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JP6378403B2 - Substrate support structure - Google Patents
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JP6378403B2 - Substrate support structure - Google Patents

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JP6378403B2
JP6378403B2 JP2017120975A JP2017120975A JP6378403B2 JP 6378403 B2 JP6378403 B2 JP 6378403B2 JP 2017120975 A JP2017120975 A JP 2017120975A JP 2017120975 A JP2017120975 A JP 2017120975A JP 6378403 B2 JP6378403 B2 JP 6378403B2
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substrate
support
substrate support
end side
support structure
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JP2017163164A (en
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淳司 中谷
淳司 中谷
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JTEKT Thermo Systems Corp
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Koyo Thermo Systems Co Ltd
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Description

本発明は、基板の熱処理装置などに備えられ、基板を略水平姿勢に支持する基板支持構造に関する。   The present invention relates to a substrate support structure that is provided in a substrate heat treatment apparatus or the like and supports a substrate in a substantially horizontal posture.

従来、液晶や有機EL用の基板を熱処理するに際しては、熱処理装置の内部に基板をその下面を支持するようにして保持する。このとき、基板の中央部を避けて、支持部が触れても影響のない周囲部(外縁から約10mm程度)を支持する場合があり、接触許容範囲が狭いという制約がある。   Conventionally, when heat-treating a substrate for liquid crystal or organic EL, the substrate is held in a heat treatment apparatus so that its lower surface is supported. At this time, there is a case where a peripheral portion (about 10 mm from the outer edge) that is not affected by the support portion is supported while avoiding the central portion of the substrate, and the allowable contact range is narrow.

このような制約を満たすため、図7に示すように、基板Wの支持方法としては、真下からピンまたは球101で支持していた(特許文献1、2参照)。図中、両矢印A1で示された基板中央の領域は接触不可範囲を示し、両矢印A2で示された基板周囲の領域は接触許容範囲を示す。   In order to satisfy such restrictions, as shown in FIG. 7, the substrate W is supported by pins or balls 101 from directly below (see Patent Documents 1 and 2). In the figure, the area at the center of the substrate indicated by the double-pointed arrow A1 indicates the non-contactable range, and the area around the substrate indicated by the double-pointed arrow A2 indicates the allowable contact range.

特開2002−100668号公報Japanese Patent Laid-Open No. 2002-1000066 特開2004−111786号公報JP 2004-111786 A

しかしながら、基板に対して真下から支持すると、搬送精度、装置の据付精度、支持位置の精度などの誤差で基板が支持部から脱落する虞や、接触不可範囲A1に接触する虞がある。   However, if the substrate is supported from directly below, there is a risk that the substrate may drop from the support portion due to errors such as conveyance accuracy, apparatus installation accuracy, and support position accuracy, or may come into contact with the non-contactable range A1.

そこで本発明の目的は、搬送精度、装置の据付精度、支持位置の精度などに誤差があっても、支持部からの基板の脱落や接触不可範囲への接触を防止することが可能な基板支持構造を提供することである。   Accordingly, an object of the present invention is to provide a substrate support capable of preventing the substrate from dropping off from the support portion or coming into contact with a non-contactable range even if there is an error in conveyance accuracy, apparatus installation accuracy, support position accuracy, or the like. Is to provide a structure.

本発明に係る基板支持構造は、被処理基板が収容されて処理される処理空間内の所定の支持位置に被処理基板を略水平姿勢に支持するためのものであり、基板支持部材を備える。基板支持部材は、基端側から先端側に向かって延び、支持位置の両側で、基端側から先端側に向かって下方に傾斜する支持部により被処理基板を支持する。又、基板支持部材は、基端側から先端側に向かって延びるベース体と、当該ベース体に配設される支持体と、を備える。ここで、支持体は、支持部を有し、ベース体の上面から支持部を露出させるようにベース体に配設される。又、支持体は、円筒側面を有し、ベース体の長手方向に沿った軸回りに回転自在に配設される。   A substrate support structure according to the present invention is for supporting a substrate to be processed in a substantially horizontal position at a predetermined support position in a processing space in which the substrate to be processed is accommodated and processed, and includes a substrate support member. The substrate support member supports the substrate to be processed by support portions that extend from the base end side toward the front end side and are inclined downward from the base end side toward the front end side at both sides of the support position. The substrate support member includes a base body that extends from the proximal end side toward the distal end side, and a support body that is disposed on the base body. Here, a support body has a support part and is arrange | positioned at a base body so that a support part may be exposed from the upper surface of a base body. The support body has a cylindrical side surface and is disposed so as to be rotatable about an axis along the longitudinal direction of the base body.

