JP6829441B2 - Photosensitivity tester - Google Patents

Description

The present invention relates to a medical examination device, and more particularly to an examination device for diagnosing photosensitivity and setting initial conditions for phototherapy.

The dermatological field and ultraviolet rays are very closely related, and not only there is a disease caused by ultraviolet rays called photosensitivity, but also skin cancer such as skin malignant lymphoma, psoriasis vulgaris, vitiligo vulgaris, atopic dermatitis, etc. Ultraviolet rays have been used for many years to treat intractable diseases. Photosensitivity is mainly the skin's excessive reaction to ultraviolet rays and visible light, and a photosensitivity test confirms how sensitive it is to light of which wavelength. When ultraviolet rays are used for treatment, treatment is performed by irradiating the affected area with long-wavelength ultraviolet rays (UVA waves), medium-wavelength ultraviolet rays (UVB waves), or the like with a predetermined amount of energy. Even if you do not have photosensitivity, there are individual differences in the amount of UV irradiation energy that the skin reacts to, so a photosensitivity test is performed before UV treatment to determine the appropriate irradiation amount.

In Patent Document 1, the applicant proposes an inspection device used for inspecting photosensitivity of skin.

JP-A-2017-056036

The present inventor has obtained the following recognition regarding an inspection device for inspecting photosensitivity.
When testing the photosensitivity of human skin in the medical field, it is desirable that the testing device be easy to use. If the inspection device is large or heavy, it cannot be said that it is easy to use.

In an inspection device for inspecting photosensitivity, it is conceivable to use a ball lens to collimate the light emitted from a light source and to use a beam splitter to emit light from a plurality of windows to the outside. However, it has been found that this configuration increases the number of parts and tends to complicate the configuration.
From this, the present inventor has recognized that there is room for improvement in the inspection device for inspecting photosensitivity from the viewpoint of reducing the number of parts and simplifying the configuration.

An object of the present invention has been made in view of such a problem, and an object of the present invention is to provide a photosensitivity inspection apparatus capable of reducing the number of parts and simplifying the configuration.

In order to solve the above problems, the inspection device of one embodiment of the present invention is an inspection device that outputs irradiation light having different illuminance values from a plurality of openings arranged side by side in the first direction, and emits light. An irradiation unit including a light source unit for output, a first reflective member extending in the first direction and provided with a plurality of openings, and a second reflective member arranged opposite to the first reflective member via a gap. , A light guide unit that guides the light output from the light source unit to the irradiation unit. The second reflective member is arranged at an angle with respect to the first reflective member so that the gap becomes smaller as the distance from the light guide portion increases.

According to this aspect, the light from the light source unit can be introduced into the gap between the first reflecting member and the second reflecting member, and the irradiation light can be output from the plurality of openings.

It should be noted that any combination of the above components and those in which the components and expressions of the present invention are mutually replaced between methods, systems and the like are also effective as aspects of the present invention.

According to the present invention, it is possible to provide a photosensitivity inspection apparatus capable of reducing the number of parts and simplifying the configuration.

It is sectional drawing of the side view of the inspection apparatus which concerns on 1st Embodiment. It is a bottom view of the inspection apparatus of FIG. It is sectional drawing of the side view of the inspection apparatus which concerns on a comparative example. It is a bottom view of the inspection apparatus of FIG. It is a graph which shows an example of the illuminance value of the irradiation light obtained by the simulation. It is a layout drawing which shows an example of the arrangement of the light source of the inspection apparatus of FIG. It is a graph which shows an example of the illuminance value of the irradiation light obtained by another simulation. It is a graph which shows an example of the illuminance value of the irradiation light obtained by another simulation. It is sectional drawing of the side view of the inspection apparatus which concerns on 2nd Embodiment. It is sectional drawing of the side view of the inspection apparatus which concerns on 3rd Embodiment.

The present inventor has studied an inspection device for inspecting photosensitivity (hereinafter, simply referred to as an inspection device) and obtained the following findings.
In order to reduce the number of parts of the inspection device, the present inventor reflects the input light a plurality of times between two reflecting plates facing each other, and outputs the output light from each of the plurality of openings arranged in the traveling direction of the light. An inspection device 500 including an irradiation unit 510 for output was devised. Hereinafter, the inspection device 500 will be described as a comparative example.

