Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JP6831964B2 - Solar cell - Google Patents
[go: Go Back, main page]

JP6831964B2 - Solar cell - Google Patents

Solar cell Download PDF

Info

Publication number
JP6831964B2
JP6831964B2 JP2019198149A JP2019198149A JP6831964B2 JP 6831964 B2 JP6831964 B2 JP 6831964B2 JP 2019198149 A JP2019198149 A JP 2019198149A JP 2019198149 A JP2019198149 A JP 2019198149A JP 6831964 B2 JP6831964 B2 JP 6831964B2
Authority
JP
Japan
Prior art keywords
solar cell
metal foil
substrate
thin film
back side
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2019198149A
Other languages
Japanese (ja)
Other versions
JP2020031228A (en
Inventor
バム リム、スン
バム リム、スン
ハーレー、ガブリエル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SunPower Corp
Original Assignee
SunPower Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SunPower Corp filed Critical SunPower Corp
Publication of JP2020031228A publication Critical patent/JP2020031228A/en
Application granted granted Critical
Publication of JP6831964B2 publication Critical patent/JP6831964B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/16Material structures, e.g. crystalline structures, film structures or crystal plane orientations
    • H10F77/169Thin semiconductor films on metallic or insulating substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F10/00Individual photovoltaic cells, e.g. solar cells
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F10/00Individual photovoltaic cells, e.g. solar cells
    • H10F10/10Individual photovoltaic cells, e.g. solar cells having potential barriers
    • H10F10/14Photovoltaic cells having only PN homojunction potential barriers
    • H10F10/146Back-junction photovoltaic cells, e.g. having interdigitated base-emitter regions on the back side
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/139Manufacture or treatment of devices covered by this subclass using temporary substrates
    • H10F71/1395Manufacture or treatment of devices covered by this subclass using temporary substrates for thin-film devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/20Electrodes
    • H10F77/206Electrodes for devices having potential barriers
    • H10F77/211Electrodes for devices having potential barriers for photovoltaic cells
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/20Electrodes
    • H10F77/206Electrodes for devices having potential barriers
    • H10F77/211Electrodes for devices having potential barriers for photovoltaic cells
    • H10F77/219Arrangements for electrodes of back-contact photovoltaic cells
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/30Coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/70Surface textures, e.g. pyramid structures
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/93Interconnections
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells

Landscapes

  • Photovoltaic Devices (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Sustainable Energy (AREA)
  • Manufacturing & Machinery (AREA)

Description

本明細書に記載する主題の実施形態は、広くは太陽電池に関する。より詳細には、主題の実施形態は、太陽電池の製造プロセス及び構造に関する。 Embodiments of the subject matter described herein relate broadly to solar cells. More specifically, embodiments of the subject relate to the manufacturing process and structure of solar cells.

太陽電池は、太陽放射光を電気エネルギーに変換するための周知のデバイスである。太陽電池は、太陽放射光を集めるために通常の動作中に太陽に面する表側と、表側と反対側の裏側と、を有する。太陽電池に当たった太陽放射光は、負荷などの外部電気回路に電力を供給するために利用することができる電荷を作り出す。 Solar cells are well-known devices for converting solar radiation into electrical energy. A solar cell has a front side facing the sun during normal operation to collect solar radiation and a back side opposite to the front side. The solar radiation that hits the solar cells creates an electric charge that can be used to power external electrical circuits such as loads.

太陽電池の製造プロセスは通常、マスキング、エッチング、成長、拡散及び他の工程など、多数の工程を含む。本発明の実施形態は、有利な太陽電池プロセスを提供する。 The manufacturing process of a solar cell usually involves a number of steps, including masking, etching, growing, diffusing and other steps. Embodiments of the present invention provide an advantageous solar cell process.

一実施形態は、太陽電池の製造方法に関する。シリコン薄膜は、シリコン基板から劈開される。シリコン薄膜の裏側は、P型ドープ領域及びN型ドープ領域を含む。シリコン薄膜の裏側には、金属箔が取り付けられる。金属箔は、シリコン薄膜の表側の処理中にシリコン薄膜を処理するための組込みキャリアとして有利に使用されてもよい。 One embodiment relates to a method of manufacturing a solar cell. The silicon thin film is cleaved from the silicon substrate. The back side of the silicon thin film contains a P-type doping region and an N-type doping region. A metal foil is attached to the back side of the silicon thin film. The metal leaf may be advantageously used as an embedded carrier for treating the silicon thin film during the treatment of the front side of the silicon thin film.

別の実施形態は、裏側にP型ドープ領域及びN型ドープ領域を有するシリコン薄膜を含む太陽電池に関する。金属箔は薄膜の裏側に接着され、金属箔とドープ領域との間に接点が形成される。 Another embodiment relates to a solar cell comprising a silicon thin film having a P-type doped region and an N-type doped region on the back side. The metal foil is adhered to the back side of the thin film to form contacts between the metal foil and the dope region.

別の実施形態は、金属箔をシリコン基板の裏側に接着する工程を含む、太陽電池の製造方法に関する。シリコン薄膜はその後、シリコン基板の裏側から分離されてもよい。金属箔は、シリコン薄膜の表側の処理中にシリコン薄膜を処理するための組込みキャリアとして使用される。 Another embodiment relates to a method of manufacturing a solar cell, which comprises a step of adhering a metal leaf to the back side of a silicon substrate. The silicon thin film may then be separated from the back side of the silicon substrate. The metal leaf is used as an embedded carrier for treating the silicon thin film during the treatment of the front side of the silicon thin film.

本発明の、これらの実施形態及び他の実施形態、態様並びに特徴は、添付の図面及び特許請求の範囲を含む本開示全体を読み解くことで当業者にとって容易に明らかになるであろう。 These and other embodiments, aspects and features of the present invention will be readily apparent to those skilled in the art by reading the entire disclosure, including the accompanying drawings and claims.

発明を実施するための形態、及び特許請求の範囲を、以下の複数の図面と併せて考察し、参照することによって、本主題のより完全な理解を得ることができる。同様の参照番号は複数の図面を通じて同様の要素を指し示す。複数の図面は、一律の倍率で描かれていない。 A more complete understanding of the subject can be obtained by considering and referring to the embodiments for carrying out the invention and the scope of claims in combination with the following drawings. Similar reference numbers point to similar elements throughout the drawings. Multiple drawings are not drawn at a uniform magnification.

本発明の実施形態による太陽電池の製造を概略的に図示する断面図である。It is sectional drawing which schematically illustrates the manufacture of the solar cell by embodiment of this invention. 本発明の実施形態による太陽電池の製造を概略的に図示する断面図である。It is sectional drawing which schematically illustrates the manufacture of the solar cell by embodiment of this invention. 本発明の実施形態による太陽電池の製造を概略的に図示する断面図である。It is sectional drawing which schematically illustrates the manufacture of the solar cell by embodiment of this invention. 本発明の実施形態による太陽電池の製造を概略的に図示する断面図である。It is sectional drawing which schematically illustrates the manufacture of the solar cell by embodiment of this invention. 本発明の実施形態による太陽電池の製造を概略的に図示する断面図である。It is sectional drawing which schematically illustrates the manufacture of the solar cell by embodiment of this invention. 本発明の実施形態による太陽電池の製造を概略的に図示する断面図である。It is sectional drawing which schematically illustrates the manufacture of the solar cell by embodiment of this invention.

本発明の実施形態による太陽電池の製造方法のフロー図である。It is a flow chart of the manufacturing method of the solar cell by embodiment of this invention.

本発明の代替実施形態による太陽電池の製造方法のフロー図である。It is a flow chart of the manufacturing method of the solar cell by the alternative embodiment of this invention.

図8の方法によって製造された製造済み太陽電池の断面図である。It is sectional drawing of the manufactured solar cell manufactured by the method of FIG.

本発明の実施形態による、シリコン薄膜の裏側を覆う金属箔の平面図である。It is a top view of the metal foil covering the back side of the silicon thin film according to the embodiment of this invention.

本発明の別の実施形態による、薄いシリコン太陽電池の製造方法のフロー図である。It is a flow chart of the manufacturing method of the thin silicon solar cell according to another embodiment of this invention.

