or Invar alloy having a thickness of about 30 mm to 50 mm. Further, a flange 16 is provided on the other end surface 12 b side of the second frame 12 so as to protrude to the opposite side to the opening 15 side. The other end surface 7 b of the first frame 7 is screwed to the collar 16. (Refer to FIG. 1). In this case, each thickness of the first frame 7, the second frame 12, and the collar 16 is such that the gap 9 is generated in a state where the first frame 7 is fixed to the collar 16 of the second frame 12. Is determined. In FIG. 2B, reference numeral 18 denotes a hole through which the screw 17 is passed.
次に、このように構成された成膜マスク1を使用した成膜について説明する。なお、以下の説明においては、成膜装置が、図4に示すようなスパッタリング装置の場合について述べる。
先ず、第1のマスク2の第1のフレーム7と第2のマスク3の第2のフレーム12とをねじ17で固定して組み立てて成膜マスク1が準備される。
Next, film formation using the film formation mask 1 configured as described above will be described. In the following description, the case where the film forming apparatus is a sputtering apparatus as shown in FIG. 4 will be described.
First, the film formation mask 1 is prepared by fixing and assembling the first frame 7 of the first mask 2 and the second frame 12 of the second mask 3 with the screws 17.
次いで、スパッタリング装置の真空チャンバー19内に設けられたマスクホルダー20に第1のマスク2が被成膜基板(以下、単に「基板22」という)側となるようにして成膜マスク1が取り付けられる。また、基板ホルダー21に設置された基板22面に平行に矢印A,B方向に往復移動可能に構成されたターゲットホルダー23には、成膜材料としての例えば円柱状の酸化インジウムスズ(以下「ITO(Indium Tin Oxide)」という)のターゲット24が、その円柱軸を上記移動方向に対して交差させて取り付けられている。 Next, the deposition mask 1 is attached to the mask holder 20 provided in the vacuum chamber 19 of the sputtering apparatus so that the first mask 2 is on the deposition target substrate (hereinafter simply referred to as “substrate 22”) side. . Further, for example, a cylindrical indium tin oxide (hereinafter referred to as “ITO”) as a film forming material is provided on the target holder 23 configured to be reciprocally movable in the directions of arrows A and B parallel to the surface of the substrate 22 installed in the substrate holder 21. (Indium Tin Oxide) ”) 24) is attached with its cylinder axis intersecting the moving direction .
成膜マスク1の取り付けが終了すると、ガス導入バルブ25を閉じた状態で排気バルブ26を開き、真空チャンバー19内の空気が排気され、予め定められた所定の真空度となるまで真空引きされる。 When the deposition mask 1 is attached, the exhaust valve 26 is opened with the gas introduction valve 25 closed, and the air in the vacuum chamber 19 is exhausted and evacuated until a predetermined degree of vacuum is reached. .
真空チャンバー19内の真空度が所定の値に達すると、ゲートバルブ27で仕切られ、略同じ真空度に保たれた図示省略の前室(図4において、真空チャンバー19に隣接して奥側に設けられている。)から図示省略の基板ローディング機構によって透明ガラスから成る基板22が搬送され、基板ホルダー21に設置される。その後、上記基板ローディング機構は上記前室まで退避し、ゲートバルブ27は閉じられる。 When the degree of vacuum in the vacuum chamber 19 reaches a predetermined value, the front chamber (not shown) is partitioned by the gate valve 27 and maintained at substantially the same degree of vacuum (in FIG. 4, adjacent to the vacuum chamber 19 on the back side). substrate 22 made provided.) by the substrate loading mechanism (not shown) from the transparency of glass is conveyed, it is placed on the substrate holder 21. Thereafter, the substrate loading mechanism is retracted to the front chamber, and the gate valve 27 is closed.
次に、マスクホルダー20が図4において矢印C方向に移動して成膜マスク1を基板22上に設置する。詳細には、図5(a)に示すように、第1のマスク2の樹脂マスク5が基板22の成膜面上に設置される。このとき、図6(a)に示すように、樹脂マスク5とメタルマスク11との間には、所定の隙間9が保たれている。その後、図5(b)に示すように、基板ホルダー21に内蔵された磁石28の磁力が作用されて第2のマスク3のメタルマスク11が吸引され、該メタルマスク11が弾性的に撓んで樹脂マスク5を押圧し、樹脂マスク5が基板22の成膜面に密着して固定される。同時に、図6(b)に示すように、メタルマスク11が樹脂マスク5の表面に密着する。 Next, the mask holder 20 moves in the direction of arrow C in FIG. 4 to place the deposition mask 1 on the substrate 22. Specifically, as shown in FIG. 5A, the resin mask 5 of the first mask 2 is placed on the film formation surface of the substrate 22. At this time, as shown in FIG. 6A, a predetermined gap 9 is maintained between the resin mask 5 and the metal mask 11. After that, as shown in FIG. 5B, the magnetic force of the magnet 28 built in the substrate holder 21 is applied to attract the metal mask 11 of the second mask 3, and the metal mask 11 is elastically bent. The resin mask 5 is pressed, and the resin mask 5 is brought into close contact with the film forming surface of the substrate 22 and fixed. At the same time, as shown in FIG. 6B, the metal mask 11 adheres to the surface of the resin mask 5.