上記基板支持構造によれば、基板支持部材の支持部が斜め下方に向かって傾斜しているため、被処理基板の撓み度合いに因らず、被処理基板の側端下縁部にのみ支持部を接触させることができる。このため、被処理基板を突起等により真下側から支持する必要がなくなり、基板支持部材の取付精度の影響や、基板を処理空間に搬送して支持体上に載置する際の精度の影響を受けない。又、基板支持部材がベース体と支持体とで構成されることにより、被処理基板に接触する支持部を支持体として部品化することが可能となり、取り扱いの簡素化が図られる。更に、支持体が、ベース体の長手方向に沿った軸回りに回転自在に配設されることにより、支持部上に載置する際の被処理基板へのショックを支持体の回転によって和らげ、支持部と接触する部位において被処理基板が損傷を受けることを防ぐことができる。   According to the substrate support structure, since the support portion of the substrate support member is inclined obliquely downward, the support portion is provided only at the lower edge of the side edge of the substrate to be processed regardless of the degree of bending of the substrate to be processed. Can be contacted. For this reason, there is no need to support the substrate to be processed from the lower side by a protrusion or the like, and the influence of the mounting accuracy of the substrate support member and the accuracy of the substrate when transported to the processing space and placed on the support are eliminated. I do not receive it. Further, since the substrate support member is composed of the base body and the support body, the support portion that comes into contact with the substrate to be processed can be made into a component as a support body, and the handling is simplified. Furthermore, the support body is disposed so as to be rotatable about an axis along the longitudinal direction of the base body, so that the shock to the substrate to be processed when placed on the support portion is softened by the rotation of the support body, It is possible to prevent the substrate to be processed from being damaged at the portion in contact with the support portion.

上記基板支持構造において、支持体は、樹脂または石英にて形成されていることが好ましい。   In the substrate support structure, the support is preferably made of resin or quartz.

上記基板支持構造において、処理空間は処理容器の内部に形成され、処理容器の側壁内面における基板の支持位置の両側に、基板支持部材の基端側を保持する保持部材が設けられていることが好ましい。   In the substrate support structure, the processing space is formed inside the processing container, and holding members for holding the base end side of the substrate supporting member are provided on both sides of the substrate support position on the inner surface of the side wall of the processing container. preferable.

上記基板支持構造において、基板支持部材が支持位置の片側について複数設けられることが好ましい。これにより、被処理基板を安定して支持することが可能になる。より具体的には、保持部材が、支持位置の両側に対向して処理空間の奥行き方向に延びると共に、複数の基板支持部材に対応して設けられることが好ましい。   In the substrate support structure, it is preferable that a plurality of substrate support members are provided on one side of the support position. Thereby, it becomes possible to stably support the substrate to be processed. More specifically, it is preferable that the holding member extends in the depth direction of the processing space so as to face both sides of the support position, and is provided corresponding to the plurality of substrate support members.

本発明によれば、搬送精度、装置の据付精度、支持位置の精度などに誤差があっても、支持部からの基板の脱落や接触不可範囲への接触を防止することができる。   According to the present invention, even if there is an error in the conveyance accuracy, the apparatus installation accuracy, the support position accuracy, etc., it is possible to prevent the substrate from falling off from the support portion or coming into contact with a non-contactable range.