本開示では、本発明の実施形態の十分な理解を提供するために、装置、構造、材料及び方法の例など、多数の具体的な詳細を提供している。しかしながら、当業者であれば、本発明はこれらの具体的な詳細のうちの1又は複数を欠いても実施できることは理解されよう。その他の場合では、本発明の態様を不明瞭にすることを避けるため、周知の詳細については図示又は説明していない。 The present disclosure provides a number of specific details, including examples of devices, structures, materials and methods, to provide a full understanding of embodiments of the present invention. However, those skilled in the art will appreciate that the present invention can be practiced in the absence of one or more of these specific details. In other cases, well known details are not illustrated or described to avoid obscuring aspects of the invention.

本開示は、金属箔を使用して薄いシリコン太陽電池を形成するための技法を提供する。有利なことに、金属箔は、それなしでは脆弱なシリコン薄膜を処理するための組込みキャリアとして、この薄膜の表側の処理中に使用されてもよい。引き続いて、金属箔は、薄膜の裏側にあるP型エミッタ及びN型エミッタに対する複数の金属指部及び複数の接点を形成するために再利用されてもよい。 The present disclosure provides techniques for forming thin silicon solar cells using metal foil. Advantageously, the metal leaf may be used during the processing of the front side of the thin film as an embedded carrier for processing the otherwise fragile silicon thin film. Subsequently, the metal leaf may be reused to form a plurality of metal fingers and contacts to the P- and N-emitters on the backside of the thin film.

図1〜図6は、本発明の実施形態による薄いシリコン太陽電池の製造を概略的に図示する断面図である。図1に示されているのは、その上にP型ドープ(P+)領域104及びN型ドープ(N+)領域106が形成されたシリコン基板102であり、これらの領域は基板102の裏側に形成されている。P+及びN+ドープ領域は、製造される太陽電池との関連においては、P型エミッタ及びN型エミッタと称されてもよい。図1に示された裏面電極型太陽電池では、複数のエミッタ及び対応する複数の接点が太陽電池の裏側に設けられる。ドープ領域は、例えば、ドーパントをドーパント源から拡散することによって形成されてもよい。 1 to 6 are cross-sectional views schematically illustrating the manufacture of a thin silicon solar cell according to an embodiment of the present invention. What is shown in FIG. 1 is a silicon substrate 102 on which a P-type dope (P +) region 104 and an N-type dope (N +) region 106 are formed, and these regions are formed on the back side of the substrate 102. Has been done. The P + and N + doped regions may be referred to as P-type emitters and N-type emitters in the context of manufactured solar cells. In the back electrode type solar cell shown in FIG. 1, a plurality of emitters and a plurality of corresponding contacts are provided on the back side of the solar cell. The doped region may be formed, for example, by diffusing the dopant from the dopant source.

薄い誘電体層108は、電気的絶縁、不動態化及び/又は他の目的のために、裏側のP+及びN+領域上に形成されてもよい。誘電体層108は、例えば、シリコン酸化物及び/又はシリコン窒化物を含んでもよい。代替的に、誘電体層108を形成する以外の手段、例えば、化学的不動態化などによって、エミッタの表面が不動態化されてもよい。 The thin dielectric layer 108 may be formed on the backside P + and N + regions for electrical insulation, passivation and / or other purposes. The dielectric layer 108 may contain, for example, silicon oxide and / or silicon nitride. Alternatively, the surface of the emitter may be passivated by means other than forming the dielectric layer 108, such as chemical passivation.

図1の太陽電池の構造は、「イオン注入器」とも称されるイオン注入工具内に配置されてもよい。イオン注入器は、図2に示されるように、予め定められたの注入深度202においてイオンを注入するために使用されてもよい。イオンは水素イオン(すなわち陽子)であってもよい。代替実施形態では、他のイオンが注入されるか又は水素と共に注入されてもよい。例えば、ヘリウムイオンが水素イオンの代わりに注入されるか又は水素イオンと共に注入されてもよい。注入量は注入深度において欠陥を生じさせるため、注入深度の上にあるシリコンの平面薄膜は、注入深度の下にある残りのシリコン基板から分離又は剥離されてもよい。注入エネルギーは注入深度を制御し、剥離後の薄いシリコン基板の厚みを制御する。例えば、薄い薄膜を10マイクロメートル〜100マイクロメートルの範囲内の厚みで劈開するために、注入エネルギーが較正されてもよい。剥離は、基板を高温で加熱することによって実現されてもよい。 The structure of the solar cell of FIG. 1 may be arranged in an ion implanter, also referred to as an "ion implanter". The ion implanter may be used to implant ions at a predetermined implantation depth 202, as shown in FIG. The ion may be a hydrogen ion (ie, a proton). In alternative embodiments, other ions may be injected or may be injected with hydrogen. For example, helium ions may be injected instead of hydrogen ions or may be injected with hydrogen ions. A planar thin film of silicon above the injection depth may be separated or stripped from the remaining silicon substrate below the injection depth, as the injection volume causes defects at the injection depth. The injection energy controls the injection depth and the thickness of the thin silicon substrate after peeling. For example, the injection energy may be calibrated to cleave a thin film with a thickness in the range of 10 micrometers to 100 micrometers. The peeling may be realized by heating the substrate at a high temperature.

図3に示されるように、金属箔306は、シリコン薄膜302の裏側における誘電体層108に接着されてもよい。金属箔306は、アルミ箔であってもよい。その箔を薄膜のキャリアとして使用することを容易にするために、シリコン薄膜302の外辺部を越えて金属箔306の拡張領域(処理領域)を延ばしてもよい。例示的実装では、金属箔306の組成物がAl−1%Si(99%のアルミニウム及び1%のシリコン)又はより一般的にはAl−x%Siであってもよく、x%は0%〜3%である。アルミ箔の他の組成物が使用されてもよい。例えば銀箔など、アルミニウム以外の金属箔を使用することもできる。 As shown in FIG. 3, the metal foil 306 may be adhered to the dielectric layer 108 on the back side of the silicon thin film 302. The metal foil 306 may be an aluminum foil. In order to facilitate the use of the foil as a carrier of the thin film, the extended region (processed region) of the metal foil 306 may be extended beyond the outer edge of the silicon thin film 302. In an exemplary implementation, the composition of the metal leaf 306 may be Al-1% Si (99% aluminum and 1% silicon) or more generally Al-x% Si, where x% is 0%. ~ 3%. Other compositions of aluminum foil may be used. A metal leaf other than aluminum, such as silver leaf, can also be used.

一実施形態では、金属箔306をシリコン薄膜302の裏側に接着するために、接着層304が使用されてもよい。接着層304は、エポキシ、シリコン、エチレン酢酸ビニル(EVA)又は基板の裏側に塗布される他の封入材料の薄い層であってもよい。一実装では、接着層が、接着前に金属箔に予め塗布されたコーティングであってもよい。 In one embodiment, an adhesive layer 304 may be used to bond the metal leaf 306 to the back side of the silicon thin film 302. The adhesive layer 304 may be a thin layer of epoxy, silicone, ethylene vinyl acetate (EVA) or other encapsulating material applied to the back side of the substrate. In one implementation, the adhesive layer may be a coating pre-applied to the metal leaf prior to bonding.

代替実施形態では、金属箔306が、金属箔306と基板の裏側との間の接触点のアレイを使用して、基板の裏側に接着されてもよい。接触点は、例えばパルスレーザを使用した金属箔の点融解によって形成されてもよい。この実施形態では、接着層304は不要である。接触点間の箔の下のエアギャップは、箔を平坦化することによって除去されてもよい。 In an alternative embodiment, the metal foil 306 may be adhered to the back side of the substrate using an array of contact points between the metal foil 306 and the back side of the substrate. The contact points may be formed by, for example, point melting of the metal leaf using a pulsed laser. In this embodiment, the adhesive layer 304 is unnecessary. The air gap under the foil between the contact points may be removed by flattening the foil.

図4に示されるように、薄膜を支持するための組込み又は一体型キャリアとして箔を使用した場合、薄膜302の表側の表面402がテクスチャ加工及び不動態化されてもよい。表面のテクスチャ加工はシリコンの表面が光を吸収する能力を増大させるために機能し、表面の不動態化は表面における電荷の再結合を低減するために機能する。表面のテクスチャ加工は、例えば、湿式表面エッチングプロセスを使用して実現されてもよい。表面の不動態化は、化学的不動態化又は他の手段によって実現されてもよい。 As shown in FIG. 4, when the foil is used as an integrated or integrated carrier to support the thin film, the front surface 402 of the thin film 302 may be textured and passivated. Surface texture processing works to increase the ability of the silicon surface to absorb light, and surface passivation works to reduce charge recombination on the surface. Surface texturing may be achieved using, for example, a wet surface etching process. Surface passivation may be achieved by chemical passivation or other means.

