JP6554874B2 - Analysis method, analysis program, and analysis apparatus - Google Patents

Description

  The present invention relates to an analysis method, an analysis program, and an analysis apparatus.

  Conventionally, in electromagnetic field analysis, a technique for dividing an analysis region into a plurality of cells and calculating a transient behavior of the electromagnetic field for each cell is known (for example, refer to Patent Document 1 below).

  Conventionally, it is known that a surface mesh model generation apparatus that generates a surface mesh model used in the calculation of the boundary element method includes a smoothing unit that performs a smoothing process for reducing unevenness (see, for example, Patent Document 2 below). ). In the smoothing process, the uneven portion of the surface mesh is used as noise, and noise of a certain frequency component is removed by a filter.

  Conventionally, in the electromagnetic fluid analysis, a point P2 in the free surface after deformation obtained by projecting the point P1 in the free surface before deformation of the electrically conductive fluid is obtained, and based on the electromagnetic force at the point P1 in the free surface before deformation. A technique for obtaining an electromagnetic force at a point P2 in the free surface after deformation is known (for example, see Patent Document 3 below).

JP 2003-6181 A JP 2012-133434 A Japanese Patent Laid-Open No. 2004-93498

  In the prior art, cell division is performed according to the shape of an element such as a wiring or a pad. For this reason, if a concave portion or a convex portion is included in the shape of an element such as a wiring or a pad, there is a problem that fine cell division is performed in the concave portion or the convex portion, and the number of cells increases.

  In one aspect, an object of the present invention is to provide an analysis method, an analysis program, and an analysis apparatus that can reduce the number of cells.

  According to an aspect of the present invention, first cell information indicating a plurality of cells obtained by dividing the analysis region into a plurality of cells based on the shape of an element arranged in the analysis region in the simulation space is generated, and the generated first Among the plurality of cells indicated by the cell information, the shape formed by the plurality of cells including the element is specified, the part of the predetermined shape included in the specified shape is specified, and the specified shape is specified. An analysis method, an analysis program, and an analysis apparatus for generating second cell information indicating a plurality of cells obtained by dividing the analysis region into a plurality of parts based on the shape from which the portion has been deleted are proposed.

  According to one embodiment of the present invention, the number of cells can be reduced.

FIG. 1 is an explanatory view showing an operation example by the analyzing apparatus according to the present invention. FIG. 2 is an explanatory diagram illustrating an example in which a fine lattice is generated. FIG. 3 is a block diagram illustrating a hardware configuration example of the analysis apparatus. FIG. 4 is a block diagram illustrating a functional configuration example of the analysis apparatus. FIG. 5 is an explanatory diagram showing an example of cell information. FIG. 6 is an explanatory diagram showing an example of a correspondence table between grid point numbers and coordinates. FIG. 7 is an explanatory diagram showing an example (part 1) of deleting a convex portion whose orientation is horizontal. FIG. 8 is an explanatory diagram illustrating an example of a method for determining the next search direction. FIG. 9 is an explanatory diagram of an example (part 2) of deleting a convex portion whose orientation is horizontal. FIG. 10 is an explanatory diagram showing an example of cell reduction for an example of convex portion deletion. FIG. 11 is an explanatory diagram illustrating an example of deleting a concave portion whose direction is vertical. FIG. 12 is an explanatory diagram showing an example of cell reduction with respect to an example of deleting a recess. FIG. 13 is a flowchart illustrating an example of an analysis processing procedure performed by the analysis apparatus. FIG. 14 is a flowchart showing a detailed description of the unevenness deletion process (step S1304) shown in FIG.

  Exemplary embodiments of an analysis method, an analysis program, and an analysis apparatus according to the present invention will be described below in detail with reference to the accompanying drawings.

  FIG. 1 is an explanatory view showing an operation example by the analyzing apparatus according to the present invention. The analysis device 100 is a computer that calculates a physical quantity for each of a plurality of cells obtained by dividing the analysis area 101 and acquires an analysis result of the analysis area 101 based on the physical quantity. The analysis apparatus 100 is a computer that estimates the calculation time required for analysis calculation before performing analysis.

  For example, in a simulation based on the FDTD (Finite-Difference Time-Domain method) method, which is a kind of electromagnetic field analysis, an electric field and a magnetic field are calculated for each of the cells obtained by dividing the analysis region 101 into a lattice shape, thereby obtaining an analysis region. The electromagnetic field distribution in 101 is analyzed.

  Specifically, the cell is an area obtained by dividing the analysis area 101 by lattice points arranged in a lattice pattern on the simulation space. The simulation space is a space set to represent on the computer the analysis area 101 including the inside of the physical element 102 to be analyzed and the space outside the element 102. For example, in the simulation space, a three-dimensional orthogonal coordinate system including, for example, an X axis, a Y axis, and a Z axis is defined. In the present embodiment, attention is paid to the X axis and the Y axis, and description of the Z axis is omitted. The cell c has a rectangular shape, for example, a square or a cube. For example, information indicating whether or not the element 102 is included can be set in the cell c. For analysis, the medium of the medium and the electric constant corresponding to the medium can be set in the cell c. Examples of the electrical constant include dielectric constant, magnetic permeability, and electrical conductivity. Examples of the element 102 include a part that forms an object such as a wiring, a pad, and a substrate.

