JP6587922B2 - Data generating apparatus and data generating method - Google Patents

Description

  The present invention relates to a data generation apparatus and a data generation method for generating combination data indicating a combination of a pair of terminals to be inspected when inspecting terminals between electronic components mounted on a substrate.

  As this type of data generation apparatus, a data generation apparatus disclosed by the applicant in Patent Document 1 below is known. This data generation apparatus includes an operation unit, a display unit, a storage unit, and a control unit, and a position where probing of an inspection probe can be performed on a land to which a terminal of an electronic component mounted on a circuit board is connected (probing) Position) is specified, and position data indicating the position can be generated.

  On the other hand, when the electronic component is mounted on the board body, the terminal of the electronic component is soldered to the land. For this reason, in the inspection of the circuit board on which the electronic component is mounted, it is determined whether or not there is a short circuit (short circuit inspection) due to a solder bridge between adjacent terminals in the electronic component. For this reason, when generating position data for short circuit inspection using the above-mentioned data generation device, it is necessary to specify a combination of a pair of adjacent terminals to be subjected to a short circuit inspection. In this case, in this type of data generation device, the control unit specifies a pair of adjacent terminals based on board data indicating the configuration of the electronic component. Specifically, the control unit identifies a terminal number (for example, a series of numbers assigned in advance to the terminal) specified from the board data, and sets a pair of terminals having consecutive numbers as one set. By repeating the above, the combination of a pair of terminals is specified.

JP 2010-107265 A (page 5-7, FIG. 2)

  However, the conventional data generation apparatus has the following problems to be solved. That is, in a conventional data generation device, a combination of a pair of adjacent terminals to be subjected to a short circuit inspection is specified based on the terminal numbers (a series of numbers). However, for electronic components in which a series of numbers are not attached to the terminals (discontinuous numbers are attached) and electronic components in which a symbol other than numbers is attached to the terminals, a pair of adjacent It becomes difficult to specify a combination of terminals. Also, when a series of numbers are attached to terminals that do not need to be subject to short circuit inspection, such as a pair of terminals located on both sides of the main body part across the main body part of the electronic component, short circuit inspection Terminals that do not need to be subject to short-circuit inspection are identified as short-circuit inspection targets, which may reduce inspection efficiency. In this case, for electronic components that are difficult to identify by processing with this type of data generation device, the operator manually identifies the combination of a pair of terminals while confirming the drawing. Due to human error, an incorrect combination may be identified, or a combination to be subjected to a short circuit inspection may not be identified.

  The present invention has been made in view of such a problem, and it is a main object of the present invention to provide a data generation device and a data generation method capable of generating data indicating an appropriate combination of a pair of terminals to be inspected in an electronic component. And

  In order to achieve the above object, the data generation device according to claim 1 specifies a combination of a pair of terminals to be inspected when inspecting each terminal on a board on which an electronic component having a plurality of terminals is mounted. And a processing unit for generating data indicating the combination, wherein the processing unit specifies a terminal position of each terminal on the substrate based on data indicating the configuration of the substrate. One treatment, a first strip region having a predetermined width along a predetermined first direction on the substrate, and a second having a predetermined width along a second direction orthogonal to the first direction. When a plurality of the terminal positions are arranged in at least one of the band-shaped areas, the plurality of first band-shaped areas and the plurality of second band-shaped areas are crossed. A second process for virtually setting a determination matrix in which the respective band-like regions are arranged in a matrix so that the respective terminal positions are located at intersections, and two parallel and adjacent bands in the determination matrix The interval between the regions is equal to or greater than a reference interval obtained by multiplying the minimum interval among the intervals between the terminal positions arranged in the at least one band-like region by a predetermined coefficient α (α is a positive number greater than 1). A third process for inserting a new band-shaped area parallel to each band-shaped area between the two band-shaped areas at the time, and among the intersections in the new determination matrix after the execution of the third process When each of the terminal positions is located at a pair of adjacent intersections, the terminals corresponding to the terminal positions are used as a combination of a pair of terminals to be inspected. Performing a fourth process and to.