その後、ガラス封入プロセスがシリコン薄膜302の表側で実施されてもよい。図5は、封入材料503を使用して表側に取り付けられた、結果として得られたガラス層502を示す。 After that, the glass encapsulation process may be carried out on the front side of the silicon thin film 302. FIG. 5 shows the resulting glass layer 502 attached to the front side using encapsulation material 503.

図6に示されるように、その後更なる工程が、シリコン薄膜302の裏側で実施されてもよい。これらの工程は、対応するP+領域104及びN+領域106にそれぞれ電気で連結するために、コンタクトホール内に金属接点604及び606を形成する工程を含む。金属接点604の第1のセットは金属箔304からP+領域104までであってもよく、金属接点606の第2のセットは金属箔304からN+領域106まで形成されてもよい。一実施形態では、金属接点604及び606が、レーザベースの接点形成プロセスを使用して形成されてもよい。このようなプロセスでは、製造される太陽電池の裏側全体にわたって、レーザスキャナがパルスレーザビームを制御可能に走査してもよい。パルスレーザビームは接着層304及び誘電体層108を貫通する複数の接触開口部を形成してもよく、複数の接触開口部は箔306から融解した金属によって充填されてもよい。 As shown in FIG. 6, a further step may then be performed on the back side of the silicon thin film 302. These steps include forming metal contacts 604 and 606 in the contact hole for electrical connection to the corresponding P + region 104 and N + region 106, respectively. The first set of the metal contacts 604 may be formed from the metal foil 304 to the P + region 104, and the second set of the metal contacts 606 may be formed from the metal foil 304 to the N + region 106. In one embodiment, metal contacts 604 and 606 may be formed using a laser-based contact forming process. In such a process, the laser scanner may controlally scan the pulsed laser beam over the entire backside of the manufactured solar cell. The pulsed laser beam may form a plurality of contact openings penetrating the adhesive layer 304 and the dielectric layer 108, and the plurality of contact openings may be filled with a metal melted from the foil 306.

更に、金属接点604の第1のセットを金属接点606の第2のセットから電気的に分離するために、指部分離608のパターンが箔エリア上に形成されてもよい。指部分離608は、複数の接点に至る箔の指部が互いに嵌合するように構成されてもよい。 Further, a pattern of finger separation 608 may be formed on the foil area in order to electrically separate the first set of metal contacts 604 from the second set of metal contacts 606. The finger separation 608 may be configured such that the fingers of the foil leading to the plurality of contacts fit together.

図7は、本発明の実施形態による薄いシリコン太陽電池を製造する例示的方法700のフロー図である。図7の例示的方法700では、最初にブロック702で複数のエミッタ領域がシリコンウェハ上に形成されてもよい。シリコンウェハは数百マイクロメートルより大きいか等しい厚みであってもよく、厚いハンドルウェハと称されてもよい。複数のエミッタ領域は、Pドープ領域及びNドープ領域の両方を含み、図1に示されるようにウェハの裏側に形成されてもよい。 FIG. 7 is a flow chart of an exemplary method 700 for manufacturing a thin silicon solar cell according to an embodiment of the present invention. In the exemplary method 700 of FIG. 7, a plurality of emitter regions may first be formed on the silicon wafer in the block 702. Silicon wafers may have a thickness greater than or equal to several hundred micrometers and may be referred to as thick handle wafers. The plurality of emitter regions include both a P-doped region and an N-doped region, and may be formed on the back side of the wafer as shown in FIG.

ブロック704では、薄いシリコン薄膜がシリコンウェハから劈開されてもよい。例えば、シリコン薄膜は10マイクロメートル〜100マイクロメートルの厚みであってもよい。一実装では、図2に関連して前述したように、イオン注入及び剥離を使用した劈開が実施されてもよい。代替的に、ウェハの表側から犠牲層を剥離又はエッチングすることによって劈開が実施されてもよい。 At block 704, a thin silicon thin film may be cleaved from the silicon wafer. For example, the silicon thin film may have a thickness of 10 micrometers to 100 micrometers. In one implementation, cleavage using ion implantation and delamination may be performed as described above in connection with FIG. Alternatively, cleavage may be performed by stripping or etching the sacrificial layer from the front side of the wafer.

ブロック706では、図3に関連して上述したように、金属箔がシリコン薄膜に接着されてもよい。具体的には、金属箔がシリコン薄膜の裏側表面に接着されてもよい。金属箔は、薄いシリコン薄膜に対する機械的な支持を提供するために、50マイクロメートル〜1ミリメートルの厚みであってもよい。箔を薄膜のキャリアとして使用することを容易にするために、シリコン薄膜の外辺部を越えて金属箔の拡張領域(処理領域)を延ばしてもよい。一実装では、金属箔とシリコン薄膜との間の複数の接点を加熱するためにレーザを使用することによって、接着が実現されてもよい。別の実装では、金属箔にコーティングされた薄い接着層を使用して、接着が実現されてもよい。 In block 706, the metal leaf may be adhered to the silicon thin film as described above in connection with FIG. Specifically, the metal foil may be adhered to the back surface of the silicon thin film. The metal leaf may be 50 micrometers to 1 millimeter thick to provide mechanical support for the thin silicon thin film. In order to facilitate the use of the foil as a carrier of the thin film, the extended region (processed region) of the metal foil may be extended beyond the outer edge of the silicon thin film. In one implementation, adhesion may be achieved by using a laser to heat multiple contacts between the metal foil and the silicon thin film. In another implementation, adhesion may be achieved using a thin adhesive layer coated on the metal leaf.

シリコン薄膜の表側表面を処理することができるように、ブロック708で、金属箔がシリコン薄膜を処理するための一体型キャリアとして使用されてもよい。表側表面の処理は、図4に関連して上述したように、テクスチャ加工及び不動態化を含んでもよい。表面のテクスチャ加工及び不動態化は、例えば、表側表面をエッチング及び不動態化するために薄膜を薬液に浸漬することによって実現されてもよい。引き続いて、金属箔援用シリコン薄膜の表側が、図5に関連して上述したように、ガラスラミネーション法を使用して処理されてもよい。表側の処理に引き続いて、金属箔の拡張領域(処理領域)がトリミングされてもよい。 In the block 708, the metal leaf may be used as an integral carrier for treating the silicon thin film so that the front surface of the silicon thin film can be treated. Treatment of the front surface may include texturing and passivation, as described above in connection with FIG. Surface texture processing and passivation may be achieved, for example, by immersing the thin film in a chemical solution to etch and passivate the front surface. Subsequently, the front side of the metal leaf-assisted silicon thin film may be treated using the glass lamination method, as described above in connection with FIG. Following the processing on the front side, the extended area (processing area) of the metal leaf may be trimmed.

ブロック710では、複数の接点が金属箔から複数のエミッタ領域まで形成されてもよい。図6に関連して上述したように、形成された複数の接点は、複数のPドープエミッタ領域104に対する接点604の第1のセットと、複数のNドープエミッタ領域106に対する接点606の第2のセットを含んでもよい。更に、接点の第1のセット及び第2のセットを電気で分離するために、指部分離608のパターンが箔上に形成されてもよい。 In block 710, a plurality of contacts may be formed from the metal leaf to a plurality of emitter regions. As described above in connection with FIG. 6, the plurality of contacts formed are the first set of contacts 604 for the plurality of P-doped emitter regions 104 and the second set of contacts 606 for the plurality of N-doped emitter regions 106. It may include a set. Further, in order to electrically separate the first set and the second set of contacts, a pattern of finger separation 608 may be formed on the foil.

代替実施形態では、連続した金属箔層を裏側に接着する工程と、それに引き続いて、箔が裏側に取り付けられる間に指部分離パターンを作製する工程と、に代わって、金属箔がシリコン薄膜の裏側に塗布される前に、指部分離パターンが金属箔内に予め形成されてもよい。図8は、本発明の実施形態による、そのように予めパターン成形された金属箔を使用する薄いシリコン太陽電池を製造する代替方法800のフロー図である。 In an alternative embodiment, the metal leaf is made of a silicon thin film, instead of a step of adhering a continuous metal leaf layer to the back side, followed by a step of creating a finger separation pattern while the foil is attached to the back side. A finger separation pattern may be preformed in the metal leaf before being applied to the back side. FIG. 8 is a flow chart of an alternative method 800 for manufacturing a thin silicon solar cell using such a pre-patterned metal leaf according to an embodiment of the present invention.

