JP6554070B2 - 波長掃引光源およびその制御方法 - Google Patents
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- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/106—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
- H01S3/107—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using electro-optic devices, e.g. exhibiting Pockels or Kerr effect
- H01S3/1075—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using electro-optic devices, e.g. exhibiting Pockels or Kerr effect for optical deflection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
- G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/08—Construction or shape of optical resonators or components thereof
- H01S3/08004—Construction or shape of optical resonators or components thereof incorporating a dispersive element, e.g. a prism for wavelength selection
- H01S3/08009—Construction or shape of optical resonators or components thereof incorporating a dispersive element, e.g. a prism for wavelength selection using a diffraction grating
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/106—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity
- H01S3/107—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling devices placed within the cavity using electro-optic devices, e.g. exhibiting Pockels or Kerr effect
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/14—External cavity lasers
- H01S5/141—External cavity lasers using a wavelength selective device, e.g. a grating or etalon
- H01S5/143—Littman-Metcalf configuration, e.g. laser - grating - mirror
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
- H01S5/06209—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes in single-section lasers
- H01S5/06216—Pulse modulation or generation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/14—External cavity lasers
- H01S5/141—External cavity lasers using a wavelength selective device, e.g. a grating or etalon
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- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Lasers (AREA)
- Semiconductor Lasers (AREA)
Description
最初に、KTN結晶に対して光照射器(例えば、LED光源)から紫色光を照射することにより、KTN結晶中のトラップに捕獲された電子を励起して除去できることを述べる。2次の電気光学効果を有する電気光学結晶では、電気光学結晶内のトラップ電子密度Ntrap(真電荷)と屈折率分布に以下の関係がある(例えば、特許文献4参照)。
102,103,202,203 電極
104,204,309 制御電圧源
105,205 入射光
106,206,307 出射光
207 光照射器
301 利得媒質
302 コリメートレンズ
303 集光レンズ
304 回折格子
305 出力結合鏡
306 電気光学偏向器
308 端面鏡
Claims (8)
- 一方の端面が光偏向器を介して回折格子および端面鏡から構成される波長フィルタに結合され、他方の端面が出力結合鏡に相対している利得媒質を含み、前記端面鏡と前記出力結合鏡との間で光共振器を構成する波長掃引光源であって、
前記光偏向器は、
電気光学結晶と、
前記電気光学結晶の対向する面に形成された少なくとも1つの電極対と、
前記電極対を介して前記電気光学結晶内に電界を形成するための制御電圧を出力する制御電圧源と、
前記電気光学結晶に光を照射する光照射器とを含み、
前記制御電圧源により前記電極対に、直流バイアス電圧が重畳された交流電圧からなる駆動電圧を出力し、前記駆動電圧を出力している期間中に前記光照射器から前記電気光学結晶に光を照射して、
前記制御電圧により形成される電界の方向に垂直な光軸に沿って入射される前記利得媒質からの入射光を、前記電界に平行な方向に偏向させて、波長掃引を行うことを特徴とする波長掃引光源。 - 一方の端面が光偏向器を介して回折格子より構成される波長フィルタに結合され、他方の端面が出力結合鏡に相対している利得媒質を含み、前記回折格子と前記出力結合鏡との間で光共振器を構成する波長掃引光源であって、
前記光偏向器は、
電気光学結晶と、
前記電気光学結晶の対向する面に形成された少なくとも1つの電極対と、
前記電極対を介して前記電気光学結晶内に電界を形成するための制御電圧を出力する制御電圧源と、
前記電気光学結晶に光を照射する光照射器とを含み、
前記制御電圧源により前記電極対に、直流バイアス電圧が重畳された交流電圧からなる駆動電圧を出力し、前記駆動電圧を出力している期間中に前記光照射器から前記電気光学結晶に光を照射して、
前記制御電圧により形成される電界の方向に垂直な光軸に沿って入射される前記利得媒質からの入射光を、前記電界に平行な方向に偏向させて、波長掃引を行うことを特徴とする波長掃引光源。 - 前記制御電圧源により前記電極対に前記駆動電圧を出力すると同時に、前記光照射器から前記電気光学結晶に光を照射することを特徴とする請求項1または2に記載の波長掃引光源。
- 前記制御電圧源から出力される前記制御電圧の前記交流電圧の波形において、前記交流電圧の周期の半分の周期の間にのみ、前記光照射器から前記電気光学結晶に光を照射することを特徴とする請求項1または2に記載の波長掃引光源。
- 前記制御電圧源により前記電極対に前記駆動電圧を出力すると同時に、前記光照射器から前記電気光学結晶にパルス状の光を、一定時間間隔で照射することを特徴とする請求項1または2に記載の波長掃引光源。
- 前記光照射器から照射する光の波長は、前記入射光の波長よりも短いことを特徴とする請求項1ないし5のいずれかに記載の波長掃引光源。
- 前記電気光学結晶は、KTN(KTa1-xNbxO3(0<x<1))結晶、またはリチウムを添加したKLTN(K1-yLiyTa1-xNbxO3(0<x<1,0<y<1))結晶のいずれかであることを特徴とする請求項1ないし6のいずれかに記載の波長掃引光源。
- 一方の端面が光偏向器を介して波長フィルタに結合され、他方の端面が出力結合鏡に相対している利得媒質を含み、前記波長フィルタと前記出力結合鏡との間で光共振器を構成する波長掃引光源の制御方法であって、
前記光偏向器は、電気光学結晶と、前記電気光学結晶の対向する面に形成された少なくとも1つの電極対と、前記電極対を介して前記電気光学結晶内に電界を形成するための制御電圧を出力する制御電圧源と、前記電気光学結晶に光を照射する光照射器とを備え、
前記制御電圧源により前記電極対に、直流バイアス電圧が重畳された交流電圧からなる駆動電圧を出力して、前記電気光学結晶内に電子を注入すること、