  Further, the data generation device according to claim 2 is provided with an operation unit capable of performing a designation operation for designating a width of the band-shaped region in the data generation device according to claim 1, wherein the processing unit stores the band-shaped region in the data generation device. Each of the above processes is executed with the width designated by the designation operation.

  According to a third aspect of the present invention, there is provided a data generation method that specifies a combination of a pair of terminals to be inspected when an inspection is performed between the terminals on a board on which an electronic component having a plurality of terminals is mounted. A data generation method for generating data indicating a first processing for specifying a terminal position of each terminal on the substrate based on data indicating a configuration of the substrate, and a first direction determined in advance on the substrate The terminal position is located in at least one of the first belt-like region having a pre-designated width along the second belt-like region having a pre-designated width along the second direction orthogonal to the first direction. When the plurality of the first band-shaped regions and the plurality of the second band-shaped regions are arranged, the terminal positions are positioned at the intersections where the band-shaped regions intersect. A second process for virtually setting a determination matrix in which the respective band-shaped areas are arranged in a matrix, and an interval between two parallel and adjacent band-shaped areas in the determination matrix are arranged in the at least one band-shaped area. Each interval between the two band-like regions when the minimum interval among the intervals of the terminal positions is equal to or greater than a reference interval obtained by multiplying a predetermined coefficient α (α is a positive number greater than 1). In the third process for inserting a new band-shaped area parallel to the band-shaped area, and the pair of adjacent intersections among the intersections in the new determination matrix after the execution of the third process, the terminal positions are A fourth process is performed to identify each terminal corresponding to each terminal position as a combination of a pair of terminals to be inspected when each terminal is located.

  According to a fourth aspect of the present invention, in the data generation method according to the third aspect, the width of the band-like region is set to a width designated by a designation operation, and the processes are executed.

  In the data generation device according to claim 1 and the data generation method according to claim 3, the combination of a pair of terminals to be inspected is specified by executing the first process, the second process, the third process, and the fourth process. Thus, data indicating the combination is generated. For this reason, in this data generation device and data generation method, it is possible to specify only a combination of a pair of adjacent terminals without omission without using numbers and symbols attached to the terminals and without depending on manual work. , Data indicating the combination can be generated. Therefore, according to the data generation device and the data generation method, it is possible to reliably generate data indicating a combination indicating an appropriate combination of a pair of terminals to be inspected in an electronic component.

  Moreover, according to the data generation device of Claim 2, and the data generation method of Claim 4, by setting each width | variety of the strip | belt-shaped area | region to the width designated by designation | designated operation, and performing each process, for example, a board | substrate By designating the width of each band-like area to the length corresponding to the maximum value of the length and width error of each terminal that may occur in the process of creating data indicating the configuration of the data, it is arranged on one straight line in design Even when each terminal position of each terminal that was scheduled to be shifted on the data indicating the configuration of the board and deviates from the straight line, such a position shift is absorbed, and these terminal positions are formed in one band shape. It can be determined that they are arranged in the area. For this reason, according to this data generation device and data generation method, it is possible to reliably specify a combination of a pair of terminals to be inspected.

1 is a configuration diagram showing a configuration of a data generation device 1. FIG. 2 is a plan view of an electronic component 101a mounted on a substrate 100. FIG. 5 is a flowchart of data generation processing 50. It is the 1st explanatory view explaining the data generation method in electronic part 101a. It is the 2nd explanatory view explaining the data generation method in electronic part 101a. It is the 3rd explanatory view explaining the data generation method in electronic part 101a. It is the 4th explanatory view explaining the data generation method in electronic part 101a. 2 is a plan view of an electronic component 101b mounted on a substrate 100. FIG. It is the 1st explanatory view explaining the data generation method in electronic part 101b. It is the 2nd explanatory view explaining the data generation method in electronic part 101b. It is the 3rd explanatory view explaining the data generation method in electronic part 101b. 2 is a plan view of an electronic component 101c mounted on a substrate 100. FIG. It is the 1st explanatory view explaining the data generation method in electronic part 101c. It is the 2nd explanatory view explaining the data generation method in electronic part 101c. It is the 3rd explanatory view explaining the data generation method in electronic part 101c.

  Hereinafter, the best mode of a data generation device and a data generation method will be described with reference to the accompanying drawings.

