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JP6607447B2 - Method for measuring polychlorinated biphenyl content by fluorescent X-ray - Google Patents
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JP6607447B2 - Method for measuring polychlorinated biphenyl content by fluorescent X-ray - Google Patents

Method for measuring polychlorinated biphenyl content by fluorescent X-ray Download PDF

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JP6607447B2
JP6607447B2 JP2016084721A JP2016084721A JP6607447B2 JP 6607447 B2 JP6607447 B2 JP 6607447B2 JP 2016084721 A JP2016084721 A JP 2016084721A JP 2016084721 A JP2016084721 A JP 2016084721A JP 6607447 B2 JP6607447 B2 JP 6607447B2
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哲也 石川
将稔 宮坂
暢彦 宮前
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本発明は、蛍光X線を利用して、ポリ塩化ビフェニルに汚染されて保管されているポリ塩化ビフェニル廃棄物のポリ塩化ビフェニル含有濃度を簡便に測定する、蛍光X線によるポリ塩化ビフェニル含有濃度測定方法に関する。   The present invention simply measures the polychlorinated biphenyl content concentration of polychlorinated biphenyl waste stored in a contaminated polychlorinated biphenyl using fluorescent X-ray, and measures the polychlorinated biphenyl content concentration by fluorescent X-ray. Regarding the method.

ポリ塩化ビフェニルは、電気絶縁性に優れており、化学的に安定であったため、過去には多くの分野で使用されていた。一方、その毒性が明らかになった後は、製造が禁止されたが、それまでに既に、多くの量が製造及び輸入され、多種多様な形態で使用されてきた。ポリ塩化ビフェニルを含む製品は、現在でも使用されているものもある。一方、使用が終了して廃棄物となった場合は、ポリ塩化ビフェニル廃棄物の適正な処理の推進に関する特別措置法に基づき、保管事業者が特別管理産業廃棄物として適正に保管し所轄行政に毎年届け出ることが義務付けられている。また、2027年3月までに保管事業者が適正保管しているポリ塩化ビフェニル廃棄物の適正な処理を完了することが法律で定められており、速やかな処理が求められる。   Polychlorinated biphenyls have been used in many fields in the past because of their excellent electrical insulation and chemical stability. On the other hand, after its toxicity became apparent, production was banned, but so far a large amount has already been produced and imported and used in a wide variety of forms. Some products containing polychlorinated biphenyls are still in use today. On the other hand, if the waste is used after being used, the storage company properly stores the waste as specially controlled industrial waste based on the Special Measures Law concerning the promotion of appropriate disposal of polychlorinated biphenyl waste. It is obliged to report every year. Moreover, the law stipulates that the proper disposal of polychlorinated biphenyl waste properly stored by the storage company by March 2027 is required, and prompt processing is required.

2012年8月にポリ塩化ビフェニル廃棄物のうち、低濃度ポリ塩化ビフェニル廃棄物という新たな区分が、法律により定められた。低濃度ポリ塩化ビフェニル含有汚染物は、
(1)汚泥、紙くず、木くず又は繊維くずのうち、当該汚泥、紙くず、木くず又は繊維くずに塗布され、又は染み込んだポリ塩化ビフェニルの量が汚泥、紙くず、木くず又は繊維くず1キログラムにつき5,000ミリグラム以下のもの、
(2)廃プラスチック類のうち、当該廃プラスチック類に付着し、又は封入されているポリ塩化ビフェニルの量が廃プラスチック類1キログラムにつき5,000ミリグラム以下のもの、
(3)金属くず、陶磁器くず又は工作物の新築、改築若しくは除去に伴って生じたコンクリートの破片その他これに類する不要物のうち、当該金属くず等に付着し、又は封入されているポリ塩化ビフェニルの量が金属くず等に付着し、又は封入されている物1キログラムにつき5,000ミリグラム以下のもの、
などとして定められている。
In August 2012, a new category of polychlorinated biphenyl waste, low-concentration polychlorinated biphenyl waste, was established by law. Contaminants containing low concentrations of polychlorinated biphenyl
(1) Of the sludge, paper waste, wood waste or fiber waste, the amount of polychlorinated biphenyl applied or soaked in the sludge, paper waste, wood waste or fiber waste is 5,000 per kilogram of sludge, paper waste, wood waste or fiber waste. Less than milligrams,
(2) Among waste plastics, the amount of polychlorinated biphenyl adhered to or enclosed in the waste plastics is 5,000 milligrams or less per kilogram of waste plastics,
(3) Polychlorinated biphenyls that adhere to or are enclosed in metal scrap, ceramic scraps, concrete debris generated by construction, renovation or removal of workpieces, and other unnecessary items similar to this 5,000 milligrams or less per kilogram of the substance attached to metal scraps or encapsulated,
It is determined as such.

また、測定方法に関しては、低濃度ポリ塩化ビフェニル含有廃棄物に関する測定方法という、国が定めるガイドラインにより測定するように明確に定められている。   In addition, the measurement method is clearly defined to be measured in accordance with the national guidelines of the measurement method for waste containing low-concentration polychlorinated biphenyl.

このようにして、ポリ塩化ビフェニル廃棄物の区分が新たに必要となり、適正保管しているポリ塩化ビフェニル廃棄物の一部をサンプリングし、分析メーカに、国が定める低濃度PCB含有廃棄物に関する測定方法により測定する必要が生じた。適正保管している密閉容器から分析するための試料のサンプリング又は当該試料を分析メーカに送るなどの手段により移動させる必要があり、さらに分析結果が判明するまでに2〜3週間の時間がかかっていた。   In this way, a new classification of polychlorinated biphenyl waste is required, a part of the polychlorinated biphenyl waste that is properly stored is sampled, and the manufacturer is measured for the low-concentration PCB-containing waste determined by the country. It became necessary to measure by the method. It is necessary to move the sample by means such as sampling the sample for analysis from the sealed container that is properly stored or sending the sample to the analysis maker, and it takes 2-3 weeks for the analysis result to be revealed. It was.

そこで、保管場所において簡便な方法で、一次区分として保管しているポリ塩化ビフェニル廃棄物のポリ塩化ビフェニル廃棄物のある程度の含有濃度を短時間で測定できれば、区分する上での目安ができると思われる。また、保管事業者にとっては、厳重に管理すべきポリ塩化ビフェニル廃棄物の移動は、行政への届出が必要であることなど、制約がある中で、保管場所で簡易にポリ塩化ビフェニル廃棄物のある程度の含有濃度が推測できれば、利便性が高いと思われる。   Therefore, if a certain level of polychlorinated biphenyl waste content of polychlorinated biphenyl waste stored as a primary classification can be measured in a short time by a simple method at the storage location, it will be possible to provide a standard for classification. It is. In addition, for storage operators, the movement of polychlorinated biphenyl waste that should be strictly managed must be notified to the government. If a certain level of concentration can be estimated, the convenience will be high.

その上で、適正保管しているポリ塩化ビフェニル廃棄物から試料をサンプリングし、分析メーカにより国が定める低濃度ポリ塩化ビフェニル含有廃棄物に関する測定方法により、含有濃度を正確に分析する。その分析結果を基に、5,000ミリグラム以下かどうかを測定し、低濃度ポリ塩化ビフェニル廃棄物に該当するかどうか判断することができる。   In addition, samples are sampled from polychlorinated biphenyl waste that is properly stored, and the content concentration is accurately analyzed by a measurement method for low-concentration polychlorinated biphenyl-containing waste established by the country by the analysis manufacturer. Based on the analysis result, it can be determined whether or not it is less than 5,000 milligrams, and whether or not it corresponds to a low concentration polychlorinated biphenyl waste.

前記の課題に鑑みて、特許文献1には、ポリ塩化ビフェニルを含む被検体にX線を照射し、発生する蛍光X線の強度から被検体中の塩素量を導出することが記載されている。   In view of the above problems, Patent Document 1 describes that a specimen containing polychlorinated biphenyl is irradiated with X-rays, and the amount of chlorine in the specimen is derived from the intensity of the generated fluorescent X-rays. .

また、特許文献2には、採取した試料を炭化させ、n−ヘキサンを用いて炭化した試料から有機ハロゲン化物を抽出し、n−ヘキサン中の有機ハロゲン化物を蛍光X線測定法で測定する有機ハロゲン化物計測方法が記載されている。   Patent Document 2 discloses an organic material in which a collected sample is carbonized, an organic halide is extracted from the carbonized sample using n-hexane, and the organic halide in n-hexane is measured by a fluorescent X-ray measurement method. A halide measurement method is described.

