JP6700728B2 - Imaging device and imaging device - Google Patents

Description

  The present invention relates to a technique for variably controlling the curvature of an image pickup surface of an image pickup device.

  In recent years, compact digital cameras are also equipped with large-sized image sensors of one or more types. This makes it possible to use ultra-high sensitivity photography, which was previously possible only with single-lens reflex cameras, and photography with a shallow depth of field and a lively bokeh, even with compact digital cameras.

  When the large image sensor is mounted on the compact digital camera as described above, the lens tends to be large, and thus it is necessary to downsize the lens. However, when attempting to downsize the lens while maintaining the same performance, there is a problem that the incident angle of the light beam that is incident on the lens from the subject becomes large.

  As means for solving such a problem, Patent Document 1 proposes an imaging device having a structure in which an imaging surface is curved in order to correct lens aberration.

Japanese Patent No. 4604307

  However, when the image pickup surface of the image pickup element is curved and the curvature is variably controlled as in Patent Document 1, the image pickup element has a structure in which circuit elements are arranged on a flat substrate, and thus strain stress is applied to the image pickup element substrate. Occurs, and the generated stress changes according to the curvature of the imaging surface. When the stress changes, the dark current characteristics of the image sensor may change, and the design characteristics may not be obtained.

  FIG. 9 illustrates the relationship between strain stress (stress) generated in the image sensor and the dark current characteristic of the image sensor. FIG. 9 shows the characteristic that the dark current amount of the image sensor decreases as the stress increases.

  Conventionally, in an image pickup apparatus such as a digital camera, when performing black reduction processing (dark correction) or noise reduction processing such as pixel defect correction, it is common to use the amount of dark current detected from the light-shielded area of the image pickup element. is there.

  In addition, since the dark current amount of the image sensor increases in proportion to the temperature and the shutter speed (charge accumulation time), there is a digital camera designed so that an appropriate noise reduction function can be selected according to the dark current amount. .

  However, in a digital camera including an image pickup device whose image pickup surface is curved, the curvature is also one parameter when selecting the noise reduction process from the relationship between the stress due to the distortion of the image pickup device and the amount of dark current. Design and control become more complex.

  The present invention has been made in view of the above problems, and an object thereof is to realize an image pickup device in which the amount of dark current does not change even when the image pickup device is bent and deformed.

  Another object of the present invention is to realize an image pickup apparatus which prevents dark current from being affected by bending deformation of the image pickup element and which suppresses complication of design and control of the noise reduction function.

To solve the above problems and to achieve the object, the imaging device of the present invention, a plurality of pixels have a pickup surface which is arranged two-dimensionally, the peripheral portion that is supported by the flat shape portion imaging In the device, the image pickup surface includes a reference pixel region in which a plurality of reference pixels are arranged, the reference pixel is a pixel for detecting a dark current amount used for noise reduction processing, and the image pickup surface is bent. when deforming, have a region that does not at least partially on the bending deformation of the reference pixel region, a region which is not deformed bend in the reference pixel region is disposed in the flat shape portion.

  An image pickup apparatus of the present invention includes the image pickup element, and a control unit that variably controls the curvature of the image pickup surface of the image pickup element during zooming.

  According to the present invention, it is possible to realize an image sensor in which the dark current amount does not change even when the image sensor is bent and deformed.

  Further, according to the present invention, since the dark current is not influenced by the bending deformation of the image pickup element, it is possible to suppress the complexity of the design and control of the noise reduction function.

The block diagram which shows the structure of the imaging device of this embodiment. FIG. 3 is a circuit diagram showing an electrical configuration of the image sensor of the present embodiment. The figure which shows a part of color filter array of the image sensor of this embodiment. The figure explaining the structure of an image sensor and a curvature control part. The figure which shows the curvature control table used for the curvature control process of this embodiment. The figure which shows the selection table of the noise reduction process of this embodiment. 6 is a flowchart showing a curvature control process of an image pickup surface of the image pickup device according to the present embodiment. Explanatory drawing of the curvature control process of this embodiment. The figure which shows the relationship between the stress and dark current characteristic which arise by bending deformation of an image sensor.

