JP6815893B2 - Metal-containing nanoparticle-supported catalyst and carbon dioxide reduction device - Google Patents
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Description
本発明は、金属含有ナノ粒子担持触媒および二酸化炭素還元装置に関するものである。 The present invention relates to a metal-containing nanoparticle-supporting catalyst and a carbon dioxide reduction device.
一般に、触媒とは、化学反応を起こす物質系の反応速度を変え、自らは化学変化しない物質をいい、触媒の種類(材料や形態など)によって特定の化学反応への選択性や、反応効率が異なる。 In general, a catalyst is a substance that changes the reaction rate of a substance system that causes a chemical reaction and does not chemically change by itself. Depending on the type of catalyst (material, form, etc.), the selectivity for a specific chemical reaction and the reaction efficiency can be determined. different.
また、触媒材料としては、金属材料が広く用いられており、特に反応性の良さから貴金属材料が重用されている。例えば、特許文献1では、特定の反応において選択性のある貴金属触媒が開示されている。また、近年では、酸化物触媒も着目されてきており、特許文献2では、触媒活性および選択性に優れた酸化物触媒が開示されている。 Further, as a catalyst material, a metal material is widely used, and a noble metal material is particularly heavily used because of its good reactivity. For example, Patent Document 1 discloses a noble metal catalyst that is selective in a specific reaction. Further, in recent years, an oxide catalyst has also attracted attention, and Patent Document 2 discloses an oxide catalyst having excellent catalytic activity and selectivity.
しかしながら、二酸化炭素の還元反応においては、選択性をもった化学反応の制御が未だ十分にできておらず、目的物を高い反応効率で得ることはできていなかった。そのため、特に二酸化炭素の還元反応において、反応を良好に促進・制御し得る触媒の開発が望まれている。 However, in the carbon dioxide reduction reaction, the chemical reaction with selectivity has not yet been sufficiently controlled, and the target product has not been obtained with high reaction efficiency. Therefore, it is desired to develop a catalyst capable of satisfactorily promoting and controlling the reaction, particularly in the reduction reaction of carbon dioxide.
そこで、本発明は、上記課題に鑑みてなされたものであり、特に二酸化炭素の還元反応に対し良好な触媒性能(例えば、触媒活性や選択性等)を有し、二酸化炭素の還元反応を良好に促進・制御し得る金属含有ナノ粒子担持触媒および二酸化炭素還元装置を提供することを目的とする。 Therefore, the present invention has been made in view of the above problems, and has particularly good catalytic performance (for example, catalytic activity, selectivity, etc.) for the reduction reaction of carbon dioxide, and the reduction reaction of carbon dioxide is good. It is an object of the present invention to provide a metal-containing nanoparticle-supporting catalyst and a carbon dioxide reducing device that can be promoted and controlled.
本発明者らは上記課題を解消するために鋭意検討した結果、ある特定の金属を含んでなる金属含有ナノ粒子を半導体粒子に担持した触媒が、特に二酸化炭素の還元反応に対し良好な触媒性能を発現し得ることを見出した。 As a result of diligent studies to solve the above problems, the present inventors have found that a catalyst in which metal-containing nanoparticles containing a specific metal are supported on semiconductor particles has particularly good catalytic performance for a carbon dioxide reduction reaction. It was found that can be expressed.
すなわち、本発明の要旨構成は、以下のとおりである。
[1] 二酸化炭素を還元するために用いられる金属含有ナノ粒子担持触媒であって、
前記金属含有ナノ粒子担持触媒は、担体としての半導体粒子に金属含有ナノ粒子を担持して成り、
前記金属含有ナノ粒子が、金、銀、銅、白金、ロジウム、パラジウム、ニッケル、コバルト、鉄、マンガン、クロム、イリジウム、亜鉛、チタンおよびルテニウムから選択される少なくとも1種の金属原子(M)を含有する、金属含有ナノ粒子担持触媒。
[2] 前記金属含有ナノ粒子の一次粒径が、0.2〜100nmである、上記[1]に記載の金属含有ナノ粒子担持触媒。
[3] 前記半導体粒子の一次粒径が、50nm〜100μmである、上記[1]または[2]に記載の金属含有ナノ粒子担持触媒。
[4] 前記半導体粒子に対する前記金属含有ナノ粒子の質量比率[(金属含有ナノ粒子の質量/半導体粒子の質量)×100]が、0.001〜1%である、上記[1]〜[3]のいずれか1項に記載の金属含有ナノ粒子担持触媒。
[5] 前記金属原子(M)が、銅である、上記[1]〜[4]のいずれか1項に記載の金属含有ナノ粒子担持触媒。
[6] 前記銅の平均価数が、0〜1.5である、上記[5]に記載の金属含有ナノ粒子担持触媒。
[7] 上記[1]〜[6]のいずれか1項に記載の金属含有ナノ粒子担持触媒を備える、二酸化炭素還元装置。
That is, the gist structure of the present invention is as follows.
[1] A metal-containing nanoparticle-supporting catalyst used for reducing carbon dioxide.
The metal-containing nanoparticles-supporting catalyst is formed by supporting metal-containing nanoparticles on semiconductor particles as a carrier.
The metal-containing nanoparticles contain at least one metal atom (M) selected from gold, silver, copper, platinum, rhodium, palladium, nickel, cobalt, iron, manganese, chromium, iridium, zinc, titanium and ruthenium. A metal-containing nanoparticle-supporting catalyst to be contained.
[2] The metal-containing nanoparticles-supporting catalyst according to the above [1], wherein the primary particle size of the metal-containing nanoparticles is 0.2 to 100 nm.
[3] The metal-containing nanoparticle-supporting catalyst according to the above [1] or [2], wherein the primary particle size of the semiconductor particles is 50 nm to 100 μm.
