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JP6703452B2 - Electroplating method - Google Patents
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JP6703452B2 - Electroplating method - Google Patents

Electroplating method Download PDF

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JP6703452B2
JP6703452B2 JP2016143360A JP2016143360A JP6703452B2 JP 6703452 B2 JP6703452 B2 JP 6703452B2 JP 2016143360 A JP2016143360 A JP 2016143360A JP 2016143360 A JP2016143360 A JP 2016143360A JP 6703452 B2 JP6703452 B2 JP 6703452B2
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anode
plating solution
plating
suction
plated
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隆夫 冨谷
隆夫 冨谷
宏人 成枝
宏人 成枝
山田 章
章 山田
峻 倉橋
峻 倉橋
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Dowa Metaltech Co Ltd
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Description

本発明は、電気めっき方法に関し、特に、めっき槽内のめっき液中においてアノードバッグ内のアノードとアノードバッグ外の被めっき材との間に電流を流して被めっき材をめっきする、電気めっき方法に関する。 The present invention relates to an electroplating method, and in particular, an electroplating method in which a plating material is plated by passing an electric current between an anode in an anode bag and a plating material outside the anode bag in a plating solution in a plating tank. Regarding

従来、めっき槽内のめっき液中において可溶性のアノードと被めっき材との間に電流を流して被めっき材を電気めっきする方法では、電気めっきの際にアノードがめっき液に溶解するときに発生するスラッジ(またはスライム)が被めっき材に付着するのを防止するために、アノードをアノードバッグ内に収容し、被めっき材をアノードバッグ外に配置している。 Conventionally, in the method of electroplating a material to be plated by passing an electric current between a soluble anode in the plating solution in the plating tank and the material to be plated, it occurs when the anode dissolves in the plating solution during electroplating. In order to prevent the sludge (or slime) from being deposited on the material to be plated, the anode is housed in the anode bag, and the material to be plated is arranged outside the anode bag.

しかし、電気めっきを連続的に長時間行うと、アノードバッグ内にスラッジが沈殿して、アノードバッグの目詰まりが生じる。そのため、アノードの電気反応により生じる変質しためっき液をアノードバッグ内外で入れ替えることができなくなり、アノードバッグの底部のめっき液の電導度が低下して、アノードの下端部付近からの電流が減少するため、被めっき材の下側部分のめっき皮膜の厚さが低下する。 However, when electroplating is continuously performed for a long time, sludge is settled in the anode bag and the anode bag is clogged. Therefore, the deteriorated plating solution generated by the electric reaction of the anode cannot be exchanged inside and outside the anode bag, the conductivity of the plating solution at the bottom of the anode bag decreases, and the current from near the lower end of the anode decreases. , The thickness of the plating film on the lower side of the material to be plated decreases.

このような問題を解決するために、めっき槽中のアノードバッグ内のスラッジ(またはスライム)を除去する方法として、めっき槽中のアノードを取り囲むアノードバッグの底部にスライム吸引口を設けて、めっき液とともにスライムを吸い出す方法(例えば、特許文献1参照)や、アノードケースから飛散および沈降したスラッジを吸い取る吸引部をアノードケースの左側および右側の少なくとも一方と、底部の外側または内側に設置する方法(例えば、特許文献2参照)などが提案されている。 In order to solve such a problem, as a method for removing sludge (or slime) in the anode bag in the plating tank, a slime suction port is provided at the bottom of the anode bag surrounding the anode in the plating tank to form a plating solution. And a method of sucking out slime (for example, refer to Patent Document 1), or a method of installing a suction portion for sucking sludge scattered and settled from the anode case on at least one of the left side and the right side of the anode case and outside or inside the bottom (for example, , Patent Document 2) and the like have been proposed.

特開平7−286299号公報(段落番号0004−0006)JP-A-7-286299 (paragraph number 0004-0006) 特許4445354号公報(段落番号0008)Japanese Patent No. 4445354 (paragraph number 0008)

しかし、特許文献1および2の方法では、アノードバッグの底部に堆積したスラッジをめっき液とともに吸引して、フィルタによりスラッジを除去しためっき液をアノードバッグ内に戻すように構成されているため、多量のスラッジが吸引されて、フィルタの寿命が短くなる。また、スラッジを吸引して除去するために大きな配管をアノードバッグの底部に設置する必要があり、めっき槽内に大きなスペースが必要になる。 However, in the methods of Patent Documents 1 and 2, the sludge accumulated on the bottom of the anode bag is sucked together with the plating solution, and the plating solution from which the sludge has been removed by the filter is returned to the inside of the anode bag. The sludge will be sucked in and the filter life will be shortened. In addition, a large pipe must be installed at the bottom of the anode bag to suck and remove the sludge, which requires a large space in the plating tank.

したがって、本発明は、このような従来の問題点に鑑み、めっき槽内のめっき液中においてアノードバッグ内のアノードとアノードバッグ外の被めっき材との間に電流を流して被めっき材をめっきする、電気めっき方法において、アノードバッグの底部に堆積したスラッジを除去しなくても、アノードバッグ内のめっき液の電導度の低下を抑制して、被めっき材に形成されるめっき皮膜の厚さの変化を抑制することができる、電気めっき方法を提供することを目的とする。 Therefore, in view of such a conventional problem, the present invention, in the plating solution in the plating tank, applies a current between the anode in the anode bag and the material to be plated outside the anode bag to plate the material to be plated. In the electroplating method, even if the sludge accumulated on the bottom of the anode bag is not removed, the decrease in the conductivity of the plating solution in the anode bag is suppressed, and the thickness of the plating film formed on the material to be plated is suppressed. It is an object of the present invention to provide an electroplating method capable of suppressing the change in

本発明者らは、上記課題を解決するために鋭意研究した結果、長尺の帯板状の被めっき材をその幅方向が略鉛直方向になるようにめっき槽内でその長手方向に沿って搬送しながら、めっき槽内のめっき液中において、アノードバッグ内のアノードとアノードバッグ外の被めっき材との間に電流を流して被めっき材をめっきする、電気めっき方法において、アノードバッグ内に吸引管を導入し、この吸引管の吸引口の最下端の高さがアノードの最下端から鉛直方向上方に70mm以下の高さになるように吸引口を配置し、被めっき材をめっきする際に、めっき液の液面の高さの最大低下量を1〜60mmに維持しながら吸引口からめっき液の一部を吸引した後に、めっき液の吸引を停止することを交互に繰り返すことにより、めっき液の一部を間欠的に吸引してめっき槽から排出することによって、アノードバッグの底部に堆積したスラッジを除去しなくても、アノードバッグ内のめっき液の電導度の低下を抑制して、被めっき材に形成されるめっき皮膜の厚さの変化を抑制することができることを見出し、本発明を完成するに至った。 As a result of intensive research to solve the above problems, the inventors of the present invention performed a long strip-shaped plate-shaped material along its longitudinal direction in a plating tank so that its width direction is substantially vertical. In the electroplating method, in which the material to be plated is plated by applying a current between the anode in the anode bag and the material to be plated outside the anode bag in the plating solution in the plating tank while transporting, When a suction pipe is introduced and the suction port is arranged such that the height of the lowermost end of the suction port of the suction pipe is 70 mm or less in the vertical direction from the lowermost end of the anode, the material to be plated is plated. In addition, after sucking a part of the plating solution from the suction port while maintaining the maximum amount of decrease in the height of the surface of the plating solution to 1 to 60 mm, by stopping sucking the plating solution alternately, By intermittently sucking part of the plating solution and discharging it from the plating tank, it is possible to suppress the decrease in the conductivity of the plating solution in the anode bag without removing the sludge accumulated on the bottom of the anode bag. The inventors have found that it is possible to suppress changes in the thickness of the plating film formed on the material to be plated, and have completed the present invention.