  Hereinafter, embodiments for carrying out the present invention will be described in detail with reference to the accompanying drawings. The embodiment described below is an example for realizing the present invention and should be appropriately modified or changed according to the configuration of the device to which the present invention is applied and various conditions. However, the present invention is not limited to the embodiment. In addition, a part of each embodiment described below may be appropriately combined and configured.

  Hereinafter, an embodiment in which the present invention is applied to an imaging device such as a compact digital camera will be described. The present invention can also be applied to another device having a function capable of variably controlling the curvature of the imaging element that can be bent and deformed and the imaging surface of the imaging element.

  <Apparatus Configuration> With reference to FIG. 1, an outline of the configuration and functions of an imaging apparatus according to an embodiment of the present invention will be described.

  In FIG. 1, the image pickup apparatus 100 of the present embodiment is equipped with a large-sized image pickup device of, for example, one type or more. The lens 101 includes a focus lens and a zoom lens. The lens control unit 102 controls the drive of the lens 101 based on the control signal from the main control unit 111. For example, during zooming, the lens control unit 102 performs zoom control for moving the lens 101 to a position corresponding to a predetermined zoom magnification between the tele end and the wide end according to the zoom operation of the user.

  The shutter 103 is a mechanical shutter that is mechanically driven to adjust the irradiation time of subject image light that is imaged on the imaging surface of the image sensor 106. The diaphragm 104 is for adjusting the amount of light of the subject image formed on the imaging surface of the image sensor 106, and includes diaphragm blades whose aperture diameter is variable by being mechanically driven. The shutter/aperture control unit 105 controls the drive of the shutter 103 and the aperture 104 based on the control signal from the main control unit 111.

  The image sensor 106 is composed of a CCD, a CMOS, or the like that converts an object image formed through an optical system including the lens 101, the diaphragm 104, and the shutter 103 into an electric signal. The detailed configuration of the image sensor 106 will be described later with reference to FIGS. 2 and 3.

  The curvature control unit 118 is provided in the image pickup device 106 as described later with reference to FIG. 4, and variably controls the curvature of the image pickup surface of the image pickup device 106 based on a control signal from the main control unit 111. A timing generator (TG) 109 generates a timing signal for driving the image sensor 106 based on a control signal from the main controller 111, and causes the image sensor 106, the CDS/A/D converter 107 and the signal processor 108 to generate a timing signal. Output.

  The CDS/A/D conversion unit 107 performs correlated double sampling, gain adjustment, and conversion from analog signal to digital signal for the analog signal output from the image sensor 106, and outputs as R, G, and B signals. It is output to the signal processing unit 108. Although the image pickup device 106 and the CDS/A/D conversion unit 107 have been described as separate configurations here, the CDS/A/D conversion unit 107 is integrated into the image pickup device 106 by being built therein. It doesn't matter. Moreover, you may use the image pick-up element 106 with which the image pick-up chip and the image processing chip were laminated|stacked.

  The signal processing unit 108 performs signal processing such as low-pass filter processing and shading processing for averaging noise in the digital signal output from the CDS/A/D conversion unit 107, and development processing such as gamma processing and white balance processing. Noise reduction processing such as color adjustment processing, black subtraction processing (dark correction) and pixel defect correction is performed, and compression processing is performed to generate image data. Further, the signal processing unit 108 outputs image data to the image memory 110 or the recording medium 114, or performs predetermined signal processing on the image data read from the image memory 110 or the recording medium 114. Further, the signal processing unit 108 also has a function of detecting distance measurement data such as a focus position and photometric data such as an exposure amount from the output signal of the image sensor 106, and outputting the data to the main control unit 111.

  The image memory 110 temporarily stores the image data output from the signal processing unit 108. The display unit 113 is, for example, an LCD or an organic EL, and displays an image, a display for assisting operations, and a camera status display, and also displays a shooting screen and a distance measurement area during shooting. The external connection unit 115 is an interface for communicating and exchanging data with an external device such as a personal computer (PC).