[4] The above [1] to [3], wherein the mass ratio of the metal-containing nanoparticles to the semiconductor particles [(mass of metal-containing nanoparticles / mass of semiconductor particles) × 100] is 0.001 to 1%. ], The metal-containing nanoparticles-supporting catalyst according to any one of the above items.
[5] The metal-containing nanoparticle-supporting catalyst according to any one of the above [1] to [4], wherein the metal atom (M) is copper.
[6] The metal-containing nanoparticle-supporting catalyst according to [5] above, wherein the average valence of copper is 0 to 1.5.
[7] A carbon dioxide reducing device comprising the metal-containing nanoparticle-supporting catalyst according to any one of the above [1] to [6].
本発明の金属含有ナノ粒子担持触媒は、特に二酸化炭素の還元反応に対し良好な触媒性能を発現する。 The metal-containing nanoparticle-supporting catalyst of the present invention exhibits good catalytic performance particularly for the reduction reaction of carbon dioxide.
本発明に従う金属含有ナノ粒子担持触媒および二酸化炭素還元装置の実施形態について、以下で詳細に説明する。 Embodiments of the metal-containing nanoparticle-supporting catalyst and the carbon dioxide reduction device according to the present invention will be described in detail below.
本実施形態に係る金属含有ナノ粒子担持触媒は、担体としての半導体粒子に金属含有ナノ粒子を担持して成り、この金属含有ナノ粒子は、金(Au)、銀(Ag)、銅(Cu)、白金(Pt)、ロジウム(Rh)、パラジウム(Pd)、ニッケル(Ni)、コバルト(Co)、鉄(Fe)、マンガン(Mn)、クロム(Cr)、イリジウム(Ir)、亜鉛(Zn),チタン(Ti)およびルテニウム(Ru)から選択される少なくとも1種の金属原子(M)を含有することを特徴とする。 The metal-containing nanoparticles-supporting catalyst according to the present embodiment is formed by supporting metal-containing nanoparticles on semiconductor particles as a carrier, and the metal-containing nanoparticles are gold (Au), silver (Ag), copper (Cu). , Platinum (Pt), Rhodium (Rh), Palladium (Pd), Nickel (Ni), Cobalt (Co), Iron (Fe), Manganese (Mn), Chromium (Cr), Iridium (Ir), Zinc (Zn) , Titanium (Ti) and Rhodium (Ru) are characterized by containing at least one metal atom (M) selected from them.
このような金属含有ナノ粒子担持触媒は、二酸化炭素の還元反応に対し優れた触媒性能を発現するため、二酸化炭素を還元するための触媒として好適に用いられる。 Such a metal-containing nanoparticle-supporting catalyst exhibits excellent catalytic performance for the reduction reaction of carbon dioxide, and is therefore preferably used as a catalyst for reducing carbon dioxide.
半導体粒子は、担体としての役割を果たし、光触媒として用いることができれば限定されず、公知の材料を用いることができる。例えば、酸化チタンや、酸化錫、酸化亜鉛、酸化ニオブ、チタン酸カルシウム、酸化ガリウム、酸化タンタル、チタン酸ストロンチウム、酸化タングステン、酸化セリウム、窒化ガリウム、窒化アルミニウムガリウム、ヒ化ガリウム、ヒ化アルミニウムガリウム等が挙げられ、上記のうち2種以上を混合して利用してもよい。中でも酸化チタン、チタン酸カルシウム、酸化ニオブ、酸化ガリウム、酸化タンタルが好ましい。 The semiconductor particles serve as a carrier and are not limited as long as they can be used as a photocatalyst, and known materials can be used. For example, titanium oxide, tin oxide, zinc oxide, niobium oxide, calcium titanate, gallium oxide, tantalum oxide, strontium titanate, tungsten oxide, cerium oxide, gallium nitride, gallium aluminum nitride, gallium arsenide, gallium aluminum arsenide. Etc., and two or more of the above may be mixed and used. Of these, titanium oxide, calcium titanate, niobium oxide, gallium oxide, and tantalum oxide are preferable.
半導体粒子の一次粒径は、50nm〜100μmであることが好ましく、より好ましくは200nm〜10μmである。上記範囲とすることにより、半導体粒子の表面に光触媒活性の高い面が形成され、かつ十分な表面積が得られ、二酸化炭素還元反応の活性が高くなる。 The primary particle size of the semiconductor particles is preferably 50 nm to 100 μm, more preferably 200 nm to 10 μm. Within the above range, a surface having high photocatalytic activity is formed on the surface of the semiconductor particles, a sufficient surface area is obtained, and the activity of the carbon dioxide reduction reaction is increased.
なお、本明細書において、一次粒径は、透過型電子顕微鏡(TEM)、走査型電子顕微鏡(SEM)等により、一次粒子(他の粒子と凝集していない、単独の粒子)の画像を撮影し、これを画像解析することにより算出した値とする。具体的には、例えばTEM等で撮影された画像から、無作為に100個の粒子(一次粒子)を選択し、画像処理装置により、粒子毎の投影面積を求め、それらの合計から粒子の合計の占有面積を算出する。この合計の占有面積を、選択した粒子の個数(100個)で割って、1粒子あたりの平均占有面積を算出し、この面積に相当する円の直径(1粒子あたりの平均円相当直径)を、一次粒径とする(以下において同じ)。 In the present specification, for the primary particle size, an image of primary particles (single particles that are not aggregated with other particles) is photographed by a transmission electron microscope (TEM), a scanning electron microscope (SEM), or the like. Then, this is used as a value calculated by image analysis. Specifically, for example, 100 particles (primary particles) are randomly selected from an image taken by TEM or the like, the projected area of each particle is obtained by an image processing device, and the total of the particles is calculated from the total of them. Calculate the occupied area of. Divide this total occupied area by the number of selected particles (100 particles) to calculate the average occupied area per particle, and calculate the diameter of the circle corresponding to this area (average circle equivalent diameter per particle). , The primary particle size (same below).