特開2006−118943号公報JP 2006-118943 A 特開2002−350374号公報JP 2002-350374 A

しかしながら、特許文献1に記載の測定方法は、複数色の光の輝度を色別に検出して蛍光X線の強度を検出するために、センサーとしてイメージインテンシファイアを用いており、装置のサイズが大きくなり、保管場所での使用に適しているとは言えない。また、被検体として、主に液体を測定対象としているため、固体には適用しにくく、測定対象が限定される。   However, the measuring method described in Patent Document 1 uses an image intensifier as a sensor in order to detect the intensity of fluorescent X-rays by detecting the luminance of light of a plurality of colors, and the size of the apparatus is small. It is large and cannot be said to be suitable for storage. Moreover, since the liquid is mainly used as the object to be measured, it is difficult to apply to the solid, and the object to be measured is limited.

特許文献2は、変圧器等の絶縁油等のポリ塩化ビフェニル含有量を簡易に測定できる有機ハロゲン化物計測装置に関するものである。しかしながら、特許文献2では、被測定物を炭化させたのち、有機溶剤を用いて炭化物中のポリ塩化ビフェニルを抽出し、抽出物の塩素のX線強度を測定するというものであって、炭化及び抽出などの前処理工程を多く必要としていた。   Patent Document 2 relates to an organic halide measuring device that can easily measure the content of polychlorinated biphenyls such as insulating oil such as a transformer. However, in Patent Document 2, after carbonizing the object to be measured, polychlorinated biphenyl in the carbide is extracted using an organic solvent, and the X-ray intensity of chlorine in the extract is measured. Many pretreatment steps such as extraction were required.

本発明は、測定対象が限定されずかつ前処理工程も必要がなく、保管場所において簡便な方法で、一次区分として保管しているポリ塩化ビフェニル廃棄物のポリ塩化ビフェニルの含有濃度を短時間で測定できる、蛍光X線によるポリ塩化ビフェニル含有濃度測定方法の提供を目的としている。   In the present invention, the measurement target is not limited and no pretreatment process is required, and the content of polychlorinated biphenyl in the polychlorinated biphenyl waste stored as the primary classification is reduced in a short time by a simple method at the storage location. The object is to provide a method for measuring the concentration of polychlorinated biphenyl using fluorescent X-rays.

本発明の一態様の蛍光X線によるポリ塩化ビフェニル含有濃度測定法は、
複数の種類のポリ塩化ビフェニル異性体を含む被検体中のポリ塩化ビフェニル濃度を平準化することで測定試料を作成する工程と、
X線源からのX線を前記測定試料に照射して、前記測定試料から発生する塩素固有の蛍光X線を半導体検出器で測定して塩素濃度を測定する工程と、
前記測定試料のうち、同一の種類の被検体により作成され、異なる塩素濃度を持つ測定試料に対し、前記蛍光X線測定で測定した塩素濃度と、GC−MS手法により測定したポリ塩化ビフェニル濃度との間で相関関係を確認し、確認した相関関係のデータに基づき、前記測定試料中のポリ塩化ビフェニル濃度を導出して、ポリ塩化ビフェニル含有濃度を測定する工程と、
を含み、
前記被検体中の前記ポリ塩化ビフェニル濃度を平準化することにより前記測定試料を作成する工程が、
前記被検体の最も長い部分の寸法が0.5mm以下になるように微細化して前記測定試料を作成する工程を含む。
The method for measuring polychlorinated biphenyl-containing concentration by fluorescent X-ray according to one aspect of the present invention is as follows.
Creating a measurement sample by leveling the polychlorinated biphenyl concentration in a specimen containing multiple types of polychlorinated biphenyl isomers;
Irradiating the measurement sample with X-rays from an X-ray source, measuring chlorine-specific fluorescent X-rays generated from the measurement sample with a semiconductor detector, and measuring the chlorine concentration;
Among the measurement samples, the chlorine concentration measured by the fluorescent X-ray measurement and the polychlorinated biphenyl concentration measured by the GC-MS method for the measurement samples having different chlorine concentrations prepared by the same type of analyte. And confirming the correlation between them, deriving the polychlorinated biphenyl concentration in the measurement sample based on the confirmed correlation data, and measuring the polychlorinated biphenyl-containing concentration,
Only including,
Creating the measurement sample by leveling the polychlorinated biphenyl concentration in the specimen,
Wherein the step of including the dimension of the longest portion of the subject to create the measurement sample as is miniaturized becomes 0.5mm or less.

本発明の他の態様の蛍光X線によるポリ塩化ビフェニル含有濃度測定法は、前記態様において、
前記塩素固有の蛍光X線を前記半導体検出器で測定して前記塩素濃度を測定する工程と、前記ポリ塩化ビフェニル濃度を導出して前記ポリ塩化ビフェニル含有濃度を測定する工程との間に、
前記測定試料のうち、前記蛍光X線測定で得られた塩素濃度が樹脂判定用閾値以上の値を取り、なおかつ、前記測定試料が樹脂であるか否かを判定する判定工程を備え、
前記判定工程で、前記蛍光X線測定で得られた塩素濃度が前記樹脂判定用閾値以上の値を取り、なおかつ、前記測定試料が樹脂であると判定した場合には、前記ポリ塩化ビフェニル含有濃度を測定する工程を実施せずに、測定試料全体におけるPCB含有濃度測定工程を行う一方、
前記判定工程で、前記蛍光X線測定で得られた塩素濃度が前記樹脂判定用閾値以上の値ではないか、又は、前記測定試料が樹脂ではないとき、前記ポリ塩化ビフェニル含有濃度を測定する工程を実施する。
According to another aspect of the present invention, the method for measuring a polychlorinated biphenyl-containing concentration by fluorescent X-rays in the above-described embodiment,
Between the step of measuring the chlorine concentration by measuring the chlorine-specific fluorescent X-ray with the semiconductor detector and the step of deriving the polychlorinated biphenyl concentration and measuring the polychlorinated biphenyl-containing concentration,
Among the measurement samples, the chlorine concentration obtained by the fluorescent X-ray measurement takes a value equal to or higher than a resin determination threshold, and further includes a determination step of determining whether the measurement sample is a resin,
In the determination step, when the chlorine concentration obtained by the fluorescent X-ray measurement takes a value equal to or greater than the resin determination threshold, and when the measurement sample is determined to be resin, the polychlorinated biphenyl-containing concentration While performing the PCB content concentration measurement process in the entire measurement sample without performing the process of measuring
A step of measuring the polychlorinated biphenyl-containing concentration when the chlorine concentration obtained by the fluorescent X-ray measurement in the determination step is not a value equal to or higher than the resin determination threshold value or the measurement sample is not a resin. To implement.

本発明の他の態様の蛍光X線によるポリ塩化ビフェニル含有濃度測定法は、前記形態において、
前記ポリ塩化ビフェニル濃度を導出して前記ポリ塩化ビフェニル含有濃度を測定する工程は、
前記測定試料のうち、同一の種類の被検体により作成され、異なる塩素濃度を持つ測定試料に対し、前記蛍光X線測定で測定した塩素濃度と、GC−MS手法により測定したポリ塩化ビフェニル濃度との間で相関関係を確認し、確認した相関関係を、原点を通る直線で近似することにより、変換係数を導出する工程と、
前記蛍光X線測定で得られた塩素濃度のデータに前記変換係数を乗ずることにより、前記測定試料中のポリ塩化ビフェニル濃度を導出して、ポリ塩化ビフェニル含有濃度を測定する工程とを備え、
前記ポリ塩化ビフェニル濃度を導出する工程は、
前記蛍光X線測定で得られた塩素濃度をX(mg/kg)とし、前記ポリ塩化ビフェニルの濃度をY(mg/kg)とし、前記変換係数を、前記測定試料の種別により異なる定数としてAとするとき、
下記式(1)に基づいて、前記測定試料中の前記ポリ塩化ビフェニル濃度を導出する。
According to another aspect of the present invention, there is provided a method for measuring a polychlorinated biphenyl-containing concentration by fluorescent X-ray, in the above-described form,
Deriving the polychlorinated biphenyl concentration and measuring the polychlorinated biphenyl-containing concentration,
Among the measurement samples, the chlorine concentration measured by the fluorescent X-ray measurement and the polychlorinated biphenyl concentration measured by the GC-MS method with respect to the measurement samples prepared by the same type of analyte and having different chlorine concentrations Deriving conversion coefficients by approximating the confirmed correlation with a straight line passing through the origin, and
A step of deriving a polychlorinated biphenyl concentration in the measurement sample by multiplying the chlorine concentration data obtained by the fluorescent X-ray measurement by the conversion coefficient, and measuring a polychlorinated biphenyl-containing concentration,
The step of deriving the polychlorinated biphenyl concentration comprises:
The chlorine concentration obtained by the fluorescent X-ray measurement is X (mg / kg), the polychlorinated biphenyl concentration is Y (mg / kg), and the conversion coefficient is a constant that varies depending on the type of the measurement sample. And when
Based on the following formula (1), the polychlorinated biphenyl concentration in the measurement sample is derived.