図8に示されるように、ブロック704で薄いシリコン薄膜がウェハから劈開された後、806では、予めパターン成形された金属箔がシリコン薄膜の裏側と副基板との間に挟まれてもよい。金属箔のパターン成形は、P型接点とN型接点との間の指部分離を実現する。副基板は、レーザ光線がそれを通って伝送され得るように、透明であってもよい。副基板は、例えば、ポリエチレンテレフタレート(PET)層又はフルオロポリマ層などの剛性ポリマ層であってもよい。その後、ブロック807では、複数の接点が金属箔と複数のエミッタ領域との間に形成されてもよい。複数の接点の形成は、例えば、複数の接触開口部を作製し、複数の接点箔から融解した金属をそれらの複数の開口部内に流し込むために、副基板を通って伝送されるパルスレーザを使用して実現されてもよい。その後、ブロック708では、図7に関連して上述したように、表側表面が処理されてもよい。表側の処理に引き続いて、金属箔の拡張領域(処理領域)がトリミングされてもよい。 As shown in FIG. 8, after the thin silicon thin film is cleaved from the wafer at the block 704, in 806, a pre-patterned metal leaf may be sandwiched between the back side of the silicon thin film and the secondary substrate. The pattern forming of the metal leaf realizes finger separation between the P-type contact and the N-type contact. The sub-board may be transparent so that the laser beam can be transmitted through it. The sub-board may be, for example, a rigid polymer layer such as a polyethylene terephthalate (PET) layer or a fluoropolymer layer. After that, in the block 807, a plurality of contacts may be formed between the metal foil and the plurality of emitter regions. The formation of multiple contacts uses, for example, a pulsed laser transmitted through a secondary substrate to create multiple contact openings and allow metal melted from multiple contact foils to flow into those multiple openings. It may be realized by Then, in block 708, the front surface may be treated as described above in connection with FIG. Following the processing on the front side, the extended area (processing area) of the metal leaf may be trimmed.

図9は、図8の方法800によって製造された、製造済みの薄いシリコン太陽電池の断面図である。図9に示されるように、予めパターン成形された指部分離908が設けられた金属箔306は、副基板902とシリコン薄膜302の裏側との間に挟まれる。更に、P型接点904及びN型接点906が示されている。上述したように、これらの接点は、透過的な副基板902を通ってパルスレーザを伝送することによって形成されてもよい。 FIG. 9 is a cross-sectional view of a manufactured thin silicon solar cell manufactured by the method 800 of FIG. As shown in FIG. 9, the metal leaf 306 provided with the pre-patterned finger separation 908 is sandwiched between the sub-board 902 and the back side of the silicon thin film 302. Further, a P-type contact 904 and an N-type contact 906 are shown. As mentioned above, these contacts may be formed by transmitting a pulsed laser through a transmissive sub-board 902.

図10は、本発明の実施形態による、シリコン薄膜の裏側を覆う金属箔の平面図である。図10の図は、薄膜の裏側を覆う箔の部分1004と、薄膜の外辺部1002を越えて延びる箔の拡張領域1006と、を示す。拡張領域1006は、外辺部の1又は複数の辺を越えて延びていてもよく、外辺部の全ての辺を越えて延びている必要はないことに留意されたい。 FIG. 10 is a plan view of a metal foil covering the back side of the silicon thin film according to the embodiment of the present invention. The figure of FIG. 10 shows a foil portion 1004 that covers the back side of the thin film and an extended region 1006 of the foil that extends beyond the outer edge portion 1002 of the thin film. It should be noted that the extension region 1006 may extend beyond one or more sides of the outer edge and need not extend beyond all sides of the outer edge.

図11は、本発明の別の実施形態による、薄いシリコン太陽電池を製造する方法1100のフロー図である。図11の例示的方法1100では、ブロック1102で、犠牲層がシリコン基板上に形成されてもよい。 FIG. 11 is a flow chart of a method 1100 for manufacturing a thin silicon solar cell according to another embodiment of the present invention. In the exemplary method 1100 of FIG. 11, at block 1102, a sacrificial layer may be formed on a silicon substrate.

犠牲層は、バイアスがかかったHF溶液内で形成されるものなどの多孔質シリコンから構成されてもよい。代替的に、犠牲層は、例えばゲルマニウムドーピング及び/又は炭素ドーピングを有するシリコンであってもよく、これらのいずれもエピタキシャル成長又は化学気相成長(CVD)プロセスによって形成され得る。犠牲層は、約700マイクロメートルのオーダーの薄いものであってもよいが、本明細書に記載する機能を実施するために特定の実施形態に所望されるように、僅かに又は有意により厚い又は薄いものであってもよい。例えば、ある実施形態では、犠牲層は、10マイクロメートルの薄いものであってもよい。ある場合には、より薄い厚みも使用されてもよい。 The sacrificial layer may be composed of porous silicon, such as those formed in a biased HF solution. Alternatively, the sacrificial layer may be, for example, silicon with germanium doping and / or carbon doping, both of which can be formed by an epitaxial growth or chemical vapor deposition (CVD) process. The sacrificial layer may be as thin as about 700 micrometers, but may be slightly or significantly thicker, as desired in certain embodiments to perform the functions described herein. It may be thin. For example, in some embodiments, the sacrificial layer may be as thin as 10 micrometers. In some cases, thinner thicknesses may also be used.

その後、ブロック1104では、シリコンのエピタキシャル層が犠牲層上に成長してもよい。ブロック1106では複数のエミッタ領域がエピタキシャル層内に形成されてもよく、ブロック1108では誘電体層が複数のエミッタ領域上に形成されてもよい。 Then, in block 1104, an epitaxial layer of silicon may grow on the sacrificial layer. In block 1106, a plurality of emitter regions may be formed in the epitaxial layer, and in block 1108, a dielectric layer may be formed on the plurality of emitter regions.

その後、ブロック1110では、金属箔が複数のエミッタ領域上に接着されてもよい。引き続いて、ブロック1112では、エピタキシャルリフトオフが選択湿式エッチング又はさもなければ犠牲層の除去によって実施されてもよい。リフトオフの後、エピタキシャル層は太陽電池のシリコン薄膜となる。プロセスのこの時点における構造体の断面図は、図3に示された図に対応している。本明細書で開示されているように、金属箔は、構造的支持及び一体型キャリア機能をシリコン薄膜に提供する。 Then, in block 1110, the metal leaf may be adhered on the plurality of emitter regions. Subsequently, at block 1112, epitaxial lift-off may be performed by selective wet etching or otherwise sacrificial layer removal. After lift-off, the epitaxial layer becomes a silicon thin film of the solar cell. The cross-sectional view of the structure at this point in the process corresponds to the view shown in FIG. As disclosed herein, metal leafs provide structural support and integrated carrier functionality to silicon thin films.

引き続いて、ブロック708では、表側表面が処理されてもよい。その後、ブロック710では、金属箔と複数のエミッタ領域との間に複数の接点が形成されてもよい。すなわち、ブロック1110でのエピタキシャルリフトオフの後、図4〜図6に関連して上述したように、処理が続けられてもよい。 Subsequently, in block 708, the front surface may be treated. After that, in the block 710, a plurality of contacts may be formed between the metal foil and the plurality of emitter regions. That is, after the epitaxial lift-off at block 1110, the process may be continued as described above in connection with FIGS. 4-6.

ここまで、金属箔を使用して薄いシリコン太陽電池を形成するための技法を開示した。有利なことに、金属箔は、それなしでは脆弱なシリコン薄膜を処理するための組込みキャリアとして、この薄膜の表側の処理中に使用されてもよい。引き続いて、金属箔は、P型エミッタの接点及びN型エミッタの接点及び金属指部を薄膜の裏側に形成するために再利用されてもよい。 So far, we have disclosed techniques for forming thin silicon solar cells using metal foil. Advantageously, the metal leaf may be used during the processing of the front side of the thin film as an embedded carrier for processing the otherwise fragile silicon thin film. Subsequently, the metal leaf may be reused to form the contacts of the P-emitter and the contacts of the N-emitter and the metal fingers on the back side of the thin film.