また、金属含有ナノ粒子に含まれる金属原子(M)は、Au、Ag、Cu、Pt、Rh、Pd、Ni、Co、Fe、Mn、Cr、Ir、Zn、TiおよびRuから選択される少なくとも1種である。このような金属含有ナノ粒子は、二酸化炭素の還元反応に卓越した性能を発揮する。中でも、金属原子(M)は、優れた還元性能の観点からCu、Ag、Au、Ni、ZnおよびPdから選択される1種であることが好ましく、特に、二酸化炭素の還元反応において選択的に炭化水素(メタンやエチレン等)を生成できる点で、Cuであることがより好ましく、選択的にギ酸を生成できる点で、Agであることがより好ましい。 The metal atom (M) contained in the metal-containing nanoparticles is at least selected from Au, Ag, Cu, Pt, Rh, Pd, Ni, Co, Fe, Mn, Cr, Ir, Zn, Ti and Ru. It is one kind. Such metal-containing nanoparticles exhibit excellent performance in the reduction reaction of carbon dioxide. Among them, the metal atom (M) is preferably one selected from Cu, Ag, Au, Ni, Zn and Pd from the viewpoint of excellent reduction performance, and is particularly selectively selected in the reduction reaction of carbon dioxide. Cu is more preferable because it can generate hydrocarbons (methane, ethylene, etc.), and Ag is more preferable because it can selectively produce formic acid.
また、金属含有ナノ粒子は、上記のような金属原子(M)を含むものであれば特に限定されず、金属原子(M)の単体、金属原子(M)を含む合金、金属原子(M)を含む金属酸化物あるいは金属原子(M)を含む複合酸化物のいずれかからなるナノ粒子であってもよい。なお、金属原子(M)を含む合金または複合酸化物は、Au、Ag、Cu、Pt、Rh、Pd、Ni、Co、Fe、Mn、Cr、Ir、Zn、TiおよびRuから選択される少なくとも1種の金属原子を含む合金または複合酸化物であればよく、上記から選択される2種以上の金属原子を含む合金または複合酸化物、あるいは金属原子(M)と合金化または複合化し得る上記以外の金属原子を含む合金または複合酸化物であってもよい。また、金属含有ナノ粒子は、特に金属原子(M)の単体または金属原子(M)を含む合金からなることが好ましい。 The metal-containing nanoparticles are not particularly limited as long as they contain the metal atom (M) as described above, and are a simple substance of the metal atom (M), an alloy containing the metal atom (M), and the metal atom (M). It may be a nanoparticle composed of either a metal oxide containing a metal oxide or a composite oxide containing a metal atom (M). The alloy or composite oxide containing the metal atom (M) is at least selected from Au, Ag, Cu, Pt, Rh, Pd, Ni, Co, Fe, Mn, Cr, Ir, Zn, Ti and Ru. It may be an alloy or composite oxide containing one kind of metal atom, and may be alloyed or composited with an alloy or composite oxide containing two or more kinds of metal atoms selected from the above, or a metal atom (M). It may be an alloy or a composite oxide containing a metal atom other than the above. Further, the metal-containing nanoparticles are particularly preferably made of a simple substance of a metal atom (M) or an alloy containing a metal atom (M).
また、金属含有ナノ粒子は、Au、Ag、Cu、Pt、Rh、Pd、Ni、Co、Fe、Mn、Cr、Ir、Zn、TiおよびRuから選択される少なくとも1種の金属原子(M)を含んでなるクラスター(以下、単に「金属含有クラスター」という。)であることが好ましい。なお、本明細書において、「クラスター」とは、複数個の原子が結合した原子集団を意味する。このような金属含有クラスターは、例えば、下記一般式(1)で表される、金属原子(M)の単体または金属原子(M)を含む金属酸化物であることが好ましい。
MnOm ・・・(1)
上記(1)式において、Mは上述の金属原子(M)を、Oは、酸素を表す。
Further, the metal-containing nanoparticles are at least one metal atom (M) selected from Au, Ag, Cu, Pt, Rh, Pd, Ni, Co, Fe, Mn, Cr, Ir, Zn, Ti and Ru. It is preferable that it is a cluster containing (hereinafter, simply referred to as “metal-containing cluster”). In addition, in this specification, a "cluster" means an atomic group in which a plurality of atoms are bonded. Such a metal-containing cluster is preferably, for example, a simple substance of a metal atom (M) or a metal oxide containing a metal atom (M) represented by the following general formula (1).
M n O m ... (1)
In the above equation (1), M represents the above-mentioned metal atom (M) and O represents oxygen.
また、上記(1)式において、mは、nとの関係で、m/nの比が0〜2であることが好ましく、より好ましくは0.5〜1.8、さらに好ましくは0.55〜0.75、特に好ましくは0.6〜0.7、一層好ましくは0.67である。上記範囲とすることにより、二酸化炭素の還元効率が高まる。なお、上記(1)式において、m/nが0のとき、金属含有クラスターは、金属原子(M)の単体からなる。 Further, in the above equation (1), m preferably has a ratio of m / n of 0 to 2, more preferably 0.5 to 1.8, and further preferably 0.55 in relation to n. It is ~ 0.75, particularly preferably 0.6 to 0.7, and even more preferably 0.67. Within the above range, the reduction efficiency of carbon dioxide is enhanced. In the above equation (1), when m / n is 0, the metal-containing cluster is composed of a single metal atom (M).