  First, the configuration of the data generation device 1 shown in FIG. 1 as an example of the data generation device will be described. For example, the data generation device 1 is an inspection target when performing a short circuit inspection between terminals T1 to T14 (hereinafter also referred to as “terminal T” when not distinguished) of the electronic component 101a mounted on the substrate 100 illustrated in FIG. The combination data Db can be generated according to a data generation method described later by specifying a combination of a pair of adjacent terminals T. Specifically, as illustrated in FIG. 1, the data generation device 1 includes an operation unit 2, a display unit 3, a storage unit 4, and a processing unit 5.

  The operation unit 2 includes various operation switches and outputs an operation signal according to the operation. The display unit 3 displays various images according to instructions from the processing unit 5. The storage unit 4 stores substrate data Da (data indicating the configuration of the substrate) used in the data generation process 50 (see FIG. 3) executed by the processing unit 5. In this case, the board data Da includes information indicating the center (centroid) position of each terminal T in the electronic component 101a mounted on the board 100 (see FIG. 2; hereinafter, also referred to as “terminal position P”). It consists of In addition, the storage unit 4 stores the combination data Db generated in the data generation process 50.

  The processing unit 5 executes various processes according to the operation signal output from the operation unit 2. Specifically, the processing unit 5 executes the data generation processing 50 shown in FIG. 3 and performs a short-circuit inspection between the terminals T of the electronic component 101a on the substrate 100, and a pair of adjacent terminals T to be inspected. The combination data Db indicating the combination is generated.

  Next, a data generation method for generating the combination data Db using the data generation device 1 and the operation of the data generation device 1 at that time will be described with reference to the drawings. First, an example of generating combination data Db indicating a combination of a pair of adjacent terminals T to be inspected when performing a short circuit inspection between the terminals T of the electronic component 101a mounted on the substrate 100 shown in FIG. Will be described. It is assumed that the substrate data Da described above is already stored in the storage unit 4.

  First, the operation unit 2 is operated to instruct execution of the generation process of the combination data Db. At this time, the operation unit 2 outputs an operation signal, and the processing unit 5 executes the data generation process 50 shown in FIG. 3 according to the operation signal. In the data generation process 50, the processing unit 5 reads the substrate data Da from the storage unit 4 (step 51). Next, the processing unit 5 specifies the center terminal position P (coordinates on the substrate 100) of each terminal T of the electronic component 101a based on the read substrate data Da (step 52). This step 52 corresponds to the first process.

  Subsequently, the processing unit 5 includes a first band-shaped region in the substrate 100 along a predetermined first direction (the direction of the arrow X shown in FIG. 4), and a second direction orthogonal to the first direction ( It is determined whether or not a plurality of terminal positions P are arranged in at least one of the second strip regions along the direction of arrow Y shown in FIG. In this case, the band-like regions Dxa and Dxb (hereinafter also referred to as “band-like region Dx” when not distinguished from each other) correspond to the first belt-like regions, respectively. The region Dy ”is also referred to as“ strip region D ”when the strip region Dx and the strip region Dy are not distinguished from each other.

  Here, in this data generation device 1, it is possible to arbitrarily designate and set the width and length of each band-like region D by operating the operation unit 2. In this case, the length and width of each terminal T, which was scheduled to be arranged on a straight line in the design with a plurality of terminals T having the same length and width, is the process of creating the substrate data Da (for example, with drawing software). There may be slight differences in the process of drawing. In such a case, the terminal position P of each terminal T shifts and deviates from the straight line without being arranged on one straight line. In order to absorb such misalignment, as an example, the length corresponding to the maximum value of the error of the length of each terminal T (length in the vertical direction in FIG. 2) that may occur in the process of creating the substrate data Da The width of the band-shaped region Dx is defined by the length, and the width of the band-shaped region Dy is defined by a length corresponding to the maximum value of the error of the width of each terminal T (the length in the left-right direction in FIG. 2). Moreover, the length of each strip | belt-shaped area | region D is prescribed | regulated as an example slightly longer than the length of the electronic component 101a. 4, 5, 9, and 13, the width of the band-like region D is illustrated wider than the actual width.