本発明の具体的な実施形態を提供したが、これらの実施形態は説明を目的としたものであり、限定的なものでないことは理解されよう。多くの更なる実施形態が、本開示を読む当業者には明らかとなろう。
[項目1]
太陽電池を製造する方法であって、
シリコン薄膜の裏側がP型ドープ領域及びN型ドープ領域を含む、前記シリコン薄膜をシリコン基板から劈開する工程と、
前記シリコン薄膜の前記裏側に金属箔を取り付ける工程と
を備える、方法。
[項目2]
前記金属箔の拡張領域が前記シリコン薄膜の外辺部を越えて延び、
前記金属箔を、前記シリコン薄膜を処理するための一体型キャリアとして使用する工程を更に備える、項目1に記載の方法。
[項目3]
前記金属箔と前記P型ドープ領域との間に接点の第1のセットを形成する工程と、
前記金属箔と前記N型ドープ領域との間に接点の第2のセットを形成する工程と、
を更に備える、項目1に記載の方法。
[項目4]
複数の前記接点がパルスレーザビームを使用して形成される、項目3に記載の方法。
[項目5]
前記金属箔内に指部分離パターンを形成する工程を更に備える、項目1に記載の方法。
[項目6]
前記裏側への取り付けの前に、前記指部分離パターンが前記金属箔内に予め形成される、項目5に記載の方法。
[項目7]
前記裏側への取り付けの前に前記金属箔を副基板に取り付ける工程を更に備え、
前記副基板は、レーザ光線に対して透過的である、項目6に記載の方法。
[項目8]
前記金属箔が接着層を使用して前記裏側に取り付けられる、項目1に記載の方法。
[項目9]
前記金属箔と前記シリコン基板の前記裏側との間の接触点のアレイにおいて前記金属箔が前記裏側に取り付けられる、項目1に記載の方法。
[項目9]
前記接触点が前記金属箔の点融解によって形成される、項目8に記載の方法。
[項目10]
前記金属箔がアルミニウムを含む、項目1に記載の方法。
[項目11]
前記金属箔を、前記シリコン薄膜を処理するためのキャリアとして使用しながら、前記シリコン薄膜の表側をテクスチャ加工及び不動態化する工程と、
前記シリコン薄膜の前記表側を封入する工程と、
を更に備える、項目1に記載の方法。
[項目12]
シリコン薄膜と、
前記シリコン薄膜の裏側のP型ドープ領域及びN型ドープ領域と、
前記シリコン薄膜の前記裏側に接着された金属箔と、
前記金属箔と前記P型ドープ領域との間の接点の第1のセットと、
前記金属箔と前記N型ドープ領域との間の接点の第2のセットと、
を備える、太陽電池。
[項目13]
前記シリコン薄膜が10〜100マイクロメートルの範囲内の厚みを有する、項目12に記載の太陽電池。
[項目14]
前記シリコン薄膜の前記裏側の前記金属箔と前記P型ドープ領域及び前記N型ドープ領域との間の接着層を更に備え、複数の前記接点が前記接着層内の複数の開口部を通過する、項目12に記載の太陽電池。
[項目15]
前記シリコン薄膜の前記裏側の前記金属箔と前記P型ドープ領域及び前記N型ドープ領域との間の複数の接触点を更に備える、項目12に記載の太陽電池。
[項目16]
前記シリコン薄膜の表側における、テクスチャ加工及び不動態化された表面と、
前記シリコン薄膜の前記表側を覆うガラス層と、
前記シリコン薄膜の前記表側と前記ガラス層との間の封入材料と、
を更に備える、項目12に記載の太陽電池。
[項目17]
前記金属箔がアルミニウムを含む、項目12に記載の太陽電池。
[項目18]
前記金属箔がAl−x%Siを含み、x%は0パーセント〜3パーセントの範囲内である、項目17に記載の太陽電池。
[項目19]
シリコン基板の裏側がP型ドープ領域及びN型ドープ領域を含む、金属箔を前記シリコン基板の前記裏側に接着する工程と、
シリコン薄膜を前記シリコン基板の前記裏側から分離する工程と、
前記シリコン薄膜の表側の処理中に前記シリコン薄膜を処理するための組込みキャリアとして前記金属箔を使用する工程と、
を備える、太陽電池の製造方法。
[項目20]
前記シリコン薄膜を分離する工程がエピタキシャルリフトオフによって実施される、項目19に記載の方法。
[項目21]
前記金属箔と前記P型ドープ領域との間に接点の第1のセットを形成する工程と、
前記金属箔と前記N型ドープ領域との間に接点の第2のセットを形成する工程と、
金属接点の前記第1のセットと金属接点の前記第2のセットとの間に複数の分離を形成する工程と、
を更に備える、項目19に記載の方法。
Although specific embodiments of the present invention have been provided, it will be appreciated that these embodiments are for illustration purposes only and are not limiting. Many further embodiments will be apparent to those skilled in the art reading this disclosure.
[Item 1]
A method of manufacturing solar cells
A step of cleaving the silicon thin film from a silicon substrate, wherein the back side of the silicon thin film contains a P-type doped region and an N-type doped region.
A method comprising a step of attaching a metal foil to the back side of the silicon thin film.
[Item 2]
The extended region of the metal leaf extends beyond the outer edge of the silicon thin film.
The method according to item 1, further comprising a step of using the metal leaf as an integrated carrier for treating the silicon thin film.
[Item 3]
A step of forming a first set of contacts between the metal foil and the P-type doped region.
A step of forming a second set of contacts between the metal foil and the N-type doped region.
The method according to item 1, further comprising.
[Item 4]
The method of item 3, wherein the plurality of contacts are formed using a pulsed laser beam.
[Item 5]
The method according to item 1, further comprising a step of forming a finger separation pattern in the metal foil.
[Item 6]
The method of item 5, wherein the finger separation pattern is preformed in the metal leaf prior to attachment to the back side.
[Item 7]
A step of attaching the metal foil to the sub-board before the attachment to the back side is further provided.
The method according to item 6, wherein the sub-board is transparent to a laser beam.
[Item 8]
The method of item 1, wherein the metal leaf is attached to the back side using an adhesive layer.
[Item 9]
The method of item 1, wherein the metal foil is attached to the back side in an array of contact points between the metal foil and the back side of the silicon substrate.
[Item 9]
8. The method of item 8, wherein the contact points are formed by point melting of the metal leaf.
[Item 10]
The method according to item 1, wherein the metal foil contains aluminum.
[Item 11]
A step of texture processing and passivating the front side of the silicon thin film while using the metal foil as a carrier for treating the silicon thin film.
The step of encapsulating the front side of the silicon thin film and
The method according to item 1, further comprising.
[Item 12]
Silicon thin film and
The P-type and N-type doped regions on the back side of the silicon thin film,
The metal foil adhered to the back side of the silicon thin film and
A first set of contacts between the metal foil and the P-type doped region,
A second set of contacts between the metal foil and the N-type doped region,
With a solar cell.
[Item 13]
The solar cell according to item 12, wherein the silicon thin film has a thickness in the range of 10 to 100 micrometers.
[Item 14]
An adhesive layer is further provided between the metal foil on the back side of the silicon thin film and the P-type doped region and the N-type doped region, and the plurality of contacts pass through a plurality of openings in the adhesive layer. Item 12. The solar cell according to item 12.
[Item 15]
The solar cell according to item 12, further comprising a plurality of contact points between the metal foil on the back side of the silicon thin film and the P-type doped region and the N-type doped region.
[Item 16]
The textured and passivated surface on the front side of the silicon thin film and
A glass layer covering the front side of the silicon thin film and
The encapsulating material between the front side of the silicon thin film and the glass layer,
The solar cell according to item 12, further comprising.
[Item 17]
The solar cell according to item 12, wherein the metal foil contains aluminum.
[Item 18]
The solar cell according to item 17, wherein the metal foil contains Al-x% Si, where x% is in the range of 0 percent to 3 percent.
[Item 19]
A step of adhering a metal foil to the back side of the silicon substrate, wherein the back side of the silicon substrate contains a P-type doping region and an N-type doping region.
A step of separating the silicon thin film from the back side of the silicon substrate, and
A step of using the metal leaf as an embedded carrier for treating the silicon thin film during the treatment of the front side of the silicon thin film, and
A method of manufacturing a solar cell.
[Item 20]
19. The method of item 19, wherein the step of separating the silicon thin film is performed by epitaxial lift-off.
[Item 21]
A step of forming a first set of contacts between the metal foil and the P-type doped region.
A step of forming a second set of contacts between the metal foil and the N-type doped region.
A step of forming a plurality of separations between the first set of metal contacts and the second set of metal contacts.
The method according to item 19, further comprising.

