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JP6790489B2 - Specimen desk and specimen support device - Google Patents
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JP6790489B2 - Specimen desk and specimen support device - Google Patents

Specimen desk and specimen support device Download PDF

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JP6790489B2
JP6790489B2 JP2016122721A JP2016122721A JP6790489B2 JP 6790489 B2 JP6790489 B2 JP 6790489B2 JP 2016122721 A JP2016122721 A JP 2016122721A JP 2016122721 A JP2016122721 A JP 2016122721A JP 6790489 B2 JP6790489 B2 JP 6790489B2
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turntable
desk
specimen
landing gear
top plate
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滝沢 幸治
幸治 滝沢
政志 鳥井
政志 鳥井
鈴木 良和
良和 鈴木
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TDK Corp
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Description

本発明は、例えばEMI測定やイミュニティ試験において供試機器を載置するのに用いられる供試体用机及び供試体支持装置に関する。 The present invention relates to a specimen desk and a specimen support device used for mounting a test instrument in, for example, an EMI measurement or an immunity test.

各種の電子機器が広く利用されるようになり、これらの電子機器が電磁波によって受ける影響や、電子機器自身が放射する電磁波が他の電子機器に与える影響が問題となっている。電子機器から発生される電磁波ノイズ測定(EMI測定、EMI:Electromagnetic Interference)は屋外試験場又は電波暗室にて行われており、外部から放射される電磁波ノイズに対する電子機器の耐性試験(イミュニティ試験)は電波暗室において行われている。 Various types of electronic devices have come into widespread use, and the effects of electromagnetic waves on these electronic devices and the effects of electromagnetic waves radiated by the electronic devices themselves on other electronic devices have become problems. Electromagnetic noise measurement (EMI measurement, EMI: Electromagnetic Interference) generated from electronic devices is performed in an outdoor test site or an anechoic chamber, and the resistance test (immunity test) of electronic devices to electromagnetic noise emitted from the outside is electromagnetic interference. It is done in a dark room.

放射エミッション測定用の電波暗室には、供試体(EUT:Equipment Under Test)を回転させるためのターンテーブルと、測定用アンテナを上下方向に走査させるためのアンテナポジショナとが設けられている。放射エミッションの測定時には、ターンテーブル上に供試体用机が配置されると共に、供試体用机の天板上にEUTが載置される。この状態で、EUTから一定の測定距離だけ離れた測定用アンテナを上下方向に走査したり、ターンテーブルを回転させながら、供試体からの最大放射ノイズを測定する。 The anechoic chamber for measuring radiation emissions is provided with a turntable for rotating the specimen (EUT: Equipment Under Test) and an antenna positioner for scanning the measuring antenna in the vertical direction. At the time of measuring the radiation emission, the specimen desk is placed on the turntable and the EUT is placed on the top plate of the specimen desk. In this state, the maximum radiation noise from the specimen is measured while scanning the measuring antenna at a certain measurement distance from the EUT in the vertical direction and rotating the turntable.

ここで、例えばCISPR(Comite International Special des Perturbations Radioelectriques)32のような放射エミッションの測定規格によれば、供試体は供試体用机の天板の前縁に揃えて載置される。また、ターンテーブルの回転中心上に供試体の中心(供試体が関連機器を含む場合は関連機器を含む仮想的な円周の中心)を合わせるように、供試体用机をターンテーブル上に配置する必要がある。 Here, according to a measurement standard for radiation emissions such as CISPR (Comite International Special des Perturbations Radioelectriques) 32, the specimens are placed aligned with the front edge of the top plate of the specimen desk. In addition, the specimen desk is placed on the turntable so that the center of the specimen (or the center of the virtual circumference including the related equipment if the specimen includes related equipment) is aligned with the rotation center of the turntable. There is a need to.

特開2013−88175号公報Japanese Unexamined Patent Publication No. 2013-88175

CISPR22では、供試体用机の天板の標準的な寸法が1.5m×1.0mであることから、天板の寸法が1.5m×1.0mの供試体用机が広く用いられている。これに加え、電波暗室の小型化等を図るために、ターンテーブルも例えば直径が1.5m程度のようにできるだけ小さいものが使用されることがある。この場合、天板の寸法が1.5m×1.0mの供試体用机を上述のようにターンテーブル上に配置して放射エミッションを測定しようとすると、下記の2つの課題が生じる。即ち、
(A)供試体用机の脚部の大きさを概ね天板の寸法と同じ程度とすると、脚部がターンテーブルからはみ出し、ターンテーブルと共に供試体用机を回転させることができなくなり、
(B)供試体用机の脚部の大きさをターンテーブルに収まる程に小さくすると、脚部は天板のうちターンテーブルの外側の領域にある部分を下方から支えることができず、ターンテーブルを回転させた際に転倒する可能性が生じる、
という課題がある。
In CISPR22, since the standard size of the top plate of the test piece desk is 1.5 m × 1.0 m, the test piece desk having the size of the top plate of 1.5 m × 1.0 m is widely used. There is. In addition to this, in order to reduce the size of the anechoic chamber, a turntable as small as possible, for example, having a diameter of about 1.5 m may be used. In this case, if a test object desk having a top plate size of 1.5 m × 1.0 m is placed on the turntable as described above and an attempt is made to measure the radiation emission, the following two problems occur. That is,
(A) If the size of the legs of the test piece desk is approximately the same as the size of the top plate, the legs will protrude from the turntable and the test piece desk cannot be rotated together with the turntable.
(B) If the size of the legs of the test piece desk is made small enough to fit in the turntable, the legs cannot support the part of the top plate in the outer area of the turntable from below, and the turntable. There is a possibility of tipping over when rotating the
There is a problem.