Y=A・X ……(1)   Y = A · X (1)

本発明の他の態様の蛍光X線によるポリ塩化ビフェニル含有濃度測定法は、前記形態において、
プラスチックフィルムを前記測定試料と前記半導体検出器との間に保護フィルムとして設け、
前記ポリ塩化ビフェニル濃度の測定ごとに前記プラスチックフィルムを取り換える。
According to another aspect of the present invention, there is provided a method for measuring a polychlorinated biphenyl-containing concentration by fluorescent X-ray, in the above-described form,
A plastic film is provided as a protective film between the measurement sample and the semiconductor detector,
The plastic film is replaced every time the polychlorinated biphenyl concentration is measured.

本発明の前記態様によれば、測定対象が限定されずかつ前処理工程も必要がなく、保管場所において簡便な方法で、一次区分として保管しているポリ塩化ビフェニル廃棄物のポリ塩化ビフェニル廃棄物の含有濃度を短時間で測定する方法を提供することができる。   According to the aspect of the present invention, the polychlorinated biphenyl waste of the polychlorinated biphenyl waste stored as the primary division is not limited and the pretreatment process is not necessary, and is stored in the storage place as a primary method. It is possible to provide a method for measuring the content concentration of saponin in a short time.

本発明の一実施形態の蛍光X線によるポリ塩化ビフェニル含有濃度測定方法を示すフローチャートThe flowchart which shows the polychlorinated biphenyl containing concentration measuring method by the fluorescent X ray of one Embodiment of this invention 本発明の一実施形態の蛍光X線によるポリ塩化ビフェニル含有濃度測定方法を実施するための装置のブロック図The block diagram of the apparatus for enforcing the polychlorinated biphenyl containing concentration measuring method by fluorescent X-rays of one embodiment of the present invention 本発明の実施例1における蛍光X線分析計を用いて測定したPCB濃度とGC−MS手法で測定したPCB濃度との相関性を示すグラフThe graph which shows the correlation with the PCB density | concentration measured using the fluorescent X ray analyzer in Example 1 of this invention, and the PCB density | concentration measured by GC-MS technique 本発明の実施例2における蛍光X線分析計を用いて測定したPCB濃度とGC−MS手法で測定したPCB濃度との相関性を示すグラフThe graph which shows the correlation with the PCB density | concentration measured using the fluorescent X ray analyzer in Example 2 of this invention, and the PCB density | concentration measured by GC-MS technique 本発明の実施例3における蛍光X線分析計を用いて測定したPCB濃度とGC−MS手法で測定したPCB濃度との相関性を示すグラフThe graph which shows the correlation with the PCB density | concentration measured using the fluorescent X ray analyzer in Example 3 of this invention, and the PCB density | concentration measured by GC-MS technique 本発明の実施例4における蛍光X線分析計を用いて測定したPCB濃度とGC−MS手法で測定したPCB濃度との相関性を示すグラフThe graph which shows the correlation of PCB density | concentration measured using the fluorescent X ray analyzer in Example 4 of this invention, and PCB density | concentration measured by the GC-MS method 本発明の他の実施形態の蛍光X線によるポリ塩化ビフェニル含有濃度測定方法を示すフローチャートThe flowchart which shows the polychlorinated biphenyl containing concentration measuring method by the fluorescent X-ray of other embodiment of this invention

以下、図面を参照して本発明における実施形態を詳細に説明する。   Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

(一つの実施形態)
図1Aに示すように、本発明の一つの実施形態の、蛍光X線によるポリ塩化ビフェニル(以下、PCBと称する)含有濃度測定方法は、測定試料作成工程S01と、測定器パラメータ調整工程S02と、X線照射工程S03と、蛍光X線測定工程S04と、変換係数導出工程S05と、全PCB濃度導出工程S06とを備える。なお、測定器パラメータ調整工程S02は、測定器が調整済の場合には不要である。また、変換係数導出工程S05と全PCB濃度導出工程S06とは、まとめて1つの工程とすることもできる。
(One embodiment)
As shown in FIG. 1A, a method for measuring the concentration of polychlorinated biphenyl (hereinafter referred to as PCB) using fluorescent X-rays according to one embodiment of the present invention includes a measurement sample preparation step S01, a measuring instrument parameter adjustment step S02, , X-ray irradiation step S03, fluorescent X-ray measurement step S04, conversion coefficient deriving step S05, and total PCB concentration deriving step S06. Note that the measuring instrument parameter adjustment step S02 is not necessary when the measuring instrument has been adjusted. Further, the conversion coefficient deriving step S05 and the total PCB concentration deriving step S06 can be combined into one step.

図1Bは、蛍光X線によるポリ塩化ビフェニル含有濃度測定方法を実施するための装置のブロック図である。測定試料1に対して、X線源3と半導体検出器4とを有する測定器2で塩素濃度を測定する。制御部6は、GC−MS装置5でGC−MS手法により測定したポリ塩化ビフェニル濃度と、測定器2で測定された塩素濃度とが記憶された記憶部7と、記憶部7の情報を基に演算を行う演算部8とを有する。   FIG. 1B is a block diagram of an apparatus for carrying out a polychlorinated biphenyl-containing concentration measuring method by fluorescent X-rays. With respect to the measurement sample 1, the chlorine concentration is measured by the measuring device 2 having the X-ray source 3 and the semiconductor detector 4. The control unit 6 is based on the storage unit 7 in which the polychlorinated biphenyl concentration measured by the GC-MS method using the GC-MS device 5 and the chlorine concentration measured by the measuring device 2 are stored, and the information in the storage unit 7. And a calculation unit 8 for performing calculation.

まず、各工程の概略について説明する。   First, the outline of each process will be described.

最初の測定試料作成工程S01は、複数の種類のPCB(ポリ塩化ビフェニル)異性体を含む被検体中のPCB濃度を平準化することで測定試料1を作成する。   In the first measurement sample creation step S01, the measurement sample 1 is created by leveling the PCB concentration in the specimen containing a plurality of types of PCB (polychlorinated biphenyl) isomers.

次いで、測定器パラメータ調整工程S02は、被検体の種類又は測定条件を考慮して測定器2のパラメータを入力してパラメータ調整を行う。   Next, the measuring instrument parameter adjustment step S02 performs parameter adjustment by inputting the parameters of the measuring instrument 2 in consideration of the type of the subject or the measurement conditions.

次いで、X線照射工程S03は、X線源3からのX線を前記測定試料1に照射する。   Next, in the X-ray irradiation step S03, the measurement sample 1 is irradiated with X-rays from the X-ray source 3.

次いで、蛍光X線測定工程S04は、前記工程S03でのX線照射の結果、前記測定試料1から発生する塩素固有の蛍光X線を半導体検出器4で測定して塩素濃度を測定する。   Next, in the fluorescent X-ray measurement step S04, as a result of the X-ray irradiation in the step S03, chlorine X-rays generated from the measurement sample 1 are measured by the semiconductor detector 4 to measure the chlorine concentration.

次いで、変換係数導出工程S05は、前記測定試料1のうち、同一の種類の被検体により作成され、異なる塩素濃度を持つ測定試料1に対し、前記蛍光X線測定で測定した塩素濃度と、GC−MS装置5によるGC−MS手法(すなわち、ガスクロマトグラフ質量分析手法)等の精密な手法により測定したPCB濃度との間で相関関係を確認し、確認した相関関係のデータを、演算部8で原点を通る直線で近似することにより、変換係数を演算部8で導出する。   Next, in the conversion coefficient deriving step S05, the chlorine concentration measured by the fluorescent X-ray measurement on the measurement sample 1 created by the same type of specimen among the measurement samples 1 and having different chlorine concentrations, and GC -Correlation is confirmed with the PCB concentration measured by a precise method such as GC-MS method (ie, gas chromatograph mass spectrometry method) by the MS device 5, and the confirmed correlation data is By approximating with a straight line passing through the origin, a conversion coefficient is derived by the calculation unit 8.

次いで、全PCB濃度導出工程S06は、前記蛍光X線測定で得られた塩素濃度のデータに前記工程S05で導出した変換係数を演算部8で乗じて、複数種類のPCB異性体を含む前記測定試料1の全体におけるPCBの濃度(以下、全PCB濃度と称する)を演算部8で導出して、蛍光X線によるポリ塩化ビフェニル含有濃度を測定する。   Next, in the total PCB concentration derivation step S06, the chlorine concentration data obtained by the fluorescent X-ray measurement is multiplied by the conversion coefficient derived in the step S05 by the calculation unit 8, and the measurement including a plurality of types of PCB isomers is performed. The concentration of PCB in the entire sample 1 (hereinafter referred to as total PCB concentration) is derived by the calculation unit 8 to measure the polychlorinated biphenyl-containing concentration by fluorescent X-rays.

前記X線照射工程S03と蛍光X線測定工程S04とを合わせて、塩素濃度検出工程とも称する。   The X-ray irradiation step S03 and the fluorescent X-ray measurement step S04 are collectively referred to as a chlorine concentration detection step.

以下、各工程について、詳述する。   Hereinafter, each step will be described in detail.

測定試料作成工程S01では、被検体を、測定に適合する形態に処理して、測定試料1を作成する。   In the measurement sample creation step S01, the subject is processed into a form suitable for measurement, and the measurement sample 1 is created.

