JP6793501B2 - Radiation diagnostic equipment - Google Patents

Description

Embodiments of the present invention relate to a radiological diagnostic apparatus.

Radiodiagnosis devices such as an X-ray CT (Computed Tomography) device, an X-ray angio device, and an X-ray diagnostic device include a radiation detector that detects X-rays that have been irradiated from an X-ray source and passed through a subject. Generally, a plurality of radiation detection elements are arranged in the radiation detector. According to the radiation detector in which a plurality of radiation detection elements are arranged, it is possible to detect a wide range of X-rays at the same time, which is very convenient.

Japanese Unexamined Patent Publication No. 2012-147949

A radiation diagnostic apparatus including a radiation detector having a plurality of radiation detection elements collects output data of all the detection elements constituting the radiation detector when imaging a subject with X-rays. However, the output data of the detection elements located in the non-observing region, which is a region that is not the imaging target under the shooting conditions, is obtained in some cases where the data of these detection elements is required, for example, post-processing. It is useless data except when it is used in.

Therefore, collecting the output data of the detection elements corresponding to the non-attention regions wastes power consumption unless the data of these detection elements is required.

The problem to be solved by the present invention is to provide a radiation diagnostic apparatus capable of operating only a member related to collecting output data of a detection element corresponding to an imaging region included in an imaging condition when imaging under the imaging condition. It is to be.

In order to solve the above-mentioned problems, the radiation diagnostic apparatus according to the embodiment of the present invention includes an X-ray tube, a plurality of radiation detection elements for detecting X-rays emitted from the X-ray tube, and the plurality of radiation detection elements. Information on a plurality of signal processing substrates that receive the output signal of the radiation detection element, perform at least analog-to-digital conversion processing and output the processed signal, and the imaging region included in the imaging conditions of the subject. Based on this, a specific unit that identifies a non-attention element that is a radiation detection element corresponding to a region other than the imaging region or a non-attention substrate that is a signal processing substrate corresponding to the non-attention element, and when imaging under the imaging conditions. , A control unit that controls the operation of the non-attention element or the non-attention substrate.

The block diagram which shows an example of the X-ray CT apparatus which concerns on one Embodiment of this invention. Explanatory drawing which shows an example of the relationship between an X-ray detector and an imaging area. Explanatory drawing which shows an example of the housing which accommodates an X-ray detector and DAS. The block diagram which shows the internal structure example of DAS. Explanatory drawing which shows the connection relation example of an X-ray detector, a conversion board group and a processing circuit. Explanatory drawing which shows an example of the relationship between an imaging region and a non-attention substrate. Explanatory drawing which shows another example of the relationship between an imaging area and a non-attention substrate. The block diagram which shows an example of the function realized by a processing circuit. FIG. 5 is a flowchart showing an example of a procedure for reducing the power consumption of an X-ray CT apparatus by limiting the operation of a non-attention substrate so as to stop the operation of outputting a signal after processing at least by the processing circuit of DAS. The explanatory view which shows an example of the case where the housing which accommodates an X-ray detector and DAS further accommodates a plurality of fans. The block diagram which shows the modification of the internal structure of DAS.

An embodiment of the radiation diagnostic apparatus according to the present invention will be described with reference to the accompanying drawings.

The radiation diagnostic apparatus according to the embodiment of the present invention is a radiation diagnostic apparatus by limiting the collection of output data of a radiation detection element (hereinafter referred to as a non-attention element) corresponding to a non-attention region which is an region other than the imaging region. Reduce the power consumption of. The collection of output data of the non-attention element is restricted, for example, by limiting the operation of the signal processing circuit provided after the non-attention element.

In the following description, an example in which an X-ray CT apparatus is used as the radiological diagnostic apparatus according to the present invention will be described.

FIG. 1 is a block diagram showing an example of an X-ray CT apparatus 10 according to an embodiment of the present invention.

In FIG. 1, the X-ray CT apparatus 10 according to the embodiment of the present invention is a so-called third-generation CT apparatus in which an X-ray tube and an X-ray detector rotate around a subject as a unit. An example of an R (ROTATE / ROTATE) type device is shown, but the present invention is not limited to this. For example, the X-ray CT apparatus 10 is an S / R (STATIONARY / ROTATE) type, which is a so-called fourth-generation CT apparatus in which a large number of detection elements are arranged in a ring shape and only an X-ray tube rotates around a subject. It may be an N / R (NUTATE / ROTATE) type device.

Further, in recent years, the commercialization of a so-called multi-tube type X-ray CT apparatus in which a plurality of pairs of an X-ray tube and an X-ray detector are mounted on a rotating ring has progressed, and the development of peripheral technologies thereof has progressed. The X-ray CT apparatus 10 according to the present embodiment can be applied to either a single-tube type or a multi-tube type. Here, an example in which the X-ray CT apparatus 10 is a single tube type will be described.

As shown in FIG. 1, the X-ray CT device 10 has a pedestal 11, a sleeper device 12, and a console 13.

The gantry 11 has a fixed pedestal 21 and a rotary pedestal 22. The fixed pedestal 21 is fixed to an installation surface such as a floor surface, and has a pedestal control circuit 26 and a data transmission device 27. The rotary pedestal 22 integrally holds the X-ray tube 31, the diaphragm 32, the X-ray detector 33, and the DAS (Data Acquisition System) 34, and rotates around the opening in the central portion. In the present embodiment, the direction parallel to the rotation center axis of the rotary base 22 is defined as the z-axis direction, the normal direction of the installation surface is defined as the y-axis direction, and the direction parallel to the installation surface is defined as the x-axis direction (FIG. 1). reference).

The X-ray tube 31 is controlled by the gantry control circuit 26, and a high voltage generated by a high-voltage power source (not shown) of the fixed gantry 21 is supplied via, for example, a slip ring. The high-voltage power supply may be provided on the rotary stand 22.

The X-rays generated by the X-ray tube 31 are irradiated toward the subject O as fan beam X-rays or cone beam X-rays.

The diaphragm 32 is composed of, for example, a wedge filter, and is controlled by a gantry control circuit 26 to cover at least one irradiation range of X-rays emitted from the X-ray tube 31 in the slice direction (z direction, column direction) and the channel direction. adjust.

The X-ray detector 33 is composed of a plurality of X-ray detection elements (charge storage elements). This X-ray detection element (radiation detection element) detects X-rays irradiated from the X-ray tube 31 and transmitted through the subject O. The X-ray tube 31 and the X-ray detector 33 are supported by the rotary pedestal 22 so as to face each other with the subject O mounted on the sleeper device 12 in between.

The X-ray detector 33 is, for example, a so-called one-dimensional array type (single slice type) having one row in the slice direction (z direction) and a plurality of X-ray detection elements in the channel direction orthogonal to the slice direction. Can be used. Further, a so-called two-dimensional array type (multi-slice type) having a plurality of rows in the slice direction and a plurality of X-ray detection elements in the channel direction may be used. In the case of the multi-slice type, a plurality of rows of X-ray detection elements having a plurality of channels in the channel direction can be arranged in the slice direction (z direction).

Further, in the case of the two-dimensional array type, the X-ray detector 33 can be composed of a plurality of X-ray detection elements densely distributed in both the slice direction (z direction) and the channel direction. In the following description, when the X-ray detector 33 is composed of a plurality of X-ray detector elements densely arranged in two dimensions of the slice direction axis (first axis) and the channel direction axis (second axis). An example is shown.