特許文献1は、「測定条件に応じて供試体台を移動させても脚部をターンテーブルに収めることができる供試体台を提供する」こと(特許文献1の[要約]の[課題])を課題とし、「前,後方向および左,右方向に広がる天板と、該天板の左,右方向の両側に配設され該天板を支持する左,右の脚部とを備えた供試体台において、前記各脚部は、下側脚部と、該下側脚部の上側に位置して該下側脚部に対して前,後方向に移動可能に取付けられた上側脚部とによって構成され、前記天板は、前記上側脚部と共に前,後方向に移動可能となり、前記上側脚部は、後側に位置して前記天板の中心側に向けて回転移動可能な後側回転部を備え、前記下側脚部は、前側に位置して前記天板の中心側に向けて回転移動可能な前側回転部を備える構成」(特許文献1の段落[0008])を開示している。ここで、特許文献1の図17ないし図19を見ると、直径が1.5m程度のターンテーブルに、天板の寸法が1.5m×1.0mの供試体用机を載置する場合であって、ターンテーブルの回転中心上に天板の前縁を合わせるように供試体用机を配置する場合に、後端支持部31の底面がターンテーブル5と接触するように配置している。この配置によって、直径が1.5m程度のターンテーブルに供試体用机を載置できるが、供試体用机の脚部の大きさ(範囲)をターンテーブルに収まる程に小さくしているため、脚部は天板のうちターンテーブルの外側の領域にある部分を下方から支えることができず、ターンテーブルを回転させた際に転倒する可能性が生じている。 Patent Document 1 "provides a specimen table capable of fitting the legs in the turntable even if the specimen table is moved according to the measurement conditions" ([Problem] of [Summary] of Patent Document 1). The subject was "a top plate extending in the front, rear, left, and right directions, and left and right legs arranged on both sides of the top plate in the left and right directions to support the top plate. In the test piece table, each of the legs is a lower leg and an upper leg that is located above the lower leg and is movably attached to the lower leg in the front and rear directions. The top plate can be moved in the front and rear directions together with the upper leg portion, and the upper leg portion is located on the rear side and can be rotationally moved toward the center side of the top plate. Disclosed "a configuration in which a side rotating portion is provided, and the lower leg portion is provided with a front rotating portion that is located on the front side and can rotate and move toward the center side of the top plate" (paragraph [0008] of Patent Document 1). doing. Here, looking at FIGS. 17 to 19 of Patent Document 1, a case where a test piece desk having a top plate size of 1.5 m × 1.0 m is placed on a turntable having a diameter of about 1.5 m. Therefore, when the specimen desk is arranged so that the front edge of the top plate is aligned with the rotation center of the turntable, the bottom surface of the rear end support portion 31 is arranged so as to come into contact with the turntable 5. With this arrangement, the specimen desk can be placed on a turntable with a diameter of about 1.5 m, but the size (range) of the legs of the specimen desk is small enough to fit in the turntable. The legs cannot support the part of the top plate in the outer region of the turntable from below, and there is a possibility that the legs may tip over when the turntable is rotated.

本発明はこうした状況を認識してなされたものであり、その目的は、ターンテーブルが小型であっても転倒リスクを抑制することの可能な供試体用机、及び当該供試体用机を備える供試体支持装置を提供することにある。 The present invention has been made in recognition of such a situation, and an object of the present invention is to provide a test piece desk capable of suppressing the risk of falling even if the turntable is small, and a test piece desk. The purpose is to provide a specimen support device.

本発明のある態様は、
天板と、
ターンテーブル上に載る主脚部と、
前記ターンテーブル外の床面上にある補助脚部と、を有し、
前記ターンテーブル上に載置されて前記ターンテーブルと共に回転する、供試体用机であって、
前記補助脚部の下面が、前記主脚部の下面よりも所定の長さだけ上方に位置する。
One aspect of the present invention is
Top plate and
The main landing gear on the turntable and
With auxiliary legs on the floor outside the turntable,
A specimen desk that is placed on the turntable and rotates together with the turntable.
The lower surface of the auxiliary landing gear is located above the lower surface of the main landing gear by a predetermined length.

本発明の別の態様は、供試体支持装置である。この供試体支持装置は、
ターンテーブルと、
前記ターンテーブルの上面を囲む床面と、
前記ターンテーブル上に載置された供試体用机と、を備え、
前記供試体用机は、
天板と、
前記ターンテーブル上に載る主脚部と、
前記床面に接触する補助脚部と、を有し、
前記ターンテーブルの回転に伴って、前記床面と前記補助脚部との間の動摩擦力により前記供試体用机に加わるトルクが、前記ターンテーブルと前記主脚部との間の静止摩擦力により前記供試体用机に加わるトルクよりも小さく、
前記ターンテーブルと前記主脚部との間の静止摩擦力により、前記供試体用机が前記ターンテーブルと共に回転することを特徴とする。
Another aspect of the present invention is a specimen support device. This specimen support device
Turntable and
The floor surrounding the upper surface of the turntable and
It is equipped with a test object desk placed on the turntable.
The test piece desk
Top plate and
The main landing gear on the turntable and
Anda complement Joashi portion you contact with the floor surface,
Along with the rotation of the turntable, the torque applied to the test object desk by the dynamic friction force between the floor surface and the auxiliary leg portion is caused by the static friction force between the turntable and the main leg portion. It is smaller than the torque applied to the test object desk,
The sample desk rotates together with the turntable due to a static frictional force between the turntable and the main landing gear.

前記ターンテーブルの上面と前記床面との間の段差が5mm以内であってもよい。 The step between the upper surface of the turntable and the floor surface may be within 5 mm.

なお、以上の構成要素の任意の組合せ、本発明の表現を方法やシステムなどの間で変換したものもまた、本発明の態様として有効である。 It should be noted that any combination of the above components and a conversion of the expression of the present invention between methods, systems and the like are also effective as aspects of the present invention.

本発明によれば、ターンテーブルが小型であっても転倒リスクを抑制することの可能な供試体用机、及び当該供試体用机を備える供試体支持装置を提供することができる。 According to the present invention, it is possible to provide a specimen desk capable of suppressing the risk of falling even if the turntable is small, and a specimen support device provided with the specimen desk.

本発明の実施の形態1に係る供試体用机1をターンテーブル7上に載置し、供試体用机1の天板10上に供試体30を載置した状態の三面図。A three-view view showing a state in which the specimen desk 1 according to the first embodiment of the present invention is placed on a turntable 7 and the specimen 30 is placed on the top plate 10 of the specimen desk 1. 図1(A)の拡大図であって、ターンテーブル7の回転中心から主脚部13及び補助脚部15までの距離の説明図。It is an enlarged view of FIG. 1A, and is the explanatory view of the distance from the rotation center of a turntable 7 to the main landing gear 13 and the auxiliary landing gear 15. 本発明の実施の形態2に係る供試体用机2をターンテーブル7上に載置し、供試体用机2の天板10上に供試体30を載置した状態の三面図。A three-view view showing a state in which the specimen desk 2 according to the second embodiment of the present invention is placed on a turntable 7 and the specimen 30 is placed on the top plate 10 of the specimen desk 2. 本発明の実施の形態3に係る供試体用机3をターンテーブル7上に載置し、供試体用机3の天板10上に供試体30を載置した状態の右側面図。The right side view of the state where the specimen desk 3 which concerns on Embodiment 3 of this invention is placed on the turntable 7, and the specimen 30 is placed on the top plate 10 of the specimen desk 3. 本発明の実施の形態4に係る供試体用机4をターンテーブル7上に載置し、供試体用机4の天板10上に供試体30を載置した状態の三面図。A three-view view showing a state in which the specimen desk 4 according to the fourth embodiment of the present invention is placed on a turntable 7 and the specimen 30 is placed on the top plate 10 of the specimen desk 4. 本発明の実施の形態5に係る供試体用机5をターンテーブル7上に載置し、供試体用机5の天板10上に供試体30を載置した状態の三面図。A three-view view showing a state in which the specimen desk 5 according to the fifth embodiment of the present invention is placed on a turntable 7 and the specimen 30 is placed on the top plate 10 of the specimen desk 5.