  In this case, when a plurality of terminal positions P are not arranged in any of the belt-like regions D, there is a possibility that there is no pair of adjacent terminals T to be inspected. For this reason, when the processing unit 5 determines in step 53 that a plurality of terminal positions P are not arranged in any of the belt-like regions D, the processing unit 5 displays that effect on the display unit 3 and ends the data generation processing 50. .

  On the other hand, when it is determined in step 53 that a plurality of terminal positions P are arranged in at least one of the belt-like region Dx and the belt-like region Dy, the processing unit 5, as shown in FIG. And a determination matrix Ma in which the band regions D are arranged in a matrix so that the terminal positions P are located at the intersections C where the band regions D intersect with each other. (Step 54). In this case, steps 53 and 54 correspond to the second process.

  Next, the processing unit 5 determines that the plurality of terminal positions P are arranged in step 53 described above (as shown in FIG. 4, in this example, the strip regions Dxa and Dxb and the strip regions Dya to Dyg). (In this example, 6 intervals (total 12) in the band-like regions Dxa and Dxb, and 1 interval (total 7) in the band-like regions Dya to Dyg, respectively). ) Is specified (in this example, the lower left interval Sp in the figure). Subsequently, the processing unit 5 calculates a reference interval Ss (see FIG. 5) obtained by multiplying the specified minimum interval Sp by a coefficient α that is a positive number larger than 1 determined in advance (step 55). Here, the coefficient α is a coefficient α for excluding the combination of two terminals having a wider interval than the interval between the two narrowest terminals from the combination to be inspected. More combinations are excluded from the target, and fewer combinations are excluded from the inspection target as the coefficient α is larger. In this case, it is preferable to define the coefficient α within a range larger than 1 and less than 2, and in this example, the coefficient α is defined as 1.5.

  Next, the processing unit 5 determines that the interval Sd between two parallel and adjacent belt-like regions D in the determination matrix Ma (that is, the interval between the adjacent belt-like regions Dx and the interval between the adjacent belt-like regions Dy) is larger than the reference interval Ss. It is determined whether or not the belt-like region D is present (step 56). In this case, as shown in FIG. 4, when it is determined that there are two belt-like regions Dxa and Dxb that are separated by the reference interval Ss or more, the processing unit 5 determines that 2 as shown in FIG. A new strip region Dxc parallel to each strip region Dxa, Dxb is inserted between the two strip regions Dxa, Dxb (step 57). In this case, steps 56 and 57 correspond to the third process. When it is determined in step 56 that there is no band-like region D that is separated by the reference interval Ss or more, step 58 described below is executed without executing step 57.

  Subsequently, the processing unit 5 is adjacent to each other in the state where the band-like region D does not exist among the intersections C of the band-like regions D in the new determination matrix Ma after the execution of the third process. A pair of intersecting portions C satisfying the condition that the terminal position P is located at the position are extracted (step 58). In this determination matrix Ma, intersections C are arranged as shown in FIG. In addition, in the same figure, it has shown that the terminal position P is located in each intersection C where the code | symbol was described, and each code | symbol has shown the code | symbol of the terminal T corresponding to the terminal position P. FIG. In this case, this step 58 corresponds to the fourth process.

  Next, as shown in FIG. 7, the processing unit 5 is a combination of a pair of terminals T whose test targets are terminals T respectively corresponding to the pair of terminal positions P located at the extracted pair of intersections C. The combination data Db that identifies and indicates the combination is generated (step 59). In this case, in the determination matrix Ma for the electronic component 101a, as shown in FIG. 6, there are 12 pairs of intersecting portions C that satisfy the condition that the terminal positions P are adjacent to each other and located on both sides. Therefore, as illustrated in FIG. 7, the processing unit 5 specifies 12 combinations as a combination of a pair of terminals T to be inspected, and generates combination data Db indicating the combination. Subsequently, the processing unit 5 stores the combination data Db in the storage unit 4 (step 60), and ends the data generation processing 50. As described above, by executing the data generation process 50, only the combination of a pair of adjacent terminals T is leaked without using the numbers and symbols attached to the terminals T and without depending on manual work. It is possible to generate the combination data Db by specifying the combination.