続いて、ガス導入バルブ25を開くと共に排気バルブ26を調節して、真空チャンバー19内にアルゴン(Ar)ガス等の不活性ガスが予め定められた所定値となるまで導入される。 Subsequently, the gas introduction valve 25 is opened and the exhaust valve 26 is adjusted so that an inert gas such as argon (Ar) gas is introduced into the vacuum chamber 19 until a predetermined value is reached.
真空チャンバー19内のガス圧が上記所定値となると、ターゲットホルダー23に高電圧が付与されて、図7に示すようにターゲット24と基板22との間にプラズマ29が生成される。そして、ターゲット24をその円柱軸を中心に回転させながら、図7に示す矢印A,B方向に往復移動させてスパッタリングが実行される。なお、詳細には、本スパッタリングが開始される前の一定時間(プリスパッタリング時間)は、ターゲット24と基板22との間に図示省略のシャッターが挿入されており、スパッタ粒子が基板22に付着するのを阻止している。 When the gas pressure in the vacuum chamber 19 reaches the predetermined value, a high voltage is applied to the target holder 23 and plasma 29 is generated between the target 24 and the substrate 22 as shown in FIG. And sputtering is performed by reciprocating in the directions of arrows A and B shown in FIG. In detail, a shutter (not shown) is inserted between the target 24 and the substrate 22 for a certain time (pre-sputtering time) before the main sputtering is started, and the sputtered particles adhere to the substrate 22. Is blocking.
予め定められた所定時間のスパッタリングが実行されて、基板22上に一定厚みのITO導電膜が堆積すると、上記シャッターが閉じられてスパッタリングが終了する。そして、ターゲットホルダー23に対する高電圧の付与が解除され、図8(a)に示すようにプラズマ29の生成が停止される。このとき、図9(a)に示すように、ITO導電膜30は、開口パターン4内の基板22の面、開口パターン4の側壁、樹脂マスク5の開口パターン4周縁部、貫通孔13の側壁及びメタルマスク11のターゲット24側の表面に堆積している。 When sputtering for a predetermined time is executed and a certain thickness of ITO conductive film is deposited on the substrate 22, the shutter is closed and the sputtering is completed. Then, the application of the high voltage to the target holder 23 is released, and the generation of the plasma 29 is stopped as shown in FIG. At this time, as shown in FIG. 9A, the ITO conductive film 30 includes the surface of the substrate 22 in the opening pattern 4, the sidewall of the opening pattern 4, the peripheral edge of the opening pattern 4 of the resin mask 5, and the sidewall of the through hole 13. And deposited on the surface of the metal mask 11 on the target 24 side.
次いで、図8(b)に示すように、基板ホルダー21に内蔵された磁石28の磁力によるメタルマスク11に対する吸引作用が取り去られると、図9(b)に示すように、メタルマスク11はその弾性復元力により元の状態に戻る。これにより、樹脂マスク5に堆積したITO導電膜30は、メタルマスク11と切り離される。また、同時に、メタルマスク11による樹脂マスク5の基板22の成膜面への押圧力が解放されるため、樹脂マスク5は基板22の成膜面から剥がれる。こうして、透明なガラスの基板22に、図10に示すようにITO導電膜30の複数の電極31(薄膜パターン)が形成されたタッチパネル基板32が形成される。 Next, as shown in FIG. 8B, when the attracting action on the metal mask 11 by the magnetic force of the magnet 28 built in the substrate holder 21 is removed, as shown in FIG. The original state is restored by the elastic restoring force. Thereby, the ITO conductive film 30 deposited on the resin mask 5 is separated from the metal mask 11. At the same time, since the pressing force of the metal mask 11 on the film formation surface of the substrate 22 is released, the resin mask 5 is peeled off from the film formation surface of the substrate 22. Thus, the substrate 22 of the transparency of glass, a touch panel substrate 32 in which a plurality of electrodes 31 of ITO conductive film 30 (thin film pattern) is formed is formed as shown in FIG. 10.