FIG. 3 is a cross-sectional view of the inspection device 500 of the comparative example in a side view. FIG. 4 is a bottom view of the inspection device 500. FIG. 3 shows a vertical cross section along the line BB shown in FIG. Hereinafter, the description will be given based on the XYZ Cartesian coordinate system. In FIGS. 3 and 4, the Y-axis direction corresponds to the left-right direction of the paper surface and is the same axis as the first direction. The X-axis direction corresponds to the vertical direction of the paper surface in FIG. 3 and the vertical direction of the paper surface in FIG. The Z-axis direction corresponds to the vertical vertical direction in FIG. The irradiation unit 510 has a square cylinder shape having a substantially rectangular cross section cut in the XZ plane. The first reflective member 512 is arranged on one surface of the irradiation unit 510 facing in the vertical direction, and the second reflective member 514 is arranged on the other surface.

The first reflective member 512 is provided with openings 518 including five openings 518a, 518b, 518c, 518d, and 518e arranged in order from the inlet side in the Y-axis direction. In the irradiation unit 510, the first reflection member 512 is arranged parallel to the XY plane, and the second reflection member 514 is arranged parallel to the first reflection member 512.

The light 526c input to the irradiation unit 510 travels toward the back of the irradiation unit 510 in the Y-axis direction while being repeatedly reflected by the first reflection member 512 and the second reflection member 514 of the irradiation unit 510, and the light thereof. A part of 526c is sequentially emitted from the opening 518 as irradiation light 528. The irradiation light 528 includes irradiation lights 528a, 528b, 528c, 528d, and 528e emitted from the openings 518a, 518b, 518c, 518d, and 518e, respectively. Therefore, it is expected that the intensity of the light 526c traveling through the irradiation unit 510 gradually decreases from the entrance to the back, and the illuminance value of the irradiation light 528 emitted from the opening 518 also gradually decreases.

Next, regarding the irradiation unit 510, the illuminance value of the irradiation light 528 obtained by the first simulation will be described. FIG. 5 is a graph showing the illuminance value of the irradiation light obtained by the first simulation, and plots the illuminance value of each of the openings 518. In FIG. 5, graph P shows the illuminance value of the irradiation light 528. In FIG. 5, points A, B, C, D, and E on the horizontal axis correspond to the irradiation lights 528a, 528b, 528c, 528d, and 528e, and the vertical axis indicates the illuminance value of each irradiation light. The illuminance value of the irradiation light is the largest at the point A, and decreases in the order of B, C, D, and E. However, it was found that the illuminance value of the irradiation light 528 was not sufficient, and the reduction rate of the irradiation light 528 was significantly smaller between DE than between AB.

Next, the illuminance value of the irradiation light 528 obtained by the second simulation will be described. FIG. 6 is a layout diagram showing the arrangement of the light emitting element 522 in the light source unit 520 of the inspection device 500. As shown in FIG. 6, the light source unit 520 includes nine light emitting elements 522 arranged in a matrix of 3 rows and 3 columns. Each of the nine light emitting elements 522 is an LED. In the second simulation, the illuminance light 528a, 528b, 528c, 528d by the light emitted from the three light emitting elements 522d, 522e, 522f arranged at the center position in the X-axis direction and separated in the Y-axis direction, The illuminance value of 528e is obtained. FIG. 7 is a graph showing an example of the illuminance value of the irradiation light obtained by the second simulation. FIG. 7 plots the respective illuminance values due to the light emitted from the light emitting elements 522d, 522e, and 522f.

In FIG. 7, graph G shows the illuminance values of the irradiation light 528a, 528b, 528c, 528d, and 528e by the light from the light emitting element 522d. Similarly, the graph H shows the illuminance values from the light emitting element 522e, and the graph J shows the illuminance values of the irradiation lights 528a, 528b, 528c, 528d, and 528e by the light from the light emitting element 522f. The illuminance value shown in the graph H corresponding to the light emitting element 522e located at the center decreases monotonically from the point A to the point E. However, the illuminance values shown by the graphs J and G corresponding to the light emitting elements 522d and 522f located closer to the end in the Y-axis direction showed points of increasing toward the back side, respectively. Therefore, it was found that the maximum difference in the illuminance values in the graphs G, H, and J was as large as 2.3 times. It is considered that this is because the light emitted from the light emitting elements 522d and 522f located near the ends in the Y-axis direction is greatly affected by the reflection by the side surface of the irradiation unit 510. Therefore, when the light emitting elements 522d, 522e, and 522f are used in combination with light having different wavelength characteristics, the distribution of the illuminance value differs for each wavelength, which may cause a decrease in inspection accuracy.