  The recording medium connection unit 112 is an interface for reading and writing image data with respect to the recording medium 114. Image data (still image, moving image) output from the signal processing unit 108 is recorded on the recording medium 114. The recording medium 114 may be a memory card or a hard disk drive mounted in the imaging device 100, or a flash memory or a hard disk drive built in the imaging device 100. The memory unit 116 and the recording medium 114, which will be described later, may have the same configuration.

  The memory unit 116 records constants for operating the CPU of the main control unit 111, programs, setting information, and the like. Here, the program is a program for executing a variable control sequence of the curvature of the image pickup surface of the image pickup element described later in this embodiment.

  The main control unit 111 has a CPU, a main memory (RAM), an input/output circuit, a timer circuit, and the like, and the CPU expands the program stored in the memory unit 116 into a work area of the RAM and executes the program, so that the device Control the overall behavior. The main memory and the image memory 110 may have the same configuration.

  The operation unit 117 is an operation unit that receives a user operation for inputting various instructions to the imaging apparatus 100, and various forms such as physical operation members such as buttons and switches and an input unit through a touch panel can be used. Is. The operation unit 117 includes, for example, a menu switch for performing various settings at the time of shooting or playing an image, a zoom lever for instructing a zoom operation of the lens 101, a switch for switching operation modes such as a shooting mode and a playback mode, a shutter switch, and a power supply. Including switches, etc. The main control unit 111 controls the imaging device 100 based on an instruction or setting input by the user via the operation unit 117, and also displays setting information, an operating state, an image, etc. on the display unit 113.

  <Imaging Device> Next, a detailed configuration of the imaging device 106 of the present embodiment will be described with reference to FIGS. 2 and 3.

  FIG. 2 is a circuit diagram showing an electrical configuration of the image sensor 106 of this embodiment. In FIG. 2, the unit pixels 201 are shown only in 4 rows×4 columns for simplification of description, but in reality, a large number of unit pixels 201 are two-dimensionally arranged.

  In FIG. 2, the unit pixel 201 includes a photodiode (PD) 202, a transfer switch 203, a floating diffusion unit (FD) 204, an amplification MOS amplifier 205 functioning as a source follower, a selection switch 206, and a reset switch 207. Light is converted into charges in the PD 202, and the charges generated in the PD 202 are transferred from the PD 202 to the FD 204 by applying the transfer signal φTX to the transfer switch 203, and are temporarily stored in the FD 204. A floating diffusion amplifier is configured by the FD 204, the amplification MOS amplifier 205, and the constant current source 209 which is a load of the amplification MOS amplifier 205. Then, by applying the selection signal φSEL, the selection switch 206 is turned on, the signal charge accumulated in the FD 204 of the selected pixel is converted into a voltage, and the voltage is output to the readout circuit 213 via the signal output line 208. . Further, the horizontal scanning circuit 214 outputs a selection signal from the selection signal line 210 to select a signal to be output from the reading circuit 213, and the selected pixel signal is output to the outside of the image sensor 106 via the output amplifier 211. It The charge accumulated in the FD 204 is removed by applying the reset signal φRES to the reset switch 207. Further, the vertical scanning circuit 212 performs driving for selectively turning on/off the transfer switch 203, the selection switch 206, and the reset switch 207.

  FIG. 3A is a diagram showing a simplified image pickup surface of the image pickup element 106 in which the unit pixel 201 shown in FIG. 2 is arranged. As shown in FIG. 3A, the image pickup device 106 has a rectangular image pickup surface having long sides and short sides. The image pickup surface of the image pickup element 106 is composed of a reference pixel area 301 in which reference pixels of the pixels 201 are arranged and an image pickup pixel area 302 in which image pickup pixels covered with primary color filters are arranged. Here, the length of the reference pixel area 301 in the long side direction on the imaging surface is W1, and the length of only the imaging pixel area is W2. The long side of the image pickup surface of the image pickup element of this embodiment is curved.