図1(A)は本発明の実施形態に係る基板支持構造の概略構成であって、基板を支持する前の状態を示す正面断面図である。図1(B)は同基板を支持した状態を示す正面断面図である。FIG. 1A is a schematic sectional view of a substrate support structure according to an embodiment of the present invention, and is a front sectional view showing a state before supporting a substrate. FIG. 1B is a front sectional view showing a state in which the substrate is supported. 基板支持構造に用いられる基板支持部材を示す分解斜視図である。It is a disassembled perspective view which shows the board | substrate support member used for a board | substrate support structure. 図3(A)は基板支持部材の保持部材への取付け状態を説明する平面図である。図3(B)は同側面図である。FIG. 3A is a plan view illustrating a state in which the substrate support member is attached to the holding member. FIG. 3B is a side view of the same. 基板支持構造を一つの処理容器内で多段に構成した例を示す概略構成図である。It is a schematic block diagram which shows the example which comprised the substrate support structure in multiple steps within one processing container. 基板支持構造を多段式ユニットとして構成した例を示す概略構成図である。It is a schematic block diagram which shows the example which comprised the board | substrate support structure as a multistage unit. 基板支持部材の角度調整機構の一例を示す図である。It is a figure which shows an example of the angle adjustment mechanism of a board | substrate support member. 従来の基板支持構造の一例の概略構成を示す正面断面図である。It is front sectional drawing which shows schematic structure of an example of the conventional board | substrate support structure.

以下、本発明の実施形態に係る基板支持構造の構成を、図面を参照して説明する。   Hereinafter, a configuration of a substrate support structure according to an embodiment of the present invention will be described with reference to the drawings.

図1に示すように、被処理基板(以下、「基板W」と称す)は処理容器4の内部に形成される処理空間100に収容されて処理される。基板支持構造1は、処理空間100内の所定の支持位置に基板Wを略水平姿勢に支持するように構成される。基板支持構造1は、基板Wに何らかの処理をする基板処理装置(例えば、熱処理装置など)のバッチ炉などへ適用されるものである。基板Wの材質は問わず、基板Wが薄く撓んだものにも対応可能である。基板形状は、矩形基板に限らず、半導体ウェーハなど円形基板でも構わない。   As shown in FIG. 1, a substrate to be processed (hereinafter referred to as “substrate W”) is accommodated and processed in a processing space 100 formed inside the processing container 4. The substrate support structure 1 is configured to support the substrate W at a predetermined support position in the processing space 100 in a substantially horizontal posture. The substrate support structure 1 is applied to a batch furnace or the like of a substrate processing apparatus (for example, a heat treatment apparatus) that performs some processing on the substrate W. Any material can be used for the substrate W, and the substrate W can be thinly bent. The substrate shape is not limited to a rectangular substrate, and may be a circular substrate such as a semiconductor wafer.

基板支持構造1は、基板支持部材2および保持部材3を有する。   The substrate support structure 1 includes a substrate support member 2 and a holding member 3.

基板支持部材2は、基端2A側から先端2B側に向かって延び、上側に基板Wを支持するための支持部2Cを備えるものである。より具体的には、図2に示すように、基板支持部材2は、基端2A側から先端2B側に向かって延びるベース体21と、支持部2Cを有し、ベース体21の上面から支持部2Cを露出させるようにベース体21に配設される支持体22と、を備える。   The substrate support member 2 extends from the base end 2A side toward the distal end 2B side, and includes a support portion 2C for supporting the substrate W on the upper side. More specifically, as shown in FIG. 2, the substrate support member 2 includes a base body 21 extending from the base end 2 </ b> A side toward the front end 2 </ b> B side and a support portion 2 </ b> C, and is supported from the upper surface of the base body 21. And a support 22 disposed on the base body 21 so as to expose the portion 2C.

ベース体21および支持体22の材質は特に限定されるものではないが、基板支持構造1が熱処理装置に適用される場合には、耐熱性を有する材料であることが必要である。特に、支持体22は基板Wに直接接触される部品なので、基板Wに対して損傷を与えないことも材質に求められる要件となる。このような要求を満たす材料としては、樹脂または石英材が好適である。   Although the material of the base body 21 and the support body 22 is not specifically limited, When the board | substrate support structure 1 is applied to a heat processing apparatus, it is required that it is a material which has heat resistance. In particular, since the support 22 is a component that is in direct contact with the substrate W, it is also a requirement for the material not to damage the substrate W. As a material satisfying such requirements, a resin or a quartz material is suitable.