  Next, when performing a short circuit inspection between the terminals A1 to J10 (hereinafter also referred to as “terminal T” when not distinguished) of the electronic component 101b (for example, BGA socket) mounted on the substrate 100 shown in FIG. An example of generating combination data Db indicating a combination of a pair of adjacent terminals T to be inspected will be described. It is assumed that the substrate data Da described above is already stored in the storage unit 4. Moreover, in the following description, the overlapping description is abbreviate | omitted about the same content as the content demonstrated in the example which produces | generates the combination data Db about the above-mentioned electronic component 101a.

  First, the operation unit 2 is operated to instruct execution of the generation process, and in response to this, the processing unit 5 executes the data generation process 50 shown in FIG. In this case, the processing unit 5 executes the above-described steps 51 and 52 to identify the center terminal position P of each terminal T of the electronic component 101b.

  Next, as shown in FIG. 9, the processing unit 5 performs strip-like regions Dxh to Dxq (corresponding to the first strip-like region) along the first direction (the direction of the arrow X). )) And at least one of the belt-like regions Dyh to Dyq (corresponding to the second belt-like region: hereinafter referred to as “band-like region Dy” when not distinguished) along the second direction (the direction of arrow Y). It is determined whether or not a plurality of terminal positions P are arranged (step 53).

  In this case, when the processing unit 5 determines in step 53 that a plurality of terminal positions P are not arranged in any of the belt-like regions D, the processing unit 5 displays that effect on the display unit 3 and ends the data generation processing 50. .

  On the other hand, when it is determined in step 53 that a plurality of terminal positions P are arranged in at least one of the belt-like region Dx and the belt-like region Dy, the processing unit 5, as shown in FIG. And a determination matrix Mb in which the belt-like regions D are arranged in a matrix so that the terminal positions P are located at the intersections C where the belt-like regions D intersect with each other. (Step 54: “Ma” in FIG. 3 shall be read as “Mb”).

  Subsequently, the processing unit 5 specifies the minimum interval (lower left interval Sp in FIG. 9) among the intervals of the terminal positions P arranged in each band-like region D, and then specifies the specified minimum interval Sp. A reference interval Ss (see FIG. 5) obtained by multiplying by 1.5 is calculated (step 55). Subsequently, the processing unit 5 determines whether or not there is a band-like region D in which the interval between the adjacent band-like regions Dx and the interval between the adjacent band-like regions Dy are separated by the reference interval Ss or more (Step 56).

  In this case, as shown in FIG. 9, since there is no band-like region D that is separated by more than the reference interval Ss, the processing unit 5 executes step 58 without executing step 57 and is adjacent to each other. A pair of intersections C that satisfy the condition that the terminal position P is located on both sides are extracted. In this case, in the determination matrix Mb, the intersections C are arranged as shown in FIG. In addition, in the same figure, it has shown that the terminal position P is located in each intersection C where the code | symbol was described, and each code | symbol has shown the code | symbol of the terminal T corresponding to the terminal position P. FIG.

  Next, as shown in FIG. 11, the processing unit 5 is a combination of a pair of terminals T whose inspection targets are terminals T respectively corresponding to the pair of terminal positions P located at each of the extracted pair of intersections C. The combination data Db that identifies and indicates the combination is generated (step 59). In this case, in the determination matrix Mb for the electronic component 101b, there are 342 pairs of intersecting portions C that satisfy the condition that the terminal positions P are adjacent to each other and are located on both sides. As shown in the figure, 342 combinations are identified as a combination of a pair of terminals T to be inspected, and combination data Db indicating the combination is generated. Subsequently, the processing unit 5 stores the combination data Db in the storage unit 4 (step 60), and ends the data generation processing 50.

  Next, the respective terminals K1 to R4 (hereinafter also referred to as “terminal T” when not distinguished) of the electronic component 101c (for example, a BGA socket in which terminals are arranged in the form of dust) mounted on the substrate 100 shown in FIG. An example of generating combination data Db indicating a combination of a pair of adjacent terminals T to be inspected when performing a short-circuit inspection between them will be described. It is assumed that the substrate data Da described above is already stored in the storage unit 4. Moreover, in the following description, the overlapping description is abbreviate | omitted about the same content as the content demonstrated in the example which produces | generates the combination data Db about electronic component 101a, 101b mentioned above.