本発明の実施形態は、測定試料として、処理が困難なためPCBの処理が進んでいないPCB汚染物を測定対象(すなわち、測定試料1)としている。なお、本願明細書で、汚染物は、廃棄物と同等の意義を有する。   In the embodiment of the present invention, as a measurement sample, a PCB contaminant that has not been processed due to difficulty in processing is used as a measurement target (that is, measurement sample 1). In the present specification, the contaminant has the same significance as the waste.

汚染物には、それぞれPCBで汚染された、汚泥(土壌)、木屑、防護服、フィルム、碍子、又は、吸収管などが挙げられる。   Contaminants include sludge (soil), wood chips, protective clothing, films, insulators, absorption tubes, etc., each contaminated with PCB.

測定試料作成工程S01では、測定試料である汚染物を測定試料1として測定に供し得るように、夫々の形態に応じて前処理し、PCB濃度を平準化する。これらのうち汚泥は、工場の廃液処理過程などで発生し産業廃棄物として最終処分場に埋設処分されるが、PCBを含んだ汚泥は土壌を汚染するため、汚泥、及び汚泥が混合した土壌は無害化処理の対象となる。本発明の実施形態では、汚泥、土壌及び木屑などについては、そのままの形態でサンプリングしてもよい。   In the measurement sample preparation step S01, pretreatment is performed in accordance with each form so that the contaminant that is the measurement sample can be used as the measurement sample 1, and the PCB concentration is leveled. Of these, sludge is generated in the waste liquid treatment process of factories and disposed as industrial waste in the final disposal site. Since sludge containing PCB contaminates the soil, sludge and soil mixed with sludge are It becomes the target of detoxification treatment. In the embodiment of the present invention, sludge, soil, wood chips and the like may be sampled as they are.

被検体の例としての汚染物が防護服又はフィルム類である場合、PCBが汚染物の一部に偏在することが多いため、元の形態のままで一部から測定試料をサンプリングしても、汚染物全体の残留PCB濃度を測定することにはならず、サンプリング誤差、及び測定誤差が大きくなってしまう。したがって、サンプリング結果が測定試料全体の濃度を正確に反映するように(言い換えれば、ポリ塩化ビフェニル濃度を平準化するように)細分化し、混合、又は、分散して測定試料1を作成することが好ましい。細分化の方法としては、例えば、シュレッダーを用いる方法が挙げられる。   When the contaminant as an example of the subject is protective clothing or films, since PCB is often unevenly distributed in a part of the contaminant, even if the measurement sample is sampled from a part in the original form, The residual PCB concentration of the entire contaminant is not measured, and a sampling error and a measurement error are increased. Therefore, the measurement sample 1 can be created by subdividing, mixing, or dispersing so that the sampling result accurately reflects the concentration of the entire measurement sample (in other words, leveling the polychlorinated biphenyl concentration). preferable. Examples of the fragmentation method include a method using a shredder.

被検体の例としての汚染物が碍子などの固形物である場合、PCBは固形物の表面に偏在する。このため、そのまま固形物を測定すると、表面に偏在したPCBからの蛍光X線強度を測定することになるため、汚染物全体が高濃度のPCBを含むかのような結果となってしまう。したがって、ポリ塩化ビフェニル濃度を平準化するために、固形物を粉砕して微細化して測定試料1を作成することが好ましい。固形物の微細化の程度は、最も長い部分の寸法が、0.1mm〜0.5mmが好ましく、0.1mm以下であることがより好ましい。   When the contaminant as an example of the specimen is a solid such as an insulator, the PCB is unevenly distributed on the surface of the solid. For this reason, if the solid matter is measured as it is, the fluorescent X-ray intensity from the PCB unevenly distributed on the surface is measured, so that the entire contaminant contains a high-concentration PCB. Therefore, in order to level the polychlorinated biphenyl concentration, it is preferable to prepare the measurement sample 1 by pulverizing and refining the solid. As for the degree of refinement of the solid matter, the dimension of the longest part is preferably 0.1 mm to 0.5 mm, and more preferably 0.1 mm or less.

測定器パラメータ調整工程S02では、被検体の種類又は測定条件を考慮して、測定器のパラメータを測定器に入力する。本実施形態では、測定器2の一例として市販のハンドヘルド蛍光X線分析計を用いた。   In the measuring instrument parameter adjustment step S02, parameters of the measuring instrument are input to the measuring instrument in consideration of the type of the subject or the measurement conditions. In the present embodiment, a commercially available handheld fluorescent X-ray analyzer is used as an example of the measuring device 2.

X線照射工程S03と蛍光X線測定工程S04とを含む塩素濃度測定工程では、測定試料1の表面に対してX線が垂直に照射されるように、測定試料1に対して測定器2を配置して、測定器2のX線源3からのX線を測定試料1に照射する。X線を照射したとき、測定試料1から発生する塩素固有の蛍光X線を測定器2の半導体検出器4で測定して、塩素濃度を蛍光X線の測定を行う。測定結果は、制御部6の記憶部7に記憶する。   In the chlorine concentration measurement step including the X-ray irradiation step S03 and the fluorescent X-ray measurement step S04, the measuring device 2 is applied to the measurement sample 1 so that the surface of the measurement sample 1 is irradiated with X-rays perpendicularly. It arrange | positions and the measurement sample 1 is irradiated with the X-ray from the X-ray source 3 of the measuring device 2. When X-rays are irradiated, the fluorescent X-rays specific to chlorine generated from the measurement sample 1 are measured by the semiconductor detector 4 of the measuring device 2, and the chlorine concentration is measured by fluorescent X-rays. The measurement result is stored in the storage unit 7 of the control unit 6.

変換係数導出工程S05では、測定試料1のうち、同一の種類の被検体により作成され、異なる塩素濃度を持つ測定試料1に対し、測定器2を使って蛍光X線測定で測定した塩素濃度と、GC−MS手法等の精密な手法により測定したPCB濃度との間で相関関係を確認し、測定結果を、制御部6の演算部8で原点を通る直線で近似することにより、変換係数を演算部8で導出する。このとき、例えば、予め、GC−MS装置5で同じ測定試料1に対してPCB濃度を測定して、測定結果を、制御部6の記憶部7に記憶しておく。   In the conversion coefficient deriving step S05, the chlorine concentration measured by the fluorescent X-ray measurement using the measuring device 2 for the measurement sample 1 created by the same type of specimen among the measurement samples 1 and having different chlorine concentrations By confirming the correlation with the PCB concentration measured by a precise method such as the GC-MS method and approximating the measurement result with a straight line passing through the origin in the calculation unit 8 of the control unit 6, the conversion coefficient is calculated. Derived by the calculation unit 8. At this time, for example, the PCB concentration is measured for the same measurement sample 1 with the GC-MS device 5 in advance, and the measurement result is stored in the storage unit 7 of the control unit 6.

全PCB濃度導出工程S06では、工程S04で測定器2で検出された測定試料1の塩素濃度(mg/kg)に変換係数導出工程S05で得た変換係数を制御部6の演算部8で乗じることにより、測定試料1中に含まれる全PCB濃度を導出して、ポリ塩化ビフェニル含有濃度を測定する。   In the total PCB concentration deriving step S06, the calculation unit 8 of the control unit 6 multiplies the chlorine concentration (mg / kg) of the measurement sample 1 detected by the measuring device 2 in step S04 by the conversion coefficient obtained in the conversion coefficient deriving step S05. Thus, the total PCB concentration contained in the measurement sample 1 is derived, and the polychlorinated biphenyl-containing concentration is measured.

すなわち、測定される塩素濃度として塩素の蛍光X線濃度をX(mg/kg)とし、全PCB濃度をY(mg/kg)とし、Aを変換係数とすると、これらは下記の(1)式の関係を有する。   That is, as the measured chlorine concentration, if the fluorescent X-ray concentration of chlorine is X (mg / kg), the total PCB concentration is Y (mg / kg), and A is a conversion coefficient, these are the following equations (1) Have the relationship.

Y=A・X ……(1)
ここで、変換係数Aは、被検体の種別により異なる定数であって、
A=(被検体の種類に依存する成分)×(PCBと塩素の分子量の比)
により表され、2成分により構成される。
Y = A · X (1)
Here, the conversion coefficient A is a constant that varies depending on the type of the subject,
A = (component depending on the type of analyte) × (ratio of molecular weight between PCB and chlorine)
It is represented by two components.

『被検体の種類に依存する成分』とは、例えば、蛍光X線測定により出力される塩素濃度がSiOに対する測定を想定した値である場合、土壌を測定した際には、比較的1に近い値をとり、材料の特性が変わると、1から離れていく値となる。 The “component depending on the type of analyte” is, for example, relatively 1 when the soil concentration is measured when the chlorine concentration output by the fluorescent X-ray measurement is a value assuming measurement with respect to SiO 2 . It takes a close value, and when the material property changes, the value goes away from 1.