次に、マスクホルダー20を、図4に示す矢印D方向に移動して成膜マスク1を基板22から離隔すると共に、真空チャンバー19内の不活性ガスが排気される。そして、真空チャンバー19と上記前室とを仕切るゲートバルブ27が開かれて、上記基板ローディング機構によりタッチパネル基板32が真空チャンバー19内から上記前室に搬出される一方で、上記前室から新たな基板22が搬入されて基板ホルダー21に設置される。 Next, the mask holder 20 is moved in the direction of arrow D shown in FIG. 4 to separate the deposition mask 1 from the substrate 22 and the inert gas in the vacuum chamber 19 is exhausted. Then, the gate valve 27 for partitioning the vacuum chamber 19 and the front chamber is opened, and the touch panel substrate 32 is carried out from the vacuum chamber 19 to the front chamber by the substrate loading mechanism. The substrate 22 is carried in and installed in the substrate holder 21.
以降、前述と同様にして新たな基板22に成膜が実行され、新たなタッチパネル基板32が形成される。そして、基板22に対する成膜が完了する都度、メタルマスク11は、樹脂マスク5から離隔するために、樹脂マスク5に堆積するITO導電膜30は、その都度メタルマスク11から切り離される。したがって、樹脂マスク5に堆積するITO導電膜30は、開口パターン4の周縁部のみとなり、隣接する開口パターン4間で分断されているため、ITO導電膜30の収縮応力が分断されて樹脂マスク5の変形が抑制される。それ故、ITO導電膜30からなる電極31の位置精度を向上することができる。また、同時に、樹脂マスク5の変形が抑制されるため、樹脂マスク5の寿命が長くなるという利点もある。 Thereafter, film formation is performed on a new substrate 22 in the same manner as described above, and a new touch panel substrate 32 is formed. Each time the film formation on the substrate 22 is completed, the metal mask 11 is separated from the resin mask 5, so that the ITO conductive film 30 deposited on the resin mask 5 is separated from the metal mask 11 each time. Therefore, the ITO conductive film 30 deposited on the resin mask 5 is only the peripheral portion of the opening pattern 4 and is divided between the adjacent opening patterns 4. Therefore, the shrinkage stress of the ITO conductive film 30 is divided and the resin mask 5 is divided. Is prevented from being deformed. Therefore, the positional accuracy of the electrode 31 made of the ITO conductive film 30 can be improved. At the same time, since the deformation of the resin mask 5 is suppressed, there is an advantage that the life of the resin mask 5 is extended.
なお、上記実施形態においては、第1のマスク2及び第2のマスク3が夫々フレーム付きの場合について説明したが、本発明はこれに限られず、第1のマスク2は、樹脂マスク5のみであってもよく、第2のマスク3はメタルマスク11のみであってもよい。この場合、樹脂マスク5とメタルマスク11との間に隙間9が形成されるように、両者間に金属スペーサを設けるとよい。 In the above embodiment, the case where the first mask 2 and the second mask 3 are each provided with a frame has been described. However, the present invention is not limited to this, and the first mask 2 includes only the resin mask 5. The second mask 3 may be only the metal mask 11. In this case, a metal spacer may be provided between the resin mask 5 and the metal mask 11 so that a gap 9 is formed between them.
また、上記実施形態においては、成膜装置がスパッタリング装置である場合について説明したが、本発明はこれに限られず、成膜装置は、蒸着装置であってもよい。 Moreover, although the case where the film-forming apparatus was a sputtering apparatus was demonstrated in the said embodiment, this invention is not limited to this, The film-forming apparatus may be a vapor deposition apparatus.
さらに、上記実施形態においては、薄膜がITO導電膜30である場合について説明したが、本発明はこれに限られず、薄膜は有機物質の薄膜、無機物質の薄膜又は金属薄膜のいずれであってもよい。 Furthermore, although the case where the thin film is the ITO conductive film 30 has been described in the above embodiment, the present invention is not limited to this, and the thin film may be any of an organic material thin film, an inorganic material thin film, or a metal thin film. Good.
1…成膜マスク
2…第1のマスク
3…第2のマスク
4…開口パターン
5…樹脂マスク
7…第1のフレーム
9…隙間
11…メタルマスク
12…第2のフレーム
13…貫通孔
22…基板
28…磁石
30…透明導電膜
31…電極
32…タッチパネル基板
DESCRIPTION OF SYMBOLS 1 ... Film-forming mask 2 ... 1st mask 3 ... 2nd mask 4 ... Opening pattern 5 ... Resin mask 7 ... 1st frame 9 ... Gap 11 ... Metal mask 12 ... 2nd frame 13 ... Through-hole 22 ... Substrate 28 ... Magnet 30 ... Transparent conductive film 31 ... Electrode 32 ... Touch panel substrate
Claims (4)
前記開口パターンを内包する大きさの貫通孔を形成して前記樹脂マスクの一面側に設置される磁性金属部材のメタルマスクと、
を備えて構成され、
前記樹脂マスクと前記メタルマスクとの間には、前記基板の裏面に設置される磁石の磁力が前記メタルマスクに作用すると前記メタルマスクを吸引して前記樹脂マスクに密着させ、前記磁石の磁力の作用が取り去られると前記メタルマスクをその弾性復元力により前記樹脂マスクから離隔させ得る大きさの隙間が設けられていることを特徴とする成膜マスク。 A resin mask having an opening pattern corresponding to the thin film pattern formed on the substrate;
A metal mask of a magnetic metal member formed on one surface side of the resin mask by forming a through-hole having a size including the opening pattern;
Configured with
Between the resin mask and the metal mask, when the magnetic force of the magnet installed on the back surface of the substrate acts on the metal mask, the metal mask is attracted and brought into close contact with the resin mask. A film-forming mask having a gap of a size capable of separating the metal mask from the resin mask by its elastic restoring force when the action is removed.