以下、図面を参照しながら本発明の好適な実施の形態を詳述する。なお、各図面に示される同一または同等の構成要素、部材等には同一の符号を付し、適宜重複した説明は省略する。また、実施の形態は発明を限定するものではなく例示であり、実施の形態に記述されるすべての特徴やその組み合わせは必ずしも発明の本質的なものであるとは限らない。 Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings. The same or equivalent components, members, etc. shown in the drawings are designated by the same reference numerals, and redundant description will be omitted as appropriate. Moreover, the embodiment is not limited to the invention but is an example, and all the features and combinations thereof described in the embodiment are not necessarily essential to the invention.

実施の形態1
図1(A)〜(C)は、本発明の実施の形態1に係る供試体用机1をターンテーブル7上に載置し、供試体用机1の天板10上に供試体30を載置した状態の三面図であり、図1(A)は上面図(平面図)、図1(B)は正面図、図1(C)は右側面図である。ターンテーブル7は、例えば電波暗室内に設けられる。ターンテーブル7の上面と、ターンテーブル7外の床面8は、略面一あるいは3〜5mm以内の段差となっている。ターンテーブル7の上面及び床面8は、金属であってもよく、あるいは電波吸収体を敷設してもよく、さらに大地の電波反射を模擬した大地相当床からなってもよい。また、電波吸収体の表面が平坦でない、くさび形やピラミッド形の場合には、そのくさび形やピラミッド形に嵌合する発泡樹脂製(発泡スチロール等)の嵌合部材を電波吸収体の表面側に嵌合させ、電波吸収体の表面側に平坦な面を構築してもよい。さらに、金属、電波吸収体(発泡樹脂製(発泡スチロール等)の嵌合部材によって表面側に平坦な面を構築した電波吸収体を含む)や大地相当床の表面は、エポキシ樹脂等によってコーティングが施されたものであってもよく、樹脂板・樹脂シート等を載せた(接着した)ものであってもよい。供試体用机1及びターンテーブル7は、供試体支持装置を構成する。
Embodiment 1
In FIGS. 1A to 1C, the specimen desk 1 according to the first embodiment of the present invention is placed on the turntable 7, and the specimen 30 is placed on the top plate 10 of the specimen desk 1. It is a three-view view in a mounted state, FIG. 1 (A) is a top view (plan view), FIG. 1 (B) is a front view, and FIG. 1 (C) is a right side view. The turntable 7 is provided, for example, in an anechoic chamber. The upper surface of the turntable 7 and the floor surface 8 outside the turntable 7 are substantially flush with each other or have a step within 3 to 5 mm. The upper surface and the floor surface 8 of the turntable 7 may be made of metal, a radio wave absorber may be laid, or may be a ground equivalent floor simulating the radio wave reflection of the ground. If the surface of the radio wave absorber is not flat, such as a wedge shape or a pyramid shape, a fitting member made of foamed resin (such as styrofoam) that fits into the wedge shape or pyramid shape is placed on the surface side of the radio wave absorber. It may be fitted to form a flat surface on the surface side of the radio wave absorber. Furthermore, the surface of metal, radio wave absorbers (including radio wave absorbers in which a flat surface is constructed on the surface side by fitting members made of foamed resin (Styrofoam, etc.)) and the floor equivalent to the ground are coated with epoxy resin or the like. It may be the one on which the resin plate, the resin sheet, etc. are placed (bonded). The test piece desk 1 and the turntable 7 form a test piece support device.

供試体用机1は、ターンテーブル7上に載置される供試体用電磁波低反射机であって、電磁波ノイズ測定(EMI測定)やアンテナの放射特性等、電磁波の測定に用いられる。測定対象となる供試体30は、各種の電子機器であって、供試体用机1の天板10上に載置される。ここでは、CISPR32に対応するために、供試体30を天板10の前縁に揃えて載置し、また、ターンテーブル7の回転中心上に供試体30の中心を合わせるように、平面寸法1.5m×1.0mの供試体用机1を直径1.5mのターンテーブル7上に配置している。供試体30は、一例として、平面寸法が0.1m×0.1mで高さが0.1mの比較的小さなものとしている。 The sample desk 1 is a sample electromagnetic wave low-reflection desk placed on a turntable 7, and is used for measuring electromagnetic waves such as electromagnetic wave noise measurement (EMI measurement) and antenna radiation characteristics. The specimen 30 to be measured is various electronic devices, and is placed on the top plate 10 of the specimen desk 1. Here, in order to correspond to CISPR32, the specimen 30 is placed so as to be aligned with the front edge of the top plate 10, and the plane dimension 1 is such that the center of the specimen 30 is aligned with the rotation center of the turntable 7. A .5 m × 1.0 m specimen desk 1 is arranged on a turntable 7 having a diameter of 1.5 m. As an example, the specimen 30 has a relatively small plane dimension of 0.1 m × 0.1 m and a height of 0.1 m.

供試体用机1は、天板10と、ターンテーブル7上に載る主脚部13と、ターンテーブル7外の床面8上にある補助脚部15と、を有する。天板10、主脚部13、及び補助脚部15は、電磁波の反射が少ない材料からなってよく、例えば、発泡スチロール、あるいは発泡スチロールと樹脂板又は樹脂シートを張り合わせたものであってもよい。本実施の形態では、主脚部13が4本、補助脚部15が2本で、各脚部が互いに独立している。各脚部は、平断面寸法が0.2m×0.2mで、長さは天板10の上面がターンテーブル7の上面から0.8mの高さとなるように設定される。4本の主脚部13とターンテーブル7の上面との合計接触面積は、2本の補助脚部15とターンテーブル7外の床面8との合計接触面積よりも大きい。なお、各脚部の平断面寸法は、各脚部の材質や実現すべき耐荷重等により適宜変わり得る。 The test object desk 1 has a top plate 10, a main landing gear 13 resting on the turntable 7, and an auxiliary landing gear 15 on the floor 8 outside the turntable 7. The top plate 10, the main landing gear 13, and the auxiliary landing gear 15 may be made of a material that reflects less electromagnetic waves. For example, Styrofoam or a resin plate or a resin sheet laminated with Styrofoam may be used. In the present embodiment, there are four main landing gears 13 and two auxiliary landing gears 15, and the legs are independent of each other. Each leg has a flat cross-sectional dimension of 0.2 m × 0.2 m, and the length is set so that the upper surface of the top plate 10 is 0.8 m above the upper surface of the turntable 7. The total contact area between the four main landing gears 13 and the upper surface of the turntable 7 is larger than the total contact area between the two auxiliary landing gears 15 and the floor surface 8 outside the turntable 7. The planographical cross-sectional dimensions of each leg may be appropriately changed depending on the material of each leg, the load capacity to be realized, and the like.