また、金属含有ナノ粒子は、銅原子または銀原子を含有するクラスターであることがより好ましい。このような金属含有ナノ粒子は、二酸化炭素の還元反応において、優れた触媒活性と選択性を発揮し、銅原子を含有するクラスターであれば炭化水素(メタンやエチレン等)の生成に優れ、銀原子を含有するクラスターであればギ酸の生成に優れる。 Further, the metal-containing nanoparticles are more preferably clusters containing copper atoms or silver atoms. Such metal-containing nanoparticles exhibit excellent catalytic activity and selectivity in the reduction reaction of carbon dioxide, and if they are clusters containing copper atoms, they are excellent in producing hydrocarbons (methane, ethylene, etc.), and silver. Clusters containing atoms are excellent in producing hydrocarbons.
また、上記のような金属含有クラスターをはじめとする、銅原子を含有する金属含有ナノ粒子において、銅の平均価数は0〜1.5であることが好ましく、1.2〜1.4であることがより好ましい。 Further, in the metal-containing nanoparticles containing copper atoms such as the metal-containing clusters as described above, the average valence of copper is preferably 0 to 1.5, and 1.2 to 1.4. More preferably.
また、金属含有ナノ粒子の一次粒径は、0.2〜100nmであることが好ましく、より好ましくは0.5〜55nmであり、さらに好ましくは0.5〜2.0nmである。上記範囲とすることにより、金属含有ナノ粒子を構成する原子数が数個から数10個になり、バルクの結晶面とは異なる二酸化炭素分子や、反応中間体、生成物との相互作用が可能となり、活性が格段に向上する。 The primary particle size of the metal-containing nanoparticles is preferably 0.2 to 100 nm, more preferably 0.5 to 55 nm, and even more preferably 0.5 to 2.0 nm. Within the above range, the number of atoms constituting the metal-containing nanoparticles is changed from several to several tens, and it is possible to interact with carbon dioxide molecules different from the bulk crystal plane, reaction intermediates, and products. The activity is significantly improved.
また、半導体粒子に対する金属含有ナノ粒子の質量比率(金属含有ナノ粒子の質量/半導体粒子の質量)×100]が、0.001〜1%であることが好ましく、より好ましくは、0.05〜0.5%である。上記範囲とすることにより、光触媒によって生じた電子が効率的に二酸化炭素の還元に利用されるようになり、金属含有ナノ粒子の質量当たりの活性が最も高くなる。 Further, the mass ratio of the metal-containing nanoparticles to the semiconductor particles (mass of the metal-containing nanoparticles / mass of the semiconductor particles) × 100] is preferably 0.001 to 1%, more preferably 0.05 to 1%. It is 0.5%. Within the above range, the electrons generated by the photocatalyst can be efficiently used for the reduction of carbon dioxide, and the activity of the metal-containing nanoparticles per mass becomes the highest.
このような金属含有ナノ粒子担持触媒の製造方法は、特に限定されず、公知の方法によって製造することができるが、不均一系析出法にて行うことが好ましい。不均一系析出法によれば、半導体粒子の表面に特定の金属を析出させることができる。 The method for producing such a metal-containing nanoparticle-supporting catalyst is not particularly limited and can be produced by a known method, but it is preferably performed by a heterogeneous precipitation method. According to the heterogeneous precipitation method, a specific metal can be deposited on the surface of the semiconductor particles.
具体的には、例えば半導体粒子と析出させたい金属に対応する金属イオンとが分散した溶液を準備し、(1)この分散溶液に水素化ホウ素ナトリウムなどの還元剤を加えて金属イオンを還元し、半導体粒子上で金属を析出させる方法や、(2)この分散溶液を加熱して溶媒を除去し、半導体粒子上に金属またはその塩を析出させる方法などにより、金属含有ナノ粒子担持触媒を作製できる。また、金属イオンが溶解した溶液としては、例えば、水やアルコール等の公知の溶媒に、析出させたい金属に対応する金属塩(例えば、塩化銅や、硝酸銀等)を溶解させたもの等を用いることができる。 Specifically, for example, a solution in which semiconductor particles and metal ions corresponding to the metal to be precipitated are dispersed is prepared, and (1) a reducing agent such as sodium boron hydride is added to this dispersion solution to reduce the metal ions. , A metal-containing nanoparticle-supporting catalyst is produced by a method of precipitating a metal on semiconductor particles, or (2) a method of heating this dispersion solution to remove a solvent and precipitating a metal or a salt thereof on the semiconductor particles. it can. Further, as the solution in which the metal ions are dissolved, for example, a solution in which a metal salt (for example, copper chloride, silver nitrate, etc.) corresponding to the metal to be precipitated is dissolved in a known solvent such as water or alcohol is used. be able to.
本発明の金属含有ナノ粒子担持触媒は、二酸化炭素の還元反応に対し良好な触媒性能を発現するため、二酸化炭素を還元するための二酸化炭素還元装置に好適に用いられる。二酸化炭素還元装置としては、例えば本発明の金属含有ナノ粒子担持触媒を分散した炭酸水素ナトリウム溶液に、二酸化炭素を含むガスをバブリングする機構と、発生したガスを回収する機構とを備え、太陽光下に置いて二酸化炭素を還元する装置が挙げられる。なお、炭酸水素ナトリウム溶液としては、例えば炭酸水素ナトリウムの濃度が10〜500mmol/Lの水溶液を用いることができる。また、バブリングするガスとしては、例えば、二酸化炭素の濃度が5質量%以上のガスを用いることができる。 The metal-containing nanoparticle-supporting catalyst of the present invention exhibits good catalytic performance for the reduction reaction of carbon dioxide, and is therefore preferably used in a carbon dioxide reduction device for reducing carbon dioxide. The carbon dioxide reduction device includes, for example, a mechanism for bubbling a gas containing carbon dioxide in a sodium hydrogen carbonate solution in which the metal-containing nanoparticle-supporting catalyst of the present invention is dispersed, and a mechanism for recovering the generated gas. Examples include devices that are placed below to reduce carbon dioxide. As the sodium hydrogen carbonate solution, for example, an aqueous solution having a sodium hydrogen carbonate concentration of 10 to 500 mmol / L can be used. Further, as the bubbling gas, for example, a gas having a carbon dioxide concentration of 5% by mass or more can be used.