Claims (10)

通常の動作中に太陽に面する表側と、前記表側と反対側の裏側とを有する基板と、A substrate having a front side facing the sun during normal operation and a back side opposite to the front side.
前記基板の前記裏側上のP型ドープ領域及びN型ドープ領域と、The P-type and N-type doped regions on the back side of the substrate,
前記P型ドープ領域及び前記N型ドープ領域上の第1の誘電体と、With the P-type doped region and the first dielectric on the N-type doped region,
前記第1の誘電体を通って前記P型ドープ領域に電気的に接続される第1の接点と、前記第1の誘電体を通って前記N型ドープ領域に電気的に接続される第2の接点とを有する金属箔であって、前記金属箔は、前記金属箔と前記基板の前記裏側との間の接触点のアレイによって、前記基板の前記裏側に接着され、前記接触点は、前記金属箔の融解した金属部分を含む、金属箔とA first contact that is electrically connected to the P-type dope region through the first dielectric and a second contact that is electrically connected to the N-type dope region through the first dielectric. The metal foil is a metal foil having the contact points of the above, and the metal foil is adhered to the back side of the substrate by an array of contact points between the metal foil and the back side of the substrate, and the contact points are the contact points. With metal foil, including the molten metal part of the metal foil
を備え、With
前記金属箔の一部は、前記基板の外辺部を越えて延びる、A portion of the metal foil extends beyond the outer edge of the substrate.
太陽電池。Solar cell.
前記金属箔と前記第1の誘電体との間に配置される接着層をさらに備え、前記金属箔は、前記接着層を貫通する接触開口部によって、前記基板の前記裏側に接着される、請求項1に記載の太陽電池。An adhesive layer is further provided between the metal foil and the first dielectric, and the metal foil is adhered to the back side of the substrate by a contact opening penetrating the adhesive layer. Item 1. The solar cell according to item 1. 前記接着層は、エポキシ、シリコン、及びエチレン酢酸ビニルからなる群から選択される材料を含む、請求項2に記載の太陽電池。The solar cell according to claim 2, wherein the adhesive layer contains a material selected from the group consisting of epoxy, silicon, and ethylene vinyl acetate. 前記基板の前記表側上の封入材料と、The encapsulating material on the front side of the substrate and
前記封入材料上の透明層とWith the transparent layer on the encapsulation material
をさらに備える、請求項1から3のいずれか一項に記載の太陽電池。The solar cell according to any one of claims 1 to 3, further comprising.
前記透明層は、ガラスを含む、請求項4に記載の太陽電池。The solar cell according to claim 4, wherein the transparent layer contains glass. 前記基板の前記表側は、テクスチャ加工される、請求項1から5のいずれか一項に記載の太陽電池。The solar cell according to any one of claims 1 to 5, wherein the front side of the substrate is textured. 前記基板は、シリコンを含む、請求項1から6のいずれか一項に記載の太陽電池。The solar cell according to any one of claims 1 to 6, wherein the substrate contains silicon. 前記金属箔は、アルミニウムを含む、請求項1から7のいずれか一項に記載の太陽電池。The solar cell according to any one of claims 1 to 7, wherein the metal foil contains aluminum. 前記金属箔は、Al−x%Siを含み、x%は0パーセント〜3パーセントの範囲内である、請求項1から8のいずれか一項に記載の太陽電池。The solar cell according to any one of claims 1 to 8, wherein the metal foil contains Al-x% Si, and x% is in the range of 0% to 3%. 前記第1の接点と前記第2の接点との間に指部分離パターンをさらに備え、前記指部分離パターンは、前記第1の接点を前記第2の接点から電気的に分離する、請求項1から9のいずれか一項に記載の太陽電池。A claim that further comprises a finger separation pattern between the first contact and the second contact, the finger separation pattern electrically separating the first contact from the second contact. The solar cell according to any one of 1 to 9.
JP2019198149A 2012-12-21 2019-10-31 Solar cell Active JP6831964B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/725,580 2012-12-21
US13/725,580 US9812592B2 (en) 2012-12-21 2012-12-21 Metal-foil-assisted fabrication of thin-silicon solar cell

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2018010846A Division JP6612906B2 (en) 2012-12-21 2018-01-25 Solar cell

Publications (2)

Publication Number Publication Date
JP2020031228A JP2020031228A (en) 2020-02-27
JP6831964B2 true JP6831964B2 (en) 2021-02-24

Family

ID=50973257

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2015549363A Active JP6283037B2 (en) 2012-12-21 2013-06-20 Metal foil-assisted manufacturing of thin silicon solar cells
JP2018010846A Active JP6612906B2 (en) 2012-12-21 2018-01-25 Solar cell
JP2019198149A Active JP6831964B2 (en) 2012-12-21 2019-10-31 Solar cell

Family Applications Before (2)

Application Number Title Priority Date Filing Date
JP2015549363A Active JP6283037B2 (en) 2012-12-21 2013-06-20 Metal foil-assisted manufacturing of thin silicon solar cells
JP2018010846A Active JP6612906B2 (en) 2012-12-21 2018-01-25 Solar cell

Country Status (8)

Country Link
US (3) US9812592B2 (en)
JP (3) JP6283037B2 (en)
KR (3) KR102333503B1 (en)
CN (2) CN110047946B (en)
DE (1) DE112013006103T5 (en)
MY (1) MY181191A (en)
TW (1) TWI601303B (en)
WO (1) WO2014098988A1 (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9812592B2 (en) * 2012-12-21 2017-11-07 Sunpower Corporation Metal-foil-assisted fabrication of thin-silicon solar cell
US9666739B2 (en) * 2013-06-28 2017-05-30 Sunpower Corporation Photovoltaic cell and laminate metallization
US9257575B1 (en) * 2014-09-18 2016-02-09 Sunpower Corporation Foil trim approaches for foil-based metallization of solar cells
US20160163901A1 (en) * 2014-12-08 2016-06-09 Benjamin Ian Hsia Laser stop layer for foil-based metallization of solar cells
US9461192B2 (en) * 2014-12-16 2016-10-04 Sunpower Corporation Thick damage buffer for foil-based metallization of solar cells
US9520507B2 (en) * 2014-12-22 2016-12-13 Sunpower Corporation Solar cells with improved lifetime, passivation and/or efficiency
US9997651B2 (en) * 2015-02-19 2018-06-12 Sunpower Corporation Damage buffer for solar cell metallization
US10396235B2 (en) * 2015-10-16 2019-08-27 Sunpower Corporation Indentation approaches for foil-based metallization of solar cells
US20170162723A1 (en) * 2015-12-03 2017-06-08 David Fredric Joel Kavulak Spot-welded and adhesive-bonded interconnects for solar cells
KR101910642B1 (en) * 2016-01-28 2018-12-28 엘지전자 주식회사 Solar cell and manufacturing method thereof
US11424373B2 (en) * 2016-04-01 2022-08-23 Sunpower Corporation Thermocompression bonding approaches for foil-based metallization of non-metal surfaces of solar cells
DE102016107802A1 (en) * 2016-04-27 2017-11-02 Universität Stuttgart Process for the preparation of back-contacted solar cells made of crystalline silicon
US10290763B2 (en) 2016-05-13 2019-05-14 Sunpower Corporation Roll-to-roll metallization of solar cells
DE102016115355A1 (en) * 2016-08-18 2018-02-22 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. A method of adhering a metallic foil to a surface of a semiconductor substrate and a semiconductor device with a metallic foil
US9670061B1 (en) 2016-09-12 2017-06-06 International Business Machines Corporation Flexible electronics for wearable healthcare sensors
EP3525244A1 (en) 2018-02-08 2019-08-14 Université de Strasbourg Silicon layer on silicon-rich aluminum layer
KR102498522B1 (en) * 2018-03-15 2023-02-10 상라오 징코 솔라 테크놀러지 디벨롭먼트 컴퍼니, 리미티드 Compound semiconductor solar cell and manufacturing method thereof
CN112534589B (en) * 2018-04-06 2024-10-29 迈可晟太阳能有限公司 Local patterning and metallization of semiconductor structures using laser beams
US20210193852A1 (en) * 2019-12-20 2021-06-24 Sunpower Corporation Subtractive metallization for solar cells