主脚部13のうち2本は、天板10の前端部の左右両側からそれぞれ下方に延びてターンテーブル7の上面と接触する。主脚部13の残りの2本は、天板10の前後方向(短手方向)略中央の左右両側からそれぞれ下方に延びてターンテーブル7の上面と接触する。2本の補助脚部15は、天板10の後端部の左右両側からそれぞれ下方に延びてターンテーブル7外の床面8の上面と接触する。すなわち、本実施の形態では、補助脚部15は、ターンテーブル7外の床面8上に載る。好ましくは、主脚部13の下面(底面)は、補助脚部15の下面(底面)と比較して、摩擦係数が大きい材質からなる。例えば、主脚部13の下面にゴムシート等からなる高摩擦係数の抵抗シートを貼付(接着)し、補助脚部15の下面にシリコンコーティングシートあるいはシリコンコーティングフィルム等からなる低摩擦係数の抵抗シートを貼付(接着)する。 Two of the main landing gears 13 extend downward from both the left and right sides of the front end of the top plate 10 and come into contact with the upper surface of the turntable 7. The remaining two main landing gears 13 extend downward from both the left and right sides at the substantially center of the top plate 10 in the front-rear direction (short direction) and come into contact with the upper surface of the turntable 7. The two auxiliary leg portions 15 extend downward from both the left and right sides of the rear end portion of the top plate 10 and come into contact with the upper surface of the floor surface 8 outside the turntable 7. That is, in the present embodiment, the auxiliary leg portion 15 rests on the floor surface 8 outside the turntable 7. Preferably, the lower surface (bottom surface) of the main landing gear 13 is made of a material having a larger friction coefficient than the lower surface (bottom surface) of the auxiliary landing gear 15. For example, a resistance sheet having a high coefficient of friction made of a rubber sheet or the like is attached (adhered) to the lower surface of the main leg portion 13, and a resistance sheet having a low coefficient of friction made of a silicon coating sheet or a silicon coating film is attached to the lower surface of the auxiliary leg portion 15. Is pasted (adhered).

上記、ターンテーブル7の直径、供試体用机1の寸法、供試体30の寸法のために、供試体用机1の主脚部13は、供試体用机1の短手方向の概ね中心付近までしか設置することができない。このため、主脚部13をターンテーブル上に設置しただけの状態でターンテーブル7を回転させると、供試体用机1が転倒する可能性がある。そこで本実施の形態では、供試体用机1にターンテーブル7外の床面8上にある補助脚部15を設けることにより、ターンテーブル7が回転した際にも供試体用机1の転倒を防止する。しかしながら、補助脚部15とターンテーブル7外の床面8との間の摩擦力(摩擦による抵抗)が大きいと、ターンテーブル7が回転した際に、供試体用机1のターンテーブル7上での位置がずれてしまうという問題が生じる。そこで本実施の形態では、ターンテーブル7が回転する際における、補助脚部15とターンテーブル7外の床面8との間の摩擦力を、主脚部13とターンテーブル7との間の摩擦力よりも小さくする。これにより、ターンテーブル7の回転に伴って、ターンテーブル7外の床面8と補助脚部15との間の摩擦力により供試体用机1に加わるトルクを、ターンテーブル7と主脚部13との間の摩擦力により供試体用机1に加わるトルクよりも小さくすることができ、ターンテーブル7と主脚部13との間の摩擦力により、ターンテーブル7と共に供試体用机1を回転させることができる(ターンテーブル7上での供試体用机1の位置を意図した位置に保つことが可能となる)。 Due to the diameter of the turntable 7, the dimensions of the specimen desk 1, and the dimensions of the specimen 30, the main landing gear 13 of the specimen desk 1 is approximately near the center of the specimen desk 1 in the lateral direction. Can only be installed up to. Therefore, if the turntable 7 is rotated while the main landing gear 13 is simply installed on the turntable, the test piece desk 1 may tip over. Therefore, in the present embodiment, by providing the test piece desk 1 with the auxiliary legs 15 on the floor surface 8 outside the turntable 7, the test piece desk 1 can be tilted even when the turntable 7 is rotated. To prevent. However, if the frictional force (resistance due to friction) between the auxiliary leg portion 15 and the floor surface 8 outside the turntable 7 is large, when the turntable 7 is rotated, the test piece desk 1 is placed on the turntable 7. There is a problem that the position of is shifted. Therefore, in the present embodiment, the frictional force between the auxiliary landing gear 15 and the floor surface 8 outside the turntable 7 when the turntable 7 is rotated is the friction between the main landing gear 13 and the turntable 7. Make it smaller than force. As a result, as the turntable 7 rotates, the torque applied to the specimen desk 1 due to the frictional force between the floor surface 8 outside the turntable 7 and the auxiliary leg portion 15 is applied to the turntable 7 and the main leg portion 13. The torque applied to the specimen desk 1 can be made smaller by the frictional force between the two, and the frictional force between the turntable 7 and the main leg 13 rotates the specimen desk 1 together with the turntable 7. (It is possible to keep the position of the specimen desk 1 on the turntable 7 at the intended position).