以上、本発明の実施形態について説明したが、本発明は上記実施形態に限定されるものではなく、本発明の概念および特許請求の範囲に含まれるあらゆる態様を含み、本発明の範囲内で種々に改変することができる。 Although the embodiments of the present invention have been described above, the present invention is not limited to the above-described embodiments, but includes all aspects included in the concept of the present invention and the scope of claims, and varies within the scope of the present invention. Can be modified to.
次に、本発明の効果をさらに明確にするために、実施例および比較例について説明するが、本発明はこれら実施例に限定されるものではない。 Next, in order to further clarify the effect of the present invention, Examples and Comparative Examples will be described, but the present invention is not limited to these Examples.
(実施例1)
まず、半導体粒子として一次粒径が253nmの酸化チタン(TiO2、石原産業株式会社製)を5質量%となるように水に分散させ、半導体粒子が分散した溶液を得た。次に、この分散溶液に塩化銅(和光純薬工業株式会社製)を加え、溶解し、塩化銅の濃度を0.004mol/Lとした。さらに、この塩化銅溶液に、水素化ホウ素ナトリウム(シグマ アルドリッチ ジャパン合同会社製)を加えて、混合し、水素化ホウ素ナトリウムの濃度が0.005mol/Lである溶液を得た。
(Example 1)
First, titanium oxide (TiO 2 , manufactured by Ishihara Sangyo Co., Ltd.) having a primary particle size of 253 nm as semiconductor particles was dispersed in water so as to have a primary particle size of 5% by mass to obtain a solution in which the semiconductor particles were dispersed. Next, copper chloride (manufactured by Wako Pure Chemical Industries, Ltd.) was added to this dispersion solution and dissolved to bring the concentration of copper chloride to 0.004 mol / L. Further, sodium borohydride (manufactured by Sigma-Aldrich Japan GK) was added to this copper chloride solution and mixed to obtain a solution having a sodium borohydride concentration of 0.005 mol / L.
得られた溶液を、室温で1時間撹拌した。続いてこの反応溶液を、回転数5,000rpmで10分間遠心分離し、生成物(銅ナノ粒子がTiO2粒子に担持された触媒)を沈降させた。その後、(1)上澄み溶液を捨て、水を加えて、生成物を再分散させた。さらに、(2)分散溶液を、回転数5,000rpmで10分間遠心分離した。上記(1)および(2)と同様の手順をさらに2回繰り返し、生成物を洗浄した。最後に、遠心分離後の上澄み溶液を除去した状態で、40℃で24時間乾燥し、銅ナノ粒子がTiO2粒子に担持された触媒を得た。 The resulting solution was stirred at room temperature for 1 hour. Subsequently, the reaction solution was centrifuged at a rotation speed of 5,000 rpm for 10 minutes to settle the product (catalyst in which copper nanoparticles were supported on TiO 2 particles). Then, (1) the supernatant solution was discarded and water was added to redisperse the product. Further, (2) the dispersion solution was centrifuged at a rotation speed of 5,000 rpm for 10 minutes. The same procedure as (1) and (2) above was repeated twice more to wash the product. Finally, with the supernatant solution removed after centrifugation, the mixture was dried at 40 ° C. for 24 hours to obtain a catalyst in which copper nanoparticles were supported on TiO 2 particles.
(実施例2)
実施例1の乾燥後の触媒を、さらに150℃で30分加熱処理して、銅ナノ粒子を酸化させ、酸化した銅ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 2)
The dried catalyst of Example 1 was further heat-treated at 150 ° C. for 30 minutes to oxidize the copper nanoparticles, and a catalyst in which the oxidized copper nanoparticles were supported on the TiO 2 particles was obtained.
(実施例3)
加熱処理の時間を1時間とした以外は実施例2と同じ方法により、酸化した銅ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 3)
A catalyst in which oxidized copper nanoparticles were supported on TiO 2 particles was obtained by the same method as in Example 2 except that the heat treatment time was set to 1 hour.
(実施例4)
塩化銅に替えて、硝酸銀(キシダ化学株式会社製)を用い、硝酸銀の0.04質量%溶液とした以外は実施例1と同じ方法により、銀ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 4)
A catalyst in which silver nanoparticles were supported on TiO 2 particles was prepared by the same method as in Example 1 except that silver nitrate (manufactured by Kishida Chemical Co., Ltd.) was used instead of copper chloride to prepare a 0.04% by mass solution of silver nitrate. Obtained.
(実施例5)
実施例4の乾燥後の触媒を、さらに130℃で15分加熱処理して、銀ナノ粒子を酸化させ、酸化した銀ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 5)
The dried catalyst of Example 4 was further heat-treated at 130 ° C. for 15 minutes to oxidize the silver nanoparticles, and a catalyst in which the oxidized silver nanoparticles were supported on TiO 2 particles was obtained.
(実施例6)
加熱処理の時間を30分とした以外は実施例5と同じ方法により、酸化した銀ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 6)
A catalyst in which oxidized silver nanoparticles were supported on TiO 2 particles was obtained by the same method as in Example 5 except that the heat treatment time was set to 30 minutes.