  Conventionally, since cell division is performed according to the shape of the element 102 such as a wiring or a pad, there is a concave portion or a convex portion. An example in which a concave portion or a convex portion is generated is shown in FIG. There is a problem in that the number of cells increases because fine cell division is performed in the concave and convex portions.

  In the present embodiment, analysis is performed based on a shape in which minute convex portions or concave portions are deleted from a shape formed by a plurality of cells including elements arranged in the analysis region among a plurality of cells obtained by dividing the analysis region. Divide the region into multiple cells. In addition, although minute concave portions and convex portions are generated in a CAD (Computer Aided Design) design stage, they are often not generated in an actual substrate and may have little influence on analysis accuracy. A minute concave part or convex part is a concave part or convex part that is smaller than a threshold set by the user. The threshold value is set by, for example, the type of the element 102 or a hole included in the element 102. For example, if the element 102 is a substrate, the threshold is a value based on the width of holes included in the substrate. More specifically, the threshold value is set to a value smaller than the width of the hole included in the substrate.

  Thereby, the number of cells can be reduced. In the case of analysis in which a physical quantity is calculated for each cell c as in the electromagnetic field analysis, the time required for the analysis increases as the number of cells c increases. Therefore, the time required for the analysis is reduced by reducing the number of cells. be able to.

  First, the analysis apparatus 100 generates first cell information 103 indicating a plurality of cells obtained by dividing the analysis region 101 into a plurality based on the shape of the element 102 arranged in the analysis region 101 in the simulation space. For example, the analysis apparatus 100 divides the analysis region 101 into a plurality of cells c by a predetermined lattice point interval. The interval between the predetermined grid points may be determined by the size of the element 102, for example. For example, when the element 102 includes a wiring, the interval between the predetermined lattice points may be the minimum width of the wiring.

  Next, the analysis apparatus 100 specifies a shape formed by a plurality of cells including the element 102 among the plurality of cells indicated by the first cell information 103. The cell including the element 102 is, for example, a cell including the element 102 at a predetermined ratio or more. The predetermined ratio may be set by a user or may be a fixed value, for example. The predetermined ratio may be 50 [%], for example. Here, in the first cell information 103, whether or not the element 102 is included in each of the plurality of cells can be set. For example, information indicating that the element 102 is included is set for the cell c1. For example, information indicating that the element 102 is not included is set for the cell c6. For example, information indicating that the element 102 is included is set for the cell c17.

  Then, the analysis device 100 specifies a portion having a predetermined shape included in the specified shape. The predetermined shape portion is, for example, a predetermined convex portion or a concave portion. The predetermined convex portion and the predetermined concave portion are a convex portion having a predetermined size or less and a concave portion having a predetermined size or less. For example, when the element 102 is a substrate, the predetermined convex portion or the predetermined concave portion is a convex portion or a concave portion having a width smaller than a hole included in the substrate. Projections and recesses larger than the holes included in the substrate are also generated in an actual substrate and cannot be ignored. On the other hand, convex portions and concave portions smaller than the holes included in the substrate often do not occur in an actual substrate, and may have little influence on analysis accuracy.

  For example, the analysis device 100 searches for a lattice point that forms an outline in a shape formed by a plurality of cells including the element 102 and specifies a predetermined convex portion or concave portion. For example, the cell c17 is specified as a predetermined convex portion or concave portion.

  Next, the analysis apparatus 100 shows a plurality of cells obtained by dividing the analysis region 101 into a plurality of cells based on a shape in which the specified convex portion or concave portion is deleted from the shape formed by the plurality of cells including the element 102. Two-cell information 104 is generated. The analysis apparatus 100 changes the setting of information indicating whether or not the element 102 is included for the specified convex or concave cell.

  For example, in the first cell information 103, the information indicating that the element 102 is included is set in the first cell information 103, and thus the analysis apparatus 100 changes the information to indicate that the element 102 is not included. . In addition, for example, in the first cell information 103, the analysis apparatus 100 is set to information indicating that the element 102 is included since information indicating that the element 102 is not included is set for the cell that is the specified recess. To do. Thereby, the shape from which the specified convex portion or concave portion is deleted is specified from the shape formed by the plurality of cells including the element 102. In the example of FIG. 1, the analysis apparatus 100 changes the setting from information indicating that an element is included for the cell c17 to information indicating that an element is not included.

  And the analysis apparatus 100 produces | generates the 2nd cell information 104 by adjusting the lattice point in the analysis area | region 101 based on the deleted shape, for example. Since one grid in the X-axis direction may be removed, in the second cell information 104, for example, the cell c5 and the cell c6 become one cell c5.

  Thereby, the number of cells can be reduced, and the time required for analysis can be reduced.

  FIG. 2 is an explanatory diagram illustrating an example in which a fine lattice is generated. A method for generating a grid in electromagnetic field analysis will be briefly described. The analysis apparatus 100 determines a reference grid width. Then, the analysis apparatus 100 generates a grid at regular intervals based on the grid width, and divides the element 102 for each cell. For example, the presence / absence of the element 102 and the medium of the element 102 are set in the cell. In the example of FIG. 2, the cell in which the element 102 is present is indicated by a black circle in “when divided along the grid”. Then, the analysis apparatus 100 extracts a grid where there is no influence on the shape of the element 102 represented by the cell even if the grid is extracted. Thereby, the number of cells can be reduced.