図2は、図1(A)の拡大図であって、ターンテーブル7の回転中心から主脚部13及び補助脚部15までの距離の説明図である。図2により、各脚部に便宜上番号を付す。ここで、
・ターンテーブル7中心と各脚部までの距離:rn
(nは、n=1,2,・・・,6で、図2に示す各脚部の番号に対応)
・1つの主脚部13に掛かる荷重:Nin
・1つの補助脚部15に掛かる荷重:Nout
(供試体30の位置により、通常はNin≧Nout)
・主脚部13底部とターンテーブル7との接触面の静止摩擦係数:μin
・補助脚部15底部とターンテーブル7外の床面8との接触面の静止摩擦係数:μout
・補助脚部15底部とターンテーブル7外の床面8との接触面の動摩擦係数:μouta
(一般的に、μout ≧ μouta)
と定義すると、
・各主脚部13の静止摩擦力:Fin_n=μin×Nin
・各補助脚部15の静止摩擦力:Fout_n=μout×Nout
・各補助脚部15の動摩擦力:Fouta_n=μouta×Nout
・ターンテーブル7の回転開始時に各主脚部13とターンテーブル7の上面との間の摩擦力により供試体用机1に加わるトルク:Tin_n=Fin_n×rn
・ターンテーブル7の回転開始時に各補助脚部15とターンテーブル7外の床面8の上面との間の摩擦力により供試体用机1に加わるトルク:Tout_n=Fout_n×rn
・ターンテーブル7の回転中に各補助脚部15とターンテーブル7外の床面8の上面との間の摩擦力により供試体用机1に加わるトルク:Touta_n=Fouta_n×rn
・ターンテーブル7と共に供試体用机1を回転させ始めるための条件:
ΣTin_n>ΣTout_n
(Tin_nは、Tin_1〜Tin_4の合計)
(ΣTout_nは、Tout_5+Tout_6)
・ターンテーブル7と共に供試体用机1を回転させ続けるための条件:
ΣTin_n>ΣTouta_n
(ΣTouta_nは、Touta_5+Touta_6)
となる。なお、通常は、ターンテーブル7と共に供試体用机1を回転させ始めるための条件が満たされれば、ターンテーブル7と共に供試体用机1を回転させ続けるための条件も満たされる。
FIG. 2 is an enlarged view of FIG. 1A, and is an explanatory view of the distances from the rotation center of the turntable 7 to the main landing gear portion 13 and the auxiliary landing gear portion 15. According to FIG. 2, each leg is numbered for convenience. here,
・ Distance between the center of turntable 7 and each leg: r n
(N is n = 1, 2, ..., 6 and corresponds to the number of each leg shown in FIG. 2)
-Load applied to one main landing gear 13: Nin
-Load applied to one auxiliary leg 15: Nout
(Usually Nin ≧ Nout depending on the position of the specimen 30)
-Standing friction coefficient of the contact surface between the bottom of the main landing gear 13 and the turntable 7: μin
-Static friction coefficient of the contact surface between the bottom of the auxiliary leg 15 and the floor surface 8 outside the turntable 7: μout
-Dynamic friction coefficient of the contact surface between the bottom of the auxiliary leg 15 and the floor surface 8 outside the turntable 7: μouta
(Generally, μout ≧ μouta)
When defined as
-Static friction force of each main landing gear 13: Fin_n = μin × Nin
-Static frictional force of each auxiliary leg 15: Fout_n = μout × Nout
-Dynamic friction force of each auxiliary leg 15: Fuuta_n = μouta × Nout
-Torque applied to the specimen desk 1 due to the frictional force between each main landing gear 13 and the upper surface of the turntable 7 at the start of rotation of the turntable 7: Tin_n = Fin_n × r n
-Torque applied to the specimen desk 1 by the frictional force between each auxiliary leg 15 and the upper surface of the floor surface 8 outside the turntable 7 at the start of rotation of the turntable 7: Tout_n = Fout_n × r n
-Torque applied to the specimen desk 1 due to the frictional force between each auxiliary leg 15 and the upper surface of the floor surface 8 outside the turntable 7 during the rotation of the turntable 7: Touta_n = Fouta_n × r n
-Conditions for starting to rotate the specimen desk 1 together with the turntable 7:
ΣTin_n> ΣTout_n
(Tin_n is the total of Tin_1 to Tin_4)
(ΣTout_n is Tout_5 + Tout_6)
-Conditions for keeping the specimen desk 1 rotating together with the turntable 7:
ΣTin_n> ΣTouta_n
(ΣTouta_n is Touta_5 + Touta_6)
Will be. Normally, if the condition for starting to rotate the specimen desk 1 together with the turntable 7 is satisfied, the condition for continuing to rotate the specimen desk 1 together with the turntable 7 is also satisfied.

本実施の形態によれば、下記の効果を奏することができる。 According to this embodiment, the following effects can be obtained.

(1) 供試体用机1は、補助脚部15を有するため、天板10の後部(ターンテーブル7の外側の領域にある部分)を補助脚部15により下方から支持することができ、ターンテーブル7が小型であっても転倒リスクを抑制することが可能となる。詳細には、標準的な1.5m×1.0mの寸法の天板10を有する供試体用机1を例えば直径が1.5m程度以下のような小型のターンテーブル7に載置する場合であっても、補助脚部15が天板10のうちターンテーブル7の外側の領域にある部分を下方から支えることができ、ターンテーブル7が回転した際に転倒する可能性を低減できる。 (1) Since the specimen desk 1 has the auxiliary leg portion 15, the rear portion of the top plate 10 (the portion in the outer region of the turntable 7) can be supported from below by the auxiliary leg portion 15, and the turn. Even if the table 7 is small, the risk of falling can be suppressed. Specifically, in the case where the specimen desk 1 having the top plate 10 having a standard size of 1.5 m × 1.0 m is placed on a small turntable 7 having a diameter of about 1.5 m or less, for example. Even if there is, the auxiliary leg portion 15 can support the portion of the top plate 10 in the outer region of the turntable 7 from below, and the possibility of tipping over when the turntable 7 rotates can be reduced.

(2) ターンテーブル7が回転する際における、補助脚部15とターンテーブル7外の床面8との間の摩擦力を、主脚部13とターンテーブル7との間の摩擦力よりも小さくし、供試体用机1がターンテーブル7と共に回転できるようにしているため、補助脚部15を設けることによる供試体用机1のターンテーブル7上での位置ずれを抑制できる。 (2) The frictional force between the auxiliary leg 15 and the floor surface 8 outside the turntable 7 when the turntable 7 rotates is smaller than the frictional force between the main leg 13 and the turntable 7. However, since the specimen desk 1 can rotate together with the turntable 7, it is possible to suppress the displacement of the specimen desk 1 on the turntable 7 by providing the auxiliary leg portion 15.