  First, the operation unit 2 is operated to instruct execution of the generation process, and in response to this, the processing unit 5 executes the data generation process 50 shown in FIG. In this case, the processing unit 5 executes the above-described steps 51 and 52 to identify the center terminal position P of each terminal T of the electronic component 101c.

  Next, as shown in FIG. 13, the processing unit 5 performs strip-like regions Dxr to Dxy (corresponding to the first strip-like region) along the first direction (the direction of the arrow X). )) And at least one of the belt-like regions Dyr to Dyy (corresponding to the second belt-like region: hereinafter referred to as “band-like region Dy” when not distinguished) along the second direction (the direction of arrow Y). It is determined whether or not a plurality of terminal positions P are arranged (step 53).

  In this case, when the processing unit 5 determines in step 53 that a plurality of terminal positions P are not arranged in any of the belt-like regions D, the processing unit 5 displays that effect on the display unit 3 and ends the data generation processing 50. .

  On the other hand, when it is determined in step 53 that a plurality of terminal positions P are arranged in at least one of the belt-like region Dx and the belt-like region Dy, the processing unit 5, as shown in FIG. And a determination matrix Mc in which each band region D is arranged in a matrix so that each terminal position P is located at an intersection C where each band region D intersects. (Step 54: “Ma” in FIG. 3 shall be read as “Mc”).

  Subsequently, the processing unit 5 specifies the minimum interval (lower left interval Sp in FIG. 13) among the intervals of the terminal positions P arranged in each strip-like region D, and then specifies the specified minimum interval. A reference interval Ss (see the figure) obtained by multiplying Sp by a coefficient 1.5 is calculated (step 55). Subsequently, the processing unit 5 determines whether or not there is a band-like region D in which the interval between the adjacent band-like regions Dx and the interval between the adjacent band-like regions Dy are separated by the reference interval Ss or more (Step 56).

  In this case, as shown in FIG. 13, since there is no band-like region D that is separated by the reference interval Ss or more, the processing unit 5 executes step 58 without executing step 57 and is adjacent to each other. A pair of intersections C that satisfy the condition that the terminal position P is located on both sides are extracted. In this case, in the determination matrix Mc, the intersections C are arranged as shown in FIG. In addition, in the same figure, it has shown that the terminal position P is located in each intersection C where the code | symbol was described, and each code | symbol has shown the code | symbol of the terminal T corresponding to the terminal position P. FIG.

  Next, as shown in FIG. 15, the processing unit 5 is a combination of a pair of terminals T whose inspection targets are terminals T respectively corresponding to a pair of terminal positions P located at each extracted pair of intersections C. The combination data Db that identifies and indicates the combination is generated (step 59). In this case, in the determination matrix Mc for the electronic component 101c, there are 49 pairs of intersecting portions C that satisfy the condition that the terminal positions P are adjacent to each other and are located on both sides. As shown in the figure, 49 combinations are identified as combinations of a pair of terminals T to be inspected, and combination data Db indicating the combinations is generated. Subsequently, the processing unit 5 stores the combination data Db in the storage unit 4 (step 60), and ends the data generation processing 50.

  As described above, in the data generation device 1 and the data generation method, the combination of the pair of terminals T to be inspected by executing the first process, the second process, the third process, and the fourth process is specified. Is generated. For this reason, in this data generation device 1 and the data generation method, the combination of a pair of adjacent terminals T is not leaked without using the numbers and symbols attached to the terminals T and without depending on manual work. In particular, the combination data Db can be generated. Therefore, according to the data generation device 1 and the data generation method, the combination data Db indicating an appropriate combination of the pair of terminals T to be inspected in the electronic components 101a to 101c can be reliably generated.

  In addition, according to the data generation device 1 and the data generation method, for example, this occurs in the process of creating the substrate data Da by executing the respective processes by setting the width of the belt-like region D to the width specified by the specifying operation. By defining the width of each band-like region D to a length corresponding to the maximum length or width error of each terminal T, each terminal T that was scheduled to be arranged on one straight line in design. Even when each terminal position P is displaced on the substrate data Da and deviates from the straight line, such a position displacement is absorbed and it is determined that these terminal positions P are arranged in one band-like region D. can do. For this reason, according to this data generation device 1 and the data generation method, the combination of a pair of terminals which should be examined can be specified certainly.