(実施例7)
まず、塩化銅(和光純薬工業株式会社製)を水に溶解し、0.21質量%の塩化銅水溶液を調製した。次に、この塩化銅水溶液に、半導体粒子として一次粒径が2.5μmの酸化ガリウム(Ga2O3、株式会社高純度化学研究所製)を添加し、分散させ、Ga2O3の濃度が21質量%の分散溶液を得た。次に、この分散溶液を、アルゴン雰囲気下、400℃、2時間の条件で加熱し、溶媒を除去して、銅ナノ粒子がGa2O3粒子に担持された触媒を得た。
(Example 7)
First, copper chloride (manufactured by Wako Pure Chemical Industries, Ltd.) was dissolved in water to prepare a 0.21% by mass copper chloride aqueous solution. Next, gallium oxide (Ga 2 O 3 , manufactured by High Purity Chemical Laboratory Co., Ltd.) having a primary particle size of 2.5 μm was added to this copper chloride aqueous solution as semiconductor particles and dispersed to obtain a concentration of Ga 2 O 3 . Obtained a dispersion solution of 21% by mass. Next, this dispersion solution was heated under an argon atmosphere at 400 ° C. for 2 hours to remove the solvent to obtain a catalyst in which copper nanoparticles were supported on Ga 2 O 3 particles.
(実施例8)
一次粒径が253nmのTiO2粒子に替えて、半導体粒子として一次粒径が1.7μmの酸化ニオブ(Nb3O8、実験合成品:参考文献 Akatsuka, K.; Takanashi, G.; Ebina, Y.; Sakai, N.; Haga, M.-a.; Sasaki, T.Electrochemical and Photoelectrochemical Study on Exfoliated Nb3O8Nanosheet. J.Phys. Chem. Solids 2008, 69, 1288-1291)を用いた以外は実施例1と同じ方法により、銅ナノ粒子がNb3O8粒子に担持された触媒を得た。
(Example 8)
And primary particle size in place of the TiO 2 particles of 253 nm, niobium oxide primary particle diameter of the semiconductor particles is 1.7μm (Nb 3 O 8, Experiment synthetic: References Akatsuka, K .; Takanashi, G .; Ebina, Y .; Sakai, N .; Haga, M.-a .; Sasaki, T. Electrochemical and Photoelectrochemical Study on Exfoliated Nb 3 O 8 Nanosheet. J.Phys. Chem. Solids 2008, 69, 1288-1291) the same method as in example 1, except to obtain copper nanoparticles supported on Nb 3 O 8 particles catalyst.
(実施例9)
一次粒径が253nmのTiO2粒子に替えて、半導体粒子として一次粒径が2.2μmのチタン酸カルシウム(CaTiO3、実験合成品:参考文献 H. Yoshida, L. Zhang, M. Sato, T. Morikawa, T. Kajino, T. Sekito, S. Matsumoto and H. Hirata, Catal. Today, 2015, 251, 132.)を用いた以外は実施例1と同じ方法により、銅ナノ粒子がCaTiO3粒子に担持された触媒を得た。
(Example 9)
Calcium titanate with a primary particle size of 2.2 μm as a semiconductor particle instead of TiO 2 particles with a primary particle size of 253 nm (CaTIO 3 , experimental synthetic product: References H. Yoshida, L. Zhang, M. Sato, T. . Morikawa, T. Kajino, T. Sekito, S. Matsumoto and H. Hirata, Catal. Today, 2015, 251, 132.) By the same method as in Example 1, the copper nanoparticles are CaTIO 3 particles. A catalyst carried on the surface was obtained.
(実施例10)
一次粒径が253nmのTiO2粒子に替えて、半導体粒子として一次粒径が250nmのTiO2粒子(石原産業株式会社製)を用いると共に、水素化ホウ素ナトリウムの濃度を0.05mol/Lとした以外は実施例1と同じ方法により、銅ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 10)
And primary particle size in place of the TiO 2 particles of 253 nm, with use of the primary particle size of 250nm of TiO 2 particles (manufactured by Ishihara Sangyo Kaisha, Ltd.) as the semiconductor particles and the concentration of sodium borohydride and 0.05 mol / L A catalyst in which copper nanoparticles were supported on TiO 2 particles was obtained by the same method as in Example 1 except that.
(実施例11)
一次粒径が253nmのTiO2粒子に替えて、半導体粒子として一次粒径が45nmのTiO2粒子(石原産業株式会社製)を用いた以外は実施例1と同じ方法により、銅ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 11)
The copper nanoparticles were nitro by the same method as in Example 1 except that TiO 2 particles having a primary particle size of 45 nm (manufactured by Ishihara Sangyo Co., Ltd.) were used as semiconductor particles instead of TiO 2 particles having a primary particle size of 253 nm. A catalyst supported on two particles was obtained.
(実施例12)
一次粒径が253nmのTiO2粒子に替えて、半導体粒子として一次粒径が173μmのTiO2粒子(石原産業株式会社製)を用いた以外は実施例1と同じ方法により、銅ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 12)
And primary particle size in place of the TiO 2 particles of 253 nm, in the same manner as in Example 1 except for using the primary particle size of TiO 2 particles 173Myuemu (manufactured by Ishihara Sangyo Kaisha, Ltd.) as the semiconductor particles, the copper nanoparticles TiO A catalyst supported on two particles was obtained.
(実施例13)
塩化銅溶液の濃度を0.4mmol/Lとした以外は実施例1と同じ方法により、銅ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 13)
A catalyst in which copper nanoparticles were supported on TiO 2 particles was obtained by the same method as in Example 1 except that the concentration of the copper chloride solution was 0.4 mmol / L.
(実施例14)
塩化銅溶液の濃度を0.2mol/Lとした以外は実施例1と同じ方法により、銅ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 14)
A catalyst in which copper nanoparticles were supported on TiO 2 particles was obtained by the same method as in Example 1 except that the concentration of the copper chloride solution was 0.2 mol / L.