実施の形態2
図3(A)〜(C)は、本発明の実施の形態2に係る供試体用机2をターンテーブル7上に載置し、供試体用机1の天板10上に供試体30を載置した状態の三面図であり、図3(A)は上面図(平面図)、図3(B)は正面図、図3(C)は右側面図である。図3(A)及び図3(C)において、補助脚部15をハッチングにより強調表示している。供試体用机2は、図1(A)〜(C)に示した実施の形態1の供試体用机1と比較して、主脚部13及び補助脚部15が天板10の左右両側においてそれぞれ連続している点で相違し、その他の点で一致する。すなわち、図1(A)に示す供試体用机1の左側の2本の主脚部13と1本の補助脚部15を連続した板状の脚部とし、右側の2本の主脚部13と1本の補助脚部15も同様に連続した板状の脚部としたものが、図3(A)に示す供試体用机2である。双方の板状の脚部のうち、ターンテーブル7の外周の内側にある部分が主脚部13であり、ターンテーブル7の外周の外側にある部分が補助脚部15である。主脚部13とターンテーブル7の上面との接触面積は、補助脚部15とターンテーブル7外の床面8との接触面積よりも大きい。なお、供試体用机2においては、主脚部13及び補助脚部15の底面を微小な面(四角形や三角形)の集合として考えることにより、図2での説明と同様に主脚部13及び補助脚部15の摩擦力及びそれによるトルクを算出することができる。本実施の形態も、実施の形態1と同様の効果を奏することができる。
Embodiment 2
In FIGS. 3A to 3C, the specimen desk 2 according to the second embodiment of the present invention is placed on the turntable 7, and the specimen 30 is placed on the top plate 10 of the specimen desk 1. It is a three-view view in a mounted state, FIG. 3 (A) is a top view (plan view), FIG. 3 (B) is a front view, and FIG. 3 (C) is a right side view. In FIGS. 3 (A) and 3 (C), the auxiliary leg portion 15 is highlighted by hatching. In the specimen desk 2, the main landing gear 13 and the auxiliary landing gear 15 are on both the left and right sides of the top plate 10 as compared with the specimen desk 1 of the first embodiment shown in FIGS. 1A to 1C. They differ in that they are continuous, and agree in other respects. That is, the two main landing gears 13 on the left side and one auxiliary landing gear 15 on the left side of the specimen desk 1 shown in FIG. 1 (A) are continuous plate-shaped legs, and the two main landing gears on the right side. The test piece desk 2 shown in FIG. 3A is a plate-shaped leg portion 13 and one auxiliary leg portion 15 which are similarly continuous. Of both plate-shaped legs, the portion inside the outer circumference of the turntable 7 is the main landing gear 13, and the portion outside the outer circumference of the turntable 7 is the auxiliary landing gear 15. The contact area between the main landing gear 13 and the upper surface of the turntable 7 is larger than the contact area between the auxiliary landing gear 15 and the floor surface 8 outside the turntable 7. In the test object desk 2, the bottom surfaces of the main landing gear 13 and the auxiliary landing gear 15 are considered as a set of minute surfaces (quadrangles and triangles), so that the main landing gear 13 and the auxiliary landing gear 15 are as described in FIG. The frictional force of the auxiliary landing gear 15 and the torque resulting from the frictional force can be calculated. The present embodiment can also have the same effect as that of the first embodiment.

実施の形態3
図4は、本発明の実施の形態3に係る供試体用机3をターンテーブル7上に載置し、供試体用机1の天板10上に供試体30を載置した状態の右側面図である。図4において、補助脚部15をハッチングにより強調表示している。供試体用机3は、図3(A)〜(C)に示した実施の形態2の供試体用机2と比較して、補助脚部15の下面が主脚部13の下面よりも所定の長さだけ上方に位置する点で相違し、その他の点で一致する。一般的に、電波暗室等に埋設されるターンテーブル7は、その外側の床面8と3〜5mm以下の段差となるよう設置される。そのため、ターンテーブル7が回転する際に、補助脚部15とターンテーブル7外の床面8との接触を防ぐためには、前記所定の長さは、3〜5mmが好適である。図4の例では、ターンテーブル7の上面とターンテーブル7外の床面8とが面一のため、ターンテーブル7外の床面8と補助脚部15の下面との間に前記所定の長さの隙間が設けられる。隙間が3〜5mmであれば、供試体用机3が転倒しかけた場合に、天板10が大きく傾く前に補助脚部15とターンテーブル7外の床面8とが接触するため、供試体30の落下等を抑制しつつ供試体用机3の転倒を防ぐことができる。なお、本実施の形態では、補助脚部15の下面を主脚部13の下面と比較して低摩擦係数の材質としなくてもよい。
Embodiment 3
FIG. 4 shows the right side surface of the specimen desk 3 according to the third embodiment of the present invention in a state where the specimen desk 3 is placed on the turntable 7 and the specimen 30 is placed on the top plate 10 of the specimen desk 1. It is a figure. In FIG. 4, the auxiliary leg portion 15 is highlighted by hatching. In the specimen desk 3, the lower surface of the auxiliary landing gear 15 is more predetermined than the lower surface of the main landing gear 13 as compared with the specimen desk 2 of the second embodiment shown in FIGS. 3 (A) to 3 (C). It differs in that it is located above by the length of, and agrees in other respects. Generally, the turntable 7 embedded in an anechoic chamber or the like is installed so as to have a step of 3 to 5 mm or less with the floor surface 8 on the outside thereof. Therefore, in order to prevent the auxiliary leg portion 15 from coming into contact with the floor surface 8 outside the turntable 7 when the turntable 7 rotates, the predetermined length is preferably 3 to 5 mm. In the example of FIG. 4, since the upper surface of the turntable 7 and the floor surface 8 outside the turntable 7 are flush with each other, the predetermined length is between the floor surface 8 outside the turntable 7 and the lower surface of the auxiliary leg portion 15. A gap is provided. If the gap is 3 to 5 mm, when the test object desk 3 is about to fall, the auxiliary leg portion 15 and the floor surface 8 outside the turntable 7 come into contact with each other before the top plate 10 is greatly tilted. It is possible to prevent the test object desk 3 from tipping over while suppressing the drop of the 30 and the like. In the present embodiment, the lower surface of the auxiliary landing gear 15 does not have to be made of a material having a lower coefficient of friction than the lower surface of the main landing gear 13.

本実施の形態によれば、補助脚部15とターンテーブル7外の床面8とが非接触で両者の間の摩擦力が0になるため、供試体用机3をスムーズにターンテーブル7と共に回転させることができる(供試体用机3のターンテーブル7上での位置ずれを抑制できる)。また、供試体用机3が転倒しかけると補助脚部15がターンテーブル7外の床面8と接触するため、供試体用机3の転倒を好適に抑制できる。 According to the present embodiment, since the auxiliary leg portion 15 and the floor surface 8 outside the turntable 7 are not in contact with each other and the frictional force between the two is zero, the specimen desk 3 can be smoothly combined with the turntable 7. It can be rotated (the displacement of the specimen desk 3 on the turntable 7 can be suppressed). Further, when the test piece desk 3 is about to fall, the auxiliary leg portion 15 comes into contact with the floor surface 8 outside the turntable 7, so that the test piece desk 3 can be suitably suppressed from falling.