すなわち、本発明による電気めっき方法は、長尺の帯板状の被めっき材をその幅方向が略鉛直方向になるようにめっき槽内でその長手方向に沿って搬送しながら、めっき槽内のめっき液中において、アノードバッグ内のアノードとアノードバッグ外の被めっき材との間に電流を流して被めっき材をめっきする、電気めっき方法において、アノードバッグ内に吸引管を導入し、この吸引管の吸引口の最下端の高さがアノードの最下端から鉛直方向上方に70mm以下の高さになるように吸引口を配置し、被めっき材をめっきする際に、めっき液の液面の高さの最大低下量を1〜60mmに維持しながら吸引口からめっき液の一部を吸引した後に、めっき液の吸引を停止することを交互に繰り返すことにより、めっき液の一部を間欠的に吸引してめっき槽から排出することを特徴とする。 That is, the electroplating method according to the present invention, the long strip plate-shaped material to be plated in the plating tank while being conveyed along the longitudinal direction in the plating tank such that the width direction thereof is substantially vertical. In the electroplating method, in which a current is passed between the anode in the anode bag and the material to be plated outside the anode bag in the plating solution to plate the material to be plated, a suction pipe is introduced into the anode bag and the suction is performed. The suction port is arranged so that the height of the bottom end of the suction port of the tube is 70 mm or less in the vertical direction from the bottom end of the anode, and when plating the material to be plated, the level of the plating solution While sucking a part of the plating solution from the suction port while maintaining the maximum height reduction of 1 to 60 mm, the suction of the plating solution is alternately stopped to intermittently part of the plating solution. It is characterized in that it is sucked into and discharged from the plating tank.

この電気めっき方法において、アノードが、アノードバッグ内のアノードケースに収容された複数のアノードボールであるのが好ましい。あるいは、アノードが、アノードバッグ内において鉛直方向に対して略垂直で且つ被めっき材に対向する面に略平行な方向に互いに離間して配置された2つのアノードケースの各々に収容された複数のアノードボールでもよい。この場合、吸引管の吸引口が、2つのアノードケースの側面の間に配置されているのが好ましい。また、めっき液の一部を間欠的に吸引する際のめっき液のそれぞれの吸引の時間がめっき液のそれぞれの吸引停止の時間よりも短いのが好ましい。この場合、めっき液のそれぞれの吸引の時間が10〜250秒間であり、前記めっき液のそれぞれの吸引停止の時間が300〜2000秒間であるのが好ましい。また、アノードが、被めっき材の少なくとも一方の面に対向するように配置されるのが好ましい。また、吸引管の吸引口が、鉛直方向に対して略垂直な方向で且つ被めっき材に対向する面に略平行な方向におけるアノードバッグの略中央部に配置されるのが好ましい。 In this electroplating method, the anode is preferably a plurality of anode balls housed in an anode case in an anode bag. Alternatively, a plurality of anodes are housed in each of two anode cases that are arranged in the anode bag in a direction substantially perpendicular to the vertical direction and substantially parallel to the surface facing the material to be plated and separated from each other. It may be an anode ball. In this case, the suction port of the suction tube is preferably arranged between the side surfaces of the two anode cases. Further, it is preferable that the suction time of each of the plating solutions when intermittently sucking a part of the plating solution is shorter than the time of stopping each suction of the plating solution. In this case, it is preferable that the suction time of each plating solution is 10 to 250 seconds and the suction time of each plating solution is 300 to 2000 seconds. Further, it is preferable that the anode is arranged so as to face at least one surface of the material to be plated. Further, it is preferable that the suction port of the suction tube is arranged at a substantially central portion of the anode bag in a direction substantially perpendicular to the vertical direction and in a direction substantially parallel to the surface facing the material to be plated.

本発明によれば、めっき槽内のめっき液中においてアノードバッグ内のアノードとアノードバッグ外の被めっき材との間に電流を流して被めっき材をめっきする、電気めっき方法において、アノードバッグの底部に堆積したスラッジを除去しなくても、アノードバッグ内のめっき液の電導度の低下を抑制して、被めっき材に形成されるめっき皮膜の厚さの変化を抑制することができる。 According to the present invention, in an electroplating method for plating a material to be plated by passing a current between an anode in an anode bag and a material to be plated outside the anode bag in a plating solution in a plating tank, Even if the sludge accumulated on the bottom is not removed, it is possible to suppress the decrease in the conductivity of the plating solution in the anode bag and suppress the change in the thickness of the plating film formed on the material to be plated.

本発明による電気めっき方法の実施の形態に使用する電気めっき装置のめっき槽内のアノードとカソードとの位置関係を概略的に示す図である。It is a figure which shows schematically the positional relationship of the anode and cathode in the plating tank of the electroplating apparatus used for embodiment of the electroplating method by this invention. 図1の電気めっき装置のアノードを概略的に示す図である。It is a figure which shows schematically the anode of the electroplating apparatus of FIG. 図1電気めっき装置のアノードと吸引管を概略的に示す平面図である。1 is a plan view schematically showing the anode and the suction tube of the electroplating apparatus. 図1の電気めっき装置のアノードと吸引管を概略的に示す側面図である。It is a side view which shows schematically the anode and suction tube of the electroplating apparatus of FIG. 図1の電気めっき装置のアノードケースと吸引管との位置関係を概略的に示す斜視図である。It is a perspective view which shows schematically the positional relationship between the anode case and the suction tube of the electroplating apparatus of FIG.

以下、添付図面を参照して、本発明による電気めっき方法の実施の形態について詳細に説明する。 Hereinafter, embodiments of the electroplating method according to the present invention will be described in detail with reference to the accompanying drawings.

図1〜図4に示すように、本発明による電気めっき方法の実施の形態では、めっき槽10内のめっき液12中に複数(図示した実施の形態では4つ)のアノードバッグ14を浸漬し、各々のアノードバッグ14内に1つまたは複数(図示した実施の形態では2つ)のアノードケース16を収容し、各々のアノードケース16内に複数の可溶性のアノードボール18を収容し、各々のアノードバッグ14内に吸引管22を導入し、この吸引管22の1つまたは複数(図示した実施の形態では3つ)の吸引口22aを(アノードボール18を収容した)アノードケース16の側面(好ましくは、被めっき材20と対向しない側面)の下端部付近に対向して配置し、アノードバッグ14内のアノード(各々のアノードケース16内に収容された複数のアノードボール18)と、めっき槽10内のめっき液12中(のアノードバッグ14外)に導入するカソードとしての被めっき材20との間に電流を流して被めっき材20をめっきする際に、めっき槽10中のアノードバッグ12内のめっき液12の液面の高さの最大低下量を1〜60mm(好ましくは5〜55mm)に維持しながら吸引口22aからめっき液12の一部を吸引した後に、めっき液12の吸引を停止することを交互に繰り返すことにより、めっき液12の一部を間欠的に吸引してめっき槽10から排出する。 As shown in FIGS. 1 to 4, in the embodiment of the electroplating method according to the present invention, a plurality of (four in the illustrated embodiment) anode bags 14 are immersed in the plating solution 12 in the plating tank 10. , One or a plurality (two in the illustrated embodiment) of anode cases 16 are housed in each of the anode bags 14, and a plurality of soluble anode balls 18 are housed in each of the anode cases 16. A suction pipe 22 is introduced into the anode bag 14, and one or a plurality (three in the illustrated embodiment) of the suction pipe 22 are provided with suction ports 22 a (side faces of the anode case 16 (where the anode balls 18 are accommodated)). Preferably, the anode is disposed in the vicinity of the lower end portion of the side surface that does not face the material to be plated 20), the anode in the anode bag 14 (the plurality of anode balls 18 housed in each anode case 16), and the plating tank. When the material to be plated 20 is plated by passing a current between it and the material to be plated 20 as the cathode that is introduced into (outside of the anode bag 14) the plating solution 12 inside the anode bag 12 in the plating tank 10. Suction of the plating solution 12 after sucking a part of the plating solution 12 from the suction port 22a while maintaining the maximum reduction amount of the height of the liquid surface of the plating solution 12 within 1 to 60 mm (preferably 5 to 55 mm). By alternately repeating the above step, a part of the plating solution 12 is intermittently sucked and discharged from the plating tank 10.

被めっき材20は、長尺の帯板状の銅や銅合金などからなる圧延板であり、めっき槽10の長手方向に沿って且つその幅方向が略鉛直方向になるようにめっき槽10内で搬送されるようになっている。 The material 20 to be plated is a long strip-shaped rolled plate made of copper or a copper alloy, and is arranged in the plating tank 10 along the longitudinal direction of the plating tank 10 so that the width direction thereof is substantially vertical. It is supposed to be transported in.

アノードバッグ14とアノードケース16は、それぞれめっき槽10の上方で略水平に延びる銅製のアノードバー26からチタン製の板材24を介して吊り下げられ、めっき槽10内の被めっき材20の両面から所定の間隔で離間してその少なくとも一方の面(図示した実施の形態では両面)に対向するように(被めっき材20と略平行に)配置されている。 The anode bag 14 and the anode case 16 are suspended from a copper anode bar 26 that extends substantially horizontally above the plating tank 10 via a titanium plate material 24, and from both surfaces of the material 20 to be plated in the plating tank 10. They are arranged at a predetermined interval so as to face at least one surface (both surfaces in the illustrated embodiment) (substantially parallel to the material to be plated 20).