  Note that the data generation device and the data generation method are not limited to the configuration and method described above. For example, the above-described electronic components 101a to 101c that are targets of creation of the combination data Db are merely examples, and the combination data Db is generated using the data generation device 1 and the data generation method described above for other various electronic components. Can be created.

  In addition, although the example in which the terminal position P at the center of the terminal T is specified as the terminal position has been described above, each terminal such as the position of the distal end portion of the terminal T, the position of the proximal end portion of the terminal T, the side portion of the terminal T, A configuration and a method for specifying the same part in T as the position of the terminal can also be adopted.

DESCRIPTION OF SYMBOLS 1 Data generation apparatus 2 Operation part 4 Memory | storage part 5 Processing part 100 Board | substrate 101a-101c Electronic component C Intersection part Da Board | substrate data Db Combination data Dxa, Dxb, Dxh-Dxy, Dya-Dyy Band-like area | region Ma, Mb, Mc Determination matrix P position Sd interval Sp interval T terminal

Claims (4)

Data including a processing unit that identifies a combination of a pair of terminals to be inspected when inspecting between the terminals on a board on which an electronic component having a plurality of terminals is mounted, and generates data indicating the combination A generating device,
The processing unit includes a first process for specifying a terminal position of each terminal on the board based on data indicating the configuration of the board, and a predetermined width along a predetermined first direction on the board. When a plurality of the terminal positions are arranged in at least one of the first belt-like region and the second belt-like region having a predetermined width along the second direction orthogonal to the first direction, Each of the band-like regions is arranged in a matrix so that each terminal position is located at an intersection formed by a plurality of the first band-like regions and a plurality of the second band-like regions. Each terminal position in which a second process for virtually setting a determination matrix and an interval between two parallel and adjacent strip regions in the determination matrix are arranged in the at least one strip region A new interval parallel to each of the band-like regions between the two band-like regions when the minimum interval is equal to or greater than a reference interval obtained by multiplying a predetermined interval α by a predetermined coefficient α (α is a positive number greater than 1). When the terminal positions are respectively located at a pair of intersecting portions adjacent to each other in the intersecting portions in the third process for inserting a strip-shaped region and a new determination matrix after execution of the third processing A data generation device that executes a fourth process that specifies each terminal corresponding to each terminal position as a combination of a pair of terminals to be inspected. An operation unit capable of performing a designation operation for designating a width of the belt-like region;
The data generation apparatus according to claim 1, wherein the processing unit sets the band-like area to a width specified by the specifying operation and executes the processes. A data generation method for identifying a combination of a pair of terminals to be inspected when inspecting between terminals on a board on which an electronic component having a plurality of terminals is mounted, and generating data indicating the combination ,
A first process for specifying the terminal position of each terminal on the board based on data indicating the configuration of the board, and a first band with a predetermined width along a predetermined first direction on the board When a plurality of the terminal positions are arranged in at least one of the second belt-like regions having a predetermined width along the second direction orthogonal to the region and the first direction, a plurality of the first positions are arranged. A determination matrix is formed by arranging each band-like area in a matrix so that each terminal position is located at an intersection where the band-like areas intersect each other and the plurality of second band-like areas intersect with each other. Of the interval between the terminal positions arranged in the at least one band-shaped region, and the second processing to be set automatically and the interval between the two parallel and adjacent band-shaped regions in the determination matrix When a minimum interval is not less than a reference interval obtained by multiplying a predetermined coefficient α (α is a positive number greater than 1), a new strip region parallel to each strip region is inserted between the two strip regions. Each terminal position when the terminal position is located at a pair of mutually adjacent intersections among the intersections in the third process to be performed and the new determination matrix after execution of the third process. A data generation method for executing a fourth process that specifies each terminal corresponding to each of the terminals as a combination of a pair of terminals to be inspected.   The data generation method according to claim 3, wherein the processing is executed by setting the width of the band-like region to a width designated by a designation operation.

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