実施の形態4
図5(A)〜(C)は、本発明の実施の形態4に係る供試体用机4をターンテーブル7上に載置し、供試体用机4の天板10上に供試体30を載置した状態の三面図であり、図5(A)は上面図(平面図)、図5(B)は正面図、図5(C)は右側面図である。供試体用机4は、図3(A)〜(C)に示した実施の形態2の供試体用机2と比較して、補助脚部15の下部にキャスター17を設けた点で相違し、その他の点で一致する。本実施の形態では、補助脚部15の下面を主脚部13の下面と比較して低摩擦係数の材質とする必要はない。キャスター17は、ターンテーブル7外の床面8と接触する。
Embodiment 4
In FIGS. 5A to 5C, the specimen desk 4 according to the fourth embodiment of the present invention is placed on the turntable 7, and the specimen 30 is placed on the top plate 10 of the specimen desk 4. It is a three-view view in a mounted state, FIG. 5 (A) is a top view (plan view), FIG. 5 (B) is a front view, and FIG. 5 (C) is a right side view. The test piece desk 4 is different from the test piece desk 2 of the second embodiment shown in FIGS. 3A to 3C in that casters 17 are provided at the lower part of the auxiliary leg portion 15. , In other respects. In the present embodiment, the lower surface of the auxiliary landing gear 15 does not need to be made of a material having a lower coefficient of friction than the lower surface of the main landing gear 13. The caster 17 comes into contact with the floor surface 8 outside the turntable 7.

本実施の形態によれば、キャスター17とターンテーブル7外の床面8との間の摩擦力は、転がり摩擦力となり、滑り摩擦力と比較して極めて小さくなるため、供試体用机4はターンテーブル7と共にスムーズに回転できる(供試体用机4のターンテーブル7上での位置ずれを抑制できる)。また、補助脚部15のキャスター17がターンテーブル7外の床面8と接触することで、供試体用机4の転倒リスクを抑制できる。 According to the present embodiment, the frictional force between the caster 17 and the floor surface 8 outside the turntable 7 becomes a rolling frictional force, which is extremely small as compared with the sliding frictional force. It can rotate smoothly together with the turntable 7 (the displacement of the specimen desk 4 on the turntable 7 can be suppressed). Further, when the caster 17 of the auxiliary leg portion 15 comes into contact with the floor surface 8 outside the turntable 7, the risk of the specimen desk 4 falling over can be suppressed.

供試体用机4において、キャスター17の下端は、主脚部13の下面よりも所定の長さ(好ましくは3〜5mm)だけ上方に位置してもよい。この場合、供試体用机4が転倒しかけた場合に、天板10が大きく傾く前にキャスター17とターンテーブル7外の床面8とが接触するため、供試体30の落下等を抑制しつつ供試体用机4の転倒を防ぐことができる。また、キャスター17とターンテーブル7外の床面8との間の摩擦力が極めて小さいため、キャスター17とターンテーブル7外の床面8とが接触しても、ターンテーブル7を停止することなく供試体用机4をターンテーブル7上の意図した場所に載置し続けることが可能となる。 In the test object desk 4, the lower end of the caster 17 may be located above the lower surface of the main landing gear 13 by a predetermined length (preferably 3 to 5 mm). In this case, when the test piece desk 4 is about to fall, the casters 17 and the floor surface 8 outside the turntable 7 come into contact with each other before the top plate 10 is greatly tilted, so that the test piece 30 is prevented from falling. It is possible to prevent the test object desk 4 from tipping over. Further, since the frictional force between the casters 17 and the floor surface 8 outside the turntable 7 is extremely small, even if the casters 17 and the floor surface 8 outside the turntable 7 come into contact with each other, the turntable 7 is not stopped. The test piece desk 4 can be continuously placed on the turntable 7 at the intended place.

実施の形態5
図6(A)〜(C)は、本発明の実施の形態5に係る供試体用机5をターンテーブル7上に載置し、供試体用机5の天板10上に供試体30を載置した状態の三面図であり、図6(A)は上面図(平面図)、図6(B)は正面図、図6(C)は右側面図である。供試体用机5は、図5(A)〜(C)に示した実施の形態4の供試体用机4と比較して、第2主脚部13aが追加され、主脚部13及び第2主脚部13aの下部にターンテーブル7の上面と接触するキャスター14が設けられ、補助脚部15のキャスター17の下端が主脚部13及び第2主脚部13aのキャスター14の下端よりも所定の長さ(好ましくは3〜5mm)だけ上方に位置する点で相違し、その他の点で一致する。
Embodiment 5
In FIGS. 6A to 6C, the specimen desk 5 according to the fifth embodiment of the present invention is placed on the turntable 7, and the specimen 30 is placed on the top plate 10 of the specimen desk 5. It is a three-view view in a mounted state, FIG. 6 (A) is a top view (plan view), FIG. 6 (B) is a front view, and FIG. 6 (C) is a right side view. A second main landing gear portion 13a is added to the specimen desk 5 as compared with the specimen desk 4 of the fourth embodiment shown in FIGS. 5A to 5C, and the main landing gear portion 13 and the second main landing gear portion 13a are added. 2 A caster 14 that comes into contact with the upper surface of the turntable 7 is provided below the main landing gear 13a, and the lower end of the caster 17 of the auxiliary landing gear 15 is smaller than the lower end of the caster 14 of the main landing gear 13 and the second main landing gear 13a. They differ in that they are located above by a predetermined length (preferably 3-5 mm) and agree in other respects.

第2主脚部13aは、天板10から下方に延び、平断面形状がV字状であり、左右の主脚部13の後端部同士を連結する。第2主脚部13aのV字の角部(谷部)はターンテーブル7の後端部上に位置し、当該角部にキャスター14が設けられる。キャスター14は、左右の主脚部13の前端部及び後端部の下部にもそれぞれ設けられる。キャスター14は、好ましくは回転ロック機能付きである。あるいは、キャスター14の周囲に、不図示のキャスター止め具等を置いてもよい。 The second main landing gear portion 13a extends downward from the top plate 10 and has a V-shaped flat cross section, and connects the rear end portions of the left and right main landing gear portions 13. The V-shaped corner (valley) of the second main landing gear 13a is located on the rear end of the turntable 7, and casters 14 are provided at the corner. The casters 14 are also provided at the lower portions of the front end and the rear end of the left and right main landing gears 13, respectively. The caster 14 preferably has a rotation lock function. Alternatively, a caster stopper or the like (not shown) may be placed around the caster 14.