  FIG. 3B illustrates a part of the color filter array provided in each pixel of the image pickup pixel area 302 of the image pickup device 106 illustrated in FIG. 2. In FIG. 3B, the first color filter is red (R), the second color filter is green (G), the third color filter is green (G), and the fourth color filter is blue (B). Is shown. This array of color filter arrays is particularly called a Bayer array among primary color filter arrays, and is a color filter array having high resolution and excellent color reproducibility.

  <Curvature Control Unit> Next, the configurations and functions of the image sensor 106 and the curvature control unit 118 of this embodiment will be described with reference to FIG. FIG. 4 is a sectional view taken along the line A-A′ in FIG. 3A including the image sensor 106 and the curvature control unit 118.

  In FIG. 4, the imaging element 106 includes an imaging chip 401 having a curved portion 403, a pedestal 404 having a flat shaped portion (flat portion) 405 and an opening 406, a bottom plate 407, and a suction portion 408. The imaging chip 401 is supported by the flat portion 405 of the pedestal 404, the bottom plate 407 is provided so as to close the opening portion of the pedestal 404 on the lower side in the drawing, and the suction portion 408 corresponds to the opening portion 406 of the bottom plate 407. It is provided at the position where

  The image pickup chip 401 has an image pickup pixel region 402 in which a plurality of unit pixels 201 for image pickup are two-dimensionally arranged in a central portion on the upper side in the drawing, and a plurality of reference pixels are arranged in an outer edge portion of the image pickup pixel region 402. The reference pixel area 402a (hatched portion), and the circuit portions 209 to 215 of FIG. 2 are provided in the peripheral portion of the reference pixel area 402a. The reference pixel area 402a may be shielded from light.

  The central portion of the imaging chip 401 is curved in a two-dimensional arc shape so that the long side of the imaging surface is convex toward the opening 406 side to form a curved portion 403. It is supported on the pedestal 404 by being fixed to the flat portion 405 via an adhesive layer.

  With this configuration, the central portion of the image pickup pixel region 402 is arranged in the curved portion 403 of the image pickup chip 401, and the reference pixel region 402a at the outer edge portion of the image pickup pixel region 402 is fixed to the flat portion 405. The imaging pixel area 302 (long side length W2) shown in FIG. 3 is located within the area of the curved portion 403, and the reference pixel area 301 (long side length W1-length W2) is the flat portion. It is located within the area fixed to 405.

  A suction unit 408 of the curvature control unit 118 is attached to the bottom plate 407. The suction portion 408 sucks the gas inside the opening portion 406 that is made airtight by the bottom plate 407, and controls the atmospheric pressure (negative pressure) inside the opening portion 406 to make the curvature ε of the bending portion 403 variable. Has been done. The amount of suction of the suction unit 408 is controlled by the curvature control unit 118, and the curvature ε of the bending portion 403 (the curvature ε of the imaging surface of the image sensor 106) is determined by this suction amount.

  FIG. 4A shows a state in which the curvature control unit 118 controls the suction force (negative pressure) of the suction unit 408 to decrease and the imaging chip 401 is not bent and deformed. Further, in FIG. 4B, the curvature control unit 118 controls the suction force (negative pressure) of the suction unit 408 to increase, the imaging chip 401 is bent and deformed, and the imaging pixel region 402 (on the long side). Only the pixel region (the length W2 on the long side) of the length W1) excluding the reference pixel region 402a is curved.

  In addition to the method of controlling the negative pressure inside the opening 406, the curvature control unit 118 controls the method by connecting a piezoelectric element to the back surface side of the imaging chip 401, or the magnetic film on the back surface side of the imaging chip 401. A method of controlling the magnetic force generated by a magnet or an electromagnetic coil can be applied.

  <Curvature Control Table> Next, with reference to FIGS. 5 to 7, the relationship between the curvature ε of the imaging pixel region and the dark current amount σ of the reference pixel region according to the zoom position in the curvature control of the present embodiment will be described. To do.