『PCBと塩素の分子量の比』とは、PCBは、ビフェニル骨格に塩素が1〜10個置換したものであるから、置換塩素の数によって、分子量が異なる。置換塩素数がn個の場合、
(PCBの分子量)
=C12(10−n)Cl=12×12+1×(10−n)+35.5n
=154+34.5n
PCBと塩素の分子量を比較すると、
(PCBと塩素の分子量の比)=(PCBの分子量)/(塩素の総原子量)
=(154+34.5n)/35.5n≒1+4.34/n
nに整数値を入れると、表1のようになる。
“PCB / chlorine molecular weight ratio” means that PCB has 1 to 10 chlorine atoms substituted on the biphenyl skeleton, so the molecular weight varies depending on the number of substituted chlorines. When the number of substituted chlorine is n,
(Molecular weight of PCB)
= C 12 H (10-n ) Cl n = 12 × 12 + 1 × (10-n) + 35.5n
= 154 + 34.5n
Comparing the molecular weight of PCB and chlorine,
(Molecular weight ratio of PCB and chlorine) = (Molecular weight of PCB) / (Total atomic weight of chlorine)
= (154 + 34.5n) /35.5n≈1+4.34/n
When an integer value is entered in n, Table 1 is obtained.

Figure 0006607447
Figure 0006607447

[変換係数]
上述のように、変換係数Aは、測定された測定試料1中の塩素の蛍光X線濃度から、測定試料1中に存在するPCB化合物の重量濃度を直接導出するのに有効な定数である。この変換係数は、測定試料1毎に異なるが、同一種類の汚染物については、一定の数値範囲となる。
[Conversion factor]
As described above, the conversion coefficient A is an effective constant for directly deriving the weight concentration of the PCB compound present in the measurement sample 1 from the measured fluorescent X-ray concentration of chlorine in the measurement sample 1. Although this conversion coefficient differs for each measurement sample 1, it is in a certain numerical range for the same type of contaminants.

変換係数Aは、汚染物の種類によって、さらに最適な範囲の数値に絞り込むことが出来る。   The conversion coefficient A can be further narrowed down to a numerical value within the optimum range depending on the type of contaminant.

例えば、(1)汚染物が汚泥(土壌)の場合には、変換係数Aは2.4〜3.0であればよく、2.6〜2.8であることがより好ましく、2.7が最も好ましい。また、別の例として、(2)汚染物がフィルム(例えば、ポリエチレンフィルム)の場合には、変換係数Aは1.7〜2.4であればよく、2.0〜2.1であればより好ましく、2.06が最も好ましい。さらに、別の例として、(3)汚染物が防護服の場合には、変換係数Aは1.8〜2.8であればよく、特に、2.2〜2.4であればより好ましく、2.29が最も好ましい。   For example, (1) when the contaminant is sludge (soil), the conversion coefficient A may be 2.4 to 3.0, more preferably 2.6 to 2.8, and 2.7. Is most preferred. As another example, (2) when the contaminant is a film (for example, a polyethylene film), the conversion coefficient A may be 1.7 to 2.4, or 2.0 to 2.1. More preferably, 2.06 is most preferable. As another example, (3) when the contaminant is protective clothing, the conversion coefficient A may be 1.8 to 2.8, and more preferably 2.2 to 2.4. 2.29 is most preferred.

また、測定値の相関性を示す相関線の決定係数Rは、0.3以上が好ましい。決定係数Rが0.3以上であれば、データとして信頼性できる。より好ましくは、決定係数Rは0.45以上であり、さらに好ましくは0.7以上、最も好ましくは0.9以上である。 The coefficient of determination R 2 of the correlation line indicating the correlation of the measured values is preferably 0.3 or more. If the coefficient of determination R 2 is 0.3 or more, it reliability as data. More preferably, the coefficient of determination R 2 is 0.45 or more, more preferably 0.7 or more, and most preferably 0.9 or more.

(他の実施形態)
図6に示すように、本発明の他の実施形態の、蛍光X線によるポリ塩化ビフェニル(以下、PCBと称する)含有濃度測定方法は、測定試料作成工程S01と、測定器パラメータ調整工程S02と、X線照射工程S03と、蛍光X線測定工程S04と、塩素系樹脂判定工程S15と、変換係数導出工程S05と、全PCB濃度導出工程S06と、測定試料全体におけるPCB含有濃度測定工程S07とを備える。なお、測定器パラメータ調整工程S02は、測定器が調整済の場合には不要である。また、変換係数導出工程S05と全PCB濃度導出工程S06とは、まとめて1つの工程とすることもできる。
(Other embodiments)
As shown in FIG. 6, the method for measuring the concentration of polychlorinated biphenyl (hereinafter referred to as PCB) using fluorescent X-rays according to another embodiment of the present invention includes a measurement sample preparation step S01, a measuring instrument parameter adjustment step S02, , X-ray irradiation step S03, fluorescent X-ray measurement step S04, chlorine-based resin determination step S15, conversion coefficient derivation step S05, total PCB concentration derivation step S06, and PCB-containing concentration measurement step S07 in the entire measurement sample, Is provided. Note that the measuring instrument parameter adjustment step S02 is not necessary when the measuring instrument has been adjusted. Further, the conversion coefficient deriving step S05 and the total PCB concentration deriving step S06 can be combined into one step.

測定試料作成工程S01から蛍光X線測定工程S04までは、先の実施形態のこれらの工程と同じ動作を行うため、説明を省略する。   Since the measurement sample preparation step S01 to the fluorescent X-ray measurement step S04 perform the same operations as those steps of the previous embodiment, the description thereof is omitted.

塩素系樹脂判定工程S15では、蛍光X線測定工程S04の後、測定試料1が塩素系樹脂である可能性があるか否かを判定する。もし、測定試料1が塩素系樹脂である可能性が無いと判定した場合には、先の実施形態と同様に、変換係数導出工程S05と全PCB濃度導出工程S06とを行う。一方、もし、測定試料1が塩素系樹脂である可能性があると判定した場合に、測定試料1を蛍光X線測定の対象から除外するため、変換係数導出工程S05以降の工程を行わずに、代わりに、測定試料全体におけるPCB含有濃度測定工程S07を行う。ここで、測定試料1の種類が塩素系樹脂である場合、蛍光X線を用いて塩素濃度を測定した際に、PCBのみに由来する塩素濃度よりも大幅に大きい測定値を示すので、これを利用して、測定試料1が塩素系樹脂である可能性があるか否かの判定を行う。   In the chlorine-based resin determination step S15, it is determined whether or not the measurement sample 1 may be a chlorine-based resin after the fluorescent X-ray measurement step S04. If it is determined that there is no possibility that the measurement sample 1 is a chlorine-based resin, the conversion coefficient deriving step S05 and the total PCB concentration deriving step S06 are performed as in the previous embodiment. On the other hand, if it is determined that there is a possibility that the measurement sample 1 is a chlorine-based resin, the measurement sample 1 is excluded from the target of the fluorescent X-ray measurement, so that the steps after the conversion coefficient deriving step S05 are not performed. Instead, the PCB-containing concentration measurement step S07 for the entire measurement sample is performed. Here, when the type of the measurement sample 1 is a chlorine-based resin, when the chlorine concentration is measured using fluorescent X-rays, a measured value that is significantly larger than the chlorine concentration derived only from PCB is shown. Utilizing this, it is determined whether or not there is a possibility that the measurement sample 1 is a chlorine-based resin.

例えば、塩素系樹脂であるポリ塩化ビニル中の塩素濃度は、分子式がCClであることより、下記の(2)式の関係が成り立つ。 For example, the concentration of chlorine in polyvinyl chloride, which is a chlorine-based resin, has the following formula (2) because the molecular formula is C 2 H 3 Cl.

塩素濃度=Clの原子量/分子量 ……(2)
ここで、Clの原子量は35.5であり、CClの分子量は62.5であることから、塩素濃度は、35.5/62.5=568000mg/kg(56.8wt%)であり、数十wt%のオーダーの塩素濃度を示すと考えられる。
Chlorine concentration = atomic weight of Cl / molecular weight (2)
Here, since the atomic weight of Cl is 35.5 and the molecular weight of C 2 H 3 Cl is 62.5, the chlorine concentration is 35.5 / 62.5 = 568000 mg / kg (56.8 wt%). It is considered that the chlorine concentration is on the order of several tens of wt%.