アノードバッグ14は、めっき液12が通過可能で且つ(電気めっきの際に生成されて沈降した)スラッジ28を通過させない材質からなり、例えば、ポリプロピレン、ポリエステル、ポリエチレン、サラン(登録商標)、テフロン(登録商標)などの織布バッグなどからなる。 The anode bag 14 is made of a material that allows the plating solution 12 to pass through but does not allow the sludge 28 (generated and settled during electroplating) to pass through. For example, polypropylene, polyester, polyethylene, Saran (registered trademark), Teflon ( (Registered trademark) and the like.

アノードケース16は、図4に示すように、内部に(長さ100〜2000mm程度、幅20〜100mm程度、高さ100〜600mm程度の)略直方体の空間を画定するチタン製バスケット(上面が開口し、側面がメッシュで、底面が板状の筐体)からなり、内部に複数のアノードボール18を収容し且つめっき液およびスラッジ28が通過できるようになっている。アノードボール18は、被めっき材20上に形成するめっき皮膜と同じ金属、例えば、Snめっきの場合はSn、Niめっきの場合はNiからなる略球状体である。なお、アノードケース16の底面には、電気めっきにより小さくなったアノードボール18を通過させず且つめっき液が通過可能な大きさの液抜き穴が形成されている。 As shown in FIG. 4, the anode case 16 has a titanium basket (upper surface is open) that defines a substantially rectangular parallelepiped space (having a length of about 100 to 2000 mm, a width of about 20 to 100 mm, and a height of about 100 to 600 mm). However, the side surface is a mesh and the bottom surface is a plate-shaped casing), and accommodates a plurality of anode balls 18 therein and allows the plating solution and the sludge 28 to pass therethrough. The anode ball 18 is a substantially spherical body made of the same metal as the plating film formed on the plated material 20, for example, Sn in the case of Sn plating and Ni in the case of Ni plating. The bottom surface of the anode case 16 is formed with a drain hole having a size that does not allow the anode ball 18 reduced in size by electroplating to pass through but allows the plating solution to pass through.

アノードケース16の側面に対向するように、鉛直方向に対して略垂直で且つ被めっき材20に対向する面に略平行な方向におけるアノードバッグ14の略中央部に(図示した実施の形態ではアノードバッグ14内に収容された2つのアノードケース16の対向する側面の間に)吸引管22の(1つまたは複数の)吸引口22aが配置され、吸引口22aの最下端の高さがアノードケース16内のアノードボール18の最下端から鉛直方向上方に70mm以下(好ましくは60mm以下)の高さになるように配置されている。なお、吸引口22aの最上端の高さがアノードケース16内のアノードボール18の最下端から鉛直方向上方に70mm以下の高さになるのが好ましい。 At a substantially central portion of the anode bag 14 in a direction substantially perpendicular to the vertical direction and substantially parallel to a surface facing the material to be plated 20 so as to face the side surface of the anode case 16 (in the illustrated embodiment, the anode The suction port 22a (one or more) of the suction tube 22 is arranged between the opposing side surfaces of the two anode cases 16 housed in the bag 14, and the height of the lowermost end of the suction port 22a is the anode case. The anode balls 18 in 16 are arranged so as to have a height of 70 mm or less (preferably 60 mm or less) vertically upward from the lowermost end. The height of the uppermost end of the suction port 22a is preferably 70 mm or less in the vertical direction from the lowermost end of the anode ball 18 in the anode case 16.

アノードケース16の側面は、対向するアノードバッグ14の側面から所定の間隔(好ましくは5〜10mmの間隔)で離間し、アノードケース16の底面は、アノードバッグ14の底面から所定の間隔(好ましくは30mm以上、さらに好ましくは50mm程度の間隔)で離間している。このようにアノードケース16の底面がアノードバッグ14の底面から所定の間隔で離間していることにより、吸引管22の吸引口22aがアノードバッグ16により塞がれるのを防止することができるとともに、アノードバッグ14の底面にスラッジ28が堆積しても、そのスラッジ28とアノードケース14の間に間隙ができ、スラッジ28の吸引を抑制することができる。吸引管22の吸引口22aからのめっき液12の吸引は、めっき液12の吸引と吸引停止をそれぞれ一定時間で交互に繰り返すように間欠的に行われ、めっき液12の吸引時間(好ましくは10〜250秒間)がめっき液12の吸引停止時間(好ましくは300〜2000秒間)よりも短くなっている。なお、吸引管22により吸引した(アノードバッグ14内の)めっき液12は、(図示しない)フィルタを通してめっき液調整槽で成分調整され、めっき槽10内(のアノードバッグ14外)に戻されて、めっき液12の吸引停止時間内に、アノードバッグ14内に浸透して、アノードバッグ14内のめっき液12の液面の高さが初期の高さに戻るようになっている。 The side surface of the anode case 16 is spaced from the side surface of the facing anode bag 14 at a predetermined distance (preferably a distance of 5 to 10 mm), and the bottom surface of the anode case 16 is at a predetermined distance from the bottom surface of the anode bag 14 (preferably, a distance). The distance is 30 mm or more, and more preferably about 50 mm. Since the bottom surface of the anode case 16 is separated from the bottom surface of the anode bag 14 at a predetermined interval in this manner, the suction port 22a of the suction tube 22 can be prevented from being blocked by the anode bag 16. Even if the sludge 28 is deposited on the bottom surface of the anode bag 14, a gap is formed between the sludge 28 and the anode case 14, and suction of the sludge 28 can be suppressed. The suction of the plating solution 12 from the suction port 22a of the suction tube 22 is performed intermittently so that the suction of the plating solution 12 and the stop of the suction are alternately repeated for a fixed time, and the suction time of the plating solution 12 (preferably 10 times). ~250 seconds) is shorter than the suction stop time of the plating solution 12 (preferably 300 to 2000 seconds). The plating solution 12 (in the anode bag 14) sucked by the suction tube 22 is adjusted in composition in a plating solution adjusting tank through a filter (not shown) and returned to the inside of the plating tank 10 (outside of the anode bag 14). During the suction stop time of the plating solution 12, the plating solution 12 permeates into the anode bag 14 and the height of the liquid surface of the plating solution 12 in the anode bag 14 returns to the initial height.

本発明による電気めっき方法の実施の形態では、めっき槽10内のめっき液12中のアノードバッグ14内に導入した吸引管22の吸引口22aの最下端の高さがアノード(アノードケース16内に収容されたアノードボール18)の最下端から鉛直方向上方に70mm以下(好ましくは60mm以下)の高さになるように、吸引管22の吸引口22aを複数のアノードの隣接する2つのアノードの側面の間に配置するとともに、被めっき材20をめっきする際に、めっき槽10中のアノードバッグ14内のめっき液12の液面の高さの最大低下量を1〜60mmに維持しながら吸引口22aからめっき液12の一部を吸引してめっき槽10から排出しているので、アノードバッグ14の底部に堆積したスラッジ28の吸引を抑制して、アノードの下端部付近のめっき液12を効果的に吸引することができるため、アノードバッグ14外のめっき液12をアノードバッグ14内に供給して、アノードの電気反応により生じる変質しためっき液12をアノードバッグ14内外で入れ替えることができ、アノードバッグ14の底部のめっき液12の電導度の低下を抑制(アノードバッグ14内のめっき液12の深さ方向の電導度差を低減)し、アノードの下端部付近からの電流の減少を抑制し、被めっき材20の下側部分のめっき皮膜の厚さの低下を抑制して、めっき槽10の鉛直方向におけるめっき皮膜の厚さの変化を抑制することができるとともに、スラッジを吸引して除去するための大きな配管をアノードバッグの底部に設置する必要がなく、多量のスラッジの吸引を防止してフィルタの寿命が短くなるのを防止することができる。 In the embodiment of the electroplating method according to the present invention, the height of the lowermost end of the suction port 22a of the suction pipe 22 introduced into the anode bag 14 in the plating solution 12 in the plating tank 10 is the anode (in the anode case 16). The suction port 22a of the suction pipe 22 is formed so as to have a height of 70 mm or less (preferably 60 mm or less) vertically upward from the lowermost end of the accommodated anode ball 18) and the side surfaces of two adjacent anodes of the plurality of anodes. And the suction port while maintaining the maximum amount of decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 in the plating tank 10 at 1 to 60 mm when the material 20 to be plated is plated. Since a part of the plating solution 12 is sucked from 22a and discharged from the plating tank 10, suction of the sludge 28 accumulated on the bottom of the anode bag 14 is suppressed, and the plating solution 12 near the lower end of the anode is effective. Since it can be sucked into the anode bag 14, the plating solution 12 outside the anode bag 14 can be supplied into the anode bag 14, and the deteriorated plating solution 12 generated by the electric reaction of the anode can be replaced inside and outside the anode bag 14. The lowering of the conductivity of the plating solution 12 at the bottom of the bag 14 is suppressed (the difference in the conductivity of the plating solution 12 in the anode bag 14 in the depth direction is reduced), and the decrease of the current from the vicinity of the lower end of the anode is suppressed. , It is possible to suppress a decrease in the thickness of the plating film on the lower side of the material to be plated 20 and to suppress a change in the thickness of the plating film in the vertical direction of the plating tank 10, and to remove sludge by suction. It is not necessary to install a large pipe for doing so at the bottom of the anode bag, and it is possible to prevent suction of a large amount of sludge and prevent the life of the filter from being shortened.