前記駆動電圧を出力している期間中に前記光照射器から前記電気光学結晶に光を照射して、前記電気光学結晶中のトラップに捕獲された電子を励起して、前記電気光学結晶内に注入された電荷量を可変すること、および
前記制御電圧源からの前記駆動電圧と、前記光照射器からの光照射時間とを調整して、所望の偏向角を得ること
を備えたことを特徴とする波長掃引光源の制御方法。
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| Application Number | Priority Date | Filing Date | Title |
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| JP2016114654A JP6554070B2 (ja) | 2016-06-08 | 2016-06-08 | 波長掃引光源およびその制御方法 |
| US15/616,270 US10205296B2 (en) | 2016-06-08 | 2017-06-07 | Swept light source and method for controlling the same |
| DE102017209572.5A DE102017209572A1 (de) | 2016-06-08 | 2017-06-07 | Streichlichtquelle und Verfahren zum Steuern dieser |
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| JP6554070B2 true JP6554070B2 (ja) | 2019-07-31 |
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| JP6965834B2 (ja) | 2018-06-13 | 2021-11-10 | 日本電信電話株式会社 | 光偏向器 |
| JP7156158B2 (ja) | 2019-04-23 | 2022-10-19 | 日本電信電話株式会社 | 光偏向器の制御方法 |
| JP7156159B2 (ja) | 2019-04-23 | 2022-10-19 | 日本電信電話株式会社 | 光偏向器の制御方法 |
| JPWO2020240726A1 (ja) * | 2019-05-29 | 2020-12-03 | ||
| WO2021090435A1 (ja) | 2019-11-07 | 2021-05-14 | 日本電信電話株式会社 | 光偏向装置 |
| JP7485015B2 (ja) * | 2020-04-16 | 2024-05-16 | 日本電信電話株式会社 | 電気光学装置 |
| WO2022079846A1 (ja) | 2020-10-14 | 2022-04-21 | 日本電信電話株式会社 | 光偏向器 |
| US12399414B2 (en) | 2020-10-14 | 2025-08-26 | Nippon Telegraph And Telephone Corporation | Optical deflector and method for determining control condition of optical deflector |
| CN113036599B (zh) * | 2021-03-04 | 2022-11-11 | 中国科学院光电技术研究所 | 一种提高Littman结构可调谐外腔半导体激光器输出功率的方法 |
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| US3492492A (en) * | 1967-06-16 | 1970-01-27 | Bell Telephone Labor Inc | Optically active device with optical enhancement |
| JPS5285120A (en) | 1976-01-06 | 1977-07-15 | Lubrizol Corp | Amine salt or quaternary ammonium salt of acrylamide alkane sulfonic acid and polymer thereof |
| JP2001337302A (ja) * | 2000-05-26 | 2001-12-07 | Nec Corp | 光導波路素子およびその製造方法ならびに光ポーリング方法 |
| US7990600B2 (en) * | 2004-05-24 | 2011-08-02 | Compound Photonics Limited | Transmissive, optically addressed, photosensitive spatial light modulators and color display systems incorporating same |
| WO2006008873A1 (ja) * | 2004-07-15 | 2006-01-26 | Nec Corporation | 外部共振器型波長可変レーザ |
| US7830594B2 (en) * | 2005-03-29 | 2010-11-09 | Technion Research And Development Foundation Ltd. | Method and apparatus for electro-optical and all-optical beam steering, self-deflection and electro-optic routing |
| WO2006137408A1 (ja) * | 2005-06-20 | 2006-12-28 | Nippon Telegraph And Telephone Corporation | 電気光学素子 |
| US7858923B2 (en) * | 2006-12-26 | 2010-12-28 | Canon Kabushiki Kaisha | Light beam scanning apparatus and image forming apparatus provided with the same |
| US8279511B2 (en) * | 2008-07-11 | 2012-10-02 | University Of Florida Research Foundation, Inc. | Method and apparatus for modulating light |
| US8488635B2 (en) * | 2010-08-17 | 2013-07-16 | The United States Of America As Represented By The Secretary Of The Army | UV illumination for mitigation of cold temperature pyroelectric effects in lithium niobate |
| EP2662683B1 (en) * | 2011-01-05 | 2016-05-04 | Nippon Telegraph And Telephone Corporation | Wavelength swept light source |
| JP5285120B2 (ja) * | 2011-05-19 | 2013-09-11 | 日本電信電話株式会社 | 光偏向器および光偏向器の制御方法 |
| JP2013140328A (ja) * | 2011-12-06 | 2013-07-18 | Ricoh Co Ltd | 光学装置、光偏向装置及び光変調装置 |
| JP2013174744A (ja) * | 2012-02-24 | 2013-09-05 | Ricoh Co Ltd | 光変調器、光変調方法 |
| JP6039485B2 (ja) * | 2013-04-01 | 2016-12-07 | 日本電信電話株式会社 | 光偏向器およびその駆動方法 |
| JP6059627B2 (ja) | 2013-09-27 | 2017-01-11 | 日本電信電話株式会社 | 光偏向器および光偏向器の制御方法 |
| JP6193773B2 (ja) * | 2014-01-30 | 2017-09-06 | 日本電信電話株式会社 | 波長掃引光源 |
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| DE102017209572A1 (de) | 2017-12-14 |
| JP2017219732A (ja) | 2017-12-14 |
| US20170358899A1 (en) | 2017-12-14 |
| US10205296B2 (en) | 2019-02-12 |
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