The DAS 34 receives analog signals output by a plurality of X-ray detection elements constituting the X-ray detector 33, and performs processes such as current-voltage conversion, amplification, and analog-digital conversion (AD conversion) on the signals. Then, the DAS 34 generates transmission data using these processed signals and transmits the transmission data to the console 13 via the data transmission device 27. The console 13 performs a reconstruction process based on the projection data included in the transmission data, and generates a reconstruction image.

The rotary pedestal 22 integrally holds the X-ray tube 31, the diaphragm 32, the X-ray detector 33, and the DAS 34, and is supported by the fixed pedestal 21. As the rotary gantry 22 is controlled and rotated by the gantry control circuit 26, the X-ray tube 31, the diaphragm 32, the X-ray detector 33, and the DAS 34 are integrally rotated around the opening in the central portion of the rotary gantry 22. , Rotate around subject O. Further, the rotary pedestal 22 may be configured to be tiltable with respect to the fixed pedestal 21. Information on the current rotation speed of the rotary gantry 22, tilt operation, and current tilt angle information is given to the console 13 via the gantry control circuit 26.

The sleeper device 12 includes a base 36 installed on an installation surface such as a floor surface, a top plate 37 supported by the base 36, and a top plate drive device 38.

The top plate 37 is configured so that the subject O can be placed on it. The top plate driving device 38 is controlled by the gantry control circuit 26 to move the top plate 37 up and down in the y-axis direction (vertical direction). Further, the top plate driving device 38 is controlled by the gantry control circuit 26 to move the top plate 37 to the X-ray irradiation field of the opening in the central portion of the rotary gantry 22 along the z-axis direction (longitudinal direction of the top plate 37). And transfer. Further, the top plate driving device 38 is controlled by the gantry control circuit 26 to transfer the top plate 37 in the x-axis direction (horizontal direction of the top plate 37). Further, the top plate driving device 38 can be controlled by the gantry control circuit 26 to rotate the top plate 37 about each axis of the xyz axis. Information regarding the movement of the top plate 37 (movement speed and movement direction) and information on the current position are given to the console 13 via the top plate drive device 38 and the gantry control circuit 26.

The gantry control circuit 26 has at least a processor and a storage circuit. The gantry control circuit 26 is controlled by the console 13 and executes X-ray imaging of the subject O by controlling the gantry 11 according to a program stored in the storage circuit.

Although FIG. 1 shows an example in which the gantry control circuit 26 and the console 13 are connected by wire, the gantry control circuit 26 and the console 13 may be connected so as to be able to transmit and receive data via a network.

The data transmission device 27 performs parallel / serial conversion, electrical / optical / electrical conversion, and serial / parallel conversion on the transmission data output from the DAS 34. The data transmission device 27 includes, for example, a parallel / serial converter (not shown), an electric / optical / electric converter, and a serial / parallel converter (not shown). The multi-channel transmission data output from the DAS 34 is converted into time-series one-channel data by the parallel / serial converter provided on the rotary stand 22, and optical communication using the electric / optical / electric converter, etc. Is supplied to the serial / parallel converter provided on the fixed frame 21.

Subsequently, the transmission data of one channel is returned to the transmission data of a plurality of channels by the above-mentioned serial / parallel converter. The projection data of the plurality of channels obtained in time series is stored in the console 13 with the arrangement position information and rotation angle information of the radiation detection elements in the channel direction and the position information (imaging position) of the projection data in the slice direction as incidental information. ..

The data transmission method by the data transmission device 27 may be another method as long as data transmission between the DAS 34 provided on the rotary pedestal 22 and the gantry control circuit 26 provided on the fixed gantry 21 is possible. For example, a device such as a slip ring may be used for data transmission by the data transmission device 27, or a method of non-contact transmission may be used.

On the other hand, the console 13 of the X-ray CT apparatus 10 is composed of, for example, a general personal computer or a workstation, and has an input circuit 41, a display 42, a storage circuit 43, and a control circuit 44. The console 13 does not have to be provided independently, and a part of the configurations 31-34 of the console 13 may be provided dispersedly on the gantry 11.

The input circuit 41 is composed of general input devices such as a trackball, a switch button, a mouse, a keyboard, and a numeric keypad, and outputs an operation input signal corresponding to the user's operation to the control circuit 44. For example, the user can set a scan plan (shooting condition) via the input circuit 41. In the present embodiment, the imaging conditions include information on the imaging region (FOV: Field Of View) in the channel direction and the slice direction. The imaging conditions may be set via the input circuit 41 or may be acquired via the network.

The display 42 is composed of a general display output device such as a liquid crystal display or an OLED (Organic Light Emitting Diode) display, and displays a reconstructed image or the like under the control of the control circuit 44.

The storage circuit 43 has a configuration including a recording medium that can be read by a processor, such as a magnetic or optical recording medium or a semiconductor memory. Some or all of the programs and data in these recording media may be configured to be downloaded by communication via an electronic network. The storage circuit 43 stores, for example, the projection data transmitted from the DAS 34, the reconstructed image generated by the control circuit 44, and the like.

The control circuit 44 executes a process of controlling the gantry 11 via the gantry control circuit 26 and a process of generating a reconstructed image based on projection data by reading and executing a program stored in the storage circuit 43. It is a processor that does. For example, when the imaging condition is set by the user via the input circuit 41, the control circuit 44 controls the gantry 11 via the gantry control circuit 26 based on the imaging condition, thereby performing X-ray imaging of the subject O. To execute.

FIG. 2 is an explanatory diagram showing an example of the relationship between the X-ray detector 33 and the imaging region 51.

Depending on the imaging conditions, the imaging area 51 may be narrower than the installation area of all the X-ray detection elements of the X-ray detector 33. In this case, the output data of the X-ray detection element (non-attention element) corresponding to the region (hereinafter referred to as the non-attention region) 52 other than the imaging region 51 is a part of the data of these non-attention elements. In some cases, for example, it is useless data except when it is used for post-processing. In this case, when imaging under the imaging conditions, only the members (X-ray detection element 33a and AD conversion substrate) related to the collection of output data of the X-ray detection element 33a corresponding to the imaging region included in the imaging conditions are operated. If the power consumption related to the collection of output data of the non-attention element can be reduced by limiting the operation of the non-attention element or the non-attention substrate, the power consumption of the X-ray CT apparatus 10 can be reduced. Conceivable.

FIG. 3 is an explanatory view showing an example of a housing 60 accommodating the X-ray detector 33 and the DAS 34. Further, FIG. 4 is a block diagram showing an example of internal configuration of DAS34.

As shown in FIG. 3, the X-ray detector 33 and the DAS 34 are housed in, for example, one housing 60. The DAS34 is a signal processing board (hereinafter referred to as an AD conversion board in this embodiment) ADC1, ADC2, ..., Which includes a signal processing circuit such as an IV converter or an AD converter that receives data from the X-ray detection element 33a. It has a conversion board group 71 composed of ADCn (where n is a positive integer) and a DAS control board 72. The housing 60 may have a protrusion for holding the DAS control board 72 (see FIG. 3).

As shown in FIG. 4, the DAS control board 72 has a processing circuit 76 and a storage circuit 77.