The present inventor examined various configurations corresponding to these simulation results, and found that the distribution of the illuminance value of the irradiation light can be improved by arranging the second reflecting member diagonally. The embodiment was devised based on such thoughts, and its specific configuration will be described below.

Hereinafter, the present invention will be described with reference to each drawing based on a preferred embodiment. In the embodiments and modifications, the same or equivalent components and members are designated by the same reference numerals, and redundant description will be omitted as appropriate. In addition, the dimensions of the members in each drawing are shown enlarged or reduced as appropriate for easy understanding. In addition, some of the members that are not important for explaining the embodiment in each drawing are omitted and displayed.
Also, terms including ordinal numbers such as 1st and 2nd are used to describe various components, but this term is used only for the purpose of distinguishing one component from other components. The components are not limited by.

[First Embodiment]
Hereinafter, the inspection device 100 according to the first embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a cross-sectional view of the inspection device 100 according to the first embodiment in a side view. In FIG. 1, in addition to the cross-sectional view, a plan view of the light source unit 20 and the operation unit 60, which will be described later, is shown. FIG. 2 is a bottom view of the inspection device 100. FIG. 1 shows a vertical cross section along the line AA shown in FIG. 1 and 2 correspond to FIGS. 3 and 4 of the comparative example. Hereinafter, the description will be given based on the XYZ Cartesian coordinate system. The Y-axis direction corresponds to the left-right direction of the paper surface, and is the same axis as the first direction. The X-axis direction corresponds to the vertical direction of the paper surface in FIG. 1 and the vertical direction of the paper surface in FIG. The Z-axis direction corresponds to the vertical vertical direction in FIG. The Y-axis direction and the Z-axis direction are orthogonal to the X-axis direction, respectively. The notation in such a direction does not limit the posture in which the inspection device 100 is used, and the inspection device 100 can be used in any posture. In particular, in the present specification, the direction away from the light guide unit 30 described later in the Y-axis direction is referred to as the first direction.

(Inspection device)
The inspection device 100 is an inspection device that irradiates irradiation light 28 having different illuminance values from a plurality of openings 18 arranged in the first direction (Y-axis direction). The inspection device 100 can be used as an inspection device for inspecting photosensitivity. The inspection device 100 mainly includes an irradiation unit 10, a light source unit 20, a light guide unit 30, an intermediate reflection member 34, a control unit 50, a power supply unit 52, an operation unit 54, and a display unit 56. Be prepared. The irradiation unit 10 emits irradiation light 28 from a plurality of openings 18 arranged in the first direction. The light source unit 20 outputs the light 26 toward the light guide unit 30. The light guide unit 30 guides the light output from the light source unit 20 to the irradiation unit 10. The intermediate reflection member 34 bends the light incident from the light guide unit 30 and emits it to the irradiation unit 10. The control unit 50 controls the light emission of the light source unit 20. The power supply unit 52 supplies electric power to the inspection device 100. The operation unit 54 detects the operation of starting or stopping the operation of the inspection device 100. The display unit 56 displays the operating state of the inspection device 100 and the like.

(Irradiation unit)
The irradiation unit 10 has a tubular shape having a substantially rectangular cross section perpendicular to the Y-axis direction, which is the longitudinal direction thereof. The external contour of the irradiation unit 10 in a side view has a trapezoidal shape in which both side sides are parallel and the hypotenuse is located on the upper side. The irradiation unit 10 includes a first reflective member 12, a second reflective member 14, a pair of side reflectors 16, and an end member 17.

The first reflecting member 12 and the second reflecting member 14 are arranged so as to be separated from each other in the Z-axis direction and their reflecting surfaces face each other. In FIG. 1, the first reflective member 12 is a lower surface, and the second reflective member 14 is a ceiling surface. The first reflective member 12 is arranged parallel to the first direction, and the second reflective member 14 is arranged at an angle with respect to the first reflective member 12. In FIG. 1, the first reflective member 12 is a flat plate-shaped member extending parallel to the XY plane. The second reflective member 14 is a flat plate-shaped member arranged at an angle in the Y-axis direction (first direction) parallel to the X-axis direction. In particular, the second reflective member 14 is arranged so as to be inclined with respect to the first reflective member 12 so that the gap with the first reflective member 12 becomes smaller as the distance from the light guide portion 30 increases. The inclination angle of the second reflective member 14 with respect to the first reflective member 12 is preferably set in the range of 5 ° to 20 °. In the example of FIG. 1, the inclination angle of the second reflective member 14 with respect to the first reflective member 12 is set in the range of 10 ° to 15 °.