支持体22は図2に示すように、円筒形を呈する。支持体22は、周面の頂点を軸方向に延びる線上の支持部2Cを有する。なお、支持体22の形状は一例であって上記に限定されない。   As shown in FIG. 2, the support 22 has a cylindrical shape. The support 22 has a support portion 2C on a line extending in the axial direction at the apex of the peripheral surface. In addition, the shape of the support body 22 is an example, and is not limited to the above.

ベース体21は図2に示すような角柱形を呈する。ベース体21の上面には長手方向に沿って延びる凹部21Aが形成されている。凹部21Aには、支持体22が収容される。本実施形態では、凹部21Aは、支持体22の円筒形に対応してハーフパイプ状に形成される。したがって、支持体22は凹部21Aに収容されると、略上半分を露出状態とされ、さらにベース体21の長手方向に沿った軸回りに回転自在となる。   The base body 21 has a prismatic shape as shown in FIG. A concave portion 21 </ b> A extending along the longitudinal direction is formed on the upper surface of the base body 21. The support 22 is accommodated in the recess 21A. In the present embodiment, the recess 21 </ b> A is formed in a half pipe shape corresponding to the cylindrical shape of the support 22. Therefore, when the support body 22 is accommodated in the recess 21 </ b> A, the substantially upper half is exposed, and the support body 22 is rotatable about an axis along the longitudinal direction of the base body 21.

ベース体21には、凹部21Aの軸中心を通過するボルト穴21Bが軸方向に貫通している。ベース体21や凹部21Aの形状は一例であって、上記に限定されない。   A bolt hole 21B passing through the axial center of the recess 21A penetrates the base body 21 in the axial direction. The shapes of the base body 21 and the recess 21A are examples, and are not limited to the above.

支持体22は、凹部21Aに収容された後、ボルト穴21Bにボルト23を嵌合させてベース体21に取り付けられる。ボルト23は、支持体22の空洞部に挿通され、支持体22がベース体21から抜けるのを防止している。なお、ボルト23は支持体22の回転に支障がないように設けられる。   After the support body 22 is accommodated in the recess 21 </ b> A, the bolt 23 is fitted into the bolt hole 21 </ b> B and attached to the base body 21. The bolt 23 is inserted into the hollow portion of the support body 22 to prevent the support body 22 from coming off the base body 21. The bolt 23 is provided so as not to hinder the rotation of the support 22.

以上のように構成される基板支持部材2は、図3に示すように、保持部材3によって支持部2Cが基端側から先端側に向かって下方に傾斜するように保持される。   As shown in FIG. 3, the substrate support member 2 configured as described above is held by the holding member 3 so that the support portion 2 </ b> C is inclined downward from the proximal end side toward the distal end side.

本実施形態では、保持部材3は、上片部31、側壁部32および底片部33からコの字型に形成された部材である。このようなコの字型の部材は、例えば、板金の曲げ加工によって作製される。   In the present embodiment, the holding member 3 is a member formed in a U shape from the upper piece portion 31, the side wall portion 32, and the bottom piece portion 33. Such a U-shaped member is produced, for example, by bending a sheet metal.

処理空間100内の基板Wの支持位置の両側に、上面が水平面に形成された梁7が奥行き方向に渡されている。図3(A)に示すように、保持部材3は、底片部33を使用して梁7の上面にビス止めで固定される。   On both sides of the support position of the substrate W in the processing space 100, beams 7 having an upper surface formed in a horizontal plane are passed in the depth direction. As shown in FIG. 3A, the holding member 3 is fixed to the upper surface of the beam 7 with screws using the bottom piece 33.