By reading and executing the program stored in the storage circuit 77, the processing circuit 76 reads and executes the output data of the X-ray detection element 33a corresponding to the imaging region 51 included in the imaging condition at least when imaging under the imaging condition. It is a processor that executes a process for operating only the member related to collection (X-ray detection element 33a and AD conversion board).

The storage circuit 77 has a configuration including a recording medium that can be read by a processor, such as a magnetic or optical recording medium or a semiconductor memory. Some or all of the programs and data in these recording media may be configured to be downloaded by communication via an electronic network. The details of the configuration of the processing circuit 76 will be described later with reference to FIG.

As shown in FIG. 4, the processing circuit 76 communicates with the conversion board group 71. Each AD conversion board (each signal processing board) ADC1, ADC2, ..., ADCn of the conversion board group 71 receives outputs of a plurality of X-ray detection elements 33a, respectively.

Each AD conversion board ADC1, ADC2, ..., ADCn of the conversion board group 71 receives output signals of a plurality of X-ray detection elements 33a constituting the X-ray detector 33, and at least analog-digital conversion (AD conversion) is performed. The operation of performing the processing and the operation of outputting the processed signal are performed. The AD conversion boards ADC1, ADC2, ..., ADCn may further perform operations such as current-voltage conversion and amplification on the output signal of the X-ray detection element 33a.

In addition, another substrate may be further provided, and an operation of performing current-voltage conversion, amplification, or the like on the output signal of the X-ray detection element 33a may be performed on the other substrate. In this case, the AD conversion substrate (signal processing substrate) described in the present embodiment means a generic term including both another substrate and a substrate that performs AD conversion.

Each AD conversion board ADC1, ADC2, ..., ADCn of the conversion board group 71 processes the transition between these states so that the ADCn operates in any of the normal start-up state, standby state, and stop state. Is controlled by. The normal activation state is a state in which an operation of performing an analog-to-digital conversion (AD conversion) operation on the output signal of the X-ray detection element 33a and an operation of outputting the processed signal are performed. The standby state is a state in which at least the operation of outputting the processed signal is stopped. The hibernate state is a state in which power supply is stopped and all operations are stopped. The standby state and the hibernate state are both states in which the operation of outputting the processed signal is stopped. In the following description, the standby state and the hibernation state are appropriately collectively referred to as operation-restricted states.

The processing circuit 76 according to the present embodiment is a member (X-ray detection element) for collecting output data of the X-ray detection element 33a corresponding to the imaging region 51 included in the imaging condition when imaging under the set imaging condition. Only 33a and the AD conversion board) are operated, and the collection of output data of the non-attention element is restricted. Therefore, the processing circuit 76 can reduce the power consumption as compared with the case where all the X-ray detection elements 33a are operated at the time of imaging.

Specifically, the processing circuit 76 is normally activated so that the processed signal can be output from the X-ray detection element 33a and the AD conversion board corresponding to the imaging region 51 when imaging under the set imaging conditions. The X-ray detection element 33a and the AD conversion board corresponding to the imaging region 51 are controlled so as to be in the state. At this time, the processing circuit 76 limits the operation of the non-attention substrate or the non-attention substrate so as to limit the operation of collecting the output data of the non-attention element at the time of imaging under the set imaging conditions. The operation of the non-attention element or the non-attention substrate is controlled so that the state or the non-attention element is in the stopped state.

Here, the drive method of the AD conversion board is broadly divided into a drive method in which all AD conversion boards are in a normal start-up state in principle (hereinafter referred to as ON in principle) and an operation restricted state in principle for all AD conversion boards. There are two methods, a driving method (hereinafter, referred to as OFF in principle) in a (for example, hibernation state).

When the AD conversion board is ON in principle, the processing circuit 76 limits the collection operation of the X-ray detection element 33a output data corresponding to the non-attention region 52 at least when imaging under the set imaging conditions. , The process for reducing the power consumption of the X-ray CT apparatus 10 is executed.

Specifically, the collection restriction of the output data of the non-attention element is restricted by stopping the operation of the non-attention element, or among the AD conversion boards ADC1, ADC2, ..., ADCn of the conversion board group 71. This is performed by limiting the operation of the AD conversion substrate (hereinafter referred to as the non-attention substrate) that receives the output signal of the non-attention element. More specifically, the processing circuit 76 performs an operation of outputting at least a processed signal by shifting the operating state of the non-attention board to an operation restricted state (either a standby state or a hibernation state), for example. Limit the operation of the non-attention board to stop. In either the standby state or the hibernation state, the power consumption of the X-ray CT apparatus 10 is reduced as compared with the normal starting state.

On the other hand, when the AD conversion board is turned off in principle, the AD conversion board corresponding to the image pickup region 51 is shifted to the normal start-up state and the output of the X-ray detection element 33a is performed at least when imaging under the set imaging conditions. Have them collect data. At this time, in principle, when the non-attention substrate is OFF, the operation of the non-attention substrate is restricted, so that the collection of output data of the non-attention element is naturally restricted.

Regardless of which driving method is used, the processing circuit 76 operates a member related to collecting output data of the X-ray detection element 33a corresponding to the imaging region included in the imaging condition and does not operate when imaging under the imaging condition. By limiting the collection of output data of the element of interest, the power consumption of the X-ray CT apparatus 10 can be reduced as compared with the case where all the X-ray detection elements 33a are operated at the time of imaging.

The storage circuit 77 stores in advance the correspondence relationship between the imaging region 51 and the plurality of X-ray detection elements 33a (hereinafter, referred to as region element correspondence relations) set in the imaging conditions of the subject O. Further, the storage circuit 77 stores in advance the correspondence relationship between the plurality of X-ray detection elements 33a and the plurality of AD conversion substrates (hereinafter, referred to as the element substrate correspondence relationship). These correspondences are stored in the storage circuit 77 in the form of a table, for example. Further, the storage circuit 77 stores in advance the correspondence relationship between the imaging region 51 and the plurality of AD conversion boards (hereinafter, referred to as the region board correspondence relationship) in place of these correspondence relationships or together with these correspondence relationships. .. The processing circuit 76 can extract the non-attention substrate corresponding to the non-attention region 52 by using, for example, the information of these correspondence relationships.

The correspondence information stored in the storage circuit 77 is stored in a storage circuit other than the storage circuit 77, for example, a storage circuit of the gantry control circuit 26 or a storage circuit 43 of the console 13, and the gantry control circuit 26 is appropriately stored. It may be given to DAS34 via.

FIG. 5 is an explanatory diagram showing an example of a connection relationship between the X-ray detector 33, the conversion board group 71, and the processing circuit 76. In FIG. 5, the X-ray detection element 33a is composed of an element 33a1 and an element 33a2 having a size smaller than that of the element 33a1, and eight minute elements 33a2 are arranged at intervals of, for example, 0.5 mm in the central portion in the slice direction. In addition, an example is shown in which four elements a1 are arranged at 1 mm intervals at both ends in the slice direction.

As shown in FIG. 5, each AD conversion board ADC1, ADC2, ..., ADCn of the conversion board group 71 includes a plurality of X-ray detection elements 33a constituting the X-ray detector 33 in a plurality of groups GP1, GP2. ..., For each group divided into GPn, one AD conversion board is connected to each of the X-ray detection elements 33a so as to correspond to each other. It should be noted that the group is just a conceptual group used for convenience of the description of the present embodiment, and the plurality of X-ray detection elements 33a may not be physically divided into groups such as on separate substrates. Absent.