FIG. 5A is a table used for the curvature control of the present embodiment. The table shows the curvature ε of the image pickup pixel region and the reference that change while the zoom position is changed from the wide (Wide) end to the tele (Tele) end. It is a curvature control table showing the relationship with the amount of dark current σ generated in the pixel region. The lens 101 according to the present embodiment is configured such that the closer the zoom position is to the wide side at the time of capturing an image or at the time of live view, the greater the angle of incidence of the light ray on the imaging surface of the image sensor 106. The relationship of each curvature ε is as follows.
ε0>ε1>ε2>ε3>ε4≧0
A curvature control table as shown in FIG. 5A is stored in the memory unit 116 of the image pickup apparatus 100 of this embodiment. The curvature control unit 118 controls the image pickup surface of the image pickup device 106 to have a curvature corresponding to the zoom position of the lens 101, using the value of the curvature ε of the curvature control table. The value of the curvature ε set in the curvature control table is obtained by performing an experiment or the like in advance on the image sensor 106 so that the curvature becomes appropriate for each zoom position.

  FIG. 5B shows the relationship between the curvature value of the bending portion 403, the bending shape, and the zoom position. In the example shown in FIG. 5B, the curvature becomes smaller as the zoom position approaches the tele side (the shape of the curved portion 403 approaches the flat side), and the curvature increases as the zoom position approaches the wide side (the bending degree of the curved portion 403 increases. The curvature is set so as to increase.

  Further, in the curvature control table of FIG. 5A, the zoom points such as Wide and M1 are used as the zoom position, but the focal length at each zoom position may be used. By using such a curvature control table, the curvature of the image pickup surface of the image pickup device 106 is controlled so that the image pickup characteristic is optimally maintained with respect to the incident angle of the light ray of the lens 101 which changes according to the zoom position during zooming. can do.

  Further, as shown in FIG. 5B, even if the curvature ε of the curved portion 403 changes according to the zoom position, the reference pixel area for detecting the dark current amount σ is fixed to the flat portion 405. , Does not bend regardless of zoom position. Therefore, as shown in FIG. 5A, the dark current amount σ generated in the reference pixel area according to the zoom position is always constant.

  FIG. 6 shows a selection table for selecting the noise reduction processing according to the dark current amount σ. In FIG. 6, the noise reduction processing A is blacking processing. The black-out processing is a light-shielded image or black image (reference image) captured by shielding the main captured image (exposure image) normally exposed to remove fixed pattern noise caused by dark current of the image sensor. Image) is subtracted. By this blacking processing, noise components such as vertical stripes, horizontal stripes, scratches, and dark shading are removed. Further, the noise reduction processing B carries out pixel defect correction. The pixel defect correction corrects a defective pixel detected in advance from an image captured under a predetermined condition, based on the position address data of the defective pixel stored in the memory unit 116.

  Then, in the present embodiment, when the noise reduction process is selected according to the selection table of FIG. 6, the dark current amount σ generated in the reference pixel area is detected and compared with the threshold value σ1 predetermined at the time of design. As a result of the comparison, when the dark current amount σ is equal to or larger than the threshold σ1 (σ≧σ1), the noise reduction process A is selected, and when the dark current amount σ is less than the threshold σ1 (σ<σ1), the noise reduction process B is selected.

  <Photographing Operation> Next, with reference to FIG. 7, a photographing operation by the image pickup apparatus 100 of the present embodiment will be described.

  Note that the processing shown in FIG. 7 is started when the image pickup apparatus 100 is powered on, at the time of capturing an image or at the time of live view, and is executed by the main control unit 111 and the curvature control unit 118 in cooperation. The CPU of the main control unit 111 implements the processing of FIG. 7 by expanding the program read from the memory unit 116 into the main memory and executing the program.

  In step S701, the main control unit 111 determines whether or not an instruction to change the zoom position has been received due to the operation of the zoom lever included in the operation unit 117. If the instruction has been received, the process proceeds to step S702. Advances to step S706.

  In step S<b>702, the main control unit 111 controls the lens control unit 102 to drive the lens 101 to the changed zoom position, and saves information about the set zoom position in the memory unit 116.

  In step S703, the main control unit 111 acquires information about the zoom position stored in the memory unit 116. In step S704, the main control unit 111 refers to the curvature control table in FIG. 5A, selects the value of the curvature ε corresponding to the zoom position acquired in step S703, and gives it to the curvature control unit 118.