基板支持部材2は、ベース体21の基端部で、保持部材3の側壁部32にボルトおよびナットを用いて固定される。基板支持部材2は、ベース体21の基端側が高く先端側が低くなる傾斜をもって取付けられる。このとき、ベース体21の基端面上縁が保持部材3の上片部31に当接することにより、ベース体21の回動が阻止され、ベース体21の傾きが一定に維持される。これにより、支持体22を凹部21Aに装着すると、図1に示すように、支持体22は支持部2Cが基端側から先端側に向かって下方に傾斜するように保持される。   The substrate support member 2 is fixed to the side wall portion 32 of the holding member 3 using bolts and nuts at the base end portion of the base body 21. The substrate support member 2 is attached with an inclination in which the base end side of the base body 21 is high and the tip end side is low. At this time, when the upper edge of the base end surface of the base body 21 contacts the upper piece 31 of the holding member 3, the rotation of the base body 21 is prevented, and the inclination of the base body 21 is maintained constant. As a result, when the support 22 is mounted in the recess 21A, the support 22 is held so that the support 2C is inclined downward from the proximal end side toward the distal end side, as shown in FIG.

基板Wを安定して支持するためには、処理空間100内の基板Wの支持位置の片側について、複数箇所で基板Wを支持することが好ましい。矩形の基板であれば、前後の隅部を支持する2つの基板支持部材2を設けることができる。これにより、矩形の基板をより安定して支持するようにできる。本実施形態では、基板Wの支持位置の片側に、梁7が処理空間100の奥行き方向に延在する。したがって、片側の梁7の長手方向に沿って複数の保持部材3を取付けることで、当該方向に並んで複数の基板支持部材2を設けることが可能である。   In order to stably support the substrate W, it is preferable to support the substrate W at a plurality of locations on one side of the support position of the substrate W in the processing space 100. If it is a rectangular board | substrate, the two board | substrate support members 2 which support the front-back corner part can be provided. Thereby, a rectangular board | substrate can be supported more stably. In the present embodiment, the beam 7 extends in the depth direction of the processing space 100 on one side of the support position of the substrate W. Therefore, by attaching the plurality of holding members 3 along the longitudinal direction of the beam 7 on one side, it is possible to provide the plurality of substrate support members 2 side by side in the direction.

上記保持部材3および基板支持部材2から成る基板支持構造1の段数は限定されない。すなわち、図4に示すように、処理容器4の側壁内面4Aに、基板支持構造1を多段に設けることにより、1つの処理容器4の処理空間100に複数の基板Wを支持することができる。   The number of stages of the substrate support structure 1 including the holding member 3 and the substrate support member 2 is not limited. That is, as shown in FIG. 4, a plurality of substrates W can be supported in the processing space 100 of one processing container 4 by providing the substrate support structure 1 in multiple stages on the side wall inner surface 4 </ b> A of the processing container 4.

多段式の変形例として、図5に示すように、1つの基板支持構造1を有する処理容器4を扁平なユニットとして形成し、このユニットの複数を多段に積み重ねる構成を採用することもできる。これによると、積み重ねるユニットの数は自由にレイアウトできるので、基板支持構造1の段数を任意に設定することができるメリットがある。   As a multistage modification, as shown in FIG. 5, it is possible to adopt a configuration in which the processing container 4 having one substrate support structure 1 is formed as a flat unit, and a plurality of the units are stacked in multiple stages. According to this, since the number of units to be stacked can be freely laid out, there is an advantage that the number of stages of the substrate support structure 1 can be arbitrarily set.

上記のように構成される基板支持構造1によって、基板Wを支持するときには、図1(A)に示すように、不図示の搬送ロボットのロボットアームの先端部に配設されたフォークによって処理空間100内の支持位置の上方へ基板Wを搬送する。続いて、ロボットアームを下降させることによって図1(B)に示すように、支持位置の両側で対峙する基板支持部材2の支持体22上に基板Wを載置する。基板Wは、その両側端部で基板支持部材2の支持部2Cによって支持される。   When the substrate W is supported by the substrate support structure 1 configured as described above, as shown in FIG. 1A, a processing space is provided by a fork disposed at the tip of a robot arm of a transfer robot (not shown). The substrate W is transported above the support position in 100. Subsequently, by lowering the robot arm, as shown in FIG. 1B, the substrate W is placed on the support 22 of the substrate support member 2 facing each other at both sides of the support position. The substrate W is supported by the support portions 2C of the substrate support member 2 at both end portions thereof.