Further, each of ADC1, ADC2, ..., ADCn of the conversion board group 71 is connected to the processing circuit 76 by a data line and a signal line, respectively. The data line is a communication line for performing communication in which the AD conversion board gives output data to the processing circuit 76. The signal line is a signal line for transmitting a signal instructing the processing circuit to limit the operation to the AD conversion board when the AD conversion board is a non-attention board.

FIG. 6 is an explanatory diagram showing an example of the relationship between the imaging region 51 and the non-attention substrate. FIG. 6 shows a case where a plurality of X-ray detection elements 33a (see the dotted line in FIG. 6) are divided into eight groups GP1, GP2, ..., GP8 (see the solid line rectangle in FIG. 6) along the channel direction. An example of is shown. In this case, the conversion board group 71 is composed of eight AD conversion boards ADC1, ADC2, ... ADC8 corresponding to each group.

In the example shown in FIG. 6, in the groups GP1 and GP8, all the X-ray detection elements 33a belonging to the group are a group of non-attention elements (see hatching in FIG. 6). In this case, the processing circuit 76 extracts the AD conversion boards ADC1 and ADC8 corresponding to these groups as non-attention boards. In the example shown in FIG. 6, the non-attention substrate corresponding to the non-attention region 52 along the channel direction is extracted.

Note that FIG. 6 shows an example of a method of extracting the corresponding AD conversion substrate as a non-attention substrate for a group in which all the X-ray detection elements 33a belonging to the group are non-attention elements. The AD conversion substrate corresponding to the group in which some of the X-ray detection elements 33a of the above are non-attention elements may be extracted as the non-attention substrate. In this case, in the example shown in FIG. 6, the AD conversion substrates ADC1, 2, 7, and 8 corresponding to the groups GP1, 2, 7, and 8 are extracted as non-attention substrates.

In the former method, the entire imaging region 51 can be imaged, and the power consumption of the X-ray CT apparatus 10 can be reduced. Further, in the latter method, a part of the vicinity of the outer periphery of the imaging region (FOV) may not be imaged, but the power consumption of the X-ray CT apparatus 10 can be further reduced as compared with the former case. The contour portion of the FOV may not have a region of interest (ROI), in which case the latter method does not adversely affect the interpretation. Which of these methods is used may be set by the user, for example, via the input circuit 41. Further, this setting may be included as a part of each imaging condition. Further, when the AD conversion substrate corresponding to the group in which a part of the plurality of X-ray detection elements 33a belonging to the group is a non-attention element is extracted as the non-attention substrate, the ratio of the non-attention elements belonging to the group is equal to or more than a predetermined threshold value. Only when is, the AD conversion substrate corresponding to the group may be extracted as a non-attention substrate.

FIG. 7 is an explanatory diagram showing another example of the relationship between the imaging region 51 and the non-attention substrate. In FIG. 7, a plurality of X-ray detection elements 33a (see the dotted line in FIG. 7) are also grouped in the slice direction, and there are a total of 32 groups (8 along the channel direction and four along the channel direction) (FIG. 7). An example of the case where it is divided into (see the solid line rectangle) is shown. In this case, the conversion board group 71 is composed of 32 AD conversion boards corresponding to each group.

When the plurality of X-ray detection elements 33a are grouped in both the channel direction and the slice direction, the non-attention substrate corresponding to the non-attention region 52 along the slice direction is extracted as well as the channel direction. In the example shown in FIG. 7, all the X-ray detection elements 33a belonging to the group have a total of 20 groups of non-attention elements (see hatching in FIG. 6). In this case, the processing circuit 76 extracts the AD conversion substrate corresponding to these groups as a non-attention substrate. In the example shown in FIG. 7, 20 groups (62.5%) out of all 32 groups are to be extracted. Therefore, the power consumption can be further reduced as compared with the example shown in FIG. 6 in which 2 groups (25%) out of all 8 groups are extracted.

In the example shown in FIG. 7, the AD conversion substrate corresponding to the group in which a part of the plurality of X-ray detection elements 33a belonging to the group is a non-attention element may be extracted as the non-attention substrate.
Next, the details of the configuration of the processing circuit 76 will be described.

FIG. 8 is a block diagram showing an example of the functions realized by the processing circuit 76. The processing circuit 76 realizes at least an imaging region acquisition function 81, a correspondence acquisition function 82, an extraction function 83, an operation restriction function 84, a processing signal acquisition function 85, and a transmission data generation function 86. Each of these functions 81-86 is stored in the storage circuit 77 in the form of a program.

With these functions 81-86, the processing circuit 76 operates only the member related to the collection of the output data of the X-ray detection element 33a corresponding to the imaging region 51 included in the imaging condition, at least when imaging under the imaging condition. As a result, processing for reducing the power consumption of the X-ray CT apparatus 10 is executed. Specifically, the processing circuit 76 may control the operation of the non-attention element or the non-attention substrate at least during imaging under imaging conditions.

For example, when the AD conversion substrate is ON in principle, the processing circuit 76 limits the operation of collecting the X-ray detection element 33a output data corresponding to the non-attention region 52 at least during imaging under imaging conditions. The collection of output data of the non-attention element can be restricted, for example, by limiting the operation of the AD conversion board provided after the non-attention element. Further, when the X-ray detection element 33a is configured to consume power for the operation of the X-ray detection element 33a, for example, when each of the X-ray detection elements 33a operates by TFT drive, the processing circuit 76 stops the power supply to the non-attention element. The X-ray detector 33 may be controlled so as to stop the operation of the non-attention element. The collection restriction of the output data of the non-attention element is performed by, for example, at least one of the operation restriction process of the AD conversion board and the operation stop process of the non-attention element. In this embodiment, an example will be described in which the collection of output data of the non-attention element is restricted by limiting the operation of the AD conversion board provided after the non-attention element.

The imaging region acquisition function 81 is a function of acquiring information on the imaging region 51 included in the imaging conditions from the console 13 via the gantry control circuit 26 and giving this information to the extraction function 83. The imaging conditions include information on the imaging region 51 (FOV) in the channel direction and the slice direction.

The image pickup area acquisition function 81 is based on the set image pickup area information as long as the image pickup area information is set even during the setting of the image pickup conditions and before the setting of the image pickup area 51. The imaging region 51 may be estimated, and the estimated information of the imaging region 51 may be given to the extraction function 83. For example, when the imaging region 51 is selected from any of Large, Medium, and Small, the imaging region acquisition function 81 can be used if the "head" is set as the imaging region. It is preferable to estimate the imaging region 51 according to the imaging region, such as estimating that the imaging region 51 is “medium” and estimating that the imaging region 51 is “large” if the “body” is set. Further, in this case, the storage circuit 77 may store in advance the correspondence between the imaging region and the imaging region 51.

When estimating the imaging area 51 based on the information of the imaging site even during the setting of the imaging conditions and before the setting of the imaging region 51, when the AD conversion board is ON in principle, all the imaging conditions are set. By being able to start the operation limitation of the non-attention substrate before it is done, the power consumption can be further reduced. Further, when the AD conversion board is turned off in principle, the AD conversion board corresponding to the image pickup area 51 can be moved to the normal start-up state and warmed up before all the imaging conditions are set. When all the imaging conditions are determined, imaging can be started promptly.