The pair of side reflectors 16 are reflectors that are arranged apart from each other in the X-axis direction and are bridged between the side side of the first reflection member 12 and the side side of the second reflection member 14. The pair of side reflectors 16 extend parallel to the YZ plane, and are arranged so that the reflecting surfaces face each other. The first reflective member 12, the second reflective member 14, and the pair of side reflectors 16 are combined so as to surround a tubular space, and the end portion on the side far from the light guide portion 30 is formed. It is covered by an end member 17. The end member 17 extends parallel to the XZ plane. The first reflective member 12, the second reflective member 14, and the pair of side reflectors 16 can be formed of various materials, and in this example, they are made of aluminum. Aluminum is preferable because it has a high reflectance in the ultraviolet light region. A material that is substantially non-reflective is used for the end member 17. The end member 17 may be painted in matt black as an example.

(Aperture)
The plurality of openings 18 are formed in the first reflective member 12. The plurality of openings 18 include openings 18a, 18b, 18c, 18d, and 18e arranged in the Y-axis direction in order from the side closer to the light guide portion 30. In the example of FIG. 2, the openings 18a, 18b, 18c, 18d, and 18e each have the same rectangular shape and are arranged at equal intervals in the first direction. The openings 18a, 18b, 18c, 18d, and 18e may each be provided with a frame at the edge. A translucent material may be provided in the openings 18a, 18b, 18c, 18d, and 18e, but in the example of FIG. 2, the translucent material is not provided.

(Light source)
The light source unit 20 outputs light 26 having a wavelength used for the photosensitivity test. The light source unit 20 may output light having a single wavelength, but the inspection device 100 is configured to output light having a plurality of wavelengths. By switching the wavelength and using it, it becomes possible to inspect the difference in light sensitivity for each wavelength. As an example, the light source unit 20 outputs long-wavelength ultraviolet rays (UVA waves) of 320 nm to 400 nm, medium-wavelength ultraviolet rays (UVB waves) of 280 nm to 350 nm, which are used for ultraviolet light therapy. As a result, the irradiation light 28 output from the plurality of openings 18 includes one or both of ultraviolet rays having a peak in the wavelength range of 320 nm to 400 nm and ultraviolet rays having a peak in the wavelength range of 280 nm to 350 nm. be able to.

The light source unit 20 includes a substrate 20b and a light emitting element 22 arranged on the substrate 20b. The light emitting element 22 may include a plurality of light emitting elements arranged in a matrix of n rows and m columns. n and m are integers of 2 or more and may be equal or non-equal. n and m can be set corresponding to a desired illuminance and a desired wave number. In the example of FIG. 1, the light emitting element 22 includes nine light emitting elements 22a, 22b, 22c, 22d, 22e, 22f, 22g, 22h, 22j arranged in 3 rows and 3 columns.

As the light emitting element 22, a light emitting element based on various principles can be adopted. In the inspection device 100, an LED (Light Emitting Diode) that emits ultraviolet light is adopted as the light emitting element 22. As the light emitting element 22, for example, by using an LED having a center wavelength or a peak wavelength of about 305 nm, it can be used for UVB wave inspection. As such an LED, an aluminum nitride gallium nitride (AlGaN) -based LED is known.

(Light guide)
The light guide unit 30 suppresses the emission of the light 26 output from the light source unit 20 and guides it to the irradiation unit 10. The light guide portion 30 includes a tubular portion 32. The tubular portion 32 is a substantially square tubular member that surrounds the light guide space that guides the light 26. The inner tubular surface of the tubular portion 32 extends in a direction parallel to the optical axis 20j of the light source portion 20. In the example of FIG. 1, the optical axis 20j is parallel to the Z-axis direction. Therefore, the tubular portion 32 advances the light 26 in the direction parallel to the optical axis 20j while suppressing the divergence of the light 26. Since the tubular portion 32 extends in the Z-axis direction, the tubular portion 32 causes the light 26 to travel in the Z-axis direction. The light 26 traveling through the tubular portion 32 is referred to as light 26b.