例えば、蛍光X線測定工程S04により、測定試料1から一定値(樹脂判定用閾値)以上、例えば、200000mg/kg以上の塩素濃度が検出された場合は、目視又は赤外分光などを用いることにより、測定試料1が樹脂であるかどうかの判定を実施する(塩素系樹脂判定工程S15を参照)。その結果、測定試料1が樹脂であると判定した場合(塩素系樹脂判定工程S15でYesの場合)には、測定試料1が塩素系樹脂である可能性があると判定し、蛍光X線によるPCB濃度測定を実施せず、代わりに、測定試料全体におけるPCB含有濃度測定工程S07として、GC−MS等の精密な手法にて測定試料1のPCB含有濃度測定を実施する。   For example, when a chlorine concentration of a certain value (resin determination threshold value) or more, for example, 200,000 mg / kg or more is detected from the measurement sample 1 by the fluorescent X-ray measurement step S04, by visual observation or using infrared spectroscopy. Then, it is determined whether or not the measurement sample 1 is a resin (see chlorine-based resin determination step S15). As a result, when it is determined that the measurement sample 1 is a resin (Yes in the chlorine-based resin determination step S15), it is determined that the measurement sample 1 may be a chlorine-based resin, and is based on fluorescent X-rays. Instead of performing the PCB concentration measurement, instead, the PCB-containing concentration measurement of the measurement sample 1 is performed by a precise method such as GC-MS as the PCB-containing concentration measurement step S07 in the entire measurement sample.

このような構成すれば、測定試料1の種類が塩素系樹脂である場合、蛍光X線を用いて塩素濃度を簡便な方法で測定するのではなく、精密に測定することができるので、高濃度のポリ塩化ビフェニル廃棄物を適切に扱うことができる。   With such a configuration, when the type of the measurement sample 1 is a chlorine-based resin, the chlorine concentration can be measured accurately rather than using a simple method using fluorescent X-rays. Of polychlorinated biphenyls can be handled properly.

[実施例1]
[PCBが付着したABS樹脂製フィルムのポリ塩化ビフェニル含有濃度測定]
被検体の例として、ABS樹脂製フィルムを裁断して測定試料を作成し、蛍光X線分析計を用いて前記実施形態にかかるポリ塩化ビフェニル含有濃度測定方法及びGC−MS手法による測定方法でそれぞれ測定試料の塩素濃度を測定した。測定試料のロット毎に蛍光X線で得られた塩素濃度から導出したPCB濃度とGC−MS手法で直接測定したPCB濃度とを対比した結果を表2に示す。図2は、表2のデータをグラフ化したものである。横軸及び縦軸の単位はそれぞれ濃度(mg/kg)である。
[Example 1]
[Measurement of polychlorinated biphenyl content in ABS resin film with PCB attached]
As an example of the specimen, an ABS resin film is cut to prepare a measurement sample, and each of the polychlorinated biphenyl-containing concentration measuring method and the measuring method using the GC-MS method according to the embodiment is performed using a fluorescent X-ray analyzer. The chlorine concentration of the measurement sample was measured. Table 2 shows the results of comparing the PCB concentration derived from the chlorine concentration obtained by fluorescent X-rays for each lot of the measurement sample and the PCB concentration directly measured by the GC-MS method. FIG. 2 is a graph of the data in Table 2. The unit of the horizontal axis and the vertical axis is the concentration (mg / kg), respectively.

表2のデータから、及び、図2から、実施例1において、蛍光X線測定から求めたPCB濃度の値と、GC−MS測定値から求めたPCB濃度との変換係数が良好な相関関係を示していることは明らかである。   From the data in Table 2 and from FIG. 2, in Example 1, the conversion coefficient between the PCB concentration value obtained from the fluorescent X-ray measurement and the PCB concentration obtained from the GC-MS measurement value has a good correlation. It is clear that it shows.

GC−MS手法によるPCB濃度測定方法は、最も実際に近いデータが得られると考えられることから、本発明の本実施形態にかかる蛍光X線測定に基づく濃度測定方法は、変換係数を適正に選択すれば、正確なPCB濃度判定に供することが確認された。   Since the PCB concentration measurement method based on the GC-MS method is considered to obtain the closest data, the concentration measurement method based on the fluorescent X-ray measurement according to this embodiment of the present invention appropriately selects the conversion coefficient. It was confirmed that this would be used for accurate PCB concentration determination.

実施例1のABS樹脂製フィルムの場合は、式(1)であるY=A・Xの変換係数Aは、2.08であった。図2の相関線の決定係数Rは0.989であり、測定値の相関性は極めて高かった。 In the case of the ABS resin film of Example 1, the conversion coefficient A of Y = A · X in the formula (1) was 2.08. The coefficient of determination R 2 of the correlation line of Figure 2 is 0.989, the correlation of the measured values was very high.

Figure 0006607447
Figure 0006607447

[実施例2]
[PCBで汚染した土壌のポリ塩化ビフェニル含有濃度測定]
図1に示したフローチャートに従って、被検体の例として、PCBを含む土壌からサンプリングした測定試料について、ハンドヘルド蛍光X線分析計による前記実施形態にかかるポリ塩化ビフェニル含有濃度測定方法とGC−MS手法による測定方法をそれぞれ行い、対比を行った。
[Example 2]
[Measurement of polychlorinated biphenyl content in soil contaminated with PCB]
According to the flowchart shown in FIG. 1, as an example of a subject, a measurement sample sampled from soil containing PCB is measured by the polychlorinated biphenyl-containing concentration measurement method and the GC-MS method according to the above-described embodiment using a handheld fluorescent X-ray analyzer. Each measurement method was performed and the comparison was performed.

測定結果を表3及び図3に示す。   The measurement results are shown in Table 3 and FIG.

実施例2の土壌の場合、変換係数Aは、2.70であった。この相関線の決定係数Rは0.97であり、測定値の相関性は極めて高かった。土壌又は汚泥の場合、PCBが比較的均一に平準化して分散しているため、測定値のばらつきが小さかったと考えられる。 In the case of the soil of Example 2, the conversion coefficient A was 2.70. The coefficient of determination R 2 of the correlation line is 0.97, was very high correlation of the measured values. In the case of soil or sludge, the PCBs are relatively uniformly leveled and dispersed, so it is considered that the variation in measured values was small.

Figure 0006607447
Figure 0006607447

[実施例3]
[PCBが付着したポリエチレンフィルムのポリ塩化ビフェニル含有濃度測定]
図1に示したフローチャートに従って、被検体の例として、PCBが付着したポリエチレンフィルムを裁断してサンプリングした測定試料についてハンドヘルド蛍光X線分析計とGC−MS手法による測定方法でそれぞれ測定試料の塩素濃度を測定し、対比を行った。
[Example 3]
[Measurement of polychlorinated biphenyl content in polyethylene film with PCB]
According to the flowchart shown in FIG. 1, as an example of the specimen, the chlorine concentration of each measurement sample was measured by a measurement method using a handheld X-ray fluorescence spectrometer and a GC-MS method for a measurement sample obtained by cutting and sampling a polyethylene film with PCB attached thereto. Were measured and compared.

測定結果を表4及び図4に示す。   The measurement results are shown in Table 4 and FIG.

実施例3のポリエチレンフィルムの場合、変換係数Aは、2.06であった。この相関線の決定係数Rは0.72であった。 In the case of the polyethylene film of Example 3, the conversion coefficient A was 2.06. The coefficient of determination R 2 of the correlation line was 0.72.

Figure 0006607447
Figure 0006607447

[実施例4]
[PCBが付着した防護服のポリ塩化ビフェニル含有濃度測定]
図1に示したフローチャートに従って、被検体の例として、PCBが付着した防護服を裁断してサンプリングした測定試料についてハンドヘルド蛍光X線分析計を用いて前記実施形態にかかるポリ塩化ビフェニル含有濃度測定方法及びGC−MS手法による測定方法でそれぞれ測定試料の塩素濃度の測定を行い、対比を行った。
[Example 4]
[Measurement of polychlorinated biphenyl content in protective clothing with PCB attached]
According to the flowchart shown in FIG. 1, as an example of a subject, a method for measuring a polychlorinated biphenyl-containing concentration according to the above-described embodiment using a handheld X-ray fluorescence spectrometer for a measurement sample obtained by cutting and sampling a protective suit with PCB attached And the chlorine concentration of the measurement sample was measured by the measuring method by the GC-MS method, respectively, and the comparison was performed.

測定結果を表5及び図5に示す。   The measurement results are shown in Table 5 and FIG.

実施例3の防護服の場合、変換係数Aは、2.29であった。この相関線の決定係数
は0.47であった。防護服の場合、PCBの付着部位が特定できないため、サンプリングされた測定試料のPCB汚染度が異なっていることを考慮すると、相関線の決定係数Rの0.47という数値は、PCB濃度の判定には十分信頼して使用できるレベルである。
In the case of the protective clothing of Example 3, the conversion coefficient A was 2.29. The coefficient of determination R 2 of the correlation line was 0.47. For protective clothing, because the attachment site of the PCB can not be identified, given that PCB contamination level of the sampled measurement sample is different, the numerical value of 0.47 for the coefficient of determination R 2 of the correlation line, the PCB concentration It is a level that can be used with sufficient confidence in the judgment.