The correspondence relationship acquisition function 82 is a function of acquiring the area element correspondence relationship and the element substrate correspondence relationship from the storage circuit 77. When the area board correspondence relationship is stored in the storage circuit 77, the correspondence relationship acquisition function 82 has a function of acquiring the area board correspondence relationship from the storage circuit 77.

The extraction function 83 extracts the non-attention element corresponding to the non-attention region 52 or the non-attention substrate corresponding to the non-attention element based on the information of the imaging region 51 received from the console 13 via the imaging region acquisition function 81. It is a function to do. At this time, the extraction function 83 may use, for example, the information on the region substrate correspondence received from the correspondence acquisition function 82. Further, when the extraction function 83 receives the region element correspondence relationship and the element substrate correspondence relationship from the correspondence relationship acquisition function 82, it is preferable to obtain the region substrate correspondence relationship based on these correspondence relationships.

The operation limiting function 84 controls the operation of the non-attention element or the non-attention substrate at least during imaging under imaging conditions. The operation limiting function 84 controls the operation of the non-focused substrate so that the non-focused substrate stops the operation of outputting at least the processed signal at least during imaging under the imaging conditions. The operation limitation of the non-attention board is performed by controlling the operating state of the non-attention board so that the non-attention board at least stops the operation of outputting the processed signal. Further, the operation limiting function 84 may control the non-attention element so that, for example, the non-attention element stops at least during imaging under imaging conditions.

More specifically, when the AD conversion board is ON in principle, the processing circuit 76 communicates with the non-attention board via a signal line, for example, at least during imaging under imaging conditions by the operation limiting function 84, and is not. Either the non-attention board is put into a standby state so as to stop the output operation of the signal after processing from the attention board, or the AD conversion board is put into a hibernation state by stopping the power supply to the non-attention board. By shifting the operating state of the non-attention board to, at least the operation of the non-attention board is restricted so as to stop the operation of outputting the processed signal. When there are a plurality of non-attention substrates, a part of the non-attention substrates may be shifted to the standby state and the remaining non-attention substrates may be shifted to the hibernation state.

Further, when the AD conversion board is turned off in principle, the processing circuit 76 communicates with the AD conversion board corresponding to, for example, the imaging region 51 via a signal line at least during imaging under imaging conditions by the operation limiting function 84. Then, the AD conversion board corresponding to the imaging region 51 is shifted to the normal startup state, and the output data of the X-ray detection element 33a is collected.

The processing signal acquisition function 85 is a function that communicates with the conversion board group 71 via a data line, receives a processed signal from an AD conversion board other than the non-attention board, and gives it to the transmission data generation function 86.

Further, the processing signal acquisition function 85 has a function of performing an error mask for communication via the data line with the AD conversion board extracted as the non-attention board. No signal can be received from the AD conversion board extracted as the non-attention board via the data line. This is because the non-attention board is stopped by the operation limiting function 84 to output at least the processed signal. If there is a data line in which no signal is transmitted, the processing circuit 76 may misunderstand that a communication disconnection error has occurred. Therefore, it is preferable that the processing signal acquisition function 85 performs an error mask on the communication with the non-attention board via the data line among the data lines to prevent the harmful effect of determining that the communication is interrupted.

The transmission data generation function 86 is a function of generating transmission data using the processed signal output from the conversion board group 71 and transmitting the transmission data to the console 13 via the data transmission device 27.

Even if the console 13 instructs the gantry control circuit 26 and DAS 34 that, for example, only the projection data of the AD conversion board corresponding to the imaging region 51 is used, and dummy data should be attached to the data of the other AD conversion boards. Good. At this time, the transmission data generation function 86 adds dummy data to the position in the transmission data structure where the processed signal corresponding to the non-attention board whose operation is restricted by the operation restriction function 84 should be arranged. .. As the dummy data, for example, a test pattern (random data or the like) used for confirming the establishment of a communication connection between the processing circuit 76 of the DAS control board 72 and the console 13 can be used. The console 13 can perform a reconstruction process based on the projection data included in the transmission data and generate a reconstruction image.

Next, an example of the operation of the X-ray CT apparatus 10 according to the present embodiment will be described.

FIG. 9 shows an example of a procedure for reducing the power consumption of the X-ray CT apparatus 10 by limiting the operation of the non-attention substrate so as to stop at least the operation of outputting the processed signal by the processing circuit 76 of the DAS34. It is a flowchart which shows. In FIG. 9, reference numerals with numbers attached to S indicate each step of the flowchart. FIG. 9 shows an example in which the AD conversion substrate is ON in principle and the operation of the non-attention substrate is restricted so as to stop the operation of outputting at least the processed signal at the time of imaging under the imaging conditions.

This procedure starts when the console 13 receives the setting of the imaging condition including the information of the imaging region (FOV) in the channel direction and the slice direction via the input circuit 41 by the user.

First, in step S1, the processing circuit 76 acquires the information of the imaging region 51 included in the imaging conditions from the console 13 via the gantry control circuit 26 by the imaging region acquisition function 81.

Next, in step S2, the processing circuit 76 acquires the region element correspondence and the element substrate correspondence from the storage circuit 77 by the correspondence acquisition function 82.

Next, in step S3, the processing circuit 76 extracts the non-attention element by the extraction function 83 based on the region element correspondence relationship and the information of the imaging region 51.

Next, in step S4, the processing circuit 76 extracts the non-attention substrate based on the element substrate correspondence relationship and the non-attention element by the extraction function 83. When the area board correspondence relationship is available, the processing circuit 76 directly extracts the non-attention board based on the information of the imaging region 51 and the area board correspondence relationship by the extraction function 83 instead of steps S3 and S4. You may.

Next, in step S5, the processing circuit 76 communicates with the non-attention board via the signal line by the operation limiting function 84, and the non-attention board stops the operation of outputting at least the processed signal. The operating state of the board is shifted to either the standby state or the hibernation state.

Next, in step S6, the processing circuit 76 performs an error mask on the communication via the data line for the data line connected to the non-attention board by the processing signal acquisition function 85.

Next, in step S7, the processing circuit 76 communicates with the conversion board group 71 via the data line by the processing signal acquisition function 85, and receives the processed signal from the AD conversion board other than the non-attention board.

Next, in step S8, the processing circuit 76 generates transmission data using the processed signal output from the conversion board group 71 by the transmission data generation function 86, and transmits the transmission data to the console 13 via the data transmission device 27. Send. At this time, the processing circuit 76 adds dummy data to the position in the transmission data structure where the processed signal corresponding to the non-attention substrate whose operation is restricted by the operation limiting function 84 should be arranged.

By the above procedure, the power consumption of the X-ray CT apparatus 10 can be reduced by limiting the operation of the non-attention substrate so as to at least stop the operation of outputting the processed signal.

FIG. 10 is an explanatory diagram showing an example of a case where the housing 60 accommodating the X-ray detector 33 and the DAS 34 further accommodates a plurality of fans 90.

As shown in FIG. 10, a plurality of fans 90 for discharging the heat generated by each AD conversion board to the outside of the housing 60 may be provided in the vicinity of the conversion board group 71. The fan 90 can exhaust the heat generated by the AD conversion substrate in the vicinity of the fan 90 from an exhaust port (not shown) of the housing 60.

When the X-ray CT apparatus 10 has the plurality of fans 90, the processing circuit 76 further consumes by stopping the operation of the fan 90 corresponding to the non-attention substrate by the operation limiting function 84 in step S5 of FIG. Power can be reduced.