(Intermediate reflective member)
The intermediate reflection member 34 is provided between the light guide unit 30 and the irradiation unit 10, reflects the light 26b incident from the light guide unit 30, and emits the light 26b toward the irradiation unit 10 in the first direction. In the example of FIG. 1, the intermediate reflection member 34 reflects the light 26b incident in the Z-axis direction from the light guide unit 30 and emits the light 26c traveling in the Y-axis direction to the irradiation unit 10. That is, the inspection device 100 includes the intermediate reflection member 34 so that the optical path of the entire device is L-shaped. In the example of FIG. 1, the intermediate reflection member 34 is a flat plate-shaped member, and is arranged on the lower end side of the tubular portion 32 in parallel with the X-axis direction and tilted by 45 ° with respect to the Z-axis direction. The light 26c travels in the Y-axis direction while being reflected inside the irradiation unit 10.

It is desirable that the inner tubular surface of the tubular portion 32 and the reflective surface of the intermediate reflective member 34 have high reflectance, and in the example of FIG. 1, they are made of an aluminum material.

The control unit 50 controls the light emission of the light emitting element 22 based on the input from the operation unit 54. The control unit 50 causes the display unit 56 to display information for setting irradiation conditions such as the light emission intensity and the lighting time of the light emitting element 22. The control unit 50 accepts the setting of these conditions through the input from the operation unit 54. The control unit 50 may hold, for example, a plurality of inspection modes and irradiation conditions corresponding to each inspection mode. The control unit 50 displays a list of a plurality of inspection modes on the display unit 56, and receives the designation of the inspection mode by the input from the operation unit 54, so that the irradiation light of the irradiation conditions corresponding to the designated inspection mode is output. The light emitting element 22 may be controlled so as to be performed. The control unit 50 can be realized by using a known CPU (Central Processing Unit) or the like.

The power supply unit 52 supplies electric power to the light source unit 20, the control unit 50, and the like. The power supply unit 52 includes a storage battery (not shown) such as a lithium ion battery. The power supply unit 52 has a power supply terminal for charging the storage battery, and is configured to be charged through an AC adapter or the like connected to the power supply terminal. The power supply unit 52 may include a dry battery which is a primary battery or a secondary battery. In this case, the inspection device 100 may be provided with a holder for holding a storage battery or a dry battery.

The operation unit 54 is used for operations for starting and ending irradiation by the inspection device 100 and for setting irradiation conditions of the inspection device 100. The display unit 56 is composed of, for example, a liquid crystal display or the like, and displays an operating state of the inspection device 100, set irradiation conditions, and the like. The operation unit 54 may be composed of switches or buttons provided at positions different from the display unit 56, or may be composed of a touch panel or the like integrated with the display unit 56.

In the inspection device 100, the irradiation unit 10, the light source unit 20, and the light guide unit 30 constitute a main body unit 58, and the control unit 50, the power supply unit 52, the operation unit 54, and the display unit 56 are It constitutes an operation unit 60. The operation unit 60 may be integrally configured with the main body 58, but in the example of FIG. 1, it is configured as a separate body and is connected to each other by an electric wire. In this case, the main body 58 becomes lightweight and the inspection work becomes easy. The main body 58 may include members and elements described as being included in the operation unit 60.

Next, the illuminance value of the irradiation light 28 obtained by the first simulation of the inspection device 100 configured in this way will be described. Graph Q of FIG. 5 shows an example of the illuminance value of the irradiation light 28 obtained by the first simulation. In FIG. 5, points A, B, C, D, and E on the horizontal axis correspond to the irradiation lights 28a, 28b, 28c, 28d, and 28e of each of the openings 18, and the vertical axis represents the illuminance value of each irradiation light. Is shown. The illuminance value of the irradiation light 28 shown in the graph Q is the largest at the point A, and decreases in the order of B, C, D, and E. The illuminance value of the irradiation light 28 shown in the graph Q is higher than the illuminance value of the irradiation light 528 of the comparative example shown in the graph P. That is, by tilting the second reflecting member 14, the illuminance value of the irradiation light 28 increases as compared with the case where the second reflecting member 14 is not tilted.

Next, the illuminance value of the irradiation light 28 obtained by the second simulation of the inspection device 100 will be described. As shown in FIG. 1, the light source unit 20 includes a plurality of light emitting elements 22 arranged in 3 rows and 3 columns. In the second simulation, the irradiation light 28a, 28b, 28c, 28d by the light emitted from the three light emitting elements 22d, 22e, 22f arranged at the center position in the X-axis direction and separated in the Y-axis direction, The illuminance value of 28e is obtained. FIG. 8 is a graph showing an example of the illuminance value of the irradiation light 28 obtained by the second simulation. FIG. 8 plots the respective illuminance values due to the light emitted from the light emitting elements 22d, 22e, and 22f.