なお、本発明による電気めっき方法の実施の形態は、スラッジの発生量が多いSnめっきに適用するのが好ましい。 The embodiment of the electroplating method according to the present invention is preferably applied to Sn plating in which a large amount of sludge is generated.

以下、本発明による電気めっき方法の実施例について詳細に説明する。 Hereinafter, examples of the electroplating method according to the present invention will be described in detail.

[実施例1]
図1〜4に示す電気めっき装置において、硫酸第一錫(SnSO)70g/Lと硫酸(HSO)75g/Lと(レベリング剤として)クレゾールスルホン酸30g/Lと(界面活性剤として)ポリオキシエチレンアルキルアミン2mL/Lとを含有する水溶液からなるSnめっき液を約300Lの容量のめっき槽10に入れ、アノードケース16の長手方向の長さを500mm、幅を60mm、高さを400mmとし、アノードケース16の底面とアノードバッグ14の底面との間隔を50mm程度とし、アノードボール18として直径50mmのSnボールを使用し、リール・ツー・リール方式で幅250mm、厚さ0.25mmの長尺の帯板状のCuからなる圧延板を被めっき材20として搬送しながら、電気めっきを行って、被めっき材20の両面に厚さ1.0μmのSnめっき皮膜を形成した。
[Example 1]
In the electroplating apparatus shown in FIGS. 1 to 4, stannous sulfate (SnSO 4 ) 70 g/L, sulfuric acid (H 2 SO 4 ) 75 g/L, cresolsulfonic acid 30 g/L (as a leveling agent) (surfactant) As a Sn plating solution consisting of an aqueous solution containing 2 mL/L of polyoxyethylene alkylamine is placed in a plating tank 10 having a capacity of about 300 L, and the length of the anode case 16 in the longitudinal direction is 500 mm, the width is 60 mm, and the height is 60 mm. Is 400 mm, the distance between the bottom surface of the anode case 16 and the bottom surface of the anode bag 14 is about 50 mm, Sn balls having a diameter of 50 mm are used as the anode balls 18, and a width of 250 mm and a thickness of 0. While carrying a 25 mm long strip-shaped Cu-made rolled plate as the material 20 to be plated, electroplating was performed to form a Sn plating film having a thickness of 1.0 μm on both surfaces of the material 20 to be plated.

なお、各々のアノードバッグ14内の2つのアノードケース16の対向する側面の間(アノードバッグ14内の長手方向中央部)に吸引管22の3つの吸引口22aを配置し、吸引口22aの最下端(吸引管22の先端の吸引口22a)をアノードケース16内のアノードボール18の最下端(から鉛直方向上方に0mmの高さ)に配置するとともに、吸引口22aの最上端(吸引管22の先端付近の側面部の吸引口22aの最上端)をアノードケース16内のアノードボール18の最下端から鉛直方向上方に20mmの高さに配置(直径10mmの吸引口22aを吸引管22の先端から鉛直方向上方に10mm離間して配置)して、電気めっきの際に、めっき液12の吸引時間を120秒、吸引停止時間を840秒として、めっき液12を吸引流量5L/分で間欠的に吸引した。この吸引時のアノードバッグ14内のめっき液12の液面の高さの最大低下量は20mmであった。なお、この吸引後の吸引停止時間内にアノードバッグ14外のめっき液12がアノードバッグ14内に浸透してアノードバッグ14内のめっき液12の液面の高さは初期の高さに戻った。 It should be noted that the three suction ports 22a of the suction pipe 22 are arranged between the opposing side surfaces of the two anode cases 16 in each anode bag 14 (the central portion in the longitudinal direction within the anode bag 14), and the suction ports 22a are set to the maximum positions. The lower end (the suction port 22a at the tip of the suction pipe 22) is arranged at the lowest end of the anode ball 18 in the anode case 16 (the height of 0 mm upward in the vertical direction), and the upper end of the suction port 22a (the suction pipe 22). The uppermost end of the suction port 22a on the side surface near the tip end of the suction tube 22 in the vertical direction upward from the lowermost end of the anode ball 18 in the anode case 16 (the suction port 22a having a diameter of 10 mm is attached to the tip of the suction tube 22). 10 mm above the vertical direction), and during the electroplating, the suction time of the plating solution 12 is 120 seconds, the suction stop time is 840 seconds, and the plating solution 12 is intermittently sucked at a flow rate of 5 L/min. Sucked into. The maximum decrease in the height of the liquid surface of the plating solution 12 in the anode bag 14 during the suction was 20 mm. It should be noted that the plating solution 12 outside the anode bag 14 permeated into the anode bag 14 within the suction stop time after this suction, and the height of the liquid surface of the plating solution 12 in the anode bag 14 returned to the initial height. ..

このようにして電気めっきを行って、2週間経過後に、アノードバッグ14外の上澄み(約100mL)を採取して電導度を測定するとともに、アノードバッグ14内の被めっき材20の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置(アノードケース16の底部付近)のめっき液12(約100mL)を採取して電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は211mS/cmであり、アノードバッグ内14の被めっき材の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置のめっき液12の電導度の(アノードバッグ14外のめっき液12の上澄み液の電導度に対する)低下量は、それぞれ28mS/cm、30mS/cmおよび38mS/cmであった。なお、電導度は、電導度計(メトラー・トレド株式会社製のSeven2Go)を使用し、サンプル中にセンサを設置して、電磁誘導法により測定時間数十秒で測定した。 Electroplating is carried out in this manner, and after 2 weeks, the supernatant (about 100 mL) outside the anode bag 14 is sampled to measure the electrical conductivity, and at the same time, the introduction side and the center of the material 20 to be plated inside the anode bag 14 are measured. Of the plating solution 12 (about 100 mL) at a position 300 mm (near the bottom of the anode case 16) vertically downward from the liquid surface on the discharge side and the discharge side, the conductivity of the plating solution 12 outside the anode bag 14 was measured. The conductivity of the supernatant liquid is 211 mS/cm, and the conductivity of the plating liquid 12 at a position 300 mm vertically below the liquid surface of the material to be plated in the anode bag 14 on the introduction side, the central portion and the discharge side ( The reductions (with respect to the conductivity of the supernatant of the plating solution 12 outside the anode bag 14) were 28 mS/cm, 30 mS/cm and 38 mS/cm, respectively. The electric conductivity was measured by using an electric conductivity meter (Seven2Go manufactured by METTLER TOLEDO Co., Ltd.), setting a sensor in the sample, and measuring the time by tens of seconds by an electromagnetic induction method.

また、被めっき材20の両面のそれぞれのSnめっき皮膜(の幅方向端部から10mmの周縁部を除いた部分)の厚さを幅方向に5mm間隔の位置で測定して、Snめっき皮膜の幅方向の厚さの最大値と最小値の差(それぞれの面のSnめっき皮膜の幅方向の厚さの最大値と最小値の差の大きい方の値)を求めたところ、0.2μmであり、厚さの差が小さかった。なお、Snめっき皮膜の厚さは、蛍光X線膜厚計(SSIナノサイエンス株式会社製のSFT3300S)を使用し、励起法により直径0.5mmの範囲を15秒間で測定した。 In addition, the thickness of each Sn plating film (portion excluding the peripheral portion of 10 mm from the widthwise end portion thereof) on both surfaces of the material to be plated 20 was measured at positions at intervals of 5 mm in the width direction, and the Sn plating film The difference between the maximum value and the minimum value in the width direction (the larger value between the maximum value and the minimum value in the width direction of the Sn plating film on each surface, whichever is larger) was calculated and found to be 0.2 μm. Yes, the difference in thickness was small. The thickness of the Sn plating film was measured by a fluorescent X-ray film thickness meter (SFT3300S manufactured by SSI Nanoscience Co., Ltd.) in a range of 0.5 mm in diameter for 15 seconds by an excitation method.