本実施の形態によれば、第2主脚部13aを追加したことで、ターンテーブル7の回転時に供試体用机5が転倒するリスクを一層低減できる。また、主脚部13及び第2主脚部13aの下部にキャスター14を設けているため、供試体用机5の運搬が容易となる。また、回転ロック機構を有するキャスター14を用いること、あるいはキャスター14の周囲に不図示のキャスター止め具を置くことで、ターンテーブル7上における供試体用机5の位置ずれを抑制できる(ターンテーブル7上での供試体用机5の位置を意図した位置に保つことが可能となる)。また、補助脚部15のキャスター17の下端が主脚部13及び第2主脚部13aのキャスター14の下端よりも所定の長さだけ上方に位置するため、キャスター17とターンテーブル7外の床面8との間の摩擦力が0となり、供試体用机5をスムーズにターンテーブル7と共に回転させることができる(供試体用机5のターンテーブル7上での位置ずれを抑制できる)。供試体用机5が補助脚部15側に転倒しかけた場合には、補助脚部15のキャスター17がターンテーブル7外の床面8と接するため、転倒を防ぐことが可能である。さらに、補助脚部15のキャスター17とターンテーブル7外の床面8との間の摩擦力は極めて小さいことから、キャスター17とターンテーブル7外の床面8とが接触しても、ターンテーブル7を停止することなく供試体用机5をターンテーブル7上の意図した場所に載置し続けることが可能となる。 According to the present embodiment, by adding the second main landing gear portion 13a, the risk of the specimen desk 5 falling over when the turntable 7 is rotated can be further reduced. Further, since the casters 14 are provided below the main landing gear 13 and the second main landing gear 13a, the test object desk 5 can be easily transported. Further, by using a caster 14 having a rotation lock mechanism or by placing a caster stopper (not shown) around the caster 14, it is possible to suppress the displacement of the test piece desk 5 on the turntable 7 (turntable 7). It is possible to keep the position of the test piece desk 5 above at the intended position). Further, since the lower end of the caster 17 of the auxiliary landing gear 15 is located above the lower end of the caster 14 of the main landing gear 13 and the second main landing gear 13a by a predetermined length, the floor outside the caster 17 and the turntable 7 The frictional force between the surface 8 and the surface 8 becomes 0, and the specimen desk 5 can be smoothly rotated together with the turntable 7 (the displacement of the specimen desk 5 on the turntable 7 can be suppressed). When the test object desk 5 is about to fall toward the auxiliary leg portion 15, the caster 17 of the auxiliary leg portion 15 comes into contact with the floor surface 8 outside the turntable 7, so that the fall can be prevented. Further, since the frictional force between the casters 17 of the auxiliary legs 15 and the floor surface 8 outside the turntable 7 is extremely small, even if the casters 17 and the floor surface 8 outside the turntable 7 come into contact with each other, the turntable It is possible to continue to place the specimen desk 5 on the turntable 7 at the intended place without stopping the 7.

以上、実施の形態を例に本発明を説明したが、実施の形態の各構成要素や各処理プロセスには請求項に記載の範囲で種々の変形が可能であることは当業者に理解されるところである。以下、変形例について触れる。 Although the present invention has been described above by taking the embodiment as an example, it is understood by those skilled in the art that various modifications can be made to each component and each processing process of the embodiment within the scope of the claims. By the way. Hereinafter, a modification will be described.

実施の形態で示した各寸法の具体的数値は一例であり、各寸法は要求される仕様に応じて適宜変更することができる。実施の形態1〜4の構成において、図6(A)〜(C)に示す実施の形態5の第2主脚部13a(キャスター14を含まず)を追加してもよい。実施の形態5において、第2主脚部13aは省略してもよい。図1(A)〜(C)に示す実施の形態1の主脚部13及び補助脚部15の下部に、キャスターを追加してもよい。 The specific numerical values of each dimension shown in the embodiment are an example, and each dimension can be appropriately changed according to the required specifications. In the configurations of the first to fourth embodiments, the second main landing gear portion 13a (not including the casters 14) of the fifth embodiment shown in FIGS. 6A to 6C may be added. In the fifth embodiment, the second main landing gear 13a may be omitted. Casters may be added to the lower parts of the main landing gear 13 and the auxiliary landing gear 15 of the first embodiment shown in FIGS. 1A to 1C.

1〜5 供試体用机(供試体用電磁波低反射机)、7 ターンテーブル、8 床面、
10 天板、13 主脚部、13a 第2主脚部、14 キャスター、15 補助脚部、17 キャスター、30 供試体(EUT)
1 to 5 Specimen desk (electromagnetic wave low reflection desk for specimen), 7 turntables, 8 floors,
10 Top plate, 13 Main landing gear, 13a 2nd main landing gear, 14 casters, 15 auxiliary landing gears, 17 casters, 30 specimens (EUT)

Claims (3)

天板と、
ターンテーブル上に載る主脚部と、
前記ターンテーブル外の床面上にある補助脚部と、を有し、
前記ターンテーブル上に載置されて前記ターンテーブルと共に回転する、供試体用机であって、
前記補助脚部の下面が、前記主脚部の下面よりも所定の長さだけ上方に位置する、供試体用机。
Top plate and
The main landing gear on the turntable and
With auxiliary legs on the floor outside the turntable,
A specimen desk that is placed on the turntable and rotates together with the turntable.
A test object desk in which the lower surface of the auxiliary landing gear is located above the lower surface of the main landing gear by a predetermined length.
ターンテーブルと、
前記ターンテーブルの上面を囲む床面と、
前記ターンテーブル上に載置された供試体用机と、を備え、
前記供試体用机は、
天板と、
前記ターンテーブル上に載る主脚部と、
前記床面に接触する補助脚部と、を有し、
前記ターンテーブルの回転に伴って、前記床面と前記補助脚部との間の動摩擦力により前記供試体用机に加わるトルクが、前記ターンテーブルと前記主脚部との間の静止摩擦力により前記供試体用机に加わるトルクよりも小さく、
前記ターンテーブルと前記主脚部との間の静止摩擦力により、前記供試体用机が前記ターンテーブルと共に回転することを特徴とする、供試体支持装置。
Turntable and
The floor surrounding the upper surface of the turntable and
It is equipped with a test object desk placed on the turntable.
The test piece desk
Top plate and
The main landing gear on the turntable and
Anda complement Joashi portion you contact with the floor surface,
Along with the rotation of the turntable, the torque applied to the test object desk by the dynamic friction force between the floor surface and the auxiliary leg portion is caused by the static friction force between the turntable and the main leg portion. It is smaller than the torque applied to the test object desk,
A specimen support device, characterized in that the specimen desk rotates together with the turntable due to a static frictional force between the turntable and the main landing gear.
前記ターンテーブルの上面と前記床面との間の段差が5mm以内である、請求項に記載の供試体支持装置。 The specimen support device according to claim 2 , wherein the step between the upper surface of the turntable and the floor surface is within 5 mm.
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