  However, for example, a portion surrounded by a square in the shape of the upper substrate has no element 102 in the shape of the substrate, so that a fine lattice is generated. For example, in the shape of the lower substrate, a portion surrounded by a square is the element 102 in the shape of the substrate, and thus a lattice is generated. As described above, a lattice is generated by the fine uneven portion, and the number of cells increases.

  Therefore, in the present embodiment, as described with reference to FIG. 1, from the shape formed by the plurality of cells including the elements arranged in the analysis region among the plurality of cells obtained by dividing the analysis region, a minute convex portion is formed. Alternatively, the analysis region is divided into a plurality of cells based on the shape from which the concave portions are deleted. Thereby, since a minute recessed part and a convex part are deleted, it becomes possible to extract a grating | lattice. Therefore, the number of cells can be reduced and the calculation time can be reduced.

(Hardware configuration example of analysis apparatus 100)
FIG. 3 is a block diagram illustrating a hardware configuration example of the analysis apparatus. In FIG. 3, the analysis device 100 includes a CPU (Central Processing Unit) 301, a ROM (Read Only Memory) 302, a RAM (Random Access Memory) 303, a disk drive 304, and a disk 305. . The analysis apparatus 100 includes an I / F (Inter / Face) 306, a keyboard 307, a mouse 308, and a display 309. Each unit is connected by a bus 300.

  Here, the CPU 301 controls the entire analysis apparatus 100. The ROM 302 stores a program such as a boot program. The RAM 303 is used as a work area for the CPU 301. The disk drive 304 controls reading / writing of data with respect to the disk 305 according to the control of the CPU 301. The disk 305 stores data written under the control of the disk drive 304. Examples of the disk 305 include a magnetic disk and an optical disk.

  The I / F 306 is connected to a network 310 such as a LAN (Local Area Network), a WAN (Wide Area Network), and the Internet through a communication line, and is connected to other devices via the network 310. The I / F 306 controls an internal interface with the network 310 and controls input / output of data from an external device. For example, a modem or a LAN adapter can be used as the I / F 306.

  The keyboard 307 and the mouse 308 are interfaces for inputting various data, for example, by user operations. The display 309 is an interface that outputs data in accordance with an instruction from the CPU 301, for example.

  Although not shown, the analysis apparatus 100 may be provided with an input device that captures images and moving images from a camera and an input device that captures sound from a microphone. Although not shown, the analysis apparatus 100 may be provided with an output device such as a printer. Although not shown, the analysis apparatus 100 may be provided with, for example, an SSD or a flash ROM.

(Functional configuration example of the analysis apparatus 100)
FIG. 4 is a block diagram illustrating a functional configuration example of the analysis apparatus. The analysis apparatus 100 includes a first generation unit 401, a first specification unit 402, a second specification unit 403, a second generation unit 404, and a storage unit 411. The storage unit 411 is realized by a storage device such as the ROM 302, the RAM 303, and the disk 305, for example. The processes of the control units from the first generation unit 401 to the second generation unit 404 are coded in, for example, a program stored in the storage unit 411 accessible by the CPU 301 illustrated in FIG. Then, the CPU 301 reads the program from the storage unit 411 and executes the process coded in the program. Thereby, the process of a control part is implement | achieved. The processing result of the control unit is stored in the storage unit 411, for example.

  The first generation unit 401 generates first cell information 103 obtained by dividing the analysis region 101 into a plurality of cells based on the shape of the element 102 arranged in the analysis region 101 in the simulation space. The element 102 arranged in the analysis area 101 is, for example, an object to be analyzed indicated by CAD data. The CAD data is data indicating each element 102 such as a part included in the object to be analyzed. Although not shown, the CAD data includes, for example, the element 102, the layer number, the start point where the element 102 is arranged, the end point where the element 102 is arranged, the line length, the line width, and the like.

  The analysis area 101 is divided into a plurality of cells c according to the lattice point intervals. Identification information capable of identifying the cell c is attached to each cell c. Further, in order to represent the position of each cell c, a number is assigned to each of the lattice point in the X-axis direction and the lattice point in the Y-axis direction as identification information that can identify the lattice point.

  FIG. 5 is an explanatory diagram showing an example of cell information. The cell information 500 illustrated in FIG. 5 is an example of information such as the first cell information 103 and the second cell information 104. The cell information 500 is information indicating a position and a medium for each of the plurality of cells c. For example, cell information 500 includes cells, upper left (X) lattice point numbers, upper left (Y) lattice point numbers, lower right (X) lattice point numbers, lower right (Y) lattice point numbers, and presence / absence of elements (medium). Has a field. By setting information in each field, it is stored as a record (for example, 501-1 to 501-4). Here, the lattice point numbers in the Z-axis direction are omitted.

  Identification information that can uniquely identify the cell c is set in the cell field. In the upper left (X) lattice point number field, among the lattice point numbers of the four vertices of the cell c, the upper left lattice point number is set. In the upper left (Y) grid point number field, the grid point number in the upper left Y-axis direction among the grid point numbers of the four vertices of the cell c is set. In the lower right (X) lattice point number field, the lattice point numbers in the lower right X-axis direction among the lattice point numbers of the four vertices of the cell c are set. In the field of the lower right (Y) lattice point number, the lattice point number in the lower right Y-axis direction among the lattice point numbers of the four vertices of the cell c is set.