[実施例2]
電気めっきの際に、めっき液12の吸引時間を60秒、吸引停止時間を420秒とし、めっき液12の吸引流量を4L/分として間欠的に吸引した以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面に厚さ1.0μmのSnめっき皮膜を形成した。なお、めっき液12の吸引時のアノードバッグ14内のめっき液12の液面の高さの最大低下量は20mmであった。なお、この吸引後の吸引停止時間内にアノードバッグ14外のめっき液12がアノードバッグ14内に浸透してアノードバッグ14内のめっき液12の液面の高さは初期の高さに戻った。
[Example 2]
At the time of electroplating, the same method as in Example 1 except that the suction time of the plating solution 12 was set to 60 seconds, the suction stop time was set to 420 seconds, and the suction flow rate of the plating solution 12 was set to 4 L/min to intermittently suction. Electroplating was performed to form Sn-plated films with a thickness of 1.0 μm on both surfaces of the material 20 to be plated. The maximum decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 during the suction of the plating solution 12 was 20 mm. It should be noted that the plating solution 12 outside the anode bag 14 permeated into the anode bag 14 within the suction stop time after this suction, and the height of the liquid surface of the plating solution 12 in the anode bag 14 returned to the initial height. ..

このようにして電気めっきを行って、2週間経過後に、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定するとともに、アノードバッグ14内の被めっき材20の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置(アノードケース16の底部付近)のめっき液12の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は220mS/cmであり、アノードバッグ内14の被めっき材の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置のめっき液12の電導度の(アノードバッグ14外のめっき液12の上澄み液の電導度に対する)低下量は、それぞれ35mS/cm、30mS/cmおよび28mS/cmであった。また、実施例1と同様の方法により、Snめっき皮膜の幅方向の厚さの最大値と最小値の差を求めたところ、0.2μmであり、厚さの差が小さかった。 Electroplating is performed in this manner, and after 2 weeks, the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 is measured by the same method as in Example 1, and the plating in the anode bag 14 is performed. The conductivity of the plating solution 12 at a position 300 mm (near the bottom of the anode case 16) vertically downward from the liquid surfaces of the introduction side, the central part and the discharge side of the material 20 was measured, and the plating solution 12 outside the anode bag 14 was measured. The conductivity of the supernatant liquid is 220 mS/cm, and the conductivity of the plating liquid 12 at a position 300 mm vertically below the liquid surface of the material to be plated in the anode bag 14 on the introduction side, the central portion and the discharge side ( The amount of decrease (relative to the conductivity of the supernatant of the plating solution 12 outside the anode bag 14) was 35 mS/cm, 30 mS/cm and 28 mS/cm, respectively. Further, when the difference between the maximum value and the minimum value of the thickness of the Sn plating film in the width direction was obtained by the same method as in Example 1, it was 0.2 μm, and the difference in thickness was small.

[実施例3]
電気めっきの際に、めっき液12の吸引流量を2L/分として間欠的に吸引した以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面に厚さ1.0μmのSnめっき皮膜を形成した。なお、めっき液12の吸引時のアノードバッグ14内のめっき液12の液面の高さの最大低下量は10mmであった。なお、この吸引後の吸引停止時間内にアノードバッグ14外のめっき液12がアノードバッグ14内に浸透してアノードバッグ14内のめっき液12の液面の高さは初期の高さに戻った。
[Example 3]
At the time of electroplating, electroplating was performed in the same manner as in Example 1 except that the suction flow rate of the plating solution 12 was set to 2 L/min and suction was performed intermittently to obtain a thickness of 1. A Sn plating film of 0 μm was formed. The maximum decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 during suction of the plating solution 12 was 10 mm. It should be noted that the plating solution 12 outside the anode bag 14 permeated into the anode bag 14 within the suction stop time after this suction, and the height of the liquid surface of the plating solution 12 in the anode bag 14 returned to the initial height. ..

このようにして電気めっきを行って、2週間経過後に、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定するとともに、アノードバッグ14内の被めっき材20の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置(アノードケース16の底部付近)のめっき液12の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は216mS/cmであり、アノードバッグ内14の被めっき材の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置のめっき液12の電導度の(アノードバッグ14外のめっき液12の上澄み液の電導度に対する)低下量は、それぞれ82mS/cm、40mS/cmおよび77mS/cmであった。また、実施例1と同様の方法により、Snめっき皮膜の幅方向の厚さの最大値と最小値の差を求めたところ、0.3μmであり、厚さの差が小さかった。 Electroplating is performed in this manner, and after 2 weeks, the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 is measured by the same method as in Example 1, and the plating in the anode bag 14 is performed. The conductivity of the plating solution 12 at a position 300 mm (near the bottom of the anode case 16) vertically downward from the liquid surfaces of the introduction side, the central part and the discharge side of the material 20 was measured, and the plating solution 12 outside the anode bag 14 was measured. The electric conductivity of the supernatant liquid is 216 mS/cm, and the electric conductivity of the plating liquid 12 at a position 300 mm vertically downward from the liquid surface on the introduction side, the central portion and the discharge side of the material to be plated in the anode bag 14 ( The reductions (with respect to the conductivity of the supernatant of the plating solution 12 outside the anode bag 14) were 82 mS/cm, 40 mS/cm and 77 mS/cm, respectively. Further, when the difference between the maximum value and the minimum value of the thickness of the Sn plating film in the width direction was obtained by the same method as in Example 1, it was 0.3 μm, and the difference in thickness was small.

[実施例4]
電気めっきの際に、めっき液12の吸引流量を10L/分として間欠的に吸引した以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面に厚さ1.0μmのSnめっき皮膜を形成した。なお、めっき液12の吸引時のアノードバッグ14内のめっき液12の液面の高さの最大低下量は50mmであった。なお、この吸引後の吸引停止時間内にアノードバッグ14外のめっき液12がアノードバッグ14内に浸透してアノードバッグ14内のめっき液12の液面の高さは初期の高さに戻った。
[Example 4]
At the time of electroplating, electroplating was performed by the same method as in Example 1 except that the suction flow rate of the plating solution 12 was set to 10 L/min to intermittently suck the plated material 20 to a thickness of 1. A Sn plating film of 0 μm was formed. The maximum decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 during suction of the plating solution 12 was 50 mm. It should be noted that the plating solution 12 outside the anode bag 14 permeated into the anode bag 14 within the suction stop time after this suction, and the height of the liquid surface of the plating solution 12 in the anode bag 14 returned to the initial height. ..

このようにして電気めっきを行って、2週間経過後に、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定するとともに、アノードバッグ14内の被めっき材20の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置(アノードケース16の底部付近)のめっき液12の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は217mS/cmであり、アノードバッグ内14の被めっき材の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置のめっき液12の電導度の(アノードバッグ14外のめっき液12の上澄み液の電導度に対する)低下量は、それぞれ19mS/cm、10mS/cmおよび22mS/cmであった。また、実施例1と同様の方法により、Snめっき皮膜の幅方向の厚さの最大値と最小値の差を求めたところ、0.2μmであり、厚さの差が小さかった。 Electroplating is performed in this manner, and after 2 weeks, the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 is measured by the same method as in Example 1, and the plating in the anode bag 14 is performed. The conductivity of the plating solution 12 at a position 300 mm (near the bottom of the anode case 16) vertically downward from the liquid surfaces of the introduction side, the central part and the discharge side of the material 20 was measured, and the plating solution 12 outside the anode bag 14 was measured. The conductivity of the supernatant liquid is 217 mS/cm, and the conductivity of the plating liquid 12 at a position 300 mm vertically downward from the liquid surface of the material to be plated in the anode bag 14 on the introduction side, the central portion and the discharge side ( The amount of decrease (relative to the conductivity of the supernatant of the plating solution 12 outside the anode bag 14) was 19 mS/cm, 10 mS/cm and 22 mS/cm, respectively. Further, when the difference between the maximum value and the minimum value of the thickness of the Sn plating film in the width direction was obtained by the same method as in Example 1, it was 0.2 μm, and the difference in thickness was small.