In FIG. 8, graph K shows the illuminance values of the irradiation light 28a, 28b, 28c, 28d, 28e by the light from the light emitting element 22d. Similarly, the graph L shows the illuminance values of the irradiation light 28a, 28b, 28c, 28d, 28e by the light from the light emitting element 22e, and the graph M shows the illuminance values of the light from the light emitting element 22f. The illuminance values shown in the graphs K, L, and M decrease monotonically from the point A to the point E. The maximum difference between the illuminance values in the graphs K, L, and M was 1.3 times. Therefore, even when the light emitting elements 22d, 22e, and 22f are used in combination with light having different wavelength characteristics, it is possible to suppress a decrease in inspection accuracy.

Next, how to use the inspection device 100 will be described. First, the irradiation conditions are determined by setting the inspection mode according to the inspection content. Next, the inspection device 100 is arranged so that the lower surface 10d of the first reflective member 12 is in close contact with the skin to be irradiated. When inspecting the skin of the upper arm or thigh, the arm or leg and the inspection device 100 are fixed by a fixing device such as a belt or a patch, so that the position of the inspection device 100 does not shift during irradiation. If there is a slight gap between the inspection device 100 and the skin, cover both the inspection device 100 and the irradiation target with a cover (for example, made of cloth) that shields the ultraviolet light so that the ultraviolet light does not leak to the surroundings. It may be attached in this way. After fixing the inspection device 100, irradiation of the inspection light is started. Irradiation is automatically stopped after a preset time has elapsed since the start of irradiation. After the irradiation is completed, the inspection device 100 is removed. The skin irradiated by the inspection device 100 is diagnosed by a doctor for the presence or absence of erythema after a predetermined time (for example, 1 to 2 days later), and the minimum irradiation amount (MED; Minimal Erythema) that causes erythema occurs. Dose), minimum reaction dose (MRD; Minimal Response Dose), and minimum phototoxic dose (MPD; Minimal Phototoxic Dose) can be specified.

Next, the operation / effect of the inspection device 100 configured in this way will be described.

The inspection device 100 of the first embodiment is an inspection device that outputs irradiation light 28 having different illuminance values from a plurality of openings 18 arranged side by side in the first direction, and includes a light source unit 20 that outputs light. An irradiation unit 10 including a first reflective member 12 extending in the first direction and having a plurality of openings 18 and a second reflective member 14 arranged to face the first reflective member 12 via a gap. A light guide unit 30 that guides the light output from the light source unit 20 to the irradiation unit 10 is provided, and the gap between the second reflective member 14 and the first reflective member 12 becomes smaller as the distance from the light guide unit 30 increases. It is arranged so as to be tilted with respect to the first reflective member 12. According to this configuration, the number of components is reduced as compared with the case where heavy and expensive optical components are used, and the configuration can be simplified. In addition, the weight of the inspection device can be reduced and the usability can be improved.

The inspection device 100 of the first embodiment is configured such that the intensity of the irradiation light 28 output from each of the plurality of openings 18 decreases in order as the distance from the light guide portion 30 increases. According to this configuration, it is possible to simultaneously irradiate a plurality of irradiation lights having different intensities required for the photosensitivity test, so that the irradiation time is compared with the method of irradiating the inspection light individually while changing the irradiation conditions. Can be shortened and the labor of the inspector can be reduced. This can reduce the burden on the doctor and the patient for the examination.

The inspection device 100 of the first embodiment is provided between the light guide unit 30 and the irradiation unit 10, and is an intermediate that reflects the light incident from the light guide unit 30 and emits the light incident from the light guide unit 30 toward the irradiation unit 10 in the first direction. It includes a reflective member 34. According to this configuration, since the optical path of the light from the light guide unit 30 can be bent, the dimension of the inspection device 100 in the first direction can be shortened as compared with the configuration in which the optical path is not bent.

In the inspection device 100 of the first embodiment, the light source unit 20 includes a plurality of light emitting elements 22, and each of the plurality of light emitting elements 22 emits light output by the light source unit 20. According to this configuration, the light source unit 20 can emit light of a desired intensity by increasing the number of light emitting elements 22 provided. Since the light source unit 20 can include a light emitting element 22 that emits light having different wavelength characteristics and intensities, the characteristics of the irradiation light 28 are adjusted according to the state of the patient by selecting the light emitting element that emits light. be able to.