  Here, the position of the cell c is represented by the upper left (X) lattice point number, the upper left (Y) lattice point number, the lower right (X) lattice point number, and the lower right (Y) lattice point number. . Further, the lower left (X) lattice point number of the cell c by the upper left (X) lattice point number, the upper left (Y) lattice point number, the lower right (X) lattice point number, and the lower right (Y) lattice point number. A point number, a lower left (Y) lattice point number, an upper right (X) lattice point number, and an upper right (Y) lattice point number can be specified.

  Information indicating whether or not the analysis target element 102 is included is set in the presence / absence field of the element 102. Further, the presence / absence field of the element 102 indicates “Yes” when the analysis target element 102 is included in the cell in a predetermined ratio or more, and “Available” indicates that the analysis target element 102 is not included in the cell in the predetermined ratio. "No". A cell in which “present” is set is also referred to as a foreground cell, for example, and a cell in which “no” is set is also referred to as a background cell, for example. In the field of presence / absence of the element 102, a medium when the analysis region 101 including the element 102 is modeled may be set. For example, examples of the medium include air and metal.

  Taking the record 501-2 as an example, the upper left (X) lattice point number of the cell c2 is 1, the upper left (Y) lattice point number of the cell c2 is 0, and the lower right (X) lattice point of the cell c2. The number is 2, the lower right (Y) lattice point number of the cell c2 is 1, and the presence or absence of the element 102 is “present”. In the field for the presence / absence of the element 102, the identification result of the first identification unit 402 described later is set.

  FIG. 6 is an explanatory diagram showing an example of a correspondence table between grid point numbers and coordinates. The correspondence table 600-X shows the correspondence between the grid point number (X) and the coordinates in the X-axis direction. For example, when the grid point number (X) is 1, the X-axis coordinate is 0.1. The correspondence table 600-Y shows the correspondence between the grid point number (Y) and the coordinates in the Y-axis direction. For example, when the grid point number (Y) is 1, the Y-axis coordinate is 0.1. The grid point number (Y) and the Y-axis coordinates are determined by the initial grid point interval d.

  The first specifying unit 402 specifies a shape formed by a plurality of cells corresponding to the element 102 among the plurality of cells indicated by the generated first cell information 103. Specifically, for example, the first specifying unit 402 specifies a cell including the element 102 arranged in the analysis region 101 in the simulation space among the plurality of cells as the foreground cell. The foreground cell may be, for example, a cell including at least a part of the element 102 or a cell including a predetermined percentage or more of the element 102. The predetermined ratio may be set by a user or the like, and is not particularly limited. Specifically, for example, the first specifying unit 402 specifies, as a background cell, a cell including the element 102 arranged in the simulation space among a plurality of cells. The first specifying unit 402 sets a cell different from the foreground cell among the plurality of cells as a background cell. The identification result is set for each cell based on the presence or absence of the element 102 included in the cell data described above.

Next, the second specifying unit 403 specifies a portion having a predetermined shape included in the specified shape.
The predetermined shape portion is, for example, a predetermined convex portion or a concave portion. Here, an example of a convex part in which the direction of the shape of the specified element 102 is horizontal and an example of a concave part in which the direction of the shape of the specified element 102 is vertical are shown. The direction of the shape of the element 102 may be specified by the user, for example, or may be determined in advance as being aligned in either the horizontal or vertical direction. The predetermined convex portion or concave portion is, for example, a convex portion or concave portion that is smaller than a threshold value.

  FIG. 7 is an explanatory diagram showing an example (part 1) of deleting a convex portion whose orientation is horizontal. An example of an element 102 including a horizontal protrusion is shown. As for the number of lattices, X is 7 and Y is 6. The number of cells is 30. Let the search start point be the lower left lattice point of the cell c1. Here, the threshold value is 2. About a threshold value, a user determines according to sizes, such as a hole of a component or a board | substrate, for example.

  As illustrated in FIG. 7A, the first specifying unit 402 determines a search start point and sets the search start point as the first start point. Next, the 1st specific | specification part 402 determines a search direction. The first specifying unit 402 searches for lattice points that form a contour in the search direction from the starting point. The cell forming the contour is a cell in the foreground and in contact with the background. Therefore, the grid points that form the outline are the grid points that form the four vertices of the foreground cell and the grid points that form the four vertices of the background cell.

  During the search, the first specifying unit 402 detects a bending point. The bending point is a lattice point that forms an outline, and the cells formed by the next lattice point in the search direction from the lattice point are all background cells. Then, the first specifying unit 402 sets the target point as a new starting point when the amount of movement of at least one of the X-axis and the Y-axis from the starting point to the target point is equal to or greater than the threshold with the bending point as the target point. To do.

  Then, as illustrated in FIG. 7B, the first specifying unit 402 determines the next search direction with the target point as a new starting point. The starting point is one grid point.

  FIG. 8 is an explanatory diagram illustrating an example of a method for determining the next search direction. First, the relationship between the moving direction and the moving amount of the cell to be searched is shown in the table. For example, the negative direction of the Y axis is direction 0, the positive direction of the X axis is direction 1, the positive direction of the Y axis is direction 2, and the negative direction of the X axis is direction 3.