Further, the conversion board group 71 may be divided into a plurality of groups, and each fan of the plurality of fans 90 may correspond to each board group. In this case, one fan is in charge of cooling a plurality of AD conversion boards belonging to the board group in charge. In this case, the operation limiting function 84 may reduce power consumption by stopping the operation of fans in which all AD conversion boards belonging to the board group in charge of the plurality of fans 90 are non-attention boards. Further, the operation limiting function 84 operates the fan in which all the AD conversion boards belonging to the board group in charge of the plurality of fans 90 correspond to the imaging region 51 as usual.

Further, when at least one AD conversion board belonging to the board group in charge corresponds to the imaging region 51, the operation limiting function 84 may operate the fan in charge of the board group. When the AD conversion board belonging to the board group in charge is composed of a board corresponding to the imaging region 51 and a non-attention board, the operation limiting function 84 intermittently operates the fan in charge of the board group. You may let me. The intermittent operation may be performed at a predetermined cycle, or may be performed according to the substrate temperature. The predetermined period may be set so that the operating time of the fan becomes longer as the number of substrates corresponding to the imaging region 51 increases.

FIG. 11 is a block diagram showing a modified example of the internal configuration of DAS34.

The X-ray CT apparatus 10 may further include temperature sensors TS1, TS2, ..., TSn. The temperature sensors TS1, TS2, ..., TSn measure the temperatures of the AD conversion boards ADC1, ADC2, ..., and ADCn of the conversion board group 71, respectively, and give the measurement results to the operation limiting function 84.

When the temperature sensors TS1, TS2, ..., TSn are provided, the operation limiting function 84 may control the operation of the fan according to the temperature of each AD conversion board. For example, when the AD conversion board belonging to the board group in charge is composed of the AD conversion board corresponding to the imaging region 51 and the non-attention board, the operation limiting function 84 is among the AD conversion boards belonging to the board group. The temperature of the AD conversion substrate corresponding to the imaging region 51 is monitored. Then, the operation limiting function 84 operates the fan when there is an AD converter plate having a temperature equal to or higher than the first predetermined temperature, while all the AD conversion boards corresponding to the imaging region 51 belonging to the board group have the first predetermined temperature. It is preferable to operate the fan intermittently by stopping the operation when the temperature is lower than the temperature. At this time, the temperature of the non-attention substrate belonging to the substrate group may be excluded from the monitoring target.

Further, when the temperature sensors TS1, TS2, ..., TSn are provided, the operation limiting function 84 operates the AD conversion board according to the temperature of each AD conversion board so that the temperature of the AD conversion board does not drop too much. It is good to control. The temperature of the X-ray detection element 33a is preferably within a temperature range suitable for X-ray detection. However, when the AD conversion board is in the operation restricted state (hibernation state or standby state) and the substrate temperature drops, the temperature of the X-ray detection element 33a connected to the AD conversion board may also drop due to heat conduction. ..

For example, when a plurality of protocols having different imaging regions 51 are set in one sequence, when the non-attention region changes to the imaging region 51 in a short time, the non-attention element changes to the attention element in a short time. Will be done. In this case, if the temperature of the element, which was a non-attention element, has dropped, the AD conversion substrate corresponding to the element shifts to a normal starting state and becomes hot, and the heat is transferred to the element. Imaging may not be resumed until the temperature rises to a temperature range suitable for X-ray detection.

Further, the X-ray CT apparatus 10 may include a heater for maintaining the temperature of the X-ray detection element 33a within a temperature range suitable for X-ray detection. However, also in this case, for example, if all the temperatures of the X-ray detector 33 are controlled by one heater, temperature unevenness will occur between the X-ray detection elements 33a constituting the X-ray detector 33. For example, when the temperature of the X-ray detector 33 is partially lowered due to the temperature drop of the non-attention element, one heater attempts to maintain the temperature in this temperature drop region and raises the temperature of the entire X-ray detector 33. Therefore, the temperature of the X-ray detection element 33a corresponding to the imaging region 51 rises too much.

Therefore, the operation limiting function 84 may intermittently increase the power supply to the AD conversion board in the operation limiting state among the conversion board group 71. Specifically, for example, when the temperature of the AD conversion board in the operation restricted state is lower than the second predetermined temperature, the AD conversion board is shifted to the normal start-up state, while the temperature of the AD conversion board is the second. When the temperature is higher than the third predetermined temperature, which is higher than the predetermined temperature of the above, it is preferable to shift to the operation restricted state again. By controlling the power supply intermittently in this way, the temperature of the AD conversion substrate is maintained within a predetermined temperature range so that the temperature of the X-ray detection element 33a is maintained within a temperature range suitable for X-ray detection. Can be done.

According to at least one embodiment described above, only the member related to the collection of output data of the detection element corresponding to the imaging region included in the imaging condition can be operated at the time of imaging under the imaging condition.

Although some embodiments of the present invention have been described, these embodiments are presented as examples and are not intended to limit the scope of the invention. These novel embodiments can be implemented in various other embodiments, and various omissions, replacements, and changes can be made without departing from the gist of the invention. These embodiments and modifications thereof are included in the scope and gist of the invention, and are also included in the scope of the invention described in the claims and the equivalent scope thereof.

For example, the radiation diagnostic apparatus according to the present embodiment includes a plurality of radiation detection elements, and is a data processing circuit (signal) to be controlled according to the present embodiment, such as an IV converter or an AD converter that receives data from these detection elements. A plurality of processing boards) may be provided, and a control system for collecting output data from these data processing circuits may be provided. In the present embodiment, as a radiological diagnostic apparatus, an X-ray CT apparatus 10 including an X-ray detector 33 for an X-ray CT apparatus having a plurality of X-ray detection elements 33a arranged in two dimensions in a slice direction and a channel direction. Although an example in which the above is used has been described, the radiological diagnostic apparatus according to the present embodiment is not limited to the X-ray CT apparatus. For example, an X-ray angio device or an X-ray diagnostic device having an FPD (Flat Panel Detector) composed of a plurality of detection elements, wherein a plurality of data processing circuits are provided after the FPD, and the data processing circuits are used. A device provided with a control system for collecting the output data of the above can be used as the radiation diagnostic apparatus according to the present embodiment.

Further, the extraction function 83, the operation restriction function 84, the processing signal acquisition function 85, and the transmission data generation function 86 of the processing circuit 76 in the present embodiment are a specific unit, a control unit, a processing signal acquisition unit, and transmission data within the scope of claims. Corresponds to each generator.

Further, the wording "processor" according to the gantry control circuit 26, the control circuit 44, and the processing circuit 76 in the present embodiment is, for example, a dedicated or general-purpose CPU (Central Processing Unit), a GPU (Graphics Processing Unit), or a specific one. Application Specific Integrated Circuits (ASICs), Programmable Logic Devices (for example, Simple Programmable Logic Devices: SPLDs), Complex Programmable Logic Devices (CPLDs), and Field Programmable Gate Arrays. (Field Programmable Gate Array: FPGA)) and the like. The processor realizes various functions by reading and executing a program stored in a storage circuit.