  In step S705, the curvature control unit 118 drives the suction unit 408 based on the value of the curvature ε selected in step S704, and bends the imaging surface of the image sensor 106. In step S706, the main control unit 111 determines whether the shutter button included in the operation unit 117 is in a half-depressed state (SW1 is on), and if it is in a half-depressed state, the process proceeds to step S708, and otherwise. If so, the process returns to step S701.

  In step S707, the main control unit 111 acquires photometric data from the signal processing unit 108, and executes a photometric operation of calculating the exposure time Tv, the aperture value Av, and the ISO sensitivity value Sv for capturing an exposure image. Then, the main control unit 111 controls the shutter/aperture control unit 105 based on the calculation result to drive the aperture 104, and stores the set aperture value Av in the memory unit 116 as a shooting parameter (AE operation).

  Further, in step S707, the main control unit 111 acquires distance measurement data from the signal processing unit 108, and executes a distance measurement operation of calculating a lens position where the subject is in focus. Then, the main controller 111 controls the lens controller 102 based on the calculation result to drive the lens 101 to the in-focus position (AF operation).

  In step S708, the main control unit 111 determines whether the shutter button included in the operation unit 117 is fully pressed (SW2 is on). If the shutter button is fully pressed, the process proceeds to step S709, otherwise. If so, the process returns to step S701.

  In step S709, the main control unit 111 reads the shooting parameters (exposure time Tv, aperture value Av, ISO sensitivity value Sv) calculated in step S708 from the memory unit 116. Then, the main control unit 111 controls the lens control unit 102 and the shutter/aperture control unit 105 under the conditions of the read shooting parameters Tv, Av, and Sv to shoot an image (exposure image) and stores it in the image memory 110. ..

  In step S710, the main control unit 111 causes the signal processing unit 108 to calculate the dark current amount σ of the reference pixel region in the image stored in the image memory 110. In step S711, the main control unit 111 compares the dark current amount σ calculated in step S710 with the threshold value σ1, and if the dark current amount σ is equal to or more than the threshold value (σ≧σ1), the process proceeds to step S712, and is less than the threshold value ( If σ<σ1), the process proceeds to step S714.

  In step S712, the main control unit 111 controls the lens control unit 102 and the shutter/aperture control unit 105 with the same exposure time Tv and ISO sensitivity value Sv as in step S710 to close the light-shielded image (black The image) is photographed and stored in the image memory 110.

  In step S713, the main control unit 111 selects the noise reduction process A with reference to the selection table of FIG. Then, the main control unit 111 reads the exposure image from the image memory 110, and the signal processing unit 108 performs black subtraction processing for subtracting the black image acquired in step S712 from the exposure image.

  In step S714, the main control unit 111 selects the noise reduction process B with reference to the selection table of FIG. Then, the main control unit 111 reads the exposure image from the image memory 110, reads the position address data of the defective pixel from the memory unit 116, and performs the pixel defect correction on the signal processing unit 108 based on the position address data of the defective pixel. ..

  In step S715, the main control unit 111 causes the signal processing unit 108 to perform signal processing such as low-pass filter processing and shading processing on the image subjected to the noise reduction processing in step SS713 or S714.

  In step S716, the main control unit 111 performs development processing such as gamma processing and white balance processing and color adjustment processing by the signal processing unit 108, performs compression processing to generate image data, and records the image data in the recording medium 114.

  In step S717, the main control unit 111 determines whether or not a series of shooting is completed, and if so, ends the shooting operation, and if shooting is continued, returns to step S701 to perform the shooting operation again.

  According to the above-described embodiment, in the image pickup apparatus using the bendable image pickup element, by disposing the reference pixel region on the flat portion which is not curved, the dark current amount does not change even when the image pickup element is bent and deformed. It is possible to realize various image pickup devices.

  Further, since the amount of dark current generated in the reference pixel area is not affected by the curvature of the image sensor, the accuracy of dark current detection is improved, the selection table for the noise reduction process is easily designed, and the control related to the noise reduction process is improved. The complexity can be suppressed.