[実施例5]
吸引管22の吸引口22aの最下端をアノードケース16内のアノードボール18の最下端から鉛直方向上方に50mmの高さに配置(吸引口22aの最上端をアノードケース16内のアノードボール18の最下端から鉛直方向上方に70mmの高さに配置)した以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面に厚さ1.0μmのSnめっき皮膜を形成した。なお、めっき液12の吸引時のアノードバッグ14内のめっき液12の液面の高さの最大低下量は20mmであった。なお、この吸引後の吸引停止時間内にアノードバッグ14外のめっき液12がアノードバッグ14内に浸透してアノードバッグ14内のめっき液12の液面の高さは初期の高さに戻った。
[Example 5]
The lowermost end of the suction port 22a of the suction pipe 22 is arranged vertically upward from the lowermost end of the anode ball 18 in the anode case 16 at a height of 50 mm (the uppermost end of the suction port 22a is located in the anode case 18). Electroplating is performed in the same manner as in Example 1 except that the Sn plating film having a thickness of 1.0 μm is formed on both surfaces of the material to be plated 20 except that the Sn plating film is arranged at a height of 70 mm vertically above the bottom end. did. The maximum decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 during the suction of the plating solution 12 was 20 mm. It should be noted that the plating solution 12 outside the anode bag 14 permeated into the anode bag 14 within the suction stop time after this suction, and the height of the liquid surface of the plating solution 12 in the anode bag 14 returned to the initial height. ..

このようにして電気めっきを行って、2週間経過後に、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定するとともに、アノードバッグ14内の被めっき材20の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置(アノードケース16の底部付近)のめっき液12の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は230mS/cmであり、アノードバッグ内14の被めっき材の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置のめっき液12の電導度の(アノードバッグ14外のめっき液12の上澄み液の電導度に対する)低下量は、それぞれ73mS/cm、43mS/cmおよび65mS/cmであった。また、実施例1と同様の方法により、Snめっき皮膜の幅方向の厚さの最大値と最小値の差を求めたところ、0.3μmであり、厚さの差が小さかった。 Electroplating is performed in this manner, and after 2 weeks, the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 is measured by the same method as in Example 1, and the plating in the anode bag 14 is performed. The conductivity of the plating solution 12 at a position 300 mm (near the bottom of the anode case 16) vertically downward from the liquid surfaces of the introduction side, the central part and the discharge side of the material 20 was measured, and the plating solution 12 outside the anode bag 14 was measured. The electric conductivity of the supernatant liquid is 230 mS/cm, and the electric conductivity of the plating liquid 12 at a position 300 mm vertically below the liquid surface of the material to be plated in the anode bag 14 on the introduction side, the central portion and the discharge side ( The amount of decrease (relative to the conductivity of the supernatant of the plating solution 12 outside the anode bag 14) was 73 mS/cm, 43 mS/cm, and 65 mS/cm, respectively. Further, when the difference between the maximum value and the minimum value of the thickness of the Sn plating film in the width direction was obtained by the same method as in Example 1, it was 0.3 μm, and the difference in thickness was small.

[実施例6]
吸引管22の吸引口22aの最下端をアノードケース16内のアノードボール18の最下端から鉛直方向上方に20mmの高さに配置(吸引口22aの最上端をアノードケース16内のアノードボール18の最下端から鉛直方向上方に40mmの高さに配置)し、電気めっきの際に、めっき液12の吸引時間を45秒、吸引停止時間を315秒として間欠的に吸引した以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面に厚さ1.0μmのSnめっき皮膜を形成した。なお、めっき液12の吸引時のアノードバッグ14内のめっき液12の液面の高さの最大低下量は10mmであった。なお、この吸引後の吸引停止時間内にアノードバッグ14外のめっき液12がアノードバッグ14内に浸透してアノードバッグ14内のめっき液12の液面の高さは初期の高さに戻った。
[Example 6]
The lowermost end of the suction port 22a of the suction tube 22 is arranged vertically upward from the lowermost end of the anode ball 18 in the anode case 16 at a height of 20 mm (the uppermost end of the suction port 22a is located in the anode case 18). Example 1 except that the suction was performed intermittently with the suction time of the plating solution 12 set to 45 seconds and the suction stop time set to 315 seconds during electroplating. Electroplating was performed in the same manner as in (1) to form a Sn plating film having a thickness of 1.0 μm on both surfaces of the material to be plated 20. The maximum decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 during suction of the plating solution 12 was 10 mm. It should be noted that the plating solution 12 outside the anode bag 14 permeated into the anode bag 14 within the suction stop time after this suction, and the height of the liquid surface of the plating solution 12 in the anode bag 14 returned to the initial height. ..

このようにして電気めっきを行って、2週間経過後に、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定するとともに、アノードバッグ14内の被めっき材20の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置(アノードケース16の底部付近)のめっき液12の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は224mS/cmであり、アノードバッグ内14の被めっき材の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置のめっき液12の電導度の(アノードバッグ14外のめっき液12の上澄み液の電導度に対する)低下量は、それぞれ40mS/cm、37mS/cmおよび40mS/cmであった。また、実施例1と同様の方法により、Snめっき皮膜の幅方向の厚さの最大値と最小値の差を求めたところ、0.3μmであり、厚さの差が小さかった。 Electroplating is performed in this manner, and after 2 weeks, the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 is measured by the same method as in Example 1, and the plating in the anode bag 14 is performed. The conductivity of the plating solution 12 at a position 300 mm (near the bottom of the anode case 16) vertically downward from the liquid surfaces of the introduction side, the central part and the discharge side of the material 20 was measured, and the plating solution 12 outside the anode bag 14 was measured. The conductivity of the supernatant liquid is 224 mS/cm, and the conductivity of the plating liquid 12 at a position 300 mm vertically downward from the liquid surface of the material to be plated in the anode bag 14 on the introduction side, the central portion and the discharge side ( The amount of decrease (relative to the conductivity of the supernatant of the plating solution 12 outside the anode bag 14) was 40 mS/cm, 37 mS/cm and 40 mS/cm, respectively. Further, when the difference between the maximum value and the minimum value of the thickness of the Sn plating film in the width direction was obtained by the same method as in Example 1, it was 0.3 μm, and the difference in thickness was small.

[比較例1]
めっき液12の吸引を行わなかった以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面に厚さ1.0μmのSnめっき皮膜を形成した。
[Comparative Example 1]
Electroplating was performed in the same manner as in Example 1 except that the plating solution 12 was not sucked to form Sn-plated films with a thickness of 1.0 μm on both surfaces of the plated material 20.

このようにして電気めっきを行って、2週間経過後に、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定するとともに、アノードバッグ14内の被めっき材20の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置(アノードケース16の底部付近)のめっき液12の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は217mS/cmであり、アノードバッグ内14の被めっき材の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置のめっき液12の電導度の(アノードバッグ14外のめっき液12の上澄み液の電導度に対する)低下量は、それぞれ133mS/cm、135mS/cmおよび128mS/cmであった。また、実施例1と同様の方法により、Snめっき皮膜の幅方向の厚さの最大値と最小値の差を求めたところ、0.7μmであり、厚さの差が大きかった。 Electroplating is performed in this manner, and after 2 weeks, the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 is measured by the same method as in Example 1, and the plating in the anode bag 14 is performed. The conductivity of the plating solution 12 at a position 300 mm (near the bottom of the anode case 16) vertically downward from the liquid surfaces of the introduction side, the central part and the discharge side of the material 20 was measured, and the plating solution 12 outside the anode bag 14 was measured. The conductivity of the supernatant liquid is 217 mS/cm, and the conductivity of the plating liquid 12 at a position 300 mm vertically downward from the liquid surface of the material to be plated in the anode bag 14 on the introduction side, the central portion and the discharge side ( The reductions (relative to the conductivity of the supernatant of the plating solution 12 outside the anode bag 14) were 133 mS/cm, 135 mS/cm and 128 mS/cm, respectively. Further, when the difference between the maximum value and the minimum value of the thickness of the Sn plating film in the width direction was obtained by the same method as in Example 1, it was 0.7 μm, and the difference in thickness was large.

[比較例2]
電気めっきの際に、めっき液12の吸引流量を0.5L/分として間欠的に吸引した以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面に厚さ1.0μmのSnめっき皮膜を形成した。なお、めっき液12の吸引時のアノードバッグ14内のめっき液12の液面の高さの最大低下量は0mmであった。
[Comparative example 2]
At the time of electroplating, electroplating was performed in the same manner as in Example 1 except that the suction flow rate of the plating solution 12 was set to 0.5 L/min and suction was performed intermittently to obtain a thickness on both surfaces of the material 20 to be plated. A 1.0 μm Sn plating film was formed. The maximum decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 during the suction of the plating solution 12 was 0 mm.