  When moving in the direction 0, the movement amount in the X-axis direction is 0, and the movement amount in the Y-axis direction is -1. When moving in the direction 1, the movement amount in the X-axis direction is 1, and the movement amount in the Y-axis direction is 0. When moving in the direction 2, the movement amount in the X-axis direction is 0, and the movement amount in the Y-axis direction is 1. When moving in the direction 3, the amount of movement in the X-axis direction is -1, and the amount of movement in the Y-axis direction is zero.

  The priorities regarding the direction of the next cell to be searched are shown in the table with respect to the previous search direction. The table shows priorities corresponding to the number of searches from the current starting point and the immediately preceding search direction. According to the table, the next search direction is in turn so that the reverse search direction is last. The second specifying unit 403 determines the next search direction using, for example, the following formula (1).

  Next search direction = ((number of searches + previous search direction−1) +4)% 4 (1)

  Returning to the description of FIG. 7B, the second specifying unit 403 determines the next search direction based on the immediately preceding search direction and the number of searches, for example. For example, since the number of searches is 0 and the previous search direction is direction 1, the second specifying unit 403 determines the next search direction as direction 0.

  Since there is no cell in direction 0, second specifying unit 403 counts up the number of searches to determine the next search direction. For example, since the number of searches is 1, and the immediately preceding search direction is direction 1, the second specifying unit 403 sets the next search direction as direction 1. Since the grid point in the direction 1 from the starting point 1 is a grid point that forms the background cell, it is not a grid point that forms an outline in the shape of the cell including the element 102. Therefore, the second specifying unit 403 determines the number of searches. Count up to determine the next search direction.

  For example, since the number of searches is 2, and the immediately preceding search direction is direction 1, the second specifying unit 403 sets the next search direction to direction 2. The lattice points in the direction 2 from the starting point 1 are lattice points that form a contour. Then, the second specifying unit 403 searches for a lattice point that forms an outline in the search direction determined from the starting point 1 and detects a bending point. The lattice point on the upper right of the cell c3 in the direction 2 from the starting point 1 is a bending point. Then, the second specifying unit 403 specifies the amount of movement from the starting point with the bending point as the target point 2. The movement amount of the target point 2 is “X direction: 0, Y direction: 1”. Therefore, the second specifying unit 403 determines that the movement amount of the target point 2 is not greater than or equal to the threshold value. Then, the second specifying unit 403 newly determines a search direction from the target point 2 and searches for a lattice point that forms a contour in the shape of the cell including the element 102.

  Then, if there is a turning point during the search, the second specifying unit 403 sets the turning point as a target point. In this way, the target point 3 and the target point 4 are searched as shown in FIG. The movement amount from the starting point 1 to the target point 3 is “X: 1, Y: 1”, and the movement amount of the target point 4 is “X: 1, Y: 2”.

  FIG. 9 is an explanatory diagram of an example (part 2) of deleting a convex portion whose orientation is horizontal. As shown in FIG. 9 (1), the second specifying unit 403 determines the target point 4 because the absolute value of the movement amount in at least one of the X-axis direction and the Y-axis direction is two or more which is a threshold value. Point 4 is set as a new starting point 1.

  Then, as illustrated in FIG. 9B, the second specifying unit 403 determines a search direction from the starting point 1 and searches for lattice points that form contours in the shapes of a plurality of cells including the element 102. The 2nd specific | specification part 403 detects a bending point as an object point. Then, the second specifying unit 403 specifies the movement amount from the starting point 1 to the target point, and whether or not the absolute value of the movement amount of at least one of the movement amount in the X-axis direction or the Y-axis direction is equal to or greater than a threshold value. Judging. Here, the movement amount of the target point 2 is “X: 1, Y: 0”, the movement amount of the target point 3 is “X: 1, Y: 1”, and the movement amount of the target point 4 is “X”. : 0, Y: 1 ”.

  In addition, when it is determined that the absolute value of the movement amount is not equal to or greater than the threshold, the second specifying unit 403 determines whether or not the movement amount regarding the direction of the unevenness has returned to zero. Here, since the direction of the unevenness is the X-axis direction, the movement amount in the X-axis direction returns to 0 between the starting point and the target point 4. When it returns to 0, the 2nd specific | specification part 403 detects between a starting point and a target point as an uneven | corrugated | grooved part. Here, since the cell including the lattice points 1 to 4 as vertices is the cell c17, the second specifying unit 403 specifies the cell c17 as the uneven portion.

  The second generation unit 404 analyzes the analysis region based on the shape obtained by deleting the convex portion or the concave portion specified by the second specification unit 403 from the shape of the element 102 indicated by the first cell information 103 generated by the first generation unit 401. Second cell information 104 indicating a plurality of cells obtained by dividing 101 into a plurality of cells is generated. Specifically, for example, in the first cell information 103, the second generation unit 404 changes to the background if the cell for the specified convex portion or concave portion is the foreground, and changes to the foreground if it is the background. Specifically, for example, the second generation unit 404 changes the background to the foreground if the cell for the specified convex or concave portion is the foreground, and changes to the foreground if the cell is the background. As shown in FIG. 9 (3), the second generation unit 404 changes the cell c17 from the foreground to the background.