(実施例15)
加熱処理の時間を3時間とした以外は実施例2と同じ方法により、酸化した銅ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 15)
A catalyst in which oxidized copper nanoparticles were supported on TiO 2 particles was obtained by the same method as in Example 2 except that the heat treatment time was set to 3 hours.
(実施例16)
水素化ホウ素ナトリウムに替えて、還元剤としてシアノ水素化ホウ素ナトリウム(東京化成工業株式会社製)を用いた以外は実施例1と同じ方法により、銅ナノ粒子がTiO2粒子に担持された触媒を得た。
(Example 16)
A catalyst in which copper nanoparticles were supported on TiO 2 particles was prepared by the same method as in Example 1 except that sodium cyanoborohydride (manufactured by Tokyo Chemical Industry Co., Ltd.) was used as a reducing agent instead of sodium borohydride. Obtained.
(比較例1)
半導体粒子としてのTiO2粒子に替えて、一次粒径が200nmのシリカ粒子(SiO2、Sicastarシリカ粒子、Micromod社製)を用いた以外は実施例1と同じ方法により、銅ナノ粒子がシリカ粒子に担持された触媒を得た。
(Comparative Example 1)
Copper nanoparticles are silica particles by the same method as in Example 1 except that silica particles having a primary particle size of 200 nm (SiO 2 , Sicastar silica particles, manufactured by Micromod) are used instead of TiO 2 particles as semiconductor particles. A catalyst carried on the surface was obtained.
(比較例2)
半導体粒子としてのTiO2粒子に替えて、一次粒径が1.6μmのアルミナ粒子(Al2O3、昭和電工株式会社製)を用いた以外は実施例1と同じ方法により、銅ナノ粒子がアルミナ粒子に担持された触媒を得た。
(Comparative Example 2)
Copper nanoparticles were produced by the same method as in Example 1 except that alumina particles (Al 2 O 3 , manufactured by Showa Denko Co., Ltd.) having a primary particle size of 1.6 μm were used instead of TiO 2 particles as semiconductor particles. A catalyst supported on alumina particles was obtained.
[評価]
上記実施例および比較例に係る触媒について、下記に示す各種測定および特性評価を行った。各特性の評価条件は下記の通りである。結果を表1に示す。
[Evaluation]
The catalysts according to the above Examples and Comparative Examples were subjected to various measurements and characteristic evaluations shown below. The evaluation conditions for each characteristic are as follows. The results are shown in Table 1.
[1]担体の一次粒径
担体となる各種半導体粒子、シリカ粒子およびアルミナ粒子について、触媒作製前に、走査型電子顕微鏡(SEM、株式会社日立ハイテクノロジーズ製)を用いて、一次粒子の輪郭が明確に認識できる倍率で一次粒子を撮影した。得られた画像を上述の条件で解析し、一次粒径を算出した。
[1] Primary particle size of carrier With respect to various semiconductor particles, silica particles and alumina particles to be carriers, the contours of the primary particles are determined by using a scanning electron microscope (SEM, manufactured by Hitachi High-Technologies Co., Ltd.) before producing a catalyst. The primary particles were photographed at a clearly recognizable magnification. The obtained image was analyzed under the above conditions, and the primary particle size was calculated.
[2]金属含有ナノ粒子の粒径
得られた触媒について、透過型電子顕微鏡(TEM、日本電子株式会社製)を用いて、一次粒子の輪郭が明確に認識できる倍率で、金属含有ナノ粒子の一次粒子を撮影した。得られた画像を上述の条件で解析し、一次粒径を算出した。
[2] Particle size of metal-containing nanoparticles With respect to the obtained catalyst, using a transmission electron microscope (TEM, manufactured by Nippon Denshi Co., Ltd.), the contours of the primary particles can be clearly recognized at a magnification of the metal-containing nanoparticles. The primary particles were photographed. The obtained image was analyzed under the above conditions, and the primary particle size was calculated.
[3]金属(M)の平均価数
触媒を構成する金属含有ナノ粒子について、X線光電子分光分析法を用いて銅および銀の平均価数を測定した。
[3] Average valence of metal (M) The average valence of copper and silver was measured for the metal-containing nanoparticles constituting the catalyst by using X-ray photoelectron spectroscopy.
[4]担体に対する金属含有ナノ粒子の質量比率(%)
得られた触媒を、誘導結合プラズマ(ICP、株式会社日立ハイテクサイエンス製)で分析し、金属含有ナノ粒子を構成する金属元素(CuまたはAg)および担体を構成する一部の元素(TiO2の場合はTi、Ga2O3の場合はGa、Nb3O8の場合はNb、CaTiO3の場合はCa、SiO2の場合はSi、Al2O3の場合はAl)の濃度をそれぞれ算出した。これらの値を用いて金属含有ナノ粒子の質量濃度および担体の質量濃度を求め、これらの比から担体に対する金属含有ナノ粒子の質量比率[(金属含有ナノ粒子の質量/担体の質量)×100]を算出した。
[4] Mass ratio of metal-containing nanoparticles to carrier (%)
The obtained catalyst is analyzed by inductively coupled plasma (ICP, manufactured by Hitachi High-Tech Science Co., Ltd.), and the metal element (Cu or Ag) constituting the metal-containing nanoparticles and some elements (TiO 2 ) constituting the carrier are analyzed. In the case of Ti, in the case of Ga 2 O 3 , Ga, in the case of Nb 3 O 8 , Nb, in the case of CaTIO 3 , Ca in the case of CaTIO 3 , Si in the case of SiO 2 , and Al in the case of Al 2 O 3 ). did. Using these values, the mass concentration of the metal-containing nanoparticles and the mass concentration of the carrier were obtained, and from these ratios, the mass ratio of the metal-containing nanoparticles to the carrier [(mass of metal-containing nanoparticles / mass of carrier) × 100]. Was calculated.