Family Cites Families (95)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4058418A (en) 1974-04-01 1977-11-15 Solarex Corporation Fabrication of thin film solar cells utilizing epitaxial deposition onto a liquid surface to obtain lateral growth
US3993533A (en) 1975-04-09 1976-11-23 Carnegie-Mellon University Method for making semiconductors for solar cells
US4321299A (en) 1977-09-15 1982-03-23 Nasa Strong thin membrane structure for use as solar sail comprising substrate with reflective coating on one surface and an infra red emissivity increasing coating on the other surface
US4318938A (en) 1979-05-29 1982-03-09 The University Of Delaware Method for the continuous manufacture of thin film solar cells
DE3036260A1 (en) 1980-09-26 1982-04-29 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt METHOD FOR PRODUCING ELECTRICAL CONTACTS ON A SILICON SOLAR CELL
US4400577A (en) 1981-07-16 1983-08-23 Spear Reginald G Thin solar cells
US4433200A (en) 1981-10-02 1984-02-21 Atlantic Richfield Company Roll formed pan solar module
US4482780A (en) 1982-11-30 1984-11-13 The United States Of America As Represented By The United States Department Of Energy Solar cells with low cost substrates and process of making same
US4461922A (en) 1983-02-14 1984-07-24 Atlantic Richfield Company Solar cell module
US4957601A (en) 1984-09-04 1990-09-18 Texas Instruments Incorporated Method of forming an array of apertures in an aluminum foil
US4917752A (en) 1984-09-04 1990-04-17 Texas Instruments Incorporated Method of forming contacts on semiconductor members
US4581103A (en) 1984-09-04 1986-04-08 Texas Instruments Incorporated Method of etching semiconductor material
US4691076A (en) 1984-09-04 1987-09-01 Texas Instruments Incorporated Solar array with aluminum foil matrix
US4582588A (en) 1984-09-04 1986-04-15 Texas Instruments Incorporated Method of anodizing and sealing aluminum
US4697041A (en) 1985-02-15 1987-09-29 Teijin Limited Integrated solar cells
US4617421A (en) 1985-04-01 1986-10-14 Sovonics Solar Systems Photovoltaic cell having increased active area and method for producing same
US4695674A (en) 1985-08-30 1987-09-22 The Standard Oil Company Preformed, thin-film front contact current collector grid for photovoltaic cells
DE3725269A1 (en) 1987-07-30 1989-02-09 Messerschmitt Boelkow Blohm METHOD FOR ENCODING MICROELECTRONIC SEMICONDUCTOR AND LAYER CIRCUITS
US5091319A (en) 1989-07-31 1992-02-25 Hotchkiss Gregory B Method of affixing silicon spheres to a foil matrix
DE69215176T2 (en) 1991-08-30 1997-03-27 Canon Kk Solar cell and its manufacturing method
US7732243B2 (en) 1995-05-15 2010-06-08 Daniel Luch Substrate structures for integrated series connected photovoltaic arrays and process of manufacture of such arrays
JP2000509909A (en) 1997-02-21 2000-08-02 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Method for selectively metallizing substrates using thermal foil embossing technology
US5951786A (en) 1997-12-19 1999-09-14 Sandia Corporation Laminated photovoltaic modules using back-contact solar cells
JPH11214720A (en) * 1998-01-28 1999-08-06 Canon Inc Manufacturing method of thin film crystal solar cell
EP1051885A1 (en) 1998-02-06 2000-11-15 FLEXcon Company, Inc. Thin film transferable electric components
US6159832A (en) 1998-03-18 2000-12-12 Mayer; Frederick J. Precision laser metallization
AU2233900A (en) 1999-03-23 2000-09-28 Kaneka Corporation Photovoltaic module
JP2001007362A (en) 1999-06-17 2001-01-12 Canon Inc Semiconductor substrate and method for manufacturing solar cell
DE10020412A1 (en) 2000-04-26 2001-11-08 Univ Konstanz Method and appliance for applying metal foil to semiconductor wafer to form contact surface involves applying pressure to foil coated with fine grain paste
AU2002238953B2 (en) 2001-03-19 2007-03-29 Shin-Etsu Chemical Co., Ltd Solar cell and its manufacturing method
US6635307B2 (en) 2001-12-12 2003-10-21 Nanotek Instruments, Inc. Manufacturing method for thin-film solar cells
JP2003246971A (en) 2002-02-25 2003-09-05 Kansai Tlo Kk Method for adhering foil or film, and target for measuring shock wave speed, obtained by the method
US20060166023A1 (en) 2002-09-06 2006-07-27 Dai Nippon Printing Co., Ltd. Backside protective sheet for solar battery module and solar battery module using the same
JP2004103959A (en) 2002-09-11 2004-04-02 Matsushita Electric Ind Co Ltd Solar cell and method of manufacturing the same
WO2004096483A1 (en) 2003-04-25 2004-11-11 Nitto Denko Corporation Method of producing laser-processed product and adhesive sheet, for laser processing used therefor
US20080223429A1 (en) 2004-08-09 2008-09-18 The Australian National University Solar Cell (Sliver) Sub-Module Formation
JP2006066762A (en) * 2004-08-30 2006-03-09 Canon Inc Flexible solar cell module and its construction method
JP4993333B2 (en) * 2004-12-21 2012-08-08 富士機械製造株式会社 Photovoltaic panel manufacturing method
JP2008066316A (en) * 2004-12-27 2008-03-21 Naoetsu Electronics Co Ltd Back junction solar cell and manufacturing method thereof
US7554031B2 (en) * 2005-03-03 2009-06-30 Sunpower Corporation Preventing harmful polarization of solar cells
JP2006310389A (en) * 2005-04-26 2006-11-09 Sharp Corp Manufacturing method of solar cell
US7468485B1 (en) * 2005-08-11 2008-12-23 Sunpower Corporation Back side contact solar cell with doped polysilicon regions
US20070137692A1 (en) 2005-12-16 2007-06-21 Bp Corporation North America Inc. Back-Contact Photovoltaic Cells
WO2007106502A2 (en) 2006-03-13 2007-09-20 Nanogram Corporation Thin silicon or germanium sheets and photovoltaics formed from thin sheets
US7795600B2 (en) * 2006-03-24 2010-09-14 Goldeneye, Inc. Wavelength conversion chip for use with light emitting diodes and method for making same
US7811900B2 (en) * 2006-09-08 2010-10-12 Silicon Genesis Corporation Method and structure for fabricating solar cells using a thick layer transfer process
DE102006044936B4 (en) 2006-09-22 2008-08-07 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Process for the metallization of solar cells and its use
US20080128019A1 (en) 2006-12-01 2008-06-05 Applied Materials, Inc. Method of metallizing a solar cell substrate
US20080216887A1 (en) 2006-12-22 2008-09-11 Advent Solar, Inc. Interconnect Technologies for Back Contact Solar Cells and Modules
JP5048380B2 (en) * 2007-04-09 2012-10-17 信越化学工業株式会社 Method for producing single crystal silicon solar cell
JP2009014791A (en) * 2007-06-29 2009-01-22 Brother Ind Ltd Optical scanning device, image display device, and retinal scanning image display device
US20110017263A1 (en) 2007-09-05 2011-01-27 Solaria Corporation Method and device for fabricating a solar cell using an interface pattern for a packaged design
JP2009088203A (en) * 2007-09-28 2009-04-23 Sanyo Electric Co Ltd SOLAR CELL, SOLAR CELL MODULE, AND SOLAR CELL MANUFACTURING METHOD
JP5252472B2 (en) * 2007-09-28 2013-07-31 シャープ株式会社 Solar cell, method for manufacturing solar cell, method for manufacturing solar cell module, and solar cell module
US20120125256A1 (en) 2007-10-06 2012-05-24 Solexel, Inc. Apparatus and method for repeatedly fabricating thin film semiconductor substrates using a template
JP2009130118A (en) * 2007-11-22 2009-06-11 Sharp Corp Semiconductor device, method for manufacturing the same, and solar cell
JP2009130116A (en) * 2007-11-22 2009-06-11 Sharp Corp Inter-element wiring member, photoelectric conversion element, photoelectric conversion element connection body using the same, and photoelectric conversion module
JP4870100B2 (en) 2008-01-30 2012-02-08 日清紡ホールディングス株式会社 Tape-like body arrangement device
US8481845B2 (en) * 2008-02-05 2013-07-09 Gtat Corporation Method to form a photovoltaic cell comprising a thin lamina
DE102008062591A1 (en) 2008-08-08 2010-03-04 Deutsche Cell Gmbh Semiconductor device
JP5152858B2 (en) * 2008-08-22 2013-02-27 シャープ株式会社 Solar cell module and manufacturing method thereof
US20100051085A1 (en) 2008-08-27 2010-03-04 Weidman Timothy W Back contact solar cell modules
JP5380546B2 (en) 2008-11-26 2014-01-08 マイクロリンク デバイセズ, インク. Solar cell with backside via in contact with emitter layer
US8242354B2 (en) * 2008-12-04 2012-08-14 Sunpower Corporation Backside contact solar cell with formed polysilicon doped regions
CN102318078B (en) * 2008-12-10 2013-10-30 应用材料公司 Enhanced Inspection System for Screen Printing Pattern Registration
TW201036183A (en) 2008-12-16 2010-10-01 Solopower Inc Thin film photovoltaic module manufacturing methods and structures
JP5731400B2 (en) 2009-01-14 2015-06-10 コーニンクレッカ フィリップス エヌ ヴェ Method for depositing at least one electrically conductive film on a substrate
CN102428565A (en) * 2009-03-26 2012-04-25 Bp北美公司 Apparatus and method for solar cells with laser fired contacts in thermally diffused doped regions
US20100294349A1 (en) * 2009-05-20 2010-11-25 Uma Srinivasan Back contact solar cells with effective and efficient designs and corresponding patterning processes
US8247243B2 (en) * 2009-05-22 2012-08-21 Nanosolar, Inc. Solar cell interconnection
DE102009022378B4 (en) 2009-05-23 2013-02-07 Solarion Ag Photovoltaik Process for the preparation of semi-transparent flexible thin-film solar cells and semi-transparent flexible thin-film solar cell
JP2011003724A (en) * 2009-06-18 2011-01-06 Sanyo Electric Co Ltd Solar cell module
DE102010004112A1 (en) * 2009-06-29 2010-12-30 Bosch Solar Energy Ag Method for producing a foil-type electrical connector for solar cells, connecting element produced in this way and method for electrically connecting at least two solar cells to a solar module
JP2011054831A (en) 2009-09-03 2011-03-17 Sharp Corp Back contact type solar cell, solar cell string, and solar cell module
KR101070071B1 (en) * 2009-09-16 2011-10-04 삼성전기주식회사 Method for manufacturing back surface electrode type of solar cell
TW201210058A (en) * 2010-05-12 2012-03-01 Applied Materials Inc Method of manufacturing crystalline silicon solar cells using epitaxial deposition
WO2012012806A2 (en) 2010-07-23 2012-01-26 Gigasi Solar, Inc. Thin film solar cells and other devices, systems and methods of fabricating same, and products produced by processes thereof
EP2601687A4 (en) * 2010-08-05 2018-03-07 Solexel, Inc. Backplane reinforcement and interconnects for solar cells
US8883552B2 (en) * 2010-08-11 2014-11-11 Crystal Solar Inc. MWT architecture for thin SI solar cells
US20120118369A1 (en) * 2010-10-15 2012-05-17 Justin Hedtke Solar cell architecture having a plurality of vias with shaped foil via interior
KR20120040016A (en) 2010-10-18 2012-04-26 엘지전자 주식회사 Substrate for solar cell and solar cell
KR20120050816A (en) * 2010-11-11 2012-05-21 엘지전자 주식회사 Photovoltaic module
JP5879754B2 (en) * 2011-06-06 2016-03-08 凸版印刷株式会社 Circuit board manufacturing method
TWI497737B (en) * 2010-12-02 2015-08-21 Au Optronics Corp Solar cell and method of manufacturing same
US8586403B2 (en) * 2011-02-15 2013-11-19 Sunpower Corporation Process and structures for fabrication of solar cells with laser ablation steps to form contact holes
WO2012135052A1 (en) 2011-03-25 2012-10-04 Kevin Michael Coakley Foil-based interconnect for rear-contact solar cells
US8486746B2 (en) * 2011-03-29 2013-07-16 Sunpower Corporation Thin silicon solar cell and method of manufacture
US20130137244A1 (en) 2011-05-26 2013-05-30 Solexel, Inc. Method and apparatus for reconditioning a carrier wafer for reuse
CN102832263B (en) * 2011-06-15 2015-01-14 茂迪股份有限公司 Solar cell with back electric field structure and manufacturing method thereof
US20130160825A1 (en) 2011-12-22 2013-06-27 E I Du Pont De Nemours And Company Back contact photovoltaic module with glass back-sheet
WO2013106225A1 (en) 2012-01-12 2013-07-18 Applied Materials, Inc. Methods of manufacturing solar cell devices
US8859322B2 (en) 2012-03-19 2014-10-14 Rec Solar Pte. Ltd. Cell and module processing of semiconductor wafers for back-contacted solar photovoltaic module
CN202608172U (en) * 2012-03-27 2012-12-19 浙江华正新材料股份有限公司 Rear panel applied to back-surface field passivation type solar cell
US9812592B2 (en) 2012-12-21 2017-11-07 Sunpower Corporation Metal-foil-assisted fabrication of thin-silicon solar cell
US9040409B2 (en) 2013-03-15 2015-05-26 Applied Materials, Inc. Methods of forming solar cells and solar cell modules

