JP6713638B2 - 表面特性測定方法、表面特性測定装置、及び表面特性測定プログラム - Google Patents
表面特性測定方法、表面特性測定装置、及び表面特性測定プログラム Download PDFInfo
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
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- G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
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- G01N2291/01—Indexing codes associated with the measuring variable
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Description
測定対象物に超音波を照射して前記測定対象物からの反射信号を取得し、
測定装置にて、前記測定対象物からの反射信号と、あらかじめ取得した参照物質からの参照反射信号との相互相関関数の最大値を計算し、
前記相互相関関数の最大値を用いて界面での反射成分を計算し、
前記反射成分と前記参照反射信号の比較結果に応じて、前記測定対象物の音響インピーダンスと前記参照物質の音響インピーダンスのいずれか一方を測定値として出力する。
(a)測定対象物に照射された超音波の反射信号を取得する手順と、
(b)前記測定対象物からの反射信号と、あらかじめ取得された参照物質からの参照反射信号との相互相関関数の最大値を計算する手順と、
(c)前記相互相関関数の最大値を用いて前記測定対象物の界面での反射成分を計算する手順と、
(d)前記反射成分と前記参照反射信号の比較結果に応じて、前記測定対象物の音響インピーダンスと前記参照物質の音響インピーダンスのいずれか一方を測定値として出力する手順と、
を実行させる。これにより表面特性を高精度に測定することができる。
2 プローブ
3 情報処理装置
5 音響窓
21 超音波センサ回路
31 CPU(プロセッサ)
33 メモリ
34 DSP(信号処理部)
37 記憶装置
Claims (13)
- 測定対象物に超音波を照射して前記測定対象物からの反射信号を取得し、
測定装置にて、前記測定対象物からの反射信号と、あらかじめ取得した参照物質からの参照反射信号との相互相関関数の最大値を計算し、
前記相互相関関数の最大値を用いて界面での反射成分を計算し、
前記反射成分と前記参照反射信号の比較結果に応じて、前記測定対象物の音響インピーダンスと前記参照物質の音響インピーダンスのいずれか一方を測定値として出力する、
ことを特徴とする表面特性測定方法。 - 前記反射成分の強度が前記参照反射信号の強度よりも小さい場合に、前記測定対象物の音響インピーダンスを算出して出力することを特徴とする請求項1に記載の表面特性測定方法。
- 前記反射成分の強度が前記参照反射信号よりも小さくない場合は、前記参照物質の音響インピーダンスを出力することを特徴とする請求項1に記載の表面特性測定方法。
- 前記反射成分は、前記参照反射信号と、前記参照反射信号に対する前記測定対象物からの反射信号の比と、前記相互相関関数の最大値とを乗算して得られることを特徴とする請求項1〜3のいずれか1項に記載の表面特性測定方法。
- 前記測定対象物に対して超音波を一次元または二次元的に相対的に走査し、
座標点ごとに前記測定値を出力する
ことを特徴とする請求項1〜4のいずれか1項に記載の表面特性測定方法。 - 前記超音波の照射は、前記測定装置のプローブの音響窓を前記測定対象物に接触させて照射することを特徴とする請求項1〜5のいずれか1項に記載の表面特性測定方法。
- 前記参照物質は水またはゲル状の物質であることを特徴とする請求項1〜6のいずれか1項に記載の表面特性測定方法。
- 前記測定対象物は皮膚であり、
前記測定値に基づいて、前記皮膚の弾性、きめ、毛穴、しわの少なくともひとつを評価することを特徴とする請求項1〜7のいずれか1項に記載の表面特性測定方法。 - 前記測定対象物は有機または無機の単層または積層の物質であり、
前記測定値に基づいて、最表層の表面粗さ、弾性、欠陥の少なくともひとつを評価することを特徴とする請求項1〜7のいずれか1項に記載の表面特性測定方法。 - プロセッサに、
測定対象物に照射された超音波の反射信号を取得する手順と、
前記測定対象物からの反射信号と、あらかじめ取得された参照物質からの参照反射信号との相互相関関数の最大値を計算する手順と、
前記相互相関関数の最大値を用いて、界面での反射成分を計算する手順と、
前記反射成分と前記参照反射信号の比較結果に応じて、前記測定対象物の音響インピーダンスと前記参照物質の音響インピーダンスのいずれか一方を測定値として出力する手順と、
を実行させる表面特性測定プログラム。 - 測定対象物に超音波を照射して前記測定対象物からの反射信号を受信する超音波送受信部と、
あらかじめ測定した参照物質からの参照反射信号の強度と、前記参照物質の音響インピーダンスを記憶するメモリと、
前記測定対象物からの反射信号と前記参照反射信号との相互相関関数の最大値に基づいて界面での反射成分を計算し、前記反射成分と前記参照反射信号の比較結果に応じて、前記測定対象物の音響インピーダンスと前記参照物質の音響インピーダンスのいずれか一方を測定値として出力する信号処理部と、
を有することを特徴とする表面特性測定装置。 - 前記信号処理部は、前記反射成分の強度が前記参照反射信号の強度よりも小さいときは前記測定対象物の音響インピーダンスを算出して出力することを特徴とする請求項11に記載の表面特性測定装置。
- 前記信号処理部は、前記反射成分の強度が前記参照反射信号よりも小さくない場合は、前記参照物質の音響インピーダンスを前記メモリから読み出して出力することを特徴とする請求項11に記載の表面特性測定装置。
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| US15/763,301 US11284863B2 (en) | 2015-09-29 | 2016-09-13 | Surface property measurement method, surface property measurement apparatus, and recording medium |
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