  Specifically, the second generation unit 404 generates the second cell information 104 indicating a plurality of cells after removing the lattice points so that the shape of the analysis target element 102 does not change. To remove a grid point is, for example, to merge a plurality of consecutive cells having the same presence or absence of cells into one cell. For example, based on the first cell information 103, the second generation unit 404 uses the cell c on the extension of the X axis and Y axis of the cell c representing the outer shape of the element 102 as a boundary and has the same presence or absence of cells. The second cell information 104 is generated by merging the cell c to be merged into one cell.

  FIG. 10 is an explanatory diagram showing an example of cell reduction for an example of convex portion deletion. For example, when the cell c17 changes from the foreground to the background, the grid in the X-axis direction is reduced by one. Thereby, for example, cell c5 and cell c6 become cell c5, cell c11 and cell c12 become cell c11, cell c17 and cell c18 become cell c17, and cell c23 and cell c24 become cell c23. And cell c29 and cell c30 become cell c29.

  Next, a description will be given of an example of deleting a concave portion in which the direction of the unevenness is vertical. Here, the direction of the unevenness is perpendicular to the Y-axis direction. Since the processing of each part is the same as the example of deleting the convex part, it will be briefly described here.

  As described above, the first generation unit 401 generates the first cell information 103 indicating a plurality of cells obtained by dividing the analysis region 101 into a plurality based on the shape of the element 102 arranged in the analysis region 101 in the simulation space. . Then, as described above, the first specifying unit 402 specifies a shape formed by a plurality of cells corresponding to the element 102 among the plurality of cells indicated by the generated first cell information 103.

  FIG. 11 is an explanatory diagram illustrating an example of deleting a concave portion whose direction is vertical. Here, a case where the threshold value is 2 is taken as an example. As shown in FIG. 11 (1), the second specifying unit 403 searches for lattice points that form contours in order in the search direction determined from the search start point as the start point. Here, the second specifying unit 403 searches from the starting point to the lower right lattice point of the cell c6.

  Since the lower right lattice point of the cell c6 is a bending point, the second specifying unit 403 sets the lower right lattice point of the cell c6 as a target point. Since the absolute value of the movement amount in the X-axis direction from the starting point to the target point is equal to or greater than the threshold value, the second specifying unit 403 determines the search direction using the target point as a new starting point. Since the search direction determination method is the same as the example shown in FIG. 8, detailed description thereof is omitted.

  As illustrated in FIG. 11A, the second specifying unit 403 searches for lattice points that form contours in order in the search direction from the starting point which is the lower right lattice point of the cell c6. The second specifying unit 403 detects the upper right lattice point of the cell c24 that is a turning point from the starting point as a target point. Next, the second specifying unit 403 determines that the absolute value of the amount of movement in the Y-axis direction from the starting point to the target point is greater than or equal to the threshold value.

  Then, the second specifying unit 403 determines the search direction using the upper right grid point of the cell c24 as a new starting point. The second specifying unit 403 searches for lattice points that form an outline in the search direction from the starting point which is the upper right lattice point of the cell c24. The second specifying unit 403 detects the upper right lattice point of the cell c22 that is a turning point from the starting point as a target point. Since the absolute value of the amount of movement in the X-axis direction from the starting point to the target point is equal to or greater than the threshold value, the second specifying unit 403 newly sets the upper right lattice point of the cell c22 that is the target point.

  Here, the starting point which is the upper right lattice point of the cell c22 is set as the starting point 1. Then, the second specifying unit 403 searches for lattice points that form contours in order in the search direction from the starting point 1 that is the upper right lattice point of the cell c22. The second specifying unit 403 detects the lower right lattice point of the cell c22 that is a turning point from the starting point 1 as the target point 2. Then, the second specifying unit 403 newly determines the search direction from the target point 2 because the absolute values of the movement amounts in the X-axis direction and the Y-axis direction from the starting point 1 to the target point 2 are not more than the threshold value. Search for lattice points that form a contour. Then, the second specifying unit 403 detects the lower left lattice point of the cell c22 that is a new bending point as the target point 3. Since the absolute values of the movement amounts in the X-axis direction and the Y-axis direction from the starting point 1 to the target point 3 are not equal to or greater than the threshold value, the second specifying unit 403 newly determines the search direction from the target point 3 and defines the contour. Search for lattice points to be formed.

  The second specifying unit 403 detects the upper left lattice point of the cell c22 which is a new bending point as the target point 4. The second specifying unit 403 determines that the absolute values of the movement amounts in the X-axis direction and the Y-axis direction from the starting point 1 to the target point 4 are not more than a threshold value. Then, the second specifying unit 403 newly determines the search direction from the target point 2 in the Y-axis direction, which is the direction of unevenness between the starting point 1 and the target point 4, and forms a contour in the determined search direction. Search for grid points.

  The second specifying unit 403 detects from the starting point 1 to the target point 4 as an uneven portion since the movement amount has returned to 0 in the Y-axis direction that is the direction of the unevenness from the starting point 1 to the target point 4.

  The second generation unit 404 analyzes the analysis region 101 based on the shape obtained by deleting the uneven portion specified by the second specification unit 403 from the shape of the element 102 indicated by the first cell information 103 generated by the first generation unit 401. 2nd cell information 104 indicating a plurality of cells divided into a plurality of cells is generated. Specifically, for example, in the first cell information 103, the second generation unit 404 changes to the background if the cell for the specified convex portion or concave portion is the foreground, and changes to the foreground if it is the background. As illustrated in FIG. 11B, the second generation unit 404 changes the cell c22 from the background to the foreground. As a result, a shape obtained by deleting the uneven portion specified by the second specifying unit 403 from the shape of the element 102 indicated by the first cell information 103 generated by the first generating unit 401 is specified.