Instead of storing the program in the storage circuit, the program may be directly embedded in the circuit of the processor. In this case, the processor realizes various functions by reading and executing a program embedded in the circuit. Further, although FIG. 4 shows an example in which a single processing circuit 76 realizes each function, a processing circuit 76 is configured by combining a plurality of independent processors, and each processor executes a program. Each function may be realized. When a plurality of processors are provided, the storage medium for storing the programs may be provided individually for each processor, or the storage circuit 77 of FIG. 4 collectively stores the programs corresponding to the functions of all the processors. You may.

10 X-ray CT device 13 Console 31 X-ray tube 33 X-ray detector 33a Detection element 51 Imaging area 76 Processing circuit 77 Storage circuit 83 Extraction function 84 Operation restriction function 85 Processing signal acquisition function 86 Transmission data generation function 90 Fan

Claims (22)

X-ray tube and
A plurality of radiation detection elements for detecting X-rays emitted from the X-ray tube, and
A plurality of signal processing boards that receive the output signals of the plurality of radiation detection elements and perform at least an operation of performing analog-to-digital conversion processing and an operation of outputting the processed signal.
Based on the information of the imaging region included in the imaging conditions of the subject, the non-attention element which is a radiation detection element corresponding to the region other than the imaging region or the non-attention substrate which is a signal processing substrate corresponding to the non-attention element is Specific part to identify and
A control unit that controls the operation of the non-attention element or the non-attention substrate during imaging under the imaging conditions.
With
The plurality of radiation detection elements constitute an X-ray detector for an X-ray CT apparatus, and are arranged two-dimensionally along a channel direction axis and a slice direction axis.
The specific portion identifies the non-attention substrate corresponding to a region other than the range of the imaging region, at least in a direction along the channel direction axis.
Radiation-ray diagnostic apparatus. The control unit
When imaging under the imaging conditions, the radiation detecting element and the signal processing board corresponding to the imaging region are arranged with the radiation detecting element corresponding to the imaging region and the signal processing substrate so as to be in a normal activated state in which the processed signal can be output. The non-attention substrate controls the signal processing substrate, and at the time of imaging under the imaging conditions, the non-attention substrate is said to limit the operation of collecting output data of the non-attention element or the non-attention substrate. The operation of the non-attention element or the non-attention substrate is controlled so that the operation of outputting the processed signal is stopped or the non-attention element is stopped.
The radiological diagnostic apparatus according to claim 1. The control unit
If all of the plurality of signal processing boards are in the normal activated state before the setting of the imaging condition, the non-attention element's output data collection operation is restricted during imaging under the imaging condition. The operation of the non-attention element or the non-attention substrate is controlled so that the attention substrate shifts to the operation restricted state or the non-attention element shifts to the operation stop state.
The radiological diagnostic apparatus according to claim 2. The control unit
If all of the plurality of signal processing boards are in the operation restricted state before the setting of the imaging conditions, the signal processing boards corresponding to the imaging region are shifted to the normal activated state at the time of imaging under the imaging conditions. The non-attention substrate is in the operation limiting state in which at least the operation of outputting the signal after the processing is stopped so as to limit the operation of collecting the output data of the non-attention element, or the non-attention element is stopped. Control the operation of the non-attention element or the non-attention substrate so as to be in a state.
The radiological diagnostic apparatus according to claim 2 or 3. The operation restricted state of the non-attention substrate is
The non-attention board is in a hibernation state in which all operations are stopped, and the power supply to the non-attention board is stopped.
The radiological diagnostic apparatus according to any one of claims 2 to 4. The operation restricted state of the non-attention substrate is
The non-attention substrate is in a standby state in which at least the operation of outputting the processed signal is stopped.
The radiological diagnostic apparatus according to any one of claims 2 to 5. A transmission data generation unit that generates transmission data based on the processed signals output from the plurality of signal processing boards, and a transmission data generation unit.
With the non-attention board which communicates with the plurality of signal processing boards, receives the processed signal from the plurality of signal processing boards and gives it to the transmission data generation unit, and is in the operation restricted state by the control unit. For communication with the processing signal acquisition unit that performs error masking,
The radiological diagnostic apparatus according to any one of claims 2 to 6, further comprising. A transmission data generation unit that generates transmission data based on the processed signals output from the plurality of signal processing boards, and a transmission data generation unit.
A console that gives the setting information of the imaging condition to the specific unit and receives the transmission data generated by the transmission data generation unit.
With more
The transmission data generation unit
Dummy data is added to the processed signal corresponding to the non-attention board whose operation is restricted by the control unit to generate the transmission data, and the transmission data is transmitted to the console.
The radiological diagnostic apparatus according to any one of claims 2 to 7. The plurality of signal processing boards
Each of the plurality of radiation detection elements is connected so that one signal processing board corresponds to each group in which the plurality of radiation detection elements are divided into a plurality of groups.
The specific part is
When all the radiation detection elements belonging to the group are located in a region other than the imaging region, the signal processing substrate corresponding to the group is specified as the non-attention substrate.
The radiological diagnostic apparatus according to any one of claims 1 to 8. The plurality of radiation detection elements are
Arranged two-dimensionally along the first and second axes
The specific part is
Identifying the non-attention substrate corresponding to a region other than the range of the imaging region in a direction along at least one of the first axis and the second axis.
The radiological diagnostic apparatus according to any one of claims 1 to 9. A storage circuit that stores in advance the correspondence between the imaging region set under the imaging conditions and the plurality of signal processing boards.
The radiological diagnostic apparatus according to any one of claims 1 to 9, further comprising. A plurality of fans that discharge heat generated by the plurality of signal processing boards,
With more
The control unit
Of the plurality of fans, the operation of the fan corresponding to the non-attention board is stopped.
The radiological diagnostic apparatus according to any one of claims 1 to 11 . Each fan of the plurality of fans
Corresponding to each group in which the plurality of signal processing boards are divided into a plurality of groups,
The control unit
Among the plurality of fans, all signal processing boards belonging to the group stop the operation of the fan which is the non-attention board.
The radiological diagnostic apparatus according to claim 12 . A temperature sensor that measures the temperature of each of the plurality of signal processing boards and gives the measurement result to the control unit.
With more
The control unit
Among the plurality of fans, for a fan corresponding to a group in which a plurality of signal processing boards correspond to the imaging region and the non-attention substrate, the temperature of the signal processing substrate corresponding to the imaging region. Operates when the temperature is above the predetermined temperature, while stops the operation when the temperature is lower than the predetermined temperature.
The radiological diagnostic apparatus according to claim 13 . A temperature sensor that measures the temperature of each of the plurality of signal processing boards and gives the measurement result to the control unit.
With more
The control unit
Of the plurality of signal processing boards, the signal processing board in the operation-restricted state is shifted to the normal start-up state when the temperature is lower than the predetermined temperature.
The radiological diagnostic apparatus according to any one of claims 2 to 14 . The specific part is
When the imaging region is set among the imaging conditions, the imaging region is estimated from the set imaging region to identify the non-attention element or the non-attention substrate.
The radiological diagnostic apparatus according to any one of claims 1 to 15 . X-ray tube and
A plurality of radiation detection elements for detecting X-rays emitted from the X-ray tube, and
A plurality of signal processing boards that receive the output signals of the plurality of radiation detection elements and perform at least an operation of performing analog-to-digital conversion processing and an operation of outputting the processed signal.
Based on the information of the imaging region included in the imaging conditions of the subject, the non-attention element which is a radiation detection element corresponding to the region other than the imaging region or the non-attention substrate which is a signal processing substrate corresponding to the non-attention element is Specific part to identify and