このようにして支持された基板Wは、基板支持部材2に直接支持されない中央部が自重で沈むように撓みが生じる。ただし、撓み具合は、基板Wの厚み、サイズ、或いは材質によって異なる。図1(B)に示した基板W1、W2、W3では、この順で撓みの度合いが大きくなくなっている。基板Wの撓み度合いは基板Wの厚み、サイズ、或いは材質によって異なる。   The substrate W supported in this way bends so that the central portion that is not directly supported by the substrate support member 2 sinks under its own weight. However, the degree of bending differs depending on the thickness, size, or material of the substrate W. In the substrates W1, W2, and W3 shown in FIG. 1B, the degree of bending does not increase in this order. The degree of bending of the substrate W varies depending on the thickness, size, or material of the substrate W.

本発明では、基板支持部材2の支持部2Cは斜め下方に向かって傾斜しているため、基板Wの撓み度合いに因らず、基板Wの側端下縁部にのみ支持部2Cを接触させることができる。このため、基板Wを突起等により真下側から支持する必要がなくなり、基板支持部材2の取付精度や基板Wを処理空間100に搬送して支持体22上に載置する際の精度の影響を受けない。   In the present invention, since the support portion 2C of the substrate support member 2 is inclined obliquely downward, the support portion 2C is brought into contact only with the lower edge of the side edge of the substrate W regardless of the degree of bending of the substrate W. be able to. For this reason, there is no need to support the substrate W from the lower side by a projection or the like, and the influence of the mounting accuracy of the substrate support member 2 and the accuracy when the substrate W is transported to the processing space 100 and placed on the support 22 is affected. I do not receive it.

また、支持部2Cを有する支持体22が回転自在であるため、基板Wを支持部2C上へ載置する際のショックを支持体22の回転によって和らげ、基板Wの支持部2Cと接触する部位が損傷を受けることを防ぐことができる。さらに、支持部2Cの材質を樹脂または石英とすることで、より確実に基板Wの損傷を防ぐことができる。   Further, since the support body 22 having the support portion 2C is rotatable, the shock when the substrate W is placed on the support portion 2C is softened by the rotation of the support body 22 and the portion of the substrate W that comes into contact with the support portion 2C. Can be prevented from being damaged. Furthermore, the damage of the board | substrate W can be prevented more reliably by making the material of the support part 2C into resin or quartz.

なお、本実施形態では、保持部材3に対して基板支持部材2を固定状態(回動不能)で取付ける場合で説明したが、処理対象となる基板Wのロットに応じて支持部2Cの下向きの傾斜角度を可変できるように回動可能に取付けるようにしても良い。例えば、図6に示すように、基板支持部材2を基端部で回動軸5を用いて保持部材3に対して回動自在に保持し、保持部材3には縦長の長孔34を、基板支持部材2のベース体21には横長の長孔24をそれぞれ設けて、長孔34,24同士が交差する任意の位置でピン6などを用いて基板支持部材2の先端側を固定する。これによって、支持部2Cの傾斜角度を調整することが可能となる。   In the present embodiment, the substrate support member 2 is attached to the holding member 3 in a fixed state (unrotatable). However, the support portion 2C faces downward depending on the lot of the substrate W to be processed. You may make it attach so that rotation is possible so that an inclination angle may be varied. For example, as shown in FIG. 6, the substrate support member 2 is rotatably held with respect to the holding member 3 using the rotation shaft 5 at the base end portion, and the holding member 3 has a vertically long slot 34. The base body 21 of the substrate support member 2 is provided with a horizontally long hole 24, and the front end side of the substrate support member 2 is fixed using a pin 6 or the like at an arbitrary position where the long holes 34 and 24 intersect each other. As a result, the inclination angle of the support portion 2C can be adjusted.