In the inspection device 100 of the first embodiment, the plurality of light emitting elements 22 include light emitting elements that emit light having wavelength characteristics different from each other. According to this configuration, it is possible to simultaneously irradiate a plurality of irradiation lights having different wavelength bands required for the photosensitivity test, so that the irradiation time is compared with the method of irradiating the inspection light individually while changing the wavelength. Can be shortened and the labor of the inspector can be reduced. This can reduce the burden on the doctor and the patient for the examination.

In the inspection device 100 of the first embodiment, the irradiation light 28 output from the plurality of openings 18 includes ultraviolet rays having a peak in the wavelength range of 320 nm to 400 nm and ultraviolet rays having a peak in the wavelength range of 280 nm to 350 nm. Includes at least one of. According to this configuration, it is possible to diagnose photosensitivity to ultraviolet rays in this wavelength range or set initial conditions for performing phototherapy in this wavelength range.

In the inspection device 100 of the first embodiment, the inclination angle of the second reflective member 14 with respect to the first reflective member 12 is set in the range of 5 ° to 20 °. According to this configuration, the illuminance value of the irradiation light 28 can be increased as compared with the case where the second reflecting member 14 is parallel to the first reflecting member 12. Further, the inspection device 100 can reduce the difference in the illuminance value of the irradiation light 28 depending on the position of the light emitting element 22 that is emitting light, as compared with the case where the second reflection member 14 is not tilted. Therefore, even when light having different wavelength characteristics is used in combination, it is possible to suppress a decrease in inspection accuracy.

[Second Embodiment]
The inspection device 200 according to the second embodiment of the present invention will be described with reference to FIG. FIG. 9 is a cross-sectional view of the inspection device 200 in a side view, and corresponds to FIG. The inspection device 200 according to the second embodiment is different from the inspection device 100 according to the first embodiment in that the intermediate reflection member 34 is not provided and the optical path of the entire device is straight. The configuration is similar. In the inspection device 100, the optical path of the entire device is formed in an L shape, whereas in the inspection device 200, the optical path of the entire device is formed in an I shape. The description that overlaps with the first embodiment will be omitted, and the different configurations will be described. The inspection device 200 includes a light guide unit 230 that guides light in the first direction instead of the light guide unit 30. In the inspection device 200, the optical axis of the light source unit 20 is oriented in the first direction, and the light 26b generated from the light source unit 20 is directly incident on the irradiation unit 10 through the light guide unit 230.

The inspection device 200 according to the second embodiment has the same configuration as the inspection device 100 according to the first embodiment, and thus exhibits the same operations and effects as the inspection device 100. In addition, since the inspection device 200 does not include the intermediate reflection member 34 and the optical path is constructed in a straight line, the configuration can be further simplified.

[Third Embodiment]
The inspection device 300 according to the third embodiment of the present invention will be described with reference to FIG. FIG. 10 is a cross-sectional view of the inspection device 300 in a side view, and corresponds to FIG. The inspection device 300 according to the third embodiment is different from the inspection device 100 according to the first embodiment in that an intermediate reflection member 36 is provided, and the optical path of the entire device is bent twice. The configuration of is similar. The optical path of the inspection device 300 includes a light guide unit 330, another intermediate reflection member 36, a light guide unit 338, and an intermediate reflection member 34 in this order from the light source unit 20 side.

The light guide unit 330 guides the light 26b from the light source unit 20 in the Y-axis direction in the direction opposite to the first direction. Another intermediate reflecting member 36 reflects the light 26b incident from the light guide unit 330 in the Z-axis direction. Another light guide unit 338 guides the light 26d from another intermediate reflection member 36 in the Z-axis direction. The intermediate reflection member 34 reflects the light 26d in the Z-axis direction incident from the light guide unit 338 in the first direction. That is, the optical path of the inspection device 300 is formed in a horizontal U shape.

The inspection device 300 according to the third embodiment has the same configuration as the inspection device 100 according to the first embodiment, and thus exhibits the same operations and effects as the inspection device 100. In addition, in the inspection device 300, since the optical path of the entire device is bent twice in a U shape, the dimensions in the Y-axis direction and the dimensions in the Z-axis direction can be reduced.