前記樹脂マスクと前記メタルマスクとの間に前記隙間が生じるようにして、前記第1のフレームと前記第2のフレームとを着脱自在に固定したことを特徴とする請求項1又は2記載の成膜マスク。 The resin mask has a peripheral edge fixed to the first frame, and the metal mask has a peripheral edge fixed to the second frame,
3. The composition according to claim 1, wherein the first frame and the second frame are detachably fixed so that the gap is formed between the resin mask and the metal mask. Membrane mask.
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013195552A JP6168944B2 (en) | 2013-09-20 | 2013-09-20 | Deposition mask |
| PCT/JP2014/074708 WO2015041296A1 (en) | 2013-09-20 | 2014-09-18 | Film-forming mask and touch panel substrate |
| TW103132201A TW201525163A (en) | 2013-09-20 | 2014-09-18 | Deposition mask and touch panel substrate |
| CN201480051077.XA CN105555991B (en) | 2013-09-20 | 2014-09-18 | Film formation mask and touch panel substrate |
| KR1020167004934A KR20160058091A (en) | 2013-09-20 | 2014-09-18 | Film-forming mask and touch panel substrate |
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| Application Number | Priority Date | Filing Date | Title |
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| JP2013195552A JP6168944B2 (en) | 2013-09-20 | 2013-09-20 | Deposition mask |
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| JP2015059262A JP2015059262A (en) | 2015-03-30 |
| JP6168944B2 true JP6168944B2 (en) | 2017-07-26 |
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| JP2013195552A Expired - Fee Related JP6168944B2 (en) | 2013-09-20 | 2013-09-20 | Deposition mask |
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| JP (1) | JP6168944B2 (en) |
| KR (1) | KR20160058091A (en) |
| CN (1) | CN105555991B (en) |
| TW (1) | TW201525163A (en) |
| WO (1) | WO2015041296A1 (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP3539229B2 (en) * | 1997-10-15 | 2004-07-07 | 東レ株式会社 | Method for manufacturing organic electroluminescent device |
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| JP4375232B2 (en) * | 2005-01-06 | 2009-12-02 | セイコーエプソン株式会社 | Mask deposition method |
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| JP5895540B2 (en) * | 2012-01-12 | 2016-03-30 | 大日本印刷株式会社 | Evaporation mask |
| JP5958824B2 (en) * | 2012-11-15 | 2016-08-02 | 株式会社ブイ・テクノロジー | Manufacturing method of vapor deposition mask |
| JP6142194B2 (en) * | 2012-11-15 | 2017-06-07 | 株式会社ブイ・テクノロジー | Vapor deposition mask manufacturing method and vapor deposition mask |
| KR101934244B1 (en) * | 2013-03-26 | 2018-12-31 | 다이니폰 인사츠 가부시키가이샤 | Deposition mask, preparatory body for deposition mask, method for manufacturing deposition mask, and method for manufacturing organic semiconductor element |
| TWI737969B (en) * | 2013-04-12 | 2021-09-01 | 日商大日本印刷股份有限公司 | Vapor deposition mask for the manufacture of organic semiconductor elements, manufacturing method of vapor deposition mask for the manufacture of organic semiconductor elements, vapor deposition mask preparations for the manufacture of organic semiconductor elements, pattern formation method, and organic semiconductor elements Manufacturing method |
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2013
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3954803A1 (en) * | 2020-08-14 | 2022-02-16 | Samsung Display Co., Ltd. | Mask, method of providing mask, and method of providing display panel using the same |
| US11773478B2 (en) | 2020-08-14 | 2023-10-03 | Samsung Display Co., Ltd. | Mask, method of providing mask, and method of providing display panel using the same |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105555991A (en) | 2016-05-04 |
| KR20160058091A (en) | 2016-05-24 |
| WO2015041296A1 (en) | 2015-03-26 |
| CN105555991B (en) | 2018-03-20 |
| JP2015059262A (en) | 2015-03-30 |
| TW201525163A (en) | 2015-07-01 |
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