上述の実施形態の説明は、すべての点で例示であって、制限的なものではないと考えられるべきである。本発明の範囲は、上述の実施形態ではなく、特許請求の範囲によって示される。更に、本発明の範囲には、特許請求の範囲と均等の意味及び範囲内での全ての変更が含まれることが意図される。   The above description of the embodiment is to be considered in all respects as illustrative and not restrictive. The scope of the present invention is shown not by the above embodiments but by the claims. Further, the scope of the present invention is intended to include all modifications within the meaning and scope equivalent to the scope of the claims.

1 基板支持構造
2 基板支持部材
2A 基端
2B 先端
2C 支持部
3 保持部材
4 処理容器
4A 側壁内面
5 回動軸
6 ピン
7 梁
21 ベース体
21A 凹部
21B ボルト穴
22 支持体
23 ボルト
24 長孔
31 上片部
32 側壁部
33 底片部
34 長孔
100 処理空間
101 球
A1 接触不可範囲
W、W1、W2、W3 基板
DESCRIPTION OF SYMBOLS 1 Substrate support structure 2 Substrate support member 2A Base end 2B Tip 2C Support part 3 Holding member 4 Processing container 4A Side wall inner surface 5 Rotating shaft 6 Pin 7 Beam 21 Base body 21A Recess 21B Bolt hole 22 Support body 23 Bolt 24 Long hole 31 Upper piece portion 32 Side wall portion 33 Bottom piece portion 34 Long hole 100 Processing space 101 Sphere A1 Non-contact range W, W1, W2, W3 Substrate

Claims (5)

被処理基板が収容されて処理される処理空間内の所定の支持位置に前記被処理基板を略水平姿勢に支持するための基板支持構造であって、
基端側から先端側に向かって延び、前記支持位置の両側で、基端側から先端側に向かって下方に傾斜する支持部により前記被処理基板を支持する基板支持部材を備え、
前記基板支持部材は、
前記基端側から前記先端側に向かって延びるベース体と、
前記支持部を有し、前記ベース体の上面から前記支持部を露出させるように前記ベース体に配設される支持体と、
を備え、
前記支持体は、円筒側面を有し、前記ベース体の長手方向に沿った軸回りに回転自在に配設される、基板支持構造。
A substrate support structure for supporting the substrate to be processed in a substantially horizontal position at a predetermined support position in a processing space in which the substrate to be processed is accommodated and processed,
A substrate support member that extends from the base end side toward the tip end side and supports the substrate to be processed by support portions that are inclined downward from the base end side toward the tip end side on both sides of the support position,
The substrate support member is
A base body extending from the base end side toward the tip end side;
A support body having the support part and disposed on the base body so as to expose the support part from an upper surface of the base body;
With
The substrate support structure, wherein the support body has a cylindrical side surface and is disposed so as to be rotatable about an axis along a longitudinal direction of the base body.
前記支持体は、樹脂または石英にて形成されている、請求項1に記載の基板支持構造。   The substrate support structure according to claim 1, wherein the support is made of resin or quartz. 前記処理空間は、処理容器の内部に形成され、前記処理容器の側壁内面における前記支持位置の両側に、前記基板支持部材の基端側を保持する保持部材が設けられた、請求項1又は2に記載の基板支持構造。   The processing space is formed inside the processing container, and holding members that hold the base end side of the substrate support member are provided on both sides of the support position on the inner surface of the side wall of the processing container. The substrate support structure described in 1. 前記基板支持部材が前記支持位置の片側について複数設けられる、請求項1又は2に記載の基板支持構造。   The substrate support structure according to claim 1, wherein a plurality of the substrate support members are provided on one side of the support position. 前記支持位置の両側に対向して前記処理空間の奥行き方向に延びて設けられる保持部材であって、複数の前記基板支持部材に対応して設けられる保持部材を備える、請求項4に記載の基板支持構造。   5. The substrate according to claim 4, further comprising a holding member provided to extend in a depth direction of the processing space so as to face both sides of the support position, and is provided corresponding to the plurality of substrate support members. Support structure.
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