  FIG. 12 is an explanatory diagram showing an example of cell reduction with respect to an example of deleting a recess. For example, the second generation unit 404 generates the second cell information 104 indicating a plurality of cells after removing lattice points so that the shape of the analysis target element 102 does not change.

  In the example of FIG. 12, the lattices between the cells c7 to c12 and the cells c13 to c18 are eliminated. Therefore, the cell c7 and the cell c13 become one cell c7, the cell c8 and the cell c14 become one cell c8, and the cell c9 and the cell c15 become one cell c9. Then, the cell c10 and the cell c16 become one cell c10, the cell c11 and the cell c17 become one cell c11, and the cell c12 and the cell c18 become one cell c12.

(Example of analysis processing procedure by analysis apparatus 100)
FIG. 13 is a flowchart illustrating an example of an analysis processing procedure performed by the analysis apparatus. The analysis apparatus 100 divides the analysis area 101 into a plurality of cells and generates first cell information 103 (step S1301). Next, the analysis apparatus 100 specifies the foreground and the background for each of the plurality of cells based on the presence / absence of the element 102 (step S1302). Then, the analysis apparatus 100 determines the processing target element 102 (step S1303).

  Next, the analysis apparatus 100 performs an unevenness deletion process (step S1304). The analysis apparatus 100 determines whether there is an unprocessed element 102 (step S1305). When it is determined that there is an unprocessed element 102 (step S1305: Yes), the analysis apparatus 100 returns to step S1303.

  When it is determined that there is no unprocessed element 102 (step S1305: No), the analysis apparatus 100 generates the second cell information 104 by adjusting the lattice based on the changed first cell information 103 ( In step S1306), a series of processing ends.

  FIG. 14 is a flowchart showing a detailed description of the unevenness deletion process (step S1304) shown in FIG. First, the analysis apparatus 100 accepts an input of the direction of unevenness for the processing target element 102 (step S1401). Next, the analysis apparatus 100 determines a search start point from the grid points included in the foreground cell forming the contour of the element 102 (step S1402). The outline of the element 102 is an outline in the shape of a plurality of cells including the element 102. Then, the analysis device 100 determines a search direction (step S1403).

  Next, the analysis apparatus 100 tracks a lattice point that forms a contour in the search direction from the starting point or the previous bending point, and detects the next bending point as a target point (step S1404). Then, the analysis apparatus 100 determines whether or not the absolute value of the movement amount from the starting point to the target point is greater than or equal to a threshold value (step S1405). In step S1405, the analysis apparatus 100 specifically includes at least one of the absolute value of the movement amount in the X-axis direction from the starting point to the target point and the absolute value of the movement amount in the X-axis direction from the starting point to the target point. It is determined whether or not the value is greater than or equal to a threshold value.

  When it is determined that the value is equal to or greater than the threshold (step S1405: Yes), the analysis apparatus 100 determines the target point as a starting point (step S1407). Then, the analysis apparatus 100 determines the next search direction (step S1408) and returns to step S1404.

  On the other hand, when it is determined that the value is not equal to or greater than the threshold value (step S1405: No), the analysis apparatus 100 determines whether or not the movement amount with respect to the direction of the unevenness that has received the input has returned to 0 (step S1406). If it is determined that the movement amount has not returned to 0 (step S1406: No), the analysis apparatus 100 proceeds to step S1408.

  When it is determined that the amount of movement has returned to 0 (step S1406: Yes), the analysis apparatus 100 changes the foreground and background of the cell including the starting point to the target point (step S1409). In step S1409, the portion from the starting point to the target point is a concave portion or a convex portion. The analysis apparatus 100 determines whether the search has been performed up to the search start point (step S1410).

  If it is determined that the search has not been made to the search start point (step S1410: No), the analysis apparatus 100 returns to step S1407. When it is determined that the search has been performed up to the search start point (step S1410: Yes), the analysis apparatus 100 ends the series of processes.

  As described above, the analysis device is based on a shape in which a convex portion or a concave portion is deleted from a shape formed by a plurality of cells including elements arranged in the analysis region among the plurality of cells obtained by dividing the analysis region. The area is divided into a plurality of cells. Thereby, the number of cells can be reduced. In the case of an analysis that calculates a physical quantity for each cell as in an electromagnetic field analysis, the time required for the analysis increases as the number of cells increases. Therefore, the time required for the analysis can be reduced by reducing the number of cells. it can.

  Further, the predetermined convex portion or concave portion has a size smaller than the threshold value. Thereby, a minute convex part or a recessed part can be deleted.

  Further, when the element has a substrate, the predetermined convex portion or the concave portion is smaller than the width of the hole included in the substrate. Projections and recesses larger than the holes included in the substrate are also generated in an actual substrate and cannot be ignored. On the other hand, convex portions and concave portions smaller than the holes included in the substrate often do not occur in an actual substrate, and may have little influence on analysis accuracy. Therefore, minute convex portions or concave portions on the substrate can be deleted, and the number of cells can be reduced.