Figure 0006607447
Figure 0006607447

[実施例5]
[PCBが付着した碍子系ガレキのポリ塩化ビフェニル含有濃度測定]
被検体の例として、PCBが付着した碍子系ガレキ(不定形)を粉砕して測定試料を作成した。このとき、粉砕前後で分析計による測定値を比較した。粉砕には、ハンマーを用い、粒径0.1mm以下に微細化した。粒径の測定には、光学顕微鏡を用いた画像イメージング法を用いることが出来る。対象試験として被検体の碍子系ガレキをGC−MS測定してPCB濃度を測定した。GC−MS測定では、被検体を粉砕して測定試料として用いた。
[Example 5]
[Measurement of the concentration of polychlorinated biphenyls in insulator rubble with PCBs attached]
As an example of the subject, a measurement sample was prepared by pulverizing an insulator-type rubble (indefinite shape) with PCB attached thereto. At this time, the measured values by the analyzer were compared before and after grinding. For pulverization, a hammer was used and the particle size was reduced to 0.1 mm or less. An image imaging method using an optical microscope can be used for measuring the particle diameter. As a target test, the PCB concentration was measured by GC-MS measurement of the insulator rubble of the subject. In the GC-MS measurement, the specimen was ground and used as a measurement sample.

Figure 0006607447
Figure 0006607447

粉砕前の碍子の測定値(すなわち、蛍光X線測定によるPCB濃度(粉砕前の碍子))<1>が、実際のPCB濃度(すなわち、GC−MS測定法によるPCB濃度)<3>よりも大幅に高くなるのは、碍子表面に付着したPCBを検出することによるためである。微細化することによって、測定試料全体として、かつ、測定視野内で、PCBの分布が平準化されたため、測定値(すなわち、蛍光X線測定によるPCB濃度(粉砕後碍子))<2>に実際の濃度を反映させることができた。   The measured value of the insulator before pulverization (that is, the PCB concentration by the fluorescent X-ray measurement (insulator before pulverization)) <1> is higher than the actual PCB concentration (that is, the PCB concentration by the GC-MS measurement method) <3>. The reason for the significant increase is due to the detection of PCB attached to the insulator surface. Since the distribution of PCB is leveled as a whole measurement sample and within the measurement visual field by miniaturization, the measured value (ie, PCB concentration by fluorescent X-ray measurement (reel after grinding)) <2> actually Was able to be reflected.

[実施例6]
[ポリ塩化ビニルの判定]
被検体の例として、PCBが付着したポリ塩化ビニルについて、蛍光X線で測定した塩素濃度の値と、GC−MS手法で測定したPCB濃度の値を比較した。
[Example 6]
[Polyvinyl chloride determination]
As an example of the test object, the value of the chlorine concentration measured by fluorescent X-rays and the value of the PCB concentration measured by the GC-MS method were compared for polyvinyl chloride with PCB attached.

蛍光X線での塩素濃度の測定値<1>が、GC−MS手法のPCB濃度<2>よりも大幅に高くなるのは、PCB中の塩素に加えて、ポリ塩化ビニル中の塩素を検出するためである。   The measured value <1> of the chlorine concentration by fluorescent X-ray is significantly higher than the PCB concentration <2> of the GC-MS method. In addition to chlorine in PCB, chlorine in polyvinyl chloride is detected. It is to do.

このように、塩素濃度が200000mg/kgを上回り、なおかつ、目視又は赤外分光などを用いて被検体が樹脂であると塩素系樹脂判定工程S15で判定した場合、被検体は塩素系樹脂である可能性があると塩素系樹脂判定工程S15で判定し、その結果、蛍光X線によるPCB濃度測定を実施せず、代わりに、GC−MS手法等にて被検体の全体におけるPCB含有濃度測定(測定試料全体におけるPCB含有濃度測定工程S07)を実施する。   As described above, when the chlorine concentration exceeds 200,000 mg / kg and it is determined in the chlorine-based resin determination step S15 that the subject is a resin by visual observation or infrared spectroscopy, the subject is a chlorine-based resin. It is determined that there is a possibility in the chlorine-based resin determination step S15, and as a result, the PCB concentration measurement by fluorescent X-rays is not performed. A PCB-containing concentration measurement step S07) is performed on the entire measurement sample.

Figure 0006607447
Figure 0006607447

[保護フィルムの使用]
本発明の別の実施形態として、保護フィルム10(図1B参照)の使用について説明する。
[Use of protective film]
As another embodiment of the present invention, the use of the protective film 10 (see FIG. 1B) will be described.

測定器2の一例としてのハンドヘルド蛍光X線分析計による測定の際には、分析計(例えば、測定器2)の先端部(例えば、少なくとも検出側の端部)を測定試料1に接触させている。したがって、分析計の先端部に微量のPCBが付着して測定データに影響することがある。この対策として、分析計の先端部(例えば、少なくとも検出側の端部)を覆う保護フィルム10を使用する方法を採用することができる。保護フィルム10は、ポリ塩化ビフェニル含有濃度測定毎に交換することが最も好ましい。保護フィルム10の材料としては、塩素原子を含まない材料であれば特に材料を選ばないが、中でもオレフィン系プラスチックフィルムが好ましく、特にポリエチレンフィルムが最も好ましい。また、保護フィルム10として、塩素原子を含むフィルムを使用する場合には、予め、フィルム10としての蛍光X線強度を測定して補正することが出来る。保護フィルム10の例としてのポリエチレンフィルムの厚みは、蛍光X線測定に影響を及ぼさない程度の厚みであればよく、0mmを越えて、0.1mm以下であればよく、0.05mm以下がより好ましい。   When measuring with a hand-held X-ray fluorescence analyzer as an example of the measuring instrument 2, the tip (for example, at least the end on the detection side) of the analyzer (for example, the measuring instrument 2) is brought into contact with the measurement sample 1. Yes. Therefore, a trace amount of PCB may adhere to the tip of the analyzer and affect the measurement data. As a countermeasure, a method using a protective film 10 that covers the tip of the analyzer (for example, at least the end on the detection side) can be employed. Most preferably, the protective film 10 is replaced every time the polychlorinated biphenyl-containing concentration measurement is performed. The material of the protective film 10 is not particularly limited as long as it does not contain a chlorine atom, but an olefin plastic film is preferable, and a polyethylene film is most preferable. Moreover, when using the film containing a chlorine atom as the protective film 10, the fluorescence X-ray intensity as the film 10 can be measured and correct | amended previously. The thickness of the polyethylene film as an example of the protective film 10 may be a thickness that does not affect the fluorescent X-ray measurement, more than 0 mm and 0.1 mm or less, and more preferably 0.05 mm or less. preferable.

複数のポリエチレンフィルムが積層された積層ポリエチレンフィルムを保護フィルム10として用いる場合でも、全体としての厚みが0mmを越えて0.1mm以下であればよい。例えば、0.01mmのフィルムを5枚積層した積層ポリエチレンフィルムを保護フィルム10として用いる場合、最初に、保護フィルム10を設置すれば、測定ごとに1枚ずつフィルムを剥離することにより、5つの異なる測定試料を同一条件で測定できる。ただし、この場合、0.01mmのフィルム1枚のときと積層フィルムとの間で、変換係数の補正が必要である。   Even when a laminated polyethylene film in which a plurality of polyethylene films are laminated is used as the protective film 10, it is sufficient that the overall thickness exceeds 0 mm and is 0.1 mm or less. For example, when a laminated polyethylene film obtained by laminating five 0.01 mm films is used as the protective film 10, if the protective film 10 is first installed, the film is peeled off one by one for each measurement. The measurement sample can be measured under the same conditions. However, in this case, it is necessary to correct the conversion coefficient between one film of 0.01 mm and the laminated film.

前記実施形態によれば、測定対象が限定されずかつ前処理工程も必要がなく、保管場所において簡便な方法で、一次区分として保管しているポリ塩化ビフェニル廃棄物のポリ塩化ビフェニル廃棄物の含有濃度を短時間で測定することができる。   According to the above embodiment, the measurement target is not limited and the pretreatment process is not required, and the polychlorinated biphenyl waste contained in the polychlorinated biphenyl waste stored as the primary division in a simple manner at the storage location The concentration can be measured in a short time.

なお、塩素濃度のデータに変換係数Aを乗ずることにより、測定試料1中のポリ塩化ビフェニル濃度を導出すると説明しているが、これに限られるものではなく、例えば、テーブル又はグラフなどを利用して、塩素濃度のデータからポリ塩化ビフェニル濃度を導出するようにしてもよい。   Although it has been described that the polychlorinated biphenyl concentration in the measurement sample 1 is derived by multiplying the chlorine concentration data by the conversion coefficient A, the present invention is not limited to this. For example, a table or a graph is used. Thus, the polychlorinated biphenyl concentration may be derived from the chlorine concentration data.

なお、前記様々な実施形態又は変形例のうちの任意の実施形態又は変形例を適宜組み合わせることにより、それぞれの有する効果を奏するようにすることができる。また、実施形態同士の組み合わせ又は実施例同士の組み合わせ又は実施形態と実施例との組み合わせが可能であると共に、異なる実施形態又は実施例の中の特徴同士の組み合わせも可能である。   In addition, it can be made to show the effect which each has by combining arbitrary embodiment or modification of the said various embodiment or modification suitably. In addition, combinations of the embodiments, combinations of the examples, or combinations of the embodiments and examples are possible, and combinations of features in different embodiments or examples are also possible.