  In the present embodiment, the long side of the image pickup chip 401 is curved. However, when the short side is curved, the reference pixel area arranged on the long side is set to the flat portion 405. However, the dark current may be detected by the reference pixel area on the short side.

  Further, in the present embodiment, the entire reference pixel area of the imaging chip 401 is arranged in the flat portion 405. However, as shown in FIG. 8A, a part of the inner edge portion of the reference pixel area 802a has a flat portion 405. It may be configured to be included in the curved portion 403 instead of being disposed in the. In this case, the area W3 excluding the reference pixel area 802a becomes the imaging pixel area. The dark current detection can obtain the same effect by using the reference pixel area arranged in the flat portion 405.

  Contrary to FIG. 8A, a part of the outer edge portion of the imaging pixel region W4 may be arranged in the flat portion 405 as shown in FIG. 8B. In this case, the image pickup pixel region 802b located on the flat portion 405 is not curved, and thus may not be used for development processing or the like.

[Other Embodiments]
The present invention supplies a program that implements one or more functions of the above-described embodiments to a system or apparatus via a network or a storage medium, and one or more processors in a computer of the system or apparatus read and execute the program. It can also be realized by the processing. It can also be realized by a circuit (for example, ASIC) that realizes one or more functions.

100... Imaging device, 101... Lens, 106... Imaging element, 108... Signal processing unit, 111... Main control unit, 118... Curvature control unit

Claims (11)

A plurality of pixels have a pickup surface which is arranged two-dimensionally, the peripheral portion. The imaging device that is supported by the flat shape portion,
The imaging surface includes a reference pixel area in which a plurality of reference pixels are arranged,
The reference pixel is a pixel for detecting the amount of dark current used for noise reduction processing,
When deforming bending the imaging surface, we have a region that does not at least partially on the bending deformation of the reference pixel region,
The image sensor, wherein a region of the reference pixel region that is not bent and deformed is disposed in the flat shape portion . The image pickup device according to claim 1 , wherein a part of the reference pixel region is arranged not in the flat shape portion but in a bendable region of the image pickup surface. The image pickup device according to claim 1 , wherein a part of the image pickup surface excluding the reference pixel region is arranged in the flat shape portion. The image pickup device according to any one of claims 1 to 3 , wherein the image pickup element has a rectangular image pickup surface having long sides and short sides, and the long side of the image pickup surface is bent and deformed. element. An image pickup device according to any one of claims 1 to 4 ,
An image pickup apparatus comprising: a control unit that variably controls a curvature of an image pickup surface of the image pickup element during zooming. Detection means for detecting the amount of dark current in the reference pixel area;
Processing means for performing the noise reduction processing on the image captured by the image sensor ,
The image pickup apparatus according to claim 5 , further comprising a selection unit that selects one of a plurality of noise reduction processes according to the amount of dark current detected by the detection unit. The noise reduction process is performed when the amount of dark current detected by the detection unit is equal to or more than a threshold value, and when the amount of dark current detected by the detection unit is less than the threshold value. Including a second noise reduction process,
The image pickup apparatus according to claim 6 , wherein the first noise reduction process includes a black subtraction process, and the second noise reduction process includes a pixel defect correction. Further comprising a first storage means for storing a first table in which the dark current amount and the plurality of noise reduction processes are associated with each other,
It said selection means, the reference to the first table, the imaging apparatus according to claim 6 or 7, wherein the selecting noise reduction processing in accordance with the dark current amount detected by said detection means. Further comprising zoom means for performing a zoom operation according to a user operation,
It said control means, the image pickup apparatus according to any one of claims 5 to 8, characterized in that variably controls the curvature of the imaging surface in accordance with the zoom position. A second storage unit that stores a second table in which the value of the curvature of the imaging surface and the zoom position are associated with each other;
The image pickup apparatus according to claim 9 , wherein the control unit controls the curvature of the image pickup surface of the image pickup element with reference to the second table. The image pickup apparatus according to claim 10 , wherein the curvature value is smaller as the zoom position is closer to the telephoto side and is larger as the zoom position is closer to the wide side.

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