Also Published As

Publication number Publication date
KR20200012029A (en) 2020-02-04
US20180033894A1 (en) 2018-02-01
JP6612906B2 (en) 2019-11-27
TWI601303B (en) 2017-10-01
US9812592B2 (en) 2017-11-07
WO2014098988A1 (en) 2014-06-26
JP2020031228A (en) 2020-02-27
MY181191A (en) 2020-12-21
TW201427059A (en) 2014-07-01
CN110047946B (en) 2023-05-16
KR20150097648A (en) 2015-08-26
US20140174519A1 (en) 2014-06-26
KR20200119896A (en) 2020-10-20
JP6283037B2 (en) 2018-02-21
JP2018082212A (en) 2018-05-24
DE112013006103T5 (en) 2015-09-17
CN110047946A (en) 2019-07-23
JP2016502283A (en) 2016-01-21
CN104981910A (en) 2015-10-14
US12080811B2 (en) 2024-09-03
CN104981910B (en) 2019-01-18
KR102333503B1 (en) 2021-12-01
KR102072262B1 (en) 2020-01-31
US20210175375A1 (en) 2021-06-10

Similar Documents

Publication Publication Date Title
JP6831964B2 (en) Solar cell
US9640676B2 (en) Methods and structures for improving the structural integrity of solar cells
CN103460354B (en) Thin silicon solar cell and method of manufacture
JP5070112B2 (en) Photovoltaic device and method for producing photovoltaic device
EP2528105A2 (en) Method for fabricating a back contact solar cell
US7967936B2 (en) Methods of transferring a lamina to a receiver element
US9252300B2 (en) Method for backside-contacting a silicon solar cell, silicon solar cell and silicon solar module
WO2003003434A1 (en) Method of producing semiconductor thin film and method of producing solar cell
KR20100016475A (en) Photovoltaic device and method for manufacturing the same
KR20160061369A (en) Epitaxial silicon solar cells with moisture barrier
JPH114008A (en) Manufacturing method of thin film solar cell
CN109673170B (en) Solar cell element
US8921686B2 (en) Back-contact photovoltaic cell comprising a thin lamina having a superstrate receiver element
US9831377B2 (en) Die-cutting approaches for foil-based metallization of solar cells
US7994064B2 (en) Selective etch for damage at exfoliated surface
US20140366938A1 (en) Wafer solar cell and solar cell production method
JP2006135017A (en) Photoelectric conversion device and manufacturing method thereof

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20191106

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20191106

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20201014

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20201201

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20201225

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20210112

R150 Certificate of patent or registration of utility model

Ref document number: 6831964

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: R3D02

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250