このようにして電気めっきを行って、2週間経過後に、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定するとともに、アノードバッグ14内の被めっき材20の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置(アノードケース16の底部付近)のめっき液12の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は220mS/cmであり、アノードバッグ内14の被めっき材の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置のめっき液12の電導度の(アノードバッグ14外のめっき液12の上澄み液の電導度に対する)低下量は、それぞれ128mS/cm、115mS/cmおよび122mS/cmであった。また、実施例1と同様の方法により、Snめっき皮膜の幅方向の厚さの最大値と最小値の差を求めたところ、0.6μmであり、厚さの差が大きかった。 Electroplating is performed in this manner, and after 2 weeks, the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 is measured by the same method as in Example 1, and the plating in the anode bag 14 is performed. The conductivity of the plating solution 12 at a position 300 mm (near the bottom of the anode case 16) vertically downward from the liquid surfaces of the introduction side, the central part and the discharge side of the material 20 was measured, and the plating solution 12 outside the anode bag 14 was measured. The conductivity of the supernatant liquid is 220 mS/cm, and the conductivity of the plating liquid 12 at a position 300 mm vertically below the liquid surface of the material to be plated in the anode bag 14 on the introduction side, the central portion and the discharge side ( The amount of decrease (relative to the conductivity of the supernatant of the plating solution 12 outside the anode bag 14) was 128 mS/cm, 115 mS/cm and 122 mS/cm, respectively. Further, when the difference between the maximum value and the minimum value of the width of the Sn plating film in the width direction was obtained by the same method as in Example 1, it was 0.6 μm, and the difference in thickness was large.

[比較例3]
電気めっきの際に、めっき液12の吸引流量を15L/分として間欠的に吸引した以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面に厚さ1.0μmのSnめっき皮膜を形成した。なお、めっき液12の吸引時のアノードバッグ14内のめっき液12の液面の高さの最大低下量が70mmと大きかった。
[Comparative Example 3]
At the time of electroplating, electroplating was performed in the same manner as in Example 1 except that the suction flow rate of the plating solution 12 was intermittently set to 15 L/min, and the thickness of 1. A Sn plating film of 0 μm was formed. The maximum decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 during suction of the plating solution 12 was as large as 70 mm.

このようにして電気めっきを行って、2週間経過後に、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定するとともに、アノードバッグ14内の被めっき材20の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置(アノードケース16の底部付近)のめっき液12の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は219mS/cmであり、アノードバッグ内14の被めっき材の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置のめっき液12の電導度の(アノードバッグ14外のめっき液12の上澄み液の電導度に対する)低下量は、それぞれ13mS/cm、12mS/cmおよび15mS/cmであった。また、実施例1と同様の方法により、Snめっき皮膜の幅方向の厚さの最大値と最小値の差を求めたところ、0.6μmであり、厚さの差が大きかった。なお、本比較例では、めっき液12の吸引時のアノードバッグ14内のめっき液12の液面の高さの最大低下量が80mmと大きかったため、被めっき材20の上側に流れる電流が小さくなって、被めっき材20の上側のSnめっき皮膜が薄くなり、Snめっき皮膜の幅方向の厚さの最大値と最小値の差が大きくなったと考えられる。 Electroplating is performed in this manner, and after 2 weeks, the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 is measured by the same method as in Example 1, and the plating in the anode bag 14 is performed. The conductivity of the plating solution 12 at a position 300 mm (near the bottom of the anode case 16) vertically downward from the liquid surfaces of the introduction side, the central part and the discharge side of the material 20 was measured, and the plating solution 12 outside the anode bag 14 was measured. The electric conductivity of the supernatant liquid is 219 mS/cm, and the electric conductivity of the plating liquid 12 at a position 300 mm vertically below the liquid surface of the material to be plated in the anode bag 14 on the introduction side, the central portion and the discharge side ( The amount of decrease (relative to the conductivity of the supernatant of the plating solution 12 outside the anode bag 14) was 13 mS/cm, 12 mS/cm and 15 mS/cm, respectively. Further, when the difference between the maximum value and the minimum value of the width of the Sn plating film in the width direction was obtained by the same method as in Example 1, it was 0.6 μm, and the difference in thickness was large. In this comparative example, since the maximum amount of decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 during suction of the plating solution 12 was as large as 80 mm, the current flowing to the upper side of the material to be plated 20 was small. Therefore, it is considered that the Sn plating film on the upper side of the material 20 to be plated becomes thin and the difference between the maximum value and the minimum value of the thickness of the Sn plating film in the width direction becomes large.

[比較例4]
吸引管22の吸引口22aの最下端をアノードケース16内のアノードボール18の最下端から鉛直方向上方に100mmの高さに配置(吸引口22aの最上端をアノードケース16内のアノードボール18の最下端から鉛直方向上方に120mmの高さに配置)し、電気めっきの際に、めっき液12の吸引流量を10L/分として間欠的に吸引した以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面に厚さ1.0μmのSnめっき皮膜を形成した。なお、めっき液12の吸引時のアノードバッグ14内のめっき液12の液面の高さの最大低下量は50mmであった。なお、この吸引後の吸引停止時間内にアノードバッグ14外のめっき液12がアノードバッグ14内に浸透してアノードバッグ14内のめっき液12の液面の高さは初期の高さに戻った。
[Comparative Example 4]
The lowermost end of the suction port 22a of the suction pipe 22 is arranged vertically upward from the lowermost end of the anode ball 18 in the anode case 16 by 100 mm (the uppermost end of the suction port 22a is located in the anode case 18 in the anode case 16). Electrolyzed by the same method as in Example 1 except that it was arranged vertically upward from the bottom end at a height of 120 mm) and intermittently sucked at a suction flow rate of the plating solution 12 of 10 L/min during electroplating. Plating was performed to form a Sn plating film having a thickness of 1.0 μm on both surfaces of the material to be plated 20. The maximum decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 during suction of the plating solution 12 was 50 mm. It should be noted that the plating solution 12 outside the anode bag 14 permeated into the anode bag 14 within the suction stop time after this suction, and the height of the liquid surface of the plating solution 12 in the anode bag 14 returned to the initial height. ..

このようにして電気めっきを行って、2週間経過後に、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定するとともに、アノードバッグ14内の被めっき材20の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置(アノードケース16の底部付近)のめっき液12の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は226mS/cmであり、アノードバッグ内14の被めっき材の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置のめっき液12の電導度の(アノードバッグ14外のめっき液12の上澄み液の電導度に対する)低下量は、それぞれ121mS/cm、60mS/cmおよび108mS/cmであった。また、実施例1と同様の方法により、Snめっき皮膜の幅方向の厚さの最大値と最小値の差を求めたところ、0.6μmであり、厚さの差が大きかった。 Electroplating is performed in this manner, and after 2 weeks, the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 is measured by the same method as in Example 1, and the plating in the anode bag 14 is performed. The conductivity of the plating solution 12 at a position 300 mm (near the bottom of the anode case 16) vertically downward from the liquid surfaces of the introduction side, the central part and the discharge side of the material 20 was measured, and the plating solution 12 outside the anode bag 14 was measured. The electric conductivity of the supernatant liquid is 226 mS/cm, and the electric conductivity of the plating liquid 12 at a position 300 mm vertically below the liquid surface of the material to be plated in the anode bag 14 on the introduction side, the central portion and the discharge side ( The amount of decrease (relative to the conductivity of the supernatant of the plating solution 12 outside the anode bag 14) was 121 mS/cm, 60 mS/cm and 108 mS/cm, respectively. Further, when the difference between the maximum value and the minimum value of the width of the Sn plating film in the width direction was obtained by the same method as in Example 1, it was 0.6 μm, and the difference in thickness was large.