  Further, the plurality of cells including the elements are a plurality of cells including the elements in a predetermined ratio or more. Thereby, the shape of an element can be reproduced more accurately by a plurality of cells.

  Note that the analysis method described in the present embodiment can be realized by executing a prepared analysis program on a computer such as a personal computer or a workstation. This analysis program is recorded on a computer-readable recording medium such as a magnetic disk, an optical disk, or a USB (Universal Serial Bus) flash memory, and is executed by being read from the recording medium by the computer. The analysis program may be distributed via a network 310 such as the Internet.

  The following additional notes are disclosed with respect to the embodiment described above.

(Supplementary note 1)
Generating first cell information indicating a plurality of cells obtained by dividing the analysis region into a plurality based on the shape of an element arranged in the analysis region in the simulation space;
Among the plurality of cells indicated by the generated first cell information, a shape formed by a plurality of cells including the element is specified,
Identify the part of the predetermined shape included in the identified shape,
Generating second cell information indicating a plurality of cells obtained by dividing the analysis region into a plurality of shapes based on the shape from which the specified portion is deleted from the specified shape;
An analysis method characterized by executing processing.

(Additional remark 2) The analysis method of Additional remark 1 characterized by the said predetermined-shaped part being a predetermined convex part or a recessed part.

(Additional remark 3) The said predetermined convex part or recessed part is smaller than a threshold value, The analysis method of Additional remark 2 characterized by the above-mentioned.

(Additional remark 4) When the said element has a board | substrate, the said threshold value is a value based on the width | variety of the hole contained in the said board | substrate, The analysis method of Additional remark 3 characterized by the above-mentioned.

(Supplementary note 5) The supplementary notes 1 to 4, wherein the plurality of cells including the element are cells including a predetermined ratio or more of the element among the plurality of cells indicated by the generated first cell information. The analysis method as described in any one.

(Appendix 6)
Generating first cell information indicating a plurality of cells obtained by dividing the analysis region into a plurality based on the shape of an element arranged in the analysis region in the simulation space;
Among the plurality of cells indicated by the generated first cell information, a shape formed by a plurality of cells including the element is specified,
Identify the part of the predetermined shape included in the identified shape,
Generating second cell information indicating a plurality of cells obtained by dividing the analysis region into a plurality of shapes based on the shape from which the specified portion is deleted from the specified shape;
An analysis program characterized by executing processing.

(Supplementary Note 7) First cell information indicating a plurality of cells obtained by dividing the analysis region into a plurality of cells based on the shape of an element arranged in the analysis region in the simulation space is generated, and the generated first cell information indicates Among the plurality of cells, the shape formed by the plurality of cells including the element is specified, the portion of the predetermined shape included in the specified shape is specified, and the specified portion is deleted from the specified shape Generating second cell information indicating a plurality of cells obtained by dividing the analysis region into a plurality based on the formed shape;
An analysis apparatus comprising a control unit.

DESCRIPTION OF SYMBOLS 100 Analysis apparatus 101 Analysis area | region 102 Element 103 1st cell information 104 2nd cell information 401 1st production | generation part 402 1st specification part 403 2nd specification part 404 2nd generation part 411 Memory | storage part 500 Cell information c1-c36 cell

Claims (3)

Computer
Generating first cell information indicating a plurality of cells obtained by dividing the analysis region into a lattice based on the shape of an element including a substrate arranged in the analysis region in the simulation space;
Among the plurality of cells indicated by the generated first cell information, a shape formed by a plurality of cells including the element is specified,
Included in the contour is a convex portion that does not include a line segment having a length equal to or greater than a threshold based on the width of a hole included in the substrate included in the identified shape , or includes a line segment having a length equal to or greater than the threshold value in the contour. Identify no recesses ,
From the identified shape, generate second cell information indicating a plurality of cells obtained by dividing the analysis region into a plurality based on the shape from which the identified convex portion or concave portion is deleted.
An analysis method characterized by executing processing. Computer
Generating first cell information indicating a plurality of cells obtained by dividing the analysis region into a lattice based on the shape of an element including a substrate arranged in the analysis region in the simulation space;
Among the plurality of cells indicated by the generated first cell information, a shape formed by a plurality of cells including the element is specified,
Included in the contour is a convex portion that does not include a line segment having a length equal to or greater than a threshold based on the width of a hole included in the substrate included in the identified shape, or includes a line segment having a length equal to or greater than the threshold value in the contour. Identify no recesses,
From the identified shape, generate second cell information indicating a plurality of cells obtained by dividing the analysis region into a plurality based on the shape from which the identified convex portion or concave portion is deleted.
An analysis program characterized by executing processing. First cell information indicating a plurality of cells obtained by dividing the analysis region into a lattice shape is generated based on the shape of an element including a substrate arranged in the analysis region in the simulation space, and the plurality of the first cell information indicated by the generated first cell information A shape formed by a plurality of cells including the element is specified, and a line segment having a length equal to or greater than a threshold based on the width of a hole included in the substrate is included in the specified shape. A convex portion not included in the contour, or a concave portion that does not include a line segment having a length equal to or longer than the threshold value in the contour, and the specified convex portion or the concave portion is deleted from the identified shape based on the shape Generating second cell information indicating a plurality of cells obtained by dividing the analysis region into a plurality of areas;
An analysis apparatus comprising a control unit.

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