[5]還元試験
上記のようにして得られた触媒100mgを、0.05mol/LのKHCO3水溶液100mLに分散させ、1g/Lの触媒分散溶液を得た。この触媒分散溶液に、CO2を1mL/minでバブリングさせながら、擬似太陽光源(ソーラ Mini USS−40、ウシオ電機株式会社製)を10時間照射し、生成物として一酸化炭素(CO)、ギ酸(HCOOH)、メタン(CH4)、エチレン(C2H4)およびエタン(C2H6)の生成量を分析した。
生成物のうち一酸化炭素、メタン、エチレンおよびエタンはガスクロマトグラフ質量分析計(GCMS−QP2010、株式会社島津製作所製)を用いて分析した。カラムは、SUPELCO CARBOXEN 1010PLOT 30m×032mmlDを用い、検出機は水素炎イオン検出器(FID)を用いた。
また、ギ酸については、上記疑似代用光源を10時間照射した後の反応液を高速液体クロマトグラフィー(HPLC、株式会社島津製作所製)で分析した。
また、これらの生成物の総量から、一酸化炭素、メタン、エチレン、エタン、またはギ酸に還元された二酸化炭素の量を算出した。
本実施例では、二酸化炭素に対して還元作用を示す触媒を合格レベルとし、さらに、一酸化炭素、メタン、エチレン、エタン、またはギ酸に還元された二酸化炭素量が0.5mmol以上を更に良好と評価した。
[5] Reduction Test 100 mg of the catalyst obtained as described above was dispersed in 100 mL of a 0.05 mol / L KHCO 3 aqueous solution to obtain a 1 g / L catalyst dispersion solution. This catalytic dispersion solution is irradiated with a pseudo-solar light source (Sora Mini USS-40, manufactured by Ushio Denki Co., Ltd.) for 10 hours while bubbling CO 2 at 1 mL / min, and carbon monoxide (CO) and formic acid are produced as products. The amounts of (HCOOH), methane (CH 4 ), ethylene (C 2 H 4 ) and ethane (C 2 H 6 ) produced were analyzed.
Of the products, carbon monoxide, methane, ethylene and ethane were analyzed using a gas chromatograph mass spectrometer (GCMS-QP2010, manufactured by Shimadzu Corporation). A SUPELCO CARBOXEN 1010PLOT 30 m × 032 mlD was used as the column, and a hydrogen flame ion detector (FID) was used as the detector.
For formic acid, the reaction solution after being irradiated with the above pseudo-substitute light source for 10 hours was analyzed by high performance liquid chromatography (HPLC, manufactured by Shimadzu Corporation).
In addition, the amount of carbon dioxide reduced to carbon monoxide, methane, ethylene, ethane, or formic acid was calculated from the total amount of these products.
In this example, a catalyst that has a reducing action on carbon dioxide is set as an acceptable level, and the amount of carbon dioxide reduced to carbon monoxide, methane, ethylene, ethane, or formic acid is set to 0.5 mmol or more, which is even better. evaluated.
表1の結果より、本発明の実施例1〜16に係る金属含有ナノ粒子担持触媒は、二酸化炭素の還元反応に対し良好な触媒性能を有し、二酸化炭素の還元反応を良好に促進・制御し得ることが確認された。特に、実施例1〜9および16にかかる金属含有ナノ粒子担持触媒は、二酸化炭素の還元反応に対してより卓越した触媒活性および選択性を発現することが確認された。 From the results in Table 1, the metal-containing nanoparticles-supported catalyst according to Examples 1 to 16 of the present invention has good catalytic performance for the reduction reaction of carbon dioxide, and promotes and controls the reduction reaction of carbon dioxide satisfactorily. It was confirmed that it could be done. In particular, it was confirmed that the metal-containing nanoparticles-supported catalysts according to Examples 1 to 9 and 16 exhibited more excellent catalytic activity and selectivity for the reduction reaction of carbon dioxide.
これに対し、比較例1および2に係る触媒は、金属含有ナノ粒子を担持する担体が半導体粒子ではなく、二酸化炭素に対して還元作用を示さないことが確認された。 On the other hand, in the catalysts of Comparative Examples 1 and 2, it was confirmed that the carrier supporting the metal-containing nanoparticles was not semiconductor particles and did not show a reducing action on carbon dioxide.
Claims (8)
前記金属含有ナノ粒子担持触媒は、担体としての半導体粒子(ただし、硫化カドミウム、セレン化カドミウム、リン化ガリウムおよび珪素からなる群から選択されるものを除く)に金属含有ナノ粒子を担持して成り、
前記金属含有ナノ粒子が、金、銀、銅、白金、ロジウム、パラジウム、ニッケル、コバルト、鉄、マンガン、クロム、イリジウム、亜鉛、チタンおよびルテニウムから選択される少なくとも1種の金属原子(M)を含有する、金属含有ナノ粒子担持触媒。 A metal-containing nanoparticle-supported catalyst used to reduce carbon dioxide.
The metal-containing nanoparticle-supporting catalyst comprises supporting metal-containing nanoparticles on semiconductor particles as a carrier (excluding those selected from the group consisting of cadmium sulfide, cadmium selenide, gallium phosphate, and silicon). ,
The metal-containing nanoparticles contain at least one metal atom (M) selected from gold, silver, copper, platinum, rhodium, palladium, nickel, cobalt, iron, manganese, chromium, iridium, zinc, titanium and ruthenium. A metal-containing nanoparticle-supporting catalyst to be contained.
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