A control unit that controls the operation of the non-attention element or the non-attention substrate at the time of imaging under the imaging conditions, and a radiation detection element and a signal processing substrate corresponding to the imaging region at the time of imaging under the imaging conditions. Controls the radiation detection element and the signal processing substrate corresponding to the imaging region so as to be in a normal activated state capable of outputting the processed signal, and at the time of imaging under the imaging conditions, the non-attention element or the above. The non-attention substrate is in an operation-restricted state in which the non-attention board stops the operation of outputting the processed signal so as to limit the operation of collecting the output data of the non-attention element, or the non-attention element is in an operation restricted state. A control unit that controls the operation of the non-attention element or the non-attention substrate so that the operation is stopped, and
A transmission data generation unit that generates transmission data based on the processed signals output from the plurality of signal processing boards, and a transmission data generation unit.
With the non-attention board which communicates with the plurality of signal processing boards, receives the processed signal from the plurality of signal processing boards and gives it to the transmission data generation unit, and is in the operation restricted state by the control unit. For communication with the processing signal acquisition unit that performs error masking,
A radiological diagnostic device equipped with. X-ray tube and
A plurality of radiation detection elements for detecting X-rays emitted from the X-ray tube, and
A plurality of signal processing boards that receive the output signals of the plurality of radiation detection elements and perform at least an operation of performing analog-to-digital conversion processing and an operation of outputting the processed signal.
Based on the information of the imaging region included in the imaging conditions of the subject, the non-attention element which is a radiation detection element corresponding to the region other than the imaging region or the non-attention substrate which is a signal processing substrate corresponding to the non-attention element is Specific part to identify and
A control unit that controls the operation of the non-attention element or the non-attention substrate at the time of imaging under the imaging conditions, and a radiation detection element and a signal processing substrate corresponding to the imaging region at the time of imaging under the imaging conditions. Controls the radiation detection element and the signal processing substrate corresponding to the imaging region so as to be in a normal activated state capable of outputting the processed signal, and at the time of imaging under the imaging conditions, the non-attention element or the above. The non-attention substrate is in an operation-restricted state in which the non-attention board stops the operation of outputting the processed signal so as to limit the operation of collecting the output data of the non-attention element, or the non-attention element is in an operation restricted state. A control unit that controls the operation of the non-attention element or the non-attention substrate so that the operation is stopped, and
A transmission data generation unit that generates transmission data based on the processed signals output from the plurality of signal processing boards, and a transmission data generation unit.
A console that gives the setting information of the imaging condition to the specific unit and receives the transmission data generated by the transmission data generation unit.
With
The transmission data generation unit
Dummy data is added to the processed signal corresponding to the non-attention board whose operation is restricted by the control unit to generate the transmission data, and the transmission data is transmitted to the console.
Radiation diagnostic equipment. X-ray tube and
A plurality of radiation detection elements for detecting X-rays emitted from the X-ray tube, and
A plurality of signal processing boards that receive the output signals of the plurality of radiation detection elements and perform at least an operation of performing analog-to-digital conversion processing and an operation of outputting the processed signal.
Based on the information of the imaging region included in the imaging conditions of the subject, the non-attention element which is a radiation detection element corresponding to the region other than the imaging region or the non-attention substrate which is a signal processing substrate corresponding to the non-attention element is Specific part to identify and
A control unit that controls the operation of the non-attention element or the non-attention substrate during imaging under the imaging conditions.
A plurality of fans that discharge heat generated by the plurality of signal processing boards, and
With
The control unit stops the operation of the fan corresponding to the non-attention board among the plurality of fans.
Radiation diagnostic equipment. X-ray tube and
A plurality of radiation detection elements for detecting X-rays emitted from the X-ray tube, and
A plurality of signal processing boards that receive the output signals of the plurality of radiation detection elements and perform at least an operation of performing analog-to-digital conversion processing and an operation of outputting the processed signal.
Based on the information of the imaging region included in the imaging conditions of the subject, the non-attention element which is a radiation detection element corresponding to the region other than the imaging region or the non-attention substrate which is a signal processing substrate corresponding to the non-attention element is Specific part to identify and
A control unit that controls the operation of the non-attention element or the non-attention substrate during imaging under the imaging conditions.
A plurality of fans that discharge heat generated by the plurality of signal processing boards, and
With
Each fan of the plurality of fans corresponds to each group in which the plurality of signal processing boards are divided into a plurality of groups.
The control unit stops the operation of the fan in which all the signal processing boards belonging to the group among the plurality of fans are the non-attention boards.
Radiation diagnostic equipment. X-ray tube and
A plurality of radiation detection elements for detecting X-rays emitted from the X-ray tube, and
A plurality of signal processing boards that receive the output signals of the plurality of radiation detection elements and perform at least an operation of performing analog-to-digital conversion processing and an operation of outputting the processed signal.
Based on the information of the imaging region included in the imaging conditions of the subject, the non-attention element which is a radiation detection element corresponding to the region other than the imaging region or the non-attention substrate which is a signal processing substrate corresponding to the non-attention element is Specific part to identify and
A control unit that controls the operation of the non-attention element or the non-attention substrate during imaging under the imaging conditions.
A plurality of fans that discharge heat generated by the plurality of signal processing boards, and
A temperature sensor that measures the temperature of each of the plurality of signal processing boards and gives the measurement result to the control unit.
With
Each fan of the plurality of fans corresponds to each group in which the plurality of signal processing boards are divided into a plurality of groups.
The control unit
Among the plurality of fans, for a fan corresponding to a group in which a plurality of signal processing boards correspond to the imaging region and the non-attention substrate, the temperature of the signal processing substrate corresponding to the imaging region. Operates when the temperature is above the predetermined temperature, while stops the operation when the temperature is lower than the predetermined temperature.
Radiation diagnostic equipment. X-ray tube and
A plurality of radiation detection elements for detecting X-rays emitted from the X-ray tube, and
A plurality of signal processing boards that receive the output signals of the plurality of radiation detection elements and perform at least an operation of performing analog-to-digital conversion processing and an operation of outputting the processed signal.
Based on the information of the imaging region included in the imaging conditions of the subject, the non-attention element which is a radiation detection element corresponding to the region other than the imaging region or the non-attention substrate which is a signal processing substrate corresponding to the non-attention element is Specific part to identify and
A control unit that controls the operation of the non-attention element or the non-attention substrate at the time of imaging under the imaging conditions, and a radiation detection element and a signal processing substrate corresponding to the imaging region at the time of imaging under the imaging conditions. Controls the radiation detection element and the signal processing substrate corresponding to the imaging region so as to be in a normal activated state capable of outputting the processed signal, and at the time of imaging under the imaging conditions, the non-attention element or the above. The non-attention substrate is in an operation-restricted state in which the non-attention board stops the operation of outputting the processed signal so as to limit the operation of collecting the output data of the non-attention element, or the non-attention element is in an operation restricted state. A control unit that controls the operation of the non-attention element or the non-attention substrate so that the operation is stopped, and
A temperature sensor that measures the temperature of each of the plurality of signal processing boards and gives the measurement result to the control unit.
With
The control unit shifts the signal processing board in the operation-restricted state among the plurality of signal processing boards to the normal start-up state when the temperature is lower than a predetermined temperature.
Radiation diagnostic equipment.

Images