本発明の前記態様にかかる蛍光X線によるポリ塩化ビフェニル含有濃度測定方法は、測定対象が限定されずかつ前処理工程も必要がなく、保管場所において、保管しているポリ塩化ビフェニル廃棄物のポリ塩化ビフェニル廃棄物の含有濃度を短時間で測定し、ポリ塩化ビフェニル廃棄物から低濃度ポリ塩化ビフェニル廃棄物を区分するにあたっての、簡便な方法での一次区分としての用途に適用できる。   In the method for measuring the concentration of polychlorinated biphenyls by fluorescent X-rays according to the above aspect of the present invention, the object to be measured is not limited and the pretreatment process is not required, and the polychlorinated biphenyl waste stored in the storage place The content concentration of the chlorinated biphenyl waste can be measured in a short time, and can be applied to the use as a primary classification by a simple method in classifying the low concentration polychlorinated biphenyl waste from the polychlorinated biphenyl waste.

1 測定試料
2 測定器
3 X線源
4 半導体検出器
5 GC−MS装置
6 制御部
7 記憶部
8 演算部
10 保護フィルム
DESCRIPTION OF SYMBOLS 1 Measurement sample 2 Measuring device 3 X-ray source 4 Semiconductor detector 5 GC-MS apparatus 6 Control part 7 Memory | storage part 8 Calculation part 10 Protective film

Claims (4)

複数の種類のポリ塩化ビフェニル異性体を含む被検体中のポリ塩化ビフェニル濃度を平準化することで測定試料を作成する工程と、
X線源からのX線を前記測定試料に照射して、前記測定試料から発生する塩素固有の蛍光X線を半導体検出器で測定して塩素濃度を測定する工程と、
前記測定試料のうち、同一の種類の被検体により作成され、異なる塩素濃度を持つ測定試料に対し、前記蛍光X線測定で測定した塩素濃度と、GC−MS手法により測定したポリ塩化ビフェニル濃度との間で相関関係を確認し、確認した相関関係のデータに基づき、前記測定試料中のポリ塩化ビフェニル濃度を導出して、ポリ塩化ビフェニル含有濃度を測定する工程と、
を含み、
前記被検体中の前記ポリ塩化ビフェニル濃度を平準化することにより前記測定試料を作成する工程が、
前記被検体の最も長い部分の寸法が0.5mm以下になるように微細化して前記測定試料を作成する工程を含む、蛍光X線によるポリ塩化ビフェニル含有濃度測定方法。
Creating a measurement sample by leveling the polychlorinated biphenyl concentration in a specimen containing multiple types of polychlorinated biphenyl isomers;
Irradiating the measurement sample with X-rays from an X-ray source, measuring chlorine-specific fluorescent X-rays generated from the measurement sample with a semiconductor detector, and measuring the chlorine concentration;
Among the measurement samples, the chlorine concentration measured by the fluorescent X-ray measurement and the polychlorinated biphenyl concentration measured by the GC-MS method for the measurement samples having different chlorine concentrations prepared by the same type of analyte. And confirming the correlation between them, deriving the polychlorinated biphenyl concentration in the measurement sample based on the confirmed correlation data, and measuring the polychlorinated biphenyl-containing concentration,
Only including,
Creating the measurement sample by leveling the polychlorinated biphenyl concentration in the specimen,
Longest portion step a including dimensions to create the measurement sample to be miniaturized so that 0.5mm below, polychlorinated biphenyls-containing concentration measurement method by the fluorescent X-ray of the subject.
前記塩素固有の蛍光X線を前記半導体検出器で測定して前記塩素濃度を測定する工程と、前記ポリ塩化ビフェニル濃度を導出して前記ポリ塩化ビフェニル含有濃度を測定する工程との間に、
前記測定試料のうち、前記蛍光X線測定で得られた塩素濃度が樹脂判定用閾値以上の値を取り、なおかつ、前記測定試料が樹脂であるか否かを判定する判定工程を備え、
前記判定工程で、前記蛍光X線測定で得られた塩素濃度が前記樹脂判定用閾値以上の値を取り、なおかつ、前記測定試料が樹脂であると判定した場合には、前記ポリ塩化ビフェニル含有濃度を測定する工程を実施せずに、測定試料全体におけるPCB含有濃度測定工程を行う一方、
前記判定工程で、前記蛍光X線測定で得られた塩素濃度が前記樹脂判定用閾値以上の値ではないか、又は、前記測定試料が樹脂ではないとき、前記ポリ塩化ビフェニル含有濃度を測定する工程を実施する、
請求項1に記載の蛍光X線によるポリ塩化ビフェニル含有濃度測定方法。
Between the step of measuring the chlorine concentration by measuring the chlorine-specific fluorescent X-ray with the semiconductor detector and the step of deriving the polychlorinated biphenyl concentration and measuring the polychlorinated biphenyl-containing concentration,
Among the measurement samples, the chlorine concentration obtained by the fluorescent X-ray measurement takes a value equal to or higher than a resin determination threshold, and further includes a determination step of determining whether the measurement sample is a resin,
In the determination step, when the chlorine concentration obtained by the fluorescent X-ray measurement takes a value equal to or greater than the resin determination threshold, and when the measurement sample is determined to be resin, the polychlorinated biphenyl-containing concentration While performing the PCB content concentration measurement process in the entire measurement sample without performing the process of measuring
A step of measuring the polychlorinated biphenyl-containing concentration when the chlorine concentration obtained by the fluorescent X-ray measurement in the determination step is not a value equal to or higher than the resin determination threshold value or the measurement sample is not a resin. Carry out the
The method for measuring polychlorinated biphenyl-containing concentration by fluorescent X-rays according to claim 1.
前記ポリ塩化ビフェニル濃度を導出して前記ポリ塩化ビフェニル含有濃度を測定する工程は、
前記測定試料のうち、同一の種類の被検体により作成され、異なる塩素濃度を持つ測定試料に対し、前記蛍光X線測定で測定した塩素濃度と、GC−MS手法により測定したポリ塩化ビフェニル濃度との間で相関関係を確認し、確認した相関関係を、原点を通る直線で近似することにより、変換係数を導出する工程と、
前記蛍光X線測定で得られた塩素濃度のデータに前記変換係数を乗ずることにより、前記測定試料中のポリ塩化ビフェニル濃度を導出して、ポリ塩化ビフェニル含有濃度を測定する工程とを備え、
前記ポリ塩化ビフェニル濃度を導出する工程は、
前記蛍光X線測定で得られた塩素濃度をX(mg/kg)とし、前記ポリ塩化ビフェニルの濃度をY(mg/kg)とし、前記変換係数を、前記測定試料の種別により異なる定数としてAとするとき、
下記式(1)に基づいて、前記測定試料中の前記ポリ塩化ビフェニル濃度を導出する、
請求項1又は2に記載の蛍光X線によるポリ塩化ビフェニル含有濃度測定方法。
Y=A・X ……(1)
Deriving the polychlorinated biphenyl concentration and measuring the polychlorinated biphenyl-containing concentration,
Among the measurement samples, the chlorine concentration measured by the fluorescent X-ray measurement and the polychlorinated biphenyl concentration measured by the GC-MS method with respect to the measurement samples prepared by the same type of analyte and having different chlorine concentrations Deriving conversion coefficients by approximating the confirmed correlation with a straight line passing through the origin, and
A step of deriving a polychlorinated biphenyl concentration in the measurement sample by multiplying the chlorine concentration data obtained by the fluorescent X-ray measurement by the conversion coefficient, and measuring a polychlorinated biphenyl-containing concentration,
The step of deriving the polychlorinated biphenyl concentration comprises:
The chlorine concentration obtained by the fluorescent X-ray measurement is X (mg / kg), the polychlorinated biphenyl concentration is Y (mg / kg), and the conversion coefficient is a constant that varies depending on the type of the measurement sample. And when
Based on the following formula (1), the polychlorinated biphenyl concentration in the measurement sample is derived.
The polychlorinated biphenyl-containing concentration measuring method using fluorescent X-rays according to claim 1 or 2.
Y = A · X (1)
プラスチックフィルムを前記測定試料と前記半導体検出器との間に保護フィルムとして設け、
前記ポリ塩化ビフェニル濃度の測定ごとに前記プラスチックフィルムを取り換える、
請求項1〜のいずれか1つに記載の蛍光X線によるポリ塩化ビフェニル含有濃度測定方法。
A plastic film is provided as a protective film between the measurement sample and the semiconductor detector,
Replacing the plastic film for each measurement of the polychlorinated biphenyl concentration;
The polychlorinated biphenyl-containing concentration measuring method using fluorescent X-rays according to any one of claims 1 to 3 .
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