[比較例5]
電気めっきの際に、めっき液12の吸引流量を10L/分として連続的に吸引した以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面にSnめっき皮膜を形成した。なお、めっき液12の吸引によりアノードバッグ14内のめっき液12の液面の高さの最大低下量が100mmと大きくなり過ぎたため、電気めっきを中止した。なお、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は228mS/cmであった。
[Comparative Example 5]
At the time of electroplating, electroplating was performed in the same manner as in Example 1 except that the suction flow rate of the plating solution 12 was continuously set to 10 L/min, and Sn plating films were formed on both surfaces of the plated material 20. Formed. The electroplating was stopped because the maximum decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 became too large by 100 mm due to the suction of the plating solution 12. The conductivity of the supernatant of the plating solution 12 outside the anode bag 14 was measured by the same method as in Example 1, and the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 was 228 mS/cm. It was

[比較例6]
電気めっきの際に、めっき液12の吸引流量を2L/分として連続的に吸引した以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面にSnめっき皮膜を形成した。なお、めっき液12の吸引によりアノードバッグ14内のめっき液12の液面の高さの最大低下量が100mmと大きくなり過ぎたため、電気めっきを中止した。なお、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は243mS/cmであった。
[Comparative Example 6]
At the time of electroplating, electroplating was performed in the same manner as in Example 1 except that the suction flow rate of the plating solution 12 was continuously set to 2 L/min to form an Sn plating film on both surfaces of the plated material 20. Formed. The electroplating was stopped because the maximum decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 became too large by 100 mm due to the suction of the plating solution 12. In addition, when the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 was measured by the same method as in Example 1, the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 was 243 mS/cm. It was

[比較例7]
電気めっきの際に、めっき液12の吸引流量を0.5L/分として連続的に吸引した以外は、実施例1と同様の方法により電気めっきを行って、被めっき材20の両面に厚さ1.0μmのSnめっき皮膜を形成した。なお、めっき液12の吸引時のアノードバッグ14内のめっき液12の液面の高さの最大低下量は0mmであった。
[Comparative Example 7]
At the time of electroplating, electroplating was carried out in the same manner as in Example 1 except that the suction flow rate of the plating solution 12 was 0.5 L/min and continuous suction was performed to obtain a thickness on both sides of the plated material 20. A 1.0 μm Sn plating film was formed. The maximum decrease in the height of the liquid level of the plating solution 12 in the anode bag 14 during the suction of the plating solution 12 was 0 mm.

このようにして電気めっきを行って、2週間経過後に、実施例1と同様の方法により、アノードバッグ14外のめっき液12の上澄み液の電導度を測定するとともに、アノードバッグ14内の被めっき材20の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置(アノードケース16の底部付近)のめっき液12の電導度を測定したところ、アノードバッグ14外のめっき液12の上澄み液の電導度は238mS/cmであり、アノードバッグ内14の被めっき材の導入側、中央部および排出側の液面から鉛直方向下方に300mmの位置のめっき液12の電導度の(アノードバッグ14外のめっき液12の上澄み液の電導度に対する)低下量は、それぞれ126mS/cm、90mS/cmおよび124mS/cmであった。また、実施例1と同様の方法により、Snめっき皮膜の幅方向の厚さの最大値と最小値の差を求めたところ、0.6μmであり、厚さの差が大きかった。 Electroplating is performed in this manner, and after 2 weeks, the conductivity of the supernatant of the plating solution 12 outside the anode bag 14 is measured by the same method as in Example 1, and the plating in the anode bag 14 is performed. The conductivity of the plating solution 12 at a position 300 mm (near the bottom of the anode case 16) vertically downward from the liquid surfaces of the introduction side, the central part and the discharge side of the material 20 was measured, and the plating solution 12 outside the anode bag 14 was measured. The electric conductivity of the supernatant liquid is 238 mS/cm, and the electric conductivity of the plating liquid 12 at a position 300 mm vertically below the liquid surface of the material to be plated in the anode bag 14 on the introduction side, the central part and the discharge side ( The amount of decrease (relative to the conductivity of the supernatant of the plating solution 12 outside the anode bag 14) was 126 mS/cm, 90 mS/cm and 124 mS/cm, respectively. Further, when the difference between the maximum value and the minimum value of the thickness of the Sn plating film in the width direction was obtained by the same method as in Example 1, it was 0.6 μm, and the difference in thickness was large.

これらの実施例および比較例の条件および結果を表1および表2に示す。 The conditions and results of these Examples and Comparative Examples are shown in Tables 1 and 2.

Figure 0006703452
Figure 0006703452

Figure 0006703452
Figure 0006703452

10 めっき槽
12 めっき液
14 アノードバッグ
16 アノードケース
18 アノードボール
20 被めっき材
22 吸引管
22a 吸引口
24 板材
26 アノードバー
28 スラッジ
10 Plating Tank 12 Plating Solution 14 Anode Bag 16 Anode Case 18 Anode Ball 20 Plated Material 22 Suction Pipe 22a Suction Port 24 Plate Material 26 Anode Bar 28 Sludge

Claims (9)

長尺の帯板状の被めっき材をその幅方向が略鉛直方向になるようにめっき槽内でその長手方向に沿って搬送しながら、めっき槽内のめっき液中において、アノードバッグ内のアノードとアノードバッグ外の被めっき材との間に電流を流して被めっき材をめっきする、電気めっき方法において、アノードバッグ内に吸引管を導入し、この吸引管の吸引口の最下端の高さがアノードの最下端より鉛直方向上方の高さであって且つアノードの最下端から70mm以下の高さになるように吸引口を配置し、被めっき材をめっきする際に、めっき液の液面の高さの最大低下量を1〜60mmに維持しながら吸引口からめっき液の一部を吸引した後に、めっき液の吸引を停止することを交互に繰り返すことにより、めっき液の一部を間欠的に吸引してめっき槽から排出することを特徴とする、電気めっき方法。 While transporting a long strip-shaped material to be plated along its longitudinal direction in the plating tank so that its width direction is substantially vertical, the anode in the anode bag is placed in the plating solution in the plating tank. In the electroplating method, in which a current is passed between the anode and the material outside the anode bag to plate the material to be plated, a suction tube is introduced into the anode bag, and the height of the lowermost end of the suction port of the suction tube is increased. the liquid surface of but arranged anode lowermost than vertically above the height of the a and and the suction port so that a lowermost end below the height 70mm anode, when plating a material to be plated, the plating solution Of the plating solution is sucked from the suction port while maintaining the maximum decrease in the height of 1 to 60 mm, and then the suction of the plating solution is stopped alternately, thereby intermittently discharging a part of the plating solution. The method of electroplating is characterized in that it is sucked and discharged from the plating tank. 前記アノードが、前記アノードバッグ内のアノードケースに収容された複数のアノードボールであることを特徴とする、請求項1に記載の電気めっき方法。 The electroplating method according to claim 1, wherein the anode is a plurality of anode balls housed in an anode case in the anode bag. 前記アノードが、前記アノードバッグ内において前記鉛直方向に対して略垂直で且つ被めっき材に対向する面に略平行な方向に互いに離間して配置された2つのアノードケースの各々に収容された複数のアノードボールであることを特徴とする、請求項1に記載の電気めっき方法。 A plurality of the anodes are housed in each of two anode cases that are arranged in the anode bag and are spaced apart from each other in a direction substantially perpendicular to the vertical direction and substantially parallel to a surface facing the material to be plated. 2. The electroplating method according to claim 1, wherein the electroplating method is the anode ball. 前記吸引管の吸引口が、前記2つのアノードケースの側面の間に配置されていることを特徴とする、請求項3に記載の電気めっき方法。 The electroplating method according to claim 3, wherein the suction port of the suction tube is arranged between the side surfaces of the two anode cases. 前記めっき液の一部を間欠的に吸引する際の前記めっき液のそれぞれの吸引の時間が前記めっき液のそれぞれの吸引停止の時間よりも短いことを特徴とする、請求項1乃至4のいずれかに記載の電気めっき方法。 5. The suction time of each of the plating solutions at the time of intermittently sucking a part of the plating solution is shorter than the stop time of each suction of the plating solution. The electroplating method as described in 1. 前記めっき液のそれぞれの吸引の時間が10〜250秒間であり、前記めっき液のそれぞれの吸引停止の時間が300〜2000秒間であることを特徴とする、請求項5に記載の電気めっき方法。 The electroplating method according to claim 5, wherein the suction time of each of the plating solutions is 10 to 250 seconds, and the suction stop time of each of the plating solutions is 300 to 2000 seconds. 前記アノードが、被めっき材の少なくとも一方の面に対向するように配置されていることを特徴とする、請求項1乃至6のいずれかに記載の電気めっき方法。 The electroplating method according to claim 1, wherein the anode is arranged so as to face at least one surface of a material to be plated. 前記めっきがSnめっきであることを特徴とする、請求項1乃至7のいずれかに記載の電気めっき方法。 The electroplating method according to claim 1, wherein the plating is Sn plating. 前記吸引管の吸引口が、鉛直方向に対して略垂直な方向で且つ前記被めっき材に対向する面に略平行な方向における前記アノードバッグの略中央部に配置されていることを特徴とする、請求項1乃至7のいずれかに記載の電気めっき方法。 The suction port of the suction pipe is arranged at a substantially central portion of the anode bag in a direction substantially perpendicular to a vertical direction and in a direction substantially parallel to a surface facing the material to be plated. The electroplating method according to any one of claims 1 to 7.
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