The above description has been made based on each embodiment of the present invention. It will be appreciated by those skilled in the art that these embodiments are exemplary and that various modifications and modifications are possible within the claims of the invention, and that such modifications and modifications are also within the claims of the present invention. It is about to be done. Therefore, the descriptions and drawings herein should be treated as exemplary rather than limiting.

Hereinafter, a modified example will be described. In the drawings and description of the modified examples, the same or equivalent components and members as those in the embodiment are designated by the same reference numerals. The description overlapping with the embodiment will be omitted as appropriate, and the configuration different from that of the first embodiment will be mainly described.

(First modification)
In the description of the first embodiment, an example in which the irradiation unit 10 is formed in a square tube shape in a front view has been described, but the present invention is not limited to this. The irradiation unit 10 may be configured to include a curved surface. For example, the second reflective member may include a curved curved surface such as a dome-shaped surface or a partially cylindrical surface. A desired distribution of irradiation light can be realized by adjusting the curved surface shape of the second reflecting member.

(Second modification)
In the description of the first embodiment, an example in which a plurality of light emitting elements 22 are arranged in a matrix has been described, but the present invention is not limited to this. The plurality of light emitting elements 22 may be arranged in an arbitrary pattern such as concentric circles.

(Third modification example)
In the description of the first embodiment, an example in which the irradiation unit 10 includes five openings 18 has been described, but the present invention is not limited thereto. The irradiation unit may include 4 or less or 6 or more openings.

(Fourth modification)
In the description of the first embodiment, an example in which a plurality of openings 18 are formed in a rectangular shape has been described, but the present invention is not limited to this. The plurality of openings 18 may include openings having an arbitrary shape such as a polygonal shape other than a rectangle or an elliptical shape.

(Fifth modification)
In the description of the first embodiment, an example in which the light source unit 20, the light guide unit 30, and the irradiation unit 10 are integrally formed has been described, but the present invention is not limited thereto. At least one of the space between the light source unit and the light guide unit and the light guide unit and the irradiation unit may be connected via an optical transmission medium such as an optical fiber.

(6th modification)
In the description of the first embodiment, an example in which the optical path of the inspection device 100 is configured without using a translucent optical element such as a lens has been described, but the present invention is not limited to this. The inspection device may be configured to include an optical element having translucency.

Each of the above-described modifications has the same effects and effects as those of the first embodiment.

Any combination of each of the above-described embodiments and modifications is also useful as an embodiment of the present invention. The new embodiments resulting from the combination have the effects of each of the combined embodiments and variants.

10 ... Irradiation unit, 12 ... 1st reflective member, 14 ... 2nd reflective member, 18 ... Opening, 20 ... Light source, 22 ... Light emitting element, 26 ... Light, 28 ... Irradiation light , 30, 230, 330 ... Light source, 34 ... Intermediate reflection member, 100, 200, 300 ... Inspection device.

Claims (7)

An inspection device that outputs irradiation light with different illuminance values from a plurality of openings arranged side by side in the first direction.
A light source that outputs light and
An irradiation unit including a first reflective member extending in the first direction and provided with the plurality of openings, and a second reflective member arranged to face the first reflective member with a gap.
A light guide unit that guides the light output from the light source unit to the irradiation unit is provided.
The inspection device is characterized in that the second reflective member is tilted with respect to the first reflective member so that the gap becomes smaller as the distance from the light guide portion increases. The inspection device according to claim 1, wherein the intensity of the irradiation light output from each of the plurality of openings is configured to decrease in order as the distance from the light guide portion increases. The claim is provided between the light guide unit and the irradiation unit, and includes an intermediate reflection member that reflects the light incident from the light guide unit and emits it in the first direction toward the irradiation unit. Item 2. The inspection device according to item 1 or 2. The light source unit includes a plurality of light emitting elements.
The inspection device according to any one of claims 1 to 3, wherein each of the plurality of light emitting elements emits light output by the light source unit. The inspection device according to claim 4, wherein the plurality of light emitting elements include light emitting elements that emit light having wavelength characteristics different from each other. The irradiation light output from the plurality of openings includes at least one of ultraviolet rays having a peak in the wavelength range of 320 nm to 400 nm and ultraviolet rays having a peak in the wavelength range of 280 nm to 350 nm. The inspection device according to any one of Items 1 to 5. The inspection device according to any one of claims 1 to 6, wherein the inclination angle of the second reflective member with respect to the first reflective member is set in the range of 5 ° to 20 °.

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